WO2020057078A1 - 近场耦合驱动的微机械悬臂梁执行器及其制作方法 - Google Patents
近场耦合驱动的微机械悬臂梁执行器及其制作方法 Download PDFInfo
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- WO2020057078A1 WO2020057078A1 PCT/CN2019/079131 CN2019079131W WO2020057078A1 WO 2020057078 A1 WO2020057078 A1 WO 2020057078A1 CN 2019079131 W CN2019079131 W CN 2019079131W WO 2020057078 A1 WO2020057078 A1 WO 2020057078A1
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- cantilever
- inductive
- dielectric layer
- metal film
- cantilever beam
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B3/00—Devices comprising flexible or deformable elements, e.g. comprising elastic tongues or membranes
- B81B3/0035—Constitution or structural means for controlling the movement of the flexible or deformable elements
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00015—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
- B81C1/00134—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems comprising flexible or deformable structures
- B81C1/0015—Cantilevers
Definitions
- the invention relates to the field of microelectronics technology, in particular to a micromechanical cantilever beam actuator driven by near field coupling and a manufacturing method thereof.
- the micro-actuator is one of the core components of a micro-system. It can provide power to the micro-system and can also become the operation and execution unit of the micro-system. Micro-actuators have many different execution methods. Common driving methods include electrostatic drive, electromagnetic drive, thermal drive, and light drive.
- Electrostatic microactuators are small in size, simple in structure, and fast in response, and are currently the most widely used microactuators.
- the output force of electrostatic actuators is much smaller than other driving forms.
- Thermal drive is to use the thermal expansion effect to cause a certain deformation of the driving part, and to realize the output of force calmly.
- the power consumption of thermal drive is large, and the accuracy is difficult to control.
- Magnetically driven actuators use magnetic fields to deflect magnetic substances or conductive conductors.
- Micromotor is a kind of magnetic driver, which can produce larger torque and higher speed.
- Shape memory alloys can also be used to make microactuators. The shape of the shape memory alloy switches between the two states when it changes between high and low temperatures. Using this characteristic of shape memory alloys, microactuators such as micro-tweezers have been fabricated.
- Electrically driven microactuators are mostly wired. This wired electric drive actuator is no longer applicable in confined spaces, inside the human body, and in rotating environments. For these environments, electrically driven microactuators that work wirelessly are needed.
- the invention aims to solve at least one of the technical problems existing in the prior art, and proposes a micromechanical cantilever beam actuator driven by near field coupling and a manufacturing method thereof.
- a first aspect of the present invention provides a micromechanical cantilever actuator driven by near-field coupling, including:
- An insulating dielectric layer disposed on one side of the substrate in a thickness direction thereof;
- a fixing member is disposed on a side of the insulating medium layer facing away from the substrate;
- An inductive cantilever beam structure the inductive cantilever beam structure is connected to the fixing member, and the inductive cantilever beam structure is suspended above the insulating dielectric layer;
- excitation inductance structure located above the inductance cantilever structure, and a near-field coupling of an electromagnetic field is formed between the excitation inductance structure and the inductance cantilever structure;
- Two ends of the excitation inductance structure are used to connect an AC signal source.
- a first end of the inductive cantilever beam structure is fixedly connected to the fixing member, and a second end of the inductive cantilever beam structure is suspended above the insulating dielectric layer.
- the fixing member is located in an edge region of the insulating dielectric layer, and a second end of the inductive cantilever structure is suspended in a central region of the insulating dielectric layer.
- the inductive cantilever structure includes a first metal film, a dielectric film, and a second metal film which are disposed in this order, the first metal film faces the insulating dielectric layer, and the second metal film faces away from the insulation.
- a dielectric layer, and the first metal film and the second metal film constitute an LC resonance circuit.
- the first metal film and the second metal film are two metals with large differences in thermal expansion coefficients.
- a thermal expansion coefficient of the first metal film is greater than a thermal expansion coefficient of the second metal film.
- a thermal expansion coefficient of the first metal film is smaller than a thermal expansion coefficient of the second metal film.
- the signal frequency of the AC signal source is equal to the resonance frequency of the inductive cantilever structure.
- a method for manufacturing a near-field coupling-driven micromechanical cantilever beam actuator includes the near-field coupling drive described above.
