WO2018107378A1

WO2018107378A1 - Testing method and testing apparatus

Info

Publication number: WO2018107378A1
Application number: PCT/CN2016/109855
Authority: WO
Inventors: 李阎非; 夏伟才
Original assignee: 深圳中兴力维技术有限公司
Priority date: 2016-12-14
Filing date: 2016-12-14
Publication date: 2018-06-21

Abstract

A testing method and testing apparatus, relating to the technical field of testing. Said method comprises the following steps: determining whether a current number of times testing has been performed on equipment to be tested is greater than a pre-set number of times of testing (S101); if the current number of times testing has been performed on the equipment to be tested is greater than the pre-set number of times of testing, powering on the equipment to be tested, and acquiring status parameters of the equipment to be tested according to a pre-set protocol (S102); determining as to whether the equipment to be tested is operating normally according to the status parameters (S103); if the equipment to be tested is operating normally, powering off said equipment to be tested, and adding 1 to the current number of times testing has been performed (S104); if the current number of times testing has been performed on the equipment to be tested is greater than the pre-set number of times of testing, or the equipment to be tested is operating abnormally, then exporting a test result (S105). Said method may automatically power equipment to be tested on and off, while automatically acquiring status parameters of the equipment to be tested by means of a communications protocol, thereby exporting a test result. Automated testing is achieved, thus vastly lowering labor costs.

Description

Title of the invention: test method and test device

Technical field

[0001] The present invention relates to the field of testing technologies, and in particular, to a testing method and a testing device.

Background technique

[0002] Frequent power-off of electronic equipment is an important performance test. The existing test method mainly uses manual control of the power supply to realize the operation of power-on and power-off, and requires manual guard to catch abnormalities. Manual analysis, this method of testing costs a lot of labor.

technical problem

In view of the above, it is an object of the present invention to provide a test method and test apparatus to solve the problem of excessive labor cost of existing tests.

Problem solution

Technical solution

[0004] In order to achieve the above object, the present invention provides a testing method comprising the following steps:

[0005] determining whether the current number of tests of the device to be tested is greater than a preset number of tests;

[0006] If the current number of tests of the device to be tested is not greater than the preset number of tests, the device to be tested is powered on, the state parameter of the device to be tested is obtained according to a preset protocol, and the operation of the device to be tested is determined according to the state parameter. Whether it is normal; if the device to be tested is running normally, power off the device to be tested, and increase the current number of tests by one;

[0007] If the current number of tests of the device to be tested is greater than the preset number of tests, or the operation of the device to be tested is abnormal, the test result is output.

[0008] Optionally, before the step of determining whether the number of tests of the device to be tested is greater than or equal to the number of tests, the method further includes:

[0009] obtaining a rated input voltage of the device to be tested;

[0010] Configuring an input voltage to the device to be tested according to the rated input voltage.

[0011] Optionally, after the step of powering on the device to be tested, the method further includes:

[0012] determining whether the device to be tested is successfully powered on in the preset power-on time; [0013] if the power-on is successful, obtaining a state parameter of the device to be tested according to a preset protocol;

[0014] If the power-on is unsuccessful, a power-on unsuccessful record is generated.

[0015] Optionally, the step of acquiring the state parameter of the device to be tested according to the preset protocol includes:

[0016] obtaining a test interface parameter of the device to be tested by using a telnet ip port;

[0017] obtaining the memory usage of the device to be tested by using snmpwalk;

[0018] obtaining the network connection parameter of the device to be tested by using ping ip, and actually connecting the device to be tested

[0019] Optionally, after the step of powering off the device to be tested, the method further includes:

[0020] determining whether the device to be tested is powered off successfully in a preset power failure time interval;

[0021] If the power failure is successful, the current test number is increased by 1;

[0022] If the power failure is unsuccessful, a power failure unsuccessful record is generated.

[0023] In addition, in order to achieve the above object, the present invention further provides a testing apparatus, including: a determining module, an executing module, and an output module;

[0024] the determining module is configured to determine whether the current number of tests of the device to be tested is greater than or equal to a preset number of tests;

[0025] The execution module is configured to: after the current test number of the device to be tested is not greater than a preset number of tests, powering on the device to be tested; obtaining a state parameter of the device to be tested according to a preset protocol, and according to the state The parameter determines whether the operation of the device to be tested is normal. If the device to be tested is operating normally, power off the device to be tested, and increase the current number of tests by one;

The output module is configured to output a test result when the current number of tests of the device to be tested is greater than a preset number of tests, or the operation of the device to be tested is abnormal.

