WO2017046340A1 - Dispositif et procédé permettant de visualiser un repère sur un verre de lunettes visible - Google Patents

Dispositif et procédé permettant de visualiser un repère sur un verre de lunettes visible Download PDF

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Publication number
WO2017046340A1
WO2017046340A1 PCT/EP2016/071990 EP2016071990W WO2017046340A1 WO 2017046340 A1 WO2017046340 A1 WO 2017046340A1 EP 2016071990 W EP2016071990 W EP 2016071990W WO 2017046340 A1 WO2017046340 A1 WO 2017046340A1
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WO
WIPO (PCT)
Prior art keywords
optical axis
optical
image sensor
optical element
lens
Prior art date
Application number
PCT/EP2016/071990
Other languages
German (de)
English (en)
Inventor
Roland Schoen
Original Assignee
Carl Zeiss Vision International Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss Vision International Gmbh filed Critical Carl Zeiss Vision International Gmbh
Publication of WO2017046340A1 publication Critical patent/WO2017046340A1/fr

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02C—SPECTACLES; SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURES AS SPECTACLES; CONTACT LENSES
    • G02C13/00—Assembling; Repairing; Cleaning
    • G02C13/003—Measuring during assembly or fitting of spectacles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
    • G—PHYSICS
    • G02—OPTICS
    • G02C—SPECTACLES; SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURES AS SPECTACLES; CONTACT LENSES
    • G02C7/00—Optical parts
    • G02C7/02—Lenses; Lens systems ; Methods of designing lenses
    • G02C7/021—Lenses; Lens systems ; Methods of designing lenses with pattern for identification or with cosmetic or therapeutic effects

