WO2018138538A1 - Système et procédé de caractérisation, de conception et/ou de modification de propriétés optiques d'une lentille - Google Patents

Système et procédé de caractérisation, de conception et/ou de modification de propriétés optiques d'une lentille Download PDF

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Publication number
WO2018138538A1
WO2018138538A1 PCT/IB2017/000044 IB2017000044W WO2018138538A1 WO 2018138538 A1 WO2018138538 A1 WO 2018138538A1 IB 2017000044 W IB2017000044 W IB 2017000044W WO 2018138538 A1 WO2018138538 A1 WO 2018138538A1
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WO
WIPO (PCT)
Prior art keywords
lens
optical
light beam
object test
unit
Prior art date
Application number
PCT/IB2017/000044
Other languages
English (en)
Inventor
María Sagrario MILLÁN GARCÍA-VARELA
Fidel VEGA LERÍN
Elisabet PÉREZ CABRÉ
Original Assignee
Universitat Politecnica De Catalunya
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Universitat Politecnica De Catalunya filed Critical Universitat Politecnica De Catalunya
Priority to PCT/IB2017/000044 priority Critical patent/WO2018138538A1/fr
Publication of WO2018138538A1 publication Critical patent/WO2018138538A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0285—Testing optical properties by measuring material or chromatic transmission properties

