WO2021115247A1

WO2021115247A1 - Sample plate

Info

Publication number: WO2021115247A1
Application number: PCT/CN2020/134455
Authority: WO
Inventors: 陈睿; 夏浩涵
Original assignee: 上海睿钰生物科技有限公司
Priority date: 2019-12-11
Filing date: 2020-12-08
Publication date: 2021-06-17
Also published as: CN110823897A

Abstract

A sample plate (200, 300, 400, 500, 700, 800, 900, 1000), which comprises sample grooves (201, 301, 401, 501, 701, 801, 901, 1001) used for containing samples; and gauge patterns (202, 302, 402, 502, 702, 802, 902, 1002) used for determining the magnification of a microscope apparatus 100.

Description

Sample plate

Cross-references to related applications

This application claims the right of priority for the Chinese invention patent application whose application date is December 11, 2019 and the application number is CN201911264674.1, the entire content of which is incorporated herein by reference.

Technical field

The present disclosure relates to the field of optical microscopy, and in particular, to a sample plate.

Background technique

At present, the existing sample plates used for cell counting or analysis usually include one or more sample slots. The sample slots are used to hold the cell samples to be tested, and then the number of cells can be obtained through the microscopic imaging system and the image analysis system. Concentration, size and other parameters. However, the detection of these parameters depends on the observation ability of the microscope or microscopic imaging system. The most important and important characteristic parameter is the magnification, and the actual magnification of many microscopic instruments on the market is inconsistent with its nominal nominal value.

At present, the calibration and calibration of microscope magnification mainly adopts micrometer or similar micrometer technology, and the actual magnification of the microscope is calibrated through the cooperation of the eyepiece micrometer and the objective micrometer. For example, the actual magnification of the microscope can be calculated by comparing the size obtained in the microscopic imaging system with the known interval size in the ruler. However, these technologies have certain defects. When the eyepiece or objective lens is changed, it needs to be re-calibrated. At this time, the sample to be tested needs to be removed, which leads to duplication and troubles of the operation, and it is necessary to search for the original field of view At the same time, it will also cause the sample to move in the sample tank, which will affect the observation results.

Therefore, it is very important to measure the magnification of a microscope or microscopic imaging system. The existing cytometer does not have the ability to accurately calibrate the magnification of the microscope, which leads to inconsistencies between the detected parameters and the actual The accuracy of the final result

Summary of the invention

According to an aspect of the present disclosure, there is provided a sample plate including: a sample tank for holding a sample; and a ruler pattern for determining the magnification of the microscopic device.

In some embodiments according to the present disclosure, the scale pattern is located at the bottom of the sample tank.

In some embodiments according to the present disclosure, the sample plate includes a plurality of sample slots, and the scale pattern is provided at the bottom of each sample slot.

In some embodiments according to the present disclosure, the scale pattern is located near the sample groove.

In some embodiments according to the present disclosure, the scale pattern includes a first scale line extending in a first direction.

In some embodiments according to the present disclosure, the scale pattern includes a plurality of first scale lines, and the plurality of first scale lines are arranged in a second direction different from the first direction.

In some embodiments according to the present disclosure, the first direction is perpendicular to the second direction.

In some embodiments according to the present disclosure, the sample groove extends in the first direction or the second direction.

In some embodiments according to the present disclosure, the scale pattern further includes a second scale line extending in a second direction.

In some embodiments according to the present disclosure, the scale pattern further includes a first mark for determining the extension direction and the arrangement direction of the sample groove.

In some embodiments according to the present disclosure, the first identification includes a first arrow and a second arrow that are perpendicular to each other.

In some embodiments according to the present disclosure, the scale pattern further includes a second mark for identifying the sample plate.

In some embodiments according to the present disclosure, the scale pattern further includes a third identification for identifying the sample slot.

Through the following detailed description of exemplary embodiments of the present disclosure with reference to the accompanying drawings, other features and advantages of the present disclosure will become clear.

Description of the drawings

The drawings constituting a part of the specification describe the embodiments of the present disclosure, and together with the specification, serve to explain the principle of the present disclosure.

With reference to the accompanying drawings, the present disclosure can be understood more clearly according to the following detailed description, in which:

Figure 1 shows a schematic diagram of a microscopic device according to some embodiments of the present disclosure.

Figure 2 shows a schematic diagram of a sample plate according to some embodiments of the present disclosure.

