WO2018225406A1

WO2018225406A1 - Method for determining configuration of surface defect inspection device, configuration determination device, configuration determination program, and recording medium

Info

Publication number: WO2018225406A1
Application number: PCT/JP2018/016391
Authority: WO
Inventors: 将人柏原; 泰三脇村
Original assignee: コニカミノルタ株式会社
Priority date: 2017-06-08
Filing date: 2018-04-23
Publication date: 2018-12-13
Also published as: JPWO2018225406A1

Abstract

In the present invention, the respective placement positions and optical axis directions of an illumination unit and imaging unit are set as first and second configuration information; arithmetic is carried out to determine an image that would be obtained by illuminating the object of inspection including a defect using the illumination unit according to the first configuration information and imaging an inspection area using the imaging unit according to the second configuration information, on the basis of information quantifying the illumination unit, imaging unit, and the appearance of the object of inspection; and the defect is detected on the basis of the image. The present invention repeatedly carries out the above processing while changing at least one from among the first and second configuration information and determines the first and second configuration information with the best detection result as the optimal configuration.

Description

Method for determining arrangement of surface defect inspection apparatus, apparatus, program and recording medium

The present invention relates to a surface defect inspection apparatus arrangement determination method, an arrangement determination apparatus, an arrangement determination program, and a recording medium on which the arrangement determination program is recorded, for determining the arrangement of each component constituting the surface defect inspection apparatus.

2. Description of the Related Art Conventionally, surface defect inspection apparatuses that detect defects on a painted surface in a vehicle body by image processing are known, and are disclosed in, for example, Patent Document 1 and Patent Document 2. The defect is, for example, unevenness or the like on the painted surface referred to as so-called “bump”, “sag”, “repellency” or the like.

The surface defect inspection apparatus disclosed in Patent Document 1 irradiates a surface to be inspected with light of a bright and dark pattern, creates a light reception image based on reflected light from the surface to be inspected, and this light reception image Is a device for inspecting a defect on a surface to be inspected based on the above. The coating inspection apparatus disclosed in Patent Document 2 is an apparatus in which an illumination unit and a CCD camera unit constituting such a surface defect inspection apparatus are mounted on the tip of a robot.

In such a surface defect inspection apparatus, the surface to be inspected is generated by the positional relationship between the illumination unit that irradiates the inspection surface with light of a light and dark pattern and the imaging unit that images the surface to be inspected with respect to the surface to be inspected. There may be a case where a defective is not detected. For example, there are portions with various curvatures on the exterior of the vehicle body, and the portion with a large curvature (the portion with a small curvature radius) becomes an image in which the light / dark pattern is overcrowded, and the defect is difficult to detect. . In addition, when the curvature is small (part where the radius of curvature is large), the width of the bright part of the light / dark pattern becomes too large, and the defective part becomes an image substantially similar to the normal part, and the defect is difficult to detect. In addition, for example, since a door mirror or the like is attached to the vehicle body, a portion that becomes a shadow when viewed from the imaging unit cannot be inspected. For this reason, in order to reduce the oversight of defects and perform a more appropriate inspection, it is necessary to verify with an actual machine by changing the position and orientation in the illumination unit and the position and orientation in the imaging unit in various ways. Man-hours). In addition, although it is necessary to prepare an image pickup unit separately for the shadowed portion, it is necessary to determine the optimum number of image pickup units in order to reduce costs, and it takes time and effort similar to the above. . Furthermore, when the vehicle type is changed, the positions and orientations of the illumination unit and the imaging unit and the number of imaging units must be set again. Take it.

JP 9-318337 A JP 2007-278713 A

The present invention is an invention made in view of the above-described circumstances, and the object thereof is the arrangement of the surface defect inspection apparatus that can determine the arrangement of each component constituting the surface defect inspection apparatus with less labor (man-hours). It is to provide a determination method, an arrangement determination apparatus and an arrangement determination program, and a recording medium on which the arrangement determination program is recorded.

In order to achieve the above-described object, the surface defect inspection apparatus arrangement determination method, arrangement determination apparatus, and arrangement determination program reflecting one aspect of the present invention determine the arrangement position and the optical axis direction of each of the illumination unit and the imaging unit. First and second arrangement information is set as the second arrangement by illuminating the inspected object with the illuminating unit based on the first arrangement information based on information obtained by quantifying the appearance of the inspected object including the illumination unit, the imaging unit, and the defect. An image obtained by imaging the inspection area by the imaging unit based on information is obtained by numerical calculation, and a defect is detected based on this image. The arrangement determination method, the arrangement determination apparatus, and the arrangement determination program of the surface defect inspection apparatus execute the above process a plurality of times while changing at least one of the first and second arrangement information, and the first and first detection results of the best detection result. 2 Arrangement information is obtained as an optimum arrangement. A recording medium reflecting one aspect of the present invention records the above-described arrangement determination program.

The advantages and features afforded by one or more embodiments of the invention will be more fully understood from the detailed description and accompanying drawings provided below. The detailed description and the accompanying drawings are given by way of example only and are not intended as a definition of the limitations of the invention.

It is a block diagram which shows the structure of the arrangement | positioning determination apparatus in embodiment. It is a figure which shows an example of a surface defect. It is a figure for demonstrating the model of the surface defect called what is called a "butsu". It is a block diagram which shows the structure of the computer which mounted the said arrangement | positioning determination apparatus. It is a flowchart which shows operation | movement of the arrangement | positioning determination apparatus in embodiment. It is a figure for demonstrating the defect setting process in the flowchart shown in FIG. It is a figure for demonstrating the case setting process in the flowchart shown in FIG. It is a figure which shows an example of the image produced | generated by the numerical calculation process in the flowchart shown in FIG. It is a figure for demonstrating the defect detection process in the flowchart shown in FIG. It is a figure for demonstrating a deformation | transformation form. It is a figure for demonstrating another modification.

Hereinafter, an embodiment according to the present invention will be described with reference to the drawings. However, the scope of the invention is not limited to the disclosed embodiments. In addition, the structure which attached | subjected the same code | symbol in each figure shows that it is the same structure, The description is abbreviate | omitted suitably. In this specification, when referring generically, it shows with the reference symbol which abbreviate | omitted the suffix, and when referring to an individual structure, it shows with the reference symbol which attached the suffix.

The arrangement determining apparatus and the arrangement determining method in the present embodiment are, for example, an arrangement determining apparatus for a surface defect inspection apparatus that determines the arrangement of each component (each component apparatus) constituting the surface defect inspection apparatus, such as an illumination apparatus or an imaging apparatus. And an arrangement determination method. This surface defect inspection apparatus arrangement determination apparatus and method synthesize the defect model information obtained by numerically modeling the defect with the inspection object model information obtained by numerically modeling the inspection object, thereby detecting the inspection object having the defect. The numerical model is created as defect-containing inspection object model information, and the defect-containing inspection object model information represented by the defect-containing inspection object model information is set as illumination unit arrangement information in the numerically modeled illumination unit. Illumination light is irradiated from the arrangement position of the illumination unit and its optical axis direction, and the inspection object is imaged from the arrangement position of the imaging unit and the optical axis direction set as the imaging unit arrangement information in the numerically modeled imaging unit In this case, an image is obtained by numerical calculation, the defect is detected from the obtained image, and the set illumination unit arrangement information and imaging unit arrangement information are evaluated based on the detection result. And this arrangement determination apparatus and method of the surface defect inspection apparatus tried this with various illumination part arrangement information and imaging part arrangement information, and the illumination part arrangement information and imaging part which gave the best detection result in the trial Arrangement information is obtained as optimal illumination unit arrangement information and imaging unit arrangement information. As a result, the apparatus and method for determining the arrangement of the surface defect inspection apparatus can determine the arrangement of the components constituting the surface defect inspection apparatus with less effort (man-hours) by a numerical experiment (simulation). Hereinafter, the arrangement determination apparatus for the surface defect inspection apparatus, the arrangement determination method and arrangement determination program for the surface defect inspection apparatus mounted thereon, and the recording medium on which the arrangement determination program is recorded will be described more specifically. To do.

FIG. 1 is a block diagram illustrating a configuration of an arrangement determining apparatus according to an embodiment. FIG. 2 is a diagram illustrating an example of a surface defect. FIG. 2A is a photograph showing a drawing showing an example of a surface defect called “butsu”, and FIG. 2B is a schematic diagram further showing the drawing shown in FIG. 2A. FIG. 2C is a photograph showing a drawing showing an example of a surface defect called “sag”, and FIG. 2D is a schematic diagram further showing the drawing shown in FIG. 2C. FIG. 2E is a drawing of a photograph showing an example of a surface defect referred to as a so-called “repellency”, and FIG. 2F is a schematic view further illustrating the drawing of the drawing shown in FIG. 2E. FIG. 3 is a diagram for explaining a model of a surface defect called a “butsu”. FIG. 4 is a block diagram showing a configuration of a computer in which the arrangement determining device is installed.

The arrangement determination apparatus D in the embodiment includes, for example, an input unit 1, an output unit 2, an interface unit 3, a control processing unit 4, and a storage unit 5, as shown in FIG.

The input unit 1 is connected to the control processing unit 4 and, for example, various commands such as a command for instructing the start of a trial, and for example, inspection object model information, defect model information, illumination unit model information, imaging unit model information, and the like Is a device that inputs various data necessary for the trial to the arrangement determining device D, for example, a plurality of input switches, a keyboard, a mouse, and the like assigned with a predetermined function. The output unit 2 is connected to the control processing unit 4, and is optimal among a plurality of trials obtained by the command and data input from the input unit 1 and the placement determination device D according to the control of the control processing unit 4. Such as a display device such as a CRT display, an LCD (liquid crystal display device) and an organic EL display, a printing device such as a printer, and the like.

A touch panel may be configured from the input unit 1 and the output unit 2. In the case of configuring this touch panel, the input unit 1 is a position input device that detects and inputs an operation position such as a resistive film method or a capacitance method, and the output unit 2 is a display device. In this touch panel, a position input device is provided on the display surface of the display device, one or more input content candidates that can be input to the display device are displayed, and the user touches the display position where the input content to be input is displayed. Then, the position is detected by the position input device, and the display content displayed at the detected position is input to the arrangement determining device D as the operation input content of the user. In such a touch panel, since the user can easily understand the input operation intuitively, the arrangement determination device D that is easy for the user to handle is provided.

The IF unit 3 is a circuit that is connected to the control processing unit 4 and inputs / outputs data to / from an external device according to the control of the control processing unit 4, for example, an RS-232C interface circuit that is a serial communication system An interface circuit using the Bluetooth (registered trademark) standard, an interface circuit performing infrared communication such as an IrDA (Infrared Data Association) standard, and an interface circuit using the USB (Universal Serial Bus) standard. The IF unit 3 is a circuit that performs communication with an external device. For example, the IF unit 3 may be a data communication card, a communication interface circuit that conforms to the IEEE 802.11 standard, or the like.

The storage unit 5 is a circuit that is connected to the control processing unit 4 and stores various predetermined programs and various predetermined data under the control of the control processing unit 4.

