WO2021070412A1 - Measurement socket - Google Patents

Measurement socket Download PDF

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Publication number
WO2021070412A1
WO2021070412A1 PCT/JP2020/019984 JP2020019984W WO2021070412A1 WO 2021070412 A1 WO2021070412 A1 WO 2021070412A1 JP 2020019984 W JP2020019984 W JP 2020019984W WO 2021070412 A1 WO2021070412 A1 WO 2021070412A1
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WO
WIPO (PCT)
Prior art keywords
cover
contact
connector
electronic module
contact guide
Prior art date
Application number
PCT/JP2020/019984
Other languages
French (fr)
Japanese (ja)
Inventor
周治 三森
Original Assignee
株式会社Sdk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社Sdk filed Critical 株式会社Sdk
Priority to JP2020562221A priority Critical patent/JP6877805B1/en
Publication of WO2021070412A1 publication Critical patent/WO2021070412A1/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R33/00Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
    • H01R33/74Devices having four or more poles, e.g. holders for compact fluorescent lamps
    • H01R33/76Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket

Definitions

  • the present invention relates to a measurement socket used when performing continuity inspection, characteristic measurement, etc. of an electronic module.
  • Patent Document 1 discloses a socket for a semiconductor device that presses the surface of an IC package for positioning.
  • Patent Document 2 points are formed on the side surfaces orthogonal to the positioning portion on the opposite side of the positioning portion of the electrical component housed in the housing portion, which is operated by the pressing operation of pressing the electrical component of the socket cover.
  • a socket for electrical components provided with one-sided means of contacting and offsetting the electrical component with respect to the positioning unit.
  • Patent Document 3 before the electric component is pressed by the pressing member on the socket body, the side surface of the electric component is brought into contact with the fixed guide portion provided on a part of the peripheral edge portion of the mounting portion.
  • a socket for an electrical component is disclosed that includes means for pushing the opposite side surface toward the fixed guide portion to bring the electrical component into contact with the fixed guide portion to position the electrical component at a predetermined mounting position.
  • Patent Document 4 a package having a rectangular flat shape is housed in a package accommodating portion on the socket body, and the surface of the package is directed toward the socket body by a pressing member of the socket cover attached to the socket body so as to be openable and closable. By pressing, the electrode formed on the back surface of the package is brought into contact with the contact pin installed on the socket body, and the socket for electrical components that electrically connects the electrode of the package and the external electrical test circuit with the contact pin is formed. Will be disclosed.
  • Patent Document 5 describes a measurement socket for an electronic module, which has a base having a recess on which the electronic module is placed, a first cover rotatably attached to the base, and the base.
  • the first cover is provided with a second cover rotatably attached and a contact pin provided on the first cover for obtaining continuity with the electronic module, and the first cover is mounted on the base of the electronic module.
  • a measuring socket is disclosed in which the second cover is configured to cover the electronic module prior to the first cover upon closing.
  • the electronic module when the electronic module is placed on the base of the measurement socket and the cover is closed, if the electronic module is misaligned on the base, the connector on the electronic module side and the contact on the cover side when the cover is closed. Poor contact with the pin is likely to occur.
  • the electronic components and connectors may be lifted and arranged due to elastic force, bending, twisting, or the like of the flexible substrate. Closing the cover while the electronic module is floating may cause poor continuity.
  • the pitch between the terminals of the connector has become narrower, and the flexible substrate may be provided with a bent portion, so that the connector on the electronic module side and the contact pin on the cover side are accurately aligned in the measurement socket. Is becoming more and more difficult.
  • An object of the present invention is to provide a measurement socket capable of accurately contacting a connector of an electronic module and a contact pin to obtain reliable conduction.
  • the present invention is a measurement socket for measuring an electronic module having a flexible substrate, an electronic component and a connector connected to the flexible substrate, and a recess for mounting the electronic module.
  • the contact pin is provided on the cover, the contact pin is provided on the cover, and the contact pin is contacted with the electronic module by covering the base on which the electronic module is mounted.
  • the contact guide With a contact guide that guides to a position, the contact guide has a fitting recess that can accommodate the connector, the contact guide is suspended from the cover, and the cover is placed on the base to cover the fitting recess of the contact guide. The inner surface comes into contact with the connector, and the contact guide is brought into the position of the connector while being fitted to the connector.
  • the contact guide since the contact guide is suspended on the cover, the contact guide can be called in according to the contact position of the electronic module by covering the base on which the electronic module is placed with the cover. It can be moved to obtain accurate conduction between the contact pin and the electronic module. Further, when the electronic module is mounted on the base, even if the position of the connector varies depending on the flexible substrate, the inner surface of the fitting recess of the contact guide comes into contact with the connector by covering the base with the cover, and the contact guide. Is moved so as to be called into the position of the connector while being fitted with the connector, so that it is possible to absorb the variation in the position of the connector and obtain reliable continuity between the contact pin and the connector.
  • the contact guide may be suspended so as to be movable in at least two directions orthogonal to each other along the reference plane of the cover.
  • the contact guide may be suspended so as to be movable in the normal direction of the reference surface of the cover.
  • the contact guide can be called into the contact position of the electronic module while moving in the normal direction of the reference plane.
  • the contact guide may be rotatably suspended from the cover.
  • the contact guide can be called into the contact position of the electronic module while moving in the rotational direction.
  • the measuring socket of the present invention may further include an urging means provided between the contact guide and the cover.
  • an urging means provided between the contact guide and the cover.
  • the contact guide has a substantially rectangular convex portion, and an urging means may be provided between the four side walls of the convex portion and the cover.
  • an urging means may be provided between the four side walls of the convex portion and the cover.
  • the opening portion on the inner surface of the fitting recess is provided with a tapered surface that extends to the opening side.
  • the contact guide may be arranged in the hole provided in the cover and suspended so as to be movable within the gap between the contact guide and the wall of the hole.
  • the contact guide can be movably suspended within the range of the hole provided in the cover, and the movement of the contact guide can be restricted within the range of the hole.
  • the cover may be provided so as to rotate with respect to the base by a hinge.
  • the contact between the contact pin on the cover side and the electronic module on the base side becomes slanted. Even in such an oblique contact, the contact pin can be accurately guided to the contact position of the electronic module by the contact guide suspended on the cover.
  • the measurement socket of the present invention may be configured so that the contact guide is called into the position of the electronic module mounted on the base by covering the base with a cover. As a result, the contact pin can be accurately guided to the contact position of the electronic module by the operation of covering the cover with the electronic module mounted on the base.
  • the measurement socket of the present invention includes a plurality of contact guides, and the plurality of contact guides may be independently suspended from the cover. As a result, each of the plurality of contact guides moves and guides independently to the contact position of the corresponding electronic module.
  • the present invention it is possible to provide a measurement socket capable of accurately contacting a connector of an electronic module and a contact pin to obtain reliable conduction.
  • FIG. 1 It is a perspective view which illustrates the state which opened the measurement socket which concerns on this embodiment. It is a perspective view which illustrates the state which the measurement socket which concerns on this embodiment is closed.
  • (A) to (c) are side views for explaining the operation of closing the cover.
  • (A) and (b) are perspective views showing the state of fitting the contact guide into the cover.
  • (A) and (b) are enlarged perspective views of the contact guide.
  • (A) and (b) are perspective views explaining the urging means of the contact guide.
  • (A) and (b) are diagrams illustrating the movement of the contact guide.
  • FIG. 1 A) and (b) are schematic views illustrating the operation at the time of fitting the contact guide and the connector.
  • A) and (b) are diagrams illustrating the movement of the contact guide.
  • (A) and (b) are schematic views illustrating the operation at the time of fitting the contact guide and the connector. It is a front view which illustrates the contact device.
  • FIG. 1 is a perspective view illustrating a state in which the measurement socket according to the present embodiment is opened.
  • FIG. 2 is a perspective view illustrating a state in which the measurement socket according to the present embodiment is closed.
  • the measurement socket 1 according to the present embodiment is a socket used when performing electrical measurement of the electronic module 100.
  • the measurement socket 1 mounts the electronic module 100 to be measured, and obtains electrical contact with the connector 103 of the electronic module 100.
  • a flexible substrate 102 to which an electronic component 101 and a connector 103 are connected is applied as the electronic module 100 to be measured.
  • a wiring pattern is formed on the flexible substrate 102, and electricity is supplied between the electronic component 101 and the connector 103. Therefore, in the measurement socket 1 of the present embodiment, electrical conduction to the electronic component 101 can be obtained by bringing the contact pin 41, which will be described later, into contact with the terminal of the connector 103.
  • the measurement socket 1 includes a base 10, a cover 20, a contact pin 41, and a contact guide 40.
  • the base 10 has a recess 11 on which the electronic module 100 is mounted.
  • the recess 11 serves as a guide for deciding the arrangement position of the electronic component 101 and the flexible substrate 102.
  • a tapered portion extending upward is provided on the opening side of the recess 11, and a straight portion is provided below the tapered portion.
  • the electronic module 100 placed in the recess 11 is called in by the tapered portion and is housed in the straight portion.
  • the cover 20 is rotatably attached to the base 10.
  • the cover 20 is attached via a hinge 50 provided at one end of the base 10.
  • the cover 20 is provided so as to be openable and closable around the axis of the hinge 50.
  • a latch 60 is provided on, for example, the base 10 of the measurement socket 1. By hooking the latch 60 on the claw 25 of the cover 20 with the cover 20 closed, the closed state of the cover 20 is maintained.
  • the cover 20 is urged in the opening direction by a spring 56 attached to the shaft of the hinge 50. Therefore, by removing the latch 60, the cover 20 is opened by the urging force of the spring 56.
  • the measurement socket 1 may be used for optical measurement.
  • a hole 201 is provided in the cover 20, and when the electronic module 100 is placed on the base 10 and the cover 20 is closed, the optical axis of the electronic component 101 corresponds to the hole 201, and the optical axis of the electronic component 101 corresponds to the hole 201.
  • Optical measurements may be made. Therefore, in the measurement socket 1 whose measurement target is the optical module, not only the electrical contact when the electronic module 100 is placed, but also the alignment accuracy of the optical axis of the electronic component 101 with respect to the measurement socket 1 is required. ..
  • the holding portion 30 is rotatably attached to the base 10.
  • the holding portion 30 is attached via a hinge 50 to which the cover 20 is attached.
  • the pressing portion 30 is provided so as to be able to open and close around the axis of the hinge 50. That is, the cover 20 and the holding portion 30 are attached to the base 10 so as to be openable and closable via the same hinge 50.
  • the holding portion 30 Since the holding portion 30 is arranged closer to the base 10 than the cover 20, when the cover 20 is closed, the holding portion 30 closes to the base 10 side before the cover 20. When the cover 20 is closed and fixed by the latch 60, the holding portion 30 is sandwiched between the cover 20 and the base 10.
  • a spring 65 may be provided between the cover 20 and the holding portion 30. Since the cover 20 and the pressing portion 30 are connected by the spring 65, the pressing portion 30 also rotates in conjunction with the rotating operation of the cover 20. When the cover 20 is closed with the electronic module 100 placed on the base 10, the pressing portion 30 is put on the electronic module 100 before the cover 20. As a result, when the electronic module 100 is placed in the recess 11 of the base 10, even if the electronic module 100 is lifted or misaligned, it is regulated by the pressing portion 30.
  • the contact pin 41 is a contact for obtaining continuity with the electronic module 100. Specifically, the contact pin 41 comes into contact with the terminal of the connector 103 of the electronic module 100 to obtain continuity with the electronic module 100. Since a plurality of terminals are arranged on the connector 103, a plurality of contact pins 41 are provided according to the number and arrangement of the terminals of the connector 103.
  • the contact guide 40 guides the contact pin 41 to the contact position of the electronic module 100.
  • the contact guide 40 is provided on the cover 20, and by covering the base 10 on which the electronic module 100 is placed with the cover 20, it serves to guide the contact pin 41 to the position of the terminal of the connector 103 of the electronic module 100.
  • the contact guide 40 is suspended (supported in a state of being bridged) on the cover 20. That is, the contact guide 40 is arranged in the hole 20h provided in the cover 20, and is suspended so as to be movable within the gap between the contact guide 40 and the hole 20h.
  • the measurement socket 1 may be provided with a plurality of contact guides 40.
  • the electronic module 100 is provided with the two connectors 103, the two contact guides 40A and 40B are provided correspondingly.
  • 3A to 3C are side views illustrating an operation of closing the cover.
  • the electronic module 100 is placed in the recess 11 of the base 10 with the cover 20 and the holding portion 30 open.
  • the electronic module 100 may be placed in a predetermined position in the recess 11, or may be placed in a slightly displaced position inside the recess 11. Further, when the flexible board 102 is bent or twisted, the position of the connector 103 connected to the flexible board 102 may not be stable.
  • the cover 20 is closed. Since the spring 65 is provided between the cover 20 and the pressing portion 30, the pressing portion 30 is also closed in conjunction with the cover 20. Then, the pressing portion 30 is put on the electronic module 100 on the base 10 before the cover 20.