Figure 3 shows a schematic diagram of a sample plate according to some embodiments of the present disclosure.

Figure 4 shows a schematic diagram of a sample plate according to some embodiments of the present disclosure.

Figure 5 shows a schematic diagram of a sample plate according to some embodiments of the present disclosure.

Figure 6A shows a scale pattern on a sample plate according to some embodiments of the present disclosure.

FIG. 6B shows an image of a ruler pattern on a sample plate according to some embodiments of the present disclosure.

Figure 7 shows a schematic diagram of a sample plate according to some embodiments of the present disclosure.

Figure 8 shows a schematic diagram of a sample plate according to some embodiments of the present disclosure.

Figure 9 shows a schematic diagram of a sample plate according to some embodiments of the present disclosure.

Figure 10 shows a schematic diagram of a sample plate according to some embodiments of the present disclosure.

FIG. 11 shows a set of scale lines in a ruler pattern on a sample plate according to some embodiments of the present disclosure.

Figure 12 shows a flow chart of the operation of the microscopic device according to some embodiments of the present disclosure.

FIG. 13 shows a schematic diagram of the pixel arrangement direction of the image sensor.

Note that in the embodiments described below, the same reference numerals are sometimes used in common between different drawings to denote the same parts or parts with the same functions, and repeated descriptions thereof are omitted. In this specification, similar reference numerals and letters are used to indicate similar items. Therefore, once a certain item is defined in one figure, it does not need to be further discussed in subsequent figures.

For ease of understanding, the position, size, range, etc. of each structure shown in the drawings and the like may not indicate the actual position, size, range, etc. Therefore, the disclosed invention is not limited to the position, size, range, etc. disclosed in the drawings and the like.

Detailed ways

Various exemplary embodiments of the present disclosure will now be described in detail with reference to the accompanying drawings. It should be noted that unless specifically stated otherwise, the relative arrangement of components and steps, numerical expressions and numerical values set forth in these embodiments do not limit the scope of the present disclosure.

The following description of at least one exemplary embodiment is actually only illustrative, and in no way serves as any limitation to the present disclosure and its application or use.

The technologies, methods, and equipment known to those of ordinary skill in the relevant fields may not be discussed in detail, but where appropriate, the technologies, methods, and equipment should be regarded as part of the authorization specification.

In all examples shown and discussed herein, any specific value should be interpreted as merely exemplary, rather than as a limitation. Therefore, other examples of the exemplary embodiment may have different values.

Fig. 1 shows a schematic diagram of a microscopic device according to an embodiment of the present disclosure.

As shown in FIG. 1, the microscopic apparatus 100 includes an image sensor 101, a memory 102, a processor 103, an optical imaging device 104, a sample stage 105 and a light source 106. At work, the sample plate to be observed is arranged on the sample stage 105. The light emitted by the light source 106 irradiates the sample plate. The optical imaging device 104 may include, for example, an objective lens and an eyepiece (not shown), and each of the objective lens and the eyepiece may be composed of one or more sets of lenses. The optical image formed by the optical device 104 is received by the image sensor 101 and converted into a digital image by the image sensor 101. The image sensor may be, for example, a charge coupled device (CCD), a complementary metal oxide semiconductor (CMOS), or the like. In some embodiments according to the present disclosure, image capturing devices such as mobile phones and cameras may also be arranged in the light path. These image capturing devices also include image sensors and can capture images of samples in the sample plate through the optical device 104 .

The digital image obtained by the image sensor 101 is stored in the memory 102, and the processor 103 can read the digital image in the memory 102 and process the digital image.

Figure 2 shows a schematic diagram of a sample plate according to some embodiments of the present disclosure. As shown in FIG. 2, the sample plate 200 includes a plurality of sample grooves 201 in which samples to be observed and photographed can be accommodated. In addition, the sample plate 200 also has a scale pattern 202.

In the exemplary embodiment shown in FIG. 2, the scale pattern 202 is located at the bottom of the sample tank (that is, on the surface of the sample tank in contact with the sample therein). When acquiring an image of a sample through the microscopic device 100, the optical imaging device 104 usually focuses on the bottom of the sample tank, and setting the scale pattern 202 at the bottom of the sample tank can obtain a clear image of the scale pattern while obtaining the sample image. The scale pattern 202 is a line segment along the horizontal direction, and the length is L. For example, in some exemplary embodiments, L may be 1 μm-100 μm. Using the scale pattern 202, the magnification of the microscopic device 100 can be accurately calculated.

