Classifications

• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N25/00—Investigating or analyzing materials by the use of thermal means
  • G01N25/18—Investigating or analyzing materials by the use of thermal means by investigating thermal conductivity
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
  • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
  • G01J5/0003—Radiation pyrometry, e.g. infrared or optical thermometry for sensing the radiant heat transfer of samples, e.g. emittance meter
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
  • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
  • G01J3/02—Details
  • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
  • G01J3/108—Arrangements of light sources specially adapted for spectrometry or colorimetry for measurement in the infrared range
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
  • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
  • G01J5/02—Constructional details
  • G01J5/026—Control of working procedures of a pyrometer, other than calibration; Bandwidth calculation; Gain control
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
  • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
  • G01J5/02—Constructional details
  • G01J5/08—Optical arrangements
  • G01J5/0803—Arrangements for time-dependent attenuation of radiation signals
  • G01J5/0805—Means for chopping radiation
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
  • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
  • G01J5/02—Constructional details
  • G01J5/08—Optical arrangements
  • G01J5/0806—Focusing or collimating elements, e.g. lenses or concave mirrors
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
  • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
  • G01J5/02—Constructional details
  • G01J5/08—Optical arrangements
  • G01J5/0896—Optical arrangements using a light source, e.g. for illuminating a surface
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N25/00—Investigating or analyzing materials by the use of thermal means
  • G01N25/72—Investigating presence of flaws
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
  • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
  • G01J2005/0077—Imaging
• • G—PHYSICS
  • G02—OPTICS
  • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
  • G02B21/00—Microscopes
  • G02B21/0004—Microscopes specially adapted for specific applications

Definitions

• the present invention relates to the field of super-resolved detection in the infrared, whether for imaging (microscopy), thermography or spectroscopy of a sample.
• infrared in the sense of the present invention, any electromagnetic field whose frequency, or indistinctly the wavelength, is included in the infrared band (including near and far), the terahertz band, and the microwave band.
• the infrared spectrum is very rich in information (molecular vibrations, phonons, plasmons in semiconductors, thermal emission, etc.). It allows to characterize a sample.
• Infrared spectroscopy is the study of the spectrum of infrared radiation reflected, transmitted, or absorbed by a sample, or produced by the thermal radiation of the surface of it as described in the book Peter R. Griffiths and James A. De Haseth, Fourier Transform Infrared Spectrometry (John Wiley and Sons, Hoboken, NJ, 2007), 2nd ed.
• the microspectroscopy measurements aimed at mapping the spectrum on the surface of the sample involve an infrared microscope coupled with an infrared spectrometer: the sample can be placed on a translation device along 2 orthogonal axes. , controlled by computer, and its spectrum measured at each scanning step, or alternatively it can be static, and its spectrum measured using a multi-channel matrix detector.
• Super-resolution whether it be microscopy, spectroscopy, or microspectroscopy, consists of avoiding the diffraction limit to obtain information with a spatial resolution better than the wavelength.
• SNOM near-field optical microscope
• AFM Atomic Force Microscope
• IR-AFM IR-AFM
• thermomechanical effect on an AFM tip.
• infrared radiation is absorbed by the sample and the resulting thermal expansion is measured by the oscillation amplitude of a cantilever AFM tip placed in contact with the surface of the sample.
• the present invention aims to overcome these constraints.
• the invention relates, according to a first of these objects, to an infrared detection device comprising:
• an infrared detector configured to emit a signal (S1) representative of the wavelength thermal radiation (L_F2) emitted by a set of at least one hot spot (21),
• a light source configured to emit an incident beam (F1) of wavelength (L_F1) less than the wavelength (L_F2), preferably in a window of visible wavelength or UV,
• a focusing device (1 1) of said incident beam (F1) the focusing of said incident beam (F1) producing an assembly of at least one focusing spot, each focusing spot having a size smaller than that of the length of the beam; the wave (L_F2) of the detected infrared thermal radiation, each focusing spot being capable of generating a respective hot spot (21) when said focusing spot is located on a support or a sample, and whose spreading speed on said support or said sample is known,
• a processing module (60), connected at least to the infrared detector (50),
• a synchronization device (70) connected to at least one of said light source (10), said infrared detector (50) and said processing module (60),
• the synchronization device (70) being configured to transmit a synchronization signal (SYNC),
• the infrared detector (50) or the processing module (60) being configured to measure the signal (S1) over a predetermined time window (FT) as a function of said synchronization signal (SYNC) and the spreading speed of the hotspot. It is essentially characterized in that the processing module (60) is configured to measure the signal (S1) over a time window (FT) whose value thereof multiplied by the value of the spreading speed of the point hot (21) is less than the value of the infrared wavelength (L_F2) of the thermal radiation emitted by said hot spot (21).
