WO2019149809A1 - Procédé d'étalonnage d'un dispositif de mesure et programme informatique associé - Google Patents

Procédé d'étalonnage d'un dispositif de mesure et programme informatique associé Download PDF

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Publication number
WO2019149809A1
WO2019149809A1 PCT/EP2019/052357 EP2019052357W WO2019149809A1 WO 2019149809 A1 WO2019149809 A1 WO 2019149809A1 EP 2019052357 W EP2019052357 W EP 2019052357W WO 2019149809 A1 WO2019149809 A1 WO 2019149809A1
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WIPO (PCT)
Prior art keywords
calibration
ellipse
parameters
radiation source
positioning device
Prior art date
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PCT/EP2019/052357
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German (de)
English (en)
Inventor
Lorenz BRANZ
Dominik Stahl
Tim WINTER
Original Assignee
Gom Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Publication of WO2019149809A1 publication Critical patent/WO2019149809A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising

Definitions

  • the invention relates to a method for calibrating a measuring device, which is set up for measuring an object with invasive radiation, in particular for computer tomographic measurement of a measuring object, and a
  • Measuring devices for computer tomographic measurement of an object are meanwhile increasingly used in the industrial environment for testing workpieces.
  • a typical measuring device for computer tomographic measurement of an object contains at least one radiation source (source of invasive radiation, for example an X-ray source), a positioning device for positioning and moving the object (manipulation system, for example a turntable), and a radiation source (source of invasive radiation, for example an X-ray source), a positioning device for positioning and moving the object (manipulation system, for example a turntable), and a radiation source (source of invasive radiation, for example an X-ray source), a positioning device for positioning and moving the object (manipulation system, for example a turntable), and a
  • Detector unit for example, a flat-panel detector
  • the detector unit acquires data representing a two-dimensional image of the object.
  • the object is moved to another position using the positioning device and further data is recorded. To measure an object, it is common data in up to several hundred different
  • Positions of the object to record, for example, by the object is on a turntable and rotates between the recordings by a predetermined angle.
  • a volume data set can be calculated with the aid of a reconstruction algorithm, which describes the object three-dimensionally.
  • a reconstruction algorithm which describes the object three-dimensionally.
  • different calibration parameters are included in the calculation.
  • Calibration parameters can be, for example, geometric parameters of the measuring device for computer tomographic measurement, such as the position of the radiation source, position and orientation of the detector unit and of the manipulation system.
  • EP 1 760 457 B1 describes a method and an arrangement for calibrating a measuring arrangement which generates images of objects to be measured by means of invasive radiation, eg. B. a computed tomography (CT) measuring arrangement.
  • CT computed tomography
  • Detected measuring arrangement wherein from detection signals of the detection device, which correspond to the radiation detected by the detection means, a
  • Radiation image of the calibration object is generated.
  • the calibration object has known dimensions.
  • Photogrammetry in: Report volume for the DGZfP annual conference 2010, DL2A.2 describes a cylindrical calibration object consisting of a cylindrical carrier object with recessed spheres and a recessed ball dumbbell of known dimensions as calibration features.
  • an ellipse operator is described for calculating projected centers of the calibration features of the calibration object in radiometric images and also a method for calibrating a CT system.
  • a method for calibrating a CT system is configured such that the
  • Calibration object is recorded so that the projected midpoints of the calibration features in the images determined photogrammetric with the ellipse operator
  • Parameters of the measuring arrangement can be determined.
  • Conventional methods employ calibration objects that include a plurality of
  • Form features have to those known dimensions, or their dimensions are determined for performing the method by a coordinate measuring machine.
  • the object of the invention is an improved method for the determination of
  • the measuring device may in particular be a computed tomography measuring arrangement.
  • a measuring device for measuring an object with invasive radiation For determining calibration parameters of a measuring device for measuring an object with invasive radiation, in particular a measuring device for
  • Computer tomographic measurement of a measurement object which has a radiation source, a detector unit and a positioning device and wherein the
  • Positioning device with the aid of at least one manipulation axis is adapted to an object in the beam path between the radiation source and the
  • Positioning device as a scale and with the associated positions of the projections of at least one calibration feature of the calibration object.
  • the relative position changes are at least one
  • Manipulation axis of the positioning device and the associated relative changes in position of the object between two different Positioning determined, and thus calibration parameters are determined by introducing the previously determined changes in position of at least one manipulation axis. At least two different positions differ in the position value of at least one manipulation axis.
