WO2019189360A1

WO2019189360A1 - Charged particle device, measurement system, and method for irradiating charged particle beam

Info

Publication number: WO2019189360A1
Application number: PCT/JP2019/013191
Authority: WO
Inventors: 貴行舩津
Original assignee: 株式会社ニコン
Priority date: 2018-03-30
Filing date: 2019-03-27
Publication date: 2019-10-03
Also published as: TW201942938A

Abstract

A charged particle device comprises: a vacuum formation member having a tubular path that can be connected to an exhaust device, a gas in a first space contacting the surface of an object being discharged via the tubular path, and the vacuum formation member forming a vacuum area; an irradiation device that irradiates a charged particle beam toward a sample via the vacuum area; a relative-position change device that changes the relative positions of the sample and the vacuum formation member, and changes the relative positions of the sample and the vacuum area; a partition wall member that divides a second space into a plurality of sections, the second space facing the other surface of the sample positioned on the opposite side from the surface of the sample irradiated by the charged particle beam; and an atmospheric pressure adjustment device that can control the atmospheric pressure of each of the plurality of sections. At least some of the gas in a space of the vacuum area that has an atmospheric pressure higher than the surrounding vacuum area is discharged via the tubular path of the vacuum formation member, and the passage of the charged particle beam irradiated from the irradiation device includes at least a part of the vacuum area.

Description

Charged particle apparatus, measurement system, and charged particle beam irradiation method

The present invention relates to a technical field of, for example, a charged particle device that irradiates an object with a charged particle beam, a measurement system including the charged particle device, and a charged particle beam irradiation method.

In Patent Document 1, a scanning electron microscope that forms a local vacuum region by blocking the periphery of an inspection target portion of an object irradiated with an electron beam from outside air is described as an example of a charged particle device. Yes. In an inspection using such an apparatus, it may be required to keep the non-inspection flat in order to reduce measurement errors.

US Patent Application Publication No. 2004/0144928

According to the first aspect, the vacuum forming member has a pipe line connectable to the exhaust device, discharges the gas in the first space in contact with the surface of the object through the pipe line, and forms a vacuum region. The relative position between the sample and the vacuum region is changed by changing the relative position between the irradiation device that irradiates the charged particle beam toward the sample through the vacuum region and the sample and the vacuum forming member. A relative position changing device, a partition member that divides a second space facing the other surface of the sample located on the opposite side of the surface to which the charged particle beam of the sample is irradiated, into a plurality of sections; An atmospheric pressure adjusting device capable of controlling the atmospheric pressure of each of the compartments, and at least a part of the gas in the space having a higher atmospheric pressure than the vacuum region around the vacuum region passes through the conduit of the vacuum forming member Discharged from the irradiation device. The path of the charged particle beam that charged particle device is provided comprising at least a portion of said vacuum region.

According to the second aspect, the pipe has a first end connected to the exhaust device and a second end connected to the first space in contact with the surface of the object, and the gas in the first space is supplied to the pipe. A vacuum forming member that discharges through a path and forms a vacuum region in the first space having a lower pressure than an external space connected to the first space; and charged particles toward the sample through the vacuum region An irradiation device for irradiating a beam, a relative position changing device for changing a relative position between the sample and the vacuum region by changing a relative position between the sample and the vacuum forming member, and the charged particle beam of the sample A partition member that divides the second space facing the other surface of the sample located on the opposite side of the surface to which the sample is irradiated into a plurality of compartments, and an atmospheric pressure adjustment device that can control the atmospheric pressure of each of the plurality of compartments A charged particle device is provided.

According to the third aspect, the pipe has a pipe line connectable to the exhaust device, and the gas is discharged through the pipe line in a state of being opposed to a part of the plane of the object. A vacuum forming member that forms a vacuum region in the first space in contact with the first portion, the pressure of which is lower than the pressure of the external space in contact with the second portion different from the first portion of the surface, and the sample through the vacuum region An irradiation device for irradiating a charged particle beam toward the surface, a relative position changing device for changing a relative position between the sample and the vacuum region by changing a relative position between the sample and the vacuum forming member, and the sample A partition member that divides the second space facing the other surface of the sample located on the opposite side of the surface irradiated with the charged particle beam into a plurality of sections, and controls the pressure of each of the plurality of sections Charged particle device equipped with possible atmospheric pressure regulator There is provided.

According to the fourth aspect, the gas in the first space that is in contact with the surface of the object is provided in a state in which the pipe that can be connected to the exhaust device is opposed to the end of the pipe. A vacuum forming member that discharges through the conduit to form a vacuum region, an irradiation device that irradiates a charged particle beam toward the sample through the vacuum region, and a relative relationship between the sample and the vacuum forming member A relative position changing device for changing the relative position between the sample and the vacuum region by changing the position; and the other surface of the sample located on the opposite side of the surface irradiated with the charged particle beam of the sample A partition member that divides the second space facing the space into a plurality of sections, and a pressure adjusting device that can control the pressure of each of the plurality of sections, and the path of the charged particle beam irradiated from the irradiation device is Charged particle packaging including at least part of the vacuum region There is provided.

According to the fifth aspect, the vacuum forming member has a pipe line connectable to the exhaust device, discharges the gas in the first space in contact with the surface of the object through the pipe line, and forms a vacuum region. A relative position for changing the relative position between the sample and the vacuum region by changing the relative position between the sample and the vacuum forming member, and an irradiation device for irradiating the sample with a charged particle beam through the vacuum region; A gas in a part of the second space facing the change device and the other surface of the sample located on the opposite side of the surface irradiated with the charged particle beam of the sample can be moved in the second space. An air pressure adjusting device including an exhaust device for exhausting air through an opening, and at least a part of a gas in a space having a higher air pressure than the vacuum region around the vacuum region passes through the conduit of the vacuum forming member. And is emitted from the irradiation device. The conductive particle beam path the charged particle device including at least a part of the vacuum region is provided.

According to the sixth aspect, the vacuum forming member has a pipe line connectable to the exhaust device, discharges the gas in the first space in contact with the surface of the object through the pipe line, and forms a vacuum region. An irradiation apparatus for irradiating the sample with a charged particle beam through the vacuum region, and a second space facing the other surface of the sample located on the opposite side of the surface of the sample to which the charged particle beam is irradiated A charged particle comprising: a partition wall that can form a pressure difference between the second space and the outside of the second space; and a pressure adjusting device that can adjust the pressure in the second space. An apparatus is provided.

According to a seventh aspect, comprising the charged particle device provided by any one of the first to sixth aspects described above, and the measuring device for measuring the sample under atmospheric pressure, the charging The particle device is provided with a measurement system that is a charged particle beam measurement device that measures the sample based on the detection result of the charged particle from the sample irradiated with the charged particle beam.

According to the eighth aspect, the gas in the first space in contact with the surface of the object is discharged through the conduit to form the vacuum region, and the atmospheric pressure is higher than the vacuum region around the vacuum region. Exhausting at least a portion of the gas through the duct, irradiating the sample with a charged particle beam that has passed through a passage space including at least a portion of the vacuum region, and the sample and the vacuum A second space divided into a plurality of sections facing the other surface of the sample located on the opposite side of the surface irradiated with the charged particle beam of the sample, and changing the relative position to the region In the vacuum region, the relative position with respect to the sample is changed in the second space by making the air pressure of some of the plurality of compartments different from the other compartments of the plurality of compartments And the area facing the sample Irradiation method of a charged particle beam comprising the reducing the difference between the pressure and the pressure of the vacuum region is provided.

According to the ninth aspect, the gas in the first space in contact with the surface of the object is discharged through the conduit to form a vacuum region, and the atmospheric pressure is higher than the vacuum region around the vacuum region. Exhausting at least a portion of the gas through the duct, irradiating the sample with a charged particle beam that has passed through a passage space including at least a portion of the vacuum region, and the sample and the vacuum Changing the relative position with respect to the region, and changing the pressure of a part of the second space facing the other surface of the sample located on the opposite side of the surface irradiated with the charged particle beam of the sample to the first By changing the relative position of the member having an opening communicating with the exhaust device that can be reduced from the atmospheric pressure of the other part of the two spaces with respect to the sample, the relative position with respect to the sample of the second space is changed. The vacuum region and the sample Irradiation method of a charged particle beam comprising the reducing the difference between the pressure and the pressure in the region opposite to the vacuum region Nde is provided.

According to the tenth aspect, the gas in the first space in contact with the surface of the object is discharged through the pipe line to form the vacuum region, and the atmospheric pressure is higher than the vacuum region around the vacuum region. Exhausting at least a portion of the gas through the duct, irradiating the sample with a charged particle beam that has passed through a passage space including at least a portion of the vacuum region, and the sample and the vacuum A second space facing the other surface of the sample located on a side opposite to the surface irradiated with the charged particle beam of the sample is changed between the sample and the partition wall. A charged particle beam comprising: enclosing and forming a pressure difference between the second space and the outside of the second space; and reducing a difference between the pressure in the second space and the pressure in the vacuum region An irradiation method is provided.

According to the eleventh aspect, the vacuum forming member capable of locally forming a vacuum region covering a part of the surface of the object in the first space on the object, and the charged particle beam on the object via the vacuum region A relative position changing device that changes a relative position between the object and the vacuum region by changing a relative position between the object and the vacuum forming member, and the charged particle beam of the object includes: A partition member that divides the second space facing the other surface of the object located on the opposite side of the irradiated surface into a plurality of sections, and the relative position of the plurality of sections with respect to the object is changed. In addition, the air pressure in a part of the compartment including the opposing region facing the vacuum region and the object is made different from the other compartments of the plurality of compartments, and the air pressure in the opposing region and the air pressure in the vacuum region are The difference between the atmospheric pressure and the atmospheric pressure in the vacuum region The charged particle device and a pressure adjustment device to reduce is provided than the difference.

According to the twelfth aspect, the vacuum forming member capable of locally forming a vacuum region covering a part of the surface of the object in the first space on the object, and the charged particle beam to the object via the vacuum region. A relative position changing device that changes a relative position between the object and the vacuum region by changing a relative position between the object and the vacuum forming member, and the charged particle beam of the object includes: Atmospheric pressure provided with an exhaust device that exhausts a part of the gas in the second space facing the other surface of the object located on the opposite side of the irradiated surface through an opening movable in the second space. An adjustment device, wherein the atmospheric pressure adjustment device positions the opening in a facing region opposite to the vacuum region, the relative position of which is changed with respect to the object, and the pressure in the facing region. The difference between the pressure in the vacuum region and the atmospheric pressure The charged particle device to reduce than the difference between the pressure in the vacuum region is provided.

According to the thirteenth aspect, the vacuum forming member capable of locally forming a vacuum region covering a part of the surface of the object in the first space on the object, and the charged particle beam on the object via the vacuum region And a second space facing the other surface of the object located on the opposite side of the surface irradiated with the charged particle beam of the object, together with the object, the second space and the The partition that can form a pressure difference with the outside of the second space, and the difference between the pressure in the second space and the pressure in the vacuum region can be reduced by the difference between the atmospheric pressure and the pressure in the vacuum region. There is provided a charged particle device comprising an atmospheric pressure adjusting device.

According to a fourteenth aspect, comprising the charged particle device provided by any one of the eleventh aspect to the thirteenth aspect described above, and a measuring device that measures the object under atmospheric pressure, the charging The particle apparatus is provided with a measurement system that is a charged particle beam measurement apparatus that measures the object based on a detection result of the charged particle from the object irradiated with the charged particle beam.

According to the fifteenth aspect, the vacuum region covering a part of the surface of the object is locally formed in the first space on the object, and the object is irradiated with the charged particle beam through the vacuum region. And changing the relative position of the object and the vacuum region, facing the other surface of the object opposite to the surface irradiated with the charged particle beam of the object, and a plurality of Relative to the object in the second space by making the atmospheric pressure of some of the plurality of sections different from the other sections of the plurality of sections in the second space divided into the sections There is provided a charged particle beam irradiation method including reducing the difference between the atmospheric pressure of the vacuum region whose position has been changed and the region facing the object across the object and the atmospheric pressure of the vacuum region.

According to the sixteenth aspect, the vacuum region that covers a part of the surface of the object is locally formed in the first space on the object, and the object is irradiated with the charged particle beam through the vacuum region. And changing the relative position between the object and the vacuum region, and a second space facing the other surface of the object located on the opposite side of the surface irradiated with the charged particle beam of the object By changing the relative position of the member having an opening communicating with the exhaust device that can reduce the atmospheric pressure of a part of the second space from the atmospheric pressure of the other part of the second space with respect to the object, There is provided a charged particle beam irradiation method including reducing the difference between the atmospheric pressure of the vacuum region whose relative position is changed with respect to an object, and the air pressure of the region facing the object across the object and the pressure of the vacuum region .

According to the seventeenth aspect, the vacuum region that covers a part of the surface of the object is locally formed in the first space on the object, and the object is irradiated with the charged particle beam through the vacuum region. And changing the relative position between the object and the vacuum region, and a second space facing the other surface of the object located on the opposite side of the surface irradiated with the charged particle beam of the object Is surrounded by the object and the partition wall, and a pressure difference is formed between the second space and the outside of the second space, and a difference between the pressure in the second space and the pressure in the vacuum region is reduced. A charged particle beam irradiation method is provided.

The operation and other advantages of the present invention will be clarified from the embodiments to be described below.

FIG. 1 is a cross-sectional view showing the structure of a scanning electron microscope. FIG. 2 is a cross-sectional view showing the structure of the beam irradiation device provided in the scanning electron microscope. FIG. 3 is a perspective view showing a structure of a beam irradiation device provided in the scanning electron microscope. FIG. 4 is a cross-sectional view showing the structure of the stage provided in the scanning electron microscope. FIG. 5 is a plan view showing the structure of the stage provided in the scanning electron microscope. Each of FIGS. 6A to 6C is a cross-sectional view showing a process in which a sample is deformed due to the formation of a vacuum region. FIG. 7 is a cross-sectional view showing a sample whose deformation is suppressed by the deformation suppressing operation. FIG. 8 is a cross-sectional view showing the structure of the stage of the first modification. Each of FIGS. 9A and 9B shows a technical reason why the sample is deformed when a local vacuum region is formed in the vicinity of the outer edge of the sample held by the stage of the first modified example. It is sectional drawing. FIG. 10 is a cross-sectional view showing the structure of the stage of the second modified example. FIG. 11 is a cross-sectional view showing the structure of the stage of the third modified example. FIG. 12 is a cross-sectional view showing the structure of the stage of the fourth modified example. FIG. 13 is a cross-sectional view showing the structure of the stage of the fifth modified example. FIG. 14 is a cross-sectional view showing the structure of the stage of the sixth modified example. FIG. 15A is a cross-sectional view showing the structure of the stage according to the seventh modification, and FIG. 15B is a plan view showing the structure of the stage according to the seventh modification. Each of FIG. 16A and FIG. 16B is a cross-sectional view schematically showing the force acting on the sample in the seventh modified example. FIG. 17 is a cross-sectional view showing the structure of the stage of the eighth modification. FIG. 18 is a cross-sectional view showing the structure of the stage of the ninth modification. FIG. 19 is a cross-sectional view showing the structure of the stage of the tenth modification. FIG. 20 is a cross-sectional view showing the structure of the stage of the eleventh modification. FIG. 21A is a cross-sectional view showing the structure of the stage of the twelfth modification, and FIG. 21B is a plan view showing the structure of the stage of the twelfth modification. FIG. 22A is a cross-sectional view showing the structure of the stage of the thirteenth modification, and FIG. 22B is a plan view showing the structure of the stage of the thirteenth modification. FIG. 23 is a cross-sectional view showing the structure of a scanning electron microscope according to the fourteenth modification. FIG. 24 is a cross-sectional view showing the structure of the stage of the fifteenth modification. FIG. 25 is a cross-sectional view showing the structure of the stage of the sixteenth modification. FIG. 26 is a cross-sectional view showing the structure of the stage of the seventeenth modification. FIG. 27 is a cross-sectional view showing the structure of the stage of the eighteenth modification. FIG. 28 is a cross-sectional view showing the structure of a scanning electron microscope of the nineteenth modification. FIG. 29 is a cross-sectional view showing how the stage holds the sample in the twentieth modification. FIG. 30 is a cross-sectional view showing how the stage holds the sample in the twenty-first modification. FIG. 31 is a cross-sectional view showing how the stage holds the sample in the twenty-second modification.

Hereinafter, embodiments of a charged particle device, a measurement system, and a charged particle beam irradiation method will be described with reference to the drawings. In the following, a scanning electron microscope (Scanning Electron Microscope) that acquires information on the sample W by irradiating the sample W with the electron beam EB via the local vacuum region VSP (for example, measuring the state of the sample W). An embodiment of a charged particle device, a measurement system, and a charged particle beam irradiation method will be described using an SEM. The sample W is, for example, a semiconductor substrate. However, the sample W may be an object different from the semiconductor substrate. The sample W is, for example, a disk-shaped substrate having a diameter of about 300 millimeters and a thickness of about 700 to 800 micrometers. However, the sample W may be a substrate (or object) having an arbitrary size and an arbitrary shape. For example, the sample W may be a square substrate for a display such as a liquid crystal display element or a square substrate for a photomask.

In the following description, the positional relationship of various components constituting the scanning electron microscope SEM will be described using an XYZ orthogonal coordinate system defined by mutually orthogonal X, Y, and Z axes. In the following description, for convenience of explanation, each of the X-axis direction and the Y-axis direction is a horizontal direction (that is, a predetermined direction in the horizontal plane), and the Z-axis direction is a vertical direction (that is, a direction orthogonal to the horizontal plane). Yes, in the vertical direction). Further, the + Z side corresponds to the upper side (that is, the upper side), and the −Z side corresponds to the lower side (that is, the lower side). The Z-axis direction is also a direction parallel to an optical axis AX of a beam optical system 11 (described later) provided in the scanning electron microscope SEM. Further, the rotation directions around the X axis, the Y axis, and the Z axis (in other words, the tilt direction) are referred to as a θX direction, a θY direction, and a θZ direction, respectively.

(1) the structure beginning of the scanning electron microscope SEM, with reference to FIGS. 1-5, a description will be given of the structure of a scanning electron microscope SEM. FIG. 1 is a cross-sectional view showing the structure of a scanning electron microscope SEM. FIG. 2 is a cross-sectional view showing the structure of the beam irradiation apparatus 1 provided in the scanning electron microscope SEM. FIG. 3 is a perspective view showing the structure of the beam irradiation apparatus 1 provided in the scanning electron microscope SEM. FIG. 4 is a cross-sectional view showing the structure of the stage 22 provided in the scanning electron microscope SEM. FIG. 5 is a plan view showing the structure of the stage 22 provided in the scanning electron microscope SEM. For simplification of the drawing, FIG. 1 does not show a cross section of some components of the scanning electron microscope SEM.

As shown in FIG. 1, the scanning electron microscope SEM includes a beam irradiation device 1, a stage device 2, a support frame 3, a control device 4, and a pump system 5. Further, the pump system 5 includes a vacuum pump 51, a vacuum pump 52, a vacuum pump 53, and a vacuum pump 54. The scanning electron microscope SEM may include a chamber that accommodates at least the beam irradiation device 1, the stage device 2, and the support frame 3. Further, an air conditioner that is connected to the chamber and controls the temperature and humidity of the space in the chamber, particularly the space around the sample W may be provided.

The beam irradiation device 1 can emit an electron beam EB downward from the beam irradiation device 1. The beam irradiation apparatus 1 can irradiate the sample beam W held by the stage apparatus 2 disposed below the beam irradiation apparatus 1 with the electron beam EB. In order to irradiate the sample W with the electron beam EB, the beam irradiation apparatus 1 includes a beam optical system 11 and a differential pumping system 12 as shown in FIGS.

As shown in FIG. 2, the beam optical system 11 includes a housing 111. The casing 111 is a cylindrical member in which a beam passage space SPb1 extending along the optical axis AX of the beam optical system 11 (that is, extending along the Z axis) is secured. The beam passage space SPb1 is used as a space through which the electron beam EB passes. In order to prevent the electron beam EB passing through the beam passage space SPb1 from passing through the casing 111 (that is, leaking out of the casing 111), the casing 111 is made of a high permeability material. Also good. An example of the high magnetic permeability material is at least one of permalloy and silicon steel. The relative permeability of these high permeability materials is 1000 or more.

The beam passage space SPb1 is a vacuum space during the period of irradiation with the electron beam EB. Specifically, a pipe (that is, a pipe) formed in the casing 111 (and further, a side wall member 122 described later) is connected to the beam passage space SPb1 so as to communicate with the beam passage space SPb1 (that is, to be connected). Path) The vacuum pump 51 is connected via the 117. The vacuum pump 51 exhausts the beam passage space SPb1 to reduce the pressure from the atmospheric pressure so that the beam passage space SPb1 becomes a vacuum space. For this reason, the vacuum space in this embodiment may mean a space whose pressure is lower than atmospheric pressure. In particular, the vacuum space is a space in which gas molecules do not exist so much as to prevent proper irradiation of the sample W of the electron beam EB (in other words, a degree of vacuum that does not prevent appropriate irradiation of the sample W of the electron beam EB). Space). The beam passage space SPb1 is a space outside the casing 111 (more specifically, a differential exhaust system 12 described later) via a beam emission port (that is, an opening) 119 formed on the lower surface of the casing 111. It communicates with the beam passage space SPb2). The beam passage space SPb1 may be a vacuum space during a period when the electron beam EB is not irradiated.

The beam optical system 11 further includes an electron gun 113, an electromagnetic lens 114, an objective lens 115, and an electron detector 116. The electron gun 113 emits an electron beam EB toward the −Z side. Instead of the electron gun 113, a photoelectric conversion surface that emits electrons when irradiated with light may be used. The electromagnetic lens 114 controls the electron beam EB emitted from the electron gun 113. For example, the electromagnetic lens 114 has a rotation amount of an image (that is, a position in the θZ direction) formed on a predetermined optical surface (for example, a virtual surface intersecting the optical path of the electron beam EB), and a magnification of the image. And any one of the focal positions corresponding to the imaging positions may be controlled. The objective lens 115 is the surface of the sample W (specifically, the surface on which the electron beam EB is irradiated with the electron beam EB at a predetermined reduction magnification, and faces the + Z side in the examples shown in FIGS. 1 and 2. The image is formed on the surface WSu). The electron detector 116 is a semiconductor-type electron detection device (that is, a semiconductor detection device) using a pn junction or pin junction semiconductor. The electron detector 116 detects electrons (for example, at least one of reflected electrons and scattered electrons. The scattered electrons include secondary electrons) generated by irradiation of the sample W with the electron beam EB. The control device 4 specifies the state of the sample W based on the detection result of the electron detector 116. For example, the control device 4 specifies the three-dimensional shape of the surface WSu of the sample W based on the detection result of the electron detector 116. In the present embodiment, the surface WSu of the sample W is ideally a flat surface, and the control device 4 identifies the three-dimensional shape of the surface WSu including the shape of the fine uneven pattern formed on the surface WSu. It shall be. Note that the surface WSu of the sample W may not be a flat surface. Further, the electron detector 116 may be provided in the differential exhaust system 12 described later.

The differential exhaust system 12 includes a vacuum forming member 121 and a side wall member 122. The side wall member 122 is a cylindrical member extending upward from the vacuum forming member 121. The side wall member 122 accommodates the housing 111 (that is, the beam optical system 11) inside. The side wall member 122 is integrated with the beam optical system 11 in a state where the beam optical system 11 is accommodated therein, but may be separable from the beam optical system 11. The vacuum forming member 121 is disposed below the beam optical system 11 (that is, on the −Z side). The vacuum forming member 121 is connected (that is, connected) to the beam optical system 11 below the beam optical system 11. The vacuum forming member 121 is connected to the beam optical system 11 and integrated with the beam optical system 11, but may be separable. Inside the vacuum forming member 121, a beam passage space SPb2 is formed. In FIG. 3, the vacuum forming member 121 is a vacuum forming member 121-1 in which a beam passing space SPb2-1 that is a part of the beam passing space SPb2 is formed, and a beam passing space that is a part of the beam passing space SPb2. The vacuum forming member 121-2 in which the SPb2-2 is formed and the vacuum forming member 121-3 in which the beam passing space SPb2-3, which is a part of the beam passing space SPb2, is formed from the beam passing space SPb2-1. Although the example has a structure in which SPb2-3 are stacked so as to communicate with each other, the structure of the vacuum forming member 121 is not limited to this example. The beam passage space SPb2 passes through a beam exit (that is, an opening) 1231 formed on the upper surface of the vacuum forming member 121 (in the example shown in FIG. 3, the surface on the + Z side of the vacuum forming member 121-3). The optical system 11 communicates with the beam passage space SPb1. The beam passage space SPb2 is exhausted (that is, decompressed) by the vacuum pump 51 together with the beam passage space SPb1. Therefore, the beam passage space SPb2 becomes a vacuum space during the period when the electron beam EB is irradiated. The beam passage space SPb2 is used as a space through which the electron beam EB from the beam passage space SPb1 passes. In order to prevent the electron beam EB passing through at least one of the beam passage spaces SPb1 and SPb2 from passing through at least one of the vacuum forming member 121 and the side wall member 122 (that is, leaking out of the differential exhaust system 12). In order to prevent the external magnetic field (so-called disturbance magnetic field) of the beam irradiation apparatus 1 from affecting the electron beam EB passing through at least one of the beam passage spaces SPb1 and SPb2, the vacuum forming member 121 and the side wall At least one of the members 122 may be made of a high magnetic permeability material.

The vacuum forming member 121 further includes an emission surface 121LS that can face the surface WSu of the sample W. In the example shown in FIG. 3, the vacuum forming member 121-1 includes an emission surface 121LS. In the beam irradiation apparatus 1, the distance D between the emission surface 121LS and the surface WSu (that is, the distance D between the beam irradiation apparatus 1 and the sample W in the Z-axis direction) is a desired distance D_target (for example, 10 μm or less and 1 μm). As described above, the alignment is performed with respect to the sample W by the interval adjusting system 14 described later. The interval D may be referred to as a distance in the Z-axis direction between the emission surface 121LS and the surface WSu. A beam exit (that is, an opening) 1232 is formed on the exit surface 121LS. Note that the vacuum forming member 121 may not include the emission surface 121LS that can face the surface WSu of the sample W. As shown in FIG. 2, the beam passage space SPb <b> 2 communicates with the beam passage space SPb <b> 3 outside the vacuum forming member 121 through the beam emission port 1232. That is, the beam passage space SPb1 communicates with the beam passage space SPb3 via the beam passage space SPb2. However, the beam passage space SPb2 may not be ensured. That is, the beam passage space SPb1 may directly communicate with the beam passage space SPb3 without passing through the beam passage space SPb2. The beam passage space SPb3 is a local space on the sample W. The beam passage space SPb3 is a local space through which the electron beam EB passes between the beam irradiation apparatus 1 and the sample W (specifically, between the emission surface 121LS and the surface WSu). The beam passage space SPb3 is a space that at least faces (or covers or touches) an irradiation region irradiated with the electron beam EB in the surface WSu of the sample W. The beam passage space SPb3 is exhausted (that is, depressurized) by the vacuum pump 51 together with the beam passage spaces SPb1 and SPb2. In this case, each of the beam passage spaces SPb1 and SPb2 can also function as an exhaust passage (that is, a pipe line) that connects the beam passage space SPb3 and the vacuum pump 51 in order to exhaust the beam passage space SPb3. Therefore, the beam passage space SPb3 becomes a vacuum space during the period when the electron beam EB is irradiated. Therefore, the electron beam EB emitted from the electron gun 113 is irradiated onto the sample W through at least a part of the beam passage spaces SPb1 to SPb3, which are all vacuum spaces. The beam passage space SPb3 may be a vacuum space during a period when the electron beam EB is not irradiated.

