WO2017143917A1

WO2017143917A1 - Noise generator, method for testing electronic device using the same, and storage medium

Info

Publication number: WO2017143917A1
Application number: PCT/CN2017/073405
Authority: WO
Inventors: 马光明; 於明剑
Original assignee: 中兴通讯股份有限公司
Priority date: 2016-02-24
Filing date: 2017-02-13
Publication date: 2017-08-31
Also published as: CN107121575A

Abstract

A noise generator for testing an electronic device, a method for testing the electronic device using the noise generator, and a computer storage medium storing computer-executable instructions for executing the method for testing the electronic device using the noise generator. The noise generator comprises: a noise generating module (200), configured to generate a test noise; a noise output terminal (201), connected to the noise generating module (200) and configured to output the test noise to an output voltage trimming pin (101), such that a power supply module adjusts an output voltage of a power supply output terminal (102) according to the test noise. The method for testing electronic devices using the noise generator, comprising: receiving an adjustment instruction from a user, and adjusting a type (301, 401) of the test noise outputted by the noise output terminal (201) according to the adjustment instruction; and inputting the test noise to the power supply module by means of the output voltage trimming pin (101), such that a ripple noise (302, 402) is generated at the power supply output terminal (102). The noise generator is capable of enabling the power supply module to generate an effective ripple noise at the power supply output terminal (102).

Description

Noise generator, method and storage medium using the same for testing electronic equipment

Technical field

The present invention relates to the field of electronic device testing technology, and more particularly to a noise generator for electronic device testing, a method for testing the same using the same, and a computer storage medium.

Background technique

When testing electronic equipment, by changing the circuit parameters, it can provoke design defects that cannot be stimulated by the traditional high-acceleration life test. In particular, changing the ripple noise of the power supply module can stimulate the deeper tolerance of the electronic equipment. Design hazards such as insufficient degrees or poor signal integrity. When the power module generates ripple noise at the power output end, the noise generator generally inputs test noise to the power module through the power output end of the power module, so that the power module generates a pattern that can be applied to the electronic device at the power output end. Wave noise. The main problem with this approach is that the output capability of the noise generator is limited, and the output power of the power module is generally large and the impedance is relatively low, which causes the maximum output of the noise generator to be difficult to make the power module output at the power supply. Generates effective ripple noise at the ends.

Summary of the invention

Embodiments of the present invention provide a noise generator for testing electronic devices, a method for testing the same using the same, and a computer storage medium. It is desirable to solve the problem that the existing noise generator cannot be used when the output power of the power module is large and the impedance is low. A problem that produces effective ripple noise at the output of the power supply.

In a first aspect, a noise generator for testing electronic equipment is provided, the noise generator package a noise generating module configured to generate test noise; a noise output coupled to the noise generating module configured to output test noise to the output voltage trimming pin,

The test noise outputted to the electronic device is used to provide a basis for the power module of the electronic device to adjust the output voltage of the power output.

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Optionally, the noise generator further includes: a noise feedback input terminal connected to the noise generating module; wherein the noise feedback input end is connected to the power output end, so that the noise generator receives the pattern at the power output end from the noise feedback input end Wave noise, and adjust the test noise output from the noise output according to ripple noise.

In a second aspect, a method for testing an electronic device by using the above-mentioned electronic device noise generator is provided, the method comprising: receiving an adjustment instruction of a user, and adjusting an output of the noise output end of the noise generator of the electronic device test according to the adjustment instruction Testing the type of noise; inputting test noise into the power module through a voltage trimming pin of the output electronics such that ripple noise is generated at the power output of the electronic device.

Optionally, after the step of inputting the test noise into the power module by the output voltage trimming pin, so that the ripple noise is generated at the power output, the method further comprises: obtaining the amplitude of the ripple noise, and according to the ripple noise The amplitude adjusts the amplitude of the test noise such that the amplitude of the ripple noise matches the preset amplitude.