[0027] Optionally, the testing device further includes an acquiring module and a configuration module, where

[0028] the obtaining module is configured to acquire a rated input voltage of the device to be tested;

[0029] The configuration module is configured to configure an input voltage to the device to be tested according to the rated input voltage.

[0030] Optionally, the testing device further includes a generating module;

[0031] The determining module is further configured to determine whether the device to be tested is successfully powered on in a preset power-on time; [0032] the executing module is configured to successfully perform power-on, according to a preset protocol Obtaining the status parameters of the device to be tested; [0033] The generating module is configured to generate a power-on unsuccessful recording after the power-on is unsuccessful.

[0034] Optionally, the execution module is specifically configured to:

[0035] obtaining a test interface parameter of the device to be tested by using a telnet ip port;

[0036] obtaining the memory usage of the device to be tested by using snmpwalk;

[0037] obtaining the network connection parameter of the device to be tested by using ping ip, and actually connecting the device to be tested

[0038] Optionally, the testing device further includes a generating module;

[0039] the determining module is further configured to determine whether the device to be tested is powered off successfully in a preset power failure time interval;

[0040] the execution module is configured to add 1 to the current test number after the power failure is successful;

[0041] The generating module is configured to generate a power failure unsuccessful recording after the power failure is unsuccessful.

Advantageous effects of the invention

Beneficial effect

[0042] The technical solution of the present invention can automatically power on and off the device to be tested, and automatically acquire the state parameters of the device to be tested through the communication protocol, output the test result, realize the automation of the test, and thereby greatly reduce The cost of labor.

Brief description of the drawing

DRAWINGS

1 is a flow chart of an embodiment of a test method of the present invention;

2 is a flow chart of another embodiment of a testing method of the present invention;

3 is a flow chart of still another embodiment of a testing method of the present invention;

4 is a flow chart of still another embodiment of a testing method of the present invention;

5 is a schematic block diagram of an embodiment of a test apparatus according to the present invention;

6 is a schematic block diagram of another embodiment of a testing device according to the present invention;

7 is a schematic block diagram of still another embodiment of a testing device of the present invention.

[0050] The implementation, functional features, and advantages of the present invention will be further described with reference to the accompanying drawings. Embodiments of the invention The present invention will be further described in detail below with reference to the accompanying drawings and embodiments in order to make the present invention. It is understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

[0052] As shown in FIG. 1, a first embodiment of the present invention provides a testing method. In this embodiment, the testing method includes the following steps:

[0053] Step S101: Determine whether the current number of tests of the device to be tested is greater than a preset number of tests.

[0054] If the current number of tests is greater than the preset number of tests, step S105 is performed. If the current number of tests is not greater than (less than or equal to) the preset number of tests, step S102 is performed.

[0055] Specifically, the preset number of tests is a number of tests set according to actual needs. The current number of tests represents the actual number of tests for the current test process. The preset number of tests and the current number of tests are recorded in the built-in memory of the test unit.

[0056] Step S102: The device to be tested is powered on, and the state parameter of the device to be tested is obtained according to a preset protocol, and then step S103 is performed.

[0057] Specifically, after the device to be tested is successfully powered on, the state parameter of the device to be tested is obtained according to a preset protocol.

[0058] The preset protocol is a communication protocol between the test device and the device to be tested, including TCP/IP (ping, telnet...) and the like.

[0059] The specific steps of obtaining the state parameter of the device to be tested according to the preset protocol include:

[0060] obtaining a test interface parameter of the device to be tested by using a telnet ip port;

[0061] obtaining the memory usage of the device to be tested by using snmpwalk;

[0062] obtaining the network connection parameter of the device to be tested by using ping ip, and actually connecting the device to be tested

[0063] Step S103, determining whether the operation of the device to be tested is normal according to the state parameter; if yes, executing step S104; if not, executing step S105.