The beam passage space SPb3 is located farther from the vacuum pump 51 than the beam passage spaces SPb1 and SPb2. The beam passage space SPb2 is located farther from the vacuum pump 51 than the beam passage space SPb1. Therefore, the degree of vacuum of the beam passage space SPb3 may be lower than the degree of vacuum of the beam passage spaces SPb1 and SPb2, and the degree of vacuum of the beam passage space SPb2 is lower than the degree of vacuum of the beam passage space SPb1. May be lower. In the present embodiment, the state “the degree of vacuum in the space B is lower than the degree of vacuum in the space A” means “the pressure in the space B is higher than the pressure in the space A”. In this case, the vacuum pump 51 is such that the degree of vacuum of the beam passage space SPb3 where the degree of vacuum may be the lowest can be set to a degree of vacuum that does not hinder appropriate irradiation of the sample W of the electron beam EB. Has exhaust capability. As an example, the vacuum pump 51, the pressure of the beam passing space SPb3 (i.e., atmospheric pressure) to keep the below 1 × ^{10 -3} pascals (e.g., approximately 1 × ^{10 -3} pascals at 1 × ^{10 -4} Pascal order It may have an exhaust capability that can be maintained). As such a vacuum pump 51, for example, a turbo molecular pump used as a main pump (or another kind of high vacuum pump including at least one of a diffusion pump, a cryopump and a sputter ion pump) and an auxiliary pump are used. A vacuum pump in combination with a dry pump (or another type of low vacuum pump) may be used. Note that the vacuum pump 51 may have an exhaust velocity [m ³ / s] that can maintain the pressure (that is, the atmospheric pressure) of the beam passage space SPb3 at 1 × 10 ⁻³ Pascal or less.

However, the beam passage space SPb3 is not a closed space surrounded by some members (specifically, the casing 111 and the vacuum forming member 121) like the beam passage spaces SPb1 and SPb2. That is, the beam passage space SPb3 is an open space that is not surrounded by any member. For this reason, even if the beam passage space SPb3 is decompressed by the vacuum pump 51, gas flows into the beam passage space SPb3 from the periphery of the beam passage space SPb3. As a result, the vacuum degree of the beam passage space SPb3 may be reduced. Therefore, the differential exhaust system 12 maintains the degree of vacuum in the beam passage space SPb3 by performing differential exhaust between the beam irradiation apparatus 1 and the sample W. That is, the differential pumping system 12 performs differential pumping between the beam irradiation device 1 and the sample W, so that a relatively high vacuum is generated between the beam irradiation device 1 and the sample W compared to the surroundings. A local vacuum region VSP is maintained, and the local vacuum region VSP includes the local beam passage space SPb3. In other words, the differential pumping system 12 performs differential pumping so that the local beam passage space SPb3 is included in the local vacuum region VSP. Note that the differential exhaust in the present embodiment is an air pressure between the sample W and the beam irradiation apparatus 1 between one space (for example, the beam passage space SPb3) and another space different from the one space. This corresponds to exhausting the beam passage space SPb3 while utilizing the property that the difference is maintained by the exhaust resistance of the gap between the sample W and the beam irradiation apparatus 1. Since the beam passage space SPb3 locally covers at least a part of the surface WSu of the sample W (for example, an irradiation region irradiated with the electron beam EB), the vacuum region VSP also includes the surface WSu of the sample W. At least a part (for example, an irradiation region irradiated with the electron beam EB) is locally covered. Specifically, an exhaust groove (that is, an opening that does not penetrate the vacuum forming member 121) 124 that surrounds the beam exit port 1232 is formed on the exit surface 121 LS of the vacuum forming member 121. A vacuum pump 52 is connected to the exhaust groove 124 via a pipe (that is, a pipe line) 125 formed in the vacuum forming member 121 and the side wall member 122 so as to communicate with the exhaust groove 124. A first end (that is, one end portion) of the pipe 125 is connected to the vacuum pump 52, and a second end (that is, the other end portion) of the pipe 125 substantially forms the exhaust groove 124. Part) is in contact with the space between the exit surface 12LS and the surface WSu of the sample W. Note that FIG. 3 shows an example in which the differential exhaust system 12 has a structure in which the pipes 125 are gathered before reaching the vacuum pump 52 from the exhaust groove 124. Specifically, FIG. 3 shows an annular channel 125 extending upward from the annular exhaust groove 124 so as to penetrate the vacuum forming member 121-1 to the vacuum forming member 121-1 having the exhaust groove 124 formed therein. -1 is formed, and N1 (four in the example shown in FIG. 3) pipes 125-21 and N1 pipes 125-21 connected to the flow path 125-1 are collected in the vacuum forming member 121-2. N2 (where N2 <N1) (two in the example shown in FIG. 3) communicating with the aggregation channel 125-22 is formed in the vacuum forming member 121-3. An annular aggregate flow path 125-32 that aggregates the pipes 125-31 and N2 pipes 125-31 is formed, the pipe 125-4 communicates with the aggregate flow path 125-32, and the pipe 125-4 is a vacuum pump. The example connected to 52 is shown. Here, the number N2 of the pipes 125-31 is half of the number N1 of the pipes 125-21, and one pipe 125-31 is located at approximately the same distance from the two pipes 125-21 communicating therewith. ing. Further, the number N2 of the pipes 125-31 is half of the number of the pipes 125-4 (one in the example shown in FIG. 3), and the pipes 125-4 are substantially separated from the two pipes 125-31 communicating therewith. Located equidistant. Therefore, the length and pressure loss of the exhaust path through each pipe 125-21 are substantially equal, and the amount of air exhausted from the exhaust groove 124 is not biased regardless of the direction. However, the structure of the pipe 125 is not limited to this example. The vacuum pump 52 exhausts the space around the beam passage space SPb3 via the exhaust groove 124. As a result, the differential exhaust system 12 can appropriately maintain the degree of vacuum of the beam passage space SPb3. The exhaust groove 124 may not be connected to one ring, but may be a plurality of exhaust grooves having a plurality of part of the ring.

Returning to FIG. 2, the vacuum pump 52 is mainly used for exhausting a local space around the beam passage space SPb3 in order to relatively increase the degree of vacuum of the beam passage space SPb3. For this reason, the vacuum pump 52 may have an exhaust capability sufficient to maintain a vacuum level lower than the vacuum level maintained by the vacuum pump 51. That is, the exhaust capability of the vacuum pump 52 may be lower than the exhaust capability of the vacuum pump 51. For example, the vacuum pump 52 may be a vacuum pump that includes a dry pump (or other type of low vacuum pump) but does not include a turbo molecular pump (or other type of high vacuum pump). Good. In this case, the degree of vacuum in the space in the exhaust groove 124 and the pipe 125 decompressed by the vacuum pump 52 may be lower than the degree of vacuum in the beam irradiation spaces SPb1 to SPb3 decompressed by the vacuum pump 51. The vacuum pump 52 may have an exhaust speed [m ³ / s] that can maintain a vacuum level lower than the vacuum level maintained by the vacuum pump 51.

Thus, while the local vacuum region VSP is formed in the beam passage space SPb3, the portion of the surface WSu of the sample W that does not face the beam passage space SPb3 (particularly, the portion away from the beam passage space SPb3). May be covered by a non-vacuum region having a lower degree of vacuum than the vacuum region VSP. Typically, at least a part of the surface WSu of the sample W that does not face the beam space SPb3 may be in an atmospheric pressure environment. That is, at least a part of the surface WSu of the sample W that does not face the beam passage space SPb3 may be covered with the atmospheric pressure region. Specifically, the differential exhaust system 12 forms a vacuum region VSP in the space SP1 (see FIG. 2) including the beam passage space SPb3. The space SP1 includes, for example, a space in contact with at least one of the beam outlet 1232 and the exhaust groove 124. The space SP1 includes a space that faces (that is, touches) a portion of the surface WSu of the sample W that is positioned immediately below at least one of the beam exit port 1232 and the exhaust groove 124. On the other hand, in the space SP2 around the space SP1 (that is, the space SP2 connected to the space SP1 (for example, fluidly connected around the space SP1, see FIG. 2)), the vacuum region VSP is Not formed. That is, the space SP2 is a space having a higher pressure than the space SP1. The space SP2 includes, for example, a space away from the beam exit 1232 and the exhaust groove 124. The space SP2 includes, for example, a space that faces a portion of the surface WSu of the sample W that is different from the portion that the space SP1 faces. The space SP2 includes a space that cannot be connected to the beam emission port 1232 and the exhaust groove 124 (further, the beam passage space SPb2 and the pipe 125) without passing through the space SP1. The space SP2 includes a space that can be connected to the beam outlet 1232 and the exhaust groove 124 (further, the beam passage space SPb2 and the pipe 125) via the space SP1. Since the pressure in the space SP2 is higher than the pressure in the space SP1, gas may flow into the space SP1 from the space SP2, but the gas flowing into the space SP1 from the space SP2 is discharged into the exhaust groove 124 ( Further, it is discharged from the space SP1 through the beam exit port 1232). That is, the gas flowing into the space SP1 from the space SP2 is discharged from the space SP1 through the pipe 125 (further, the beam passage space SPb2). For this reason, the degree of vacuum of the vacuum region VSP formed in the space SP1 is maintained. For this reason, the state in which the vacuum region VSP is locally formed is a state in which the vacuum region VSP is locally formed on the surface WSu of the sample W (that is, the vacuum region VSP in the direction along the surface WSu of the sample W). May mean a state in which is locally formed.

In FIG. 1 again, the stage device 2 is disposed below the beam irradiation device 1 (that is, on the −Z side). The stage device 2 includes a surface plate 21 and a stage 22. The surface plate 21 is disposed on a support surface SF such as a floor. The stage 22 is disposed on the surface plate 21. Between the stage 22 and the surface plate 21, an anti-vibration device (not shown) for preventing the vibration of the surface plate 21 from being transmitted to the stage 22 is installed.

The stage 22 can hold the sample W. The stage 22 can release the held sample W. In order to hold the sample W in a releasable manner, the stage 22 includes a bottom member 221, a side wall member 222, and a plurality of support members 223 as shown in FIGS. 4 and 5. The bottom member 221 is a disk-like (or other arbitrary shape) member extending along the XY plane. When the outer shape or contour of the sample W is circular, the bottom member 221 may be disk-shaped, and when the outer shape or contour of the sample W is rectangular, the bottom member 221 is rectangular. There may be. The side wall member 222 is a member formed so as to protrude upward (that is, + Z side) from the bottom member 221 at the outer edge of the bottom member 221. The side wall member 222 is a member having an annular shape (or other arbitrary shape) in plan view. When the outer shape or outline of the sample W is circular, the side wall member 222 may have an annular shape in plan view. When the outer shape or outline of the sample W is rectangular, the side wall member 222 is It may be rectangular in plan view. The upper surface (that is, + Z side surface) 222Su of the side wall member 222 is located above the upper surface 221Su of the bottom member 221. Therefore, a stage space SPs corresponding to a recessed space surrounded by the bottom member 221 and the side wall member 222 is formed in the stage 22. Each of the plurality of support members 223 has a pin shape formed on the bottom member 221 so as to protrude upward (that is, on the + Z side) from the bottom member 221 in a region surrounded by the side wall member 222 (that is, the stage space SPs). Or a conical or pyramidal member. The plurality of support members 223 are arranged in a regular (or random) arrangement pattern in a region surrounded by the side wall member 222. The plurality of support members 223 may have a regular arrangement pattern in which the support members 223 are uniformly distributed in the region surrounded by the side wall member 222, and the center of the region in the region surrounded by the side wall member 222 ( It may be a regular arrangement pattern in which the density varies depending on the distance from the center of gravity. The upper surface 223Su of the support member 223 is positioned at the same height as the upper surface 222Su of the side wall member 222. That is, the upper surface 223Su of the support member 223 may be located on the same plane as the upper surface 222Su of the side wall member 222. The stage 22 is in a state where the back surface of the sample W (that is, the surface opposite to the front surface WSu and the surface on the −Z side) WS1 is in contact with the upper surface 222Su of the side wall member 222 and the upper surfaces 223Su of the plurality of support members 223. The sample W is held. The stage 22 holds the sample W with the back surface WSl of the sample W facing the stage space SPs.

An exhaust port 2241 is formed on the upper surface 221Su of the bottom member 221. A vacuum pump 53 is connected to the exhaust port 2241 via a pipe 2251. The vacuum pump 53 can evacuate the stage space SPs surrounded by the bottom member 221, the side wall member 222, and the sample W to reduce the pressure from the atmospheric pressure. Here, the surface WSu of the sample W (however, the vacuum surface portion WSu_vac facing the above-described local vacuum region VSP of the surface WSu of the sample W) is exposed to atmospheric pressure. For this reason, when the stage space SPs is exhausted (that is, depressurized), a negative pressure that draws the sample W toward the stage space SPs acts on the sample W. The stage 22 holds the sample W by vacuum-sucking the sample W using this negative pressure. Therefore, it can be said that the stage 22 is a stage for holding the sample W using a so-called vacuum chuck.

The vacuum pump 53 only needs to have an exhaust capability that allows the stage 22 to vacuum-suck and hold the sample W. For example, the vacuum pump 53 sets the pressure of the stage space SPs to a pressure (for example, a pressure on the order of about 5 × 10 ⁴ Pascals) smaller than the atmospheric pressure (that is, a pressure on the order of about 1 × 10 ⁵ Pascals). What is necessary is just to have the exhaust capability which can be maintained. Furthermore, the vacuum pump 53 may have a lower exhaust capacity than the vacuum pump 51 that exhausts the beam passage spaces SPb1 to SPb3. That is, the vacuum pump 53 lowers the pressure of the stage space SPs facing the back surface WSl of the sample W as low as the pressure of the beam passage space SPb3 facing the surface WSu of the sample W (that is, the pressure of the vacuum region VSP). You may have the exhaust capability of the grade which is not necessary. The vacuum pump 53 may have an exhaust speed [m ³ / s] that can maintain the pressure of the stage space SPs at 5 × 10 ⁴ Pascal or less.

An exhaust port 2242 is further formed on the upper surface of the bottom member 221. A vacuum pump 54 is connected to the exhaust port 2242 via a pipe 2252. As with the vacuum pump 53, the vacuum pump 54 can evacuate the stage space SPs to reduce the pressure from atmospheric pressure. When the stage space SPs is depressurized, the difference between the pressure in the stage space SPs and the pressure in the vacuum region VSP becomes smaller than the difference between the atmospheric pressure and the pressure in the vacuum region VSP. In this case, the bottom member 221, the side wall member 222, and the sample W are members that can ensure the airtightness of the stage space SPs (that is, members that can seal the stage space SPs, and the stage space SPs and the stage space SPs). It is used as a member capable of forming a pressure difference with the external space. The vacuum pump 54 has an exhaust capability equivalent to that of the vacuum pump 51 that exhausts the beam passage spaces SPb1 to SPb3. As an example, the vacuum pump 54 can maintain the pressure of the stage space SPs at 1 × 10 ⁻³ Pascal or less (eg, approximately on the order of 1 × 10 ⁻³ Pascal to 1 × 10 ⁻⁴ Pascal). It may have a degree of exhaust capability. The vacuum pump 54 may have an exhaust speed [m ³ / s] that can maintain the pressure of the stage space SPs at 1 × 10 ⁻³ Pascal or less. As such a vacuum pump 54, for example, a turbo molecular pump used as a main pump (or another type of high vacuum pump including at least one of a diffusion pump, a cryopump and a sputter ion pump) and an auxiliary pump are used. A vacuum pump in combination with a dry pump (or another type of low vacuum pump) may be used. For this reason, when the vacuum pump 54 exhausts the stage space SPs, the surface WSu (particularly, the local vacuum region VSP) of the sample W is compared with the case where the vacuum pump 53 exhausts the stage space SPs. The difference (that is, the pressure difference) between the pressure on the vacuum surface portion WSu_v) and the pressure on the back surface WSl of the sample W is reduced. That is, the difference between the pressure in the stage space SPs and the pressure in the vacuum region VSP is reduced. In the present embodiment, the scanning electron microscope SEM uses the vacuum pump 54 in this way to calculate the difference between the pressure on the surface WSu of the sample W (particularly the vacuum surface portion WSu_v) and the pressure on the back surface WSl of the sample W. By making it smaller, a deformation suppressing operation for suppressing the deformation of the sample W due to the formation of the vacuum region VSP is performed. The deformation suppressing operation will be described in detail later.

In FIG. 1 again, the stage 22 holds the sample W under the control of the control device 4 and follows at least one of the X axis direction, the Y axis direction, the Z axis direction, the θX direction, the θY direction, and the θZ direction. Can be moved. In order to move the stage 22, the stage apparatus 2 includes a stage drive system 23. The stage drive system 23 moves the stage 22 using, for example, an arbitrary motor (for example, a linear motor). Furthermore, the stage device 2 includes a position measuring device 24 that measures the position of the stage 22. The position measurement device 24 includes, for example, at least one of an encoder and a laser interferometer. When the stage 22 holds the sample W, the control device 4 can specify the position of the sample W from the position of the stage 22. The stage 22 may have a reference plate having a reference mark for associating the position of the electron beam EB by the beam irradiation apparatus 1 with the position of the stage 22 (position in the XYZ directions).

When the stage 22 moves along the XY plane, the relative position between the sample W and the beam irradiation apparatus 1 in the direction along the XY plane changes. For this reason, when the stage 22 moves along the XY plane, the relative position between the sample W in the direction along the XY plane and the irradiation region of the electron beam EB on the surface WSu of the sample W changes. That is, when the stage 22 moves along the XY plane, the irradiation region of the electron beam EB moves relative to the surface WSu of the sample W in the direction along the XY plane (that is, the direction along the surface WSu of the sample W). To do. Further, when the stage 22 moves along the XY plane, the relative positions of the sample W, the beam passage space SPb3, and the vacuum region VSP in the direction along the XY plane change. That is, when the stage 22 moves along the XY plane, the beam passing space SPb3 and the vacuum region VSP with respect to the surface WSu of the sample W in the direction along the XY plane (that is, the direction along the surface WSu of the sample W). Move. The control device 4 controls the stage drive system 23 so that the electron beam EB is irradiated to a desired position on the surface WSu of the sample W and the beam passage space SPb3 is set (that is, the vacuum region VSP is formed). The stage 22 may be moved along the XY plane. Specifically, for example, the control device 4 controls the stage drive system 23 to move the stage 22 along the XY plane so that the vacuum region VSP is formed in the first portion of the surface WSu of the sample W. . After the stage 22 moves so that the vacuum region VSP is formed on the first portion of the surface WSu of the sample W, the beam irradiation apparatus 1 irradiates the first portion of the surface WSu of the sample W with the electron beam EB, The state of the first part is measured. During the period in which the beam irradiation apparatus 1 irradiates the first portion of the surface WSu of the sample W with the electron beam EB, the stage drive system 23 does not have to move the stage 22 along the XY plane. After the measurement of the state of the first part is completed, the control device 4 controls the stage drive system 23 so that the vacuum region VSP is formed in the second part of the surface WSu of the sample W, and moves the stage 22 to the XY plane. Move along. After the stage 22 moves so that the vacuum region VSP is formed in the second part of the surface WSu of the sample W, the beam irradiation apparatus 1 irradiates the second part of the surface WSu of the sample W with the electron beam EB, The state of the second part is measured. The stage driving system 23 may not move the stage 22 along the XY plane during the period in which the beam irradiation apparatus 1 irradiates the second portion of the surface WSu of the sample W with the electron beam EB. Thereafter, the state of the surface WSu of the sample W is measured by repeating the same operation.

When the stage 22 moves along the Z axis, the relative position between the sample W and the beam irradiation apparatus 1 in the direction along the Z axis changes. For this reason, when the stage 22 moves along the Z axis, the relative position between the sample W and the focus position of the electron beam EB in the direction along the Z axis changes. The control device 4 moves the stage 22 along the Z axis by controlling the stage drive system 23 so that the focus position of the electron beam EB is set on the surface WSu of the sample W (or in the vicinity of the surface WSu). You may let them. Here, the focus position of the electron beam EB may be a focal position corresponding to the imaging position of the beam optical system 11 or a position in the Z-axis direction where the blur of the electron beam EB is minimized.

Furthermore, when the stage 22 moves along the Z axis, the interval D between the sample W and the beam irradiation apparatus 1 changes. Therefore, the stage drive system 23 may move the stage 22 under the control of the control device 4 so that the interval D becomes the desired interval D_target in cooperation with the interval adjustment system 14 described later. At this time, the control device 4 is based on the measurement result of the position measurement device 24 (further, the measurement result of the position measurement device 15 that measures the position of the beam irradiation device 1 described later (in particular, the position of the vacuum forming member 121)). Thus, the actual interval D is specified, and at least one of the stage drive system 23 and the interval adjustment system 14 is controlled so that the specified interval D becomes the desired interval D_target. For this reason, the

position measurement devices

15 and 24 can also function as a detection device that detects the interval D. In addition, when the thickness (dimension) of the sample W in the Z-axis direction is known, the control device 4 replaces / in addition to the actual distance D, and in addition to the beam irradiation device 1 and the reference surface (for example, the surface of the reference plate). Using the information about the distance in the Z-axis direction and the information about the thickness (dimension) of the sample W in the Z-axis direction, the stage is set so that the distance from the beam irradiation device 1 to the sample W becomes the target distance. At least one of the drive system 23 and the interval adjustment system 14 may be controlled.

The support frame 3 supports the beam irradiation device 1. Specifically, the support frame 3 includes support legs 31 and support members 32. The support leg 31 is disposed on the support surface SF. Between the support leg 31 and the support surface SF, an anti-vibration device (not shown) for preventing or reducing transmission of vibration of the support surface SF to the support leg 31 may be installed. The support leg 31 is a member that extends upward from the support surface SF, for example. The support leg 31 supports the support member 32. The support member 32 is an annular plate member having an opening 321 formed in the center in plan view. On the upper surface of the support member 32, the distance adjusting system 14 is extended outward from the outer surface of the beam irradiation apparatus 1 (in the example shown in FIGS. 1 to 3, the outer surface of the side wall member 122 provided in the differential exhaust system 12). The lower surface of the flange member 13 is connected. At this time, the beam irradiation apparatus 1 is disposed so as to penetrate the opening 321. As a result, the support frame 3 can support the beam irradiation device 1 so as to lift it from the upper surface of the support member 32. However, the support frame 3 may support the beam irradiation device 1 by another support method different from the support method shown in FIG. 1 as long as the beam irradiation device 1 can be supported. For example, the support frame 3 may support the beam irradiation device 1 so as to be suspended from the lower surface of the support member 32. In addition, between the support leg 31 and the support member 32, the vibration isolator (not shown) for preventing or reducing the transmission of the vibration of the support surface SF to the support member 32 may be provided.

The interval adjusting system 14 moves the beam irradiation device 1 at least along the Z axis, thereby causing the interval D between the emission surface 121LS of the vacuum forming member 121 and the surface WSu of the sample W or the emission of the vacuum forming member 121. The distance in the Z-axis direction from the surface 121LS to the surface WSu of the sample W is adjusted. For example, the interval adjusting system 14 may move the beam irradiation apparatus 1 along the Z-axis direction so that the interval D becomes the desired interval D_target. As such an interval adjustment system 14, for example, a drive system that moves the beam irradiation apparatus 1 using a driving force of a motor, a drive system that moves the beam irradiation apparatus 1 using a force generated by the piezoelectric effect of a piezoelectric element, A drive system that moves the beam irradiation device 1 using Coulomb force (for example, electrostatic force generated between at least two electrodes) and Lorentz force (for example, electromagnetic force generated between the coil and the magnetic pole) are used. Thus, at least one of drive systems for moving the beam irradiation apparatus 1 may be used. However, when the distance D between the exit surface 121LS and the surface WSu may be fixed, a distance adjusting member such as a shim is provided between the support member 32 and the flange member 13 instead of the distance adjusting system 14. May be arranged. In this case, the gap adjusting member such as a shim may not be disposed between the support member 32 and the flange member 13. Moreover, the beam irradiation apparatus 1 may be movable along the XY directions.

In order to measure the position in the Z direction of the beam irradiation apparatus 1 movable by the interval adjustment system 14 (particularly, the position in the Z direction of the vacuum forming member 121), the scanning electron microscope SEM includes a position measuring device 15. Yes. The position measuring device 15 includes, for example, at least one of an encoder and a laser interferometer. Note that the position measuring device 15 may measure the position of the beam irradiation apparatus 1 in the XY direction and the attitude in the θX direction and the θY direction. Further, a measurement device that measures the position of the beam irradiation device 1 in the XY direction, the orientation in the θX direction, and the θY direction may be provided separately from the position measuring device 15.

Control device 4 controls the operation of the scanning electron microscope SEM. For example, the control device 4 controls the beam irradiation device 1 so as to irradiate the sample W with the electron beam EB. For example, the control device 4 controls the pump system 5 (particularly, the vacuum pumps 51 and 52) so that the beam passage spaces SPb1 to SPb3 are in a vacuum space. For example, the control device 4 controls the stage drive system 23 so that the electron beam EB is irradiated to a desired position on the surface WSu of the sample W. For example, the control device 4 controls the interval adjustment system 14 so that the interval D between the emission surface 121LS of the vacuum forming member 121 and the surface WSu of the sample W becomes the desired interval D_target. For example, the control device 4 controls the pump system 5 (particularly, the vacuum pump 53) so that the stage 22 holds the sample W. In the present embodiment, in particular, the control device 4 controls the pump system 5 (particularly, the vacuum pump 54) so that the deformation suppression operation for suppressing the deformation of the sample W due to the formation of the vacuum region VSP is performed. . Hereinafter, the deformation suppression operation will be further described. In order to control the operation of the scanning electron microscope SEM, the control device 4 may include at least one of an arithmetic device such as a CPU (Central Processing Unit) and a storage device such as a memory.

(2) Deformation suppression operation Next, the deformation suppression operation will be described.

(2-1) Technical Reason for Deformation of Sample W Due to Formation of Local Vacuum Region VSP First, as a premise of the deformation suppression operation, the vacuum region VSP will be described with reference to FIGS. After describing the technical reason why the sample W is deformed due to the formation of, a specific method for suppressing the deformation will be described.

As shown in FIG. 6A, when the stage 22 holds the sample W, the vacuum pump 53 depressurizes the stage space SPs via the pipe 2251. As a result, as described above, the negative pressure that draws the back surface WSl of the sample W toward the stage space SPs acts on the back surface WSl of the sample W. Since the sample W is solid, the negative pressure that pulls the back surface WSl of the sample W to the stage space SPs is substantially equivalent to the negative pressure that pulls the sample W itself to the stage space SPs. This negative pressure acts on the sample W as a force that presses the sample W against the stage 22 (in particular, the upper surface 222Su of the side wall member 222 and the upper surfaces 223Su of the plurality of support members 223). Therefore, the stage 22 uses the force F_hold1 that acts on the sample W (particularly, the back surface WSl of the sample W) due to the decompression by the vacuum pump 53 as a force for holding the sample W. Hold.

