WO2017148583A1 - Système de mesure optique mécaniquement robuste au moyen d'une mesure de propagation de lumière et/ou de réflectivité - Google Patents

Système de mesure optique mécaniquement robuste au moyen d'une mesure de propagation de lumière et/ou de réflectivité Download PDF

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Publication number
WO2017148583A1
WO2017148583A1 PCT/EP2017/000271 EP2017000271W WO2017148583A1 WO 2017148583 A1 WO2017148583 A1 WO 2017148583A1 EP 2017000271 W EP2017000271 W EP 2017000271W WO 2017148583 A1 WO2017148583 A1 WO 2017148583A1
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WIPO (PCT)
Prior art keywords
detector
scanning
measurement
tracking
light
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PCT/EP2017/000271
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German (de)
English (en)
Inventor
Wilhelm Stork
Siegwart Bogatscher
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Karlsruher Institut für Technologie
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Publication of WO2017148583A1 publication Critical patent/WO2017148583A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/42—Simultaneous measurement of distance and other co-ordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/481—Constructional features, e.g. arrangements of optical elements
    • G01S7/4811—Constructional features, e.g. arrangements of optical elements common to transmitter and receiver
    • G01S7/4812—Constructional features, e.g. arrangements of optical elements common to transmitter and receiver transmitted and received beams following a coaxial path
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/481—Constructional features, e.g. arrangements of optical elements
    • G01S7/4816—Constructional features, e.g. arrangements of optical elements of receivers alone
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/481—Constructional features, e.g. arrangements of optical elements
    • G01S7/4817—Constructional features, e.g. arrangements of optical elements relating to scanning

Definitions

  • the invention relates to an optical measuring system and a measuring method for measuring measuring objects and / or arrangements of measuring objects, in particular of three-dimensional measuring objects and / or arrangements of measuring objects, e.g. by means of light transit time measurement (time-of-flight measurement), intensity measurement, reflectivity measurement, etc.
  • the invention relates to a laser scanner or a laser ranger scanner.
  • Laser scanners are known in the field of optical metrology. They are often used to perform a fast, two-axis beam deflection of a transmitting unit and a receiving unit. Typically, the beam is diverted in a line or spiral to simplify signal processing. Therefore, a fast and a slow scan axis are needed, which are usually perpendicular to each other.
  • mechanical scanning mirrors can be used, which have a fast and a slow scan axis due to their small mass and a gimbal suspension.
  • the receiving unit needs the largest possible area to receive enough stray light from a measuring object, a fast biaxial beam deflection for inertial reasons is problematic.
  • a laser scanner which uses an array of synchronously vibrating micromechanical oscillating mirrors in order to achieve an enlarged receiving aperture is described, for example, in DE 10 2007 045 334 A1.
  • the approach of such a micromechanical oscillating mirror array solves the problem of an enlarged receiving aperture only imperfectly, since the filling factor of the array is very low due to the control and the suspension of the oscillating mirror. This causes a relatively large space with the same receiving aperture.
  • Another problem is the beam folding, which requires an additional increase in the installation space. Especially at scan angle ranges below approx. Apart from the installation space, 60x60 degrees is another disadvantage:
  • the wafer area required for micromechanical oscillating mirror arrays is relatively large. However, the wafer surface represents an important measure of the system cost.
  • An object of the present invention is to provide an improved optical system and a method for measuring measurement objects, in particular of three-dimensional measurement objects, by means of time-of-flight measurement
  • an optical system is provided for measuring measurement objects and / or arrangements of measurement objects, in particular of three-dimensional measurement objects, arrangements of measurement objects, 3D scenarios, etc.
  • the optical system can in particular for determining the distance to one or more objects
  • the measurement can be carried out, for example, by means of time-of-flight measurement and / or reflectivity measurement.
  • the measurement objects preferably have the same reflectivity.
  • the optical measuring system comprises:
  • At least one light source for emitting a transmission beam
  • a (transmitter-side) scanning or angled deflection device for scanning or for optically scanning a measurement object with the transmission beam along two scan axes, a receiving device for detecting or detecting at least a part of the transmission beam reflected and / or scattered by the measurement object and for generating at least one reception signal, wherein the receiving device comprises at least one detector or a detector array;
  • a (receiving side) tracking device for tracking the reflected and / or scattered by the measurement object in the direction of the receiving device and transmit beam beam light;
  • a signal processing device for processing the at least one received signal to obtain information about the distance to individual measuring points of the measuring object.
  • the light source may include, for example, a laser, an LED or other suitable light sources.
