WO2016161819A1 - X射线成像系统和方法 - Google Patents

X射线成像系统和方法 Download PDF

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Publication number
WO2016161819A1
WO2016161819A1 PCT/CN2015/098454 CN2015098454W WO2016161819A1 WO 2016161819 A1 WO2016161819 A1 WO 2016161819A1 CN 2015098454 W CN2015098454 W CN 2015098454W WO 2016161819 A1 WO2016161819 A1 WO 2016161819A1
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Prior art keywords
ray
grating
image
inspected
dark field
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English (en)
French (fr)
Inventor
陈志强
张丽
沈乐
黄清萍
金鑫
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Tsinghua University
Nuctech Co Ltd
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Tsinghua University
Nuctech Co Ltd
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Priority to US15/505,199 priority Critical patent/US10641715B2/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph

Definitions

  • Embodiments of the present disclosure relate to radiation imaging, and in particular to a CT imaging system and method.
  • the existing X-ray imaging system utilizes the attenuation characteristics of X-rays of material materials to non-destructively inspect the internal structure of the object for substance identification or safety inspection.
  • a transmissive article machine that performs a security inspection on a baggage article transmits an image of the object to be inspected by X-rays to obtain an image that is attenuated in the transmission direction, and then determines the shape or transmission of the object in the attenuated image represented by the gradation. The value is used to determine whether or not dangerous substances are included in the object to be inspected.
  • the CT type product machine performs a CT scan on the object to be inspected to obtain a tomographic image of a certain position of the object to be inspected, thereby more accurately determining the internal structure of the object to be inspected, thereby achieving more accurate substance identification and safety inspection. performance.
  • a technique for checking an object more accurately or more quickly Even if such a technique still has a false positive or misidentification, there is still a technique for checking an object more accurately or more quickly.
  • the embodiment of the present disclosure proposes a CT imaging system and method.
  • an X-ray imaging system comprising: an X-ray source emitting an X-ray beam; a first grating and a second grating disposed in sequence along an emission direction of the X-ray; and a detector disposed at Downstream of the second grating in the X-ray emission direction; control and data processing means for controlling the X-ray source to emit X-rays, controlling the detector to receive X-rays passing through the first grating and the second grating, generating phase contrast information and / or dark field information, and CT inspection of the object to be inspected based on the phase contrast information and / or dark field information, to obtain a CT image.
  • control and data processing device controls the X-ray source and the detector to perform a transmission scan of the object under inspection to obtain phase contrast information and/or dark field information based on the phase contrast information and/or dark field
  • the information determines a position of interest in the object to be inspected, and performs a CT scan on the position of interest of the object to be inspected to obtain a CT image.
  • the CT image obtained by CT scanning the position of interest of the object to be inspected includes a phase At least one of a lining image, a dark field image, an attenuation coefficient image, an atomic number image, and an electron density image.
  • the CT scan is one of a circular orbit CT scan, a spiral orbit CT scan, and a raster based CT scan.
  • the X-ray imaging system further includes a source grating disposed between the X-ray source and the first absorption grating, and the scanned object is scanned between the source grating and the first absorption grating.
  • the position of the X-ray source and detector are interchangeable to form an inverse geometric grating imaging system.
  • the detector is specifically a line array detector or an area array detector.
  • the first grating and the second grating are respectively an absorption grating and/or a phase grating.
  • the first grating and the second grating are specifically a splicing of a focusing grating, an arc grating or a multi-segment linear grating.
  • an X-ray imaging method comprising the steps of: performing a transmission scan on an object to be inspected to obtain phase contrast information and/or dark field information; based on the phase contrast information and/or dark field Information determines a location of interest in the object under inspection; CT scans the location of interest of the object under inspection to obtain a CT image.
  • the step of determining a position of interest in the object under inspection according to the phase contrast information and/or dark field information comprises: being checked from phase contrast information and/or dark field information of the object to be inspected An internal feature of the object; wherein the internal feature satisfies a predetermined condition, the location of interest is determined based on the internal feature.
  • the CT image obtained by CT scanning the position of interest of the object to be inspected includes at least one of a phase contrast image, a dark field image, an attenuation coefficient image, an atomic number image, and an electron density image.
  • the CT scan is one of a circular orbit CT scan, a spiral orbit CT scan, and a raster based CT scan.