6A, assume that a local vacuum region VSP is formed between the beam irradiation device 1 and the sample W as shown in FIG. 6B. In this case, the force (that is, the vacuum region VSP) due to the formation of the vacuum region VSP is applied to the vacuum surface portion WSu_vac facing the vacuum region VSP (that is, facing the beam passage space SPb3) of the surface WSu of the sample W. F_VSP acts to attract the surface WSu of the sample W). Furthermore, the force F_hold1 resulting from the pressure reduction of the stage space SPs by the vacuum pump 53 still acts on the vacuum surface portion WSl_vac corresponding to the vacuum surface portion WSu_vac of the back surface WSl of the sample W. Since the sample W is solid, the force F_VSP acting on the vacuum surface portion WSu_vac indirectly acts on the specific portion W_vac facing the vacuum region VSP (that is, facing the beam passage space SPb3) of the sample W. Similarly, the force F_hold1 acting on the vacuum surface portion WSl_vac also acts indirectly on the specific portion W_vac (or on the vacuum surface portion WSu_vac. That is, the specific portion W_vac of the sample W is applied to the sample W from the vacuum region VSP. The acting force (that is, the force by which the vacuum region VSP sucks the sample W) F_VSP and the force that acts on the sample W from the stage space SPs (that is, the force by which the stage space SPs sucks the sample W) The force F_vac that is the sum of F_hold1 and the force that holds the sample W is applied.Here, as described above, the pressure in the vacuum region VSP that faces the front surface WSu of the sample W is the stage that faces the back surface WSl of the sample W. In other words, the pressure acting on the vacuum surface portion WSu_vac is less than the pressure in the space SPs. Therefore, when the vacuum region VSP is formed, the force F_vac acting on the specific portion W_vac is a force that draws the specific portion W_vac to the vacuum region VSP. The force F_vac that pulls the specific portion W_vac away from the stage 22 is applied to the specific portion W_vac, which has been subjected to the force F_hold1 that presses the specific portion W_vac against the stage 22 before the VSP is formed, due to the formation of the vacuum region VSP. In other words, due to the formation of the vacuum region VSP, the specific portion W_vac pushes or pulls away (that is, displaces) the specific portion W_vac in the direction from the stage 22 toward the beam irradiation device 1. F_vac acts.

As described above, when the force F_vac that pulls the specific portion W_vac away from the stage 22 due to the formation of the vacuum region VSP acts on the specific portion W_vac, the specific portion W_vac of the sample W moves from the stage 22 as shown in FIG. May be pulled apart. On the other hand, the vacuum region VSP is not formed in a portion other than the specific portion W_vac in the sample W. For this reason, the force F_hold1 that presses the other part against the stage 22 continues to act on the part other than the specific part W_vac in the sample W. That is, parts other than the specific part W_vac in the sample W are not easily separated from the stage 22. As a result, the sample W may be deformed as shown in FIG. Such deformation of the sample W is not preferable for measurement of the state of the sample W. Therefore, the scanning electron microscope SEM of the present embodiment suppresses such deformation of the sample W by performing a deformation suppressing operation.

(2-2) Specific Content of Deformation Suppressing Operation Next , specific content of the deformation suppressing operation (that is, a specific method for suppressing the deformation of the sample W) will be described with reference to FIG. In the present embodiment, the scanning electron microscope SEM evacuates the stage space SPs using the vacuum pump 54 in addition to or instead of the vacuum pump 53 used for holding the sample W under the control of the control device 4. Then, the deformation of the sample W is suppressed by reducing the pressure from the atmospheric pressure. Specifically, as described above, the vacuum pump 54 that depressurizes the stage space SPs has an exhaust capacity comparable to that of the vacuum pump 51 for forming the local vacuum region VSP. For this reason, when the vacuum pump 54 depressurizes the stage space SPs, the pressure of the stage space SPs facing the back surface WSl of the sample W is the pressure of the vacuum region VSP facing the surface WSu (particularly, the vacuum surface portion WSu_vac) of the sample W. It becomes the same level as. That is, the pressure acting on the vacuum surface portion WSu_vac of the surface WSu of the sample W is approximately the same as the pressure acting on the vacuum surface portion WSl_vac of the back surface WSl of the sample W. For this reason, the force F_hold2 resulting from the pressure reduction by the vacuum pump 54 is the same magnitude as the force F_VSP acting on the sample W from the vacuum region VSP, and the force is in the opposite direction. Here, since the sample W is solid as described above, the force F_hold2 acting on the vacuum surface portion WSl_vac is the vacuum surface on which the specific portion W_vac (or the force F_VSP resulting from the formation of the vacuum region VSP is acting). Acts indirectly on the part WSu_vac). Therefore, the force F_hold2 pushes out the specific portion W_vac (or the vacuum surface portion WSu_vac on which the force F_VSP resulting from the formation of the vacuum region VSP is applied) in the direction from the beam irradiation device 1 toward the stage 22 ( That is, it corresponds to a displacement force. For this reason, when the vacuum pump 54 depressurizes the stage space SPs, in the specific portion W_vac, the force F_VSP that acts on the sample W from the vacuum region VSP and the force F_hold2 that acts on the sample W from the stage space SPs cancel each other. In FIG. 7, the force F_VSP and the force F_hold2 that are canceled out are indicated by dotted lines. For this reason, compared with the force F_vac (that is, the sum of the force F_VSP and the force F_hold1) applied to the specific portion W_vac before the vacuum pump 54 depressurizes the stage space SPs, the vacuum pump 54 is The force F_vac acting on the specific part W_vac after reducing the pressure of SPs (that is, the sum of the force F_VSP and the force F_hold2) is reduced. Typically, after the vacuum pump 54 depressurizes the stage space SPs, the force F_vac does not act on the specific portion W_vac. That is, the force F_hold2 that acts on the sample W from the stage space SPs corresponds to a force that can reduce (or make zero) the force F_vac that acts on the specific portion W_vac. In other words, the force F_hold2 that acts on the sample W from the stage space SPs corresponds to a force that can reduce (or cancel) the influence of the force F_VSP that acts on the sample W from the region VSP. Since the main cause of the deformation of the sample W is the force F_vac that has acted to pull the specific portion W_vac away from the stage 22, if the force F_vac does not act on the specific portion W_vac, as shown in FIG. The deformation of the sample W is appropriately suppressed. That is, the flatness of the surface WSu of the sample W becomes higher (that is, the surface WSu of the sample W approaches a plane) than before the vacuum pump 54 depressurizes the stage space SPs.

On the other hand, since the vacuum pump 54 has the same exhaust capability as the vacuum pump 51, the exhaust capability of the vacuum pump 54 is higher than the exhaust capability of the vacuum pump 53. Therefore, when the vacuum pump 54 is depressurizing the stage space SPs, the vacuum pump 54 is not depressurizing the stage space SPs (that is, the vacuum pump 53 is depressurizing the stage space SPs). In comparison, the negative pressure that draws the sample W toward the stage space SPs becomes relatively large. For this reason, the sample W is more strongly pressed against the stage 22. Even in this case, the back surface WSl of the sample W is still supported by the upper surface 222Su of the side wall member 222 and the upper surfaces 223Su of the plurality of support members 223. For this reason, even if the negative pressure that draws the sample W to the stage space SPs due to the vacuum pump 54 depressurizing the stage space SPs becomes relatively large, the sample is caused by the relatively large negative pressure. There is little or no deformation of W. That is, even when the vacuum pump 54 depressurizes the stage space SPs, the stage 22 uses the negative pressure that draws the sample W toward the stage space SPs in the same manner as when the vacuum pump 53 depressurizes the stage space SPs. Can be held appropriately.

When the local vacuum region VSP is not formed between the beam irradiation apparatus 1 and the sample W, there is no possibility that the sample W is deformed due to the formation of the vacuum region VSP. For this reason, the scanning electron microscope SEM does not have to perform the deformation suppressing operation in at least a part of the period in which the local vacuum region VSP is not formed between the beam irradiation apparatus 1 and the sample W. On the other hand, the scanning electron microscope SEM performs a deformation suppressing operation during a period in which a local vacuum region VSP is formed between the beam irradiation apparatus 1 and the sample W. However, the scanning electron microscope SEM does not have to perform the deformation suppressing operation in at least a part of the period in which the local vacuum region VSP is formed between the beam irradiation apparatus 1 and the sample W. For example, when deformation of the sample W is allowed in a situation where a local vacuum region VSP is formed between the beam irradiation apparatus 1 and the sample W, the scanning electron microscope SEM performs a deformation suppressing operation. It does not have to be done.

In the above description, the stage space SPs is depressurized by using the vacuum pump 54 having an exhaust capability equivalent to that of the vacuum pump 51 for forming the vacuum region VSP. However, the stage space SPs may be decompressed using the vacuum pump 54 having a higher exhaust capacity than the vacuum pump 51. That is, the pressure in the stage space SPs in which the vacuum pump 54 is decompressed may be lower than the pressure in the beam passage space SPb3 in which the vacuum pump 51 is decompressed (that is, the pressure in the vacuum region VSP). In this case, a force pressing the specific portion W_vac against the stage 22 acts on the sample W (particularly, the specific portion W_vac). Even in this case, the back surface WSl of the sample W is still supported by the upper surface 222Su of the side wall member 222 and the upper surfaces 223Su of the plurality of support members 223. For this reason, even if the vacuum pump 54 has a higher exhaust capacity than the vacuum pump 51, the sample W is hardly or not deformed due to that.

Alternatively, the stage space SPs may be depressurized using the vacuum pump 54 having a lower exhaust capacity than the vacuum pump 51. That is, the pressure in the stage space SPs in which the vacuum pump 54 is decompressed may be higher than the pressure in the beam passage space SPb3 in which the vacuum pump 51 is decompressed (that is, the pressure in the vacuum region VSP). However, in this case, the pressure of the stage space SPs when the vacuum pump 54 is depressurizing the stage space SPs is lower than the pressure of the stage space SPs when the vacuum pump 53 is depressurizing the stage space SPs. Thus, the exhaust capacity of the

vacuum pumps

53 and 54 is set. For example, the vacuum pump 54 may have a higher exhaust capacity than the vacuum pump 53. When the evacuation capabilities of the

vacuum pumps

53 and 54 are set in this way, compared to before the vacuum pump 54 depressurizes the stage space SPs (that is, compared with the case where the vacuum pump 53 depressurizes the stage space SPs). The vacuum degree of the stage space SPs approaches the vacuum degree of the beam passage space SPb3. That is, the pressure in the stage space SPs approaches the pressure in the vacuum region VSP. In other words, the difference between the pressure in the stage space SPs and the pressure in the vacuum region VSP (that is, the difference between the pressure on the back surface WSl of the sample W and the pressure on the surface WSu of the sample W) becomes small. For this reason, the force F_vac acting on the specific portion W_vac is reduced. That is, a force F_vac that is smaller than the force F_vac acting on the specific portion W_vac before the vacuum pump 54 depressurizes the stage space SPs acts on the specific portion W_vac. If the force F_vac acting on the specific portion W_vac is reduced, the degree of deformation of the sample W is reduced. That is, the deformation of the sample W can be suppressed to some extent. Therefore, compared with the case where the vacuum pump 53 depressurizes the stage space SPs, the difference between the pressure in the stage space SPs and the pressure in the vacuum region VSP (that is, the pressure with respect to the back surface WSl of the sample W and the surface WSu of the sample W). The deformation of the sample W can be suppressed as long as the vacuum pump 54 has an evacuation capacity to the extent that the difference between the pressure and the pressure can be reduced.

In the above description, the stage space SPs is evacuated using the vacuum pump 54 having an evacuation capability comparable to that of the vacuum pump 51 for forming the vacuum region VSP. However, the stage space SPs may be exhausted using the vacuum pump 51. Even in this case, the pressure of the stage space SPs facing the back surface WSl of the sample W is approximately the same as the pressure of the vacuum region VSP facing the surface WSu of the sample W (particularly, the vacuum surface portion WSu_vac). For this reason, the deformation of the sample W is appropriately suppressed. In this case, the pump system 5 may not include the vacuum pump 54.

When the stage space SPs is evacuated using the vacuum pump 51, the vacuum pump 51 is connected to the beam passage spaces SPb1 to SPb3 via the pipe 117, and is connected to the stage space SPs via the pipe 2252. The In this case, an opening / closing member (for example, a valve) that can open and close the pipe 117 may be disposed in the pipe 117. In addition to or in place of the opening / closing member disposed in the pipe 117, an opening / closing member (for example, a valve) capable of opening and closing the pipe 2252 may be disposed in the pipe 2252. When the open / close members are arranged in both the

pipes

117 and 2252, the scanning electron microscope SEM exhausts both the state of the vacuum pump 51 (i) the beam passage spaces SPb1 to SPb3 and the stage space SPs. The first state, (ii) the second state where the beam passage spaces SPb1 to SPb3 are exhausted while the stage space SPs is not exhausted, and the (iii) the stage space SPs is exhausted while the beam passage spaces SPb1 to SPb3 are not exhausted. It is possible to switch between the third state and (iv) a fourth state in which both the beam passage spaces SPb1 to SPb3 and the stage space SPs are not exhausted. However, the scanning electron microscope SEM can switch the state of the vacuum pump 51 between the first state and the fourth state even when the opening / closing member is not disposed in both the

pipes

117 and 2252. it can.

The force F_vac acting on the specific portion W_vac before the vacuum pump 54 depressurizes the stage space SPs is mainly the force F_VSP caused by the vacuum region VSP. Then, considering that the force F_vac acting on the specific portion W_vac before the vacuum pump 54 depressurizes the stage space SPs does not act on the specific portion W_vac due to the vacuum pump 54 reducing the stage space SPs. It can be said that the operation of reducing the stage space SPs using the pump 54 is equivalent to the operation of canceling out the force F_VSP caused by the vacuum region VSP. That is, in the operation of reducing the stage space SPs using the vacuum pump 54, the force F_cancel that can cancel the force F_vac caused by the vacuum region VSP is applied to the sample W (particularly, at least the specific portion W_vac) as the force F_hold2 described above. It can be said that the operation is equivalent to For this reason, the scanning electron microscope SEM is not limited to the operation of depressurizing the stage space SPs using the vacuum pump 54, but can arbitrarily cancel the force F_VSP acting on the specific portion W_vac due to the formation of the vacuum region VSP. By performing this operation, deformation of the sample W may be suppressed. The scanning electron microscope SEM is not limited to the operation of depressurizing the stage space SPs using the vacuum pump 54, and the force F_cancel that can cancel the force VSP that has acted on the specific portion W_vac due to the formation of the vacuum region VSP. The deformation of the sample W may be suppressed by performing an arbitrary operation applied to the sample W. Note that an example of an arbitrary operation that cancels the force F_VSP that has been applied to the specific portion W_vac (or applies a force F_cancel that can cancel the force F_VSP to the sample W) is a modification described later (for example, a sixth modification) Example).

The force F_cancel that can cancel the force F_VSP may be a force determined according to the force F_VSP. As an example of the force F_cancel, there is a force having an opposite direction and the same magnitude compared to the force F_VSP. For example, as described above, the force F_VSP is a force that acts to displace the sample W in the direction from the stage 22 toward the beam irradiation apparatus 1 (for example, the + Z direction), so the force F_cancel is applied from the beam irradiation apparatus 1 to the stage. The force may act to displace the sample W in the direction toward 22 (for example, the −Z direction) and may be a force having the same magnitude as the force F_VSP. However, the force F_cancel is not limited to the force determined according to the force F_VSP, and may be any force that can suppress the deformation of the sample W, and increases the flatness of the surface WSu of the sample W (that is, Any force capable of bringing the surface WSu of the sample W close to a plane) may be used.

Alternatively, when the force F_vac acting on the specific portion W_vac before the vacuum pump 54 depressurizes the stage space SPs is reduced by the depressurization of the space SPs by the vacuum pump 54, the stage space SPs is used by using the vacuum pump 54. It can be said that the operation of reducing the pressure is equivalent to the operation of reducing the force F_vac acting on the specific portion W_vac. That is, the operation of depressurizing the stage space SPs using the vacuum pump 54 is an operation of applying to the sample W (particularly at least the specific portion W_vac) a force F_reduce that can reduce the force F_vac acting on the specific portion W_vac. It can be said that it is equivalent to. For this reason, the scanning electron microscope SEM is not limited to the operation of reducing the pressure of the stage space SPs using the vacuum pump 54, but performs an arbitrary operation of reducing the force F_vac acting on the specific portion W_vac, thereby deforming the sample W. May be suppressed. The scanning electron microscope SEM is not limited to the operation of depressurizing the stage space SPs using the vacuum pump 54, but is an arbitrary operation of applying to the sample W a force F_reduce that can reduce the force F_vac acting on the specific portion W_vac. The deformation of the sample W may be suppressed by performing the above.

The force F_reduce that can reduce the force F_vac acting on the specific portion W_vac may also be a force determined according to the force F_VSP. As an example of the force F_reduce, there is a force having an opposite direction and a different magnitude compared to the force F_VSP. For example, as described above, the force F_VSP is a force that acts to displace the sample W in the direction from the stage 22 toward the beam irradiation apparatus 1 (for example, the + Z direction). The force may act to displace the sample W in the direction toward 22 (for example, the −Z direction) and may be a force smaller or larger than the force F_VSP. However, the force F_reduce is not limited to the force determined according to the force F_VSP, and may be any force that can suppress the deformation of the sample W, and increases the flatness of the surface WSu of the sample W (that is, Any force capable of bringing the surface WSu of the sample W close to a plane) may be used.

(3) Modified Example Next, a modified example of the scanning electron microscope SEM will be described.

(3-1) First Modification First , a scanning electron microscope SEMa of a first modification will be described. The scanning electron microscope SEMa of the first modification is different from the above-described scanning electron microscope SEM in that a stage 22a is provided instead of the stage 22. The other structure of the scanning electron microscope SEMa may be the same as the other structure of the scanning electron microscope SEM described above. Therefore, hereinafter, the structure of the stage 22a will be described with reference to FIG. In the following description, constituent elements that have already been described are assigned the same reference numerals, and detailed descriptions thereof are omitted.

As shown in FIG. 8, the stage 22a differs from the stage 22 described above in that a side wall member 222a is provided instead of the side wall member 222. The side wall member 222 a is different from the side wall member 222 in that the upper surface 222 Su of the side wall member 222 a is positioned below the upper surface 223 Su of the support member 223. For this reason, in the first modification, the stage 22a holds the sample W in a state where the back surface WSl of the sample W is in contact with the upper surfaces 223Su of the plurality of support members 223 but not in contact with the upper surface 222Su of the side wall member 222a. In the first variation, the stage 22a may be said to form the outer edge space SPg1 between the sample W and the upper surface 222Su of the side wall member 222a. The dimension of the outer edge space SPg1 in the Z-axis direction, in other words, the distance along the Z-axis direction from the lower surface WS1 of the sample W to the upper surface 222Su of the side wall member 222a may be 1 μm or more and 10 μm or less. A pin-shaped, conical or pyramidal support member that can contact the lower surface WSl of the sample W may be provided on the upper surface 222Su of the side wall member 222a. A plurality of support members may be provided along the circumferential direction on the upper surface 222Su of the side wall member 222a. Such a support member may be an annular shape extending in the circumferential direction on the upper surface 222Su of the side wall member 222a. The annular support member may not be in contact with the back surface of the sample W. The other structure of the stage 22a may be the same as the other structure of the stage 22 described above.

Even in the scanning electron microscope SEMa of the first modified example provided with such a stage 22a, the same effects as those that can be enjoyed by the above-described scanning electron microscope SEM can be obtained. In addition, in the first modification, since the sample W does not contact the upper surface 222Su of the side wall member 222a, an unnecessary substance (for example, at least one of dust, dust, and dust) adheres to the upper surface 222Su of the side wall member 222a. Even when the sample W is present, distortion (that is, deformation) of the sample W due to the influence of the unnecessary substance can be prevented.

(3-2) Second Modification As shown in FIG. 8, the stage 22a of the first modification described above is in a state in which the outer edge space SPg1 exists between the sample W and the upper surface 222Su of the side wall member 222a. Thus, the sample W is held. Since the outer edge space SPg1 communicates with the stage space SPs, the outer edge space SPg1 is exhausted (ie, depressurized) by the vacuum pump 54. On the other hand, the outer edge space SPg1 communicates with an atmospheric pressure space outside the stage space SPs. For this reason, gas tends to flow into the outer edge space SPg1 from the atmospheric pressure space. As a result, the pressure in the outer edge space SPg1 may be higher than the pressure in the stage space SPs. For this reason, as shown in FIG. 9A, the force F_hold2 acting to press the outer edge portion W_edge of the sample W facing the upper surface 222Su of the side wall member 222a against the stage 22a is other than the outer edge portion W_edge of the sample W. May be smaller than the force F_hold2 that acts to press the portion against the stage 22a. That is, the force F_hold2 that holds the outer edge portion W_edge by the stage 22a may be smaller than the force F_hold2 that holds the portion of the sample W other than the outer edge portion W_edge by the stage 22a.

Here, as shown in FIG. 9B, when the local vacuum region VSP facing the outer edge portion W_edge of the sample W is formed, the outer edge portion W_edge is caused by the formation of the vacuum region VSP. A force F_VSP that acts to pull the outer edge portion W_edge away from the stage 22 acts. In this case, as described above, the pressure in the outer edge space SPg1 below the outer edge portion W_edge is relatively low. For this reason, although the outer edge space SPg1 is decompressed by the vacuum pump 54 via the stage space SPs, there is a possibility that the force F_hold2 acting on the outer edge portion W_edge cannot cancel the force F_VSP. As a result, a force F_vac (that is, relative force) acting on the outer edge portion W_edge to pull the outer edge portion W_edge away from the stage 22 even though the vacuum pump 54 decompresses the outer edge space SPg1 through the stage space SPs. There is a possibility that a large force F_VSP and a relatively small force F_hold2) continue to act. In other words, since the force F_hold2 that the stage 22a holds the outer edge portion W_edge is relatively weak, the outer edge portion W_edge has the outer edge portion W_edge in spite of the vacuum pump 54 depressurizing the outer edge space SPg1 through the stage space SPs. There is a possibility that the force F_vac acting to pull the outer edge portion W_edge away from the stage 22 continues to act. As a result, the outer edge portion W_edge of the sample W may be separated from the stage 22 as shown in FIG. For this reason, the sample W may be deformed.

Therefore, the following description of the scanning electron microscope SEMb of the second modified example capable of suppressing the deformation of the sample W caused by the outer edge portion W_edge separating from the stage 22 will be continued. The scanning electron microscope SEMb of the second modified example is different from the above-described scanning electron microscope SEMa in that a stage 22b is provided instead of the stage 22a. The other structure of the scanning electron microscope SEMb may be the same as the other structure of the scanning electron microscope SEMa described above. Therefore, hereinafter, the structure of the stage 22b will be described with reference to FIG.

As shown in FIG. 10, the stage 22b is different from the stage 22a in that an exhaust port 2243b is formed on the upper surface 222Su of the side wall member 222a. Other structures of the stage 22b may be the same as the other structures of the stage 22a described above.

The exhaust port 2243b is formed in a portion of the upper surface 222Su of the side wall member 222a that faces the back surface WSl of the sample W. At this time, the exhaust port 2243b may be formed on the outermost periphery of the portion of the upper surface 222Su of the side wall member 222a that faces the back surface WSl of the sample W. The exhaust ports 2243b may be formed in an annular distribution pattern so that the exhaust ports 2243b are continuously distributed on the upper surface 222Su of the side wall member 222a. A plurality of the exhaust ports 2243b may be formed so as to be arranged in a regular (or random) arrangement pattern on the upper surface 222Su of the side wall member 222a. However, the exhaust ports 2243b may be formed in an arbitrary arrangement pattern or distribution pattern. The exhaust holes 2243b may have a regular arrangement pattern in which the exhaust holes 2243b are uniformly distributed on the upper surface 222Su of the side wall member 222a, and the region in the region surrounded by the side wall member 222a on the upper surface 222Su of the side wall member 222a. It may be an array pattern that is distributed at equal intervals or unequal intervals on the circumference centered on the center (center of gravity) of the. Further, the exhaust holes 2243b may have an arrangement pattern in which the exhaust holes 2243b are distributed at equal intervals or unequal intervals along each of a plurality of circumferences having different radii with the center (center of gravity) of the region as the center.

A vacuum pump 54 is connected to the exhaust port 2243b via a pipe 2253b. The vacuum pump 54 can depressurize the outer edge space SPg1 by exhausting it. In other words, in the second modified example, the outer edge space SPg1 is directly depressurized by the vacuum pump 54 without passing through the stage space SPs in addition to or instead of being depressurized indirectly through the stage space SPs. The For this reason, compared with the case where outer edge space SPg1 is only pressure-reduced indirectly via stage space SPs, possibility that the pressure of outer edge space SPg1 will become higher than the pressure of stage space SPs becomes small. Therefore, the possibility that the force F_hold2 for holding the outer edge portion W_edge of the sample W by the stage 22a is smaller than the force F_hold2 for holding the portion of the sample W other than the outer edge portion W_edge by the stage 22a is reduced. As a result, the possibility that the force F_VSP and the force F_hold2 cancel each other out in the outer edge portion W_edge of the sample W is relatively increased. That is, even if the local vacuum region VSP is formed in the outer edge portion W_edge of the sample W, the possibility that the force F_vac acting to pull the outer edge portion W_edge away from the stage 22 continues to act on the outer edge portion W_edge is reduced. For this reason, as shown in FIG. 10, the possibility that the outer edge portion W_edge of the sample W is separated from the stage 22 is reduced. For this reason, possibility that the sample W will deform | transform will become small. That is, the deformation of the sample W is appropriately suppressed.

Typically, since the outer edge space SPg1 and the stage space SPs are depressurized by the same vacuum pump 54, the pressure of the outer edge space SPg1 becomes equal to the pressure of the stage space SPs. Therefore, the force F_hold2 at which the stage 22a holds the outer edge portion W_edge of the sample W is equal to the force F_hold2 at which the stage 22a holds a portion other than the outer edge portion W_edge of the sample W. As a result, even if the local vacuum region VSP is formed in the outer edge portion W_edge of the sample W, the force F_vac that acts to pull the outer edge portion W_edge away from the stage 22 does not act on the outer edge portion W_edge. For this reason, as shown in FIG. 10, the outer edge portion W_edge of the sample W is not pulled away from the stage 22. That is, the outer edge portion W_edge of the sample W is continuously held by the stage 22. For this reason, the sample W is not deformed. That is, the deformation of the sample W is appropriately suppressed.

The outer edge portion W_edge is separated from the stage 22 due to the formation of the vacuum region VSP when the local vacuum region VSP is formed in the outer edge portion W_edge (that is, the outer edge portion W_edge is separated from the vacuum region VSP). Negative pressure (that is, when suction force is applied). For this reason, the scanning electron microscope SEMb uses the vacuum pump 54 and the outer edge space via the exhaust port 2243b and the exhaust pipe 2253b during at least a part of the period during which the local vacuum region VSP is formed in the outer edge portion W_edge. Reduce pressure of SPg1. On the other hand, when the local vacuum region VSP is not formed in the outer edge portion W_edge, the possibility that the outer edge portion W_edge is separated from the stage 22 due to the formation of the vacuum region VSP is relatively low. For this reason, the scanning electron microscope SEMb uses the vacuum pump 54 in the outer edge space through the exhaust port 2243b and the exhaust pipe 2253b in at least a part of the period when the local vacuum region VSP is not formed in the outer edge portion W_edge. It is not necessary to depressurize SPg1. In this case, an opening / closing member (for example, a valve) that can open and close the pipe 2253b may be disposed in the pipe 2253b. However, the scanning electron microscope SEMb uses the vacuum pump 54 to provide the outer edge space through the exhaust port 2243b and the exhaust pipe 2253b even at least during a period when the local vacuum region VSP is not formed in the outer edge portion W_edge. SPg1 may be decompressed. Note that the vacuum pump for decompressing the outer edge section SPg1 may be a vacuum pump different from the vacuum pump 54 for decompressing the stage space SPs.