Definitions

  • the invention relates to a device for visualizing a Signier Hils or optical defects on an optical element, in particular a spectacle lens. Furthermore, the present invention relates to a method for visualizing a sign or optical defects on an optical element, in particular a spectacle lens.
  • Eyeglass lenses especially so-called.
  • Progressive lenses are provided with markings whose position is detected and processed during the production of the spectacle lens to stretch the lens in the correct position, edit, stamp and finally bring in the glasses of the end user.
  • Signing marks are aimed at spectacle lenses and Permanently attached by diamond trimming, by molding when casting plastic lenses or by laser marking.
  • the document DE 103 33 426 A1 shows a method for visualizing a
  • the retroreflector should as possible a movement in the manner of a parallel rotational translation, for example on a cycloidal track. Such movements, however, are difficult to balance, especially if they are to be designed with a high frequency, so that the expenditure on equipment is very great.
  • Visualizing a sign on a spectacle lens wherein an illuminating light beam is directed to the spectacle lens, which hits the spectacle lens, is reflected after striking the spectacle lens on a reflector designed as a retroreflector, as the observation beam again meets the spectacle lens and finally a camera is fed, wherein a reflection region of the illumination light beam is varied on the reflector by means of a moving first optical element, wherein the illumination light beam after the spectacle lens meets the first optical element.
  • imaging methods and devices are for visualizing signing but also for the inspection of defects such as streaks, scratches, etc. on optical, that is transparent components, such as eyeglass lenses applicable.
  • a component which is optically active in transmitted light in particular a spectacle lens, is imaged, without the image being distorted by the action of the optical element.
  • the illumination is usually carried out with an incident to an optical axis of the lens incident light. Therefore, it can happen in the recorded images that a reflection of the built-in lighting device light source, such as an LED (light emitting diode), is visible. This reflex can be particularly disturbing in the context of an inspection of the test specimen.
  • the invention is therefore the object of developing methods and devices of the type mentioned in such a way that the disadvantages mentioned are avoided. All this should be done with the simplest possible apparatus and procedural means.
  • the device further comprises an image sensor for receiving an image of the optical element Imaging optics for imaging the optical element on the image sensor, wherein the imaging optics has at least one lens element with an optical axis and / or a plurality of lens elements, which are arranged one behind the other along a common optical axis, has a retroreflector and a lighting device for providing a reflected light illumination, wherein the support area is arranged outside the optical axis.
  • the optical axis or common optical axis can be an imaging beam path of a light beam emitted by the illumination device, which would pass through the at least one lens element or the plurality of lens elements without being deflected.
  • a method of visualizing a sign or an optical defect of an optical element in particular a spectacle lens, in which the optical element is illuminated by means of a beam of reflected light illumination impinging on the optical element is reflected on the optical element at a retroreflector, as an observation beam again encounters the optical element, and is finally fed by an imaging optical system to an image sensor, the imaging optics having at least one lens element with an optical axis and / or a plurality of lens elements, which are arranged behind one another along a common optical axis, and wherein the optical element is arranged outside the optical axis.
  • the optical axis or common optical axis can be an imaging beam path of a light beam emitted by the illumination device, which would pass through the at least one lens element or the plurality of lens elements without being deflected.
  • the optical element to be inspected is the imaging one
  • the image of a light source, in particular an LED resulting reflexes can be avoided become, if at least the optical element to be checked outside the optical axis of the imaging optics is arranged.
  • the image sensor can therefore also be arranged outside the optical axis. The reversal of the figure is to be observed, as will be explained below.
  • optical axis denotes an imaging beam path of a light beam emitted by the illumination device, which would pass through a lens element without deflection.
  • the optical axis is therefore perpendicular to the two optical surfaces of the lens element. Consequently, it is provided that a light beam emitted by the illumination device, which would pass undisturbed through the at least one lens element and / or the plurality of lens elements, would have an imaging beam path along the optical axis or the common optical axis.
  • the imaging beam path is the beam path from an object to its image, in particular from an object point to be imaged to the resulting image point, for example from the sample holder to its image.
  • An imaging optics or a lens has at least one lens element, often
  • the at least one or the plurality of lens elements referred to in the preceding invention is typically configured with spherical front and back surfaces. These lens elements are generally rotationally symmetric. Thus, a vertex of the front and back surfaces of these lens elements lies on the rotational symmetry axis, which is then also the optical axis.
  • This type of lens element has a common optical axis in imaging optics. Along the lens elements are arranged one behind the other.
  • the imaging optics further comprise, for example, still a reflective optical element or a refractive optical element having a front and / or rear surface configuration in which each light beam is deflected and therefore considered isolated this optical element strictly speaking has no optical axis, this is negligible when considering an entire imaging optics. Therefore, in the present case, the optical axis is defined by means of the imaging beam path of that light beam which passes through or passes through the at least one lens element and / or the plurality of lens elements without being deflected. For example, since the optical element is disposed off the optical axis, this imaging beam path may be assumed to be from the sample holder when illuminated by the illumination device.
  • the beam of reflected light illumination or incident light illumination may be at least partially coaxial or coaxial with the optical axis.
  • coaxial means that a portion of the beam is aligned coaxially with the optical axis.
  • the beam runs in the center or on the rotational symmetry axis of the beam cone coaxially to the optical axis.
  • the beam is in the center coaxial with the optical axis.
  • the illumination light beam thus initially impinges on the spectacle lens, wherein the illumination light beam is then transmitted by it or can pass through it or can be reflected by it.
  • the term "impact” can thus be understood as “transmitting or reflecting”.
  • the illuminating light beam strikes the first optical element.
  • the first optical element can also pass through the illumination light beam or can be transmitted by it or reflected by it.
  • the illuminating light beam is reflected by the retroreflector.
  • the proposed method and the proposed device can thus be provided in a transmissive or a reflective structure. In the transmissive structure, the illumination light beam passes through the spectacle lens and passes through it again as an observation light beam.
  • the illumination light beam is reflected by the spectacle lens, in particular its surface facing away from the illumination light source, and reflected again by the spectacle lens as an observation light beam.
  • the first optical element is then arranged on the first side of the spectacle lens. It is important to ensure compliance with the Scheimpflug condition. If the Scheimpflug condition is adhered to, the image plane and the lens plane or objective main plane of the camera and the focal plane intersect in a straight line. The focal plane would be the nominal plane of the spectacle lens in the case of the reflective structure. Therefore, the camera, the retroreflector and the spectacle lens, or a nominal plane of the spectacle lens, are to be arranged in such a way that the Scheimpflug condition for the imaging of the spectacle lens in the camera is fulfilled. Then a sharp image of the nominal plane of the lens takes place.
