WO2019019519A1

WO2019019519A1 - Ferromagnetic resonance probe

Info

Publication number: WO2019019519A1
Application number: PCT/CN2017/114902
Authority: WO
Inventors: 何世坤
Original assignee: 中电海康集团有限公司
Priority date: 2017-07-24
Filing date: 2017-12-07
Publication date: 2019-01-31
Also published as: CN109298359B; CN109298359A

Abstract

A ferromagnetic resonance probe, comprising a planar waveguide (10). The ferromagnetic resonance probe further comprises: a base (20), the planar waveguide (10) being disposed on the base (20); a pressing and bearing assembly (30) disposed on the base (20) and having a bearing platform (31) used for bearing a sample to be tested (40), the bearing platform (31) and the planar waveguide (10) being movably disposed relative to each other, so as to press the sample to be tested (40) on the planar waveguide (10). The ferromagnetic resonance probe resolves the problem in the prior art it is difficult to prevent the sample to be tested (40) from tilting toward the planar waveguide (10) during the test of the ferromagnetic resonance probe; a channel with high heat conductivity is established between the sample to be tested (40) and the base (20), so as to implement quick and accurate control of the temperature of the sample to be tested (40).

Description

Ferromagnetic resonance probe

Technical field

The present invention relates to the field of ferromagnetic resonance and, in particular, to a ferromagnetic resonance probe.

Background technique

A typical design schematic of a wide-band ferromagnetic resonance in a parallel magnetic field is shown in Figures 1 to 3. The basic components are the back ground plane waveguide 1, the high frequency connector 2, and the electromagnet 3. The back ground plane waveguide generates a high frequency microwave (RF) magnetic field to drive and maintain a small angular precession of the sample 4 magnetic moment. Since the ferromagnetic resonance requires the microwave magnetic field generated by the principle to be perpendicular to the external magnetic field, the waveguide below the sample 4 must be parallel to the external magnetic field; an electromagnet usually has a magnetic pole gap of several inches, and further reduction is required in order to achieve a higher magnetic field. A small gap, so the U-shaped planar waveguide 1 is a common design, and the sample 4 corresponding to the planar waveguide 1 is placed in a flipping manner or flipped and then fixed with a non-residual tape 5, so that the film surface is close to the planar waveguide 1 but must be avoided Electrically conductive.

However, in the measurement, it is necessary to adjust the relative orientation of the external magnetic field relative to the plane of the film sample, and the surface of the film sample is generally not parallel to the horizontal plane. In this case, when the existing ferromagnetic resonance probe is loaded with a sample, there is a possibility that there is a small angle between the surface of the sample and the ground plane waveguide of the back, and it is usually necessary to adjust the position of the tape 5 a plurality of times to obtain an ideal response curve. In addition, the above installation is difficult when the sample is mounted in a limited space or the sample is mounted on a plane perpendicular to the horizontal plane. Moreover, the installation method has poor temperature stability. Since the waveguide is a low thermal conductivity material, when the temperature of the base is significantly different from the ambient temperature, there is a large temperature difference between the sample and the base.

The influence of the above angle on the measurement signal is evaluated as follows: Since the planar waveguide 1 is used as a special printed circuit board, the surface has occasional curvature and a small bump caused by the conductive plating, and the pressure at both ends of the tape is inconsistent, and the sample inevitably has a small angle. Tilt (about 1 degree), as shown in Figure 3, one side of the sample is snug against the waveguide and the other side is lifted. Assuming the sample has a length of L = 5 mm, then the interval d between the sample and the waveguide in the middle of the sample is:

Calculated with a typical center conductor width of a planar waveguide of S = 100 microns, this would result in a position of p2 with a gap of 44 μm from the waveguide, roughly half the width of the center conductor. Compared with the P1 position close to the surface, it can be known from Ampere's law that the microwave magnetic field has a bright surface attenuation; the microwave magnetic field has a larger vertical component. Under the same test conditions, this will result in a weaker signal and a resonant response that introduces different modes.

Summary of the invention

The main object of the present invention is to provide a ferromagnetic resonance probe to solve the problem that the sample to be tested which is observed in the prior art of the ferromagnetic resonance probe is inclined to the planar waveguide.