  • the pressing portion 30 does not come into contact with the electronic module 100 when the pressing portion 30 is closed.
  • the electronic component 101 is floating, the electronic component 101 is pressed from above by the pressing portion 30, and is corrected to the normal position of the recess 11.
  • the cover 20 is further closed and fixed by the latch 60.
  • the holding portion 30 is sandwiched between the cover 20 and the base 10.
  • the contact guide 40 of the cover 20 is fitted with the connector 103 of the electronic module 100.
  • the contact guide 40 is suspended on the cover 20, the contact guide 40 is movably provided with respect to the cover 20. Therefore, even if the position of the connector 103 is misaligned, when the contact guide 40 is fitted to the connector 103 by covering the cover 20, the contact guide 40 is moved so as to be called in according to the position of the connector 103. Become (self-alignment).
  • the contact guide 40 is fitted to the connector 103, the contact pin 41 is exposed from the contact guide 40 and comes into contact with the terminal of the connector 103. As a result, accurate continuity between the contact pin 41 and the terminal of the connector 103 can be obtained.
  • FIG. 4 is a perspective view showing the upper part of the contact guide.
  • FIG. 4 shows a state in which the contact guide cover 210 shown in FIG. 2 is removed.
  • FIG. 5 is an enlarged perspective view showing the upper part of the contact guide.
  • FIG. 5 shows a state in which the top cover 200 shown in FIG. 4 is removed.
  • 6 (a) and 6 (b) are perspective views showing a state in which the contact guide is fitted into the cover.
  • FIG. 6A shows a state in which the contact guide 40 is fitted into the cover 20
  • FIG. 6B shows a state in which the contact guide 40A (40) is removed from the cover 20.
  • 7 (a) and 7 (b) are enlarged perspective views of the contact guide.
  • 8 (a) and 8 (b) are perspective views illustrating a contact guide urging means.
  • the contact guide 40 includes a base 410, a substantially rectangular convex portion 420 protruding from the base 410, and a guide portion 430 protruding to the opposite side of the convex portion 420 of the base 410.
  • the side of the base 410 where the convex portion 420 is provided is referred to as the upper side (upper side)
  • the side where the guide portion 430 is provided is referred to as the lower side (lower side).
  • the base 410 is provided on a substantially rectangular parallelepiped, and a cable 440 that conducts with the contact pin 41 is attached.
  • the cable 440 is composed of a flexible substrate, and inputs / outputs a signal from the outside of the measurement socket 1 to the terminal of the connector 103 in contact with the contact pin 41.
  • the base 410 is fitted into the recess 202 provided in the cover 20, and the recess 202 is provided with a hole 20h.
  • the guide portion 430 enters the hole 20h. ..
  • a spring holder 425 is arranged adjacent to each of the four side walls of the convex portion 420 provided in a substantially rectangular shape.
  • the spring holder 425 is provided with a hole 425h for accommodating the coil spring 450, which is an example of the urging means.
  • one spring holder 425 is provided with two holes 425h in parallel, and each hole 425h accommodates a coil spring 450.
  • a coil spring 450 is arranged in the convex portion 420 so as to face each of the two orthogonal directions.
  • the coil spring 450 housed in the hole 425h of the spring holder 425 is incorporated between the side wall of the convex portion 420 and the top cover 200 facing the side wall. That is, the top cover 200 is provided with a substantially cross-shaped hole into which the convex portion 420 and the four spring holders 425 can be fitted, and by mounting the top cover 200 on the cover 20, this is achieved. The convex portion 420 and the four spring holders 425 are fitted into the holes.
  • the convex portion 420 is pressed by the coil spring 450 from four directions and is supported by the balance of the urging force of the coil spring 450. Therefore, the contact guide 40 is suspended from the cover 20 by the convex portion 420 supported by the coil spring 450. Therefore, when a force is applied to the contact guide 40, the coil spring 450 expands and contracts to move the position of the convex portion 420, and the position of the contact guide 40 also moves accordingly.
  • the guide portion 430 protruding downward from the base 410 is provided in a frame shape, and the contact pin 41 is arranged inside the frame of the guide portion 430.
  • the connector 103 of the electronic module 100 is fitted into the frame of the guide portion 430.
  • the contact guide 40 is suspended from the cover 20 by the convex portion 420 supported by the coil spring 450, when the guide portion 430 is fitted into the connector 103, it receives an external force from the connector 103.
  • the position of the contact guide 40 moves with the expansion and contraction of the coil spring 450, and the guide portion 430 is aligned so as to be called into the position of the connector 103.
  • FIGS. 9 and 10 are diagrams illustrating the movement of the contact guide.
  • FIGS. 9 and 10 FIG. 9A is a perspective view and FIG. 10B is a sectional view.
  • 9 (a) and 9 (b) show a state in which the contact guide 40 is located at one end of a predetermined movement range
  • FIGS. 10 (a) and 10 (b) show the contact guide 40 in a predetermined movement. The state located at the other end of the range is shown.
  • the contact guide 40 is suspended on the cover 20 by a convex portion 420 supported by the coil spring 450, and can move in at least two directions orthogonal to each other along the reference plane RS of the cover 20.
  • the reference surface RS is a contact surface (lower surface of the top cover 200) with the base 410 in the top cover 200.
  • the two directions orthogonal to each other along the reference plane RS are referred to as the X direction and the Y direction.
  • the normal direction of the reference plane RS is referred to as the Z direction.
  • FIGS. 9 (a) and 9 (b) show a state in which the contact guide 40 has moved to one end in the X direction.
  • the convex portion 420 is pushed in the direction of the arrow A
  • the spring holder 425A on one end side of the two spring holders 425A and 425B facing each other in the X direction is pushed, and the coil spring 450A contracts.
  • the coil spring 450B on the other end side extends and the spring holder 425B pushes the convex portion 420 toward one end side.
  • FIG. 10 shows an operation when the contact guide 40 moves in the direction of the arrow A as in FIG. 9.
  • the guide portion 430 of the contact guide 40 is provided with a fitting recess 431 capable of accommodating the connector 103.
  • the inner surface of the fitting recess 431 is provided with a fitting surface 432 that comes into contact with the outer surface of the connector 103 when the connector 103 is accommodated.
  • the opening portion on the inner surface of the fitting recess 431 is provided with a tapered surface 433 that expands toward the opening side.
  • the contact guide 40 suspended from the cover 20 has the urging force of the coil springs 450A and 450B. It is placed in a neutral position by balance.
  • the position of the connector 103 with respect to the base 10 may be displaced due to bending or bending of the flexible substrate 102.
  • the guide portion 430 By covering the base 10 with the cover 20 in this state, the guide portion 430 approaches the connector 103, and when the connector 103 begins to fit into the fitting recess 431, the outer surface of the connector 103 becomes the fitting surface 432 of the fitting recess 431. When they come into contact with each other, the guide portion 430 moves so as to be attracted to the position of the connector 103 while being fitted to the connector 103.
  • the fitting recess 431 is provided with the tapered surface 433
  • the position of the fitting recess 431 is called into the position of the connector 103 while the outer surface of the connector 103 is in contact with the tapered surface 433, and the fitting recess 431 is easily fitted.
  • the contact guide 40 suspended from the cover 20 moves in the direction of arrow A (the direction in which the connector 103 is displaced), and the fitting recess 431 is formed in the connector 103. It moves so as to follow the position, and the connector 103 and the fitting recess 431 are fitted.
  • FIGS. 9 (a) and 11 (b) show a state in which the contact guide 40 has moved to the other end in the X direction, contrary to FIGS. 9 (a) and 9 (b).
  • the convex portion 420 is pushed in the direction of the arrow B
  • the spring holder 425B on the other end side of the two spring holders 425A and 425B facing each other in the X direction is pushed, and the coil spring 450B contracts.
  • the coil spring 450A on one end side extends and the spring holder 425A pushes the convex portion 420 toward the other end side.
  • FIG. 12 shows an operation when the contact guide 40 moves in the direction of the arrow B as in FIG.
  • the contact guide 40 suspended from the cover 20 has the urging force of the coil springs 450A and 450B. It is placed in a neutral position by balance.
  • the position of the connector 103 with respect to the base 10 may be displaced due to bending or bending of the flexible substrate 102.
  • the guide portion 430 By covering the base 10 with the cover 20 in this state, the guide portion 430 approaches the connector 103, and when the connector 103 begins to fit into the fitting recess 431, the outer surface of the connector 103 becomes the fitting surface 432 of the fitting recess 431. When they come into contact with each other, the guide portion 430 moves so as to be attracted to the position of the connector 103 while being fitted to the connector 103.
  • the contact guide 40 suspended from the cover 20 moves in the direction of arrow B (the direction in which the connector 103 is displaced), and the fitting recess 431 is formed in the connector 103. It moves so as to follow the position, and the connector 103 and the fitting recess 431 are fitted.
  • the contact guide 40 is suspended on the cover 20, is arranged in the neutral position by the balance of the urging forces of the coil springs 450A and 450B, and is arranged along the reference plane RS by the external force. It can be moved. As a result, even if the position of the connector 103, which is the object of fitting, is misaligned, the contact guide 40 moves so as to follow the misalignment, and the connector 103 is securely fitted while absorbing the misalignment. You will be able to meet.
  • the electronic module 100 in which the electronic component 101 and the connector 103 are connected to the flexible substrate 102 is the measurement target, and the terminal position of the connector 103 that contacts the contact pin 41 is provided with reference to the position of the connector 103.
  • the contact between each terminal and the contact pin 41 can be made by fitting the fitting recess 431 with reference to the outer surface of the connector 103 to make a contact at an accurate position. It will be realized.
  • the position of the connector 103 changes due to misalignment in the connection of the connector 103 to the flexible substrate 102, or even if the connector 103 is connected to an accurate position on the flexible substrate 102, the elastic force, bending, twisting, etc. of the flexible substrate 102. become.
  • the flexible substrate 102 since the flexible substrate 102 has become relatively hard and may be bent, the relative positional relationship between the electronic component 101 connected to the flexible substrate 102 and the connector 103 tends to be unstable. .. Therefore, if the terminal of the connector 103 and the contact pin 41 are aligned with respect to the electronic component 101, accurate contact is often not possible.
  • the fitting surface 432 of the fitting recess 431 comes into contact with the outer surface of the connector 103, so that the connector 103 is suspended.
  • the contact guide 40 is moved so that the fitting recess 431 of the guide portion 430 can be fitted in accordance with the position of the connector 103 in which the deviation occurs.
  • the contact guide 40 corresponds to the case where the position of the connector 103, which is the object to be fitted with the fitting recess 431 of the guide portion 430, is displaced, and even if the displacement occurs, the contact guide 40 follows the position of the connector 103. Can be moved. Therefore, it is possible to directly absorb the misalignment of the connector 103, which is the object of fitting (connection), and reliably fit the fitting recess 431 of the guide portion 430 and the connector 103. It becomes. By securely fitting the fitting recess 431 with reference to the position of the connector 103, it is possible to accurately bring the contact pins 41 into contact with a plurality of terminals juxtaposed with the connector 103 at a narrow pitch.
  • the contact guide 40 may be suspended so as to be movable in the Z direction.
  • a slight gap is provided between the upper surface of the base 410 and the lower surface of the top cover 200 (reference surface RS). That is, thereby, the contact guide 40 is supported by the coil spring 450 in a slightly floating state in the Z direction.
  • the contact guide 40 can move not only in the XY direction but also in the Z direction.
  • the contact guide 40 when the contact guide 40 is supported in a floating state in the Z direction, the contact guide 40 can also move in the rotation direction (rotation direction centered on each of the three axes in the XYZ direction). As a result, when the contact guide 40 is fitted with the connector 103 of the electronic module 100, the contact guide 40 moves according to the position and orientation of the connector 103, and the contact guide 40 is securely fitted even if the connector 103 is misaligned. In this way, the contact pin 41 and the terminal of the connector 103 can be brought into contact with each other.
  • FIG. 13 is a front view illustrating the contact device.
  • the contact device 500 according to the present embodiment includes a base 10, a cover 20, a holding portion 30, a contact pin 41, and a contact guide 40, similarly to the measurement socket 1 described above.
  • the cover 20 and the pressing portion 30 are configured to move up and down with respect to the base 10.
  • the base 10 is provided with a recess 11 on which the electronic module 100 is placed.
  • the base 10 is provided with columns 15 at four positions, for example.
  • the cover 20 is supported by the support column 15 and is provided so as to be vertically movable along the support column 15.
  • a spring 17 is provided on the support column 15 to urge the cover 20 upward.
  • the cover 20 is put on the base 10 by being pushed by a drive mechanism (not shown) with a force exceeding the urging force of the spring 17.
  • the holding portion 30 is provided between the base 10 and the cover 20.
  • the pressing portion 30 is configured so that when the cover 20 is lowered and put on the base 10, the pressing portion 30 is put on the electronic module 100 before the cover 20.
  • the cover 20 and the holding portion 30 are lowered with the electronic module 100 placed in the recess 11 of the base 10.
  • the connector 103 is fitted into the contact guide 40, and the contact pin 41 and the terminal of the connector 103 come into contact with each other. Since the contact guide 40 is suspended from the cover 20, even if the position of the connector 103 is displaced, the contact guide 40 is called in according to the position of the connector 103 when the contact guide 40 is fitted to the connector 103. Therefore, accurate continuity between the contact pin 41 and the terminal of the connector 103 can be obtained.
  • the measurement socket 1 capable of accurately contacting the connector 103 of the electronic module 100 and the contact pin 41 to obtain reliable conduction.
  • the present invention is not limited to these examples.
  • the electronic module 100 to be measured is an example in which the electronic component 101 and the connector 103 are connected to the flexible substrate 102, but the configuration of the electronic module 100 is not limited to this.
  • those skilled in the art appropriately adding, deleting, or changing the design of each of the above-described embodiments or specific examples thereof, and those in which the features of each embodiment are appropriately combined are also included in the present invention. As long as it has a gist, it is included in the scope of the present invention.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)