  • an X-ray imaging system comprising: an X-ray source emitting an X-ray beam; a first grating and a second grating disposed in sequence along an emission direction of the X-ray; a detector, setting Downstream of the second grating in the X-ray emission direction; control and data processing means for controlling the X-ray source to emit X-rays, controlling the detector to receive X-rays passing through the first grating and the second grating to generate phase contrast information And/or dark field information, and a transmission image obtained without scanning the first grating and the second grating, and determining whether the object to be inspected contains a suspect based on the transmission image and phase contrast information and/or dark field information.
  • an X-ray imaging system comprising: a first X-ray inspection apparatus that obtains a transmission image of an object to be inspected; and a second X-ray inspection apparatus that obtains a phase of the object to be inspected Lining information and/or dark field information; control and data processing means determining whether the object to be inspected contains a suspect based on the transmission image and phase contrast information and/or dark field information.
  • an X-ray imaging system comprising: a first X-ray CT apparatus for obtaining an X-ray CT image of an object to be inspected; and a second X-ray CT apparatus for obtaining an inspection A phase contrast CT image and/or a dark field CT image of the object; a control data processing device that determines whether the object to be inspected contains a suspect based on the X-ray CT image and the phase contrast CT image and/or the dark field CT image.
  • an X-ray imaging system comprising: an X-ray inspection apparatus that obtains a transmission image of an object to be inspected; an X-ray CT apparatus that obtains a phase contrast CT image of the object to be inspected and/or Or a dark field CT image; a control and data processing device that determines whether the object under inspection contains a suspect based on the transmission image and the phase contrast CT image and/or the dark field CT image.
  • an X-ray imaging system comprising: an X-ray source emitting an X-ray beam; a first grating and a second grating disposed in sequence along an emission direction of the X-ray; a detector, setting Downstream of the second grating in the X-ray emission direction; control and data processing means for controlling the X-ray source and the detector to perform CT scanning on the object to be inspected, obtaining a CT image, and utilizing the first grating according to the information of the CT image and The second grating produces phase contrast information and/or dark field information of the object under inspection.
  • FIG. 1 is a block diagram depicting an X-ray imaging system in accordance with an embodiment of the present disclosure
  • FIG. 2 is a flow chart describing an operational procedure of an X-ray imaging system in accordance with an embodiment of the present disclosure
  • FIG. 3 is a schematic structural view illustrating an X-ray imaging system according to another embodiment of the present disclosure.
  • FIG. 4 is a schematic diagram describing a structure of a grating used in an X-ray imaging system according to an embodiment of the present disclosure
  • FIG. 5 is a schematic structural view illustrating an X-ray imaging system according to still another embodiment of the present disclosure.
  • FIG. 6 is a schematic structural view illustrating an X-ray imaging system according to still another embodiment of the present disclosure.
  • FIG. 7 is a diagram describing an example of performing substance recognition or dangerous goods identification in accordance with an embodiment of the present disclosure.
  • FIG. 8 is another example of describing substance identification or dangerous goods identification in accordance with another embodiment of the present disclosure.
  • FIG. 1 is a schematic structural view describing an X-ray imaging system according to an embodiment of the present disclosure.
  • an X-ray imaging system according to an embodiment of the present disclosure includes an X-ray source 10, a detector 20, a drive mechanism 30, a lifting and rotating mechanism 50, a control and imaging computer 60, a source grating 70, and a first absorption grating 80. And a second absorption grating 90.
  • the X-ray source 10 is, for example, an X-ray machine or the like
  • the probe 20 is, for example, a line array detector or an area array detector.
  • the active grating 70 is included in the illustrated embodiment, those skilled in the art will appreciate that where the spot of the X-ray source 10 is sufficiently small, the source grating may not be used. In the case where the source grating 70 is included, the source grating 70 is disposed between the X-ray source 10 and the first absorption grating 80, and the scanned object 40 is scanned between the source grating 70 and the first absorption grating 80. Although absorption gratings 80 and 90 are used in the illustrated embodiment, these gratings may also be phase gratings.
  • a (DR) digital radiography scan and a two-dimensional circular orbit fan beam CT scan can be realized.
  • a preliminary determination is made by acquiring the DR image of the first-order phase information and the dark field information to identify, for example, whether non-uniformity exists in the liquid article.
