WO2020062296A1 - 一种输出状态的测试方法和系统、及计算机存储介质 - Google Patents

一种输出状态的测试方法和系统、及计算机存储介质 Download PDF

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Publication number
WO2020062296A1
WO2020062296A1 PCT/CN2018/109205 CN2018109205W WO2020062296A1 WO 2020062296 A1 WO2020062296 A1 WO 2020062296A1 CN 2018109205 W CN2018109205 W CN 2018109205W WO 2020062296 A1 WO2020062296 A1 WO 2020062296A1
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WO
WIPO (PCT)
Prior art keywords
voltage
current
time
state
adapter
Prior art date
Application number
PCT/CN2018/109205
Other languages
English (en)
French (fr)
Inventor
田晨
Original Assignee
Oppo广东移动通信有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oppo广东移动通信有限公司 filed Critical Oppo广东移动通信有限公司
Priority to EP18935592.8A priority Critical patent/EP3716561B1/en
Priority to CN201880033248.4A priority patent/CN111434082B/zh
Priority to ES18935592T priority patent/ES2906372T3/es
Priority to PCT/CN2018/109205 priority patent/WO2020062296A1/zh
Priority to KR1020217001117A priority patent/KR102611263B1/ko
Priority to JP2021500824A priority patent/JP7288038B2/ja
Priority to US16/728,244 priority patent/US11329493B2/en
Publication of WO2020062296A1 publication Critical patent/WO2020062296A1/zh

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Classifications

    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
    • H02J7/00—Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries
    • H02J7/0047—Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries with monitoring or indicating devices or circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16528—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values using digital techniques or performing arithmetic operations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
    • G01R19/16542—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies for batteries
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40—Testing power supplies
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
    • H02J7/00—Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries
    • H02J7/00032—Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries characterised by data exchange
    • H02J7/00036—Charger exchanging data with battery
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
    • H02J7/00—Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries
    • H02J7/007—Regulation of charging or discharging current or voltage

Definitions

  • the embodiments of the present application relate to charging technologies in the field of terminals, and in particular, to a method and system for testing output status, and a computer storage medium.
  • the fast charging technology can charge the battery of the terminal through the adapter in a segmented constant current manner, so that fast charging can be performed on the premise of ensuring safety and reliability, which greatly improves the charging speed of the terminal.
  • the output state of the adapter that is, the output voltage and output current, will have a certain impact on the effect of flash charging.
  • the embodiments of the present application provide a method and a system for testing an output state, and a computer storage medium.
  • the number of detection instructions can be reduced, and a detection process can be simplified, thereby greatly improving detection efficiency and accuracy.
  • An embodiment of the present application provides a method for testing an output state.
  • the method includes:
  • the embodiments of the present application provide a method and a system for testing an output state, and a computer storage medium.
  • the test system receives a first instruction after instructing the adapter to enable the fast charging function, wherein the first instruction is used to perform a state of the output voltage. OK; in response to the first instruction, obtain the first real-time voltage and determine the voltage state according to the first real-time voltage; after accessing the charging current corresponding to the fast charge function, obtain the current change rate corresponding to the charging current, and determine the current according to the current change rate State; according to the voltage state and current state, obtain the test result of the corresponding output state of the adapter.
  • the test system may detect the output voltage of the adapter after instructing the adapter to enable the fast charging function, obtain a first real-time voltage, and then determine the voltage state of the adapter according to the first real-time voltage. ; After connecting the charging current corresponding to the fast charge function, the output current of the adapter can be detected to obtain the current change rate corresponding to the charging current, and then the current status of the adapter can be determined, so that the detection of the output status of the adapter can be obtained. result.
  • test system of the present application can directly detect the voltage state and current state of the adapter when communicating with the adapter, and then can reduce the number of detection instructions and simplify the detection process when detecting the output state of the adapter, so that it can Greatly improve detection efficiency and accuracy.
  • FIG. 1 is a schematic diagram of a fast charge communication process in an embodiment of the present application
  • FIG. 2 is a schematic flowchart of an output state test method according to an embodiment of the present application.
  • FIG. 3 is a schematic diagram of a test system in an embodiment of the present application.
  • Figure 4 is a schematic diagram of a test board
  • Figure 5 is a schematic diagram of the connection between the test system and the adapter
  • FIG. 6 is a first schematic structural diagram of a composition of a test system according to an embodiment of the present application.
  • FIG. 7 is a second schematic diagram of a composition structure of a test system according to an embodiment of the present application.
  • FIG. 8 is a third schematic diagram of a composition structure of a test system according to an embodiment of the present application.
  • a custom adapter and battery are required to implement the flash charge function.
  • a micro controller unit (MCU) smart chip is configured in the adapter for flash charge, so the adapter is Upgradeable smart charger.
  • FIG. 1 is a schematic diagram of a fast charge communication flow in the embodiment of the present application, as shown in FIG. 1.
  • the process of fast charging the terminal by the adapter mainly includes the following five stages:
  • Phase 1 The terminal detects the adapter type.
  • the adapter enables handshake communication between the adapter and the terminal.
  • the adapter sends an instruction to ask the terminal whether to enable the fast charging mode. After the terminal agrees to enable fast charging, the fast charging communication process enters phase 2.
  • the terminal can detect the type of the adapter through D + and D-.
  • the current absorbed by the terminal can be greater than a preset current value I2 .
  • the adapter detects that the output current of the adapter is greater than or equal to I2 within a preset time period, the adapter considers that the terminal has completed the identification of the adapter type, the adapter starts handshake communication between the adapter and the terminal, and the adapter sends an instruction to ask the terminal whether to enable the fast charging mode.
  • the adapter receives a response instruction from the terminal indicating that the terminal does not agree to enable the fast charging mode, it detects the output current of the adapter again.
  • Phase 2 The adapter sends another command to the terminal to inquire whether the output voltage of the adapter matches. After the terminal responds that the output voltage of the adapter is high, low, or matched, the adapter adjusts the output voltage until the output voltage is suitable.
  • the output voltage of the adapter can include multiple gears.
  • the adapter can send instructions to the terminal to ask the terminal whether the output voltage of the adapter is suitable as the charging voltage in the fast charging mode. If the adapter receives a high output voltage from the terminal or When the feedback is low, the adapter adjusts its output voltage by one division, and sends an instruction to the terminal again, asking again whether the output voltage of the terminal adapter matches.
  • Phase 3 The adapter sends another command to the terminal, asking the terminal for the maximum charging current currently supported, the terminal responds to the adapter's maximum charging current, and enters phase 4.
  • Phase 4 The adapter can set the output current to the maximum charging current currently supported by the terminal and enter the constant current phase, which is Phase 5.
  • Phase 5 When entering the constant current phase, the adapter can send another command every other time to query the current voltage of the terminal battery.
  • the terminal can feedback the current voltage of the terminal battery to the adapter.
  • the adapter can respond to the current voltage of the terminal battery based on the terminal. Feedback to determine whether the contact is good and whether the current charging current of the terminal needs to be reduced.
  • constant current phase does not mean that the output current of the adapter has remained constant during phase 5.
  • constant current is segmented constant current, that is, it remains unchanged for a period of time.
  • FIG. 2 is a schematic flowchart of an output state testing method according to an embodiment of the present application. As shown in FIG. 2, in the embodiment of the present application, The test method for the output state of the test system may include the following steps:
  • Step 101 After instructing the adapter to enable the fast charging function, a first instruction is received; wherein the first instruction is used to determine a state of the output voltage.
  • the test system receives the first instruction after instructing the adaption to enable the fast charge function.
  • the first instruction is used to determine a state of the output voltage.
  • the test system may receive the first instruction in a second stage of fast charging communication with the adapter.
  • the test system may be a system for performing parameter detection on the adapter.
  • FIG. 3 is a schematic diagram of a test system in an embodiment of the present application.
  • the test system may include a test board, an electronic load, and a host computer.
  • the test board may be connected to the electronic load and cooperate with it. Control the field-effect transistor (Metal-Oxide-Semiconductor, Field-Effect, Transistor, MOSFET, MOS) switch, so as to simulate the state of the terminal.
  • the test board may transmit various values of the detected adapter to the host computer, for example, the test board may report the output status of the detected adapter to the host computer.
  • FIG. 4 is a schematic diagram of the test board, as shown in FIG. 4, the test board may be integrated with MCU and MOS, where VBUS is the USB voltage GND is the power ground.
  • FIG. 5 is a schematic diagram of the connection between the test system and the adapter. As shown in FIG. For two-way communication.
  • the above-mentioned test system can simulate the process of fast charging the terminal by the adapter through connection and communication with the adapter, so that various parameters of the adapter can be directly tested without Then you need to get the parameter test results of the adapter through the oscilloscope.
  • the adapter may be used to quickly charge the terminal.
  • the adapter may be connected to the terminal through a USB interface.
  • the USB interface may be a common USB interface or a microUSB. Interface or Type C interface.
  • the power cable in the USB interface is used for charging the terminal by the foregoing adapter.
  • the power cable in the USB interface may be a VBus line and / or a ground cable in the USB interface.
  • the data line in the USB interface is used for the two-way communication between the adapter and the terminal.
  • the data line may be a D + line and / or a D- line in the USB interface.
  • the so-called two-way communication may refer to the information exchange between the adapter and the terminal.
  • the adapter may support a normal charging mode and a fast charging mode, wherein a charging current of the fast charging mode is greater than a charging current of the normal charging mode, that is, a charging speed of the fast charging mode is greater than the normal charging mode.
  • Charging speed in charging mode can be understood as a charging mode with a rated output voltage of 5V and a rated output current of 2.5A or less.
  • the power adapter output ports D + and D- can be shorted, while the fast charging mode
  • the lower power adapter can use D + and D- for communication and data exchange with the terminal.
  • the performance parameters of the adapter may include sending instructions. Time parameters, output voltage, output current, etc.
  • the output state corresponding to the adapter in the present application may include the output voltage and the output current, that is, the output state is used to characterize the charging capability of the adapter.
  • the adapter may send a clock signal to the test system through a data line in a USB interface, where the clock signal is used to indicate the adapter. And the timing of communication between the test system. Specifically, the adapter actively sends a clock signal to the test system, and the adapter can keep sending the clock signal throughout the connection with the test system, so that it can perform two-way communication with the test system under the control of the communication timing.
  • the communication sequence includes the instruction sending period of the adapter and the instruction receiving period of the adapter generated alternately.
  • the test system may receive a query sent by the adapter to confirm whether to start the fast charging mode.
  • the test system may respond to instruct the adapter to enable the fast charge function, or instruct the adapter not to enable the fast charge function. , But continue to charge through the normal charging mode, and can also instruct the above adapter to disconnect and end two-way communication.
  • the adapter may send the first command to the test system, where the first command may be used for Further determination of the above output voltage.
  • Step 102 In response to the first instruction, obtain a first real-time voltage and determine a voltage state according to the first real-time voltage.
  • the test system may obtain the first real-time voltage in response to the first instruction, and then further determine the voltage corresponding to the adapter according to the first real-time voltage. status.
  • the test system may perform real-time detection on the output voltage corresponding to the adapter, so as to obtain the real-time output voltage of the adapter, that is, the above First real-time voltage.
  • the first real-time voltage can be compared with a voltage suitable for fast charging, so that the voltage state can be obtained.
  • the above voltage states may include three states: high voltage, proper voltage, and low voltage.
  • Step 103 After accessing the charging current corresponding to the fast charging function, obtain a current change rate corresponding to the charging current, and determine a current state according to the current change rate.
  • the test system after the test system is connected to the charging current corresponding to the fast charging function, it can obtain a current change rate corresponding to the charging current, so that the current corresponding to the adapter can be determined according to the current change rate. status.
  • the test system may send the adapter to indicate the maximum current value that can be used for fast charging, and the adapter may transmit to the test system according to the maximum current value. recharging current.
  • the charging current may be detected in real time to determine the charging current. Change situation, namely the above-mentioned current change rate.
  • the adapter in stage 4 of performing fast charge communication, starts to perform the test system after receiving the maximum current value sent by the test system.
  • the output current changes in real time.
  • the output current of the adapter is continuously increasing, that is, the charging current connected to the test system is increasing. Therefore, the adapter can detect and obtain the current change rate. .
  • the test system after the test system detects and obtains the current change rate, it can further determine the current state corresponding to the adapter according to the current change rate. Specifically, the magnitude of the current change rate can be determined. A determination is made to determine whether the output current capability of the adapter meets the requirements.
  • the above-mentioned current state may include two states that meet a change requirement and a non-compliance with a change requirement.
  • Step 104 Obtain a test result of an output state corresponding to the adapter according to the voltage state and the current state.
  • the test system may further determine a detection result of the output state corresponding to the adapter according to the voltage state and the current state.
  • the output state of the adapter may include the voltage state corresponding to the output voltage and the current state corresponding to the output current.
  • the test result may include a test result of the output voltage and a test result of the output current. That is, the above test results can characterize the states of the output voltage and output current corresponding to the adapter.
  • An embodiment of the present application provides a method for testing an output state.
