WO2020042223A1 - Etching solution composition for copper/molybdenum film layer - Google Patents

Etching solution composition for copper/molybdenum film layer Download PDF

Info

Publication number
WO2020042223A1
WO2020042223A1 PCT/CN2018/105231 CN2018105231W WO2020042223A1 WO 2020042223 A1 WO2020042223 A1 WO 2020042223A1 CN 2018105231 W CN2018105231 W CN 2018105231W WO 2020042223 A1 WO2020042223 A1 WO 2020042223A1
Authority
WO
WIPO (PCT)
Prior art keywords
etching
acid
solution composition
etching solution
sodium
Prior art date
Application number
PCT/CN2018/105231
Other languages
French (fr)
Chinese (zh)
Inventor
赵芬利
Original Assignee
深圳市华星光电技术有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 深圳市华星光电技术有限公司 filed Critical 深圳市华星光电技术有限公司
Publication of WO2020042223A1 publication Critical patent/WO2020042223A1/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23FNON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
    • C23F1/00Etching metallic material by chemical means
    • C23F1/44Compositions for etching metallic material from a metallic material substrate of different composition

Definitions

  • the invention relates to the field of copper process etching, in particular to an etching solution composition for a copper / molybdenum film layer.
  • the metal wiring of the display usually uses copper metal. Compared with aluminum metal, copper has a low resistance value and excellent processability. The width of the copper wire does not need to reach the width of the aluminum wire, which can improve the penetration of the display and The efficiency of the backlight source makes copper wires more suitable for the production of high-resolution panels.
  • the formation of the copper process pattern in the display panel is generally: firstly forming a copper / molybdenum film on the substrate, molybdenum can increase the adhesion of copper to the substrate, and at the same time can prevent the diffusion of copper on the substrate; then it can be formed on the copper / molybdenum film A photoresist in a predetermined pattern; thereafter, the copper / molybdenum film is etched with an etchant to form a metal circuit.
  • the conventional fluorine-containing etching solution is corrosive, has low etching efficiency, poor stability, and is unfriendly to the environment.
  • the invention provides an etching solution composition for a copper / molybdenum film layer to solve the existing etching solution, which contains fluoride, has a negative impact on the device and the environment, and has a low etching efficiency, thereby affecting the technical problems of display.
  • the invention provides an etching solution composition for a copper / molybdenum film layer, comprising: a uniformly mixed oxidant, organic acid, etching regulator, inorganic salt, chelating agent, etching inhibitor, and deionized water;
  • the mass of the composition the mass fraction of the oxidant is 5% to 15%, the mass fraction of the organic acid is 4% to 13%, the mass fraction of the etching conditioner is 0.1% to 5%, and the inorganic
  • the mass fraction of the salt is 0.1% to 5%
  • the mass fraction of the chelating agent is 0.5% to 9%
  • the mass fraction of the etching inhibitor is 0.001% to 1%
  • the balance is the deionized water.
  • the oxidant is hydrogen peroxide.
  • the organic acid is selected from the group consisting of acetic acid, glycolic acid, 2-hydroxypropane-1,2,3-tricarboxylic acid, benzoic acid, oxalic acid, succinic acid, 2, At least one of 3-dihydroxysuccinic acid, 2-hydroxysuccinic acid, 2-hydroxypropionic acid, and phthalic acid.
  • the etching modifier is an amine compound.
  • the etching modifier is selected from at least one of diisopropanolamine, polyacrylamide, m-phenylenediamine, p-chloroaniline, and monoisopropanolamine.
  • the inorganic salt is selected from at least one of a sodium salt, a magnesium salt, and a potassium salt.
  • the inorganic salt is selected from the group consisting of sodium chloride, magnesium chloride, potassium chloride, sodium sulfate, magnesium sulfate, potassium sulfate, sodium nitrate, magnesium nitrate, potassium nitrate, sodium acetate, and magnesium acetate. At least one of potassium acetate.
  • the chelating agent is selected from at least one of sodium stannate, sodium pyrophosphate, 8-hydroxyquinoline, and chitosan.
  • the etching inhibitor is selected from the group consisting of 6-nitrobenzimidazole, 2-aminothiazole, 2-amino-5-nitrothiazole, 5-aminotetrazole, 3- At least one of amino-1,2,4-triazole, benzotriazole, benzotriazole, sodium azole triazole, and sulfobenzotriazole.
  • the invention also provides an etching solution composition for a copper / molybdenum film layer, including:
  • the mass fraction of the oxidant is 5% to 15%
  • the mass fraction of the organic acid is 4% to 13%
  • the mass fraction of the etching conditioner is 0.1% to 5 %
  • the mass fraction of the inorganic salt is 0.1% to 5%
  • the mass fraction of the chelating agent is 0.5% to 9%
  • the mass fraction of the etching inhibitor is 0.001% to 1%
  • the balance is the Solvent.
  • the oxidant is hydrogen peroxide.
  • the organic acid is selected from the group consisting of acetic acid, glycolic acid, 2-hydroxypropane-1,2,3-tricarboxylic acid, benzoic acid, oxalic acid, succinic acid, 2, At least one of 3-dihydroxysuccinic acid, 2-hydroxysuccinic acid, 2-hydroxypropionic acid, and phthalic acid.
  • the etching modifier is an amine compound.
  • the etching modifier is selected from at least one of diisopropanolamine, polyacrylamide, m-phenylenediamine, p-chloroaniline, and monoisopropanolamine.