• FT time window
• the signal (S1) may be an electrical signal or an optical signal.
• connection between the synchronization device (70), the light source (10), the infrared detector (50) and the processing module (60) can be electrical and / or optical, for example with a fast photodiode.
• the processing module (60) is configured to measure the signal (S1) over a time window (FT) whose value thereof is multiplied by the value of the hot spot spreading rate. (21) is less than the value of the infrared wavelength (L_F2) of the thermal radiation emitted by said hot spot (21).
• the size of the hot point (s) thus produced is less than the infrared wavelength (L_F2) of the thermal radiation.
• the wavelength (L_F2) of the thermal radiation emitted by a set of at least one hot spot (21) is comprised in the medium infrared (3 micrometers to 50 micrometers) and the far infrared (50 micrometers to 1000 microns).
• Tests were carried out with a spectral range detector of between 7 and 12 micrometers.
• the light source (10) is a pulse source, configured to emit a train of at least one pulse when it is activated, and
• the synchronization signal (SYNC) is transmitted according to said train of at least one pulse.
• the processing module is configured to take the signal (S1) which corresponds to the thermal radiation arriving on the infrared detector (50) directly after the train of at least one pulse, for a duration such that the spreading of the point The heat is less than the infrared wavelength of the detected thermal radiation.
• S1 the signal which corresponds to the thermal radiation arriving on the infrared detector (50) directly after the train of at least one pulse, for a duration such that the spreading of the point The heat is less than the infrared wavelength of the detected thermal radiation.
• the light source (10) is a continuous or pulse light source modulated temporally at a modulation frequency (Fmod),
• the infrared detection device further comprising a demodulator configured to demodulate the signal (S1) originating from the infrared detector (50) at the modulation frequency
• the infrared detector (50) comprises at least one of: a single-channel infrared detector or an infrared imager (51), and
• infrared imager is meant a multichannel infrared detector typically formed of an array of infrared detectors.
• the hot spot can be super-localized, ie the hot spot produces a diffraction-limited Airy spot that can be sampled over several pixels of the infrared imager.
• the center of the spot can thus be determined with an accuracy better than the infrared wavelength by the adjustment of a Gaussian function in two dimensions on the profile of this task, as known by microscopy by photoactivated localization or microscopy PALM (for photo-activated localization microscopy in English).
• An optical objective (40) configured to collect heat radiation (F2) from a hot spot (21) to said infrared detector (50) can also be provided.
• the processing module (60) is configured to measure the signal (S1) over a time window (FT) whose value thereof is multiplied by the value of the spreading rate of the hot spot (21). ) is less than the value of the infrared wavelength (L_F2) of the thermal radiation emitted by said hot spot (21).
• a scanning device configured to modify the relative position of the focusing point of the beam (F1) and the support (30) of the sample.
• the invention relates to an infrared detection method capable of implementing the device according to the invention, the method comprising the steps of:
• the method further comprises, steps of:
• the light source (10) is a pulse source, it is configured to generate a pulse train comprising a set of rising edges and falling edges, the step of activating the infrared detector (50) then consisting of activating the infrared detector (50) at the latest on the last falling edge of the pulse train
• the step of measuring the output signal (S1) over a predetermined time window (FT) comprises one of:
• the step of activating the infrared detector (50) is to activate the infrared detector (50) at the latest at the last falling edge of the pulse train.
• the step of taking the output signal (S1) during a predetermined time window (FT) starts at the latest at the last falling edge of the pulse train.
• the present invention not only allows probing the infrared properties of the sample surface, but also probing under the surface of the sample, which SNOM probes do not allow.
• the present invention can exploit infrared heat radiation emitted from the hot spot of size smaller than (L_F2) created on the sample.
• the sample is therefore its own source of infrared radiation, the present invention does not require an external infrared source.
• the present invention can exploit the infrared heat radiation emitted from the hot spot created under the sample.
• the carrier is the own source of infrared radiation, the present invention does not require an external infrared source either.
• the infrared radiation generated by the sample has a broad spectrum and intrinsically contains all the optical frequencies of interest to characterize the sample, which is very advantageous compared to SNOM probes that require an external infrared source which the spectrum has an overlap with the optical frequencies of interest of the sample.