  • the final judgment is made by the CT image of the phase information, the dark field information, and the attenuation coefficient, and the composition of the liquid is identified.
  • step S10 the control and imaging computer 60 controls the X-ray source 10, the detector 20, and the lifting and rotating mechanism 50 to perform a transmission scan of the object 40 to be inspected, and is obtained by the detector 20.
  • Phase contrast information and/or dark field information of the object to be inspected are obtained by the detector 20.
  • the control and imaging computer 60 determines the location of interest in the object under inspection based on the phase contrast information and/or dark field information.
  • step S30 the control and imaging computer 60 controls the drive mechanism 30 to move the source grating 70, the first absorption grating 80, and the second absorption grating 90 out of the inspection field of view, and performs a circular orbit on the object to be inspected at the determined position of interest.
  • CT scan CT scan such as spiral orbital CT scan
  • the CT image of the object to be inspected is obtained, and then the substance is identified or checked to determine whether it contains dangerous goods or prohibited substances.
  • the CT image obtained by CT scanning the position of interest of the object under inspection includes at least one of a phase contrast image, a dark field image, an attenuation coefficient image, an atomic number image, and an electron density image.
  • an internal feature of the object to be inspected is obtained from phase contrast information and/or dark field information of the object to be inspected, and if the internal feature satisfies a predetermined condition, the interest is determined according to the internal feature Position, and then CT scan at the location of interest. This can improve the accuracy of the inspection and increase the speed of inspection.
  • control and imaging computer control 60 may, after obtaining the location of interest, may also remove the drive mechanism 30 from the imaging field of view, but perform a raster-based CT imaging process on the object under inspection at the location of interest, A CT image is obtained, which is then subjected to substance identification or inspection to determine whether it contains dangerous goods or prohibited substances.
  • the above example of the working process is to first perform transmission imaging (for example, grating-based transmission imaging) on the object to be inspected, determine the position of interest, and then perform a CT scan such as a circular orbit or other raster-based CT scan, but Those skilled in the art will also recognize that the X-ray imaging system described above can also perform CT scans and raster-based CT scans of the object to be inspected, and then combine the information obtained by the two scans for security check. In other examples of working processes, it is also possible to perform a security check on the object to be inspected by performing a transmission scan without using a grating and a transmission scan using a grating, thereby synthesizing the information obtained by the two scans.
  • transmission imaging for example, grating-based transmission imaging
  • CT inspection is performed based on phase contrast information and/or dark field information.
  • the object to be inspected may be first examined by CT, and then according to the actual situation reflected by the information of the CT inspection, such as the internal structure of the object or the liquid containing the internal structure, etc.,
  • the liquid article is subjected to grating-based phase contrast imaging and/or dark field imaging to obtain phase contrast information and/or dark field information.
  • FIG. 3 is a schematic structural diagram describing an X-ray imaging system according to another embodiment of the present disclosure.
  • the scheme shown in Figure 3 relates to the structure of an inverse geometric grating imaging system.
  • the positions of the X-ray source 10 and the detector 20 are interchanged, thereby realizing the inverse geometric grating optical path.
  • the optical path is unchanged from the scheme of Figure 1, but the positions of X-ray source 10 and detector 20 are swapped.
  • Common geometric grating area source grating area ⁇ first light
  • the gate area ⁇ the second grating area, the period of the first grating of the period ⁇ the period of the first grating ⁇ the period of the source grating.
  • FIG. 4 is a schematic diagram describing the structure of a grating used in an X-ray imaging system according to an embodiment of the present disclosure.
  • the grating should be designed to be in focus or near focus, as described in detail in (A), (B), and (C) of FIG. 4, wherein (A) shows Light source 401 and focusing grating 402, (B) shows light source 401 and curved grating 403, and (C) shows light source 401 and multi-segment linear grating splicing 404.
  • the second absorption grating 90 its function is to block the area of one-half of the detector unit (for example, the line detector includes a plurality of detector units), so if the detector pixel is close to the grating period, shielding can be employed.
  • the half detector is used to achieve the occlusion of the second absorption grating.
  • FIG. 5 is a schematic structural diagram describing an X-ray imaging system according to still another embodiment of the present disclosure.
  • the X-ray imaging system includes at least one set of raster DR imaging subsystems, including an X-ray source 420, a first absorption grating 480 and a second absorption grating 490, and a detector 470.