Optionally, the amplitude of the ripple noise is obtained, and the amplitude of the test noise is adjusted according to the amplitude of the ripple noise, so that the amplitude of the ripple noise matches the preset amplitude, including: detecting ripple noise; detecting ripple The noise is subjected to analog-to-digital conversion and digital signal processing to obtain the amplitude of the ripple noise; the amplitude of the test noise is adjusted according to the amplitude of the ripple noise, so that the amplitude of the ripple noise matches the preset amplitude.

Optionally, before the step of obtaining the amplitude of the ripple noise and adjusting the amplitude of the test noise according to the amplitude of the ripple noise, so that the amplitude of the ripple noise matches the preset amplitude, the method further includes Including: obtaining the amplitude of the ripple noise at the desired power output of the user input and saving it as a preset amplitude.

The embodiment of the invention further provides a computer storage medium, wherein the computer storage medium stores computer executable instructions, and the computer executable instructions are used to execute the foregoing method for testing an electronic device.

In the embodiment of the present invention, the noise output end of the noise generator of the electronic device test inputs the test noise into the power module through the output voltage trimming pin, so that the power module receives the test noise outputted by the noise generator from the output voltage trimming pin. The power supply voltage output from the power supply output is adjusted according to the test noise. Thereby, an effective ripple noise that can be applied to the electronic device to be tested is generated at the power output of the power module.

DRAWINGS

1 is a schematic structural diagram of a first noise generator for testing an electronic device according to an embodiment of the present invention;

2 is a schematic structural diagram of a second noise generator for testing an electronic device according to an embodiment of the present invention;

FIG. 3 is a schematic flowchart diagram of a first method for testing an electronic device according to an embodiment of the present disclosure;

FIG. 4 is a schematic flowchart diagram of a second method for testing an electronic device according to an embodiment of the present invention.

[Main reference mark description]

101: output voltage trimming pin, 102: power output, 200: noise generating module,

201: noise output, 202: noise feedback input.

detailed description

The technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. It should be understood that the preferred embodiments described below are only for The invention is not intended to limit the invention.

Please refer to FIG. 1. FIG. 1 is a structural diagram of a noise generator for testing an electronic device according to an embodiment of the present invention. The specific structure includes:

a noise generating module 200 configured to generate test noise; and a noise output terminal 201 configured to output test noise to the noise generating module 200; wherein the noise output terminal 201 is connected to the output voltage trimming pin 101 of the power module of the electronic device, The output voltage trimming pin 101 inputs test noise into the power module; since a different voltage or a different resistor is applied to the output voltage trimming pin 101 to cause a change in the output voltage of the power supply terminal 102 of the power module, when the power is supplied When the module receives test noise from the output voltage trimming pin 101, the power supply voltage output from the power supply output 102 can be adjusted based on the test noise to generate ripple noise at the power supply output 102. In this case, the ripple noise generated by the power output terminal 102 is substantially equivalent to the ripple noise generated by the power module according to the test noise output by the noise generator. During the process of outputting ripple noise, the power module will process the smaller test noise input to the voltage trimming pin, and then obtain the final test noise with large amplitude variation, for example, the ripple noise. The power output terminal 102 adjusts the output power voltage according to the test noise outputted by the voltage trimming pin 101. The test noise outputted by the voltage trimming pin 101 is the basis for adjusting the power supply voltage of the power output terminal 102.

In this embodiment, the noise output end of the noise generator is connected to the output voltage trimming pin of the power module, and the test noise is input into the power module through the output voltage trimming pin, so that the power module receives noise from the output voltage trimming pin. The test output noise is measured, and the power supply voltage output from the power supply output is adjusted according to the test noise. Thereby, an effective ripple noise that can be applied to the electronic device to be tested is generated at the power output of the power module.

Referring to FIG. 2, FIG. 2 is a structural diagram of a noise generator for testing an electronic device according to another embodiment of the present invention. The specific structure includes:

a noise generating module 200 configured to generate test noise; a noise output terminal 201 for outputting test noise is connected to the noise generating module 200; wherein the noise output terminal 201 is connected to the output voltage trimming pin 101 of the power module of the electronic device, The output voltage trimming pin 101 inputs test noise into the power module; since the power module output voltage changes by applying different voltages or different resistors on the output voltage trimming pin 101, when the power module is fine-tuned from the output voltage When the pin 101 receives the test noise, the power supply voltage output from the power supply output 102 can be adjusted according to the test noise to generate ripple noise at the power supply output 102.

