WO2019087474A1 - Electroless nickel-phosphorus-cobalt plating bath, and electroless nickel-phosphorus-cobalt plating film - Google Patents
Electroless nickel-phosphorus-cobalt plating bath, and electroless nickel-phosphorus-cobalt plating film Download PDFInfo
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- WO2019087474A1 WO2019087474A1 PCT/JP2018/026954 JP2018026954W WO2019087474A1 WO 2019087474 A1 WO2019087474 A1 WO 2019087474A1 JP 2018026954 W JP2018026954 W JP 2018026954W WO 2019087474 A1 WO2019087474 A1 WO 2019087474A1
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/48—Coating with alloys
- C23C18/50—Coating with alloys with alloys based on iron, cobalt or nickel
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/18—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using precipitation techniques to apply the conductive material
Definitions
- the present invention relates to an electroless nickel-phosphorus-cobalt plating bath and an electroless nickel-phosphorus-cobalt plating film.
- electroless nickel plating films are formed on Al and Cu patterns of flexible substrates and silicon wafer substrates.
- the electroless nickel plating method is a method capable of forming a metallic nickel film on the surface of a material to be plated simply by immersing the material to be plated in a plating bath, and the shape and type of the material. Regardless of the film thickness, a film of uniform thickness can be obtained, so it is suitable for plating of complex shapes and precision parts.
- the electroless nickel plating film containing cobalt is proposed. More specifically, disclosed is an electroless nickel plating film containing 1 to 50% by mass of cobalt, 1 to 20% by mass of tungsten, and 1 to 4% by mass of phosphorus. And while such an electroless nickel plating film has high hardness in the wide temperature range ranging from room temperature to a high temperature range, it is described as it is excellent in abrasion resistance (for example, refer to patent documents 1).
- the plating bath used when forming the above conventional electroless nickel-phosphorus-cobalt plating film (the one containing cobalt in the electroless nickel-phosphorus plating bath) is likely to cause abnormal plating of cobalt. Therefore, it was unstable as a bath. Further, as a countermeasure for this, when the concentration of lead or bismuth used as a stabilizer is increased, there is a problem that the occurrence of defects around the plating and the film thickness become thin, so that the galling occurs.
- the present invention is capable of forming a plated film having high hardness and excellent in wear resistance and appearance without causing instability of the plating bath. -To provide a cobalt plating bath.
- the electroless nickel-phosphorus-cobalt plating bath according to the present invention comprises an electroless nickel containing a water-soluble nickel salt, a hypophosphite, a cobalt-containing compound and a heavy metal compound.
- -A phosphorus-cobalt plating bath which further contains at least one selected from the group consisting of an acetylene compound, an iodide ion source or an iodate ion source, and a nitro group-containing aromatic compound containing one or more nitro groups
- Concentration of the acetylene compound is 10 to 120 mg / L
- concentration of the iodide ion source or iodate ion source is 10 to 4000 mg / L
- concentration of the nitro group-containing aromatic compound is 0.1 to 5000 mg / L It is characterized by being.
- an electroless nickel having high hardness and capable of forming a plating film excellent in wear resistance and appearance without causing destabilization of a plating bath caused by abnormal plating of cobalt. It becomes possible to provide a phosphorus-cobalt plating bath.
- the electroless nickel-phosphorus-cobalt plating film of the present embodiment comprises an acetylene compound and an iodide ion source in a plating bath containing a water-soluble nickel salt, a hypophosphite, a cobalt-containing compound, and a heavy metal compound.
- electroless nickel-phosphorus-cobalt plating bath (hereinafter simply referred to as "plating bath") containing at least one member selected from the group consisting of an iodate ion source and a nitro group-containing aromatic compound containing one or more nitro groups
- the plating process can be performed on the object to be plated.
- the water-soluble nickel salt is not particularly limited as long as it is soluble in the plating bath and an aqueous solution having a predetermined concentration can be obtained.
- inorganic water-soluble nickel salts such as nickel sulfate, nickel chloride and nickel hypophosphite, and organic water-soluble nickel salts such as nickel acetate and nickel malate can be used.
- these water-soluble nickel salts can be used individually or in mixture of 2 or more types.
- the concentration of nickel ions in the plating bath is, for example, preferably 3 to 7 g / L, more preferably 4 to 6 g / L as metallic nickel. If the nickel concentration is too low, the plating rate may be slow, which is not preferable. In addition, if the nickel concentration is too high, white turbidity may occur in the plating bath or the viscosity of the plating bath may increase, so the uniform deposition property may decrease and pits may occur in the formed plated film. Not desirable.
- hypophosphite examples include sodium hypophosphite (sodium hypophosphite) and potassium hypophosphite.
- the concentration of hypophosphite in the plating bath is, for example, preferably 5 to 50 g / L, more preferably 10 to 40 g / L. If the concentration of the reducing agent is too low, the plating rate may be slow, which is not preferable. In addition, when the concentration of the reducing agent is too high, the phosphorus content in the film may be an amorphous structure due to the fact that it is more than 4% by mass described later, and the bath stability is also reduced. Therefore, the plating bath may be decomposed, which is not preferable.
- hypophosphite as the reducing agent, at least 0.1% by mass or more of phosphorus is co-deposited.
- Cobalt-containing compound As a cobalt containing compound, cobalt sulfate (II) heptahydrate etc. are mentioned, for example.
- concentration of cobalt ions in the plating bath is preferably 0.3 to 10 g / L, more preferably 0.6 to 5 g / L. If the concentration of cobalt ions is too low, the wear resistance of the electroless nickel-phosphorus plating film may not be sufficiently improved, which is not preferable. If the concentration of cobalt ions is too high, the plating bath may become unstable and the plating bath may decompose, which is not preferable.
- the heavy metal compound acts as a stabilizer and is used to stabilize the plating bath together with an acetylene compound, an iodide ion source or an iodate ion source, and a nitro group-containing aromatic compound described later.
- this heavy metal compound examples include lead compounds such as lead acetate, bismuth compounds such as bismuth acetate, thallium compounds such as thallium carbonate, and cadmium compounds such as cadmium acetate. These stabilizers may be used alone or in combination of two or more.
- the concentration of heavy metal ions (eg, Pb ions) in the plating bath varies depending on the type of heavy metal compound used, but is preferably 0.1 to 10 mg / L, more preferably 0.3 to 5 mg / L. is there.
- concentration of heavy metal ions is too low, the bath stability is unfavorably reduced.
- concentration of heavy metal ions is too high, the appearance unevenness easily occurs, which is not preferable.
- acetylene compound As an acetylene compound, it is generated from a reducing agent generated in a plating bath to hide the active substance that causes the instability of the plating bath, and from the viewpoint of enhancing the bath stability, -C-C- in the molecule. Substantially water soluble acetylenic compounds having a structure are preferred.
- an acetylene compound for example, water molecule such as hydroxyl group, hydroxymethyl group, hydroxyethyl group, hydroxypropyl group, methoxy group, ethoxy group, carboxyl group, hydroxyethoxy group, sulfo group, amino group in the molecule What has a sex functional group is mentioned.
- acetylene compound more specifically, the following general formula (I) R 1 -C ⁇ C-R 2 (I) (Wherein, R 1 and / or R 2 is a substituent having the above-mentioned water-soluble functional group. R 1 and R 2 may be the same or different)
- R 1 and R 2 may be the same or different
- the acetylene compound shown by these is illustrated.
- substituent R 1 or R 2 for example, hydrogen, a halogen group, a diethylaminoethyl group, a morpholinomethyl group, an alkyl group, an alkenyl group, an alkynyl group, a cyano group, and the above-mentioned water-soluble compounds
- transduced the sex functional group is mentioned.
- acetylene compound for example, butyne diol, butyne diol ethoxylate, propargyl alcohol, propargyl alcohol ethoxylate, propargyl alcohol propoxylate, propargyl alcohol butylate, dimethylaminopropyne, aminopropyne and the like can be mentioned. .
- propargyl alcohol and / or a derivative thereof is preferable from the viewpoint of the adsorptivity to fine particles such as nickel.
- the propargyl alcohol be ethoxylated and / or propoxylated from the viewpoint of stable operation without vaporization even when plating at a high temperature of about 90 ° C.
- ethoxylated and / or propoxylated propargyl alcohol includes propargyl alcohol ethoxylate and propargyl alcohol propoxylate.
- the concentration of the acetylene compound in the plating bath of the present invention is 10 to 120 mg / L, preferably 40 to 80 mg / L. If the concentration of the acetylene compound is less than 10 mg / L, the bath stability may be deteriorated or the flexibility of the film may be deteriorated. On the other hand, if it exceeds 120 mg / L, the plating reaction is stopped and the appearance unevenness is easily generated, which is not preferable.
- the iodide ion source or iodate ion source, iodide ion in the plating bath (I -) or iodate (IO 3 -) is particularly so long as it acts gently against reducing agents as an oxidizing agent It is not limited.
- an iodide ion source potassium iodide, iron iodide, nickel iodide, lithium iodide, sodium iodide etc. can be used, for example.
- potassium iodate ion source potassium iodate, sodium iodate, ammonium iodate etc. can be used, for example.
- these iodide ion sources or iodate ion sources may be used alone or in combination of two or more.
- the concentration of the iodide ion source or the iodate ion source is 10 to 4000 mg / L, and in this concentration range, the iodide ion source and the iodate ion source behave exactly the same. And by making an iodide ion source or an iodate ion source into such a concentration, a plating bath can be stabilized and a fall of the deposition rate of a nickel plating film can be prevented.
- the concentration of the iodide ion source or the iodate ion source is preferably 500 to 2000 mg / L, whereby the state of the plating bath can be made more stable. And the reduction of the deposition rate of the nickel plating film can be prevented more effectively.
- the nitro group-containing aromatic compound may contain one or more nitro groups. That is, one or more nitro groups may be contained in the aromatic compound.
- the nitro group-containing aromatic compound preferably contains 1 to 3 nitro groups, preferably 1 to 2 nitro groups, and more preferably 1 nitro group from the viewpoint of handling. .
- the nitro group-containing aromatic compound is at least selected from the group consisting of benzene having a nitro group and benzene having a substituent other than a nitro group, naphthalene having a substituent other than a nitro group, and alkali metal salts thereof. It is one kind.
- the substituent is preferably at least one selected from the group consisting of a carboxyl group, a hydroxyl group, a halogen atom, a sulfonic acid group, an ester group, an alkoxy group, and an amino group.
- the substituent is more preferably at least one selected from the group consisting of a carboxyl group, a hydroxyl group, a halogen atom, a sulfonic acid group, and an amino group.
- the nitro group-containing aromatic compound is an alkali metal salt
- the nitro group-containing aromatic compound is preferably at least one of a sodium salt and a potassium salt.
- the halogen group is preferably at least one selected from the group consisting of a chloro group, a bromo group, and an iodo group.