  • the Scan or Winkelablenkvorraum may include, for example, mirrors, prisms or other suitable means to deflect the emitted from the light source of the transmission beam and optically scan the measurement object along two scan axes.
  • the optical system may also include a plurality of light sources (eg, multiple lasers, LEDs, etc.) each emitting a transmit beam.
  • the individual light sources could scan the measurement object at different angles of incidence or in different directions.
  • the optical system may comprise two or more light sources which scan the measurement object at different angles of incidence along one scanning axis (eg along the horizontal direction). The same applies to the second scan axis (eg for the vertical direction).
  • the multiple light sources can be operated in parallel or in a time-shifted or multiplexed manner.
  • the two scan axes may be orthogonal to each other. However, other arrangements are also possible. Further, one of the two axes may be a fast axis and the other a slow axis.
  • the tracking device is designed to track the first of the two scan axes optically and the second scan axis electronically or virtually.
  • the tracking device comprises a transmissive optical beam deflecting arrangement which is designed to deflect the transmitted beam light reflected and / or scattered by the measurement object in the direction of the receiving device (hereinafter also referred to as receive light or receive beam) synchronously with the (transmitter side) scan process in the one (first) scan axis (eg to deflect in synchronism with the deflection of the transmit beam along the one (first) scan axis).
  • the tracking device comprises at least one imaging optical element which is designed to image or focus the light propagated by the beam deflection arrangement onto the at least one detector or the at least one detector array.
  • the tracking device is further designed to synchronize different sections of the detector or the detector array to the (transmitter side) scanning in the second scan axis shadow or to activate, wherein the respective switched or activated portion is in signal communication with the signal processing device.
  • the different partial regions of the detector or of the detector array can be connected or activated, for example serially one after another and synchronously with the deflection of a transmitted beam emitted by a light source and deflected by the scanning or angular deflection device. As a result, an electronic tracking for the other (second) scan axis can be realized.
  • the detector may be a linear detector, i. a detector that is (substantially) longer than it is wide.
  • the detector array may be a linear detector array, i. a cellular arrangement of individual detectors or detector elements. The individual detectors or detector elements of the array can each be (substantially) longer than they are wide.
  • the linear detector or the linear detector array may be arranged substantially perpendicular to the optical axis of the tracking device or perpendicular to the optical axis of the receiving branch of the optical measuring system and / or substantially parallel to one of the scanning axes.
  • the optical system may comprise two (or more) light sources which scan or optically scan the measurement object along one of the scan axes (eg along the horizontal scan axis) at different angles of incidence.
  • the receiving device may comprise two detectors or two detector arrays, which are designed to detect the light reflected and / or scattered by the measurement object of the respective light source.
  • the two (eg vertically arranged) detectors or detector arrays can be read out in parallel or with a time offset or multipliexed.
  • the optical system may comprise two (or more) light sources which scan the measurement object along one of the scan axes (eg the vertical scan axis) at different angles of incidence.
  • the receiving device may comprise, for example, a linear detector or a linear detector array, which is arranged vertically.
  • the detector or the detector array can be designed and arranged such that the spots of the respective light source on the detector or detector array are spatially offset from one another, for example by a plurality of detector elements.
  • the corresponding subregions of the detector or of the detector array can be read out in parallel, for example, by means of an NxX multiple xor. It is likewise possible to read out the sections of the detector or of the detector array which correspond to the different light sources with a time offset or multiplexed.
  • optical measuring system optical measuring system
  • two different tracking techniques a virtual tracking and an optical tracking are advantageously combined with each other, wherein the optical tracking is effected by means of transmissive optical elements.
  • the electronic tracking is used for the fast scan axis and the optical tracking for the slow scan axis.
  • the term “virtual” or “electronic” tracking is understood to mean the change of the reception angular range (viewing direction) of the detector-receiving optical system in synchronism with the scanning process in at least one scan axis by switching or activating partial regions of the detector or of the detector array. As a result, the change in the reception spot position is accommodated depending on the reception angle range.
  • the term “virtual” or “electronic” tracking means the change in the directional dependence of the receiving characteristic of the detector-receiving optical combination by means of electronic circuit or activation of portions of the detector synchronously to the scanning process in at least one scan axis understood (eg synchronously with the beam deflection the transmission beam in at least one scan axis).
  • a subarea of a detector or a detector array with the signal processing of the optical Measuring device is connected.
  • the subregion of the detector or of the detector array can consist of one or more detector elements.
  • the portion of the detector or the detector array connected to the signal processing is switched synchronously to the scanning process. If, for example, a detector array is illuminated with a scan pattern, the currently illuminated detector element is connected to the subsequent signal processing at any time.
