WO2016186376A1 - Display apparatus using semiconductor light-emitting device and manufacturing method thereof - Google Patents

Display apparatus using semiconductor light-emitting device and manufacturing method thereof Download PDF

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Publication number
WO2016186376A1
WO2016186376A1 PCT/KR2016/005015 KR2016005015W WO2016186376A1 WO 2016186376 A1 WO2016186376 A1 WO 2016186376A1 KR 2016005015 W KR2016005015 W KR 2016005015W WO 2016186376 A1 WO2016186376 A1 WO 2016186376A1
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WO
WIPO (PCT)
Prior art keywords
light emitting
semiconductor light
conductive
electrode
emitting devices
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PCT/KR2016/005015
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French (fr)
Korean (ko)
Inventor
최환준
이병준
Original Assignee
엘지전자 주식회사
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Publication of WO2016186376A1 publication Critical patent/WO2016186376A1/en

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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B47/00Circuit arrangements for operating light sources in general, i.e. where the type of light source is not relevant
    • H05B47/10Controlling the light source
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21LIGHTING
    • F21SNON-PORTABLE LIGHTING DEVICES; SYSTEMS THEREOF; VEHICLE LIGHTING DEVICES SPECIALLY ADAPTED FOR VEHICLE EXTERIORS
    • F21S2/00Systems of lighting devices, not provided for in main groups F21S4/00 - F21S10/00 or F21S19/00, e.g. of modular construction
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00Electroluminescent light sources
    • H05B33/12Light sources with substantially two-dimensional radiating surfaces
    • H05B33/14Light sources with substantially two-dimensional radiating surfaces characterised by the chemical or physical composition or the arrangement of the electroluminescent material, or by the simultaneous addition of the electroluminescent material in or onto the light source

Definitions

  • the present invention relates to a display device and a method of manufacturing the same, and more particularly, to a flexible display device using a semiconductor light emitting device.
  • LCD Liguid Crystal Display
  • AMOLED Active Matrix Organic Light Emitting Diodes
  • LED Light Emitting Diode
  • LED is a well-known semiconductor light emitting device that converts current into light.
  • red LEDs using GaAsP compound semiconductors were commercialized. It has been used as a light source for display images of electronic devices including communication devices. Therefore, a method of solving the above problems by implementing a flexible display using the semiconductor light emitting device can be presented.
  • the present invention provides a mechanism for improving the luminous efficiency even with a simple structure.
  • An object of the present invention is to provide a structure for improving the brightness in the display device and a manufacturing method thereof.
  • Another object of the present invention is to implement a structure that is simply implemented while blocking the leakage of light between the semiconductor light emitting devices.
  • a display apparatus includes a wiring board on which an electrode is disposed, an adhesive layer disposed on the wiring board, a plurality of semiconductor light emitting devices coupled to the adhesive layer and electrically connected to the electrode, and the plurality of semiconductors. Filled in the space formed between the light emitting elements, and includes reflective particles reflecting the light emitted from the semiconductor light emitting elements.
  • the adhesive layer may be formed to cover the reflective particles together with the plurality of semiconductor light emitting devices. At least a portion of the adhesive layer is formed to penetrate between the reflective particles.
  • the reflecting particles include a nano-sized oxide.
  • the nano-sized oxide may be any one of spherical, acicular and plate-shaped alumina or titania.
  • each of the plurality of semiconductor light emitting devices may include a first conductive electrode and a second conductive electrode spaced apart from each other along one direction, and the reflective particles may be disposed along the thickness direction of the display device.
  • the first conductive electrode and the second conductive electrode overlap each other, and are disposed so as not to overlap the other.
  • the first conductive electrode may have a bottom surface formed at a position farther from the reflective particles from the second conductive electrode.
  • the second conductive electrode may extend to protrude from at least one side of the plurality of semiconductor light emitting devices.
  • the plurality of semiconductor light emitting devices include a first conductive semiconductor layer and a second conductive semiconductor layer on which the first conductive electrode and the second conductive electrode are disposed, respectively, the second conductive electrode and the second conductive electrode.
  • the conductive semiconductor layer may be covered by an insulating part, and the reflective particles may be formed to cover the insulating part.
  • the present invention is to grow a first conductive semiconductor layer, an active layer and a second conductive semiconductor layer on a substrate, forming an array of semiconductor light emitting elements on the substrate through etching, the semiconductor light emitting device Forming at least one conductivity type electrode in the semiconductor, charging the reflective particles reflecting light between the semiconductor light emitting elements in the array of semiconductor light emitting elements, and the array of semiconductor light emitting elements charged with the reflective particles.
  • a method of manufacturing a display apparatus comprising: connecting a wiring board to a wiring board and removing the board.
  • the charging may include applying the reflective particles to the array of semiconductor light emitting devices, and filling the coated reflective particles between the semiconductor light emitting devices through rolling.
  • a second conductive electrode is stacked on the second conductive semiconductor layer.
  • a first conductive electrode is stacked on the first conductive semiconductor layer.
  • the side emitting light of the semiconductor light emitting devices is directed upward.
  • the mixed light is prevented in the display device by blocking the light emitted from the side surfaces.
  • the structure of surrounding the individual elements of the semiconductor light emitting device despite the simple manufacturing method can be implemented to improve the brightness of the display device.
  • the conductive electrode may be protected from the conductive ball of the conductive adhesive layer.
  • FIG. 1 is a conceptual diagram illustrating an embodiment of a display device using the semiconductor light emitting device of the present invention.
  • FIG. 2 is an enlarged view of a portion A of FIG. 1, and FIGS. 3A and 3B are cross-sectional views taken along the lines B-B and C-C of FIG. 2.
  • FIG. 4 is a conceptual diagram illustrating the flip chip type semiconductor light emitting device of FIG. 3.
  • 5A through 5C are conceptual views illustrating various forms of implementing colors in connection with a flip chip type semiconductor light emitting device.
  • FIG. 6 is a cross-sectional view illustrating a method of manufacturing a display device using the semiconductor light emitting device of the present invention.
  • FIG. 7 is a perspective view showing another embodiment of a display device using the semiconductor light emitting device of the invention.
  • FIG. 8 is a cross-sectional view taken along the line D-D of FIG. 7.
  • FIG. 9 is a conceptual diagram illustrating the vertical semiconductor light emitting device of FIG. 8.
  • FIG. 10 is an enlarged view of portion A of FIG. 1 for explaining another embodiment of the present invention to which a semiconductor light emitting device having a new structure is applied.
  • FIG. 11A is a cross-sectional view taken along the line E-E of FIG. 10.
  • FIG. 11B is a cross-sectional view taken along the line F-F of FIG. 11.
  • FIG. 12 is a conceptual diagram illustrating the flip chip type semiconductor light emitting device of FIG. 11A.
  • FIG. 13 is an enlarged view of a portion A of FIG. 1 for explaining still another embodiment of the present invention.
  • FIG. 14 is a cross-sectional view taken along the line G-G of FIG. 13, and FIG. 15 is a cross-sectional view taken along the line H-H of FIG. 13.
  • 16A, 16B, 16C, 16D, 16E, 16F, 16G, 16H, 17A, 17B, and 17C are cross-sectional views illustrating a method of manufacturing a display device using the semiconductor light emitting device according to the present invention. .
  • the display device described herein includes a mobile phone, a smart phone, a laptop computer, a digital broadcasting terminal, a personal digital assistant (PDA), a portable multimedia player (PMP), navigation, and a slate PC. , Tablet PC, Ultra Book, digital TV, desktop computer.
  • PDA personal digital assistant
  • PMP portable multimedia player
  • slate PC slate PC
  • Tablet PC Ultra Book
  • digital TV desktop computer
  • FIG. 1 is a conceptual diagram illustrating an embodiment of a display device using the semiconductor light emitting device of the present invention.
  • the information processed by the controller of the display apparatus 100 may be displayed using a flexible display.
  • the flexible display includes a display that can be bent, bent, twisted, foldable, or rollable by external force.
  • a flexible display can be a display fabricated on a thin, flexible substrate that can be bent, bent, folded, or rolled like a paper while maintaining the display characteristics of a conventional flat panel display.
  • the display area of the flexible display becomes flat.
  • the display area may be a curved surface in a state in which the first state is bent by an external force (for example, a state having a finite radius of curvature, hereinafter referred to as a second state).
  • the information displayed in the second state may be visual information output on a curved surface.
  • Such visual information is implemented by independently controlling light emission of a sub-pixel disposed in a matrix form.
  • the unit pixel refers to a minimum unit for implementing one color.
  • the unit pixel of the flexible display may be implemented by a semiconductor light emitting device.
  • a light emitting diode LED
  • the light emitting diode is formed to have a small size, thereby enabling it to serve as a unit pixel even in the second state.
  • FIG. 2 is a partially enlarged view of portion A of FIG. 1
  • FIGS. 3A and 3B are cross-sectional views taken along lines BB and CC of FIG. 2
  • FIG. 4 is a conceptual diagram illustrating a flip chip type semiconductor light emitting device of FIG. 3A.
  • 5A through 5C are conceptual views illustrating various forms of implementing colors in connection with a flip chip type semiconductor light emitting device.
  • a display device 100 using a passive matrix (PM) type semiconductor light emitting device is illustrated as a display device 100 using a semiconductor light emitting device.
  • PM passive matrix
  • AM active matrix
  • the display apparatus 100 includes a substrate 110, a first electrode 120, a conductive adhesive layer 130, a second electrode 140, and a plurality of semiconductor light emitting devices 150.
  • the substrate 110 may be a flexible substrate.
  • the substrate 110 may include glass or polyimide (PI).
  • PI polyimide
  • any material such as polyethylene naphthalate (PEN) or polyethylene terephthalate (PET) may be used as long as it is an insulating and flexible material.
  • the substrate 110 may be either a transparent material or an opaque material.
  • the substrate 110 may be a wiring board on which the first electrode 120 is disposed, and thus the first electrode 120 may be positioned on the substrate 110.
  • the insulating layer 160 may be disposed on the substrate 110 on which the first electrode 120 is disposed, and the auxiliary electrode 170 may be positioned on the insulating layer 160.
  • a state in which the insulating layer 160 is stacked on the substrate 110 may be one wiring board.
  • the insulating layer 160 is made of an insulating and flexible material such as polyimide (PI, Polyimide), PET, and PEN, and can be formed integrally with the substrate 110 to form one substrate.
  • the auxiliary electrode 170 is an electrode that electrically connects the first electrode 120 and the semiconductor light emitting device 150.
  • the auxiliary electrode 170 is disposed on the insulating layer 160 and disposed to correspond to the position of the first electrode 120.
  • the auxiliary electrode 170 may have a dot shape and may be electrically connected to the first electrode 120 by an electrode hole 171 passing through the insulating layer 160.
  • the electrode hole 171 may be formed by filling a via material with a conductive material.
  • the conductive adhesive layer 130 is formed on one surface of the insulating layer 160, but the present invention is not necessarily limited thereto.
  • a layer is formed between the insulating layer 160 and the conductive adhesive layer 130 or a structure in which the conductive adhesive layer 130 is disposed on the substrate 110 without the insulating layer 160. It is also possible.
  • the conductive adhesive layer 130 may serve as an insulating layer.
  • the conductive adhesive layer 130 may be a layer having adhesiveness and conductivity.
  • the conductive adhesive layer 130 may be mixed with a conductive material and an adhesive material.
  • the conductive adhesive layer 130 is flexible, thereby enabling a flexible function in the display device.
  • the conductive adhesive layer 130 may be an anisotropic conductive film (ACF), an anisotropic conductive paste, a solution containing conductive particles, or the like.
  • ACF anisotropic conductive film
  • the conductive adhesive layer 130 allows electrical interconnection in the Z direction through the thickness, but may be configured as a layer having electrical insulation in the horizontal X-Y direction. Therefore, the conductive adhesive layer 130 may be referred to as a Z-axis conductive layer (however, hereinafter referred to as a 'conductive adhesive layer').
  • the anisotropic conductive film is a film in which an anisotropic conductive medium is mixed with an insulating base member. When the heat and pressure are applied, only the specific portion is conductive by the anisotropic conductive medium.
  • the heat and pressure is applied to the anisotropic conductive film, other methods are possible in order for the anisotropic conductive film to be partially conductive. Such a method can be, for example, only one of the heat and pressure applied or UV curing or the like.
  • the anisotropic conductive medium may be, for example, conductive balls or conductive particles.
  • the anisotropic conductive film in this example is a film in which the conductive ball is mixed with the insulating base member, and only a specific portion of the conductive ball is conductive when heat and pressure are applied.
  • the anisotropic conductive film may be in a state in which a core of a conductive material contains a plurality of particles coated by an insulating film made of a polymer material, and in this case, a portion to which heat and pressure are applied becomes conductive by the core as the insulating film is destroyed. .
  • the shape of the core may be deformed to form a layer in contact with each other in the thickness direction of the film.
  • heat and pressure are applied to the anisotropic conductive film as a whole, and the electrical connection in the Z-axis direction is partially formed by the height difference of the counterpart bonded by the anisotropic conductive film.
  • the anisotropic conductive film may be in a state containing a plurality of particles coated with a conductive material on the insulating core.
  • the portion to which the heat and pressure are applied is deformed (pressed) to have conductivity in the thickness direction of the film.
  • the conductive material may penetrate the insulating base member in the Z-axis direction and have conductivity in the thickness direction of the film. In this case, the conductive material may have a pointed end.
  • the anisotropic conductive film may be a fixed array anisotropic conductive film (fixed array ACF) consisting of a conductive ball inserted into one surface of the insulating base member.
  • the insulating base member is formed of an adhesive material, and the conductive ball is concentrated on the bottom portion of the insulating base member, and deforms with the conductive ball when heat and pressure are applied to the base member. Therefore, it has conductivity in the vertical direction.
  • the present invention is not necessarily limited thereto, and the anisotropic conductive film has a form in which conductive balls are randomly mixed in an insulating base member or a plurality of layers, in which a conductive ball is disposed in one layer (double- ACF) etc. are all possible.
  • the anisotropic conductive paste is a combination of a paste and a conductive ball, and may be a paste in which conductive balls are mixed with an insulating and adhesive base material.
  • solutions containing conductive particles can be solutions in the form of conductive particles or nanoparticles.
  • the second electrode 140 is positioned on the insulating layer 160 spaced apart from the auxiliary electrode 170. That is, the conductive adhesive layer 130 is disposed on the insulating layer 160 on which the auxiliary electrode 170 and the second electrode 140 are located.
  • the semiconductor light emitting device 150 is connected in a flip chip form by applying heat and pressure. In this case, the semiconductor light emitting device 150 is electrically connected to the first electrode 120 and the second electrode 140.
  • the semiconductor light emitting device may be a flip chip type light emitting device.
  • the semiconductor light emitting device may include a p-type electrode 156, a p-type semiconductor layer 155 on which the p-type electrode 156 is formed, an active layer 154 formed on the p-type semiconductor layer 155, and an active layer ( The n-type semiconductor layer 153 formed on the 154 and the n-type electrode 152 disposed horizontally spaced apart from the p-type electrode 156 on the n-type semiconductor layer 153.
  • the p-type electrode 156 may be electrically connected to the auxiliary electrode 170 by the conductive adhesive layer 130, and the n-type electrode 152 may be electrically connected to the second electrode 140.
  • the auxiliary electrode 170 is formed to be long in one direction, and one auxiliary electrode may be electrically connected to the plurality of semiconductor light emitting devices 150.
  • the p-type electrodes of the left and right semiconductor light emitting devices around the auxiliary electrode may be electrically connected to one auxiliary electrode.
  • the semiconductor light emitting device 150 is press-fitted into the conductive adhesive layer 130 by heat and pressure, and thus, between the p-type electrode 156 and the auxiliary electrode 170 of the semiconductor light emitting device 150. Only the portion and the portion between the n-type electrode 152 and the second electrode 140 of the semiconductor light emitting device 150 have conductivity, and the rest of the semiconductor light emitting device does not have a press-fitted conductivity. As such, the conductive adhesive layer 130 not only couples the semiconductor light emitting device 150 and the auxiliary electrode 170 and between the semiconductor light emitting device 150 and the second electrode 140 but also forms an electrical connection.
  • the plurality of semiconductor light emitting devices 150 constitute an array of light emitting devices, and a phosphor layer 180 is formed on the light emitting device array.
  • the light emitting device array may include a plurality of semiconductor light emitting devices having different luminance values.
  • Each semiconductor light emitting device 150 constitutes a unit pixel and is electrically connected to the first electrode 120.
  • a plurality of first electrodes 120 may be provided, the semiconductor light emitting devices may be arranged in several rows, and the semiconductor light emitting devices may be electrically connected to any one of the plurality of first electrodes.
  • semiconductor light emitting devices are connected in a flip chip form, semiconductor light emitting devices grown on a transparent dielectric substrate may be used.
  • the semiconductor light emitting devices may be, for example, nitride semiconductor light emitting devices. Since the semiconductor light emitting device 150 has excellent brightness, individual unit pixels may be configured with a small size.
  • the partition wall 190 may be formed between the semiconductor light emitting devices 150.
  • the partition wall 190 may serve to separate the individual unit pixels from each other, and may be integrally formed with the conductive adhesive layer 130.
  • the base member of the anisotropic conductive film may form the partition wall.
  • the partition 190 may have reflective properties and contrast may be increased.
  • a reflective partition may be separately provided as the partition 190.
  • the partition 190 may include a black or white insulator according to the purpose of the display device.
  • the partition wall of the white insulator is used, the reflectivity may be improved, and when the partition wall of the black insulator is used, the contrast may be increased at the same time.
  • the phosphor layer 180 may be located on the outer surface of the semiconductor light emitting device 150.
  • the semiconductor light emitting device 150 is a blue semiconductor light emitting device that emits blue (B) light, and the phosphor layer 180 performs a function of converting the blue (B) light into the color of a unit pixel.
  • the phosphor layer 180 may be a red phosphor 181 or a green phosphor 182 constituting individual pixels.
  • a red phosphor 181 capable of converting blue light into red (R) light may be stacked on the blue semiconductor light emitting element 151 at a position forming a red unit pixel, and a position forming a green unit pixel.
  • a green phosphor 182 capable of converting blue light into green (G) light may be stacked on the blue semiconductor light emitting device 151.
  • only the blue semiconductor light emitting device 151 may be used alone in a portion of the blue unit pixel.
  • the unit pixels of red (R), green (G), and blue (B) may form one pixel. More specifically, phosphors of one color may be stacked along each line of the first electrode 120. Therefore, one line in the first electrode 120 may be an electrode for controlling one color. That is, red (R), green (G), and blue (B) may be sequentially disposed along the second electrode 140, and thus, a unit pixel may be implemented.
  • the present invention is not limited thereto, and instead of the phosphor, the semiconductor light emitting device 150 and the quantum dot QD may be combined to implement unit pixels of red (R), green (G), and blue (B). have.
  • a black matrix 191 may be disposed between the respective phosphor layers in order to improve contrast. That is, the black matrix 191 may improve contrast of the contrast.
  • the present invention is not necessarily limited thereto, and other structures for implementing blue, red, and green may be applied.
  • each semiconductor light emitting device 150 is mainly made of gallium nitride (GaN), and indium (In) and / or aluminum (Al) is added together to emit light of various colors including blue. It can be implemented as an element.
  • the semiconductor light emitting devices 150 may be red, green, and blue semiconductor light emitting devices, respectively, to form a sub-pixel.
  • the red, green, and blue semiconductor light emitting devices R, G, and B are alternately disposed, and the red, green, and blue unit pixels are arranged by the red, green, and blue semiconductor light emitting devices. These pixels constitute one pixel, and thus, a full color display may be implemented.
  • the semiconductor light emitting device may include a white light emitting device W having a yellow phosphor layer for each individual device.
  • a red phosphor layer 181, a green phosphor layer 182, and a blue phosphor layer 183 may be provided on the white light emitting device W.
  • a unit pixel may be formed by using a color filter in which red, green, and blue are repeated on the white light emitting device W.
  • the red phosphor layer 181, the green phosphor layer 182, and the blue phosphor layer 183 may be provided on the ultraviolet light emitting device UV.
  • the semiconductor light emitting device can be used not only for visible light but also for ultraviolet light (UV) in all areas, and can be extended in the form of a semiconductor light emitting device in which ultraviolet light (UV) can be used as an excitation source of the upper phosphor. .
  • the semiconductor light emitting device 150 is positioned on the conductive adhesive layer 130 to constitute a unit pixel in the display device. Since the semiconductor light emitting device 150 has excellent brightness, individual unit pixels may be configured with a small size.
  • the size of the individual semiconductor light emitting device 150 may be 80 ⁇ m or less in length of one side, and may be a rectangular or square device. In the case of a rectangle, the size may be 20 ⁇ 80 ⁇ m or less.
  • the display device using the semiconductor light emitting device described above may be manufactured by a new type of manufacturing method. Hereinafter, the manufacturing method will be described with reference to FIG. 6.
  • FIG. 6 is a cross-sectional view illustrating a method of manufacturing a display device using the semiconductor light emitting device of the present invention.
  • the conductive adhesive layer 130 is formed on the insulating layer 160 on which the auxiliary electrode 170 and the second electrode 140 are located.
  • the insulating layer 160 is stacked on the first substrate 110 to form a single substrate (or a wiring substrate), and the first electrode 120, the auxiliary electrode 170, and the second electrode 140 are formed on the wiring substrate. Is placed.
  • the first electrode 120 and the second electrode 140 may be disposed in a direction perpendicular to each other.
  • the first substrate 110 and the insulating layer 160 may each include glass or polyimide (PI).
  • the conductive adhesive layer 130 may be implemented by, for example, an anisotropic conductive film.
  • an anisotropic conductive film may be applied to a substrate on which the insulating layer 160 is located.
  • the semiconductor light emitting device 150 may include a second substrate 112 corresponding to the positions of the auxiliary electrodes 170 and the second electrodes 140 and on which the plurality of semiconductor light emitting devices 150 constituting individual pixels are located. ) Is disposed to face the auxiliary electrode 170 and the second electrode 140.
  • the second substrate 112 may be a growth substrate for growing the semiconductor light emitting device 150, and may be a sapphire substrate or a silicon substrate.
  • the semiconductor light emitting device When the semiconductor light emitting device is formed in a wafer unit, the semiconductor light emitting device may be effectively used in the display device by having a gap and a size capable of forming the display device.
  • the wiring board and the second board 112 are thermocompressed.
  • the wiring board and the second substrate 112 may be thermocompressed by applying an ACF press head.
  • the thermocompression bonding the wiring substrate and the second substrate 112 are bonded. Only a portion between the semiconductor light emitting device 150, the auxiliary electrode 170, and the second electrode 140 has conductivity due to the property of the conductive anisotropic conductive film by thermocompression bonding.
  • the device 150 may be electrically connected.
  • the semiconductor light emitting device 150 is inserted into the anisotropic conductive film, through which a partition wall may be formed between the semiconductor light emitting device 150.
  • the second substrate 112 is removed.
  • the second substrate 112 may be removed using a laser lift-off (LLO) or chemical lift-off (CLO).
  • LLO laser lift-off
  • CLO chemical lift-off
  • a transparent insulating layer (not shown) may be formed by coating silicon oxide (SiOx) on the wiring board to which the semiconductor light emitting device 150 is coupled.
  • the method may further include forming a phosphor layer on one surface of the semiconductor light emitting device 150.
  • the semiconductor light emitting device 150 is a blue semiconductor light emitting device that emits blue (B) light, and a red phosphor or a green phosphor for converting the blue (B) light into a color of a unit pixel emits the blue semiconductor light.
  • a layer may be formed on one surface of the device.
  • the manufacturing method or structure of the display device using the semiconductor light emitting device described above may be modified in various forms.
  • a vertical semiconductor light emitting device may also be applied to the display device described above.
  • a vertical structure will be described with reference to FIGS. 5 and 6.
  • FIG. 7 is a perspective view showing another embodiment of a display device using the semiconductor light emitting device of the present invention.
  • FIG. 8 is a cross-sectional view taken along the line DD of FIG. 7, and
  • FIG. 9 is a conceptual view showing the vertical semiconductor light emitting device of FIG. 8. to be.
  • the display device may be a display device using a passive semiconductor light emitting device of a passive matrix (PM) type.
  • PM passive matrix
  • the display device includes a substrate 210, a first electrode 220, a conductive adhesive layer 230, a second electrode 240, and a plurality of semiconductor light emitting devices 250.
  • the substrate 210 is a wiring substrate on which the first electrode 220 is disposed, and may include polyimide (PI) in order to implement a flexible display device.
  • PI polyimide
  • any material that is insulating and flexible may be used.
  • the first electrode 220 is positioned on the substrate 210 and may be formed as an electrode having a bar shape that is long in one direction.
  • the first electrode 220 may be formed to serve as a data electrode.
  • the conductive adhesive layer 230 is formed on the substrate 210 on which the first electrode 220 is located. Like a display device to which a flip chip type light emitting device is applied, the conductive adhesive layer 230 is a solution containing an anisotropic conductive film (ACF), anisotropic conductive paste, and conductive particles. ), Etc. However, this embodiment also illustrates a case where the conductive adhesive layer 230 is implemented by the anisotropic conductive film.