  • the inorganic salt is selected from at least one of a sodium salt, a magnesium salt, and a potassium salt.
  • the inorganic salt is selected from the group consisting of sodium chloride, magnesium chloride, potassium chloride, sodium sulfate, magnesium sulfate, potassium sulfate, sodium nitrate, magnesium nitrate, potassium nitrate, sodium acetate, and magnesium acetate. At least one of potassium acetate.
  • the chelating agent is selected from at least one of sodium stannate, sodium pyrophosphate, 8-hydroxyquinoline, and chitosan.
  • the etching inhibitor is selected from the group consisting of 6-nitrobenzimidazole, 2-aminothiazole, 2-amino-5-nitrothiazole, 5-aminotetrazole, 3- At least one of amino-1,2,4-triazole, benzotriazole, benzotriazole, sodium azole triazole, and sulfobenzotriazole.
  • the etching solution composition for the copper / molybdenum film layer provided by the present invention reduces the influence of the chemical solution on the environment and the device, and improves the etching efficiency and etching stability.
  • FIG. 1 is a schematic cross-sectional view of a copper / molybdenum film layer when an etching solution composition of the present invention is etched;
  • FIG. 3 is another electron microscope image of the copper / molybdenum film layer when the etchant composition of Embodiment 1 of the present invention is etched.
  • the present invention is directed to the existing etching solution, because it contains fluoride, which has a negative impact on the environment and devices, and has a low etching efficiency. This embodiment can solve this defect.
  • the invention provides an etching solution composition for a copper / molybdenum film layer, comprising: an oxidant, an organic acid, an etching regulator, an inorganic salt, a chelating agent, an etching inhibitor, and a solvent, which are uniformly mixed.
  • the mass fraction of the oxidant is 5% to 15%
  • the mass fraction of the organic acid is 4% to 13%
  • the mass fraction of the etching conditioner is 0.1% to 5 %
  • the mass fraction of the inorganic salt is 0.1% to 5%
  • the mass fraction of the chelating agent is 0.5% to 9%
  • the mass fraction of the etching inhibitor is 0.001% to 1%
  • the balance is the Solvent.
  • the etching temperature of the etching solution composition is 25 to 35 degrees Celsius, and at this temperature, the etching effect is better.
  • the oxidant is hydrogen peroxide, and the solvent is deionized water.
  • the organic acid is selected from the group consisting of acetic acid, glycolic acid, 2-hydroxypropane-1,2,3-tricarboxylic acid, benzoic acid, oxalic acid, succinic acid, 2,3-dihydroxysuccinic acid, and 2-hydroxyl. At least one of succinic acid, 2-hydroxypropionic acid, and phthalic acid.
  • the etching regulator is an amine compound.
  • the etching regulator may be one or more of diisopropanolamine, polyacrylamide, m-phenylenediamine, p-chloroaniline, and monoisopropanolamine.
  • the etching rate of the copper / molybdenum film layer can be adjusted by adjusting the content of the etching inhibitor in the etching solution composition, so that the film layer has an etching profile with an appropriate taper angle.
  • the inorganic salt may be one or more combinations of inorganic sodium salt, inorganic magnesium salt, and inorganic potassium salt.
  • the inorganic salt may be sodium chloride, magnesium chloride, potassium chloride, sodium sulfate, magnesium sulfate, One or more combinations of potassium sulfate, sodium nitrate, magnesium nitrate, potassium nitrate, sodium acetate, magnesium acetate, potassium acetate.
  • the chelating agent is selected from one or more of sodium stannate, sodium pyrophosphate, 8-hydroxyquinoline, and chitosan.
  • the etching inhibitor is selected from 6-nitrobenzimidazole, 2-aminothiazole, 2-amino-5-nitrothiazole, 5-aminotetrazole, 3-amino-1,2,4-triazole, At least one of benzotriazole, benzotriazole, sodium azole triazole, and sulfobenzotriazole.
  • the etching solution composition for the copper / molybdenum film layer includes: hydrogen peroxide, 2-hydroxypropane-1,2,3-tricarboxylic acid, diisopropanolamine, 8-hydroxyquinoline, and chlorination. Sodium, benzotriazole.
  • Table 1 is a composition table of the etching solution composition. With respect to the mass of the entire etching solution composition, the mass fraction of each component is: hydrogen peroxide 10%, 2-hydroxypropane-1 8% of 2,3-tricarboxylic acid, 3% of diisopropanolamine, 2.5% of 8-hydroxyquinoline, 0.5% of sodium chloride, 0.02% of benzotriazole and 75.98% of deionized water.
  • a device having a copper / molybdenum film layer is contacted with an etching solution.
  • the device includes a substrate 11, a copper / molybdenum film layer 12, and a photoresist. 13.
  • the etching solution with good performance can suppress the side etching amount of the film layer, so that the cross-sectional shape of the film layer after the etching is within a predetermined range.
  • the taper angle ⁇ formed by the side etched surface of the end of the etched copper / molybdenum film layer 12 and the plane on which the substrate 11 is located is preferably 30-60 degrees, and the photoresist 13 on the same side
  • the vertical distance m (CD Loss) from the endpoint of the lower surface to the endpoint of the lower surface of the copper-molybdenum film layer 12 is preferably less than 1 micron.
  • the etching solution composition for the copper / molybdenum film layer provided by the present invention reduces the influence of the chemical solution on the environment and devices, and improves the etching efficiency and etching stability.