  • a test system receives a first instruction after instructing an adapter to enable a fast charge function; the first instruction is used to determine a state of an output voltage; and in response to the first instruction, Obtain the first real-time voltage and determine the voltage state according to the first real-time voltage; after accessing the charging current corresponding to the fast charge function, obtain the current change rate corresponding to the charging current, and determine the current state according to the current change rate; according to the voltage state and current Status to obtain the test result of the output status corresponding to the adapter.
  • the test system may detect the output voltage of the adapter after instructing the adapter to enable the fast charging function, obtain a first real-time voltage, and then determine the voltage state of the adapter according to the first real-time voltage. ; After connecting the charging current corresponding to the fast charge function, the output current of the adapter can be detected to obtain the current change rate corresponding to the charging current, and then the current status of the adapter can be determined, so that the detection of the output status of the adapter can be obtained. result.
  • test system of the present application can directly detect the voltage state and current state of the adapter when communicating with the adapter, and then can reduce the number of detection instructions and simplify the detection process when detecting the output state of the adapter, so that it can Greatly improve detection efficiency and accuracy.
  • the method for the test system to determine a voltage state according to the first real-time voltage may include the following steps:
  • Step 201 When the first real-time voltage is greater than a preset voltage threshold, determine that the voltage state is high.
  • Step 202 When the first real-time voltage is equal to a preset voltage threshold, determine that the voltage state is appropriate.
  • Step 203 When the first real-time voltage is less than a preset voltage threshold, determine that the voltage state is low.
  • the test system may determine the voltage state according to the first real-time voltage and a preset voltage threshold.
  • the preset voltage threshold is used to characterize the charging voltage corresponding to the fast charging function, that is, the matching charging voltage set by the test system that requires fast charging.
  • the batteries configured for different terminals may have different charging voltages suitable for fast charging under different environmental conditions and use conditions. Therefore, the above test system can be set in advance when the analog terminal communicates with the adapter.
  • a voltage value suitable for fast charging is the preset voltage threshold.
  • the test system may compare a preset voltage threshold set in advance for the first real-time voltage, so that the voltage state may be further determined according to a comparison result.
  • test system compares the preset real-time voltage preset voltage threshold, if the first real-time voltage is greater than the preset voltage threshold, the test The system can determine the above voltage state as high.
  • the test system after comparing the first real-time voltage with a preset voltage threshold preset by the test system, if the first real-time voltage is equal to the preset voltage threshold, then the test The system can determine the above voltage state as appropriate.
  • the test system after comparing the first real-time voltage with a preset voltage threshold preset by the test system, if the first real-time voltage is less than the preset voltage threshold, then the test The system can determine the above voltage state as low.
  • the state detection method may further include the following steps:
  • Step 105 Send a first response according to the voltage status.
  • the test system may send a first response according to the voltage state.
  • the first response carries the voltage state. Therefore, the first response can instruct the adapter how to adjust the output voltage to output a voltage that can be used for fast charging. .
  • the adapter after the adapter receives the first response carrying the voltage state sent by the test system, if the voltage state is appropriate, it indicates that the output voltage corresponding to the adapter is suitable for Fast charging, so the adapter can not adjust the output voltage.
  • the adapter after the adapter receives the first response carrying the voltage state sent by the test system, if the voltage state is partial or low, the adapter corresponding to the The output voltage is not suitable for fast charging, so the adapter needs to adjust the output voltage.
  • the test system when the voltage state is not suitable, performs an output state detection method after sending the first response according to the voltage state, that is, after step 105.
  • You can also include the following steps:
  • Step 106 Receive and respond to the first instruction again to obtain a second real-time voltage.
  • the test system may receive the first command again after sending the first response according to the voltage state, and respond The first command received again, and the output voltage corresponding to the adapter is detected again, so that the second real-time voltage can be obtained.
  • the adapter after the adapter receives the first response carrying the voltage state, if the voltage state is high or low, the adapter can adjust the output voltage. To make the output voltage suitable for fast charging.
  • the output voltage output by the adapter may include multiple gears. If the adapter receives feedback from the test system regarding whether the output voltage is high or low, the adapter sets the The output voltage is adjusted by one division, and the first instruction is sent to the test system again to inquire again whether the output voltage of the test system matches.
  • the adapter has adjusted the output voltage, so the output corresponding to the adapter can be re-adjusted.
  • the voltage is detected, so that the second real-time voltage can be obtained again.
  • Step 107 Determine the voltage state again according to the second real-time voltage until the voltage state is proper.
  • the test system may perform re-detection based on the second real-time voltage again. Determine the above voltage state until the above voltage state is appropriate.
  • the test system after the test system detects the output voltage corresponding to the adapter to obtain the second real-time voltage after charging, if the second real-time voltage obtained after re-detection is equal to the preset value, Voltage threshold, then the test system can re-determine that the voltage state is appropriate.
  • the test system after the test system detects the output voltage corresponding to the adapter to obtain the second real-time voltage after charging, if the second real-time voltage obtained by re-detection is greater than or less than the preset value, Voltage threshold, then the test system can re-determine whether the voltage state is high or low.
  • the test system may resend the response to the adapter according to the newly determined voltage state.
  • the adapter needs to continuously adjust the output voltage according to the first response until the voltage state is suitable.
  • An embodiment of the present application provides a method for testing an output state.
  • a test system receives a first instruction after instructing an adapter to enable a fast charge function; the first instruction is used to determine a state of an output voltage; and in response to the first instruction, Obtain the first real-time voltage and determine the voltage state according to the first real-time voltage; after accessing the charging current corresponding to the fast charge function, obtain the current change rate corresponding to the charging current, and determine the current state according to the current change rate; according to the voltage state and current Status to obtain the test result of the output status corresponding to the adapter.
  • the test system may detect the output voltage of the adapter after instructing the adapter to enable the fast charging function, obtain a first real-time voltage, and then determine the voltage state of the adapter according to the first real-time voltage. ; After connecting the charging current corresponding to the fast charge function, the output current of the adapter can be detected to obtain the current change rate corresponding to the charging current, and then the current status of the adapter can be determined, so that the detection of the output status of the adapter can be obtained. result.
  • test system of the present application can directly detect the voltage state and current state of the adapter when communicating with the adapter, and then can reduce the number of detection instructions and simplify the detection process when detecting the output state of the adapter, so that it can Greatly improve detection efficiency and accuracy.
  • the test system determines the voltage state again according to the second real-time voltage, and can read the voltage adjustment time after the voltage state is suitable;
  • the voltage adjustment time is a time when the adapter adjusts the first real-time voltage to the second real-time voltage, and then the test result of the output state may be generated according to the voltage adjustment time and a preset time threshold.
  • the test system simulates the fast charging communication between the terminal and the adapter.
  • the adapter can adjust the output voltage until the voltage state is a proper response.
  • the test system can record the state of the output voltage adjustment of the adapter, that is, read the voltage adjustment time required by the adapter to adjust the voltage state to a high or low voltage to an appropriate process, and then according to the The voltage adjustment time and the preset time threshold are described to determine the test result of the above output state.
  • the test result further includes whether the adapter meets a voltage adjustment requirement. Specifically, if the voltage adjustment time is less than or equal to the preset time threshold, the adapter may be considered to meet the voltage Adjustment requirements; if the voltage adjustment time is greater than the preset time threshold, the adapter may be considered to not meet the voltage adjustment requirements.
  • the test system may compare the second real-time voltage with the first real-time voltage to obtain a voltage adjustment mode, wherein the voltage adjustment mode Including step-up and step-down. Then, the test result of the output state may be generated according to the voltage state and the voltage adjustment mode.
  • the test system simulates the fast charging communication between the terminal and the adapter.
  • the adapter can perform step-up or step-down processing on the output voltage according to the above-mentioned voltage state. Specifically, if the above-mentioned voltage state is low, then the above-mentioned adapter needs to perform step-up process; For higher, then the above adapter needs to be stepped down.
  • the test system may compare the first real-time voltage and the second real-time voltage to obtain the voltage adjustment mode, that is, determine that the adapter is Whether to perform step-up processing or step-down processing, and then generate the test result according to the voltage adjustment mode and the voltage state.
  • the test result may further include whether the voltage adjustment mode corresponding to the adapter meets a voltage state. Specifically, if the voltage state is low and the first real-time voltage is less than the second real-time voltage, it can be determined that the adapter has performed a boost process according to the voltage state, that is, the voltage adjustment mode corresponding to the adapter meets the voltage state. .
  • the test system simulates the process of fast charging communication between the terminal and the adapter.
  • a third instruction may be received, wherein the third instruction is used to determine a voltage state in a constant current charging phase.
  • the third real-time voltage can be obtained in response to the third instruction.
  • the test system may detect the charging current; when the charging current is greater than or equal to the preset current upper limit, the test system may send the pre-charge to the adapter.
  • the current upper limit is set so that the charging current can be updated according to the preset current upper limit.
  • the test system may receive the third instruction sent by the adapter and used to determine a voltage state in a constant current charging phase.
  • the test system may respond to the third instruction and perform real-time detection on the voltage to obtain the third real-time voltage. If the third real-time voltage is greater than or equal to a preset fast charging voltage, and the detected charging current is greater than or equal to the preset current When the upper limit is reached, then the test system may send the preset current upper limit to the adapter to control the adapter to control the output current according to the preset current upper limit.
  • the preset fast charging voltage and the preset current upper limit are two parameters corresponding to each other.
  • the test system performs real-time detection on the voltage to obtain the third real-time voltage.
  • V1 if V1 is greater than or equal to the preset fast charging voltage V2, and the detected charging current I1 is greater than or equal to the preset current upper limit I2, then the test system may send I2 to the adapter to control the adapter according to The above I2 controls the output current; if V1 is greater than or equal to the preset fast charging voltage V3 and the detected charging current I1 is greater than or equal to the preset current upper limit I3, then the test system may send I3 to the adapter, To control the adapter to control the output current according to the I3.
  • the test system may respond to the third instruction and detect a voltage change parameter according to a preset time period. If the voltage change parameter is greater than or equal to a preset abrupt change When the threshold is reached, a shutdown instruction is sent to the adapter, and then a shutdown response corresponding to the shutdown instruction can be received. For example, when the above-mentioned test system detects a voltage combination ⁇ 4.396, 3.484 ⁇ that is greater than or equal to a preset mutation threshold, it can be considered that the voltage has abruptly changed, so the voltage combination ⁇ 4.396, 3.484 ⁇ and a shutdown instruction can be sent to the adapter.
  • the above-mentioned test system needs to perform real-time detection of voltage changes during fast charging. Specifically, the above-mentioned test system can detect the change of voltage according to a preset time period to obtain For the voltage change parameter, if the voltage change parameter is greater than or equal to a preset sudden change threshold, it can be considered that a sudden change occurs in the voltage, and the test system needs to notify charging, so a shutdown instruction can be sent to the adapter.
  • the test system may obtain a shutdown time for turning off charging, where the shutdown time may be used for Characterize the response time of the adapter to the shutdown command.
  • the test system may generate a test result of the output state according to the shutdown time and a preset shutdown threshold.
  • the test result may further include whether the adapter can quickly respond to a shutdown instruction. Specifically, if the shutdown time is less than or equal to the preset shutdown threshold, the test system may consider that the adapter can quickly respond to the received shutdown command; if the shutdown time is greater than the preset shutdown threshold, then the above The test system can consider that the time required for the adapter to respond to the received shutdown command does not meet the requirements.
  • the test system can respond The third instruction sends reset query information to the adapter, where the reset query information is used to determine a reset state of the adapter. Then, a reset response corresponding to the reset query information sent by the adapter may be received, where the reset response is used to characterize a reset status corresponding to the adapter.
  • the test system accesses a charging current corresponding to the fast charging function, and After performing the constant current charging, the test system may detect a current change parameter corresponding to the charging current, and then may generate a test result of the output state according to the current change parameter and a preset control accuracy.
  • the test result may further include whether the adapter meets the accuracy of current control. Specifically, if the current change parameter is less than or equal to the preset control accuracy, the test system may consider that the adapter can meet the accuracy of the current control; if the current change parameter is greater than the preset control accuracy, the test system may It can be considered that the above-mentioned adapter cannot satisfy the accuracy of current control.
  • the test system obtains the voltage state and the current state according to the voltage state and the current state.
  • the test system can receive the disconnect request sent by the adapter, wherein the disconnect request carries the power disconnect time corresponding to the adapter. , Then the test system can respond to the disconnect request and disconnect from the adapter.
  • the disconnection time may be recorded, and then according to the power-off time and the disconnection, The connection time determines the disconnection time interval corresponding to the adapter, that is, the time interval between the disconnection of the external power supply and the disconnection of the communication with the test system from the adapter. After the test system determines the disconnection time interval, the test system may generate a test result of the output state according to the disconnection time interval and a preset interval threshold.
  • the test result may further include whether the adapter can quickly disconnect the communication connection. Specifically, if the disconnection time interval is less than or equal to the preset interval threshold value, the test system may consider that the adapter can satisfy the fast disconnection of the communication connection; if the disconnection time interval is greater than the preset interval threshold value, then the above The test system can conclude that the aforementioned adapter cannot quickly disconnect the communication connection.