(3-3) Third Modification Next, a scanning electron microscope SEMc of the third modification will be described. The scanning electron microscope SEMc of the third modification is different from the above-described scanning electron microscope SEMb in that a stage 22c is provided instead of the stage 22b. The other structure of the scanning electron microscope SEMc may be the same as the other structure of the scanning electron microscope SEMb described above. Therefore, hereinafter, the structure of the stage 22c will be described with reference to FIG.

As shown in FIG. 11, the stage 22c is different from the stage 22b in that a guard member 224c is provided. The other structure of the stage 22c may be the same as the other structure of the stage 22b described above.

The guard member 224c is formed on a portion of the upper surface 222Su of the side wall member 222a that does not face the rear surface WSl of the sample W. The guard member 224c is formed outside the exhaust port 2243b. The guard member 224c is formed outside the sample W held on the stage 22c. The upper surface 224Su of the guard member 224c may be a flat surface. The upper surface 224Su of the guard member 224c may be located at the same height as the surface WSu of the sample W held on the stage 22c. That is, the upper surface 224Su of the guard member 224c may be located on the same plane as the surface WSu of the sample W held on the stage 22c. A part of the side surface (for example, the inner surface) of the guard member 224c faces the side surface (for example, the outer surface) of the sample W. At this time, the side surface of the guard member 224c does not contact the side surface of the sample W. That is, a gap is secured between the side surface of the guard member 224c and the side surface of the sample W.

Even in the scanning electron microscope SEMc of the third modified example provided with such a stage 22c, it is possible to enjoy the same effects as those that can be enjoyed by the above-described scanning electron microscope SEMb. In addition, since the scanning electron microscope SEMc of the third modification includes the guard member 224c formed on the upper surface 222Su of the side wall member 222a, the vacuum region VSP is appropriately formed in the outer edge portion W_edge of the sample W. Can do. Specifically, if the guard member 224c does not exist, a part of the vacuum region VSP becomes a part of the sample W and the beam irradiation device in a state where the vacuum region VSP is formed in the outer edge portion W_edge of the sample W. There is a possibility that it is formed between the beam irradiation device 1 and the upper surface 222Su of the side wall member 222a located outside the sample W instead of between the beam irradiation device 1 and the sample. The distance between the upper surface 222Su of the side wall member 222a and the beam irradiation apparatus 1 is larger than the distance D between the sample W and the beam irradiation apparatus 1. Therefore, when a part of the vacuum region VSP is formed between the upper surface 222Su of the side wall member 222a and the beam irradiation device 1, the entire vacuum region VSP is between the sample W and the beam irradiation device 1. Compared with the case where it is formed, it becomes difficult to maintain the vacuum region VSP. On the other hand, when the guard member 224c is present, a part of the vacuum region VSP is formed between the sample W and the beam irradiation apparatus 1 in a situation where the vacuum region VSP is formed in the outer edge portion W_edge of the sample W. There is a possibility that it is formed between the beam irradiation device 1 and the upper surface 224Su of the guard member 224c located outside the sample W, not between them. The distance between the upper surface 224Su of the guard member 224c and the beam irradiation apparatus 1 is the same as the distance D between the sample W and the beam irradiation apparatus 1. Therefore, even if a part of the vacuum region VSP is formed between the upper surface 224Su of the guard member 224a and the beam irradiation device 1, the entire vacuum region VSP is formed between the sample W and the beam irradiation device 1. The vacuum region VSP can be appropriately maintained as in the case of being formed therebetween. Thus, in the third modification, the vacuum region VSP can be appropriately formed in the outer edge portion W_edge of the sample W.

Note that the upper surface 224Su of the guard member 224c may not be located at the same height as the surface WSu of the sample W held on the stage 22c. That is, the upper surface 224Su of the guard member 224c does not have to be located on the same plane as the surface WSu of the sample W held on the stage 22c. For example, the upper surface 224Su of the guard member 224c may be positioned above the surface WSu of the sample W held on the stage 22c. The upper surface 224Su of the guard member 224c may be positioned below the surface WSu of the sample W held on the stage 22c. The side surface of the guard member 224c and the side surface of the sample W may be in contact with each other. The upper surface 224Su of the guard member 224c may be inclined with respect to the surface WSu of the sample W. At this time, the height of the surface WSu at the outermost edge of the sample W and the height of the innermost edge of the upper surface 224Su of the inclined guard member 224c may be the same height. Further, the width (dimension in the XY plane) of the upper surface 224Su of the guard member 224c may be ½ or more of the dimension in the XY direction of the local vacuum region VSP. The width (dimension in the XY plane) of the upper surface 224Su of the guard member 224c is ½ or more of the size in the XY direction of the emission surface 121LS of the vacuum forming member 121, or the outermost periphery of the emission surface 121LS from the center of the beam emission port 1232 It may be more than the distance to the position. Further, the upper surface 224Su of the guard member 224c may be a curved surface.

The guard member 224c may be integrated with the side wall member 222a. Alternatively, the guard member 224c may not be integrated with the side wall member 222a. For example, the guard member 224c may be a member that can be detached from the side wall member 222a.

(3-4) Fourth Modification Next, a scanning electron microscope SEMd of the fourth modification will be described. The scanning electron microscope SEMd of the fourth modified example is different from the above-described scanning electron microscope SEM in that a stage 22d is provided instead of the stage 22. The other structure of the scanning electron microscope SEMd may be the same as the other structure of the scanning electron microscope SEM described above. Therefore, hereinafter, the structure of the stage 22d will be described with reference to FIG.

12, the stage 22d is different from the stage 22 in that a side wall member 222d is provided instead of the side wall member 222. The upper surface 222Su of the side wall member 222d is positioned above the upper surfaces 223Su of the plurality of support members 223. The side wall member 222 d is formed outside the sample W held on the stage 22. For this reason, in the fourth modification, the stage 22d has the back surface WS1 of the sample W in contact with the upper surfaces 223Su of the plurality of support members 223, while not contacting the upper surface 222Su of the side wall member 222d (particularly, the side wall member 222d is not in contact with the sample W). The sample W is held in a state of being located outside the substrate). Other structures of the side wall member 222d may be the same as the other structures of the side wall member 222 described above.

The upper surface 222Su of the side wall member 222d may be a flat surface. The upper surface 222Su of the side wall member 222d may be located at the same height as the surface WSu of the sample W held on the stage 22d. That is, the upper surface 222Su of the side wall member 222d may be located on the same plane as the surface WSu of the sample W held on the stage 22d. In this case, the side wall member 222d can also function as the guard member 224c of the third modification. That is, the side wall member 222d can be a member that contributes to appropriately forming the vacuum region VSP in the outer edge portion W_edge of the sample W. However, the upper surface 222Su of the side wall member 222d may not be located at the same height as the surface WSu of the sample W held on the stage 22d. That is, the upper surface 222Su of the side wall member 222d may not be located on the same plane as the surface WSu of the sample W held on the stage 22d.

A part of the side surface 222d of the side wall member 222d (in particular, the side surface facing the stage space SPs, for example, the inner surface, the same applies hereinafter) opposes the side surface (for example, the outer surface) of the sample W. The side surface 222Ss of the side wall member 222d does not contact the side surface of the sample W. That is, a gap is secured between the side surface 222Ss of the side wall member 222d and the side surface of the sample W. In this case, the outer edge space SPg2 communicating with the atmospheric pressure space outside the stage space SPs through the gap in the stage space SPs is similar to the outer edge space SPg1 in the second or third modification described above from the atmospheric pressure space. Gas tends to flow in. As a result, the pressure in the outer edge space SPg2 may be higher than the pressure in the portion of the stage space SPs other than the outer edge space SPg2. For this reason, also in the stage 22d of the fourth modified example, the outer edge portion W_edge ′ facing the outer edge space SPg2 of the sample W is pulled away from the stage 22 in the same manner as the stage 22a of the first modified example. May be deformed.

Therefore, in the fourth modified example, as in the second modified example, in order to suppress the deformation of the sample W, the exhaust port 2244d is formed in the side wall member 222d. However, in the fourth modified example, since the upper surface 222Su of the side wall member 222d does not face the outer edge space SPg2, the exhaust port 2244d is formed on a surface (specifically, the side surface 222Ss) of the side wall member 222d that faces the outer edge space SPg2. Is formed. The exhaust ports 2244d may be formed in an annular distribution pattern so that the exhaust ports 2244d are continuously distributed on the side surface 222Ss of the side wall member 222d. A plurality of exhaust ports 2244d may be formed so as to be arranged in a regular (or random) arrangement pattern on the side surface 222Ss of the side wall member 222d. However, the exhaust port 2244d may be formed in an arbitrary arrangement pattern or distribution pattern.

A vacuum pump 54 is connected to the exhaust port 2244d through a pipe 2254d. The vacuum pump 54 can evacuate the outer edge space SPg2 to reduce the pressure. That is, in the fourth modified example, the outer edge space SPg2 is relative to the outer edge space SPg2 in addition to or instead of being depressurized by the vacuum pump 54 via the exhaust port 2242 relatively distant from the outer edge space SPg2. The pressure is reduced through the exhaust port 2244d close to the. For this reason, also in the fourth modified example, as in the second modified example, the possibility that the outer edge portion W_edge 'of the sample W is separated from the stage 22d is reduced. For this reason, possibility that the sample W will deform | transform will become small. That is, the deformation of the sample W is appropriately suppressed.

In the above description, the exhaust port 2244d is formed in the side wall member 222d. However, the exhaust port 2244d may be formed in a member other than the side wall member 222d. The exhaust port 2244d may be formed in a member facing the outer edge space SPg2 other than the side wall member 222d. The exhaust port 2244d may be formed on a surface facing the outer edge space SPg2 among members other than the side wall member 222d. In the example shown in FIG. 12, the exhaust port 2244d may be formed in a portion of the upper surface 221Su of the bottom member 221 that faces the outer edge space SPg2. The exhaust port 2244d may be formed in at least one support member 223 facing the outer edge space SPg2 among the plurality of support members 223. Similarly, in the second to third modifications described above, the exhaust port 2243b may be formed in a member other than the side wall member 222b. The exhaust port 2243b may be formed in a member facing the outer edge space SPg1 other than the side wall member 222b. The exhaust port 2243b may be formed on a surface facing the outer edge space SPg1 among members other than the side wall member 222b. The upper surface 222Su of the side wall member 222d may be inclined with respect to the surface WSu of the sample W held on the stage 22d. At this time, the height of the surface WSu at the outermost edge of the sample W and the height of the innermost edge of the inclined upper surface 222Su may be the same height. Further, the width (dimension in the XY plane) of the upper surface 222Su of the side wall member 222d may be 1/2 or more of the dimension in the XY direction of the local vacuum region VSP. The width (dimension in the XY plane) of the upper surface 222Su of the side wall member 222d is ½ or more of the size in the XY direction of the emission surface 121LS of the vacuum forming member 121, or the outermost periphery of the emission surface 121LS from the center of the beam emission port 1232 It may be more than the distance to the position. Further, the upper surface 222Su of the side wall member 222d may be a curved surface.

(3-5) Fifth Modification Next, a scanning electron microscope SEMe of a fifth modification will be described. The scanning electron microscope SEMe of the fifth modified example is different from the scanning electron microscope SEMa of the first modified example described above in that a stage 22e is provided instead of the stage 22a. The other structure of the scanning electron microscope SEMe may be the same as the other structure of the scanning electron microscope SEMa described above. Therefore, hereinafter, the structure of the stage 22e will be described with reference to FIG.

As shown in FIG. 13, the stage 22e is different from the above-described stage 22a in that it includes a temperature adjusting device 2291e and a temperature measuring device 2292e. Other structures of the stage 22e may be the same as the other structures of the stage 22a described above.

The temperature adjusting device 2291e is disposed on the side wall member 222a. However, the temperature adjusting device 2291e may be disposed on a member (for example, the bottom member 221) other than the side wall member 222a. The temperature adjusting device 2291e is arranged in an annular distribution pattern so as to be continuously distributed along the upper surface 222Su of the side wall member 222a. However, the temperature adjustment device 2291e may be arranged in an arbitrary arrangement pattern or distribution pattern. For example, a plurality of temperature adjusting devices 2291e may be arranged so as to be arranged in a regular (or random) arrangement pattern along the upper surface 222Su of the side wall member 222a. The temperature adjustment device 2291e is embedded in the side wall member 222a, but may be disposed on the surface (for example, the upper surface 222Su) of the side wall member 222a. The temperature measuring device 2292e may also be arranged in the same arrangement manner as the temperature adjusting device 2291e.

The temperature adjusting device 2291e adjusts the temperature of the space around the side wall member 222a. Specifically, the temperature adjustment device 2291e adjusts the temperature of at least a part of the outer edge space SPg1. The temperature adjusting device 2291e adjusts the temperature of at least part of the outer edge space SPg1 by heating at least part of the outer edge space SPg1. In this case, the temperature adjustment device 2291e includes, for example, a heater.

The temperature adjustment by heating at least a part of the outer edge space SPg1 is performed in order to make the temperature of the sample W uniform. Specifically, as described above, gas easily flows from the atmospheric pressure space into the outer edge space SPg1. As a result, there is a possibility that the temperature of the gas flowing into the outer edge space SPg1 from the atmospheric pressure space is lowered by adiabatic expansion. When the temperature of the gas flowing into the outer edge space SPg1 decreases, the temperature of the outer edge portion W_edge facing the outer edge space SPg1 may also decrease. As a result, the temperature of the outer edge portion W_edge of the sample W may be lower than the temperature of the portion other than the outer edge portion W_edge of the sample W. In this case, the sample W may be thermally deformed. Therefore, in the fifth modification, the temperature adjustment device 2291e adjusts the temperature of at least a part of the outer edge space SPg1 to make the temperature of the sample W uniform. As a result, thermal deformation of the sample W is suppressed.

The temperature measuring device 2292e can measure the temperature of the sample W. For this reason, the temperature adjusting device 2291e adjusts the temperature of at least a part of the outer edge space SPg1 so that the temperature of the sample W becomes uniform based on the measurement result of the temperature measuring device 2292e.

Even in the scanning electron microscope SEMe of the fifth modified example provided with such a stage 22e, it is possible to enjoy the same effects as those that can be enjoyed by the above-described scanning electron microscope SEMa. In addition, the scanning electron microscope SEMe of the fifth modified example can appropriately suppress the thermal deformation of the sample W.

Considering that the purpose of adjusting the temperature of the outer edge space SPg1 by the temperature adjusting device 2291e is to make the temperature of the sample W uniform (that is, adjusting the temperature of the sample W), the temperature adjusting device 2291e. In addition to or instead of the outer edge space SPg1, the temperature of at least a part of the sample W (particularly, the outer edge portion W_edge) may be adjusted. In this case, the temperature adjustment device 2291e may be disposed at a position where it can contact at least a part of the sample W (particularly, the outer edge portion W_edge). For example, one or more temperature adjustment devices 2291e may be arranged on the bottom member 221 to reduce local temperature fluctuations of the sample W caused by the local vacuum region VSP.

(3-6) Sixth Modification Next, a scanning electron microscope SEMf of the sixth modification will be described. The scanning electron microscope SEMf of the sixth modified example is different from the above-described scanning electron microscope SEM in that a stage 22f is provided instead of the stage 22. The other structure of the scanning electron microscope SEMf may be the same as the other structure of the scanning electron microscope SEM described above. Therefore, hereinafter, the structure of the stage 22f will be described with reference to FIG.

As shown in FIG. 14, the stage 22f is different from the stage 22 in that an electrostatic chuck 225f is provided. The electrostatic chuck 225f includes at least one electrode. The electrostatic chuck 225f can generate an electrostatic force (that is, coulomb force) F_elec under the control of the control device 4. The electrostatic chuck 225f can generate an electrostatic force F_elec acting on the sample W. The electrostatic chuck 225f can generate an electrostatic force F_elec that acts on the sample W so as to draw the sample W (for example, the back surface WSl of the sample W) to the electrostatic chuck 225f (and as a result, draw it to the stage 22f). That is, the electrostatic chuck 225f can generate an electrostatic force F_elec that acts in a direction from the sample W toward the stage 22f. The electrostatic chuck 225f can generate an electrostatic force F_elec that acts evenly on the sample W in the XY plane. The stage 22f uses the electrostatic force F_elec generated by the electrostatic chuck 225f as a force for holding the sample W. For this reason, in the sixth modified example, the stage 22f may not be provided with the exhaust port 2241 provided in the stage 22 described above in order to reduce the stage space SPs and hold the sample W. Further, the pipe 2251 may not be arranged on the stage 22f. Further, the pump system 5 may not include the vacuum pump 53. However, in addition to the electrostatic force F_elec generated by the electrostatic chuck 225f, the stage 22f may use a force F_hold1 due to the negative pressure generated by reducing the stage space SPs as a force for holding the sample W. In this case, an exhaust port 2241 may be formed on the stage 22f, a pipe 2251 may be disposed on the stage 22f, or the pump system 5 may include a vacuum pump 53.

In addition, in the sixth modification, the scanning electron microscope SEMf suppresses deformation of the sample W using the electrostatic force F_elec generated by the electrostatic chuck 225f under the control of the control device 4. That is, the stage 22f uses the electrostatic force F_elec generated by the electrostatic chuck 225f as a force for suppressing the deformation of the sample W. For this reason, in the sixth modified example, the stage 22f may not be provided with the exhaust port 2242 provided in the stage 22 described above in order to reduce the stage space SPs and suppress the deformation of the sample W. Further, the pipe 2252 may not be arranged on the stage 22f. Further, the pump system 5 may not include the vacuum pump 54. However, the stage 22f may suppress the deformation of the sample W by reducing the stage space SPs in addition to the electrostatic force F_elec generated by the electrostatic chuck 225f. In this case, the exhaust port 2242 may be formed in the stage 22f, the pipe 2252 may not be disposed in the stage 22f, and the pump system 5 may include the vacuum pump 54.

The control device 4 controls the electrostatic force F_elec generated by the electrostatic chuck 225f according to the force F_VSP caused by the vacuum region VSP (that is, the force acting on the specific portion W_vac so as to separate the specific portion W_vac from the stage 22). To do.

For example, in order to suppress the deformation of the sample W, the control device 4 cancels the force (that is, the force F_VSP) acting on the specific portion W_vac before the electrostatic chuck 225f applies the electrostatic force F_elec. In addition, the electrostatic force F_elec generated by the electrostatic chuck 225f may be controlled. In this case, the control device 4 sets the electrostatic force F_elec according to the force F_VSP so that the force F_VSP is canceled by the electrostatic force F_elec (that is, the force F_vac obtained by adding the electrostatic force F_elec and the force F_VSP becomes zero). You may control. In other words, the control device 4 may control the electrostatic force F_elec according to the force F_VSP so that the electrostatic force F_elec that can cancel the force F_VSP acts on (i.e., is applied to) the sample W. In this case, the control device 4 controls the electrostatic force F_elec so that the electrostatic force F_elec that acts in the opposite direction and has the same magnitude acts on the sample W compared to the force F_VSP. Also good. That is, the control device 4 acts to displace the sample W in the direction from the beam irradiation device 1 toward the stage 22f (for example, the −Z direction), and the electrostatic force F_elec having the same magnitude as the force F_VSP is generated by the sample W. The electrostatic force F_elec may be controlled so as to act on. When such electrostatic force F_elec is applied to the sample W by the electrostatic chuck 225f, both the force F_VSP caused by the vacuum region VSP and the electrostatic force F_elec generated by the electrostatic chuck 225f are applied to the specific portion W_vac. The For this reason, the force F_vac acting on the specific portion W_vac before the electrostatic chuck 225f applies the electrostatic force F_elec does not act on the specific portion W_vac after the electrostatic chuck 225f applies the electrostatic force F_elec. For this reason, the specific portion W_vac is not separated from the stage 22f. As a result, deformation of the sample W is appropriately suppressed. The electrostatic force F_elec satisfying such a condition is a specific example of the above-described force F_cancel that can cancel the force F_VSP caused by the vacuum region VSP.

Alternatively, for example, the control device 4 may control the electrostatic force F_elec generated by the electrostatic chuck 225f so that the force F_vac acting on the specific portion W_vac is reduced in order to suppress deformation of the sample W. In this case, the control device 4 may control the electrostatic force F_elec so that the electrostatic force F_elec acting in the opposite direction and having a different magnitude acts on the sample W compared to the force F_VSP. . That is, the control device 4 acts to displace the sample W in the direction from the beam irradiation device 1 toward the stage 22 (for example, the −Z direction), and an electrostatic force F_elec having a magnitude different from the force F_VSP acts on the sample W. Thus, the electrostatic force F_elec may be controlled. When such electrostatic force F_elec is applied to the sample W by the electrostatic chuck 225f, both the force F_VSP caused by the vacuum region VSP and the electrostatic force F_elec generated by the electrostatic chuck 225f are applied to the specific portion W_vac. The For this reason, the electrostatic chuck 225f is identified after the electrostatic force F_elec is applied compared to the force F_vac (that is, the force F_VSP) that has been applied to the specific portion W_vac before the electrostatic force F_elec is applied. The force F_vac acting on the portion W_vac (that is, the sum of the force F_VSP and the force F_elec) is reduced. For this reason, the specific portion W_vac is not easily separated from the stage 22f. Alternatively, even if the specific portion W_vac is separated from the stage 22f, the amount of separation (that is, the interval between the specific portion W_vac and the stage 22f) becomes small. As a result, the deformation of the sample W is appropriately suppressed as compared with at least the case where the electrostatic chuck 225f does not apply the electrostatic force F_elec. That is, the deformation of the sample W is appropriately suppressed. The electrostatic force F_elec that satisfies such a condition is a specific example of the above-described force F_reduce that can reduce the force F_vac acting on the specific portion W_vac.

Even in the scanning electron microscope SEMf of the sixth modified example provided with such a stage 22f, it is possible to enjoy the same effects as those that can be enjoyed by the above-described scanning electron microscope SEM.

Note that the electrostatic chuck 225f may be provided so as to be in contact with the lower surface WSl of the sample W. Further, the electrostatic chuck 225f may be provided at a portion that contacts the lower surface WSl of the sample W in the support member 223 of the stage 22.

In the second to fourth modifications described above, the deformation of the sample W caused by the outer edge portion W_edge of the sample W being separated from the

stage

22a or 22b using the electrostatic force generated by the electrostatic chuck. May be suppressed. For example, in each of the second modification and the third modification described above, the stage 22b adds the outer edge portion W_edge of the sample W to the stage 22a (particularly, in addition to or instead of the exhaust port 2243b for decompressing the space SPg). An electrostatic chuck capable of generating an electrostatic force acting on the outer edge portion W_edge so as to be drawn toward the upper surface 222Su) of the side wall member 222a may be provided. In the above-described fourth modified example, the stage 22b draws the outer edge portion W_edge ′ of the sample W toward the stage 22d (in particular, draws downward) in addition to or instead of the exhaust port 2244d for decompressing the space SPg2. Thus, an electrostatic chuck capable of generating an electrostatic force acting on the outer edge portion W_edge ′ may be provided.

The scanning electron microscope SEMf may suppress deformation of the sample W by using a different type of force from the electrostatic force F_elec. In other words, the scanning electron microscope SEMf includes an applying device that can apply a different type of force from the electrostatic force F_elec as a force for suppressing deformation of the sample W in addition to or instead of the electrostatic chuck 225f. May be. For example, the scanning electron microscope SEMf includes a moving member disposed on the stage 22f so as to be attached to the back surface WSl of the sample W and to be movable along the Z axis while being attached to the back surface WSl. It may be provided as an example. In this case, the scanning electron microscope SEMf may use the force accompanying the movement of the moving member as a force for suppressing the deformation of the sample W. Note that at least one of the plurality of support members 223 may be used as a moving member. Alternatively, for example, the scanning electron microscope SEMf may include a Bernoulli chuck disposed on the stage 22f so as to face the back surface WSl of the sample W as an example of the applying device. In this case, the scanning electron microscope SEMf uses a force acting between the Bernoulli chuck and the back surface WSl of the sample W due to the gas ejected from the Bernoulli chuck as a force for suppressing the deformation of the sample W. May be.

(3-7) Subsequently seventh modification will be described scanning electron microscope SEMg the seventh modification. The scanning electron microscope SEMg according to the seventh modification is different from the above-described scanning electron microscope SEM in that a stage 22g is provided instead of the stage 22. The other structure of the scanning electron microscope SEMg may be the same as the other structure of the scanning electron microscope SEM described above. Therefore, the structure of the stage 22g will be described below with reference to FIGS. 15 (a) to 15 (b).

15 (a) and 15 (b), the stage 22g is different from the stage 22 in that it includes a partition member 227g. The partition member 227g is a member formed so as to protrude upward (that is, on the + Z side) from the bottom member 221 in a region surrounded by the side wall member 222. The upper surface 227Su of the partition wall member 227g is positioned at the same height as the upper surface 222Su of the side wall member 222 and the upper surface 223Su of the support member 223. That is, the upper surface 227Su of the partition wall member 227g is located on the same plane as the upper surface 222Su of the side wall member 222 and the upper surface 223Su of the support member 223. Accordingly, the stage 22g holds the sample W in a state where the back surface WSl of the sample W is in contact with the upper surface 222Su of the side wall member 222, the upper surfaces 223Su of the plurality of support members 223, and the upper surface 227Su of the partition wall member 227g.

The partition member 227g has N (where N is an integer of 2 or more) divided spaces SPsg (specifically, divided spaces) in which the stage space SPs is surrounded by the bottom member 221, the sidewall member 222, and the partition member 227g. This is a member for dividing SPsg # 1 to SPsg # N). The partition member 227g is formed on the bottom member 221 so that the stage space SPs is distributed in a distribution pattern that can be divided into N divided spaces SPsg in plan view. FIGS. 15A and 15B show an example in which the partition member 227g divides the stage space SPs into nine divided spaces SPsg # 1 to SPsg # 9 (that is, an example in which N = 9). Yes.

The stage 22g further has N exhaust ports 2241g (specifically, exhaust ports 2241g # 1 to 2241g # N) respectively corresponding to the N divided spaces SPsg as compared with the stage 22. It is different in point. A vacuum pump 53 is connected to the N exhaust ports 2241g via N pipes 2251g (specifically, pipes 2251g # 1 to 2251g # N), respectively. The vacuum pump 53 can exhaust the divided space SPsg # i and depressurize it from the atmospheric pressure via the exhaust port 2241g # i (where i is an integer of 1 or more and N or less) and the pipe 2251g # i. .

The stage 22g further has N exhaust ports 2242g (specifically, exhaust ports 2242g # 1 to 2242g # N) respectively corresponding to the N divided spaces SPsg compared to the stage 22. It is different in point. A vacuum pump 54 is connected to the N exhaust ports 2242g via N pipes 2252g (specifically, pipes 2252g # 1 to 2252g # N), respectively. The vacuum pump 54 can exhaust the divided space SPsg # i through the exhaust port 2242g # i and the pipe 2252g # i to reduce the pressure from the atmospheric pressure.