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • ing And Chemical Polishing (AREA)
  • Weting (AREA)

Abstract

An etching solution composition for a copper/molybdenum film layer, comprising a homogeneous mixture of an oxidizing agent, an organic acid, an etching regulator, an inorganic salt, a chelating agent, an etching inhibitor, and a solvent. Relative to the total mass of the composition, the oxidizing agent has a mass fraction of 5% to 15%, the organic acid has a mass fraction of 4% to 13%, the etching regulator has a mass fraction of 0.1% to 5%, the inorganic salt has a mass fraction of 0.1% to 5%, the chelating agent has a mass fraction of 0.5% to 9%, the etching inhibitor has a mass fraction of 0.001% to 1%, and the remaining is the solvent.

Description

铜/钼膜层用蚀刻液组合物Etchant composition for copper / molybdenum film layer 技术领域Technical field
本发明涉及铜制程刻蚀领域,尤其涉及一种铜/钼膜层用蚀刻液组合物。The invention relates to the field of copper process etching, in particular to an etching solution composition for a copper / molybdenum film layer.
背景技术Background technique
近年来,随着显示器的需求量的增加,人们对产品的质量和画面精度也提出了更高的要求,而蚀刻的效果好坏,直接影响电路板制造工艺的好坏,进而影响显示图像的质量。随着显示器尺寸的增大,与薄膜晶体管连接的栅极线和数据线等金属配线的长度会增加,随之金属配线的电阻会增加,会产生信号延迟等问题。In recent years, with the increase in the demand for displays, people have put forward higher requirements for product quality and screen accuracy, and the quality of the etching effect directly affects the quality of the circuit board manufacturing process, and then affects the display image. quality. As the size of the display increases, the length of metal wirings such as gate lines and data lines connected to the thin film transistors will increase, and the resistance of the metal wirings will increase, which will cause problems such as signal delay.
目前,显示器的金属配线通常采用铜金属,相较于铝金属,铜的电阻值低,加工性能优异,铜导线的线宽不需要达到铝导线的宽度,就能提高显示器的穿透度和背光源的使用效率,因此铜导线更加适合用于高分辨面板的制作。At present, the metal wiring of the display usually uses copper metal. Compared with aluminum metal, copper has a low resistance value and excellent processability. The width of the copper wire does not need to reach the width of the aluminum wire, which can improve the penetration of the display and The efficiency of the backlight source makes copper wires more suitable for the production of high-resolution panels.
显示面板中铜制程图案的形成一般为:先在基板上形成铜/钼薄膜,钼能够增加铜与基板的贴附性,同时能够阻止铜在基板上的扩散;再在铜/钼薄膜上形成预定图案的光刻胶;之后,利用蚀刻液对铜/钼薄膜进行刻蚀,以形成金属线路。但是,传统的含氟蚀刻液具有腐蚀性,刻蚀效率低下,稳定性差,且对环境不友好。The formation of the copper process pattern in the display panel is generally: firstly forming a copper / molybdenum film on the substrate, molybdenum can increase the adhesion of copper to the substrate, and at the same time can prevent the diffusion of copper on the substrate; then it can be formed on the copper / molybdenum film A photoresist in a predetermined pattern; thereafter, the copper / molybdenum film is etched with an etchant to form a metal circuit. However, the conventional fluorine-containing etching solution is corrosive, has low etching efficiency, poor stability, and is unfriendly to the environment.
技术问题technical problem
本发明提供一种铜/钼膜层用蚀刻液组合物,以解决现有的蚀刻液,由于含有氟化物,对器件和环境产生负面影响,且刻蚀效率低下,进而影响显示的技术问题。The invention provides an etching solution composition for a copper / molybdenum film layer to solve the existing etching solution, which contains fluoride, has a negative impact on the device and the environment, and has a low etching efficiency, thereby affecting the technical problems of display.
技术解决方案Technical solutions
为解决上述问题,本发明提供的技术方案如下:To solve the above problems, the technical solution provided by the present invention is as follows:
本发明提供一种铜/钼膜层用蚀刻液组合物,包括:混合均匀的氧化剂、有机酸、蚀刻调节剂、无机盐、螯合剂、蚀刻抑制剂、以及去离子水;其中,相对于整体组合物的质量,所述氧化剂的质量分数为5%~15%,所述有机酸的质量分数为4%~13%,所述蚀刻调节剂的质量分数为0.1%~5%,所述无机盐的质量分数为0.1%~5%,所述螯合剂的质量分数为0.5%~9%,所述蚀刻抑制剂的质量分数为0.001%~1%,余量为所述去离子水。The invention provides an etching solution composition for a copper / molybdenum film layer, comprising: a uniformly mixed oxidant, organic acid, etching regulator, inorganic salt, chelating agent, etching inhibitor, and deionized water; The mass of the composition, the mass fraction of the oxidant is 5% to 15%, the mass fraction of the organic acid is 4% to 13%, the mass fraction of the etching conditioner is 0.1% to 5%, and the inorganic The mass fraction of the salt is 0.1% to 5%, the mass fraction of the chelating agent is 0.5% to 9%, the mass fraction of the etching inhibitor is 0.001% to 1%, and the balance is the deionized water.
在本发明的至少一种实施例中,所述氧化剂为过氧化氢。In at least one embodiment of the present invention, the oxidant is hydrogen peroxide.
在本发明的至少一种实施例中,所述有机酸选自乙酸、羟基乙酸、2-羟基丙烷-1,2,3-三羧酸、苯甲酸、乙二酸、丁二酸、2,3-二羟基丁二酸、2-羟基丁二酸、2-羟基丙酸、邻苯二甲酸中的至少一种。In at least one embodiment of the present invention, the organic acid is selected from the group consisting of acetic acid, glycolic acid, 2-hydroxypropane-1,2,3-tricarboxylic acid, benzoic acid, oxalic acid, succinic acid, 2, At least one of 3-dihydroxysuccinic acid, 2-hydroxysuccinic acid, 2-hydroxypropionic acid, and phthalic acid.