The various predetermined programs include a control program, a defect setting program, a synthesis program, a case setting program, an image numerical calculation generation program, a surface defect detection program, a simulation control program, and an arrangement determination program. The control program is a program for controlling each of the units 1 to 3 and 5 of the arrangement determining apparatus D according to the function of each unit. The defect setting program executes a defect setting process in which an inspection area is set on the surface of a predetermined inspection object, and one or a plurality of defect placement positions are set randomly (randomly) in the set inspection area. It is a program. The synthesis program is stored in an inspection object model information stored in an inspection object model information storage unit 54, which will be described later, in a defect model information storage unit 53, which will be described later, at a defect arrangement position set by the defect setting program. This is a program for executing a synthesis process for generating defect-containing inspection object model information by synthesizing the defect model information. The case setting program randomly sets the arrangement position in the illumination unit and its optical axis direction as illumination unit arrangement information, and sets the arrangement position in the imaging unit and its optical axis direction randomly as image pickup unit arrangement information It is a program that executes The image numerical calculation generation program includes illumination unit model information stored in an illumination unit model information storage unit 51 described later, imaging unit model information stored in an imaging unit model information storage unit 52 described later, and the synthesis program. Based on the generated defect-containing inspection object model information, the imaging unit arrangement information set by the case setting program by illuminating the inspection object with the illumination unit according to the illumination unit arrangement information set by the case setting program Is a program for executing a numerical calculation process for calculating an image generated by imaging the inspection area set by the defect setting program by the numerical calculation. The surface defect detection program detects a defect based on the image obtained by the image numerical calculation generation program, and detects the detected result and the illumination unit arrangement information and the imaging unit arrangement information set by the case setting program. This is a program that executes detection processing stored in a simulation result storage unit 56 described later as one set in association with each other. The simulation control program causes the case setting program to execute the case setting program to change each of the numerical calculation process and the detection process while changing at least one of the illumination unit arrangement information and the imaging unit arrangement information. It is a program that executes trial processing that causes an image numerical calculation generation program and the surface defect detection program to be executed a plurality of times. The arrangement determination program determines a group having the best detection result from a plurality of groups stored in the simulation result storage unit 56, and sets the plurality of illumination unit arrangement information and imaging unit arrangement information of the determined group. This is a program for executing an arrangement determination process to be obtained as the optimum illumination unit arrangement information and image pickup unit arrangement information.

The various kinds of predetermined data include data necessary for executing each program such as illumination unit model information, imaging unit model information, defect model information, and inspection object model information. The storage unit 5 includes, for example, a ROM (Read Only Memory) that is a nonvolatile storage element, an EEPROM (Electrically Erasable Programmable Read Only Memory) that is a rewritable nonvolatile storage element, and the like. The storage unit 5 includes a RAM (Random Access Memory) that serves as a working memory of the so-called control processing unit 4 that stores data generated during execution of the predetermined program. The storage unit 5 includes the illumination unit model information, the imaging unit model information, the defect model information, the inspection object model information, and the defect-containing inspection object generated by combining the defect model information with the inspection object model information. In order to store model information and simulation results as trial results, respectively, an illumination unit model information storage unit 51, an imaging unit model information storage unit 52, a defect model information storage unit 53, and an inspection object model information storage unit 54 The defect-containing inspection object model information storage unit 55 and the simulation result storage unit 56 are functionally provided.

Such various predetermined programs and various predetermined data are connected to a communication network, and from the server device that stores and manages these various predetermined programs and various predetermined data, the communication network and It may be downloaded via the IF unit 3 and stored in the storage unit 5. Alternatively, these various predetermined programs and various predetermined data may be read from a recording medium such as a USB memory, which is recorded (stored), via the IF unit 3 and stored in the storage unit 5. Alternatively, the arrangement determining device D further includes a drive device such as a DVD-ROM drive device or a CD-ROM drive device, for example, which stores various predetermined programs and various predetermined data, such as a DVD-ROM or CD. It may be read from the ROM or the like via the IF unit 3 and stored in the storage unit 5. Various predetermined data may be input from the input unit 1 and stored in the storage unit 5.

The illuminator model information storage unit 51 stores the illuminator model information, which is information representing an illuminator model that quantifies the illuminator that irradiates the object to be inspected with illumination light, which constitutes the surface defect inspection apparatus. is there. The illumination unit model information is input in advance from the input unit 1, the IF unit 3, and the like, and is stored in the illumination unit model information storage unit 51. The illumination unit model information includes luminance distribution information representing the luminance distribution in the light emission part of the illumination unit, shape information representing the shape in the light emission part of the illumination unit, and light distribution representing the light distribution characteristics in the light emission part of the illumination unit. One or more of the characteristic information including at least the luminance distribution information is included. The luminance distribution may include not only a distribution in which the luminance varies depending on the position but also a distribution in which the luminance is uniform regardless of the position. The shape of the light emitting portion of the illumination unit is defined by the width and height of the light emitting portion, the surface shape of the light emitting surface (plane, curved surface, etc.) and the like. The shape may include a bright / dark pattern, and may include a bright part width and a spacing between bright parts in the bright / dark pattern. Note that the light / dark pattern may be configured by setting a plurality of illumination units. In this case, the bright part width in the bright / dark pattern is set by setting the shape of each illumination part, and the interval between bright parts in the bright / dark pattern is set by setting the interval between the illumination parts.

The illumination unit may be of one type, and accordingly the illumination unit model information may be of one type. Alternatively, the illumination unit may be of a plurality of types, and accordingly the illumination unit model information may be of a plurality of types. The plurality of types of illumination units (plural types of illumination unit model information) are different from each other in at least one of luminance distribution (luminance distribution information), shape (shape information), and light distribution characteristics (light distribution characteristic information). When the illumination unit (illumination unit model information) includes a plurality of types, one of the plurality of types is randomly selected by receiving the designation from the input unit 1 or by the simulation control unit 47 described later. Thus, the illumination unit (illumination unit model information) used for the trial is set.

The imaging unit model information storage unit 52 stores the imaging unit model information, which is information representing an imaging unit model that quantifies the imaging unit that images the inspection object, which constitutes the surface defect inspection apparatus. The imaging unit model information is input in advance from the input unit 1, the IF unit 3, and the like, and is stored in the imaging unit model information storage unit 52. The imaging unit model information includes imaging element information indicating the pixel size (pixel size) and the number of pixels (imaging element size) of the imaging element in the imaging unit, optical characteristic information indicating the optical characteristics of the imaging optical system in the imaging unit, And one or a plurality of spectral sensitivity characteristic information representing spectral sensitivity characteristics of the imaging element in the imaging unit including at least the imaging element information. The optical characteristic information may include construction data of an optical element forming the imaging optical system, glass material data of the optical element and a surface coat of the optical element, and an F number of the imaging optical system.

The imaging unit may be of one type, and according to this, the imaging unit model information may be of one type. Alternatively, the imaging unit may be of a plurality of types, and the imaging unit model information may be of a plurality of types accordingly. The plurality of types of imaging units (plural types of imaging unit model information) includes at least one of a pixel size and a number of pixels (imaging element information), an optical characteristic (optical characteristic information), and a spectral sensitivity characteristic (spectral sensitivity characteristic information). One is different from each other. When the imaging unit (imaging unit model information) is composed of a plurality of types, one of the plurality of types is randomly selected by receiving the designation from the input unit 1 or by the simulation control unit 47 described later. Thus, the imaging unit (imaging unit model information) used for the trial is set.

The defect model information storage unit 53 stores the defect model information, which is information representing a defect model obtained by quantifying a predetermined defect that may occur in the inspection object. The defect model information is input in advance from the input unit 1, the IF unit 3, etc., and is stored in the defect model information storage unit 53. When the object to be inspected is a painted surface applied to the exterior surface of a vehicle, the defect may be a so-called “slip” shown as an example in FIGS. 2A and 2B, or a so-called “sag” shown as an example in FIGS. 2C and 2D. And so-called “repellency” shown as an example in FIGS. 2E and 2F. Numerical data representing the outer contour surface of such a defect is stored in the defect model information storage unit 53 as the defect model information. FIG. 3 shows, as an example, one cross-sectional line in the outer contour surface of the “Butsu”. A defect (defect model information) to be used for trial is set by accepting designation of one of the plurality of types from the input unit 1 or by random selection by the simulation control unit 47 described later. The

Note that even if the defect is of the same type (in the above example, any one of “spot”, “sag”, and “repellency”), the defect model depends on the size, height, shape in plan view, and the like. Information may consist of a plurality. Alternatively, from one type of defect model, different defect model information such as the size, height, and shape in plan view may be generated by enlargement, reduction, or deformation. A defect (defect model information) used for a trial is set when one of the plurality receives the designation from the input unit 1 or is randomly selected by the simulation control unit 47 described later. In addition, for the purpose of determining the arrangement of each component constituting the surface defect inspection apparatus depending on whether or not defects can be detected better, preferably the size of the defect is a limit that can be detected by the surface defect inspection apparatus. Size.

The inspection object model information storage unit 54 stores the inspection object model information, which is information representing an inspection object model in which the appearance of the inspection object to be inspected by the surface defect inspection apparatus is quantified. The inspection object model information is input in advance from the input unit 1, the IF unit 3, and the like, and is stored in the inspection object model information storage unit 54. The inspection object model information represents inspection object position information indicating the arrangement position of the inspection object, inspection object contour shape information indicating the outer contour surface shape of the inspection object, and reflection characteristics outside the inspection object. Includes inspection object reflection characteristic information. The inspection object position information is represented by the position of a predetermined point of the inspection object in a space (virtual space) in which the inspection object is inspected by the surface defect inspection apparatus. For example, it is represented by the position of the center of gravity or the position of the center point of the inspection object. The inspected object contour shape information is numerical data representing the outer contour surface of the inspected object with the arrangement position of the inspected object represented by the inspected object position information as the origin. The reflection characteristic may be represented by a light distribution characteristic of reflected light. The object to be inspected may have a single-layer structure or a two-layer structure including a first paint layer and a second paint layer overcoated on the first paint layer. The inspection object reflection characteristic information includes first coating layer reflection characteristic information indicating the reflection characteristic of the first coating layer and second coating layer reflection characteristic information indicating the reflection characteristic of the second coating layer. The reflection characteristic may be a spectral reflection characteristic.

The inspection object may be of one type, and the inspection object model information may be one type according to this. Alternatively, the inspection object may be of a plurality of types, and the inspection object model information may be of a plurality of types according to this. The plurality of types of inspection objects (plural types of inspection object model information) is at least one of the outer contour surface shape (inspection object contour shape information) and the reflection characteristics (inspection object reflection characteristic information). Are different from each other. When the inspection object (inspection object model information) is composed of a plurality of types, one of the plurality of types is randomly selected by receiving the designation from the input unit 1 or by the simulation control unit 47. Thus, the inspection object (inspection object model information) used for the trial is set.