N pieces of open / close members 2261g (specifically, open / close members 2261g # 1 to 2261g # N) that can open and close the N pieces of pipes 2251g are arranged in the N pieces of pipes 2251g, respectively. The opening / closing member 2261g is, for example, a valve. Furthermore, N open / close members 2262g (specifically, open / close members 2262g # 1 to 2262g # N) that can open and close the N pipes 2252g are arranged in the N pipes 2252g, respectively. The opening / closing member 2262g is, for example, a valve. The state of the opening / closing member 2261g # i is a state in which the pipe 2251g # i is shut off under the control of the control device 4 (that is, a state in which the vacuum pump 53 does not depressurize the divided space SPsg # i) and a pipe 2251g # i is opened (Ie, the vacuum pump 53 depressurizes the divided space SPsg # i). The state of the opening / closing member 2262g # i is a state in which the pipe 2252g # i is shut off under the control of the control device 4 (that is, a state in which the vacuum pump 54 does not depressurize the divided space SPsg # i) and (Ie, the vacuum pump 54 depressurizes the divided space SPsg # i).

In the seventh modification, the control device 4 controls the atmospheric pressure of each of the N divided spaces SPsg. Specifically, the control device 4 includes at least one divided space SPsg facing the specific portion W_vac in which the vacuum region VSP is formed (that is, irradiated with the electron beam EB) among the N divided spaces SPsg. The N opening / closing members 2261g and the N opening / closing members 2262g are controlled so that the state is reduced by the vacuum pump 54 instead of the vacuum pump 53. That is, the control device 4 reduces the state of at least one divided space SPsg facing the vacuum region VSP across the specific portion W_vac among the N divided spaces SPsg by the vacuum pump 54 instead of the vacuum pump 53. The N opening / closing members 2261g and the N opening / closing members 2262g are controlled so as to be in a state of being performed. On the other hand, the control device 4 has at least one other divided space SPsg that does not face the specific portion W_vac among the N divided spaces SPsg (for example, a division that opposes the atmospheric pressure space with the sample W interposed therebetween). The N opening / closing members 2261g and the N opening / closing members 2262g are controlled so that the state of the space SPsg) is reduced by the vacuum pump 53 instead of the vacuum pump 54. That is, in the seventh modification, the control device 4 is configured so that a part of the stage space SPs is decompressed by the vacuum pump 54 while another part of the stage space SPs is decompressed by the vacuum pump 53. The number of opening / closing members 2261g and the number N of opening / closing members 2262g are controlled. For example, as illustrated in FIG. 16A, when the divided space SPsg # 2 faces the specific portion W_vac, the control device 4 reduces the divided space SPsg # 2 while the divided space SPsg # 2 is decompressed by the vacuum pump 54. The N opening / closing members 2261g and the N opening / closing members 2262g are controlled so that the spaces SPsg # 1 and SPsg # 3 to SPsg # 9 are depressurized by the vacuum pump 53. For example, as shown in FIG. 16B, when the divided space SPsg # 3 faces the specific portion W_vac, the control device 4 reduces the divided space SPsg # 3 while the divided space SPsg # 3 is decompressed by the vacuum pump 54. The N opening / closing members 2261g and the N opening / closing members 2262g are controlled so that the space SPsg # 1, SPsg # 2, and SPsg # 4 to SPsg # 9 is depressurized by the vacuum pump 53. In this case, when the vacuum region VSP moves from the position shown in FIG. 16 (a) to the position shown in FIG. 16 (b) (that is, the relative position between the sample W and the differential exhaust system 12 is shown in FIG. 16 (a)). ) Is changed from the positional relationship shown in FIG. 16B to the positional relationship shown in FIG. 16B), the state of the divided space SPsg # 2 is a relatively high vacuum state (that is, the divided space is reduced by the vacuum pump 54). From a state in which the atmospheric pressure in the space SPsg # 2 becomes the atmospheric pressure # 21, a relatively low vacuum state in which the pressure is reduced by the vacuum pump 53 (that is, the atmospheric pressure # 22 in which the atmospheric pressure in the divided space SPsg # 2 is higher than the atmospheric pressure # 21). State). Further, the state of the divided space SPsg # 3 is reduced by the vacuum pump 54 from a relatively low vacuum state where the pressure is reduced by the vacuum pump 53 (that is, a state where the atmospheric pressure of the divided space SPsg # 3 becomes the atmospheric pressure # 31). Transition to a relatively high vacuum state (that is, a state in which the atmospheric pressure in the divided space SPsg # 3 becomes the atmospheric pressure # 32 lower than the atmospheric pressure # 31). 16A and 16B show the magnitude of the force acting on the sample W by the thickness of the arrow. Specifically, FIG. 16A and FIG. 16B show the magnitude of the force acting on the sample W so that the arrow indicating the force increases as the force acting on the sample W increases. ing.

As a result, the pressure of the divided space SPsg not facing the specific part W_vac is lower than the atmospheric pressure. For this reason, when the vacuum pump 53 depressurizes the divided space SPsg that does not face the specific portion W_vac, the force F_hold1 (that is, the sample due to the depressurization by the vacuum pump 53) is applied to a portion other than the specific portion W_vac in the sample W. (Force that draws W to the stage space SPs). Accordingly, the sample W is held by the stage 22f. On the other hand, the pressure in the divided space SPsg facing the specific portion W_vac is approximately the same as the pressure in the beam passage space SPb3 (that is, the pressure in the vacuum region VSP). That is, as the divided space SPsg facing the specific portion W_vac is exhausted by the vacuum pump 54, the difference between the pressure of the divided space SPsg facing the specific portion W_vac and the pressure of the vacuum region VSP is the atmospheric pressure and the vacuum region VSP. The difference from the pressure is smaller. For this reason, in the specific portion W_vac, the force F_VSP caused by the vacuum region VSP and the force F_hold2 caused by the pressure reduction by the vacuum pump 54 cancel each other. That is, the force F_vac that is the sum of F_VSP and force F_hold2 does not act on the specific portion W_vac. Therefore, deformation of the specific portion W_vac is suppressed. Thus, even with the scanning electron microscope SEMg according to the seventh modification including such a stage 22g, it is possible to enjoy the same effects that the scanning electron microscope SEM described above can enjoy. it can.

In addition, in the seventh modification, compared to the case where the entire stage space SPs is depressurized by the vacuum pump 54, the back surface of the sample W is attracted to the stage space SPs due to the depressurization of the stage space SPs. The negative pressure acting on WSl is reduced. This is because in the seventh modification, a part of the stage space SPs is decompressed by the vacuum pump 54, while the other part of the stage space SPs is decompressed by the vacuum pump 53 having a lower exhaust capacity than the vacuum pump 54. This is because that. For this reason, deformation of the sample W (particularly, deformation of a part other than the specific part W_vac in the sample W) due to the decompression of the stage space SPs is suppressed. The suppression of the deformation of the part other than the specific part W_vac in the sample W is performed by measuring the state of the specific part W_vac in the sample W by irradiating the electron beam EB while the part other than the specific part W_vac in the sample W. In the case where the state is measured by another type of measurement device (for example, a measurement device such as an optical microscope described later), this leads to suppression of deterioration in measurement accuracy of the other type of measurement device (fourteenth modification described later). reference).

As described above, as the stage 22g moves, the relative position between the sample W and the vacuum region VSP on the surface WSu of the sample W changes. That is, as the stage 22g moves, the relative position between the sample W and the specific portion W_vac changes. In other words, the position of the specific portion W_vac in the sample W changes with the movement of the stage 22g. For this reason, the control device 4 changes at least one divided space SPsg that is decompressed by the vacuum pump 54 among the N divided spaces SPsg, according to the position of the specific portion W_vac in the sample W. The position of the specific portion W_vac in the sample W depends on the relative position between the sample W and the differential exhaust system 12 that forms the vacuum region VSP. For this reason, the operation of changing at least one divided space SPsg reduced in pressure by the vacuum pump 54 out of the N divided spaces SPsg according to the position of the specific portion W_vac is relative to the sample W and the differential exhaust system 12. This can be regarded as equivalent to an operation of changing at least one divided space SPsg decompressed by the vacuum pump 54 out of the N divided spaces SPsg based on the position information. As a result, even when the position of the specific portion W_vac in the sample W changes, the scanning electron microscope SEMg appropriately holds the sample W by the stage 22g and deforms the sample W due to the formation of the vacuum region VSP. Can be suppressed. Note that the control device 4 may change at least one divided space SPsg that is decompressed by the vacuum pump 54 among the N divided spaces SPsg according to information different from the position of the specific portion W_vac in the sample W. Good. Further, the divided section SPsg decompressed by the vacuum pump 54 may be returned to the original pressure or may remain decompressed.

As described above, the operation of reducing the stage space SPs using the vacuum pump 54 is an operation of applying to the sample W a force F_cancel that can cancel the force F_VSP or a force F_reduce that can reduce the force F_vac. Is equivalent. Then, the operation of changing at least one divided space SPsg decompressed by the vacuum pump 54 among the N divided spaces SPsg is equivalent to an operation of changing the position to which the force F_cancel or the force F_reduce is applied.

(3-8) Eighth Modification Next, a scanning electron microscope SEMh according to an eighth modification will be described. The scanning electron microscope SEMh of the eighth modified example is different from the scanning electron microscope SEMg of the seventh modified example described above in that a stage 22h is provided instead of the stage 22g. The other structure of the scanning electron microscope SEMh may be the same as the other structure of the scanning electron microscope SEMg described above. Therefore, hereinafter, the structure of the stage 22h will be described with reference to FIG.

As shown in FIG. 17, the stage 22h has N supply ports 2249h (specifically, exhaust ports 2249h # 1 to 2249h # N corresponding to the N divided spaces SPsg, respectively, as compared with the stage 22g. ) Is formed. The air supply port 2249h # i is formed at a position facing the corresponding divided space SPsg # i. In the example shown in FIG. 17, each air supply port 2249 h is formed in the bottom member 221. A gas supply device 55h is connected to the N supply ports 2249h via N pipes 2259h (specifically, pipes 2259h # 1 to 2259h # N), respectively. The gas supply device 55h can be pressurized by supplying gas to the divided space SPsg # i via the air supply port 2249h # i and the pipe 2259h # i.

N pieces of open / close members 2269h (specifically, open / close members 2269h # 1 to 2269h # N) that can open and close the N pieces of pipe 2259h are arranged in the N pieces of pipes 2259h, respectively. The opening / closing member 2269h is, for example, a valve. The state of the opening / closing member 2269h # i includes a state where the pipe 2259h # i is shut off under the control of the control device 4 (that is, a state where the gas supply device 55h does not supply gas to the divided space SPsg # i), and a pipe 2259h # i. It is possible to switch between a state in which i is opened (that is, a state in which the gas supply device 55h supplies gas to the divided space SPsg # i).

In the eighth modification, the control device 4 has a gas supply device at a timing when the state of the divided space SPsg # i should be switched from a high vacuum state in which the pressure is reduced by the vacuum pump 54 to a low vacuum state in which the pressure is reduced by the vacuum pump 53. The opening / closing member 2269h # i is controlled so that 55h supplies gas to the divided space SPsg # i. That is, the control device 4 divides the gas supply device 55h at a timing when the state of the divided space SPsg # i should be switched from a high vacuum state with a relatively high degree of vacuum to a low vacuum state with a relatively low degree of vacuum. The opening / closing member 2269h # i is controlled so as to supply gas to the space SPsg # i. As a result, the time required for the state of the divided space SPsg # i to switch from the high vacuum state to the low vacuum state is compared with the case where the gas supply device 55h does not supply gas to the divided space SPsg # i at this timing. Shorter. That is, the scanning electron microscope SEMh according to the eighth modified example enjoys the same effect that can be enjoyed by the scanning electron microscope SEMg according to the seventh modified example described above, but also in the divided space SPsg # i. The time required for the state to switch from the high vacuum state to the low vacuum state can be shortened.

Considering such a technical effect, the gas supply device 55h supplies the gas having a flow rate sufficient to promote the switching of the state of the divided space SPsg # i from the high vacuum state to the low vacuum state into the divided space SPsg. What is necessary is just to supply to #i. That is, the intake device 55h may not supply the divided space SPsg # i with a gas having such a flow rate that the divided space SPsg # i returns to the atmospheric pressure space. Note that the divided section SPsg decompressed by the vacuum pump 54 may remain decompressed.

It should be noted that at least one air inlet 2249h may be formed in the stage 22 or the like in which the stage space SPs is not divided into N divided spaces SPsg. In this case, the control device 4 causes the gas supply device 55h to move to the stage space SPs at a timing when the state of the stage space SPs should be switched from a high vacuum state where the pressure is reduced by the vacuum pump 54 to a low vacuum state where the pressure is reduced by the vacuum pump 53. The opening / closing member 2269h disposed in the pipe 2259h that connects the gas supply device 55h and the stage space SPs may be controlled so that gas is supplied to the gas. Also in this case, the time required for the state of the stage space SPs to switch from the high vacuum state to the low vacuum state is shortened.

Further, the control device 4 causes the gas supply device 55h to supply gas to the divided space SPsg # i at a timing different from the timing at which the state of the divided space SPsg # i should be switched from the high vacuum state to the low vacuum state. The opening / closing member 2269h # i may be controlled. For example, the control device 4 controls the opening / closing member 2269h # i so that the gas supply device 55h supplies gas to the divided space SPsg # i at the timing of releasing the sample W held by the stage 22h. Good. As a result, the time required for the divided space SPsg # i in the high vacuum state to return to the atmospheric pressure space is shortened. For this reason, the time required for releasing the sample W (that is, exchanging the sample W held by the stage 22h) is shortened.

(3-9) Ninth Modification Next, a scanning electron microscope SMi of the ninth modification will be described. The scanning electron microscope SMi of the ninth modification differs from the scanning electron microscope SEMf of the sixth modification described above in that a stage 22i is provided instead of the stage 22f. The other structure of the scanning electron microscope SEMi may be the same as the other structure of the scanning electron microscope SEMf described above. Therefore, hereinafter, the structure of the stage 22i will be described with reference to FIG.

As shown in FIG. 18, the stage 22i differs from the stage 22f in that a plurality of electrostatic chucks 225i are provided instead of the single electrostatic chuck 225f. FIG. 18 shows an example in which the stage 22i includes nine electrostatic chucks 225i # 1 to 225i # 9. Each electrostatic chuck 225i acts on the sample W so as to draw the sample W to the electrostatic chuck 225i (as a result, to the stage 22i) under the control of the control device 4 in the same manner as the electrostatic chuck 225f described above. An electrostatic force F_elec can be generated. The stage 22i uses an electrostatic force F_elec generated by at least a part of the plurality of electrostatic chucks 225i as a force for holding the sample W.

Each electrostatic chuck 225i can generate an electrostatic force F_elec that acts locally (in other words, partially) on the sample W in the XY plane. That is, each electrostatic chuck 225i can generate an electrostatic force F_elec that acts locally (in other words, partially) on a portion of the sample W corresponding to each electrostatic chuck 225i. For example, the first electrostatic chuck 225i # 1 of the plurality of electrostatic chucks 225i generates an electrostatic force F_elec that acts on the first portion of the sample W, and the first of the plurality of electrostatic chucks 225i. The second electrostatic chuck 225i # 2 different from the electrostatic chuck 225i # 1 is different from the first part (or at least partially overlaps with the first part). Electric power F_elec may be generated.

In the control device 4, at least one electrostatic chuck 225 i corresponding to the specific portion W_vac in which the vacuum region VSP is formed (that is, irradiated with the electron beam EB) among the plurality of electrostatic chucks 225 i is the sample W The plurality of electrostatic chucks 225i are controlled so as to generate a relatively large electrostatic force F_elec (hereinafter referred to as “electrostatic force F_elec_L”) for suppressing the deformation of the electrostatic chuck. The electrostatic chuck 225i corresponding to the specific portion W_vac is an electrostatic chuck 225i that can generate an electrostatic force F_elec acting on the specific portion W_vac. The electrostatic chuck 225i that can generate the electrostatic force F_elec acting on the specific portion W_vac is typically the electrostatic chuck 225i that faces the vacuum region VSP with the specific portion W_vac interposed therebetween. Therefore, the control device 4 includes the electrostatic force F_elec_L for suppressing at least one electrostatic chuck 225i that can generate the electrostatic force F_elec acting on the specific portion W_vac among the plurality of electrostatic chucks 225i. To control the plurality of electrostatic chucks 225i. Specifically, the control device 4 applies the sample W to the electrode constituting at least one electrostatic chuck 225i capable of generating an electrostatic force F_elec acting on the specific portion W_vac among the plurality of electrostatic chucks 225i. A first voltage capable of generating an electrostatic force F_elec_L for suppressing deformation is applied. The electrostatic force F_elec_L for suppressing the deformation of the sample W is an electrostatic force F_elec corresponding to the force F_VSP caused by the vacuum region VSP, and is applied to the sample W from the electrostatic chuck 225f in the sixth modification. It is the same force as the electrostatic force F_elec. On the other hand, the control device 4 uses a relatively small electrostatic force F_elec (hereinafter referred to as “electrostatic force”) for holding at least one electrostatic chuck 225i that does not correspond to the specific portion W_vac among the plurality of electrostatic chucks 225i. , Referred to as “electrostatic force F_elec_S”), the plurality of electrostatic chucks 225i are controlled. That is, the control device 4 is configured such that at least one electrostatic chuck 225i capable of generating an electrostatic force F_elec acting on a part other than the specific portion W_vac among the plurality of electrostatic chucks 225i is relatively small for holding the sample W. The plurality of electrostatic chucks 225i are controlled so as to generate the electrostatic force F_elec_S. Specifically, the control device 4 applies the sample W to the electrode constituting at least one electrostatic chuck 225i capable of generating an electrostatic force F_elec that acts on a part other than the specific portion W_vac among the plurality of electrostatic chucks 225i. A second voltage capable of generating an electrostatic force F_elec_S for holding the voltage (that is, a voltage different from the first voltage capable of generating an electrostatic force F_elec_L for suppressing deformation of the sample W) is applied. In addition, since the electrostatic force F_elec_S is relatively small and the electrostatic force F_elec_L is relatively large, the electrostatic force F_elec_S is smaller than the electrostatic force F_elec_L. It may be the same size. As described in the seventh modification, the position of the specific portion W_vac in the sample W depends on the relative position between the sample W and the differential exhaust system 12 that forms the vacuum region VSP. Therefore, the operation of controlling the plurality of electrostatic chucks 225i so that at least one electrostatic chuck 225i corresponding to the specific portion W_vac generates the electrostatic force F_elec_L relates to the relative position between the sample W and the differential exhaust system 12. This can be regarded as equivalent to an operation of controlling the plurality of electrostatic chucks 225i based on the information.

FIG. 18 shows an example in which the electrostatic chuck 225i # 5 can generate an electrostatic force F_elec that acts on the specific portion W_vac. Therefore, FIG. 18 shows that the electrostatic chuck 225i # 5 generates an electrostatic force F_elec_L for suppressing deformation of the sample W, and the electrostatic chucks 225i # 1 to

225i #

4 and 225i # 6 to 225i # 9 3 shows an example in which an electrostatic force F_elec_S for holding the sample W is generated. FIG. 18 shows the magnitude of the force acting on the sample W by the length and thickness of the arrow. Specifically, FIG. 18 shows the magnitude of the force acting on the sample W so that the arrow indicating the force becomes thicker and longer as the force acting on the sample W increases.

As a result, when such an electrostatic force F_elec is applied to the sample W by the plurality of electrostatic chucks 225i, the scanning electron microscope SEMi forms the vacuum region VSP while appropriately holding the sample W by the stage 22i. The deformation of the sample W caused can be suppressed.

As described above, the position of the specific portion W_vac in the sample W changes with the movement of the stage 22i. For this reason, the control device 4 has at least one electrostatic force for applying an electrostatic force F_elec_L for suppressing deformation of the sample W among the plurality of electrostatic chucks 225i according to the position of the specific portion W_vac in the sample W. The electric chuck 225i is changed. As a result, even when the position of the specific portion W_vac in the sample W changes, the scanning electron microscope SEMi appropriately holds the sample W by the stage 22i, and deforms the sample W due to the formation of the vacuum region VSP. Can be suppressed. As an example, when the state of the first portion of the sample W transitions from a state not facing the vacuum region VSP to a state facing the vacuum region VSP (that is, the sample W and the differential exhaust system 12 and Is changed from a positional relationship in which the first portion of the sample W does not face the vacuum region VSP to a positional relationship in which the first portion faces the vacuum region VSP). The voltage applied to the electrostatic chuck 225i corresponding to is changed from a voltage capable of generating the electrostatic force F_elec_S to a voltage capable of generating the electrostatic force F_elec_L (for example, a voltage higher than a voltage capable of generating the electrostatic force F_elec_S). To do. On the other hand, when the state of the first portion of the sample W transitions from the state facing the vacuum region VSP to the state not facing the vacuum region VSP (that is, the sample W and the differential exhaust system 12) Is changed from a positional relationship in which the first portion of the sample W faces the vacuum region VSP to a positional relationship in which the first portion does not face the vacuum region VSP). The voltage applied to the electrostatic chuck 225i corresponding to is changed from a voltage capable of generating the electrostatic force F_elec_L to a voltage capable of generating the electrostatic force F_elec_S.

Note that the plurality of electrostatic chucks 225i may be provided so as to contact the lower surface WSl of the sample W. In addition, the plurality of electrostatic chucks 225i may be provided at portions of the support member 223 of the stage 22i that are in contact with the lower surface WSl of the sample W.

In the ninth modified example, similarly to the sixth modified example, the scanning electron microscope SEMi uses a static force as a force for suppressing the deformation of the sample W in addition to or instead of the plurality of electrostatic chucks 225i. There may be provided a plurality of applying devices capable of applying a different type of power from the electric power F_elec. Even in this case, the control device 4 is configured so that at least one application device corresponding to the specific portion W_vac in which the vacuum region VSP is formed among the plurality of application devices is relatively used for suppressing the deformation of the sample W. A plurality of applying devices may be controlled so as to generate a large force. The control device 4 controls the plurality of application devices such that at least one application device that does not correspond to the specific portion W_vac generates a relatively small force for holding the sample W among the plurality of application devices. You may control.

(3-10) Tenth Modification Next, a scanning electron microscope SEMj of the tenth modification will be described. The scanning electron microscope SEMj of the tenth modified example is different from the above-described scanning electron microscope SEM in that a stage 22j is provided instead of the stage 22. The other structure of the scanning electron microscope SEMj may be the same as the other structure of the scanning electron microscope SEM described above. Therefore, hereinafter, the structure of the stage 22j will be described with reference to FIG.

As shown in FIG. 19, the stage 22j is different from the stage 22 in that a vacuum chuck 228j is provided. Further, the stage 22j is different from the stage 22 in that the exhaust port 2242 may not be formed in the bottom member 221 and the pipe 2252 may not be disposed in the stage 22j. The other structure of the stage 22j may be the same as the other structure of the stage 22 described above. In FIG. 19, the description of the plurality of support members 223 is omitted for simplification of the drawing.

The vacuum chuck 228j is disposed in the stage space SPs. The vacuum chuck 228j can partially (ie locally) vacuum-suck the back surface WSl of the sample W. Specifically, the vacuum chuck 228j can define a local adsorption space SPsj facing the back surface WSl of the sample W in a part of the stage space SPs. An exhaust port 2245j is formed in the vacuum chuck 228j. A vacuum pump 54 is connected to the exhaust port 2245j through a pipe 2255j. For this reason, the pressure in the adsorption space SPsj is approximately equal to the pressure in the beam passage space SPb3 (that is, the pressure in the vacuum region VSP).

The vacuum chuck 228j can be moved along the XY plane (that is, along the back surface WSl of the sample W) in the stage space SPs by the drive system 24j provided in the stage apparatus 2j of the tenth modification. When the vacuum chuck 228j moves, the relative position between the sample W and the vacuum chuck 228j changes. That is, when the vacuum chuck 228j moves, the exhaust port 2245j moves in the stage space SPs. Particularly in the tenth modification, the control device 4 controls the drive system 24j to move the vacuum chuck 228j in accordance with the position of the specific portion W_vac in the sample W. As described in the seventh modification, the position of the specific portion W_vac in the sample W depends on the relative position between the sample W and the differential exhaust system 12 that forms the vacuum region VSP. For this reason, the operation of moving the vacuum chuck 228j according to the position of the specific portion W_vac can be regarded as equivalent to the operation of moving the vacuum chuck 228j based on information on the relative position between the sample W and the differential exhaust system 12. Specifically, the control device 4 moves the vacuum chuck 228j so that the suction space SPsj faces the specific portion W_vac. That is, the control device 4 moves the vacuum chuck 228j so that the exhaust port 2245j is located in a region facing the specific portion W_vac. As a result, when the suction space SPsj is depressurized by the vacuum pump 54, the pressure of the suction space SPsj facing the specific portion W_vac is approximately equal to the pressure of the beam passage space SPb3 (that is, the pressure of the vacuum region VSP). In other words, the suction space SPsj facing the specific portion W_vac is exhausted by the vacuum pump 54, so that the difference between the pressure of the suction space SPsj facing the specific portion W_vac and the pressure of the vacuum region VSP is the atmospheric pressure and the vacuum region VSP. The difference from the pressure is smaller. For this reason, when the vacuum pump 54 depressurizes the adsorption space SPsh, in the specific portion W_vac, the force F_VSP acting on the sample W from the vacuum region VSP and the force F_hold2 acting on the sample W from the adsorption space SPsj cancel each other. Therefore, deformation of the specific portion W_vac is suppressed. On the other hand, the stage space SPs (particularly, the space other than the adsorption space SPsj in the stage space SPs) is decompressed by the vacuum pump 53. For this reason, force F_hold1 resulting from the pressure reduction by the vacuum pump 53 acts on at least a part of the sample W other than the specific portion W_vac. Accordingly, the stage 22j holds the sample W by using this force F_hold1 as a force for holding the sample W.

As an example, when the state of the first portion of the sample W transitions from a state not facing the vacuum region VSP to a state facing the vacuum region VSP (that is, the sample W and the differential exhaust system 12 and Is changed from a positional relationship in which the first portion of the sample W does not face the vacuum region VSP to a positional relationship in which the first portion faces the vacuum region VSP), the stage space SPs. Of these, the pressure of the portion facing the first portion changes from the first pressure to a second pressure lower than the first pressure. On the other hand, when the state of the first portion of the sample W transitions from the state facing the vacuum region VSP to the state not facing the vacuum region VSP (that is, the sample W and the differential exhaust system 12) Is changed from a positional relationship in which the first portion of the sample W faces the vacuum region VSP to a positional relationship in which the first portion does not face the vacuum region VSP). Of these, the pressure of the part facing the first part changes from the second pressure to the first pressure lower than the second pressure.

Note that the vacuum piping of the vacuum chuck 228j may not penetrate the bottom member 221. For example, an opening communicated with the vacuum pump 54 may be provided on the side of the side wall member 222 on the stage space SPs, and a vacuum pipe connecting the opening and the vacuum chuck 228j may be provided. At this time, the vacuum pipe may be a flexible member such as a bellows.

Thus, even the scanning electron microscope SEMj of the tenth modified example including the stage 22j can enjoy the same effects as those that can be enjoyed by the above-described scanning electron microscope SEM. In particular, the scanning electron microscope SEMj of the tenth modification is caused by the formation of the vacuum region VSP while appropriately holding the sample W by the stage 22j even when the position of the specific portion W_vac in the sample W changes. The deformation of the sample W can be suppressed.

(3-11) Eleventh Modification Next, a scanning electron microscope SEMk of the eleventh modification will be described. The scanning electron microscope SEMk of the eleventh modification is different from the above-described scanning electron microscope SEMj of the tenth modification in that a stage 22k is provided instead of the stage 22j. The other structure of the scanning electron microscope SEMk may be the same as the other structure of the scanning electron microscope SEMj described above. Therefore, hereinafter, the structure of the stage 22k will be described with reference to FIG.

