WO2021103231A1

WO2021103231A1 - Encoder measurement and calibration method, device and apparatus, as well as storage medium

Info

Publication number: WO2021103231A1
Application number: PCT/CN2019/127794
Authority: WO
Inventors: 夏一帆
Original assignee: 浙江禾川科技股份有限公司
Priority date: 2019-11-29
Filing date: 2019-12-24
Publication date: 2021-06-03
Also published as: CN110849406A; CN110849406B

Abstract

Provided are an encoder measurement and calibration method, device, and apparatus as well as a storage medium, wherein the method comprises: obtaining in advance a deviation curve function of an encoder relative to a standard encoder; wherein, the deviation curve function is a curve function obtained by curve fitting for each fitting point after performing linear regression processing on the deviation waveform of the measurement deviation value of the encoder and the standard encoder that changes with the position point in a measurement period, to obtain multiple fitting points on the linear regression curve; and calibrating all test data according to the deviation curve function. The method obtains in advance a deviation curve function that can characterize a deviation change trend between the measured value of the encoder and the measured value of the standard encoder, and calibrate the measurement value of the encoder on the basis of the deviation curve function, and thus improve the accuracy of the encoder.

Description

Measurement and calibration method, device, equipment and storage medium of encoder

This application claims the priority of a Chinese patent application filed with the Chinese Patent Office on November 29, 2019, the application number is 201911204611.7, and the invention title is "Encoder measurement and calibration method, device, equipment, and storage medium". The entire content of the application is approved. The reference is incorporated in this application.

Technical field

The present invention relates to the technical field of encoder accuracy calibration, in particular to an encoder measurement calibration method, device, equipment and computer readable storage medium.

Background technique

The encoder is a measuring device that converts angular displacement and linear displacement into electrical signals, and performs analog-to-digital conversion of the electrical signals to generate digital position information. There are many types of encoders, including magnetic encoders, electrical encoders, etc. according to different measurement principles, and can be divided into absolute encoders and incremental encoders according to different decoding principles.

Because in the design and production of the encoder, design defects and production errors are unavoidable, which inevitably leads to corresponding errors in the position information measured by the encoder. Therefore, the encoder needs to be calibrated for accuracy based on the standard encoder before leaving the factory.

At present, the calibration of the encoder mainly includes two methods: segmented calibration and integrated calibration. The segmented type has the problem of poor calibration accuracy, while the integrated type has the problem that the fitting function obtained by the calibration is complicated and the calculation amount of the encoder is increased.

Summary of the invention

The purpose of the present invention is to provide an encoder measurement calibration method, device, equipment and computer readable storage medium, which is beneficial to improve the accuracy of encoder calibration.

In order to solve the above technical problems, the present invention provides an encoder measurement calibration method, including: obtaining in advance the deviation curve function of the encoder relative to the standard encoder; wherein, the deviation curve function is a comparison between the encoder and the encoder. The deviation waveform of the measurement deviation value of the standard encoder that changes with the position point in a measurement period, after performing linear regression processing to obtain multiple fitting points on the linear regression curve, the curve fitting is obtained by performing curve fitting on each of the fitting points Curve function

Collect test data at each test location;

Calibrate each of the test data according to the deviation curve function, and obtain the calibrated test data corresponding to each test position point.

In an optional embodiment, linear regression processing is performed on the deviation waveforms of the measured deviation values of the encoder and the standard encoder that vary with the position points within a measurement period to obtain multiple linear regression curves. Fitting points, including:

Dividing the deviation waveform into a number of waveform sections according to position points;

Perform a linear regression operation on the deviation waveform in each of the waveform sections to obtain a linear regression function corresponding to each of the waveform sections;

A fitting point is selected on the linear regression function in each waveform section.

In an optional embodiment, the performing a linear regression operation on the deviation waveform in each of the waveform segments to obtain a linear regression function corresponding to each of the waveform segments includes:

Perform a first-order linear regression operation on the deviation waveforms in each of the waveform sections to obtain a first-order linear regression function.

In an optional embodiment, the process of performing curve fitting on each of the fitting points to obtain the deviation curve function includes:

A cubic spline interpolation algorithm is used to perform curve fitting on each of the fitting points, and the fitting obtains the deviation curve function passing through each of the fitting points.