- nitro group-containing aromatic compound examples include nitrobenzene, 2,4,6-trinitrotoluene, 2-nitrophenol, 4-nitrophenol, 2-nitroaniline, 4-nitroaniline, 3-nitrobenzoic acid, 4 -Nitrobenzoic acid, 4-nitrophthalimide, 2,4,6-trinitrophenol, 4-amino-2-nitrophenol, 2-amino-4-nitrophenol, 5-nitroisophthalic acid, 4-bromonitrobenzene, 2 -Bromo-6-chloro-4-nitroaniline, sodium 3-nitrobenzenesulfonate, sodium 2-nitroaniline-4-sulfonate, 2,4-dinitrobenzenesulfonic acid, 4-chloro-3-nitrobenzoic acid, and 3-methyl-4-nitroaniline and the like.
- the concentration of the nitro group-containing aromatic compound in the plating bath varies depending on the type of heavy metal compound used, but is 0.1 to 5000 mg / L, preferably 1.0 to 1000 mg / L.
- concentration of the nitro group-containing aromatic compound is too low, the bath stability is unfavorably reduced.
- concentration of the nitro group-containing aromatic compound is too high, the appearance unevenness easily occurs, which is not preferable.
- an acetylene compound in addition to the heavy metal compound acting as a conventional stabilizer, an acetylene compound, an iodide ion source or an iodate ion source, and a nitro group-containing one or more nitro group. It contains at least one selected from the group consisting of aromatic compounds.
- the active substance which is generated from the reducing agent and causes destabilization of the plating bath is concealed, and as for the iodide ion source or the iodate ion source and the nitro group-containing aromatic compound, Since it acts as an oxidizing agent on the agent and suppresses excessive oxidation reaction, abnormal plating of cobalt can be suppressed in each case.
- the plating bath When the plating bath is to be stabilized using only the acetylene compound acting as an oxidant without using the above-mentioned heavy metal compound acting as a stabilizer component, a large amount of the oxidant is required, and no plating ( In the plating bath of the present invention, it is necessary to use a heavy metal compound and an oxidizing agent in combination, because the plating may not be deposited).
- complexing agent As the complexing agent, various complexing agents used in known electroless nickel plating baths can be used. Specific examples of the complexing agent include amino acids such as glycine, alanine, arginine, aspartic acid, glutamic acid, lysine and phenylalanine, monocarboxylic acids such as lactic acid, propionic acid, glycolic acid and gluconic acid, tartaric acid, oxalic acid and succinic acid And dicarboxylic acids such as malic acid, and tricarboxylic acids such as citric acid. Moreover, these salts, for example, sodium salt, potassium salt etc. can also be used as a complexing agent. In addition, these complexing agents can be used individually or in mixture of 2 or more types.
- amino acids such as glycine, alanine, arginine, aspartic acid, glutamic acid, lysine and phenylalanine
- monocarboxylic acids such as lactic acid, propionic acid
- the concentration of the complexing agent in the plating bath varies depending on the type of complexing agent used, but is preferably 10 to 200 g / L, more preferably 30 to 100 g / L. If the concentration of the complexing agent is too low, precipitation of nickel hydroxide is likely to occur, which is not preferable. In addition, when the concentration of the complexing agent is too high, the viscosity of the plating bath becomes high, so the uniform deposition may be reduced, which is not preferable.
- the pH of the plating bath according to the present embodiment is preferably 5.5 to 7.5, and more preferably 6.0 to 7 in order to stabilize the plating bath and to suppress the appearance unevenness. 0 is more preferable.
- the pH can be adjusted with an alkali such as aqueous ammonia or sodium hydroxide (caustic soda), or an acid such as sulfuric acid, hydrochloric acid or nitric acid.
- the temperature of the plating bath to be used is preferably 75 to 95 ° C., and particularly preferably 80 to 90 ° C. If the temperature of the plating bath is too high, the plating bath itself may be thermally decomposed, and if the temperature of the plating bath is too low, the plating reaction may be reduced, which is not preferable.
- the plating treatment time can be appropriately changed depending on the thickness of the plating film to be formed, but it is generally 30 to 240 minutes.
- the plating bath of the present invention can further contain various known additives to be blended in the electroless nickel plating bath, as necessary.
- the additive include reaction accelerators, brighteners, surfactants, functionalizing agents and the like. These types are not particularly limited, and commonly used ones can be adopted.
- the electroless nickel-phosphorus-cobalt plated film (hereinafter sometimes simply referred to as “plated film”) of the present embodiment is a plated film formed on an object to be plated. Although it does not specifically limit as a to-be-plated thing in which the plating film of this embodiment is formed, For example, metals, such as iron, aluminum, copper, or the alloy of metals is mentioned.
- the content of phosphorus is 0.1 to 4% by mass, and 1 to 2% by mass is particularly preferable.
- the content of phosphorus is 0.1 to 4% by mass, and 1 to 2% by mass is particularly preferable.
- cobalt is contained, and by blending cobalt in the film, a part of nickel in the crystal is replaced with cobalt, thereby improving the toughness of the film, and as a result, Wear resistance is improved.
- the content of cobalt is 1 to 20% by mass, and 2 to 9% by mass is particularly preferable.
- the content of cobalt is 1 to 20% by mass, and 2 to 9% by mass is particularly preferable.
- the plating film of this embodiment formed by the plating process using the above-mentioned plating bath has high hardness (Vickers hardness is 650 or more), it becomes possible to implement
- the thickness of the plating film is preferably 10 to 40 ⁇ m, and particularly preferably 20 to 30 ⁇ m. This is because when the plating film is too thin, the original function of the plating may not be exhibited, such as a decrease in corrosion resistance, and when the plating film is too thick, uneven plating appearance and the like are easily generated.
- Examples 1 to 21, Comparative Examples 1 to 9 (Preparation of plating bath) Nickel (II) sulfate hexahydrate which is a water-soluble nickel salt, sodium hypophosphite as a reducing agent, lead acetate (II) trihydrate which is a heavy metal compound, and cobalt sulfate which is a cobalt-containing compound (II) heptahydrate, propargyl alcohol ethoxylate acting as an oxidizing agent, potassium iodate or nitrobenzene, glycine which is a complexing agent, and sodium hydroxide which is a pH adjusting agent;
- the plating baths of Examples 1 to 21 and Comparative Examples 1 to 9 were prepared by mixing and stirring so as to obtain the concentration shown in the following.
- the temperature of the plating bath was set to 90 ° C., and the pH was set to 6.8.
- the prepared SPCC-SB plate (size: 50 mm ⁇ 50 mm, thickness: 4 mm) is immersed in the prepared plating bath for 120 minutes, and electroless nickel having a thickness of 25 ⁇ m on the material to be plated A phosphorus-cobalt plating film was formed.
- composition analysis of plating film Next, the composition of the formed plating film was analyzed. More specifically, the electroless nickel-phosphorus-cobalt plating film deposited is dissolved in nitric acid, and this solution is subjected to quantitative analysis of phosphorus and cobalt by ICP (manufactured by HORIBA, trade name: Ultima Expert) to dissolve it. From the weight of the plated film, the mass% of each component in the film was calculated. The above results are shown in Tables 3 to 4.
- the electroless nickel-phosphorus-cobalt plating bath of the present embodiment is suitably used for the formation of a plating film excellent in wear resistance and appearance.
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Abstract
An electroless nickel-phosphorus-cobalt plating bath contains a water-soluble nickel salt, a hypophosphorous acid salt, a cobalt-containing compound and a heavy metal compound, and additionally contains at least one component selected from the group consisting of an acetylene compound, an iodide ion source or an iodic acid ion source, and a nitro-group-containing aromatic compound that contains at least one nitro group. The concentration of the acetylene compound is 10 to 120 mg/L, the concentration of the iodide ion source or the iodic acid ion source is 10 to 4000 mg/L, and the concentration of the nitro-group-containing aromatic compound is 0.1 to 5000 mg/L.
Description
本発明は、無電解ニッケル-リン-コバルトめっき浴及び無電解ニッケル-リン-コバルトめっき皮膜に関する。
The present invention relates to an electroless nickel-phosphorus-cobalt plating bath and an electroless nickel-phosphorus-cobalt plating film.
従来、電子部品分野において、フレキシブル基板やシリコンウェハ基板のAlやCuパターン上に無電解ニッケルめっき皮膜を形成することが行われている。
Conventionally, in the field of electronic components, electroless nickel plating films are formed on Al and Cu patterns of flexible substrates and silicon wafer substrates.
無電解ニッケルめっき法は、電気めっき法と異なり、めっき浴中に被めっき物を浸漬するだけで、被めっき物の表面に金属ニッケル皮膜を形成することができる方法であり、素材の形状や種類にかかわらず、均一な厚みの皮膜が得られるため、複雑な形状や精密な部品のめっき加工処理に適している。
Unlike the electroplating method, the electroless nickel plating method is a method capable of forming a metallic nickel film on the surface of a material to be plated simply by immersing the material to be plated in a plating bath, and the shape and type of the material. Regardless of the film thickness, a film of uniform thickness can be obtained, so it is suitable for plating of complex shapes and precision parts.
ここで、近年、耐摩耗性に優れためっき皮膜が要求されているが、従来の無電解ニッケル-リンめっき皮膜においては、硬度は十分(ビッカーズ硬度が650以上)であるものの、耐摩耗性が不十分であるという問題があった。
Here, in recent years, a plating film excellent in wear resistance is required, but in the conventional electroless nickel-phosphorus plating film, although the hardness is sufficient (Vickers hardness is 650 or more), the wear resistance is There was a problem of being inadequate.
そこで、上記問題を解決するために、コバルトを含有する無電解ニッケルめっき皮膜が提案されている。より具体的には、コバルトを1~50質量%、タングステンを1~20質量%、リンを1~4質量%含有する無電解ニッケルめっき皮膜が開示されている。そして、このような無電解ニッケルめっき皮膜は、室温から高温領域にわたる広い温度範囲において高い硬度を有するとともに、耐摩耗性に優れると記載されている(例えば、特許文献1参照)。
Then, in order to solve the said problem, the electroless nickel plating film containing cobalt is proposed. More specifically, disclosed is an electroless nickel plating film containing 1 to 50% by mass of cobalt, 1 to 20% by mass of tungsten, and 1 to 4% by mass of phosphorus. And while such an electroless nickel plating film has high hardness in the wide temperature range ranging from room temperature to a high temperature range, it is described as it is excellent in abrasion resistance (for example, refer to patent documents 1).
しかし、上記従来の無電解ニッケル-リン-コバルトめっき皮膜を形成する際に使用するめっき浴(無電解ニッケル-リン-めっき浴にコバルトを含有させたもの)は、コバルトのめっき異常析出が生じやすいため、浴として不安定であった。また、この対策として、安定剤として使用される鉛やビスマスの濃度を高くすると、めっき付き回りの不良の発生や膜厚が薄くなるため、かじりが発生するという問題があった。
However, the plating bath used when forming the above conventional electroless nickel-phosphorus-cobalt plating film (the one containing cobalt in the electroless nickel-phosphorus plating bath) is likely to cause abnormal plating of cobalt. Therefore, it was unstable as a bath. Further, as a countermeasure for this, when the concentration of lead or bismuth used as a stabilizer is increased, there is a problem that the occurrence of defects around the plating and the film thickness become thin, so that the galling occurs.