The inspected object may be an arbitrary object, but in the present embodiment, it is a vehicle, and the inspected object model information is vehicle model information obtained by quantifying the appearance of the vehicle. The vehicle model information includes vehicle position information that represents the position of the vehicle, vehicle contour information that represents the outer contour surface shape of the vehicle (vehicle body), and vehicle reflection characteristic information that represents reflection characteristics outside the vehicle. As the vehicle contour shape information, CAD (Computer-aided design) data can be used. The painting of the vehicle body may be a single layer structure or a two layer structure. In the case of a two-layer structure, the first paint layer is, for example, a metallic layer, and the second paint layer is a clear layer. There may be one type of vehicle, and the vehicle model information may be one type accordingly. Alternatively, the vehicle type may be a plurality of types, and the vehicle model information may be a plurality of types according to this. The plurality of vehicle types (plural types of vehicle model information) are different from each other in at least the outer contour surface shape (inspection object contour shape information). In the case of a plurality of vehicle types (a plurality of vehicle model information), one of the plurality of vehicle types is selected by receiving the designation from the input unit 1 or randomly selected by the simulation control unit 47. The vehicle type (vehicle model information) used for the trial is set. In the present embodiment, the vehicle contour shape information is numerical data representing the outer contour surface shape of the entire vehicle (the entire vehicle body). For example, the right half of the vehicle body, the door portion, the bumper portion, etc. May be part.

The defect-containing inspection object model information storage unit 55 stores the defect-containing inspection object model information generated by combining the defect model information with the inspection object model information.

The simulation result storage unit 56 stores a detection result by a surface defect detection unit 46, which will be described later, the illumination unit arrangement information of the illumination unit, and the imaging unit arrangement information of the imaging unit in association with each other as a set.

The control processing unit 4 controls each of the units 1 to 3 and 5 of the arrangement determining device D according to the function of each unit, and determines the arrangement of each component constituting the surface defect inspection apparatus by trial using a numerical model. It is a circuit for doing. The control processing unit 4 includes, for example, a CPU (Central Processing Unit) and its peripheral circuits. When the control processing program is executed, the control processing unit 4 includes a control unit 41, a defect setting unit 42, a synthesis unit 43, a case setting unit 44, an image numerical value calculation generation unit 45, a surface defect detection unit 46, and simulation control. The unit 47 and the arrangement determining unit 48 are functionally provided.

The control unit 41 controls each of the units 1 to 3 and 5 of the arrangement determining device D according to the function of each unit, and controls the entire arrangement determining device D.

The defect setting unit 42 executes a defect setting process for setting an inspection area on the surface of the inspection object and setting one or a plurality of defect arrangement positions in the set inspection area. The inspection area may be designated by the user (operator) from the input unit 1 at, for example, a door portion or a bonnet portion, and may be set by the defect setting unit 42 according to this designation. Alternatively, the inspection area may be set randomly (randomly) by the defect setting unit 42. The number of defects may be specified from the input unit 1 by the user, for example, or may be set at random by the defect setting unit 42. The arrangement position may be designated from the input unit 1 by the user, for example, and may be set by the defect setting unit 42 according to this designation. Alternatively, the arrangement position may be set randomly by the defect setting unit 42. For the purpose of determining the arrangement of each component constituting the surface defect inspection apparatus depending on whether or not the defect can be detected better, it is preferable that the defect arrangement position is detected by the surface defect inspection apparatus. It is a position that is assumed to be difficult.

The synthesis unit 43 adds the defect model information stored in the defect model information storage unit 53 to the inspection object model information stored in the inspection object model information storage unit 54 at the defect placement position set by the defect setting unit 42. Is combined to generate defect-containing inspection object model information. More specifically, the synthesis unit 43 superimposes the defect model information on the inspection object model information at the defect placement position set by the defect setting unit 42, so that the defect model information is included in the inspection object model information. Is synthesized. More specifically, the synthesis unit 43 adds the numerical data of the defect model information to the numerical data of the inspection object model information at the defect arrangement position set by the defect setting unit 42, thereby inspecting the object model information. The defect model information is synthesized. The combining unit 43 stores the generated defect-containing inspection object model information in the defect-containing inspection object model information storage unit 55.

The case setting unit 44 executes case setting processing for setting the arrangement position in the illumination unit and its optical axis direction as illumination unit arrangement information, and setting the arrangement position in the image pickup unit and its optical axis direction as image pickup unit arrangement information. It is. The arrangement position of the illumination unit and the arrangement position of the imaging unit are each represented by coordinate values of a coordinate system having the arrangement position of the inspection object represented by the inspection object position information as the origin. Alternatively, the world coordinate system is set (virtual) in a space (virtual space) in which the inspection object is inspected by the surface defect inspection apparatus, and the arrangement position of the inspection object, the arrangement position of the illumination unit, and the arrangement position of the imaging unit are respectively It is expressed by the coordinate value of this world coordinate system. The illumination unit arrangement information and the imaging unit arrangement information may each be designated by the user (operator) from the input unit 1 and set by the case setting unit 44 according to this designation. Alternatively, the illumination unit arrangement information and the imaging unit arrangement information may be set randomly (randomly) by the case setting unit 44, respectively. Alternatively, each of the illumination unit arrangement information and the imaging unit arrangement information is designated by a user as a range (designated range) from the input unit 1, and is randomly set by the case setting unit 44 within the designated designated range. good. In the actual (actual) place where the surface defect inspection apparatus is installed, there may be a range in which the components constituting the surface defect inspection apparatus cannot be arranged. In such a case, the user can designate the designated range by excluding the range where each component constituting the surface defect inspection apparatus cannot be arranged, and even in such a case, the arrangement determining apparatus D in the present embodiment The illumination unit arrangement information and the imaging unit arrangement information can be set by excluding a range in which the components constituting the surface defect inspection apparatus cannot be arranged.

The image numerical calculation generation unit 45 includes the illumination unit model information stored in the illumination unit model information storage unit 51, the imaging unit model information stored in the imaging unit model information storage unit 52, and the defect containing Based on the defect-containing inspection object model information stored in the inspection object model information storage unit 55, the inspection object is illuminated by the illumination unit based on the illumination unit arrangement information set by the case setting unit 44, and the case setting unit 44 A numerical calculation process is performed in which an image generated by imaging the inspection area set by the defect setting unit by the imaging unit based on the set imaging unit arrangement information is obtained by numerical calculation.

In the image formation by this numerical calculation, for example, first, the image numerical value calculation generation unit 45 has a plurality of tens of thousands to hundreds of millions necessary for forming the image in the illumination unit represented by the illumination unit model information. Is set. Next, the image numerical calculation generation unit 45 performs forward ray tracing for each of the plurality of light rays by using a predetermined optical simulator on the light propagation path from the illumination unit to the imaging unit via the inspection object. Next, the image numerical calculation generation unit 45 converts the light intensity emitted from the illumination unit based on the illumination unit model information, on the light propagation path, for each of a plurality of light beams from the illumination unit to the imaging unit via the inspection object. The light intensity incident on the imaging unit is obtained by multiplying the transmission surface and reflection surface of the image by the transmittance and the reflectance. Then, the image numerical calculation generation unit 45 summarizes each light intensity incident on the imaging unit for each of a plurality of light beams from the illumination unit through the inspection object to the imaging unit, for each pixel of the imaging unit. Each light intensity incident on each is obtained. At this time, the spectral sensitivity of the imaging unit may be taken into consideration. The light intensity incident on this pixel becomes the pixel value of the pixel, and an image by numerical calculation is formed and generated thereby.

In the above description, the light propagation path from the illumination unit to the imaging unit via the object to be inspected is obtained by forward ray tracking. However, the light propagation from the illumination unit to the imaging unit through the object to be inspected by reverse ray tracing is performed. A path may be obtained (that is, a light propagation path from each pixel of the imaging unit to the illumination unit through the object to be inspected may be obtained). According to this reverse ray tracing, the number of the plurality of rays can be reduced as compared with forward ray tracing. In this case, the angle range of the light ray incident on the pixel is obtained from the optical characteristic information of the imaging optical system, and the light ray for tracing the reverse ray may be set within this angle range.

The optical simulator may be any appropriate simulator. For example, LightTools manufactured by Synopsys is available.

The surface defect detection unit 46 detects a defect based on the image obtained by the image numerical value calculation generation unit 45, and the detected detection result, the illumination unit arrangement information and the imaging unit arrangement information set by the case setting unit 44, and Are associated with each other, and a detection process for storing them as a set in the simulation result storage unit 56 is executed. As a defect detection method, a known method may be used, but the method of this embodiment will be described later.

The simulation control unit 47 causes the case setting process to be executed by the case setting unit 44 to change each of the numerical calculation process and the detection process while changing at least one of the illumination unit arrangement information and the imaging unit arrangement information. Trial processing that causes each of the numerical calculation generation unit 45 and the surface defect detection unit 46 to execute a plurality of times is executed.

The arrangement determination unit 48 determines a group having the best detection result from a plurality of groups stored in the simulation result storage unit 56, and sets the plurality of illumination unit arrangement information and imaging unit arrangement information of the determined group. In this set, an arrangement determination process to be obtained as optimal illumination unit arrangement information and imaging unit arrangement information is executed. The arrangement determination unit 48 outputs the obtained illumination unit arrangement information and imaging unit arrangement information from the output unit 2 to the outside. Alternatively, the arrangement determining unit 48 outputs the obtained illumination unit arrangement information and imaging unit arrangement information from the IF unit 3 to the external device.

For example, as shown in FIG. 4, such an arrangement determining apparatus D includes a CPU 11, a RAM 12, a ROM 13, a hard disk drive (HDD) 14, an LCD 16, a keyboard 17, a mouse 18, a USB interface 19, and the CPU 11, RAM 12. , ROM 13, HDD 14, LCD 16, keyboard 17, mouse 18, and USB interface 19 can be configured by, for example, a desktop or node type computer provided with a bus 15.

Next, the operation of this embodiment will be described. FIG. 5 is a flowchart illustrating the operation of the arrangement determining apparatus according to the embodiment. FIG. 6 is a diagram for explaining the defect setting processing in the flowchart shown in FIG. FIG. 7 is a diagram for explaining case setting processing in the flowchart shown in FIG. 5. FIG. 8 is a diagram showing an example of an image generated by the numerical calculation process in the flowchart shown in FIG. FIG. 9 is a diagram for explaining the defect detection processing in the flowchart shown in FIG.

When the power is turned on, the arrangement determining apparatus D having such a configuration executes necessary initialization of each part and starts its operation. By executing the control processing program, the control processing unit 4 includes a control unit 41, a defect setting unit 42, a synthesis unit 43, a case setting unit 44, an image numerical value calculation generation unit 45, a surface defect detection unit 46, and a simulation control unit 47. And the arrangement | positioning determination part 48 is comprised functionally.

Then, in determining the arrangement of each component constituting the surface defect inspection apparatus, in FIG. 5, the arrangement determining apparatus D is first input from the input unit 1 by the user (operator) by the simulation control unit 47 of the control processing unit 4. The input simulation count (trial count) is received (S11).