- the manufacturing method includes:
- Step S110 deposit an insulating dielectric layer on the surface of the substrate
- Step S120 deposit a dielectric layer on the surface of the insulating dielectric layer, and etch to form the fixing member;
- Step S130 apply a sacrificial layer, and perform photolithography and etching
- Step S140 depositing and forming the inductive cantilever beam structure
- Step S150 The sacrificial layer is etched to release the inductive cantilever beam structure.
- step S140 specifically includes:
- the micromechanical cantilever beam actuator of the present invention and a manufacturing method thereof include a substrate, an insulating medium layer, a fixing member, an inductive cantilever beam structure, and an exciting inductance structure.
- the inductive cantilever beam structure is connected to the fixing member, and the inductive cantilever beam structure is suspended above the insulating dielectric layer.
- the excitation inductance structure is located above the inductance cantilever structure, and a near-field coupling of an electromagnetic field is formed between the excitation inductance structure and the inductance cantilever structure.
- the micromechanical cantilever actuator of the present invention works wirelessly and can work in harsh environments such as closed environments or rotating environments.
- the micromechanical cantilever actuator of the present invention uses an on-chip integrated structure, which has a small size and fast response. And the advantages of mass production.
- FIG. 1 is a perspective view of a micromechanical cantilever actuator in a first embodiment of the present invention
- FIG. 2 is a front view of a micromechanical cantilever actuator in a second embodiment of the present invention.
- FIG. 3 is a flowchart of a method for manufacturing a micromechanical cantilever actuator in a third embodiment of the present invention.
- a first aspect of the present invention relates to a near-field coupled micromechanical cantilever actuator 100.
- the micromechanical cantilever actuator 100 includes a substrate 110, an insulating dielectric layer 120, The fixing member 130, the inductive cantilever structure 140 and the excitation inductive structure 150.
- the insulating dielectric layer 120 is disposed on one side of the substrate 110 in a thickness direction thereof.
- the insulating dielectric layer 120 is disposed on an upper surface of the substrate 110.
- the fixing member 130 is disposed on a side of the insulating medium layer 120 facing away from the substrate 110, that is, as shown in FIGS.
- the fixing member 130 is disposed on an upper surface of the insulating medium layer 120.
- the inductive cantilever beam structure 140 is connected to the fixing member 130, and the inductive cantilever beam structure 140 is suspended above the insulating dielectric layer 120.
- the exciting inductor structure 150 is located above the inductive cantilever structure 140, and a near-field coupling of an electromagnetic field is formed between the exciting inductor structure 150 and the inductive cantilever structure 140. Two ends of the excitation inductance structure 150 are used to connect an AC signal source S.
- the micromechanical cantilever actuator 100 of the structure of this embodiment includes a substrate 110, an insulating dielectric layer 120, a fixing member 130, an inductive cantilever structure 140, and an excitation inductive structure 150.
- the inductive cantilever beam structure 140 is connected to the fixing member 130, and the inductive cantilever beam structure 140 is suspended above the insulating dielectric layer 120.
- the exciting inductor structure 150 is located above the inductive cantilever structure 140, and a near-field coupling of an electromagnetic field is formed between the exciting inductor structure 150 and the inductive cantilever structure 140. Therefore, the micromechanical cantilever actuator 100 in this embodiment works wirelessly and can work in a closed environment or a harsh environment such as a rotating environment.
- the micromechanical cantilever actuator 100 in the structure of this embodiment uses The on-chip integrated structure has the advantages of small size, fast response and mass production.
- the specific distance of the inductive cantilever structure 140 suspended above the insulating dielectric layer 120 is not limited. In practical applications, the height dimension of the fixing member 130 can be set according to actual needs, so that The size of the inductive cantilever beam structure 140 from above the insulating dielectric layer 120 may be defined indirectly.
- the specific distance between the excitation inductor structure 150 and the inductor cantilever structure 140 is not limited. In practical applications, the excitation inductor structure 150 and the inductor may be limited according to actual needs. The distance between the cantilever beam structures 140, however, the distance between the two should satisfy the near-field coupling that forms an electromagnetic field between the excitation inductive structure 150 and the inductive cantilever structure 140.
- a first end of the inductive cantilever structure 140 is fixedly connected to the fixing member 130, and a second end of the inductive cantilever structure 140 is suspended in the insulating dielectric layer. Above 120.
- the fixing member 130 may be located at an edge region of the insulating dielectric layer 120, and a second end of the inductive cantilever structure 140 is suspended in a central region of the insulating dielectric layer 120.