Abstract

Provided is a measurement socket that is capable of bringing a connector of an electronic module into precise contact with a contact pin so as to ensure electrical conduction therebetween. The present invention pertains to a measurement socket for measuring an electronic module, said socket comprising: a base having a recess on which the electronic module is to be placed; a cover which is laid over the base; a contact pin for achieving electrical conduction with the electronic module; and a contact guide which is provided to the cover and which, as the cover is laid over the base having the electronic module placed thereon, guides the contact pin to a contact location on the electronic module. Therein, the contact guide has an engagement recess in which a connector can be accommodated, the contact guide is suspended by the cover, and, when the cover is laid over the base, an inner surface of the engagement recess of the contact guide comes into contact with the connector, thereby guiding the contact guide to the position of the connector while engaged with the connector.

Description

測定用ソケットMeasurement socket
 本発明は、電子モジュールの導通検査や特性測定などを行う際に用いられる測定用ソケットに関する。 The present invention relates to a measurement socket used when performing continuity inspection, characteristic measurement, etc. of an electronic module.
 従来、IC等の電子部品の電気的な測定を行う際に用いられる測定用ソケット(以下、単に「ソケット」とも言う。)として、電子部品を一方向に押圧して位置決めするソケットが開示されている。例えば、特許文献1では、ICパッケージの表面を押圧して位置決めを行う半導体装置用ソケットが開示される。 Conventionally, as a measurement socket (hereinafter, also simply referred to as "socket") used when electrically measuring an electronic component such as an IC, a socket that presses and positions the electronic component in one direction is disclosed. There is. For example, Patent Document 1 discloses a socket for a semiconductor device that presses the surface of an IC package for positioning.
 また、特許文献2には、ソケットカバーの電気部品を押圧する押圧動作に伴って操作され、収容部に収容された電気部品の位置決め部と反対側の隅角部にて直交する側面にそれぞれ点接触し、電気部品を位置決め部に対して片寄せする片寄せ手段を備えた電気部品用ソケットが開示される。 Further, in Patent Document 2, points are formed on the side surfaces orthogonal to the positioning portion on the opposite side of the positioning portion of the electrical component housed in the housing portion, which is operated by the pressing operation of pressing the electrical component of the socket cover. Disclosed is a socket for electrical components provided with one-sided means of contacting and offsetting the electrical component with respect to the positioning unit.
 また、特許文献3には、ソケット本体に、電気部品が押圧部材で押圧される前に、載置部の周縁部の一部に設けられた固定ガイド部に当接される電気部品の側面と反対側の側面を固定ガイド部の方向に押し、電気部品を固定ガイド部に当接させて所定の載置位置に位置決めする手段を備えた電気部品用ソケットが開示される。 Further, in Patent Document 3, before the electric component is pressed by the pressing member on the socket body, the side surface of the electric component is brought into contact with the fixed guide portion provided on a part of the peripheral edge portion of the mounting portion. A socket for an electrical component is disclosed that includes means for pushing the opposite side surface toward the fixed guide portion to bring the electrical component into contact with the fixed guide portion to position the electrical component at a predetermined mounting position.
 特許文献4には、ソケット本体上のパッケージ収容部に平面形状が矩形形状のパッケージを収容し、ソケット本体に開閉可能に取り付けられたソケットカバーの押圧部材でパッケージの表面をソケット本体側へ向けて押圧することにより、パッケージの裏面に形成された電極をソケット本体に設置されたコンタクトピンに接触させ、パッケージの電極と外部電気的テスト回路とをコンタクトピンで電気的に接続する電気部品用ソケットが開示される。 In Patent Document 4, a package having a rectangular flat shape is housed in a package accommodating portion on the socket body, and the surface of the package is directed toward the socket body by a pressing member of the socket cover attached to the socket body so as to be openable and closable. By pressing, the electrode formed on the back surface of the package is brought into contact with the contact pin installed on the socket body, and the socket for electrical components that electrically connects the electrode of the package and the external electrical test circuit with the contact pin is formed. Will be disclosed.
 特許文献5には、電子モジュールを測定対象とする測定用ソケットであって、電子モジュールを載置する凹部を有するベースと、ベースに対して回動可能に取り付けられた第1カバーと、ベースに対して回動可能に取り付けられた第2カバーと、第1カバーに設けられ、電子モジュールとの導通を得るためのコンタクトピンと、を備え、電子モジュールをベースに載置した状態で第1カバーを閉じる際に、第1カバーよりも先に第2カバーが電子モジュールの上に被せられるよう構成された測定用ソケットが開示される。 Patent Document 5 describes a measurement socket for an electronic module, which has a base having a recess on which the electronic module is placed, a first cover rotatably attached to the base, and the base. On the other hand, the first cover is provided with a second cover rotatably attached and a contact pin provided on the first cover for obtaining continuity with the electronic module, and the first cover is mounted on the base of the electronic module. A measuring socket is disclosed in which the second cover is configured to cover the electronic module prior to the first cover upon closing.
特開2011-023164号公報Japanese Unexamined Patent Publication No. 2011-023164 特開2005-061948号公報Japanese Unexamined Patent Publication No. 2005-061948 特開2004-296155号公報Japanese Unexamined Patent Publication No. 2004-296155 特開2012-164434号公報Japanese Unexamined Patent Publication No. 2012-164434 特開2018-040678号公報JP-A-2018-040678
 しかしながら、測定用ソケットのベースに電子モジュールを載置してカバーを閉める場合、ベース上で電子モジュールに位置ずれが生じていると、カバーを閉めた際に電子モジュール側のコネクタとカバー側のコンタクトピンとの接触不良が発生しやすくなる。特に、フレキシブル基板に電子部品およびコネクタが接続されている電子モジュールでは、フレキシブル基板の弾性力、曲がり、捩れなどによって電子部品やコネクタが浮き上がって配置されることがある。電子モジュールが浮き上がったままカバーを閉めると、導通不良の原因となる。近年では、コネクタの端子間ピッチが狭くなってきているとともに、フレキシブル基板に屈曲部分が設けられていることもあり、測定用ソケットにおいて電子モジュール側のコネクタとカバー側のコンタクトピンとの正確な位置合わせが益々困難になってきている。 However, when the electronic module is placed on the base of the measurement socket and the cover is closed, if the electronic module is misaligned on the base, the connector on the electronic module side and the contact on the cover side when the cover is closed. Poor contact with the pin is likely to occur. In particular, in an electronic module in which electronic components and connectors are connected to a flexible substrate, the electronic components and connectors may be lifted and arranged due to elastic force, bending, twisting, or the like of the flexible substrate. Closing the cover while the electronic module is floating may cause poor continuity. In recent years, the pitch between the terminals of the connector has become narrower, and the flexible substrate may be provided with a bent portion, so that the connector on the electronic module side and the contact pin on the cover side are accurately aligned in the measurement socket. Is becoming more and more difficult.
 本発明は、電子モジュールのコネクタとコンタクトピンとを正確に接触させて確実な導通を得ることができる測定用ソケットを提供することを目的とする。 An object of the present invention is to provide a measurement socket capable of accurately contacting a connector of an electronic module and a contact pin to obtain reliable conduction.
 上記課題を解決するため、本発明は、フレキシブル基板と、フレキシブル基板に接続された電子部品およびコネクタと、を有する電子モジュールを測定対象とする測定用ソケットであって、電子モジュールを載置する凹部を有するベースと、ベースに被せられるカバーと、電子モジュールとの導通を得るためのコンタクトピンと、カバーに設けられ、電子モジュールが載置されたベースにカバーを被せることでコンタクトピンを電子モジュールの接触位置にガイドするコンタクトガイドと、を備え、コンタクトガイドは、コネクタを収容可能な嵌合凹部を有し、コンタクトガイドは、カバーに懸架され、カバーをベースに被せることでコンタクトガイドの嵌合凹部の内面がコネクタと接触し、コンタクトガイドがコネクタに嵌合しながらコネクタの位置へ呼び込まれることを特徴とする。 In order to solve the above problems, the present invention is a measurement socket for measuring an electronic module having a flexible substrate, an electronic component and a connector connected to the flexible substrate, and a recess for mounting the electronic module. The contact pin is provided on the cover, the contact pin is provided on the cover, and the contact pin is contacted with the electronic module by covering the base on which the electronic module is mounted. With a contact guide that guides to a position, the contact guide has a fitting recess that can accommodate the connector, the contact guide is suspended from the cover, and the cover is placed on the base to cover the fitting recess of the contact guide. The inner surface comes into contact with the connector, and the contact guide is brought into the position of the connector while being fitted to the connector.
 このような構成によれば、コンタクトガイドがカバーに懸架されているため、電子モジュールが載置されたベースにカバーを被せることで、電子モジュールの接触位置に合わせてコンタクトガイドが呼び込まれるように移動して、コンタクトピンと電子モジュールとの正確な導通を得ることができる。また、電子モジュールをベースに載置した際、フレキシブル基板によってコネクタの位置にばらつきが発生していても、カバーをベースに被せることでコンタクトガイドの嵌合凹部の内面がコネクタと接触し、コンタクトガイドがコネクタと嵌合しながらコネクタの位置へ呼び込まれるように動くため、コネクタの位置のばらつきを吸収して、コンタクトピンとコネクタとの確実な導通を得ることができる。 According to such a configuration, since the contact guide is suspended on the cover, the contact guide can be called in according to the contact position of the electronic module by covering the base on which the electronic module is placed with the cover. It can be moved to obtain accurate conduction between the contact pin and the electronic module. Further, when the electronic module is mounted on the base, even if the position of the connector varies depending on the flexible substrate, the inner surface of the fitting recess of the contact guide comes into contact with the connector by covering the base with the cover, and the contact guide. Is moved so as to be called into the position of the connector while being fitted with the connector, so that it is possible to absorb the variation in the position of the connector and obtain reliable continuity between the contact pin and the connector.
 本発明の測定用ソケットにおいて、コンタクトガイドは、カバーの基準面に沿った少なくとも互いに直交する2方向に移動可能に懸架されていてもよい。これにより、電子モジュールが載置されたベースにカバーを被せることで、コンタクトガイドが基準面に沿って移動しながら電子モジュールの接触位置に呼び込まれることが可能になる。 In the measuring socket of the present invention, the contact guide may be suspended so as to be movable in at least two directions orthogonal to each other along the reference plane of the cover. As a result, by covering the base on which the electronic module is placed with a cover, the contact guide can be called into the contact position of the electronic module while moving along the reference plane.
 本発明の測定用ソケットにおいて、コンタクトガイドは、カバーの基準面の法線方向に移動可能に懸架されていてもよい。これにより、電子モジュールが載置されたベースにカバーを被せることで、コンタクトガイドが基準面の法線方向に移動しながら電子モジュールの接触位置に呼び込まれることが可能になる。 In the measurement socket of the present invention, the contact guide may be suspended so as to be movable in the normal direction of the reference surface of the cover. As a result, by covering the base on which the electronic module is placed with a cover, the contact guide can be called into the contact position of the electronic module while moving in the normal direction of the reference plane.
 本発明の測定用ソケットにおいて、コンタクトガイドは、カバーに対して回転可能に懸架されていてもよい。これにより、電子モジュールが載置されたベースにカバーを被せることで、コンタクトガイドが回転方向に移動しながら電子モジュールの接触位置に呼び込まれることが可能になる。 In the measuring socket of the present invention, the contact guide may be rotatably suspended from the cover. As a result, by covering the base on which the electronic module is placed with a cover, the contact guide can be called into the contact position of the electronic module while moving in the rotational direction.