  • the reflection area When the reflection area is moved on the reflector, a homogeneous background is created, from which the signing marks are much clearer and therefore more contrasting.
  • the spectacle lenses to be tested appear uniformly bright during the measurement.
  • the edges of the marking marks show such a strong scattering that the scattered light no longer satisfies the retroreflective condition, with the result that the signing marks appear dark on a light background.
  • the "sign marks" are irregularly applied irregularities of the spectacle lens, for example streaks in the glass material or plastic, then they can be made visible by means of the proposed method and the proposed device and thus the spectacle lens can be checked for its quality.
  • the imaging optics has a plurality of lens elements which are arranged one behind the other along a common optical axis.
  • the imaging optics may comprise a plurality of lens elements arranged one behind the other along the optical axis, wherein the optical axis is a common optical axis of the plurality of lens elements.
  • the support area has a recess and an edge region surrounding the recess.
  • the optical element can be arranged lying over the recess and on the edge region.
  • This transmissive structure requires the presence of a recess through the sample holder. Based on this recess, the support area is identifiable.
  • the edge area around the recess may, for example, be 1 mm, 2 mm, 3 mm, 4 mm, 5 mm, 6 mm, 7 mm, 8 mm, 9 mm, 10 mm wide.
  • the edge region may have a width of 1 to 10 mm.
  • Lighting device is coupled by means of a beam splitter to the optical axis.
  • a camera with image sensor is usually arranged vertically above the sample holder together with the imaging optics. Laterally offset, the illumination device can thus be provided and coupled in by means of a beam splitter between the imaging optics and the sample holder. Furthermore, a beam trap arranged opposite the illumination device can be provided. In this way, an illumination beam path can be coupled coaxially to the optical axis.
  • the central beam that is to say the axis of rotational symmetry of the cone, extends coaxially to the optical axis.
  • Lighting device has at least one LED as a light source.
  • Image sensor is arranged outside the optical axis. Since the support portion is disposed outside the optical axis, accordingly, an image sensor outside the optical axis is sufficient. With regard to the optical axis, the image sensor must be arranged correspondingly opposite the support area. In this way, furthermore, reflections along the optical axis, which would otherwise hit the image sensor, can be reliably avoided.
  • Image sensor is arranged with respect to the optical axis opposite to the support area.
  • the support area with the optical element arranged thereon can be reliably imaged on the image sensor by means of the imaging optics.
  • Image sensor is arranged such that a central axis of the image sensor is coaxial with the optical axis.
  • the "center axis" is to be understood as an axis perpendicular to a surface of the individual sensor elements of the image sensor. This center axis extends through a centroid of a surface formed by the individual sensor elements of the image sensor. In the case of a rectangular arrangement of the sensor elements of the image sensor, the central axis thus runs perpendicular to the sensor surface through the intersection of the diagonal of the rectangle.
  • the image sensor may be, for example, a CCD (charge-coupled device) sensor.
  • Retroreflector is rotatable about an axis of rotation.
  • the device may further comprise a drive device for rotating the retroreflector.
  • Rotation axis coaxial with the optical axis.
  • the axis of rotation extends outside the optical axis.
  • the axis of rotation is arranged coaxially to the optical axis, this has the consequence that, for example, in the transmissive structure, a region of the retroreflector is illuminated and used for reflection on which a path velocity is relatively high. Areas of low web speeds, in which contaminants and / or defects of the retroreflector can influence despite the rotation, such as near the axis of rotation, are not used.
  • the rotation axis can also be arranged outside the optical axis. For example, in this way a space-saving design can be brought about and / or a retroreflector with a smaller size can be used.
  • the retroreflector is fixed.
  • the retroreflector may also be arranged fixed. For example, then a drive device for moving the retroreflector can be avoided.
  • a movable optical element between the sample holder and the retroreflector is arranged.
  • the illumination beam path and / or the observation beam path extend through this optical element.
  • the influence of dirt, damage and / or a structure of the retroreflector can also be avoided in this way with a fixed retroreflector.
  • Device further comprises a housing in which the image sensor is arranged, wherein the housing has a connection opening for coupling the housing to the imaging optics.
  • connection provides a defined connection for an imaging optics or a lens.
  • An example of such a connection is also known as "C-mount”.
  • connection opening in the housing is arranged such that a central axis of the image sensor extends outside the optical axis of the imaging optics.
  • the center of the image sensor is usually on the optical axis of the imaging optics.
  • the structure provided in one embodiment of the invention is possible, for example, using a so-called “board level camera".
  • a "board level camera” has a printed circuit board on which the image sensor and the necessary for its operation control and evaluation electronics are mounted.
  • Such a "board level camera” can be installed in a suitable housing, which is designed with a lens connection described above with lateral offset to the image sensor.
  • the imaging optics has a plurality of lens elements which are arranged one behind the other along a common optical axis.
  • the imaging optics may comprise a plurality of lens elements arranged one behind the other along the optical axis, wherein the optical axis is a common optical axis of the plurality of lens elements.
  • the image sensor is arranged outside the optical axis. Furthermore, it can be provided in one embodiment of the method that the image sensor is arranged with its central axis coaxial with the optical axis and only partially read.
  • FIG. 1 shows a conventional construction of a device in the transmissive structure and with a rotating retroreflector
  • FIG. 3 shows a conventional construction of a device in the reflective construction and with a fixed retroreflector
  • FIG. 5 shows an embodiment of a device according to the invention
  • Fig. 6 shows a schematic representation of the structure of a camera
  • Fig. 7 shows a schematic embodiment of an alternative embodiment
  • Fig. 8 shows a schematic flow diagram of an embodiment
  • Fig. 1 shows a conventional apparatus for recognizing Signier Hil or optical
  • the device is designated overall by the reference numeral 1.
  • the device 1 has a sample holder 12 in which a recess 14
  • an optical element 16 in the present case a spectacle lens, is arranged, which is to be examined.
  • the spectacle lens 16 has a sign 18, which is to be read.
  • At least one LED as
  • the optical element 16 is illuminated. This is illustrated by an illumination beam path 22.
  • An optical axis of an imaging optics (not shown in detail in FIG. 1) of a camera 36 is designated schematically by the reference numeral 21.
  • the illumination beam path 22 is thus coupled onto the optical axis 21.
  • a beam trap 26 is provided, which catches radiation passing through the beam splitter 24.
  • the illumination beam path 22 then impinges on the optical element 16, passes therethrough and falls on a retroreflector 30.
  • the retroreflector has, for example, a plurality of intensity mirrors 32.
  • the retroreflector provides such that light incident on it falls back at the same angle.
  • the light passes as an observation beam path 34 again through the optical element 16, through the beam splitter 24 and incident on the camera 36th