In an optional embodiment, the dividing the deviation waveform into a plurality of waveform segments according to position points includes:

Dividing the deviation waveform into a plurality of the waveform sections whose width difference between any two of the waveform sections is not greater than a preset difference;

The selection of a fitting point on the linear regression function in each of the waveform segments includes:

The fitting point is selected in the middle section of the waveform section, and the middle section is a middle-third section of the waveform section.

The application also provides a measurement calibration device for an encoder, including:

The obtaining function module is used to obtain the deviation curve function of the encoder relative to the standard encoder in advance; wherein the deviation curve function is the measurement deviation value of the encoder and the standard encoder in a measurement period with position After performing linear regression processing on the deviation waveform of the point change to obtain multiple fitting points on the linear regression curve, perform curve fitting on each of the fitting points to obtain the curve function;

Data collection module, used to collect test data at each test location;

The data calibration module is used to calibrate each of the test data according to the deviation curve function, and obtain the calibrated test data corresponding to each test position point.

In an optional embodiment, a function calculation module is included for dividing the deviation waveform into a number of waveform sections according to position points; performing linear regression operations on the deviation waveforms in each of the waveform sections to obtain A linear regression function corresponding to each of the waveform sections; a fitting point is selected on the linear regression function in each of the waveform sections.

In an optional embodiment, the function operation module is specifically configured to perform a first-order linear regression operation on the deviation waveforms in each of the waveform segments to obtain a first-order linear regression function.

The application also provides a measurement and calibration equipment for an encoder, including:

Memory, used to store computer programs;

The processor is used to implement the steps of the measurement calibration method of the encoder as described in any one of the preceding items when the computer program is executed.

The present application also provides a computer-readable storage medium with a computer program stored on the computer-readable storage medium, and when the computer program is executed by a processor, the steps of the encoder measurement calibration method as described in any of the above are implemented .

The method for measuring and calibrating an encoder provided by the present invention includes obtaining the deviation curve function of the encoder relative to the standard encoder in advance; wherein, the deviation curve function is the measurement deviation value of the encoder and the standard encoder in one measurement period. After performing linear regression processing to obtain multiple fitting points on the linear regression curve, perform the linear regression processing on the deviation waveform that varies with the position point, and perform curve fitting on each fitting point to obtain the curve function; collect the test data of each test position point; The deviation curve function calibrates each test data, and obtains the calibrated test data corresponding to each test position point.

In this application, based on the analysis and processing of the deviation waveform measured between the encoder and the standard encoder in advance, a deviation curve function that can characterize the deviation change trend between the measured value of the encoder and the measured value of the standard encoder is obtained; and this A deviation curve function is a curve function obtained by first performing linear regression processing on the deviation waveform, and then fitting the fitting points on the linear regression function to avoid the more serious sampling points in the deviation waveform, and to simulate the subsequent curve. The combination produces interference, thereby improving the accuracy of the deviation curve function obtained by the subsequent curve fitting, thereby improving the accuracy of the encoder accuracy calibration.

The present application also provides a measurement and calibration device, equipment and computer-readable storage medium for an encoder, which have the above-mentioned beneficial effects.

Description of the drawings

In order to explain the embodiments of the present invention or the technical solutions of the prior art more clearly, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the drawings in the following description are merely For some of the embodiments of the present invention, those of ordinary skill in the art can obtain other drawings based on these drawings without creative work.

FIG. 1 is a schematic flowchart of a measurement and calibration method for an encoder provided by an embodiment of the application;

Figure 2 is a schematic diagram of the deviation waveform of the encoder to be tested;

FIG. 3 is a schematic flowchart of a process of obtaining a deviation curve function provided by an embodiment of the application;

Fig. 4 is a structural block diagram of an encoder measurement and calibration device provided by an embodiment of the present invention.

Detailed ways

In order to enable those skilled in the art to better understand the solution of the present invention, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.

As shown in FIG. 1, FIG. 1 is a schematic flowchart of a measurement and calibration method for an encoder provided by an embodiment of the application, and the measurement and calibration method may include:

Step S11: Obtain in advance the deviation curve function of the encoder relative to the standard encoder.

Among them, the deviation curve function is the deviation waveform of the measurement deviation value of the encoder and the standard encoder that changes with the position point in a measurement period. After linear regression processing is performed to obtain multiple fitting points on the linear regression curve, each simulation is performed. The curve function obtained by curve fitting at the junction point.

Step S12: Collect test data of each test location point.