In order to achieve the above object, the present invention provides a ferromagnetic resonance probe comprising a planar waveguide, the ferromagnetic resonance probe further comprising: a base, the planar waveguide is disposed on the base; the ballast assembly, the ballast assembly is disposed on the base, and the ballast is The assembly has a carrying platform for carrying the sample to be tested, and the carrying platform and the planar waveguide are relatively movably disposed to press the sample to be tested onto the planar waveguide.

Further, the ballast assembly includes: a fixing seat disposed on the base to allow the ballast assembly to be disposed on the base through the fixing base; wherein at least a portion of the carrying platform is movably disposed in the fixing seat.

Further, the carrying platform includes: a carrying platform for carrying the sample to be tested, the carrying platform is disposed opposite to the planar waveguide, so that the sample to be tested on the carrying platform is attached to the planar waveguide; and the connecting rod and the connecting rod are movably disposed In the mount, the carrier is disposed at one end of the connecting rod adjacent to the planar waveguide such that the carrier is movably disposed relative to the planar waveguide by the connecting rod.

Further, the ballast assembly further includes: an elastic member, the elastic member is sleeved on the connecting rod, and the elastic member is disposed between the fixing seat and the carrying platform, so that the carrying platform is close to or away from the planar waveguide under the action of the elastic member. The direction is set retractably.

Further, the fixing seat is provided with a mounting hole, and the connecting rod is disposed in the mounting hole; the mounting hole comprises a first hole segment and a second hole segment, and one end of the elastic member is disposed in the second hole segment, and the elastic member is further One end abuts the carrier; wherein the outer peripheral surface of the elastic member is in clearance with the inner wall of the second hole segment.

Further, the ballast assembly further includes: a moving handle, one end of the connecting rod is used for connecting with the carrying platform, and the other end of the connecting rod is connected to the moving handle after passing through the mounting hole to drive the connecting rod to move by driving the moving handle.

Further, the moving handle is provided with an internal thread, and the connecting rod has an external thread adapted to the internal thread to screw the moving handle with the connecting rod.

Further, the fixing seat is provided with a fastening hole through which the fastener passes, and the fastening hole communicates with the first hole segment to make the fastener abut the connecting rod after passing through the fastening hole.

Further, the base includes a support table and a support plate disposed on the support table, and the planar waveguide is disposed on the support plate.

Further, the support plate has a first bonding surface for conforming to the planar waveguide, and the first bonding surface is disposed in parallel with the vertical plane.

Further, the support plate has a first bonding surface for conforming to the planar waveguide, and the first bonding surface is disposed in parallel with the horizontal plane.

Further, the ferromagnetic resonance probe further comprises: a temperature sensing unit, the temperature sensing unit is disposed on the base to determine the temperature of the planar waveguide by monitoring the temperature of the base; the heating component, the heating component is disposed on the base, and the temperature sensing unit A signal is coupled to the heating assembly to control the heating assembly through the temperature sensing unit to change the temperature of the planar waveguide by heating the base.

Further, the ferromagnetic resonance probe further includes: a binding post, the binding post is disposed on the base, the binding post has a first terminal group for connecting with the temperature sensing unit, and a connection line for connecting with the heating component The second terminal group is such that the temperature sensing unit and the heating assembly are in communication with the external line through the first terminal group and the second terminal group.

Further, the manufacturing materials of the base and the carrying platform are both thermally conductive metal materials, and the outer surface of the carrying platform is coated with a thermal conductive adhesive.

The ferromagnetic resonance probe of the invention realizes the flat fitting of the sample to be tested and the plane waveguide through the base and the ballast assembly, wherein the plane waveguide is disposed on the base, the ballast assembly is disposed on the base, and the sample to be tested is set in the ballast The component is on the carrying platform. During the specific installation process, the sample to be tested is placed on the carrying platform. Considering that the carrying platform is relatively movably disposed with the planar waveguide, the sample to be tested is placed close to the planar waveguide by moving the carrying platform until the sample to be tested is attached to the planar waveguide. When the pressure demand of both is met, the mobile bearer platform is stopped.

Compared with the prior art, the sample to be tested needs to be stabilized on the planar waveguide by the tape, thereby causing the sample to be tested to tilt relative to the planar waveguide, affecting the subsequent test results, and the ferromagnetic resonance probe of the present invention passes through the base and the ballast assembly. It is realized that the sample to be tested is quickly pressed onto the planar waveguide, and the two do not have a relative tilt, thereby solving the problem that the sample to be tested which is observed in the prior art is inclined to the planar waveguide during the detection process.