For example, as shown in FIG. 13, for an image sensor 101 in which pixels are uniformly arranged in two directions (X direction and Y direction) perpendicular to each other, it is assumed that in the digital image generated by the image sensor 101, the lines at both ends of the ruler pattern 202 The coordinates are (x1, y1) and (x2, y2) respectively. Here, the coordinates (x1, y1) and (x2, y2) represent the positions on the image sensor 101 of pixels corresponding to both ends of the line segment. Then the size K of the line segment image formed on the image sensor 101 by the line segment on the sample board can be calculated according to formula (1):

K=D·sqrt[(x2-x1) ² +(y2-y1) ² ] (1)

Wherein, D is the distance between adjacent pixels in the image sensor 101, that is, the distance from the center of one pixel in the X direction or the Y direction to the center of adjacent pixels. The function sqrt means to calculate the square root.

Then, the magnification M of the optical imaging device 104 of the microscopic apparatus 100 can be calculated according to the following formula (2):

M=K/L (2)

Through the above method, the actual magnification of the microscopic device 100 can be accurately obtained.

In the above exemplary embodiment, the pixel array of the image sensor 101 is a rectangular array, and the pitch of adjacent pixels is the same in the X direction and the Y direction. In other embodiments according to the present disclosure, the pitch of adjacent pixels of the image sensor 101 is different in the X direction and the Y direction. For example, if the distance between adjacent pixels in the X direction is D1, and the distance between adjacent pixels in the Y direction is D2, the line segment image formed on the image sensor 101 by the line segment on the sample board can be calculated according to the following formula (3) Size K:

K=sqrt[(D1) ² ·(x2-x1) ² +(D2) ² ·(y2-y1) ² ] (3)

Then, the actual magnification M of the microscopic device 100 can be calculated according to the above formula (2).

The foregoing calculation of the actual magnification can be performed by the processor 103 of the microscopic device 100, for example. For example, the pitch of adjacent pixels of the image sensor 101 may be stored in the memory 102 in advance. After the image sensor 101 generates a digital image of the sample plate 200, the digital image is stored in the memory 102.

Then, the processor 103 reads the digital image from the memory 102 and recognizes the scale pattern in the digital image. Next, the processor 103 can read the distance between adjacent pixels of the image sensor 101 from the memory, and calculate the actual magnification M of the microscopic device 101 according to the above formulas (1)-(3).

In addition, in some embodiments according to the present disclosure, for a sample plate 200 having a plurality of sample grooves 201, the magnification M can also be calculated in the following manner.

For the sample plate 200 shown in FIG. 2 with three sample slots 201, the corresponding magnifications M1, M2, and M3 can be calculated based on the ruler pattern 202 on each sample slot 201, and then the microscopy can be calculated by formula (4) The actual magnification of the device M.

M=(M1+M2+M3)/3 (4)

That is, the average value of the magnifications M1, M2, and M3 is taken as the actual magnification M of the microscopic device. In this way, the calculation error can be reduced, and the accuracy of the magnification can be further improved.

In addition, in other embodiments according to the present disclosure, the sum K'of the line segments of each scale pattern 202 can be calculated by the following formula (5).

K'=D·sqrt[(x2-x1) ² +(y2-y1) ² ]

+D·sqrt[(x3-x4) ² +(y3-y4) ² ]

+D·sqrt[(x5-x6) ² +(y5-y6) ² ] (5)

Among them, (x1, y1) and (x2, y2) are the coordinates of the two ends of the ruler pattern of the first sample slot 202 in the upper part of FIG. 2 in the digital image, and (x3, y3) and (x4, y4) are the graphs 2 The coordinates of the two ends of the ruler pattern of the second sample slot 202 in the middle in the digital image, (x5, y5) and (x6, y6) are the two ends of the ruler pattern of the third sample slot 202 in the lower part of Fig. 2 The coordinates in the digital image.

Then, the actual magnification M of the microscopic device can be calculated by formula (6).

M=K’/(3L) (6)

In this way, the calculation error can be reduced, and the accuracy of the magnification can be further improved.