Next, the arrangement determining apparatus D performs a defect setting process for setting the defect to the inspection object by the defect setting unit 42 of the control processing unit 4 (S12). More specifically, as shown in FIG. 6 as an example, the defect setting unit 42 sets an inspection area AR on the outer surface (exterior surface) of the inspection object Ob (vehicle body Ob in the example shown in FIG. 6). In the inspection area AR thus set, one or more arrangement positions Pn of the defects DEn are set at random. In the example shown in FIG. 6, four first to fourth arrangement positions P1 to P4 for four first to fourth defects DE1 to DE4 are set in a rectangular inspection area AR.

Next, the arrangement determining apparatus D performs a combining process for generating defect-containing inspection object model information by combining the defect model information with the inspection object model information by the combining unit 43 of the control processing unit 4 (S13). ). More specifically, the synthesizing unit 43 adds the defect DEn placement position Pn set by the defect setting unit 42 in step S12 to the numerical data of the inspected object model information stored in the inspected object model information storage unit 54. Then, by adding the numerical data of the defect model information stored in the defect model information storage unit 53, the defect model information is synthesized with the inspection object model information to generate defect-containing inspection object model information. Then, the synthesis unit 43 stores the generated defect-containing inspection object model information in the defect-containing inspection object model information storage unit 55 of the storage unit 5. In the example shown in FIG. 6, the synthesis unit 43 adds the numerical data of the defect model information in the first defect DE1 at the first arrangement position P1 to the numerical data of the vehicle model information obtained by digitizing the vehicle body Ob. The numerical data of the defect model information at the second defect DE2 at the second arrangement position P2 is added to the numerical data of the vehicle model information, and the third defect DE3 at the third arrangement position P3 is added to the numerical data of the vehicle model information. And the numerical data of the defect model information in the fourth defect DE4 at the fourth arrangement position P4 is added to the numerical data of the vehicle model information. As a result, defect-containing vehicle model information is generated and stored in the defect-containing inspection object model information storage unit 55.

Next, the arrangement determining apparatus D executes a case setting process for setting the illumination unit arrangement information and the imaging unit arrangement information by the case setting unit 44 of the control processing unit 4 (S14). More specifically, the case setting unit 44 sets the arrangement position in the illumination unit and its optical axis direction at random (randomly) as the illumination unit arrangement information, and sets the arrangement position in the imaging unit and its optical axis direction as the imaging unit. Set at random as placement information. As an example, as shown in FIG. 7, in a lighting unit having a light / dark pattern having first to sixth bright portions LS1 to LS6 having six straight rectangular planes from the side surface of the vehicle body Ob (or from the side surface of the vehicle body Ob). The vehicle body Ob is illuminated by the first to sixth illuminating units LS1 to LS6 having six straight rectangular planes in a light / dark pattern, and the vehicle body Ob is imaged by the imaging unit from the side surface of the vehicle body Ob at the center position of the light / dark pattern. As described above, the case setting unit 44 sets the illumination unit arrangement information and the imaging unit arrangement information.

Next, the arrangement determining apparatus D performs numerical calculation processing for obtaining an image by numerical calculation by the image numerical calculation generation unit 45 of the control processing unit 4 (S15). More specifically, the image numerical value calculation generation unit 45 includes the illumination unit model information stored in the illumination unit model information storage unit 51, the imaging unit model information stored in the imaging unit model information storage unit 52, and the combining unit. Based on the defect-containing inspection object model information generated in 43 and stored in the defect-containing inspection object model information storage unit 55, the inspection object is illuminated by the illumination unit based on the illumination unit arrangement information set by the case setting unit 44 Then, an image generated by imaging the inspection area set by the defect setting unit 42 by the imaging unit based on the imaging unit arrangement information set by the case setting unit 44 is obtained by numerical calculation. For example, as described above, the angle range of the light ray incident on the pixel is obtained from the optical characteristic information of the imaging optical system. Within this angular range, a light propagation path from the illumination unit to the imaging unit via the object to be inspected is obtained by back ray tracing using an optical simulator. The respective light intensities incident on the imaging unit for each of a plurality of light beams from the illumination unit through the inspection object to the imaging unit are determined. And the light intensity of each pixel is calculated | required by putting together each light intensity which injects into the image pick-up part of each of several light rays which reach an image pick-up part via a to-be-inspected object from an illumination part. . As a result, an image by numerical calculation is generated. For example, in the above example, the image shown in FIG. 8 is generated by numerical calculation. In the example shown in FIG. 8, the entire inspection area AR set in step S12 cannot be imaged, and an image including the first to third defects DE1 to DE3 is generated. The first and second defects DE1 and DE2 appear in the bright part of the light / dark pattern and appear in the image at black points, and the third defect DE3 appears in the dark part of the light / dark pattern and appear in the image at the white point.

Next, the arrangement determining apparatus D performs a defect detection process for detecting the defect DEn from the image obtained by the numerical calculation by the surface defect detection unit 46 of the control processing unit 4 (S16). More specifically, the surface defect detection unit 46 determines the contrast of the defect DEn at the position Pn of the defect DEn set in step S12 from the image generated in step S15 for each defect DEn set in step S12. Ask for. For example, in the image shown in FIG. 8, the pixel value of each pixel on the row II-II passing through the first defect DE1 changes into a rectangular pulse train as shown in FIG. At a location corresponding to one defect DE1, the pixel value of the first defect DE1 is a dark pixel value y as compared to the bright pixel value x in the bright area around the first defect DE1. The surface defect detection unit 46 obtains, as the contrast, the ratio (ratio) of the pixel value y of the first defect to the bright pixel value x of the bright part around the first defect DE1 ((contrast of the first defect DE1) = y. / X). In contrast, the larger the value, the better the detection result. When such a contrast is obtained for each defect DEn, the surface defect detection unit 46 associates each contrast of each defect DEn with the illumination unit arrangement information and the imaging unit arrangement information set in step S12 to 1 The result is stored in the simulation result storage unit 56 as a set. In addition, like the fourth defect DE4 in the example illustrated in FIG. 8, there may be a case where the defect DEn does not appear outside the imaging range of the image generated in the process S15. In this case, the contrast of the defect DEn is set to 0 outside the imaging range of the image generated in step S15. Further, there may be a case where the defect hits a dark part of the light / dark pattern like the third defect DE3 in the example shown in FIG. In such a case, it is only necessary to obtain the contrast in the same manner as described above after reversing the brightness in the dark part.

In the above description, the contrast y / x is used for the detection result, but other amounts may be used as long as the defect can be evaluated. For example, the size (area) of the image of the defect DE in the image generated in step S15 may be used. When the size (area) of the image of the defect DE is used, the larger the value, the better the detection result. The image generated in the process S15 can be three-dimensionalized by giving a height with each pixel value of each pixel. However, when this three-dimensionalization is performed, a concave portion is formed in a bright portion and a convex portion is formed in a dark portion at the position of the defect DE. Part is formed. For example, the volume of this recessed part or convex part may be used. In the case where the volume of the concave portion or convex portion is used, the larger the value, the better the detection result.

Next, the arrangement determining apparatus D determines whether or not the number of the sets has reached the number of simulations accepted in the process S11 by the simulation control unit 47 (S17). As a result of this determination, when the number of simulations has been reached (Yes), the simulation control unit 47 executes the next process S18. On the other hand, if the number of simulations has not been reached as a result of the determination (No), the simulation control unit 47 returns the process to step S14 in order to make the next trial. As a result, the simulation control unit 47 causes the case setting unit 44 to execute the case setting process, thereby changing the numerical value calculation while changing at least one of the illumination unit arrangement information and the imaging unit arrangement information in the present embodiment. Each of the processing and the detection processing is executed by the image numerical value calculation generation unit 45 and the surface defect detection unit 46 multiple times.

In the process S18, the arrangement determining device D executes an arrangement determining process for determining the arrangement of each component constituting the surface defect inspection apparatus by the arrangement determining unit 48 of the control processing unit 4. More specifically, the arrangement determining unit 48 determines a group having the best detection result from the plurality of groups stored in the simulation result storage unit 56, and the illumination unit arrangement information and the imaging of the determined group. The part arrangement information is obtained as the optimum illumination part arrangement information and imaging part arrangement information among the plurality of sets.

In determining the group having the best detection result, for example, the arrangement determining apparatus D uses the average value of the detection results for each of the plurality of groups. In the above example, the average of the contrasts of the first to fourth defects DE1 to DE4. The value is obtained, and the group having the largest average value is determined as the group having the best detection result.

And the arrangement | positioning determination part 48 outputs the illumination part arrangement | positioning information and imaging part arrangement | positioning information which were calculated | required in this way to the exterior from the output part 2, and complete | finishes this process. Note that the arrangement determination unit 48 may output the obtained illumination unit arrangement information and imaging unit arrangement information from the IF unit 3 to an external device as necessary.

As described above, the surface defect inspection apparatus arrangement determination device D and the arrangement determination method and arrangement determination program implemented in the present embodiment convert the illumination unit, the imaging unit, the inspection object, and the defect respectively into numerical models. An image generated by illuminating the object to be inspected with the illumination unit based on the illumination unit arrangement information using a computer and imaging the inspection region with the imaging unit based on the imaging unit arrangement information is obtained by numerical calculation, and the obtained image is Based on the detection of defects. And the arrangement | positioning determination method of the said surface defect inspection apparatus performs this several times, changing at least one of illumination part arrangement information and imaging part arrangement information, and the illumination part arrangement information and imaging which gave the best detection result The part arrangement information is obtained as the optimum illumination part arrangement information and imaging part arrangement information in the plurality of times. As described above, the arrangement determining device D, the arrangement determining method, and the arrangement determining program can verify the quality of the defect detection by numerical calculation with respect to the illumination unit arrangement information and the imaging unit arrangement information which are variously changed. The arrangement of each component constituting the surface defect inspection apparatus can be determined with effort (man-hours). Since the arrangement determination device D, the arrangement determination method, and the arrangement determination program can verify the quality of defect detection by numerical calculation with respect to variously changed illumination unit arrangement information and the imaging unit arrangement information, it is possible to change the model or model It can respond flexibly to changes.

In the above-described embodiment, the simulation control unit 47 causes the case setting unit 44 to execute the case setting process in each of the processes S14 to S17 that are repeated. While changing both the arrangement information, each of the numerical value calculation processing and the detection processing is executed by the image numerical value calculation generation unit 45 and the surface defect detection unit 46 a plurality of times. The numerical value calculation processing and the detection processing are respectively generated as image numerical value calculation while changing only the imaging portion arrangement information by fixing the illumination portion arrangement information and causing the case setting unit 44 to execute the case setting process. Each of the unit 45 and the surface defect detection unit 46 may be executed a plurality of times, In each of the repeated processes S <b> 14 to S <b> 17, while changing only the illumination unit arrangement information by fixing the imaging unit arrangement information and causing the case setting unit 44 to execute the case setting process, Each of the detection processes may be executed by the image numerical meter calculation unit 45 and the surface defect detection unit 46 a plurality of times.

In the above-described embodiment, the arrangement determining unit 48 obtains a simple average value of detection results in each group, and evaluates and compares each group. However, the arrangement determining unit 48 detects that the contrast cannot be detected as 0. First, the group including the result is excluded (removed) from the plurality of groups stored in the simulation result storage unit 56, and the group having the best detection result is determined from the plurality of remaining groups. You may obtain | require this illumination part arrangement | positioning information and imaging part arrangement | positioning information of this determined group as optimal illumination part arrangement | positioning information and imaging part arrangement | positioning information in said several group.