  • the charging current when the test system acquires the current change rate corresponding to the charging current, the charging current may be detected in real time according to a preset preset time interval to obtain the above. Rate of current change.
  • the test system may set an interval time for detecting a change in current, that is, the preset time interval.
  • the test system may preset the preset time interval as 1s, after the test system is connected to the charging current, the charging current can be detected every 1s, and then the current change rate corresponding to the charging current is further obtained.
  • the method for determining the current state by the test system according to the current change rate may include the following steps:
  • Step 301 When the current change rate is less than or equal to a preset rate threshold, determine that the current state is in compliance with the change requirement.
  • the test system may determine the current Status is in compliance with change requirements.
  • the test system may first set a lower limit value of the change rate, that is, the preset rate threshold, so as to determine whether the output current of the adapter is based on the preset rate threshold. Satisfy the current change conditions of fast charge.
  • the current change rate can be compared with the preset rate threshold, so that the current state corresponding to the adapter can be determined according to the comparison result. Compliance with change requirements. Specifically, in the embodiment of the present application, the above is the process in which the adapter slowly raises the current to the preset current threshold, and the current change rate corresponding to the charging current should be lower than the preset rate threshold.
  • test system compares the current change rate with the preset rate threshold, if the current change rate is less than or equal to the preset rate threshold, the test The system can consider that the change in the output current of the adapter meets the requirements of fast charge, so it is determined that the current state meets the change requirement.
  • Step 302 When the current change rate is greater than a preset rate threshold, determine that the current state does not meet the change requirement.
  • the test system may determine that the current state is a non-compliant change. Claim.
  • the current change rate may be compared with the preset rate threshold, so that the current corresponding to the adapter may be determined according to a comparison result. Whether the status meets the change requirements.
  • test system compares the current change rate with the preset rate threshold, if the current change rate is greater than the preset rate threshold, the test system can It is considered that the change in the output current of the adapter does not meet the requirements of fast charge, so it is determined that the current state does not meet the change requirement.
  • a method for performing an output state test by the test system may include the following: step:
  • Step 107 Receive a second instruction.
  • the second instruction is used to query an upper limit value of the charging current.
  • the test system may first receive a second instruction.
  • the second instruction is used by the adapter to query the upper limit value of the charging current, that is, to determine the maximum charging current corresponding to the fast charging.
  • the test system may receive the second instruction in the above stage 3 during the process of simulating fast charging communication between the terminal and the adapter.
  • Step 108 In response to the second instruction, send a preset current threshold value, where the preset current threshold value is used to determine the charging current.
  • the test system may send the preset current threshold value set in advance to the adapter in response to the second instruction.
  • the preset current threshold is used to determine the charging current, and the preset current threshold may be used to characterize a maximum charging current of the adapter when performing fast charging.
  • the charging currents suitable for fast charging may be different under different environmental conditions and use conditions. Therefore, the test system described above simulates the terminal and When the adapter performs communication, a maximum current value suitable for fast charging, that is, the preset current threshold value may be set in advance.
  • the adapter can quickly charge the test system according to the preset current threshold.
  • An embodiment of the present application provides a method for testing an output state.
  • a test system receives a first instruction after instructing an adapter to enable a fast charge function; the first instruction is used to determine a state of an output voltage; and in response to the first instruction, Obtain the first real-time voltage and determine the voltage state according to the first real-time voltage; after accessing the charging current corresponding to the fast charge function, obtain the current change rate corresponding to the charging current, and determine the current state according to the current change rate; according to the voltage state and current Status to obtain the test result of the output status corresponding to the adapter.
  • the test system may detect the output voltage of the adapter after instructing the adapter to enable the fast charging function, obtain a first real-time voltage, and then determine the voltage state of the adapter according to the first real-time voltage. ; After connecting the charging current corresponding to the fast charge function, the output current of the adapter can be detected to obtain the current change rate corresponding to the charging current, and then the current status of the adapter can be determined, so that the detection of the output status of the adapter can be obtained. result.
  • test system of the present application can directly detect the voltage state and current state of the adapter when communicating with the adapter, and then can reduce the number of detection instructions and simplify the detection process when detecting the output state of the adapter, so that it can Greatly improve detection efficiency and accuracy.
  • FIG. 6 is a schematic structural diagram 1 of a test system according to the embodiment of the present application.
  • the test system 1 may include a receiving section. 11, acquisition section 12, determination section 13, transmission section 14.
  • the receiving section 11 is configured to receive a first instruction after instructing the adapter to enable the fast charging function, wherein the first instruction is used to determine a state of an output voltage.
  • the obtaining section 12 is configured to obtain a first real-time voltage in response to the first instruction.
  • the determining section 13 is configured to determine a voltage state according to the first real-time voltage.
  • the obtaining section 12 is further configured to obtain a current change rate corresponding to the charging current after accessing a charging current corresponding to the fast charging function.
  • the determining section 13 is further configured to determine a current state according to the current change rate.
  • the obtaining section 12 is further configured to obtain a test result of an output state corresponding to the adapter according to the voltage state and the current state.
  • the determining section 13 is specifically configured to determine that the voltage state is high when the first real-time voltage is greater than a preset voltage threshold; and when the first real-time voltage is high; When the voltage is equal to the preset voltage threshold, it is determined that the voltage state is appropriate; and when the first real-time voltage is less than the preset voltage threshold, it is determined that the voltage state is low.
  • the sending section 14 is configured to respond to the first instruction, obtain a first real-time voltage, and determine a voltage state according to the first real-time voltage, and then send according to the voltage state. A first response; wherein the first response carries the voltage state.
  • the receiving section 11 is further configured to: when the voltage status is not appropriate, after receiving a first response according to the voltage status, receive and respond to the first instruction again to obtain a second real-time voltage.
  • the determining section 13 is further configured to determine the voltage state again according to the second real-time voltage until the voltage state is proper.
  • the obtaining section 12 is specifically configured to detect the charging current in real time according to a preset time interval to obtain the current change rate.
  • the determining section 13 is specifically configured to determine that the current state meets a change requirement when the current change rate is less than or equal to a preset rate threshold; and when the current change rate is less than the preset rate threshold, It is determined that the current state does not meet the change requirement.
  • the receiving section 11 is further configured to receive a second instruction; wherein the second instruction is used to query an upper limit value of the charging current.
  • the sending section 14 is further configured to send a preset current threshold value in response to the second instruction, wherein the preset current threshold value is used to determine the charging current.
  • the obtaining section 12 is further configured to determine the voltage state again according to the second real-time voltage, and read the voltage adjustment time until the voltage state is suitable;
  • the voltage adjustment time is a time for the adapter to adjust the first real-time voltage to the second real-time voltage.
  • the determining section 13 is further configured to generate a test result of the output state according to the voltage adjustment time and a preset time threshold.
  • the obtaining section 12 is further configured to obtain a voltage adjustment mode after comparing the second real-time voltage and the first real-time voltage after obtaining a second real-time voltage, wherein the voltage adjustment mode includes step-up and step-down.
  • the determining section 13 is further configured to generate a test result of the output state according to the voltage state and the voltage adjustment mode.
  • FIG. 7 is a second schematic diagram of the composition and structure of a test system according to an embodiment of the present application. As shown in FIG.
  • the receiving section 11 is further configured to receive a third instruction after accessing a charging current corresponding to the fast charging function, wherein the third instruction is used to determine a voltage state in a constant current charging stage.
  • the obtaining section 12 is further configured to obtain a third real-time voltage in response to the third instruction.
  • the detecting section 15 is configured to detect the charging current when the third real-time voltage is greater than or equal to a first preset fast charging voltage.
  • the sending section 14 is further configured to: when the charging current is greater than or equal to a first preset current upper limit, send the first preset current upper limit to the adapter to update according to the first preset current upper limit. Said charging current.
  • the detecting section 15 is further configured to detect a voltage change parameter according to a preset time period after receiving a third instruction in response to the third instruction.
  • the sending section 14 is further configured to send a shutdown instruction when the voltage change parameter is greater than or equal to a preset sudden change threshold.
  • the receiving section 11 is further configured to receive a shutdown response corresponding to the shutdown instruction.
  • the obtaining section 12 is further configured to obtain a closing time after receiving a closing response corresponding to the closing instruction; wherein the closing time is used to represent a response time of the adapter to the closing instruction.
  • the determining section 13 is further configured to generate a test result of the output state according to the closing time and a preset closing threshold.
  • the sending section 14 is further configured to, after receiving the shutdown response corresponding to the shutdown instruction, send the reset query information in response to the third instruction when receiving the third instruction again.
  • the receiving section 11 is further configured to receive a reset response corresponding to the reset query information, wherein the reset response is used to characterize a reset status corresponding to the adapter.
  • the detecting section 15 is further configured to detect a charging current corresponding to the charging current after the charging current corresponding to the fast charging function is connected and after the constant current charging is performed. Current change parameter.
  • the determining section 13 is further configured to generate a test result of the output state according to the current change parameter and a preset control accuracy.
  • the receiving section 11 is further configured to receive a disconnection request before obtaining a test result of an output state corresponding to the adapter according to the voltage state and the current state; wherein , The disconnection request carries a power disconnection time corresponding to the adapter.
  • the disconnection section 16 is configured to disconnect from the adapter in response to the disconnection request.
  • the recording section 17 is configured to record the disconnection time after disconnecting from the adapter in response to the disconnection request.
  • the determining section 13 is further configured to determine a disconnection time interval according to the power-off time and the disconnection time; and generate the output status of the output state according to the disconnection time interval and a preset interval threshold. Test Results.
  • FIG. 8 is a third structural schematic diagram of a test system according to an embodiment of the present application.
  • the test system 1 may further include a test board 18, a host computer 19, and an electronic load 110.
  • the test board is integrated with a processor and a memory storing instructions executable by the processor.
  • the test system 1 may further include a communication interface 111 and a bus 112 for connecting the test board 18, the host computer 19, the electronic load 110, and the communication interface 111.
  • a processor and a memory may also be integrated into the upper computer 19, and the functions of the processor and the memory in the test board 18 are the same.
  • the processor may be an Application Specific Integrated Circuit (ASIC), a Digital Signal Processor (DSP), or a Digital Signal Processing Device (DSPD). , Programmable logic device (ProgRAMmable, Logic Device, PLD), Field programmable gate array (Field, ProgRAMmable, Array, FPGA), Central Processing Unit (CPU), Controller, Microcontroller, Microprocessor At least one. It can be understood that, for different devices, the electronic device used to implement the processor function may be other, which is not specifically limited in the embodiment of the present application.
  • ASIC Application Specific Integrated Circuit
  • DSP Digital Signal Processor
  • DSPD Digital Signal Processing Device
  • Programmable logic device ProgRAMmable, Logic Device, PLD
  • Field programmable gate array Field, ProgRAMmable, Array, FPGA
  • CPU Central Processing Unit
  • Controller Microcontroller
  • Microprocessor At least one. It can be understood that, for different devices, the electronic device used to implement the processor function may be other, which is not specifically limited in the embodiment of the present application
  • the test system 1 may further include a memory, which may be connected to a processor, where the memory is used to store executable program code, the program code includes computer operation instructions, and the memory may include a high-speed RAM memory or a non-volatile memory. Memory, for example, at least two disk memories.
  • the memory is configured to store instructions and data.
  • the processor is configured to receive a first instruction after instructing the adapter to enable the fast charging function; wherein the first instruction is used to determine a state of the output voltage;
  • the first instruction obtains a first real-time voltage and determines a voltage state according to the first real-time voltage; after accessing a charging current corresponding to the fast charging function, obtaining a current change rate corresponding to the charging current, and
  • the current change rate determines the current state; according to the voltage state and the current state, a test result of the output state corresponding to the adapter is obtained.
  • the foregoing memory may be a volatile first memory (volatile memory), such as a random access first memory (Random-Access Memory, RAM); or a non-volatile first memory (non-volatile memory)
  • volatile first memory such as a random access first memory (Random-Access Memory, RAM)
  • non-volatile first memory non-volatile memory
  • read-only memory Read-Only Memory
  • flash memory flash memory
  • hard disk Hard Disk Drive, HDD
  • SSD solid-state drive
  • the functional modules in this embodiment may be integrated into one processing unit, or each unit may exist separately physically, or two or more units may be integrated into one unit.
  • the above integrated unit may be implemented in the form of hardware or in the form of software functional modules.
  • the integrated unit is implemented in the form of a software functional module and is not sold or used as an independent product, it can be stored in a computer-readable storage medium.
  • the technical solution of this embodiment is essentially Part of the prior art contribution or all or part of the technical solution can be embodied in the form of a software product.
  • the computer software product is stored in a storage medium and includes several instructions to make a computer device (which can be a personal A computer, a server, or a network device) or a processor executes all or part of the steps of the method in this embodiment.
  • the foregoing storage media include: U disks, mobile hard disks, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks, which can store program codes.
  • a test system receives a first instruction after instructing the adapter to enable the fast charging function.
  • the first instruction is used to determine a state of an output voltage.
  • a first A real-time voltage and the voltage state are determined according to the first real-time voltage; after the charging current corresponding to the fast charge function is connected, the current change rate corresponding to the charging current is obtained, and the current state is determined according to the current change rate; according to the voltage state and current state, Obtain the test result of the output status corresponding to the adapter.