  • a motor device 38 which via a fastening device 37 with the
  • Retroreflector 30 is coupled, rotates this in a direction schematically indicated 39th
  • An evaluation and control device 40 evaluates the images recorded by the camera 36 and controls the individual elements of the device 1, for example the motor device 38.
  • Fig. 2 a slightly modified, also known construction is shown. The same elements are designated by the same reference numerals and will therefore not be explained again.
  • the retroreflector 30 is fixedly arranged.
  • a further optical element 42 is provided, in this case a prism.
  • the further optical element 42 is held in a mounting device 44, which in turn is coupled via the device 37 with a motor device 38. In this way, the further optical element 42 can be rotated. Also in this way it is possible to vary on the fixed retroreflector 30, the reflection range.
  • this embodiment has the same operation as the embodiment of FIG. 1.
  • FIG. 3 shows another possible known embodiment.
  • This embodiment is the modification of the embodiment of FIG. 2 in a reflective structure.
  • no transmissive structure is used to read out the sign 18, but a reflective structure.
  • this may be advantageous under some circumstances.
  • the operation of the embodiment of FIG. 2 corresponds.
  • FIGS. 4a and 4b show examples of image recordings in conventional
  • the optical element 16 can be easily recognized in each case. In the case of FIG. 4b, it is an optical element 16 with a near portion 48. Furthermore, a reflection point 46 that results from an LED as the light source of the illumination device 20 can be clearly seen. Under certain circumstances can This reflection point 46 lead to problems when just at the point of the reflection point 46, an optical defect of the optical element 16 is present. In this respect, such a reflection point 46 should be avoided.
  • FIG. 5 shows an embodiment of a device 10 according to the invention
  • the device 10 has an imaging optical system 50.
  • the imaging optics 50 has an imaging optical system 50.
  • the point 46 lies on the sample holder 12. If the point 46 were illuminated by the illumination device, the light beam emitted by the illumination device at the point 46 would, after being reflected in the point 46, pass through the lens elements 51, 52 without being deflected. The imaging beam path starting from this point 46, which would pass through the lens elements 51, 52 without being deflected, is consequently the optical axis 21.
  • the optical elements 51, 52 are arranged one behind the other along a common optical axis 21.
  • the illumination beam path 22 of the illumination device 20, which has at least one LED 73, is provided as reflected-light illumination and is coupled onto the optical axis 21 by means of the beam splitter 24.
  • the beam of the illumination beam path 22 can be collimated and then provided in particular with a constant cross section. However, it can also be a conical bundle of rays as shown schematically. A center beam or the rotational symmetry axis of the provided beam can then extend coaxially with respect to the optical axis 21.
  • a lighting is provided in such a way that no rotationally symmetrical beam of rays of the illumination beam path 22 is provided.
  • a beam of the illumination beam path 22 can be shaped in such a way that that, in particular substantially, only one support region 69 of the sample holder 12 is illuminated.
  • the sample holder 12 has the support region 69.
  • the support region 69 has, in particular, the recess 14 and an edge region 68 surrounding the recess 14. This edge area can be 1 to 10 mm wide.
  • the support region 69 is located outside the optical axis 21.
  • the optical element 16 is arranged outside the optical axis 21. In this way it is avoided that a reflection on the optical element 16 or a scattering on a surface of the optical element 16 enters the imaging optical system 50.
  • the sample holder 12 may in particular be formed from a material or be provided with a coating which has a very low reflection coefficient. Thus, a reflection from the sample holder 12, which is designated schematically by the reference numeral 58, can be avoided.
  • a camera 36 is provided.
  • the camera 36 has a housing 54.
  • an image sensor 56 is provided, for example a CCD array. This image sensor 56 is also disposed outside the optical axis 21. Due to the imaging properties of the imaging optics 50, the image sensor 56 is arranged opposite the support region 69 and thus of the optical element 16 with respect to the optical axis 21.
  • the support region 69 or the optical element 16 is imaged on the image sensor 56 by means of the imaging optics 50.
  • the rotation of the retroreflector 30 takes place about the rotation axis 75. This is arranged outside the optical axis 21. in principle however, it may also be provided to arrange the rotation axis 75 coaxially with the optical axis 21 in order to arrange regions of higher path velocity of the retroreflector 30 in an impact area of the radiation passing through the optical element 16.
  • the image sensor 56 is arranged with respect to the optical axis 21 such that the optical element is imaged on it.
  • the support region 69 has the recess 14 and the edge region 68.
  • the edge region 68 or the support region 69 is then spaced by a distance designated by the reference numeral 70 from the optical axis 21.
  • the distance 70 may be about 1 mm to 10 mm.
  • the camera 36 has a housing 54.
  • the housing 54 has a connection opening 64 for attaching the imaging optics 50.
  • the image sensor 56 is arranged in a stationary manner in the optical housing 54 on a sensor board 60.
  • a connection 62 for input and / or output signals or for connection to the evaluation and control device 40 may be provided.
  • a central axis of the image sensor 56 is designated by the reference numeral 66.
  • this central axis 66 is perpendicular to the sensor surface at the intersection of the diagonal of the rectangle. As can be seen, this central axis 66 lies outside the optical axis 21. This is ensured by a corresponding laterally offset connection opening 64.
  • the central axis 66 is arranged coaxially with the optical axis 21. In this way, for example, a conventional structure in a camera 26 can be maintained. It can then be provided to read only one read-out region 72, in which an image of the support region 69 or of the optical element 16 takes place, and to evaluate it by means of the evaluation and control device 40. On In this way, due to the lower volume of data to be read out and evaluated, faster image processing and / or a higher recording frequency can be provided.
  • FIG. 8 shows a schematic flow diagram of a method 100.
  • a device 10 is provided. This device
  • the apparatus 10 may in particular have the sample holder 12 for supporting the optical element 16, in particular the sample holder has a support region 69 in which the optical element 16 is to be arranged on the sample holder 12.
  • the apparatus 10 further includes the image sensor 56 for capturing an image of the optical element 16.
  • the imaging optics 50 are provided for imaging the optical element 16 onto the image sensor 56, wherein the imaging optics 50 has at least one lens element 51, 52 with an optical axis (21) and / or a plurality of lens elements 51, 52 running one behind the other a common optical axis 21 are arranged.
  • the apparatus 10 has a retroreflector 30 and a lighting device 20 for providing incident light illumination, in particular at least partially coaxial or coaxial with the optical axis 21.
  • the support region 69 is then arranged outside the optical axis 21.
  • the optical element 16 is arranged in the support area 69 outside the optical axis 21.
  • a step 104 the optical element is then illuminated by means of the illumination device 20.
  • a reflection takes place at the retroreflector 30.
  • a step 108 the light then passes through the optical element 16 again as an observation beam path 34.
  • a step 110 the observation beam path 34 is imaged on the image sensor 56 by means of the imaging optics 50.
  • a step 1 12 a reading of the image sensor 56 and an evaluation of the image data with regard to the read-out sign 18 and / or optical defects of the optical element 16 are then carried out.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Ophthalmology & Optometry (AREA)
  • Optics & Photonics (AREA)
  • Geometry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