In the above-described embodiment, the detection positions of the defects in the bright and dark portions of the light / dark pattern are used to determine the arrangement positions of the illumination unit and the imaging unit. However, the defect detection using only the bright part is assumed. Then, only the detection result of the defect in the bright part may be used to determine the arrangement positions of the illumination unit and the imaging unit, or the defect in the dark part is assumed assuming defect detection using only the dark part. Only the detection result may be used to determine the arrangement positions of the illumination unit and the imaging unit.

Further, in the above-described embodiment, the arrangement determining unit 48 calculates the simple average value of the detection results in each group, and evaluates and compares each group. However, the weighted average value may be calculated instead of the simple average value. good. FIG. 10 is a diagram for explaining a modified embodiment. In particular, when the object to be inspected is a vehicle body, the allowable degree of surface defect DE varies depending on the location where the defect occurs. For example, the allowable range of the surface defect DE generated in the roof is relatively wide (loose), and the allowable range of the surface defect DE generated in the door is relatively narrow (strict). For example, as shown in FIG. 10, a weight boundary line α is provided for the vehicle body, and the detection result (contrast in the above example) for the defect DE set in step S12 on the roof side from the boundary line α includes the weight β1. And the detection result (contrast in the above) for the defect DE set in step S12 below the boundary line α is assigned a weight β2, and a weighted average value of the detection results of the set is obtained.

Further, in the above-described embodiments, in a plurality of trials, the illumination unit and the imaging unit are fixed, and at least one of the illumination unit arrangement information and the imaging unit arrangement information is changed. Instead, a plurality of trials may be executed as in the following first to fourth modes, or a combination thereof.

In the first aspect, the illumination unit model information includes a variable illumination unit model parameter, and the simulation control unit 47 performs the illumination unit arrangement information and the imaging unit arrangement information in each of the processes S14 to S17 repeated. And changing at least one of the illumination unit arrangement information and the imaging unit arrangement information by changing the variable illumination unit model parameter or by causing the case setting unit 44 to execute the case setting process. While changing the variable illumination unit model parameter, each of the numerical value calculation processing and the detection processing is executed by the image numerical value calculation generation unit 45 and the surface defect detection unit 46 a plurality of times.

The variable illumination unit model parameter includes, for example, one or more of a luminance distribution in the light emission part of the illumination unit, a shape in the light emission part of the illumination unit, and a light distribution characteristic in the light emission part of the illumination unit. Good. The variable illumination unit model parameter may be set by the user from the input unit 1 or may be set at random by the simulation control unit 47 and the parameter value in the variable illumination unit model parameter used for the trial is set. When a variable range is defined for the variable illumination unit model parameter, the variable illumination unit model parameter is varied within the variable range.

Such an arrangement determination device D, an arrangement determination method, and an arrangement determination program can be used for various illumination lights in the same type of illumination unit or for various types of illumination units by changing variable illumination unit model parameters. The quality of defect detection can be verified by numerical calculation.

In the second aspect, the imaging unit model information includes a variable imaging unit model parameter, and the simulation control unit 47 displays the illumination unit arrangement information and the imaging unit arrangement information in each of the processes S14 to S17 repeated. While changing the variable imaging unit model parameter fixedly or by causing the case setting unit 44 to execute the case setting process, at least one of the illumination unit arrangement information and the imaging unit arrangement information is changed. While changing the variable imaging unit model parameter, the numerical value calculation processing and the detection processing are respectively executed by the image numerical value calculation generation unit 45 and the surface defect detection unit 46 a plurality of times.

The variable imaging unit model parameters include, for example, the pixel size (pixel size) and the number of pixels of the imaging device in the imaging unit, the optical characteristics of the imaging optical system in the imaging unit, and the spectrum of the imaging device in the imaging unit. One or more of the sensitivity characteristics may be included. The variable imaging unit model parameter may be set by the user from the input unit 1 or may be randomly set by the simulation control unit 47 to set a parameter value in the variable imaging unit model parameter used for trial. When a variable range is defined for the variable imaging unit model parameter, the variable imaging unit model parameter is varied within the variable range.

Such an arrangement determination device D, an arrangement determination method, and an arrangement determination program can verify the quality of defect detection for various types of imaging units by numerical calculation by changing variable imaging unit model parameters.

In the above description, there are a plurality of the illumination units LS1 to LS6 in order to form a light / dark pattern. However, in the third aspect, the illumination unit is not limited to the formation of such a light / dark pattern, but is an arbitrary free aspect. There may be a plurality. In this case, the illumination unit arrangement information is a plurality corresponding to each of the plurality of illumination units.

The number of illumination units may be set by the user from the input unit 1 or may be randomly set by the simulation control unit 47 to set the number of illumination units used for the trial. When there are a plurality of illumination units, the plurality of illumination units may be of the same type, or part or all of them may be of different types. The type of the illumination unit may be set by the user from the input unit 1 for each of the plurality of illumination units, or may be randomly set by the simulation control unit 47 to set the type of the illumination unit used for the trial. When a variable range is defined for the number of illumination units, the number of illumination units is variable within the variable range.

Such an arrangement determining apparatus D, an arrangement determining method, and an arrangement determining program can verify the quality of defect detection by numerical calculation by changing the number of illumination units, and determine the arrangement of each component constituting the surface defect inspection apparatus. it can.

In the fourth aspect, the imaging section may be plural. In this case, the imaging unit arrangement information is a plurality corresponding to each of the plurality of imaging units.

The number of imaging units may be set by the user from the input unit 1, or is set randomly by the simulation control unit 47, and the number of imaging units used for trials is set. When there are a plurality of imaging units, the plurality of imaging units may be of the same type, or part or all of them may be of different types. The type of the imaging unit may be set by the user from the input unit 1 for each of the plurality of imaging units, or may be randomly set by the simulation control unit 47 to set the type of the imaging unit used for the trial. When a variable range is defined for the number of imaging units, the number of imaging units can be varied within the variable range.

Such an arrangement determining device D, an arrangement determining method, and an arrangement determining program can verify the quality of defect detection by changing the number of imaging units by numerical calculation, and determine the arrangement of each component constituting the surface defect inspection apparatus. it can.

In the above-described embodiments, the inspection object, the illumination unit, and the imaging unit are relatively stationary, but the inspection object, the illumination unit, and the imaging unit may move relatively. good. More specifically, for example, the inspection object is a vehicle, the inspection object model information is vehicle model information obtained by quantifying the appearance of the vehicle, and the vehicle model information is The vehicle numerical value calculation generation unit 45 includes vehicle position information representing the arrangement position, and obtains a plurality of images by numerical calculation while moving the arrangement position of the vehicle.

FIG. 11 is a diagram for explaining another modified embodiment. 11A shows how the vehicle Ob has moved to the first position, FIG. 11B shows how the vehicle Ob has moved from the first position to the second position, and FIG. 11C shows that the vehicle Ob has moved to the second position. The state which moved to 3rd position from is shown.

More specifically, in the above-described process S15, the image numerical value calculation generation unit 45 first arranges a vehicle (vehicle body) Ob at a predetermined first position and stores it in the storage unit 5, as shown in FIG. 11A. Based on the illumination unit model information, the imaging unit model information, and the defect-containing inspection object model information, the illumination unit illuminates the vehicle at the first position by the illumination unit arrangement information set by the case setting unit 44 in step S12. Numerical calculation of an image obtained by numerical calculation of an image generated by imaging the inspection area set by the defect setting unit 42 in processing S12 by the imaging unit based on the imaging unit arrangement information set by the case setting unit 44 in processing S12 The process is executed and stored in the storage unit 5 in association with the first position. The predetermined first position is randomly generated by accepting designation by the user from the input unit 1, or by subtracting a predetermined value set in advance from the vehicle position information, or from the vehicle position information. It is set by subtracting the value obtained.

Subsequently, as shown in FIG. 11B, the image numerical value calculation generation unit 45 arranges the vehicle (vehicle body) Ob at the second position moved from the first position, and executes the same numerical value calculation processing as that described above. Then, it is stored in the storage unit 5 in association with the second position. The predetermined second position is randomly received by accepting designation by the user from the input unit 1, or by adding a predetermined value set in advance to the first position, or at the first position. It is set by adding the generated value to.

Subsequently, as shown in FIG. 11C, the image numerical value calculation generation unit 45 arranges the vehicle (vehicle body) Ob at the third position moved from the second position, and executes the same numerical value calculation processing as that described above. Then, it is stored in the storage unit 5 in association with the second position. The predetermined third position is set similarly to the predetermined second position described above. Each of the predetermined second and third positions may be obtained from a preset moving speed of the vehicle and an image generation interval by the image numerical value calculation generation unit 45.

And in the above-mentioned process S16, the surface defect detection part 46 performs the process of the defect detection which detects the defect DEn from the image by the said numerical calculation with respect to each image calculated | required in each position of a vehicle, Each contrast of each defect DEn at each position, the illumination unit arrangement information and the imaging unit arrangement information set in step S12 are associated with each other and stored in the simulation result storage unit 56 as one set.

In this case, in step S18, the arrangement determining unit 48 may obtain an average value for each contrast of each defect DEn at each position of the vehicle. First, for each defect DEn, each position at each position is determined. The best contrast (maximum contrast) may be selected as the contrast of the defect from among the contrasts, and an average value may be obtained for each contrast of each of the selected defects DEn.

Such an arrangement determination device D, an arrangement determination method, and an arrangement determination program can verify the quality of defect detection by numerical calculation on the assumption that a defect of the vehicle is inspected on a production line that produces the vehicle. Arrangement of each component constituting the inspection apparatus can be determined.

Further, in the above-described embodiments, the inspection object is one type, but may be a plurality of types. More specifically, the inspected object is a vehicle, and the inspected object model information is vehicle model information obtained by quantifying the appearance of the vehicle, and the vehicle model information is a plurality of mutually different defects. The setting unit 42, the synthesis unit 43, the case setting unit 44, the image numerical value calculation generation unit 45, the surface defect detection unit 46, the simulation control unit 47, and the arrangement determination unit 48 each have the defect setting for each of the plurality of vehicle model information. The process, the synthesis process, the case setting process, the numerical calculation process, the detection process, the trial process, and the arrangement determination process are executed. For example, vehicle model information of a sedan (saloon), vehicle model information of a coupe, vehicle model information of a one box, vehicle model information of a SUV (Sport Utility Vehicle), and the like can be mentioned.

Such an arrangement determination device D, an arrangement determination method, and an arrangement determination program can verify the quality of defect detection by numerical calculation assuming a plurality of vehicle types, and determine the arrangement of each component constituting the surface defect inspection apparatus. it can.

This specification discloses various modes of technology as described above, and the main technologies are summarized below.