• the present invention allows super-resolved imaging, i.e., the spatial resolution is less than the wavelength of the measured thermal radiation (L_F2). In this case, by adjusting the time window, the resolution may be equal to the size of the focus spot.
• the present invention generalises the concept of super-resolved microscopy at longer wavelengths (mid-infrared, terahertz), and operates without a marker because the detected signal comes from the infrared heat radiation of the sample itself. which distinguishes the present invention from superresolute fluorescence microscopy technologies, which are further restricted to the spectral range of visible and near infrared.
• the present invention is very inexpensive and allows probing under the surface of a sample since it is a non-contact technique.
• FIG. 1 illustrates an embodiment of a device according to the invention
• FIG. 2 illustrates a configuration in reflection of a device according to the invention
• FIG. 3 illustrates a configuration in transmission of a device according to the invention
• FIG. 4 illustrates a configuration in reflection of a device according to the invention.
• FIG. 5 illustrates a transmission configuration of a device according to the invention
• FIG. 6 illustrates a conventional infrared microscopy image comprising, in insert, a super-resolved infrared image of a glass fiber, in this case of 13 microns. thickness, obtained according to the invention
• FIG. 7 illustrates a decline curve of the intensity of the infrared signal F2 as a function of time
• FIG. 8A illustrates the infrared spectrum obtained on a glass sample using a spectrometer according to the invention
• FIG. 8B illustrates the infrared spectrum obtained on a sample of PDMS using a spectrometer according to the invention.
• Figure 1 illustrates an embodiment of the device according to the invention.
• the device comprises a light source 10, configured to generate an incident light excitation beam F1, also called signal F1.
• the light source 10 is an impulse light source or modulated temporally.
• the incident light beam F1 is a laser beam and the light source 10 is a laser emitting in the visible spectrum.
• pulse a single pulse or a train of pulses.
• the light beam F1 is preferably of short wavelength. Typically the wavelength is in the visible window or in the UV window. Typically, it is expected that the wavelength L_F1 of the beam F1 is much smaller than the wavelength L_F2 of the heat radiation F2 of a sample, as described below.
• very low is meant that the ratio between the wavelength L_F1 of the beam F1 and the wavelength L_F2 of the thermal radiation is less than a predetermined threshold value. Typically the threshold value is greater than or equal to 10.
• the term "the" wavelength L_F2 the average wavelength of the spectrum of the thermal radiation emitted by a hot spot 21.
• L_F2 is beyond the mean infrared, that is to say greater than 2.5 ⁇ .
• the sample 20 is for example placed on a support 30, typically a support 30 of a microscope not shown.
• the sample 20 is disposed in an environment at a preferably substantially constant temperature, typically room temperature. Without activation of the light source 10, the internal heat of the sample 20 generates in this case a thermal radiation F2, also called signal F2, whose intensity is substantially constant.
• a thermal radiation F2 also called signal F2
• the incident beam F1 is focused on a focusing zone of the sample 20, on the external or internal surface thereof, or inside thereof, for example by a optical focusing device of the incident beam 1 1, such as an optical objective, possibly integrated with the light source 10.
• the beam F1 it is possible to focus the beam F1 on a focusing zone whose equivalent diameter is smaller than the wavelength L_F2 of the thermal radiation F2, also called beam F2 or signal F2.
• the equivalent diameter of the focusing zone is about 1 micron
• the L_F2 wavelength is about 10 microns.
• the focusing of the incident beam F1 on the sample generates by absorption a local elevation of the temperature thereof.
• the local temperature of the focusing zone increases and becomes greater than that of the remainder of the sample, provided that said sample is absorbent at the wavelength of the incident beam F1, and thus defines a hot spot 21.
• the hot spot 21 may be unique.
• the corresponding single focusing point is typically achieved by passing an extended exciter laser through a lens.
• Multiplexing with multiple hot spots can be achieved by passing an extended exciter laser through a plurality of microlenses. This principle is used in confocal fluorescence microscopy with the so-called SDCLM method for Spinning disk confocal laser microscopy in English and described for example at http://www.andor.com/learning- academy / spinning-disk-confocal- has technical-overview.
• the hot spot 21 instead of using a single laser spot that scans the surface of the sample, several spots perform the scanning simultaneously using a rotating disk with microlenses, where the laser simultaneously illuminates a set of microlenses.