  • a second set of DR imaging subsystems can be added, either dual-energy X-ray DR or raster DR.
  • the second system includes an X-ray source 410 and a detector 460.
  • the object 450 to be inspected moves on the carrier mechanism 440, passing through two sets of systems in sequence.
  • the control and imaging computer 430 respectively controls the first system and the second system to perform inspection based on phase contrast information, dark field information, transmission information, electron density information, atomic number information, etc., and then comprehensively analyzes the above information for security check. And substance identification.
  • the control and imaging computer selects at least two or three of the above information for security check or substance identification.
  • the viewing direction of the second set of DR imaging subsystems is at an angle to the viewing direction of the first set of DR imaging subsystems.
  • the object to be inspected passes through two sets of DR imaging subsystems through the carrying mechanism 440.
  • the line integral of the attenuation coefficient and the line integral of the electron density can be obtained.
  • the line integral of the attenuation coefficient, the first-order phase difference, and the line integral of the dark field information can be obtained. .
  • the control and imaging computer identifies and judges dangerous goods based on the complementary information provided by the two sets of DR systems.
  • FIG. 6 is a block diagram depicting an X-ray imaging system according to still another embodiment of the present disclosure.
  • the X-ray imaging system includes two sets of grating-based DR systems, of which the first system A source grating 480 and an absorption grating 490 are included, and the second system includes a source grating 520 and an absorption grating 510.
  • the X-ray imaging system includes a set of raster CT imaging subsystems and a set of conventional dual energy X-ray CT imaging subsystems.
  • the object to be inspected passes through the bearing mechanism and sequentially enters two sets of CT subsystems for CT scanning and reconstruction.
  • the dual-energy X-ray CT imaging subsystem the electron density, atomic number, high-energy attenuation coefficient, and low-energy attenuation coefficient information of the scanning fault can be obtained.
  • the refractive index of the scanning fault can be obtained. Characteristic quantities such as rate, dark field information, and attenuation coefficient information. Combining the above feature quantities, at least two feature quantities are selected for identification of dangerous goods.
  • FIG. 7 is a diagram describing an example of performing substance recognition or dangerous article identification in accordance with an embodiment of the present disclosure. As shown in Fig. 7, dangerous goods identification is performed using electron density, atomic number, and refractive index.
  • FIG. 8 is another example of describing substance identification or dangerous goods identification in accordance with another embodiment of the present disclosure. As shown in Fig. 8, the damage identification, dark field information, and refractive index are used for dangerous goods identification. As described above, since the raster-based scanning imaging information and the raster-free scanning imaging information are used, more feature information of the object to be inspected is integrated, and the obtained inspection result is more accurate.
  • aspects of the embodiments disclosed herein may be implemented in an integrated circuit as a whole or in part, as one or more of one or more computers running on one or more computers.
  • a computer program eg, implemented as one or more programs running on one or more computer systems
  • implemented as one or more programs running on one or more processors eg, implemented as one or One or more programs running on a plurality of microprocessors, implemented as firmware, or substantially in any combination of the above, and those skilled in the art, in accordance with the present disclosure, will be provided with design circuitry and/or write software and / or firmware code capabilities.
  • signal bearing media include, but are not limited to, recordable media such as floppy disks, hard disk drives, compact disks (CDs), digital versatile disks (DVDs), digital tapes, computer memories.
  • transmission media such as digital and/or analog communication media (eg, fiber optic cables, waveguides, wired communication links, wireless communication links, etc.).