 本発明の測定用ソケットにおいて、コンタクトガイドとカバーとの間に設けられた付勢手段をさらに備えていてもよい。これにより、コンタクトガイドが付勢手段による付勢力によってカバーに懸架され、付勢力を利用したコンタクトガイドの移動および呼び込みが行われる。 The measuring socket of the present invention may further include an urging means provided between the contact guide and the cover. As a result, the contact guide is suspended on the cover by the urging force of the urging means, and the contact guide is moved and called by using the urging force.
 本発明の測定用ソケットにおいて、コンタクトガイドは略矩形の凸状部分を有し、凸状部分の4つの側壁とカバーとの間に付勢手段が設けられていてもよい。これにより、コンタクトガイドが4つの付勢手段の付勢力のバランスによって懸架され、コンタクトガイドの移動の自由度を高めることができる。 In the measuring socket of the present invention, the contact guide has a substantially rectangular convex portion, and an urging means may be provided between the four side walls of the convex portion and the cover. As a result, the contact guide is suspended by the balance of the urging forces of the four urging means, and the degree of freedom of movement of the contact guide can be increased.
 本発明の測定用ソケットにおいて、嵌合凹部の内面における開口部分には開口側に拡がるテーパ面が設けられているとよい。これにより、コネクタの外面がテーパ面に接触しながら嵌合凹部の位置がコネクタの位置へ呼び込まれるようになる。 In the measuring socket of the present invention, it is preferable that the opening portion on the inner surface of the fitting recess is provided with a tapered surface that extends to the opening side. As a result, the position of the fitting recess is brought into the position of the connector while the outer surface of the connector is in contact with the tapered surface.
 本発明の測定用ソケットにおいて、コンタクトガイドは、カバーに設けられた孔内に配置され、コンタクトガイドと孔の壁との隙間の範囲内で移動可能に懸架されていてもよい。これにより、コンタクトガイドは、カバーに設けられた孔の範囲内で移動可能に懸架されるとともに、孔の範囲内でコンタクトガイドの移動の規制を行うことができる。 In the measuring socket of the present invention, the contact guide may be arranged in the hole provided in the cover and suspended so as to be movable within the gap between the contact guide and the wall of the hole. As a result, the contact guide can be movably suspended within the range of the hole provided in the cover, and the movement of the contact guide can be restricted within the range of the hole.
 本発明の測定用ソケットにおいて、カバーは、ヒンジによってベースに対して回動するよう設けられていてもよい。カバーがベースに対して回動する構成では、カバー側のコンタクトピンとベース側の電子モジュールとの接触が斜めになる。このような斜めの接触であっても、カバーに懸架されたコンタクトガイドによってコンタクトピンを電子モジュールの接触位置に正確にガイドすることができる。 In the measuring socket of the present invention, the cover may be provided so as to rotate with respect to the base by a hinge. In the configuration in which the cover rotates with respect to the base, the contact between the contact pin on the cover side and the electronic module on the base side becomes slanted. Even in such an oblique contact, the contact pin can be accurately guided to the contact position of the electronic module by the contact guide suspended on the cover.
 本発明の測定用ソケットにおいて、カバーをベースに被せることでベースに載置された電子モジュールの位置へコンタクトガイドが呼び込まれるよう構成されていてもよい。これにより、電子モジュールをベースに載置した状態でカバーを被せる動作により、コンタクトピンを電子モジュールの接触位置に正確にガイドできるようになる。 The measurement socket of the present invention may be configured so that the contact guide is called into the position of the electronic module mounted on the base by covering the base with a cover. As a result, the contact pin can be accurately guided to the contact position of the electronic module by the operation of covering the cover with the electronic module mounted on the base.
 本発明の測定用ソケットにおいて、複数のコンタクトガイドを備え、複数のコンタクトガイドは、カバーに対してそれぞれ独立して懸架されていてもよい。これにより、複数のコンタクトガイドのそれぞれが、対応する電子モジュールの接触位置にそれぞれ独立して動き、ガイドされる。 The measurement socket of the present invention includes a plurality of contact guides, and the plurality of contact guides may be independently suspended from the cover. As a result, each of the plurality of contact guides moves and guides independently to the contact position of the corresponding electronic module.
 本発明によれば、電子モジュールのコネクタとコンタクトピンとを正確に接触させて確実な導通を得ることができる測定用ソケットを提供することが可能になる。 According to the present invention, it is possible to provide a measurement socket capable of accurately contacting a connector of an electronic module and a contact pin to obtain reliable conduction.
本実施形態に係る測定用ソケットを開いた状態を例示する斜視図である。It is a perspective view which illustrates the state which opened the measurement socket which concerns on this embodiment. 本実施形態に係る測定用ソケットを閉じた状態を例示する斜視図である。It is a perspective view which illustrates the state which the measurement socket which concerns on this embodiment is closed. (a)~(c)は、カバーを閉じる動作を説明する側面図である。(A) to (c) are side views for explaining the operation of closing the cover. コンタクトガイドの上部を示す斜視図である。It is a perspective view which shows the upper part of a contact guide. コンタクトガイドの上部を示す拡大斜視図である。It is an enlarged perspective view which shows the upper part of a contact guide. (a)および(b)は、コンタクトガイドのカバーへの嵌め込みの状態を示す斜視図である。(A) and (b) are perspective views showing the state of fitting the contact guide into the cover. (a)および(b)は、コンタクトガイドの拡大斜視図である。(A) and (b) are enlarged perspective views of the contact guide. (a)および(b)は、コンタクトガイドの付勢手段を説明する斜視図である。(A) and (b) are perspective views explaining the urging means of the contact guide. (a)および(b)は、コンタクトガイドの動きを例示する図である。(A) and (b) are diagrams illustrating the movement of the contact guide. (a)および(b)は、コンタクトガイドとコネクタとの嵌合時の動作を例示する模式図である。(A) and (b) are schematic views illustrating the operation at the time of fitting the contact guide and the connector. (a)および(b)は、コンタクトガイドの動きを例示する図である。(A) and (b) are diagrams illustrating the movement of the contact guide. (a)および(b)は、コンタクトガイドとコネクタとの嵌合時の動作を例示する模式図である。(A) and (b) are schematic views illustrating the operation at the time of fitting the contact guide and the connector. コンタクト装置を例示する正面図である。It is a front view which illustrates the contact device.
 以下、本発明の実施形態を図面に基づいて説明する。なお、以下の説明では、同一の部材には同一の符号を付し、一度説明した部材については適宜その説明を省略する。 Hereinafter, embodiments of the present invention will be described with reference to the drawings. In the following description, the same members are designated by the same reference numerals, and the description of the members once described will be omitted as appropriate.
(測定用ソケットの構成)
 図1は、本実施形態に係る測定用ソケットを開いた状態を例示する斜視図である。
 図2は、本実施形態に係る測定用ソケットを閉じた状態を例示する斜視図である。
 本実施形態に係る測定用ソケット1は、電子モジュール100の電気的な測定を行う際に用いられるソケットである。測定用ソケット1は、測定対象となる電子モジュール100を搭載して、電子モジュール100のコネクタ103との電気的な接触を得る。本実施形態では、測定対象となる電子モジュール100として、フレキシブル基板102に電子部品101およびコネクタ103が接続されたものが適用される。
(Measurement socket configuration)
FIG. 1 is a perspective view illustrating a state in which the measurement socket according to the present embodiment is opened.
FIG. 2 is a perspective view illustrating a state in which the measurement socket according to the present embodiment is closed.
The measurement socket 1 according to the present embodiment is a socket used when performing electrical measurement of the electronic module 100. The measurement socket 1 mounts the electronic module 100 to be measured, and obtains electrical contact with the connector 103 of the electronic module 100. In the present embodiment, as the electronic module 100 to be measured, a flexible substrate 102 to which an electronic component 101 and a connector 103 are connected is applied.
 フレキシブル基板102には配線パターンが形成され、電子部品101とコネクタ103との間の通電がなされる。したがって、本実施形態の測定用ソケット1では、後述するコンタクトピン41をコネクタ103の端子と接触させることによって、電子部品101に対する電気的な導通を得ることができる。 A wiring pattern is formed on the flexible substrate 102, and electricity is supplied between the electronic component 101 and the connector 103. Therefore, in the measurement socket 1 of the present embodiment, electrical conduction to the electronic component 101 can be obtained by bringing the contact pin 41, which will be described later, into contact with the terminal of the connector 103.
 本実施形態に係る測定用ソケット1は、ベース10と、カバー20と、コンタクトピン41と、コンタクトガイド40とを備えている。ベース10は、電子モジュール100を搭載する凹部11を有する。凹部11は、電子部品101およびフレキシブル基板102の配置位置を決めるためのガイドの役目を果たす。凹部11の開口側には、上に広がるテーパ部が設けられ、テーパ部の下方にはストレート部が設けられている。凹部11に載置された電子モジュール100はテーパ部で呼び込まれて、ストレート部に収納される。 The measurement socket 1 according to the present embodiment includes a base 10, a cover 20, a contact pin 41, and a contact guide 40. The base 10 has a recess 11 on which the electronic module 100 is mounted. The recess 11 serves as a guide for deciding the arrangement position of the electronic component 101 and the flexible substrate 102. A tapered portion extending upward is provided on the opening side of the recess 11, and a straight portion is provided below the tapered portion. The electronic module 100 placed in the recess 11 is called in by the tapered portion and is housed in the straight portion.
 カバー20は、ベース10に対して回動可能に取り付けられる。本実施形態では、ベース10の一端に設けられたヒンジ50を介してカバー20が取り付けられる。カバー20は、ヒンジ50の軸を中心として開閉動作可能に設けられる。 The cover 20 is rotatably attached to the base 10. In this embodiment, the cover 20 is attached via a hinge 50 provided at one end of the base 10. The cover 20 is provided so as to be openable and closable around the axis of the hinge 50.
 測定用ソケット1の例えばベース10にはラッチ60が設けられる。カバー20を閉じた状態でラッチ60をカバー20の爪25に引っ掛けることで、カバー20を閉じた状態が維持される。カバー20は、ヒンジ50の軸に取り付けられたバネ56によって開く方向に付勢されている。したがって、ラッチ60を外すことで、バネ56の付勢力によってカバー20は開くことになる。 A latch 60 is provided on, for example, the base 10 of the measurement socket 1. By hooking the latch 60 on the claw 25 of the cover 20 with the cover 20 closed, the closed state of the cover 20 is maintained. The cover 20 is urged in the opening direction by a spring 56 attached to the shaft of the hinge 50. Therefore, by removing the latch 60, the cover 20 is opened by the urging force of the spring 56.
 なお、電子モジュール100が光学モジュールの場合、測定用ソケット1で光学的な測定を行うこともある。この場合、カバー20に孔201を設けておき、電子モジュール100をベース10に載置してカバー20を閉じた際に、電子部品101の光軸が孔201に対応して、この孔201から光学的な測定を行うようにすればよい。したがって、光学モジュールを測定対象にする測定用ソケット1では、電子モジュール100を載置した際の電気的な接触のほか、測定用ソケット1に対する電子部品101の光軸の位置合わせ精度も必要になる。 When the electronic module 100 is an optical module, the measurement socket 1 may be used for optical measurement. In this case, a hole 201 is provided in the cover 20, and when the electronic module 100 is placed on the base 10 and the cover 20 is closed, the optical axis of the electronic component 101 corresponds to the hole 201, and the optical axis of the electronic component 101 corresponds to the hole 201. Optical measurements may be made. Therefore, in the measurement socket 1 whose measurement target is the optical module, not only the electrical contact when the electronic module 100 is placed, but also the alignment accuracy of the optical axis of the electronic component 101 with respect to the measurement socket 1 is required. ..
 本実施形態では、ベース10に対して回動可能に押さえ部30が取り付けられている。押さえ部30は、カバー20が取り付けられるヒンジ50を介して取り付けられる。押さえ部30は、ヒンジ50の軸を中心として開閉動作可能に設けられる。すなわち、カバー20および押さえ部30は、同じヒンジ50を介して開閉動作可能にベース10に取り付けられる。 In this embodiment, the holding portion 30 is rotatably attached to the base 10. The holding portion 30 is attached via a hinge 50 to which the cover 20 is attached. The pressing portion 30 is provided so as to be able to open and close around the axis of the hinge 50. That is, the cover 20 and the holding portion 30 are attached to the base 10 so as to be openable and closable via the same hinge 50.