Definitions

  • the present invention is directed, in general, to the field of optical systems.
  • the invention relates to a system and to a method for characterizing, designing and/or modifying optical properties of a lens without needing to manufacture such a lens. More specifically, the invention simulates the design and characterization of hybrid refractive-diffractive lenses in optical bench.
  • US-A1 -20050275849 patent application discloses a method of calibrating an interferometer for determining an optical property of the interferometer using a calibrating optical arrangement.
  • the calibrating optical arrangement comprises at least one diffractive pattern and a mirror having a reflecting surface.
  • the diffractive pattern and the reflecting surface are disposed at a distance from each other in a beam path of measuring light emitted from interferometer optics of the interferometer system to be calibrated.
  • US-A-5155553 discloses an achromatic or multi-wavelength null lens employing the combination of refractive and diffractive elements for performing null tests on strong aspheric optical elements.
  • the incorporation of the refractive and diffractive elements enables the null lens to be tuned at two separate wavelengths thus enabling an equivalent wavelength to be formed such that an optical element under test can be tested for defects at a wide range of manufacturing stages.
  • the equivalent wavelength enables a desensitized interference pattern to be formed by superimposing an interference pattern formed by the first wavelength on an interference pattern formed by the second wavelength, generally by the two-wavelength holographic technique.
  • a method for measuring the optical properties of a diffractive lens may measure diffractive lenses that have toric or aspheric components. The method may include sampling regions of the wavefront of a diffractive lens. A wavefront of a diffractive lens has discontinuities and a sample of the wavefront may not be fine enough to measure the true wavefront.
  • the solutions provided in these prior art documents do not allow characterizing the optical quality of the lens before the lens being manufactured.
  • the characterization of the lens is made during the manufacturing process, as a quality control.
  • the cited prior art documents do not allow separating the refractive contribution of the lens from the diffractive contribution allowing separately analyzing the optical properties of the lens from each contribution alone as well as together in the compound hybrid lens.
  • a system to characterize, design and/or modify optical properties of a lens comprising: a first arm including an object test and an illuminating unit configured to emit a light beam with a specific spectral content onto the object test; an optical system configured to form an image of said object test at an image plane; and an acquisition system configured to record said image formed at said image plane by converting light intensity thereof in an electrical signal and by digitizing said electrical signal into a corresponding digital image of the image plane.
  • the optical system includes a first optical unit preferably acting as a beam splitter thus relating four arms: a first arm which includes the illuminating unit and the object test, a second arm which includes a first element, a third arm which includes a second element, and a fourth arm which includes a supporting structure to hold up the lens the optical properties of which have to be characterized, designed and/or modified followed by said acquisition system.
  • the first optical unit which keeps the state of polarization of the light beam passing through it, is configured to receive the light beam; split the received light beam towards said first element and to said second element along said second and third arms; receive the split light beam reflected on at least one of said two elements; and direct a part of said received reflected light beam towards said lens.
  • the lens to be characterized, designed and/or modified may be a diffractive-refractive hybrid lens, a diffractive lens, or a refractive lens.
  • At least one of said first element and second element is a spatial light modulator, i.e. a programmable device that modulates light -in some of its properties such as amplitude, phase, or polarization- according to a fixed spatial (pixel) pattern.
  • the second element is a spatial light modulator and the first element is a flat mirror.
  • both of said first and second elements are spatial light modulators.
  • the illuminating unit and the object test are assembled (e.g. the object test is displayed on a microdisplay such as a LED-backlit Liquid crystal display (LCD) screen).
  • the illuminating unit (which may comprise a laser, a Light-Emitting Diode (LED), a lamp, among other light sources that emit a monochromatic light or a polychromatic light, and optical components configured to obtain the light beam with a specific spectral content/bandwidth in a given plane of polarization), according to a second embodiment, is external to the object test.
  • the light emitted by the illuminating unit can be either polarized or non-polarized; however, for the case of a non-polarized illuminating unit the system further includes a polarizer, and optionally a half-wave plate.
  • the object test may comprise a pinhole.
  • the system further has a spatial filter including said pinhole and a condenser comprising either a condenser lens or a microscope objective, which is preferably located with inverted orientation after the illuminating unit and is configured to focus the light beam on said pinhole.
  • the object test may comprise a slit, a standard chart or an extended object such as a resolving power test target.
  • the illuminating unit will emit the light beam with a specific spectral content to illuminate this object test.
  • the optical system may further include a lens and diaphragm, located between the object test and the first optical unit, and configured to adjust the vergence (i.e. the quotient between the index of refraction of the optical medium and the frontal object distance) and size, respectively, of the light beam impinging on the first optical unit and on said first and second elements, respectively.
  • a lens and diaphragm located between the object test and the first optical unit, and configured to adjust the vergence (i.e. the quotient between the index of refraction of the optical medium and the frontal object distance) and size, respectively, of the light beam impinging on the first optical unit and on said first and second elements, respectively.
  • the acquisition system may further include means such as an objective or a microscope configured to amplify the image at the image plane with a required magnification previous to being recorded.
