WO2019127735A1 - 偏光片光学参数的测量方法及测量装置 - Google Patents

偏光片光学参数的测量方法及测量装置 Download PDF

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WO2019127735A1
WO2019127735A1 PCT/CN2018/073212 CN2018073212W WO2019127735A1 WO 2019127735 A1 WO2019127735 A1 WO 2019127735A1 CN 2018073212 W CN2018073212 W CN 2018073212W WO 2019127735 A1 WO2019127735 A1 WO 2019127735A1
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brightness
state
compensation film
polarizer
pva layer
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PCT/CN2018/073212
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English (en)
French (fr)
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海博
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惠州市华星光电技术有限公司
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Priority to US15/752,425 priority Critical patent/US10746628B2/en
Publication of WO2019127735A1 publication Critical patent/WO2019127735A1/zh

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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G02B5/3083—Birefringent or phase retarding elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G02B5/3025—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
    • G02B5/3033—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state in the form of a thin sheet or foil, e.g. Polaroid
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G02B5/3025—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
    • G02B5/3033—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state in the form of a thin sheet or foil, e.g. Polaroid
    • G02B5/3041—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state in the form of a thin sheet or foil, e.g. Polaroid comprising multiple thin layers, e.g. multilayer stacks
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G02B5/3025—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state

Definitions

  • the present invention relates to the field of polarizer technology, and in particular to a method and a measuring device for measuring optical parameters of a polarizer.
  • HDR High-Dynamic Range
  • peak brightness and dark state brightness are required.
  • the actual requirement is contrast leveling and contrast enhancement. Therefore, it is important to improve the contrast of the liquid crystal panel by reducing the dark state transmittance of the polarizer and increasing the degree of polarization of the polarizer.
  • the polarizer is a multilayer film composite structure, and generally includes a PVA layer, a compensation film, etc., and affecting the polarization degree of the polarizer, not only the PVA layer of the core layer, but also the compensation film layer affects the degree of polarization, thereby affecting the contrast of the liquid crystal panel. How to clarify the influence of the polarizer is very important. Only by clarifying the influence of the film layer, it is possible to improve the overall structure and improve the polarization and panel contrast.
  • the commonly used liquid crystal panel display mode is VA mode, etc.
  • the VA display is a normally aligned black mode, and the upper and lower substrate polarizer absorption axes are vertically offset.
  • the polarizer plays a vital role throughout the display.
  • the polarizer absorbs light in a direction perpendicular to the polarization axis, and transmits only light in the direction of the polarization axis, and converts the natural light into linearly polarized light.
  • Such materials exist in the form of a film or a sheet, and thus are often referred to as a polarizing film or a polarizing plate.
  • the dark state brightness has a great influence on the contrast of the liquid crystal panel. See Table 1 for details:
  • the effect of dark state brightness on contrast is a decisive factor. Therefore, it is important to improve the contrast of the liquid crystal panel by reducing the brightness of the dark state of the polarizer and increasing the degree of polarization of the polarizer.
  • the main factors affecting the dark state transmittance and the degree of polarization in the polarizer are the PVA layer and the compensation film.
  • the current measurement is to measure the whole of the polarizer, and it is impossible to clarify which layer affects the dark state.
  • an object of the present invention is to provide a method and a measuring device for measuring optical parameters of a polarizer to measure the influence of each layer in the polarizer on the optical performance of the polarizer.
  • the ray polarized light passes through the compensation film and the PVA layer in sequence, and obtains the first measurement parameter and the second measurement parameter when the brightness of the polarized light emitted by the polarizer is the lowest and the brightness is the highest;
  • the ray polarized light passes through the PVA layer and the compensation film in sequence, and obtains the third measurement parameter and the fourth measurement parameter when the brightness of the emitted light of the polarizer is the lowest and the brightness is the highest in the state;
  • optical parameters of the compensation film and/or the PVA layer in the polarizer according to one or more of the first measurement parameter, the second measurement parameter, the third measurement parameter, and the fourth measurement parameter, where the optical parameter includes a dark state brightness, Any one or more of contrast and polarization.
  • the first measurement parameter in the first state includes a dark state brightness Lv 1
  • the second measurement parameter includes a brightness state brightness Lv 2
  • the third measurement parameter in the second state includes a dark state
  • the fourth measurement parameter includes a bright state brightness Lv 4 .
  • the optical parameters include any one or more of the following:
  • the effect of the PVA layer on the brightness of the dark state is: Lv 3 ;
  • the effect of the PVA layer and the compensation film on the brightness of the dark state is: Lv 1 ;
  • the effect of the compensation film on the brightness of the dark state is: Lv 1 - Lv 3 ;
  • the measuring method further comprises:
  • the third penetration spectrum and the fourth penetration spectrum are obtained when the brightness of the emitted light of the polarizer is the lowest and the brightness is the highest.
  • the first measurement parameter in the first state includes a dark state transmittance T 1 ⁇
  • the second measurement parameter includes a light state transmittance T 2//
  • the third measurement parameter includes a dark state transmittance T 3 ⁇
  • the fourth measurement parameter includes a bright state transmittance T 4 // .
  • the optical parameters include any one or more of the following:
  • the effect of the PVA layer on the brightness of the dark state is: T 3 ⁇ ;
  • the effect of the PVA layer and the compensation film on the brightness of the dark state is: T 1 ⁇ ;
  • the effect of the compensation film on the brightness of the dark state is: T 1 ⁇ -T 3 ⁇ ;
  • the polarizer further comprises one or more of a substrate layer, a protective layer, and a bonding layer.