The method for determining the arrangement of a surface defect inspection apparatus according to one aspect includes an A step of setting an inspection area on the surface of a predetermined inspection object, and setting one or a plurality of defect arrangement positions in the set inspection area, A defect-containing inspection object model is obtained by synthesizing defect model information obtained by quantifying a predetermined defect at an arrangement position of the defect set in the step A with inspection object model information obtained by quantifying the appearance of the inspection object. B process for generating information, C process for setting the arrangement position and the optical axis direction of the illumination unit that irradiates the inspection object with illumination light as illumination unit arrangement information, and an imaging unit for imaging the inspection object Generated in the D step of setting the arrangement position and its optical axis direction as the imaging unit arrangement information, the illumination unit model information obtained by digitizing the illumination unit, the imaging unit model information obtained by digitizing the imaging unit, and the B step Was Based on the defect-containing inspected object model information, the imaging unit illuminates the inspection object with the illuminating unit according to the illuminating unit arrangement information set in the C process, and the imaging unit uses the imaging unit arrangement information set in the D process. An E step for obtaining an image generated by imaging the inspection area set in the B step by numerical calculation, an F step for detecting a defect based on the image obtained in the E step, and the F step The G process for storing the detection result, the illumination unit arrangement information set in the C process and the imaging unit arrangement information set in the D process in the storage unit in association with each other, the C process, and the By changing at least one of the illumination unit arrangement information and the imaging unit arrangement information by executing at least one of the D steps, a plurality of the E step, the F step, and the G step are performed. The H process to be executed, and a group having the best detection result is determined from a plurality of sets obtained in the H process and stored in the storage unit, and the illumination unit arrangement information and the imaging unit arrangement of the decided group are determined. I process for obtaining information as the optimal illumination unit arrangement information and imaging unit arrangement information in the plurality of sets, and each process of the A process to the I process is executed using a computer. Preferably, in the arrangement determination method of the surface defect inspection apparatus described above, the inspection object model information includes inspection object position information indicating an arrangement position of the inspection object, and an object indicating an outer contour surface shape of the inspection object. It includes inspection object contour shape information and inspection object reflection characteristic information representing reflection characteristics outside the inspection object. Preferably, the coating of the inspection object has a two-layer structure including a first coating layer and a second coating layer overcoated on the first coating layer, and the inspection object reflection characteristic information is the first coating layer. It consists of first paint layer reflection characteristic information representing the reflection characteristics of the paint layer and second paint layer reflection characteristic information representing the reflection characteristics of the second paint layer. Preferably, the reflection characteristic is a spectral reflection characteristic. Preferably, in the above-described surface defect inspection apparatus arrangement determination method, the illumination unit model information includes luminance distribution information representing a luminance distribution in the light emission portion of the illumination unit, and a shape representing a shape in the light emission portion of the illumination unit. Among the information and the light distribution characteristic information representing the light distribution characteristic in the light emission portion of the illumination unit, one or more including at least the luminance distribution information is included. Preferably, the luminance distribution includes not only a distribution in which the luminance varies depending on the position but also a distribution in which the luminance is uniform regardless of the position. Preferably, the shape of the light emitting portion of the illumination unit includes a light / dark pattern, and includes a light portion width and a space between light portions in the light / dark pattern. Preferably, in the arrangement determination method of the surface defect inspection apparatus described above, the imaging unit model information represents an imaging element representing a pixel size (pixel size) and a number of pixels (imaging element size) of the imaging element in the imaging unit. One or more including at least the imaging element information among information, optical characteristic information representing optical characteristics of the imaging optical system in the imaging unit, and spectral sensitivity characteristic information representing spectral sensitivity characteristics of the imaging element in the imaging unit Including. Preferably, the optical characteristic information includes construction data of an optical element forming the imaging optical system, glass material data of the optical element and a surface coat of the optical element, and an F number of the imaging optical system.

Such a surface defect inspection apparatus arrangement determination method includes numerically modeling an illumination unit, an imaging unit, an inspection object, and a defect, and illuminating the inspection object with an illumination unit based on the illumination unit arrangement information using a computer. An image generated by imaging the inspection area by the imaging unit based on the arrangement information is obtained by numerical calculation, and a defect is detected based on the obtained image. And the arrangement | positioning determination method of the said surface defect inspection apparatus performs this several times, changing at least one of illumination part arrangement information and imaging part arrangement information, and the illumination part arrangement information and imaging which gave the best detection result The part arrangement information is obtained as the optimum illumination part arrangement information and imaging part arrangement information in the plurality of times. As described above, the method for determining the arrangement of the surface defect inspection apparatus can verify the quality of the defect detection by numerical calculation with respect to the illumination unit arrangement information and the imaging unit arrangement information that have been variously changed, so that less labor (man-hours) is required. Thus, the arrangement of the components constituting the surface defect inspection apparatus can be determined.

In another aspect, in the above-described surface defect inspection apparatus arrangement determination method, the illumination unit model information includes a variable illumination unit model parameter, and the H step includes the illumination unit arrangement information and the imaging unit arrangement information. At least one of the illumination unit arrangement information and the imaging unit arrangement information by changing the variable illumination unit model parameter while fixing the variable, or by executing at least one of the C step and the D step The E process, the F process, and the G process are executed a plurality of times while changing the variable illumination unit model parameter. Preferably, in the arrangement determination method of the surface defect inspection apparatus described above, the variable illumination unit model parameter includes a luminance distribution in a light emission portion of the illumination unit, a shape in the light emission portion of the illumination unit, and the illumination unit. One or more of the light distribution characteristics in the light emitting portion of

Such a method for determining the arrangement of surface defect inspection devices can detect defects for various types of illumination light in the same type of illumination unit or for various types of illumination units by changing variable illumination unit model parameters. Can be verified numerically.

In another aspect, in the above-described surface defect inspection apparatus arrangement determination method, the imaging unit model information includes a variable imaging unit model parameter, and the H step includes the illumination unit arrangement information and the imaging unit arrangement. While fixing the information and changing the variable imaging unit model parameter, or by executing at least one of the C step and the D step, at least one of the illumination unit arrangement information and the imaging unit arrangement information The E process, the F process, and the G process are executed a plurality of times while changing one and changing the variable imaging unit model parameter. Preferably, in the above-described surface defect inspection apparatus arrangement determination method, the variable imaging unit model parameters include the pixel size (pixel size) and the number of pixels of the imaging element in the imaging unit, and the imaging optical system in the imaging unit. It includes one or more of optical characteristics and spectral sensitivity characteristics of the image sensor in the imaging unit.

Such an arrangement determination method for the surface defect inspection apparatus can verify the quality of defect detection for various types of image pickup units by numerical calculation by changing the variable image pickup unit model parameters.

In another aspect, in the above-described surface defect inspection apparatus arrangement determination method, there are a plurality of illumination units, and the illumination unit arrangement information is a plurality corresponding to each of the plurality of illumination units.

Such a method for determining the arrangement of the surface defect inspection apparatus can verify the quality of defect detection by changing the number of illumination units by numerical calculation, and can determine the arrangement of each component constituting the surface defect inspection apparatus.

In another aspect, in the above-described arrangement determination method for the surface defect inspection apparatus, there are a plurality of imaging units, and the imaging unit arrangement information is a plurality corresponding to each of the plurality of imaging units.

Such an arrangement determination method of the surface defect inspection apparatus can verify the quality of defect detection by numerical calculation by changing the number of imaging units, and can determine the arrangement of each component constituting the surface defect inspection apparatus.

In another aspect, in the above-described surface defect inspection apparatus arrangement determination method, the inspection object is a vehicle, and the inspection object model information is vehicle model information obtained by quantifying the appearance of the vehicle. In addition, the vehicle model information includes vehicle position information representing the arrangement position of the vehicle, and the step E obtains a plurality of images by numerical calculation while moving the arrangement position of the vehicle.

Such an arrangement determination method for a surface defect inspection apparatus can verify the quality of defect detection by numerical calculation on the assumption that the defect of the vehicle is inspected on a production line for producing the vehicle, and constitutes a surface defect inspection apparatus The arrangement of each component to be performed can be determined.

In another aspect, in the above-described surface defect inspection apparatus arrangement determination method, the inspection object is a vehicle, and the inspection object model information is vehicle model information obtained by quantifying the appearance of the vehicle. Yes, the vehicle model information is a plurality of different ones, and the steps A to I are executed for each of the plurality of vehicle model information.

Such an arrangement determination method of the surface defect inspection apparatus can verify the quality of defect detection by numerical calculation assuming a plurality of vehicle types, and can determine the arrangement of each component constituting the surface defect inspection apparatus.

An arrangement determining apparatus for a surface defect inspection apparatus according to another aspect includes an illumination unit model information storage unit that stores illumination unit model information obtained by quantifying an illumination unit that irradiates a predetermined inspection object with illumination light; An imaging unit model information storage unit that stores imaging unit model information obtained by quantifying an imaging unit that images an inspection object, a defect model information storage unit that stores defect model information obtained by quantifying a predetermined defect, and the inspection object An inspection object model information storage unit for storing inspection object model information in which the appearance of the inspection object is quantified, and an inspection area is set on the surface of the inspection object, and the placement position of the defect is set to 1 or in the set inspection area A defect setting unit that executes a plurality of defect setting processes, and the defect model information at the defect placement position set by the defect setting unit in the inspection object model information stored in the inspection object model information storage unit Storage A synthesis unit that executes a synthesis process for generating defect-containing inspection object model information by synthesizing the stored defect model information, and setting an arrangement position in the illumination unit and its optical axis direction as illumination unit arrangement information, A case setting unit for executing a case setting process for setting an arrangement position and its optical axis direction in the imaging unit as imaging unit arrangement information; illumination unit model information stored in the illumination unit model information storage unit; and the imaging unit model Based on the imaging unit model information stored in the information storage unit and the defect-containing inspection object model information generated by the synthesis unit, the illumination unit includes the illumination unit arrangement information set by the case setting unit. The object to be inspected is illuminated and the inspection area set by the defect setting unit is imaged by the imaging unit according to the imaging unit arrangement information set by the case setting unit An image numerical calculation generation unit that executes numerical calculation processing for obtaining an image generated by the numerical calculation, a defect is detected based on the image obtained by the image numerical calculation generation unit, and the detected detection result and the A surface defect detection unit that executes a detection process in which the illumination unit arrangement information and the imaging unit arrangement information set in the case setting unit are associated with each other and stored in the simulation result storage unit as a set, and the case setting process is performed in the case The numerical value calculation processing and the detection processing are respectively performed on the image numerical value calculation generation unit and the surface defect detection unit while changing at least one of the illumination unit arrangement information and the imaging unit arrangement information by causing the setting unit to execute the setting unit. A simulation control unit that executes trial processing to be executed a plurality of times, and a simulation result storage unit A group having the best detection result is determined from the plurality of stored groups, and the illumination unit arrangement information and the imaging unit arrangement information of the determined group are set to the optimum illumination unit arrangement information and the plurality of groups. An arrangement determination unit that executes an arrangement determination process to be obtained as imaging unit arrangement information.