La présente invention concerne un dispositif (10) permettant de visualiser un repère (18) ou un défaut optique d'un élément optique (16), en particulier sur un verre de lunettes, comportant un porte-échantillon (12) permettant de soutenir le verre de lunettes, ce porte-échantillon (12) présentant une zone d'appui (69) dans laquelle le verre de lunettes peut être disposé sur le porte-échantillon (12), le dispositif (10) présentant également un capteur d'images (56) permettant de capter une image de l'élément optique (16), une optique de reproduction (50) permettant de reproduire l'élément optique (16) sur le capteur d'images (56), l'optique de reproduction (50) présentant au moins un élément de lentille (51, 52) ayant un axe optique (21) et/ou une pluralité d'éléments de lentille (51, 52) disposés l'un après l'autre le long d'un axe optique commun (21), un rétroréflecteur (30) et un dispositif d'éclairage (20) permettant de créer un éclairage par lumière incidente, et l'axe optique (21) ou l'axe optique commun (21) étant un trajet du faisceau de représentation d'un faisceau lumineux émis par le dispositif d'éclairage (20) devant traverser ledit au moins élément de lentille (51, 52) ou la pluralité d'éléments de lentille (51, 52) sans déviation, et la zone d'appui (69) étant disposée en dehors de l'axe optique (21). La présente invention concerne également un procédé (100) permettant de visualiser un repère (18) ou un défaut optique d'un élément optique (16).
PCT/EP2016/071990 2015-09-17 2016-09-16 Dispositif et procédé permettant de visualiser un repère sur un verre de lunettes visible WO2017046340A1 (fr)