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Abstract

一种X射线成像系统和方法。该系统包括：X射线源（10），发出X射线束；沿着X射线的发射方向依次设置的第一光栅（80）和第二光栅（90）；探测器（20），设置在X射线发射方向上第二光栅（90）的下游；控制和数据处理装置（60），用于控制X射线源（10）发出X射线，控制所述探测器（20）接收经过第一光栅（80）和第二光栅（90）的X射线，产生相衬信息和/或暗场信息，并且基于所述相衬信息和/或暗场信息对被检查物体（40）进行CT检查，获得CT图像。利用该系统，能够得到被检查物体的更多的特征信息，从而允许作出更准确的物质识别及提高安检性能。

Description

X射线成像系统和方法 技术领域
本公开的实施例涉及辐射成像，具体涉及一种CT成像系统和方法。
背景技术
现有的X射线成像系统是利用物质材料对X射线的衰减特性来非破坏性地检查物体的内部结构进而进行物质识别或者安全检查。例如，对行李物品进行安全检查的透射型物品机利用X射线对被检查物体进行透射成像，得到透射方向上衰减后的图像，然后通过判断以灰度表示的衰减图像中的物体的形状或者透射值来判断被检查物体中是否包含危险品等。进一步地，CT型物品机是对被检查物体进行CT扫描，得到被检查物体某个位置的断层图像，从而更确切地判断出被检查物体的内部结构，实现更为准确的物质识别和安全检查性能。但是，即使这样的技术仍旧存在误报或者错误识别的情况，仍旧存在更准确或者更快速地检查物体的技术。
发明内容
针对现有技术中存在的能谱重叠影响了物质区分能力的技术问题，本公开的实施例提出了一种CT成像系统和方法。
在本公开的一个方面，提出了一种X射线成像系统，包括：X射线源，发出X射线束；沿着X射线的发射方向依次设置的第一光栅和第二光栅；探测器，设置在X射线发射方向上第二光栅的下游；控制和数据处理装置，用于控制X射线源发出X射线，控制所述探测器接收经过第一光栅和第二光栅的X射线，产生相衬信息和/或暗场信息，并且基于所述相衬信息和/或暗场信息对被检查物体进行CT检查，获得CT图像。
优选地，控制和数据处理装置控制所述X射线源和所述探测器对对被检查物体进行透射扫描，获得相衬信息和/或暗场信息，基于所述相衬信息和/或暗场信息确定所述被检查物体中的感兴趣位置，并且对所述被检查物体的感兴趣位置进行CT扫描，获得CT图像。
优选地，对所述被检查物体的感兴趣位置进行CT扫描得到的CT图像包括相 衬图像、暗场图像、衰减系数图像、原子序数图像、电子密度图像中的至少之一。
优选地，所述CT扫描是圆轨道CT扫描、螺旋轨道CT扫描、基于光栅的CT扫描之一。
优选地，所述的X射线成像系统还包括源光栅，设置在X射线源和第一吸收光栅之间，被扫描物体在源光栅和第一吸收光栅之间进行扫描。
优选地，X射线源和探测器的位置是可交换的，以形成反几何光栅成像系统。
优选地，所述探测器具体为线阵探测器或者面阵探测器。
优选地，所述第一光栅和所述第二光栅分别为吸收光栅和/或相位光栅。
优选地，所述第一光栅和第二光栅具体为聚焦光栅、弧形光栅或者多段直线光栅的拼接。
在本公开的另一方面，提出了一种X射线成像方法，包括步骤：对被检查物体进行透射扫描，获得相衬信息和/或暗场信息；基于所述相衬信息和/或暗场信息确定所述被检查物体中的感兴趣位置；对所述被检查物体的感兴趣位置进行CT扫描，获得CT图像。
优选地，根据所述相衬信息和/或暗场信息确定所述被检查物体中的感兴趣位置的步骤包括：从所述被检查物体的相衬信息和/或暗场信息中得到被检查物体的内部特征；在所述内部特征满足预定条件的情况下，根据所述内部特征确定感兴趣位置。
优选地，对所述被检查物体的感兴趣位置进行CT扫描得到的CT图像包括相衬图像、暗场图像、衰减系数图像、原子序数图像、电子密度图像中的至少之一。
优选地，所述CT扫描是圆轨道CT扫描、螺旋轨道CT扫描、基于光栅的CT扫描之一。