Step S13: Calibrate each test data according to the deviation curve function, and obtain the calibrated test data corresponding to each test position point.

It should be noted that obtaining the deviation curve function of the encoder relative to the standard encoder is by obtaining in advance the deviation waveform of the deviation between the measured value and the accurate value of the encoder at each position point, where the deviation The waveform is based on the position data measured by the encoder as the abscissa, and the deviation value corresponding to the position data is the waveform where the discrete point of the ordinate is located. The deviation waveform fitting obtains the deviation curve function that can characterize the change trend of the encoder measurement deviation .

Specifically, refer to FIG. 2, which is a schematic diagram of the deviation waveform of the encoder under test. In Figure 2, the deviation waveform of the rotary encoder is taken as an example for description. Therefore, the abscissa is the position angle value, and the ordinate is the deviation value corresponding to each position value, where the position angle value and the deviation value form the discrete point It falls on two realization curves. The deviation curve function that needs to be fitted is the function of the dashed curve in the figure.

In the prior art, there are mainly two ways to fit the waveform formed by discrete points:

One is integral fitting. Algorithms such as Fourier series or Lagrangian expansion can be used to fit the discrete points on the entire waveform as a whole, so that the fitted curve function passes through as much as possible Every discrete point on the deviation waveform; although the fitting function obtained by this method has a high degree of fit with each discrete point, it is also prone to overfitting, although it has a good fit with the current deviation waveform , But it cannot accurately reflect the overall deviation trend of the encoder; in addition, the fitting function obtained by this fitting method is relatively complicated. If it is applied to the encoder, it must be solved by the encoder's MCU according to the fitting function. The position data will increase the computing pressure of the MCU to a certain extent.

The other is segmented fitting. The waveform is first divided into multiple equally divided waveform sections, a discrete point is selected as the fitting point in each waveform section, and each fitting point is simulated by interpolation. Together, the fitting curve passing through each fitting point is obtained. This fitting method greatly reduces the number of discrete points on the deviation waveform, which can reduce the over-fitting problem to a certain extent, and the obtained fitting function is relatively simpler.

The deviation waveform obtained for each data acquisition of the encoder is not constant, and the discrete points on the deviation waveform should fluctuate near the deviation curve, which is a curve that accurately reflects the deviation change trend of the encoder.

It can be seen that, for the deviation curve, it should be a curve approaching the fluctuation center of the deviation waveform, which is more accurate, rather than the curve that passes through the most discrete points on the deviation waveform. However, in the prior art, whether the fitting curve function obtained by the integral fitting or the segmented fitting of the waveform fitting in the prior art is fitted through discrete points, the encoder accuracy is calibrated based on the fitting curve , It will obviously reduce the calibration accuracy; and if some discrete points have large deviations due to measurement or other reasons, the accuracy of the fitting curve function obtained on the basis of these discrete points will be further reduced.

In order to further illustrate the technical solution in the present application, the process of obtaining the deviation curve function in the present application will be described in detail below with specific embodiments.

As shown in FIG. 3, FIG. 3 is a schematic flowchart of a process of obtaining a deviation curve function provided by an embodiment of the application, and the process may include:

Step S21: Collect and obtain the deviation waveform of the encoder to be calibrated.

Among them, the deviation waveform is the waveform of the measurement deviation value of the encoder to be calibrated and the standard encoder varying with the position point within a measurement period;

In order to obtain the deviation waveform, the encoder to be calibrated and the standard encoder can be measured at the same time. When measuring the same position point, record the reading of the encoder to be calibrated and the standard encoder, and take the reading of the encoder to be calibrated as Position data, the difference between the readings of the encoder to be calibrated and the standard encoder is the deviation data; according to similar principles, the position data and deviation data corresponding to each position point of the encoder in one cycle can be obtained; and then measured by the encoder to be calibrated The position data corresponding to each position point of is the abscissa, the deviation data is the ordinate, and the obtained multiple discrete points, the waveform formed by each discrete point is the deviation waveform.

It should be noted that for a rotary encoder, generally one rotation is also a cycle, and the deviation of the measured position value should be repeated. Therefore, in the actual calibration process, only one rotation of the encoder Calibration can be done at each position point within.

But for the linear encoder, because there is only one cycle, it is necessary to measure the deviation data of all the position points in the entire range.

Step S22: Divide the deviation waveform into several waveform sections according to the position points.