Applications Claiming Priority (2)

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DE102015115735.7 2015-09-17
DE102015115735.7A DE102015115735B3 (de) 2015-09-17 2015-09-17 Vorrichtung und Verfahren zum Sichtbarmachen eines Signierzeichens auf einem Brillenglas

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WO1999027844A1 (fr) * 1997-12-01 1999-06-10 Sensar, Inc. Procede et appareil d'illumination et de visualisation d'yeux a travers des lunettes par utilisation de plusieurs sources d'eclairage
CA2413343A1 (fr) * 2002-12-02 2004-06-02 Peter Vokhmin Methode et appareil de verification de composants optiques
EP2239552A1 (fr) * 2007-12-26 2010-10-13 Hoya Corporation Dispositif de capture d'image pour lentille
DE102011078833A1 (de) * 2011-07-07 2013-01-10 3D-Micromac Ag Verfahren und Vorrichtung zum Detektieren einer Markierung an einem Objekt
EP2597451A2 (fr) * 2011-11-25 2013-05-29 Carl Zeiss Vision International GmbH Procédé et dispositif de visualisation d'un signe de signature sur un verre de lunette

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DE4337707A1 (de) * 1993-11-05 1995-05-11 Ulrich Dr Luebbert Anordnung zur Beleuchtung und Abbildung
DE4434699C2 (de) * 1994-09-28 2001-02-22 Fraunhofer Ges Forschung Anordnung zur Prüfung durchsichtiger oder spiegelnder Objekte
IL119850A (en) * 1996-12-17 2000-11-21 Prolaser Ltd Optical method and apparatus for detecting low frequency defects
DE102013212827B4 (de) * 2013-07-01 2015-03-26 Sac Sirius Advanced Cybernetics Gmbh Verfahren und Vorrichtung zur optischen Formerfassung und/oder Prüfen eines Gegenstandes

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999027844A1 (fr) * 1997-12-01 1999-06-10 Sensar, Inc. Procede et appareil d'illumination et de visualisation d'yeux a travers des lunettes par utilisation de plusieurs sources d'eclairage
CA2413343A1 (fr) * 2002-12-02 2004-06-02 Peter Vokhmin Methode et appareil de verification de composants optiques
EP2239552A1 (fr) * 2007-12-26 2010-10-13 Hoya Corporation Dispositif de capture d'image pour lentille
DE102011078833A1 (de) * 2011-07-07 2013-01-10 3D-Micromac Ag Verfahren und Vorrichtung zum Detektieren einer Markierung an einem Objekt
EP2597451A2 (fr) * 2011-11-25 2013-05-29 Carl Zeiss Vision International GmbH Procédé et dispositif de visualisation d'un signe de signature sur un verre de lunette

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