そこで、本発明は、上述の問題に鑑み、めっき浴の不安定化を生じることなく、高い硬度を有するとともに、耐摩耗性及び外観に優れためっき皮膜を形成することができる無電解ニッケル-リン-コバルトめっき浴を提供することを目的とする。
Therefore, in view of the above problems, the present invention is capable of forming a plated film having high hardness and excellent in wear resistance and appearance without causing instability of the plating bath. -To provide a cobalt plating bath.
上記目的を達成するために、本発明に係る無電解ニッケル-リン-コバルトめっき浴は、水溶性ニッケル塩と、次亜リン酸塩と、コバルト含有化合物と、重金属化合物とを含有する無電解ニッケル-リン-コバルトめっき浴であって、アセチレン化合物、ヨウ化物イオン源又はヨウ素酸イオン源、及びニトロ基を1以上含有するニトロ基含有芳香族化合物からなる群より選ばれる少なくとも1種を更に含有し、アセチレン化合物の濃度が10~120mg/Lであり、ヨウ化物イオン源又はヨウ素酸イオン源の濃度が10~4000mg/Lであり、ニトロ基含有芳香族化合物の濃度が0.1~5000mg/Lであることを特徴とする。
In order to achieve the above object, the electroless nickel-phosphorus-cobalt plating bath according to the present invention comprises an electroless nickel containing a water-soluble nickel salt, a hypophosphite, a cobalt-containing compound and a heavy metal compound. -A phosphorus-cobalt plating bath, which further contains at least one selected from the group consisting of an acetylene compound, an iodide ion source or an iodate ion source, and a nitro group-containing aromatic compound containing one or more nitro groups Concentration of the acetylene compound is 10 to 120 mg / L, concentration of the iodide ion source or iodate ion source is 10 to 4000 mg / L, and concentration of the nitro group-containing aromatic compound is 0.1 to 5000 mg / L It is characterized by being.
本発明によれば、コバルトのめっき異常析出に起因するめっき浴の不安定化を生じることなく、高い硬度を有するとともに、耐摩耗性及び外観に優れためっき皮膜を形成することができる無電解ニッケル-リン-コバルトめっき浴を提供することが可能になる。
According to the present invention, an electroless nickel having high hardness and capable of forming a plating film excellent in wear resistance and appearance without causing destabilization of a plating bath caused by abnormal plating of cobalt. It becomes possible to provide a phosphorus-cobalt plating bath.
以下、本実施形態における無電解ニッケル-リン-コバルトめっき浴及び無電解ニッケル-リン-コバルト皮膜について説明する。
Hereinafter, the electroless nickel-phosphorus-cobalt plating bath and the electroless nickel-phosphorus-cobalt coating in the present embodiment will be described.
<無電解ニッケル-リン-コバルトめっき浴>
本実施形態の無電解ニッケル-リン-コバルトめっき皮膜は、水溶性ニッケル塩と、次亜リン酸塩と、コバルト含有化合物と、重金属化合物とを含有するめっき浴に、アセチレン化合物、ヨウ化物イオン源又はヨウ素酸イオン源、及びニトロ基を1以上含有するニトロ基含有芳香族化合物からなる群より選ばれる少なくとも1種を含有する無電解ニッケル-リン-コバルトめっき浴(以下、単に「めっき浴」という場合がある。)を用いてめっき処理を行うことにより、被めっき物上に形成することができる。 <Electroless nickel-phosphorus-cobalt plating bath>
The electroless nickel-phosphorus-cobalt plating film of the present embodiment comprises an acetylene compound and an iodide ion source in a plating bath containing a water-soluble nickel salt, a hypophosphite, a cobalt-containing compound, and a heavy metal compound. Or electroless nickel-phosphorus-cobalt plating bath (hereinafter simply referred to as "plating bath") containing at least one member selected from the group consisting of an iodate ion source and a nitro group-containing aromatic compound containing one or more nitro groups In some cases, the plating process can be performed on the object to be plated.
本実施形態の無電解ニッケル-リン-コバルトめっき皮膜は、水溶性ニッケル塩と、次亜リン酸塩と、コバルト含有化合物と、重金属化合物とを含有するめっき浴に、アセチレン化合物、ヨウ化物イオン源又はヨウ素酸イオン源、及びニトロ基を1以上含有するニトロ基含有芳香族化合物からなる群より選ばれる少なくとも1種を含有する無電解ニッケル-リン-コバルトめっき浴(以下、単に「めっき浴」という場合がある。)を用いてめっき処理を行うことにより、被めっき物上に形成することができる。 <Electroless nickel-phosphorus-cobalt plating bath>
The electroless nickel-phosphorus-cobalt plating film of the present embodiment comprises an acetylene compound and an iodide ion source in a plating bath containing a water-soluble nickel salt, a hypophosphite, a cobalt-containing compound, and a heavy metal compound. Or electroless nickel-phosphorus-cobalt plating bath (hereinafter simply referred to as "plating bath") containing at least one member selected from the group consisting of an iodate ion source and a nitro group-containing aromatic compound containing one or more nitro groups In some cases, the plating process can be performed on the object to be plated.
(水溶性ニッケル塩)
水溶性ニッケル塩としては、めっき浴に可溶性で、所定の濃度の水溶液が得られるものであれば、特に限定されない。例えば、硫酸ニッケル、塩化ニッケル、次亜リン酸ニッケル等の無機の水溶性ニッケル塩、及び酢酸ニッケル、リンゴ酸ニッケル等の有機の水溶性ニッケル塩等を用いることができる。なお、これらの水溶性ニッケル塩は単独で、あるいは2種以上を混合して用いることができる。 (Water soluble nickel salt)
The water-soluble nickel salt is not particularly limited as long as it is soluble in the plating bath and an aqueous solution having a predetermined concentration can be obtained. For example, inorganic water-soluble nickel salts such as nickel sulfate, nickel chloride and nickel hypophosphite, and organic water-soluble nickel salts such as nickel acetate and nickel malate can be used. In addition, these water-soluble nickel salts can be used individually or in mixture of 2 or more types.
水溶性ニッケル塩としては、めっき浴に可溶性で、所定の濃度の水溶液が得られるものであれば、特に限定されない。例えば、硫酸ニッケル、塩化ニッケル、次亜リン酸ニッケル等の無機の水溶性ニッケル塩、及び酢酸ニッケル、リンゴ酸ニッケル等の有機の水溶性ニッケル塩等を用いることができる。なお、これらの水溶性ニッケル塩は単独で、あるいは2種以上を混合して用いることができる。 (Water soluble nickel salt)
The water-soluble nickel salt is not particularly limited as long as it is soluble in the plating bath and an aqueous solution having a predetermined concentration can be obtained. For example, inorganic water-soluble nickel salts such as nickel sulfate, nickel chloride and nickel hypophosphite, and organic water-soluble nickel salts such as nickel acetate and nickel malate can be used. In addition, these water-soluble nickel salts can be used individually or in mixture of 2 or more types.
また、めっき浴中のニッケルイオンの濃度は、例えば、金属ニッケルとして3~7g/Lが好ましく、より好ましくは4~6g/Lである。ニッケル濃度が低過ぎると、めっき速度が遅くなる場合があるため、好ましくない。また、ニッケル濃度が高過ぎると、めっき浴において白濁が生じる場合や、めっき浴の粘度が高くなる場合があるため、均一析出性が低下し、形成後のめっき皮膜にピットが生じる場合があるため、好ましくない。
The concentration of nickel ions in the plating bath is, for example, preferably 3 to 7 g / L, more preferably 4 to 6 g / L as metallic nickel. If the nickel concentration is too low, the plating rate may be slow, which is not preferable. In addition, if the nickel concentration is too high, white turbidity may occur in the plating bath or the viscosity of the plating bath may increase, so the uniform deposition property may decrease and pits may occur in the formed plated film. Not desirable.
(次亜リン酸塩)
還元剤としての次亜リン酸塩としては、例えば、次亜リン酸ナトリウム(次亜リン酸ソーダ)や次亜リン酸カリウム等が挙げられる。 (Hypophosphite)
Examples of hypophosphite as a reducing agent include sodium hypophosphite (sodium hypophosphite) and potassium hypophosphite.
還元剤としての次亜リン酸塩としては、例えば、次亜リン酸ナトリウム(次亜リン酸ソーダ)や次亜リン酸カリウム等が挙げられる。 (Hypophosphite)
Examples of hypophosphite as a reducing agent include sodium hypophosphite (sodium hypophosphite) and potassium hypophosphite.
また、めっき浴における次亜リン酸塩の濃度は、例えば、5~50g/Lが好ましく、より好ましくは10~40g/Lである。還元剤の濃度が低過ぎると、めっき速度が遅くなる場合があるため、好ましくない。また、還元剤の濃度が高過ぎると、皮膜におけるリンの含有率が後述の4質量%よりも多くなることに起因して非晶質構造となる場合があり、また、浴安定性も低下するため、めっき浴が分解する場合があり、好ましくない。
In addition, the concentration of hypophosphite in the plating bath is, for example, preferably 5 to 50 g / L, more preferably 10 to 40 g / L. If the concentration of the reducing agent is too low, the plating rate may be slow, which is not preferable. In addition, when the concentration of the reducing agent is too high, the phosphorus content in the film may be an amorphous structure due to the fact that it is more than 4% by mass described later, and the bath stability is also reduced. Therefore, the plating bath may be decomposed, which is not preferable.
なお、還元剤として、次亜リン酸塩を使用することにより、少なくとも0.1質量%以上のリンが共析する。
In addition, by using hypophosphite as the reducing agent, at least 0.1% by mass or more of phosphorus is co-deposited.
(コバルト含有化合物)
コバルト含有化合物としては、例えば、硫酸コバルト(II)七水和物等が挙げられる。また、めっき浴中におけるコバルトイオンの濃度は、0.3~10g/Lが好ましく、より好ましくは0.6~5g/Lである。コバルトイオンの濃度が低過ぎると、無電解ニッケル-リンめっき皮膜の耐摩耗性が十分に向上しない場合があるため、好ましくない。また、コバルトイオンの濃度が高過ぎると、めっき浴が不安定となり、めっき浴が分解する場合があり、好ましくない。 (Cobalt-containing compound)
As a cobalt containing compound, cobalt sulfate (II) heptahydrate etc. are mentioned, for example. The concentration of cobalt ions in the plating bath is preferably 0.3 to 10 g / L, more preferably 0.6 to 5 g / L. If the concentration of cobalt ions is too low, the wear resistance of the electroless nickel-phosphorus plating film may not be sufficiently improved, which is not preferable. If the concentration of cobalt ions is too high, the plating bath may become unstable and the plating bath may decompose, which is not preferable.