The above briefly introduces how to calculate the actual magnification of the microscopic device 100 based on the ruler pattern on the sample plate. It should be understood that the present disclosure is not limited to the above-mentioned manner. Under the teaching and enlightenment of the present disclosure, those skilled in the art can also use other methods to calculate the actual magnification of the microscopic device 100 based on the scale pattern.

Figure 3 shows a schematic diagram of a sample plate according to some embodiments of the present disclosure. As shown in FIG. 3, the sample plate 300 includes a plurality of sample grooves 301, and samples to be observed and photographed can be accommodated in the sample grooves 301. In addition, the sample plate 300 also has a scale pattern 302.

In the exemplary embodiment shown in FIG. 3, the scale pattern 302 is located at the bottom of the sample tank. The scale pattern 302 is equal-spaced scale lines (first scale lines), each scale line extends along the horizontal direction (first direction), and the distance between each scale line in the vertical direction (second direction) is D. In some exemplary embodiments according to the present disclosure, the pitch D may be, for example, 1 μm-10 μm. Using the ruler pattern 302, the magnification of the microscopic device can be accurately calculated.

For example, the processor 103 may obtain the coordinates (x1', y1') of a point on a scale line in the scale pattern 302 according to the digital image generated by the image sensor 101, and obtain the passing point (x1', y1') along The coordinates (x2', y2') of the intersection point between the direction perpendicular to the scale line and the adjacent scale line.

Using a method similar to the method described above, the actual magnification of the microscopic device 100 can be calculated.

In the example shown in FIG. 3, there are a plurality of scale lines 302 on each sample tank. When the magnification of the microscopic device 100 is large, even if only a part of a single sample tank is included in the field of view, the actual magnification can be accurately obtained.

FIG. 4 shows a schematic diagram of a sample plate 400 according to some embodiments of the present disclosure. As shown in FIG. 4, in the sample plate 400, the scale pattern 402 is provided on the outside of the sample tank 401. In this way, the interference of the ruler pattern 402 on the sample in the sample tank 401 can be avoided, and the sample can be observed and analyzed more clearly. In order to obtain a clear image of the scale pattern 402, the scale pattern 402 may be located on the same plane as the bottom of the sample tank.

FIG. 5 shows a schematic diagram of a sample plate 500 according to some embodiments of the present disclosure. As shown in FIG. 5, the sample plate 500 includes a plurality of sample slots 501. A cross-shaped ruler pattern 502 is provided at the bottom of each sample slot 501. The scale pattern 502 includes two line segments perpendicular to each other, and the length of the two line segments can be the same or different. For example, one line segment (ie, the first scale line) extends in the horizontal direction, and the other line segment (ie, the second scale line) extends in the vertical direction.

Using the scale pattern 502 on the sample plate 500 of FIG. 5, the magnification of the microscopic device can also be calculated from the digital image taken by the image sensor 101. For example, the magnification of the microscopic device can be calculated according to the above formulas (1)-(2) and the length of any one of the two line segments in the scale pattern 502. Alternatively, the magnification can be calculated separately based on each of the two line segments, and then the average of the two magnifications can be taken as the magnification of the microscopy device.

In addition, the scale pattern 502 on the sample plate 500 of FIG. 5 can also be used to identify and correct the distortion of the microscopic device 100. For example, when there is no distortion in the optical imaging device 104 of the microscopic apparatus 100, the image of the scale pattern 502 should also be two line segments perpendicular to each other, as shown in FIG. 6A. However, if there is distortion in the optical imaging device 104 of the microscopic apparatus 100, the two line segments in the image of the scale pattern 502 will no longer be perpendicular, as shown in FIG. 6B. Based on the images of the two line segments, the processor 103 can recognize that the optical imaging device of the microscopic apparatus 100 is distorted. Further, the processor 103 may also correct the digital image generated by the image sensor 101 based on known parameters such as the size of the scale pattern 502, so as to improve the image quality.

The above describes the sample plate according to the present disclosure and how to obtain the magnification of the microscope device according to the scale pattern on the sample plate. It should be understood that this application is not limited to the above-mentioned embodiments.