  • a measuring device for optical parameters of a polarizer comprising a light source disposed along an optical path, a first stage, a rotatable stage, a second stage, and a brightness measuring instrument, wherein the first load a through hole is arranged on the table, the rotatable stage, and the second stage, so that the brightness measuring instrument can receive the light emitted by the light source, and the first stage and the second stage are respectively used for carrying Standard polarizer, the rotatable stage is used to carry the polarizer to be measured.
  • the first stage, the rotatable stage, and the second stage are respectively provided with reference edges for limiting the polarizer placed thereon.
  • the brightness measuring instrument is a spectrophotometer.
  • the measuring device of the invention has simple structure, simple and easy operation method, and has the advantages of low cost, quickness and convenience;
  • the invention can measure the influence of the compensation film and/or the PVA layer on the dark state brightness, the contrast and the polarization degree of the polarizer in the polarizer, thereby improving the optical performance of the polarizer in a targeted manner.
  • FIG. 1 is a schematic structural view of a polarizing plate in the prior art.
  • FIG. 2 is a schematic structural view of a liquid crystal panel in the prior art.
  • FIG. 3 is a schematic flow chart of a method for measuring optical parameters of a polarizer according to the present invention.
  • FIG. 4 and FIG. 5 are respectively schematic diagrams of measurement of the first state and the second state in Embodiment 1 of the present invention.
  • FIG. 6 and FIG. 7 are respectively schematic diagrams of measurement of a first state and a second state in Embodiment 2 of the present invention.
  • FIGS. 8 and 9 are schematic diagrams of measurement of a first state and a second state in Embodiment 3 of the present invention, respectively.
  • 10 and 11 are schematic diagrams showing measurement of a first state and a second state in Embodiment 4 of the present invention.
  • Figure 12 is a schematic structural view of an optical parameter measuring device for a polarizer according to Embodiment 7 of the present invention.
  • first and second are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated.
  • features defining “first” or “second” may include at least one of the features, either explicitly or implicitly.
  • the meaning of “multiple” is at least two, for example, two, three, etc., unless specifically defined otherwise.
  • the polarizer has a great influence on the dark state, and the main factors affecting the dark state of the liquid crystal panel by the polarizer are:
  • the degree of polarization of the polarizer itself, the uniformity of the arrangement of the polarizers and the angle of the direction can affect the polarization of the polarizer;
  • the compensation film, the polarizer used in the VA liquid crystal display mode is provided with a compensation film, and if the optical axis of the compensation film is not 0 or 90 degrees with the absorption axis of the polarizer, the linearly polarized light passing through the polarizer is changed.
  • the polarization state is changed to elliptically polarized light, which is transmitted from the upper polarizing plate, causing light leakage, which affects dark state brightness and polarization.
  • FIG. 1 is a schematic structural view of a polarizer, which in turn includes a PSA bonding layer, a compensation film, a PVA layer, and a TAC protective layer.
  • FIG. 2 is a schematic structural view of a liquid crystal panel, which in turn includes a backlight, a lower TAC protective layer, a lower PVA layer, a lower compensation film, a lower PSA bonding layer, a liquid crystal cell, an upper PSA bonding layer, an upper compensation film, Upper PVA layer and upper TAC protection layer.
  • the visible light source emitted by the backlight is polarized by the lower polarizing plate, passes through the liquid crystal cell, and passes through the upper polarizing plate.
  • the present invention discloses a method for measuring optical parameters of a polarizer.
  • the polarizer includes a compensation film and a PVA layer, and the measurement method includes:
  • the ray polarized light passes through the compensation film and the PVA layer in sequence, and obtains the first measurement parameter and the second measurement parameter when the brightness of the polarized light emitted by the polarizer is the lowest and the brightness is the highest;
  • the ray polarized light passes through the PVA layer and the compensation film in sequence, and obtains the third measurement parameter and the fourth measurement parameter when the brightness of the emitted light of the polarizer is the lowest and the brightness is the highest in the state;
  • optical parameters of the compensation film and/or the PVA layer in the polarizer according to one or more of the first measurement parameter, the second measurement parameter, the third measurement parameter, and the fourth measurement parameter, where the optical parameter includes a dark state brightness, Any one or more of contrast and polarization.
  • the polarizer to be measured in this embodiment includes a PSA bonding layer, a compensation film, a PVA layer, and a TAC protective layer.
  • the dark state brightness and polarization can be affected by changing the polarization state of the ray polarized light, while outside the PVA layer (as shown in Figure 5), The dark state brightness and the polarizer polarization are not affected.
  • a measurement method can be designed to detect the case where the compensation film and/or the PVA layer affect the dark state brightness and the degree of polarization.
  • the incident ray polarized light sequentially passes through the compensation film and the PVA layer, and obtains the first measurement parameter and the second measurement parameter when the brightness of the polarized light emitted by the polarizer is the lowest and the brightness is the highest;
  • the incident ray polarized light sequentially passes through the PVA layer and the compensation film, and obtains the third measurement parameter and the fourth measurement parameter when the brightness of the polarized light emitted by the polarizer is the lowest and the brightness is the highest;
  • optical parameters of the compensation film and/or the PVA layer in the polarizer are obtained according to one or more of the first measurement parameter, the second measurement parameter, the third measurement parameter and the fourth measurement parameter, and the optical parameters include dark state brightness and contrast Any one or more of the degree of polarization.
  • the incoming ray polarized light passes through the compensation film and then passes through the PVA layer.
  • the compensation film if the optical axis of the compensation film and the absorption axis of the PVA layer have an angle of not 0 or 90 degrees, the polarized light of the incident light will become elliptically polarized light, and there will be light leakage when passing through the PVA layer, which affects the brightness and polarization of the dark state.
  • Sheet polarization if the optical axis of the compensation film and the absorption axis of the PVA layer have an angle of not 0 or 90 degrees, the polarized light of the incident light will become elliptically polarized light, and there will be light leakage when passing through the PVA layer, which affects the brightness and polarization of the dark state. Sheet polarization.