コバルト含有化合物としては、例えば、硫酸コバルト(II)七水和物等が挙げられる。また、めっき浴中におけるコバルトイオンの濃度は、0.3~10g/Lが好ましく、より好ましくは0.6~5g/Lである。コバルトイオンの濃度が低過ぎると、無電解ニッケル-リンめっき皮膜の耐摩耗性が十分に向上しない場合があるため、好ましくない。また、コバルトイオンの濃度が高過ぎると、めっき浴が不安定となり、めっき浴が分解する場合があり、好ましくない。 (Cobalt-containing compound)
As a cobalt containing compound, cobalt sulfate (II) heptahydrate etc. are mentioned, for example. The concentration of cobalt ions in the plating bath is preferably 0.3 to 10 g / L, more preferably 0.6 to 5 g / L. If the concentration of cobalt ions is too low, the wear resistance of the electroless nickel-phosphorus plating film may not be sufficiently improved, which is not preferable. If the concentration of cobalt ions is too high, the plating bath may become unstable and the plating bath may decompose, which is not preferable.
(重金属化合物)
重金属化合物は安定剤として作用するものであり、後述のアセチレン化合物、ヨウ化物イオン源又はヨウ素酸イオン源、及びニトロ基含有芳香族化合物と共にめっき浴の安定化を図るために使用される。 (Heavy metal compounds)
The heavy metal compound acts as a stabilizer and is used to stabilize the plating bath together with an acetylene compound, an iodide ion source or an iodate ion source, and a nitro group-containing aromatic compound described later.
重金属化合物は安定剤として作用するものであり、後述のアセチレン化合物、ヨウ化物イオン源又はヨウ素酸イオン源、及びニトロ基含有芳香族化合物と共にめっき浴の安定化を図るために使用される。 (Heavy metal compounds)
The heavy metal compound acts as a stabilizer and is used to stabilize the plating bath together with an acetylene compound, an iodide ion source or an iodate ion source, and a nitro group-containing aromatic compound described later.
この重金属化合物としては、例えば、酢酸鉛等の鉛化合物、酢酸ビスマス等のビスマス化合物、炭酸タリウム等のタリウム化合物、酢酸カドミウム等のカドミウム化合物が挙げられる。なお、これらの安定剤は、単独で使用してもよく、二種以上を混合して使用してもよい。
Examples of this heavy metal compound include lead compounds such as lead acetate, bismuth compounds such as bismuth acetate, thallium compounds such as thallium carbonate, and cadmium compounds such as cadmium acetate. These stabilizers may be used alone or in combination of two or more.
また、めっき浴における重金属イオン(例えば、Pbイオン)の濃度は、使用する重金属化合物の種類により異なるが、例えば、0.1~10mg/Lが好ましく、より好ましくは0.3~5mg/Lである。重金属イオンの濃度が低過ぎると、浴安定性が低下するため、好ましくない。また、また、重金属イオンの濃度が高過ぎると、外観ムラが発生し易くなるため、好ましくない。
The concentration of heavy metal ions (eg, Pb ions) in the plating bath varies depending on the type of heavy metal compound used, but is preferably 0.1 to 10 mg / L, more preferably 0.3 to 5 mg / L. is there. When the concentration of heavy metal ions is too low, the bath stability is unfavorably reduced. In addition, when the concentration of heavy metal ions is too high, the appearance unevenness easily occurs, which is not preferable.
(アセチレン化合物)
アセチレン化合物としては、めっき浴中に生成する還元剤から発生して、めっき浴の不安定化の原因となる活性物質を隠蔽し、浴安定性を高める観点から、分子中に-C≡C-構造を有する、実質的に水溶性のアセチレン系化合物が好適である。このようなアセチレン化合物としては、例えば、分子中にヒドロキシル基、ヒドロキシメチル基、ヒドロキシエチル基、ヒドロキシプロピル基、メトキシ基、エトキシ基、カルボキシル基、ヒドロキシエトキシ基、スルホ基、アミノ基のような水溶性官能基を有するものが挙げられる。 (Acetylene compound)
As an acetylene compound, it is generated from a reducing agent generated in a plating bath to hide the active substance that causes the instability of the plating bath, and from the viewpoint of enhancing the bath stability, -C-C- in the molecule. Substantially water soluble acetylenic compounds having a structure are preferred. As such an acetylene compound, for example, water molecule such as hydroxyl group, hydroxymethyl group, hydroxyethyl group, hydroxypropyl group, methoxy group, ethoxy group, carboxyl group, hydroxyethoxy group, sulfo group, amino group in the molecule What has a sex functional group is mentioned.
アセチレン化合物としては、めっき浴中に生成する還元剤から発生して、めっき浴の不安定化の原因となる活性物質を隠蔽し、浴安定性を高める観点から、分子中に-C≡C-構造を有する、実質的に水溶性のアセチレン系化合物が好適である。このようなアセチレン化合物としては、例えば、分子中にヒドロキシル基、ヒドロキシメチル基、ヒドロキシエチル基、ヒドロキシプロピル基、メトキシ基、エトキシ基、カルボキシル基、ヒドロキシエトキシ基、スルホ基、アミノ基のような水溶性官能基を有するものが挙げられる。 (Acetylene compound)
As an acetylene compound, it is generated from a reducing agent generated in a plating bath to hide the active substance that causes the instability of the plating bath, and from the viewpoint of enhancing the bath stability, -C-C- in the molecule. Substantially water soluble acetylenic compounds having a structure are preferred. As such an acetylene compound, for example, water molecule such as hydroxyl group, hydroxymethyl group, hydroxyethyl group, hydroxypropyl group, methoxy group, ethoxy group, carboxyl group, hydroxyethoxy group, sulfo group, amino group in the molecule What has a sex functional group is mentioned.
なお、好ましいアセチレン化合物として、より具体的には、下記一般式(I)
R1-C≡C-R2・・・(I)
(式中、R1及び/又はR2は上述の水溶性官能基を有する置換基を示す。R1及びR2は同一でも異なっていても良い。)
で示されるアセチレン化合物が例示される。 In addition, as a preferable acetylene compound, more specifically, the following general formula (I)
R 1 -C≡C-R 2 (I)
(Wherein, R 1 and / or R 2 is a substituent having the above-mentioned water-soluble functional group. R 1 and R 2 may be the same or different)
The acetylene compound shown by these is illustrated.
R1-C≡C-R2・・・(I)
(式中、R1及び/又はR2は上述の水溶性官能基を有する置換基を示す。R1及びR2は同一でも異なっていても良い。)
で示されるアセチレン化合物が例示される。 In addition, as a preferable acetylene compound, more specifically, the following general formula (I)
R 1 -C≡C-R 2 (I)
(Wherein, R 1 and / or R 2 is a substituent having the above-mentioned water-soluble functional group. R 1 and R 2 may be the same or different)
The acetylene compound shown by these is illustrated.
ここで、上記置換基R1又はR2としては、例えば、水素、ハロゲン基、ジエチルアミノエチル基、モルホリノメチル基、アルキル基、アルケニル基、アルキニル基、シアノ基、及びこれらの置換基に上述の水溶性官能基を導入した置換基が挙げられる。
Here, as the substituent R 1 or R 2 , for example, hydrogen, a halogen group, a diethylaminoethyl group, a morpholinomethyl group, an alkyl group, an alkenyl group, an alkynyl group, a cyano group, and the above-mentioned water-soluble compounds The substituent which introduce | transduced the sex functional group is mentioned.
また、上記アセチレン化合物としては、例えば、ブチンジオール、ブチンジオールエトキシレート、プロパルギルアルコール、プロパルギルアルコールエトキシレート、プロパルギルアルコールプロポキシレート、プロパルギルアルコールブトキシレート、ジメチルアミノプロピン、アミノプロピン等を挙げることができる。このうち、ニッケル等の微粒子への吸着性の観点から、プロパルギルアルコール及び/又はその誘導体であることが好ましい。また、90℃前後という高温においてめっきする場合にも気化せず安定的に働くという観点から、エトキシ化及び/又はプロポキシ化されたプロパルギルアルコールであることが好ましい。このようなエトキシ化及び/又はプロポキシ化されたプロパルギルアルコールとしては、プロパルギルアルコールエトキシレート、プロパルギルアルコールプロポキシレートが挙げられる。
Moreover, as the above-mentioned acetylene compound, for example, butyne diol, butyne diol ethoxylate, propargyl alcohol, propargyl alcohol ethoxylate, propargyl alcohol propoxylate, propargyl alcohol butylate, dimethylaminopropyne, aminopropyne and the like can be mentioned. . Among these, propargyl alcohol and / or a derivative thereof is preferable from the viewpoint of the adsorptivity to fine particles such as nickel. In addition, it is preferable that the propargyl alcohol be ethoxylated and / or propoxylated from the viewpoint of stable operation without vaporization even when plating at a high temperature of about 90 ° C. Such ethoxylated and / or propoxylated propargyl alcohol includes propargyl alcohol ethoxylate and propargyl alcohol propoxylate.
本発明のめっき浴中における上記アセチレン化合物の濃度としては、10~120mg/Lであり、40~80mg/Lが好ましい。アセチレン化合物の濃度が10mg/L未満であると浴安定性が悪くなる場合や皮膜の柔軟性が悪くなる場合がある。一方、120mg/Lを超えると、めっき反応が停止し、外観ムラが発生し易くなるため、好ましくない。
The concentration of the acetylene compound in the plating bath of the present invention is 10 to 120 mg / L, preferably 40 to 80 mg / L. If the concentration of the acetylene compound is less than 10 mg / L, the bath stability may be deteriorated or the flexibility of the film may be deteriorated. On the other hand, if it exceeds 120 mg / L, the plating reaction is stopped and the appearance unevenness is easily generated, which is not preferable.
(ヨウ化物イオン源又はヨウ素酸イオン源)
ヨウ化物イオン源又はヨウ素酸イオン源としては、めっき浴中でヨウ化物イオン(I-)又はヨウ素酸イオン(IO3 -)が酸化剤として還元剤に対して穏やかに作用するものであれば特に限定されない。ヨウ化物イオン源としては、例えば、ヨウ化カリウム、ヨウ化鉄、ヨウ化ニッケル、ヨウ化リチウム、ヨウ化ナトリウム等を用いることができる。また、ヨウ素酸イオン源としては、例えば、ヨウ素酸カリウム、ヨウ素酸ナトリウム、ヨウ素酸アンモニウム等を用いることができる。また、これらのヨウ化物イオン源又はヨウ素酸イオン源は、1種単独で用いてもよく、2種以上を混合して用いることもできる。 (Iodo ion source or iodate ion source)
The iodide ion source or iodate ion source, iodide ion in the plating bath (I -) or iodate (IO 3 -) is particularly so long as it acts gently against reducing agents as an oxidizing agent It is not limited. As an iodide ion source, potassium iodide, iron iodide, nickel iodide, lithium iodide, sodium iodide etc. can be used, for example. Moreover, as an iodate ion source, potassium iodate, sodium iodate, ammonium iodate etc. can be used, for example. Moreover, these iodide ion sources or iodate ion sources may be used alone or in combination of two or more.
