WO2019040434A3 - Chopped bias magnetic field solid-state spin sensor for low-frequency measurements of physical quantities - Google Patents

Chopped bias magnetic field solid-state spin sensor for low-frequency measurements of physical quantities

Info

Publication number
WO2019040434A3
WO2019040434A3 PCT/US2018/047222 US2018047222W WO2019040434A3 WO 2019040434 A3 WO2019040434 A3 WO 2019040434A3 US 2018047222 W US2018047222 W US 2018047222W WO 2019040434 A3 WO2019040434 A3 WO 2019040434A3
Authority
WO
WIPO (PCT)
Prior art keywords
magnetic field
bias magnetic
state spin
low
spin sensor
Prior art date
Application number
PCT/US2018/047222
Other languages
French (fr)
Other versions
WO2019040434A2 (en
Inventor
Linh M. PHAM
Erik M. THOMPSON
John F. BARRY
Danielle A. BRAJE
Kerry Johnson
Original Assignee
Massachusetts Institute Of Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Massachusetts Institute Of Technology filed Critical Massachusetts Institute Of Technology
Publication of WO2019040434A2 publication Critical patent/WO2019040434A2/en
Publication of WO2019040434A3 publication Critical patent/WO2019040434A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
    • G01R33/1284—Spin resolved measurements; Influencing spins during measurements, e.g. in spintronics devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0017—Means for compensating offset magnetic fields or the magnetic flux to be measured; Means for generating calibration magnetic fields
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/24—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/26—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux using optical pumping

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Magnetic Variables (AREA)

Abstract

Applying a bias magnetic field to a solid-state spin sensor enables vector magnetic field measurements with the solid-state spin sensor. Unfortunately, if the bias magnetic field drifts slowly, it creates noise that confounds low-frequency field measurements. Fortunately, the undesired slow drift of the magnitude of the bias magnetic field can be removed, nullified, or cancelled by reversing the direction (polarity) of the bias magnetic field at known intervals. This makes the resulting solid-state spin sensor system suitable for detecting low-frequency (mHz, for example) changes in magnetic field or other physical parameters.
PCT/US2018/047222 2017-08-21 2018-08-21 Chopped bias magnetic field solid-state spin sensor for low-frequency measurements of physical quantities WO2019040434A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201762548096P 2017-08-21 2017-08-21
US62/548,096 2017-08-21

Publications (2)

Publication Number Publication Date
WO2019040434A2 WO2019040434A2 (en) 2019-02-28
WO2019040434A3 true WO2019040434A3 (en) 2020-04-09

Family

ID=65439589

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2018/047222 WO2019040434A2 (en) 2017-08-21 2018-08-21 Chopped bias magnetic field solid-state spin sensor for low-frequency measurements of physical quantities

Country Status (2)

Country Link
US (1) US11041916B2 (en)
WO (1) WO2019040434A2 (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015105527A1 (en) 2014-01-08 2015-07-16 Massachusetts Institute Of Technology Methods and apparatus for optically detecting magnetic resonance
US10620251B2 (en) 2016-06-28 2020-04-14 Massachusetts Institute Of Technology Spin-based electrometry with solid-state defects
WO2018089455A1 (en) 2016-11-08 2018-05-17 Massachusetts Institute Of Technology Methods and apparatus for optically detecting magnetic resonance
CN109001652B (en) * 2018-05-25 2019-10-22 中国科学技术大学 A kind of magnetic field measuring device and Measurement Method for Magnetic Field based on solid-state spin
CN110085094A (en) * 2019-04-16 2019-08-02 国仪量子(合肥)技术有限公司 The teaching equipment of quantum calculation and quantum accurate measurement
US12032044B2 (en) 2020-02-26 2024-07-09 Massachusetts Institute Of Technology Oscillator-based solid-state spin sensor
US11156675B2 (en) 2020-03-05 2021-10-26 Honeywell International Inc. Magnetometer device based on electrical pumping in nitrogen-vacancy centers in diamond
TWI821750B (en) * 2020-10-07 2023-11-11 台灣愛司帝科技股份有限公司 Electronic component measuring equipment, electronic component measuring method, and led manufacturing method
CN113447869B (en) * 2021-06-25 2022-10-28 中国科学技术大学 Solid-state spin sensor and magnetic field measuring method thereof
JP2023075801A (en) * 2021-11-19 2023-05-31 スミダコーポレーション株式会社 Digitizing device and digitizing method
DE102022211859A1 (en) 2022-11-09 2024-05-16 Robert Bosch Gesellschaft mit beschränkter Haftung Magnetometer unit with magnetic field modulation for direction-sensitive measurement of a magnetic field and gradiometer unit with magnetometer unit
CN115762843A (en) * 2022-12-01 2023-03-07 杭州旷潼量子科技有限公司 Be used for super cold atomic magnetic field precision control device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100308813A1 (en) * 2007-12-03 2010-12-09 President And Fellows Of Harvard College High sensitivity solid state magnetometer
US20120001625A1 (en) * 2009-01-16 2012-01-05 Katholieke Universiteit Leuven Ultrasensitive magnetic sensor based on giant faraday rotation
US20150369881A1 (en) * 2011-02-08 2015-12-24 Infineon Technologies Ag Low offset vertical hall device and current spinning method
US20170030982A1 (en) * 2015-07-28 2017-02-02 Rmit University Sensor for measuring an external magnetic field
US20170059666A1 (en) * 2013-12-03 2017-03-02 The Regents Of The University Of California Offset suppression in micromachined lorentz force magnetic sensor by current chopping

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2515226A (en) 2012-04-13 2014-12-17 Univ California Gyroscopes based on nitrogen-vacancy centers in diamond
WO2014210486A1 (en) 2013-06-28 2014-12-31 Dirk Robert Englund Wide-field sensing using nitrogen vacancies
WO2015105527A1 (en) * 2014-01-08 2015-07-16 Massachusetts Institute Of Technology Methods and apparatus for optically detecting magnetic resonance
US10620251B2 (en) * 2016-06-28 2020-04-14 Massachusetts Institute Of Technology Spin-based electrometry with solid-state defects
WO2018089455A1 (en) 2016-11-08 2018-05-17 Massachusetts Institute Of Technology Methods and apparatus for optically detecting magnetic resonance

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100308813A1 (en) * 2007-12-03 2010-12-09 President And Fellows Of Harvard College High sensitivity solid state magnetometer
US20120001625A1 (en) * 2009-01-16 2012-01-05 Katholieke Universiteit Leuven Ultrasensitive magnetic sensor based on giant faraday rotation
US20150369881A1 (en) * 2011-02-08 2015-12-24 Infineon Technologies Ag Low offset vertical hall device and current spinning method
US20170059666A1 (en) * 2013-12-03 2017-03-02 The Regents Of The University Of California Offset suppression in micromachined lorentz force magnetic sensor by current chopping
US20170030982A1 (en) * 2015-07-28 2017-02-02 Rmit University Sensor for measuring an external magnetic field

Also Published As

Publication number Publication date
US20200025835A1 (en) 2020-01-23
WO2019040434A2 (en) 2019-02-28
US11041916B2 (en) 2021-06-22

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