  • the test system may detect the output voltage of the adapter after instructing the adapter to enable the fast charging function, obtain a first real-time voltage, and then determine the voltage state of the adapter according to the first real-time voltage. ; After connecting the charging current corresponding to the fast charge function, the output current of the adapter can be detected to obtain the current change rate corresponding to the charging current, and then the current status of the adapter can be determined, so that the detection of the output status of the adapter can be obtained. result.
  • test system of the present application can directly detect the voltage state and current state of the adapter when communicating with the adapter, and then can reduce the number of detection instructions and simplify the detection process when detecting the output state of the adapter, so that it can Greatly improve detection efficiency and accuracy.
  • An embodiment of the present application provides a first computer-readable storage medium on which a program is stored, and when the program is executed by a processor, the test method for output states described above is implemented.
  • the program instructions corresponding to an output state test method in this embodiment may be stored on a storage medium such as an optical disc, a hard disk, a USB flash drive, and the like.
  • a storage medium such as an optical disc, a hard disk, a USB flash drive, and the like.
  • the embodiments of the present application may be provided as a method, a system, or a computer program product. Therefore, this application may take the form of a hardware embodiment, a software embodiment, or an embodiment combining software and hardware aspects. Moreover, the present application may take the form of a computer program product implemented on one or more computer-usable storage media (including, but not limited to, disk storage, optical storage, and the like) containing computer-usable program code.
  • a computer-usable storage media including, but not limited to, disk storage, optical storage, and the like
  • These computer program instructions may be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing device to produce a machine, so that the instructions generated by the processor of the computer or other programmable data processing device are used to generate instructions Means for realizing the functions specified in a process flow diagram or a plurality of flow diagrams and / or a block diagram or a block or flow diagrams of the block diagram.
  • These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to work in a particular manner such that the instructions stored in the computer-readable memory produce a manufactured article including an instruction device, the instructions
  • the device implements the functions specified in the implementation flow diagram, one flow or multiple flows, and / or the block diagram, one block or multiple blocks.
  • These computer program instructions can also be loaded on a computer or other programmable data processing device, so that a series of steps can be performed on the computer or other programmable device to produce a computer-implemented process, which can be executed on the computer or other programmable device.
  • the instructions provide steps for implementing the functions specified in implementing one or more of the flowcharts and / or one or more of the block diagrams of the block diagrams.
  • the embodiments of the present application provide a method and a system for testing an output state, and a computer storage medium.
  • the test system receives a first instruction after instructing the adapter to enable the fast charging function, wherein the first instruction is used to perform a state of the output voltage. OK; in response to the first instruction, obtain the first real-time voltage and determine the voltage state according to the first real-time voltage; after accessing the charging current corresponding to the fast charge function, obtain the current change rate corresponding to the charging current, and determine the current according to the current change rate State; according to the voltage state and current state, obtain the test result of the corresponding output state of the adapter.
  • the test system may detect the output voltage of the adapter after instructing the adapter to enable the fast charging function, obtain a first real-time voltage, and then determine the voltage state of the adapter according to the first real-time voltage. ; After connecting the charging current corresponding to the fast charge function, the output current of the adapter can be detected to obtain the current change rate corresponding to the charging current, and then the current status of the adapter can be determined, so that the detection of the output status of the adapter can be obtained. result.
  • test system of the present application can directly detect the voltage state and current state of the adapter when communicating with the adapter, and then can reduce the number of detection instructions and simplify the detection process when detecting the output state of the adapter, so that it can Greatly improve detection efficiency and accuracy.

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Abstract

本申请实施例公开了一种输出状态的测试方法和系统、及计算机存储介质，上述测试方法包括：在指示适配器开启快充功能之后，接收第一指令；其中，第一指令用于对输出电压的状态进行确定；响应第一指令，获取第一实时电压并根据第一实时电压确定电压状态；在接入快充功能对应的充电电流之后，获取充电电流对应的电流变化速率，并根据电流变化速率确定电流状态；根据电压状态和电流状态，获得适配器对应的输出状态的测试结果。

Description

一种输出状态的测试方法和系统、及计算机存储介质 技术领域
本申请实施例涉及终端领域的充电技术，尤其涉及一种输出状态的测试方法和系统、及计算机存储介质。
背景技术
快速充电技术，可以通过适配器采用分段恒流的方式为终端的电池进行充电，从而可以在保证安全可靠的前提下进行快速充电，大大提高了终端的充电速度。其中，在进行快速充电时，由于需要适配器与终端进行双向通信，因此适配器输出状态，即输出电压和输出电流，会对闪充的效果具有一定影响。
现有技术中，通过示波器对适配器的输出状态进行检测时，检测指令数量大且检测过程复杂，检测效率低、精度差。
发明内容
本申请实施例提供一种输出状态的测试方法和系统、及计算机存储介质，在对适配器进行输出状态的检测时，能够减少检测指令数量，简化检测过程，从而可以大大提高检测效率和精度。
本申请实施例的技术方案是这样实现的：
本申请实施例提供了一种输出状态的测试方法，所述方法包括：
在指示适配器开启快充功能之后，接收第一指令；其中，所述第一指令用于对输出电压的状态进行确定；
响应所述第一指令，获取第一实时电压并根据所述第一实时电压确定电压状态；
在接入所述快充功能对应的充电电流之后，获取所述充电电流对应的电流变化速率，并根据所述电流变化速率确定电流状态；
根据所述电压状态和所述电流状态，获得所述适配器对应的输出状态的测试结果。