As shown in FIG. 20, the stage 22k is different from the stage 22j in that an electrostatic chuck 225k is provided instead of the vacuum chuck 228j. The other structure of the stage 22k may be the same as the other structure of the stage 22j described above. In FIG. 20, the description of the plurality of support members 223 is omitted for simplification of the drawing.

The electrostatic chuck 225k is similar to the electrostatic chuck 225i of the ninth modified example described above so that the sample W is attracted to the electrostatic chuck 225k (as a result, is attracted to the stage 22k) under the control of the control device 4. An electrostatic force F_elec acting on W can be generated. However, the electrostatic chuck 225k can generate an electrostatic force F_elec that acts locally (in other words, partially) on the sample W in the XY plane. In particular, the electrostatic chuck 225k can locally generate an electrostatic force F_elec for suppressing deformation of the sample W.

Similarly to the vacuum chuck 228j of the tenth modification, the electrostatic chuck 225k is moved along the XY plane (that is, the sample W) in the stage space SPs by the drive system 24k provided in the stage device 2k of the eleventh modification. Along the backside WSl). When the electrostatic chuck 225k moves, the relative position between the sample W and the electrostatic chuck 225k changes. Particularly in the eleventh modification, the control device 4 controls the drive system 24k to move the electrostatic chuck 225k according to the position of the specific portion W_vac in the sample W. As described in the seventh modification, the position of the specific portion W_vac in the sample W depends on the relative position between the sample W and the differential exhaust system 12 that forms the vacuum region VSP. Therefore, the operation of moving the electrostatic chuck 225k according to the position of the specific portion W_vac can be regarded as equivalent to the operation of moving the electrostatic chuck 225k based on information on the relative position between the sample W and the differential exhaust system 12. . Specifically, the control device 4 moves the electrostatic chuck 225k so that the electrostatic force F_elec is applied to the specific portion W_vac. That is, the control device 4 moves the electrostatic chuck 225k to a position facing the vacuum region VSP with the specific portion W_vac in between. As a result, when the electrostatic force F_elec is applied by the electrostatic chuck 225k, in the specific portion W_vac, the force F_VSP acting on the sample W from the vacuum region VSP and the force F_elec acting on the sample W from the electrostatic chuck 225k cancel each other. Fit. For this reason, the deformation of the sample W is appropriately suppressed. On the other hand, the stage space SPs is decompressed by the vacuum pump 53. For this reason, force F_hold1 resulting from the pressure reduction by the vacuum pump 53 also acts on the sample W. Therefore, the stage 22k holds the sample W by using this force F_hold1 as a force for holding the sample W.

Thus, even the scanning electron microscope SEMk of the eleventh modified example including the stage 22k can enjoy the same effects as those that can be enjoyed by the above-described scanning electron microscope SEM. In particular, the scanning electron microscope SEMk of the eleventh modification is caused by the formation of the vacuum region VSP while appropriately holding the sample W by the stage 22k even when the position of the specific portion W_vac in the sample W changes. The deformation of the sample W can be suppressed.

The electrostatic chuck 225k may be configured to be able to contact the lower surface WSl of the sample W during at least a part of the period during which the force F_elec is applied to the sample W.

In the eleventh modified example, similarly to the sixth modified example, the scanning electron microscope SEMk uses the electrostatic force F_elec as a force for suppressing the deformation of the sample W in addition to or instead of the electrostatic chuck 225k. You may provide the provision apparatus which can provide the kind of force different from. Also in this case, the control device 4 may move the applying device according to the position of the specific portion W_vac in the sample W. That is, the control device 4 may move the applying device such that a force is applied to the specific portion W_vac from the applying device. Furthermore, in the eleventh modification, the pump system 5 does not have to include the vacuum pump 54 because the vacuum pump 54 may not be used to suppress the deformation of the sample W.

(3-12) Twelfth Modification Next, a scanning electron microscope SEMl of a twelfth modification will be described. The scanning electron microscope SEMl of the twelfth modified example is different from the above-described scanning electron microscope SEM in that a stage 22l is provided instead of the stage 22. The other structure of the scanning electron microscope SEMl may be the same as the other structure of the scanning electron microscope SEM described above. Therefore, the structure of the stage 22l will be described below with reference to FIGS. 21 (a) and 21 (b).

21 (a) and 21 (b), the stage 22l is different from the stage 22 described above in that the arrangement of the plurality of support members 223 is different. Specifically, the stage 22l is different from the stage 22 described above in that the arrangement mode of the support member 223 in the outer edge portion 22_edge of the stage 22l is different from the arrangement mode of the support member 223 in the center portion 22_center of the stage 22l. It is different in point. The outer edge portion 22_edge of the stage 22l is a portion located outside the center portion 22_center of the stage 22l (that is, the side closer to the side wall member 222). The center portion 22_center of the stage 22l is located closer to the center of the stage 22l (specifically, the center in the XY plane, typically the center of the surface WSu) than the outer edge portion 22_edge of the stage 22l. It is a part to do. The outer edge portion 22_edge of the stage 22l is typically a portion that includes or is close to a portion that faces the outer edge portion W_edge of the sample W. The center portion 22_center of the stage 22l is typically a portion that includes or is close to a portion that faces the center of the surface WSu of the sample W. The other structure of the stage 22l may be the same as the other structure of the stage 22 described above.

In the twelfth modification, the arrangement mode of the support members 223 includes the number of the support members 223 per unit area. For this reason, the number of support members 223 per unit area in the outer edge portion 22_edge of the stage 22l is different from the number of support members 223 per unit area in the center portion 22_center of the stage 22l. More specifically, as shown in FIGS. 21A and 21B, the number of support members 223 per unit area in the outer edge portion 22_edge of the stage 22l is equal to the unit area in the central portion 22_center of the stage 22l. The number of the supporting members 223 becomes smaller.

Even in the scanning electron microscope SEMl of the twelfth modified example provided with such a stage 22l, it is possible to enjoy the same effects as those that can be enjoyed by the above-described scanning electron microscope SEM. In addition, in the twelfth modified example, the number of support members 223 per unit area in the central portion 22_center of the stage 22l is relatively increased, so that the heat dissipation of the sample W via the support members 223 is further promoted. As a result, thermal deformation of the sample W is suppressed.

Note that when the number of support members 223 per unit area is relatively large, there is a relative possibility that dust or the like may be trapped between the support member 223 and the sample W (as a result, the sample W may be deformed by dust or the like). Become bigger. However, as described above, when the stage space SPs is depressurized by the vacuum pump 54, the sample W is more strongly applied to the support member 223 than when the stage space SPs is depressurized by the vacuum pump 53. Pressed. For this reason, there is a relatively high possibility that dust or the like sandwiched between the support member 223 and the sample W will be crushed by the force with which the sample W is pressed against the support member 223. That is, the possibility that the sample W is deformed by dust or the like becomes relatively small. Therefore, the scanning electron microscope SEMl can further suppress the thermal deformation of the sample W by further promoting the heat dissipation of the sample W through the support member 223 without causing the deformation of the sample W due to dust or the like.

In particular, compared with the pressure in the space portion in the outer edge portion 22_edge of the stage 22l in the stage space SPs, the pressure in the space portion in the center portion 22_center of the stage 22l in the stage space SPs is less likely to decrease. This is because the pressure drop in the stage space SPs is caused by the gas flowing into the stage space SPs through the gap between the side wall member 222 located near the outer edge portion 22_edge of the stage 22l and the sample W. This is because such a decrease in pressure is more likely to occur in the outer edge portion 22_edge of the stage 22l than in the central portion 22_center of the stage 22l. Therefore, compared with the scanning electron microscope of the comparative example in which the number of the support members 223 is relatively increased without distinguishing the outer edge portion 22_edge and the central portion 22_center, a specific region (that is, the central portion 22_center of the stage 22l (that is, The scanning electron microscope SEMl of the twelfth modified example in which the number of support members 223 per unit area is relatively large in the region where the pressure of the stage space SPs is unlikely to decrease) causes deformation of the sample W due to dust or the like. Without excessively increasing the possibility, heat dissipation of the sample W through the support member 223 can be further promoted to suppress thermal deformation of the sample W. The arrangement mode of the support member 223 shown in the twelfth modification may be applied to the above-described embodiment and other modifications.

(3-13) Thirteenth Modification Next, a scanning electron microscope SEMm of the thirteenth modification will be described. The scanning electron microscope SEMm of the thirteenth modified example is different from the above-described scanning electron microscope SEM in that a stage 22m is provided instead of the stage 22. Other structures of the scanning electron microscope SEMm may be the same as the other structures of the scanning electron microscope SEM described above. Therefore, hereinafter, the structure of the stage 22m will be described with reference to FIGS. 22 (a) and 22 (b).

As shown in FIGS. 22A and 22B, the stage 22m is different from the stage 22 described above in the size (ie, substantially the area) of the upper surface 223Su of the plurality of support members 223. It is different in that. Specifically, in the stage 22m, the size of the upper surface 223Su of the support member 223 at the outer edge portion 22_edge of the stage 22m is larger than the size of the upper surface 223Su of the support member 223 at the center portion 22_center of the stage 22l as compared with the stage 22 described above. It is different in that it is smaller. The other structure of the stage 22m may be the same as the other structure of the stage 22 described above. Note that the outer edge portion 22_edge and the center portion 22_center in the thirteenth modification are the same as the outer edge portion 22_edge and the center portion 22_center in the twelfth modification.

Even in the scanning electron microscope SEMm of the thirteenth modified example provided with such a stage 22m, the same effects as those that can be enjoyed by the above-described scanning electron microscope SEM can be obtained. In addition, in the thirteenth modification, the size of the upper surface 223Su of the support member 223 at the center portion 22_center of the stage 22m is relatively large, so that the contact area between the support member 223 and the sample W at the center portion 22_center of the stage 22m is increased. It becomes relatively large. That is, the contact area between the support member 223 and the sample W at the center portion 22_center of the stage 22m is relatively larger than the contact area between the support member 223 and the sample W at the outer edge portion 22_edge of the stage 22m. For this reason, the heat dissipation of the sample W through the support member 223 is further promoted. As a result, thermal deformation of the sample W is suppressed.

In addition, when the size of the upper surface 223Su of the support member 223 is relatively large as in the case where the number of the support members 223 per unit area is relatively large, the space between the support member 223 and the sample W is also large. There is a relatively high possibility that dust or the like is caught (as a result, the sample W is deformed by dust or the like). However, for the same reason as the scanning electron microscope SEMl of the twelfth modification, the scanning electron microscope SEMm of the thirteenth modification also causes the sample through the support member 223 without causing deformation of the sample W due to dust or the like. The heat dissipation of W can be further promoted to suppress thermal deformation of the sample W. Note that the arrangement of the support member 223 shown in the thirteenth modification may be applied to the above-described embodiment and other modifications.

(3-14) Fourteenth Modification Next, a scanning electron microscope SEMn according to a fourteenth modification will be described with reference to FIG. As shown in FIG. 23, the scanning electron microscope SEMn according to the fourteenth modified example is different from the above-described scanning electron microscope SEM in that it includes an optical microscope 16n. The other structure of the scanning electron microscope SEMn may be the same as the other structure of the scanning electron microscope SEM described above.

The optical microscope 16n is a device that can optically measure the state of the sample W (for example, the state of at least a part of the surface WSu of the sample W). That is, the optical microscope 16n is an apparatus that can optically measure the state of the sample W and acquire information about the sample W. In particular, the optical microscope 16n is capable of measuring the state of the sample W under an atmospheric pressure environment, and is therefore a beam irradiation apparatus 1 (particularly, the electron detector 116) that measures the state of the sample W under a vacuum environment. Different.

The optical microscope 16n measures the state of the sample W before the beam irradiation apparatus 1 irradiates the sample W with the electron beam EB and measures the state of the sample W. That is, the scanning electron microscope SEMn measures the state of the sample W using the beam irradiation apparatus 1 after measuring the state of the sample W using the optical microscope 16n. Here, since the optical microscope 16n can measure the state of the sample W under the atmospheric pressure environment, the beam irradiation apparatus 1 sets the vacuum region VSP during the period when the optical microscope 16n is measuring the state of the sample W. It does not have to be formed. As a result, while the optical microscope 16n is measuring the state of the sample W, the sample W is not deformed due to the formation of the vacuum region VSP. Therefore, the stage space SPs may be decompressed by the vacuum pump 53 during the period in which the optical microscope 16 n is measuring the state of the sample W. That is, the pressure in the stage space SPs is lower than the atmospheric pressure so that the stage 22 can hold the sample W, but it does not have to be so low that the deformation of the sample W can be suppressed. . On the other hand, the beam irradiation apparatus 1 forms the vacuum region VSP and irradiates the sample W with the electron beam EB after the optical microscope 16n completes the measurement of the state of the sample W. For this reason, during the period when the beam irradiation apparatus 1 measures the state of the sample W, the sample W may be deformed due to the formation of the vacuum region VSP. Accordingly, the stage space SPs is decompressed by the vacuum pump 54 while the beam irradiation apparatus 1 is measuring the state of the sample W. That is, the optical microscope 16n measures the state of the sample W so that the pressure of the stage space SPs during the period when the beam irradiation apparatus 1 is measuring the state of the sample W can suppress the deformation of the sample W. It becomes lower than the pressure of the stage space SPs during the period.

The stage 22 may move so that the sample W is positioned at a position where the beam irradiation device 1 can irradiate the electron beam EB during the period in which the beam irradiation device 1 irradiates the sample W with the electron beam EB. During the period in which the optical microscope 16n measures the state of the sample W, the stage 22 may move so that the sample W is positioned at a position where the optical microscope 16n can measure the state of the sample W. The stage 22 may move between a position where the beam irradiation apparatus 1 can irradiate the electron beam EB and a position where the optical microscope 16n can measure.

The scanning electron microscope SEMn may measure the state of the sample W using the beam irradiation apparatus 1 based on the measurement result of the state of the sample W using the optical microscope 16n. For example, the scanning electron microscope SEMn may first measure the state of a desired region in the sample W using the optical microscope 16n. Thereafter, the scanning electron microscope SEMn uses the beam irradiation device 1 to determine the state of the same desired region of the sample W (or the desired region and the desired region) based on the measurement result of the state of the desired region of the sample W using the optical microscope 16n. May be measured in different regions). In this case, a predetermined indicator that can be used for measuring the state of the sample W using the beam irradiation apparatus 1 may be formed in a desired region of the sample W. As an example of the predetermined index object, for example, there is a mark (for example, at least one of a fiducial mark and an alignment mark) used for alignment between the sample W and the beam irradiation apparatus 1.

Alternatively, as described above, a fine uneven pattern is formed on the surface WSu of the sample W. For example, when the sample W is a semiconductor substrate, an example of a fine uneven pattern is a resist pattern that remains on a semiconductor substrate after the semiconductor substrate coated with a resist is exposed by an exposure device and developed by a developing device. It is done. In this case, for example, the scanning electron microscope SEMn may first measure the state of the concavo-convex pattern formed in a desired region of the sample W using the optical microscope 16n. Thereafter, the scanning electron microscope SEMn uses the beam microscope 1 based on the measurement result of the state of the desired region of the sample W using the optical microscope 16n (that is, the measurement result of the state of the uneven pattern formed in the desired region). May be used to measure the state of the concavo-convex pattern formed in the same desired region of the sample W. For example, the scanning electron microscope SEMn controls the characteristics of the electron beam EB based on the measurement result of the optical microscope 16n so that the electron beam EB optimal for measurement of the uneven pattern is irradiated, and then the beam irradiation apparatus 1 May be used to measure the state of the concavo-convex pattern formed in the same desired region of the sample W.

Even with the scanning electron microscope SEMn according to the fourteenth modified example, it is possible to receive the same effects as the effects that the above-described scanning electron microscope SEM can enjoy. In addition, the scanning electron microscope SEMn of the fourteenth modified example more appropriately measures the state of the sample W using the electron beam EB than the scanning electron microscope of the comparative example that does not include the optical microscope 16n. be able to.

In the above description, the scanning electron microscope SEMn measures the state of the sample W using the beam irradiation apparatus 1 after measuring the state of the sample W using the optical microscope 16n. However, the scanning electron microscope SEMn may perform the measurement of the state of the sample W using the optical microscope 16n and the measurement of the state of the sample W using the beam irradiation apparatus 1 in parallel. For example, the scanning electron microscope SEMn may simultaneously measure the state of the desired region of the sample W using the optical microscope 16n and the beam irradiation apparatus 1. In this case, since the electron beam EB is irradiated to the desired region of the sample W through the vacuum region VSP, the stage space SPs is decompressed by the vacuum pump 54. Alternatively, the scanning electron microscope SEMn measures the state of the first region of the sample W using the optical microscope 16n and the second region of the sample W using the beam irradiation apparatus 1 (however, the second region is the first region). Measurement of the state of (different from) may be performed in parallel. In this case, since the electron beam EB is irradiated to the desired region of the sample W through the vacuum region VSP, the stage space SPs is decompressed by the vacuum pump 54. Alternatively, when the stage space SPs is divided into a plurality of divided spaces SPsg (see the stage 22g of the seventh modification shown in FIGS. 15A and 15B), the optical microscope 16n measures the state. The divided space SPsg corresponding to the first region of the sample W being reduced is decompressed to a relatively low degree of vacuum by the vacuum pump 53, while the second of the sample W whose state is being measured by the beam irradiation apparatus 1 The divided space SPsg corresponding to the region may be decompressed by the vacuum pump 54 to a relatively high degree of vacuum.

Further, the scanning electron microscope SEMn may include an arbitrary measuring device capable of measuring the state of the sample W under an atmospheric pressure environment in addition to or instead of the optical microscope 16n. An example of an arbitrary measurement device is a diffraction interferometer. The diffraction interferometer, for example, splits light source light to generate measurement light and reference light, and irradiates the measurement light to the sample W to generate reflected light (or transmitted light or scattered light) and reference light. Is a measurement device that detects an interference pattern generated by interference and measures the state of the sample W. In addition, a scatterometer is mentioned as another example of arbitrary measuring devices. The scatterometer is a measuring device that irradiates the sample W with measurement light, receives scattered light (diffracted light or the like) from the sample W, and measures the state of the sample W.

(3-15) Fifteenth Modification Next, a scanning electron microscope SEMo of the fifteenth modification will be described. The scanning electron microscope SEMo of the fifteenth modification differs from the scanning electron microscope SEMa of the first modification described above in that a stage 22o is provided instead of the stage 22a. The other structure of the scanning electron microscope SEMo may be the same as the other structure of the scanning electron microscope SEMa described above. Therefore, the structure of the stage 22o will be described below with reference to FIG.

As shown in FIG. 24, the stage 22o differs from the stage 22a described above in that a side wall member 222o is provided instead of the side wall member 222a. Similar to the side wall member 222a, the side wall member 222o is the same in that the upper surface 222Su of the side wall member 222o is located below the upper surface 223Su of the support member 223. On the other hand, as compared with the side wall member 222a, the side wall member 222o is located on the outer side (that is, the side away from the center of the stage 22o) of the outer side surface (that is, the outer peripheral end) 222So of the side wall member 222o. That is, the difference is that the outer peripheral edge (WSo) is located. That is, the size of the side wall member 222o (that is, the size of the stage 22o) is set so that the outer side surface WSo of the sample W is positioned outside the outer side surface 2w22So of the side wall member 222o. As a result, as shown in FIG. 24, the sample W is held by the stage 22o so that the sample W overhangs with respect to the side wall member 222o (that is, overhangs with respect to the stage 22o). The sample W is held by the stage 22o so that the sample W projects over the side wall member 222o. The other structure of the stage 22o may be the same as the other structure of the stage 22a described above.

Even in the scanning electron microscope SEMo of the fifteenth modified example provided with such a stage 22o, the same effect as that which can be enjoyed by the scanning electron microscope SEMa of the first modified example described above is obtained. Can do. In addition, in the fifteenth modification, since the sample W is allowed to overhang with respect to the side wall member 222o, the stage 22o can hold the sample W having an outer shape larger than the outer shape of the stage 22o. . That is, restrictions on the size of the sample W that can be held by the stage 22o are relaxed.

(3-16) Sixteenth Modification Next, a scanning electron microscope SEMp of the sixteenth modification will be described. The scanning electron microscope SEMp of the sixteenth modification differs from the scanning electron microscope SEMo of the fifteenth modification in that a stage 22p is provided instead of the stage 22o. The other structure of the scanning electron microscope SEMp may be the same as the other structure of the scanning electron microscope SEMo described above. Therefore, hereinafter, the structure of the stage 22p will be described with reference to FIG.

As shown in FIG. 25, the stage 22p is different from the above-described stage 22o in that a bottom member 221p is provided instead of the bottom member 221. Furthermore, the stage 22p is different from the above-described stage 22o in that it includes a guard member 224p. Furthermore, the stage 22p is different from the stage 22o described above in that an exhaust port 2243p is formed on the upper surface 222Su of the side wall member 222o. The other structure of the stage 22p may be the same as the other structure of the stage 22o described above.

The bottom member 221p is different from the above-described bottom member 221 in that it extends to the outside of the side wall member 222o. The other structure of the bottom member 221p may be the same as the other structure of the bottom member 221 described above.

The guard member 224p is formed in a region outside the side wall member 222o on the upper surface 221Su of the bottom member 221p. The guard member 224p is formed outside the sample W held on the stage 22p. The upper surface 224Su of the guard member 224p is positioned at the same height as the surface WSu of the sample W held on the stage 22p. That is, the upper surface 224Su of the guard member 224p is positioned on the same plane as the surface WSu of the sample W held on the stage 22p. A part of the side surface (for example, the inner surface) of the guard member 224p faces the side surface (for example, the outer surface) of the sample W. At this time, the side surface of the guard member 224p does not contact the side surface of the sample W. That is, a gap is secured between the side surface of the guard member 224p and the side surface of the sample W. The other structure of the guard member 224p may be the same as the other structure of the guard member 224c of the third modification described above.

The exhaust port 2243p is formed in a portion of the upper surface 222Su of the side wall member 222o that faces the rear surface WSl of the sample W. At this time, the exhaust port 2243p may be formed on the outermost periphery of the portion of the upper surface 222Su of the side wall member 222o that faces the back surface WSl of the sample W. The exhaust ports 2243p may be formed in an annular distribution pattern so as to be continuously distributed on the upper surface 222Su of the side wall member 222o. A plurality of exhaust ports 2243p may be formed so as to be arranged in a regular (or random) arrangement pattern on the upper surface 222Su of the side wall member 222o. However, the exhaust port 2243p may be formed in an arbitrary arrangement pattern or distribution pattern. A vacuum pump 54 is connected to the exhaust port 2243p via a pipe 2253p. The vacuum pump 54 can evacuate the outer edge space SPg1 between the sample W and the upper surface 222Su of the side wall member 222o. That is, in the sixteenth modified example, as in the second modified example, the outer edge space SPg1 is reduced in pressure by the vacuum pump 54 indirectly through the stage space SPs, or instead of the stage space SPs. The pressure is reduced directly without intervention. The other structure of the exhaust port 2243p may be the same as the other structure of the exhaust port 2243b formed in the side wall member 222a in the second modification described above.

Even in the scanning electron microscope SEMp according to the sixteenth modified example having such a stage 22p, the same effects as those that can be enjoyed by the scanning electron microscope SEMo according to the fifteenth modified example are obtained. Can do. Further, since the scanning electron microscope SEMp of the sixteenth modified example includes the guard member 224p, the vacuum region VSP is formed in the outer edge portion W_edge of the sample W in the same manner as the scanning electron microscope SEMc of the third modified example described above. It can be formed appropriately. Further, in the sixteenth modified example, the exhaust port 2243p is formed on the upper surface 222Su of the side wall member 222o, so that the deformation of the sample W (particularly, the deformation of the outer edge portion W_edge of the sample W) is appropriate as in the second modified example. To be suppressed.

Note that the upper surface 224Su of the guard member 224p does not have to be positioned at the same height as the surface WSu of the sample W held on the stage 22p. For example, the upper surface 224Su of the guard member 224p may be positioned above the surface WSu of the sample W held on the stage 22p. The upper surface 224Su of the guard member 224p may be positioned below the surface WSu of the sample W held on the stage 22p. The side surface of the guard member 224p and the side surface of the sample W may be in contact with each other. The guard member 224p may be integrated with the bottom member 221p. Alternatively, the guard member 224p may not be integrated with the bottom member 221p. For example, the guard member 224p may be a member that can be detached from the bottom member 221p. The exhaust port 2243p may be formed in a member other than the side wall member 222o. The exhaust port 2243p may be formed in a member facing the outer edge space SPg1.

(3-17) Following seventeenth modified example will be described scanning electron microscope SEMq seventeenth modification. The scanning electron microscope SEMq of the seventeenth modified example is different from the above-described scanning electron microscope SEMq of the ninth modified example in that a stage 22q is provided instead of the stage 22i. The other structure of the scanning electron microscope SEMq may be the same as the other structure of the scanning electron microscope SEMi described above. Therefore, hereinafter, the structure of the stage 22q will be described with reference to FIG.

As shown in FIG. 26, the stage 22q includes a plurality of electrostatic chucks 225i in the same manner as the stage 22i. On the other hand, the stage 22q is different from the stage 22i in that a plurality of electrostatic chucks 225i (particularly, electrodes constituting the electrostatic chuck 225i) are arranged in the stage space SPs. Furthermore, the stage 22q is different from the stage 22i in that an exhaust port 2246q is formed in the bottom member 221 and a pipe 2256q is connected to the exhaust port 2246q. The other structure of the stage 22q may be the same as the other structure of the stage 22i.

In the seventeenth modified example, as in the ninth modified example, at least one electrostatic chuck 225i corresponding to the specific portion W_vac where the vacuum region VSP is formed among the plurality of electrostatic chucks 225i is deformed of the sample W. In order to generate a relatively large electrostatic force F_elec_L for suppressing the above, at least one electrostatic chuck 225i that does not correspond to the specific portion W_vac among the plurality of electrostatic chucks 225i holds the sample W. Of relatively small electrostatic force F_elec_S. As a result, the scanning electron microscope SEMq of the seventeenth modification can enjoy the same effects as those that can be enjoyed by the scanning electron microscope SEMi of the ninth modification.

Particularly in the seventeenth modification, during the period in which the vacuum region VSP is formed, at least one of the vacuum pumps 53 and 54 (or another vacuum pump included in the pump system 5) is connected via the exhaust port 2246q and the pipe 2256q. The stage space SPs is evacuated and decompressed. That is, the stage space SPs is a vacuum space whose pressure is lower than the atmospheric pressure. Therefore, the plurality of electrostatic chucks 225i are arranged in the stage space SPs that is a vacuum space. As a result, it is possible to prevent unintended discharge of the plurality of electrostatic chucks 225i as compared to the case where the plurality of electrostatic chucks 225i are arranged in an atmospheric pressure environment.

In the above-described sixth modification, the stage 22f includes a single electrostatic chuck 225f instead of the plurality of electrostatic chucks 225i. However, in this case as well, the stage where the electrostatic chuck 225f is a vacuum space. It may be arranged in the space SPs. As a result, unintended discharge of the electrostatic chuck 225f can be prevented. Also in the eleventh modification described above, since the electrostatic chuck 225k is disposed in the stage section SPs decompressed by the vacuum pump 53, unintentional discharge of the electrostatic chuck 225f can be prevented.

The plurality of electrostatic chucks 225i may be arranged in a vacuum space different from the stage space SPs. For example, the plurality of electrostatic chucks 225i may be arranged in a space that is secured inside the stage 22q separately from the stage space SPs and can be depressurized (that is, can be made a vacuum space) by a vacuum pump. .