  • the dimensions of the calibration object and its calibration features need not be known.
  • a calibration object is placed between the radiation source and the detector unit such that at least part of the calibration object is located in the beam path from the radiation source to the detector unit.
  • the placement of the calibration object is carried out by means of a positioning device.
  • the positioning device is suitably an object, in particular a measurement object or a
  • Calibration object to be positioned in the beam path between the radiation source and the detector unit.
  • the detector unit for example a flat-panel X-ray detector
  • the detector unit supplies data which is in the form of two-dimensional
  • the data of the detector unit provide a two-dimensional image of a projection of the calibration object with invasive radiation, hereinafter also referred to as a projection image.
  • the invasive radiation of the radiation source is attenuated to different degrees as it penetrates the calibration object.
  • features located in the interior of the calibration object can also be imaged in the projection image.
  • An exemplary calibration object has at least one calibration feature.
  • Calibration feature bodies of different shapes and materials are suitable.
  • the material of the calibration feature should be chosen so that its projection can be evaluated in the projection image due to a greater attenuation of the invasive radiation compared to the attenuation by the material of the calibration object. Due to their geometry often spherical features are used, but other shapes are conceivable.
  • the different positioning of the calibration object can be achieved by positioning the calibration object with the aid of the positioning device.
  • the positioning device is suitable for this purpose an object, for example the calibration object, during a position change with the aid of the positioning device, but in particular during a measurement, which consists of a plurality of images of projection images, in a stationary position relative to
  • Positioning device to hold For example, the positioning device on a support surface for placing the object and / or a holding device for holding the object.
  • the positioning device may have different types of manipulation axes, such as translation axes or rotation axes, in different numbers.
  • the positioning device preferably has at least one
  • Manipulation axis designed as a translation axis.
  • the positioning device has at least two manipulation axes, wherein one of the manipulation axes is designed as a translation axis and one of the manipulation axes is designed as a rotation axis.
  • the positioning device can move the object both along a translation axis, as well as rotate about a rotation axis.
  • further manipulation axes are present, in particular further translation axes. For example, one of the
  • Translational axes serve to move the object in the beam direction and another translation axis is intended to move the object along the axis of rotation.
  • the positioning of the object in the beam path can be described on the basis of position values of the positioning device.
  • the positioning device is designed such that position values of at least one manipulation axis
  • Position change of the object for example, be determined during a shift along a translation axis.
  • this corresponds to a first measurement position of the calibration object
  • Determining the position value of the manipulation axis in a second position this corresponds to a second measurement position of the calibration object, can
  • Position values of a translation axis are preferably determined in two surveying positions, so that the obtained
  • Difference value of the position values a size measure, for example, a length in mm results.
  • the determined relative change in position of the manipulation axis provides a yardstick for the determination of the calibration parameters.
  • an evaluation takes place in that the positions of the projections of the calibration features are determined in the recorded projection images and a compensation calculation for the determination of the calibration parameters is carried out, which is based on the positions of the projections of the calibration features and the position values of the manipulation axes determines the calibration parameters of the measuring device.
  • a compensation calculation for the determination of the calibration parameters is carried out, which is based on the positions of the projections of the calibration features and the position values of the manipulation axes determines the calibration parameters of the measuring device.
  • various embodiments are conceivable.
  • Program code means for determining the calibration parameters as a function of the results of a measurement irradiated by the radiation source
  • Manipulation axis of the positioning device are set up and the
  • Program code means are executed on a data processing unit.
  • the calibration features may have different shapes, accordingly, the method for determining the position of the projection of the calibration features in the projection images should be appropriately selected. It is common to use balls as calibration features. In the projection, the spheres are usually depicted as ellipses whose position is to be determined. Method for the determination of
  • the calibration object is at least one spherical
  • Calibration feature contains.
  • the position of the spherical calibration feature is to be done in this exemplary embodiment by the determination of the ball center.
  • Projection of the spherical calibration features is in the form of an ellipse
  • Position of the calibration feature can be specified in the projection image in a two-dimensional image coordinate system. For example, the origin of an image coordinate system is placed in a corner of the image. To determine the position of the projection of the ball center are in
  • Projection image determines the ellipse positions.
  • ellipse parameters such as the position, radii and orientation, are estimated for ellipses imaged in the projection image.
  • these first estimated ellipse parameters are referred to as start values.
  • the estimated ellipse parameters serve as a basis for mathematically modeling ellipses for an estimated ellipse model; this modeled ellipse is also referred to as a model ellipse.