  • the principle of virtual tracking is described, for example, in the publications "Laser Rangefinder based on MEMS mirrors for adaptive robotics", S.
  • optical or “angle-enhanced” tracking is understood to mean the change in the reception angle range or the viewing direction of the detector-receiving optical system in synchronism with the scanning process in at least one scan axis by optical means. This can be achieved by deflecting or changing the propagation direction of the part of the transmission beam light reflected and / or scattered by the measurement object in the direction of the receiving device about at least one axis, the deflection or the change of the propagation direction being synchronous with the scanning process along at least one scan axis takes place (eg synchronously with the deflection of a transmission beam along at least one scan axis).
  • the change in the reception angular range is effected by means of a receiving-side optical beam deflection arrangement based on the principle of beam transmission.
  • the transmitted beam light reflected and / or scattered by a measurement object in the direction of the reception device or the receiver passes through the transmissive beam deflection arrangement, is deflected by the latter and then focused onto the linear detector or the linear detector array.
  • the angular range in which the receiving beam is deflected can be, for example, ⁇ 80 °, ⁇ 70 °, ⁇ 60 °, ⁇ 45 ° or another angular range.
  • a major advantage of the proposed system concept is that the strengths of the two tracking techniques used can be optimally utilized while at the same time minimizing or avoiding the greatest principle-related weaknesses.
  • the respective strengths lie in particular in the decoupling between receiving aperture and scanning frequency (virtual or electronic tracking) and between receiving aperture and field of view (optical or angle-enhanced tracking).
  • the field of view of the electronically tracked scan axis can be made smaller than that of the optically or angularly enhanced tracking scan axis.
  • the scanning frequency of the electronically tracked axis can be chosen to be significantly higher than that of the optical or angle-enhanced (eg mechanically-translationally) tracked axis.
  • transmissive optical elements transmission optics or transmission elements
  • the installation space of the optical measuring device can be significantly reduced.
  • a space saving is achieved in particular by the fact that a filling factor of the receiving optics can be achieved up to 100% and the receiving side only transmission elements are used, which can be arranged directly behind each other to save space.
  • Another advantage is the small wafer area required for a given receive aperture at certain scan angle ranges. The required wafer area is e.g. considerably smaller than in the approach proposed in DE 10 2007 045 334 A1 with an array of synchronously oscillating micromechanical oscillating mirrors.
  • Another advantage is the long service life, since bearings or other components subject to wear can be largely avoided.
  • the deflection of the transmitted beam light (receiving beam) reflected and / or scattered by the measurement object in the direction of the receiving device or of the receiver can be achieved, for example, by a mechanical-translatory movement of at least two transmissive optical elements relative to each other.
  • This type of tracking is also referred to below as mechanical-translational tracking.
  • the mechanical movement may, for example, be a translational movement of two microlens arrays or lenticular lens arrays relative to one another.
  • the microlens or lenticular lens arrays can be arranged essentially parallel to one another and perpendicular to the optical axis of the receiving branch and in particular of the receiving device.
  • the size of the micro or lenticular lens array is preferably in the range of 5x5 mm 2 to 50x50 mm 2 .
  • the individual lenses of the micro or lenticular lens array may be elongated lenses, such as cylindrical or other aspherical lenses.
  • the longitudinal axis of the individual lenses of the micro- or lenticular lens array may be substantially parallel to the linear detector or detector array and substantially perpendicular to the translational motion of the micro- or lenticular lens array.
  • the period of the micro- or lenticular lens array can be, for example, from 50 ⁇ m to 500 ⁇ m, preferably approximately 200 ⁇ m.
  • the maximum translational movement of the micro or lenticular lens array is approximately half the diameter of the individual lenses of the micro or lenticular lens array.
  • the speed of the translational motion may be in the range of sub-kilohertz, e.g. in the range of 1 Hz to 50 Hz.
  • the maximum deflection angle may be in the range of several tens of degrees. For example, the maximum deflection angle can be ⁇ 25 °, preferably ⁇ 26.5 °.
  • An advantage of the mechanical-translational tracking by means of microlenses or lenticular lenses is that with relatively small translational movements, a relatively large scan area can be covered. As a result, the optical tracking can be implemented very space-saving. Furthermore, it is possible to make the mechanical drive due to the relatively small movement necessary simple and inexpensive.
  • a deflection of the transmitted beam light (receiving beam) reflected and / or scattered by the measurement object in the direction of the receiving device or the receiver can likewise be achieved by an opposite rotation of two transmission gratings or by at least one temporally variable or programmable transmission grating. It is possible, for example, to control transmissive spatial light modulators, such as LCD, for example Modulators, in which gratings with variable direction and period are inscribed.