In addition, in the embodiment, the noise generator further includes a noise feedback input terminal 202 connected to the noise generating module 200, wherein the noise feedback input terminal 202 is connected to the power output terminal 102 of the power module, and the noise generator is input from the noise feedback. The terminal 202 receives the ripple noise at the power supply output 102 of the power module and adjusts the test noise output by the noise output 201 in accordance with the ripple noise. In this way, the noise generator can detect the ripple noise at the power output end 102 of the power module, that is, the ripple noise input from the power module to the electronic device, and adjust the output test noise according to the detection result, thereby ensuring The accuracy of the ripple noise input to the electronic device.

In this embodiment, the noise output end of the noise generator inputs the test noise to the power module through the output voltage trimming pin of the power module, so that the power module receives the test noise output by the noise generator from the output voltage trimming pin, and according to the test. The noise adjusts the power supply voltage outputted from the output of the power supply; and the noise generator can receive the ripple noise at the output of the power supply through the noise feedback input, and adjust the test noise of the output according to the ripple noise, thereby making the power output of the power module At the end, effective ripple noise that can be applied to the electronic device to be tested is generated, and the accuracy of the ripple noise applied to the electronic device can be effectively ensured.

Please refer to FIG. 3. FIG. 3 is a flowchart of a method for testing an electronic device according to still another embodiment of the present invention. The specific steps are as follows:

Step 301: Receive an adjustment instruction of the user, and adjust a type of test noise output by the noise output end according to the adjustment instruction.

It should be noted that since the noise generator is required to output a specific type of noise when testing the electronic device, the type of test noise outputted from the noise output terminal needs to be adjusted during the test so that the noise generator outputs the correct type of test. noise.

Step 302: Input test noise into the power module through the output voltage trimming pin, so that ripple noise is generated at the power output.

It should be noted that since the power module output voltage changes by applying different voltages or different resistors on the output voltage trimming pins, when the power module receives the test noise output from the noise generator from the output voltage trimming pin. Ripple noise is generated at the output of the power supply.

The implementation receives the adjustment instruction of the user, and adjusts the type of test noise outputted by the noise output terminal according to the adjustment instruction; the test noise is input into the power module through the output voltage trimming pin, so that ripple noise is generated at the power output end. It effectively ensures that ripple noise that can be applied to the electronic device to be tested is generated at the power output.

Please refer to FIG. 4. FIG. 4 is a flow chart showing a method for testing an electronic device according to an embodiment of the present invention. The specific steps are as follows:

Step 401: Receive an adjustment instruction of the user, and adjust a type of test noise output by the noise output end according to the adjustment instruction.

Step 402: Input test noise into the power module through the output voltage trimming pin, so that ripple noise is generated at the power output.

It should be noted that since the power module output voltage changes by applying different voltages or different resistors on the output voltage trimming pins, when the power module receives the test noise output from the noise generator from the output voltage trimming pin. Will generate ripple at the output of the power supply noise.

Step 403: Acquire the amplitude of the ripple noise at the desired power output of the user input and save it as a preset amplitude.

It should be noted that the user can input a ripple noise amplitude expected to be obtained at the power output when performing the test, that is, the amplitude of the ripple noise expected to be input to the electronic device to be tested, and the amplitude is used as a preset. The amplitude is saved.

In step 404, the amplitude of the ripple noise is obtained, and the amplitude of the test noise is adjusted according to the amplitude of the ripple noise, so that the amplitude of the ripple noise matches the preset amplitude.

It should be noted that step 404 specifically detects the ripple noise at the output end of the power supply; then performs analog-to-digital conversion and digital signal processing on the detected ripple noise to obtain the amplitude of the ripple noise; The amplitude of the noise adjusts the amplitude of the test noise such that the amplitude of the ripple noise matches the preset amplitude. The accuracy of the ripple noise input to the electronic device to be tested can be effectively ensured by step 404.