In addition, in the prior art, the planar waveguide is a printed circuit board, and the sample is attached to the planar waveguide and has poor thermal conductivity between the base and the base. The ballast assembly of the invention simultaneously establishes a rapid heat transfer path between the sample and the base, solves the heat conduction problem in the prior art, and designs a temperature control component on the probe, which is suitable for the variable temperature ferromagnetic resonance test.

DRAWINGS

The accompanying drawings, which are incorporated in the claims of the claims In the drawing:

Figure 1 is a schematic view showing the structure of a prior art ferromagnetic resonance system;

2 is a schematic view showing an angle between a sample of the prior art and a planar waveguide;

Figure 3 shows a front view of the sample of Figure 2 and a planar waveguide;

Figure 4 is an exploded perspective view showing a first embodiment of a ferromagnetic resonance probe according to the present invention;

Figure 5 is a block diagram showing the structure of a first embodiment of a ferromagnetic resonance probe according to the present invention;

Figure 6 is a schematic exploded perspective view showing a second embodiment of a ferromagnetic resonance probe according to the present invention;

Figure 7 shows a comparison of the ferromagnetic resonance response of a conventional sample loading and loading using the ferromagnetic resonance probe of the present invention.

Wherein, the above figures include the following reference numerals:

1, plane waveguide; 2, high frequency connector; 3, electromagnet; 4, sample; 5, tape; 10, plane waveguide; 20, base; 21, support table; 211, second bonding surface; Plate; 221, first bonding surface; 30, ballast assembly; 31, carrying platform; 311, carrying platform; 312, connecting rod; 32, fixing seat; 321, first hole section; 322, fastening hole; , elastic member; 34, moving handle; 35, fasteners; 40, sample to be tested; 50, heating components; 60, binding posts; 70, temperature sensing unit; 80, high frequency connector.

Detailed ways

It should be noted that the embodiments in the present application and the features in the embodiments may be combined with each other without conflict. The invention will be described in detail below with reference to the drawings in conjunction with the embodiments.

The present invention provides a ferromagnetic resonance probe. Referring to FIG. 4 to FIG. 6, the ferromagnetic resonance probe includes a planar waveguide 10, and the ferromagnetic resonance probe further includes: a base 20, the planar waveguide 10 is disposed on the base 20; and the ballast assembly 30, the ballast assembly 30 is disposed on the base 20, and the ballast assembly 30 has a carrying platform 31 for carrying the sample 40 to be tested. The carrying platform 31 and the planar waveguide 10 are relatively movably disposed to press the sample 40 to be tested. On the planar waveguide 10.

The ferromagnetic resonance probe of the present invention realizes a flat fit of the sample 40 to be tested and the planar waveguide 10 through the base 20 and the ballast assembly 30, wherein the planar waveguide 10 is disposed on the base 20, and the ballast assembly 30 is disposed on the base 20. The sample to be tested 40 is disposed on the carrying platform 31 of the ballast assembly 30. During the specific installation process, the sample to be tested 40 is placed on the carrying platform 31. Considering that the carrying platform 31 is relatively movably disposed with the planar waveguide 10, the sample to be tested 40 is moved closer to the planar waveguide 10 by moving the carrying platform 31 until the standby The test sample 40 is attached to the planar waveguide 10, and when the pressure demand is met, the mobile load bearing platform 31 is stopped.

Compared with the prior art, the sample 40 to be tested needs to be stabilized on the planar waveguide 10 by tape, thereby causing the sample to be tested to tilt relative to the planar waveguide 10, affecting subsequent test results, and the ferromagnetic resonance probe of the present invention passes through the base 20. And the ballast assembly 30 realizes that the sample 40 to be tested is quickly pressed onto the planar waveguide 10 without relative tilting, thereby solving the sample to be tested in the prior art by the ferromagnetic resonance probe during the detection process. The problem of tilting to the planar waveguide 10.

In order to be able to mount the ballast assembly 30 on the base 20, as shown in FIG. 4, the ballast assembly 30 includes a fixing base 32 that is disposed on the base 20 such that the ballast assembly 30 is disposed through the fixing base 32. The base 20 is; wherein at least a portion of the carrying platform 31 is movably disposed within the mount 32.