  • An advantage of using electronically controllable transmission grids or other electronically controllable light modulators is that the tracking device does not require any mechanically moving components. Thereby, the scanning speed of the tracking device can be increased and its structure can be simplified. Furthermore, the construction volume of the optical measuring device can be reduced and its robustness can be increased.
  • the imaging optical element may be a converging lens, in particular a Fresnel lens.
  • the advantages of a Fresnel lens are, in particular, its low weight, its simple and cost-effective production (even of complex aspherical lenses) and its very low installation space requirements. Furthermore, Fresnel lenses can be very well integrated into convenient brackets due to their planarity.
  • the transmitter-side scan or angle deflection device may comprise a vibrating and / or rotating scanning mirror.
  • the scan jig can e.g. a micromirror or other micromechanical scanning element.
  • the micromirror may e.g.
  • the scanning mirror may e.g. electrostatically, electromagnetically or piezo-electrically driven.
  • the fast scan axis may e.g. vibrate resonantly, the slow scan axis can e.g. be statically controllable.
  • the scan or angle deflection device may also comprise a plurality of scanning mirrors, e.g. a one- or two-dimensional mirror array.
  • the scanning or angled deflection device may further comprise a position device for measuring the position of the scanning mirror, which may be in signal communication with the tracking device and / or the signal processing device.
  • the transmission-side scan or angle deflection device and the reception-side tracking device can be components of a scan unit or of a scan module.
  • a scanning mirror of the scanning or angled deflection device may be disposed in a recess in at least one optical transmission element (such as in the double-sided and / or single-sided micro or lenticular lens array).
  • the construction volume of the optical measuring system can be reduced.
  • the transmitter-side scanning or angular deflection device and the receiving-side tracking device and / or receiving device can be arranged such that their optical axes are coaxial.
  • the transmitter and the receiver can be arranged coaxially. Due to the coaxial arrangement of the transmitter-side scan or Winkelablenkvoriques and / or the receiving side tracking device and / or receiving device (ie the transmitter and the receiver) can occur due to the triangulation unwanted distance-dependent displacement of the receiving beam spot on the detector (or a parallax error) can be avoided or minimized , This distance-dependent spot shift is accompanied by an unintentional distance-dependent shift of the optimal switchover times, which is particularly noticeable at small measurement distances.
  • a coaxial arrangement of the scanning or angled deflecting device and the tracking device may e.g. be realized by the above-described arrangement of the scanning mirror in a recess in one or more transmissive optical elements of the transmissive beam deflection arrangement.
  • a further aspect of the invention relates to a method for measuring measuring objects and / or arrangements of measuring objects, in particular of three-dimensional measuring objects and / or arrangements of measuring objects, e.g. by means of time-of-flight measurement and / or by means of reflectivity measurement
  • the method can be carried out, for example, with the optical measuring system described above.
  • Detecting or detecting at least a part of the transmitted beam light (or at least part of the receiving beam) reflected and / or scattered by the measured object by means of at least one (eg linear) detector or at least one (eg linear) detector array of the receiving device and generating at least one received signal; and
  • the optical tracking of the first scan axis comprises:
  • Reception beam to the detector or the detector array.
  • the electronic tracking of the second scan axis comprises switching or activating different subregions of the detector or of the detector array (for example serially one after the other) synchronously with the scanning process in the second scan axis, wherein the respectively activated subarea is in signal connection with the signal processing device.
  • the different portions of the detector or detector array may be serially serially, e.g. be switched or activated synchronously to the beam deflection of the transmission beam along the second scan axis.
  • the deflection of the transmitted beam light or the receiving beam reflected and / or scattered by the measurement object in the direction of the receiving device can take place, for example, by means of a translatory movement of a double-sided micro- or lenticular lens array and a single-sided micro- or lenticular lens array relative to each other. It is also possible to realize the deflection by means of an opposite rotation of two transmission gratings or by means of an electronically switchable (electronic) transmission grating.
  • the imaging of the light or the reception beam propagated by the beam deflection arrangement onto the detector or the detector array can take place by means of a Fresnel lens.
  • the scanning of the measurement object with the transmission beam can be done by means of an oscillating and / or rotating scanning mirror, for example an electrostatically or electromagnetically operated micromirror.
  • the measuring system according to the invention and the measuring method according to the invention can be used in automation technology, robotics, driverless transport systems, automobile production, logistics, etc.
  • Uniaxial-scanning laser scanners are currently used in most of these areas because the problem of providing efficient, robust and fast two-axis laser scanners has not been satisfactorily solved.
  • Another field of application of the optical measuring system is autonomous driving, for example, for the localization of vehicles side by side and at different distances and / or for distinguishing road users and their distance.