  • a difference is determined from the estimated ellipse model and the associated recorded projection image (measured ellipse).
  • the analysis can only include subsections. In case the model ellipse and measured ellipse match, the difference would be zero. Since the initial starting values for the ellipses may be inaccurate, it is unlikely that this will happen immediately. Therefore be in one
  • Center of the sphere takes place for at least two, preferably for all recorded projection images and for at least one, preferably for all ellipses imaged therein.
  • the determined positions of the projections of the ball centers are included in the subsequent compensation calculation.
  • Surveying an object with invasive radiation provided to carry out the determination of the calibration parameters by introducing the determined during the recording of projection images position values of at least one manipulation axis. At least two projection images are assigned the associated position values
  • Manipulation axis determined. It is particularly advantageous if this manipulation axis is a translational axis. Furthermore, it is particularly advantageous if the determination of the position values of the manipulation axis occurs not only for two projection images but for more than two projection images, in a particularly advantageous manner for all projection images.
  • the position values can be stored, for example, in a data processing unit.
  • Kalibrierparameter the measuring device so for example, the distance between the radiation source and the detector unit or the position of the axis of rotation of the
  • Calibration features estimated in the calibration object are the 3D positions of the calibration features in the calibration object, which should not be confused with the positions of the projections of the calibration features in the two-dimensional
  • Image coordinate system of the projection image is.
  • the measuring device for measuring an object with invasive radiation in particular the measuring device for computer tomographic measurement of a measurement object, is simulated to the extent that it is possible for a
  • Projections of the calibration features in a specific recording situation are compared with the positions of the projections of the calibration parameters, which are preceded by a Evaluation of the measured projection images were determined. This happens, for example, by subtraction. This difference takes place for at least one calibration feature and preferably for all evaluable calibration features and for more than one previously recorded projection image and preferably for all previously
  • the variation of the 3D positions of the calibration features is designed such that the relative change in position of a calibration feature in two recording situations with the relative position change assumed to be the correct scale
  • Such a simple calibration object may be, for example, a block of expanded polystyrene foam in which at least one
  • Calibration feature preferably several calibration features were plugged.
  • Calibration feature are, for example, balls of iron or tungsten carbide.
  • Decalibration period therefore has no effect on the calibration.
  • this known dimension can be used to check the results for the calibration parameters determined by the method according to the invention.
  • the fact is taken into account that a special recording situation can influence the calibration parameters.
  • an object is located on a positioning device in the form of a translation axis. This is arranged so that the object can be displaced by the translation axis in the direction from the radiation source to the detector unit. This direction is defined, for example, as the x-direction. A change in position of the object along this axis would then ideally also only a change in position of the
  • the z-position of the translation axis TZ provides a fixed value TZ, since this was seen in the compensation calculation as a constant.
  • TZ does not assume a constant value but changes its value as a function of its x-position.
  • TZ is described as a consequence of a model function TZ (x).
  • the model function thus describes reproducible deviations of the translation axis from an ideal translation axis, which occur during translation along the translation axis.
  • an inserted turntable can wobble.
  • the normal of the turntable surface does not point exactly in the direction of the axis of rotation, as in the assumed ideal case, but includes an angle with it.
  • a calibration parameter which defines the direction of the axis of rotation with respect to the turntable surface, thus does not yield a constant as idealized, but can be replaced by a Model function depending on the current position of the turntable, which is described by the position value of the rotation axis (rotation axis) describe.
  • Projection images with calibration features are not only performed with a calibration object, but projection images are recorded with several different calibration objects and the evaluation is carried out via a combination of
  • the calibration objects may be, for example, in size, material, shape and / or number, size, material and / or
  • Figure 1 Schematic representation of a measuring device for measuring a
  • the positioning device has a rotation axis and a translation axis
  • Figure 2 Schematic representation of a measuring device for measuring a
  • the positioning device has a rotation axis and two translation axes
  • FIG. 3 shows a sketch of an exemplary calibration object
  • FIG. 4 Schematic flow of a method according to the invention
  • FIG. 5 Exemplary method for determining positions of the projections of spherical calibration features.
  • FIG. 1 shows schematically the structure of a measuring device 1 for measuring an object 2 with invasive radiation, in particular a computer tomograph.
  • the measuring device 1 has a radiation source 3, a positioning device 4 and a detector unit 5.