在本公开的再一方面，提出了一种X射线成像系统，包括：X射线源，发出X射线束；沿着X射线的发射方向依次设置的第一光栅和第二光栅；探测器，设置在X射线发射方向上第二光栅的下游；控制和数据处理装置，用于控制X射线源发出X射线，控制所述探测器接收经过第一光栅和第二光栅的X射线，产生相衬信息和/或暗场信息，以及不使用第一光栅和第二光栅扫描得到的透射图像，并且基于所述透射图像和相衬信息和/或暗场信息判断被检查物体是否包含嫌疑物。
在本公开的又一方面，提出了一种X射线成像系统，包括：第一X射线检查设备，获得被检查物体的透射图像；第二X射线检查设备，获得被检查物体的相 衬信息和/或暗场信息；控制和数据处理装置，基于所述透射图像和相衬信息和/或暗场信息判断被检查物体是否包含嫌疑物。
在本公开的又一方面，提出了一种X射线成像系统，包括：第一X射线CT设备，用于获得被检查物体的X光CT图像；第二X射线CT设备，用于获得被检查物体的相衬CT图像和/或暗场CT图像；控制数据处理装置，基于所述X光CT图像和相衬CT图像和/或暗场CT图像判断被检查物体是否包含嫌疑物。
在本公开的又一方面，提出了一种X射线成像系统，包括：X射线检查设备，获得被检查物体的透射图像；X射线CT设备，用于获得被检查物体的相衬CT图像和/或暗场CT图像；控制和数据处理装置，基于所述透射图像和相衬CT图像和/或暗场CT图像判断被检查物体是否包含嫌疑物。
在本公开的再一方面，提供了一种X射线成像系统，包括：X射线源，发出X射线束；沿着X射线的发射方向依次设置的第一光栅和第二光栅；探测器，设置在X射线发射方向上第二光栅的下游；控制和数据处理装置，用于控制X射线源和探测器对被检查物体进行CT扫描，得到CT图像，并根据CT图像的信息利用第一光栅和第二光栅，产生被检查物体的相衬信息和/或暗场信息。
利用上述技术方案，能够得到被检查物体的更多的特征信息，从而允许做出更准确的物质识别及安检性能。
附图说明
下面的附图表明了本公开的实施方式。这些附图和实施方式以非限制性、非穷举性的方式提供了本公开的一些实施例，其中：
图1是描述根据本公开实施例的X射线成像系统的结构示意图；
图2是描述根据本公开实施例的X射线成像系统的操作过程的流程图；
图3是描述根据本公开另一实施例的X射线成像系统的结构示意图；
图4是描述在根据本公开实施例的X射线成像系统中使用的光栅的结构的示意图；
图5是描述根据本公开又一实施例的X射线成像系统的结构示意图；
图6是描述根据本公开再一实施例的X射线成像系统的结构示意图；
图7是描述根据本公开的实施例中进行物质识别或者危险品识别的例子；以及
图8是描述根据本公开的另一实施例中进行物质识别或者危险品识别的另一例子。
具体实施方式
下面将详细描述本公开的具体实施例，应当注意，这里描述的实施例只用于举例说明，并不用于限制本公开。在以下描述中，为了提供对本公开的透彻理解，阐述了大量特定细节。然而，对于本领域普通技术人员显而易见的是：不必采用这些特定细节来实行本公开。在其他实例中，为了避免混淆本公开，未具体描述公知的电路、材料或方法。
图1是描述根据本公开实施例的X射线成像系统的结构示意图。如图1所示，根据本公开实施例的X射线成像系统包括X射线源10、探测器20、驱动机构30、升降旋转机构50、控制和成像计算机60、源光栅70、第一吸收光栅80和第二吸收光栅90。X射线源10例如为X光机等，探测器20例如为线阵探测器或者面阵探测器等。虽然在图示的实施例中包含有源光栅70，但是本领域的技术人员能够理解，在X射线源10的光点足够小的情况下，可以不使用源光栅。在包含源光栅70的情况下，源光栅70设置在X射线源10和第一吸收光栅80之间，被扫描物体40在源光栅70和第一吸收光栅80之间进行扫描。虽然在图示的实施例中使用了吸收光栅80和90，但是这些光栅也可以为相位光栅。
例如，在使用线阵探测器的情况下，搭配源光栅70、第一吸收光栅80和第二吸收光栅90，可以实现透射(DR,digital radiography)扫描和二维圆轨道扇束CT扫描。在DR扫描模式下，通过获取一阶相位信息、暗场信息的DR图像进行初步判断，识别例如液体物品中是否存在非均匀性。通过相位信息、暗场信息和衰减系数的CT图像进行最终判断，识别液体的成分。