  • the measuring system according to the invention and the measuring method according to the invention can be used to determine a 3D point cloud of an object, e.g. of an object to be transported in driverless transport systems.
  • a metrologically determined 3D point cloud of the object to be transported helps to implement the charge carrier recording more reliably and faster, which saves costs and time.
  • FIG. 1 shows an exemplary scanning pattern
  • Fig. 2A the principle of virtual tracking
  • FIG. 2B shows the principle of optical or angle-enhanced tracking
  • 2C shows a partial region of the beam path of the receiving beam through two
  • FIG. 3 and 4 show the schematic structure of an exemplary optical measuring system, wherein the receiving beam for a substantially vertical angle of incidence (Figure 3) and for an oblique angle of incidence (Figure 4) of the slow scan axis is shown.
  • Fig. 5 is a perspective view of the measuring system shown in Figs. 3 and 4;
  • Fig. 6 is an exemplary microlens array disposed in front of a detector array; 7 shows an exemplary embodiment of a microlens array with a recess for the transmitter-side scanning mirror; and
  • FIG. 8 shows the schematic structure of a further exemplary optical measuring system; 9 shows the light diffraction on a transmission grating;
  • FIG. 10 shows an exemplary beam deflection arrangement comprising two counter-rotating transmission gratings.
  • optical measuring system and the optical measuring method in the following examples are based on the time of flight measurement. However, the measuring system and measuring methods can be based on the reflectivity measurement.
  • pulse transit time measurement method and phase transit time measurement method can be used.
  • frequency modulation based methods such as e.g. FMCW Radar (English: Frequency Modulated Continuous Wave).
  • the principle of the pulse transit time measurement is based on the direct time measurement. Therefore, this method is often referred to as direct time-of-flight measurement (English: “direct time-of-flight” or “ToF”).
  • direct time-of-flight measurement English: "direct time-of-flight” or "ToF”
  • For a single-point measurement in the simplest case, only a single pulse is transmitted by the transmitter. This pulse is scattered back and / or reflected by a measured object at a distance d and registered by the receiver in a weakened form. The measured time difference between the transmitted and received pulses corresponds to the round trip time r. The sought measuring distance can finally be calculated according to equation (1).
  • an indirect measurement of the light transit time is carried out during the phase delay measurement via a phase measurement.
  • this method is often referred to as an indirect "time-of-flight" method in which a, usually sinusoidal, amplitude modulation of the transmitted optical power with the modulation frequency / m zj m.
  • the phase ⁇ between transmitted and received signal corresponds the orbital period ⁇ via the following relationship
  • the measuring devices and measuring methods in the following examples are scanning methods and are based on a beam deflection of the transmitted and received beam and thus on a sequential measurement of the field of view.
  • the pixels or the measured points of the measurement object are measured serially one after the other.
  • An exemplary cell scan pattern is shown in FIG.
  • the measurement object is scanned or optically scanned along a fast axis y and a slow axis x.
  • the horizontal scan motion may be a sinusoidal motion, while the vertical scan motion may be a linear motion.
  • the scan pattern is processed once per frame. At the end of the frame, a return to the starting position or the frame runs counter to the pattern "backwards".
  • the reception concept of the optical measuring system and the measuring method is based on a combination of two different tracking techniques: a virtual or electronic tracking and an optical or angle-enhanced tracking.
  • Fig. 2A schematically illustrates the principle of the virtual or electronic tracking, which takes place without a beam deflection of the receiving beam.
  • the term "receiving beam” is understood to mean the part of the light (receiving light) which is reflected and / or scattered by the measuring object in the direction of the receiving device or of the receiver and is detected by the receiving device or the receiver. the receiving device or the receiver in the direction from which the receiving beam comes.
  • the term “receive beam” can thus in some cases with the Viewing direction of the receiving device or the receiver are equated.
  • the entire scan angle range of a scan axis (e.g., the fast axis y) is imaged by an imaging optical element (e.g., a converging lens) onto an elongate or linear detector or onto a linear or one-dimensional detector array 9, respectively.
  • an imaging optical element e.g., a converging lens
  • the receiving beam 51 focused on the detector or on the detector array 9 moves over the detector or the detector array 9 due to the scanning process, in each case the most-illuminated detector element is connected by a multiplexer 10 to the subsequent signal processing 11.
  • the individual detectors of the detector array 9 By switching between the individual detectors of the detector array 9, the total amount of light of the receiving beam 51 which impinges on the converging lens 7 can be received.
  • the two largest receiving angles of the receiving beam 51 that can be received are shown in dashed and solid lines, respectively.