  • the incident ray polarized light passes through the PVA layer and then passes through the compensation film.
  • the incident polarized light is also linearly polarized, and then passes through the compensation film. Even if the optical axis and the absorption axis of the PVA layer have an angle of not 0 or 90 degrees, the incident polarized light will become elliptically polarized light, but not Will affect the light intensity, so it does not affect the dark state brightness and polarizer polarization.
  • the influence of the compensation film and the PVA layer on the dark state brightness, contrast, and polarization degree can be estimated by the measurement results in the above two states.
  • the polarizer to be measured in this embodiment includes a PSA bonding layer, a compensation film, and a PVA layer. Compared with the first embodiment, the polarizer in this embodiment removes the TAC protective layer, and the measurement accuracy can be improved.
  • the measurement method is exactly the same as that in Embodiment 1, and will not be described again here.
  • the polarizer to be measured in this embodiment includes a compensation film and a PVA layer.
  • the polarizer in this embodiment removes the TAC protective layer and the PSA bonding layer, and the measurement accuracy can be improved.
  • the measurement method is exactly the same as that in Embodiment 1, and will not be described again here.
  • the polarizer to be measured in this embodiment comprises a PSA bonding layer, a compensation film, a PVA layer, and a PET substrate layer.
  • the measurement method is exactly the same as that in Embodiment 1, and will not be described again here.
  • the polarizer comprises a compensation film and a PVA layer
  • the measuring method comprises:
  • the ray polarized light passes through the compensation film and the PVA layer in sequence, and obtains the first measurement parameter and the second measurement parameter when the brightness of the emitted light of the polarizer is the lowest and the brightness is the highest in the state;
  • the measurement parameters include the dark state brightness Lv 1 and the second measurement parameter includes the bright state brightness Lv 2 .
  • the incident ray polarized light sequentially passes through the PVA layer and the compensation film, and obtains the third measurement parameter and the fourth measurement parameter when the brightness of the polarized light emitted by the polarizer is the lowest and the brightness is the highest;
  • the measurement parameters include the dark state brightness Lv 3
  • the fourth measurement parameter includes the bright state brightness Lv 4 .
  • optical parameters of the compensation film and/or the PVA layer in the polarizer according to one or more of the first measurement parameter, the second measurement parameter, the third measurement parameter, and the fourth measurement parameter, and the specific optical parameter is any one of the following Or multiple:
  • the effect of the PVA layer on the brightness of the dark state is: Lv 3 ;
  • the effect of the PVA layer and the compensation film on the brightness of the dark state is: Lv 1 ;
  • the effect of the compensation film on the brightness of the dark state is: Lv 1 - Lv 3 ;
  • the measurement method in this embodiment may further include:
  • the third penetration spectrum and the fourth penetration spectrum are obtained when the brightness of the emitted light of the polarizer is the lowest and the brightness is the highest.
  • the influence of a specific wavelength on the optical parameters of the polarizer can be analyzed.
  • the polarizer comprises a compensation film and a PVA layer
  • the measuring method comprises:
  • the ray polarized light passes through the compensation film and the PVA layer in sequence, and obtains the first measurement parameter and the second measurement parameter when the brightness of the emitted light of the polarizer is the lowest and the brightness is the highest in the state;
  • the measurement parameters include the dark state transmittance T 1 ⁇ and the second measurement parameter includes the bright state transmittance T 2 / / .
  • the incident ray polarized light sequentially passes through the PVA layer and the compensation film, and obtains the third measurement parameter and the fourth measurement parameter when the brightness of the polarized light emitted by the polarizer is the lowest and the brightness is the highest;
  • the measurement parameters include the dark state transmittance T 3 ⁇
  • the fourth measurement parameter includes the bright state transmittance T 4 / / .
  • optical parameters of the compensation film and/or the PVA layer in the polarizer according to one or more of the first measurement parameter, the second measurement parameter, the third measurement parameter, and the fourth measurement parameter, and the specific optical parameter is any one of the following Or multiple:
  • the effect of the PVA layer on the brightness of the dark state is: T 3 ⁇ ;
  • the effect of the PVA layer and the compensation film on the brightness of the dark state is: T 1 ⁇ ;
  • the effect of the compensation film on the brightness of the dark state is: T 1 ⁇ -T 3 ⁇ ;
  • the measuring device for the optical parameters of the polarizer in the embodiment includes the light source 10 disposed along the optical path, the first stage 20, the rotatable stage 30, the second stage 40, and the brightness measurement. Instrument 50.
  • the first stage 20, the rotatable stage 30, and the second stage 40 are respectively provided with through holes 21, 31, 41 to enable the brightness measuring instrument 50 to receive the light emitted by the light source 10.
  • the first stage 20 and the second stage 40 are respectively used for carrying a standard polarizer, and 30 sets of rotatable loads are used for carrying the polarizer to be measured, and the three stages need to be aligned, that is, the angles are uniform.
  • the first stage 20, the rotatable stage 30, and the second stage 40 are respectively provided with reference sides for limiting the polarizer placed thereon.
  • the stage is square or rectangular, and the four sides of the stage are reference sides.
  • the reference edge of the polarizer can be placed in alignment with the reference edge of the stage.
  • the rotatable stage 30 is rotatable, and is connected to the servo motor.
  • the servo motor precisely controls the rotation, the rotation precision can reach 0.01 degrees, and the rotation angle is a plane 0-360 degree rotation.
  • the brightness measuring instrument needs to use high-precision measuring equipment.
  • the spectrophotometer is used for measurement, such as the CS2000, CS2000A and SR-UL2 spectrophotometers, and has the spectrum measuring function.