本申请实施例提供了一种输出状态的测试方法和系统、及计算机存储介质，测试系统在指示适配器开启快充功能之后，接收第一指令；其中，第一指令用于对输出电压的状态进行确定；响应第一指令，获取第一实时电压并根据第一实时电压确定电压状态；在接入快充功能对应的充电电流之后，获取充电电流对应的电流变化速率，并根据电流变化速率确定电流状态；根据电压状态和电流状态，获得适配器对应的输出状态的测试结果。由此可见，在本申请的实施例中，测试系统可以在指示适配器开启快充功能之后，可以对适配器的输出电压检测，获得第一实时电压，然后根据第一实时电压确定出适配器的电压状态；还可以在接入快充功能对应的充电电流之后，对适配器的输出电流进行检测，获得充电电流对应的电流变化速率，然后确定出适配器的电流状态，从而便可以获得适配器的输出状态的检测结果。正是由于本申请的测试系统可以在与适配器进行通信时直接对适配器进行电压状态和电流状态的检测，进而在对适配器进行输出状态的检测时，能够减少检测指令数量，简化检测过程，从而可以大大提高检测效率和精度。
附图说明
图1为本申请实施例中快充通信流程示意图；
图2为本申请实施例提出的一种输出状态的测试方法的实现流程示意图；
图3为本申请实施例中测试系统的示意图；
图4为测试小板的示意图；
图5为测试系统与适配器的连接示意图；
图6为本申请实施例提出的测试系统的组成结构示意图一；
图7为本申请实施例提出的测试系统的组成结构示意图二；
图8为本申请实施例提出的测试系统的组成结构示意图三。
具体实施方式
下面将结合本申请实施例中的附图，对本申请实施例中的技术方案进行清楚、完整地描述。可以理解的是，此处所描述的具体实施例仅仅用于解释相关申请，而非对该申请的限定。另外还需要说明的是，为了便于描述，附图中仅示出了与有关申请相关的部分。
终端在进行快速充电时，需要通过定制的适配器和电池来实现闪充的功能，一般情况下，用于闪充的适配器中配置有微控制单元(Microcontroller Unit，MCU)智能芯片，因此该适配器为可以升级的智能充电器。
进一步地，在本申请的实施例中，图1为本申请实施例中快充通信流程示意图，如图1所示。适配器在对终端进行快速充电的过程主要可以包括以下五个阶段：
阶段1：终端检测适配器类型，适配器开启适配器与终端之间的握手通信，适配器发送一指令询问终端是否开启快速充电模式，当终端同意开启快充后，快充通信流程进入阶段2。
其中，终端可以通过D+、D-检测适配器类型，当检测到适配器为非通过通用串行总线(Universal Serial Bus，USB)类型的充电装置时，则终端吸收的电流可以大于一个预设电流值I2。当适配器检测到预设时长内适配器输出电流大于或等于I2时，则适配器认为终端对于适配器类型识别已经完成，适配器开启适配器与终端之间的握手通信，适配器发送指令询问终端是否开启快速充电模式。当适配器收到终端的回复指令指示终端不同意开启快速充电模式时，则再次检测适配器的输出电流，当适配器的输出电流仍然大于或等于I2时，再次发起请求，询问终端是否开启快速充电模式，重复阶段1的上述步骤，直到终端答复同意开启快速充电模式，或适配器的输出电流不再满足大于或等于I2的条件。
阶段2：适配器向终端发送又一指令，询问适配器的输出电压是否匹配，终端答复适配器其输出电压偏高、偏低或匹配后，适配器调整输出电压，直到输出电压合适。
其中，适配器输出的电压可以包括多个档位，适配器可以向终端发送指令询问终端述适配器的输出电压是否适合作为快速充电模式下的充电电压，如果适配器接收到终端关于适配器的输出电压偏高或偏低的反馈时，则适配器将其输出电压调整一格档位，并再次向终端发送指令，重新询问终端适配器的输出电压是否匹配。
阶段3：适配器向终端发送再一指令，询问终端当前支持的最大充电电流，终端答复适配器最大充电电流，并进入阶段4。
阶段4：适配器可以设置输出电流为终端当前支持的最大充电电流，进入恒流阶段，即阶段5。
阶段5：当进入恒流阶段时，适配器可以每间隔一段时间发送一次另一指令，询问终端电池的当前电压，终端可以向适配器反馈终端电池的当前电压，适配器可以根据终端关于终端电池的当前电压的反馈，判断接触是否良好以及是否需要降低终端当前的充电电流值。
需要说明的是，恒流阶段并非指适配器的输出电流在阶段5一直保持不变，所谓恒流是分段恒流，即在一段时间内保持不变。
正是由于快速充电是通过适配器与终端建立双向通信来对终端进行分段恒流充电实现的，因此，适配器发送指令的各项参数都对闪充的效果有着很大的影响，对适配器发送指令的参数进行检测就尤为重要。
下面将结合本申请实施例中的附图，对本申请实施例中的技术方案进行清楚、完整地描述。
本申请一实施例提供了一种输出状态的测试方法，图2为本申请实施例提出的一种输出状态的测试方法的实现流程示意图，如图2所示，在本申请的实施例中，上述测试系统进行输出状态的测试方法可以包括以下步骤：
步骤101、在指示适配器开启快充功能之后，接收第一指令；其中，第一指令用于对输出电压的状态进行确定。
在本申请的实施例中，上述测试系统在指示上述适配开启快充功能之后，接收第一指令。
需要说明的是，在本申请的实施例中，上述第一指令用于对输出电压的状态进行确定。
进一步地，基于上述图1，上述测试系统可以在与上述适配器进行快充通信的第二阶段接收上述第一指令。
需要说明的是，在本申请的实施例中，上述测试系统可以为对上述适配器进行参数检测的一种系统。图3为本申请实施例中测试系统的示意图，如图3所示，测试系统可以包括测试小板、电子负载以及上位机，其中，测试小板可以与电子负载连接并进行配合，同时可以通过控制场效应管(Metal-Oxide-Semiconductor Field-Effect Transistor，MOSFET，MOS)开关，从而便可以模拟终端的状态。具体地，在本申请的实施例中，测试小板可以将检测到的适配器的各项数值传输至上位机，例如，测试小板可以将检测到的适配器的输出状态上报给上位机。
需要说明的是，在本申请的实施例中，基于上述图2，图4为测试小板的示意图，如图4所示，测试小板中可以集成有MCU和MOS，其中，VBUS为USB电压，GND为电源地。
进一步地，在本申请的实施例中，基于上述图2，图5为测试系统与适配器的连接示意图，如图5所示，测试系统中的测试小板可以与适配器进行连接，并且可以与适配器进行双向通信。
需要说明的是，在本申请的实施例中，上述测试系统可以通过与上述适配器的连接和通信，模拟适配器对终端进行快充的过程，从而可以直接对适配器的各项参数进行测试，而不再需要通过示波器获取适配器的参数测试结果。
进一步地，在本申请的实施例中，上述适配器可以用于对终端进行快速充电，具体地，上述适配器与终端可以通过USB接口相连，该USB接口可以是普通的USB接口，也可以是micro USB接口或Type C接口等。USB接口中的电源线用于上述适配器为终端充电，其中，USB接口中的电源线可以是USB接口中的VBus线和/或地线。USB接口中的数据线用于上述适配器和终端进行双向通信，该数据线可以是USB接口中的D+线和/或D-线，所谓双向通信可以指适配器和终端双方进行信息的交互。
进一步地，在本申请的实施例中，上述适配器可以支持普通充电模式和快速充电模式，其中，快速充电模式的充电电流大于普通充电模式的充电电流，即快速充电模式的充电速度大于所述普通充电模式的充电速度。一般而言，普通充电模式可以理解为额定输出电压为5V，额定输出电流小于等于2.5A的充电模式，此外，在普通充电模式下， 电源适配器输出端口D+和D-可以短路，而快速充电模式下电源适配器可以利用D+和D-与终端进行通信和数据交换。
需要说明的是，在本申请的实施例中，由于上述适配器对终端快充的效果有着较为决定性的作用，因此，对适配器的性能参数测试尤为重要，其中，适配器的性能参数可以包括发送指令的时间参数、输出电压、输出电流等。其中，本申请中的上述适配器对应的上述输出状态可以包括上述输出电压和上述输出电流，即上述输出状态用于表征上述适配器的充电能力。
需要说明的是，在本申请的实施例中，上述测试系统在与上述适配器建立连接之后，上述适配器可以通过USB接口中的数据线向测试系统发送时钟信号，其中，时钟信号用于指示上述适配器和测试系统之间的通信时序。具体地，上述适配器主动向测试系统发送时钟信号，且上述适配器可以在与测试系统连接的整个过程中保持该时钟信号的发送，从而便可以在该通信时序的控制下与测试系统进行双向通信。
进一步地，在本申请的实施例中，通信时序包括交替产生的上述适配器的指令发送时段和上述适配器的指令接收时段。
进一步地，在本申请的实施例中，上述测试系统在与上述适配器建立连接之后，便可以接收由上述适配器发送的确认是否开始快充模式的询问。
进一步地，在本申请的实施例中，上述测试系统在接收是否开始快充模式的询问之后，便可以进行响应，指示上述适配器开启上述快充功能，或者指示上述适配器不开启上述快充功能饿，而是继续通过普通充电模式进行充电，还可以指示上述适配器断开连接，结束双向通信。
需要说明的是，在本申请的实施例中，上述测试系统如果指示上述适配器开启快充功能，那么上述适配器便可以向上述测试系统发送上述第一指令，其中，上述第一指令可以用于对上述输出电压的进一步确定。
步骤102、响应第一指令，获取第一实时电压并根据第一实时电压确定电压状态。
在本申请的实施例中，上述测试系统在接收上述第一指令之后，便可以响应上述第一指令，获取上述第一实时电压，然后可以根据上述第一实时电压进一步确定上述适配器对应的上述电压状态。
需要说明的是，在本申请的实施例中，上述测试系统在接收到上述第一指令之后，可以对上述适配器对应的输出电压进行实时检测，从而便可以获得上述适配器的实时输出电压，即上述第一实时电压。
进一步地，在本申请的实施例中，上述测试系统在检测获得上述第一实时电压之后，可以将上述第一实时电压与适合进行快充的电压进行比较，从而便可以获得上述电压状态。
需要说明的是，在本申请的实施例中，上述电压状态可以包括电压偏高、电压合适以及电压偏低三种状态。
步骤103、在接入快充功能对应的充电电流之后，获取充电电流对应的电流变化速率，并根据所述电流变化速率确定电流状态。
在本申请的实施例中，上述测试系统在接入上述快充功能对应的充电电流之后，可以获取上述充电电流对应的电流变化速率，从而可以根据所述电流变化速率确定出适配器对应的上述电流状态。
需要说明的是，在本申请的实施例中，上述测试系统可以向所述适配器发送用于指示可以用于进行快充的最大电流值，上述适配器便可以根据该最大电流值向上述测试系统传输充电电流。
进一步地，在本申请的实施例中，上述测试系统在接入上述适配器传输的、与上述 快充功能对应的上述充电电流之后，可以对上述充电电流进行实时检测，从而确定出上述充电电流的变化情况，即上述电流变化速率。
需要说明的是，在本申请的实施例中，基于上述图1，在进行快充通信的阶段4中，上述适配器在接收到上述测试系统发送的最大电流值之后，在对上述测试系统开始进行快充时，输出电流在实时的变化，具体地，上述适配器的输出电流在不断的增大，即上述测试系统接入的充电电流在不断增大，因此，上述适配器可以检测获得上述电流变化速率。
进一步地，在本申请的实施例中，上述测试系统在检测获得上述电流变化速率之后，便可以根据上述电流变化速率进一步确定上述适配器对应的电流状态，具体地，可以对上述电流变化速率的大小进行判定，以确定出上述适配器的输出电流的能力是否符合要求。
需要说明的是，在本申请的实施例中，上述电流状态可以包括符合变化要求和不符合变化要求两种状态。
步骤104、根据电压状态和电流状态，获得适配器对应的输出状态的测试结果。
在本申请的实施例中，上述测试系统在确定上述电压状态和上述电流状态之后，便可以进一步根据上述电压状态和上述电流状态确定出上述适配器对应的输出状态的检测结果。
需要说明的是，在本申请的实施例中，上述适配器的输出状态可以包括上述输出电压对应的上述电压状态和上述输出电流对应的上述电流状态。
进一步地，在申请的实施例中，上述测试结果可以包括上述输出电压的测试结果和上述输出电流的测试结果。即上述测试结果可以表征上述适配器对应的输出电压和输出电流的状态。
本申请实施例提供的一种输出状态的测试方法，测试系统在指示适配器开启快充功能之后，接收第一指令；其中，第一指令用于对输出电压的状态进行确定；响应第一指令，获取第一实时电压并根据第一实时电压确定电压状态；在接入快充功能对应的充电电流之后，获取充电电流对应的电流变化速率，并根据电流变化速率确定电流状态；根据电压状态和电流状态，获得适配器对应的输出状态的测试结果。由此可见，在本申请的实施例中，测试系统可以在指示适配器开启快充功能之后，可以对适配器的输出电压检测，获得第一实时电压，然后根据第一实时电压确定出适配器的电压状态；还可以在接入快充功能对应的充电电流之后，对适配器的输出电流进行检测，获得充电电流对应的电流变化速率，然后确定出适配器的电流状态，从而便可以获得适配器的输出状态的检测结果。正是由于本申请的测试系统可以在与适配器进行通信时直接对适配器进行电压状态和电流状态的检测，进而在对适配器进行输出状态的检测时，能够减少检测指令数量，简化检测过程，从而可以大大提高检测效率和精度。
基于上述实施例，在本申请的另一实施例中，上述测试系统根据所述第一实时电压确定电压状态的方法可以包括以下步骤：
步骤201、当第一实时电压大于预设电压阈值时，确定电压状态为偏高。
步骤202、当第一实时电压等于预设电压阈值时，确定电压状态为合适。
步骤203、当第一实时电压小于预设电压阈值时，确定电压状态为偏低。
在本申请的实施例中，上述测试系统在检测获得上述第一实时电压之后，可以根据上述第一实时电压和预先设置的预设电压阈值，确定出上述电压状态。
需要说明的是，在本申请的实施例中，上述预设电压阈值用于表征上述快充功能对应的充电电压，即上述测试系统设定的需要进行快充使所匹配的充电电压。其中，对于不同的终端所配置的电池，在不同环境状态和使用状态的情况下，适合进行快充的充电 电压可以不相同，因此上述测试系统在模拟终端与上述适配器进行通信时，可以预先设置一个适合快充的电压值，即上述预设电压阈值。
进一步地，在本申请的实施例中，上述测试系统可以将上述第一实时电压预先设置的预设电压阈值进行比较，从而可以根据比较结果进一步确定出上述电压状态。
需要说明的是，在本申请的实施例中，上述测试系统在将上述第一实时电压预先设置的预设电压阈值进行比较之后，如果上述第一实时电压大于上述预设电压阈值，那么上述测试系统可以将上述电压状态确定为偏高。
需要说明的是，在本申请的实施例中，上述测试系统在将上述第一实时电压预先设置的预设电压阈值进行比较之后，如果上述第一实时电压等于上述预设电压阈值，那么上述测试系统可以将上述电压状态确定为合适。