  • the focus of the receiving beam moves with a e.g. sinusoidal velocity profile across the detector array 9 away.
  • the maximum illuminated detector is connected to the signal processing at any time. This can be done by a multiplexer 10. If the detector does not consist of a detector array, the multiplexer 10 is omitted and it is not necessary to switch over. In this case, however, the stray light of the entire angular range falls on the detector and increases the noise.
  • a decoupling between scanning frequency and receiving aperture is achieved in the electronic or virtual tracking.
  • the synchronization effort can be shifted from the mechanical to the electrical domain.
  • the synchronization accuracy can be further improved, for example, by a sensor-detected position signal of the micromirror.
  • the achievable receive aperture is determined by the size of the detector array.
  • increasing the number of detector elements can lead to complication of circuit design and cost increase.
  • a disadvantage of the electronic tracking can be the reduced measurement accuracy in the switching ranges.
  • One reason for this reduction of the measurement accuracy may be a falsification of the phase measurement during switching between two detectors or detector elements.
  • a possible solution to this problem is to replace the measured values obtained during the switching process with an in-phase delayed copy of the last measured values before a quadrature demodulation.
  • Another solution is to adapt the circuit design.
  • part of the light in the switching area may be lost by distributing the spot illuminated by the receiving beam to two or more detector elements, which may result in a reduction of the signal-to-noise ratio.
  • the reduction of the signal-to-noise ratio in the switching region can be reduced.
  • the reduction of the signal-to-noise ratio can be reduced from 2 to 2.
  • a desynchronization between the oscillation of the scanning mirror and the detector switching can be avoided by tracking the switching times with corresponding position sensors of the scanning mirror.
  • FIG. 2B shows schematically the principle of the optical or angle-enhanced tracking and in particular the mechanical-translational tracking.
  • the mechanical-translational beam tracking is realized by means of a transmissive beam deflection arrangement comprising three microlens arrays.
  • Fig. 2B shows the case of the maximum deflection angle ß ma x ⁇
  • the first lens array LA1 focuses the incident beam (receive beam 51) in the field plane at a distance f ml , in which the field lens array LA2 same focal length f ml be.
  • FIG. 2C shows a possible implementation of the principle of mechanical translational tracking shown in FIG. 2B with a microlens array 4 structured on both sides and a microlens array 5 structured on one side.
  • FIG. 2C shows a partial region of the beam path of the receiving beam 51 through the two microlens arrays 4 and 5 at maximum deflection angle of the slow scan axis.
  • the received beam 51 reflected and / or scattered by a measuring object 3 is divided by the double-sided microlens array 4 into individual sub-beams, which are focused into an intermediate plane and then collimated again onto a second, unilaterally structured microlens array 5 and then onto a detector or on a detector array (not shown) focused.
  • a lateral beam deflection can be achieved, ie a beam deflection in a plane perpendicular to the optical axis z of the receiving device.
  • the shift takes place synchronously with the beam deflection along one of the scan axes (eg the slow scan axis).
  • a mechanical-translational tracking can also be realized with other transmissive optical elements.
  • the deflection angle ß durc h an opposite rotational movement of two transmission gratings can be changed relative to each other. It is also possible to change the deflection angle ß durc h two electronically controllable or variable transmission grating or other spatial light modulators. Since no mechanically moving parts are necessary in this case, the robustness and / or accuracy of the system can be increased.
  • FIG. 3 shows a top view of an exemplary measuring system by means of light transit time measurement, wherein the receiving beam 51 is shown for an angle of incidence of the slow scan axis y, which is substantially zero (vertical incidence).
  • Fig. 4 shows the same structure as Fig. 3, wherein the receiving beam 51 is shown for an oblique angle of incidence of the slow scan axis y.
  • FIG. 5 shows a perspective view of the measuring system shown in FIGS. 3 and 4.
  • the measuring system comprises a transmitting unit with a laser diode 1 or another suitable light source.
  • the transmitting unit may be in signal communication with a signal processing device and may be configured to convert an electrical signal generated by the signal processing device into a modulated optical signal (transmit beam).
  • the optical signal may e.g. be amplitude modulated.
  • a collimated transmission beam 50 is emitted by the laser diode 1 and deflected via a transmitter-side scanning mirror 2 within the field of view in two axes (scanning axes).
  • the transmitter-side scanning mirror 2 can be, for example, a micromechanical, electrostatically or electromagnetically driven oscillating mirror.
  • the fast scan axis (y) is a vibration about the x-axis
  • the slow scan axis (x) a vibration about the y-axis. If there is a scattering and / or reflective measurement object 3 in the field of view of the optical measurement system, a reception signal 51 is produced which strikes the tracking device.
