WO2017189113A3 - Substrate defect based demodulation - Google Patents
Substrate defect based demodulation Download PDFInfo
- Publication number
- WO2017189113A3 WO2017189113A3 PCT/US2017/022527 US2017022527W WO2017189113A3 WO 2017189113 A3 WO2017189113 A3 WO 2017189113A3 US 2017022527 W US2017022527 W US 2017022527W WO 2017189113 A3 WO2017189113 A3 WO 2017189113A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- electromagnetic radiation
- substrate
- wavelength
- region
- device includes
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2/00—Demodulating light; Transferring the modulation of modulated light; Frequency-changing of light
- G02F2/004—Transferring the modulation of modulated light, i.e. transferring the information from one optical carrier of a first wavelength to a second optical carrier of a second wavelength, e.g. all-optical wavelength converter
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Optics & Photonics (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Devices and methods for demodulating a frequency modulated electromagnetic wave are provided. In various embodiments, a device includes a substrate comprising at least a first region having a plurality of atomic defects therewithin. The device includes a light source configured to emit electromagnetic radiation of a first wavelength and to illuminate the first region of the substrate. The first region of the substrate emits electromagnetic radiation of a second wavelength when exposed to electromagnetic radiation of the first wavelength. The device includes a photodetector configured to detect electromagnetic radiation of the second wavelength. The photodetector is configured to detect electromagnetic radiation emitted by the first region of the substrate.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201662308347P | 2016-03-15 | 2016-03-15 | |
US62/308,347 | 2016-03-15 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2017189113A2 WO2017189113A2 (en) | 2017-11-02 |
WO2017189113A3 true WO2017189113A3 (en) | 2018-01-11 |
Family
ID=60161043
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2017/022527 WO2017189113A2 (en) | 2016-03-15 | 2017-03-15 | Substrate defect based demodulation |
Country Status (1)
Country | Link |
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WO (1) | WO2017189113A2 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102018127394A1 (en) * | 2018-11-02 | 2020-05-07 | Bernd Burchard | Device and method for generating and controlling a magnetic field strength |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4880613A (en) * | 1987-01-12 | 1989-11-14 | Sumitomo Electric Industries, Ltd. | Light emitting element comprising diamond and method for producing the same |
US7113276B1 (en) * | 1996-09-10 | 2006-09-26 | Asti Operating Company, Inc. | Micro defects in semi-conductors |
US20130214780A1 (en) * | 2012-02-22 | 2013-08-22 | Geometrics, Inc. | Quantum mechanical measurement device |
US20150001422A1 (en) * | 2013-06-28 | 2015-01-01 | Massachusetts Institute Of Technology | Wide-field imaging using nitrogen vacancies |
-
2017
- 2017-03-15 WO PCT/US2017/022527 patent/WO2017189113A2/en active Application Filing
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4880613A (en) * | 1987-01-12 | 1989-11-14 | Sumitomo Electric Industries, Ltd. | Light emitting element comprising diamond and method for producing the same |
US7113276B1 (en) * | 1996-09-10 | 2006-09-26 | Asti Operating Company, Inc. | Micro defects in semi-conductors |
US20130214780A1 (en) * | 2012-02-22 | 2013-08-22 | Geometrics, Inc. | Quantum mechanical measurement device |
US20150001422A1 (en) * | 2013-06-28 | 2015-01-01 | Massachusetts Institute Of Technology | Wide-field imaging using nitrogen vacancies |
Non-Patent Citations (1)
Title |
---|
SHAO ET AL.: "Wide-Field Optical Microscopy of Microwave Fields Using Nitrogen-Vacancy Centers in Diamonds", ADV. OPTICAL MATER., vol. 4, 11 May 2016 (2016-05-11), pages 10 75 - 1080, XP055450437, Retrieved from the Internet <URL:http://ciqm.harvard.edu/uploads/2/3/3/4/23349210/shao2016.pdf> [retrieved on 20171024] * |
Also Published As
Publication number | Publication date |
---|---|
WO2017189113A2 (en) | 2017-11-02 |
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