 押さえ部30は、カバー20よりもベース10側に配置されるため、カバー20を閉じると、カバー20よりも先に押さえ部30がベース10側に閉じるようになる。カバー20を閉じてラッチ60で固定されると、押さえ部30はカバー20とベース10との間で挟持されることになる。 Since the holding portion 30 is arranged closer to the base 10 than the cover 20, when the cover 20 is closed, the holding portion 30 closes to the base 10 side before the cover 20. When the cover 20 is closed and fixed by the latch 60, the holding portion 30 is sandwiched between the cover 20 and the base 10.
 カバー20と押さえ部30との間にはバネ65が設けられていてもよい。バネ65によってカバー20と押さえ部30とが連結されていることで、カバー20の回動動作と連動して押さえ部30も回動するようになる。電子モジュール100をベース10に載置した状態でカバー20を閉じる際に、カバー20よりも先に押さえ部30が電子モジュール100の上に被せられることになる。これにより、ベース10の凹部11に電子モジュール100を載置した際、電子モジュール100に浮きや位置ずれが生じていても、押さえ部30によって規制される。 A spring 65 may be provided between the cover 20 and the holding portion 30. Since the cover 20 and the pressing portion 30 are connected by the spring 65, the pressing portion 30 also rotates in conjunction with the rotating operation of the cover 20. When the cover 20 is closed with the electronic module 100 placed on the base 10, the pressing portion 30 is put on the electronic module 100 before the cover 20. As a result, when the electronic module 100 is placed in the recess 11 of the base 10, even if the electronic module 100 is lifted or misaligned, it is regulated by the pressing portion 30.
 コンタクトピン41は、電子モジュール100との導通を得るための接触子である。具体的には、コンタクトピン41は電子モジュール100のコネクタ103の端子と接触することで、電子モジュール100との導通を得る。コネクタ103には複数の端子が配列されているため、コネクタ103の端子の本数および配列に合わせて複数本のコンタクトピン41が設けられる。 The contact pin 41 is a contact for obtaining continuity with the electronic module 100. Specifically, the contact pin 41 comes into contact with the terminal of the connector 103 of the electronic module 100 to obtain continuity with the electronic module 100. Since a plurality of terminals are arranged on the connector 103, a plurality of contact pins 41 are provided according to the number and arrangement of the terminals of the connector 103.
 コンタクトガイド40は、コンタクトピン41を電子モジュール100の接触位置にガイドする。コンタクトガイド40はカバー20に設けられ、電子モジュール100が載置されたベース10にカバー20を被せることで、コンタクトピン41を電子モジュール100のコネクタ103の端子の位置へガイドする役目を果たす。 The contact guide 40 guides the contact pin 41 to the contact position of the electronic module 100. The contact guide 40 is provided on the cover 20, and by covering the base 10 on which the electronic module 100 is placed with the cover 20, it serves to guide the contact pin 41 to the position of the terminal of the connector 103 of the electronic module 100.
 本実施形態では、コンタクトガイド40がカバー20に懸架(架け渡した状態で支持)される。すなわち、コンタクトガイド40はカバー20に設けられた孔20h内に配置され、コンタクトガイド40と孔20hとの隙間の範囲内で移動可能に懸架される。 In the present embodiment, the contact guide 40 is suspended (supported in a state of being bridged) on the cover 20. That is, the contact guide 40 is arranged in the hole 20h provided in the cover 20, and is suspended so as to be movable within the gap between the contact guide 40 and the hole 20h.
 なお、測定用ソケット1は、複数のコンタクトガイド40を備えていてもよい。本実施形態では、電子モジュール100に2つのコネクタ103が設けられているため、これに対応して2つのコンタクトガイド40A、40Bが設けられる。 The measurement socket 1 may be provided with a plurality of contact guides 40. In the present embodiment, since the electronic module 100 is provided with the two connectors 103, the two contact guides 40A and 40B are provided correspondingly.
(カバーの動作)
 次に、本実施形態に係る測定用ソケット1のカバー20の動作の詳細について説明する。
 図3(a)~(c)は、カバーを閉じる動作を説明する側面図である。
 先ず、図3(a)に示すように、カバー20および押さえ部30を開いた状態で、ベース10の凹部11に電子モジュール100を載置する。電子モジュール100は、凹部11内の所定位置に載置される場合もあれば、凹部11の内側において僅かにずれた位置に載置される場合もある。また、フレキシブル基板102に曲がりや捩れなどがある場合、フレキシブル基板102に接続されたコネクタ103の位置が安定しないこともある。
(Cover operation)
Next, the details of the operation of the cover 20 of the measurement socket 1 according to the present embodiment will be described.
3A to 3C are side views illustrating an operation of closing the cover.
First, as shown in FIG. 3A, the electronic module 100 is placed in the recess 11 of the base 10 with the cover 20 and the holding portion 30 open. The electronic module 100 may be placed in a predetermined position in the recess 11, or may be placed in a slightly displaced position inside the recess 11. Further, when the flexible board 102 is bent or twisted, the position of the connector 103 connected to the flexible board 102 may not be stable.
 次に、図3(b)に示すように、カバー20を閉じる。カバー20と押さえ部30との間にはバネ65が設けられているため、カバー20と連動して押さえ部30も閉じることになる。そして、押さえ部30はカバー20よりも先にベース10上の電子モジュール100の上に被せられる。 Next, as shown in FIG. 3 (b), the cover 20 is closed. Since the spring 65 is provided between the cover 20 and the pressing portion 30, the pressing portion 30 is also closed in conjunction with the cover 20. Then, the pressing portion 30 is put on the electronic module 100 on the base 10 before the cover 20.
 ここで、電子モジュール100が凹部11の正常な位置に載置されている場合、押さえ部30を閉じた状態では押さえ部30は電子モジュール100に接触しない。一方、電子部品101が浮いている場合には、押さえ部30によって電子部品101が上から押さえられ、凹部11の正常な位置に修正される。 Here, when the electronic module 100 is placed in the normal position of the recess 11, the pressing portion 30 does not come into contact with the electronic module 100 when the pressing portion 30 is closed. On the other hand, when the electronic component 101 is floating, the electronic component 101 is pressed from above by the pressing portion 30, and is corrected to the normal position of the recess 11.
 次に、図3(c)に示すように、カバー20をさらに閉じて、ラッチ60によって固定する。この状態では押さえ部30がカバー20とベース10との間で挟持される。カバー20を閉じると、カバー20のコンタクトガイド40が電子モジュール100のコネクタ103と嵌合する。 Next, as shown in FIG. 3C, the cover 20 is further closed and fixed by the latch 60. In this state, the holding portion 30 is sandwiched between the cover 20 and the base 10. When the cover 20 is closed, the contact guide 40 of the cover 20 is fitted with the connector 103 of the electronic module 100.
 本実施形態では、コンタクトガイド40がカバー20に懸架されているため、カバー20に対してコンタクトガイド40が移動可能に設けられる。したがって、コネクタ103の位置にずれがあっても、カバー20を被せてコンタクトガイド40がコネクタ103に嵌合する際、コネクタ103の位置に合わせてコンタクトガイド40が呼び込まれるように移動することになる(セルフアライメント)。コンタクトガイド40がコネクタ103に嵌合する段階で、コンタクトガイド40からコンタクトピン41が露出し、コネクタ103の端子と接触する。これにより、コンタクトピン41とコネクタ103の端子との正確な導通を得ることができる。 In the present embodiment, since the contact guide 40 is suspended on the cover 20, the contact guide 40 is movably provided with respect to the cover 20. Therefore, even if the position of the connector 103 is misaligned, when the contact guide 40 is fitted to the connector 103 by covering the cover 20, the contact guide 40 is moved so as to be called in according to the position of the connector 103. Become (self-alignment). When the contact guide 40 is fitted to the connector 103, the contact pin 41 is exposed from the contact guide 40 and comes into contact with the terminal of the connector 103. As a result, accurate continuity between the contact pin 41 and the terminal of the connector 103 can be obtained.
(コンタクトガイドの構成)
 次に、コンタクトガイドの詳細について説明する。
 図4は、コンタクトガイドの上部を示す斜視図である。図4では、図2に示すコンタクトガイドカバー210を外した状態が示される。
 図5は、コンタクトガイドの上部を示す拡大斜視図である。図5では、図4に示すトップカバー200を外した状態が示される。
 図6(a)および(b)は、コンタクトガイドのカバーへの嵌め込みの状態を示す斜視図である。図6(a)にはコンタクトガイド40をカバー20へ嵌め込んだ状態が示され、図6(b)にはコンタクトガイド40A(40)をカバー20から外した状態が示される。
 図7(a)および(b)は、コンタクトガイドの拡大斜視図である。
 図8(a)および(b)は、コンタクトガイドの付勢手段を説明する斜視図である。
(Structure of contact guide)
Next, the details of the contact guide will be described.
FIG. 4 is a perspective view showing the upper part of the contact guide. FIG. 4 shows a state in which the contact guide cover 210 shown in FIG. 2 is removed.
FIG. 5 is an enlarged perspective view showing the upper part of the contact guide. FIG. 5 shows a state in which the top cover 200 shown in FIG. 4 is removed.
6 (a) and 6 (b) are perspective views showing a state in which the contact guide is fitted into the cover. FIG. 6A shows a state in which the contact guide 40 is fitted into the cover 20, and FIG. 6B shows a state in which the contact guide 40A (40) is removed from the cover 20.
7 (a) and 7 (b) are enlarged perspective views of the contact guide.
8 (a) and 8 (b) are perspective views illustrating a contact guide urging means.
 コンタクトガイド40は、基台410と、基台410から突出する略矩形の凸状部分420と、基台410の凸状部分420とは反対側に突出するガイド部430とを備える。なお、説明の便宜上、基台410の凸状部分420が設けられている側を上(上側)、ガイド部430が設けられている側を下(下側)ということにする。 The contact guide 40 includes a base 410, a substantially rectangular convex portion 420 protruding from the base 410, and a guide portion 430 protruding to the opposite side of the convex portion 420 of the base 410. For convenience of explanation, the side of the base 410 where the convex portion 420 is provided is referred to as the upper side (upper side), and the side where the guide portion 430 is provided is referred to as the lower side (lower side).
 基台410は略直方体に設けられ、コンタクトピン41と導通するケーブル440が取り付けられる。ケーブル440はフレキシブル基板によって構成され、コンタクトピン41と接触したコネクタ103の端子に対して測定用ソケット1の外部からの信号の入出力を行う。 The base 410 is provided on a substantially rectangular parallelepiped, and a cable 440 that conducts with the contact pin 41 is attached. The cable 440 is composed of a flexible substrate, and inputs / outputs a signal from the outside of the measurement socket 1 to the terminal of the connector 103 in contact with the contact pin 41.
 基台410はカバー20に設けられた凹部202に嵌め込まれる、凹部202には孔20hが設けられており、基台410を凹部202に嵌め込むと、ガイド部430が孔20hに入り込むようになる。 The base 410 is fitted into the recess 202 provided in the cover 20, and the recess 202 is provided with a hole 20h. When the base 410 is fitted into the recess 202, the guide portion 430 enters the hole 20h. ..
 略矩形に設けられた凸状部分420の4つの側壁のそれぞれに隣接してスプリングホルダ425が配置される。スプリングホルダ425には、付勢手段の例であるコイルスプリング450を収容する穴425hが設けられる。例えば、1つのスプリングホルダ425に2つの穴425hが平行に設けられ、それぞれの穴425hにコイルスプリング450が収容される。凸状部分420には、直交する2方向のそれぞれに対向するようコイルスプリング450が配置される。 A spring holder 425 is arranged adjacent to each of the four side walls of the convex portion 420 provided in a substantially rectangular shape. The spring holder 425 is provided with a hole 425h for accommodating the coil spring 450, which is an example of the urging means. For example, one spring holder 425 is provided with two holes 425h in parallel, and each hole 425h accommodates a coil spring 450. A coil spring 450 is arranged in the convex portion 420 so as to face each of the two orthogonal directions.
 スプリングホルダ425の穴425hに収容されたコイルスプリング450は、凸状部分420の側壁と、この側壁と対向するトップカバー200との間に組み込まれる。すなわち、トップカバー200には、凸状部分420と4つのスプリングホルダ425とを嵌め込むことができる略十字型の孔が設けられており、トップカバー200をカバー20の上に取り付けることで、この孔に凸状部分420と4つのスプリングホルダ425とが嵌め込まれる状態になる。 The coil spring 450 housed in the hole 425h of the spring holder 425 is incorporated between the side wall of the convex portion 420 and the top cover 200 facing the side wall. That is, the top cover 200 is provided with a substantially cross-shaped hole into which the convex portion 420 and the four spring holders 425 can be fitted, and by mounting the top cover 200 on the cover 20, this is achieved. The convex portion 420 and the four spring holders 425 are fitted into the holes.
 この状態で、スプリングホルダ425の穴425hにコイルスプリング450を組み込むことで、凸状部分420が4方向からコイルスプリング450で押圧され、コイルスプリング450の付勢力のバランスによって支持される状態になる。したがって、コンタクトガイド40は、コイルスプリング450で支持された凸状部分420でカバー20に懸架されるようになる。このため、コンタクトガイド40に力が加わると、コイルスプリング450が伸縮して凸状部分420の位置が移動し、これに伴いコンタクトガイド40の位置も移動することになる。 In this state, by incorporating the coil spring 450 into the hole 425h of the spring holder 425, the convex portion 420 is pressed by the coil spring 450 from four directions and is supported by the balance of the urging force of the coil spring 450. Therefore, the contact guide 40 is suspended from the cover 20 by the convex portion 420 supported by the coil spring 450. Therefore, when a force is applied to the contact guide 40, the coil spring 450 expands and contracts to move the position of the convex portion 420, and the position of the contact guide 40 also moves accordingly.