Optionally, the deviation waveform is divided into a plurality of waveform sections whose width difference between any two waveform sections is not greater than a preset difference value.

In the prior art segmented fitting of the waveform, when the waveform is divided into waveform sections, the division is generally performed strictly in a manner of equal division. In this embodiment, there is no requirement for the uniformity of the division of the deviation waveform section. The width between the various waveform sections may not be exactly the same, to avoid the problem that some critical points are difficult to obtain. However, for the convenience of calculation, it can be ensured that the width of each waveform segment is approximately the same.

Step S23: Perform a linear regression operation on the deviation waveform in each waveform section to obtain a linear regression function corresponding to each waveform section.

It should be noted that linear regression operation is a statistical analysis method that uses regression analysis operations in mathematical statistics to determine the quantitative relationship between two or more variables. The principle of linear regression operation is to make each discrete point as far as possible to be distributed on both sides of the linear regression curve, that is to say, it is not necessarily required that each discrete point is located on the regression curve, thereby eliminating some serious deviations from the discrete point curve. The influence of the fitting further improves the accuracy of the calibration of the encoder by the fitting curve function, wherein the fitting curve function is also the above-mentioned deviation curve function.

Optionally, in order to simplify the calculation process as much as possible to reduce the complexity of fitting the deviation curve function, a first-order linear regression operation may be performed on each waveform segment to obtain a first-order linear function. Of course, the technical solution of obtaining a second-order linear function by using a second-order linear regression operation is not excluded in this application.

Step S24: a fitting point is selected from the linear regression function in each waveform section, and curve fitting is performed on the fitting point to obtain a deviation curve function passing through each fitting point.

Optionally, obtaining the fitting points on the linear regression function in each waveform segment may specifically include:

The fitting point is selected in the middle section of the waveform section, and the middle section is the middle one-third section of the waveform section.

Generally, when selecting discrete points in each waveform section, select the discrete points corresponding to the center point of the section on the abscissa. If the discrete point is a point where there is a large deviation in the fluctuation center of the relative deviation waveform, the accuracy of the deviation curve function will be reduced.

The fitting points in this embodiment are points on the linear regression function, which can avoid this problem. However, as far as possible, the point at the center of the linear regression function is selected as the fitting point, which is beneficial to the calibration accuracy of a high deviation curve function. Considering that the center point of each waveform segment may be inconvenient to obtain a value, you can try to select the fitting point corresponding to the position point near the center point of each waveform segment, such as the point where the position data is an integer (such as 0 degrees, 5 degrees, The fitting point corresponding to the 10 degree position, etc.).

In short, as long as it can ensure the calibration accuracy of the deviation curve function obtained by fitting the fitting point as much as possible, and reduce the difficulty of calculation as much as possible.

After the linear regression function is obtained, the points on the linear regression function are used as fitting points to perform curve fitting, so that the fitted curve passes through each fitting point. Compared with the discrete points that are often used for fitting in the prior art based on actual collected data, the fitting points in this embodiment are closer to the fluctuation of the deviation waveform than the discrete points in the prior art. The center, using this as the reference for fitting the deviation curve, can further improve the accuracy of the obtained fitting curve function.

Specifically, there are many ways to perform curve fitting on each fitting point. The simplest one is to connect each adjacent fitting point with a straight line. The function expression of each straight line is the deviation curve function. The deviation curve function obtained by this method has the advantages of simple function formula and reducing the difficulty of mcu operation of the encoder.

In addition, the cubic spline interpolation algorithm can also be used to fit each fitting point. Compared with the deviation curve function obtained by directly connecting the fitting points, the cubic spline interpolation algorithm also has the advantage of simple function. At the same time, it is also closer to the fluctuation center of the deviation waveform, that is, the deviation curve function obtained by the cubic spline interpolation algorithm, as the calibration curve function of the encoder, has a higher calibration accuracy.

Of course, other fitting algorithms can also be used in this application to fit the fitting points, as long as the complexity of the deviation curve function can be reduced as much as possible, and the calibration accuracy of the deviation curve function to the encoder can be improved as much as possible.