- the inductive cantilever structure 140 includes a first metal film 141, a dielectric film 142, and a second metal film 143 disposed in this order.
- the first metal film 141 faces the insulating dielectric layer 120.
- the second metal film 143 faces away from the insulating dielectric layer 120, and the first metal film 141 and the second metal film 143 form an LC resonance circuit.
- the first metal film 141 and the second metal film 143 are two metals with large differences in thermal expansion coefficients.
- the AC signal on the excitation inductive structure 150 is wirelessly coupled to the inductive cantilever structure 140.
- the AC signal coupled to the inductive cantilever structure 140 then generates Joule heat on the inductive cantilever structure 140.
- the thermal expansion coefficients of the first metal film 141 and the second metal film 143 are different, when the temperature of the inductive cantilever structure 140 changes, the volume expansion amounts of the first metal film 141 and the second metal film 143 will be different.
- the unequal volume expansion of the first metal film 141 and the second metal film 143 causes thermal stress between the first metal film 141 and the second metal film 143.
- the thermal stress generated between the first metal film 141 and the second metal film 143 may eventually deflect the inductive cantilever structure 140.
- the thermal expansion coefficient of the first metal film 141 is greater than the thermal expansion coefficient of the second metal film 143. In this way, when the temperature of the inductive cantilever structure 140 rises, since the thermal expansion coefficient of the first metal film 141 is greater than that of the second metal film 143, the thermal stress generated by the first metal film 141 will cause the inductive cantilever structure 140 to deflect upward.
- the thermal expansion coefficient of the first metal film 141 is smaller than the thermal expansion coefficient of the second metal film 143. In this way, when the temperature of the inductive cantilever structure 140 rises, because the thermal expansion coefficient of the first metal film 141 is smaller than the thermal expansion coefficient of the second metal film 143, the thermal stress generated by it will cause the inductive cantilever structure 140 to deflect downward.
- the signal frequency of the AC signal source S is equal to the resonance frequency of the inductive cantilever structure 140. This is because as long as an AC signal is loaded on the excitation inductance structure 150, the inductance cantilever structure 140 can be deflected. In order to maximize the efficiency of near-field coupling, the frequency of the loaded AC signal is the same as the LC resonance frequency of the inductive cantilever structure 140. By adjusting the amplitude of the loaded AC signal, the deflection amplitude of the inductive cantilever structure 140 can be controlled.
- the second aspect of the present invention provides a manufacturing method S100 of a near-field coupling-driven micromechanical cantilever beam actuator.
- the near-field coupling-driven micromechanical cantilever beam actuator includes the previously described
- the manufacturing method includes:
- Step S110 deposit an insulating dielectric layer on the surface of the substrate
- Step S120 deposit a dielectric layer on the surface of the insulating dielectric layer, and etch to form the fixing member;
- Step S130 apply a sacrificial layer, and perform photolithography and etching
- Step S140 depositing and forming the inductive cantilever beam structure
- Step S150 The sacrificial layer is etched to release the inductive cantilever beam structure.
- a dielectric layer is first deposited on the surface of the substrate, and then a dielectric layer is deposited on the surface of the dielectric layer and etched.
- the fixing member is formed, and then, a sacrificial layer is coated, and photolithography and etching are performed.
- the inductor cantilever structure is formed by deposition.
- the sacrificial layer is etched to release the inductor cantilever structure. Therefore, the manufactured micromechanical cantilever actuator can work wirelessly and can work in harsh environments such as closed environments or rotating environments.
- it uses an on-chip integrated structure, which has a small size, fast response, and mass production. advantage.
- step S140 specifically includes:
- Photoetching and etching the first metal layer, the dielectric layer, and the second metal layer to form the inductor cantilever structure are photoetching and etching the first metal layer, the dielectric layer, and the second metal layer to form the inductor cantilever structure.