  • the positioning device 4 has in the example shown as Manipulationsachsen an axis of rotation corresponding to the axis of rotation of the rotary unit 6 and a vertical translation axis 7. The directions of movement are indicated in the figure by arrows.
  • the translation axis 7 is suitable for positioning an object 2 at different heights in the beam path of the radiation source 3 to the detector unit 5, the relative position change resulting from this movement being indicated as dTZ.
  • the rotary unit 6 allows the object 2 to rotate about the rotation axis of the rotary unit 6, and thus to perform a relative position change by dR. Due to the change in position dR about the axis of rotation, it is possible the object 2 off to radiate different directions.
  • the object 2 can be a measurement object or else a calibration object that can be used in a method for determining
  • the evaluation unit 8 is suitable for receiving and processing data from the detector unit 5 and the positioning device 4.
  • a feature contained in the object 2 is imaged as a projection on the detector unit 5.
  • Manipulation axes leads to a change dP in the position of the projection of the
  • the change in the position of the projection of a calibration feature dP is calculated as a function of the calibration parameters, of dTZ and / or dR.
  • a value for dP is determined from the associated projection images.
  • the calibration parameters are iteratively varied until the deviation from the calculated dP and the dP determined from the projection images becomes minimal.
  • the expected positions P1 and P2 of the projections of a calibration feature for the corresponding associated recording situations be mathematically simulated. They become theoretical, so to speak
  • dP can also be determined from the recorded projection images. If the values for the calibration parameters of the measuring device 1 are correctly assumed, then the calculated dP and the dP determined from the recordings will be the same. If this is not the case, then the
  • Calibration parameters of the measuring device 1 as long as varied until the best possible match is achieved.
  • the best possible match is achieved, for example, if the difference between the calculated dP and the dP determined from the recordings falls below a previously defined value.
  • Figure 2 shows a schematic structure of another embodiment of the measuring device 1 for measuring an object 2 with invasive radiation, in particular a CT scanners.
  • the positioning device 4 has two translation axes 7 and 9.
  • the translation axis 7 is intended to move the object 2 along the axis of rotation of the rotary unit 6, a further translation axis 9 serves to move the object 2 in the beam direction.
  • a change in position along the translation axis 9 is indicated as dTX.
  • FIG. 3 shows an exemplary embodiment of a calibration object 10, as may be used, for example, in the method according to the invention.
  • the calibration object 10 may be, for example, a simple calibration object 10, which has a material body M consisting of a first material of density DM and at least one calibration feature K consisting of a second material of density DK, the density DK is greater than the density DM.
  • the calibration feature K may be wholly or partly inside the material body M.
  • i calibration features Ki are used, wherein the index i is a natural number greater than 1.
  • the calibration features Ki can be of different shape, size or material and be located wholly or partially inside the material body M. Their arrangement may be chosen arbitrarily, since their dimensions and positions to each other for the implementation of the method need not be known, yet the use of calibration objects with ordered structures is possible.
  • FIG. 4 schematically shows the sequence of an exemplary method according to the invention for determining calibration parameters of a measuring device 1 for measuring an object 2 with invasive radiation, in particular a measuring device 1 for computer tomographic measurement of a measuring object 2.
  • the measuring device 1 may be, for example, a measuring device 1, as shown in FIG. 1 or FIG.
  • a calibration object 2 is positioned in the beam path between the radiation source 3 and the detector unit 5 with the aid of the positioning device 4 such that a projection image recorded by the detector unit 5
  • Calibration object 2 contains.
  • step b) a projection image of the calibration object 2, including the calibration features contained in the calibration object, is recorded in a positioning effected with the aid of the positioning device 4.
  • the positioning can be described on the basis of position values of the manipulation axes 6, 7, 9.
  • step c) the position values of at least one of the manipulation axes are detected.
  • the determination of the position values of a manipulation axis 6, 7, 9 can be carried out, for example, by reading out a position value of the manipulation axis 6, 7, 9.
  • the positioning of the calibration object with the aid of the positioning device 4 is changed by one or more manipulation axes 6, 7, 9 changing their position. After the positioning change of the calibration object in the beam path between the radiation source 3 and the
  • Detector unit 5 is again recorded a projection image, and stored, for example, for further evaluation in an evaluation unit 8.
  • steps b) and c) can be carried out as often as desired, but at least twice, that is, as many as desired, but at least two,
  • the position values of at least one of the manipulation axes are determined. Further positioning in which a recording of projection images takes place, but no determination of the position values of the
  • Manipulation axes is performed, are conceivable.