  • ACF anisotropic conductive film
  • Etc Etc
  • the semiconductor light emitting device 250 is connected to the semiconductor light emitting device 250 by applying heat and pressure. It is electrically connected to the electrode 220.
  • the semiconductor light emitting device 250 may be disposed on the first electrode 220.
  • the electrical connection is created because, as described above, in the anisotropic conductive film is partially conductive in the thickness direction when heat and pressure are applied. Therefore, in the anisotropic conductive film is divided into a portion 231 having conductivity and a portion 232 having no conductivity in the thickness direction.
  • the conductive adhesive layer 230 implements not only electrical connection but also mechanical coupling between the semiconductor light emitting device 250 and the first electrode 220.
  • the semiconductor light emitting device 250 is positioned on the conductive adhesive layer 230, thereby forming individual pixels in the display device. Since the semiconductor light emitting device 250 has excellent brightness, individual unit pixels may be configured with a small size.
  • the size of the individual semiconductor light emitting device 250 may be 80 ⁇ m or less in length of one side, and may be a rectangular or square device. In the case of a rectangle, the size may be 20 ⁇ 80 ⁇ m or less.
  • the semiconductor light emitting device 250 may have a vertical structure.
  • a plurality of second electrodes 240 disposed in a direction crossing the length direction of the first electrode 220 and electrically connected to the vertical semiconductor light emitting device 250 are positioned.
  • the vertical semiconductor light emitting device includes a p-type electrode 256, a p-type semiconductor layer 255 formed on the p-type electrode 256, and an active layer 254 formed on the p-type semiconductor layer 255. ), An n-type semiconductor layer 253 formed on the active layer 254, and an n-type electrode 252 formed on the n-type semiconductor layer 253.
  • the lower p-type electrode 256 may be electrically connected by the first electrode 220 and the conductive adhesive layer 230, and the upper n-type electrode 252 may be the second electrode 240 described later.
  • a phosphor layer 280 may be formed on one surface of the semiconductor light emitting device 250.
  • the semiconductor light emitting device 250 is a blue semiconductor light emitting device 251 that emits blue (B) light
  • the phosphor layer 280 is provided to convert the blue (B) light into the color of a unit pixel.
  • the phosphor layer 280 may be a red phosphor 281 and a green phosphor 282 constituting individual pixels.
  • a red phosphor 281 capable of converting the blue light into the red (R) light may be stacked on the blue semiconductor light emitting element 251, and the position forming the green unit pixel.
  • a green phosphor 282 capable of converting blue light into green (G) light may be stacked on the blue semiconductor light emitting device 251.
  • only the blue semiconductor light emitting device 251 may be used alone in a portion of the blue unit pixel. In this case, the unit pixels of red (R), green (G), and blue (B) may form one pixel.
  • the present invention is not necessarily limited thereto, and as described above in the display device to which the flip chip type light emitting device is applied, other structures for implementing blue, red, and green may be applied.
  • the second electrode 240 is positioned between the semiconductor light emitting devices 250 and is electrically connected to the semiconductor light emitting devices 250.
  • the semiconductor light emitting devices 250 may be arranged in a plurality of columns, and the second electrode 240 may be positioned between the columns of the semiconductor light emitting devices 250.
  • the second electrode 240 may be positioned between the semiconductor light emitting devices 250.
  • the second electrode 240 may be formed as an electrode having a bar shape that is long in one direction, and may be disposed in a direction perpendicular to the first electrode.
  • the second electrode 240 and the semiconductor light emitting device 250 may be electrically connected by a connection electrode protruding from the second electrode 240.
  • the connection electrode may be an n-type electrode of the semiconductor light emitting device 250.
  • the n-type electrode is formed of an ohmic electrode for ohmic contact, and the second electrode covers at least a portion of the ohmic electrode by printing or deposition.
  • the second electrode 240 and the n-type electrode of the semiconductor light emitting device 250 may be electrically connected to each other.
  • the second electrode 240 may be positioned on the conductive adhesive layer 230.
  • a transparent insulating layer (not shown) including silicon oxide (SiOx) may be formed on the substrate 210 on which the semiconductor light emitting device 250 is formed.
  • SiOx silicon oxide
  • the second electrode 240 is positioned after the transparent insulating layer is formed, the second electrode 240 is positioned on the transparent insulating layer.
  • the second electrode 240 may be formed to be spaced apart from the conductive adhesive layer 230 or the transparent insulating layer.
  • the present invention has the advantage of not having to use a transparent electrode such as ITO by placing the second electrode 240 between the semiconductor light emitting devices 250. Therefore, the light extraction efficiency can be improved by using a conductive material having good adhesion with the n-type semiconductor layer as a horizontal electrode without being limited to the selection of a transparent material.
  • a transparent electrode such as indium tin oxide (ITO)
  • the partition wall 290 may be located between the semiconductor light emitting devices 250. That is, the partition wall 290 may be disposed between the vertical semiconductor light emitting devices 250 to isolate the semiconductor light emitting devices 250 forming individual pixels. In this case, the partition wall 290 may serve to separate individual unit pixels from each other, and may be integrally formed with the conductive adhesive layer 230. For example, when the semiconductor light emitting device 250 is inserted into the anisotropic conductive film, the base member of the anisotropic conductive film may form the partition wall.
  • the partition wall 290 may have reflective properties and contrast may be increased.
  • a reflective partition may be separately provided.
  • the partition 290 may include a black or white insulator according to the purpose of the display device.
  • the partition wall 290 is disposed between the vertical semiconductor light emitting device 250 and the second electrode 240. It can be located in between. Accordingly, the individual unit pixels may be configured even with a small size by using the semiconductor light emitting device 250, and the distance between the semiconductor light emitting devices 250 is relatively large enough so that the second electrode 240 is connected to the semiconductor light emitting device 250. ), And a flexible display device having HD image quality can be implemented.
  • a black matrix 291 may be disposed between the respective phosphors in order to improve contrast. That is, this black matrix 291 can improve contrast of the contrast.
  • the semiconductor light emitting device 250 is positioned on the conductive adhesive layer 230, thereby forming individual pixels in the display device. Since the semiconductor light emitting device 250 has excellent brightness, individual unit pixels may be configured with a small size. Therefore, a full color display in which the unit pixels of red (R), green (G), and blue (B) form one pixel may be implemented by the semiconductor light emitting device.
  • FIG. 10 is an enlarged view of a portion A of FIG. 1 for explaining another embodiment of the present invention to which a semiconductor light emitting device having a new structure is applied
  • FIG. 11A is a cross-sectional view taken along the line EE of FIG. 10
  • FIG. 11 is a cross-sectional view taken along the line FF of FIG. 11
  • FIG. 12 is a conceptual diagram illustrating the flip chip type semiconductor light emitting device of FIG. 11A.
  • a display device 1000 using a passive matrix (PM) type semiconductor light emitting device is illustrated as a display device 1000 using a semiconductor light emitting device.
  • PM passive matrix
  • AM active matrix
  • the display apparatus 1000 includes a substrate 1010, a first electrode 1020, a conductive adhesive layer 1030, a second electrode 1040, and a plurality of semiconductor light emitting devices 1050.
  • the first electrode 1020 and the second electrode 1040 may each include a plurality of electrode lines.
  • the substrate 1010 is a wiring board on which the first electrode 1020 is disposed, and may include polyimide (PI) to implement a flexible display device.
  • PI polyimide
  • any material that is insulating and flexible may be used.
  • the first electrode 1020 is positioned on the substrate 1010 and may be formed as an electrode having a bar shape that is long in one direction.
  • the first electrode 1020 may be configured to serve as a data electrode.
  • the conductive adhesive layer 1030 is formed on the substrate 1010 on which the first electrode 1020 is located.
  • the conductive adhesive layer 1030 is a solution containing an anisotropic conductive film (ACF), anisotropic conductive paste, and conductive particles. solution, etc.
  • ACF anisotropic conductive film
  • the conductive adhesive layer 1030 may be replaced with an adhesive layer.
  • the adhesive layer may not need conductivity.
  • a plurality of second electrodes 1040 are disposed between the semiconductor light emitting devices in a direction crossing the length direction of the first electrode 1020 and electrically connected to the semiconductor light emitting devices 1050.
  • the second electrode 1040 may be located on the conductive adhesive layer 1030. That is, the conductive adhesive layer 1030 is disposed between the wiring board and the second electrode 1040. The second electrode 1040 may be electrically connected to the semiconductor light emitting device 1050 by contact.
  • the plurality of semiconductor light emitting devices 1050 are coupled to the conductive adhesive layer 1030 and electrically connected to the first electrode 1020 and the second electrode 1040.
  • a transparent insulating layer (not shown) including silicon oxide (SiOx) may be formed on the substrate 1010 on which the semiconductor light emitting device 1050 is formed.
  • SiOx silicon oxide
  • the second electrode 1040 is positioned after the transparent insulating layer is formed, the second electrode 1040 is positioned on the transparent insulating layer.
  • the second electrode 1040 may be formed to be spaced apart from the conductive adhesive layer 1030 or the transparent insulating layer.
  • the plurality of semiconductor light emitting devices 1050 may form a plurality of columns in a direction parallel to the plurality of electrode lines provided in the first electrode 1020.
  • the present invention is not necessarily limited thereto.
  • the plurality of semiconductor light emitting devices 1050 may form a plurality of columns along the second electrode 1040.
  • the display apparatus 1000 may further include a phosphor layer 1080 formed on one surface of the plurality of semiconductor light emitting devices 1050.
  • the semiconductor light emitting device 1050 is a blue semiconductor light emitting device that emits blue (B) light
  • the phosphor layer 1080 performs a function of converting the blue (B) light into the color of a unit pixel.
  • the phosphor layer 1080 may be a red phosphor 1081 or a green phosphor 1082 constituting individual pixels. That is, at the position forming the red unit pixel, a red phosphor 1081 capable of converting the blue light into the red (R) light may be stacked on the blue semiconductor light emitting device 1051a, and the position forming the green unit pixel.
  • a green phosphor 1082 capable of converting blue light into green (G) light may be stacked on the blue semiconductor light emitting device 1051b.
  • the blue semiconductor light emitting device 1051c may be used alone in a portion of the blue unit pixel.
  • the unit pixels of red (R), green (G), and blue (B) may form one pixel.
  • phosphors of one color may be stacked along each line of the first electrode 1020. Accordingly, one line in the first electrode 1020 may be an electrode for controlling one color. That is, red (R), green (G), and blue (B) may be sequentially disposed along the second electrode 1040, and thus a unit pixel may be implemented.
  • the present invention is not necessarily limited thereto, and instead of the phosphor, a unit pixel that emits red (R), green (G), and blue (B) by combining a quantum dot (QD) with a semiconductor light emitting element 1050 may be used. Can be implemented.
  • the display apparatus may further include a black matrix 1091 disposed between the respective phosphors.
  • the black matrix 1091 may form a gap between phosphor dots, and a black material may be formed to fill the gap.
  • the black matrix 1091 may absorb the external light reflection and improve contrast of the contrast.
  • the black matrix 1091 is positioned between the phosphor layers along the first electrode 1020 in the direction in which the phosphor layers 1080 are stacked. In this case, the phosphor layer is not formed at a position corresponding to the blue semiconductor light emitting element 1051, but the black matrix 1091 has a space without the phosphor layer therebetween (or between the blue semiconductor light emitting element 1051c). On each side) can be formed.
  • the semiconductor light emitting device 1050 of the present example since the semiconductor light emitting device 1050 may be disposed up and down in this example, the semiconductor light emitting device 1050 has a great advantage of reducing the chip size.
  • the electrodes are disposed up and down, the semiconductor light emitting device of the present invention may be a flip chip type light emitting device.
  • the semiconductor light emitting device 1050 may include a first conductive semiconductor layer 1155 on which a first conductive electrode 1156, a first conductive electrode 1156 are formed, and An active layer 1154 formed on the first conductive semiconductor layer 1155, and a second formed on the second conductive semiconductor layer 1153 and the second conductive semiconductor layer 1153 formed on the active layer 1154.
  • a conductive electrode 1152 may be included in the semiconductor light emitting device 1050.
  • first conductive electrode 1156 and the first conductive semiconductor layer 1155 may be a p-type electrode and a p-type semiconductor layer, respectively, and the second conductive electrode 1152 and the second conductive layer may be formed.
  • the conductive semiconductor layer 1153 may be an n-type electrode and an n-type semiconductor layer, respectively.
  • the present invention is not necessarily limited thereto, and an example in which the first conductive type is n-type and the second conductive type is p-type is also possible.
  • the first conductive electrode 1156 is formed on one surface of the first conductive semiconductor layer 1155, and the active layer 1154 is formed on the other surface of the first conductive semiconductor layer 1155.
  • the second conductive semiconductor layer 1153 is formed between one surface of the second conductive semiconductor layer 1153, and the second conductive electrode 1152 is formed on one surface of the second conductive semiconductor layer 1153.
  • the second conductive electrode is disposed on one surface of the second conductive semiconductor layer 1153, and an undoped semiconductor layer 1153a is disposed on the other surface of the second conductive semiconductor layer 1153. ) May be formed.
  • one surface of the second conductive semiconductor layer may be the surface closest to the wiring board, and the other surface of the second conductive semiconductor layer may be closest to the wiring substrate. It can be far away.
  • first conductive electrode 1156 and the second conductive electrode 1152 have a height difference from each other in the width direction and the vertical direction (or thickness direction) at positions spaced apart along the width direction of the semiconductor light emitting device. It is made to have.
  • the second conductive electrode 1152 is formed on the second conductive semiconductor layer 1153 using the height difference, but is disposed adjacent to the second electrode 1040 positioned above the semiconductor light emitting device.
  • the second conductive electrode 1152 may have at least a portion of the second conductive electrode 1152 in the width direction from the side surface of the second conductive semiconductor layer 1153 (or the side surface of the undoped semiconductor layer 1153a). It protrudes along. As such, since the second conductive electrode 1152 protrudes from the side surface, the second conductive electrode 1152 may be exposed to the upper side of the semiconductor light emitting device. Through this, the second conductive electrode 1152 is disposed at a position overlapping with the second electrode 1040 disposed above the conductive adhesive layer 1030.
  • the semiconductor light emitting device includes a protrusion 1152a extending from the second conductive electrode 1152 and protruding from the side surfaces of the plurality of semiconductor light emitting devices.
  • the first conductive electrode 1156 and the second conductive electrode 1152 are disposed at positions spaced apart along the protrusion direction of the protrusion 1152a. It may be represented to have a height difference from each other in the direction perpendicular to the protruding direction.
  • the protrusion 1152a extends from one surface of the second conductive semiconductor layer 1153 to the side surface, and more specifically to an upper surface of the second conductive semiconductor layer 1153, an undoped semiconductor layer. Extends to 1153a.
  • the protrusion 1152a protrudes along the width direction from the side of the undoped semiconductor layer 1153a. Accordingly, the protrusion 1152a may be electrically connected to the second electrode 1040 on the opposite side of the first conductive electrode based on the second conductive semiconductor layer.
  • the structure having the protrusion 1152a may be a structure that can utilize the advantages of the above-described horizontal semiconductor light emitting device and vertical semiconductor light emitting device. Meanwhile, fine grooves may be formed on the upper surface furthest from the first conductive electrode 1156 in the undoped semiconductor layer 1153a by roughing.
  • the semiconductor light emitting device 1050 may include an insulating portion 1158 formed to cover the second conductive electrode 1152.
  • the insulating part 1158 may be formed to cover a portion of the first conductive semiconductor layer 1155 together with the second conductive electrode 1152.
  • the second conductive electrode 1152 and the active layer 1154 are formed on one surface of the second conductive semiconductor layer 1153, and are spaced apart in one direction with the insulating portion 1158 interposed therebetween. do.
  • one direction (or horizontal direction) may be the width direction of the semiconductor light emitting device
  • the vertical direction may be the thickness direction of the semiconductor light emitting device.
  • the first conductive electrode 1156 may be formed in a portion of the first conductive semiconductor layer 1155 that is not covered by the insulating portion 1158 and is exposed. Therefore, the first conductive electrode 1156 is exposed to the outside through the insulating portion 1158.
  • the n-type electrode and the p-type electrode of the semiconductor light emitting device may be insulated.
  • the display apparatus 1000 may further include a phosphor layer 1080 (refer to FIG. 11B) formed on one surface of the plurality of semiconductor light emitting devices 1050.
  • a phosphor layer 1080 (refer to FIG. 11B) formed on one surface of the plurality of semiconductor light emitting devices 1050.
  • the light output from the semiconductor light emitting devices is excited using a phosphor, thereby implementing red (R) and green (G).
  • the aforementioned black matrices 191, 291, 1091, FIGS. 3B, 8, and 11B serve as partition walls that prevent color mixing between the phosphors.
  • the structure and manufacturing method of the display device is simple, but the mechanism of increasing the brightness and a method of manufacturing the same are presented.
  • FIG. 13 is an enlarged view of a portion A of FIG. 1 for explaining another embodiment of the present invention
  • FIG. 14 is a sectional view taken along the GG of FIG. 13
  • FIG. 15 is a sectional view taken along the HH of FIG. .
  • FIGS. 13, 14, and 15 illustrate a display device 2000 using the flip chip type semiconductor light emitting device described with reference to FIGS. 10 to 12 as a display device using the semiconductor light emitting device.
  • the flip chip type semiconductor light emitting device described with reference to FIGS. 10 to 12 exemplifies a case where a mechanism for increasing brightness is added.
  • the arrow shown in Fig. 14 represents a path of light for increasing the luminance.
  • the example described below may be applied to a display device using the above-described other type of semiconductor light emitting device.
  • the display apparatus 2000 includes a substrate 2010, a first electrode 2020, a conductive adhesive layer 2030, a second electrode 2040, and a plurality of semiconductor light emitting devices 2050.
  • the description will be replaced with the description with reference to FIGS. 10 to 12. Therefore, in the present exemplary embodiment, the conductive adhesive layer 2030 is replaced with an adhesive layer, and a plurality of semiconductor light emitting devices are attached to the adhesive layer disposed on the substrate 2010, and the first electrode 2020 is formed on the substrate 2010. It may be formed integrally with the conductive electrode of the semiconductor light emitting device without being located at.
  • the second electrode 2040 may be located on the conductive adhesive layer 2030. That is, the conductive adhesive layer 2030 is disposed between the wiring board and the second electrode 2040. The second electrode 2040 may be electrically connected to the semiconductor light emitting device 2050 by contact.
  • the semiconductor light emitting device 2050 may include a first conductive electrode 2156, a first conductive semiconductor layer 2155 on which the first conductive electrode 2156 is formed, and a first conductive semiconductor layer 2155. ) And a second conductive type electrode 2152 formed on the second conductive type semiconductor layer 2153 and the second conductive type semiconductor layer 2153 formed on the active layer 2154. The description thereof will be replaced with the description with reference to FIG. 12.
  • the protrusion 2152a extends from one surface of the second conductive semiconductor layer 2153 to the side surface, and to the top surface of the second conductive semiconductor layer 2153. Specifically, it extends to the undoped semiconductor layer 2153a.
  • the protrusion 2152a may be electrically connected to the second electrode 2040 on the opposite side of the first conductive electrode based on the second conductive semiconductor layer.
  • the semiconductor light emitting device 2050 may include an insulating portion 2158 formed to cover the second conductive electrode 2152.
  • the insulating part 2158 may be formed to cover a portion of the first conductive semiconductor layer 2155 together with the second conductive electrode 2152.
  • the first conductive electrode 2156 may be formed at a portion of the first conductive semiconductor layer 2155 that is not covered by the insulating portion 2158 and is exposed. Therefore, the first conductive electrode 2156 is exposed to the outside through the insulating portion 2158.
  • the display apparatus 2000 may further include a phosphor layer 2080 formed on one surface of the plurality of semiconductor light emitting devices 2050.
  • the semiconductor light emitting device 2050 is a blue semiconductor light emitting device that emits blue (B) light
  • the phosphor layer 2080 performs a function of converting the blue (B) light into the color of a unit pixel.
  • the light output from the semiconductor light emitting devices 2050 is excited using a phosphor, thereby implementing red (R) and green (G).
  • the phosphor layer 2080 may be replaced with a color filter or quantum dot.
  • the aforementioned black matrices 191, 291, 1091, FIGS. 3B, 8, and 11B serve as partition walls that prevent color mixing between the phosphors.
  • reflecting particles 2060 are filled in a space formed between the plurality of semiconductor light emitting devices 2050 to reflect light emitted from the semiconductor light emitting devices 2050.
  • the reflective particles 2060 may include a nano-sized oxide, and the nano-sized oxide may be any one of spherical, acicular, and plate-shaped alumina or titania.
  • the conductive adhesive layer 2030 electrically and physically connecting the wiring board 2010 and the semiconductor light emitting devices 2050 may include the reflective particles 2060 together with the plurality of semiconductor light emitting devices 2050. ) Is formed to cover. In addition, at least a portion of the conductive adhesive layer 2030 may penetrate between the reflective particles 2060. As an example, an insulating base member or base material of the conductive adhesive layer 2030 may penetrate between the reflective particles 2060.
  • the reflective particles 2060 may be disposed in different forms in both directions perpendicular to each other.
  • the semiconductor light emitting devices 2050 may form a light emitting device array, and the light emitting device array may be formed to have a narrow interval between the semiconductor light emitting devices in a horizontal direction and to be wide in a vertical direction.
  • the vertical direction may be defined as a direction in which the second conductive electrode protrudes
  • the horizontal direction may be a direction perpendicular to the vertical direction.
  • the phosphor layer 2080 is formed to extend in the longitudinal direction, and phosphor layers 2081 and 2082 implementing different colors are sequentially arranged along the horizontal direction.
  • the reflective particles 2060 may fill the gap in the horizontal direction where the gap is narrow, and the reflective particles 2060 may fill only a portion of the gap in the longitudinal direction where the gap is relatively wide. have. Since only a part of the gap is filled in the longitudinal direction, the first portion 2061 with the reflective particles disposed between the conductive adhesive layer 2030 and the phosphor layer 2080 in the longitudinal direction, and the undisposed first agent. Two portions 2062 may be formed. This is because the phosphor layer of the same color along the longitudinal direction covers the first portion 2061 and the second portion 2062 together, so that only the luminance increase is required along the longitudinal direction, so that the problem of color mixing does not occur. Because.
  • the reflective particles 2060 may reflect light reflected from the phosphor layer 2080 and directed toward the inside of the display device to the phosphor layer 2080.
  • the unarranged second portion 2062 may be formed of a layer having reflective particles formed therein than the first portion 2061. It can be a thin layer. That is, for the re-reflection, the second particles 2062 are disposed in a smaller amount than the first portion 2061, not completely unplaced.
  • the reflective particles 2060 overlap with one of the first conductive electrode 2156 and the second conductive electrode 2152 along the thickness direction of the display device, and do not overlap with the other. May be arranged so as not to. As an example, the reflective particles 2060 may be formed to overlap the second conductive electrode 2152 and not overlap the first conductive electrode 2156.
  • the reflective particles are formed to cover the insulating portion 2158, and since the insulating portion is disposed between the reflective particles and the second conductive electrode 2152, the reflective particles 2060 are formed. It may overlap with the second conductive electrode 2152. On the other hand, since the first conductive electrode 2156 is provided without being covered by the insulating portion 2158, the reflective particles are formed so as not to cover the first conductive electrode 2156. .
  • the first conductive electrode 2156 is connected to the wiring electrode at the lower side and the second conductive electrode 2152 at the upper side in the thickness direction of the display device. More specifically, the first conductive electrode 2156 has a lower surface formed at a position farther from the second conductive electrode 2152 than the reflective particles 2060, and the lower surface is electrically connected to the wiring electrode. Connected.
  • a structure that improves luminance and a structure that is simply implemented while blocking leakage of light between the semiconductor light emitting devices may be implemented.
  • 16A, 16B, 16C, 16D, 16E, 16F, 16G, 16H, 17A, 17B, and 17C are cross-sectional views illustrating a method of manufacturing a display device using the semiconductor light emitting device according to the present invention. .
  • the second conductive semiconductor layer 2053, the active layer 2054, and the first conductive semiconductor layer 2055 are grown on the growth substrate W or the semiconductor wafer (FIG. 16A).
  • the second conductive semiconductor layer 2053 When the second conductive semiconductor layer 2053 is grown, an active layer 2054 is grown on the first conductive semiconductor layer 2052, and then a first conductive semiconductor is formed on the active layer 2054. Grow layer 2055. As such, when the second conductive semiconductor layer 2053, the active layer 2054, and the first conductive semiconductor layer 2055 are sequentially grown, as shown in the drawing, the second conductive semiconductor layer 2053 and the active layer ( 2054 and the first conductive semiconductor layer 2055 form a stacked structure.
  • the growth substrate W may be formed of a material having a light transmissive property, for example, sapphire (Al 2 O 3), GaN, ZnO, or AlO, but is not limited thereto.