在本发明的至少一种实施例中,所述蚀刻调节剂为胺类化合物。In at least one embodiment of the present invention, the etching modifier is an amine compound.
在本发明的至少一种实施例中,所述蚀刻调节剂选自二异丙醇胺、聚丙烯酰胺、间苯二胺、对氯苯胺、一异丙醇胺中的至少一种。In at least one embodiment of the present invention, the etching modifier is selected from at least one of diisopropanolamine, polyacrylamide, m-phenylenediamine, p-chloroaniline, and monoisopropanolamine.
在本发明的至少一种实施例中,所述无机盐选自钠盐、镁盐、钾盐中的至少一种。In at least one embodiment of the present invention, the inorganic salt is selected from at least one of a sodium salt, a magnesium salt, and a potassium salt.
在本发明的至少一种实施例中,所述无机盐选自氯化钠、氯化镁、氯化钾、硫酸钠、硫酸镁、硫酸钾、硝酸钠、硝酸镁、硝酸钾、醋酸钠、乙酸镁、乙酸钾中的至少一种。In at least one embodiment of the present invention, the inorganic salt is selected from the group consisting of sodium chloride, magnesium chloride, potassium chloride, sodium sulfate, magnesium sulfate, potassium sulfate, sodium nitrate, magnesium nitrate, potassium nitrate, sodium acetate, and magnesium acetate. At least one of potassium acetate.
在本发明的至少一种实施例中,所述螯合剂选自锡酸钠、焦磷酸钠、8-羟基喹啉、壳聚糖中的至少一种。In at least one embodiment of the present invention, the chelating agent is selected from at least one of sodium stannate, sodium pyrophosphate, 8-hydroxyquinoline, and chitosan.
在本发明的至少一种实施例中,所述蚀刻抑制剂选自6-硝基苯并咪唑、2-氨基噻唑、2-氨基-5-硝基噻唑、5-氨基四氮唑、3-氨基-1,2,4-三唑、苯骈三氮唑、苯并三唑、唑氮钠、疏基苯并三氮唑中的至少一种。In at least one embodiment of the present invention, the etching inhibitor is selected from the group consisting of 6-nitrobenzimidazole, 2-aminothiazole, 2-amino-5-nitrothiazole, 5-aminotetrazole, 3- At least one of amino-1,2,4-triazole, benzotriazole, benzotriazole, sodium azole triazole, and sulfobenzotriazole.
本发明还提供一种铜/钼膜层用蚀刻液组合物,包括:The invention also provides an etching solution composition for a copper / molybdenum film layer, including:
混合均匀的氧化剂、有机酸、蚀刻调节剂、无机盐、螯合剂、蚀刻抑制剂、以及溶剂;Mix uniformly oxidant, organic acid, etching regulator, inorganic salt, chelating agent, etching inhibitor, and solvent;
其中,相对于整体组合物的质量,所述氧化剂的质量分数为5%~15%,所述有机酸的质量分数为4%~13%,所述蚀刻调节剂的质量分数为0.1%~5%,所述无机盐的质量分数为0.1%~5%,所述螯合剂的质量分数为0.5%~9%,所述蚀刻抑制剂的质量分数为0.001%~1%,余量为所述溶剂。Wherein, relative to the mass of the overall composition, the mass fraction of the oxidant is 5% to 15%, the mass fraction of the organic acid is 4% to 13%, and the mass fraction of the etching conditioner is 0.1% to 5 %, The mass fraction of the inorganic salt is 0.1% to 5%, the mass fraction of the chelating agent is 0.5% to 9%, the mass fraction of the etching inhibitor is 0.001% to 1%, and the balance is the Solvent.
在本发明的至少一种实施例中,所述氧化剂为过氧化氢。In at least one embodiment of the present invention, the oxidant is hydrogen peroxide.
在本发明的至少一种实施例中,所述有机酸选自乙酸、羟基乙酸、2-羟基丙烷-1,2,3-三羧酸、苯甲酸、乙二酸、丁二酸、2,3-二羟基丁二酸、2-羟基丁二酸、2-羟基丙酸、邻苯二甲酸中的至少一种。In at least one embodiment of the present invention, the organic acid is selected from the group consisting of acetic acid, glycolic acid, 2-hydroxypropane-1,2,3-tricarboxylic acid, benzoic acid, oxalic acid, succinic acid, 2, At least one of 3-dihydroxysuccinic acid, 2-hydroxysuccinic acid, 2-hydroxypropionic acid, and phthalic acid.
在本发明的至少一种实施例中,所述蚀刻调节剂为胺类化合物。In at least one embodiment of the present invention, the etching modifier is an amine compound.
在本发明的至少一种实施例中,所述蚀刻调节剂选自二异丙醇胺、聚丙烯酰胺、间苯二胺、对氯苯胺、一异丙醇胺中的至少一种。In at least one embodiment of the present invention, the etching modifier is selected from at least one of diisopropanolamine, polyacrylamide, m-phenylenediamine, p-chloroaniline, and monoisopropanolamine.
在本发明的至少一种实施例中,所述无机盐选自钠盐、镁盐、钾盐中的至少一种。In at least one embodiment of the present invention, the inorganic salt is selected from at least one of a sodium salt, a magnesium salt, and a potassium salt.
在本发明的至少一种实施例中,所述无机盐选自氯化钠、氯化镁、氯化钾、硫酸钠、硫酸镁、硫酸钾、硝酸钠、硝酸镁、硝酸钾、醋酸钠、乙酸镁、乙酸钾中的至少一种。In at least one embodiment of the present invention, the inorganic salt is selected from the group consisting of sodium chloride, magnesium chloride, potassium chloride, sodium sulfate, magnesium sulfate, potassium sulfate, sodium nitrate, magnesium nitrate, potassium nitrate, sodium acetate, and magnesium acetate. At least one of potassium acetate.
在本发明的至少一种实施例中,所述螯合剂选自锡酸钠、焦磷酸钠、8-羟基喹啉、壳聚糖中的至少一种。In at least one embodiment of the present invention, the chelating agent is selected from at least one of sodium stannate, sodium pyrophosphate, 8-hydroxyquinoline, and chitosan.
在本发明的至少一种实施例中,所述蚀刻抑制剂选自6-硝基苯并咪唑、2-氨基噻唑、2-氨基-5-硝基噻唑、5-氨基四氮唑、3-氨基-1,2,4-三唑、苯骈三氮唑、苯并三唑、唑氮钠、疏基苯并三氮唑中的至少一种。In at least one embodiment of the present invention, the etching inhibitor is selected from the group consisting of 6-nitrobenzimidazole, 2-aminothiazole, 2-amino-5-nitrothiazole, 5-aminotetrazole, 3- At least one of amino-1,2,4-triazole, benzotriazole, benzotriazole, sodium azole triazole, and sulfobenzotriazole.