  • Example 7 Using the measuring apparatus of Example 7, three different polarizers were measured by the method of Example 6, and the results are shown in Table 2-4.
  • the PVA layers of the three polarizers themselves have a relatively dark state, and the compensation film of the third film has the greatest influence on the dark state of the polarizer.
  • the measuring device of the invention has simple structure, simple and easy operation method, and has the advantages of low cost, quickness and convenience;
  • the invention can measure the influence of the compensation film and/or the PVA layer on the dark state brightness, the contrast and the polarization degree of the polarizer in the polarizer, thereby improving the optical performance of the polarizer in a targeted manner.

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Abstract

本发明公开了一种偏光片光学参数的测量方法及测量装置，偏光片包括补偿膜和PVA层，测量方法包括：第一状态下，入射线偏振光依次经过补偿膜和PVA层，获取该状态下偏光片出射光线亮度最低和亮度最高时的第一测量参数和第二测量参数；第二状态下，入射线偏振光依次经过PVA层和补偿膜，获取该状态下偏光片出射光线亮度最低和亮度最高时的第三测量参数和第四测量参数；根据第一测量参数、第二测量参数、第三测量参数及第四测量参数中的一个或多个获取偏光片中补偿膜和/或PVA层的光学参数，光学参数包括暗态亮度、对比度、偏光度中的任意一种或多种。本发明能够测量得到偏光片中补偿膜和/或PVA层对偏光片光学参数的影响，从而针对性改善偏光片的光学性能。

Description

偏光片光学参数的测量方法及测量装置 技术领域
本发明涉及偏光片技术领域，特别是涉及一种偏光片光学参数的测量方法及测量装置。
背景技术
HDR(High-Dynamic Range，高动态范围图像)规格中要求峰值亮度和暗态亮度，实际要求为对比的层次感及对比度提升。因此，通过降低偏光片的暗态穿透率和提高偏光片的偏光度对提升液晶面板的对比度至关重要。
偏光片是多层膜组合结构，通常包括PVA层、补偿膜等，影响偏光片偏光度的不仅仅只有核心层的PVA层，补偿膜层也会影响偏光度，从而影响液晶面板的对比度。如何理清偏光片的影响膜层很重要，只有理清了影响膜层，才能针对性的去改善优化整体结构，提高偏光度和面板对比度。
常用的液晶面板显示模式为VA模式等，VA显示是一种垂直配向的常黑模式，其上下基板偏光片吸收轴垂直偏贴。在整个显示过程中，偏光片起到至关重要的作用。偏光片吸收与偏光轴垂直方向的光，只让偏光轴方向的光透过，把自然光转变成线偏振光。这种材料都是以膜或板的形式存在，因此常被成为偏光膜或偏光板。
而暗态亮度对液晶面板的对比度影响很大。具体参表1所示：
表1：液晶面板暗态亮度对对比度的影响
Figure PCTCN2018073212-appb-000001
Figure PCTCN2018073212-appb-000002
如上表可以看出，暗态亮度对对比度的影响取决定性的因素。所以通过降低偏光片的暗态亮度和提高偏光片的偏光度对提升液晶面板的对比度至关重要。
偏光片中影响暗态穿透率和偏光度的主要因素是PVA层和补偿膜，目前量测是量测偏光片整体，无法理清是哪一层影响暗态表现。
因此，针对上述技术问题，有必要提供一种偏光片光学参数的测量方法及测量装置。
发明内容
为克服现有技术的不足，本发明的目的在于提供一种偏光片光学参数的测量方法及测量装置，以测量偏光片中各层对偏光片光学性能的影响。
为了实现上述目的，本发明一实施例提供的技术方案如下：
一种偏光片光学参数的测量方法，偏光片包括补偿膜和PVA层，所述测量方法包括：
第一状态下，入射线偏振光依次经过补偿膜和PVA层，获取该状态下偏光片出射光线亮度最低和亮度最高时的第一测量参数和第二测量参数；
第二状态下，入射线偏振光依次经过PVA层和补偿膜，获取该状态下偏光片出射光线亮度最低和亮度最高时的第三测量参数和第四测量参数；
根据第一测量参数、第二测量参数、第三测量参数及第四测量参数中的一个或多个获取偏光片中补偿膜和/或PVA层的光学参数，所述光学参数包括暗态亮度、对比度、偏光度中的任意一种或多种。
作为本发明的进一步改进，所述第一状态下的第一测量参数包括暗态亮度 Lv 1，第二测量参数包括亮态亮度Lv 2；所述第二状态下的第三测量参数包括暗态亮度Lv 3，第四测量参数包括亮态亮度Lv 4。