  • the growth substrate W may be formed of a material suitable for growing a semiconductor material, a carrier wafer.
  • At least one of Si, GaAs, GaP, InP, and Ga2O3 may be formed of a material having excellent thermal conductivity, including a conductive substrate or an insulating substrate, for example, a SiC substrate having a higher thermal conductivity than a sapphire (Al2O3) substrate. Can be used.
  • the second conductive semiconductor layer 2053 is an n-type semiconductor layer, and may be a nitride semiconductor layer such as n-Gan, and may further include an undoped semiconductor layer 2153a.
  • an etching process for separating the p-type semiconductor and the n-type semiconductor is performed.
  • the first conductive semiconductor layer 2055 and the active layer 2054 are etched to partition the first conductive semiconductor layer 2055 into a plurality of portions ( Mesa etching).
  • Mesa etching a portion of the active layer 2054 and the first conductive semiconductor layer 2055 are removed in the vertical direction, and the second conductive semiconductor layer 2053 is exposed to the outside.
  • the etching forms an array of semiconductor light emitting devices on the substrate.
  • etching may proceed until the undoped semiconductor layer is exposed.
  • etching may be performed until a part of the second conductive semiconductor layer 2053 is left between the semiconductor light emitting devices.
  • At least one conductive electrode is formed on the semiconductor light emitting devices (FIG. 16D). More specifically, the second conductive electrode 2052 is formed on one surface of the second conductive semiconductor layer 2053. That is, after forming an array of semiconductor light emitting devices on the substrate, a second conductive electrode 2052 is stacked on the second conductive semiconductor layer 2053.
  • the insulator is applied to form the insulator 2058 (FIG. 16E).
  • the second conductive electrode 2052 and the active layer 2054 are formed on one surface of the second conductive semiconductor layer 2053, and are spaced apart in the horizontal direction with the insulating portion 2058 interposed therebetween.
  • the plurality of semiconductor light emitting devices forming the light emitting device array may be disposed to be spaced apart from adjacent light emitting devices with a predetermined space therebetween, and may be filled with an insulating portion 2058 between the spaced apart semiconductor light emitting devices.
  • the insulating portion 2058 is formed so as not to cover a portion of the first conductive semiconductor layer 2055 for electrical connection of the first conductive electrode 2056.
  • the charging step includes applying the reflective particles to the array of semiconductor light emitting devices (FIG. 16F), and filling the coated reflective particles between the semiconductor light emitting devices (FIG. 16G) through rolling. can do.
  • a solvent in which the oxides of the nanoparticles are dispersed is applied by a spray method, and in the filling step, the applied solvent is pressed by using a roller or rubber to nano-measure the mesa space of the semiconductor light emitting devices. To fill the particles. Pressurization of the rollers or rubbers may be repeatedly applied in the horizontal and vertical directions.
  • a first conductive electrode is stacked on the first conductive semiconductor layer (FIG. 16H).
  • the reflective particles are filled in the space formed between the plurality of semiconductor light emitting devices, it can be implemented to reflect the light emitted from the semiconductor light emitting devices.
  • the array of semiconductor light emitting devices filled with the reflective particles is connected to a wiring board and the substrate is removed.
  • the semiconductor light emitting devices are bonded to the wiring board using the conductive adhesive layer, and the growth substrate is removed (FIG. 17A).
  • the wiring board is in a state where a first electrode 2020 is formed, and the first electrode 2020 is a lower wiring and is electrically connected to the first conductive electrode 2156 by a conductive ball in the conductive adhesive layer 2030. do.
  • at least a part of the conductive adhesive layer penetrates between the reflective particles by thermal compression.
  • a second electrode 2040 connecting the protruding second conductive electrode 2152 is formed (FIG. 17c).
  • the second electrode 2040 is an upper wiring and is directly connected to the second conductive electrode 2152.
  • the undoped semiconductor layer may be replaced with another type of absorbing layer that absorbs a UV laser.
  • the absorber layer may be a buffer layer, may be formed in a low temperature atmosphere, and may be formed of a material that can alleviate the difference in lattice constant between the semiconductor layer and the growth substrate.
  • it may include materials such as GaN, InN, AlN, AlInN, InGaN, AlGaN, and InAlGaN.
  • the brightness of the display device can be improved despite the simple manufacturing method.
  • the display device using the semiconductor light emitting device described above is not limited to the configuration and method of the embodiments described above, but the embodiments may be configured by selectively combining all or part of the embodiments so that various modifications may be made. It may be.

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Abstract

The present invention relates to a display apparatus and, more particularly, to a display apparatus using a semiconductor light-emitting device. A display apparatus according to the present invention comprises: a wiring board in which an electrode is disposed; an adhesive layer disposed on the wiring board; a plurality of semiconductor light-emitting devices combined with the adhesive layer and electrically connected to the electrode; and reflective particles, charged in a space formed among the plurality of light-emitting devices, for reflecting light emitted from the semiconductor light-emitting devices.

Description

반도체 발광 소자를 이용한 디스플레이 장치 및 이의 제조방법Display device using semiconductor light emitting device and manufacturing method thereof
본 발명은 디스플레이 장치 및 이의 제조방법에 관한 것으로 특히, 반도체 발광 소자를 이용한 플렉서블 디스플레이 장치에 관한 것이다.The present invention relates to a display device and a method of manufacturing the same, and more particularly, to a flexible display device using a semiconductor light emitting device.
최근에는 디스플레이 기술분야에서 박형, 플렉서블 등의 우수한 특성을 가지는 디스플레이 장치가 개발되고 있다. 이에 반해, 현재 상용화된 주요 디스플레이는 LCD(Liguid Crystal Display)와 AMOLED(Active Matrix Organic Light Emitting Diodes)로 대표되고 있다.Recently, display apparatuses having excellent characteristics such as thin and flexible have been developed in the display technology field. In contrast, the major displays currently commercialized are represented by LCD (Liguid Crystal Display) and AMOLED (Active Matrix Organic Light Emitting Diodes).
그러나, LCD의 경우에 빠르지 않은 반응 시간과, 플렉서블의 구현이 어렵다는 문제점이 존재하고, AMOLED의 경우에 수명이 짧고, 양산 수율이 좋지 않을 뿐 아니라 플렉서블의 정도가 약하다는 취약점이 존재한다.However, there is a problem that the LCD is not fast response time, difficult implementation of the flexible, there is a weak life in the case of AMOLED, short-lived, not good yield yield, the weakness of the flexible.
한편, 발광 다이오드(Light Emitting Diode: LED)는 전류를 빛으로 변환시키는 잘 알려진 반도체 발광 소자로서, 1962년 GaAsP 화합물 반도체를 이용한 적색 LED가 상품화된 것을 시작으로 GaP:N 계열의 녹색 LED와 함께 정보 통신기기를 비롯한 전자장치의 표시 화상용 광원으로 이용되어 왔다. 따라서, 상기 반도체 발광 소자를 이용하여 플렉서블 디스플레이를 구현하여, 상기의 문제점을 해결하는 방안이 제시될 수 있다. On the other hand, Light Emitting Diode (LED) is a well-known semiconductor light emitting device that converts current into light.In 1962, red LEDs using GaAsP compound semiconductors were commercialized. It has been used as a light source for display images of electronic devices including communication devices. Therefore, a method of solving the above problems by implementing a flexible display using the semiconductor light emitting device can be presented.
상기 반도체 발광 소자를 이용한 플렉서블 디스플레이는 상기 반도체 발광 소자의 발광 효율을 향상시켜야 한다는 필요성이 존재할 수 있다. 이러한 필요성의 해결을 위하여, 상기 반도체 발광 소자의 구조를 새로이 하는 방법 등이 이용될 수 있으나, 이는 반도체 발광 소자의 제조를 복잡하게 하는 단점이 있다. 이에, 본 발명에서는 간단한 구조임에도 발광 효율을 향상하는 메커니즘에 대하여 제시한다.In the flexible display using the semiconductor light emitting device, there may be a need to improve the luminous efficiency of the semiconductor light emitting device. In order to solve this necessity, a method of renewing the structure of the semiconductor light emitting device and the like may be used, but this has the disadvantage of complicating the manufacturing of the semiconductor light emitting device. Thus, the present invention provides a mechanism for improving the luminous efficiency even with a simple structure.
본 발명의 일 목적은 디스플레이 장치에서 휘도를 향상하는 구조 및 이의 제조방법을 제공하기 위한 것이다.An object of the present invention is to provide a structure for improving the brightness in the display device and a manufacturing method thereof.
본 발명의 다른 일 목적은, 반도체 발광소자들의 사이로 빛의 누수를 차단하면서도 간단하게 구현되는 구조를 구현하기 위한 것이다.Another object of the present invention is to implement a structure that is simply implemented while blocking the leakage of light between the semiconductor light emitting devices.
본 발명에 따른 디스플레이 장치는, 전극이 배치되는 배선기판과, 상기 배선기판에 배치되는 접착층과, 상기 접착층에 결합되며, 상기 전극과 전기적으로 연결되는 복수의 반도체 발광 소자들, 및 상기 복수의 반도체 발광소자들의 사이에 형성되는 공간에 충전되어, 상기 반도체 발광소자들에서 발광되는 빛을 반사하는 반사입자들을 포함한다.According to an exemplary embodiment of the present invention, a display apparatus includes a wiring board on which an electrode is disposed, an adhesive layer disposed on the wiring board, a plurality of semiconductor light emitting devices coupled to the adhesive layer and electrically connected to the electrode, and the plurality of semiconductors. Filled in the space formed between the light emitting elements, and includes reflective particles reflecting the light emitted from the semiconductor light emitting elements.
실시 예에 있어서, 상기 접착층은 상기 복수의 반도체 발광 소자들과 함께 상기 반사입자들을 덮도록 형성된다. 상기 접착층은 적어도 일부가 상기 반사입자들의 사이로 침투하도록 이루어진다.In example embodiments, the adhesive layer may be formed to cover the reflective particles together with the plurality of semiconductor light emitting devices. At least a portion of the adhesive layer is formed to penetrate between the reflective particles.
실시 예에 있어서, 상기 반사입자들은 나노 크기의 산화물을 포함한다. 상기 나노 크기의 산화물은 구상, 침상 및 판상의 알루미나 또는 타이타니아 중 어느 하나가 될 수 있다.In an embodiment, the reflecting particles include a nano-sized oxide. The nano-sized oxide may be any one of spherical, acicular and plate-shaped alumina or titania.
실시 예에 있어서, 상기 복수의 반도체 발광소자들은 각각, 일방향을 따라 서로 이격 배치되는 제1도전형 전극 및 제2도전형 전극을 구비하며, 상기 반사입자들은 상기 디스플레이 장치의 두께방향을 따라 상기 제1도전형 전극 및 제2도전형 전극 중 어느 하나와 오버랩되며, 다른 하나와 오버랩되지 않도록 배치된다.In example embodiments, each of the plurality of semiconductor light emitting devices may include a first conductive electrode and a second conductive electrode spaced apart from each other along one direction, and the reflective particles may be disposed along the thickness direction of the display device. The first conductive electrode and the second conductive electrode overlap each other, and are disposed so as not to overlap the other.
상기 제1도전형 전극은 상기 제2도전형 전극으로부터 상기 반사입자들보다 먼 위치에 형성되는 하면을 구비할 수 있다. 상기 제2도전형 전극은 상기 복수의 반도체 발광 소자들 중 적어도 하나의 측면에서 돌출되도록 연장될 수 있다. 상기 복수의 반도체 발광소자들은 상기 제1도전형 전극 및 제2도전형 전극이 각각 배치되는 제1도전형 반도체층 및 제2도전형 반도체층을 구비하고, 상기 제2도전형 전극과 상기 제2도전형 반도체층은 절연부에 의하여 덮이며, 상기 반사입자들은 상기 절연부를 덮도록 이루어질 수 있다.The first conductive electrode may have a bottom surface formed at a position farther from the reflective particles from the second conductive electrode. The second conductive electrode may extend to protrude from at least one side of the plurality of semiconductor light emitting devices. The plurality of semiconductor light emitting devices include a first conductive semiconductor layer and a second conductive semiconductor layer on which the first conductive electrode and the second conductive electrode are disposed, respectively, the second conductive electrode and the second conductive electrode. The conductive semiconductor layer may be covered by an insulating part, and the reflective particles may be formed to cover the insulating part.
또한, 본 발명은, 기판상에 제1도전형 반도체층, 활성층 및 제2도전형 반도체층을 성장시키는 단계와, 식각을 통하여 상기 기판상에서 반도체 발광소자들의 어레이를 형성하고, 상기 반도체 발광소자들에 적어도 하나의 도전형 전극을 형성하는 단계와, 상기 반도체 발광소자들의 어레이에서 상기 반도체 발광소자들의 사이에 빛을 반사하는 반사입자들을 충전하는 단계, 및 상기 반사입자들을 충전된 반도체 발광소자들의 어레이를 배선기판과 연결하고 상기 기판을 제거하는 단계를 포함하는 디스플레이 장치의 제조방법을 개시한다.In addition, the present invention is to grow a first conductive semiconductor layer, an active layer and a second conductive semiconductor layer on a substrate, forming an array of semiconductor light emitting elements on the substrate through etching, the semiconductor light emitting device Forming at least one conductivity type electrode in the semiconductor, charging the reflective particles reflecting light between the semiconductor light emitting elements in the array of semiconductor light emitting elements, and the array of semiconductor light emitting elements charged with the reflective particles. A method of manufacturing a display apparatus, the method comprising: connecting a wiring board to a wiring board and removing the board.
실시 예에 있어서, 상기 충전하는 단계는, 상기 반사입자들을 상기 반도체 발광소자들의 어레이에 도포하는 단계, 및 롤링을 통하여 상기 도포된 반사입자들을 상기 반도체 발광소자들의 사이에 충전하는 단계를 포함한다.In an embodiment, the charging may include applying the reflective particles to the array of semiconductor light emitting devices, and filling the coated reflective particles between the semiconductor light emitting devices through rolling.
실시 예에 있어서, 상기 기판상에서 반도체 발광소자들의 어레이를 형성한 후에, 상기 제2도전형 반도체층에는 제2도전형 전극이 적층된다. 상기 반사입자들이 상기 반도체 발광소자들의 사이에 충전된 후에, 상기 제1도전형 반도체층에는 제1도전형 전극이 적층된다.In example embodiments, after forming an array of semiconductor light emitting devices on the substrate, a second conductive electrode is stacked on the second conductive semiconductor layer. After the reflective particles are filled between the semiconductor light emitting devices, a first conductive electrode is stacked on the first conductive semiconductor layer.
본 발명에 따른 디스플레이 장치에서는, 반도체 발광소자들의 개별 소자의 주변이 반사입자로 둘러싸임에 따라, 반도체 발광소자들의 측면 발광 빛을 상부로 유도하게 된다. 또한, 형광체로 여기된 빛의 궤도상 하부로 향하는 빛을 반사시킬 수 있게 된다. 이를 통하여, 디스플레이 장치의 휘도가 향상될 수 있다.In the display device according to the present invention, as the periphery of the individual elements of the semiconductor light emitting devices is surrounded by the reflective particles, the side emitting light of the semiconductor light emitting devices is directed upward. In addition, it is possible to reflect the light toward the lower portion on the track of the light excited by the phosphor. Through this, the brightness of the display device may be improved.
또한, 본 발명에서는, 반사입자들이 반도체 발광소자들의 측면에 배치됨에 따라, 상기 측면에서 발산하는 빛을 차단하여 디스플레이 장치에서 혼색을 방지하게 된다.In addition, in the present invention, as the reflective particles are disposed on the side surfaces of the semiconductor light emitting devices, the mixed light is prevented in the display device by blocking the light emitted from the side surfaces.
또한, 본 발명에서는, 반사입자를 도포하여, 반도체 발광소자들의 개별 소자를 감싸는 구조에 따라, 간단한 제법임에도 불구하고 디스플레이 장치의 휘도 향상이 구현될 수 있다.In addition, in the present invention, by applying the reflective particles, the structure of surrounding the individual elements of the semiconductor light emitting device, despite the simple manufacturing method can be implemented to improve the brightness of the display device.
또한, 본 발명에서는, 절연성의 반사입자가 도전형 전극와 오버랩됨에 따라, 도전성 접착층의 도전볼로부터 상기 도전형 전극이 보호될 수 있다.In addition, in the present invention, as the insulating reflective particles overlap with the conductive electrode, the conductive electrode may be protected from the conductive ball of the conductive adhesive layer.
도 1은 본 발명의 반도체 발광 소자를 이용한 디스플레이 장치의 일 실시예를 나타내는 개념도이다.1 is a conceptual diagram illustrating an embodiment of a display device using the semiconductor light emitting device of the present invention.
도 2는 도 1의 A부분의 부분 확대도이고, 도 3a 및 도 3b는 도 2의 라인 B-B 및 C-C를 따라 취한 단면도들이다.2 is an enlarged view of a portion A of FIG. 1, and FIGS. 3A and 3B are cross-sectional views taken along the lines B-B and C-C of FIG. 2.
도 4는 도 3의 플립 칩 타입 반도체 발광 소자를 나타내는 개념도이다.4 is a conceptual diagram illustrating the flip chip type semiconductor light emitting device of FIG. 3.
도 5a 내지 도 5c는 플립 칩 타입 반도체 발광 소자와 관련하여 컬러를 구현하는 여러가지 형태를 나타내는 개념도들이다.5A through 5C are conceptual views illustrating various forms of implementing colors in connection with a flip chip type semiconductor light emitting device.
도 6은 본 발명의 반도체 발광 소자를 이용한 디스플레이 장치의 제조방법을 나타낸 단면도들이다.6 is a cross-sectional view illustrating a method of manufacturing a display device using the semiconductor light emitting device of the present invention.
도 7은 발명의 반도체 발광 소자를 이용한 디스플레이 장치의 다른 일 실시예를 나타내는 사시도이다.7 is a perspective view showing another embodiment of a display device using the semiconductor light emitting device of the invention.
도 8은 도 7의 라인 D-D를 따라 취한 단면도이다.FIG. 8 is a cross-sectional view taken along the line D-D of FIG. 7.
도 9는 도 8의 수직형 반도체 발광소자를 나타내는 개념도이다.9 is a conceptual diagram illustrating the vertical semiconductor light emitting device of FIG. 8.
도 10은 새로운 구조의 반도체 발광소자가 적용된 본 발명의 다른 실시 예를 설명하기 위한, 도 1의 A부분의 확대도이다.FIG. 10 is an enlarged view of portion A of FIG. 1 for explaining another embodiment of the present invention to which a semiconductor light emitting device having a new structure is applied.
도 11a는 도 10의 라인 E-E를 따라 취한 단면도이다.FIG. 11A is a cross-sectional view taken along the line E-E of FIG. 10.
도 11b는 도 11의 라인 F-F를 따라 취한 단면도이다.FIG. 11B is a cross-sectional view taken along the line F-F of FIG. 11.
도 12는 도 11a의 플립 칩 타입 반도체 발광 소자를 나타내는 개념도이다.12 is a conceptual diagram illustrating the flip chip type semiconductor light emitting device of FIG. 11A.
도 13은 본 발명의 또 다른 실시 예를 설명하기 위한, 도 1의 A부분의 확대도이다.FIG. 13 is an enlarged view of a portion A of FIG. 1 for explaining still another embodiment of the present invention.
도 14는 도 13의 G-G를 따라 취한 단면도이며, 도 15는 도 13의 H-H를 따라 취한 단면도이다.FIG. 14 is a cross-sectional view taken along the line G-G of FIG. 13, and FIG. 15 is a cross-sectional view taken along the line H-H of FIG. 13.
도 16a, 도 16b, 도 16c, 도 16d, 도 16e, 도 16f, 도 16g, 도 16h, 도 17a, 도 17b 및 도 17c는 본 발명의 반도체 발광 소자를 이용한 디스플레이 장치의 제조방법을 나타낸 단면도들이다.16A, 16B, 16C, 16D, 16E, 16F, 16G, 16H, 17A, 17B, and 17C are cross-sectional views illustrating a method of manufacturing a display device using the semiconductor light emitting device according to the present invention. .
이하, 첨부된 도면을 참조하여 본 명세서에 개시된 실시 예를 상세히 설명하되, 도면 부호에 관계없이 동일하거나 유사한 구성요소는 동일한 참조 번호를 부여하고 이에 대한 중복되는 설명은 생략하기로 한다. 이하의 설명에서 사용되는 구성요소에 대한 접미사 "모듈" 및 "부"는 명세서 작성의 용이함만이 고려되어 부여되거나 혼용되는 것으로서, 그 자체로 서로 구별되는 의미 또는 역할을 갖는 것은 아니다. 또한, 본 명세서에 개시된 실시 예를 설명함에 있어서 관련된 공지 기술에 대한 구체적인 설명이 본 명세서에 개시된 실시 예의 요지를 흐릴 수 있다고 판단되는 경우 그 상세한 설명을 생략한다. 또한, 첨부된 도면은 본 명세서에 개시된 실시 예를 쉽게 이해할 수 있도록 하기 위한 것일 뿐, 첨부된 도면에 의해 본 명세서에 개시된 기술적 사상이 제한되는 것으로 해석되어서는 아니 됨을 유의해야 한다.Hereinafter, embodiments of the present disclosure will be described in detail with reference to the accompanying drawings, and the same or similar components are denoted by the same reference numerals regardless of the reference numerals, and redundant description thereof will be omitted. The suffixes "module" and "unit" for components used in the following description are given or used in consideration of ease of specification, and do not have distinct meanings or roles from each other. In addition, in describing the embodiments disclosed herein, when it is determined that the detailed description of the related known technology may obscure the gist of the embodiments disclosed herein, the detailed description thereof will be omitted. In addition, it should be noted that the accompanying drawings are only for easily understanding the embodiments disclosed in the present specification and are not to be construed as limiting the technical spirit disclosed in the present specification by the accompanying drawings.
또한, 층, 영역 또는 기판과 같은 요소가 다른 구성요소 "상(on)"에 존재하는 것으로 언급될 때, 이것은 직접적으로 다른 요소 상에 존재하거나 또는 그 사이에 중간 요소가 존재할 수도 있다는 것을 이해할 수 있을 것이다.Also, when an element such as a layer, region or substrate is referred to as being on another component "on", it is to be understood that it may be directly on another element or intermediate elements may be present therebetween. There will be.
본 명세서에서 설명되는 디스플레이 장치에는 휴대폰, 스마트 폰(smart phone), 노트북 컴퓨터(laptop computer), 디지털방송용 단말기, PDA(personal digital assistants), PMP(portable multimedia player), 네비게이션, 슬레이트 피씨(Slate PC), Tablet PC, Ultra Book, 디지털 TV, 데스크탑 컴퓨터 등이 포함될 수 있다. 그러나, 본 명세서에 기재된 실시 예에 따른 구성은 추후 개발되는 새로운 제품형태이라도, 디스플레이가 가능한 장치에는 적용될 수도 있음을 본 기술분야의 당업자라면 쉽게 알 수 있을 것이다.The display device described herein includes a mobile phone, a smart phone, a laptop computer, a digital broadcasting terminal, a personal digital assistant (PDA), a portable multimedia player (PMP), navigation, and a slate PC. , Tablet PC, Ultra Book, digital TV, desktop computer. However, it will be readily apparent to those skilled in the art that the configuration according to the embodiments described herein may be applied to a device capable of displaying even a new product form developed later.
도 1은 본 발명의 반도체 발광 소자를 이용한 디스플레이 장치의 일 실시예를 나타내는 개념도이다.1 is a conceptual diagram illustrating an embodiment of a display device using the semiconductor light emitting device of the present invention.
도시에 의하면, 디스플레이 장치(100)의 제어부에서 처리되는 정보는 플렉서블 디스플레이(flexible display)를 이용하여 표시될 수 있다. According to an embodiment, the information processed by the controller of the display apparatus 100 may be displayed using a flexible display.
플렉서블 디스플레이는 외력에 의하여 휘어질 수 있는, 구부러질 수 있는, 비틀어질 수 있는, 접힐 수 있는, 말려질 수 있는 디스플레이를 포함한다. 예를 들어, 플렉서블 디스플레이는 기존의 평판 디스플레이의 디스플레이 특성을 유지하면서, 종이와 같이 휘어지거나, 구부리거나, 접을 수 있거나 말 수 있는 얇고 유연한 기판 위에 제작되는 디스플레이가 될 수 있다.The flexible display includes a display that can be bent, bent, twisted, foldable, or rollable by external force. For example, a flexible display can be a display fabricated on a thin, flexible substrate that can be bent, bent, folded, or rolled like a paper while maintaining the display characteristics of a conventional flat panel display.