  • the supporting structure may comprise a wet cuvette or any mechanical structure arranged to reproduce the anterior and the posterior optical media in which the lens is located and aimed to be characterized, designed and/or modified.
  • the second and/or third arms may further include diaphragms or masks configured to control a zone of the lens aperture, including the central region or the peripheral region, on which the first and second elements respectively act.
  • the object test is a reflective test; in this case, the system further comprises a second optical unit such as a beam splitter configured to convey information of the reflective test onto the first arm.
  • Another object of the present invention is also to provide a method for characterizing, designing and/or modifying optical properties of a lens.
  • the method comprises emitting, by an illuminating unit, a light beam with a specific spectral content/bandwidth onto an object test; forming, by an optical system, an image of said object test at an image plane by receiving, by a first optical unit of said optical system, said emitted light beam; splitting, by the first optical unit, the received light beam towards a first element and a second element of said optical system; receiving, by the first optical unit, the split light beam reflected on at least one of said two elements; and directing, by the first optical unit, a part of said reflected light beam towards a lens the optical properties of which have to be characterized, designed, and/or modified.
  • the first optical unit keeps the state of polarization of the light beam passing through it.
  • at least one of said first element and second element is a spatial light modulator.
  • the method also records, by an acquisition system, said image formed at said image plane by converting light intensity thereof in an electrical signal and by digitizing said electrical signal into a corresponding digital image of the image plane. Consequently, the characterization, design or modification of said lens, or alternatively, of a compound hybrid lens of interest (phase distribution displayed on the spatial light modulator combined with the phase function of the lens) can be computed from the analysis of the digital image acquired by the acquisition system.
  • Fig. 1 schematically illustrates, in its different views 1A and 1 B, perspective and plane projection, respectively, a system for characterizing, designing, and/or modifying optical properties of a lens, according to a first embodiment of the proposed invention.
  • the illuminating unit is external to the object test and the light beam is linearly polarized.
  • Fig. 2 schematically illustrates, in its different views 2A and 2B, perspective and plane projection, respectively, a system for characterizing, designing, and/or modifying optical properties of a lens, according to a second embodiment of the proposed invention.
  • the illuminating unit is external to the object test and the light beam has non-linear polarization or is even nonpolarized (named non-polarized hereon).
  • Fig. 3 schematically illustrates a system for characterizing, designing, and/or modifying optical properties of a lens, according to a third embodiment of the proposed invention.
  • the illuminating unit and the object test are assembled in a microdisplay.
  • Fig. 4 schematically illustrates a system for characterizing, designing, and/or modifying optical properties of a lens, according to a fourth embodiment of the proposed invention.
  • the object test is a reflective test.
  • Fig. 5 is a flowchart illustrating a method for characterizing, designing, and/or modifying optical properties of a lens, according to the proposed invention.
  • Fig. 1 shows a first embodiment of a system for characterizing, designing and/or modifying optical properties of a lens, before the lens being manufactured or before recording a diffractive pattern on a refractive lens.
  • the system comprises an illuminating unit 1 included in a first arm A1 of the system and emitting a linearly polarized light beam with a specific spectral content onto an object test OT located at an object plane O.
  • the object test OT allows the passage of the light beam there through.
  • the illuminating unit 1 is a light source emitting linearly polarized light, typically, a polarized laser.
  • the light beam may be either a monochromatic light or a polychromatic light.
  • the first arm A1 may optionally include a half-wave plate, not illustrated, for the fine adjustment of the polarization plane.
  • the system also comprises an optical system OP_S to form an image of said object test OT at an image plane O', and an acquisition system 9 such as a camera, to record said image formed at said image plane O' by converting light intensity thereof in an electrical signal and by digitizing said electrical signal into a corresponding digital image of the image plane O'.
  • the acquisition system 9 in this embodiment includes a compound objective including a microscope objective and a tube lens 8 that magnifies the image at said image plane O' previous to being recorded.
  • a compound objective including a microscope objective and a tube lens 8 that magnifies the image at said image plane O' previous to being recorded.
  • other objective lenses may be used for a proper image acquisition.
  • the optical system OP_S of Fig. 1 includes an optical unit 4 (or first optical unit as termed in the claims) such as a beam splitter, not limitative as other optical devices could be also used, which splits the light beam and keeps the state of polarization of the linearly polarized light beam passing through it; a flat mirror 5 positioned in a second arm A2 of the system; a spatial light modulator, or SLM, 6 positioned in a third arm A3 of the system; and a supporting structure 17 on a fourth arm A4 of the system to hold up a lens 7 the optical properties of which have to be characterized and/or modified.
  • an optical unit 4 or first optical unit as termed in the claims
  • a beam splitter not limitative as other optical devices could be also used, which splits the light beam and keeps the state of polarization of the linearly polarized light beam passing through it
  • a flat mirror 5 positioned in a second arm A2 of the system
  • a spatial light modulator, or SLM, 6 positioned in
  • the optical system OP_S of Fig. 1 also includes a lens and diaphragm 3, located between the object test OT and the optical unit 4.
  • the lens and diaphragm 3 are configured to adjust the vergence and size (diameter), respectively, of the linearly polarized light beam impinging on the optical unit 4. It should be noted that even though in the embodiment of Fig. 1 the lens and diaphragm 3 has been drawn together, these two elements (lens and diaphragm) can be separated elements.