In this application, based on the analysis and processing of the deviation waveform measured between the encoder and the standard encoder in advance, a deviation curve function that can characterize the deviation change trend between the measured value of the encoder and the measured value of the standard encoder is obtained; and this A deviation curve function is a curve function obtained by first performing linear regression processing on the deviation waveform and then fitting the fitting points on the linear regression function. The linear regression algorithm is used to perform linear regression on each waveform section of the deviation waveform. Operation, the obtained linear regression function largely excludes the collection of data, and based on the point on the linear regression function as the fitting point, the deviation curve function is obtained by fitting, so that the obtained deviation curve function is closer to the deviation The fluctuation center of the waveform also avoids the problem of the accuracy of the fitting function caused by the abnormal fluctuation deviation of the discrete points on the deviation waveform, which is beneficial to improve the calibration accuracy when the deviation curve function is used to calibrate the encoder.

The measurement and calibration device for the encoder provided by the embodiment of the present invention will be introduced below. The measurement and calibration device for the encoder described below and the measurement and calibration method for the encoder described above can be referred to each other.

FIG. 4 is a structural block diagram of an encoder measurement and calibration device provided by an embodiment of the present invention. Referring to FIG. 4, the encoder measurement and calibration device may include:

The obtaining function module 100 is used to obtain the deviation curve function of the encoder relative to the standard encoder in advance; wherein the deviation curve function is the measurement deviation value of the encoder and the standard encoder within a measurement period. After performing linear regression processing to obtain a plurality of fitting points on the linear regression curve, the deviation waveform of the change of the position point is curve function obtained by performing curve fitting on each of the fitting points;

The data collection module 200 is used to collect test data at various test locations;

The data calibration module 300 is configured to calibrate each of the test data according to the deviation curve function, and obtain the calibrated test data corresponding to each test position point.

Optionally, in another specific embodiment of the present application, it may further include:

The function calculation module is used to divide the deviation waveform into a number of waveform sections according to the position points; perform linear regression operations on the deviation waveforms in each of the waveform sections to obtain the linear regression function corresponding to each of the waveform sections ; Select a fitting point on the linear regression function in each waveform section.

The function calculation module is used to perform a first-order linear regression operation on the deviation waveforms in each of the waveform sections to obtain a first-order linear regression function.

The function calculation module is configured to use a cubic spline interpolation algorithm to perform curve fitting on each of the fitting points, and to obtain the deviation curve function by fitting.

The function calculation module is specifically configured to divide the deviation waveform into a plurality of the waveform sections whose width difference between any two of the waveform sections is not greater than a preset difference; and within the waveform section The fitting point is selected in the middle section, and the middle section is the middle one-third section of the waveform section.

The encoder measurement and calibration device of this embodiment is used to implement the aforementioned encoder measurement and calibration method. Therefore, the specific implementation of the encoder measurement and calibration device can be seen in the previous embodiment of the encoder measurement and calibration method, for example , The data acquisition module 100, the section division module 200, the regression calculation module 300, and the curve fitting module 400 are respectively used to implement steps S11, S12, S13 and S14 in the measurement calibration method of the encoder, so the specific implementation Reference can be made to the descriptions of the respective parts of the embodiments, which will not be repeated here.

This application also provides an embodiment of an encoder measurement and calibration equipment, including:

Memory, used to store computer programs;

The processor is used to implement the steps of the measurement calibration method of the encoder as described below when the computer program is executed:

Obtain in advance the deviation curve function of the encoder relative to the standard encoder; wherein, the deviation curve function is a deviation waveform of the measured deviation value of the encoder and the standard encoder that changes with position points within a measurement period, After performing linear regression processing to obtain multiple fitting points on the linear regression curve, perform curve fitting on each of the fitting points to obtain the curve function;

Collect test data at each test location;

The processor in this embodiment executes the computer program stored in the memory, and uses the deviation curve function obtained in advance to calibrate the measured measurement data, which is simple, convenient and easy to implement, and the deviation curve function is used to calibrate each waveform area of the deviation waveform. After the linear regression operation of the segment, the fitting point is obtained based on the linear regression function, and then the deviation curve function obtained by curve fitting is performed according to the fitting point, so that the deviation curve function can be used to a certain extent when the deviation curve function is used for the calibration of the encoder. Improve the calibration accuracy of the encoder, and then improve the measurement accuracy of the encoder.

Specifically, the computer-readable storage medium may be random access memory (RAM), internal memory, read-only memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, register, hard disk, removable disk, CD-ROM , Or any other form of storage medium known in the technical field.