作为本发明的进一步改进，所述光学参数包括下述任意一种或多种：
PVA层对暗态亮度的影响为：Lv 3；
PVA层和补偿膜对暗态亮度的影响为：Lv 1；
补偿膜对暗态亮度的影响为：Lv 1-Lv 3；
PVA层对对比度的影响为：Lv 4/Lv 3；
PVA层和补偿膜对对比度的影响为：Lv 2/Lv 1；
补偿膜对对比度的影响为：(Lv 4/Lv 3)-(Lv 2/Lv 1)；
PVA层对偏光度的影响为：(Lv 4-Lv 3)/(Lv 3+Lv 4)；
PVA层和补偿膜对偏光度的影响为：(Lv 2-Lv 1)/(Lv 1+Lv 2)；
补偿膜对偏光度的影响为：(Lv 4-Lv 3)/(Lv 3+Lv 4)-(Lv 2-Lv 1)/(Lv 1+Lv 2)。
作为本发明的进一步改进，所述测量方法还包括：
第一状态下，获取偏光片出射光线亮度最低和亮度最高时的第一穿透频谱和第二穿透频谱；
第二状态下，获取偏光片出射光线亮度最低和亮度最高时的第三穿透频谱和第四穿透频谱。
作为本发明的进一步改进，所述第一状态下的第一测量参数包括暗态穿透率T 1⊥，第二测量参数包括亮态穿透率T 2//；所述第二状态下的第三测量参数包括暗态穿透率T 3⊥，第四测量参数包括亮态穿透率T 4//。
作为本发明的进一步改进，所述光学参数包括下述任意一种或多种：
PVA层对暗态亮度的影响为：T 3⊥；
PVA层和补偿膜对暗态亮度的影响为：T 1⊥；
补偿膜对暗态亮度的影响为：T 1⊥-T 3⊥；
PVA层对偏光度的影响为：(T 4//-T 3⊥)/(T 3⊥+T 4//)；
PVA层和补偿膜对偏光度的影响为：(T 2//-T 1⊥)/(T 1⊥+T 2//)；
补偿膜对偏光度的影响为：(T 4//-T 3⊥)/(T 3⊥+T 4//)-√(T 2//-T 1⊥)/(T 1⊥+T 2//)。
作为本发明的进一步改进，所述偏光片还包括基材层、保护层、粘结层中的一种或多种。
本发明另一实施例提供的技术方案如下：
一种偏光片光学参数的测量装置，所述测量装置包括沿光路设置的光源、第一载物台、可旋转载物台、第二载物台、及亮度测量仪，其中，第一载物台、可旋转载物台、及第二载物台上设有通孔，以使亮度测量仪能够接收到光源发出的光线，所述第一载物台和第二载物台分别用于承载标准偏光片，可旋转载物台用于承载待测量偏光片。
作为本发明的进一步改进，所述第一载物台、可旋转载物台、及第二载物台分别设有基准边，用于对放置于其上的偏光片进行限位。
作为本发明的进一步改进，所述亮度测量仪为分光光度计。
本发明测量装置结构简单，测量方法简单易操作，具有成本低、快捷、方便等优点；
本发明能够测量得到偏光片中补偿膜和/或PVA层对偏光片暗态亮度、对比度、偏光度的影响，从而针对性改善偏光片的光学性能。
附图说明
为了更清楚地说明本发明实施例或现有技术中的技术方案，下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍，显而易见地，下面描述 中的附图仅仅是本发明中记载的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获得其他的附图。
图1为现有技术中偏振片的结构示意图。
图2为现有技术中液晶面板的结构示意图。
图3为本发明偏光片光学参数测量方法的流程示意图。
图4、图5分别为本发明实施例1中第一状态和第二状态的测量示意图。
图6、图7分别为本发明实施例2中第一状态和第二状态的测量示意图。
图8、图9分别为本发明实施例3中第一状态和第二状态的测量示意图。
图10、图11分别为本发明实施例4中第一状态和第二状态的测量示意图。
图12为本发明实施例7中偏光片光学参数测量装置的结构示意图。
具体实施方式
为了使本技术领域的人员更好地理解本发明中的技术方案，下面将结合本发明实施例中的附图，对本发明实施例中的技术方案进行清楚、完整地描述，显然，所描述的实施例仅仅是本发明一部分实施例，而不是全部的实施例。基于本发明中的实施例，本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例，都应当属于本发明保护的范围。
本文使用的例如“上”、“上方”、“下”、“下方”等表示空间相对位置的术语是出于便于说明的目的来描述如附图中所示的一个单元或特征相对于另一个单元或特征的关系。空间相对位置的术语可以旨在包括设备在使用或工作中除了图中所示方位以外的不同方位。例如，如果将图中的设备翻转，则被描述为位于其他单元或特征“下方”或“之下”的单元将位于其他单元或特征“上方”。 因此，示例性术语“下方”可以囊括上方和下方这两种方位。设备可以以其他方式被定向(旋转90度或其他朝向)，并相应地解释本文使用的与空间相关的描述语。
此外，术语“第一”、“第二”仅用于描述目的，而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此，限定有“第一”、“第二”的特征可以明示或者隐含地包括至少一个该特征。在本发明的描述中，“多种”的含义是至少两种，例如两种，三种等，除非另有明确具体的限定。
如背景技术所讲，偏光片对暗态影响影响很大，偏光片影响液晶面板暗态的主要因素为：
1、偏光片本身的偏光度，偏光片排列的整齐度及方向角度均可影响偏光片偏光度；