In this embodiment, the type of test noise outputted by the noise output terminal is adjusted by receiving an adjustment instruction of the user, and the test noise is input into the power module through the output voltage trimming pin, so that ripple noise is generated at the power output end. Obtaining the amplitude of the ripple noise at the desired power output of the user input and saving it as a preset amplitude; obtaining the amplitude of the ripple noise, and adjusting the amplitude of the test noise according to the amplitude of the ripple noise, so that the ripple noise The magnitude of the match matches the preset amplitude. It effectively ensures that ripple noise that can be applied to the electronic device to be tested is generated at the power output end, and the accuracy of the ripple noise is ensured.

The embodiment of the present invention further provides a computer storage medium, where the computer storage medium stores computer executable instructions, and the computer executable instructions are used to execute one or more of the foregoing methods for testing an electronic device, and The method shown in Figure 3 or Figure 4.

The computer storage medium provided by the embodiment of the present invention may be a random storage medium or a read-only storage medium, a flash memory, an optical disk, or a DVD, and the like, and may be a non-transitory storage medium.

It is to be understood that the term "comprises", "comprising", or any other variants thereof is intended to encompass a non-exclusive inclusion, such that a process, method, article, or terminal device that includes a series of elements includes not only those elements And also includes other elements not explicitly listed, or elements that are inherent to such a process, method, item, or terminal device. An element defined by the phrase "comprising a ..." does not exclude the presence of additional identical elements in the process, method, article, or terminal device that comprises the element, without further limitation.

The above is only the specific embodiment of the present invention, but the scope of the present invention is not limited thereto, and modifications made in accordance with the principles of the present invention should be understood as falling within the scope of the present invention.

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Claims

A noise generator for testing electronic equipment, the noise generator comprising:

a noise generating module configured to generate test noise;

a noise output terminal coupled to the noise generating module, configured to output the test noise to an output voltage trimming pin of the electronic device, wherein the test noise output to the electronic device is used for the electronic device The power module provides a basis for adjusting the output voltage at the output of the power supply.
The noise generator of claim 1 wherein said noise generator further comprises: a noise feedback input coupled to said noise generating module;

Wherein the noise feedback input is connected to the power output, such that the noise generator receives ripple noise at the power output from the noise feedback input, and adjusts according to the ripple noise The test noise output from the noise output.
A method for testing an electronic device using a noise generator for testing an electronic device according to claim 1 or 2, comprising:

Receiving an adjustment instruction of the user, and adjusting a type of test noise output by the noise output end of the noise generator of the electronic device test according to the adjustment instruction;

The test noise is input into a power module of the electronic device through an output voltage trimming pin of the electronic device such that ripple noise is generated at a power output of the electronic device.
The method of claim 3, wherein said testing noise is input into a power module of said electronic device through an output voltage trimming pin of said electronic device such that said power output of said electronic device After the step of generating ripple noise, the method further includes:

Obtaining an amplitude of the ripple noise, and adjusting an amplitude of the test noise according to the amplitude of the ripple noise such that the amplitude of the ripple noise matches a preset amplitude.
The method of claim 4, wherein said obtaining an amplitude of ripple noise and adjusting an amplitude of said test noise according to an amplitude of said ripple noise such that said amplitude of said ripple noise is different from a preset amplitude Matches, including:

Detecting the ripple noise;

Performing analog-to-digital conversion and digital signal processing on the detected ripple noise to obtain the amplitude of the ripple noise;

The amplitude of the test noise is adjusted according to the amplitude of the ripple noise such that the amplitude of the ripple noise matches a preset amplitude.
The method of claim 4, wherein said obtaining an amplitude of ripple noise and adjusting an amplitude of said test noise according to an amplitude of said ripple noise such that said amplitude of said ripple noise is different from a preset amplitude Before the step of matching, the method further includes:

Obtaining a desired amplitude of ripple noise at the power output of the user input and saving as the preset amplitude.
A computer storage medium having stored therein computer executable instructions for performing the method of any one of claims 3 to 6.