需要说明的是，在本申请的实施例中，上述测试系统在将上述第一实时电压预先设置的预设电压阈值进行比较之后，如果上述第一实时电压小于上述预设电压阈值，那么上述测试系统可以将上述电压状态确定为偏低。
在本申请的实施例中，进一步地，上述测试系统在响应所述第一指令，获取第一实时电压并根据所述第一实时电压确定电压状态之后，即步骤101之后，上述测试系统进行输出状态检测的方法还可以包括以下步骤：
步骤105、根据电压状态发送第一响应。
在本申请的实施例中，上述测试系统在响应上述第一指令，获取上述第一实时电压，然后根据上述第一实时电压确定上述电压状态之后，可以根据上述电压状态发送第一响应。
需要说明的是，在本申请的实施例中，上述第一响应携带有上述电压状态，因此，上述第一响应可以向上述适配器指示如何对输出电压进行调整，以输出可以用于快充的电压。
进一步地，在本申请的实施例中，上述适配器在接收到上述测试系统发送的携带有上述电压状态的上述第一响应之后，如果上述电压状态为合适，说明上述适配器对应的上述输出电压适合进行快速充电，那么上述适配器便可以不对上述输出电压进行调整。
进一步地，在本申请的实施例中，上述适配器在接收到上述测试系统发送的携带有上述电压状态的上述第一响应之后，如果上述电压状态为偏稿或者偏低，说明上述适配器对应的上述输出电压不适合进行快速充电，那么上述适配器便需要对上述输出电压进行调整。
在本申请的实施例中，进一步地，当所述电压状态不为合适时，上述测试系统在根据所述电压状态发送第一响应之后，即步骤105之后，上述测试系统进行输出状态检测的方法还可以包括以下步骤：
步骤106、再次接收并响应第一指令，获取第二实时电压。
在本申请的实施例中，如果上述电压状态不为合适，而是偏高或者偏低，那么上述测试系统在根据上述电压状态发送上述第一响应之后，可以再次接收上述第一指令，并响应再次接收的上述第一指令，重新对上述适配器对应的输出电压进行检测，从而可以获得上述第二实时电压。
需要说明的是，在本申请的实施例中，上述适配器在接收到携带有上述电压状态的上述第一响应之后，如果上述电压状态为偏高或者偏低，那么上述适配器可以对输出电压进行调整，以使得上述输出电压适合进行快速充电。
进一步地，在本申请的实施例中，上述适配器输出的上述输出电压可以包括多个档位，如果上述适配器接收到上述测试系统关于输出电压偏高或偏低的反馈时，则上述适配器将上述输出电压调整一格档位，并再次向上述测试系统发送上述第一指令，以重新 询问上述测试系统上述输出电压是否匹配。
需要说明的是，在本申请的实施例中，上述测试系统在重新接收到上述第一指令之后，既可以认为上述适配器已经对上述输出电压进行了调整，因此可以重新对上述适配器对应的上述输出电压进行检测，从而便可以重新获得上述第二实时电压。
步骤107、根据第二实时电压再次确定电压状态，直到电压状态为合适。
在本申请的实施例中，上述测试系统在再次接收上述第一指令，并响应再次接收的上述第一指令，重新获得上述第二实时电压之后，便可以根据重新检测的上述第二实时电压再次确定上述电压状态，直到上述电压状态为合适。
需要说明的是，在本申请的实施例中，上述测试系统在充电对上述适配器对应的上述输出电压进行检测获得上述第二实时电压之后，如果重新检测获得的上述第二实时电压等于上述预设电压阈值，那么上述测试系统便可以重新确定上述电压状态为合适。
进一步地，在本申请的实施例中，上述测试系统在充电对上述适配器对应的上述输出电压进行检测获得上述第二实时电压之后，如果重新检测获得的上述第二实时电压大于或者小于上述预设电压阈值，那么上述测试系统便可以重新确定上述电压状态为偏高或者偏低。
需要说明的是，在本申请的实施例中，上述测试系统在充电确定上述电压状态之后，可以根据重新确定的上述电压状态向上述适配器重新发送上述响应。
进一步，在本申请的实施例中，上述适配器需要不断的根据上述第一响应对输出电压进行调整，直到上述电压状态为适合为止。
本申请实施例提供的一种输出状态的测试方法，测试系统在指示适配器开启快充功能之后，接收第一指令；其中，第一指令用于对输出电压的状态进行确定；响应第一指令，获取第一实时电压并根据第一实时电压确定电压状态；在接入快充功能对应的充电电流之后，获取充电电流对应的电流变化速率，并根据电流变化速率确定电流状态；根据电压状态和电流状态，获得适配器对应的输出状态的测试结果。由此可见，在本申请的实施例中，测试系统可以在指示适配器开启快充功能之后，可以对适配器的输出电压检测，获得第一实时电压，然后根据第一实时电压确定出适配器的电压状态；还可以在接入快充功能对应的充电电流之后，对适配器的输出电流进行检测，获得充电电流对应的电流变化速率，然后确定出适配器的电流状态，从而便可以获得适配器的输出状态的检测结果。正是由于本申请的测试系统可以在与适配器进行通信时直接对适配器进行电压状态和电流状态的检测，进而在对适配器进行输出状态的检测时，能够减少检测指令数量，简化检测过程，从而可以大大提高检测效率和精度。
基于上述实施例，在本申请的又一实施例中，进一步地，上述测试系统在根据上述第二实时电压再次确定上述电压状态，直到所述电压状态为合适之后，可以读取电压调整时间；其中，上述电压调整时间为上述适配器将所述第一实时电压调整至所述第二实时电压的时间，然后可以根据所述电压调整时间和预设时间阈值，生成上述输出状态的测试结果。
需要说明的是，在本申请的实施例中，上述测试系统在模拟终端与上述适配器的快充通信的过程中，在上述阶段2中，上述测试系统在向上述适配器发送上述电压状态之后，如果所述电压状态不为合适，那么上述适配器可以对输出电压进行调整，直到接收到电压状态为合适的响应为止。其中，上述测试系统可以对上述适配器进行输出电压调整的状态进行记录，即读取上述适配器将电压状态为偏高或者偏低调整至合适的过程中所需要的上述电压调整时间，然后再根据所述电压调整时间和预设时间阈值，确定上述输出状态的测试结果。
进一步地，在本申请的实施例中，上述测试结果还包括所述适配器是否满足电压调 整要求，具体地，如果上述电压调整时间小于或者等于所述预设时间阈值，那么可以认为上述适配器满足电压调整要求；如果上述电压调整时间大于所述预设时间阈值，那么可以认为上述适配器不满足电压调整要求。
在本申请的实施例中，进一步地，所述测试系统在获取上述第二实时电压之后，可以比较所述第二实时电压和上述第一实时电压，获得电压调整模式，其中，上述电压调整模式包括升压和降压。然后可以根据上述电压状态和上述电压调整模式，生成上述输出状态的测试结果。
需要说明的是，在本申请的实施例中，上述测试系统在模拟终端与上述适配器的快充通信的过程中，在上述阶段2中，上述测试系统在向上述适配器发送上述电压状态之后，如果上述电压状态不为合适，那么上述适配器可以根据上述电压状态对输出电压进行升压或者降压处理，具体地，如果上述电压状态为偏低，那么上述适配器需要进行升压处理；如果上述电压状态为偏高，那么上述适配器需要进行降压处理。
进一步地，在本申请的实施例中，上述测试系统在获取上述第二实时电压之后，可以将上述第一实时电压和上述第二实时电压进行比较，获得上述电压调整模式，即确定上述适配器是进行升压处理还是进行降压处理，然后便可以根据上述电压调整模式和上述电压状态，生成上述测试结果。
需要说明的是，在本申请的实施例中，上述测试结果还可以包括上述适配器对应的电压调整模式是否满足电压状态。具体地，如果上述电压状态为偏低，且上述第一实时电压小于上述第二实时电压，那么可以确定上述适配器根据上述电压状态进行了升压处理，即上述适配器对应的电压调整模式满足电压状态。
在本申请的实施例中，进一步地，上述测试系统在模拟终端与上述适配器的快充通信的过程中，在上述阶段4中，上述测试系统在接入所述快充功能对应的充电电流之后，可以接收第三指令，其中，上述第三指令用于对恒流充电阶段中的电压状态进行确定。然后可以响应上述第三指令，获取第三实时电压。当上述第三实时电压大于或者等于预设快充电压时，上述测试系统可以检测上述充电电流；当上述充电电流大于或者等于上述预设电流上限时，上述测试系统便可以向上述适配器发送上述预设电流上限，从而便可以根据上述预设电流上限更新上述充电电流。
需要说明的是，在本申请的实施例中，上述测试系统在接入上述充电电流之后，可以接收上述适配器发送的、用于对恒流充电阶段中的电压状态进行确定上述第三指令，上述测试系统可以响应所述第三指令，对电压进行实时检测获得上述第三实时电压，如果所述第三实时电压大于或者等于预设快充电压，且检测获得的充电电流大于或者等于预设电流上限时时，那么上述测试系统可以将所述预设电流上限发送给上述适配器，以控制所述适配器根据上述预设电流上限对输出电流进行控制。
需要说明的是，在本申请的实施例中，上述预设快充电压和所述预设电流上限为相互对应的两个参数，例如，上述测试系统对电压进行实时检测获得上述第三实时电压V1，如果V1大于或者等于预设快充电压V2，且检测获得的充电电流I1大于或者等于预设电流上限时I2时，那么上述测试系统可以将I2发送给上述适配器，以控制所述适配器根据上述I2对输出电流进行控制；如果V1大于或者等于预设快充电压V3，且检测获得的充电电流I1大于或者等于预设电流上限时I3时，那么上述测试系统可以将I3发送给上述适配器，以控制所述适配器根据上述I3对输出电流进行控制。
进一步地，在本申请的实施例中，上述测试系统在接收上述第三指令之后，可以响应上述第三指令，按照预设时间周期检测电压变化参数，如果上述电压变化参数大于或者等于预设突变阈值时，向所述适配器发送关闭指令，然后可以接收上述关闭指令对应的关闭响应。例如，当上述测试系统检测到大于或者等于预设突变阈值的电压组合{4.396， 3.484}时，可以认为电压发生了突变，因此可以将电压组合{4.396，3.484}和关闭指令发送给上述适配器。
需要说明的是，在本申请的实施例中，上述测试系统在进行快充时，需要对电压的变化进行实时检测，具体地，上述测试系统可以按照预设时间周期检测电压的变化情况，获得上述电压变化参数，如果上述电压变化参数大于或者等于预设突变阈值，即可以认为上述电压发生了突变，那么上述测试系统需要通知充电，因此可以向上述适配器发送关闭指令。
进一步地，在本申请的实施例中，上述测试系统在向上述适配器发送关闭指令，并接收到上述关闭指令对应的关闭响应之后，可以获取关闭充电的关闭时间，其中，上述关闭时间可以用于表征上述适配器对上述关闭指令的响应时间。上述测试系统在获取上述关闭时间之后，便可以根据上述关闭时间和预设关闭阈值，生成上述输出状态的测试结果。
需要是说明的是，在本申请的实施例中，上述测试结果还可以包括上述适配器是否能快速响应关闭指令。具体地，如果上述关闭时间小于或者等于上述预设关闭阈值，那么上述测试系统便可以认为上述适配器可以快速的对接收到的关闭指令进行响应；如果上述关闭时间大于上述预设关闭阈值，那么上述测试系统便可以认为上述适配器对接收到的关闭指令进行响应的时间不满足要求。
进一步地，在本申请的实施例中，上述测试系统在向上述适配器发送关闭指令，并接收到上述关闭指令对应的关闭响应之后，如果再次接收到上述第三指令，那么上述测试系统便可以响应上述第三指令，向上述适配器发送复位询问信息，其中，上述复位询问信息用于对上述适配器的复位状态进行确定。然后可以接收上述适配器发送的、上述复位询问信息对应的复位响应，其中，上述复位响应用于表征上述适配器对应的复位状态。
在本申请的实施例中，进一步地，上述测试系统在模拟终端与上述适配器的快充通信的过程中，在上述阶段5中，上述测试系统在接入上述快充功能对应的充电电流，且当进行所述恒流充电之后，上述测试系统可以检测上述充电电流对应的电流变化参数，然后可以根据上述电流变化参数和预设控制精度，生成上述输出状态的测试结果。
需要是说明的是，在本申请的实施例中，上述测试结果还可以包括上述适配器是否满足电流控制的精度。具体地，如果上述电流变化参数小于或者等于上述预设控制精度，那么上述测试系统便可以认为上述适配器可以满足电流控制的精度；如果上述电流变化参数大于上述预设控制精度，那么上述测试系统便可以认为上述适配器不能满足电流控制的精度。
在本申请的实施例中，进一步地，上述测试系统在模拟终端与上述适配器的快充通信的过程中，在上述阶段5中，上述测试系统在根据所述电压状态和所述电流状态，获得所述适配器对应的输出状态的测试结果之前，当上述适配器断开外部电源之后，上述测试系统可以接收上述适配器发送的断开请求，其中，上述断开请求中携带有适配器对应的电源断开时间，然后上述测试系统可以响应上述断开请求，与上述适配器断开连接。
进一步地，在本申请的实施例中，上述测试系统在响应所述断开请求，与所述适配器断开连接之后，可以记录断开连接时间，然后可以根据上述电源断开时间和上述断开连接时间，确定出上述适配器对应的断开时间间隔，即确定出上述适配器从断开外部电源至与上述测试系统断开通信之间的时间间隔。上述测试系统在确定上述断开时间间隔之后，可以根据上述断开时间间隔和预设间隔阈值，生成上述输出状态的测试结果。
需要是说明的是，在本申请的实施例中，上述测试结果还可以包括上述适配器是否能够快速断开通信连接。具体地，如果上述断开时间间隔小于或者等于上述预设间隔阈 值，那么上述测试系统便可以认为上述适配器可以满足快速断开通信连接；如果上述断开时间间隔大于上述预设间隔阈值，那么上述测试系统便可以认为上述适配器不能够快速断开通信连接。
基于上述实施例，在本申请的再一实施例中，上述测试系统在获取上述充电电流对应的上述电流变化速率时，可以根据预先设置的预设时间间隔对上述充电电流进行实时检测，获得上述电流变化速率。
需要说明的是，在本申请的实施例中，上述测试系统可以设置一个用于检测电流变化情况的间隔时间，即上述预设时间间隔，例如，上述测试系统可以预先设置上述预设时间间隔为1s，那么上述测试系统在接入上述充电电流之后，每隔1s便可以对上述充电电流进行检测，然后进一步获得上述充电电流对应的电流变化速率。
在本申请的实施例中，进一步地，上述测试系统根据所述电流变化速率确定电流状态的方法可以包括以下步骤：
步骤301、当电流变化速率小于或者等于预设速率阈值时，确定电流状态为符合变化要求。
在本申请的实施例中，上述测试系统在确定上述充电电流对应的上述电流变化速率之后，如果上述电流变化速率小于或者等于预先设置的预设速率阈值，那么所述测试系统便可以确定上述电流状态为符合变化要求。
需要说明的是，在本申请的实施例中，上述测试系统可以先预先设置一个变化速率下限值，即所述预设速率阈值，从而可以根据上述预设速率阈值对上述适配器的输出电流是否满足快充的电流变化条件进行判定。