 基台410から下側に突出するガイド部430は枠型に設けられ、ガイド部430の枠の内側にコンタクトピン41が配置される。カバー20を閉じることでガイド部430の枠内に電子モジュール100のコネクタ103が嵌め込まれる。先に説明したように、コンタクトガイド40はコイルスプリング450で支持された凸状部分420でカバー20に懸架されているため、ガイド部430がコネクタ103に嵌め込まれる際、コネクタ103から外力を受けてコンタクトガイド40の位置がコイルスプリング450の伸縮とともに移動し、コネクタ103の位置に呼び込まれるようにガイド部430が位置合わせされる。 The guide portion 430 protruding downward from the base 410 is provided in a frame shape, and the contact pin 41 is arranged inside the frame of the guide portion 430. By closing the cover 20, the connector 103 of the electronic module 100 is fitted into the frame of the guide portion 430. As described above, since the contact guide 40 is suspended from the cover 20 by the convex portion 420 supported by the coil spring 450, when the guide portion 430 is fitted into the connector 103, it receives an external force from the connector 103. The position of the contact guide 40 moves with the expansion and contraction of the coil spring 450, and the guide portion 430 is aligned so as to be called into the position of the connector 103.
(コンタクトガイドの動き)
 次に、コンタクトガイドの動きについて説明する。
 図9(a)~図10(b)は、コンタクトガイドの動きを例示する図である。図9および図10において(a)は斜視図、(b)は断面図である。図9(a)および(b)には、コンタクトガイド40が所定の移動範囲の一方端に位置する状態が示され、図10(a)および(b)には、コンタクトガイド40が所定の移動範囲の他方端に位置する状態が示される。
(Movement of contact guide)
Next, the movement of the contact guide will be described.
9 (a) to 10 (b) are diagrams illustrating the movement of the contact guide. In FIGS. 9 and 10, FIG. 9A is a perspective view and FIG. 10B is a sectional view. 9 (a) and 9 (b) show a state in which the contact guide 40 is located at one end of a predetermined movement range, and FIGS. 10 (a) and 10 (b) show the contact guide 40 in a predetermined movement. The state located at the other end of the range is shown.
 コンタクトガイド40はコイルスプリング450で支持される凸状部分420でカバー20に懸架されており、カバー20の基準面RSに沿った少なくとも互いに直交する2方向に移動可能になっている。ここで、基準面RSは、トップカバー200における基台410との接触面(トップカバー200の下面)である。説明の便宜上、基準面RSに沿った互いに直交する2方向をX方向およびY方向ということにする。また、基準面RSの法線方向をZ方向ということにする。コイルスプリング450の伸縮によって凸状部分420が移動する際、コンタクトガイド40は基準面RSに沿ってXY方向に移動可能となる。 The contact guide 40 is suspended on the cover 20 by a convex portion 420 supported by the coil spring 450, and can move in at least two directions orthogonal to each other along the reference plane RS of the cover 20. Here, the reference surface RS is a contact surface (lower surface of the top cover 200) with the base 410 in the top cover 200. For convenience of explanation, the two directions orthogonal to each other along the reference plane RS are referred to as the X direction and the Y direction. Further, the normal direction of the reference plane RS is referred to as the Z direction. When the convex portion 420 moves due to the expansion and contraction of the coil spring 450, the contact guide 40 can move in the XY direction along the reference surface RS.
 図9(a)および(b)では、コンタクトガイド40がX方向の一方端に移動した状態が示される。この場合、凸状部分420は矢印Aの方向に押され、X方向に対向する2つのスプリングホルダ425A、425Bのうち一方端側のスプリングホルダ425Aが押され、コイルスプリング450Aが縮む。一方、他方端側のコイルスプリング450Bは伸びてスプリングホルダ425Bが凸状部分420を一方端側へ押す状態になる。 9 (a) and 9 (b) show a state in which the contact guide 40 has moved to one end in the X direction. In this case, the convex portion 420 is pushed in the direction of the arrow A, the spring holder 425A on one end side of the two spring holders 425A and 425B facing each other in the X direction is pushed, and the coil spring 450A contracts. On the other hand, the coil spring 450B on the other end side extends and the spring holder 425B pushes the convex portion 420 toward one end side.
 図10(a)および(b)は、コンタクトガイドとコネクタとの嵌合時の動作を例示する模式図である。
 図10には、図9と同様にコンタクトガイド40が矢印Aの方向に移動する際の動作が示される。
 コンタクトガイド40のガイド部430にはコネクタ103を収容可能な嵌合凹部431が設けられる。嵌合凹部431の内面には、コネクタ103を収容した際にコネクタ103の外面と接触する嵌合面432が設けられる。嵌合凹部431の内面における開口部分には開口側に向けて拡がるテーパ面433が設けられているとよい。
10 (a) and 10 (b) are schematic views illustrating the operation when the contact guide and the connector are fitted.
FIG. 10 shows an operation when the contact guide 40 moves in the direction of the arrow A as in FIG. 9.
The guide portion 430 of the contact guide 40 is provided with a fitting recess 431 capable of accommodating the connector 103. The inner surface of the fitting recess 431 is provided with a fitting surface 432 that comes into contact with the outer surface of the connector 103 when the connector 103 is accommodated. It is preferable that the opening portion on the inner surface of the fitting recess 431 is provided with a tapered surface 433 that expands toward the opening side.
 図10(a)に示すように、ガイド部430がコネクタ103と離れている状態(嵌合前の状態)では、カバー20に懸架されるコンタクトガイド40は、コイルスプリング450A、450Bの付勢力のバランスによって中立位置に配置される。ベース10に載置される電子モジュール100において、例えばフレキシブル基板102の撓みや曲がりによってベース10に対するコネクタ103の位置にずれが生じる場合がある。 As shown in FIG. 10A, when the guide portion 430 is separated from the connector 103 (the state before fitting), the contact guide 40 suspended from the cover 20 has the urging force of the coil springs 450A and 450B. It is placed in a neutral position by balance. In the electronic module 100 mounted on the base 10, for example, the position of the connector 103 with respect to the base 10 may be displaced due to bending or bending of the flexible substrate 102.
 この状態でベース10にカバー20を被せることでガイド部430がコネクタ103に接近し、嵌合凹部431にコネクタ103が嵌まり始めると、コネクタ103の外面が嵌合凹部431の嵌合面432と接触し、ガイド部430がコネクタ103に嵌合しながらコネクタ103の位置へ呼び込まれるように動くようになる。嵌合凹部431にテーパ面433が設けられていると、コネクタ103の外面がテーパ面433に接触しながら嵌合凹部431の位置がコネクタ103の位置へ呼び込まれ、嵌め込みやすくなる。 By covering the base 10 with the cover 20 in this state, the guide portion 430 approaches the connector 103, and when the connector 103 begins to fit into the fitting recess 431, the outer surface of the connector 103 becomes the fitting surface 432 of the fitting recess 431. When they come into contact with each other, the guide portion 430 moves so as to be attracted to the position of the connector 103 while being fitted to the connector 103. When the fitting recess 431 is provided with the tapered surface 433, the position of the fitting recess 431 is called into the position of the connector 103 while the outer surface of the connector 103 is in contact with the tapered surface 433, and the fitting recess 431 is easily fitted.
 これにより、図10(b)に示すように、カバー20に懸架されているコンタクトガイド40が矢印Aの方向(コネクタ103の位置ずれの方向)に移動して、嵌合凹部431がコネクタ103の位置に倣うように動き、コネクタ103と嵌合凹部431との嵌合が行われるようになる。 As a result, as shown in FIG. 10B, the contact guide 40 suspended from the cover 20 moves in the direction of arrow A (the direction in which the connector 103 is displaced), and the fitting recess 431 is formed in the connector 103. It moves so as to follow the position, and the connector 103 and the fitting recess 431 are fitted.
 図11(a)および(b)では、図9(a)および(b)とは反対に、コンタクトガイド40がX方向の他方端に移動した状態が示される。この場合、凸状部分420は矢印Bの方向に押され、X方向に対向する2つのスプリングホルダ425A、425Bのうち他方端側のスプリングホルダ425Bが押され、コイルスプリング450Bが縮む。一方、一方端側のコイルスプリング450Aは伸びてスプリングホルダ425Aが凸状部分420を他方端側へ押す状態になる。 11 (a) and 11 (b) show a state in which the contact guide 40 has moved to the other end in the X direction, contrary to FIGS. 9 (a) and 9 (b). In this case, the convex portion 420 is pushed in the direction of the arrow B, the spring holder 425B on the other end side of the two spring holders 425A and 425B facing each other in the X direction is pushed, and the coil spring 450B contracts. On the other hand, the coil spring 450A on one end side extends and the spring holder 425A pushes the convex portion 420 toward the other end side.
 図12(a)および(b)は、コンタクトガイドとコネクタとの嵌合時の動作を例示する模式図である。
 図12には、図11と同様にコンタクトガイド40が矢印Bの方向に移動する際の動作が示される。
12 (a) and 12 (b) are schematic views illustrating the operation when the contact guide and the connector are fitted.
FIG. 12 shows an operation when the contact guide 40 moves in the direction of the arrow B as in FIG.
 図12(a)に示すように、ガイド部430がコネクタ103と離れている状態(嵌合前の状態)では、カバー20に懸架されるコンタクトガイド40は、コイルスプリング450A、450Bの付勢力のバランスによって中立位置に配置される。ベース10に載置される電子モジュール100において、例えばフレキシブル基板102の撓みや曲がりによってベース10に対するコネクタ103の位置にずれが生じる場合がある。 As shown in FIG. 12A, when the guide portion 430 is separated from the connector 103 (the state before fitting), the contact guide 40 suspended from the cover 20 has the urging force of the coil springs 450A and 450B. It is placed in a neutral position by balance. In the electronic module 100 mounted on the base 10, for example, the position of the connector 103 with respect to the base 10 may be displaced due to bending or bending of the flexible substrate 102.
 この状態でベース10にカバー20を被せることでガイド部430がコネクタ103に接近し、嵌合凹部431にコネクタ103が嵌まり始めると、コネクタ103の外面が嵌合凹部431の嵌合面432と接触し、ガイド部430がコネクタ103に嵌合しながらコネクタ103の位置へ呼び込まれるように動くようになる。 By covering the base 10 with the cover 20 in this state, the guide portion 430 approaches the connector 103, and when the connector 103 begins to fit into the fitting recess 431, the outer surface of the connector 103 becomes the fitting surface 432 of the fitting recess 431. When they come into contact with each other, the guide portion 430 moves so as to be attracted to the position of the connector 103 while being fitted to the connector 103.
 これにより、図12(b)に示すように、カバー20に懸架されているコンタクトガイド40が矢印Bの方向(コネクタ103の位置ずれの方向)に移動して、嵌合凹部431がコネクタ103の位置に倣うように動き、コネクタ103と嵌合凹部431との嵌合が行われるようになる。 As a result, as shown in FIG. 12B, the contact guide 40 suspended from the cover 20 moves in the direction of arrow B (the direction in which the connector 103 is displaced), and the fitting recess 431 is formed in the connector 103. It moves so as to follow the position, and the connector 103 and the fitting recess 431 are fitted.
 上記のように、本実施形態では、コンタクトガイド40がカバー20に懸架されており、コイルスプリング450A、450Bの付勢力のバランスによって中立位置に配置され、外部からの力によって基準面RSに沿って移動できるようになっている。これにより、嵌合の対象物であるコネクタ103の位置にずれが生じていても、そのずれに応じてコンタクトガイド40が倣うように移動して、コネクタ103の位置ずれを吸収しながら確実に嵌合できるようになる。 As described above, in the present embodiment, the contact guide 40 is suspended on the cover 20, is arranged in the neutral position by the balance of the urging forces of the coil springs 450A and 450B, and is arranged along the reference plane RS by the external force. It can be moved. As a result, even if the position of the connector 103, which is the object of fitting, is misaligned, the contact guide 40 moves so as to follow the misalignment, and the connector 103 is securely fitted while absorbing the misalignment. You will be able to meet.
 本実施形態では、フレキシブル基板102に電子部品101およびコネクタ103が接続された電子モジュール100を測定対象としており、コンタクトピン41を接触させるコネクタ103の端子の位置は、コネクタ103の位置を基準として設けられている。コネクタ103の端子は狭ピッチで多数並置されていることから、各端子とコンタクトピン41との接触は、コネクタ103の外面を基準として嵌合凹部431を嵌め込むことで正確な位置へのコンタクトが実現される。 In the present embodiment, the electronic module 100 in which the electronic component 101 and the connector 103 are connected to the flexible substrate 102 is the measurement target, and the terminal position of the connector 103 that contacts the contact pin 41 is provided with reference to the position of the connector 103. Has been done. Since many terminals of the connector 103 are juxtaposed at a narrow pitch, the contact between each terminal and the contact pin 41 can be made by fitting the fitting recess 431 with reference to the outer surface of the connector 103 to make a contact at an accurate position. It will be realized.