In the present embodiment, by providing the fixing seat 32 on the ballast assembly 30, the fixing seat 32 is disposed on the base 20, so that the ballast assembly 30 is disposed on the base 20 through the fixing base 32, in order to be able to be The sample 40 is pressed onto the planar waveguide 10. In this embodiment, at least a portion of the carrying platform 31 is movably disposed in the fixing base 32, so that the sample 40 to be tested can be realized by the moving bearing platform 31. Pressing.

For the specific structure of the carrying platform 31, as shown in FIG. 4, the carrying platform 31 includes: a carrying platform 311 for carrying a sample to be tested, and the carrying platform 311 is disposed opposite to the planar waveguide 10, so that the sample to be tested on the carrying platform 311 40 is attached to the planar waveguide 10; the connecting rod 312 is movably disposed in the fixing base 32. The carrying platform 311 is disposed at one end of the connecting rod 312 near the planar waveguide 10, so that the carrying platform 311 passes through the connecting rod 312. It is movably disposed with respect to the planar waveguide 10.

In this embodiment, the carrying platform 31 is composed of a carrying platform 311 and a connecting rod 312. The connecting rod 312 is movably disposed in the fixing base 32. The carrying platform 311 is disposed at one end of the connecting rod 312 near the planar waveguide 10. The sample to be tested 40 is placed on the carrier 311. By placing the carrier 311 opposite to the planar waveguide 10, the sample 40 to be tested on the carrier 311 can be attached to the planar waveguide 10 by moving the connecting rod 312.

In order to enable automatic movement of the connecting rod 312, the ballast assembly 30 further includes: an elastic member 33, the elastic member 33 is sleeved on the connecting rod 312, and the elastic member 33 is disposed between the fixing base 32 and the carrying platform 311 so as to be carried Table 311 in elastic parts The action of 33 is telescopically disposed in a direction toward or away from the planar waveguide 10. The elastic member 33 is disposed on the ballast assembly 30, wherein the elastic member 33 is sleeved on the connecting rod 312, and the elastic member 33 is disposed between the fixing base 32 and the carrying platform 311, so that the elastic member 33 can be expanded and contracted. The carrier 311 is telescopically disposed in a direction toward or away from the planar waveguide 10.

In the present embodiment, the elastic member 33 is a beryllium copper spring having an outer diameter of 5 mm.

Preferably, the fixing base 32 is provided with a mounting hole, and the connecting rod 312 is disposed in the mounting hole; the mounting hole includes a first hole section 321 and a second hole section, and one end of the elastic member 33 is disposed in the second hole section. The other end of the elastic member 33 abuts against the carrier 311; wherein the outer peripheral surface of the elastic member 33 is in clearance with the inner wall of the second hole segment.

In the present embodiment, the outer peripheral surface of the elastic member 33 is clearance-fitted with the inner wall of the second hole section, and since the diameter of the second hole section for mounting the spring is slightly larger than the outer diameter of the spring, the spring will adaptively fine-tune the orientation. Therefore, it can be matched with the surface of the planar waveguide, which is beneficial to ensure that the surface of the sample to be tested 40 and the plane of the planar waveguide 10 are parallel to improve the degree of compression.

In order to facilitate the operation, the ballast assembly 30 further includes a moving handle 34. One end of the connecting rod 312 is connected to the carrying platform 311, and the other end of the connecting rod 312 is connected to the moving handle 34 through the mounting hole to be moved by the driving. The handle 34 moves to drive the connecting rod 312.

In this embodiment, a moving handle 34 is disposed on the ballast assembly 30, wherein one end of the connecting rod 312 is used for connecting with the carrying platform 311, and the other end of the connecting rod 312 is connected to the moving handle 34 after passing through the mounting hole. When the sample to be tested 40 needs to be installed, the elastic member 33 is compressed by pulling the moving handle 34, and the sample 40 to be tested is away from the planar waveguide 10. After the sample 40 to be tested is installed, the moving handle 34 is released, and the carrying table 311 is released. Moving toward the side close to the planar waveguide 10 by the elastic member 33, the sample 40 to be tested is pressed onto the planar waveguide 10.