  • the aperture of the diaphragm 3 coincides with the aperture of the lens 7.
  • the illuminating unit 11 emits a non-polarized light beam, i.e., the illuminating unit 11 is non-polarized.
  • the illuminating unit 1 1 may be any of a non-polarized laser, a LED, an Organic Light-Emitting Diode (OLED), a discharge lamp, among others, and the light beam may be either a monochromatic light or a polychromatic light.
  • the system further includes optical components such as a linear polarizer 12 and a half-wave plate 13 (optional) to precisely adjust the plane of the linear polarization of light to the requirements of the optical configuration of the spatial light modulator 6 (given by its molecular director, and therefore its fast and slow axis).
  • the polarizer 12 and the half-wave plate 13 are positioned between the lens and diaphragm 3 and the optical unit 4.
  • these two elements, polarizer 12 and half-wave plate 13, may be positioned either between the lens and diaphragm 3 and the object test OT or between the object test OT and the illuminating unit 11.
  • a pinhole is used as object test OT.
  • the system as shown in Figs. 1 and 2, includes a spatial filter 2 including said pinhole and a condenser (for example, a microscope objective with inverted orientation) configured to focus the light beam (either polarized or nonpolarized) onto said pinhole.
  • the object test OT may comprise a slit or an extended object such as a standard chart (for instance, the USAF test) or any other resolving power test target.
  • the second and third arms A2, A3 may also include further diaphragms or masks (not shown in Figs. 1 and 2) in order to control a zone of an aperture of the lens 7, on which the flat mirror 5 and spatial light modulator 6 are acting. In this way, for instance, if a diaphragm with a small diameter is placed in the third arm, and the second arm remains operational and unchanged, the phase distribution displayed by the SLM in the spatial light modulator 6 will only affect the central part of the lens 7, whereas the light passing through its peripheral part will not be affected.
  • the illuminating unit 21 is integrated into the object test OT (e.g. a light-spot, light-line, a standard chart), the latter displayed on a miniaturized pixelated screen, assembled in a backlit microdisplay 23.
  • the object test OT e.g. a light-spot, light-line, a standard chart
  • the object test OT can be a reflective test.
  • the system also incorporates a second optical unit 14 such as a beam splitter configured to include information of the reflective test onto the first arm A1.
  • the system when the light beam is non-polarized, further includes a linear polarizer 12 and a half- wave plate 13 to precisely adjust the plane of the linear polarization of light to the requirements of the optical configuration of the spatial light modulator 6.
  • Operation of the optical system OP_S in any of the described embodiments, can be as follows.
  • the optical unit 4 splits it towards the flat mirror 5 and towards the spatial light modulator 6. Then, the optical unit 4 receives the split light beam reflected on at least one of said two elements 5, 6 and directs a part of the received reflected light beam towards the lens 7.
  • the proposed system can be used to characterize, design, and/or modify optical properties of diffractive-refractive hybrid lenses, diffractive lenses or refractive lenses.
  • the proposed system allows three main operations:
  • the simulation i.e. the modification, of the characteristics of the lens 7 according to a previously designed model without actually altering or modifying the lens 7, or without having to manufacture it again.
  • the spatial light modulator 6 works as a programmable diffractive optical element by displaying a phase distribution function corresponding to said designed model, while the flat mirror 5 is blocked (covered).
  • the proposed system allows the experimental assessment of the lens 7 by operating either with the flat mirror 5 of the second arm A2 or with the spatial light modulator 6 acting as a flat mirror in the third arm A3.
  • the lens 7 can be therefore checked with respect to its nominal specifications as provided by the manufacturer.
  • the system can be used also to analyze optical properties of diffractive lenses before these lenses being manufactured.
  • the flat mirror 5 is blocked and the support structure 17 would be empty, i.e. without any lens, or even removed.
  • the flat mirror 5 positioned in the second arm A2 is replaced by another spatial light modulator, i.e. two spatial light modulators are used, one located in the second arm A2 and the other located in the third arm A3, to characterize, design and/or modify optical properties of a lens. So, the possibilities of simulating new lens designs are increased.
  • a diaphragm and a mask can be additionally inserted in the second and third arms A2, A3 to control the part of the lens aperture on which each arm is acting.
  • one of the spatial light modulators can be used to modify the optical behavior of a central region of the lens 7 while the other spatial light modulator can be used to modify the behavior of a peripheral region of the lens.
  • the supporting structure 17 depending on the type of lens 7 to be characterized, designed and/or modified would have physical properties or others.
  • the supporting structure 17 may be a wet cuvette, for instance when the lens 7 is an intraocular lens (IOL).
  • the lens is a contact lens (CL) or another kind of lens
  • the supporting structure is an optomechanical structure that mimics the conditions in which such lens is typically used.
  • the spatial light modulator(s) used in the proposed invention are liquid crystal spatial light modulators (LCSLMs) or liquid crystal on silicon spatial Light modulators (LCoS SLMs) which work in a reflection mode.
  • LCDSLMs liquid crystal spatial light modulators
  • LCDoS SLMs liquid crystal on silicon spatial Light modulators
  • the method comprises emitting, e.g. by the illuminating unit 1 , 11 , 21 , a light beam onto an object test OT.
  • an image of the object test OT is formed at an image plane O' by the optical unit 4 receiving the emitted light beam, splitting the light beam towards two elements, at least one being a spatial light modulator, receiving the reflected light beam from said elements and directing a part thereof towards the lens 7 the optical properties of which have to be characterized, designed and/or modified.
  • the image formed at said image plane O' is recorded, e.g. by the acquisition system 9, by converting light intensity thereof in an electrical signal and by digitizing said electrical signal into a corresponding image of the image plane O'.
  • SLM Spatial Light Modulator