Further, the plurality of electrostatic chucks 225i may be provided so as to be in contact with the lower surface WSl of the sample W. In addition, the plurality of electrostatic chucks 225i may be provided at portions of the support member 223 of the stage 22q that are in contact with the lower surface WSl of the sample W, respectively.

(3-18) Eighteenth Modification Subsequently, a scanning electron microscope SEMr of the eighteenth modification will be described. The scanning electron microscope SEMr of the eighteenth modified example is different from the above-described scanning electron microscope SEMq of the seventeenth modified example in that a stage 22r is provided instead of the stage 22q. Furthermore, the scanning electron microscope SEMr of the eighteenth modification is different from the above-described scanning electron microscope SEMq of the seventeenth modification in that a gas supply device 55r is provided. The other structure of the scanning electron microscope SEMr may be the same as the other structure of the scanning electron microscope SEMq described above. Therefore, the structure of the stage 22r will be described below with reference to FIG.

As shown in FIG. 27, the stage 22r includes a plurality of electrostatic chucks 225i arranged in the stage space SPs, like the stage 22q. On the other hand, the stage 22r is different from the stage 22q in that an air supply port 2247r is formed in the bottom member 221 and a pipe 2257r is connected to the air supply port 2247r. Other structures of the stage 22r may be the same as other structures of the stage 22i.

In the eighteenth modification, a gas supply device 55r is connected to the air supply port 2247r through a pipe 2257r. The gas supply device 55r can supply gas to the stage space SPs via the air supply port 2247r and the pipe 2257r. The gas is air whose humidity is lower than the predetermined humidity. The predetermined humidity is humidity that can prevent unintended discharge of the plurality of electrostatic chucks 225i. That is, the predetermined humidity is a humidity that can prevent discharge from the electrode when a voltage is applied to the electrode constituting the electrostatic chuck 2225i. An example of such a gas is CDA (Clean Dry Air). Alternatively, the gas may be a gas other than air (for example, an inert gas) whose humidity is lower than the predetermined humidity. An example of the inert gas is at least one of nitrogen gas and argon gas.

As a result, the stage space SPs is a space having a low humidity enough to prevent unintended discharge of the plurality of electrostatic chucks 225i. For this reason, the plurality of electrostatic chucks 225i are arranged in the stage space SPs, which is a space where the humidity is low enough to prevent unintended discharge of the plurality of electrostatic chucks 225i. As a result, a plurality of electrostatic chucks 225i are arranged in an atmospheric pressure environment (particularly, a space where the humidity is not low enough to prevent unintended discharge of the plurality of electrostatic chucks 225i). In comparison, unintentional discharge of the plurality of electrostatic chucks 225i can be prevented.

In the above-described sixth modification, the stage 22f includes a single electrostatic chuck 225f instead of the plurality of electrostatic chucks 225i. However, in this case, the electrostatic chuck 225f also includes a plurality of electrostatic chucks 225f. The chuck 225i may be disposed in the stage space SPs, which is a space having a low humidity to the extent that unintentional discharge can be prevented. As a result, unintended discharge of the electrostatic chuck 225f can be prevented.

The plurality of electrostatic chucks 225f may be arranged in a space where the humidity is low enough to prevent unintentional discharge of the plurality of electrostatic chucks 225i, unlike the stage space SPs. For example, the plurality of electrostatic chucks 225f are secured in the stage 22r separately from the stage space SPs and are disposed in a space where the humidity is low enough to prevent unintended discharge of the plurality of electrostatic chucks 225i. May be.

In the eighteenth modified example, the plurality of electrostatic chucks 225i may be provided so as to be in contact with the lower surface WSl of the sample W. In addition, the plurality of electrostatic chucks 225i may be provided at portions of the support member 223 of the stage 22r that are in contact with the lower surface WSl of the sample W.

(3-19) Nineteenth Modification Next, a scanning electron microscope SEMs according to a nineteenth modification will be described with reference to FIG. FIG. 28 is a cross-sectional view showing the structure of a scanning electron microscope SEMs of the nineteenth modification.

As shown in FIG. 28, the scanning electron microscope SEMs of the nineteenth modified example is different from the above-described scanning electron microscope SEM in that it includes a chamber 181s and an air conditioner 182s. The other structure of the scanning electron microscope SEMs may be the same as the other structure of the scanning electron microscope SEM described above.

The chamber 181s accommodates at least the beam irradiation device 1, the stage device 2, and the support frame 3. However, the chamber 181s may not accommodate at least a part of the beam irradiation device 1, the stage device 2, and the support frame 3. The chamber 181s may accommodate other constituent elements (for example, at least a part of the position measurement device 15, the control device 4, and the pump system 5) included in the scanning electron microscope SEMs.

The space outside the chamber 181s is, for example, an atmospheric pressure space. The space inside the chamber 181s (that is, the space that accommodates at least the beam irradiation device 1, the stage device 2, and the support frame 3) is also an atmospheric pressure space, for example. In this case, at least the beam irradiation device 1, the stage device 2, and the support frame 3 are disposed in the atmospheric pressure space. However, as described above, the beam irradiation apparatus 1 forms a local vacuum region VSP in the atmospheric pressure space inside the chamber 181s.

The air conditioner 182s can supply gas (for example, at least one of the above-described inert gas and clean dry air) to the space inside the chamber 181s. The air conditioner 182s can recover the gas from the space inside the chamber 181s. The air conditioner 182s collects gas from the space inside the chamber 181s, so that the cleanliness of the space inside the chamber 181s is kept good. At this time, the air conditioner 182s can control at least one of the temperature and the humidity of the space inside the chamber 181s by controlling at least one of the temperature and the humidity of the gas supplied to the space inside the chamber 181s.

Such a scanning electron microscope SEMs of the nineteenth modified example can enjoy the same effects as the effects that the scanning electron microscope SEM can enjoy.

In the description of the scanning electron microscope SEMs described above, the scanning electron microscope SEM is provided with a chamber 181m and an air conditioner 182m. However, each of the scanning electron microscope SEMr of the first modification to the scanning electron microscope SEMr of the eighteenth modification may include the chamber 181s and the air conditioner 182s.

(3-20) Twentieth Modification In the above description, the sample W has such a large size that the vacuum region VSP can cover only a part of the surface WSu of the sample W. On the other hand, in the twentieth modified example, as shown in FIG. 29 which is a cross-sectional view showing the stage 22 holding the sample W in the twentieth modified example, the sample W has a vacuum region VSP of the surface WSu of the sample W. You may have a size small enough to cover the whole. Alternatively, the sample W may have such a small size that the beam passing space SPb3 included in the vacuum region VSP can cover the entire surface WSu of the sample W. In this case, as shown in FIG. 29, the vacuum region VSP formed by the differential pumping system 12 covers the surface WSu of the sample W and / or faces (ie, contacts) the surface WSu of the sample W. , May cover at least part of the surface of the stage 22 (for example, the outer peripheral surface OS different from the holding surface HS that holds the sample W among the surfaces of the stage 22) and / or the surface of the stage 22 (for example, outer periphery) May face at least part of the surface OS). The outer peripheral surface OS typically includes a surface located around the holding surface HS. FIG. 29 shows an example in which the scanning electron microscope SEM irradiates the electron beam EB to the sample W having a small size described in the twentieth modification for convenience of explanation. It goes without saying that each of the scanning electron microscope SEMs from the scanning electron microscope SEMa to the nineteenth modified example may also irradiate the sample W having a small size described in the twentieth modified example with the electron beam EB. Absent.

In the twentieth modification, the scanning electron microscope SEM is configured such that the interval D between the emission surface 121LS of the beam emission apparatus 1 and the surface WSu of the sample W becomes the desired interval D_target, and the emission surface 121LS and the stage 22 are used. At least one of the interval adjustment system 14 and the stage drive system 23 may be controlled so that the interval Do1 between the surface and the surface (for example, the outer peripheral surface OS) becomes the desired interval D_target. The stage 22 may have a structure for performing the above-described deformation suppressing operation. 29, the structure of the stage 22 is simplified in FIG. 29, but the stage 22 may have a structure for performing the above-described deformation suppressing operation.

(3-21) 21st Modification In the 20th modification described above, the holding surface HS of the stage 22 and the outer peripheral surface OS of the stage 22 are located at the same height. On the other hand, in the twenty-first modification, as shown in FIG. 30, which is a cross-sectional view showing the stage 22 holding the sample W in the twenty-first modification, the holding surface HS and the outer peripheral surface OS have different heights (that is, , Different positions in the Z-axis direction). FIG. 30 shows an example in which the holding surface HS is positioned at a position lower than the outer peripheral surface OS, but the holding surface HS may be positioned at a position higher than the outer peripheral surface OS. When the holding surface HS is located at a position lower than the outer peripheral surface OS, the stage 22 is substantially a storage space in which the sample W is stored (that is, a space that is recessed so that the sample W can be stored). It can be said that is formed. FIG. 30 shows an example in which the outer peripheral surface OS is located at a position higher than the surface WSu of the sample W. However, the outer peripheral surface OS may be located at a position lower than the surface WSu. The OS may be located at the same height as the surface WSu. 30 shows an example in which the scanning electron microscope SEM irradiates the electron beam EB to the sample W held on the holding surface HS having a height different from that of the outer peripheral surface OS described in the twentieth modification for convenience of explanation. However, each of the scanning electron microscope SEMa of the first modification to the scanning electron microscope SEMs of the nineteenth modification also has a holding surface whose height is different from that of the outer peripheral surface OS described in the twenty-first modification. Needless to say, the sample W held in the HS may be irradiated with the electron beam EB.

In the twenty-first modification, similarly to the twentieth modification, the sample W may have a size small enough to allow the vacuum region VSP to cover the entire surface WSu of the sample W. In this case, as in the twentieth modification, the vacuum region VSP formed by the differential exhaust system 12 covers the surface WSu of the sample W and / or faces the surface WSu of the sample W, in addition to the stage 22 It may cover at least part of the surface (for example, outer peripheral surface OS) and / or face at least part of the surface (for example, outer peripheral surface OS) of the stage 22. Alternatively, the sample W may have such a large size that the vacuum region VSP can cover only a part of the surface WSu of the sample W. In this case, the vacuum region VSP formed by the differential exhaust system 12 covers a part of the surface WSu of the sample W and / or faces a part of the surface WSu of the sample W, while the surface of the stage 22 (for example, The outer peripheral surface OS) may not cover at least a portion and / or may not face at least a portion of the surface of the stage 22 (for example, the outer peripheral surface OS).

Also in the twenty-first modification, similarly to the twentieth modification, the scanning electron microscope SEM is configured such that the interval D between the emission surface 121LS and the surface WSu becomes the desired interval D_target, and the stage 121LS and the stage At least one of the interval adjustment system 14 and the stage drive system 23 may be controlled such that the interval Do1 between the surface 22 (for example, the outer peripheral surface OS) becomes the desired interval D_target. For simplification of the drawing, the structure of the stage 22 is simplified in FIG. 30, but the stage 22 may have a structure for performing the above-described deformation suppressing operation.

(3-22) Twenty-second Modification In the twenty-second modification, as shown in FIG. 31 which is a cross-sectional view showing the stage 22 holding the sample W in the twenty-second modification, the sample W is It may be covered. That is, the sample W may be irradiated with the electron beam EB in a state where the cover member 25 is disposed between the sample W and the beam irradiation apparatus 1 (particularly, the emission surface 121LS). At this time, a through hole may be formed in the cover member 25, and the sample W may be irradiated with the electron beam EB through the through hole of the cover member 25. The cover member 25 may be disposed above the sample W so as to be in contact with the surface WSu of the sample W or to ensure a gap with the surface WSu. In this case, the differential exhaust system 12 may form a vacuum region VSP that covers at least a part of the surface 25s of the cover member 25 instead of the vacuum region VSP that covers at least a part of the surface WSu of the sample W. The differential exhaust system 12 may form a vacuum region VSP in contact with the surface 25s of the cover member 25 instead of the vacuum region VSP in contact with the surface WSu of the sample W. FIG. 31 shows an example in which the scanning electron microscope SEM irradiates the electron beam EB to the sample W covered with the cover member 25 described in the twenty-second modification for convenience of explanation. Each of the scanning electron microscope SEMs from the scanning electron microscope SEMa to the nineteenth modified example may also irradiate the sample W covered with the cover member 25 described in the twenty-second modified example with the electron beam EB. Needless to say.

The surface 25s of the cover member 25 may be located at the same height as the outer peripheral surface OS of the stage 22. The surface 25s of the cover member 25 may be located above the outer peripheral surface OS of the stage 22. The surface 25s of the cover member 25 may be positioned below the outer peripheral surface OS of the stage 22.

In the twenty-second modification, the sample W may have a size small enough to allow the vacuum region VSP to cover the entire surface WSu of the sample W, or the vacuum region VSP may be included in the surface WSu of the sample W. It may have a size large enough to cover only a part of the.

In the twenty-second modified example, the scanning electron microscope SEM includes a gap between the emission surface 121LS and the surface 25s of the cover member 25, instead of the interval D between the emission surface 121LS and the surface WSu being the desired interval D_target. You may control at least one of the space | interval adjustment system 14 and the stage drive system 23 so that the space | interval Do2 may become the desired space | interval D_target. For simplification of the drawing, the structure of the stage 22 is simplified in FIG. 31, but the stage 22 may have a structure for performing the above-described deformation suppressing operation.

(3-23) Other Modifications In the above description, the differential exhaust system 12 is a single-stage differential exhaust system including a single exhaust mechanism (specifically, the exhaust groove 124 and the pipe 125). is there. However, the differential exhaust system 12 may be a multistage differential exhaust system including a plurality of exhaust mechanisms. In this case, a plurality of exhaust grooves 124 are formed on the emission surface 121 LS of the vacuum forming member 121, and a plurality of pipes 125 respectively communicating with the plurality of exhaust grooves 124 are formed on the vacuum forming member 121. The plurality of pipes 125 are respectively connected to the plurality of vacuum pumps 52 included in the pump system 5. The exhaust capabilities of the plurality of vacuum pumps 52 may be the same or different.

In the above description, the pump system 5 includes a plurality of vacuum pumps, but the pump system 5 may be configured to include a single vacuum pump.

In the above description, since the beam irradiation position by the beam irradiation system 1 is set to an arbitrary position on the sample W, the stage 22 holding the sample W is movable at least in the XY plane. 1 may be configured to be movable in the XY plane.

Not only the scanning electron microscope SEM but also any electron beam apparatus that irradiates the sample W (or any other object) with the electron beam EB has the same structure as the above-described scanning electron microscope SEM. Also good. That is, any electron beam apparatus may include the stage 22 described above. As an example of an arbitrary electron beam apparatus, an electron beam exposure apparatus that forms a pattern on a wafer by exposing a wafer coated with an electron beam resist using the electron beam EB, and the base material is irradiated with the electron beam EB. And at least one of electron beam welding apparatuses for welding the base material with the heat generated by the above.

Alternatively, not limited to the electron beam apparatus, any beam apparatus that irradiates an arbitrary sample W (or other arbitrary object) with an arbitrary charged particle beam or energy beam (for example, an ion beam) different from the electron beam EB. May have the same structure as the scanning electron microscope SEM described above. That is, an arbitrary beam apparatus including a beam optical system that can irradiate a charged particle beam or an energy beam may include the stage 22 described above. As an example of an arbitrary beam device, a focused ion beam (FIB) device that performs processing and observation by irradiating a focused ion beam to a sample, and a soft X-ray region (for example, a wavelength region of 5 to 15 nm) Examples include at least one of EUV exposure apparatuses that form a pattern on a wafer by exposing a wafer coated with a resist using EUV (Extreme Ultraviolet) light. Alternatively, the scanning electron described above is not limited to the beam apparatus, but any irradiation apparatus that irradiates an arbitrary sample W (or other arbitrary object) with an arbitrary charged particle including electrons in an irradiation form different from that of the beam. It may have the same structure as the microscope SEM. That is, any irradiation apparatus including an irradiation system that can irradiate (for example, emit, generate, eject) charged particles may include the stage 22 described above. As an example of an arbitrary irradiation apparatus, an etching apparatus that etches an object using plasma, and a film formation apparatus that performs film formation processing on an object using plasma (for example, a PVD (Physical Vapor Deposition) apparatus such as a sputtering apparatus, And at least one of CVD (Chemical Vapor Deposition) equipment.

Alternatively, not only charged particles, but also any vacuum apparatus that causes an arbitrary substance to act on a sample W (or other arbitrary object) in a form different from that of irradiation under vacuum is the same as the scanning electron microscope SEM described above. It may have the structure. As an example of an arbitrary vacuum apparatus, there is a vacuum vapor deposition apparatus that forms a film by allowing vapor of a material evaporated or sublimated in a vacuum to reach a sample and accumulate it.

(4) Supplementary Notes The following supplementary notes are further disclosed with respect to the embodiment described above.
[Appendix 1]
A vacuum forming member capable of locally forming a vacuum region covering a part of the surface of the object in a first space on the object, an irradiation device for irradiating the object with a charged particle beam through the vacuum region, and A relative position changing device for changing a relative position between the object and the vacuum forming member to change a relative position between the object and the vacuum region; and a side of the object opposite to the surface irradiated with the charged particle beam A partition member that divides a second space facing the other surface of the object located at a plurality of sections, and the vacuum region whose relative position is changed with respect to the object among the plurality of sections and the object The pressure of a part of the compartment including the opposing region sandwiched therebetween is different from that of the other of the plurality of compartments, and the difference between the air pressure of the opposing region and the air pressure of the vacuum region is expressed by the atmospheric pressure and the vacuum. Pressure to reduce than the difference from the area pressure The charged particle apparatus and a settling device.
[Appendix 2]
The charged particle device according to appendix 1, wherein the atmospheric pressure adjusting device further includes a pipe capable of supplying air to the plurality of sections.
[Appendix 3]
A vacuum forming member capable of locally forming a vacuum region covering a part of the surface of the object in a first space on the object, an irradiation device for irradiating the object with a charged particle beam through the vacuum region, and A relative position changing device for changing a relative position between the object and the vacuum forming member to change a relative position between the object and the vacuum region; and a side of the object opposite to the surface irradiated with the charged particle beam A pressure adjusting device including an exhaust device that exhausts a part of the gas in the second space facing the other surface of the object located in the second space through an opening movable in the second space; The adjustment device positions the opening in a facing region that is opposed to the vacuum region, the relative position of which is changed with respect to the object, and a difference between a pressure in the facing region and a pressure in the vacuum region. Between the atmospheric pressure and the pressure in the vacuum region The charged particle device to reduce than.
[Appendix 4]
The vacuum forming member forms the vacuum region by exhausting the first space using a first exhaust device, and the atmospheric pressure adjusting device uses a second exhaust device different from the first exhaust device. The charged particle device according to any one of appendices 1 to 3, which exhausts the second space.
[Appendix 5]
The charged particle device according to appendix 4, wherein the second exhaust device includes at least one of a diffusion pump, a cryopump, a turbo molecular pump, and a sputter ion pump.
[Appendix 6]
The vacuum forming member forms the vacuum region by exhausting the first space using a first exhaust device, and the atmospheric pressure adjusting device exhausts the second space using the first exhaust device. The charged particle device according to any one of appendices 1 to 3.
[Appendix 7]
A vacuum forming member capable of locally forming a vacuum region covering a part of the surface of the object in a first space on the object, an irradiation device for irradiating the object with a charged particle beam through the vacuum region, and Surrounding the second space facing the other surface of the object opposite to the surface irradiated with the charged particle beam of the object together with the object, and between the second space and the outside of the second space And a pressure adjusting device capable of reducing the difference between the atmospheric pressure in the second space and the atmospheric pressure in the vacuum region from the difference between the atmospheric pressure and the atmospheric pressure in the vacuum region. Particle equipment.
[Appendix 8]
The partition wall part has an opening that communicates with an atmospheric pressure adjustment device that can reduce a difference between the atmospheric pressure in the second space and the atmospheric pressure in the vacuum region by a difference between the atmospheric pressure and the atmospheric pressure in the vacuum region. Charged particle device.
[Appendix 9]
The atmospheric pressure adjusting device calculates the difference between the atmospheric pressure in the second space and the atmospheric pressure in the vacuum region through the opening in at least part of a period in which the vacuum region is formed on the outer edge of the object. The charged particle device according to appendix 8, wherein the charged particle device is reduced by a difference from a pressure in the vacuum region.
[Appendix 10]
The charged particle device according to any one of appendices 7 to 9, wherein the partition wall portion can seal the second space together with the object.
[Appendix 11]
11. The charged particle device according to claim 1, further comprising a holding member that holds the object, wherein the holding member includes a plurality of pin-shaped members that support the other surface in the second space. .
[Appendix 12]
The number per unit area of the pin-shaped member in the portion of the holding member that holds the outer edge portion of the object is greater than the number per unit area of the pin-shaped member that holds the center of the object of the holding member. The charged particle apparatus according to Supplementary Note 11, which is few.
[Appendix 13]
The contact area of the pin-like member with the object at the portion of the holding member that holds the outer edge of the object is the contact area of the pin-like member with the object that holds the center of the object of the holding member. The charged particle apparatus according to

Supplementary Note

11 or 12, wherein
[Appendix 14]
The vacuum forming member forms a vacuum region having a degree of vacuum higher than a degree of vacuum in a region different from the space in a space between the irradiation device and an irradiation region on the object irradiated with the charged particle beam. The charged particle device according to any one of appendices 1 to 13.
[Appendix 15]
The charged particle device according to any one of appendices 1 to 14, wherein the vacuum region covers a part of a surface on the object.
[Appendix 16]
The charged particle device according to any one of appendices 1 to 15, wherein the vacuum region is in contact with a part of the surface on the object.
[Appendix 17]
17. When the vacuum region is formed, at least another part of the surface of the object is covered with a non-vacuum region or a region having a lower degree of vacuum than the vacuum region. Charged particle device.
[Appendix 18]
The charged particle device according to any one of appendices 1 to 17, wherein the vacuum forming member has a surface provided with an opening that is provided to face the surface of the object and communicates with an exhaust device.
[Appendix 19]
The charged particle device according to appendix 18, wherein the opening is a first opening and has a second opening around the first opening on the surface.
[Appendix 20]
The charged particle apparatus according to appendix 19, wherein the degree of vacuum in the space in the first opening is higher than the degree of vacuum in the second opening.
[Appendix 21]
The vacuum forming member forms a vacuum by evacuating the space in which a difference in atmospheric pressure between the space and the other space is maintained by an exhaust resistance of a gap between the object and the vacuum forming member. 21. The charged particle device according to any one of appendices 1 to 20, which is a differential evacuation type vacuum forming member.
[Appendix 22]
The charged particle device according to any one of appendices 1 to 21, further comprising an applying device that applies an applying force opposite to the attracting force to a portion of the object where the attracting force of the vacuum region acts.
[Appendix 23]
The charged particle device according to appendix 22, wherein the applying force is determined according to the attractive force.
[Appendix 24]
The application force is any one of

appendix

22 or 23, wherein the total of the suction force and the application force acting on the portion can be reduced as compared with the case where the application force is not applied. The charged particle device according to Item.
[Appendix 25]
The charged particle device according to any one of appendices 22 to 24, wherein the effect of the applied force can cancel the effect of the attractive force.
[Appendix 26]
The suction force includes a component that acts to displace at least a part of the object in a first direction from the object toward the irradiation device, and the application force is in a direction opposite to the first direction. 26. The charged particle device according to any one of appendices 22 to 25, including a component that acts to displace at least a part of the object in the second direction.
[Appendix 27]
The charging according to any one of appendices 22 to 26, wherein the applying force is capable of suppressing deformation of the object due to the suction force as compared to a case where the applying force is not applied. Particle equipment.
[Appendix 28]
In any one of appendices 22 to 27, the applying force can bring the surface of the object irradiated with the charged particle beam closer to a plane as compared to a case where the applying force is not applied. The charged particle device described.
[Appendix 29]
The charged particle device according to any one of appendices 22 to 28, wherein the applying device locally applies the applying force to a part of a surface of the object that is irradiated with the charged particle beam.
[Appendix 30]
The charged particle device according to any one of appendices 22 to 29, wherein the applying force is applied to a portion to be attracted to which the attraction force is applied in the object.
[Appendix 31]
The charged particle device according to any one of appendices 22 to 30, wherein the applying force is applied to a deformed portion of the object that deforms due to the suction force.
[Appendix 32]
The charged particle device according to any one of appendices 22 to 31, wherein the applying force is applied to a vacuum portion of the object that faces the vacuum region.
[Appendix 33]
The charged particle device according to any one of appendices 22 to 32, wherein the applying force is applied to an irradiated portion of the object where an irradiation region of the charged particle beam is set.
[Appendix 34]
34. The charged particle device according to any one of appendices 22 to 33, wherein a position where the applying device applies the applying force changes.
[Appendix 35]
The irradiation device changes a relative position between the object and an irradiation area of the charged particle beam in a direction along a surface of the object irradiated with the charged particle beam, irradiates the charged particle beam, and applies the application The charged particle device according to any one of appendices 22 to 34, wherein the device changes a position to which the applying force is applied in accordance with the relative position between the object and the irradiation region.
[Appendix 36]
The vacuum forming member changes a relative position between the object and the vacuum region in a direction along a surface irradiated with the charged particle beam of the object, and the applying device determines a position at which the applying force is applied. 36. The charged particle device according to any one of appendices 22 to 35, wherein the charged particle device is changed according to the relative position between the object and the vacuum region.
[Appendix 37]
The application device includes a plurality of application mechanisms capable of applying the application force to different positions, and the application device is at least one application mechanism to which the application force is to be applied among the plurality of application mechanisms. 37. The charged particle device according to any one of appendices 22 to 36, wherein the position to which the applying force is applied is changed by changing the selection.
[Appendix 38]
The apparatus further includes a position changing device that changes a relative position between the object and the applying device, and the applying device applies the applying force by changing the relative position between the object and the applying device by the position changing device. The charged particle device according to any one of appendices 22 to 37, wherein the position to be changed is changed.
[Appendix 39]
The charged particle device according to any one of appendices 22 to 38, wherein the applying device includes an electromagnetic force applying device that applies a force resulting from electromagnetic interaction as the applying force.
[Appendix 40]
40. The charged particle device according to any one of appendices 1 to 39, wherein the pressure in the vacuum region is 1 × 10 ⁻³ Pascal or less.
[Appendix 41]
41. The charged particle device according to any one of appendices 1 to 40, wherein a distance between the vacuum holy member and the object is 1 μm or more and 10 μm or less.
[Appendix 42]
42. A charged particle device according to any one of appendices 1 to 41, and a measurement device that measures the object under atmospheric pressure, wherein the charged particle device includes a beam from the object irradiated with the charged particle beam. A measurement system which is a charged particle beam measurement device for measuring the object based on a detection result of charged particles.
[Appendix 43]
43. The measurement system according to appendix 42, wherein at least a part of a region on the object measured by the measurement device is measured by the charged particle beam measurement device.
[Appendix 44]
44. The measurement system according to appendix 43, wherein a predetermined index object is formed in the region.
[Appendix 45]
45. The measurement system according to appendix 43 or 44, wherein a resist pattern is formed in the region.
[Appendix 46]
The measurement system according to any one of appendices 42 to 45, wherein the charged particle beam measurement apparatus acquires information related to a pattern formed inside the object.
[Appendix 47]
47. The measurement system according to any one of appendices 42 to 46, wherein measurement is performed by the charged particle beam measurement device after measurement by the measurement device.
[Appendix 48]
48. The measurement system according to any one of appendices 42 to 47, wherein the measurement by the measurement device and the measurement by the charged particle beam measurement device are performed in parallel.
[Appendix 49]
The measurement apparatus includes at least one of an optical microscope and a diffraction interferometer, and the diffraction interferometer is obtained by causing the diffracted light diffracted by irradiating the index object or the resist pattern on the object to interfere with each other. 49. The measurement system according to any one of appendices 42 to 48, wherein the object is measured by detecting interference light generated.
[Appendix 50]
When the measurement device measures the object, the atmospheric pressure adjustment device adjusts the atmospheric pressure of the second space to the first atmospheric pressure, and when the charged particle device measures the object, the atmospheric pressure adjustment device 50. The measurement system according to appendixes 42 to 49, wherein the atmospheric pressure in the two spaces is adjusted to a second atmospheric pressure different from the first atmospheric pressure.
[Appendix 51]
The measurement system according to appendix 50, wherein the second atmospheric pressure is lower than the first atmospheric pressure.
[Appendix 52]
The second space is divided into a plurality of compartments, and the atmospheric pressure adjusting device changes the atmospheric pressure of the plurality of compartments, thereby changing the atmospheric pressure on the back surface of the position where the charged particle device measures the object. 52. The measurement system according to claim 50 or 51, wherein the second atmospheric pressure is changed, and the back surface of the position where the measurement device measures the object is changed to the first atmospheric pressure.
[Appendix 53]
Forming a vacuum region locally covering a part of the surface of the object in a first space on the object; irradiating the object with a charged particle beam through the vacuum region; and A second space which is divided into a plurality of sections facing the other surface of the object located on the opposite side of the surface irradiated with the charged particle beam of the object, and changing the relative position to the region In the vacuum area, the relative position with respect to the object is changed in the second space by making the pressure of some of the plurality of sections different from the other sections of the plurality of sections. And a method of irradiating a charged particle beam including reducing a difference between an air pressure in a region facing the object and an air pressure in the vacuum region.
[Appendix 54]
Forming a vacuum region locally covering a part of the surface of the object in a first space on the object; irradiating the object with a charged particle beam through the vacuum region; and Changing the relative position with respect to the region, and changing the pressure of a part of the second space facing the other surface of the object located on the opposite side of the surface irradiated with the charged particle beam of the object By changing the relative position of the member having the opening communicating with the exhaust device that can be reduced from the atmospheric pressure of the other part of the two spaces with respect to the object, the relative position with respect to the object is changed in the second space A method of irradiating a charged particle beam, comprising: reducing a difference between an air pressure in a region facing the vacuum region and the object sandwiched between the air pressure in the vacuum region and the air pressure in the vacuum region.
[Appendix 55]
Forming a vacuum region locally covering a part of the surface of the object in a first space on the object; irradiating the object with a charged particle beam through the vacuum region; and A second space facing the other surface of the object located on a side opposite to the surface irradiated with the charged particle beam of the object is changed between the object and the partition wall. A charged particle beam comprising: enclosing and forming a pressure difference between the second space and the outside of the second space; and reducing a difference between the pressure in the second space and the pressure in the vacuum region Irradiation method.