In order to ensure mounting stability, the moving handle 34 is provided with internal threads, and the connecting rod 312 has an external thread adapted to the internal thread to screw the moving handle 34 with the connecting rod 312.

In order to prevent the connecting rod 312 from moving when the sample 40 to be tested is installed or disassembled, as shown in FIG. 4, the fixing seat 32 is provided with a fastening hole 322 through which the fastener 35 passes, the fastening hole 322 and the first hole. The segment 321 is in communication such that the fastener 35 passes through the fastening hole 322 and abuts against the connecting rod 312.

In order to facilitate the mounting of the planar waveguide 10 and facilitate testing, as shown in FIGS. 4 to 6, the base 20 includes a support table 21 and a support plate 22 disposed on the support table 21, and the planar waveguide 10 is disposed on the support plate 22.

For the first application embodiment of the mounting manner of the ballast assembly 30 and the planar waveguide 10, as shown in FIGS. 4 and 5, the support plate 22 has a first bonding surface 221 for conforming to the planar waveguide 10. The first bonding surface 221 is disposed in parallel with the vertical plane.

In this embodiment, the ballast assembly 30 is disposed on the support table 21, and the planar waveguide 10 is disposed on the support plate 22. wherein the support table 21 is a circular table, the support table 21 is horizontally disposed, and the support plate 22 is disposed perpendicular to the horizontal plane. The planar waveguide 10 is attached to the support plate 22 and disposed perpendicular to the horizontal plane. The surface of the support plate 22 for bonding with the planar waveguide 10 is a first bonding surface 221, and the support table 21 is used for supporting The surface of the first bonding surface of the board 22 is connected to the second surface. The first bonding surface 221 is perpendicular to the second bonding surface 211, the first bonding surface 221 is perpendicular to the horizontal plane, and the second bonding surface 211 is parallel to the horizontal plane.

For a second application embodiment of the mounting manner of the ballast assembly 30 and the planar waveguide 10, as shown in FIG. 6, the support plate 22 has a first bonding surface 221 for bonding with the planar waveguide 10, the first bonding surface 221 is arranged in parallel with the horizontal plane.

In this embodiment, the ballast assembly 30 and the planar waveguide 10 are both disposed on the support plate 22, wherein the support table 21 is a cylindrical table, and the surface of the support plate 22 for bonding with the planar waveguide 10 is the first bonding surface. 221, the surface of the support table 21 for bonding with the support plate 22 is a second bonding surface 211, and the first bonding surface 221 is parallel to the second bonding surface 211, wherein the first bonding surface 221 and the second surface The mating faces 211 are all parallel to the horizontal plane.

In order to realize the temperature change test, as shown in FIG. 4, the ferromagnetic resonance probe further includes: a temperature sensing unit 70, and the temperature sensing unit 70 is disposed on the base 20 to determine the temperature of the planar waveguide 10 by monitoring the temperature of the base 20; The assembly 50, the heating assembly 50 is disposed on the base 20, and the temperature sensing unit 70 is signally coupled to the heating assembly 50 to control the heating assembly 50 through the temperature sensing unit 70 to change the temperature of the planar waveguide 10 by heating the base 20.

Preferably, the ferromagnetic resonance probe further comprises: a terminal 60, the terminal 60 is disposed on the base 20, the terminal 60 has a first terminal group for connecting with the temperature sensing unit 70, and is used for heating The second terminal group of the connection of the component 50 is connected such that the temperature sensing unit 70 and the heating assembly 50 communicate with the external line through the first terminal group and the second terminal group.

In the present embodiment, an insulating alumina gasket is disposed between the planar waveguide 10 and the base 20.

In order to provide the heat transfer capability of the sample to be tested 40 and the base 20, the base 20 and the load-bearing platform 31 are made of a thermally conductive metal material, and the outer surface of the load-bearing platform 31 is coated with a thermal conductive adhesive.

Commonly used thermally conductive metal materials such as aluminum, copper, gold, silver, etc., in this embodiment, the base 20 and the load-bearing platform 31 are made of gold-plated copper.

The specific structure and use process of the ferromagnetic resonance probe of the present invention are described:

The outer dimensions of the ferromagnetic resonance probe of the present invention are designed according to the dimensions of the electromagnet or cryostat, and are guaranteed to match the peripheral equipment. Mounted to the peripheral device or to the stage by screws, wherein the probe base 20 will be used to secure the waveguide assembly, the temperature control unit and the sample loading (ballast assembly 30) assembly.