상기 플렉서블 디스플레이가 휘어지지 않는 상태(예를 들어, 무한대의 곡률반경을 가지는 상태, 이하 제1상태라 한다)에서는 상기 플렉서블 디스플레이의 디스플레이 영역이 평면이 된다. 상기 제1상태에서 외력에 의하여 휘어진 상태(예를 들어, 유한의 곡률반경을 가지는 상태, 이하, 제2상태라 한다)에서는 상기 디스플레이 영역이 곡면이 될 수 있다. 도시와 같이, 상기 제2상태에서 표시되는 정보는 곡면상에 출력되는 시각 정보가 될 수 있다. 이러한 시각 정보는 매트릭스 형태로 배치되는 단위 화소(sub-pixel)의 발광이 독자적으로 제어됨에 의하여 구현된다. 상기 단위 화소는 하나의 색을 구현하기 위한 최소 단위를 의미한다.In a state where the flexible display is not bent (for example, a state having an infinite curvature radius, hereinafter referred to as a first state), the display area of the flexible display becomes flat. The display area may be a curved surface in a state in which the first state is bent by an external force (for example, a state having a finite radius of curvature, hereinafter referred to as a second state). As shown in the drawing, the information displayed in the second state may be visual information output on a curved surface. Such visual information is implemented by independently controlling light emission of a sub-pixel disposed in a matrix form. The unit pixel refers to a minimum unit for implementing one color.
상기 플렉서블 디스플레이의 단위 화소는 반도체 발광 소자에 의하여 구현될 수 있다. 본 발명에서는 전류를 빛으로 변환시키는 반도체 발광 소자의 일 종류로서 발광 다이오드(Light Emitting Diode: LED)를 예시한다. 상기 발광 다이오드는 작은 크기로 형성되며, 이를 통하여 상기 제2상태에서도 단위 화소의 역할을 할 수 있게 된다.The unit pixel of the flexible display may be implemented by a semiconductor light emitting device. In the present invention, a light emitting diode (LED) is exemplified as a type of semiconductor light emitting device that converts current into light. The light emitting diode is formed to have a small size, thereby enabling it to serve as a unit pixel even in the second state.
이하, 상기 발광 다이오드를 이용하여 구현된 플렉서블 디스플레이에 대하여 도면을 참조하여 보다 상세히 설명한다.Hereinafter, a flexible display implemented using the light emitting diode will be described in more detail with reference to the accompanying drawings.
도 2는 도 1의 A부분의 부분 확대도이고, 도 3a 및 도 3b는 도 2의 라인 B-B 및 C-C를 따라 취한 단면도들이며, 도 4는 도 3a의 플립 칩 타입 반도체 발광 소자를 나타내는 개념도이고, 도 5a 내지 도 5c는 플립 칩 타입 반도체 발광 소자와 관련하여 컬러를 구현하는 여러가지 형태를 나타내는 개념도들이다.FIG. 2 is a partially enlarged view of portion A of FIG. 1, FIGS. 3A and 3B are cross-sectional views taken along lines BB and CC of FIG. 2, and FIG. 4 is a conceptual diagram illustrating a flip chip type semiconductor light emitting device of FIG. 3A. 5A through 5C are conceptual views illustrating various forms of implementing colors in connection with a flip chip type semiconductor light emitting device.
도 2, 도 3a 및 도 3b의 도시에 의하면, 반도체 발광 소자를 이용한 디스플레이 장치(100)로서 패시브 매트릭스(Passive Matrix, PM) 방식의 반도체 발광 소자를 이용한 디스플레이 장치(100)를 예시한다. 다만, 이하 설명되는 예시는 액티브 매트릭스(Active Matrix, AM) 방식의 반도체 발광 소자에도 적용 가능하다.Referring to FIGS. 2, 3A, and 3B, a display device 100 using a passive matrix (PM) type semiconductor light emitting device is illustrated as a display device 100 using a semiconductor light emitting device. However, the example described below is also applicable to an active matrix (AM) type semiconductor light emitting device.
상기 디스플레이 장치(100)는 기판(110), 제1전극(120), 전도성 접착층(130), 제2전극(140) 및 복수의 반도체 발광 소자(150)를 포함한다.The display apparatus 100 includes a substrate 110, a first electrode 120, a conductive adhesive layer 130, a second electrode 140, and a plurality of semiconductor light emitting devices 150.
기판(110)은 플렉서블 기판일 수 있다. 예를 들어, 플렉서블(flexible) 디스플레이 장치를 구현하기 위하여 기판(110)은 유리나 폴리이미드(PI, Polyimide)를 포함할 수 있다. 이외에도 절연성이 있고, 유연성 있는 재질이면, 예를 들어 PEN(Polyethylene Naphthalate), PET(Polyethylene Terephthalate) 등 어느 것이라도 사용될 수 있다. 또한, 상기 기판(110)은 투명한 재질 또는 불투명한 재질 어느 것이나 될 수 있다.The substrate 110 may be a flexible substrate. For example, in order to implement a flexible display device, the substrate 110 may include glass or polyimide (PI). In addition, any material such as polyethylene naphthalate (PEN) or polyethylene terephthalate (PET) may be used as long as it is an insulating and flexible material. In addition, the substrate 110 may be either a transparent material or an opaque material.
상기 기판(110)은 제1전극(120)이 배치되는 배선기판이 될 수 있으며, 따라서 상기 제1전극(120)은 기판(110) 상에 위치할 수 있다.The substrate 110 may be a wiring board on which the first electrode 120 is disposed, and thus the first electrode 120 may be positioned on the substrate 110.
도시에 의하면, 절연층(160)은 제1전극(120)이 위치한 기판(110) 상에 배치될 수 있으며, 상기 절연층(160)에는 보조전극(170)이 위치할 수 있다. 이 경우에, 상기 기판(110)에 절연층(160)이 적층된 상태가 하나의 배선기판이 될 수 있다. 보다 구체적으로, 절연층(160)은 폴리이미드(PI, Polyimide), PET, PEN 등과 같이 절연성이 있고, 유연성 있는 재질로, 상기 기판(110)과 일체로 이루어져 하나의 기판을 형성할 수 있다.In some embodiments, the insulating layer 160 may be disposed on the substrate 110 on which the first electrode 120 is disposed, and the auxiliary electrode 170 may be positioned on the insulating layer 160. In this case, a state in which the insulating layer 160 is stacked on the substrate 110 may be one wiring board. More specifically, the insulating layer 160 is made of an insulating and flexible material such as polyimide (PI, Polyimide), PET, and PEN, and can be formed integrally with the substrate 110 to form one substrate.
보조전극(170)은 제1전극(120)과 반도체 발광 소자(150)를 전기적으로 연결하는 전극으로서, 절연층(160) 상에 위치하고, 제1전극(120)의 위치에 대응하여 배치된다. 예를 들어, 보조전극(170)은 닷(dot) 형태이며, 절연층(160)을 관통하는 전극홀(171)에 의하여 제1전극(120)과 전기적으로 연결될 수 있다. 상기 전극홀(171)은 비아 홀에 도전물질이 채워짐에 의하여 형성될 수 있다.The auxiliary electrode 170 is an electrode that electrically connects the first electrode 120 and the semiconductor light emitting device 150. The auxiliary electrode 170 is disposed on the insulating layer 160 and disposed to correspond to the position of the first electrode 120. For example, the auxiliary electrode 170 may have a dot shape and may be electrically connected to the first electrode 120 by an electrode hole 171 passing through the insulating layer 160. The electrode hole 171 may be formed by filling a via material with a conductive material.
본 도면들을 참조하면, 절연층(160)의 일면에는 전도성 접착층(130)이 형성되나, 본 발명은 반드시 이에 한정되는 것은 아니다. 예를 들어, 절연층(160)과 전도성 접착층(130)의 사이에 특정 기능을 수행하는 레이어가 형성되거나, 절연층(160)이 없이 전도성 접착층(130)이 기판(110)상에 배치되는 구조도 가능하다. 전도성 접착층(130)이 기판(110)상에 배치되는 구조에서는 전도성 접착층(130)이 절연층의 역할을 할 수 있다.Referring to the drawings, the conductive adhesive layer 130 is formed on one surface of the insulating layer 160, but the present invention is not necessarily limited thereto. For example, a layer is formed between the insulating layer 160 and the conductive adhesive layer 130 or a structure in which the conductive adhesive layer 130 is disposed on the substrate 110 without the insulating layer 160. It is also possible. In the structure in which the conductive adhesive layer 130 is disposed on the substrate 110, the conductive adhesive layer 130 may serve as an insulating layer.
상기 전도성 접착층(130)은 접착성과 전도성을 가지는 층이 될 수 있으며, 이를 위하여 상기 전도성 접착층(130)에서는 전도성을 가지는 물질과 접착성을 가지는 물질이 혼합될 수 있다. 또한 전도성 접착층(130)은 연성을 가지며, 이를 통하여 디스플레이 장치에서 플렉서블 기능을 가능하게 한다.The conductive adhesive layer 130 may be a layer having adhesiveness and conductivity. For this purpose, the conductive adhesive layer 130 may be mixed with a conductive material and an adhesive material. In addition, the conductive adhesive layer 130 is flexible, thereby enabling a flexible function in the display device.
이러한 예로서, 전도성 접착층(130)은 이방성 전도성 필름(anistropy conductive film, ACF), 이방성 전도 페이스트(paste), 전도성 입자를 함유한 솔루션(solution) 등이 될 수 있다. 상기 전도성 접착층(130)은 두께를 관통하는 Z 방향으로는 전기적 상호 연결을 허용하나, 수평적인 X-Y 방향으로는 전기절연성을 가지는 레이어로서 구성될 수 있다. 따라서 상기 전도성 접착층(130)은 Z축 전도층으로 명명될 수 있다(다만, 이하 '전도성 접착층'이라 한다).In this example, the conductive adhesive layer 130 may be an anisotropic conductive film (ACF), an anisotropic conductive paste, a solution containing conductive particles, or the like. The conductive adhesive layer 130 allows electrical interconnection in the Z direction through the thickness, but may be configured as a layer having electrical insulation in the horizontal X-Y direction. Therefore, the conductive adhesive layer 130 may be referred to as a Z-axis conductive layer (however, hereinafter referred to as a 'conductive adhesive layer').
상기 이방성 전도성 필름은 이방성 전도매질(anisotropic conductive medium)이 절연성 베이스부재에 혼합된 형태의 필름으로서, 열 및 압력이 가해지면 특정 부분만 이방성 전도매질에 의하여 전도성을 가지게 된다. 이하, 상기 이방성 전도성 필름에는 열 및 압력이 가해지는 것으로 설명하나, 상기 이방성 전도성 필름이 부분적으로 전도성을 가지기 위하여 다른 방법도 가능하다. 이러한 방법은, 예를 들어 상기 열 및 압력 중 어느 하나만이 가해지거나 UV 경화 등이 될 수 있다.The anisotropic conductive film is a film in which an anisotropic conductive medium is mixed with an insulating base member. When the heat and pressure are applied, only the specific portion is conductive by the anisotropic conductive medium. Hereinafter, although the heat and pressure is applied to the anisotropic conductive film, other methods are possible in order for the anisotropic conductive film to be partially conductive. Such a method can be, for example, only one of the heat and pressure applied or UV curing or the like.
또한, 상기 이방성 전도매질은 예를 들어, 도전볼이나 전도성 입자가 될 수 있다. 도시에 의하면, 본 예시에서 상기 이방성 전도성 필름은 도전볼이 절연성 베이스 부재에 혼합된 형태의 필름으로서, 열 및 압력이 가해지면 특정부분만 도전볼에 의하여 전도성을 가지게 된다. 이방성 전도성 필름은 전도성 물질의 코어가 폴리머 재질의 절연막에 의하여 피복된 복수의 입자가 함유된 상태가 될 수 있으며, 이 경우에 열 및 압력이 가해진 부분이 절연막이 파괴되면서 코어에 의하여 도전성을 가지게 된다. 이때, 코어의 형태는 변형되어 필름의 두께방향으로 서로 접촉하는 층을 이룰 수 있다. 보다 구체적인 예로서, 열 및 압력은 이방성 전도성 필름에 전체적으로 가해지며, 이방성 전도성 필름에 의하여 접착되는 상대물의 높이차에 의하여 Z축 방향의 전기적 연결이 부분적으로 형성된다.In addition, the anisotropic conductive medium may be, for example, conductive balls or conductive particles. According to the drawing, the anisotropic conductive film in this example is a film in which the conductive ball is mixed with the insulating base member, and only a specific portion of the conductive ball is conductive when heat and pressure are applied. The anisotropic conductive film may be in a state in which a core of a conductive material contains a plurality of particles coated by an insulating film made of a polymer material, and in this case, a portion to which heat and pressure are applied becomes conductive by the core as the insulating film is destroyed. . At this time, the shape of the core may be deformed to form a layer in contact with each other in the thickness direction of the film. As a more specific example, heat and pressure are applied to the anisotropic conductive film as a whole, and the electrical connection in the Z-axis direction is partially formed by the height difference of the counterpart bonded by the anisotropic conductive film.
다른 예로서, 이방성 전도성 필름은 절연 코어에 전도성 물질이 피복된 복수의 입자가 함유된 상태가 될 수 있다. 이 경우에는 열 및 압력이 가해진 부분이 전도성 물질이 변형되어(눌러 붙어서) 필름의 두께방향으로 전도성을 가지게 된다. 또 다른 예로서, 전도성 물질이 Z축 방향으로 절연성 베이스 부재를 관통하여 필름의 두께방향으로 전도성을 가지는 형태도 가능하다. 이 경우에, 전도성 물질은 뽀족한 단부를 가질 수 있다.As another example, the anisotropic conductive film may be in a state containing a plurality of particles coated with a conductive material on the insulating core. In this case, the portion to which the heat and pressure are applied is deformed (pressed) to have conductivity in the thickness direction of the film. As another example, the conductive material may penetrate the insulating base member in the Z-axis direction and have conductivity in the thickness direction of the film. In this case, the conductive material may have a pointed end.
도시에 의하면, 상기 이방성 전도성 필름은 도전볼이 절연성 베이스 부재의 일면에 삽입된 형태로 구성되는 고정배열 이방성 전도성 필름(fixed array ACF)가 될 수 있다. 보다 구체적으로, 절연성 베이스부재는 접착성을 가지는 물질로 형성되며, 도전볼은 상기 절연성 베이스부재의 바닥부분에 집중적으로 배치되며, 상기 베이스부재에서 열 및 압력이 가해지면 상기 도전볼과 함께 변형됨에 따라 수직방향으로 전도성을 가지게 된다.According to the illustration, the anisotropic conductive film may be a fixed array anisotropic conductive film (fixed array ACF) consisting of a conductive ball inserted into one surface of the insulating base member. More specifically, the insulating base member is formed of an adhesive material, and the conductive ball is concentrated on the bottom portion of the insulating base member, and deforms with the conductive ball when heat and pressure are applied to the base member. Therefore, it has conductivity in the vertical direction.
다만, 본 발명은 반드시 이에 한정되는 것은 아니며, 상기 이방성 전도성 필름은 절연성 베이스부재에 도전볼이 랜덤하게 혼입된 형태나, 복수의 층으로 구성되며 어느 한 층에 도전볼이 배치되는 형태(double-ACF) 등이 모두 가능하다.However, the present invention is not necessarily limited thereto, and the anisotropic conductive film has a form in which conductive balls are randomly mixed in an insulating base member or a plurality of layers, in which a conductive ball is disposed in one layer (double- ACF) etc. are all possible.
이방성 전도 페이스트는 페이스트와 도전볼의 결합형태로서, 절연성 및 접착성의 베이스 물질에 도전볼이 혼합된 페이스트가 될 수 있다. 또한, 전도성 입자를 함유한 솔루션은 전도성 particle 혹은 nano 입자를 함유한 형태의 솔루션이 될 수 있다.The anisotropic conductive paste is a combination of a paste and a conductive ball, and may be a paste in which conductive balls are mixed with an insulating and adhesive base material. In addition, solutions containing conductive particles can be solutions in the form of conductive particles or nanoparticles.
다시 도면을 참조하면, 제2전극(140)은 보조전극(170)과 이격하여 절연층(160)에 위치한다. 즉, 상기 전도성 접착층(130)은 보조전극(170) 및 제2전극(140)이 위치하는 절연층(160) 상에 배치된다.Referring to the drawing again, the second electrode 140 is positioned on the insulating layer 160 spaced apart from the auxiliary electrode 170. That is, the conductive adhesive layer 130 is disposed on the insulating layer 160 on which the auxiliary electrode 170 and the second electrode 140 are located.
절연층(160)에 보조전극(170)과 제2전극(140)이 위치된 상태에서 전도성 접착층(130)을 형성한 후에, 반도체 발광 소자(150)를 열 및 압력을 가하여 플립 칩 형태로 접속시키면, 상기 반도체 발광 소자(150)는 제1전극(120) 및 제2전극(140)과 전기적으로 연결된다. After the conductive adhesive layer 130 is formed in the state where the auxiliary electrode 170 and the second electrode 140 are positioned on the insulating layer 160, the semiconductor light emitting device 150 is connected in a flip chip form by applying heat and pressure. In this case, the semiconductor light emitting device 150 is electrically connected to the first electrode 120 and the second electrode 140.
도 4를 참조하면, 상기 반도체 발광 소자는 플립 칩 타입(flip chip type)의 발광 소자가 될 수 있다.Referring to FIG. 4, the semiconductor light emitting device may be a flip chip type light emitting device.
예를 들어, 상기 반도체 발광 소자는 p형 전극(156), p형 전극(156)이 형성되는 p형 반도체층(155), p형 반도체층(155) 상에 형성된 활성층(154), 활성층(154) 상에 형성된 n형 반도체층(153) 및 n형 반도체층(153) 상에서 p형 전극(156)과 수평방향으로 이격 배치되는 n형 전극(152)을 포함한다. 이 경우, p형 전극(156)은 보조전극(170)과 전도성 접착층(130)에 의하여 전기적으로 연결될 수 있고, n형 전극(152)은 제2전극(140)과 전기적으로 연결될 수 있다. For example, the semiconductor light emitting device may include a p-type electrode 156, a p-type semiconductor layer 155 on which the p-type electrode 156 is formed, an active layer 154 formed on the p-type semiconductor layer 155, and an active layer ( The n-type semiconductor layer 153 formed on the 154 and the n-type electrode 152 disposed horizontally spaced apart from the p-type electrode 156 on the n-type semiconductor layer 153. In this case, the p-type electrode 156 may be electrically connected to the auxiliary electrode 170 by the conductive adhesive layer 130, and the n-type electrode 152 may be electrically connected to the second electrode 140.
다시 도 2, 도 3a 및 도 3b를 참조하면, 보조전극(170)은 일방향으로 길게 형성되어, 하나의 보조전극이 복수의 반도체 발광 소자(150)에 전기적으로 연결될 수 있다. 예를 들어, 보조전극을 중심으로 좌우의 반도체 발광 소자들의 p형 전극들이 하나의 보조전극에 전기적으로 연결될 수 있다.Referring to FIGS. 2, 3A, and 3B, the auxiliary electrode 170 is formed to be long in one direction, and one auxiliary electrode may be electrically connected to the plurality of semiconductor light emitting devices 150. For example, the p-type electrodes of the left and right semiconductor light emitting devices around the auxiliary electrode may be electrically connected to one auxiliary electrode.
보다 구체적으로, 열 및 압력에 의하여 전도성 접착층(130)의 내부로 반도체 발광 소자(150)가 압입되며, 이를 통하여 반도체 발광 소자(150)의 p형 전극(156)과 보조전극(170) 사이의 부분과, 반도체 발광 소자(150)의 n형 전극(152)과 제2전극(140) 사이의 부분에서만 전도성을 가지게 되고, 나머지 부분에서는 반도체 발광 소자의 압입이 없어 전도성을 가지지 않게 된다. 이와 같이, 전도성 접착층(130)은 반도체 발광 소자(150)와 보조전극(170) 사이 및 반도체 발광 소자(150)와 제2전극(140) 사이를 상호 결합시켜줄 뿐만 아니라 전기적 연결까지 형성시킨다.More specifically, the semiconductor light emitting device 150 is press-fitted into the conductive adhesive layer 130 by heat and pressure, and thus, between the p-type electrode 156 and the auxiliary electrode 170 of the semiconductor light emitting device 150. Only the portion and the portion between the n-type electrode 152 and the second electrode 140 of the semiconductor light emitting device 150 have conductivity, and the rest of the semiconductor light emitting device does not have a press-fitted conductivity. As such, the conductive adhesive layer 130 not only couples the semiconductor light emitting device 150 and the auxiliary electrode 170 and between the semiconductor light emitting device 150 and the second electrode 140 but also forms an electrical connection.
또한, 복수의 반도체 발광 소자(150)는 발광 소자 어레이(array)를 구성하며, 발광 소자 어레이에는 형광체층(180)이 형성된다. In addition, the plurality of semiconductor light emitting devices 150 constitute an array of light emitting devices, and a phosphor layer 180 is formed on the light emitting device array.
발광 소자 어레이는 자체 휘도값이 상이한 복수의 반도체 발광 소자들을 포함할 수 있다. 각각의 반도체 발광 소자(150)는 단위 화소를 구성하며, 제1전극(120)에 전기적으로 연결된다. 예를 들어, 제1전극(120)은 복수 개일 수 있고, 반도체 발광 소자들은 예컨대 수 열로 배치되며, 각 열의 반도체 발광 소자들은 상기 복수 개의 제1전극 중 어느 하나에 전기적으로 연결될 수 있다.The light emitting device array may include a plurality of semiconductor light emitting devices having different luminance values. Each semiconductor light emitting device 150 constitutes a unit pixel and is electrically connected to the first electrode 120. For example, a plurality of first electrodes 120 may be provided, the semiconductor light emitting devices may be arranged in several rows, and the semiconductor light emitting devices may be electrically connected to any one of the plurality of first electrodes.
또한, 반도체 발광 소자들이 플립 칩 형태로 접속되므로, 투명 유전체 기판에 성장시킨 반도체 발광 소자들을 이용할 수 있다. 또한, 상기 반도체 발광 소자들은 예컨대 질화물 반도체 발광 소자일 수 있다. 반도체 발광 소자(150)는 휘도가 우수하므로, 작은 크기로도 개별 단위 픽셀을 구성할 수 있다.In addition, since the semiconductor light emitting devices are connected in a flip chip form, semiconductor light emitting devices grown on a transparent dielectric substrate may be used. In addition, the semiconductor light emitting devices may be, for example, nitride semiconductor light emitting devices. Since the semiconductor light emitting device 150 has excellent brightness, individual unit pixels may be configured with a small size.
도시에 의하면, 반도체 발광 소자(150)의 사이에 격벽(190)이 형성될 수 있다. 이 경우, 격벽(190)은 개별 단위 화소를 서로 분리하는 역할을 할 수 있으며, 전도성 접착층(130)과 일체로 형성될 수 있다. 예를 들어, 이방성 전도성 필름에 반도체 발광 소자(150)가 삽입됨에 의하여 이방성 전도성 필름의 베이스부재가 상기 격벽을 형성할 수 있다. According to an embodiment, the partition wall 190 may be formed between the semiconductor light emitting devices 150. In this case, the partition wall 190 may serve to separate the individual unit pixels from each other, and may be integrally formed with the conductive adhesive layer 130. For example, when the semiconductor light emitting device 150 is inserted into the anisotropic conductive film, the base member of the anisotropic conductive film may form the partition wall.
또한, 상기 이방성 전도성 필름의 베이스부재가 블랙이면, 별도의 블랙 절연체가 없어도 상기 격벽(190)이 반사 특성을 가지는 동시에 대비비(contrast)가 증가될 수 있다.In addition, when the base member of the anisotropic conductive film is black, even if there is no separate black insulator, the partition 190 may have reflective properties and contrast may be increased.
다른 예로서, 상기 격벽(190)으로 반사성 격벽이 별도로 구비될 수 있다. 이 경우에, 상기 격벽(190)은 디스플레이 장치의 목적에 따라 블랙(Black) 또는 화이트(White) 절연체를 포함할 수 있다. 화이트 절연체의 격벽을 이용할 경우 반사성을 높이는 효과가 있을 수 있고, 블랙 절연체의 격벽을 이용할 경우, 반사 특성을 가지는 동시에 대비비(contrast)를 증가시킬 수 있다.As another example, a reflective partition may be separately provided as the partition 190. In this case, the partition 190 may include a black or white insulator according to the purpose of the display device. When the partition wall of the white insulator is used, the reflectivity may be improved, and when the partition wall of the black insulator is used, the contrast may be increased at the same time.
형광체층(180)은 반도체 발광 소자(150)의 외면에 위치할 수 있다. 예를 들어, 반도체 발광 소자(150)는 청색(B) 광을 발광하는 청색 반도체 발광 소자이고, 형광체층(180)은 상기 청색(B) 광을 단위 화소의 색상으로 변환시키는 기능을 수행한다. 상기 형광체층(180)은 개별 화소를 구성하는 적색 형광체(181) 또는 녹색 형광체(182)가 될 수 있다. The phosphor layer 180 may be located on the outer surface of the semiconductor light emitting device 150. For example, the semiconductor light emitting device 150 is a blue semiconductor light emitting device that emits blue (B) light, and the phosphor layer 180 performs a function of converting the blue (B) light into the color of a unit pixel. The phosphor layer 180 may be a red phosphor 181 or a green phosphor 182 constituting individual pixels.