For example, FIG. 7 shows a schematic diagram of a sample plate 700 according to some embodiments of the present disclosure. As shown in FIG. 7, the sample plate 700 includes a plurality of sample grooves 701 extending in a horizontal direction, and the bottom of each sample groove 701 is provided with a scale pattern 702. The scale pattern 702 includes a plurality of scale lines, each scale line extends in the horizontal direction (first direction), and the plurality of scale lines are arranged in the direction of the broken line 703 (second direction). The direction of the broken line 703 is not a vertical direction perpendicular to the horizontal direction. In this way, the scale pattern 702 can cover most of the sample groove 701 area. When the magnification of the microscopic device 100 is large and the field of view can only cover a part of the sample tank 701, this form of the ruler pattern 702 can ensure that at least one complete graduation line appears in the field of view. In this way, no matter which position of the sample tank 701 is observed, the magnification of the microscopic device can be accurately calculated.

In addition, in some embodiments according to the present disclosure, the orientation of the sample plate and the sample slot can also be determined according to the scale pattern on the sample plate. For example, the sample plate 300 shown in FIG. 3 includes a plurality of sample grooves 301 arranged in a vertical direction, and each sample groove 301 extends in a horizontal direction.

When observing and photographing the samples in the sample tank 301 through the microscopic device 100, due to the visual field and other reasons, it is often impossible to observe and photograph all the samples in the sample tank 301 at the same time. Therefore, it is necessary to translate the sample stage 105 so that the sample plate is translated in the field of view, so as to observe and photograph different sample grooves 301 on the sample plate 300 or different parts of the same sample groove 301.

As shown in FIG. 3, each scale line in the scale pattern 302 extends in the horizontal direction, that is, the extension direction of the scale line is the same as the extension direction of the sample tank, and the arrangement direction of the multiple scale lines is consistent with the arrangement direction of the multiple sample tanks. . Therefore, although only a part of the sample tank is displayed in the field of view of the microscopic equipment or the photographed picture, the processor 103 or the operator can determine the extension direction and the arrangement direction of the sample tank according to the extension direction and the arrangement direction of the scale line, and according to the determined The extension direction and arrangement direction of the sample slots move the sample plate 300 on the sample stage 105 to realize the observation and shooting of different sample slots 301 or different areas of the same sample slot 301.

FIG. 8 shows a schematic diagram of a sample plate 800 according to other embodiments of the present disclosure. As shown in FIG. 8, the sample plate 800 includes a plurality of sample grooves 801 extending in a horizontal direction, and the plurality of sample grooves 801 are arranged in a vertical direction. A scale pattern 802 is provided at the bottom of each sample tank 801. The scale pattern 802 includes a first identifier for determining the arrangement direction and the extension direction of the sample grooves 801. The first logo is composed of two

arrows

803 and 804 perpendicular to each other, wherein the arrow 803 extends in the vertical direction, and the arrow 804 extends in the horizontal direction. In addition, in this example, the longer arrow indicates the arrangement direction of the sample tanks, and the shorter arrow indicates the extension direction of the sample tanks. As shown in Figure 8, the length of the arrow 803 is greater than the length of the arrow 804. Therefore, according to the extending direction of the arrow 803, it can be determined that the plurality of sample grooves 801 are arranged in the vertical direction, and according to the extending direction of the arrow 804, the sample grooves 802 can be determined to be in the horizontal direction. extend.

FIG. 9 shows a schematic diagram of a sample plate 900 according to some embodiments of the present disclosure. As shown in FIG. 9, the sample plate 900 includes a plurality of sample slots 901 arranged in a horizontal direction, and each sample slot 901 also extends in the horizontal direction. A scale pattern 902 is provided at the bottom of each sample tank 901. The scale pattern 902 includes a first mark for determining the arrangement direction and extension direction of the sample grooves 901. The first mark is composed of

arrows

903 and 904, wherein the longer arrow 903 indicates the arrangement direction of the sample tank 901, and the shorter arrow 904 indicates the extension direction of the sample tank 901. In this way, through the extending directions of the

arrows

903 and 904, it can be determined that the plurality of sample grooves 901 are arranged in the horizontal direction, and each sample groove 901 also extends in the horizontal direction.