The planar waveguide 10 for the waveguide assembly is U-shaped with a nominal impedance of 50 ohms, by the waveguide by Rogers (RT/

6010, thickness 254μm) printed circuit board, the center conductor is 100μm wide, the circuit board is installed with a high-frequency connector 80 through the through hole, and then mounted on the probe base.

The temperature control unit is composed of a temperature sensor (temperature sensing unit 70), a heating wire (heating assembly 50), and a terminal 60. All machined parts are gold-plated copper with a high thermal conductivity k. Therefore, the response characteristic time t=C/k with small temperature control, where C is the system heat capacity. The temperature difference between the waveguide and the sensor will be minimized when the heater is in operation.

7 is a test result of the sample loading mode and the conventional sample loading mode of the present invention, wherein the dotted line is the test result of the conventional sample loading mode, and the solid line is the test result of the sample loading mode of the present invention. A 2 nm cobalt iron boron (CFB) film sample was used with a microwave frequency of 20 GHz and a power of 0 dBm (1 mW). With this scheme, the height of one ferromagnetic resonance signal is increased by 20% compared with the maximum signal of six ordinary loading tests. In addition, the unique asymmetric peak shape of ferromagnetic resonance is more in line with theoretical expectations in this design.

The ferromagnetic resonance spectrum is a relative change curve of the microwave transmission coefficient S21 with the external magnetic field H(Oe) at a fixed frequency. In the absence of magnetic resonance, the microwave transmission coefficient S21 does not vary with the external magnetic field. When the resonance condition is satisfied, the ferromagnetic resonance causes microwave absorption, and the microwave transmission energy is lowered, so that a decrease in S21 occurs. The resonance spectrum can generally be fitted by solving the magnetic moment dynamics equation. The stronger the resonance spectrum signal is, the more accurate the fitting is.

From the above description, it can be seen that the above-described embodiments of the present invention achieve the following technical effects:

The ferromagnetic resonance probe of the present invention realizes a flat fit of the sample 40 to be tested and the planar waveguide 10 through the base 20 and the ballast assembly 30, wherein the planar waveguide 10 is disposed on the base 20, and the ballast assembly 30 is disposed on the base 20. The sample to be tested 40 is disposed on the carrying platform 31 of the ballast assembly 30. During the specific installation process, the sample to be tested 40 is placed on the carrying platform 31. Considering that the carrying platform 31 is relatively movably disposed with the planar waveguide 10, the sample to be tested 40 is moved closer to the planar waveguide 10 by moving the carrying platform 31 until the standby The sample is attached to the planar waveguide 10, and a certain pressure is maintained by the elastic member 33 to ensure that the bonding state does not change with time, the probe temperature, and the probe orientation.

Compared with the prior art, the sample 40 to be tested needs to be stabilized on the planar waveguide 10 by the tape, thereby causing the sample to be tested to tilt relative to the planar waveguide 10, and the change of the bonding state during the temperature change process affects the subsequent test results. The ferromagnetic resonance probe of the present invention realizes the rapid pressing of the sample 40 to be tested onto the planar waveguide 10 through the base 20 and the ballast assembly 30, and the two do not appear to be relatively inclined, and are not affected by the measurement conditions and time, thereby solving the problem. The prior art ferromagnetic resonance probe has a problem that the sample to be tested is inclined to the planar waveguide 10 during the detection process.

The above description is only the preferred embodiment of the present invention, and is not intended to limit the present invention, and various modifications and changes can be made to the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and scope of the present invention are intended to be included within the scope of the present invention.