  • the respective position values of the manipulation axes 6, 7, 9 in step c) are determined for each of the pickup positions assumed in step b), and for example in one
  • Evaluation unit 8 which may be, for example, a data processing unit stored.
  • step d) a determination of the positions of the projections of
  • the determination of the projected position of the calibration feature takes place for at least two, preferably all recorded ones Projection images and for at least one, preferably all ellipses imaged therein.
  • the particular projected positions of the sphere centers are included in the subsequent equalization calculation.
  • the strict sequence of steps a) to d) does not matter. They can be executed successively, overlapping, concurrently, simultaneously or in a different order, provided that the goal is achieved of taking projection images of the calibration object in different positions and determining position values associated therewith for at least two mutually different positions.
  • step e the determination of calibration parameters with at least one resulting from the position values for the different positioning takes place
  • FIG. 5a to 5d schematically illustrate an example, not
  • the ellipse parameters such as the position, radii and orientation, of the projected ellipses 11 are iteratively determined. Using these ellipse parameters, the values for the position of the projection of the calibration feature are then calculated.
  • FIG. 5 a shows schematically and by way of example an ellipse 11 (measured ellipse) resulting from the projection of a spherical calibration feature in the projection image.
  • start values for the position and the further parameters of the ellipse are assumed and, based on this, a model ellipse 12 is computationally created.
  • a defined analysis area 13 then takes place
  • the analysis area 13 may include only parts of the projection image, or even the entire projection image.
  • a difference of model ellipse 12 and associated recorded ellipse 1 is determined using a difference function.
  • the resulting difference is shown in FIG. 5b by way of example in the form of a differential image 14.
  • Image parts that are inside the measured ellipse 11, but outside the calculated ellipse 12, and image parts that are outside the measured ellipse 11, but within the calculated ellipse 12, are shown in black.
  • Image parts which are located both within the measured ellipse 11 and within the calculated ellipse 12 are shown in white.
  • parts of the image which are shown both outside the measured ellipse 1 1 and outside the calculated ellipse 12 are shown white.
  • the values for the position and the further parameters of the model ellipse 12 are varied until the difference between calculated model ellipse 12 and measured ellipse 11 takes on a minimal value.
  • FIG. 5 c and FIG. 5 d show an example of a calculated ellipse 12 'and an associated difference image 14', as it could result in the further course of the iteration method.
  • the calculated ellipse 12 ' has a smaller deviation from the measured ellipse 1 1 than the ellipse 12 shown in FIG. 5a. This is illustrated by a smaller black area in the difference image 14'.

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Abstract

L'invention concerne un procédé permettant de déterminer des paramètres d'étalonnage d'un dispositif de mesure (1) destiné à mesurer un objet (2) avec un rayonnement invasif. Le dispositif de mesure (1) comporte une source de rayonnement (3), une unité de détection (5) et un dispositif de positionnement (4) destiné à recevoir et positionner un objet (2) dans le trajet de faisceau entre la source de rayonnement (3) et l'unité de détection (5). Le procédé comprend les étapes suivantes : f) placer un objet d'étalonnage (2, 10) dans le trajet de faisceau entre la source de rayonnement (3) et l'unité de détection (5) au moyen du dispositif de positionnement (4), g) enregistrer des images de projection de l'objet d'étalonnage (2, 10) dans au moins deux positions différentes, h) déterminer des valeurs de position d'au moins un axe de manipulation (6, 7, 9) du dispositif de positionnement (4) dans au moins deux des positions différentes utilisées à l'étape b), i) déterminer des positions des projections d'au moins une caractéristique d'étalonnage de l'objet d'étalonnage dans au moins deux des positions différentes utilisées à l'étape c), et j) déterminer des paramètres d'étalonnage avec au moins un changement de position, résultant des valeurs de position pour les positions différentes, d'au moins un axe de manipulation (6, 7, 9) du dispositif de positionnement (4) comme échelle de mesure et avec les positions associées des projections d'au moins une caractéristique d'étalonnage de l'objet.
PCT/EP2019/052357 2018-02-02 2019-01-31 Procédé d'étalonnage d'un dispositif de mesure et programme informatique associé WO2019149809A1 (fr)

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DE102018102412.6A DE102018102412A1 (de) 2018-02-02 2018-02-02 Verfahren zur Kalibrierung einer Messeinrichtung sowie Computerprogramm hierzu
DE102018102412.6 2018-02-02

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