[0064] Specifically, the specific step of determining whether the operation of the device to be tested is normal may be: comparing the obtained state parameter of the actual operation of the device to be tested with the preset normal operation to make the state parameter; if the obtained comparison value Within the preset range, it indicates that the device to be tested is operating normally; if the obtained comparison value is not within the preset range, it indicates that the device to be tested is operating abnormally. [0065] Step S104, powering off the device to be tested, and adding 1 to the current number of tests.

[0066] Specifically, when the device to be tested is powered off successfully, the number of recorded tests is increased by one. For example, the current number of tests a

=1, then record the current number of tests a=l+l, that is, a=2. Then, go back to step 101.

[0067] Step S105, outputting a test result.

[0068] Specifically, the test result is a result of comparing the obtained state parameter of the device to be tested with the state parameter of the device to be tested, and the test result is presented to the user by display, printing, or the like.

[0069] The technical solution of the embodiment can automatically power on and off the device to be tested, and automatically obtain the state parameters of the device to be tested through the communication protocol, output the test result, and realize the automation of the test, thereby greatly Reduced labor costs.

[0070] As shown in FIG. 2, a test method according to a second embodiment of the present invention is based on the foregoing first embodiment. In this embodiment, it is determined whether the current number of tests of the device to be tested is greater than a preset number of tests. Before the steps, the test methods also include:

[0071] Step S106: Acquire a rated input voltage of the device to be tested, and then perform step S107.

[0072] Specifically, the specific manner of obtaining the rated input voltage of the device to be tested may be: automatically obtaining the rated parameter of the device to be tested, or receiving the input of the operator.

[0073] Step S107, configuring an input voltage to the device to be tested according to the rated input voltage, and then performing step S101.

[0074] Specifically, the test device is provided with a relay such that the output voltage has at least three rated input voltages commonly used by commonly used devices to be tested, 12V, 24V, and 48V. After obtaining the rated input voltage of the device to be tested, the corresponding output voltage is selected according to its rated input voltage to supply power to the device to be tested.

[0075] The technical solution of the embodiment provides a corresponding output voltage for the device to be tested by acquiring the rated input voltage of the device to be tested, so as to meet the testing requirements of different devices to be tested.

[0076] As shown in FIG. 3, a test method according to a third embodiment of the present invention, in this embodiment, the test method includes:

[0077] Step S201: Determine whether the current number of tests of the device to be tested is greater than a preset number of tests.

[0078] If the current number of tests is greater than the preset number of tests, step S202 is performed, and if the current number of tests is not greater than (less than or equal to) the preset number of tests, step S208 is performed.

[0079] Step S202, powering on the device to be tested, and then performing step S203. [0080] Step S203, determining whether the device to be tested is successfully powered on in the preset power-on time;

, step S204 is performed. If the power-on is unsuccessful, step S207 is performed.

[0081] Specifically, the preset power-off time is a normal power-off time of the device to be tested, which is pre-stored in the built-in memory of the test device.

[0082] The method for determining whether the device to be tested is successfully powered on in the preset power-on time may be: after the preset power-on time is reached, determining whether the device to be tested enters a normal running state, and if so, Then, it is determined that the device to be tested is successfully powered on. If no, it is determined that the device to be tested is powered on unsuccessfully.

[0083] Step S204: Acquire a state parameter of the device to be tested according to the preset protocol, and then perform step S205.

[0084] The preset protocol is a communication protocol between the test device and the device to be tested, including TCP/IP (ping, telnet...) and the like.

[0085] The specific steps of obtaining the state parameter of the device to be tested according to the preset protocol include:

[0086] obtaining a test interface parameter of the device to be tested by using a telnet ip port;

[0087] obtaining the memory usage of the device to be tested by using snmpwalk;

[0088] obtaining the network connection parameter of the device to be tested by using ping ip, and actually connecting the device to be tested

[0089] Step S205, determining whether the operation of the device to be tested is normal according to the state parameter; if yes, executing step S206; if not, executing step S208.

[0090] Specifically, the specific step of determining whether the operation of the device to be tested is normal may be: comparing the obtained state parameter of the actual operation of the device to be tested with the preset normal operation to make the state parameter; if the obtained comparison value Within the preset range, it indicates that the device to be tested is operating normally; if the obtained comparison value is not within the preset range, it indicates that the device to be tested is operating abnormally.