• the local temperature rise of the sample around said hot point 21 then produces an increase in the thermal radiation F2 in the infrared of the sample, located around said hot spot, and whose intensity corresponds to the local elevation of the thermal radiation of the sample.
• the position of the hot spot 21 is known and its spatial extension corresponds at least to the focusing area of the incident beam F1.
• An optical objective 40 collects the thermal radiation F2 from the hot spot 21 and then directs said beam F2 towards at least one infrared detector 50, in this case at least one of:
• the infrared detector 50 then generates an output signal S1, representative of the thermal radiation F2, which is sent to a processing module 60.
• the processing module 60 is synchronized with the light source 10, in this case by means of electrical pulses sent by the light source 10 to the processing module 60 at each pulse of the incident beam F1.
• temporal windowing or temporal selection, also known as boxcar anglicism, which consists of activating the infrared detector 50 or selecting the signal (S1) that it produces on a window is provided.
• predetermined time FT from a predetermined time after activation of the light source 10.
• the measurement time of the thermal radiation F2 which corresponds to the activation time of the infrared detector 50 or the duration of selection of the signal S1 that it produces, also called “window width" makes it possible to modify the optical spatial resolution.
• the time window FT is initialized at the latest at the end of the activation of the light source 10, in this case with a pulse light source, at the latest at the last falling edge of the pulse train.
• the window width is slaved to the thermal diffusion constant of the sample.
• the window width is preferably inversely proportional to the thermal diffusion constant of the sample.
• a synchronization device 70 of the light source 10 and the infrared detector 50 or the processing module 60 there is provided a synchronization device 70 of the light source 10 and the infrared detector 50 or the processing module 60.
• the synchronization device 70 can be integrated in the processing module 60.
• the light source 10 is a pulse source that generates a heating pulse, very localized in space (hot spot 21) and in time (pulse).
• the light source 10 is a UV laser source which generates pulses of 1 nanosecond each, at a maximum rate of 1 kHz.
• the heat radiation of the hot spot F2 is collected shortly after the heating pulse of the light source 10.
• short term is meant at the latest a predetermined time after the heating pulse, c that is, the activation of the light source.
• the infrared detector 50 is activated in a detection window FT whose duration is predetermined and whose time position is locked at the end of a heating pulse.
• the detection window FT is activated at the latest after the last falling edge of a heating pulse train, and the window width depends on the nature of the sample.
• the light source 10 is a continuous source whose intensity is temporally modulated at a modulation frequency Fmod, preferably high frequency, for example according to a sinusoidal function.
• a modulation frequency Fmod preferably high frequency, for example according to a sinusoidal function.
• the modulation frequency Fmod is greater than or equal to a frequency f for which the thermal diffusion length LDT substantially corresponds to the size of the hot spot 21, with
• the signal F2 from the hotspot is also modulated at the same modulation frequency Fmod or one of its harmonics.
• the modulation of the F1 signal can be produced using an acousto-optic modulator.
• Synchronous detection of the heat radiation of a hot spot is then provided, that is to say that it is intended to capture the infrared signal F2 by the infrared detector 50 at the modulation frequency Fmod or one of its harmonics . Indeed, there is in this case a link between the spatial extension of the hot spot due to thermal diffusion and the modulation frequency.
• the signal S1 can then be demodulated, typically by means of an unillustrated demodulator.
• the demodulator can be integrated in the processing module 60. In this case, the demodulator comprises a synchronous detection amplifier (Lock in English).
• the detection of the signal F2 can be carried out either in time or frequency regime.
• the scanning is implemented by modifying the relative position of the focusing point of the beam F1 and either of the sample or of its support.
• the position of the focusing point of the beam F1 can be modified, the position of the sample (or of its support) remaining fixed; or change the position of the sample (or its support), the position of the focus point of the beam F1 remaining fixed. It is thus possible to obtain an infrared thermal radiation image of the sample point by point with a resolution determined by the temporal windowing.
• the signal F2 can also be transmitted as input to an infrared spectrometer 52, for example a Fourier transform infrared spectrometer.
• Infrared imaging and infrared spectrometry are combinable.
• infrared image of a sample by scanning, then to select in said infrared image a set of at least one hot spot, whose position is known, and which is of interest. Thanks to this analysis of the infrared image, it is then possible to carry out a spectroscopic analysis of said sample for at least one selected hot spot.
• the present solution can have two configurations, described below. Whatever the first or the second configuration, one of the following 3 variants can be provided.
• the point of focus of the beam F1 is disposed on the external surface of the sample.