2、补偿膜，在VA液晶显示模式中使用的偏光片是含有补偿膜的，补偿膜光轴如果与偏光片吸收轴夹角非0度或90度，就会改变经过偏光片线偏振光的偏振态，改为椭圆偏振光，从而从上偏振片透过，导致漏光，影响暗态亮度和偏光度。
3、上下吸收轴是否垂直。
参图1所示为一偏光片的结构示意图，其依次包括PSA粘结层、补偿膜、PVA层、TAC保护层。
参图2所示为一液晶面板的结构示意图，其依次包括背光、下TAC保护层、下PVA层、下补偿膜、下PSA粘结层、液晶单元、上PSA粘结层、上补偿膜、上PVA层、及上TAC保护层。背光发出的可见光源通过下偏振片起偏变为线偏振光，通过液晶单元，再通过上偏振片。
参图3所示，本发明公开了一种偏光片光学参数的测量方法，偏光片包括 补偿膜和PVA层，测量方法包括：
第一状态下，入射线偏振光依次经过补偿膜和PVA层，获取该状态下偏光片出射光线亮度最低和亮度最高时的第一测量参数和第二测量参数；
第二状态下，入射线偏振光依次经过PVA层和补偿膜，获取该状态下偏光片出射光线亮度最低和亮度最高时的第三测量参数和第四测量参数；
根据第一测量参数、第二测量参数、第三测量参数及第四测量参数中的一个或多个获取偏光片中补偿膜和/或PVA层的光学参数，所述光学参数包括暗态亮度、对比度、偏光度中的任意一种或多种。
以下结合具体实施例对本发明作详细说明。
实施例1：
参图4、图5所示，本实施例中的待测量的偏光片包括PSA粘结层、补偿膜、PVA层、及TAC保护层。
基于补偿膜在只有PVA层内侧时(如图4所示)，才能通过改变入射线偏振光的偏振态来影响暗态亮度和偏光度，而在PVA层外侧时(如图5所示)，则不影响暗态亮度和偏光片偏光度，根据这一原理可以设计测量方法来检测补偿膜和/或PVA层影响暗态亮度和偏光度的情况。
如图4所示，第一状态下，入射线偏振光依次经过补偿膜和PVA层，获取该状态下偏光片出射光线亮度最低和亮度最高时的第一测量参数和第二测量参数；
如图5所示，第二状态下，入射线偏振光依次经过PVA层和补偿膜，获取该状态下偏光片出射光线亮度最低和亮度最高时的第三测量参数和第四测量参数；
最后根据第一测量参数、第二测量参数、第三测量参数及第四测量参数中 的一个或多个获取偏光片中补偿膜和/或PVA层的光学参数，光学参数包括暗态亮度、对比度、偏光度中的任意一种或多种。
第一状态下，入射线偏振光先经过补偿膜，再经过PVA层。经过补偿膜时，如果补偿膜光轴与PVA层吸收轴有非0或90度夹角，入射线偏振光会变为椭圆偏振光，再经过PVA层时会有漏光，影响暗态亮度和偏光片偏光度。
第二状态下，入射线偏振光先经过PVA层，再经过补偿膜。经过PVA层时，入射线偏振光还是线偏振光，再经过补偿膜，即使光轴与PVA层吸收轴有非0或90度夹角，入射线偏振光是会变为椭圆偏振光，但不会影响光强，所以不影响暗态亮度和偏光片偏光度。
通过上述两种状态下的测量结果即可推算补偿膜和PVA层对暗态亮度、对比度、及偏光度的影响。
实施例2：
参图6、图7所示，本实施例中的待测量的偏光片包括PSA粘结层、补偿膜、及PVA层。与实施例1相比，本实施例中的偏光片去除了TAC保护层，可以提高测量精度。
其测量方法与实施例1中完全相同，此处不再进行赘述。
实施例3：
参图8、图9所示，本实施例中的待测量的偏光片包括补偿膜及PVA层。与实施例1相比，本实施例中的偏光片去除了TAC保护层和PSA粘结层，可以提高测量精度。
其测量方法与实施例1中完全相同，此处不再进行赘述。
实施例4：
参图10、图11所示，本实施例中的待测量的偏光片包括PSA粘结层、补 偿膜、PVA层、及PET基材层。
其测量方法与实施例1中完全相同，此处不再进行赘述。
实施例5：
本实施例的偏光片光学参数的测量方法，偏光片包括补偿膜和PVA层，测量方法包括：
参图8所示，第一状态下，入射线偏振光依次经过补偿膜和PVA层，获取该状态下偏光片出射光线亮度最低和亮度最高时的第一测量参数和第二测量参数；第一测量参数包括暗态亮度Lv 1，第二测量参数包括亮态亮度Lv 2。
参图9所示，第二状态下，入射线偏振光依次经过PVA层和补偿膜，获取该状态下偏光片出射光线亮度最低和亮度最高时的第三测量参数和第四测量参数；第三测量参数包括暗态亮度Lv 3，第四测量参数包括亮态亮度Lv 4。
根据第一测量参数、第二测量参数、第三测量参数及第四测量参数中的一个或多个获取偏光片中补偿膜和/或PVA层的光学参数，具体光学参数为下述任意一种或多种：
PVA层对暗态亮度的影响为：Lv 3；
PVA层和补偿膜对暗态亮度的影响为：Lv 1；
补偿膜对暗态亮度的影响为：Lv 1-Lv 3；
PVA层对对比度的影响为：Lv 4/Lv 3；
PVA层和补偿膜对对比度的影响为：Lv 2/Lv 1；
补偿膜对对比度的影响为：(Lv 4/Lv 3)-(Lv 2/Lv 1)；
PVA层对偏光度的影响为：(Lv 4-Lv 3)/(Lv 3+Lv 4)；
PVA层和补偿膜对偏光度的影响为：(Lv 2-Lv 1)/(Lv 1+Lv 2)；
补偿膜对偏光度的影响为：(Lv 4-Lv 3)/(Lv 3+Lv 4)-(Lv 2-Lv 1)/(Lv 1+Lv 2)。
进一步地，本实施例中的测量方法还可包括：
第一状态下，获取偏光片出射光线亮度最低和亮度最高时的第一穿透频谱和第二穿透频谱；
第二状态下，获取偏光片出射光线亮度最低和亮度最高时的第三穿透频谱和第四穿透频谱。
通过穿透频谱的测量，可以分析特定波长对偏光片光学参数的影响。
实施例6：
本实施例的偏光片光学参数的测量方法，偏光片包括补偿膜和PVA层，测量方法包括：