有益效果Beneficial effect
本发明的有益效果为:本发明提供的铜/钼膜层用蚀刻液组合物,降低了药液对环境和器件的影响,提高了刻蚀效率和刻蚀稳定性。The beneficial effects of the present invention are: the etching solution composition for the copper / molybdenum film layer provided by the present invention reduces the influence of the chemical solution on the environment and the device, and improves the etching efficiency and etching stability.
附图说明BRIEF DESCRIPTION OF THE DRAWINGS
为了更清楚地说明实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单介绍,显而易见地,下面描述中的附图仅仅是发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。In order to more clearly explain the embodiments or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings in the following description are merely inventions. For some embodiments, for those skilled in the art, other drawings can be obtained based on these drawings without paying creative labor.
图1为本发明的蚀刻液组合物进行蚀刻时的铜/钼膜层的截面示意图;1 is a schematic cross-sectional view of a copper / molybdenum film layer when an etching solution composition of the present invention is etched;
图2为本发明的实施例一的蚀刻液组合物进行刻蚀时的铜/钼膜层的电镜图;2 is an electron micrograph of a copper / molybdenum film layer when the etchant composition of the first embodiment of the present invention is etched;
图3为本发明的实施例一的蚀刻液组合物进行刻蚀时的铜/钼膜层的另一电镜图。FIG. 3 is another electron microscope image of the copper / molybdenum film layer when the etchant composition of Embodiment 1 of the present invention is etched.
本发明的实施方式Embodiments of the invention
以下各实施例的说明是参考附加的图示,用以例示本发明可用以实施的特定实施例。本发明所提到的方向用语,例如[上]、[下]、[前]、[后]、[左]、[右]、[内]、[外]、[侧面]等,仅是参考附加图式的方向。因此,使用的方向用语是用以说明及理解本发明,而非用以限制本发明。在图中,结构相似的单元是用以相同标号表示。The following descriptions of the embodiments are made with reference to additional illustrations to illustrate specific embodiments in which the present invention can be implemented. The directional terms mentioned in the present invention, such as [up], [down], [front], [rear], [left], [right], [in], [out], [side], etc., are for reference only. The direction of the attached schema. Therefore, the directional terms used are for explaining and understanding the present invention, but not for limiting the present invention. In the figure, similarly structured units are denoted by the same reference numerals.
本发明针对现有的蚀刻液,由于含有氟化物,对环境和器件造成负面影响,且刻蚀效率低下的问题,本实施例能够解决该缺陷。The present invention is directed to the existing etching solution, because it contains fluoride, which has a negative impact on the environment and devices, and has a low etching efficiency. This embodiment can solve this defect.
本发明提供一种铜/钼膜层用蚀刻液组合物,包括:混合均匀的氧化剂、有机酸、蚀刻调节剂、无机盐、螯合剂、蚀刻抑制剂、以及溶剂。The invention provides an etching solution composition for a copper / molybdenum film layer, comprising: an oxidant, an organic acid, an etching regulator, an inorganic salt, a chelating agent, an etching inhibitor, and a solvent, which are uniformly mixed.
其中,相对于整体组合物的质量,所述氧化剂的质量分数为5%~15%,所述有机酸的质量分数为4%~13%,所述蚀刻调节剂的质量分数为0.1%~5%,所述无机盐的质量分数为0.1%~5%,所述螯合剂的质量分数为0.5%~9%,所述蚀刻抑制剂的质量分数为0.001%~1%,余量为所述溶剂。Wherein, relative to the mass of the overall composition, the mass fraction of the oxidant is 5% to 15%, the mass fraction of the organic acid is 4% to 13%, and the mass fraction of the etching conditioner is 0.1% to 5 %, The mass fraction of the inorganic salt is 0.1% to 5%, the mass fraction of the chelating agent is 0.5% to 9%, the mass fraction of the etching inhibitor is 0.001% to 1%, and the balance is the Solvent.
所述蚀刻液组合物的蚀刻温度为25~35摄氏度,在此温度下,蚀刻效果较佳。The etching temperature of the etching solution composition is 25 to 35 degrees Celsius, and at this temperature, the etching effect is better.
所述氧化剂为过氧化氢,所述溶剂为去离子水。The oxidant is hydrogen peroxide, and the solvent is deionized water.
所述有机酸选自乙酸、羟基乙酸、2-羟基丙烷-1,2,3-三羧酸、苯甲酸、乙二酸、丁二酸、2,3-二羟基丁二酸、2-羟基丁二酸、2-羟基丙酸、邻苯二甲酸中的至少一种。The organic acid is selected from the group consisting of acetic acid, glycolic acid, 2-hydroxypropane-1,2,3-tricarboxylic acid, benzoic acid, oxalic acid, succinic acid, 2,3-dihydroxysuccinic acid, and 2-hydroxyl. At least one of succinic acid, 2-hydroxypropionic acid, and phthalic acid.
所述蚀刻调节剂为胺类化合物,具体的,所述蚀刻调节剂可为二异丙醇胺、聚丙烯酰胺、间苯二胺、对氯苯胺、一异丙醇胺中的一种或多种组合,在进行刻蚀时,通过调节所述蚀刻液组合物中的蚀刻抑制剂的含量,可调节铜/钼膜层的刻蚀速度,使得膜层具有适当锥角的蚀刻轮廓。The etching regulator is an amine compound. Specifically, the etching regulator may be one or more of diisopropanolamine, polyacrylamide, m-phenylenediamine, p-chloroaniline, and monoisopropanolamine. In a combination, when etching is performed, the etching rate of the copper / molybdenum film layer can be adjusted by adjusting the content of the etching inhibitor in the etching solution composition, so that the film layer has an etching profile with an appropriate taper angle.