즉, 적색의 단위 화소를 이루는 위치에서, 청색 반도체 발광 소자(151) 상에는 청색 광을 적색(R) 광으로 변환시킬 수 있는 적색 형광체(181)가 적층될 수 있고, 녹색의 단위 화소를 이루는 위치에서는, 청색 반도체 발광 소자(151) 상에 청색 광을 녹색(G) 광으로 변환시킬 수 있는 녹색 형광체(182)가 적층될 수 있다. 또한, 청색의 단위 화소를 이루는 부분에는 청색 반도체 발광 소자(151)만 단독으로 이용될 수 있다. 이 경우, 적색(R), 녹색(G) 및 청색(B)의 단위 화소들이 하나의 화소를 이룰 수 있다. 보다 구체적으로, 제1전극(120)의 각 라인을 따라 하나의 색상의 형광체가 적층될 수 있다. 따라서, 제1전극(120)에서 하나의 라인은 하나의 색상을 제어하는 전극이 될 수 있다. 즉, 제2전극(140)을 따라서, 적색(R), 녹색(G) 및 청색(B)이 차례로 배치될 수 있으며, 이를 통하여 단위 화소가 구현될 수 있다.That is, a red phosphor 181 capable of converting blue light into red (R) light may be stacked on the blue semiconductor light emitting element 151 at a position forming a red unit pixel, and a position forming a green unit pixel. In FIG. 3, a green phosphor 182 capable of converting blue light into green (G) light may be stacked on the blue semiconductor light emitting device 151. In addition, only the blue semiconductor light emitting device 151 may be used alone in a portion of the blue unit pixel. In this case, the unit pixels of red (R), green (G), and blue (B) may form one pixel. More specifically, phosphors of one color may be stacked along each line of the first electrode 120. Therefore, one line in the first electrode 120 may be an electrode for controlling one color. That is, red (R), green (G), and blue (B) may be sequentially disposed along the second electrode 140, and thus, a unit pixel may be implemented.
다만, 본 발명은 반드시 이에 한정되는 것은 아니며, 형광체 대신에 반도체 발광 소자(150)와 퀀텀닷(QD)이 조합되어 적색(R), 녹색(G) 및 청색(B)의 단위 화소들을 구현할 수 있다.However, the present invention is not limited thereto, and instead of the phosphor, the semiconductor light emitting device 150 and the quantum dot QD may be combined to implement unit pixels of red (R), green (G), and blue (B). have.
또한, 대비비(contrast) 향상을 위하여 각각의 형광체층들의 사이에는 블랙 매트릭스(191)가 배치될 수 있다. 즉, 이러한 블랙 매트릭스(191)는 명암의 대조를 향상시킬 수 있다. In addition, a black matrix 191 may be disposed between the respective phosphor layers in order to improve contrast. That is, the black matrix 191 may improve contrast of the contrast.
다만, 본 발명은 반드시 이에 한정되는 것은 아니며, 청색, 적색, 녹색을 구현하기 위한 다른 구조가 적용될 수 있다. However, the present invention is not necessarily limited thereto, and other structures for implementing blue, red, and green may be applied.
도 5a를 참조하면, 각각의 반도체 발광 소자(150)는 질화 갈륨(GaN)을 주로 하여, 인듐(In) 및/또는 알루미늄(Al)이 함께 첨가되어 청색을 비롯한 다양한 빛을 발광하는 고출력의 발광 소자로 구현될 수 있다.Referring to FIG. 5A, each semiconductor light emitting device 150 is mainly made of gallium nitride (GaN), and indium (In) and / or aluminum (Al) is added together to emit light of various colors including blue. It can be implemented as an element.
이 경우, 반도체 발광 소자(150)는 각각 단위 화소(sub-pixel)를 이루기 위하여 적색, 녹색 및 청색 반도체 발광 소자일 수 있다. 예컨대, 적색, 녹색 및 청색 반도체 발광 소자(R, G, B)가 교대로 배치되고, 적색, 녹색 및 청색 반도체 발광 소자에 의하여 적색(Red), 녹색(Green) 및 청색(Blue)의 단위 화소들이 하나의 화소(pixel)를 이루며, 이를 통하여 풀 칼라 디스플레이가 구현될 수 있다.In this case, the semiconductor light emitting devices 150 may be red, green, and blue semiconductor light emitting devices, respectively, to form a sub-pixel. For example, the red, green, and blue semiconductor light emitting devices R, G, and B are alternately disposed, and the red, green, and blue unit pixels are arranged by the red, green, and blue semiconductor light emitting devices. These pixels constitute one pixel, and thus, a full color display may be implemented.
도 5b를 참조하면, 반도체 발광 소자는 황색 형광체층이 개별 소자마다 구비된 백색 발광 소자(W)를 구비할 수 있다. 이 경우에는, 단위 화소를 이루기 위하여, 백색 발광 소자(W) 상에 적색 형광체층(181), 녹색 형광체층(182), 및 청색 형광체층(183)이 구비될 수 있다. 또한, 이러한 백색 발광 소자(W) 상에 적색, 녹색, 및 청색이 반복되는 컬러 필터를 이용하여 단위 화소를 이룰 수 있다.Referring to FIG. 5B, the semiconductor light emitting device may include a white light emitting device W having a yellow phosphor layer for each individual device. In this case, in order to form a unit pixel, a red phosphor layer 181, a green phosphor layer 182, and a blue phosphor layer 183 may be provided on the white light emitting device W. In addition, a unit pixel may be formed by using a color filter in which red, green, and blue are repeated on the white light emitting device W. FIG.
도 5c를 참조하면, 자외선 발광 소자(UV) 상에 적색 형광체층(181), 녹색 형광체층(182), 및 청색 형광체층(183)이 구비되는 구조도 가능하다. 이와 같이, 반도체 발광 소자는 가시광선뿐만 아니라 자외선(UV)까지 전영역에 사용가능하며, 자외선(UV)이 상부 형광체의 여기원(excitation source)으로 사용가능한 반도체 발광 소자의 형태로 확장될 수 있다.Referring to FIG. 5C, the red phosphor layer 181, the green phosphor layer 182, and the blue phosphor layer 183 may be provided on the ultraviolet light emitting device UV. As such, the semiconductor light emitting device can be used not only for visible light but also for ultraviolet light (UV) in all areas, and can be extended in the form of a semiconductor light emitting device in which ultraviolet light (UV) can be used as an excitation source of the upper phosphor. .
본 예시를 다시 살펴보면, 반도체 발광 소자(150)는 전도성 접착층(130) 상에 위치되어, 디스플레이 장치에서 단위 화소를 구성한다. 반도체 발광 소자(150)는 휘도가 우수하므로, 작은 크기로도 개별 단위 화소를 구성할 수 있다. 이와 같은 개별 반도체 발광 소자(150)의 크기는 한 변의 길이가 80㎛ 이하일 수 있고, 직사각형 또는 정사각형 소자일 수 있다. 직사각형인 경우에는 20X80㎛ 이하의 크기가 될 수 있다.Referring back to the present example, the semiconductor light emitting device 150 is positioned on the conductive adhesive layer 130 to constitute a unit pixel in the display device. Since the semiconductor light emitting device 150 has excellent brightness, individual unit pixels may be configured with a small size. The size of the individual semiconductor light emitting device 150 may be 80 μm or less in length of one side, and may be a rectangular or square device. In the case of a rectangle, the size may be 20 × 80 μm or less.
또한, 한 변의 길이가 10㎛인 정사각형의 반도체 발광 소자(150)를 단위 화소로 이용하여도 디스플레이 장치를 이루기 위한 충분한 밝기가 나타난다. 따라서, 단위 화소의 크기가 한 변이 600㎛, 나머지 한변이 300㎛인 직사각형 화소인 경우를 예로 들면, 반도체 발광 소자의 거리가 상대적으로 충분히 크게 된다. 따라서, 이러한 경우, HD화질을 가지는 플렉서블 디스플레이 장치를 구현할 수 있게 된다.In addition, even when a square semiconductor light emitting element 150 having a side length of 10 μm is used as a unit pixel, sufficient brightness for forming a display device appears. Therefore, for example, when the size of the unit pixel is a rectangular pixel in which one side is 600 µm and the other side is 300 µm, the distance of the semiconductor light emitting element is relatively sufficiently large. Therefore, in this case, it is possible to implement a flexible display device having an HD image quality.
상기에서 설명된 반도체 발광 소자를 이용한 디스플레이 장치는 새로운 형태의 제조방법에 의하여 제조될 수 있다. 이하, 도 6을 참조하여 상기 제조방법에 대하여 설명한다.The display device using the semiconductor light emitting device described above may be manufactured by a new type of manufacturing method. Hereinafter, the manufacturing method will be described with reference to FIG. 6.
도 6은 본 발명의 반도체 발광 소자를 이용한 디스플레이 장치의 제조방법을 나타낸 단면도들이다.6 is a cross-sectional view illustrating a method of manufacturing a display device using the semiconductor light emitting device of the present invention.
본 도면을 참조하면, 먼저, 보조전극(170) 및 제2전극(140)이 위치된 절연층(160) 상에 전도성 접착층(130)을 형성한다. 제1기판(110)에 절연층(160)이 적층되어 하나의 기판(또는 배선기판)을 형성하며, 상기 배선기판에는 제1전극(120), 보조전극(170) 및 제2전극(140)이 배치된다. 이 경우에, 제1전극(120)과 제2전극(140)은 상호 직교 방향으로 배치될 수 있다. 또한, 플렉서블(flexible) 디스플레이 장치를 구현하기 위하여 제1기판(110) 및 절연층(160)은 각각 유리 또는 폴리이미드(PI)를 포함할 수 있다. Referring to this figure, first, the conductive adhesive layer 130 is formed on the insulating layer 160 on which the auxiliary electrode 170 and the second electrode 140 are located. The insulating layer 160 is stacked on the first substrate 110 to form a single substrate (or a wiring substrate), and the first electrode 120, the auxiliary electrode 170, and the second electrode 140 are formed on the wiring substrate. Is placed. In this case, the first electrode 120 and the second electrode 140 may be disposed in a direction perpendicular to each other. In addition, in order to implement a flexible display device, the first substrate 110 and the insulating layer 160 may each include glass or polyimide (PI).
상기 전도성 접착층(130)은 예를 들어, 이방성 전도성 필름에 의하여 구현될 수 있으며, 이를 위하여 절연층(160)이 위치된 기판에 이방성 전도성 필름이 도포될 수 있다.The conductive adhesive layer 130 may be implemented by, for example, an anisotropic conductive film. For this purpose, an anisotropic conductive film may be applied to a substrate on which the insulating layer 160 is located.
다음에, 보조전극(170) 및 제2전극(140)들의 위치에 대응하고, 개별 화소를 구성하는 복수의 반도체 발광 소자(150)가 위치된 제2기판(112)을 상기 반도체 발광 소자(150)가 보조전극(170) 및 제2전극(140)와 대향하도록 배치한다.Next, the semiconductor light emitting device 150 may include a second substrate 112 corresponding to the positions of the auxiliary electrodes 170 and the second electrodes 140 and on which the plurality of semiconductor light emitting devices 150 constituting individual pixels are located. ) Is disposed to face the auxiliary electrode 170 and the second electrode 140.
이 경우에, 제2기판(112)은 반도체 발광 소자(150)를 성장시키는 성장 기판으로서, 사파이어(spire) 기판 또는 실리콘(silicon) 기판이 될 수 있다.In this case, the second substrate 112 may be a growth substrate for growing the semiconductor light emitting device 150, and may be a sapphire substrate or a silicon substrate.
상기 반도체 발광 소자는 웨이퍼(wafer) 단위로 형성될 때, 디스플레이 장치를 이룰 수 있는 간격 및 크기를 가지도록 함으로써, 디스플레이 장치에 효과적으로 이용될 수 있다.When the semiconductor light emitting device is formed in a wafer unit, the semiconductor light emitting device may be effectively used in the display device by having a gap and a size capable of forming the display device.
그 다음에, 배선기판과 제2기판(112)을 열압착한다. 예를 들어, 배선기판과 제2기판(112)은 ACF press head 를 적용하여 열압착될 수 있다. 상기 열압착에 의하여 배선기판과 제2기판(112)은 본딩(bonding)된다. 열압착에 의하여 전도성을 갖는 이방성 전도성 필름의 특성에 의해 반도체 발광 소자(150)와 보조전극(170) 및 제2전극(140)의 사이의 부분만 전도성을 가지게 되며, 이를 통하여 전극들과 반도체 발광소자(150)는 전기적으로 연결될 수 있다. 이 때에, 반도체 발광 소자(150)가 상기 이방성 전도성 필름의 내부로 삽입되며, 이를 통하여 반도체 발광 소자(150) 사이에 격벽이 형성될 수 있다.Next, the wiring board and the second board 112 are thermocompressed. For example, the wiring board and the second substrate 112 may be thermocompressed by applying an ACF press head. By the thermocompression bonding, the wiring substrate and the second substrate 112 are bonded. Only a portion between the semiconductor light emitting device 150, the auxiliary electrode 170, and the second electrode 140 has conductivity due to the property of the conductive anisotropic conductive film by thermocompression bonding. The device 150 may be electrically connected. At this time, the semiconductor light emitting device 150 is inserted into the anisotropic conductive film, through which a partition wall may be formed between the semiconductor light emitting device 150.
그 다음에, 상기 제2기판(112)을 제거한다. 예를 들어, 제2기판(112)은 레이저 리프트 오프법(Laser Lift-off, LLO) 또는 화학적 리프트 오프법(Chemical Lift-off, CLO)을 이용하여 제거할 수 있다.Next, the second substrate 112 is removed. For example, the second substrate 112 may be removed using a laser lift-off (LLO) or chemical lift-off (CLO).
마지막으로, 상기 제2기판(112)을 제거하여 반도체 발광 소자들(150)을 외부로 노출시킨다. 필요에 따라, 반도체 발광 소자(150)가 결합된 배선기판 상을 실리콘 옥사이드(SiOx) 등을 코팅하여 투명 절연층(미도시)을 형성할 수 있다. Finally, the second substrate 112 is removed to expose the semiconductor light emitting devices 150 to the outside. If necessary, a transparent insulating layer (not shown) may be formed by coating silicon oxide (SiOx) on the wiring board to which the semiconductor light emitting device 150 is coupled.
또한, 상기 반도체 발광 소자(150)의 일면에 형광체층을 형성하는 단계를 더 포함할 수 있다. 예를 들어, 반도체 발광 소자(150)는 청색(B) 광을 발광하는 청색 반도체 발광 소자이고, 이러한 청색(B) 광을 단위 화소의 색상으로 변환시키기 위한 적색 형광체 또는 녹색 형광체가 상기 청색 반도체 발광 소자의 일면에 레이어를 형성할 수 있다.In addition, the method may further include forming a phosphor layer on one surface of the semiconductor light emitting device 150. For example, the semiconductor light emitting device 150 is a blue semiconductor light emitting device that emits blue (B) light, and a red phosphor or a green phosphor for converting the blue (B) light into a color of a unit pixel emits the blue semiconductor light. A layer may be formed on one surface of the device.
이상에서 설명된 반도체 발광 소자를 이용한 디스플레이 장치의 제조방법이나 구조는 여러가지 형태로 변형될 수 있다. 그 예로서, 상기에서 설명된 디스플레이 장치에는 수직형 반도체 발광 소자도 적용될 수 있다. 이하, 도 5 및 도 6을 참조하여 수직형 구조에 대하여 설명한다.The manufacturing method or structure of the display device using the semiconductor light emitting device described above may be modified in various forms. As an example, a vertical semiconductor light emitting device may also be applied to the display device described above. Hereinafter, a vertical structure will be described with reference to FIGS. 5 and 6.
또한, 이하 설명되는 변형예 또는 실시예에서는 앞선 예와 동일 또는 유사한 구성에 대해서는 동일, 유사한 참조번호가 부여되고, 그 설명은 처음 설명으로 갈음된다. In addition, in the modification or embodiment described below, the same or similar reference numerals are assigned to the same or similar configuration as the previous example, and the description is replaced with the first description.
도 7은 발명의 반도체 발광 소자를 이용한 디스플레이 장치의 다른 일 실시예를 나타내는 사시도이고, 도 8은 도 7의 라인 D-D를 따라 취한 단면도이며, 도 9은 도 8의 수직형 반도체 발광소자를 나타내는 개념도이다.FIG. 7 is a perspective view showing another embodiment of a display device using the semiconductor light emitting device of the present invention. FIG. 8 is a cross-sectional view taken along the line DD of FIG. 7, and FIG. 9 is a conceptual view showing the vertical semiconductor light emitting device of FIG. 8. to be.
본 도면들을 참조하면, 디스플레이 장치는 패시브 매트릭스(Passive Matrix, PM) 방식의 수직형 반도체 발광 소자를 이용한 디스플레이 장치가 될 수 있다.Referring to the drawings, the display device may be a display device using a passive semiconductor light emitting device of a passive matrix (PM) type.
상기 디스플레이 장치는 기판(210), 제1전극(220), 전도성 접착층(230), 제2전극(240) 및 복수의 반도체 발광 소자(250)를 포함한다.The display device includes a substrate 210, a first electrode 220, a conductive adhesive layer 230, a second electrode 240, and a plurality of semiconductor light emitting devices 250.
기판(210)은 제1전극(220)이 배치되는 배선기판으로서, 플렉서블(flexible) 디스플레이 장치를 구현하기 위하여 폴리이미드(PI)를 포함할 수 있다. 이외에도 절연성이 있고, 유연성 있는 재질이면 어느 것이라도 사용 가능할 것이다.The substrate 210 is a wiring substrate on which the first electrode 220 is disposed, and may include polyimide (PI) in order to implement a flexible display device. In addition, any material that is insulating and flexible may be used.
제1전극(220)은 기판(210) 상에 위치하며, 일 방향으로 긴 바(bar) 형태의 전극으로 형성될 수 있다. 상기 제1전극(220)은 데이터 전극의 역할을 하도록 이루어질 수 있다.The first electrode 220 is positioned on the substrate 210 and may be formed as an electrode having a bar shape that is long in one direction. The first electrode 220 may be formed to serve as a data electrode.
전도성 접착층(230)은 제1전극(220)이 위치하는 기판(210)상에 형성된다. 플립 칩 타입(flip chip type)의 발광 소자가 적용된 디스플레이 장치와 같이, 전도성 접착층(230)은 이방성 전도성 필름(anistropy conductive film, ACF), 이방성 전도 페이스트(paste), 전도성 입자를 함유한 솔루션(solution) 등이 될 수 있다. 다만, 본 실시예에서도 이방성 전도성 필름에 의하여 전도성 접착층(230)이 구현되는 경우를 예시한다.The conductive adhesive layer 230 is formed on the substrate 210 on which the first electrode 220 is located. Like a display device to which a flip chip type light emitting device is applied, the conductive adhesive layer 230 is a solution containing an anisotropic conductive film (ACF), anisotropic conductive paste, and conductive particles. ), Etc. However, this embodiment also illustrates a case where the conductive adhesive layer 230 is implemented by the anisotropic conductive film.
기판(210) 상에 제1전극(220)이 위치하는 상태에서 이방성 전도성 필름을 위치시킨 후에, 반도체 발광 소자(250)를 열 및 압력을 가하여 접속시키면, 상기 반도체 발광 소자(250)가 제1전극(220)과 전기적으로 연결된다. 이 때, 상기 반도체 발광 소자(250)는 제1전극(220) 상에 위치되도록 배치되는 것이 바람직하다.After the anisotropic conductive film is positioned on the substrate 210 with the first electrode 220 positioned thereon, the semiconductor light emitting device 250 is connected to the semiconductor light emitting device 250 by applying heat and pressure. It is electrically connected to the electrode 220. In this case, the semiconductor light emitting device 250 may be disposed on the first electrode 220.
상기 전기적 연결은 전술한 바와 같이, 이방성 전도성 필름에서 열 및 압력이 가해지면 부분적으로 두께방향으로 전도성을 가지기 때문에 생성된다. 따라서, 이방성 전도성 필름에서는 두께방향으로 전도성을 가지는 부분(231)과 전도성을 가지지 않는 부분(232)으로 구획된다.The electrical connection is created because, as described above, in the anisotropic conductive film is partially conductive in the thickness direction when heat and pressure are applied. Therefore, in the anisotropic conductive film is divided into a portion 231 having conductivity and a portion 232 having no conductivity in the thickness direction.
또한, 이방성 전도성 필름은 접착 성분을 함유하기 때문에, 전도성 접착층(230)은 반도체 발광 소자(250)와 제1전극(220) 사이에서 전기적 연결뿐만 아니라 기계적 결합까지 구현한다.In addition, since the anisotropic conductive film contains an adhesive component, the conductive adhesive layer 230 implements not only electrical connection but also mechanical coupling between the semiconductor light emitting device 250 and the first electrode 220.
이와 같이, 반도체 발광 소자(250)는 전도성 접착층(230) 상에 위치되며, 이를 통하여 디스플레이 장치에서 개별 화소를 구성한다. 반도체 발광 소자(250)는 휘도가 우수하므로, 작은 크기로도 개별 단위 픽셀을 구성할 수 있다. 이와 같은 개별 반도체 발광 소자(250)의 크기는 한 변의 길이가 80㎛ 이하일 수 있고, 직사각형 또는 정사각형 소자일 수 있다. 직사각형인 경우에는 20X80㎛ 이하의 크기가 될 수 있다.As such, the semiconductor light emitting device 250 is positioned on the conductive adhesive layer 230, thereby forming individual pixels in the display device. Since the semiconductor light emitting device 250 has excellent brightness, individual unit pixels may be configured with a small size. The size of the individual semiconductor light emitting device 250 may be 80 μm or less in length of one side, and may be a rectangular or square device. In the case of a rectangle, the size may be 20 × 80 μm or less.
상기 반도체 발광 소자(250)는 수직형 구조가 될 수 있다.The semiconductor light emitting device 250 may have a vertical structure.
수직형 반도체 발광 소자들의 사이에는, 제1전극(220)의 길이 방향과 교차하는 방향으로 배치되고, 수직형 반도체 발광 소자(250)와 전기적으로 연결된 복수의 제2전극(240)이 위치한다.Between the vertical semiconductor light emitting devices, a plurality of second electrodes 240 disposed in a direction crossing the length direction of the first electrode 220 and electrically connected to the vertical semiconductor light emitting device 250 are positioned.
도 9를 참조하면, 이러한 수직형 반도체 발광 소자는 p형 전극(256), p형 전극(256) 상에 형성된 p형 반도체층(255), p형 반도체층(255) 상에 형성된 활성층(254), 활성층(254)상에 형성된 n형 반도체층(253) 및 n형 반도체층(253) 상에 형성된 n형 전극(252)을 포함한다. 이 경우, 하부에 위치한 p형 전극(256)은 제1전극(220)과 전도성 접착층(230)에 의하여 전기적으로 연결될 수 있고, 상부에 위치한 n형 전극(252)은 후술하는 제2전극(240)과 전기적으로 연결될 수 있다. 이러한 수직형 반도체 발광 소자(250)는 전극을 상/하로 배치할 수 있으므로, 칩 사이즈를 줄일 수 있다는 큰 강점을 가지고 있다.9, the vertical semiconductor light emitting device includes a p-type electrode 256, a p-type semiconductor layer 255 formed on the p-type electrode 256, and an active layer 254 formed on the p-type semiconductor layer 255. ), An n-type semiconductor layer 253 formed on the active layer 254, and an n-type electrode 252 formed on the n-type semiconductor layer 253. In this case, the lower p-type electrode 256 may be electrically connected by the first electrode 220 and the conductive adhesive layer 230, and the upper n-type electrode 252 may be the second electrode 240 described later. ) Can be electrically connected. Since the vertical semiconductor light emitting device 250 can arrange electrodes up and down, the vertical semiconductor light emitting device 250 has a great advantage of reducing chip size.
다시 도 8을 참조하면, 상기 반도체 발광 소자(250)의 일면에는 형광체층(280)이 형성될 수 있다. 예를 들어, 반도체 발광 소자(250)는 청색(B) 광을 발광하는 청색 반도체 발광 소자(251)이고, 이러한 청색(B) 광을 단위 화소의 색상으로 변환시키기 위한 형광체층(280)이 구비될 수 있다. 이 경우에, 형광체층(280)은 개별 화소를 구성하는 적색 형광체(281) 및 녹색 형광체(282) 일 수 있다.Referring back to FIG. 8, a phosphor layer 280 may be formed on one surface of the semiconductor light emitting device 250. For example, the semiconductor light emitting device 250 is a blue semiconductor light emitting device 251 that emits blue (B) light, and the phosphor layer 280 is provided to convert the blue (B) light into the color of a unit pixel. Can be. In this case, the phosphor layer 280 may be a red phosphor 281 and a green phosphor 282 constituting individual pixels.