ヨウ化物イオン源又はヨウ素酸イオン源としては、めっき浴中でヨウ化物イオン(I-)又はヨウ素酸イオン(IO3 -)が酸化剤として還元剤に対して穏やかに作用するものであれば特に限定されない。ヨウ化物イオン源としては、例えば、ヨウ化カリウム、ヨウ化鉄、ヨウ化ニッケル、ヨウ化リチウム、ヨウ化ナトリウム等を用いることができる。また、ヨウ素酸イオン源としては、例えば、ヨウ素酸カリウム、ヨウ素酸ナトリウム、ヨウ素酸アンモニウム等を用いることができる。また、これらのヨウ化物イオン源又はヨウ素酸イオン源は、1種単独で用いてもよく、2種以上を混合して用いることもできる。 (Iodo ion source or iodate ion source)
The iodide ion source or iodate ion source, iodide ion in the plating bath (I -) or iodate (IO 3 -) is particularly so long as it acts gently against reducing agents as an oxidizing agent It is not limited. As an iodide ion source, potassium iodide, iron iodide, nickel iodide, lithium iodide, sodium iodide etc. can be used, for example. Moreover, as an iodate ion source, potassium iodate, sodium iodate, ammonium iodate etc. can be used, for example. Moreover, these iodide ion sources or iodate ion sources may be used alone or in combination of two or more.
ヨウ化物イオン又はヨウ素酸イオンは、その添加効果は等しく、上述したように、どちらのイオンも還元剤に対して酸化剤として穏やかに作用するため、その適正濃度範囲が広い。本発明のめっき浴においては、ヨウ化物イオン源又はヨウ素酸イオン源の濃度は、10~4000mg/Lであり、この濃度範囲において、ヨウ化物イオン源とヨウ素酸イオン源は全く同じ挙動を示す。そして、ヨウ化物イオン源又はヨウ素酸イオン源をこのような濃度とすることにより、めっき浴を安定にすることができ、ニッケルめっき皮膜の析出速度の低下を防止することができる。特に、本実施の形態に係るめっき浴では、ヨウ化物イオン源又はヨウ素酸イオン源の濃度を500~2000mg/Lとすることが好ましく、これにより、めっき浴の状態をより安定にすることができ、ニッケルめっき皮膜の析出速度の低下をより効果的に防止することができる。
The addition effect of iodide ion or iodate ion is equal, and as described above, since both ions gently act on the reducing agent as the oxidizing agent, the appropriate concentration range is wide. In the plating bath of the present invention, the concentration of the iodide ion source or the iodate ion source is 10 to 4000 mg / L, and in this concentration range, the iodide ion source and the iodate ion source behave exactly the same. And by making an iodide ion source or an iodate ion source into such a concentration, a plating bath can be stabilized and a fall of the deposition rate of a nickel plating film can be prevented. In particular, in the plating bath according to the present embodiment, the concentration of the iodide ion source or the iodate ion source is preferably 500 to 2000 mg / L, whereby the state of the plating bath can be made more stable. And the reduction of the deposition rate of the nickel plating film can be prevented more effectively.
(ニトロ基含有芳香族化合物)
ニトロ基含有芳香族化合物は、ニトロ基を1個以上含んでいればよい。即ち、芳香族化合物に含まれるニトロ基は1個であっても、複数であってもよい。ニトロ基含有芳香族化合物は、ニトロ基を1~3個含むことが好ましく、取扱性の観点から、ニトロ基が1~2個であることが好ましく、ニトロ基が1個であることが更に好ましい。 (Nitro group-containing aromatic compound)
The nitro group-containing aromatic compound may contain one or more nitro groups. That is, one or more nitro groups may be contained in the aromatic compound. The nitro group-containing aromatic compound preferably contains 1 to 3 nitro groups, preferably 1 to 2 nitro groups, and more preferably 1 nitro group from the viewpoint of handling. .
ニトロ基含有芳香族化合物は、ニトロ基を1個以上含んでいればよい。即ち、芳香族化合物に含まれるニトロ基は1個であっても、複数であってもよい。ニトロ基含有芳香族化合物は、ニトロ基を1~3個含むことが好ましく、取扱性の観点から、ニトロ基が1~2個であることが好ましく、ニトロ基が1個であることが更に好ましい。 (Nitro group-containing aromatic compound)
The nitro group-containing aromatic compound may contain one or more nitro groups. That is, one or more nitro groups may be contained in the aromatic compound. The nitro group-containing aromatic compound preferably contains 1 to 3 nitro groups, preferably 1 to 2 nitro groups, and more preferably 1 nitro group from the viewpoint of handling. .
また、上記ニトロ基含有芳香族化合物は、ニトロ基を有するとともに、ニトロ基以外の置換基を有するベンゼン、ニトロ基以外の置換基を有するナフタレン、及びそれらのアルカリ金属塩からなる群より選ばれる少なくとも1種である。また、上記置換基は、カルボキシル基、水酸基、ハロゲン原子、スルホン酸基、エステル基、アルコキシ基、及びアミノ基からなる群より選ばれる少なくとも1種であることが好ましい。
The nitro group-containing aromatic compound is at least selected from the group consisting of benzene having a nitro group and benzene having a substituent other than a nitro group, naphthalene having a substituent other than a nitro group, and alkali metal salts thereof. It is one kind. The substituent is preferably at least one selected from the group consisting of a carboxyl group, a hydroxyl group, a halogen atom, a sulfonic acid group, an ester group, an alkoxy group, and an amino group.
上記置換基は、カルボキシル基、水酸基、ハロゲン原子、スルホン酸基、及びアミノ基からなる群より選ばれる少なくとも1種であることがより好ましい。
The substituent is more preferably at least one selected from the group consisting of a carboxyl group, a hydroxyl group, a halogen atom, a sulfonic acid group, and an amino group.
上記ニトロ基含有芳香族化合物がアルカリ金属塩である場合は、上記ニトロ基含有芳香族化合物は、ナトリム塩及びカリウム塩の少なくとも一方であることが好ましい。
When the nitro group-containing aromatic compound is an alkali metal salt, the nitro group-containing aromatic compound is preferably at least one of a sodium salt and a potassium salt.
上記ハロゲン基は、クロロ基、ブロモ基、及びヨード基からなる群よりより選ばれる少なくとも1種であることが好ましい。
The halogen group is preferably at least one selected from the group consisting of a chloro group, a bromo group, and an iodo group.
ニトロ基含有芳香族化合物の具体例としては、ニトロベンゼン、2,4,6-トリニトロトルエン、2-ニトロフェノール、4-ニトロフェノール、2-ニトロアニリン、4-ニトロアニリン、3-ニトロ安息香酸、4-ニトロ安息香酸、4-ニトロフタルイミド、2,4,6-トリニトロフェノール、4-アミノ-2-ニトロフェノール、2-アミノ-4-ニトロフェノール、5-ニトロイソフタル酸、4-ブロモニトロベンゼン、2-ブロモ-6-クロロ-4-ニトロアニリン、3-ニトロベンゼンスルホン酸ナトリウム、2-ニトロアニリン-4-スルホン酸ナトリウム、2,4-ジニトロベンゼンスルホン酸、4-クロロ-3-ニトロ安息香酸、及び3-メチル-4-ニトロアニリン等が挙げられる。
Specific examples of the nitro group-containing aromatic compound include nitrobenzene, 2,4,6-trinitrotoluene, 2-nitrophenol, 4-nitrophenol, 2-nitroaniline, 4-nitroaniline, 3-nitrobenzoic acid, 4 -Nitrobenzoic acid, 4-nitrophthalimide, 2,4,6-trinitrophenol, 4-amino-2-nitrophenol, 2-amino-4-nitrophenol, 5-nitroisophthalic acid, 4-bromonitrobenzene, 2 -Bromo-6-chloro-4-nitroaniline, sodium 3-nitrobenzenesulfonate, sodium 2-nitroaniline-4-sulfonate, 2,4-dinitrobenzenesulfonic acid, 4-chloro-3-nitrobenzoic acid, and 3-methyl-4-nitroaniline and the like.
また、めっき浴におけるニトロ基含有芳香族化合物の濃度は、使用する重金属化合物の種類により異なるが、0.1~5000mg/Lであり、好ましくは1.0~1000mg/Lである。ニトロ基含有芳香族化合物の濃度が低過ぎると、浴安定性が低下するため、好ましくない。また、また、ニトロ基含有芳香族化合物の濃度が高過ぎると、外観ムラが発生し易くなるため、好ましくない。
The concentration of the nitro group-containing aromatic compound in the plating bath varies depending on the type of heavy metal compound used, but is 0.1 to 5000 mg / L, preferably 1.0 to 1000 mg / L. When the concentration of the nitro group-containing aromatic compound is too low, the bath stability is unfavorably reduced. In addition, when the concentration of the nitro group-containing aromatic compound is too high, the appearance unevenness easily occurs, which is not preferable.
以上のように、本発明のめっき浴においては、従来の安定剤として作用する重金属化合物に加えて、アセチレン化合物、ヨウ化物イオン源又はヨウ素酸イオン源、及びニトロ基を1以上含有するニトロ基含有芳香族化合物からなる群より選ばれる少なくとも1種を含有している。
As described above, in the plating bath of the present invention, in addition to the heavy metal compound acting as a conventional stabilizer, an acetylene compound, an iodide ion source or an iodate ion source, and a nitro group-containing one or more nitro group. It contains at least one selected from the group consisting of aromatic compounds.
このうち、アセチレン化合物については、還元剤から発生してめっき浴の不安定化の原因となる活性物質を隠蔽し、ヨウ化物イオン源又はヨウ素酸イオン源及びニトロ基含有芳香族化合物については、還元剤に対して酸化剤として作用し、過剰な酸化反応を抑制するため、それぞれ共にコバルトのめっき異常析出を抑制することができる。
Among these, as for acetylene compounds, the active substance which is generated from the reducing agent and causes destabilization of the plating bath is concealed, and as for the iodide ion source or the iodate ion source and the nitro group-containing aromatic compound, Since it acts as an oxidizing agent on the agent and suppresses excessive oxidation reaction, abnormal plating of cobalt can be suppressed in each case.
従って、従来の重金属安定剤成分の濃度を高くした場合のめっき付き回りの不良の発生や膜厚が薄くなる現象、及びかじりの発生などを生じることなく、めっき浴の安定化を図ることが可能になる。その結果、コバルトのめっき異常析出に起因するめっき浴の不安定化を生じることなく、無電解ニッケル-リン-コバルトめっき皮膜を形成することができる。
Therefore, it is possible to stabilize the plating bath without causing the occurrence of defects in the area around the plating, the film thickness becoming thin, and the occurrence of galling etc. when the concentration of the conventional heavy metal stabilizer component is increased. become. As a result, an electroless nickel-phosphorus-cobalt plating film can be formed without causing destabilization of the plating bath due to abnormal plating of cobalt.
なお、安定剤成分として作用する上記重金属化合物を使用しないで、酸化剤として作用するアセチレン化合物等のみを使用して、めっき浴の安定化を図る場合、多量の酸化剤が必要となり、無めっき(めっき未析出)といった不都合が生じる場合があるため、本発明のめっき浴においては、重金属化合物と酸化剤を併用する必要がある。
When the plating bath is to be stabilized using only the acetylene compound acting as an oxidant without using the above-mentioned heavy metal compound acting as a stabilizer component, a large amount of the oxidant is required, and no plating ( In the plating bath of the present invention, it is necessary to use a heavy metal compound and an oxidizing agent in combination, because the plating may not be deposited).