[0091] Step S206, powering off the device to be tested, adding 1 to the current number of tests, and then returning to step 201

[0092] Specifically, when the device to be tested is powered off successfully, the number of recorded tests is increased by one. For example, the current number of tests a

=1, then record the current number of tests a=l+l, that is, a=2. .

[0093] Step S207, generating a power-on unsuccessful record.

[0094] Specifically, when it is detected that the device to be tested fails to be successfully powered on in the preset power-on time (that is, fails to operate normally), generating a power-on unsuccessful record, and then performing step S208. [0095] It is worth mentioning that if the device to be tested fails to be powered on in the preset power-on time, but is successfully powered on afterwards, then a power-on super-record is generated, and the power-on is super-powered. The 吋 record will be presented in the output test results.

[0096] Step S208, outputting a test result.

[0097] Specifically, in this embodiment, if a power-on is unsuccessful after performing a plurality of test cycles, the output test result includes the obtained state parameter of the device to be tested and the device to be tested are normally operated. The result of the comparison of the state parameters of the ,, as well as the unsuccessful recording of the power-on. If the power is unsuccessful in the first test cycle, the output test result only contains the unsuccessful record.

[0098] As shown in FIG. 4, a test method according to a fourth embodiment of the present invention, in this embodiment, the test method includes:

[0099] Step S301: Determine whether the current number of tests of the device to be tested is greater than a preset number of tests.

[0100] If the current number of tests is greater than the preset number of tests, step S302 is performed. If the current number of tests is not greater than (less than or equal to) the preset number of tests, step S308 is performed.

[0101] Step S302: The device to be tested is powered on, and the state parameter of the device to be tested is obtained according to a preset protocol, and then step S303 is performed.

[0102] Specifically, after the device to be tested is successfully powered on, the state parameter of the device to be tested is obtained according to a preset protocol.

[0103] The preset protocol is a communication protocol between the test device and the device to be tested, including TCP/IP (ping, tel net...) and the like.

[0104] The specific steps of obtaining the state parameter of the device to be tested according to the preset protocol include:

[0105] obtaining a test interface parameter of the device to be tested by using a telnet ip port;

[0106] obtaining the memory usage of the device to be tested through snmpwalk;

[0107] obtaining the network connection parameter of the device to be tested by using ping ip, and actually connecting the device to be tested

[0108] Step S303, determining whether the operation of the device to be tested is normal according to the state parameter; if yes, executing step S304; if not, executing step S308.

[0109] Specifically, the specific step of determining whether the operation of the device to be tested is normal may be: comparing the obtained state parameter of the actual operation of the device to be tested with the preset normal operation to make the state parameter; If the comparison value is within the preset range, it indicates that the device to be tested is operating normally; if the obtained comparison value is not within the preset range, it indicates that the device to be tested is abnormal.

[0110] Step S304: Power off the device to be tested, and then perform step S305.

[0111] Step S305: Determine whether the device to be tested is powered off successfully within a preset power failure time.

[0112] Specifically, the preset power-off time is a normal power-off time of the device to be tested, which is pre-stored in the built-in memory of the test device.

[0113] determining whether the device to be tested is powered off successfully in a preset power-off period may be, after reaching a preset power-off time, determining whether the device to be tested enters a completely closed state, and if so, Then, it is determined that the device to be tested is powered off successfully. If no, it is determined that the device to be tested is powered off unsuccessfully.

[0114] If the power failure is successful, step S306 is performed. If the power is unsuccessful, step S307 is performed.

[0115] Step S306, and adding 1 to the current number of tests.

[0116] Specifically, when the device to be tested is powered off successfully, the number of recorded tests is increased by one. For example, the current number of tests a

=1, then record the current number of tests a=l+l, that is, a=2. Then, return to step 301.

[0117] Step S307, generating a power failure unsuccessful record.

[0118] Specifically, when it is detected that the device to be tested fails to be powered off successfully (that is, fails to be normally turned off) within the preset power-off time, the power failure unsuccessful recording is generated, and then step S308 is performed.

[0119] It is worth mentioning that if the device to be tested fails to be powered off in the preset power-off time, but the power is successfully turned off afterwards, then a power-off super-record is generated, and the power-off is super The 吋 record will be presented in the output test results.

[0120] Step S308, outputting a test result.