FIG. 10 shows a schematic diagram of a sample plate 1000 according to some embodiments of the present disclosure. As shown in FIG. 10, the sample plate 1000 includes a plurality of sample slots 1001 arranged in a vertical direction, and each sample slot 1001 extends in a horizontal direction. A scale pattern 1002 is provided at the bottom of the sample tank 1001. The ruler pattern 1002 includes a second mark 1004 for identifying the sample plate and a third mark 1003 for identifying the sample slot. The second mark 1004 and the third mark 1003 are composed of a plurality of scale lines, which are arranged in a horizontal direction, and each scale line extends in a vertical direction. The leftmost scale line 1005 and the rightmost scale line 1006 indicate the beginning and end of the second mark 1004 and the third mark 1003. The second mark 1004 and the third mark 1003 are between the scale line 1005 and the scale line 1006. According to the second identification 1004 and the third identification 1003, the number of the sample plate and the number of the sample slot can be determined respectively.

As shown in FIG. 10, in the lower sample slot 1001, the third mark 1003 contains two scale lines, and the number of the sample slot in which the third mark 1003 is located can be determined as 11. In the upper sample slot 1001, the third mark 1003 contains one scale line, and it can be obtained according to the distance between the scale lines. A scale line is missing in front of the scale line. Therefore, the sample where the third mark 1003 is located The slot number can be determined as 01. In the same way, for the third identification 1003 in the sample slot 1001 in the middle, it can be determined that the number of the sample slot is 10.

Similarly, in the second mark 1004, according to the distance between the scale lines, it is determined that the missing scale lines represent 0, and the number of the sample plate 1000 can be determined to be 1101.

In addition, in some embodiments according to the present disclosure, other ways may also be used to represent 0 and 1 in the number. For example, in a set of scale lines as shown in FIG. 11, scale lines of different lengths can be used to represent 0 and 1 respectively. Among them, the longer scale line represents 1, and the shorter scale line represents 0. A set of tick marks in Figure 11 can be identified as 1011011.

It should be understood that under the teaching and enlightenment of the present disclosure, those skilled in the art may also use other ways to combine the first mark, the second mark, the third mark and the scale line as a ruler pattern.

FIG. 12 shows a flowchart of the operation of the microscopic device 100 according to some embodiments of the present disclosure.

As shown in FIG. 12, first, the sample plate is placed on the sample stage 105 (step 1201). There are samples to be observed and photographed in the sample slot of the sample plate.

Then, a digital image of the sample is generated by the image sensor 101 (step 1202). The optical image formed by the optical imaging device 104 of the microscopic apparatus 100 is received by the image sensor 101, and a digital image is generated. The digital image can be stored in the memory 102.

Next, the processor 103 can read the digital image from the memory 102 and perform various processing (step 1203). For example, as described above, the magnification of the microscopy device 100 can be calculated based on the scale pattern in the digital image, the extension direction and arrangement direction of the sample slot can be determined, the sample plate (number) can be identified, or the sample slot can be identified (of Number), etc.

In addition, the embodiments according to the present disclosure may also include the following technical solutions:

1. A sample plate, including:

A sample tank for holding samples; and

The ruler pattern used to determine the magnification.

2. The sample plate according to 1, wherein the scale pattern is located at the bottom of the sample tank.

3. The sample plate according to 2, wherein the sample plate includes a plurality of sample slots, and the scale pattern is provided at the bottom of each sample slot.

4. The sample plate according to 1, wherein the scale pattern is located near the sample slot.

5. The sample plate according to any one of 1-4, wherein the scale pattern includes a first scale line extending in a first direction.

6. The sample plate according to 5, wherein the scale pattern includes a plurality of first scale lines, and the plurality of first scale lines are arranged in a second direction different from the first direction.

7. The sample plate according to 6, wherein the first direction is perpendicular to the second direction.

8. The sample plate according to 6 or 7, wherein the sample groove extends in the first direction or the second direction.

9. The sample plate according to any one of 6-8, wherein the scale pattern further includes a second scale line extending in a second direction.

10. The sample plate according to any one of 1-9, wherein the scale pattern further includes a first identifier for determining the extension direction and the arrangement direction of the sample groove.

11. The sample plate according to 10, wherein the first mark includes a first arrow and a second arrow perpendicular to each other.

12. The sample plate according to any one of 1-11, wherein the scale pattern further includes a second mark for identifying the sample plate.

13. The sample plate according to 12, wherein the scale pattern further includes a third mark for identifying the sample slot.

In the specification and claims, the words "front", "rear", "top", "bottom", "above", "below", etc., if they exist, are used for descriptive purposes and are not necessarily used To describe the same relative position. It should be understood that the words used in this way are interchangeable under appropriate circumstances, so that the embodiments of the present disclosure described herein, for example, can be used in other orientations different from those shown or otherwise described herein. Operation in orientation.