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Abstract
Description
Claims (10)
- 一种近场耦合驱动的微机械悬臂梁执行器,其特征在于,包括:衬底;绝缘介质层,所述绝缘介质层设置在所述衬底沿其厚度方向的一侧;固定件,所述固定件设置在所述绝缘介质层背离所述衬底的一侧;电感悬臂梁结构,所述电感悬臂梁结构与所述固定件连接,且所述电感悬臂梁结构悬空在所述绝缘介质层上方;激励电感结构,所述激励电感结构位于所述电感悬臂梁结构的上方,所述激励电感结构和所述电感悬臂梁结构之间形成电磁场的近场耦合;所述激励电感结构的两端用于连接交流信号源。
- 根据权利要求1所述的微机械悬臂梁执行器,其特征在于,所述电感悬臂梁结构的第一端与所述固定件固定连接,所述电感悬臂梁结构的第二端悬空在所述绝缘介质层的上方。
- 根据权利要求2所述的微机械悬臂梁执行器,其特征在于,所述固定件位于所述绝缘介质层的边缘区域,所述电感悬臂梁结构的第二端悬空在所述绝缘介质层的中央区域。
- 根据权利要求1所述的微机械悬臂梁执行器,其特征在于,所述电感悬臂梁结构包括依次设置的第一金属膜、介质膜和第二金属膜,所述第一金属膜朝向所述绝缘介质层,所述第二金属膜背离所述绝缘介质层,且所述第一金属膜与所述第二金属膜构成LC谐振回路。
- 根据权利要求4所述的微机械悬臂梁执行器,其特征在于, 所述第一金属膜和所述第二金属膜为两种热膨胀系数相差较大的金属。
- 根据权利要求5所述的微机械悬臂梁执行器,其特征在于,所述第一金属膜的热膨胀系数大于所述第二金属膜的热膨胀系数。
- 根据权利要求5所述的微机械悬臂梁执行器,其特征在于,所述第一金属膜的热膨胀系数小于所述第二金属膜的热膨胀系数。
- 根据权利要求1至7中任意一项所述的微机械悬臂梁执行器,其特征在于,所述交流信号源的信号频率与所述电感悬臂梁结构的谐振频率相等。
- 一种近场耦合驱动的微机械悬臂梁执行器的制作方法,其特征在于,所述近场耦合驱动的微机械悬臂梁执行器包括权利要求1至9中任意一项所述的近场耦合驱动的微机械悬臂梁执行器,所述制作方法包括:步骤S110、在所述衬底表面沉积一层绝缘介质层;步骤S120、在所述绝缘介质层的表面沉积一层介质层,并刻蚀形成所述固定件;步骤S130、涂覆牺牲层,并进行光刻和刻蚀;步骤S140、沉积形成所述电感悬臂梁结构;步骤S150、腐蚀牺牲层,释放所述电感悬臂梁结构。
- 根据权利要求9所述的制作方法,其特征在于,步骤S140具体包括:依次在所述绝缘介质层的表面沉积第一金属层、介质层和第二金属层;对所述第一金属层、介质层和第二金属层进行光刻并刻蚀,形成所述电感悬臂梁结构。
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811090343.6 | 2018-09-18 | ||
| CN201811090343.6A CN109292724A (zh) | 2018-09-18 | 2018-09-18 | 近场耦合驱动的微机械悬臂梁执行器及其制作方法 |
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| WO2020057078A1 true WO2020057078A1 (zh) | 2020-03-26 |
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| CN (1) | CN109292724A (zh) |
| WO (1) | WO2020057078A1 (zh) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112744782A (zh) * | 2020-12-30 | 2021-05-04 | 江西铭德半导体科技有限公司 | 一种微悬臂梁的制备方法 |
| CN114105084A (zh) * | 2021-11-15 | 2022-03-01 | 歌尔微电子股份有限公司 | Mems共腔分膜的soc芯片及其制备方法 |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109292724A (zh) * | 2018-09-18 | 2019-02-01 | 东南大学 | 近场耦合驱动的微机械悬臂梁执行器及其制作方法 |
| CN113203758B (zh) * | 2021-05-14 | 2022-12-27 | 东南大学 | 一种用于tem/sem电镜的原位多参数测试芯片结构及制备方法 |
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- 2018-09-18 CN CN201811090343.6A patent/CN109292724A/zh active Pending
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| US20090315335A1 (en) * | 2006-01-25 | 2009-12-24 | Regents Of The University Of California | Energy harvesting by means of thermo-mechanical device utilizing bistable ferromagnets |
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| CN112744782A (zh) * | 2020-12-30 | 2021-05-04 | 江西铭德半导体科技有限公司 | 一种微悬臂梁的制备方法 |
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| CN114105084A (zh) * | 2021-11-15 | 2022-03-01 | 歌尔微电子股份有限公司 | Mems共腔分膜的soc芯片及其制备方法 |
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| CN109292724A (zh) | 2019-02-01 |
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