(錯化剤)
錯化剤としては、公知の無電解ニッケルめっき浴において用いられている各種の錯化剤を用いることができる。錯化剤の具体例としては、グリシン、アラニン、アルギニン、アスパラギン酸、グルタミン酸、リジン、フェニルアラニン等のアミノ酸、乳酸、プロピオン酸、グリコール酸、グルコン酸等のモノカルボン酸、酒石酸、シュウ酸、コハク酸、リンゴ酸等のジカルボン酸、クエン酸等のトリカルボン酸などが挙げられる。また、これらの塩、例えば、ナトリウム塩、カリウム塩等も錯化剤として使用可能である。なお、これらの錯化剤は、単独で、または2種以上混合して用いることができる。 (Complexing agent)
As the complexing agent, various complexing agents used in known electroless nickel plating baths can be used. Specific examples of the complexing agent include amino acids such as glycine, alanine, arginine, aspartic acid, glutamic acid, lysine and phenylalanine, monocarboxylic acids such as lactic acid, propionic acid, glycolic acid and gluconic acid, tartaric acid, oxalic acid and succinic acid And dicarboxylic acids such as malic acid, and tricarboxylic acids such as citric acid. Moreover, these salts, for example, sodium salt, potassium salt etc. can also be used as a complexing agent. In addition, these complexing agents can be used individually or in mixture of 2 or more types.
錯化剤としては、公知の無電解ニッケルめっき浴において用いられている各種の錯化剤を用いることができる。錯化剤の具体例としては、グリシン、アラニン、アルギニン、アスパラギン酸、グルタミン酸、リジン、フェニルアラニン等のアミノ酸、乳酸、プロピオン酸、グリコール酸、グルコン酸等のモノカルボン酸、酒石酸、シュウ酸、コハク酸、リンゴ酸等のジカルボン酸、クエン酸等のトリカルボン酸などが挙げられる。また、これらの塩、例えば、ナトリウム塩、カリウム塩等も錯化剤として使用可能である。なお、これらの錯化剤は、単独で、または2種以上混合して用いることができる。 (Complexing agent)
As the complexing agent, various complexing agents used in known electroless nickel plating baths can be used. Specific examples of the complexing agent include amino acids such as glycine, alanine, arginine, aspartic acid, glutamic acid, lysine and phenylalanine, monocarboxylic acids such as lactic acid, propionic acid, glycolic acid and gluconic acid, tartaric acid, oxalic acid and succinic acid And dicarboxylic acids such as malic acid, and tricarboxylic acids such as citric acid. Moreover, these salts, for example, sodium salt, potassium salt etc. can also be used as a complexing agent. In addition, these complexing agents can be used individually or in mixture of 2 or more types.
また、めっき浴における錯化剤の濃度は、使用する錯化剤の種類により異なるが、10~200g/Lが好ましく、より好ましくは30~100g/Lである。錯化剤濃度が低すぎると、水酸化ニッケルの沈殿が生じやすくなるため好ましくない。また、錯化剤濃度が高すぎると、めっき浴の粘度が高くなるため、均一析出性が低下する場合があり、好ましくない。
The concentration of the complexing agent in the plating bath varies depending on the type of complexing agent used, but is preferably 10 to 200 g / L, more preferably 30 to 100 g / L. If the concentration of the complexing agent is too low, precipitation of nickel hydroxide is likely to occur, which is not preferable. In addition, when the concentration of the complexing agent is too high, the viscosity of the plating bath becomes high, so the uniform deposition may be reduced, which is not preferable.
(pH)
また、めっき浴の安定化を図るとともに、外観ムラの発生を抑制するとの観点から、本実施形態のめっき浴のpHは5.5~7.5であることが好ましく、6.0~7.0がより好ましい。なお、pHは、アンモニア水、水酸化ナトリウム(苛性ソーダ)等のアルカリ、硫酸、塩酸、硝酸等の酸で調整可能である。 (PH)
The pH of the plating bath according to the present embodiment is preferably 5.5 to 7.5, and more preferably 6.0 to 7 in order to stabilize the plating bath and to suppress the appearance unevenness. 0 is more preferable. The pH can be adjusted with an alkali such as aqueous ammonia or sodium hydroxide (caustic soda), or an acid such as sulfuric acid, hydrochloric acid or nitric acid.
また、めっき浴の安定化を図るとともに、外観ムラの発生を抑制するとの観点から、本実施形態のめっき浴のpHは5.5~7.5であることが好ましく、6.0~7.0がより好ましい。なお、pHは、アンモニア水、水酸化ナトリウム(苛性ソーダ)等のアルカリ、硫酸、塩酸、硝酸等の酸で調整可能である。 (PH)
The pH of the plating bath according to the present embodiment is preferably 5.5 to 7.5, and more preferably 6.0 to 7 in order to stabilize the plating bath and to suppress the appearance unevenness. 0 is more preferable. The pH can be adjusted with an alkali such as aqueous ammonia or sodium hydroxide (caustic soda), or an acid such as sulfuric acid, hydrochloric acid or nitric acid.
(めっき浴の温度)
また、使用するめっき浴の温度は、75~95℃が好ましく、80~90℃が、特に好ましい。めっき浴の温度が高すぎると、めっき浴自体が熱分解する場合があり、また、めっき浴の温度が低すぎると、めっき反応が低下する場合があるため、好ましくない。なお、めっき処理時間は、形成するめっき皮膜の膜厚によって適宜、変更可能であるが、30~240分が一般的である。 (Temperature of plating bath)
Further, the temperature of the plating bath to be used is preferably 75 to 95 ° C., and particularly preferably 80 to 90 ° C. If the temperature of the plating bath is too high, the plating bath itself may be thermally decomposed, and if the temperature of the plating bath is too low, the plating reaction may be reduced, which is not preferable. The plating treatment time can be appropriately changed depending on the thickness of the plating film to be formed, but it is generally 30 to 240 minutes.
また、使用するめっき浴の温度は、75~95℃が好ましく、80~90℃が、特に好ましい。めっき浴の温度が高すぎると、めっき浴自体が熱分解する場合があり、また、めっき浴の温度が低すぎると、めっき反応が低下する場合があるため、好ましくない。なお、めっき処理時間は、形成するめっき皮膜の膜厚によって適宜、変更可能であるが、30~240分が一般的である。 (Temperature of plating bath)
Further, the temperature of the plating bath to be used is preferably 75 to 95 ° C., and particularly preferably 80 to 90 ° C. If the temperature of the plating bath is too high, the plating bath itself may be thermally decomposed, and if the temperature of the plating bath is too low, the plating reaction may be reduced, which is not preferable. The plating treatment time can be appropriately changed depending on the thickness of the plating film to be formed, but it is generally 30 to 240 minutes.
(その他)
本発明のめっき浴は、必要に応じて、無電解ニッケルめっき浴に配合される公知の各種添加剤を更に含有することができる。添加剤としては、例えば、反応促進剤、光沢剤、界面活性剤、機能付与剤等が挙げられる。これらの種類は特に限定されず、通常用いられるものを採用することができる。 (Others)
The plating bath of the present invention can further contain various known additives to be blended in the electroless nickel plating bath, as necessary. Examples of the additive include reaction accelerators, brighteners, surfactants, functionalizing agents and the like. These types are not particularly limited, and commonly used ones can be adopted.
本発明のめっき浴は、必要に応じて、無電解ニッケルめっき浴に配合される公知の各種添加剤を更に含有することができる。添加剤としては、例えば、反応促進剤、光沢剤、界面活性剤、機能付与剤等が挙げられる。これらの種類は特に限定されず、通常用いられるものを採用することができる。 (Others)
The plating bath of the present invention can further contain various known additives to be blended in the electroless nickel plating bath, as necessary. Examples of the additive include reaction accelerators, brighteners, surfactants, functionalizing agents and the like. These types are not particularly limited, and commonly used ones can be adopted.
<無電解ニッケル-リン-コバルトめっき皮膜>
本実施形態の無電解ニッケル-リン-コバルトめっき皮膜(以下、単に「めっき皮膜」という場合がある。)は、被めっき物上に形成されためっき皮膜である。本実施形態のめっき皮膜が形成される被めっき物としては、特に限定されないが、例えば、鉄やアルミニウム、銅等の金属または金属の合金が挙げられる。 <Electroless nickel-phosphorus-cobalt plating film>
The electroless nickel-phosphorus-cobalt plated film (hereinafter sometimes simply referred to as “plated film”) of the present embodiment is a plated film formed on an object to be plated. Although it does not specifically limit as a to-be-plated thing in which the plating film of this embodiment is formed, For example, metals, such as iron, aluminum, copper, or the alloy of metals is mentioned.
本実施形態の無電解ニッケル-リン-コバルトめっき皮膜(以下、単に「めっき皮膜」という場合がある。)は、被めっき物上に形成されためっき皮膜である。本実施形態のめっき皮膜が形成される被めっき物としては、特に限定されないが、例えば、鉄やアルミニウム、銅等の金属または金属の合金が挙げられる。 <Electroless nickel-phosphorus-cobalt plating film>
The electroless nickel-phosphorus-cobalt plated film (hereinafter sometimes simply referred to as “plated film”) of the present embodiment is a plated film formed on an object to be plated. Although it does not specifically limit as a to-be-plated thing in which the plating film of this embodiment is formed, For example, metals, such as iron, aluminum, copper, or the alloy of metals is mentioned.
また、本発明のめっき皮膜においては、リンの含有量が0.1~4質量%であり、1~2質量%が特に好ましい。リンの含有量を0.1~4質量%とすることにより、微結晶構造となるため、めっき皮膜の硬度が向上する。
In the plating film of the present invention, the content of phosphorus is 0.1 to 4% by mass, and 1 to 2% by mass is particularly preferable. By setting the content of phosphorus to 0.1 to 4% by mass, a microcrystalline structure is obtained, so that the hardness of the plated film is improved.
また、本発明のめっき皮膜においては、コバルトを含有しており、皮膜中にコバルトを配合することにより、結晶中のニッケルの一部がコバルトに置き換わるため、皮膜の靭性が向上し、結果として、耐摩耗性が向上する。
In addition, in the plating film of the present invention, cobalt is contained, and by blending cobalt in the film, a part of nickel in the crystal is replaced with cobalt, thereby improving the toughness of the film, and as a result, Wear resistance is improved.
本発明のめっき皮膜においては、コバルトの含有量は1~20質量%であり、2~9質量%が特に好ましい。コバルトの含有量を1~20質量%とすることにより、めっき皮膜の靭性が向上し、めっき皮膜の耐摩耗性が向上する。
In the plated film of the present invention, the content of cobalt is 1 to 20% by mass, and 2 to 9% by mass is particularly preferable. By setting the content of cobalt to 1 to 20% by mass, the toughness of the plating film is improved, and the wear resistance of the plating film is improved.