즉, 적색의 단위 화소를 이루는 위치에서, 청색 반도체 발광 소자(251) 상에는 청색 광을 적색(R) 광으로 변환시킬 수 있는 적색 형광체(281)가 적층될 수 있고, 녹색의 단위 화소를 이루는 위치에서는, 청색 반도체 발광 소자(251) 상에 청색 광을 녹색(G) 광으로 변환시킬 수 있는 녹색 형광체(282)가 적층될 수 있다. 또한, 청색의 단위 화소를 이루는 부분에는 청색 반도체 발광 소자(251)만 단독으로 이용될 수 있다. 이 경우, 적색(R), 녹색(G) 및 청색(B)의 단위 화소들이 하나의 화소를 이룰 수 있다.That is, at the position forming the red unit pixel, a red phosphor 281 capable of converting the blue light into the red (R) light may be stacked on the blue semiconductor light emitting element 251, and the position forming the green unit pixel. In FIG. 3, a green phosphor 282 capable of converting blue light into green (G) light may be stacked on the blue semiconductor light emitting device 251. In addition, only the blue semiconductor light emitting device 251 may be used alone in a portion of the blue unit pixel. In this case, the unit pixels of red (R), green (G), and blue (B) may form one pixel.
다만, 본 발명은 반드시 이에 한정되는 것은 아니며, 플립 칩 타입(flip chip type)의 발광 소자가 적용된 디스플레이 장치에서 전술한 바와 같이, 청색, 적색, 녹색을 구현하기 위한 다른 구조가 적용될 수 있다. However, the present invention is not necessarily limited thereto, and as described above in the display device to which the flip chip type light emitting device is applied, other structures for implementing blue, red, and green may be applied.
다시 본 실시예를 살펴보면, 제2전극(240)은 반도체 발광 소자들(250) 사이에 위치하고, 반도체 발광 소자들(250)과 전기적으로 연결된다. 예를 들어, 반도체 발광 소자들(250)은 복수의 열로 배치되고, 제2전극(240)은 반도체 발광 소자들(250)의 열들 사이에 위치할 수 있다. Referring back to the present embodiment, the second electrode 240 is positioned between the semiconductor light emitting devices 250 and is electrically connected to the semiconductor light emitting devices 250. For example, the semiconductor light emitting devices 250 may be arranged in a plurality of columns, and the second electrode 240 may be positioned between the columns of the semiconductor light emitting devices 250.
개별 화소를 이루는 반도체 발광 소자(250) 사이의 거리가 충분히 크기 때문에 제2전극(240)은 반도체 발광 소자들(250) 사이에 위치될 수 있다. Since the distance between the semiconductor light emitting devices 250 forming the individual pixels is sufficiently large, the second electrode 240 may be positioned between the semiconductor light emitting devices 250.
제2전극(240)은 일 방향으로 긴 바(bar) 형태의 전극으로 형성될 수 있으며, 제1전극과 상호 수직한 방향으로 배치될 수 있다.The second electrode 240 may be formed as an electrode having a bar shape that is long in one direction, and may be disposed in a direction perpendicular to the first electrode.
또한, 제2전극(240)과 반도체 발광 소자(250)는 제2전극(240)에서 돌출된 연결 전극에 의해 전기적으로 연결될 수 있다. 보다 구체적으로, 상기 연결 전극이 반도체 발광 소자(250)의 n형 전극이 될 수 있다. 예를 들어, n형 전극은 오믹(ohmic) 접촉을 위한 오믹 전극으로 형성되며, 상기 제2전극은 인쇄 또는 증착에 의하여 오믹 전극의 적어도 일부를 덮게 된다. 이를 통하여 제2전극(240)과 반도체 발광 소자(250)의 n형 전극이 전기적으로 연결될 수 있다.In addition, the second electrode 240 and the semiconductor light emitting device 250 may be electrically connected by a connection electrode protruding from the second electrode 240. More specifically, the connection electrode may be an n-type electrode of the semiconductor light emitting device 250. For example, the n-type electrode is formed of an ohmic electrode for ohmic contact, and the second electrode covers at least a portion of the ohmic electrode by printing or deposition. Through this, the second electrode 240 and the n-type electrode of the semiconductor light emitting device 250 may be electrically connected to each other.
도시에 의하면, 상기 제2전극(240)은 전도성 접착층(230) 상에 위치될 수 있다. 경우에 따라, 반도체 발광 소자(250)가 형성된 기판(210) 상에 실리콘 옥사이드(SiOx) 등을 포함하는 투명 절연층(미도시)이 형성될 수 있다. 투명 절연층이 형성된 후에 제2전극(240)을 위치시킬 경우, 상기 제2전극(240)은 투명 절연층 상에 위치하게 된다. 또한, 제2전극(240)은 전도성 접착층(230) 또는 투명 절연층에 이격되어 형성될 수도 있다.According to the illustration, the second electrode 240 may be positioned on the conductive adhesive layer 230. In some cases, a transparent insulating layer (not shown) including silicon oxide (SiOx) may be formed on the substrate 210 on which the semiconductor light emitting device 250 is formed. When the second electrode 240 is positioned after the transparent insulating layer is formed, the second electrode 240 is positioned on the transparent insulating layer. In addition, the second electrode 240 may be formed to be spaced apart from the conductive adhesive layer 230 or the transparent insulating layer.
만약 반도체 발광 소자(250) 상에 제2전극(240)을 위치시키기 위하여는 ITO(Indium Tin Oxide)와 같은 투명 전극을 사용한다면, ITO 물질은 n형 반도체층과는 접착성이 좋지 않은 문제가 있다. 따라서, 본 발명은 반도체 발광 소자(250) 사이에 제2전극(240)을 위치시킴으로써, ITO와 같은 투명 전극을 사용하지 않아도 되는 이점이 있다. 따라서, 투명한 재료 선택에 구속되지 않고, n형 반도체층과 접착성이 좋은 전도성 물질을 수평 전극으로 사용하여 광추출 효율을 향상시킬 수 있다.If a transparent electrode such as indium tin oxide (ITO) is used to position the second electrode 240 on the semiconductor light emitting device 250, the ITO material may not have good adhesion with the n-type semiconductor layer. have. Therefore, the present invention has the advantage of not having to use a transparent electrode such as ITO by placing the second electrode 240 between the semiconductor light emitting devices 250. Therefore, the light extraction efficiency can be improved by using a conductive material having good adhesion with the n-type semiconductor layer as a horizontal electrode without being limited to the selection of a transparent material.
도시에 의하면, 반도체 발광 소자(250) 사이에는 격벽(290)이 위치할 수 있다. 즉, 개별 화소를 이루는 반도체 발광 소자(250)를 격리시키기 위하여 수직형 반도체 발광 소자(250) 사이에는 격벽(290)이 배치될 수 있다. 이 경우, 격벽(290)은 개별 단위 화소를 서로 분리하는 역할을 할 수 있으며, 상기 전도성 접착층(230)과 일체로 형성될 수 있다. 예를 들어, 이방성 전도성 필름에 반도체 발광 소자(250)가 삽입됨에 의하여 이방성 전도성 필름의 베이스부재가 상기 격벽을 형성할 수 있다. According to an embodiment, the partition wall 290 may be located between the semiconductor light emitting devices 250. That is, the partition wall 290 may be disposed between the vertical semiconductor light emitting devices 250 to isolate the semiconductor light emitting devices 250 forming individual pixels. In this case, the partition wall 290 may serve to separate individual unit pixels from each other, and may be integrally formed with the conductive adhesive layer 230. For example, when the semiconductor light emitting device 250 is inserted into the anisotropic conductive film, the base member of the anisotropic conductive film may form the partition wall.
또한, 상기 이방성 전도성 필름의 베이스 부재가 블랙이면, 별도의 블랙 절연체가 없어도 상기 격벽(290)이 반사 특성을 가지는 동시에 대비비(contrast)가 증가될 수 있다.In addition, when the base member of the anisotropic conductive film is black, even if there is no separate black insulator, the partition wall 290 may have reflective properties and contrast may be increased.
다른 예로서, 상기 격벽(190)으로서, 반사성 격벽이 별도로 구비될 수 있다. 격벽(290)은 디스플레이 장치의 목적에 따라 블랙(Black) 또는 화이트(White) 절연체를 포함할 수 있다.As another example, as the partition 190, a reflective partition may be separately provided. The partition 290 may include a black or white insulator according to the purpose of the display device.
만일 제2전극(240)이 반도체 발광 소자(250) 사이의 전도성 접착층(230) 상에 바로 위치된 경우, 격벽(290)은 수직형 반도체 발광 소자(250) 및 제2전극(240)의 사이사이에 위치될 수 있다. 따라서, 반도체 발광 소자(250)를 이용하여 작은 크기로도 개별 단위 픽셀을 구성할 수 있고, 반도체 발광 소자(250)의 거리가 상대적으로 충분히 크게 되어 제2전극(240)을 반도체 발광 소자(250) 사이에 위치시킬 수 있고, HD 화질을 가지는 플렉서블 디스플레이 장치를 구현할 수 있는 효과가 있게 된다.If the second electrode 240 is positioned directly on the conductive adhesive layer 230 between the semiconductor light emitting devices 250, the partition wall 290 is disposed between the vertical semiconductor light emitting device 250 and the second electrode 240. It can be located in between. Accordingly, the individual unit pixels may be configured even with a small size by using the semiconductor light emitting device 250, and the distance between the semiconductor light emitting devices 250 is relatively large enough so that the second electrode 240 is connected to the semiconductor light emitting device 250. ), And a flexible display device having HD image quality can be implemented.
또한, 도시에 의하면, 대비비(contrast) 향상을 위하여 각각의 형광체 사이에는 블랙 매트릭스(291)가 배치될 수 있다. 즉, 이러한 블랙 매트릭스(291)는 명암의 대조를 향상시킬 수 있다. In addition, according to the drawings, a black matrix 291 may be disposed between the respective phosphors in order to improve contrast. That is, this black matrix 291 can improve contrast of the contrast.
상기 설명과 같이, 반도체 발광 소자(250)는 전도성 접착층(230) 상에 위치되며, 이를 통하여 디스플레이 장치에서 개별 화소를 구성한다. 반도체 발광 소자(250)는 휘도가 우수하므로, 작은 크기로도 개별 단위 픽셀을 구성할 수 있다. 따라서, 반도체 발광 소자에 의하여 적색(R), 녹색(G) 및 청색(B)의 단위 화소들이 하나의 화소를 이루는 풀 칼라 디스플레이가 구현될 수 있다.As described above, the semiconductor light emitting device 250 is positioned on the conductive adhesive layer 230, thereby forming individual pixels in the display device. Since the semiconductor light emitting device 250 has excellent brightness, individual unit pixels may be configured with a small size. Therefore, a full color display in which the unit pixels of red (R), green (G), and blue (B) form one pixel may be implemented by the semiconductor light emitting device.
상기에서 설명된 본 발명의 반도체 발광 소자를 이용한 디스플레이 장치에는 플립 칩 타입이 적용된 경우에는 동일평면상에 제1 및 제2전극이 배치되므로 고정세(파인 피치)의 구현이 어려운 문제가 있다. 이하, 이러한 문제를 해결할 수 있는 본 발명의 다른 실시예에 따른 플립 칩 타입의 발광소자가 적용된 디스플레이 장치에 대하여 설명한다.In the display device using the semiconductor light emitting device of the present invention described above, when the flip chip type is applied, since the first and second electrodes are disposed on the same plane, it is difficult to realize a high definition (fine pitch). Hereinafter, a display device to which a flip chip type light emitting device is applied according to another exemplary embodiment of the present invention may be solved.
도 10은 새로운 구조의 반도체 발광소자가 적용된 본 발명의 다른 실시 예를 설명하기 위한, 도 1의 A부분의 확대도이고, 도 11a는 도 10의 라인 E-E를 따라 취한 단면도이며, 도 11b는 도 11의 라인 F-F를 따라 취한 단면도이고, 도 12는 도 11a의 플립 칩 타입 반도체 발광 소자를 나타내는 개념도이다.10 is an enlarged view of a portion A of FIG. 1 for explaining another embodiment of the present invention to which a semiconductor light emitting device having a new structure is applied, FIG. 11A is a cross-sectional view taken along the line EE of FIG. 10, and FIG. 11 is a cross-sectional view taken along the line FF of FIG. 11, and FIG. 12 is a conceptual diagram illustrating the flip chip type semiconductor light emitting device of FIG. 11A.
도 10, 도 11a 및 도 11b의 도시에 의하면, 반도체 발광 소자를 이용한 디스플레이 장치(1000)로서 패시브 매트릭스(Passive Matrix, PM) 방식의 반도체 발광 소자를 이용한 디스플레이 장치(1000)를 예시한다. 다만, 이하 설명되는 예시는 액티브 매트릭스(Active Matrix, AM) 방식의 반도체 발광 소자에도 적용 가능하다. Referring to FIGS. 10, 11A, and 11B, a display device 1000 using a passive matrix (PM) type semiconductor light emitting device is illustrated as a display device 1000 using a semiconductor light emitting device. However, the example described below is also applicable to an active matrix (AM) type semiconductor light emitting device.
디스플레이 장치(1000)는 기판(1010), 제1전극(1020), 전도성 접착층(1030), 제2전극(1040) 및 복수의 반도체 발광 소자(1050)를 포함한다. 여기에서, 제1 전극(1020) 및 제2 전극(1040)은 각각 복수의 전극 라인들을 포함할 수 있다.The display apparatus 1000 includes a substrate 1010, a first electrode 1020, a conductive adhesive layer 1030, a second electrode 1040, and a plurality of semiconductor light emitting devices 1050. Here, the first electrode 1020 and the second electrode 1040 may each include a plurality of electrode lines.
기판(1010)은 제1전극(1020)이 배치되는 배선기판으로서, 플렉서블(flexible) 디스플레이 장치를 구현하기 위하여 폴리이미드(PI)를 포함할 수 있다. 이외에도 절연성이 있고, 유연성 있는 재질이면 어느 것이라도 사용 가능할 것이다.The substrate 1010 is a wiring board on which the first electrode 1020 is disposed, and may include polyimide (PI) to implement a flexible display device. In addition, any material that is insulating and flexible may be used.
제1전극(1020)은 기판(1010) 상에 위치하며, 일 방향으로 긴 바(bar) 형태의 전극으로 형성될 수 있다. 상기 제1전극(1020)은 데이터 전극의 역할을 하도록 이루어질 수 있다.The first electrode 1020 is positioned on the substrate 1010 and may be formed as an electrode having a bar shape that is long in one direction. The first electrode 1020 may be configured to serve as a data electrode.
전도성 접착층(1030)은 제1전극(1020)이 위치하는 기판(1010)상에 형성된다. 전술한 플립 칩 타입(flip chip type)의 발광 소자가 적용된 디스플레이 장치와 같이, 전도성 접착층(1030)은 이방성 전도성 필름(anistropy conductive film, ACF), 이방성 전도 페이스트(paste), 전도성 입자를 함유한 솔루션(solution) 등이 될 수 있다. 다만, 본 실시예에서 상기 전도성 접착층(1030)은 접착층으로 대체될 수 있다. 예를 들어, 상기 제1전극(1020)이 기판(1010)상에 위치하지 않고, 반도체 발광소자의 도전형 전극과 일체로 형성된다면, 접착층은 전도성이 필요없게 될 수 있다.The conductive adhesive layer 1030 is formed on the substrate 1010 on which the first electrode 1020 is located. Like the display device to which the above-described flip chip type light emitting device is applied, the conductive adhesive layer 1030 is a solution containing an anisotropic conductive film (ACF), anisotropic conductive paste, and conductive particles. solution, etc. However, in the present embodiment, the conductive adhesive layer 1030 may be replaced with an adhesive layer. For example, if the first electrode 1020 is not located on the substrate 1010 and is integrally formed with the conductive electrode of the semiconductor light emitting device, the adhesive layer may not need conductivity.
상기 반도체 발광 소자들의 사이에는, 제1전극(1020)의 길이 방향과 교차하는 방향으로 배치되고, 상기 반도체 발광 소자(1050)와 전기적으로 연결된 복수의 제2전극(1040)이 위치한다.A plurality of second electrodes 1040 are disposed between the semiconductor light emitting devices in a direction crossing the length direction of the first electrode 1020 and electrically connected to the semiconductor light emitting devices 1050.
도시에 의하면, 상기 제2전극(1040)은 전도성 접착층(1030) 상에 위치될 수 있다. 즉, 전도성 접착층(1030)은 배선기판과 제2전극(1040)의 사이에 배치된다. 상기 제2전극(1040)은 상기 반도체 발광 소자(1050)와 접촉에 의하여 전기적으로 연결될 수 있다.According to the illustration, the second electrode 1040 may be located on the conductive adhesive layer 1030. That is, the conductive adhesive layer 1030 is disposed between the wiring board and the second electrode 1040. The second electrode 1040 may be electrically connected to the semiconductor light emitting device 1050 by contact.
상기에서 설명된 구조에 의하여, 복수의 반도체 발광 소자(1050)는 상기 전도성 접착층(1030)에 결합 되며, 제1전극(1020) 및 제2전극(1040)과 전기적으로 연결된다.By the above-described structure, the plurality of semiconductor light emitting devices 1050 are coupled to the conductive adhesive layer 1030 and electrically connected to the first electrode 1020 and the second electrode 1040.
경우에 따라, 반도체 발광 소자(1050)가 형성된 기판(1010) 상에 실리콘 옥사이드(SiOx) 등을 포함하는 투명 절연층(미도시)이 형성될 수 있다. 투명 절연층이 형성된 후에 제2전극(1040)을 위치시킬 경우, 상기 제2전극(1040)은 투명 절연층 상에 위치하게 된다. 또한, 제2전극(1040)은 전도성 접착층(1030) 또는 투명 절연층에 이격 되어 형성될 수도 있다.In some cases, a transparent insulating layer (not shown) including silicon oxide (SiOx) may be formed on the substrate 1010 on which the semiconductor light emitting device 1050 is formed. When the second electrode 1040 is positioned after the transparent insulating layer is formed, the second electrode 1040 is positioned on the transparent insulating layer. In addition, the second electrode 1040 may be formed to be spaced apart from the conductive adhesive layer 1030 or the transparent insulating layer.
도시와 같이, 복수의 반도체 발광소자(1050)는 제1전극(1020)에 구비되는 복수의 전극 라인들과 나란한 방향으로 복수의 열들을 형성할 수 있다. 다만, 본 발명은 반드시 이에 한정되는 것은 아니다. 예를 들어, 복수의 반도체 발광소자(1050)는 제2전극(1040)을 따라 복수의 열들을 형성할 수 있다.As illustrated, the plurality of semiconductor light emitting devices 1050 may form a plurality of columns in a direction parallel to the plurality of electrode lines provided in the first electrode 1020. However, the present invention is not necessarily limited thereto. For example, the plurality of semiconductor light emitting devices 1050 may form a plurality of columns along the second electrode 1040.
나아가, 디스플레이 장치(1000)는, 복수의 반도체 발광소자(1050)의 일면에 형성되는 형광체층(1080)을 더 구비할 수 있다. 예를 들어, 반도체 발광 소자(1050)는 청색(B) 광을 발광하는 청색 반도체 발광 소자이고, 형광체층(1080)은 상기 청색(B) 광을 단위 화소의 색상으로 변환시키는 기능을 수행한다. 상기 형광체층(1080)은 개별 화소를 구성하는 적색 형광체(1081) 또는 녹색 형광체(1082)가 될 수 있다. 즉, 적색의 단위 화소를 이루는 위치에서, 청색 반도체 발광 소자(1051a) 상에는 청색 광을 적색(R) 광으로 변환시킬 수 있는 적색 형광체(1081)가 적층 될 수 있고, 녹색의 단위 화소를 이루는 위치에서는, 청색 반도체 발광 소자(1051b) 상에 청색 광을 녹색(G) 광으로 변환시킬 수 있는 녹색 형광체(1082)가 적층될 수 있다. 또한, 청색의 단위 화소를 이루는 부분에는 청색 반도체 발광 소자(1051c)만 단독으로 이용될 수 있다. 이 경우, 적색(R), 녹색(G) 및 청색(B)의 단위 화소들이 하나의 화소를 이룰 수 있다. 보다 구체적으로, 제1전극(1020)의 각 라인을 따라 하나의 색상의 형광체가 적층 될 수 있다. 따라서, 제1전극(1020)에서 하나의 라인은 하나의 색상을 제어하는 전극이 될 수 있다. 즉, 제2전극(1040)을 따라서, 적색(R), 녹색(G) 및 청색(B)이 차례로 배치될 수 있으며, 이를 통하여 단위 화소가 구현될 수 있다. 다만, 본 발명은 반드시 이에 한정되는 것은 아니며, 형광체 대신에 반도체 발광 소자(1050)와 퀀텀닷(QD)이 조합되어 적색(R), 녹색(G) 및 청색(B)을 발광하는 단위 화소를 구현할 수 있다.In addition, the display apparatus 1000 may further include a phosphor layer 1080 formed on one surface of the plurality of semiconductor light emitting devices 1050. For example, the semiconductor light emitting device 1050 is a blue semiconductor light emitting device that emits blue (B) light, and the phosphor layer 1080 performs a function of converting the blue (B) light into the color of a unit pixel. The phosphor layer 1080 may be a red phosphor 1081 or a green phosphor 1082 constituting individual pixels. That is, at the position forming the red unit pixel, a red phosphor 1081 capable of converting the blue light into the red (R) light may be stacked on the blue semiconductor light emitting device 1051a, and the position forming the green unit pixel. In the above, a green phosphor 1082 capable of converting blue light into green (G) light may be stacked on the blue semiconductor light emitting device 1051b. In addition, only the blue semiconductor light emitting device 1051c may be used alone in a portion of the blue unit pixel. In this case, the unit pixels of red (R), green (G), and blue (B) may form one pixel. More specifically, phosphors of one color may be stacked along each line of the first electrode 1020. Accordingly, one line in the first electrode 1020 may be an electrode for controlling one color. That is, red (R), green (G), and blue (B) may be sequentially disposed along the second electrode 1040, and thus a unit pixel may be implemented. However, the present invention is not necessarily limited thereto, and instead of the phosphor, a unit pixel that emits red (R), green (G), and blue (B) by combining a quantum dot (QD) with a semiconductor light emitting element 1050 may be used. Can be implemented.
한편, 이러한 형광체층(1080)의 대비비(Contrast) 향상을 위하여 디스플레이 장치는 각각의 형광체들의 사이에 배치되는 블랙 매트릭스(1091)를 더 포함할 수 있다. 상기 블랙 매트릭스(1091)는 형광체 도트 사이에 갭을 만들고, 흑색 물질이 상기 갭을 채우는 형태로 형성될 수 있다. 이를 통하여 블랙 매트릭스(1091)는 외광반사를 흡수함과 동시에 명암의 대조를 향상시킬 수 있다. 이러한 블랙 매트릭스(1091)는, 형광체층(1080)이 적층된 방향인 제1전극(1020)을 따라 각각의 형광체층들의 사이에 위치한다. 이 경우에, 청색 반도체 발광 소자(1051)에 해당하는 위치에는 형광체층이 형성되지 않으나, 블랙 매트릭스(1091)는 상기 형광체층이 없는 공간을 사이에 두고(또는 청색 반도체 발광 소자(1051c)를 사이에 두고) 양측에 각각 형성될 수 있다.Meanwhile, in order to improve contrast of the phosphor layer 1080, the display apparatus may further include a black matrix 1091 disposed between the respective phosphors. The black matrix 1091 may form a gap between phosphor dots, and a black material may be formed to fill the gap. As a result, the black matrix 1091 may absorb the external light reflection and improve contrast of the contrast. The black matrix 1091 is positioned between the phosphor layers along the first electrode 1020 in the direction in which the phosphor layers 1080 are stacked. In this case, the phosphor layer is not formed at a position corresponding to the blue semiconductor light emitting element 1051, but the black matrix 1091 has a space without the phosphor layer therebetween (or between the blue semiconductor light emitting element 1051c). On each side) can be formed.
다시, 본 예시의 반도체 발광소자(1050)를 살펴보면, 본 예시에서 반도체 발광 소자(1050)는 전극을 상/하로 배치할 수 있으므로, 칩 사이즈를 줄일 수 있다는 큰 강점을 가지고 있다. 다만, 전극이 상/하로 배치되나, 본 발명의 반도체 발광소자는 플립 칩 타입(flip chip type)의 발광 소자가 될 수 있다. Again, referring to the semiconductor light emitting device 1050 of the present example, since the semiconductor light emitting device 1050 may be disposed up and down in this example, the semiconductor light emitting device 1050 has a great advantage of reducing the chip size. However, although the electrodes are disposed up and down, the semiconductor light emitting device of the present invention may be a flip chip type light emitting device.
도 12를 참조하면, 예를 들어, 상기 반도체 발광 소자(1050)는 제1도전형 전극(1156)과, 제1도전형 전극(1156)이 형성되는 제1도전형 반도체층(1155)과, 제1도전형 반도체층(1155) 상에 형성된 활성층(1154)과, 상기 활성층(1154) 상에 형성된 제2도전형 반도체층(1153) 및 제2도전형 반도체층(1153)에 형성되는 제2도전형 전극(1152)을 포함한다.12, for example, the semiconductor light emitting device 1050 may include a first conductive semiconductor layer 1155 on which a first conductive electrode 1156, a first conductive electrode 1156 are formed, and An active layer 1154 formed on the first conductive semiconductor layer 1155, and a second formed on the second conductive semiconductor layer 1153 and the second conductive semiconductor layer 1153 formed on the active layer 1154. A conductive electrode 1152.