  • the tracking device comprises the transmissive optical elements 4, 5, 6 and 7 arranged in succession in the z-direction (ie in the direction perpendicular to the x-axis and y-axis, the z-direction preferably coinciding with the optical axis of the receiving device) the arrangement of the optical elements 4, 5, 6 and 7 except for one condition may be arbitrary.
  • the condition to be met is that the receive beam 51 first strikes and passes through the two microlens arrays 4, 5 before hitting the condenser lens 7.
  • one of the two microlens arrays is structured on both sides (double-sided microlens array 4), the other one-sided (single-sided microlens array 5).
  • the two microlens arrays 4 and 5 comprise a plurality of individual microlenses, e.g. several cylindrical, lenticular, etc. microlenses.
  • the longitudinal axis of each individual microlens is substantially perpendicular to the x-direction and parallel to the y-direction.
  • the two microlens arrays 4 and 5 are arranged substantially parallel to each other and perpendicular to the optical axis z.
  • the two microlens arrays 4 and 5 are moved in synchronism with the movement of the slow scanning axis of the transmitting-side scanning mirror 2 relative to each other in the x-direction (see FIG. 4).
  • the relative movement as shown in FIG. 4, can be realized by a movement of the double-sided microlens array 4, by a movement of the single-sided microlens array 5, or by a movement of both microlens arrays 4 and 5.
  • the unilaterally structured microlens array 5 can be moved, the thickness of which can be reduced to the minimum necessary value which ensures the desired stability.
  • the limiting mechanical factor for the receive aperture is the scan frequency.
  • the receiving beam 51 After the receiving beam 51 has passed the optical filter 6, it is focused on the detector array 9 in front of the condenser lens 7 (e.g., a Fresnel lens).
  • the linear detector array 9 with the detector elements extends in the y-direction (see, e.g., Fig. 5).
  • An additional micro or lenticular lens array 8 may be positioned in front of the detector array 9 to increase the fill factor of the detector array 9 (such as shown in Fig. 6).
  • the additional microlens array 8 may be e.g. be a one-sided micro-lenticular lens array.
  • the transmissive optical filter 6 is designed to suppress unwanted wavelength ranges (such as extraneous light sources, solar radiation, etc.) of the electromagnetic spectrum and to allow the desired ranges to pass.
  • the optical filter 6 can a narrowband bandpass filter whose transmission maximum is at the wavelength of the light emitted by the laser diode 1 light. Interference filters and absorption filters can also be combined to realize narrow band filters with high optical density in the stop bands.
  • the focus of the receiving beam 51 moves on the detector array 9 due to the vibration of the fast scan axis in the y direction.
  • the detector element or the detector elements on or on which the focus of the focus is connected via a multiplexer 10 with the subsequent signal processing 1 1.
  • the multiplexer 10 may be a semiconductor-based analog multiplexer, e.g. a CMOS multiplexer, a buffered analog multiplexer or video multiplexer-amplifier.
  • the number of multiplexer stages will be kept to a minimum to reduce noise. This can be achieved by minimizing the number of detector elements, resulting in an increase in the active area of each individual detector for a given detector length and thus a reduction of the bandwidth.
  • FIG. 6 shows an exemplary single-sided microlens array 8, which can optionally be arranged in front of the detector array 9. The microlens array 8 can be used to increase the filling factor of the detector array 9.
  • Fig. 7 shows an exemplary embodiment of the microlens array 4, which has a recess. This recess can serve to position the transmission-side scanning mirror 2 in the plane of the microlens array 4.
  • a particularly compact measuring system can be realized.
  • the optical axes of Transmitter and the receiver or the transmitter-side scan or Winkelablenkvorraum and the receiving side tracking device and / or receiving device collinear.
  • the transmitter-side scanning mirror 2 is arranged next to the receiving-side tracking device (comprising the microlens arrays 4 and 5, the filter 6 and the converging lens 7).
  • the receiving-side tracking device comprising the microlens arrays 4 and 5, the filter 6 and the converging lens 7.
  • an off-axis Fresnel lens may be used as the condensing lens 7.
  • microlens arrays are used for beam deflection and thus optical tracking.
  • other transmissive optical elements such as e.g. Lenticular lens arrays or diffractive transmission gratings can be used.
  • Lenticular lens arrays or diffractive transmission gratings
  • the translational principle can be implemented in a very space-saving manner.
  • the switching of the detector elements takes place synchronously with the scanning process along one of the scanning axes.
  • a time deviation between the optimal switching time at the transition of the focus between two detector elements and the actual switching time can lead to a deterioration of the received signal.