そして、上述のめっき浴を用いためっき処理により形成される本実施形態のめっき皮膜は、高い硬度(ビッカース硬度が650以上)を有するため、優れた耐摩耗性を実現することが可能になる。また、めっき皮膜の外観ムラが生じないため、優れた外観性を実現することが可能になる。
And since the plating film of this embodiment formed by the plating process using the above-mentioned plating bath has high hardness (Vickers hardness is 650 or more), it becomes possible to implement | achieve the outstanding abrasion resistance. Moreover, since the appearance unevenness of a plating film does not arise, it becomes possible to implement | achieve the outstanding appearance.
なお、めっき皮膜の厚みは、10~40μmが好ましく、20~30μmが、特に好ましい。これは、めっき皮膜が薄すぎると、耐食性の低下等、めっき本来の機能を発揮できない場合があり、めっき皮膜が厚すぎると、めっき外観ムラ等が発生しやすくなるためである。
The thickness of the plating film is preferably 10 to 40 μm, and particularly preferably 20 to 30 μm. This is because when the plating film is too thin, the original function of the plating may not be exhibited, such as a decrease in corrosion resistance, and when the plating film is too thick, uneven plating appearance and the like are easily generated.
以下、実施例及び比較例に基づき本出願に係る発明をさらに具体的に説明するが、本発明は以下の実施例に何ら限定されるものではない。
Hereinafter, the invention according to the present application will be more specifically described based on examples and comparative examples, but the present invention is not limited to the following examples.
(実施例1~21、比較例1~9)
(めっき浴の調製)
水溶性ニッケル塩である硫酸ニッケル(II)六水和物と、還元剤である次亜リン酸ナトリウムと、重金属化合物である酢酸鉛(II)三水和物と、コバルト含有化合物である硫酸コバルト(II)七水和物と、酸化剤として作用するプロパルギルアルコールエトキシレート、ヨウ素酸カリウム、またはニトロベンゼンと、錯化剤であるグリシンと、pH調製剤である水酸化ナトリウムとを、表1~2に示す濃度となるように混合して攪拌することにより、実施例1~21、比較例1~9のめっき浴を調製した。なお、めっき浴の温度を90℃、pHを6.8に設定した。 (Examples 1 to 21, Comparative Examples 1 to 9)
(Preparation of plating bath)
Nickel (II) sulfate hexahydrate which is a water-soluble nickel salt, sodium hypophosphite as a reducing agent, lead acetate (II) trihydrate which is a heavy metal compound, and cobalt sulfate which is a cobalt-containing compound (II) heptahydrate, propargyl alcohol ethoxylate acting as an oxidizing agent, potassium iodate or nitrobenzene, glycine which is a complexing agent, and sodium hydroxide which is a pH adjusting agent; The plating baths of Examples 1 to 21 and Comparative Examples 1 to 9 were prepared by mixing and stirring so as to obtain the concentration shown in the following. The temperature of the plating bath was set to 90 ° C., and the pH was set to 6.8.
(めっき浴の調製)
水溶性ニッケル塩である硫酸ニッケル(II)六水和物と、還元剤である次亜リン酸ナトリウムと、重金属化合物である酢酸鉛(II)三水和物と、コバルト含有化合物である硫酸コバルト(II)七水和物と、酸化剤として作用するプロパルギルアルコールエトキシレート、ヨウ素酸カリウム、またはニトロベンゼンと、錯化剤であるグリシンと、pH調製剤である水酸化ナトリウムとを、表1~2に示す濃度となるように混合して攪拌することにより、実施例1~21、比較例1~9のめっき浴を調製した。なお、めっき浴の温度を90℃、pHを6.8に設定した。 (Examples 1 to 21, Comparative Examples 1 to 9)
(Preparation of plating bath)
Nickel (II) sulfate hexahydrate which is a water-soluble nickel salt, sodium hypophosphite as a reducing agent, lead acetate (II) trihydrate which is a heavy metal compound, and cobalt sulfate which is a cobalt-containing compound (II) heptahydrate, propargyl alcohol ethoxylate acting as an oxidizing agent, potassium iodate or nitrobenzene, glycine which is a complexing agent, and sodium hydroxide which is a pH adjusting agent; The plating baths of Examples 1 to 21 and Comparative Examples 1 to 9 were prepared by mixing and stirring so as to obtain the concentration shown in the following. The temperature of the plating bath was set to 90 ° C., and the pH was set to 6.8.
(めっき処理)
次に、調製しためっき浴に、被めっき物であるSPCC-SB板(サイズ:50mm×50mm、厚み:4mm)を120分間、浸漬し、被めっき物上に25μmの厚みを有する無電解ニッケル-リン-コバルトめっき皮膜を形成した。 (Plating treatment)
Next, the prepared SPCC-SB plate (size: 50 mm × 50 mm, thickness: 4 mm) is immersed in the prepared plating bath for 120 minutes, and electroless nickel having a thickness of 25 μm on the material to be plated A phosphorus-cobalt plating film was formed.
次に、調製しためっき浴に、被めっき物であるSPCC-SB板(サイズ:50mm×50mm、厚み:4mm)を120分間、浸漬し、被めっき物上に25μmの厚みを有する無電解ニッケル-リン-コバルトめっき皮膜を形成した。 (Plating treatment)
Next, the prepared SPCC-SB plate (size: 50 mm × 50 mm, thickness: 4 mm) is immersed in the prepared plating bath for 120 minutes, and electroless nickel having a thickness of 25 μm on the material to be plated A phosphorus-cobalt plating film was formed.
(めっき皮膜の組成分析)
次に、形成しためっき皮膜の組成を分析した。より具体的には、めっき析出した無電解ニッケルーリン-コバルトめっき皮膜を硝酸に溶解させ、この溶解液をICP(HORIBA製、商品名:Ultima Expert)にてリン及びコバルトの定量分析を行い、溶解しためっき皮膜の重量から、皮膜中の各成分の質量%を算出した。以上の結果を表3~4に示す。 (Composition analysis of plating film)
Next, the composition of the formed plating film was analyzed. More specifically, the electroless nickel-phosphorus-cobalt plating film deposited is dissolved in nitric acid, and this solution is subjected to quantitative analysis of phosphorus and cobalt by ICP (manufactured by HORIBA, trade name: Ultima Expert) to dissolve it. From the weight of the plated film, the mass% of each component in the film was calculated. The above results are shown in Tables 3 to 4.
次に、形成しためっき皮膜の組成を分析した。より具体的には、めっき析出した無電解ニッケルーリン-コバルトめっき皮膜を硝酸に溶解させ、この溶解液をICP(HORIBA製、商品名:Ultima Expert)にてリン及びコバルトの定量分析を行い、溶解しためっき皮膜の重量から、皮膜中の各成分の質量%を算出した。以上の結果を表3~4に示す。 (Composition analysis of plating film)
Next, the composition of the formed plating film was analyzed. More specifically, the electroless nickel-phosphorus-cobalt plating film deposited is dissolved in nitric acid, and this solution is subjected to quantitative analysis of phosphorus and cobalt by ICP (manufactured by HORIBA, trade name: Ultima Expert) to dissolve it. From the weight of the plated film, the mass% of each component in the film was calculated. The above results are shown in Tables 3 to 4.
(めっき皮膜の硬度)
次に、上述のめっき処理により形成しためっき皮膜の硬度をJIS Z 2244に準拠した方法により測定した。具体的には微小硬さ試験機(ミツトヨ製、商品名:HM-125)を用いて荷重が100gf、押し込み時間が15秒の条件で、ダイヤモンド圧子にて試料に押し込みを行い、圧子を取り去った時のくぼみの対角線長さから計算される圧子と試料との接触面積で試験力を割って、ビッカース硬度を測定した(ビッカース硬度HV=0.1891×F/d2、F:試験力[N]、d=対角線長さ[mm])。以上の結果を表3~4に示す。 (Hardness of plating film)
Next, the hardness of the plating film formed by the above-mentioned plating treatment was measured by the method according to JIS Z 2244. Specifically, using a microhardness tester (manufactured by Mitutoyo, trade name: HM-125), the sample was pressed with a diamond indenter under a load of 100 gf and an indentation time of 15 seconds, and the indenter was removed The Vickers hardness was measured by dividing the test force by the contact area between the indenter and the sample calculated from the diagonal length of the indentation at the time (Vickers hardness HV = 0.1891 × F / d 2 , F: test force [N ], D = diagonal length [mm]). The above results are shown in Tables 3 to 4.
次に、上述のめっき処理により形成しためっき皮膜の硬度をJIS Z 2244に準拠した方法により測定した。具体的には微小硬さ試験機(ミツトヨ製、商品名:HM-125)を用いて荷重が100gf、押し込み時間が15秒の条件で、ダイヤモンド圧子にて試料に押し込みを行い、圧子を取り去った時のくぼみの対角線長さから計算される圧子と試料との接触面積で試験力を割って、ビッカース硬度を測定した(ビッカース硬度HV=0.1891×F/d2、F:試験力[N]、d=対角線長さ[mm])。以上の結果を表3~4に示す。 (Hardness of plating film)
Next, the hardness of the plating film formed by the above-mentioned plating treatment was measured by the method according to JIS Z 2244. Specifically, using a microhardness tester (manufactured by Mitutoyo, trade name: HM-125), the sample was pressed with a diamond indenter under a load of 100 gf and an indentation time of 15 seconds, and the indenter was removed The Vickers hardness was measured by dividing the test force by the contact area between the indenter and the sample calculated from the diagonal length of the indentation at the time (Vickers hardness HV = 0.1891 × F / d 2 , F: test force [N ], D = diagonal length [mm]). The above results are shown in Tables 3 to 4.
(耐摩耗性)
次に、広域荷重摩擦摩耗試験機(芯東科学(株)製、商品名:トライボギア TYPE35)を用いてボールオンディスク試験を行うことにより、上述のめっき処理により形成しためっき皮膜の耐摩耗性を評価した。より具体的には、径が10mmのアルミナボール、及び潤滑油を用いて、所定の摩耗条件(荷重:15kg、直径1cmのアルミナボールを250rpmで10分間、回転させて、合計摩擦距離が78.5mの回転摩耗を行う、という条件)下で、めっき皮膜の表面を摩耗し、回転摩耗によって生じた摩耗痕について、その摩耗深さ(未摩耗部との深さの差)を各条件4点測定し、その平均値を算出した。以上の結果を表3~4に示す。 (Abrasion resistance)
Next, a ball-on-disk test is performed using a wide area load friction and wear tester (trade name: Tribogear TYPE 35, manufactured by Kadoto Scientific Co., Ltd.) to obtain the abrasion resistance of the plated film formed by the above-described plating process. evaluated. More specifically, using alumina balls of 10 mm in diameter and lubricating oil, predetermined friction conditions (load: 15 kg, alumina balls of 1 cm in diameter are rotated at 250 rpm for 10 minutes, and the total friction distance is 78. Under the condition that 5 m of rotational wear is performed, the surface of the plating film is abraded under the condition that 5 m of rotational abrasion is performed, and the abrasion depth (difference in depth from the non-abraded part) is 4 points for each abrasion mark It measured and calculated the average value. The above results are shown in Tables 3 to 4.