[0121] Specifically, in this embodiment, if a power failure is unsuccessful after performing a plurality of test cycles, the output test result includes the obtained state parameter of the device to be tested and the device to be tested are normally operated. The result of the comparison of the state parameters of the ,, as well as the unsuccessful recording of the power failure. If the power failure is unsuccessful in the first test cycle, the output test result contains only the unsuccessful recording.

[0122] It is worth mentioning that the foregoing method embodiments can be combined with each other without conflicts to form a new embodiment. For example, step S106 and step S107 in the second embodiment may be applied to the third embodiment and the fourth embodiment; step S302 in the fourth embodiment is replaced with step S202 in the third embodiment. S203 and step S204 are applied to the fourth embodiment or the like. [0123] As shown in FIG. 5, a first embodiment of the present invention provides a testing apparatus, and the testing apparatus includes a determining module 410.

The execution module 420, and the output module 430. among them,

[0124] The determining module 410 is configured to determine whether the current number of tests of the device to be tested is greater than or equal to a preset number of tests.

[0125] Specifically, the preset number of tests is a number of tests set according to actual needs. The current number of tests represents the actual number of tests for the current test process. The preset number of tests and the current number of tests are recorded in the built-in memory of the test unit.

[0126] The execution module 420 is configured to: after the current test number of the device to be tested is not greater than the preset number of tests, power on the device to be tested; obtain a state parameter of the device to be tested according to a preset protocol, and according to the state parameter Determine whether the device to be tested is running normally. If the device to be tested is operating normally, power off the device to be tested and increase the current number of tests by one.

[0127] Specifically, the preset protocol is a communication protocol between the test device and the device to be tested, including TCP/IP (ping, telnet...) and the like. The specific steps of obtaining the status parameter of the device to be tested according to the preset protocol include

The telnet ip port is used to obtain the test interface parameters of the device to be tested. The snmpwalk is used to obtain the memory usage of the device to be tested. The ping ip is used to obtain the network connection parameters of the device to be tested and the actual power of the device to be tested.

[0128] The specific step of determining whether the operation of the device to be tested is normal may be: comparing the obtained state parameter of the actual device to be tested with the preset normal operation to make the state parameter; if the obtained comparison value is preset The range of the device to be tested indicates that the device to be tested is operating normally. If the comparison value obtained is not within the preset range, it indicates that the device to be tested is operating abnormally.

[0129] When the device to be tested is powered off successfully, the number of recorded tests is increased by one. For example, if the current number of tests is a=l, then the current number of tests is recorded a=l+l, that is, a=2. Then, go back to step 101.

[0130] The output module 430 is configured to output a test result when the current number of tests of the device to be tested is greater than a preset number of tests, or the operation of the device to be tested is abnormal.

[0131] Specifically, the test result is a result of comparing the obtained state parameter of the device to be tested with the state parameter of the device to be tested, and the test result is presented to the user by display, printing, or the like.

[0132] The technical solution of the embodiment can automatically power on and off the device to be tested, and automatically obtain the state parameter of the device to be tested through the communication protocol, output the test result, and realize the automation of the test. And greatly reduce the labor cost.

As shown in FIG. 6, a second embodiment of the present invention provides a test apparatus including a determination module 410, an execution module 420, an output module 430, an acquisition module 440, and a configuration module 450. among them,

[0134] The determination module 410, the execution module 420, and the output module 430 have the same functions as those of the first embodiment described above, and are not described herein.

[0135] The obtaining module 440 is configured to obtain a rated input voltage of the device to be tested.

[0136] Specifically, the specific manner of obtaining the rated input voltage of the device to be tested may be: automatically obtaining the rated parameter of the device to be tested, or receiving the input of the operator.

[0137] The configuration module 450 is configured to configure an input voltage to the device to be tested according to the rated input voltage.

[0138] Specifically, the test device is provided with a relay such that the output voltage has at least three rated input voltages commonly used by commonly used devices to be tested, 12V, 24V, and 48V. After obtaining the rated input voltage of the device to be tested

Select the corresponding output voltage according to its rated input voltage to supply power to the device to be tested.

[0139] The technical solution of the embodiment provides a corresponding output voltage for the device to be tested by acquiring the rated input voltage of the device to be tested, so as to meet the testing requirements of different devices to be tested.