As used herein, the word "exemplary" means "serving as an example, instance, or illustration" and not as a "model" to be copied exactly. Any implementation described exemplarily herein is not necessarily construed as being preferred or advantageous over other implementations. Moreover, the present disclosure is not limited by any expressed or implied theory given in the above technical field, background art, summary of the invention, or specific embodiments.

As used herein, the word "substantially" means to include any minor changes caused by design or manufacturing defects, device or component tolerances, environmental influences, and/or other factors. The word "substantially" also allows for differences between the perfect or ideal situation due to parasitic effects, noise, and other practical considerations that may be present in the actual implementation.

The foregoing description may indicate elements or nodes or features that are "connected" or "coupled" together. As used herein, unless expressly stated otherwise, "connected" means that one element/node/feature is electrically, mechanically, logically, or otherwise directly connected (or Direct communication). Similarly, unless expressly stated otherwise, "coupled" means that one element/node/feature can be directly or indirectly connected to another element/node/feature mechanically, electrically, logically, or in other ways. Interaction is allowed, even if the two features may not be directly connected. In other words, "coupled" is intended to include direct connection and indirect connection of elements or other features, including the connection of one or more intermediate elements.

In addition, for reference purposes only, certain terminology may also be used in the following description, and thus is not intended to be limiting. For example, unless the context clearly dictates it, the words "first", "second" and other such numerical words referring to structures or elements do not imply an order or order.

It should also be understood that when the term "including/comprising" is used in this text, it indicates that the specified features, wholes, steps, operations, units and/or components are present, but it does not exclude the presence or addition of one or more other features, Whole, steps, operations, units and/or components and/or combinations thereof.

In the present disclosure, the term "provide" is used in a broad sense to cover all the ways to obtain an object, so "provide an object" includes but is not limited to "purchase", "preparation/manufacturing", "arrangement/setting", "installation/ "Assemble", and/or "Order" objects, etc.

Those skilled in the art should realize that the boundaries between the above operations are merely illustrative. Multiple operations can be combined into a single operation, a single operation can be distributed in additional operations, and the operations can be executed at least partially overlapping in time. Also, alternative embodiments may include multiple instances of specific operations, and the order of operations may be changed in other various embodiments. However, other modifications, changes and replacements are also possible. Therefore, this specification and drawings should be regarded as illustrative rather than restrictive.

Although some specific embodiments of the present disclosure have been described in detail through examples, those skilled in the art should understand that the above examples are only for illustration and not for limiting the scope of the present disclosure. The various embodiments disclosed herein can be combined arbitrarily without departing from the spirit and scope of the present disclosure. Those skilled in the art should also understand that various modifications can be made to the embodiments without departing from the scope and spirit of the present disclosure. The scope of the present disclosure is defined by the appended claims.

Claims

A sample plate including:

A sample tank for holding samples; and

The ruler pattern used to determine the magnification.
The sample plate according to claim 1, wherein the scale pattern is located at the bottom of the sample tank.
The sample plate according to claim 2, wherein the sample plate comprises a plurality of sample grooves, and the scale pattern is provided at the bottom of each sample groove.
The sample plate according to claim 1, wherein the scale pattern is located near the sample groove.
The sample plate according to any one of claims 1 to 4, wherein the scale pattern includes a first scale line extending in a first direction.
The sample plate of claim 5, wherein the scale pattern includes a plurality of first scale lines, and the plurality of first scale lines are arranged in a second direction different from the first direction.
The sample plate according to claim 6, wherein the first direction is perpendicular to the second direction.
The sample plate according to claim 6 or 7, wherein the sample groove extends in the first direction or the second direction.
8. The sample plate according to any one of claims 6-8, wherein the scale pattern further comprises a second scale line extending in a second direction.
9. The sample plate according to any one of claims 1-9, wherein the scale pattern further comprises a first mark for determining the extension direction and the arrangement direction of the sample groove.
The sample plate according to claim 10, wherein the first mark includes a first arrow and a second arrow perpendicular to each other.
The sample plate according to any one of claims 1-11, wherein the scale pattern further comprises a second mark for identifying the sample plate.
The sample plate according to claim 12, wherein the scale pattern further includes a third mark for identifying the sample slot.