 一方、コネクタ103の位置は、フレキシブル基板102に対するコネクタ103の接続における位置ずれや、フレキシブル基板102上の正確な位置に接続されたとしてもフレキシブル基板102の弾性力、曲がり、捩れなどによって変化することになる。近年では、フレキシブル基板102が比較的硬めになっており、折り曲げられていることもあるため、フレキシブル基板102に接続される電子部品101とコネクタ103との相対的な位置関係は不安定になりやすい。このため、電子部品101を基準としてコネクタ103の端子とコンタクトピン41との位置合わせをすると、正確なコンタクトができないことも多い。 On the other hand, the position of the connector 103 changes due to misalignment in the connection of the connector 103 to the flexible substrate 102, or even if the connector 103 is connected to an accurate position on the flexible substrate 102, the elastic force, bending, twisting, etc. of the flexible substrate 102. become. In recent years, since the flexible substrate 102 has become relatively hard and may be bent, the relative positional relationship between the electronic component 101 connected to the flexible substrate 102 and the connector 103 tends to be unstable. .. Therefore, if the terminal of the connector 103 and the contact pin 41 are aligned with respect to the electronic component 101, accurate contact is often not possible.
 本実施形態では、ガイド部430との嵌合の対象物であるコネクタ103の位置がずれていても、コネクタ103の外面に嵌合凹部431の嵌合面432が接触することで、懸架されているコンタクトガイド40が移動して、ずれの生じているコネクタ103の位置に合わせてガイド部430の嵌合凹部431を嵌合させることができる。 In the present embodiment, even if the position of the connector 103, which is the object of fitting with the guide portion 430, is displaced, the fitting surface 432 of the fitting recess 431 comes into contact with the outer surface of the connector 103, so that the connector 103 is suspended. The contact guide 40 is moved so that the fitting recess 431 of the guide portion 430 can be fitted in accordance with the position of the connector 103 in which the deviation occurs.
 ここで、特許文献4に開示される電気部品用ソケットでは、ソケットカバーを閉じた際、ソケット本体側の傾斜面に倣って押圧部材が移動するようになる。しかし、本実施形態のように嵌合(接触)の対象物であるコネクタ103の位置ずれを吸収するようにコンタクトガイド40が移動するものではない。すなわち、特許文献4では、ソケットカバーとソケット本体との組み立て誤差を吸収するものであり、接触の対象物であるパッケージがソケット本体に対して位置ずれしている場合には、その位置ずれを吸収して正確なコンタクトを行うことはできない。これは、ソケット本体に対してパッケージが正確に載置されていることを前提としているためである。 Here, in the socket for electrical parts disclosed in Patent Document 4, when the socket cover is closed, the pressing member moves according to the inclined surface on the socket body side. However, the contact guide 40 does not move so as to absorb the misalignment of the connector 103, which is the object of fitting (contact) as in the present embodiment. That is, in Patent Document 4, the assembly error between the socket cover and the socket body is absorbed, and when the package which is the object of contact is misaligned with respect to the socket body, the misalignment is absorbed. It is not possible to make accurate contact. This is because it is assumed that the package is correctly placed on the socket body.
 本実施形態では、ガイド部430の嵌合凹部431を嵌め込む対象物であるコネクタ103の位置がずれる場合に対応し、位置ずれが発生していてもコネクタ103の位置に倣うようにコンタクトガイド40が移動できるようになっている。したがって、嵌合(接続)の対象物であるコネクタ103の位置ずれに対してその位置ずれを直接吸収して、ガイド部430の嵌合凹部431とコネクタ103とを確実に嵌合させることが可能となる。コネクタ103の位置を基準として嵌合凹部431が確実に嵌め込まれることで、コネクタ103に狭ピッチで多数並置されている複数の端子とコンタクトピン41とを正確に接触させることが可能となる。 In the present embodiment, the contact guide 40 corresponds to the case where the position of the connector 103, which is the object to be fitted with the fitting recess 431 of the guide portion 430, is displaced, and even if the displacement occurs, the contact guide 40 follows the position of the connector 103. Can be moved. Therefore, it is possible to directly absorb the misalignment of the connector 103, which is the object of fitting (connection), and reliably fit the fitting recess 431 of the guide portion 430 and the connector 103. It becomes. By securely fitting the fitting recess 431 with reference to the position of the connector 103, it is possible to accurately bring the contact pins 41 into contact with a plurality of terminals juxtaposed with the connector 103 at a narrow pitch.
 なお、図9から図12ではX方向の移動例について示したが、Y方向の移動についても同様である。また、コンタクトガイド40は、Z方向に移動可能に懸架されていてもよい。例えば、コンタクトガイド40を懸架する際、基台410の上面とトップカバー200の下面(基準面RS)との間に僅かな隙間を設けておく。すなわち、これにより、コンタクトガイド40は、コイルスプリング450によってZ方向に僅かに浮いた状態で支持される。これにより、コンタクトガイド40は、XY方向のみならずZ方向にも移動可能となる。さらに、コンタクトガイド40がZ方向に浮いた状態で支持されていると、コンタクトガイド40は回転方向(XYZ方向の3軸のそれぞれを中心とした回転方向)にも移動可能となる。これにより、コンタクトガイド40が電子モジュール100のコネクタ103と嵌合する際、コネクタ103の位置や向きに合わせて移動するようになり、コネクタ103の位置ずれがあっても確実にコンタクトガイド40が嵌合して、コンタクトピン41とコネクタ103の端子とを接触させることができるようになる。 Although the examples of movement in the X direction are shown in FIGS. 9 to 12, the same applies to the movement in the Y direction. Further, the contact guide 40 may be suspended so as to be movable in the Z direction. For example, when suspending the contact guide 40, a slight gap is provided between the upper surface of the base 410 and the lower surface of the top cover 200 (reference surface RS). That is, thereby, the contact guide 40 is supported by the coil spring 450 in a slightly floating state in the Z direction. As a result, the contact guide 40 can move not only in the XY direction but also in the Z direction. Further, when the contact guide 40 is supported in a floating state in the Z direction, the contact guide 40 can also move in the rotation direction (rotation direction centered on each of the three axes in the XYZ direction). As a result, when the contact guide 40 is fitted with the connector 103 of the electronic module 100, the contact guide 40 moves according to the position and orientation of the connector 103, and the contact guide 40 is securely fitted even if the connector 103 is misaligned. In this way, the contact pin 41 and the terminal of the connector 103 can be brought into contact with each other.
(コンタクト装置)
 次に、コンタクト装置について説明する。
 図13は、コンタクト装置を例示する正面図である。
 本実施形態に係るコンタクト装置500は、先に説明した測定用ソケット1と同様に、ベース10、カバー20、押さえ部30、コンタクトピン41およびコンタクトガイド40を備える。コンタクト装置500では、カバー20および押さえ部30がベース10に対して上下動するよう構成される。
(Contact device)
Next, the contact device will be described.
FIG. 13 is a front view illustrating the contact device.
The contact device 500 according to the present embodiment includes a base 10, a cover 20, a holding portion 30, a contact pin 41, and a contact guide 40, similarly to the measurement socket 1 described above. In the contact device 500, the cover 20 and the pressing portion 30 are configured to move up and down with respect to the base 10.
 ベース10には、電子モジュール100を載置する凹部11が設けられる。ベース10には、例えば4箇所に支柱15が設けられている。カバー20は、この支柱15によって支持され、支柱15に沿って上下動可能に設けられる。支柱15にはバネ17が設けられており、カバー20を上方に付勢している。カバー20は、図示しない駆動機構によってバネ17の付勢力を超えた力で押し込まれることにより、ベース10の上に被せられる。 The base 10 is provided with a recess 11 on which the electronic module 100 is placed. The base 10 is provided with columns 15 at four positions, for example. The cover 20 is supported by the support column 15 and is provided so as to be vertically movable along the support column 15. A spring 17 is provided on the support column 15 to urge the cover 20 upward. The cover 20 is put on the base 10 by being pushed by a drive mechanism (not shown) with a force exceeding the urging force of the spring 17.
 押さえ部30は、ベース10とカバー20との間に設けられる。押さえ部30は、カバー20を下降させてベース10上に被せる際、カバー20よりも先に押さえ部30が電子モジュール100の上に被せられるよう構成される。 The holding portion 30 is provided between the base 10 and the cover 20. The pressing portion 30 is configured so that when the cover 20 is lowered and put on the base 10, the pressing portion 30 is put on the electronic module 100 before the cover 20.
 コンタクト装置500では、ベース10の凹部11に電子モジュール100を載置した状態でカバー20および押さえ部30を下降させる。これにより、コンタクトガイド40にコネクタ103が嵌合し、コンタクトピン41とコネクタ103の端子とが接触するようになる。コンタクトガイド40はカバー20に懸架されているため、コネクタ103の位置にずれがあっても、コンタクトガイド40がコネクタ103に嵌合する際、コネクタ103の位置に合わせてコンタクトガイド40が呼び込まれるように移動することになり、コンタクトピン41とコネクタ103の端子との正確な導通を得ることができる。 In the contact device 500, the cover 20 and the holding portion 30 are lowered with the electronic module 100 placed in the recess 11 of the base 10. As a result, the connector 103 is fitted into the contact guide 40, and the contact pin 41 and the terminal of the connector 103 come into contact with each other. Since the contact guide 40 is suspended from the cover 20, even if the position of the connector 103 is displaced, the contact guide 40 is called in according to the position of the connector 103 when the contact guide 40 is fitted to the connector 103. Therefore, accurate continuity between the contact pin 41 and the terminal of the connector 103 can be obtained.
 以上説明したように、実施形態によれば、電子モジュール100のコネクタ103とコンタクトピン41とを正確に接触させて確実な導通を得ることができる測定用ソケット1を提供することが可能になる。 As described above, according to the embodiment, it is possible to provide the measurement socket 1 capable of accurately contacting the connector 103 of the electronic module 100 and the contact pin 41 to obtain reliable conduction.
 なお、上記に本実施形態およびその具体例を説明したが、本発明はこれらの例に限定されるものではない。例えば、測定対象となる電子モジュール100として、フレキシブル基板102に電子部品101およびコネクタ103が接続されたものを例としたが、電子モジュール100の構成は、これに限定されない。また、前述の各実施形態またはその具体例に対して、当業者が適宜、構成要素の追加、削除、設計変更を行ったものや、各実施形態の特徴を適宜組み合わせたものも、本発明の要旨を備えている限り、本発明の範囲に包含される。 Although the present embodiment and specific examples thereof have been described above, the present invention is not limited to these examples. For example, the electronic module 100 to be measured is an example in which the electronic component 101 and the connector 103 are connected to the flexible substrate 102, but the configuration of the electronic module 100 is not limited to this. In addition, those skilled in the art appropriately adding, deleting, or changing the design of each of the above-described embodiments or specific examples thereof, and those in which the features of each embodiment are appropriately combined are also included in the present invention. As long as it has a gist, it is included in the scope of the present invention.
1…測定用ソケット
10…ベース
11…凹部
15…支柱
17…バネ
20…カバー
20h…孔
25…爪
30…押さえ部
40,40A,40B…コンタクトガイド
41…コンタクトピン
50…ヒンジ
56…バネ
60…ラッチ
65…バネ
100…電子モジュール
101…電子部品
102…フレキシブル基板
103…コネクタ
200…トップカバー
201…孔
202…凹部
210…コンタクトガイドカバー
410…基台
420…凸状部分
425,425A,425B…スプリングホルダ
425h…穴
430…ガイド部
431…嵌合凹部
432…嵌合面
433…テーパ面
440…ケーブル
450,450A,450B…コイルスプリング
500…コンタクト装置
A,B…矢印
RS…基準面
1 ... Measuring socket 10 ... Base 11 ... Recess 15 ... Support 17 ... Spring 20 ... Cover 20h ... Hole 25 ... Claw 30 ... Holding part 40, 40A, 40B ... Contact guide 41 ... Contact pin 50 ... Hinge 56 ... Spring 60 ... Latch 65 ... Spring 100 ... Electronic module 101 ... Electronic component 102 ... Flexible board 103 ... Connector 200 ... Top cover 201 ... Hole 202 ... Recessed 210 ... Contact guide cover 410 ... Base 420 ... Convex part 425, 425A, 425B ... Spring Holder 425h ... Hole 430 ... Guide portion 431 ... Fitting recess 432 ... Fitting surface 433 ... Tapered surface 440 ... Cable 450, 450A, 450B ... Coil spring 500 ... Contact device A, B ... Arrow RS ... Reference surface