在一个示例工作过程中，如图2所述，在步骤S10，控制和成像计算机60控制X射线源10、探测器20和升降旋转机构50对被检查物体40进行透射扫描，通过探测器20得到被检查物体的相衬信息和/或暗场信息等。在此基础上，在步骤S20，控制和成像计算机60根据所述相衬信息和/或暗场信息确定被检查物体中的感兴趣位置。然后，在步骤S30，控制和成像计算机60控制驱动机构30将源光栅70、第一吸收光栅80和第二吸收光栅90移出检查视野，在所确定的感兴趣位置对被检查物体进行诸如圆轨道CT扫描、螺旋轨道CT扫描之类的CT扫 描，得到被检查物体的CT图像，进而进行物质识别或者检查判断其是否包含了危险品或者违禁物。
在优选实施例中，对被检查物体的感兴趣位置进行CT扫描得到的CT图像包括相衬图像、暗场图像、衰减系数图像、原子序数图像、电子密度图像中的至少之一。具体来说，对从所述被检查物体的相衬信息和/或暗场信息中得到被检查物体的内部特征，在所述内部特征满足预定条件的情况下，根据所述内部特征确定感兴趣位置，进而在感兴趣位置进行CT扫描。这样既能够提高检查的准确率，又提高了检查的速度。
在另一示例工作过程中，控制和成像计算机控制60在得到感兴趣位置后，也可以不将驱动机构30移出成像视野，而是在感兴趣位置对被检查物体进行基于光栅的CT成像处理，得到CT图像，进而进行物质识别或者检查判断其是否包含了危险品或者违禁物。
虽然上述的工作过程的例子中是先对被检查物体进行透射成像(例如基于光栅的透射成像)，确定感兴趣位置，然后进行诸如圆轨道的CT扫描或者其他的基于光栅的CT扫描，但是本领域的技术人员也可以认识到，上述的X射线成像系统也可以对被检查物体进行不适用光栅的CT扫描和基于光栅的CT扫描，然后综合两次扫描得到的信息来进行安全检查。在其他的工作过程的例子中，也可以对被检查物体进行不使用光栅的透射扫描和使用光栅的透射扫描，进而综合两次扫描得到的信息来进行安全检查。
此外，在图示的实施例中描述的是基于相衬信息和/或暗场信息来进行CT检查。在其他的实施例中，也可以先对被检查物体进行CT检查，然后根据CT检查的信息所反映的实际情况，例如物体的内部结构或者液体包含了内部结构等信息，来对被检查物体或者液体物品进行基于光栅的相衬成像和/或暗场成像，得到相衬信息和/或暗场信息。
图3是描述根据本公开另一实施例的X射线成像系统的结构示意图。如图3所示的方案涉及反几何光栅成像系统的结构。与图1的系统相比可知，在图3的例子中，X射线源10和探测器20的位置进行了互换，从而实现了反几何光栅光路。
如图3所示的反几何光栅成像的例子中，光路相比于图1的方案不变，但交换了X射线源10和探测器20的位置。普通几何的光栅面积源光栅面积<第一光 栅面积<第二光栅面积，周期第一光栅的周期<第一光栅的周期<源光栅的周期。对于反几何光路，源光栅面积>第一光栅面积>第二光栅面积，而光栅周期不变，这样加工较容易。
图4是描述在根据本公开实施例的X射线成像系统中使用的光栅的结构的示意图。在本公开的实施例中，对于发散射线束，光栅应当设计为聚焦或接近聚焦的，具体参见图4中(A)、(B)和(C)3种方式，其中(A)示出了光源401和聚焦光栅402，(B)示出了光源401和弧形光栅403，(C)示出了光源401和多段直线光栅拼接404。
此外，对于第二吸收光栅90，其作用就是遮挡二分之一的探测器单元的面积(例如线阵探测器包括多个探测器单元)，因此，如果探测器像素接近光栅周期，可以采用屏蔽一半探测器的方式来实现第二吸收光栅的遮挡作用。
图5是描述根据本公开又一实施例的X射线成像系统的结构示意图。如图5所示的实施例中，X射线成像系统包括至少一套光栅DR成像子系统，包含X射线源420，第一吸收光栅480和第二吸收光栅490，探测器470。在此基础上，可以附加第二套DR成像子系统，既可以是双能X射线DR，也可以是光栅DR。例如第二套系统包括X射线源410和探测器460。
被检查物体450在承载机构440上运动，依次通过两套系统。控制和成像计算机430分别控制第一套系统和第二套系统进行检查，得到基于相衬信息、暗场信息、透射信息、电子密度信息、原子序数信息等等，然后综合上述的信息进行安全检查和物质识别。例如，控制和成像计算机从上述的信息中选择至少两种或者三种来进行安全检查或者物质识别。