参图8所示，第一状态下，入射线偏振光依次经过补偿膜和PVA层，获取该状态下偏光片出射光线亮度最低和亮度最高时的第一测量参数和第二测量参数；第一测量参数包括暗态穿透率T 1⊥，第二测量参数包括亮态穿透率T 2//。
参图9所示，第二状态下，入射线偏振光依次经过PVA层和补偿膜，获取该状态下偏光片出射光线亮度最低和亮度最高时的第三测量参数和第四测量参数；第三测量参数包括暗态穿透率T 3⊥，第四测量参数包括亮态穿透率T 4//。
根据第一测量参数、第二测量参数、第三测量参数及第四测量参数中的一个或多个获取偏光片中补偿膜和/或PVA层的光学参数，具体光学参数为下述任意一种或多种：
PVA层对暗态亮度的影响为：T 3⊥；
PVA层和补偿膜对暗态亮度的影响为：T 1⊥；
补偿膜对暗态亮度的影响为：T 1⊥-T 3⊥；
PVA层对偏光度的影响为：(T 4//-T 3⊥)/(T 3⊥+T 4//)；
PVA层和补偿膜对偏光度的影响为：(T 2//-T 1⊥)/(T 1⊥+T 2//)；
补偿膜对偏光度的影响为：(T 4//-T 3⊥)/(T 3⊥+T 4//)-√(T 2//-T 1⊥)/(T 1⊥+T 2//)。
实施例7：
参图12所示，本实施例中偏光片光学参数的测量装置，包括沿光路设置的光源10、第一载物台20、可旋转载物台30、第二载物台40、及亮度测量仪50。
其中，第一载物台20、可旋转载物台30、第二载物台40上分别设有通孔21、31、41，以使亮度测量仪50能够接收到光源10发出的光线。第一载物台20和第二载物台40分别用于承载标准偏光片，可旋转载物30台用于承载待测量偏光片，且三个载物台需要对齐，即角度一致。
第一载物台20、可旋转载物台30、第二载物台40分别设有基准边，用于对放置于其上的偏光片进行限位。这里，载物台为正方形或长方形，载物台的四边为基准边。这样在放置标准偏光片和待测量偏光片时可以用偏光片的基准边与载物台的基准边对齐放置。
可旋转载物台30可旋转，其和伺服马达相连接，通过伺服马达精确控制转动，转动精度可达到0.01度，转动角度为平面0-360度旋转。
亮度测量仪需要采用高精度的测量设备，这里选用分光光度计进行测量，如CS2000，CS2000A和SR-UL2等分光光度计，同时具有频谱测量功能。
实施例8：
采用实施例7中的测量装置，通过实施例6中的方法对3片不同的偏光片进行测量，得到结果如表2-4。
表2：PVA层和补偿膜的共同光学参数
Figure PCTCN2018073212-appb-000003
Figure PCTCN2018073212-appb-000004
表3：PVA层的光学参数
Figure PCTCN2018073212-appb-000005
表4：补偿膜的光学参数
  第一片 第二片 第三片
垂直穿透率 -0.0003 -0.0004 -0.0007
偏光度 0.0008 0.0010 0.0019
对比度 5458 6554 11625
通过上述参数，可知三片偏光片本身的PVA层暗态表现较一致，第三片的补偿膜对该片偏光片的暗态影响最大。
由以上技术方案可以看出，本发明具有以下有益效果：
本发明测量装置结构简单，测量方法简单易操作，具有成本低、快捷、方便等优点；
本发明能够测量得到偏光片中补偿膜和/或PVA层对偏光片暗态亮度、对比度、偏光度的影响，从而针对性改善偏光片的光学性能。
对于本领域技术人员而言，显然本发明不限于上述示范性实施例的细节，而且在不背离本发明的精神或基本特征的情况下，能够以其他的具体形式实现本发明。因此，无论从哪一点来看，均应将实施例看作是示范性的，而且是非限制性的，本发明的范围由所附权利要求而不是上述说明限定，因此旨在将落在权利要求的等同要件的含义和范围内的所有变化囊括在本发明内。不应将权利要求中的任何附图标记视为限制所涉及的权利要求。
此外，应当理解，虽然本说明书按照实施方式加以描述，但并非每个实施方式仅包含一个独立的技术方案，说明书的这种叙述方式仅仅是为清楚起见，本领域技术人员应当将说明书作为一个整体，各实施例中的技术方案也可以经适当组合，形成本领域技术人员可以理解的其他实施方式。

Claims (16)

  1. 一种偏光片光学参数的测量方法，偏光片包括补偿膜和PVA层，其中，所述测量方法包括：
    第一状态下，入射线偏振光依次经过补偿膜和PVA层，获取该状态下偏光片出射光线亮度最低和亮度最高时的第一测量参数和第二测量参数；
    第二状态下，入射线偏振光依次经过PVA层和补偿膜，获取该状态下偏光片出射光线亮度最低和亮度最高时的第三测量参数和第四测量参数；
    根据第一测量参数、第二测量参数、第三测量参数及第四测量参数中的一个或多个获取偏光片中补偿膜和/或PVA层的光学参数，所述光学参数包括暗态亮度、对比度、偏光度中的任意一种或多种。
  2. 根据权利要求1所述的测量方法，其中，所述第一状态下的第一测量参数包括暗态亮度Lv 1，第二测量参数包括亮态亮度Lv 2；所述第二状态下的第三测量参数包括暗态亮度Lv 3，第四测量参数包括亮态亮度Lv 4。
  3. 根据权利要求2所述的测量方法，其中，所述光学参数包括下述任意一种或多种：
    PVA层对暗态亮度的影响为：Lv 3；
    PVA层和补偿膜对暗态亮度的影响为：Lv 1；
    补偿膜对暗态亮度的影响为：Lv 1-Lv 3；
    PVA层对对比度的影响为：Lv 4/Lv 3；
    PVA层和补偿膜对对比度的影响为：Lv 2/Lv 1；