보다 구체적으로, 상기 제1도전형 전극(1156) 및 제1도전형 반도체층(1155)은 각각 p형 전극 및 p형 반도체층이 될 수 있으며, 상기 제2도전형 전극(1152) 및 제2도전형 반도체층(1153)은 각각 n형 전극 및 n형 반도체층이 될 수 있다. 다만, 본 발명은 반드시 이에 한정되는 것은 아니며, 제1도전형이 n형이 되고 제2도전형이 p형이 되는 예시도 가능하다.More specifically, the first conductive electrode 1156 and the first conductive semiconductor layer 1155 may be a p-type electrode and a p-type semiconductor layer, respectively, and the second conductive electrode 1152 and the second conductive layer may be formed. The conductive semiconductor layer 1153 may be an n-type electrode and an n-type semiconductor layer, respectively. However, the present invention is not necessarily limited thereto, and an example in which the first conductive type is n-type and the second conductive type is p-type is also possible.
보다 구체적으로, 상기 제1도전형 전극(1156)은 상기 제1도전형 반도체층(1155)의 일면에 형성되며, 상기 활성층(1154)은 상기 제1도전형 반도체층(1155)의 타면과 상기 제2도전형 반도체층(1153)의 일면의 사이에 형성되고, 상기 제2도전형 전극(1152)은 상기 제2도전형 반도체층(1153)의 일면에 형성된다.More specifically, the first conductive electrode 1156 is formed on one surface of the first conductive semiconductor layer 1155, and the active layer 1154 is formed on the other surface of the first conductive semiconductor layer 1155. The second conductive semiconductor layer 1153 is formed between one surface of the second conductive semiconductor layer 1153, and the second conductive electrode 1152 is formed on one surface of the second conductive semiconductor layer 1153.
이 경우에, 상기 제2도전형 전극은 상기 제2도전형 반도체층(1153)의 일면에 배치되며, 상기 제2도전형 반도체층(1153)의 타면에는 언도프된(Undoped) 반도체층(1153a)이 형성될 수 있다. In this case, the second conductive electrode is disposed on one surface of the second conductive semiconductor layer 1153, and an undoped semiconductor layer 1153a is disposed on the other surface of the second conductive semiconductor layer 1153. ) May be formed.
도 12를 도 10 내지 도 11b와 함께 참조하면, 상기 제2도전형 반도체층의 일면은 상기 배선기판에 가장 가까운 면이 될 수 있고, 상기 제2도전형 반도체층의 타면은 상기 배선기판에 가장 먼 면이 될 수 있다.Referring to FIG. 12 together with FIGS. 10 to 11B, one surface of the second conductive semiconductor layer may be the surface closest to the wiring board, and the other surface of the second conductive semiconductor layer may be closest to the wiring substrate. It can be far away.
또한, 상기 제1도전형 전극(1156) 및 제2도전형 전극(1152)은 반도체 발광소자의 폭방향을 따라 이격된 위치에서 각각 상기 폭방향과 수직방향(또는 두께방향)으로 서로 높이차를 가지도록 이루어진다. In addition, the first conductive electrode 1156 and the second conductive electrode 1152 have a height difference from each other in the width direction and the vertical direction (or thickness direction) at positions spaced apart along the width direction of the semiconductor light emitting device. It is made to have.
상기 높이차를 이용하여 상기 제2도전형 전극(1152)은 상기 제2도전형 반도체층(1153)에 형성되나, 반도체 발광소자의 상측에 위치하는 상기 제2전극(1040)과 인접하게 배치된다. 예를 들어, 상기 제2도전형 전극(1152)은 적어도 일부가 상기 제2도전형 반도체층(1153)의 측면(또는, 언도프된(Undoped) 반도체층(1153a)의 측면)으로부터 상기 폭방향을 따라 돌출된다. 이와 같이, 제2도전형 전극(1152)이 상기 측면에서 돌출되기에, 상기 제2도전형 전극(1152)은 반도체 발광소자의 상측으로 노출될 수 있다. 이를 통하여, 상기 제2도전형 전극(1152)은 전도성 접착층(1030)의 상측에 배치되는 상기 제2전극(1040)과 오버랩되는 위치에 배치된다.The second conductive electrode 1152 is formed on the second conductive semiconductor layer 1153 using the height difference, but is disposed adjacent to the second electrode 1040 positioned above the semiconductor light emitting device. . For example, the second conductive electrode 1152 may have at least a portion of the second conductive electrode 1152 in the width direction from the side surface of the second conductive semiconductor layer 1153 (or the side surface of the undoped semiconductor layer 1153a). It protrudes along. As such, since the second conductive electrode 1152 protrudes from the side surface, the second conductive electrode 1152 may be exposed to the upper side of the semiconductor light emitting device. Through this, the second conductive electrode 1152 is disposed at a position overlapping with the second electrode 1040 disposed above the conductive adhesive layer 1030.
보다 구체적으로, 반도체 발광 소자는 상기 제2도전형 전극(1152)에서 연장되며, 상기 복수의 반도체 발광 소자의 측면에서 돌출되는 돌출부(1152a)를 구비한다. 이 경우에, 상기 돌출부(1152a)를 기준으로 보면, 상기 제1도전형 전극(1156) 및 제2도전형 전극(1152)은 상기 돌출부(1152a)의 돌출방향을 따라 이격된 위치에서 배치되며, 상기 돌출방향과 수직한 방향으로 서로 높이차를 가지도록 형성되는 것으로 표현될 수 있다.More specifically, the semiconductor light emitting device includes a protrusion 1152a extending from the second conductive electrode 1152 and protruding from the side surfaces of the plurality of semiconductor light emitting devices. In this case, based on the protrusion 1152a, the first conductive electrode 1156 and the second conductive electrode 1152 are disposed at positions spaced apart along the protrusion direction of the protrusion 1152a. It may be represented to have a height difference from each other in the direction perpendicular to the protruding direction.
상기 돌출부(1152a)는 상기 제2도전형 반도체층(1153)의 일면에서 측면으로 연장되며, 상기 제2도전형 반도체층(1153)의 상면으로, 보다 구체적으로는 언도프된(Undoped) 반도체층(1153a)으로 연장된다. 상기 돌출부(1152a)는 상기 언도프된(Undoped) 반도체층(1153a)의 측면에서 상기 폭방향을 따라 돌출된다. 따라서, 상기 돌출부(1152a)는 상기 제2도전형 반도체층을 기준으로 상기 제1도전형 전극의 반대측에서 상기 제2전극(1040)과 전기적으로 연결될 수 있다. The protrusion 1152a extends from one surface of the second conductive semiconductor layer 1153 to the side surface, and more specifically to an upper surface of the second conductive semiconductor layer 1153, an undoped semiconductor layer. Extends to 1153a. The protrusion 1152a protrudes along the width direction from the side of the undoped semiconductor layer 1153a. Accordingly, the protrusion 1152a may be electrically connected to the second electrode 1040 on the opposite side of the first conductive electrode based on the second conductive semiconductor layer.
상기 돌출부(1152a)를 구비하는 구조는, 전술한 수평형 반도체 발광소자와 수직형 반도체 발광소자의 장점을 이용할 수 있는 구조가 될 수 있다. 한편, 상기 언도프된(Undoped) 반도체층(1153a)에서 상기 제1도전형 전극(1156)으로부터 가장 먼 상면에는 roughing 에 의하여 미세홈들이 형성될 수 있다.The structure having the protrusion 1152a may be a structure that can utilize the advantages of the above-described horizontal semiconductor light emitting device and vertical semiconductor light emitting device. Meanwhile, fine grooves may be formed on the upper surface furthest from the first conductive electrode 1156 in the undoped semiconductor layer 1153a by roughing.
또한, 상기 반도체 발광소자(1050)는 상기 제2도전형 전극(1152)을 덮도록 형성되는 절연부(1158)를 포함할 수 있다. 상기 절연부(1158)는 상기 제2도전형 전극(1152)과 함께 상기 제1도전형 반도체층(1155)의 일부를 덮도록 형성될 수 있다. In addition, the semiconductor light emitting device 1050 may include an insulating portion 1158 formed to cover the second conductive electrode 1152. The insulating part 1158 may be formed to cover a portion of the first conductive semiconductor layer 1155 together with the second conductive electrode 1152.
이 경우에, 상기 제2도전형 전극(1152) 및 상기 활성층(1154)은 상기 제2도전형 반도체층(1153)의 일면에 형성되며, 상기 절연부(1158)를 사이에 두고 일방향으로 이격 배치된다. 여기에서, 일방향(또는 수평방향)은 상기 반도체 발광소자의 폭방향이 되며, 수직방향은 상기 반도체 발광소자의 두께방향이 될 수 있다. In this case, the second conductive electrode 1152 and the active layer 1154 are formed on one surface of the second conductive semiconductor layer 1153, and are spaced apart in one direction with the insulating portion 1158 interposed therebetween. do. Here, one direction (or horizontal direction) may be the width direction of the semiconductor light emitting device, the vertical direction may be the thickness direction of the semiconductor light emitting device.
또한, 상기 제1도전형 반도체층(1155)에서 상기 절연부(1158)에 의하여 덮이지 않고 노출되는 부분에 상기 제1도전형 전극(1156)이 형성될 수 있다. 따라서, 상기 제1도전형 전극(1156)은 상기 절연부(1158)를 관통하여 외부로 노출된다.In addition, the first conductive electrode 1156 may be formed in a portion of the first conductive semiconductor layer 1155 that is not covered by the insulating portion 1158 and is exposed. Therefore, the first conductive electrode 1156 is exposed to the outside through the insulating portion 1158.
이와 같이, 상기 제1도전형 전극 및 제2도전형 전극(1156, 1152)은, 상기 절연부(1058)에 의해 이격되므로, 반도체 발광 소자의 n형 전극 및 p형 전극은 절연될 수 있다.As such, since the first conductive electrode and the second conductive electrode 1156 and 1152 are spaced apart by the insulating portion 1058, the n-type electrode and the p-type electrode of the semiconductor light emitting device may be insulated.
또한, 디스플레이 장치(1000)는 복수의 반도체 발광소자(1050)의 일면에 형성되는 형광체층(1080, 도 11b 참조)를 더 구비할 수 있다. 이 경우에, 반도체 발광소자들에서 출력된 빛은 형광체를 이용하여 여기시켜, 적색(R) 및 녹색(G)을 구현하게 된다. 또한, 전술한 블랙 매트릭스(191, 291, 1091, 도 3b, 도 8 및 도 11b 참조)가 형광체들의 사이에서 혼색을 방지하는 격벽의 역할을 하게 된다. In addition, the display apparatus 1000 may further include a phosphor layer 1080 (refer to FIG. 11B) formed on one surface of the plurality of semiconductor light emitting devices 1050. In this case, the light output from the semiconductor light emitting devices is excited using a phosphor, thereby implementing red (R) and green (G). In addition, the aforementioned black matrices 191, 291, 1091, FIGS. 3B, 8, and 11B serve as partition walls that prevent color mixing between the phosphors.
나아가, 본 발명에서는, 디스플레이 장치에서 구조 및 제법은 간단하나, 휘도는 증가되는 메커니즘 및 이의 제조방법을 제시한다. Furthermore, in the present invention, the structure and manufacturing method of the display device is simple, but the mechanism of increasing the brightness and a method of manufacturing the same are presented.
이하, 휘도를 증가시키는 본 발명의 디스플레이 장치의 구조에 대하여 첨부된 도면과 함께 상세하게 살펴본다. 도 13은 본 발명의 또 다른 실시 예를 설명하기 위한, 도 1의 A부분의 확대도이며, 도 14는 도 13의 G-G를 따라 취한 단면도이며, 도 15는 도 13의 H-H를 따라 취한 단면도이다.Hereinafter, the structure of the display device of the present invention for increasing luminance will be described in detail with reference to the accompanying drawings. FIG. 13 is an enlarged view of a portion A of FIG. 1 for explaining another embodiment of the present invention, FIG. 14 is a sectional view taken along the GG of FIG. 13, and FIG. 15 is a sectional view taken along the HH of FIG. .
도 13, 도 14 및 도 15의 도시에 의하면, 반도체 발광 소자를 이용한 디스플레이 장치로서 도 10 내지 도 12를 참조하여 설명한 플립 칩 타입 반도체 발광 소자를 이용한 디스플레이 장치(2000)를 예시한다. 보다 구체적으로, 도 10 내지 도 12를 참조하여 설명한 플립 칩 타입 반도체 발광소자에서 휘도는 증가되는 메커니즘이 부가된 경우를 예시한다. 이 경우에, 도 14에 도시된 화살표는 휘도를 증가시키는 빛의 경로를 나타낸다. 한편, 이하 설명되는 예시는 전술한 다른 형태의 반도체 발광 소자를 이용한 디스플레이 장치에도 적용 가능하다. 13, 14, and 15 illustrate a display device 2000 using the flip chip type semiconductor light emitting device described with reference to FIGS. 10 to 12 as a display device using the semiconductor light emitting device. More specifically, the flip chip type semiconductor light emitting device described with reference to FIGS. 10 to 12 exemplifies a case where a mechanism for increasing brightness is added. In this case, the arrow shown in Fig. 14 represents a path of light for increasing the luminance. Meanwhile, the example described below may be applied to a display device using the above-described other type of semiconductor light emitting device.
이하 설명되는 본 예시에서는, 앞서 도 10 내지 도 12를 참조하여 설명한 예시의 각 구성과 동일 또는 유사한 구성에 대해서는 동일, 유사한 참조번호가 부여되고, 그 설명은 처음 설명으로 갈음된다. 예를 들어, 디스플레이 장치(2000)는 기판(2010), 제1전극(2020), 전도성 접착층(2030), 제2전극(2040) 및 복수의 반도체 발광 소자(2050)를 포함하며, 이들에 대한 설명은 앞서 도 10 내지 도 12를 참조한 설명으로 갈음한다. 따라서, 본 실시예에서 상기 전도성 접착층(2030)은 접착층으로 대체되고, 복수의 반도체 발광소자들이 기판(2010)상에 배치되는 접착층에 부착되며, 상기 제1전극(2020)이 기판(2010)상에 위치하지 않고, 반도체 발광소자의 도전형 전극과 일체로 형성될 수 있다. In the present example described below, the same or similar reference numerals are assigned to the same or similar components as those in the above-described examples with reference to FIGS. 10 to 12, and the description is replaced with the first description. For example, the display apparatus 2000 includes a substrate 2010, a first electrode 2020, a conductive adhesive layer 2030, a second electrode 2040, and a plurality of semiconductor light emitting devices 2050. The description will be replaced with the description with reference to FIGS. 10 to 12. Therefore, in the present exemplary embodiment, the conductive adhesive layer 2030 is replaced with an adhesive layer, and a plurality of semiconductor light emitting devices are attached to the adhesive layer disposed on the substrate 2010, and the first electrode 2020 is formed on the substrate 2010. It may be formed integrally with the conductive electrode of the semiconductor light emitting device without being located at.
상기 제2전극(2040)은 전도성 접착층(2030) 상에 위치될 수 있다. 즉, 전도성 접착층(2030)은 배선기판과 제2전극(2040)의 사이에 배치된다. 상기 제2전극(2040)은 상기 반도체 발광 소자(2050)와 접촉에 의하여 전기적으로 연결될 수 있다.The second electrode 2040 may be located on the conductive adhesive layer 2030. That is, the conductive adhesive layer 2030 is disposed between the wiring board and the second electrode 2040. The second electrode 2040 may be electrically connected to the semiconductor light emitting device 2050 by contact.
또한, 상기 반도체 발광 소자(2050)는 제1도전형 전극(2156)과, 제1도전형 전극(2156)이 형성되는 제1도전형 반도체층(2155)과, 제1도전형 반도체층(2155) 상에 형성된 활성층(2154)과, 상기 활성층(2154) 상에 형성된 제2도전형 반도체층(2153) 및 제2도전형 반도체층(2153)에 형성되는 제2도전형 전극(2152)을 포함하며, 이들에 대한 설명은 앞서 도 12를 참조한 설명으로 갈음한다. In addition, the semiconductor light emitting device 2050 may include a first conductive electrode 2156, a first conductive semiconductor layer 2155 on which the first conductive electrode 2156 is formed, and a first conductive semiconductor layer 2155. ) And a second conductive type electrode 2152 formed on the second conductive type semiconductor layer 2153 and the second conductive type semiconductor layer 2153 formed on the active layer 2154. The description thereof will be replaced with the description with reference to FIG. 12.
또한, 도 12를 참조하여 전술한 바와 같이, 돌출부(2152a)가 상기 제2도전형 반도체층(2153)의 일면에서 측면으로 연장되며, 상기 제2도전형 반도체층(2153)의 상면으로, 보다 구체적으로는 언도프된(Undoped) 반도체층(2153a)으로 연장된다. 따라서, 상기 돌출부(2152a)는 상기 제2도전형 반도체층을 기준으로 상기 제1도전형 전극의 반대측에서 상기 제2전극(2040)과 전기적으로 연결될 수 있다. In addition, as described above with reference to FIG. 12, the protrusion 2152a extends from one surface of the second conductive semiconductor layer 2153 to the side surface, and to the top surface of the second conductive semiconductor layer 2153. Specifically, it extends to the undoped semiconductor layer 2153a. Thus, the protrusion 2152a may be electrically connected to the second electrode 2040 on the opposite side of the first conductive electrode based on the second conductive semiconductor layer.
또한, 상기 반도체 발광소자(2050)는 상기 제2도전형 전극(2152)을 덮도록 형성되는 절연부(2158)를 포함할 수 있다. 상기 절연부(2158)는 상기 제2도전형 전극(2152)과 함께 상기 제1도전형 반도체층(2155)의 일부를 덮도록 형성될 수 있다. In addition, the semiconductor light emitting device 2050 may include an insulating portion 2158 formed to cover the second conductive electrode 2152. The insulating part 2158 may be formed to cover a portion of the first conductive semiconductor layer 2155 together with the second conductive electrode 2152.
또한, 상기 제1도전형 반도체층(2155)에서 상기 절연부(2158)에 의하여 덮이지 않고 노출되는 부분에 상기 제1도전형 전극(2156)이 형성될 수 있다. 따라서, 상기 제1도전형 전극(2156)은 상기 절연부(2158)를 관통하여 외부로 노출된다.In addition, the first conductive electrode 2156 may be formed at a portion of the first conductive semiconductor layer 2155 that is not covered by the insulating portion 2158 and is exposed. Therefore, the first conductive electrode 2156 is exposed to the outside through the insulating portion 2158.
또한, 디스플레이 장치(2000)는 복수의 반도체 발광소자(2050)의 일면에 형성되는 형광체층(2080)을 더 구비할 수 있다. 예를 들어, 반도체 발광 소자(2050)는 청색(B) 광을 발광하는 청색 반도체 발광 소자이고, 형광체층(2080)은 상기 청색(B) 광을 단위 화소의 색상으로 변환시키는 기능을 수행한다. 이 경우에, 반도체 발광소자들(2050)에서 출력된 빛은 형광체를 이용하여 여기시켜, 적색(R) 및 녹색(G)을 구현하게 된다. 한편, 상기 형광체층(2080)은 컬러필터나 퀀텀닷 등으로 대체될 수 있다. 또한, 전술한 블랙 매트릭스(191, 291, 1091, 도 3b, 도 8 및 도 11b 참조)가 형광체들의 사이에서 혼색을 방지하는 격벽의 역할을 하게 된다. In addition, the display apparatus 2000 may further include a phosphor layer 2080 formed on one surface of the plurality of semiconductor light emitting devices 2050. For example, the semiconductor light emitting device 2050 is a blue semiconductor light emitting device that emits blue (B) light, and the phosphor layer 2080 performs a function of converting the blue (B) light into the color of a unit pixel. In this case, the light output from the semiconductor light emitting devices 2050 is excited using a phosphor, thereby implementing red (R) and green (G). Meanwhile, the phosphor layer 2080 may be replaced with a color filter or quantum dot. In addition, the aforementioned black matrices 191, 291, 1091, FIGS. 3B, 8, and 11B serve as partition walls that prevent color mixing between the phosphors.
본 도면들을 참조하면, 상기 복수의 반도체 발광소자들(2050)의 사이에 형성되는 공간에는 반사입자들(2060)이 충전되어, 상기 반도체 발광소자들(2050)에서 발광되는 빛을 반사한다. 상기 반사입자들(2060)은 나노 크기의 산화물을 포함하며, 상기 나노 크기의 산화물은 구상, 침상 및 판상의 알루미나 또는 타이타니아 중 어느 하나가 될 수 있다.Referring to the drawings, reflecting particles 2060 are filled in a space formed between the plurality of semiconductor light emitting devices 2050 to reflect light emitted from the semiconductor light emitting devices 2050. The reflective particles 2060 may include a nano-sized oxide, and the nano-sized oxide may be any one of spherical, acicular, and plate-shaped alumina or titania.
이 경우에, 상기 배선기판(2010)과 상기 반도체 발광소자들(2050)을 전기적 및 물리적으로 연결하는 전도성 접착층(2030)은 상기 복수의 반도체 발광 소자들(2050)과 함께 상기 반사입자들(2060)을 덮도록 형성된다. 또한, 상기 전도성 접착층(2030)은 적어도 일부가 상기 반사입자들(2060)의 사이로 침투할 수 있다. 이러한 예로서, 상기 전도성 접착층(2030)의 절연성 베이스 부재 또는 베이스 물질이 반사입자들(2060)의 사이로 침투할 수 있다.In this case, the conductive adhesive layer 2030 electrically and physically connecting the wiring board 2010 and the semiconductor light emitting devices 2050 may include the reflective particles 2060 together with the plurality of semiconductor light emitting devices 2050. ) Is formed to cover. In addition, at least a portion of the conductive adhesive layer 2030 may penetrate between the reflective particles 2060. As an example, an insulating base member or base material of the conductive adhesive layer 2030 may penetrate between the reflective particles 2060.
한편, 상기 반사입자들(2060)은 서로 수직한 양 방향에 대하여 서로 다른 형태로 배치될 수 있다. 보다 구체적으로, 상기 반도체 발광소자들(2050)은 발광소자 어레이를 형성하며, 상기 발광소자 어레이는 가로방향으로 상기 반도체 발광소자들의 간격이 좁고, 세로방향으로 넓게 형성될 수 있다. 이 경우에, 상기 세로방향은 상기 제2도전형 전극이 돌출되는 방향으로 정의되며, 상기 가로방향은 상기 세로방향과 수직한 방향이 될 수 있다. 한편, 상기 형광체층(2080)은 상기 세로방향으로 연장되도록 형성되며, 서로 다른 색상을 구현하는 형광체층들(2081, 2082)은 상기 가로방향을 따라 순차적으로 배열된다.On the other hand, the reflective particles 2060 may be disposed in different forms in both directions perpendicular to each other. More specifically, the semiconductor light emitting devices 2050 may form a light emitting device array, and the light emitting device array may be formed to have a narrow interval between the semiconductor light emitting devices in a horizontal direction and to be wide in a vertical direction. In this case, the vertical direction may be defined as a direction in which the second conductive electrode protrudes, and the horizontal direction may be a direction perpendicular to the vertical direction. Meanwhile, the phosphor layer 2080 is formed to extend in the longitudinal direction, and phosphor layers 2081 and 2082 implementing different colors are sequentially arranged along the horizontal direction.
이 때에, 간격이 좁은 가로방향으로는 상기 반사입자들(2060)이 상기 간격을 채우며, 간격이 상대적으로 넓은 세로방향으로는 상기 반사입자들(2060)이 상기 간격의 일부만을 채우도록 형성될 수 있다. 상기 세로방향으로 간격의 일부만이 채워지므로, 상기 세로방향으로는 상기 전도성 접착층(2030)과 상기 형광체층(2080)의 사이에 상기 반사입자들이 배치된 제1부분(2061)과, 미배치된 제2부분(2062)이 형성될 수 있다. 이는 상기 세로방향을 따라 동일한 색상의 형광체층이 상기 제1부분(2061)과 제2부분(2062)을 함께 덮기에, 상기 세로방향을 따라서는 휘도증가만 요구될 뿐 혼색의 문제가 발생하지 않기 때문이다.In this case, the reflective particles 2060 may fill the gap in the horizontal direction where the gap is narrow, and the reflective particles 2060 may fill only a portion of the gap in the longitudinal direction where the gap is relatively wide. have. Since only a part of the gap is filled in the longitudinal direction, the first portion 2061 with the reflective particles disposed between the conductive adhesive layer 2030 and the phosphor layer 2080 in the longitudinal direction, and the undisposed first agent. Two portions 2062 may be formed. This is because the phosphor layer of the same color along the longitudinal direction covers the first portion 2061 and the second portion 2062 together, so that only the luminance increase is required along the longitudinal direction, so that the problem of color mixing does not occur. Because.