次に、広域荷重摩擦摩耗試験機(芯東科学(株)製、商品名:トライボギア TYPE35)を用いてボールオンディスク試験を行うことにより、上述のめっき処理により形成しためっき皮膜の耐摩耗性を評価した。より具体的には、径が10mmのアルミナボール、及び潤滑油を用いて、所定の摩耗条件(荷重:15kg、直径1cmのアルミナボールを250rpmで10分間、回転させて、合計摩擦距離が78.5mの回転摩耗を行う、という条件)下で、めっき皮膜の表面を摩耗し、回転摩耗によって生じた摩耗痕について、その摩耗深さ(未摩耗部との深さの差)を各条件4点測定し、その平均値を算出した。以上の結果を表3~4に示す。 (Abrasion resistance)
Next, a ball-on-disk test is performed using a wide area load friction and wear tester (trade name: Tribogear TYPE 35, manufactured by Kadoto Scientific Co., Ltd.) to obtain the abrasion resistance of the plated film formed by the above-described plating process. evaluated. More specifically, using alumina balls of 10 mm in diameter and lubricating oil, predetermined friction conditions (load: 15 kg, alumina balls of 1 cm in diameter are rotated at 250 rpm for 10 minutes, and the total friction distance is 78. Under the condition that 5 m of rotational wear is performed, the surface of the plating film is abraded under the condition that 5 m of rotational abrasion is performed, and the abrasion depth (difference in depth from the non-abraded part) is 4 points for each abrasion mark It measured and calculated the average value. The above results are shown in Tables 3 to 4.
(めっき外観)
次に、上述のめっき処理により形成しためっき皮膜の外観について、以下の基準で目視にて評価した。以上の結果を表3~4に示す。
◎:めっき皮膜の全面が均一に光沢
○:めっき皮膜にムラが無く、めっき皮膜の全面が均一
△:めっき皮膜の一部において外観ムラが発生
×:めっき皮膜の全面に外観ムラが発生 (Plating appearance)
Next, the appearance of the plating film formed by the above-described plating treatment was visually evaluated according to the following criteria. The above results are shown in Tables 3 to 4.
:: The entire surface of the plating film is uniformly glossy ○: There is no unevenness in the plating film, and the entire surface of the plating film is uniform Δ: Non-uniform appearance occurs in part of the non-plated film
次に、上述のめっき処理により形成しためっき皮膜の外観について、以下の基準で目視にて評価した。以上の結果を表3~4に示す。
◎:めっき皮膜の全面が均一に光沢
○:めっき皮膜にムラが無く、めっき皮膜の全面が均一
△:めっき皮膜の一部において外観ムラが発生
×:めっき皮膜の全面に外観ムラが発生 (Plating appearance)
Next, the appearance of the plating film formed by the above-described plating treatment was visually evaluated according to the following criteria. The above results are shown in Tables 3 to 4.
:: The entire surface of the plating film is uniformly glossy ○: There is no unevenness in the plating film, and the entire surface of the plating film is uniform Δ: Non-uniform appearance occurs in part of the non-plated film
(めっき浴の安定性)
また、上述のめっき浴を1日7時間で計7日間、昇温放置(即ち、1Lビーカー、及び500Wヒーターを用いて、直径35mmのスタラーピースを300rpmの回転速度で回転させ、90℃にて昇温放置)した時のめっき浴の状態を目視で観察し、以下の基準で評価した。
◎:ヒーター部(一番温度が高い部分)にニッケルが析出せず、かつ、めっき浴全体にニッケルの微粉末が発生せず
○:ヒーター部にニッケルが析出しないが、めっき浴の全体にニッケルの微粉末が一部発生
△:ヒーター部にニッケルが析出
×:めっき浴全体にニッケルの微粉末が発生してめっき浴が分解 (Stability of plating bath)
In addition, the above-mentioned plating bath is left for 7 days in total for 7 days a day (ie, a 35 mm diameter stirrer piece is rotated at 300 rpm using a 1 L beaker and a 500 W heater, and raised at 90 ° C.) The condition of the plating bath when it was allowed to stand was visually observed and evaluated according to the following criteria.
◎: Nickel does not precipitate in the heater portion (the highest temperature portion), and fine powder of nickel does not occur in the entire plating bath ○: Nickel does not precipitate in the heater portion, but nickel in the entire plating bath微: Nickel is deposited on the heater part. ×: Nickel fine powder is generated throughout the plating bath and the plating bath is decomposed.
また、上述のめっき浴を1日7時間で計7日間、昇温放置(即ち、1Lビーカー、及び500Wヒーターを用いて、直径35mmのスタラーピースを300rpmの回転速度で回転させ、90℃にて昇温放置)した時のめっき浴の状態を目視で観察し、以下の基準で評価した。
◎:ヒーター部(一番温度が高い部分)にニッケルが析出せず、かつ、めっき浴全体にニッケルの微粉末が発生せず
○:ヒーター部にニッケルが析出しないが、めっき浴の全体にニッケルの微粉末が一部発生
△:ヒーター部にニッケルが析出
×:めっき浴全体にニッケルの微粉末が発生してめっき浴が分解 (Stability of plating bath)
In addition, the above-mentioned plating bath is left for 7 days in total for 7 days a day (ie, a 35 mm diameter stirrer piece is rotated at 300 rpm using a 1 L beaker and a 500 W heater, and raised at 90 ° C.) The condition of the plating bath when it was allowed to stand was visually observed and evaluated according to the following criteria.
◎: Nickel does not precipitate in the heater portion (the highest temperature portion), and fine powder of nickel does not occur in the entire plating bath ○: Nickel does not precipitate in the heater portion, but nickel in the entire plating bath微: Nickel is deposited on the heater part. ×: Nickel fine powder is generated throughout the plating bath and the plating bath is decomposed.
表3、表4に示すように、アセチレン化合物の濃度が10~120mg/Lである実施例1~4,13,16~17、ヨウ素酸イオン源の濃度が10~4000mg/Lである実施例5~8,14,18、ヨウ化物イオン源の濃度が10~4000mg/Lである実施例20~21、及びニトロ基含有芳香族化合物の濃度が0.1~5000mg/Lである実施例9~12,15,19においては、めっき浴の不安定化を生じることなく、高い硬度を有するとともに、耐摩耗性及び外観に優れためっき皮膜を形成することができることが分かる。
As shown in Tables 3 and 4, Examples 1 to 4, 13, 16 to 17 in which the concentration of the acetylene compound is 10 to 120 mg / L, and Examples in which the concentration of the iodate ion source is 10 to 4000 mg / L 5 to 8, 14, 18, Examples 20 to 21 in which the concentration of the iodide ion source is 10 to 4000 mg / L, and Example 9 in which the concentration of the nitro group-containing aromatic compound is 0.1 to 5000 mg / L It can be seen that, in Nos. 12, 15, and 19, it is possible to form a plated film having high hardness and excellent in wear resistance and appearance without causing instability of the plating bath.
本実施形態の無電解ニッケル-リン-コバルトめっき浴は、耐摩耗性及び外観に優れためっき皮膜の形成に好適に使用される。
The electroless nickel-phosphorus-cobalt plating bath of the present embodiment is suitably used for the formation of a plating film excellent in wear resistance and appearance.
Claims (5)
- 水溶性ニッケル塩と、次亜リン酸塩と、コバルト含有化合物と、重金属化合物とを含有する無電解ニッケル-リン-コバルトめっき浴であって、
アセチレン化合物、ヨウ化物イオン源又はヨウ素酸イオン源、及びニトロ基を1以上含有するニトロ基含有芳香族化合物からなる群より選ばれる少なくとも1種を更に含有し、
前記アセチレン化合物の濃度が10~120mg/Lであり、前記ヨウ化物イオン源又はヨウ素酸イオン源の濃度が10~4000mg/Lであり、前記ニトロ基含有芳香族化合物の濃度が0.1~5000mg/Lであることを特徴とする無電解ニッケル-リン-コバルトめっき浴。 An electroless nickel-phosphorus-cobalt plating bath comprising a water-soluble nickel salt, a hypophosphite, a cobalt-containing compound, and a heavy metal compound,
And at least one selected from the group consisting of an acetylene compound, an iodide ion source or an iodate ion source, and a nitro group-containing aromatic compound containing one or more nitro groups,
The concentration of the acetylene compound is 10 to 120 mg / L, the concentration of the iodide ion source or the iodate ion source is 10 to 4000 mg / L, and the concentration of the nitro group-containing aromatic compound is 0.1 to 5000 mg Electroless nickel-phosphorus-cobalt plating bath characterized in that - 前記アセチレン化合物が、プロパルギルアルコール及び/又はその誘導体であることを特徴とする請求項1に記載の無電解ニッケル-リン-コバルトめっき浴。 The electroless nickel-phosphorus-cobalt plating bath according to claim 1, wherein the acetylene compound is propargyl alcohol and / or a derivative thereof.
- 前記プロパルギルアルコールが、エトキシ化及び/又はプロポキシ化されたプロパルギルアルコールであることを特徴とする請求項2に記載の無電解ニッケル-リン-コバルトめっき浴。 The electroless nickel-phosphorus-cobalt plating bath according to claim 2, wherein the propargyl alcohol is ethoxylated and / or propoxylated propargyl alcohol.
- 前記ヨウ化物イオン源又はヨウ素酸イオン源が、ヨウ化カリウム、ヨウ化鉄、ヨウ化ニッケル、ヨウ化リチウム、ヨウ化ナトリウム、ヨウ素酸カリウム、ヨウ素酸ナトリウム、及びヨウ素酸アンモニウムからなる群より選ばれる少なくとも1種であることを特徴とする請求項1~請求項3のいずれか1項に記載の無電解ニッケル-リン-コバルトめっき浴。 The iodide ion source or the iodate ion source is selected from the group consisting of potassium iodide, iron iodide, nickel iodide, lithium iodide, sodium iodide, sodium iodide, potassium iodate, sodium iodate, and ammonium iodate The electroless nickel-phosphorus-cobalt plating bath according to any one of claims 1 to 3, which is at least one type.
- 前記ニトロ基含有芳香族化合物が、ニトロ基以外の置換基を有するベンゼン、ニトロ基以外の置換基を有するナフタレン、及びそれらのアルカリ金属塩からなる群より選ばれる少なくとも1種であることを特徴とする請求項1~請求項4のいずれか1項に記載の無電解ニッケル-リン-コバルトめっき浴。 The nitro group-containing aromatic compound is at least one selected from the group consisting of benzene having a substituent other than a nitro group, naphthalene having a substituent other than a nitro group, and alkali metal salts thereof. The electroless nickel-phosphorus-cobalt plating bath according to any one of claims 1 to 4.
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JPS62502972A (en) * | 1985-05-03 | 1987-11-26 | マツクダ−ミツド インコ−ポレ−テツド | Methods and compositions for electroless nickel deposition |
JPS6324072A (en) * | 1986-03-04 | 1988-02-01 | Ishihara Yakuhin Kk | Electroless palladium-nickel alloy plating liquid |
JPH01205081A (en) * | 1987-12-28 | 1989-08-17 | Domain Technol | Electroless plating method and composition of magnetic recording medium |
JPH04187780A (en) * | 1990-11-20 | 1992-07-06 | Univ Waseda | Electroless plating bath |
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