WO2018106066A1 - Procédé d'analyse quantitative à base d'images de matériaux - Google Patents

Procédé d'analyse quantitative à base d'images de matériaux Download PDF

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Publication number
WO2018106066A1
WO2018106066A1 PCT/KR2017/014407 KR2017014407W WO2018106066A1 WO 2018106066 A1 WO2018106066 A1 WO 2018106066A1 KR 2017014407 W KR2017014407 W KR 2017014407W WO 2018106066 A1 WO2018106066 A1 WO 2018106066A1
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WO
WIPO (PCT)
Prior art keywords
quantitative
ratio
quantitative data
threshold value
value
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Application number
PCT/KR2017/014407
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English (en)
Korean (ko)
Inventor
윤완수
김다솔
김수현
Original Assignee
성균관대학교산학협력단
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by 성균관대학교산학협력단 filed Critical 성균관대학교산학협력단
Publication of WO2018106066A1 publication Critical patent/WO2018106066A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering
    • G01N21/658—Raman scattering enhancement Raman, e.g. surface plasmons
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Engineering & Computer Science (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

L'invention concerne un procédé d'analyse quantitative de matériaux. Les étapes du procédé d'analyse quantitative de matériaux consistent : à mesurer des éléments multiples de données quantitatives sur un premier matériau à partir chaque échantillon d'un nombre N d'échantillons ayant différentes premières valeurs quantitatives pour le premier matériau, les éléments multiples de données quantitatives changeant en fonction des premières valeurs quantitatives, puis à calculer un ratio des données quantitatives ayant une valeur égale ou supérieure à une valeur de seuil préconfigurée parmi les éléments multiples de données quantitatives, par rapport à chaque échantillon du nombre N d'échantillons, et à déduire une fonction d'analyse prenant en compte la corrélation du ratio de données quantitatives ayant une valeur égale ou supérieure à la valeur de seuil par rapport aux valeurs quantitatives du premier matériau au moyen du ratio calculé ; et à calculer les valeurs quantitatives du premier matériau inclus dans un spécimen à analyser au moyen de la fonction d'analyse, une plage analysable quantitativement et une précision d'analyse quantitative pour un matériau pouvant ainsi être améliorées de manière remarquable.
PCT/KR2017/014407 2016-12-09 2017-12-08 Procédé d'analyse quantitative à base d'images de matériaux WO2018106066A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2016-0167624 2016-12-09
KR1020160167624A KR101841369B1 (ko) 2016-12-09 2016-12-09 이미지 기반 물질 정량 분석방법

Publications (1)

Publication Number Publication Date
WO2018106066A1 true WO2018106066A1 (fr) 2018-06-14

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ID=61901190

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PCT/KR2017/014407 WO2018106066A1 (fr) 2016-12-09 2017-12-08 Procédé d'analyse quantitative à base d'images de matériaux

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KR (1) KR101841369B1 (fr)
WO (1) WO2018106066A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102552252B1 (ko) * 2022-05-16 2023-07-07 한국표준과학연구원 표면증강 라만 산란 감지 플랫폼 및 이를 이용한 검출 대상 물질의 검출방법

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000258346A (ja) * 1999-03-08 2000-09-22 Arkray Inc ラマン分光法による基質の定量分析方法
JP2011022014A (ja) * 2009-07-16 2011-02-03 Dainippon Sumitomo Pharma Co Ltd 顕微ラマン分光法による固体材料中の分散粒子の粒径の測定法
KR20120017362A (ko) * 2010-08-18 2012-02-28 한양대학교 산학협력단 표면-증강 라만 산란 이미지 측정용 금패턴 면역분석 마이크로어레이 및 이를 이용한 면역분석방법
KR101298744B1 (ko) * 2012-12-18 2013-08-21 한국생산기술연구원 파이프 내에서 유동하는 다상 유동 유체의 성분 및 조성을 측정하기 위한 임베디드 장치
KR101639527B1 (ko) * 2015-06-25 2016-07-14 중앙대학교 산학협력단 처리 용액 내 오염물 농도의 분석 장치, 분석 방법, 이를 위한 데이터 모델링 방법 및 처리 용액 내 오염물 농도의 분석 시스템

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000258346A (ja) * 1999-03-08 2000-09-22 Arkray Inc ラマン分光法による基質の定量分析方法
JP2011022014A (ja) * 2009-07-16 2011-02-03 Dainippon Sumitomo Pharma Co Ltd 顕微ラマン分光法による固体材料中の分散粒子の粒径の測定法
KR20120017362A (ko) * 2010-08-18 2012-02-28 한양대학교 산학협력단 표면-증강 라만 산란 이미지 측정용 금패턴 면역분석 마이크로어레이 및 이를 이용한 면역분석방법
KR101298744B1 (ko) * 2012-12-18 2013-08-21 한국생산기술연구원 파이프 내에서 유동하는 다상 유동 유체의 성분 및 조성을 측정하기 위한 임베디드 장치
KR101639527B1 (ko) * 2015-06-25 2016-07-14 중앙대학교 산학협력단 처리 용액 내 오염물 농도의 분석 장치, 분석 방법, 이를 위한 데이터 모델링 방법 및 처리 용액 내 오염물 농도의 분석 시스템

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KR101841369B1 (ko) 2018-03-22

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