한편, 상기 반사입자들(2060)은 상기 형광체층(2080)에서 반사되어 디스플레이 장치의 내부로 향하는 빛을 상기 형광체층(2080)으로 재반사하는 역할을 할 수 있다. 이 경우에 상기 형광체층(2080)에서 반사되어 디스플레이 장치의 내부로 향하는 빛을 재반사하기 위하여, 상기 미배치된 제2부분(2062)은 상기 제1부분(2061)보다 반사입자들이 형성된 레이어의 두께가 얇은 층이 될 수 있다. 즉, 상기 재반사를 위하여, 상기 제2부분(2062)에는 상기 반사입자들이 완전히 미배치되는 것이 아니라 상기 제1부분(2061)보다 소량으로 배치되는 것이다.The reflective particles 2060 may reflect light reflected from the phosphor layer 2080 and directed toward the inside of the display device to the phosphor layer 2080. In this case, in order to reflect back light reflected from the phosphor layer 2080 to the inside of the display device, the unarranged second portion 2062 may be formed of a layer having reflective particles formed therein than the first portion 2061. It can be a thin layer. That is, for the re-reflection, the second particles 2062 are disposed in a smaller amount than the first portion 2061, not completely unplaced.
도시에 의하면, 상기 반사입자들(2060)은 상기 디스플레이 장치의 두께방향을 따라 상기 제1도전형 전극(2156) 및 제2도전형 전극(2152) 중 어느 하나와 오버랩되며, 다른 하나와 오버랩되지 않도록 배치될 수 있다. 이러한 예로서, 상기 반사입자들(2060)은 상기 제2도전형 전극(2152)와 오버랩되며, 상기 제1도전형 전극(2156)과는 오버랩되지 않도록 형성될 수 있다.As illustrated, the reflective particles 2060 overlap with one of the first conductive electrode 2156 and the second conductive electrode 2152 along the thickness direction of the display device, and do not overlap with the other. May be arranged so as not to. As an example, the reflective particles 2060 may be formed to overlap the second conductive electrode 2152 and not overlap the first conductive electrode 2156.
보다 구체적으로, 상기 반사입자들은 상기 절연부(2158)를 덮도록 형성되며, 상기 반사입자와 상기 제2도전형 전극(2152)과 사이에 절연부가 배치되기에, 상기 반사입자들(2060)은 상기 제2도전형 전극(2152)와 오버랩될 수 있다. 반면에, 상기 제1도전형 전극(2156)은 상기 절연부(2158)에 의하여 덮이지 않고 노출되는 부분을 구비하기에, 상기 반사입자는 상기 제1도전형 전극(2156)을 덮지 않도록 형성된다. More specifically, the reflective particles are formed to cover the insulating portion 2158, and since the insulating portion is disposed between the reflective particles and the second conductive electrode 2152, the reflective particles 2060 are formed. It may overlap with the second conductive electrode 2152. On the other hand, since the first conductive electrode 2156 is provided without being covered by the insulating portion 2158, the reflective particles are formed so as not to cover the first conductive electrode 2156. .
이는 제1도전형 전극(2156)은 디스플레이 장치의 두께 방향을 따라 하측에서, 상기 제2도전형 전극(2152)은 상측에서 각각 배선전극과 연결되기 때문이다. 보다 구체적으로, 상기 제1도전형 전극(2156)은 상기 제2도전형 전극(2152)으로부터 상기 반사입자들(2060)보다 먼 위치에 형성되는 하면을 구비하며, 상기 하면이 배선전극과 전기적으로 연결된다.This is because the first conductive electrode 2156 is connected to the wiring electrode at the lower side and the second conductive electrode 2152 at the upper side in the thickness direction of the display device. More specifically, the first conductive electrode 2156 has a lower surface formed at a position farther from the second conductive electrode 2152 than the reflective particles 2060, and the lower surface is electrically connected to the wiring electrode. Connected.
이상에서 살펴본 새로운 디스플레이 장치의 구조에 의하면, 휘도를 향상하는 구조와, 반도체 발광소자들의 사이로 빛의 누수를 차단하면서도 간단하게 구현되는 구조가 구현될 수 있다.According to the structure of the new display device described above, a structure that improves luminance and a structure that is simply implemented while blocking leakage of light between the semiconductor light emitting devices may be implemented.
이하에서는, 위에서 살펴본 새로운 디스플레이 장치의 구조를 형성하는 제조하는 방법에 대하여 첨부된 도면과 함께 보다 구체적으로 살펴본다. 도 16a, 도 16b, 도 16c, 도 16d, 도 16e, 도 16f, 도 16g, 도 16h, 도 17a, 도 17b 및 도 17c는 본 발명의 반도체 발광 소자를 이용한 디스플레이 장치의 제조방법을 나타낸 단면도들이다.Hereinafter, a manufacturing method for forming the structure of the new display device described above will be described in more detail with reference to the accompanying drawings. 16A, 16B, 16C, 16D, 16E, 16F, 16G, 16H, 17A, 17B, and 17C are cross-sectional views illustrating a method of manufacturing a display device using the semiconductor light emitting device according to the present invention. .
먼저, 제조방법에 의하면, 성장기판(W, 또는 반도체 웨이퍼에 제2도전형 반도체층(2053), 활성층(2054), 제1 도전형 반도체층(2055)을 각각 성장시킨다(도 16a).First, according to the manufacturing method, the second conductive semiconductor layer 2053, the active layer 2054, and the first conductive semiconductor layer 2055 are grown on the growth substrate W or the semiconductor wafer (FIG. 16A).
제2도전형 반도체층(2053)이 성장하면, 다음은, 상기 제1도전형 반도체층(2052) 상에 활성층(2054)을 성장시키고, 다음으로 상기 활성층(2054) 상에 제1도전형 반도체층(2055)을 성장시킨다. 이와 같이, 제2도전형 반도체층(2053), 활성층(2054) 및 제1도전형 반도체층(2055)을 순차적으로 성장시키면, 도시된 것과 같이, 제2도전형 반도체층(2053), 활성층(2054) 및 제1도전형 반도체층(2055)이 적층 구조를 형성한다.When the second conductive semiconductor layer 2053 is grown, an active layer 2054 is grown on the first conductive semiconductor layer 2052, and then a first conductive semiconductor is formed on the active layer 2054. Grow layer 2055. As such, when the second conductive semiconductor layer 2053, the active layer 2054, and the first conductive semiconductor layer 2055 are sequentially grown, as shown in the drawing, the second conductive semiconductor layer 2053 and the active layer ( 2054 and the first conductive semiconductor layer 2055 form a stacked structure.
성장기판(W)은 광 투과적 성질을 가지는 재질, 예를 들어 사파이어(Al2O3), GaN, ZnO, AlO 중 어느 하나를 포함하여 형성될 수 있으나, 이에 한정하지는 않는다. 또한, 성장기판(W)은 반도체 물질 성장에 적합한 물질, 캐리어 웨이퍼로 형성될 수 있다. 열 전도성이 뛰어난 물질로 형성될 수 있으며, 전도성 기판 또는 절연성 기판을 포함하여 예를 들어, 사파이어(Al2O3) 기판에 비해 열전도성이 큰 SiC 기판 또는 Si, GaAs, GaP, InP, Ga2O3 중 적어도 하나를 사용할 수 있다. The growth substrate W may be formed of a material having a light transmissive property, for example, sapphire (Al 2 O 3), GaN, ZnO, or AlO, but is not limited thereto. In addition, the growth substrate W may be formed of a material suitable for growing a semiconductor material, a carrier wafer. At least one of Si, GaAs, GaP, InP, and Ga2O3 may be formed of a material having excellent thermal conductivity, including a conductive substrate or an insulating substrate, for example, a SiC substrate having a higher thermal conductivity than a sapphire (Al2O3) substrate. Can be used.
상기 제2도전형 반도체층(2053)은 n형 반도체층으로서, n-Gan 과 같은 질화물 반도체층이 될 수 있으며, 나아가 언도프된(Undoped) 반도체층(2153a)을 포함할 수 있다.The second conductive semiconductor layer 2053 is an n-type semiconductor layer, and may be a nitride semiconductor layer such as n-Gan, and may further include an undoped semiconductor layer 2153a.
다음은, p형 반도체와 n형 반도체를 분리하기 위한 식각 과정이 수행된다. 예를 들어, 도 16b를 참조하면, 상기 제1도전형 반도체층(2055)과 활성층(2054)의 적어도 일부를 식각하여, 상기 제1도전형 반도체층(2055)을 복수의 부분으로 구획한다(Mesa 식각). 이 경우에, 상기 활성층(2054) 및 제1 도전형 반도체층(2055)은 수직방향으로 일부가 제거되어, 상기 제2도전형 반도체층(2053)이 외부로 노출된다. 상기 식각을 통하여 상기 기판상에서 반도체 발광소자들의 어레이를 형성하게 된다.Next, an etching process for separating the p-type semiconductor and the n-type semiconductor is performed. For example, referring to FIG. 16B, at least a portion of the first conductive semiconductor layer 2055 and the active layer 2054 are etched to partition the first conductive semiconductor layer 2055 into a plurality of portions ( Mesa etching). In this case, a portion of the active layer 2054 and the first conductive semiconductor layer 2055 are removed in the vertical direction, and the second conductive semiconductor layer 2053 is exposed to the outside. The etching forms an array of semiconductor light emitting devices on the substrate.
다음으로, 식각을 통하여 상기 기판상에서 서로 고립(isolation)된 복수의 반도체 발광소자를 형성한다(도 16c 참조). 이 경우에, 상기 식각은 언도프된(Undoped) 반도체층이 드러날때까지 진행될 수 있다. 다른 예로서, 반도체 발광소자의 사이에서 상기 제2도전형 반도체층(2053)의 일부를 남겨놓은 상태까지 식각이 진행될 수 있다.Next, a plurality of semiconductor light emitting devices that are isolated from each other on the substrate are formed through etching (see FIG. 16C). In this case, the etching may proceed until the undoped semiconductor layer is exposed. As another example, etching may be performed until a part of the second conductive semiconductor layer 2053 is left between the semiconductor light emitting devices.
다음으로, 상기 반도체 발광소자들에 적어도 하나의 도전형 전극을 형성(도 16d)한다. 보다 구체적으로, 상기 제2도전형 반도체층(2053)의 일면에 상기 제2도전형 전극(2052)을 형성한다. 즉, 상기 기판상에서 반도체 발광소자들의 어레이를 형성한 후에, 상기 제2도전형 반도체층(2053)에는 제2도전형 전극(2052)이 적층된다.Next, at least one conductive electrode is formed on the semiconductor light emitting devices (FIG. 16D). More specifically, the second conductive electrode 2052 is formed on one surface of the second conductive semiconductor layer 2053. That is, after forming an array of semiconductor light emitting devices on the substrate, a second conductive electrode 2052 is stacked on the second conductive semiconductor layer 2053.
이후에, 상기 제2도전형 전극(2052)이 형성된 상태에서, 절연체를 도포하여 절연부(2058)를 형성한다(도 16e).Thereafter, in the state where the second conductive electrode 2052 is formed, the insulator is applied to form the insulator 2058 (FIG. 16E).
상기 제2도전형 전극(2052) 및 상기 활성층(2054)은 상기 제2 도전형 반도체층(2053)의 일면에 형성되며, 상기 절연부(2058)를 사이에 두고 수평방향으로 이격 배치된다. 또한, 발광 소자 어레이를 형성하는 복수의 반도체 발광 소자들은 인접한 발광 소자들과 일정 공간을 사이에 두고 이격되도록 배치될 수 있는데, 이격 배치되는 반도체 발광 소자들의 사이는 절연부(2058)로 채워질 수 있다. 또한, 상기 절연부(2058)는 상기 제1도전형 전극(2056)의 전기적 연결을 위하여, 상기 제1도전형 반도체층(2055)의 일부를 덮지 않도록 이루어진다.The second conductive electrode 2052 and the active layer 2054 are formed on one surface of the second conductive semiconductor layer 2053, and are spaced apart in the horizontal direction with the insulating portion 2058 interposed therebetween. In addition, the plurality of semiconductor light emitting devices forming the light emitting device array may be disposed to be spaced apart from adjacent light emitting devices with a predetermined space therebetween, and may be filled with an insulating portion 2058 between the spaced apart semiconductor light emitting devices. . In addition, the insulating portion 2058 is formed so as not to cover a portion of the first conductive semiconductor layer 2055 for electrical connection of the first conductive electrode 2056.
다음으로, 상기 반도체 발광소자들의 어레이에서 상기 반도체 발광소자들의 사이에 빛을 반사하는 반사입자들을 충전하는 단계가 진행된다(도 16f 및 도 16g).Next, the filling of reflective particles reflecting light between the semiconductor light emitting devices in the array of semiconductor light emitting devices is performed (FIGS. 16F and 16G).
상기 충전하는 단계는 상기 반사입자들을 상기 반도체 발광소자들의 어레이에 도포(도 16f)하는 단계와, 롤링을 통하여 상기 도포된 반사입자들을 상기 반도체 발광소자들의 사이에 충전(도 16g)하는 단계를 포함할 수 있다.The charging step includes applying the reflective particles to the array of semiconductor light emitting devices (FIG. 16F), and filling the coated reflective particles between the semiconductor light emitting devices (FIG. 16G) through rolling. can do.
상기 도포하는 단계에서는 나노 입자의 산화물이 분산되어 있는 용매제를 스프레이 방식으로 도포하며, 상기 충전하는 단계에서는 롤러나 러버류를 이용하여 상기 도포된 용매제를 가압하여 반도체 발광소자들의 메사 공간에 나노 입자를 충전하게 된다. 상기 롤러나 러버류의 가압은 가로방향 및 세로방향으로 반복하여 가해질 수 있다.In the applying step, a solvent in which the oxides of the nanoparticles are dispersed is applied by a spray method, and in the filling step, the applied solvent is pressed by using a roller or rubber to nano-measure the mesa space of the semiconductor light emitting devices. To fill the particles. Pressurization of the rollers or rubbers may be repeatedly applied in the horizontal and vertical directions.
이와 같이, 상기 반사입자들이 상기 반도체 발광소자들의 사이에 충전된 후에, 상기 제1도전형 반도체층에는 제1도전형 전극이 적층된다(도 16h).As described above, after the reflective particles are filled between the semiconductor light emitting devices, a first conductive electrode is stacked on the first conductive semiconductor layer (FIG. 16H).
이와 같은 공정에 의하면, 반사입자들이 상기 복수의 반도체 발광소자들의 사이에 형성되는 공간에 충전되어, 상기 반도체 발광소자들에서 발광되는 빛을 반사하는 구조가 구현될 수 있다.According to this process, the reflective particles are filled in the space formed between the plurality of semiconductor light emitting devices, it can be implemented to reflect the light emitted from the semiconductor light emitting devices.
이후에, 상기 반사입자들을 충전된 반도체 발광소자들의 어레이를 배선기판과 연결하고 상기 기판을 제거하는 단계가 진행된다.Subsequently, the array of semiconductor light emitting devices filled with the reflective particles is connected to a wiring board and the substrate is removed.
예를 들어, 반도체 발광소자들을 전도성 접착층을 이용하여 배선기판에 결합하며, 성장기판을 제거한다(도 17a). 상기 배선기판은 제1전극(2020)이 형성된 상태이며, 상기 제1전극(2020)은 하부 배선으로서 상기 전도성 접착층(2030)내에서 도전볼 등에 의해 제1도전형 전극(2156)과 전기적으로 연결된다. 이 때에, 열 압착에 의하여 전도성 접착층의 적어도 일부가 반사입자들의 사이로 침투하게 된다.For example, the semiconductor light emitting devices are bonded to the wiring board using the conductive adhesive layer, and the growth substrate is removed (FIG. 17A). The wiring board is in a state where a first electrode 2020 is formed, and the first electrode 2020 is a lower wiring and is electrically connected to the first conductive electrode 2156 by a conductive ball in the conductive adhesive layer 2030. do. At this time, at least a part of the conductive adhesive layer penetrates between the reflective particles by thermal compression.
이후에, 언도프된(Undoped) 반도체층(2153a)을 식각하여 제거한 후(도 17b)에, 상기 돌출된 제2도전형 전극(2152)을 연결하는 제2전극(2040)을 형성한다(도 17c). 상기 제2전극(2040)은 상부 배선으로서, 상기 제2도전형 전극(2152)과 직접 연결된다.Thereafter, after the undoped semiconductor layer 2153a is etched and removed (FIG. 17B), a second electrode 2040 connecting the protruding second conductive electrode 2152 is formed (FIG. 17c). The second electrode 2040 is an upper wiring and is directly connected to the second conductive electrode 2152.
다만, 본 발명은 반드시 이에 한정되는 것은 아니며, 상기 언도프된 반도체층은 UV 레이저를 흡수하는 다른 형태의 흡수층으로 대체될 수 있다. 상기 흡수층은 버퍼층이 될 수 있으며, 저온 분위기에서 형성되며, 반도체층과 성장기판과의 격자상수 차이를 완화시켜 줄 수 있는 물질로 이루어 질 수 있다. 예를 들어, GaN, InN, AlN, AlInN, InGaN, AlGaN, 및 InAlGaN 과 같은 물질을 포함할 수 있다.However, the present invention is not necessarily limited thereto, and the undoped semiconductor layer may be replaced with another type of absorbing layer that absorbs a UV laser. The absorber layer may be a buffer layer, may be formed in a low temperature atmosphere, and may be formed of a material that can alleviate the difference in lattice constant between the semiconductor layer and the growth substrate. For example, it may include materials such as GaN, InN, AlN, AlInN, InGaN, AlGaN, and InAlGaN.
이상에서 설명된 제조방법에 의하면, 반사입자를 도포하여, 반도체 발광소자들의 개별 소자를 감싸는 구조에 따라, 간단한 제법임에도 불구하고 디스플레이 장치의 휘도 향상이 구현될 수 있다.According to the manufacturing method described above, by applying the reflective particles, depending on the structure surrounding the individual elements of the semiconductor light emitting device, the brightness of the display device can be improved despite the simple manufacturing method.
이상에서 설명한 반도체 발광 소자를 이용한 디스플레이 장치는 위에서 설명된 실시예들의 구성과 방법에 한정되는 것이 아니라, 상기 실시예들은 다양한 변형이 이루어질 수 있도록 각 실시예들의 전부 또는 일부가 선택적으로 조합되어 구성될 수도 있다.The display device using the semiconductor light emitting device described above is not limited to the configuration and method of the embodiments described above, but the embodiments may be configured by selectively combining all or part of the embodiments so that various modifications may be made. It may be.

Claims (12)

  1. 전극이 배치되는 배선기판;A wiring board on which electrodes are disposed;
    상기 배선기판에 배치되는 접착층;An adhesive layer disposed on the wiring board;
    상기 접착층에 결합되며, 상기 전극과 전기적으로 연결되는 복수의 반도체 발광 소자들; 및A plurality of semiconductor light emitting devices coupled to the adhesive layer and electrically connected to the electrodes; And
    상기 복수의 반도체 발광소자들의 사이에 형성되는 공간에 충전되어, 상기 반도체 발광소자들에서 발광되는 빛을 반사하는 반사입자들을 포함하는 디스플레이 장치.And a reflective particle filled in a space formed between the plurality of semiconductor light emitting devices to reflect light emitted from the semiconductor light emitting devices.
  2. 제1항에 있어서,The method of claim 1,
    상기 접착층은 상기 복수의 반도체 발광 소자들과 함께 상기 반사입자들을 덮도록 형성되는 것을 특징으로 하는 디스플레이 장치.And the adhesive layer is formed to cover the reflective particles together with the plurality of semiconductor light emitting devices.
  3. 제2항에 있어서,The method of claim 2,
    상기 접착층은 적어도 일부가 상기 반사입자들의 사이로 침투하는 것을 특징으로 하는 디스플레이 장치.At least a portion of the adhesive layer penetrates between the reflective particles.
  4. 제1항에 있어서,The method of claim 1,
    상기 반사입자들은 나노 크기의 산화물을 포함하는 것을 특징으로 하는 디스플레이 장치.And the reflective particles comprise a nano-sized oxide.
  5. 제4항에 있어서,The method of claim 4, wherein
    상기 나노 크기의 산화물은 구상, 침상 및 판상의 알루미나 또는 타이타니아 중 어느 하나인 것을 특징으로 하는 디스플레이 장치.The nano-sized oxide is any one of spherical, acicular and plate-shaped alumina or titania.
  6. 제1항에 있어서,The method of claim 1,
    상기 복수의 반도체 발광소자들은 각각, 일방향을 따라 서로 이격 배치되는 제1도전형 전극 및 제2도전형 전극을 구비하며,Each of the plurality of semiconductor light emitting devices includes a first conductive electrode and a second conductive electrode which are spaced apart from each other along one direction.
    상기 반사입자들은 상기 디스플레이 장치의 두께방향을 따라 상기 제1도전형 전극 및 제2도전형 전극 중 어느 하나와 오버랩되며, 다른 하나와 오버랩되지 않도록 배치되는 것을 특징으로 하는 디스플레이 장치.And the reflective particles overlap with any one of the first conductive electrode and the second conductive electrode in the thickness direction of the display device, and are arranged not to overlap with the other.
  7. 제6항에 있어서,The method of claim 6,
    상기 제1도전형 전극은 상기 제2도전형 전극으로부터 상기 반사입자들보다 먼 위치에 형성되는 하면을 구비하는 것을 특징으로 하는 디스플레이 장치.And the first conductive electrode has a lower surface formed at a position farther from the second conductive electrode than the reflective particles.
  8. 제6항에 있어서,The method of claim 6,
    상기 제2도전형 전극은 상기 복수의 반도체 발광 소자들 중 적어도 하나의 측면에서 돌출되도록 연장되는 것을 특징으로 하는 디스플레이 장치.The second conductive electrode extends to protrude from at least one side of the plurality of semiconductor light emitting devices.
  9. 제6항에 있어서,The method of claim 6,
    상기 복수의 반도체 발광소자들은 상기 제1도전형 전극 및 제2도전형 전극이 각각 배치되는 제1도전형 반도체층 및 제2도전형 반도체층을 구비하고, The plurality of semiconductor light emitting devices include a first conductive semiconductor layer and a second conductive semiconductor layer on which the first conductive electrode and the second conductive electrode are disposed, respectively.
    상기 제2도전형 전극과 상기 제2도전형 반도체층은 절연부에 의하여 덮이며, 상기 반사입자들은 상기 절연부를 덮도록 이루어지는 것을 특징으로 하는 디스플레이 장치.And the second conductive electrode and the second conductive semiconductor layer are covered by an insulating part, and the reflective particles cover the insulating part.
  10. 기판상에 제1도전형 반도체층, 활성층 및 제2도전형 반도체층을 성장시키는 단계;Growing a first conductive semiconductor layer, an active layer and a second conductive semiconductor layer on the substrate;
    식각을 통하여 상기 기판상에서 반도체 발광소자들의 어레이를 형성하고, 상기 반도체 발광소자들에 적어도 하나의 도전형 전극을 형성하는 단계;Forming an array of semiconductor light emitting devices on the substrate through etching, and forming at least one conductive electrode on the semiconductor light emitting devices;
    상기 반도체 발광소자들의 어레이에서 상기 반도체 발광소자들의 사이에 빛을 반사하는 반사입자들을 충전하는 단계; 및Charging reflective particles reflecting light between the semiconductor light emitting devices in the array of semiconductor light emitting devices; And
    상기 반사입자들을 충전된 반도체 발광소자들의 어레이를 배선기판과 연결하고 상기 기판을 제거하는 단계를 포함하는 디스플레이 장치의 제조방법.And connecting the array of semiconductor light emitting devices filled with the reflective particles with a wiring substrate and removing the substrate.
  11. 제10항에 있어서,The method of claim 10,
    상기 충전하는 단계는,The charging step,
    상기 반사입자들을 상기 반도체 발광소자들의 어레이에 도포하는 단계; 및Applying the reflective particles to the array of semiconductor light emitting devices; And
    롤링을 통하여 상기 도포된 반사입자들을 상기 반도체 발광소자들의 사이에 충전하는 단계를 포함하는 디스플레이 장치의 제조방법.And filling the coated reflective particles between the semiconductor light emitting devices through rolling.
  12. 제10항에 있어서,The method of claim 10,
    상기 기판상에서 반도체 발광소자들의 어레이를 형성한 후에, 상기 제2도전형 반도체층에는 제2도전형 전극이 적층되고, After forming an array of semiconductor light emitting devices on the substrate, a second conductive electrode is stacked on the second conductive semiconductor layer,
    상기 반사입자들이 상기 반도체 발광소자들의 사이에 충전된 후에, 상기 제1도전형 반도체층에는 제1도전형 전극이 적층되는 것을 특징으로 하는 디스플레이 장치의 제조방법.And after the reflective particles are filled between the semiconductor light emitting devices, a first conductive electrode is stacked on the first conductive semiconductor layer.
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