Such a surface defect inspection apparatus arrangement determination apparatus numerically models an illumination unit, an imaging unit, an object to be inspected, and a defect, and illuminates the object to be inspected by the illumination unit based on the illumination unit arrangement information, and performs imaging based on the imaging unit arrangement information. An image generated by imaging the inspection area by the unit is obtained by numerical calculation, and a defect is detected based on the obtained image. Then, the surface defect inspection device arrangement determination device executes this multiple times by changing at least one of the illumination unit arrangement information and the imaging unit arrangement information, and the illumination unit arrangement information and the imaging that give the best detection result. The part arrangement information is obtained as the optimum illumination part arrangement information and imaging part arrangement information in the plurality of times. As described above, the arrangement determination apparatus for the surface defect inspection apparatus can verify the quality of the defect detection by numerical calculation with respect to the illumination unit arrangement information and the imaging unit arrangement information that have been variously changed. Thus, the arrangement of the components constituting the surface defect inspection apparatus can be determined.

In another aspect, in the arrangement determination apparatus for a surface defect inspection apparatus described above, the illumination unit model information includes a variable illumination unit model parameter, and the simulation control unit includes the illumination unit arrangement information and the imaging unit arrangement. At least one of the illumination unit arrangement information and the imaging unit arrangement information is changed while fixing the information and changing the variable illumination unit model parameter or by causing the case setting unit to execute the case setting process. Both the numerical calculation process and the detection process are executed by the image numerical calculation generation unit and the surface defect detection unit a plurality of times while changing the variable illumination unit model parameters.

Such a surface defect inspection device arrangement determination device detects a defect for various illumination lights in the same type of illumination unit or for various types of illumination units by changing a variable illumination unit model parameter. Can be verified numerically.

In another aspect, in the arrangement determination apparatus for the surface defect inspection apparatus described above, the imaging unit model information includes a variable imaging unit model parameter, and the simulation control unit includes the illumination unit arrangement information and the imaging unit. While fixing the arrangement information and changing the variable imaging unit model parameter, or by causing the case setting unit to execute the case setting process, at least one of the illumination unit arrangement information and the imaging unit arrangement information is changed. Each of the numerical value calculation processing and the detection processing is executed by the image numerical value calculation calculation portion and the surface defect detection portion a plurality of times while changing the variable imaging unit model parameter.

Such a surface defect inspection device arrangement determination device can verify the quality of defect detection for various types of image pickup units by numerical calculation by changing a variable image pickup unit model parameter.

In another aspect, in the above-described arrangement determination apparatus for the surface defect inspection apparatus, there are a plurality of illumination units, and the illumination unit arrangement information is a plurality corresponding to each of the plurality of illumination units.

Such an arrangement determination device for a surface defect inspection apparatus can verify the quality of defect detection by changing the number of illumination units by numerical calculation, and can determine the arrangement of each component constituting the surface defect inspection apparatus.

In another aspect, in the above-described arrangement determination apparatus for the surface defect inspection apparatus, there are a plurality of imaging units, and the imaging unit arrangement information is a plurality corresponding to each of the plurality of imaging units.

Such an arrangement determination device for a surface defect inspection apparatus can verify the quality of defect detection by changing the number of imaging units by numerical calculation, and can determine the arrangement of each component constituting the surface defect inspection apparatus.

In another aspect, in the arrangement determination apparatus for the surface defect inspection apparatus described above, the inspection object is a vehicle, and the inspection object model information is vehicle model information obtained by quantifying the appearance of the vehicle. The vehicle model information includes vehicle position information representing the arrangement position of the vehicle, and the image numerical value calculation generation unit obtains a plurality of images by numerical calculation while moving the arrangement position of the vehicle.

Such a surface defect inspection device arrangement determination device can verify the quality of defect detection by numerical calculation on the assumption that the vehicle is inspected for defects on the production line for producing the vehicle, and constitutes a surface defect inspection device The arrangement of each component to be performed can be determined.

In another aspect, in the arrangement determination apparatus for the surface defect inspection apparatus described above, the inspection object is a vehicle, and the inspection object model information is vehicle model information obtained by quantifying the appearance of the vehicle. The vehicle model information is a plurality of different ones, and the defect setting unit, the synthesis unit, the case setting unit, the image numerical value calculation generation unit, the surface defect detection unit, the simulation control unit, and the arrangement determination unit Each of the plurality of vehicle model information performs the defect setting process, the synthesis process, the case setting process, the numerical calculation process, the detection process, the trial process, and the placement determination process.

Such an arrangement determination device for a surface defect inspection apparatus can verify the quality of defect detection by numerical calculation assuming a plurality of vehicle types, and can determine the arrangement of each component constituting the surface defect inspection apparatus.

An arrangement determination program for a surface defect inspection apparatus according to another aspect sets an inspection area on a surface of a predetermined inspection object in a computer and sets one or a plurality of defect arrangement positions in the set inspection area. A defect is obtained by combining defect model information obtained by quantifying a predetermined defect at the position where the defect is set in the A process and the inspection object model information obtained by quantifying the appearance of the inspection object. B process for generating contained inspected object model information, C process for setting the arrangement position and the optical axis direction of the illumination unit for irradiating illumination light to the inspected object as illumination unit arrangement information, and the inspected object D process for setting the arrangement position of the imaging unit to be imaged and its optical axis direction as imaging unit arrangement information, illumination unit model information that digitizes the illumination unit, imaging unit model information that digitizes the imaging unit, and Based on the defect-containing inspection object model information generated in the B process, the imaging is performed by illuminating the inspection object with the illumination unit according to the illumination unit arrangement information set in the C process. Detecting a defect based on an E process obtained by numerical calculation of an image generated by imaging the inspection area set in the B process by the imaging unit based on part arrangement information, and an image obtained in the E process The F process, the detection result of the F process, the illumination unit arrangement information set in the C process, and the imaging unit arrangement information set in the D process are associated with each other and stored in the storage unit as one set. Step E, changing the at least one of the illumination unit arrangement information and the imaging unit arrangement information by executing at least one of the step C and the step D, the step E, the step F And determining the set having the best detection result from the plurality of sets obtained in the H step and stored in the storage unit. The I step for obtaining the illumination unit arrangement information and the imaging unit arrangement information as the optimum illumination unit arrangement information and the imaging unit arrangement information among the plurality of sets is executed.

Such an arrangement determination program for a surface defect inspection apparatus numerically models an illumination unit, an imaging unit, an inspection object, and a defect, and illuminates the inspection object with an illumination unit based on illumination unit arrangement information using a computer. An image generated by imaging the inspection area by the imaging unit based on the arrangement information is obtained by numerical calculation, and a defect is detected based on the obtained image. The surface defect inspection apparatus arrangement determination program executes this multiple times by changing at least one of the illumination unit arrangement information and the imaging unit arrangement information, and provides the best detection result. The part arrangement information is obtained as the optimum illumination part arrangement information and imaging part arrangement information in the plurality of times. As described above, the arrangement determination program for the surface defect inspection apparatus can verify the quality of the defect detection by numerical calculation with respect to the illumination unit arrangement information and the imaging unit arrangement information which have been changed variously, so that less labor (man-hours) is required. Thus, the arrangement of the components constituting the surface defect inspection apparatus can be determined.

The recording medium according to another aspect includes a step A for setting an inspection area on a surface of a predetermined inspection object in a computer, and setting one or a plurality of defect placement positions in the set inspection area; Defect-containing inspected object model information by combining defect model information in which a predetermined defect is quantified at the defect placement position set in the step A with the inspected object model information in which the appearance of the inspection object is quantified B process for generating the image, C process for setting the arrangement position and the optical axis direction of the illumination unit that irradiates the inspection object with illumination light as illumination unit arrangement information, and the arrangement of the imaging unit for imaging the inspection object Generated in the D step of setting the position and its optical axis direction as the imaging unit arrangement information, the illumination unit model information in which the illumination unit is digitized, the imaging unit model information in which the imaging unit is digitized, and the B step Lack Based on the contained inspected object model information, the object to be inspected is illuminated by the illuminating unit according to the illuminating unit arrangement information set in the C step, and the imaging unit by the imaging unit arrangement information set in the D step An E process for obtaining an image generated by imaging the inspection region set in the B process by numerical calculation, an F process for detecting a defect based on the image obtained in the E process, and the F process The G process that stores the detection result, the illumination unit arrangement information set in the C process, and the imaging unit arrangement information set in the D process in the storage unit in association with each other, the C process, and the D The E step, the F step, and the G step are performed a plurality of times while changing at least one of the illumination unit arrangement information and the imaging unit arrangement information by executing at least one of the steps. The H process to be performed and the group having the best detection result is determined from the plurality of groups obtained in the H process and stored in the storage unit, and the illumination unit arrangement information and the imaging unit arrangement of the determined group are determined. This is a recording of a surface defect inspection apparatus arrangement determination program for executing an I step for obtaining information as optimum illumination part arrangement information and imaging part arrangement information among the plurality of sets.

According to this, it is possible to provide a recording medium in which the arrangement determination program for the surface defect inspection apparatus is recorded.

This application is based on Japanese Patent Application No. 2017-113293 filed on June 8, 2017, the contents of which are included in this application.

Although embodiments of the present invention have been illustrated and described in detail, it is merely exemplary and illustrative and not limiting. The scope of the invention should be construed by the language of the appended claims.

In order to express the present invention, the present invention has been properly and fully described through the embodiments with reference to the drawings. However, those skilled in the art can easily change and / or improve the above-described embodiments. It should be recognized that this is possible. Therefore, unless the modifications or improvements implemented by those skilled in the art are at a level that departs from the scope of the claims recited in the claims, the modifications or improvements are not covered by the claims. To be construed as inclusive.

According to the present invention, there is provided a surface defect inspection apparatus arrangement determination method, an arrangement determination apparatus and an arrangement determination program, and a recording medium on which the arrangement determination program is recorded. Can be provided.