所述无机盐可以无机钠盐、无机镁盐、无机钾盐中的一种或多种组合,具体的,所述无机盐可为氯化钠、氯化镁、氯化钾、硫酸钠、硫酸镁、硫酸钾、硝酸钠、硝酸镁、硝酸钾、醋酸钠、乙酸镁、乙酸钾中的一种或多种组合。The inorganic salt may be one or more combinations of inorganic sodium salt, inorganic magnesium salt, and inorganic potassium salt. Specifically, the inorganic salt may be sodium chloride, magnesium chloride, potassium chloride, sodium sulfate, magnesium sulfate, One or more combinations of potassium sulfate, sodium nitrate, magnesium nitrate, potassium nitrate, sodium acetate, magnesium acetate, potassium acetate.
所述螯合剂选自锡酸钠、焦磷酸钠、8-羟基喹啉、壳聚糖中的一种或多种。The chelating agent is selected from one or more of sodium stannate, sodium pyrophosphate, 8-hydroxyquinoline, and chitosan.
所述蚀刻抑制剂选自6-硝基苯并咪唑、2-氨基噻唑、2-氨基-5-硝基噻唑、5-氨基四氮唑、3-氨基-1,2,4-三唑、苯骈三氮唑、苯并三唑、唑氮钠、疏基苯并三氮唑中的至少一种。The etching inhibitor is selected from 6-nitrobenzimidazole, 2-aminothiazole, 2-amino-5-nitrothiazole, 5-aminotetrazole, 3-amino-1,2,4-triazole, At least one of benzotriazole, benzotriazole, sodium azole triazole, and sulfobenzotriazole.
下面结合具体实施例进行说明。The following description is made with reference to specific embodiments.
本实施例提供的铜/钼膜层用蚀刻液组合物包括:过氧化氢、2-羟基丙烷-1,2,3-三羧酸、二异丙醇胺、8-羟基喹啉、氯化钠、苯骈三氮唑。The etching solution composition for the copper / molybdenum film layer provided in this embodiment includes: hydrogen peroxide, 2-hydroxypropane-1,2,3-tricarboxylic acid, diisopropanolamine, 8-hydroxyquinoline, and chlorination. Sodium, benzotriazole.
如表1所示,表1为蚀刻液组合物的组成表,相对于整体蚀刻液组合物的质量,各个组成成分所占的质量分数分别为:过氧化氢10%、2-羟基丙烷-1,2,3-三羧酸8%、二异丙醇胺3%、8-羟基喹啉2.5%、氯化钠0.5%、苯骈三氮唑0.02%、去离子水75.98%。As shown in Table 1, Table 1 is a composition table of the etching solution composition. With respect to the mass of the entire etching solution composition, the mass fraction of each component is: hydrogen peroxide 10%, 2-hydroxypropane-1 8% of 2,3-tricarboxylic acid, 3% of diisopropanolamine, 2.5% of 8-hydroxyquinoline, 0.5% of sodium chloride, 0.02% of benzotriazole and 75.98% of deionized water.
表1Table 1
组分 Component 氧化物 Oxide 有机酸 Organic acid 蚀刻调节剂 Etching modifier 螯合剂 Chelating agent 无机盐 Inorganic salt 蚀刻抑制剂 Etching inhibitor 溶剂 Solvent
物质 Matter 过氧化氢 hydrogen peroxide 2-羟基丙烷-1,2,3-三羧酸 2-hydroxypropane-1,2,3-tricarboxylic acid 二异丙醇胺 Diisopropanolamine 8-羟基喹啉 8-hydroxyquinoline 氯化钠 Sodium chloride 苯骈三氮唑 Benzotriazole 去离子水 Deionized water
质量分数 Quality score 10% 10% 8% 8% 3% 3% 2.50% 2.50% 0.50% 0.50% 0.02% 0.02% 75.98% 75.98%
如图1所示,一般对铜/钼膜层进行蚀刻时,将具有铜/钼膜层的装置与蚀刻液接触,所述装置包括:基板11,铜/钼膜层12,以及光刻胶13。As shown in FIG. 1, when a copper / molybdenum film layer is generally etched, a device having a copper / molybdenum film layer is contacted with an etching solution. The device includes a substrate 11, a copper / molybdenum film layer 12, and a photoresist. 13.
性能良好的蚀刻液能够抑制膜层的侧蚀刻量,使得蚀刻后的膜层截面形状在规定的范围内。一般来讲,蚀刻后的铜/钼膜层12的端部的侧蚀刻面与所述基板11所在的平面形成的锥角α为30~60度较佳,同一侧的所述光刻胶13的下表面的端点到所述铜钼膜层12的下表面的端点的垂直距离m(CD Loss)小于1微米较佳。The etching solution with good performance can suppress the side etching amount of the film layer, so that the cross-sectional shape of the film layer after the etching is within a predetermined range. Generally speaking, the taper angle α formed by the side etched surface of the end of the etched copper / molybdenum film layer 12 and the plane on which the substrate 11 is located is preferably 30-60 degrees, and the photoresist 13 on the same side The vertical distance m (CD Loss) from the endpoint of the lower surface to the endpoint of the lower surface of the copper-molybdenum film layer 12 is preferably less than 1 micron.
如图2所示,在蚀刻温度为35条件下,利用扫描电子显微镜(SEM)对蚀刻后的膜层进行观察,数据表明,锥角α为46.2度,CD Loss为0.78微米,如图3所示,利用本实施例的蚀刻液组合物进行蚀刻后的膜层没有钼残留。由此可看出来,本发明提供的蚀刻液组合物的蚀刻效果良好。As shown in Figure 2, under the condition of an etching temperature of 35, the etched film was observed using a scanning electron microscope (SEM). The data showed that the cone angle α was 46.2 degrees and the CD Loss was 0.78 microns, as shown in Figure 3. It is shown that there is no molybdenum remaining on the film layer after being etched by using the etchant composition of this embodiment. It can be seen that the etching effect of the etching solution composition provided by the present invention is good.
有益效果:本发明提供的铜/钼膜层用蚀刻液组合物,降低了药液对环境和器件的影响,提高了刻蚀效率和刻蚀稳定性。Beneficial effect: The etching solution composition for the copper / molybdenum film layer provided by the present invention reduces the influence of the chemical solution on the environment and devices, and improves the etching efficiency and etching stability.
综上所述,虽然本发明已以优选实施例揭露如上,但上述优选实施例并非用以限制本发明,本领域的普通技术人员,在不脱离本发明的精神和范围内,均可作各种更动与润饰,因此本发明的保护范围以权利要求界定的范围为准。In summary, although the present invention has been disclosed as above with preferred embodiments, the above preferred embodiments are not intended to limit the present invention. Those skilled in the art can make various modifications without departing from the spirit and scope of the present invention. This kind of modification and retouching, therefore, the protection scope of the present invention is subject to the scope defined by the claims.