[0140] As shown in FIG. 7, a third embodiment of the present invention provides a testing apparatus, and the testing apparatus includes a determining module 410.

The execution module 420, the output module 430, and the generation module 460. Wherein, the determining module 410 and the executing module 4

20. The output module 430 has the same functions as the first embodiment described above,

The determining module 410 is further configured to determine whether the device to be tested is successfully powered on in the preset power-on time.

[0142] Specifically, the preset power-off time is a normal power-off time of the device to be tested, which is pre-stored in the built-in memory of the test device.

[0143] The method for determining whether the device to be tested is successfully powered on in the preset power-on time may be: after the preset power-on time is reached, determining whether the device to be tested is in a normal running state, and if so, Then, it is determined that the device to be tested is successfully powered on. If no, it is determined that the device to be tested is powered on unsuccessfully.

[0144] The generating module 460 is configured to generate a power-on unsuccessful recording after the power-on is unsuccessful.

[0145] Specifically, when it is detected that the device to be tested fails to be successfully powered on in the preset power-on time (that is, fails to operate normally), a power-on unsuccessful record is generated.

[0146] In this embodiment, if a power-on is unsuccessful after performing a plurality of test cycles, the output test result includes the acquired state parameter of the device to be tested and the state in which the device to be tested is in normal operation. The result of the comparison of the parameters, as well as the unsuccessful recording of power-on. If the power is unsuccessful in the first test cycle, the output test result only contains the unsuccessful record.

[0147] It is worth mentioning that if the device to be tested fails to be powered on within the preset power-on time, but is successfully powered on afterwards, then a power-on super-record is generated, and the power-on is super-powered. The 吋 record will be presented in the output test results.

[0148] As shown in FIG. 7, a fourth embodiment of the present invention provides a testing apparatus. The testing apparatus includes a determining module 410, an executing module 420, an output module 430, and a generating module 460. The determination module 410, the execution module 4 20, and the output module 430 have the same functions as the first embodiment described above, and

[0149] The determining module 410 is further configured to determine whether the device to be tested is powered off successfully in a preset power-off time.

[0150] Specifically, the preset power-off time is a normal power-off time of the device to be tested, which is pre-stored in the built-in memory of the test device.

[0151] determining whether the device to be tested is powered off successfully in a preset power-off period may be, after reaching a preset power-off time, determining whether the device to be tested enters a completely closed state, and if so, Then, it is determined that the device to be tested is powered off successfully. If no, it is determined that the device to be tested is powered off unsuccessfully.

[0152] The generating module 460 is configured to generate a power failure unsuccessful recording after the power failure is unsuccessful.

[0153] Specifically, when it is detected that the device to be tested fails to be powered off successfully within the preset power-off time (that is, fails to be normally turned off), a power failure unsuccessful record is generated.

[0154] In this embodiment, if a power failure is unsuccessful after performing a plurality of test cycles, the output test result includes the obtained state parameter of the device to be tested and the state in which the device to be tested is in normal operation. The result of the comparison of the parameters, as well as the unsuccessful recording of the power failure. If the power failure is unsuccessful in the first test cycle, the output test result contains only the unsuccessful recording.

[0155] It is worth mentioning that if the device to be tested fails to be powered off within the preset power-off time, but after the power-off is successful, then a power-off super-record is generated, and the power-off is exceeded. The 吋 record will be presented in the output test results.

[0156] It is to be noted that the terms "comprising", "including", or any other variants thereof are intended to encompass a non-exclusive inclusion, such that a process, method, article, or device comprising a series of elements includes Those elements, but also other elements not explicitly listed, or elements that are inherent to such a process, method, item or device. In the absence of more restrictions, by the statement "package Included in a "restricted element" does not exclude the existence of additional identical elements in a process, method, article, or device that includes the element.

[0157] Through the description of the above embodiments, those skilled in the art can clearly understand that the foregoing method can be implemented by means of software plus a necessary general hardware platform, and can also be implemented by hardware, but in many cases. The former is a better implementation. Based on such understanding, the technical solution of the present invention, which is essential or contributes to the prior art, may be embodied in the form of a software product stored in a storage medium (such as ROM/RAM, disk, The optical disc includes a number of instructions for causing a terminal device (which may be a mobile phone, a computer, a server, an air conditioner, or a network device, etc.) to perform the methods described in various embodiments of the present invention.