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

L'invention concerne un système comprenant une unité d'éclairage (1, 11, 21) permettant d'émettre un faisceau lumineux présentant un contenu spectral spécifique sur un test d'objet (OT) ; un système optique (OP_S) permettant de former une image dudit test d'objet (OT) au niveau d'un plan d'image (Ο'), ledit système optique (OP_S) comprenant une première unité optique (4), un premier élément, un second élément et une structure de support (17) permettant de maintenir une lentille (7) dont les propriétés optiques doivent être caractérisées, conçues et/ou modifiées, l'unité optique (4) maintenant l'état de polarisation du faisceau lumineux traversant cette dernière ; et un système d'acquisition (9) conçu pour enregistrer ladite image formée au niveau dudit plan d'image (Ο') par la conversion de son intensité lumineuse en un signal électrique et par la numérisation dudit signal électrique en une image numérique correspondante du plan image (Ο').
PCT/IB2017/000044 2017-01-30 2017-01-30 Système et procédé de caractérisation, de conception et/ou de modification de propriétés optiques d'une lentille WO2018138538A1 (fr)

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PCT/IB2017/000044 WO2018138538A1 (fr) 2017-01-30 2017-01-30 Système et procédé de caractérisation, de conception et/ou de modification de propriétés optiques d'une lentille

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PCT/IB2017/000044 WO2018138538A1 (fr) 2017-01-30 2017-01-30 Système et procédé de caractérisation, de conception et/ou de modification de propriétés optiques d'une lentille

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3889568A4 (fr) * 2018-12-03 2022-01-26 Shanghai Intelight Electronic Technology Co., Ltd. Procédé et système de détection optique et système de fabrication de dispositif optique
CN117629587A (zh) * 2023-11-21 2024-03-01 同济大学 一种测量双波长激光光束质量因子的装置及方法

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US5155553A (en) 1990-12-21 1992-10-13 Hughes Aircraft Company Multiple-color null lens employing refractive and diffractive optical elements
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US5155553A (en) 1990-12-21 1992-10-13 Hughes Aircraft Company Multiple-color null lens employing refractive and diffractive optical elements
US20050275849A1 (en) 2002-11-21 2005-12-15 Carl Zeiss Smt Ag Method of calibrating an interferometer and method of manufacturing an optical element
US7777872B2 (en) 2007-07-31 2010-08-17 Alcon Research, Ltd. Method of measuring diffractive lenses

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LAURA REMÓN ET AL: "Through-focus response of multifocal intraocular lenses evaluated with a spatial light modulator", APPLIED OPTICS, OPTICAL SOCIETY OF AMERICA, WASHINGTON, DC; US, vol. 51, no. 36, 20 December 2012 (2012-12-20), pages 8594, XP001580728, ISSN: 0003-6935, DOI: HTTP://DX.DOI.ORG/10.1364/AO.51.008594 *
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Cited By (3)

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Publication number Priority date Publication date Assignee Title
EP3889568A4 (fr) * 2018-12-03 2022-01-26 Shanghai Intelight Electronic Technology Co., Ltd. Procédé et système de détection optique et système de fabrication de dispositif optique
US11841288B2 (en) 2018-12-03 2023-12-12 Shanghai Intelight Electronic Technology Co., Ltd. Optical measurement method and system and optical device manufacturing system
CN117629587A (zh) * 2023-11-21 2024-03-01 同济大学 一种测量双波长激光光束质量因子的装置及方法

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