Claims (18)

  1. 一种铜/钼膜层用蚀刻液组合物,其中,包括:An etching solution composition for a copper / molybdenum film layer, comprising:
    混合均匀的氧化剂、有机酸、蚀刻调节剂、无机盐、螯合剂、蚀刻抑制剂、以及去离子水;Mix uniformly oxidant, organic acid, etching regulator, inorganic salt, chelating agent, etching inhibitor, and deionized water;
    其中,相对于整体组合物的质量,所述氧化剂的质量分数为5%~15%,所述有机酸的质量分数为4%~13%,所述蚀刻调节剂的质量分数为0.1%~5%,所述无机盐的质量分数为0.1%~5%,所述螯合剂的质量分数为0.5%~9%,所述蚀刻抑制剂的质量分数为0.001%~1%,余量为所述去离子水。Wherein, relative to the mass of the overall composition, the mass fraction of the oxidant is 5% to 15%, the mass fraction of the organic acid is 4% to 13%, and the mass fraction of the etching conditioner is 0.1% to 5 %, The mass fraction of the inorganic salt is 0.1% to 5%, the mass fraction of the chelating agent is 0.5% to 9%, the mass fraction of the etching inhibitor is 0.001% to 1%, and the balance is the Deionized water.
  2. 根据权利要求1所述的蚀刻液组合物,其中,所述氧化剂为过氧化氢。The etching solution composition according to claim 1, wherein the oxidant is hydrogen peroxide.
  3. 根据权利要求1所述的蚀刻液组合物,其中,所述有机酸选自乙酸、羟基乙酸、2-羟基丙烷-1,2,3-三羧酸、苯甲酸、乙二酸、丁二酸、2,3-二羟基丁二酸、2-羟基丁二酸、2-羟基丙酸、邻苯二甲酸中的至少一种。The etching solution composition according to claim 1, wherein the organic acid is selected from the group consisting of acetic acid, glycolic acid, 2-hydroxypropane-1,2,3-tricarboxylic acid, benzoic acid, oxalic acid, and succinic acid. At least one of 2,3-dihydroxysuccinic acid, 2-hydroxysuccinic acid, 2-hydroxypropionic acid, and phthalic acid.
  4. 根据权利要求1所述的蚀刻液组合物,其中,所述蚀刻调节剂为胺类化合物。The etching solution composition according to claim 1, wherein the etching conditioner is an amine compound.
  5. 根据权利要求4所述的蚀刻液组合物,其中,所述蚀刻调节剂选自二异丙醇胺、聚丙烯酰胺、间苯二胺、对氯苯胺、一异丙醇胺中的至少一种。The etching solution composition according to claim 4, wherein the etching modifier is selected from at least one of diisopropanolamine, polyacrylamide, m-phenylenediamine, p-chloroaniline, and monoisopropanolamine. .
  6. 根据权利要求1所述的蚀刻液组合物,其中,所述无机盐选自钠盐、镁盐、钾盐中的至少一种。The etching solution composition according to claim 1, wherein the inorganic salt is at least one selected from a sodium salt, a magnesium salt, and a potassium salt.
  7. 根据权利要求6所述的蚀刻液组合物,其中,所述无机盐选自氯化钠、氯化镁、氯化钾、硫酸钠、硫酸镁、硫酸钾、硝酸钠、硝酸镁、硝酸钾、醋酸钠、乙酸镁、乙酸钾中的至少一种。The etching solution composition according to claim 6, wherein the inorganic salt is selected from the group consisting of sodium chloride, magnesium chloride, potassium chloride, sodium sulfate, magnesium sulfate, potassium sulfate, sodium nitrate, magnesium nitrate, potassium nitrate, and sodium acetate. , Magnesium acetate, potassium acetate.
  8. 根据权利要求1所述的蚀刻液组合物,其中,所述螯合剂选自锡酸钠、焦磷酸钠、8-羟基喹啉、壳聚糖中的至少一种。The etching solution composition according to claim 1, wherein the chelating agent is at least one selected from the group consisting of sodium stannate, sodium pyrophosphate, 8-hydroxyquinoline, and chitosan.
  9. 根据权利要求1所述的蚀刻液组合物,其中,所述蚀刻抑制剂选自6-硝基苯并咪唑、2-氨基噻唑、2-氨基-5-硝基噻唑、5-氨基四氮唑、3-氨基-1,2,4-三唑、苯骈三氮唑、苯并三唑、唑氮钠、疏基苯并三氮唑中的至少一种。The etching solution composition according to claim 1, wherein the etching inhibitor is selected from the group consisting of 6-nitrobenzimidazole, 2-aminothiazole, 2-amino-5-nitrothiazole, and 5-aminotetrazole. , At least one of 3-amino-1,2,4-triazole, benzotriazole, benzotriazole, sodium oxazolium, and sulfobenzotriazole.
  10. 一种铜/钼膜层用蚀刻液组合物,其中,包括:An etching solution composition for a copper / molybdenum film layer, comprising:
    混合均匀的氧化剂、有机酸、蚀刻调节剂、无机盐、螯合剂、蚀刻抑制剂、以及溶剂;Mix uniformly oxidant, organic acid, etching regulator, inorganic salt, chelating agent, etching inhibitor, and solvent;
    其中,相对于整体组合物的质量,所述氧化剂的质量分数为5%~15%,所述有机酸的质量分数为4%~13%,所述蚀刻调节剂的质量分数为0.1%~5%,所述无机盐的质量分数为0.1%~5%,所述螯合剂的质量分数为0.5%~9%,所述蚀刻抑制剂的质量分数为0.001%~1%,余量为所述溶剂。Wherein, relative to the mass of the overall composition, the mass fraction of the oxidant is 5% to 15%, the mass fraction of the organic acid is 4% to 13%, and the mass fraction of the etching conditioner is 0.1% to 5 %, The mass fraction of the inorganic salt is 0.1% to 5%, the mass fraction of the chelating agent is 0.5% to 9%, the mass fraction of the etching inhibitor is 0.001% to 1%, and the balance is the Solvent.
  11. 根据权利要求10所述的蚀刻液组合物,其中,所述氧化剂为过氧化氢。The etching solution composition according to claim 10, wherein the oxidant is hydrogen peroxide.
  12. 根据权利要求10所述的蚀刻液组合物,其中,所述有机酸选自乙酸、羟基乙酸、2-羟基丙烷-1,2,3-三羧酸、苯甲酸、乙二酸、丁二酸、2,3-二羟基丁二酸、2-羟基丁二酸、2-羟基丙酸、邻苯二甲酸中的至少一种。The etching solution composition according to claim 10, wherein the organic acid is selected from the group consisting of acetic acid, glycolic acid, 2-hydroxypropane-1,2,3-tricarboxylic acid, benzoic acid, oxalic acid, and succinic acid. At least one of 2,3-dihydroxysuccinic acid, 2-hydroxysuccinic acid, 2-hydroxypropionic acid, and phthalic acid.
  13. 根据权利要求10所述的蚀刻液组合物,其中,所述蚀刻调节剂为胺类化合物。The etching solution composition according to claim 10, wherein the etching modifier is an amine compound.
  14. 根据权利要求13所述的蚀刻液组合物,其中,所述蚀刻调节剂选自二异丙醇胺、聚丙烯酰胺、间苯二胺、对氯苯胺、一异丙醇胺中的至少一种。The etching solution composition according to claim 13, wherein the etching modifier is selected from at least one of diisopropanolamine, polyacrylamide, m-phenylenediamine, p-chloroaniline, and monoisopropanolamine. .
  15. 根据权利要求10所述的蚀刻液组合物,其中,所述无机盐选自钠盐、镁盐、钾盐中的至少一种。The etching solution composition according to claim 10, wherein the inorganic salt is at least one selected from a sodium salt, a magnesium salt, and a potassium salt.
  16. 根据权利要求15所述的蚀刻液组合物,其中,所述无机盐选自氯化钠、氯化镁、氯化钾、硫酸钠、硫酸镁、硫酸钾、硝酸钠、硝酸镁、硝酸钾、醋酸钠、乙酸镁、乙酸钾中的至少一种。The etching solution composition according to claim 15, wherein the inorganic salt is selected from the group consisting of sodium chloride, magnesium chloride, potassium chloride, sodium sulfate, magnesium sulfate, potassium sulfate, sodium nitrate, magnesium nitrate, potassium nitrate, and sodium acetate. , Magnesium acetate, potassium acetate.
  17. 根据权利要求10所述的蚀刻液组合物,其中,所述螯合剂选自锡酸钠、焦磷酸钠、8-羟基喹啉、壳聚糖中的至少一种。The etching solution composition according to claim 10, wherein the chelating agent is at least one selected from the group consisting of sodium stannate, sodium pyrophosphate, 8-hydroxyquinoline, and chitosan.
  18. 根据权利要求10所述的蚀刻液组合物,其中,所述蚀刻抑制剂选自6-硝基苯并咪唑、2-氨基噻唑、2-氨基-5-硝基噻唑、5-氨基四氮唑、3-氨基-1,2,4-三唑、苯骈三氮唑、苯并三唑、唑氮钠、疏基苯并三氮唑中的至少一种。The etching solution composition according to claim 10, wherein the etching inhibitor is selected from the group consisting of 6-nitrobenzimidazole, 2-aminothiazole, 2-amino-5-nitrothiazole, and 5-aminotetrazole. , At least one of 3-amino-1,2,4-triazole, benzotriazole, benzotriazole, sodium oxazolium, and sulfobenzotriazole.
PCT/CN2018/105231 2018-08-31 2018-09-12 Etching solution composition for copper/molybdenum film layer WO2020042223A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201811013118.2A CN109023372A (en) 2018-08-31 2018-08-31 Copper/molybdenum film layer etchant
CN201811013118.2 2018-08-31