Claims

A ferromagnetic resonance probe comprising a planar waveguide (10), characterized in that the ferromagnetic resonance probe further comprises:

a base (20), the planar waveguide (10) is disposed on the base (20);

a ballast assembly (30), the ballast assembly (30) being disposed on the base (20), the ballast assembly (30) having a load bearing platform (31) for carrying a sample (40) to be tested, The carrying platform (31) and the planar waveguide (10) are relatively movably disposed to press the sample to be tested (40) onto the planar waveguide (10).
The ferromagnetic resonance probe of claim 1 wherein said ballast assembly (30) comprises:

a fixing seat (32), the fixing seat (32) is disposed on the base (20), so that the ballast assembly (30) is disposed on the base (20) through the fixing base (32) Wherein at least a portion of the carrier platform (31) is movably disposed within the mount (32).
The ferromagnetic resonance probe according to claim 2, wherein the carrying platform (31) comprises:

a carrying platform (311) for carrying the sample to be tested, the carrying platform (311) is disposed opposite to the planar waveguide (10), so that the sample to be tested (40) on the carrying platform (311) Bonding with the planar waveguide (10);

a connecting rod (312), the connecting rod (312) is movably disposed in the fixing base (32), and the carrying platform (311) is disposed on the connecting rod (312) adjacent to the planar waveguide ( One end of 10) is such that the carrier (311) is movably disposed relative to the planar waveguide (10) through the connecting rod (312).
The ferromagnetic resonance probe according to claim 3, wherein the ballast assembly (30) further comprises:

An elastic member (33), the elastic member (33) is sleeved on the connecting rod (312), and the elastic member (33) is disposed on the fixing base (32) and the carrying platform (311) In order to enable the carrying platform (311) to be telescopically disposed in the direction of being close to or away from the planar waveguide (10) by the elastic member (33).
The ferromagnetic resonance probe according to claim 4, wherein the fixing base (32) is provided with a mounting hole, and the connecting rod (312) is disposed in the mounting hole; the mounting hole comprises a first hole section (321) and a second hole section, one end of the elastic member (33) is disposed in the second hole section, and the other end of the elastic member (33) is opposite to the carrying platform (311) Abutting; wherein an outer peripheral surface of the elastic member (33) is in clearance fit with an inner wall of the second hole segment.
The ferromagnetic resonance probe according to claim 5, wherein the ballast assembly (30) further comprises:

Moving the handle (34), one end of the connecting rod (312) is for connecting with the carrying platform (311), and the other end of the connecting rod (312) passes through the mounting hole and the moving handle ( 34) connecting to drive the connecting rod (312) to move by driving the moving handle (34).
The ferromagnetic resonance probe according to claim 6, wherein the moving handle (34) is provided with an internal thread, and the connecting rod (312) has an external thread adapted to the internal thread, The moving handle (34) is threadedly coupled to the connecting rod (312).
The ferromagnetic resonance probe according to claim 6, wherein the fixing base (32) is provided with a fastening hole (322) through which the fastener (35) passes, the fastening hole (322) And communicating with the first hole section (321) such that the fastener (35) abuts the connecting rod (312) after passing through the fastening hole (322).
The ferromagnetic resonance probe according to claim 1, wherein the base (20) comprises a support table (21) and a support plate (22) disposed on the support table (21), the planar waveguide (10) is disposed on the support plate (22).
The ferromagnetic resonance probe according to claim 9, wherein said support plate (22) has a first bonding surface (221) for conforming to said planar waveguide (10), said A mating surface (221) is disposed in parallel with the vertical plane.
The ferromagnetic resonance probe according to claim 9, wherein said support plate (22) has a first bonding surface (221) for conforming to said planar waveguide (10), said A mating surface (221) is disposed in parallel with the horizontal plane.
The ferromagnetic resonance probe according to claim 1, wherein the ferromagnetic resonance probe further comprises:

a temperature sensing unit (70), the temperature sensing unit (70) is disposed on the base (20) to determine a temperature of the planar waveguide (10) by monitoring a temperature of the base (20);

a heating assembly (50) disposed on the base (20), the temperature sensing unit (70) being signally coupled to the heating assembly (50) for sensing by the temperature The unit (70) controls the heating assembly (50) to change the temperature of the planar waveguide (10) by heating the base (20).
The ferromagnetic resonance probe according to claim 12, wherein the ferromagnetic resonance probe further comprises:

a terminal (60) disposed on the base (20), the terminal (60) having a first connection for a connection with the temperature sensing unit (70) An end set, and a second set of terminals for connection to a connection line of the heating assembly (50) to pass the temperature sensing unit (70) and the heating assembly (50) through the first wiring The end group and the second terminal group are in communication with an external line.
The ferromagnetic resonance probe according to claim 1, wherein the base (20) and the bearing platform (31) are made of a thermally conductive metal material, and the outer surface of the bearing platform (31) is coated. Covered with thermal paste.