    补偿膜对对比度的影响为：(Lv 4/Lv 3)-(Lv 2/Lv 1)；
    PVA层对偏光度的影响为：(Lv 4-Lv 3)/(Lv 3+Lv 4)；
    PVA层和补偿膜对偏光度的影响为：(Lv 2-Lv 1)/(Lv 1+Lv 2)；
    补偿膜对偏光度的影响为：(Lv 4-Lv 3)/(Lv 3+Lv 4)-(Lv 2-Lv 1)/(Lv 1+Lv 2)。
  4. 根据权利要求2所述的测量方法，其中，所述测量方法还包括：
    第一状态下，获取偏光片出射光线亮度最低和亮度最高时的第一穿透频谱和第二穿透频谱；
    第二状态下，获取偏光片出射光线亮度最低和亮度最高时的第三穿透频谱和第四穿透频谱。
  5. 根据权利要求1所述的测量方法，其中，所述第一状态下的第一测量参数包括暗态穿透率T 1⊥，第二测量参数包括亮态穿透率T 2//；所述第二状态下的第三测量参数包括暗态穿透率T 3⊥，第四测量参数包括亮态穿透率T 4//。
  6. 根据权利要求5所述的测量方法，其中，所述光学参数包括下述任意一种或多种：
    PVA层对暗态亮度的影响为：T 3⊥；
    PVA层和补偿膜对暗态亮度的影响为：T 1⊥；
    补偿膜对暗态亮度的影响为：T 1⊥-T 3⊥；
    PVA层对偏光度的影响为：(T 4//-T 3⊥)/(T 3⊥+T 4//)；
    PVA层和补偿膜对偏光度的影响为：(T 2//-T 1⊥)/(T 1⊥+T 2//)；
    补偿膜对偏光度的影响为：(T 4//-T 3⊥)/(T 3⊥+T 4//)-√(T 2//-T 1⊥)/(T 1⊥+T 2//)。
  7. 根据权利要求1所述的测量方法，其中，所述偏光片还包括基材层、保护层、粘结层中的一种或多种。
  8. 根据权利要求5所述的测量方法，其中，所述第一状态下的第一测量参数包括暗态亮度Lv 1，第二测量参数包括亮态亮度Lv 2；所述第二状态下的第三测量参数包括暗态亮度Lv 3，第四测量参数包括亮态亮度Lv 4。
  9. 根据权利要求8所述的测量方法，其中，所述光学参数包括下述任意一 种或多种：
    PVA层对暗态亮度的影响为：Lv 3；
    PVA层和补偿膜对暗态亮度的影响为：Lv 1；
    补偿膜对暗态亮度的影响为：Lv 1-Lv 3；
    PVA层对对比度的影响为：Lv 4/Lv 3；
    PVA层和补偿膜对对比度的影响为：Lv 2/Lv 1；
    补偿膜对对比度的影响为：(Lv 4/Lv 3)-(Lv 2/Lv 1)；
    PVA层对偏光度的影响为：(Lv 4-Lv 3)/(Lv 3+Lv 4)；
    PVA层和补偿膜对偏光度的影响为：(Lv 2-Lv 1)/(Lv 1+Lv 2)；
    补偿膜对偏光度的影响为：(Lv 4-Lv 3)/(Lv 3+Lv 4)-(Lv 2-Lv 1)/(Lv 1+Lv 2)。
  10. 根据权利要求8所述的测量方法，其中，所述测量方法还包括：
    第一状态下，获取偏光片出射光线亮度最低和亮度最高时的第一穿透频谱和第二穿透频谱；
    第二状态下，获取偏光片出射光线亮度最低和亮度最高时的第三穿透频谱和第四穿透频谱。
  11. 根据权利要求6所述的测量方法，其中，所述第一状态下的第一测量参数包括暗态亮度Lv 1，第二测量参数包括亮态亮度Lv 2；所述第二状态下的第三测量参数包括暗态亮度Lv 3，第四测量参数包括亮态亮度Lv 4。
  12. 根据权利要求11所述的测量方法，其中，所述光学参数包括下述任意一种或多种：
    PVA层对暗态亮度的影响为：Lv 3；
    PVA层和补偿膜对暗态亮度的影响为：Lv 1；
    补偿膜对暗态亮度的影响为：Lv 1-Lv 3；
    PVA层对对比度的影响为：Lv 4/Lv 3；
    PVA层和补偿膜对对比度的影响为：Lv 2/Lv 1；
    补偿膜对对比度的影响为：(Lv 4/Lv 3)-(Lv 2/Lv 1)；
    PVA层对偏光度的影响为：(Lv 4-Lv 3)/(Lv 3+Lv 4)；
    PVA层和补偿膜对偏光度的影响为：(Lv 2-Lv 1)/(Lv 1+Lv 2)；
    补偿膜对偏光度的影响为：(Lv 4-Lv 3)/(Lv 3+Lv 4)-(Lv 2-Lv 1)/(Lv 1+Lv 2)。
  13. 根据权利要求11所述的测量方法，其中，所述测量方法还包括：
    第一状态下，获取偏光片出射光线亮度最低和亮度最高时的第一穿透频谱和第二穿透频谱；
    第二状态下，获取偏光片出射光线亮度最低和亮度最高时的第三穿透频谱和第四穿透频谱。
  14. 一种偏光片光学参数的测量装置，其中，所述测量装置包括沿光路设置的光源、第一载物台、可旋转载物台、第二载物台、及亮度测量仪，其中，第一载物台、可旋转载物台、及第二载物台上设有通孔，以使亮度测量仪能够接收到光源发出的光线，所述第一载物台和第二载物台分别用于承载标准偏光片，可旋转载物台用于承载待测量偏光片。
  15. 根据权利要求14所述的测量方法，其中，所述第一载物台、可旋转载物台、及第二载物台分别设有基准边，用于对放置于其上的偏光片进行限位。
  16. 根据权利要求14所述的测量方法，其中，所述亮度测量仪为分光光度计。
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