Publications (1)

Publication Number Publication Date
WO2020042223A1 true WO2020042223A1 (en) 2020-03-05

Family

ID=64622686

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2018/105231 WO2020042223A1 (en) 2018-08-31 2018-09-12 Etching solution composition for copper/molybdenum film layer

Country Status (2)

Country Link
CN (1) CN109023372A (en)
WO (1) WO2020042223A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110079803B (en) * 2019-04-24 2020-11-24 深圳市华星光电技术有限公司 Etching liquid, etching combination liquid and etching method
CN109930154A (en) * 2019-04-24 2019-06-25 深圳市华星光电技术有限公司 Etching liquid, etch combinations liquid and lithographic method
CN109930153B (en) * 2019-04-24 2021-01-01 深圳市华星光电技术有限公司 Etching liquid and etching device
CN113106454A (en) * 2021-03-24 2021-07-13 Tcl华星光电技术有限公司 Etching solution and etching method of copper/molybdenum metal wire
CN114540818B (en) * 2022-02-15 2023-11-10 江西省科学院应用物理研究所 Copper magnesium silicon alloy metallographic corrosive and metallographic structure display method thereof
CN115505389B (en) * 2022-08-22 2023-04-28 福建天甫电子材料有限公司 ITO etching solution and use method thereof

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102102206A (en) * 2009-12-18 2011-06-22 鑫林科技股份有限公司 Metal etching liquid composition and etching method
CN103924244A (en) * 2013-01-14 2014-07-16 易安爱富科技有限公司 Etching Liquid Composition Of Copper/molybdenum Film Or Copper/molybdenum Alloy Film
KR20150050948A (en) * 2013-11-01 2015-05-11 솔브레인 주식회사 Etchant composition for Cu/Mo alloy film
CN105369249A (en) * 2014-08-25 2016-03-02 乐金显示有限公司 Etchant composition and method for manufacturing thin film transistor array substrate
CN107858685A (en) * 2017-11-15 2018-03-30 深圳市华星光电技术有限公司 Etching solution and its application for copper/molybdenum film layer

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6494254B2 (en) * 2014-11-18 2019-04-03 関東化學株式会社 Copper / molybdenum metal laminated film etching solution composition, etching method using the composition, and method for extending the life of the composition
CN105803459B (en) * 2016-05-03 2019-01-15 苏州晶瑞化学股份有限公司 A kind of microelectronics metal multilayer film etching solution and its application
CN108004550A (en) * 2017-12-29 2018-05-08 深圳市华星光电技术有限公司 Etching solution and its application for copper/molybdenum film layer

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102102206A (en) * 2009-12-18 2011-06-22 鑫林科技股份有限公司 Metal etching liquid composition and etching method
CN103924244A (en) * 2013-01-14 2014-07-16 易安爱富科技有限公司 Etching Liquid Composition Of Copper/molybdenum Film Or Copper/molybdenum Alloy Film
KR20150050948A (en) * 2013-11-01 2015-05-11 솔브레인 주식회사 Etchant composition for Cu/Mo alloy film
CN105369249A (en) * 2014-08-25 2016-03-02 乐金显示有限公司 Etchant composition and method for manufacturing thin film transistor array substrate
CN107858685A (en) * 2017-11-15 2018-03-30 深圳市华星光电技术有限公司 Etching solution and its application for copper/molybdenum film layer

Also Published As

Publication number Publication date
CN109023372A (en) 2018-12-18

Similar Documents

Publication Publication Date Title
WO2020042223A1 (en) Etching solution composition for copper/molybdenum film layer
KR101057360B1 (en) Etchant composition for single layer and multi layers consisting of aluminum or aluminum alloy or/and molybdenum or molybdenum alloy
CN109234736B (en) Long-life copper-molybdenum etching solution and etching method
US8377325B2 (en) Etchant for metal wiring and method for manufacturing metal wiring using the same
CN106367755B (en) Etchant composition, method of manufacturing array substrate for liquid crystal display device using the same, and array substrate
KR102012426B1 (en) Manufacturing method of an array substrate for display device
WO2021208126A1 (en) Method for etching copper-molybdenum film layer and array substrate
CN107630219B (en) Metal film etching solution composition and method for manufacturing array substrate for display device
TWI684674B (en) Etchant composition for etching copper-based metal layer and etching method using the same
US20220349064A1 (en) Etchant and etching method for copper-molybdenum film layer
KR102344034B1 (en) Wet etching method for a single layer or multiple layer comprising Ag or Ag alloy, and etchant composition for a single layer or multiple layer comprising Ag or Ag alloy, and method for manufacturing a thin film transistor and a thin film transistor
KR100639594B1 (en) Eching composition for making metal electrodes of tft in flat panel display
KR20090061756A (en) Etchant composition and method for fabricating metal pattern
KR101369946B1 (en) Etchant for thin film transistor-liquid crystal displays
CN109594079B (en) Molybdenum-aluminum common etching solution and etching method
KR20080018010A (en) Etchant compositions for metal laminated films having titanium and aluminum layer
KR20100090535A (en) Manufacturing method of an array substrate for liquid crystal display
KR102362460B1 (en) Etchant composition
TW201627473A (en) Etching solution composition for indium oxide layer and method for manufacturing array substrate for liquid crystal display device using the same
KR101461180B1 (en) Copper Echant without Hydrogen Peroxide
KR20170047921A (en) Manufacturing method of an array substrate for liquid crystal display
KR20080051249A (en) Etchant composition for multi layers thin film comprising titanium or titanium alloy layer, and aluminum or aluminum alloy layer
JP2023138936A (en) Etchant composition
KR20120015487A (en) Etching solution composition for metal layer comprising copper and titanium
KR101602499B1 (en) Etching solution composition for formation of metal line

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 18931704

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 18931704

Country of ref document: EP

Kind code of ref document: A1