• This type of configuration is close to the principle of SNOM probes with the difference that the solution proposed here is without contact with the sample.
• the point of focus of the beam F1 is disposed inside the sample.
• the point of focus of the beam F1 is disposed on the internal surface of the sample.
• the light source 10 and the infrared detector 50 are provided on the same side of the sample, in this case on the external side EXT of the sample 20, the internal side INT being for example in contact with a support.
• the sample 20 has an absorption at the wavelength L_F1 of the incident beam F1.
• Sample 20 is the source of infrared radiation F2.
• the sample 20 is transparent at the wavelength L_F1 of the incident beam F1; and the support 30 (or substrate) has an absorption at the wavelength L_F1 of the incident beam F1.
• the support 30 is the source of the infrared radiation F2 and this radiation is partially absorbed by the sample 20.
• the sample is placed on the support 30, so that they are in contact with each other. one of the other.
• the sample 20 has an absorption at the infrared thermal wavelength produced by the support 30, which is detected by the infrared detector 50. It is possible to directly detect the infrared spectrum emitted by the support 30 and partially absorbed by the Sample 20.
• the material of the layer 22 used to cover the sample must be transparent at both excitation wavelength L_F1 and transparent to the wavelength L_F2 of the thermal radiation.
• FIG. 5 shows a sample 20 in the form of a microfluidic cell comprising an outer layer 22, transparent to the excitation wavelength L_F1, a microfluidic channel 23 comprising, for example, biological cells 25, and an inner layer 24, transparent at the wavelength L_F2 of the thermal radiation.
• the F1 beam is focused on a cell in the microfluidic channel.
• the microfluidic cell is illuminated on one side (outer side EXT) visible or UV to create the hot spot 21, and placed on a transparent substrate 24 in the IR on the opposite side (inner side INT) through which is detected the thermal radiation F2 emitted.
• the local temperature of the sample increases very rapidly up to a maximum, then declines according to a decay curve that depends on the diffusion of heat in the sample, related to its nature and its geometry. It is therefore preferable to provide an FT time windowing which starts from the pulse of the light source 10, which ensures that the peak of intensity of the signal F2 is detected.
• Figure 6 compares a conventional infrared microscopy image and insert (in the box at the top of Figure 6) a super-resolved infrared image of a fiberglass.
• the time window is 50 ⁇ after the heating pulse and the fiberglass is 13 microns thick.
• Each point of the image of the insert of FIG. 6 is an intensity value of the infrared signal F2 averaged over the time window FT as a function of the position.
• FIG. 8A and FIG. 8B illustrate the infrared spectra obtained respectively on a glass sample and a polydimethylsiloxane (PDMS) sample, obtained by means of a spectrometer according to the invention.
• PDMS polydimethylsiloxane
• the present invention allows non-contact characterization of infrared optical properties at a scale less than the thermal wavelength L_F2.
• the light source 10 is combined with at least one of an electronic synchronization device 70 and the processing module 60, which makes it possible to act on the signal S1 at the output of the infrared detector used. This limits the diffusion of the heat spot around the hot spot of the sample that contributes to the signal F2.
• the infrared heat radiation of the sample is thus detected from a zone of size less than the characteristic L_F2 wavelength of this radiation. This The area can be scanned on the surface of the sample to perform super-resolved infrared imaging and spectroscopy measurements.
• the synchronization can be carried out in real time or in post-processing, in this case thanks to the processing module 60, which makes it possible to leave the infrared detector 50 activated independently of the activation of the light source 10.
• the sample must absorb in a region of the spectrum where the wavelength L_F1 is smaller than that of the detected thermal radiation L_F2, so as to be able to create a hot spot 21 of subwavelength size. Otherwise, the sample can be placed on a substrate and form the hot spot at the interface between this substrate and the sample. For example, by depositing the sample on a single glass slide, one can create the hot spot at the interface with a UV laser because it is strongly absorbed by the glass.
• the present invention can be implemented in infrared thermography, in particular for non-contact studies of thermal transport under dynamic conditions following a brief (or modulated) and punctual pulse of heat that can be scanned on the surface of the sample. By scanning the infrared detector with respect to the hot spot, it is also possible to image the heat spreading at various times after the heat pulse, and thus obtain, for example, a mapping of local differences in conductivities. thermal.
• Abnormalities in thermal transport can non-destructively detect defects in a structure, which may be useful for samples such as biological tissues, polymers, composite materials, etc.
• Optical device for collecting the thermal radiation of a sample optical objective

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