The preferred embodiments of the present invention have been described above with reference to the drawings, and are not intended to limit the scope of the invention.

The serial numbers of the embodiments of the present invention are merely for the description, and do not represent the advantages and disadvantages of the embodiments. In addition, although the logical order is shown in the flowchart, in some cases the steps shown or described may be performed in a different order than the ones described herein.

A person skilled in the art can implement the invention in various variants without departing from the scope and spirit of the invention. For example, the features of one embodiment can be used in another embodiment to obtain a further embodiment. Any modifications, equivalent substitutions and improvements made within the technical concept of the invention are intended to be within the scope of the invention.

Industrial applicability

[0160] The technical solution of the present invention can automatically power on and power off the device to be tested, automatically obtain the state parameters of the device to be tested through the communication protocol, output the test result, realize the automation of the test, and thereby greatly reduce The cost of labor. Therefore, it has industrial applicability.

Claims

Claim

A test method includes the following steps:

If the current number of tests of the device to be tested is greater than the preset number of tests, the device to be tested is powered on, and the device to be tested is obtained according to a preset protocol. State parameter, and judge whether the operation of the device to be tested is normal according to the state parameter; if the device to be tested is operating normally, power off the device to be tested, and increase the current number of tests by one;

If the current number of tests of the device to be tested is greater than the preset number of tests, or the device to be tested is abnormally running, the test result is output.

The test method according to claim 1, wherein before the step of determining whether the number of tests of the device to be tested is greater than or equal to the number of tests, the method further comprises:

Obtain the rated input voltage of the device to be tested;

The input voltage is configured for the device under test based on the rated input voltage.

The testing method of claim 1, wherein after the step of powering up the device to be tested, the method further comprises:

Determining whether the device to be tested is successfully powered on in the preset power-on time;

If the power-on is successful, the status parameter of the device to be tested is obtained according to the preset protocol. If the power-on is unsuccessful, the power-on unsuccessful record is generated.

The testing method according to claim 1, wherein the step of acquiring the state parameter of the device to be tested according to the preset protocol comprises:

Obtain the test interface parameters of the device to be tested by using telnet ip plus port.

Obtain the memory usage of the device to be tested through snmpwalk.

Use ping ip to obtain the network connection parameters of the device to be tested and the actual power-on time of the device to be tested.

The testing method according to claim 1, wherein after the step of powering off the device to be tested, the method further comprises:

Determining whether the device to be tested is powered off successfully within a preset power failure time;

If the power failure is successful, the current test number is increased by 1; If the power failure is unsuccessful, a power failure unsuccessful record is generated.

A testing device, comprising: a determining module, an executing module, and an output module; wherein the determining module is configured to determine whether the current number of tests of the device to be tested is greater than or equal to a preset number of tests;

The execution module is configured to: after the current number of tests of the device to be tested is not greater than the preset number of tests, power on the device to be tested; obtain a state parameter of the device to be tested according to a preset protocol, and determine, according to the state parameter, Whether the test equipment is running normally; if the equipment to be tested is operating normally, power off the equipment to be tested, and increase the current number of tests by one;

The testing device according to claim 6, further comprising an obtaining module and a configuration module; wherein

The obtaining module is configured to obtain a rated input voltage of the device to be tested;

The configuration module is configured to configure an input voltage to the device to be tested according to the rated input voltage. The testing device according to claim 6, further comprising a generating module;

The determining module is further configured to determine whether the device to be tested is successfully powered on in a preset power-on time;

The execution module is configured to obtain a state parameter of the device to be tested according to a preset protocol after the power is successfully powered on;

The generating module is configured to generate a power-on unsuccessful record after the power-on is unsuccessful.

The test apparatus according to claim 6, wherein

The execution module is specifically used to

Obtain the memory usage of the device to be tested through snmpwalk.

The testing device according to claim 6, further comprising a generating module;

The determining module is further configured to determine whether the device to be tested is powered off within a preset power failure time Success

The execution module is configured to add 1 to the current number of tests after the power failure is successful; and the generating module is configured to generate a power failure unsuccessful record after the power failure is unsuccessful.