Claims

A step of setting an inspection region on the surface of a predetermined inspection object, and setting one or a plurality of defect arrangement positions in the set inspection region;
A defect-containing inspection object is obtained by synthesizing the defect model information obtained by quantifying a predetermined defect at the defect placement position set in the step A with the inspection object model information obtained by quantifying the appearance of the inspection object. B process for generating model information;
C step of setting the arrangement position of the illumination unit that irradiates the inspection object with illumination light and the optical axis direction thereof as illumination unit arrangement information;
D step of setting the arrangement position of the imaging unit that images the inspection object and the optical axis direction thereof as imaging unit arrangement information;
Based on the illumination unit model information obtained by digitizing the illumination unit, the imaging unit model information obtained by digitizing the imaging unit, and the defect-containing inspection object model information generated in the B step, the setting is performed in the C step. It is generated by illuminating the object to be inspected by the illumination unit according to the illumination unit arrangement information and imaging the inspection region set in the B process by the imaging unit by the imaging unit arrangement information set in the D process. E process for obtaining the image by numerical calculation;
F step of detecting defects based on the image obtained in the E step;
G process for storing the detection result of the F process, the illumination unit arrangement information set in the C process, and the imaging unit arrangement information set in the D process in the storage unit in association with each other;
The E step, the F step, and the G step are performed a plurality of times while changing at least one of the illumination unit arrangement information and the imaging unit arrangement information by executing at least one of the C step and the D step. H process to be executed;
The group having the best detection result is determined from the plurality of groups obtained in the H step and stored in the storage unit, and the illumination unit arrangement information and the imaging unit arrangement information of the determined group are determined. And the I step to obtain as the optimal illumination unit arrangement information and imaging unit arrangement information in,
A method for determining the arrangement of a surface defect inspection apparatus, wherein the steps A to I are performed using a computer.
The illumination unit model information includes a variable illumination unit model parameter,
In the H step, the illumination unit arrangement information and the imaging unit arrangement information are fixed and the variable illumination unit model parameter is changed, or by executing at least one of the C step and the D step. While changing at least one of the illumination unit arrangement information and the imaging unit arrangement information and changing the variable illumination unit model parameter, the E step, the F step, and the G step are executed a plurality of times.
The arrangement | positioning determination method of the surface defect inspection apparatus of Claim 1.
The imaging unit model information includes a variable imaging unit model parameter,
In the H step, the illumination unit arrangement information and the imaging unit arrangement information are fixed and the variable imaging unit model parameter is changed, or by executing at least one of the C step and the D step. While changing at least one of the illumination unit arrangement information and the imaging unit arrangement information and changing the variable imaging unit model parameter, the E step, the F step, and the G step are executed a plurality of times.
The arrangement | positioning determination method of the surface defect inspection apparatus of Claim 1 or Claim 2.
There are a plurality of the illumination units,
The illumination unit arrangement information is a plurality corresponding to each of the plurality of illumination units.
The arrangement | positioning determination method of the surface defect inspection apparatus of any one of Claim 1 thru | or 3.
The imaging unit is plural,
The imaging unit arrangement information is a plurality corresponding to each of the plurality of imaging units.
The arrangement | positioning determination method of the surface defect inspection apparatus of any one of Claim 1 thru | or 4.
The inspection object is a vehicle, and the inspection object model information is vehicle model information obtained by quantifying the appearance of the vehicle,
The vehicle model information includes vehicle position information representing an arrangement position of the vehicle,
The E step calculates a plurality of images by numerical calculation while moving the arrangement position of the vehicle.
The arrangement | positioning determination method of the surface defect inspection apparatus of any one of Claim 1 thru | or 5.
The inspection object is a vehicle, and the inspection object model information is vehicle model information obtained by quantifying the appearance of the vehicle,
The vehicle model information is a plurality of different from each other,
For each of the plurality of vehicle model information, each of the steps A to I is executed.
The arrangement | positioning determination method of the surface defect inspection apparatus of any one of Claim 1 thru | or 6.
An illumination unit model information storage unit that stores illumination unit model information obtained by quantifying the illumination unit that irradiates the predetermined inspection object with illumination light;
An imaging unit model information storage unit that stores imaging unit model information obtained by quantifying an imaging unit that images the inspection object;
A defect model information storage unit for storing defect model information obtained by quantifying a predetermined defect;
Inspected object model information storage unit for storing inspected object model information in which the appearance of the inspected object is quantified,
A defect setting unit that sets an inspection area on the surface of the inspection object, and executes a defect setting process for setting one or a plurality of defect placement positions in the set inspection area;
By synthesizing the defect model information stored in the defect model information storage unit at the defect placement position set in the defect setting unit with the inspection object model information stored in the inspection object model information storage unit A synthesis unit for executing a synthesis process for generating defect-containing inspection object model information;
A case setting unit that executes a case setting process for setting the arrangement position in the illumination unit and its optical axis direction as illumination unit arrangement information, and setting the arrangement position in the imaging unit and its optical axis direction as imaging unit arrangement information;
Based on the illumination unit model information stored in the illumination unit model information storage unit, the imaging unit model information stored in the imaging unit model information storage unit, and the defect-containing inspection object model information generated by the combining unit The illumination unit illuminates the inspection object by the illumination unit arrangement information set by the case setting unit, and is set by the defect setting unit by the imaging unit by the imaging unit arrangement information set by the case setting unit. An image numerical calculation generation unit that executes numerical calculation processing for obtaining an image generated by imaging the inspection region by numerical calculation;
A set is obtained by detecting a defect based on the image obtained by the image numerical calculation generation unit and associating the detected detection result with the illumination unit arrangement information and the imaging unit arrangement information set by the case setting unit. As a surface defect detection unit that executes a detection process stored in the simulation result storage unit,
By causing the case setting unit to execute the case setting process, the numerical value calculation process and the detection process are respectively performed while changing at least one of the illumination unit arrangement information and the imaging unit arrangement information. A simulation control unit for performing trial processing to be executed multiple times for each of the surface defect detection units;
The group having the best detection result is determined from the plurality of groups stored in the simulation result storage unit, and the illumination unit arrangement information and the imaging unit arrangement information of the determined group are optimized among the plurality of groups. An arrangement determining unit that executes an arrangement determining process to be obtained as the illumination unit arrangement information and the imaging unit arrangement information.
Arrangement determination device for surface defect inspection equipment.
The illumination unit model information includes a variable illumination unit model parameter,
The simulation control unit fixes the illumination unit arrangement information and the imaging unit arrangement information and changes the variable illumination unit model parameter, or causes the case setting unit to execute the case setting process. While changing at least one of the part arrangement information and the image pickup part arrangement information and changing the variable illumination unit model parameter, the numerical calculation process and the detection process are respectively performed by the image numerical calculation generation unit and the surface defect detection. Make each part run multiple times,
The arrangement | positioning determination apparatus of the surface defect inspection apparatus of Claim 8.
The imaging unit model information includes a variable imaging unit model parameter,
The simulation control unit fixes the illumination unit arrangement information and the imaging unit arrangement information and changes the variable imaging unit model parameter or causes the case setting unit to execute the case setting process. While changing at least one of the part arrangement information and the image pickup part arrangement information and changing the variable image pickup part model parameter, the numerical value calculation process and the detection process are respectively performed by the image numerical value calculation generation part and the surface defect detection part. Let each run multiple times,
The arrangement | positioning determination apparatus of the surface defect inspection apparatus of Claim 8 or Claim 9.
There are a plurality of the illumination units,
The illumination unit arrangement information is a plurality corresponding to each of the plurality of illumination units.
The arrangement | positioning determination apparatus of the surface defect inspection apparatus of any one of Claims 8 thru | or 10.
The imaging unit is plural,
The imaging unit arrangement information is a plurality corresponding to each of the plurality of imaging units.
The arrangement | positioning determination apparatus of the surface defect inspection apparatus of any one of Claims 8 thru | or 11.
The inspection object is a vehicle, and the inspection object model information is vehicle model information obtained by quantifying the appearance of the vehicle,
The vehicle model information includes vehicle position information representing an arrangement position of the vehicle,
The image numerical value calculation generation unit obtains a plurality of images by numerical calculation while moving the arrangement position of the vehicle.
The arrangement | positioning determination apparatus of the surface defect inspection apparatus of any one of Claims 8 thru | or 12.
The inspection object is a vehicle, and the inspection object model information is vehicle model information obtained by quantifying the appearance of the vehicle,
The vehicle model information is a plurality of different from each other,
The defect setting unit, the synthesizing unit, the case setting unit, the image numerical value calculation generation unit, the surface defect detection unit, the simulation control unit, and the arrangement determination unit, respectively, for each of the plurality of vehicle model information, Executing the setting process, the synthesis process, the case setting process, the numerical calculation process, the detection process, the trial process, and the placement determination process;
The arrangement determination apparatus of the surface defect inspection apparatus of any one of Claims 8 thru | or 13.
On the computer,
A step of setting an inspection region on the surface of a predetermined inspection object, and setting one or a plurality of defect arrangement positions in the set inspection region;
A defect-containing inspection object is obtained by synthesizing the defect model information obtained by quantifying a predetermined defect at the defect placement position set in the step A with the inspection object model information obtained by quantifying the appearance of the inspection object. B process for generating model information;
C step of setting the arrangement position of the illumination unit that irradiates the inspection object with illumination light and the optical axis direction thereof as illumination unit arrangement information;
D step of setting the arrangement position of the imaging unit that images the inspection object and the optical axis direction thereof as imaging unit arrangement information;
Based on the illumination unit model information obtained by digitizing the illumination unit, the imaging unit model information obtained by digitizing the imaging unit, and the defect-containing inspection object model information generated in the B step, the setting is performed in the C step. It is generated by illuminating the object to be inspected by the illumination unit according to the illumination unit arrangement information and imaging the inspection region set in the B process by the imaging unit by the imaging unit arrangement information set in the D process. E process for obtaining the image by numerical calculation;
F step of detecting defects based on the image obtained in the E step;
G process for storing the detection result of the F process, the illumination unit arrangement information set in the C process, and the imaging unit arrangement information set in the D process in the storage unit in association with each other;
The E step, the F step, and the G step are performed a plurality of times while changing at least one of the illumination unit arrangement information and the imaging unit arrangement information by executing at least one of the C step and the D step. H process to be executed;
The group having the best detection result is determined from the plurality of groups obtained in the H step and stored in the storage unit, and the illumination unit arrangement information and the imaging unit arrangement information of the determined group are determined. The arrangement determination program of the surface defect inspection apparatus for executing the I step obtained as the optimum illumination unit arrangement information and the imaging unit arrangement information.
On the computer,
A step of setting an inspection region on the surface of a predetermined inspection object, and setting one or a plurality of defect arrangement positions in the set inspection region;
A defect-containing inspection object is obtained by synthesizing the defect model information obtained by quantifying a predetermined defect at the defect placement position set in the step A with the inspection object model information obtained by quantifying the appearance of the inspection object. B process for generating model information;
C step of setting the arrangement position of the illumination unit that irradiates the inspection object with illumination light and the optical axis direction thereof as illumination unit arrangement information;
D step of setting the arrangement position of the imaging unit that images the inspection object and the optical axis direction thereof as imaging unit arrangement information;
Based on the illumination unit model information obtained by digitizing the illumination unit, the imaging unit model information obtained by digitizing the imaging unit, and the defect-containing inspection object model information generated in the B step, the setting is performed in the C step. It is generated by illuminating the object to be inspected by the illumination unit according to the illumination unit arrangement information and imaging the inspection region set in the B process by the imaging unit by the imaging unit arrangement information set in the D process. E process for obtaining the image by numerical calculation;
F step of detecting defects based on the image obtained in the E step;
G process for storing the detection result of the F process, the illumination unit arrangement information set in the C process, and the imaging unit arrangement information set in the D process in the storage unit in association with each other;
The E step, the F step, and the G step are performed a plurality of times while changing at least one of the illumination unit arrangement information and the imaging unit arrangement information by executing at least one of the C step and the D step. H process to be executed;
The group having the best detection result is determined from the plurality of groups obtained in the H step and stored in the storage unit, and the illumination unit arrangement information and the imaging unit arrangement information of the determined group are determined. The recording medium which recorded the arrangement | positioning determination program of the surface defect inspection apparatus which performs I process calculated | required as optimal illumination part arrangement | positioning information and imaging part arrangement | positioning information in the inside.