进一步地，在本申请的实施例中，上述测试系统在确定上述电流变化速率之后，可以将上述电流变化速率与上述预设速率阈值进行比较，从而可以根据比较结果确定出上述适配器对应的电流状态是否符合变化要求。具体地，在本申请的实施例中，上述是适配器在缓慢提升电流至上述预设电流阈值的过程中，充电电流对应的电流变化速率应低于上述预设速率阈值。
需要说明的是，在本申请的实施例中，所述测试系统在将上述电流变化速率与上述预设速率阈值进行比较之后，如果上述电流变化速率小于或者等于上述预设速率阈值，那么上述测试系统便可以认为上述适配器的输出电流的变化满足快充的要求，因此确定上述电流状态为符合变化要求。
步骤302、当电流变化速率大于预设速率阈值时，确定电流状态为不符合变化要求。
在本申请的实施例中，上述测试系统在确定上述充电电流对应的上述电流变化速率之后，如果上述电流变化速率大于上述预设速率阈值，那么上述测试系统便可以确定上述电流状态为不符合变化要求。
进一步地，在本申请的实施例中，上述测试系统在确定上述电流变化速率之后，可以将上述电流变化速率与上述预设速率阈值进行比较，从而可以根据比较结果确定出上述适配器对应的上述电流状态是否符合变化要求。
需要说明的是，在本申请的实施例中，上述测试系统在将上述电流变化速率与上述预设速率阈值进行比较之后，如果上述电流变化速率大于上述预设速率阈值，那么上述测试系统便可以认为上述适配器的输出电流的变化不满足快充的要求，因此确定上述电流状态为不符合变化要求。
在本申请的实施例中，进一步地，上述测试系统在获取所述充电电流对应的电流变化速率，并根据所述电流变化速率确定电流状态之前，上述测试系统进行输出状态测试的方法可以包括以下步骤：
步骤107、接收第二指令；其中，第二指令用于询问充电电流的上限值。
在本申请的实施例中，上述测试系统在获取上述充电电流对应的电流变化速率，并根据上述电流变化速率确定上述电流状态之前，上述测试系统可以先接收第二指令。
需要说明的是，在本申请的实施例中，上述第二指令用于上述适配器询问充电电流的上限值，即用于对快充对应的最大充电电流进行确定。
进一步地，在本申请的实施例中，基于上述图1，上述测试系统在模拟终端与上述适配器的快充通信的过程中，可以在上述阶段3接收上述第二指令。
步骤108、响应第二指令，发送预设电流阈值；其中，预设电流阈值用于对充电电流进行确定。
在本申请的实施例中，上述测试系统在接收上述第二指令之后，可以响应上述第二指令，向上述适配器发送预先设置的上述预设电流阈值。
需要说明的是，在本申请的实施例中，上述预设电流阈值用于对上述充电电流进行确定，且上述预设电流阈值可以用于表征上述适配器进行快充时的最大充电电流。
进一步地，在本申请的实施例中，对于不同的终端所配置的电池，在不同环境状态和使用状态的情况下，适合进行快充的充电电流可以不相同，因此上述测试系统在模拟终端与上述适配器进行通信时，可以预先设置一个适合快充的最大电流值，即上述预设电流阈值。
进一步地，在本申请的实施例中，上述测试系统在将上述预设电流阈值发送至上述适配器之后，上述适配器便可以根据上述预设电流阈值对上述测试系统进行快充。
本申请实施例提供的一种输出状态的测试方法，测试系统在指示适配器开启快充功能之后，接收第一指令；其中，第一指令用于对输出电压的状态进行确定；响应第一指令，获取第一实时电压并根据第一实时电压确定电压状态；在接入快充功能对应的充电电流之后，获取充电电流对应的电流变化速率，并根据电流变化速率确定电流状态；根据电压状态和电流状态，获得适配器对应的输出状态的测试结果。由此可见，在本申请的实施例中，测试系统可以在指示适配器开启快充功能之后，可以对适配器的输出电压检测，获得第一实时电压，然后根据第一实时电压确定出适配器的电压状态；还可以在接入快充功能对应的充电电流之后，对适配器的输出电流进行检测，获得充电电流对应的电流变化速率，然后确定出适配器的电流状态，从而便可以获得适配器的输出状态的检测结果。正是由于本申请的测试系统可以在与适配器进行通信时直接对适配器进行电压状态和电流状态的检测，进而在对适配器进行输出状态的检测时，能够减少检测指令数量，简化检测过程，从而可以大大提高检测效率和精度。
基于上述实施例，本申请的又一实施例中，图6为本申请实施例提出的测试系统的组成结构示意图一，如图6所示，本申请实施例提出的测试系统1可以包括接收部分11，获取部分12，确定部分13，发送部分14。
所述接收部分11，用于在指示适配器开启快充功能之后，接收第一指令；其中，所述第一指令用于对输出电压的状态进行确定。
所述获取部分12，用于响应所述第一指令，获取第一实时电压。
所述确定部分13，用于根据所述第一实时电压确定电压状态。
所述获取部分12，还用于在接入所述快充功能对应的充电电流之后，获取所述充电电流对应的电流变化速率。
所述确定部分13，还用于根据所述电流变化速率确定电流状态。
所述获取部分12，还用于根据所述电压状态和所述电流状态，获得所述适配器对应的输出状态的测试结果。
进一步地，在本申请的实施例中，所述确定部分13，具体用于当所述第一实时电压大于预设电压阈值时，确定所述电压状态为偏高；以及当所述第一实时电压等于预设电 压阈值时，确定所述电压状态为合适；以及当所述第一实时电压小于预设电压阈值时，确定所述电压状态为偏低。
进一步地，在本申请的实施例中，所述发送部分14，用于响应所述第一指令，获取第一实时电压并根据所述第一实时电压确定电压状态之后，根据所述电压状态发送第一响应；其中，所述第一响应中携带所述电压状态。
所述接收部分11，还用于当所述电压状态不为合适时，所述根据所述电压状态发送第一响应之后，再次接收并响应所述第一指令，获取第二实时电压。
所述确定部分13，还用于根据所述第二实时电压再次确定所述电压状态，直到所述电压状态为合适。
进一步地，在本申请的实施例中，所述获取部分12，具体用于根据预设时间间隔对所述充电电流进行实时检测，获得所述电流变化速率。
所述确定部分13，具体用于当所述电流变化速率小于或者等于预设速率阈值时，确定所述电流状态为符合变化要求；以及当所述电流变化速率小于所述预设速率阈值时，确定所述电流状态为不符合变化要求。
进一步地，在本申请的实施例中，所述接收部分11，还用于接收第二指令；其中，所述第二指令用于询问充电电流的上限值。
所述发送部分14，还用于响应所述第二指令，发送预设电流阈值；其中，所述预设电流阈值用于对所述充电电流进行确定。
进一步地，在本申请的实施例中，获取部分12，还用于根据所述第二实时电压再次确定所述电压状态，直到所述电压状态为合适之后，读取电压调整时间；其中，所述电压调整时间为所述适配器将所述第一实时电压调整至所述第二实时电压的时间。
所述确定部分13，还用于根据所述电压调整时间和预设时间阈值，生成所述输出状态的测试结果。
所述获取部分12，还用于获取第二实时电压之后，比较所述第二实时电压和所述第一实时电压，获得电压调整模式；其中，所述电压调整模式包括升压和降压。
所述确定部分13，还用于根据所述电压状态和所述电压调整模式，生成所述输出状态的测试结果。
图7为本申请实施例提出的测试系统的组成结构示意图二，如图7所示，本申请实施例提出的测试系统1还可以包括检测部分15，断开部分16以及记录部分17。
所述接收部分11，还用于在接入所述快充功能对应的充电电流之后，接收第三指令；其中，所述第三指令用于对恒流充电阶段中的电压状态进行确定。
所述获取部分12，还用于响应所述第三指令，获取第三实时电压。
所述检测部分15，用于当所述第三实时电压大于或者等于第一预设快充电压时，检测所述充电电流。
所述发送部分14，还用于当所述充电电流大于或者等于第一预设电流上限时，向所述适配器发送所述第一预设电流上限，以根据所述第一预设电流上限更新所述充电电流。
所述检测部分15，还用于接收第三指令之后，响应所述第三指令，按照预设时间周期检测电压变化参数。
所述发送部分14，还用于当所述电压变化参数大于或者等于预设突变阈值时，发送关闭指令。
所述接收部分11，还用于接收所述关闭指令对应的关闭响应。
所述获取部分12，还用于接收所述关闭指令对应的关闭响应之后，获取关闭时间；其中，所述关闭时间用于表征所述适配器对所述关闭指令的响应时间。
所述确定部分13，还用于根据所述关闭时间和预设关闭阈值，生成所述输出状态的 测试结果。
所述发送部分14，还用于接收所述关闭指令对应的关闭响应之后，当再次接收所述第三指令时，响应所述第三指令，发送复位询问信息。
所述接收部分11，还用于接收所述复位询问信息对应的复位响应；其中，所述复位响应用于表征所述适配器对应的复位状态。
进一步地，在本申请的实施例中，所述检测部分15，还用于在接入所述快充功能对应的充电电流之后，当进行所述恒流充电之后，检测所述充电电流对应的电流变化参数。
所述确定部分13，还用于根据所述电流变化参数和预设控制精度，生成所述输出状态的测试结果。
进一步地，在本申请的实施例中，所述接收部分11，还用于根据所述电压状态和所述电流状态，获得所述适配器对应的输出状态的测试结果之前，接收断开请求；其中，所述断开请求携带所述适配器对应的电源断开时间。
所述断开部分16，用于响应所述断开请求，与所述适配器断开连接。
所述记录部分17，用于响应所述断开请求，与所述适配器断开连接之后，记录断开连接时间。
所述确定部分13，还用于根据所述电源断开时间和所述断开连接时间，确定断开时间间隔；以及根据所述断开时间间隔和预设间隔阈值，生成所述输出状态的测试结果。
图8为本申请实施例提出的测试系统的组成结构示意图三，如图8所示，本申请实施例提出的测试系统1还可以包括测试小板18、上位机19以及电子负载110。其中，测试小板中集成有处理器、存储有处理器可执行指令的存储器。可选的，上述测试系统1还可以包括通信接口111，和用于连接测试小板18、上位机19、以及电子负载110以及通信接口111的总线112。
进一步地，在本申请的实施例中，上述上位机19中也可以集成有处理器和存储器，且与上述测试小板18中的处理器和存储器的作用相同。
在本申请的实施例中，上述处理器可以为特定用途集成电路(Application Specific Integrated Circuit，ASIC)、数字信号处理器(Digital Signal Processor，DSP)、数字信号处理装置(Digital Signal Processing Device，DSPD)、可编程逻辑装置(ProgRAMmable Logic Device，PLD)、现场可编程门阵列(Field ProgRAMmable Gate Array，FPGA)、中央处理器(Central Processing Unit，CPU)、控制器、微控制器、微处理器中的至少一种。可以理解地，对于不同的设备，用于实现上述处理器功能的电子器件还可以为其它，本申请实施例不作具体限定。测试系统1还可以包括存储器，该存储器可以与处理器连接，其中，存储器用于存储可执行程序代码，该程序代码包括计算机操作指令，存储器可能包含高速RAM存储器，也可能还包括非易失性存储器，例如，至少两个磁盘存储器。
在本申请的实施例中，存储器，用于存储指令和数据。
进一步地，在本申请的实施例中，上述处理器，用于在指示适配器开启快充功能之后，接收第一指令；其中，所述第一指令用于对输出电压的状态进行确定；响应所述第一指令，获取第一实时电压并根据所述第一实时电压确定电压状态；在接入所述快充功能对应的充电电流之后，获取所述充电电流对应的电流变化速率，并根据所述电流变化速率确定电流状态；根据所述电压状态和所述电流状态，获得所述适配器对应的输出状态的测试结果。
在实际应用中，上述存储器可以是易失性第一存储器(volatile memory)，例如随机存取第一存储器(Random-Access Memory，RAM)；或者非易失性第一存储器(non-volatile memory)，例如只读第一存储器(Read-Only Memory，ROM)，快闪第一 存储器(flash memory)，硬盘(Hard Disk Drive，HDD)或固态硬盘(Solid-State Drive，SSD)；或者上述种类的第一存储器的组合，并向处理器提供指令和数据。
另外，在本实施例中的各功能模块可以集成在一个处理单元中，也可以是各个单元单独物理存在，也可以两个或两个以上单元集成在一个单元中。上述集成的单元既可以采用硬件的形式实现，也可以采用软件功能模块的形式实现。
集成的单元如果以软件功能模块的形式实现并非作为独立的产品进行销售或使用时，可以存储在一个计算机可读取存储介质中，基于这样的理解，本实施例的技术方案本质上或者说对现有技术做出贡献的部分或者该技术方案的全部或部分可以以软件产品的形式体现出来，该计算机软件产品存储在一个存储介质中，包括若干指令用以使得一台计算机设备(可以是个人计算机，服务器，或者网络设备等)或processor(处理器)执行本实施例方法的全部或部分步骤。而前述的存储介质包括：U盘、移动硬盘、只读存储器(Read Only Memory，ROM)、随机存取存储器(Random Access Memory，RAM)、磁碟或者光盘等各种可以存储程序代码的介质。
本申请实施例提出的一种测试系统，该测试系统在指示适配器开启快充功能之后，接收第一指令；其中，第一指令用于对输出电压的状态进行确定；响应第一指令，获取第一实时电压并根据第一实时电压确定电压状态；在接入快充功能对应的充电电流之后，获取充电电流对应的电流变化速率，并根据电流变化速率确定电流状态；根据电压状态和电流状态，获得适配器对应的输出状态的测试结果。由此可见，在本申请的实施例中，测试系统可以在指示适配器开启快充功能之后，可以对适配器的输出电压检测，获得第一实时电压，然后根据第一实时电压确定出适配器的电压状态；还可以在接入快充功能对应的充电电流之后，对适配器的输出电流进行检测，获得充电电流对应的电流变化速率，然后确定出适配器的电流状态，从而便可以获得适配器的输出状态的检测结果。正是由于本申请的测试系统可以在与适配器进行通信时直接对适配器进行电压状态和电流状态的检测，进而在对适配器进行输出状态的检测时，能够减少检测指令数量，简化检测过程，从而可以大大提高检测效率和精度。
本申请实施例提供第一计算机可读存储介质，其上存储有程序，该程序被处理器执行时实现如上所述的输出状态的测试方法。
具体来讲，本实施例中的一种输出状态的测试方法对应的程序指令可以被存储在光盘，硬盘，U盘等存储介质上，当存储介质中的与一种输出状态的测试方法对应的程序指令被一电子设备读取或被执行时，包括如下步骤：
在指示适配器开启快充功能之后，接收第一指令；其中，所述第一指令用于对输出电压的状态进行确定；
响应所述第一指令，获取第一实时电压并根据所述第一实时电压确定电压状态；