  • This can be done by taking into account the position of the Scan mirror are minimized in the processing of the received signal generated by the detector.
  • the position of the scanning mirror can be detected, for example, by means of a suitable position sensor (which can be integrated in the scanning mirror).
  • a temporal shift of the optimal switching times for example due to temperature or humidity fluctuations, which for example slightly influence the oscillation amplitude, can be substantially compensated.
  • the beam deflection arrangement can be designed to substantially compensate for the triangulation-dependent distance-dependent displacement of the receiving beam spot or of the focus on the detector.
  • the condenser lens may be a Fresnel lens.
  • a Fresnel lens is its low weight, which is especially important for large lenses. In the mass production of plastic optics can be achieved with the injection molding technology with aspherical structures, a very low unit cost.
  • Fresnel lenses also have very small installation space requirements and can be very well integrated into favorable support concepts due to their planarity. For the production of small quantities also cutting manufacturing processes can be used.
  • a disadvantage of Fresnel lenses is the shadow areas that occur by total reflection on the sidewalls of the structures. The shadow effect can e.g. skilfully arranging the Fresnel structures, but in many cases can not be completely avoided.
  • the spot of the detector array illuminated by the receiving beam 51 preferably comprises a detector element.
  • the illuminated spot comprises a plurality of detector elements.
  • the reception power is distributed in this case to two or more detector elements and is reduced. This usually leads to a reduction of the signal-to-noise ratio.
  • FIG. 9 schematically shows the diffraction of light at a transmission grating 12.
  • the grating is a blazed grating.
  • Such grids diffract the light substantially into a diffraction order and have a high diffraction efficiency. It is also possible to use other grids, but they have clutter and are less efficient.
  • the lattice diffraction can be described vectorially with the wave vector concept.
  • the diffraction at the grating adds to the wave vector of the incident wavefront k in e in
  • equation (6) denote:
  • k in ⁇ de n Wave vector of the incident wavefront
  • g ⁇ de n Gittevektor
  • p the period of the grid
  • ⁇ is the wavelength of the incident light.
  • the 10 shows an exemplary beam deflection arrangement comprising two counter-rotating transmission gratings 13 and 14.
  • the grids 13 and 14 are blazed gratings.
  • the grating vectors of the transmission gratings 12 and 14 are each g x and g 2 -

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Electromagnetism (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

L'invention concerne un système de mesure optique et un procédé de mesure d'objets à mesurer et/ou d'agencements d'objets à mesurer, en particulier d'objets à mesurer tridimensionnels et/ou d'ensembles tridimensionnels d'objets à mesurer. Le système de mesure optique comporte au moins une source de lumière pour l'émission d'un rayon d'émission (50), un dispositif de balayage ou de déflection angulaire pour le balayage d'un objet à mesurer (3) avec le rayon d'émission (50) le long de deux axes de balayage, un système de réception permettant la détection d'au moins une partie de la lumière du rayon d'émission réfléchie et/ou diffusée par l'objet à mesurer (51) et permettant la génération d'au moins un signal de réception, le système de réception comprenant au moins un détecteur ou un réseau de détecteurs (9) ; un dispositif de suivi permettant le suivi de la lumière du rayon d'émission (51) réfléchie et/ou diffusée par l'objet à mesurer (3) en direction du système de réception, le premier des deux axes de balayage étant suivi de manière optique tandis que le second axe de balayage l'est de manière électronique ; et un système de traitement de signaux permettant le traitement du ou des signaux de réception pour obtenir des informations sur la distance en différents points de mesure de l'objet à mesurer (3) et/ou sur la réflectivité en différents points de mesure de l'objet à mesurer (3). Le dispositif de suivi comporte un ensemble de déflection de rayon optique transmissif (4, 5) qui est conçu pour dévier la lumière du rayon d'émission (51) réfléchie et/ou diffusée par l'objet à mesurer (3) en direction du système de réception en synchronisme avec l'opération de balayage dans le premier axe de balayage ; et un élément optique imageur (7) qui est conçu pour reproduire la lumière propagée à travers l'ensemble de déflection de rayon (4, 5) sur le détecteur ou sur le réseau de détecteurs (9). Le dispositif de suivi est en outre conçu pour mettre sous tension des sous-zones différentes du détecteur ou du réseau de détecteurs (9) en synchronisme avec l'opération de balayage dans le second axe de balayage, chaque sous-zone mise sous-tension étant en liaison de signal avec le système de traitement de signaux.
PCT/EP2017/000271 2016-02-29 2017-02-28 Système de mesure optique mécaniquement robuste au moyen d'une mesure de propagation de lumière et/ou de réflectivité WO2017148583A1 (fr)

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