Claims (11)

  1.  フレキシブル基板と、前記フレキシブル基板に接続された電子部品およびコネクタと、を有する電子モジュールを測定対象とする測定用ソケットであって、
     前記電子モジュールを載置する凹部を有するベースと、
     前記ベースに被せられるカバーと、
     前記電子モジュールとの導通を得るためのコンタクトピンと、
     前記カバーに設けられ、前記電子モジュールが載置された前記ベースに前記カバーを被せることで前記コンタクトピンを前記電子モジュールの接触位置にガイドするコンタクトガイドと、を備え、
     前記コンタクトガイドは、前記コネクタを収容可能な嵌合凹部を有し、
     前記コンタクトガイドは、前記カバーに懸架され、
     前記カバーを前記ベースに被せることで前記コンタクトガイドの前記嵌合凹部の内面が前記コネクタと接触し、前記コンタクトガイドが前記コネクタに嵌合しながら前記コネクタの位置へ呼び込まれる、ことを特徴とする測定用ソケット。
    A measurement socket for measuring an electronic module having a flexible substrate and an electronic component and a connector connected to the flexible substrate.
    A base having a recess on which the electronic module is placed,
    The cover that covers the base and
    A contact pin for obtaining continuity with the electronic module,
    A contact guide provided on the cover and guiding the contact pin to the contact position of the electronic module by covering the base on which the electronic module is mounted is provided.
    The contact guide has a fitting recess that can accommodate the connector.
    The contact guide is suspended from the cover and
    By covering the base with the cover, the inner surface of the fitting recess of the contact guide comes into contact with the connector, and the contact guide is called into the position of the connector while being fitted to the connector. Measurement socket.
  2.  前記コンタクトガイドは、前記カバーの基準面に沿った少なくとも互いに直交する2方向に移動可能に懸架される、請求項1記載の測定用ソケット。 The measurement socket according to claim 1, wherein the contact guide is suspended so as to be movable in at least two directions orthogonal to each other along a reference plane of the cover.
  3.  前記コンタクトガイドは、前記カバーの前記基準面の法線方向に移動可能に懸架される、請求項2記載の測定用ソケット。 The measurement socket according to claim 2, wherein the contact guide is suspended so as to be movable in the normal direction of the reference surface of the cover.
  4.  前記コンタクトガイドは、前記カバーに対して回転可能に懸架される、請求項2または請求項3に記載の測定用ソケット。 The measurement socket according to claim 2 or 3, wherein the contact guide is rotatably suspended from the cover.
  5.  前記コンタクトガイドと前記カバーとの間に設けられた付勢手段をさらに備えた、請求項1から請求項4のいずれか1項に記載の測定用ソケット。 The measuring socket according to any one of claims 1 to 4, further comprising an urging means provided between the contact guide and the cover.
  6.  前記コンタクトガイドは略矩形の凸状部分を有し、
     前記凸状部分の4つの側壁と前記カバーとの間に前記付勢手段が設けられた、請求項5記載の測定用ソケット。
    The contact guide has a substantially rectangular convex portion and has a substantially rectangular convex portion.
    The measuring socket according to claim 5, wherein the urging means is provided between the four side walls of the convex portion and the cover.
  7.  前記嵌合凹部の内面における開口部分には開口側に拡がるテーパ面が設けられた、請求項1から請求項6のいずれか1項に記載の測定用ソケット。 The measurement socket according to any one of claims 1 to 6, wherein a tapered surface extending to the opening side is provided in the opening portion on the inner surface of the fitting recess.
  8.  前記コンタクトガイドは、前記カバーに設けられた孔内に配置され、
     前記コンタクトガイドと前記孔の壁との隙間の範囲内で移動可能に懸架される、請求項1から請求項7のいずれか1項に記載の測定用ソケット。
    The contact guide is arranged in a hole provided in the cover.
    The measuring socket according to any one of claims 1 to 7, which is movably suspended within a gap between the contact guide and the wall of the hole.
  9.  前記カバーは、ヒンジによって前記ベースに対して回動するよう設けられた、請求項1から請求項8のいずれか1項に記載の測定用ソケット。 The measurement socket according to any one of claims 1 to 8, wherein the cover is provided so as to rotate with respect to the base by a hinge.
  10.  前記カバーを前記ベースに被せることで前記ベースに載置された前記電子モジュールの位置へ前記コンタクトガイドが呼び込まれる、請求項1から請求項9のいずれか1項に記載の測定用ソケット。 The measurement socket according to any one of claims 1 to 9, wherein the contact guide is called to the position of the electronic module mounted on the base by covering the base with the cover.
  11.  複数の前記コンタクトガイドを備え、
     前記複数のコンタクトガイドは、前記カバーに対してそれぞれ独立して懸架される、請求項1から請求項10のいずれか1項に記載の測定用ソケット。
    Equipped with multiple contact guides
    The measuring socket according to any one of claims 1 to 10, wherein the plurality of contact guides are independently suspended from the cover.
PCT/JP2020/019984 2019-10-09 2020-05-20 Measurement socket WO2021070412A1 (en)

Priority Applications (1)

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JP2020562221A JP6877805B1 (en) 2019-10-09 2020-05-20 Measuring socket

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JP2019185972 2019-10-09
JP2019-185972 2019-10-09

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WO2021070412A1 true WO2021070412A1 (en) 2021-04-15

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WO (1) WO2021070412A1 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012164434A (en) * 2011-02-03 2012-08-30 Enplas Corp Socket for electrical component
JP2017142995A (en) * 2016-02-10 2017-08-17 株式会社Sdk Measuring socket
JP2018040678A (en) * 2016-09-07 2018-03-15 株式会社Sdk Measurement socket and contact device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012164434A (en) * 2011-02-03 2012-08-30 Enplas Corp Socket for electrical component
JP2017142995A (en) * 2016-02-10 2017-08-17 株式会社Sdk Measuring socket
JP2018040678A (en) * 2016-09-07 2018-03-15 株式会社Sdk Measurement socket and contact device

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JP6877805B1 (en) 2021-05-26
JPWO2021070412A1 (en) 2021-10-28

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