At least a part of the constituent elements of each of the above-described embodiments (including each modification, the same applies in this paragraph below) can be appropriately combined with at least another part of the constituent elements of each of the above-described embodiments. Some of the configuration requirements of the above-described embodiments may not be used. In addition, as long as permitted by law, the disclosures of all published publications and US patents cited in the above-described embodiments are incorporated as part of the description of the text.

The present invention is not limited to the above-described embodiment, and can be appropriately changed without departing from the gist or concept of the invention that can be read from the claims and the entire specification. The measurement system and the charged particle beam irradiation method are also included in the technical scope of the present invention.

SEM Scanning electron microscope 1 Beam irradiation device 11 Beam optical system 12 Differential exhaust system 2 Stage device 22 Stage 221 Bottom member 221Su Top surface 222 Side wall member 222Su Top surface 223 Support member 223Su Top surface

224c Guard members

2241, 2242, 2243b,

2244d Exhaust port

2251, 2252, 2253b,

2254d Piping

225f, 225g, 225i Electrostatic chuck 2261f, 2262f Opening / closing member 227f Partition member 228h Vacuum chuck 4 Controller 5

Pump system

51, 52, 53, 54 Vacuum pump 6j Measuring device SPb1, SPb2, SPb3 Beam passage space SPs Stage space SPsf Division space SPg1, SPg2 Outer edge space SPsh Adsorption space VSP Vacuum region W Sample W_vac Specific part W_edg The outer edge portion WSu surface WSl backside

Claims

A vacuum forming member that has a pipe line connectable to the exhaust device, discharges the gas in the first space contacting the surface of the object through the pipe line, and forms a vacuum region;
An irradiation device for irradiating a charged particle beam toward the sample through the vacuum region;
A relative position changing device for changing a relative position between the sample and the vacuum region by changing a relative position between the sample and the vacuum forming member;
A partition member that divides a second space facing the other surface of the sample located on the opposite side of the surface irradiated with the charged particle beam of the sample into a plurality of sections;
An atmospheric pressure adjusting device capable of controlling the atmospheric pressure of each of the plurality of compartments,
At least a part of the gas in the space having a higher atmospheric pressure than the vacuum region around the vacuum region is discharged through the pipe line of the vacuum forming member,
A charged particle apparatus in which a passage of a charged particle beam irradiated from the irradiation apparatus includes at least a part of the vacuum region.
A pipe having a first end connected to the exhaust device and a second end connected to the first space in contact with the surface of the object, and discharging the gas in the first space through the pipe; A vacuum forming member for forming a vacuum region in the first space having a lower pressure than an external space connected to the first space;
An irradiation device for irradiating a charged particle beam toward the sample through the vacuum region;
A relative position changing device for changing a relative position between the sample and the vacuum region by changing a relative position between the sample and the vacuum forming member;
A partition member that divides a second space facing the other surface of the sample located on the opposite side of the surface irradiated with the charged particle beam of the sample into a plurality of sections;
A charged particle device comprising: an atmospheric pressure adjustment device capable of controlling an atmospheric pressure of each of the plurality of sections.
A first space that has a conduit that can be connected to an exhaust device and that is in contact with a first portion of the surface of the object by discharging gas through the conduit while facing a part of the surface of the object In addition, a vacuum forming member that forms a vacuum region whose pressure is lower than the pressure of the external space in contact with the second portion different from the first portion of the surface;
An irradiation device for irradiating a charged particle beam toward the sample through the vacuum region;
A relative position changing device for changing a relative position between the sample and the vacuum region by changing a relative position between the sample and the vacuum forming member;
A partition member that divides a second space facing the other surface of the sample located on the opposite side of the surface irradiated with the charged particle beam of the sample into a plurality of sections;
A charged particle device comprising: an atmospheric pressure adjustment device capable of controlling an atmospheric pressure of each of the plurality of sections.
The charged particle device according to claim 2, wherein the external space cannot be connected to the pipe line without passing through the first space, but can be connected through the first space.
A conduit that can be connected to an exhaust device, and with the surface of the object facing the end of the conduit, the gas in the first space in contact with the surface of the object is discharged through the conduit; A vacuum forming member for forming a vacuum region;
An irradiation device for irradiating a charged particle beam toward the sample through the vacuum region;
A relative position changing device for changing a relative position between the sample and the vacuum region by changing a relative position between the sample and the vacuum forming member;
A partition member that divides a second space facing the other surface of the sample located on the opposite side of the surface irradiated with the charged particle beam of the sample into a plurality of sections;
An atmospheric pressure adjusting device capable of controlling the atmospheric pressure of each of the plurality of compartments,
A charged particle apparatus in which a passage of a charged particle beam irradiated from the irradiation apparatus includes at least a part of the vacuum region.
6. The air pressure adjusting device according to claim 1, wherein the air pressure of one space among the plurality of sections is made different from the air pressure of another space of the plurality of spaces. Charged particle device.
The charged particle device according to any one of claims 1 to 6, wherein the atmospheric pressure adjustment device controls the atmospheric pressure of each of the plurality of sections based on information related to a relative position between the sample and the vacuum forming member.
The first compartment of the plurality of compartments is changed from a first atmospheric pressure to a second atmospheric pressure when the sample and the vacuum forming member are changed from a first relative positional relationship to a second relative positional relationship. The charged particle device according to any one of 1 to 7.
In the second relative positional relationship, the first section is opposed to the vacuum region across the sample,
The charged particle device according to claim 8, wherein the second atmospheric pressure is lower than the first atmospheric pressure.
The charged particle device according to claim 8 or 9, wherein, in the first relative positional relationship, the first section faces an atmospheric pressure space with the sample interposed therebetween.
The charged particle device according to any one of claims 1 to 10, wherein the atmospheric pressure adjusting device further includes a pipe capable of supplying air to the plurality of sections.
A vacuum forming member that has a pipe line connectable to the exhaust device, discharges the gas in the first space contacting the surface of the object through the pipe line, and forms a vacuum region;
An irradiation device for irradiating the sample with a charged particle beam through the vacuum region;
A relative position changing device for changing a relative position between the sample and the vacuum region by changing a relative position between the sample and the vacuum forming member;
A part of the gas in the second space facing the other surface of the sample located on the opposite side to the surface irradiated with the charged particle beam of the sample is passed through an opening that can move in the second space. And an air pressure adjusting device equipped with an exhaust device for exhausting air,
At least a part of the gas in the space having a higher atmospheric pressure than the vacuum region around the vacuum region is discharged through the pipe line of the vacuum forming member,
A charged particle apparatus in which a passage of a charged particle beam irradiated from the irradiation apparatus includes at least a part of the vacuum region.
The charged particle device according to claim 12, wherein the atmospheric pressure adjustment device moves the opening based on information on a relative position between the sample and the vacuum forming member.
The charged particle apparatus according to claim 14, wherein the atmospheric pressure adjusting device positions the opening in a facing region that is opposed to the vacuum region, the relative position of which is changed with respect to the sample, and the sample.
The charge according to claim 14, wherein when the sample and the vacuum forming member are changed from a first relative positional relationship to a second relative positional relationship, the facing region is changed from a first atmospheric pressure to a second atmospheric pressure. Particle equipment
The charged particle device according to claim 15, wherein the second atmospheric pressure is lower than the first atmospheric pressure.
The vacuum forming member forms the vacuum region by exhausting the first space using a first exhaust device,
The charged particle device according to any one of claims 1 to 16, wherein the atmospheric pressure adjustment device exhausts the second space using a second exhaust device different from the first exhaust device.
The charged particle device according to claim 17, wherein the second exhaust device includes at least one of a diffusion pump, a cryopump, a turbo molecular pump, and a sputter ion pump.
The vacuum forming member forms the vacuum region by exhausting the first space using a first exhaust device,
The charged particle device according to any one of claims 1 to 16, wherein the atmospheric pressure adjusting device exhausts the second space using the first exhaust device.
A vacuum forming member that has a pipe line connectable to the exhaust device, discharges the gas in the first space contacting the surface of the object through the pipe line, and forms a vacuum region;
An irradiation device for irradiating the sample with a charged particle beam through the vacuum region;
A second space facing the other surface of the sample located on the opposite side of the surface irradiated with the charged particle beam of the sample is enclosed with the sample, and the second space and the outside of the second space are A partition wall portion capable of forming a pressure difference therebetween,
A charged particle device comprising: a pressure adjusting device capable of adjusting a pressure of the second space.
21. The atmospheric pressure adjustment device according to claim 20, further comprising: an atmospheric pressure adjustment device capable of reducing a difference between an atmospheric pressure in the second space and an atmospheric pressure in the vacuum region based on a difference between an atmospheric pressure and an atmospheric pressure in the vacuum region. Charged particle device.
21. The partition wall has an opening that communicates with a pressure adjusting device that can reduce a difference between a pressure in the second space and a pressure in the vacuum region by a difference between a pressure in the vacuum region and a pressure in the vacuum region. The charged particle device according to 21.
The atmospheric pressure adjusting device calculates the difference between the atmospheric pressure in the second space and the atmospheric pressure in the vacuum region through the opening as an atmospheric pressure in at least part of a period in which the vacuum region is formed on the outer edge of the sample. The charged particle device according to claim 22, wherein the charged particle device is reduced by a difference from a pressure in the vacuum region.
The atmospheric pressure adjusting device increases the difference between the atmospheric pressure in the second space and the atmospheric pressure in the vacuum region through the opening during at least a part of the period during which the suction force of the vacuum region acts on the outer edge of the sample. The charged particle device according to claim 22 or 23, wherein the charged particle device is reduced by a difference between a pressure and a pressure in the vacuum region.
The charged particle device according to any one of claims 20 to 24, wherein the partition wall portion can seal the second space together with the sample.
The irradiation device irradiates the charged particle beam to the sample through the vacuum region,
The charged particle device according to any one of claims 1 to 25, wherein the other surface of the sample is located on a side opposite to a surface of the sample irradiated with the charged particle beam.
A holding member for holding the sample;
The charged particle device according to any one of claims 1 to 26, wherein the holding member includes a plurality of pin-shaped members that support the other surface in the second space.
The number per unit area of the pin-shaped member in the portion of the holding member that holds the outer edge portion of the sample is larger than the number per unit area of the pin-shaped member that holds the central portion of the sample of the holding member. The charged particle device according to claim 27.
The contact area of the pin-shaped member with the sample at the portion of the holding member that holds the outer edge of the sample is the contact area of the pin-shaped member with the sample that holds the center of the sample of the holding member. The charged particle device according to claim 27 or 28.
The vacuum forming member forms a vacuum region having a degree of vacuum higher than a degree of vacuum in a region different from the space in a space between the irradiation device and the irradiation region on the sample irradiated with the charged particle beam. The charged particle device according to any one of claims 1 to 29.
The charged particle device according to any one of claims 1 to 30, wherein the vacuum region covers a part of a surface on the sample.
The charged particle device according to any one of claims 1 to 31, wherein the vacuum region is in contact with a part of a surface on the sample.
33. When the vacuum region is formed, at least another part of the surface of the sample is covered with a non-vacuum region or a region whose degree of vacuum is lower than that of the vacuum region. Charged particle device.
The vacuum forming member is provided so as to face the surface of the sample and has a surface including an opening communicating with an exhaust device.
The charged particle device according to any one of claims 1 to 33.
The charged particle device according to claim 34, wherein the opening is a first opening, and has a second opening around the first opening in the surface.
36. The charged particle device according to claim 35, wherein the degree of vacuum in the space in the first opening is higher than the degree of vacuum in the second opening.
The vacuum forming member forms a vacuum by evacuating the space in which a difference in atmospheric pressure between the space and the other space is maintained by an exhaust resistance of a gap between the object and the vacuum forming member. The charged particle device according to any one of claims 1 to 36, wherein the charged particle device is a differential evacuation type vacuum forming member.
The charged particle device according to any one of claims 1 to 37, further comprising: an applying device that applies an applying force in a direction opposite to the attracting force to a portion of the sample where the attracting force of the vacuum region acts.
The charged particle device according to claim 38, wherein the applying force is determined according to the attractive force.
40. The application force can reduce the total of the suction force and the application force acting on the portion as compared with a case where the application force is not applied. The charged particle device according to one item.
41. The charged particle device according to any one of claims 38 to 40, wherein the influence of the applying force can cancel the influence of the attraction force.
The suction force includes a component that acts to displace at least a part of the sample in a first direction from the sample toward the irradiation device;
The charge according to any one of claims 38 to 41, wherein the applying force includes a component that acts to displace at least a part of the sample in a second direction opposite to the first direction. Particle equipment.
43. The application force according to any one of claims 38 to 42, wherein the application force is capable of suppressing deformation of the sample due to the suction force as compared to a case where the application force is not applied. Charged particle device.
44. The application force can bring the surface of the sample irradiated with the charged particle beam closer to a plane as compared to a case where the application force is not applied. The charged particle device described in 1.
The charged particle device according to any one of claims 38 to 44, wherein the applying device locally applies the applying force to a part of a surface of the sample irradiated with the charged particle beam.
The charged particle apparatus according to any one of claims 38 to 45, wherein the applying force is applied to a portion to be sucked to which the suction force is applied in the sample.
The charged particle device according to any one of claims 38 to 46, wherein the applying force is applied to a deformed portion of the sample that deforms due to the suction force.
The charged particle device according to any one of claims 38 to 47, wherein the applying force is applied to a vacuum portion of the sample that faces the vacuum region.
The charged particle apparatus according to any one of claims 38 to 48, wherein the applying force is applied to an irradiated portion of the sample where an irradiation region of the charged particle beam is set.
The charged particle device according to any one of claims 38 to 49, wherein a position where the applying device applies the applying force changes.
The irradiation apparatus changes a relative position between the sample and the irradiation region of the charged particle beam in a direction along the surface of the sample, and irradiates the charged particle beam,
The charged particle device according to any one of claims 38 to 50, wherein the applying device changes a position to which the applying force is applied according to the relative position between the sample and the irradiation region.
The vacuum forming member changes a relative position between the sample and the vacuum region in a direction along the surface of the sample,
The charged particle device according to any one of claims 38 to 51, wherein the applying device changes a position to which the applying force is applied according to the relative position between the sample and the vacuum region.
The application device includes a plurality of application mechanisms each capable of applying the application force to different positions.
The said grant apparatus changes the position which provides the said grant force by changing selection of the at least 1 grant mechanism which should give the said grant force among these several grant mechanisms. The charged particle device according to one item.
A position changing device for changing the relative position between the sample and the applying device;
54. The charged particle according to claim 38, wherein the applying device changes a position to which the applying force is applied by changing the relative position between the sample and the applying device by the position changing device. apparatus.
The charged particle device according to any one of claims 38 to 54, wherein the applying device includes an electromagnetic force applying device that applies a force resulting from electromagnetic interaction as the applying force.
56. The charged particle device according to any one of claims 1 to 55, wherein an air pressure in the vacuum region is 1 × 10 −3 Pascal or less.
57. The charged particle device according to claim 1, wherein a distance between the vacuum forming member and the object is 1 μm or more and 10 μm or less.
The charged particle device according to claim 1, wherein at least a part of the surface of the object faces at least a part of the vacuum region.
59. The charged particle device according to any one of claims 1 to 58, wherein at least a part of the surface of the object is covered with at least a part of the vacuum region.
The charged particle according to any one of claims 1 to 59, wherein a part of the surface of the object faces the vacuum region, and another part of the surface of the object faces an atmospheric pressure region. apparatus.
The charged particle device according to any one of claims 1 to 60, wherein the surface of the object includes at least a part of a surface of the sample.
The charged particle apparatus according to any one of claims 1 to 61, wherein the surface of the object includes at least a part of a surface of a member that holds the sample.
The charged particle device according to any one of claims 1 to 62, wherein the surface of the object includes at least a part of a surface of a member disposed between the sample and the vacuum forming member.
64. The degree of vacuum in the vacuum region is maintained higher than the degree of vacuum in a space outside the vacuum forming member that is different from the space in which the vacuum region is formed. The charged particle device according to claim 1.
A charged particle device according to any one of claims 1 to 64;
A measuring device for measuring the sample under atmospheric pressure,
The charged particle device is a charged particle beam measurement device that measures the sample based on a detection result of charged particles from the sample irradiated with the charged particle beam.
The measurement system according to claim 65, wherein at least a part of a region on the sample measured by the measurement device is measured by the charged particle beam measurement device.
The measurement system according to claim 66, wherein a predetermined index object is formed in the region.
The measurement system according to claim 66, wherein a resist pattern is formed in the region.
The measurement system according to any one of claims 65 to 67, wherein the charged particle beam measurement apparatus acquires information related to a pattern formed in the sample.
The measurement system according to any one of claims 65 to 69, wherein measurement is performed by the charged particle beam measurement device after measurement by the measurement device.
The measurement system according to any one of claims 65 to 70, wherein the measurement by the measurement device and the measurement by the charged particle beam measurement device are performed in parallel.
The measurement according to any one of claims 65 to 71, wherein the measurement device measures the one region on the sample during a period in which the one region on the sample is not covered with the vacuum region. system.
The measurement device according to any one of claims 65 to 71, wherein the measurement device measures the one region on the sample during a period in which the charged particle beam is not irradiated on the one region on the sample. Measuring system.
The measurement device includes at least one of an optical microscope and a diffraction interferometer,
66. The diffraction interferometer measures the sample by detecting interference light obtained by causing the diffracted light diffracted by irradiating the index object or the resist pattern on the sample to interfere with each other. 74. The measurement system according to any one of 73.
When the measurement device measures the sample, the atmospheric pressure adjustment device adjusts the atmospheric pressure of the second space to the first atmospheric pressure,
The measurement system according to any one of claims 65 to 74, wherein when the charged particle device measures the sample, the atmospheric pressure adjustment device adjusts the atmospheric pressure in the second space to a second atmospheric pressure different from the first atmospheric pressure.
The measurement system according to claim 75, wherein the second atmospheric pressure is lower than the first atmospheric pressure.
The second space is divided into a plurality of sections,
The atmospheric pressure adjustment device changes the atmospheric pressure of the plurality of sections,
Changing the pressure on the back of the position where the charged particle device measures the sample to the second pressure,
Changing the back surface of the position where the measurement device measures the sample to the first atmospheric pressure;
The measurement system according to claim 75 or 76.
Exhausting the gas in the first space in contact with the surface of the object through a conduit to form a vacuum region;
Exhausting at least a portion of a gas in a space having a higher atmospheric pressure than the vacuum region around the vacuum region through the conduit;
Irradiating the sample with a charged particle beam that has passed through a passage space including at least a part of the vacuum region;
Changing the relative position of the sample and the vacuum region;
In a second space that faces the other surface of the sample located on the opposite side of the surface to which the charged particle beam of the sample is irradiated and is divided into a plurality of partitions, a part of the plurality of partitions By differentiating the air pressure in the compartments from the other compartments in the plurality of compartments, the air pressure in the second space and the area opposite to the sample with the vacuum region whose relative position is changed with respect to the sample And reducing the difference between the pressure in the vacuum region and the charged particle beam irradiation method.
Exhausting the gas in the first space in contact with the surface of the object through a conduit to form a vacuum region;
Exhausting at least a portion of a gas in a space having a higher atmospheric pressure than the vacuum region around the vacuum region through the conduit;
Irradiating the sample with a charged particle beam that has passed through a passage space including at least a part of the vacuum region;
Changing the relative position of the sample and the vacuum region;
The pressure of a part of the second space facing the other surface of the sample located on the opposite side of the surface irradiated with the charged particle beam of the sample can be reduced from the pressure of the other part of the second space. By changing the relative position of the member having an opening communicating with the exhaust device that is relative to the sample in the second space, the vacuum region whose relative position is changed with respect to the sample is sandwiched between the sample and the vacuum region. A charged particle beam irradiation method comprising: reducing a difference between an air pressure in an opposing region and an air pressure in the vacuum region.
Exhausting the gas in the first space in contact with the surface of the object through a conduit to form a vacuum region;
Exhausting at least a portion of a gas in a space having a higher atmospheric pressure than the vacuum region around the vacuum region through the conduit;
Irradiating the sample with a charged particle beam that has passed through a passage space including at least a part of the vacuum region;
Changing the relative position of the sample and the vacuum region;
A second space facing the other surface of the sample located on the opposite side of the surface irradiated with the charged particle beam of the sample is surrounded by the sample and the partition wall, and the second space and the second space are enclosed. Forming a pressure difference with the outside of the
Reducing the difference between the pressure in the second space and the pressure in the vacuum region.
A vacuum forming member capable of locally forming a vacuum region covering a part of the surface of the object in a first space on the object;
An irradiation device for irradiating the object with a charged particle beam through the vacuum region;
A relative position changing device for changing a relative position between the object and the vacuum forming member to change a relative position between the object and the vacuum region;
A partition member that divides a second space facing the other surface of the object on the opposite side of the surface irradiated with the charged particle beam of the object into a plurality of sections;
Among the plurality of compartments, the air pressure in a part of the plurality of compartments including the vacuum region whose relative position is changed with respect to the object and an opposing region that is opposed to the object is placed between the other compartments in the plurality of compartments. A charged particle device comprising: a pressure adjusting device that makes the difference between the air pressure in the opposite region and the air pressure in the vacuum region different from the difference between the atmospheric pressure and the air pressure in the vacuum region.
A vacuum forming member capable of locally forming a vacuum region covering a part of the surface of the object in a first space on the object;
An irradiation device for irradiating the object with a charged particle beam through the vacuum region;
A relative position changing device for changing a relative position between the object and the vacuum forming member to change a relative position between the object and the vacuum region;
A part of the gas in the second space facing the other surface of the object located on the opposite side to the surface irradiated with the charged particle beam of the object is passed through an opening movable in the second space. And an air pressure adjusting device equipped with an exhaust device for exhausting air,
The air pressure adjusting device positions the opening in a facing region facing the vacuum region whose relative position is changed with respect to the object, and the pressure in the facing region and the pressure in the vacuum region. A charged particle device that reduces the difference between the atmospheric pressure and the atmospheric pressure in the vacuum region.
A vacuum forming member capable of locally forming a vacuum region covering a part of the surface of the object in a first space on the object;
An irradiation device for irradiating the object with a charged particle beam through the vacuum region;
A second space facing the other surface of the object located on the opposite side of the surface irradiated with the charged particle beam of the object is enclosed with the object, and the second space and the outside of the second space are A partition wall portion capable of forming a pressure difference therebetween,
A charged particle device comprising: an atmospheric pressure adjustment device capable of reducing a difference between an atmospheric pressure in the second space and an atmospheric pressure in the vacuum region by a difference between an atmospheric pressure and an atmospheric pressure in the vacuum region.
A charged particle device according to any one of claims 81 to 83;
A measuring device for measuring the object under atmospheric pressure,
The charged particle device is a charged particle beam measurement device that measures the object based on a detection result of charged particles from the object irradiated with the charged particle beam.
Locally forming a vacuum region covering a part of the surface of the object in a first space on the object;
Irradiating the object with a charged particle beam through the vacuum region;
Changing the relative position of the object and the vacuum region;
In a second space facing the other surface of the object located on the opposite side of the surface irradiated with the charged particle beam of the object and divided into a plurality of sections, a part of the plurality of sections By changing the pressure of the compartments from the other compartments of the plurality of compartments, the air pressure in the second space that is opposed to the vacuum region, the relative position of which is changed with respect to the object, across the object And reducing the difference between the pressure in the vacuum region and the charged particle beam irradiation method.
Locally forming a vacuum region covering a part of the surface of the object in a first space on the object;
Irradiating the object with a charged particle beam through the vacuum region;
Changing the relative position of the object and the vacuum region;
The pressure of a part of the second space facing the other surface of the object located on the opposite side of the surface irradiated with the charged particle beam of the object can be reduced from the pressure of the other part of the second space. By changing the relative position of the member having an opening communicating with the exhaust device, which is relative to the object, between the vacuum region of the second space whose relative position is changed with respect to the object and the object A charged particle beam irradiation method comprising: reducing a difference between an air pressure in an opposing region and an air pressure in the vacuum region.
Locally forming a vacuum region covering a part of the surface of the object in a first space on the object;
Irradiating the object with a charged particle beam through the vacuum region;
Changing the relative position of the object and the vacuum region;
A second space facing the other surface of the object located on the opposite side to the surface irradiated with the charged particle beam of the object is surrounded by the object and the partition wall, and the second space and the second space are enclosed. Forming a pressure difference with the outside of the
Reducing the difference between the pressure in the second space and the pressure in the vacuum region.