在接入所述快充功能对应的充电电流之后，获取所述充电电流对应的电流变化速率，并根据所述电流变化速率确定电流状态；
根据所述电压状态和所述电流状态，获得所述适配器对应的输出状态的测试结果。
本领域内的技术人员应明白，本申请的实施例可提供为方法、系统、或计算机程序产品。因此，本申请可采用硬件实施例、软件实施例、或结合软件和硬件方面的实施例的形式。而且，本申请可采用在一个或多个其中包含有计算机可用程序代码的计算机可用存储介质(包括但不限于磁盘存储器和光学存储器等)上实施的计算机程序产品的形式。
本申请是参照根据本申请实施例的方法、设备(系统)、和计算机程序产品的实现流程示意图和/或方框图来描述的。应理解可由计算机程序指令实现流程示意图和/或方框图中的每一流程和/或方框、以及实现流程示意图和/或方框图中的流程和/或方框的结 合。可提供这些计算机程序指令到通用计算机、专用计算机、嵌入式处理机或其他可编程数据处理设备的处理器以产生一个机器，使得通过计算机或其他可编程数据处理设备的处理器执行的指令产生用于实现在实现流程示意图一个流程或多个流程和/或方框图一个方框或多个方框中指定的功能的装置。
这些计算机程序指令也可存储在能引导计算机或其他可编程数据处理设备以特定方式工作的计算机可读存储器中，使得存储在该计算机可读存储器中的指令产生包括指令装置的制造品，该指令装置实现在实现流程示意图一个流程或多个流程和/或方框图一个方框或多个方框中指定的功能。
这些计算机程序指令也可装载到计算机或其他可编程数据处理设备上，使得在计算机或其他可编程设备上执行一系列操作步骤以产生计算机实现的处理，从而在计算机或其他可编程设备上执行的指令提供用于实现在实现流程示意图一个流程或多个流程和/或方框图一个方框或多个方框中指定的功能的步骤。
以上所述，仅为本申请的较佳实施例而已，并非用于限定本申请的保护范围。
工业实用性
本申请实施例提供了一种输出状态的测试方法和系统、及计算机存储介质，测试系统在指示适配器开启快充功能之后，接收第一指令；其中，第一指令用于对输出电压的状态进行确定；响应第一指令，获取第一实时电压并根据第一实时电压确定电压状态；在接入快充功能对应的充电电流之后，获取充电电流对应的电流变化速率，并根据电流变化速率确定电流状态；根据电压状态和电流状态，获得适配器对应的输出状态的测试结果。由此可见，在本申请的实施例中，测试系统可以在指示适配器开启快充功能之后，可以对适配器的输出电压检测，获得第一实时电压，然后根据第一实时电压确定出适配器的电压状态；还可以在接入快充功能对应的充电电流之后，对适配器的输出电流进行检测，获得充电电流对应的电流变化速率，然后确定出适配器的电流状态，从而便可以获得适配器的输出状态的检测结果。正是由于本申请的测试系统可以在与适配器进行通信时直接对适配器进行电压状态和电流状态的检测，进而在对适配器进行输出状态的检测时，能够减少检测指令数量，简化检测过程，从而可以大大提高检测效率和精度。

Claims (27)

  1. 一种输出状态的测试方法，所述方法包括：
    在指示适配器开启快充功能之后，接收第一指令；其中，所述第一指令用于对输出电压的状态进行确定；
    响应所述第一指令，获取第一实时电压并根据所述第一实时电压确定电压状态；
    在接入所述快充功能对应的充电电流之后，获取所述充电电流对应的电流变化速率，并根据所述电流变化速率确定电流状态；
    根据所述电压状态和所述电流状态，获得所述适配器对应的输出状态的测试结果。
  2. 根据权利要求1所述的方法，其中，所述根据所述第一实时电压确定电压状态，包括：
    当所述第一实时电压大于预设电压阈值时，确定所述电压状态为偏高；
    当所述第一实时电压等于预设电压阈值时，确定所述电压状态为合适；
    当所述第一实时电压小于预设电压阈值时，确定所述电压状态为偏低。
  3. 根据权利要求2所述的方法，其中，所述响应所述第一指令，获取第一实时电压并根据所述第一实时电压确定电压状态之后，所述方法还包括：
    根据所述电压状态发送第一响应；其中，所述第一响应中携带所述电压状态。
  4. 根据权利要求3所述的方法，其中，当所述电压状态不为合适时，所述根据所述电压状态发送第一响应之后，所述方法还包括：
    再次接收并响应所述第一指令，获取第二实时电压；
    根据所述第二实时电压再次确定所述电压状态，直到所述电压状态为合适。
  5. 根据权利要求1所述的方法，其中，所述获取所述充电电流对应的电流变化速率，包括：
    根据预设时间间隔对所述充电电流进行实时检测，获得所述电流变化速率。
  6. 根据权利要求5所述的方法，其中，所述根据所述电流变化速率确定电流状态，包括：
    当所述电流变化速率小于或者等于预设速率阈值时，确定所述电流状态为符合变化要求；
    当所述电流变化速率大于所述预设速率阈值时，确定所述电流状态为不符合变化要求。
  7. 根据权利要求1所述的方法，其中，所述获取所述充电电流对应的电流变化速率，并根据所述电流变化速率确定电流状态之前，所述方法还包括：
    接收第二指令；其中，所述第二指令用于询问充电电流的上限值；
    响应所述第二指令，发送预设电流阈值；其中，所述预设电流阈值用于对所述充电电流进行确定。
  8. 根据权利要求4所述的方法，其中，所述根据所述第二实时电压再次确定所述电压状态，直到所述电压状态为合适之后，所述方法还包括：
    读取电压调整时间；其中，所述电压调整时间为所述适配器将所述第一实时电压调整至所述第二实时电压的时间；
    根据所述电压调整时间和预设时间阈值，生成所述输出状态的测试结果。
  9. 根据权利4所述的方法，其中，所述获取第二实时电压之后，所述方法还包括：
    比较所述第二实时电压和所述第一实时电压，获得电压调整模式；其中，所述电压调整模式包括升压和降压；
    根据所述电压状态和所述电压调整模式，生成所述输出状态的测试结果。
  10. 根据权利1所述的方法，其中，所述在接入所述快充功能对应的充电电流之后，所述方法还包括：
    接收第三指令；其中，所述第三指令用于对恒流充电阶段中的电压状态进行确定；
    响应所述第三指令，获取第三实时电压；
    当所述第三实时电压大于或者等于预设快充电压时，检测所述充电电流；
    当所述充电电流大于或者等于预设电流上限时，向所述适配器发送所述预设电流上限，以根据所述预设电流上限更新所述充电电流。
  11. 根据权利要求10所述的方法，其中，所述接收第三指令之后，所述方法还包括：
    响应所述第三指令，按照预设时间周期检测电压变化参数；
    当所述电压变化参数大于或者等于预设突变阈值时，发送关闭指令；
    接收所述关闭指令对应的关闭响应。
  12. 根据权利要求11所述的方法，其中，所述接收所述关闭指令对应的关闭响应之后，所述方法还包括：
    获取关闭时间；其中，所述关闭时间用于表征所述适配器对所述关闭指令的响应时间；
    根据所述关闭时间和预设关闭阈值，生成所述输出状态的测试结果。
  13. 根据权利要求11所述的方法，其中，所述接收所述关闭指令对应的关闭响应之后，所述方法还包括：
    当再次接收所述第三指令时，响应所述第三指令，发送复位询问信息；
    接收所述复位询问信息对应的复位响应；其中，所述复位响应用于表征所述适配器对应的复位状态。
  14. 根据权利10所述的方法，其中，所述在接入所述快充功能对应的充电电流之后，所述方法还包括：
    当进行所述恒流充电之后，检测所述充电电流对应的电流变化参数；
    根据所述电流变化参数和预设控制精度，生成所述输出状态的测试结果。
  15. 根据权利要求1所述的方法，其中，所述根据所述电压状态和所述电流状态，获得所述适配器对应的输出状态的测试结果之前，所述方法还包括：
    接收断开请求；
    响应所述断开请求，与所述适配器断开连接。
  16. 根据权利要求15所述的方法，其中，所述断开请求携带所述适配器对应的电源断开时间，所述响应所述断开请求，与所述适配器断开连接之后，所述方法还包括：
    记录断开连接时间；
    根据所述电源断开时间和所述断开连接时间，确定断开时间间隔；
    根据所述断开时间间隔和预设间隔阈值，生成所述输出状态的测试结果。
  17. 一种测试系统，其中，所述测试系统包括：接收部分、获取部分以及确定部分，
    所述接收部分，用于在指示适配器开启快充功能之后，接收第一指令；其中，所述第一指令用于对输出电压的状态进行确定；
    所述获取部分，用于响应所述第一指令，获取第一实时电压；
    所述确定部分，用于根据所述第一实时电压确定电压状态；
    所述获取部分，还用于在接入所述快充功能对应的充电电流之后，获取所述充电电流对应的电流变化速率；
    所述确定部分，还用于根据所述电流变化速率确定电流状态；
    所述获取部分，还用于根据所述电压状态和所述电流状态，获得所述适配器对应的 输出状态的测试结果。
  18. 根据权利要求17所述的测试系统，其中，
    所述确定部分，具体用于当所述第一实时电压大于预设电压阈值时，确定所述电压状态为偏高；以及当所述第一实时电压等于预设电压阈值时，确定所述电压状态为合适；以及当所述第一实时电压小于预设电压阈值时，确定所述电压状态为偏低。
  19. 根据权利要求18所述的测试系统，其中，所述测试系统还包括发送部分，
    所述发送部分，用于响应所述第一指令，获取第一实时电压并根据所述第一实时电压确定电压状态之后，根据所述电压状态发送第一响应；其中，所述第一响应中携带所述电压状态；
    所述接收部分，还用于当所述电压状态不为合适时，所述根据所述电压状态发送第一响应之后，再次接收并响应所述第一指令，获取第二实时电压；
    所述确定部分，还用于根据所述第二实时电压再次确定所述电压状态，直到所述电压状态为合适。
  20. 根据权利要求17所述的测试系统，其中，
    所述获取部分，具体用于根据预设时间间隔对所述充电电流进行实时检测，获得所述电流变化速率；
    所述确定部分，具体用于当所述电流变化速率小于或者等于预设速率阈值时，确定所述电流状态为符合变化要求；以及当所述电流变化速率大于所述预设速率阈值时，确定所述电流状态为不符合变化要求。
  21. 根据权利要求19所述的测试系统，其中，
    所述接收部分，还用于接收第二指令；其中，所述第二指令用于询问充电电流的上限值；
    所述发送部分，还用于响应所述第二指令，发送预设电流阈值；其中，所述预设电流阈值用于对所述充电电流进行确定。
  22. 根据权利要求19所述的测试系统，其中，
    所述获取部分，还用于根据所述第二实时电压再次确定所述电压状态，直到所述电压状态为合适之后，读取电压调整时间；其中，所述电压调整时间为所述适配器将所述第一实时电压调整至所述第二实时电压的时间；
    所述确定部分，还用于根据所述电压调整时间和预设时间阈值，生成所述输出状态的测试结果；
    所述获取部分，还用于获取第二实时电压之后，比较所述第二实时电压和所述第一实时电压，获得电压调整模式；其中，所述电压调整模式包括升压和降压；
    所述确定部分，还用于根据所述电压状态和所述电压调整模式，生成所述输出状态的测试结果。
  23. 根据权利要求17所述的测试系统，其中，所述测试系统还包括：检测部分，
    所述接收部分，还用于在接入所述快充功能对应的充电电流之后，接收第三指令；其中，所述第三指令用于对恒流充电阶段中的电压状态进行确定；
    所述获取部分，还用于响应所述第三指令，获取第三实时电压；
    所述检测部分，用于当所述第三实时电压大于或者等于第一预设快充电压时，检测所述充电电流；
    所述发送部分，还用于当所述充电电流大于或者等于第一预设电流上限时，向所述适配器发送所述第一预设电流上限，以根据所述第一预设电流上限更新所述充电电流；
    所述检测部分，还用于接收第三指令之后，响应所述第三指令，按照预设时间周期检测电压变化参数；
    所述发送部分，还用于当所述电压变化参数大于或者等于预设突变阈值时，发送关闭指令；
    所述接收部分，还用于接收所述关闭指令对应的关闭响应；
    所述获取部分，还用于接收所述关闭指令对应的关闭响应之后，获取关闭时间；其中，所述关闭时间用于表征所述适配器对所述关闭指令的响应时间；
    所述确定部分，还用于根据所述关闭时间和预设关闭阈值，生成所述输出状态的测试结果；
    所述发送部分，还用于接收所述关闭指令对应的关闭响应之后，当再次接收所述第三指令时，响应所述第三指令，发送复位询问信息；
    所述接收部分，还用于接收所述复位询问信息对应的复位响应；其中，所述复位响应用于表征所述适配器对应的复位状态。
  24. 根据权利要求23所述的测试系统，其中，
    所述检测部分，还用于在接入所述快充功能对应的充电电流之后，当进行所述恒流充电之后，检测所述充电电流对应的电流变化参数；
    所述确定部分，还用于根据所述电流变化参数和预设控制精度，生成所述输出状态的测试结果。
  25. 根据权利要求23所述的测试系统，其中，所述测试系统还包括：断开部分和记录部分，
    所述接收部分，还用于根据所述电压状态和所述电流状态，获得所述适配器对应的输出状态的测试结果之前，接收断开请求；其中，所述断开请求携带所述适配器对应的电源断开时间；
    所述断开部分，用于响应所述断开请求，与所述适配器断开连接；
    所述记录部分，用于响应所述断开请求，与所述适配器断开连接之后，记录断开连接时间；
    所述确定部分，还用于根据所述电源断开时间和所述断开连接时间，确定断开时间间隔；以及根据所述断开时间间隔和预设间隔阈值，生成所述输出状态的测试结果。
  26. 一种测试系统，其中，所述测试系统包括测试小板、上位机以及电子负载，其中，所述测试小板和所述上位机中集成有处理器、存储有所述处理器可执行指令的存储器，当所述指令被执行时，所述处理器执行时实现如权利要求1-16任一项所述的方法。
  27. 一种计算机可读存储介质，其上存储有程序，应用于测试系统中，其中，所述程序被处理器执行时实现如权利要求1-16任一项所述的方法。
PCT/CN2018/109205 2018-09-30 2018-09-30 一种输出状态的测试方法和系统、及计算机存储介质 WO2020062296A1 (zh)

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