The various embodiments in this specification are described in a progressive manner. Each embodiment focuses on the differences from other embodiments, and the same or similar parts between the various embodiments can be referred to each other. For the device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant parts can be referred to the description of the method part.

Professionals may further realize that the units and algorithm steps of the examples described in the embodiments disclosed in this article can be implemented by electronic hardware, computer software, or a combination of both, in order to clearly illustrate the possibilities of hardware and software. Interchangeability, in the above description, the composition and steps of each example have been generally described in accordance with the function. Whether these functions are executed by hardware or software depends on the specific application and design constraint conditions of the technical solution. Professionals and technicians can use different methods for each specific application to implement the described functions, but such implementation should not be considered as going beyond the scope of the present invention.

Claims

A method for measuring and calibrating an encoder, which is characterized in that it comprises:

Obtain in advance the deviation curve function of the encoder relative to the standard encoder; wherein, the deviation curve function is a deviation waveform of the measured deviation value of the encoder and the standard encoder that changes with position points within a measurement period, After performing linear regression processing to obtain multiple fitting points on the linear regression curve, perform curve fitting on each of the fitting points to obtain the curve function;

Collect test data at each test location;

Calibrate each of the test data according to the deviation curve function, and obtain the calibrated test data corresponding to each of the test position points.
The encoder measurement calibration method according to claim 1, characterized in that, linear regression processing is performed on the deviation waveform of the measurement deviation value of the encoder and the standard encoder that varies with the position point within a measurement period Obtain multiple fitting points on the linear regression curve, including:

Dividing the deviation waveform into a number of waveform sections according to position points;

Perform a linear regression operation on the deviation waveform in each of the waveform sections to obtain a linear regression function corresponding to each of the waveform sections;

A fitting point is selected on the linear regression function in each waveform section.
3. The method for measuring and calibrating an encoder according to claim 2, wherein the performing linear regression operation on the deviation waveforms in each of the waveform segments to obtain the linear regression function corresponding to each of the waveform segments comprises:

Perform a first-order linear regression operation on the deviation waveforms in each of the waveform sections to obtain a first-order linear regression function.
The method for measuring and calibrating an encoder according to claim 2, wherein the process of performing curve fitting on each of the fitting points to obtain the deviation curve function comprises:

A cubic spline interpolation algorithm is used to perform curve fitting on each of the fitting points, and the fitting obtains the deviation curve function passing through each of the fitting points.
The method for measuring and calibrating an encoder according to any one of claims 2 to 4, wherein the dividing the deviation waveform into a plurality of waveform sections according to position points comprises:

Dividing the deviation waveform into a plurality of the waveform sections whose width difference between any two of the waveform sections is not greater than a preset difference;

The selecting a fitting point on the linear regression function in each waveform segment includes:

The fitting point is selected in a middle section in the waveform section, and the middle section is a middle-third section of the waveform section.
A measurement and calibration device for an encoder, which is characterized in that it comprises:

The obtaining function module is used to obtain the deviation curve function of the encoder relative to the standard encoder in advance; wherein, the deviation curve function is the measurement deviation value of the encoder and the standard encoder in a measurement period with position After performing linear regression processing to obtain multiple fitting points on the linear regression curve for the deviation waveform of the point change, perform curve fitting on each of the fitting points to obtain the curve function;

Data collection module, used to collect test data at each test location;

The data calibration module is used to calibrate each of the test data according to the deviation curve function, and obtain the calibrated test data corresponding to each test position point.
The encoder measurement and calibration device according to claim 6, characterized in that it comprises a function calculation module, which is used to divide the deviation waveform into several waveform sections according to the position points; A linear regression operation is performed on the deviation waveform to obtain a linear regression function corresponding to each of the waveform sections; a fitting point is selected on the linear regression function in each of the waveform sections.
The encoder measurement calibration device according to claim 6, wherein the function calculation module is specifically configured to perform a first-order linear regression operation on the deviation waveform in each of the waveform sections to obtain a first-order linear regression function .
A measurement and calibration equipment for an encoder, which is characterized in that it comprises:

Memory, used to store computer programs;

The processor is configured to implement the steps of the encoder measurement calibration method according to any one of claims 1 to 5 when the computer program is executed.
A computer-readable storage medium, wherein a computer program is stored on the computer-readable storage medium, and when the computer program is executed by a processor, the measurement of the encoder according to any one of claims 1 to 5 is realized. Steps of the calibration method.