在示例中，第二套DR成像子系统的视角方向与第一套DR成像子系统的视角方向具有一定夹角。
被检查物体通过承载机构440依次经过2套DR成像子系统。对于双能X射线DR系统，可以获取的是衰减系数的线积分、电子密度的线积分；对于光栅DR系统，可以获取的是衰减系数的线积分、一阶相位差分、暗场信息的线积分。这样，控制和成像计算机根据2套DR系统提供的互补信息进行危险品的识别和判断。
图6是描述根据本公开再一实施例的X射线成像系统的结构示意图。在图6的示例中，该X射线成像系统包括两套基于光栅的DR系统，其中第一套系统中 包含了源光栅480和吸收光栅490，第二套系统包含了源光栅520和吸收光栅510。
在其他实施例中，X射线成像系统包括一套光栅CT成像子系统和一套普通的双能X射线CT成像子系统。被检查物体通过承载机构，依次进入2套CT子系统进行CT扫描和重建。对于双能X射线CT成像子系统，可以获得的是扫描断层的电子密度、原子序数、高能衰减系数、低能衰减系数信息等特征量；对于光栅CT成像子系统，可以获得的是扫描断层的折射率、暗场信息和衰减系数信息等特征量。综合上述特征量，选择至少2个特征量进行危险品的识别。
图7是描述根据本公开的实施例中进行物质识别或者危险品识别的例子。如图7所示，使用电子密度、原子序数和折射率进行危险品识别。图8是描述根据本公开的另一实施例中进行物质识别或者危险品识别的另一例子。如图8所示，使用衰减系数、暗场信息和折射率进行危险品识别。如上所述，由于使用了基于光栅的扫描成像信息和不基于光栅的扫描成像信息，因此综合了被检查物体的更多的特征信息，得到的检查结果也更为准确。
以上的详细描述通过使用方框图、流程图和/或示例，已经阐述了X射线成像系统和方法的众多实施例。在这种方框图、流程图和/或示例包含一个或多个功能和/或操作的情况下，本领域技术人员应理解，这种方框图、流程图或示例中的每一功能和/或操作可以通过各种硬件、软件、固件或实质上它们的任意组合来单独和/或共同实现。在一个实施例中，本公开的实施例所述主题的若干部分可以通过专用集成电路(ASIC)、现场可编程门阵列(FPGA)、数字信号处理器(DSP)、或其他集成格式来实现。然而，本领域技术人员应认识到，这里所公开的实施例的一些方面在整体上或部分地可以等同地实现在集成电路中，实现为在一台或多台计算机上运行的一个或多个计算机程序(例如，实现为在一台或多台计算机系统上运行的一个或多个程序)，实现为在一个或多个处理器上运行的一个或多个程序(例如，实现为在一个或多个微处理器上运行的一个或多个程序)，实现为固件，或者实质上实现为上述方式的任意组合，并且本领域技术人员根据本公开，将具备设计电路和/或写入软件和/或固件代码的能力。此外，本领域技术人员将认识到，本公开所述主题的机制能够作为多种形式的程序产品进行分发，并且无论实际用来执行分发的信号承载介质的具体类型如何，本公开所述主题的示例性实施例均适用。信号承载介质的示例包括但不限于：可记录型介质，如软盘、硬盘驱动器、紧致盘(CD)、数字通用盘(DVD)、数字磁带、计算机存储器 等；以及传输型介质，如数字和/或模拟通信介质(例如，光纤光缆、波导、有线通信链路、无线通信链路等)。
虽然已参照几个典型实施例描述了本公开，但应当理解，所用的术语是说明和示例性、而非限制性的术语。由于本公开能够以多种形式具体实施而不脱离公开的精神或实质，所以应当理解，上述实施例不限于任何前述的细节，而应在随附权利要求所限定的精神和范围内广泛地解释，因此落入权利要求或其等效范围内的全部变化和改型都应为随附权利要求所涵盖。

Claims (18)

  1. 一种X射线成像系统，包括：
    X射线源，发出X射线束；
    沿着X射线的发射方向依次设置的第一光栅和第二光栅；
    探测器，设置在X射线发射方向上第二光栅的下游；
    控制和数据处理装置，用于控制X射线源发出X射线，控制所述探测器接收经过第一光栅和第二光栅的X射线，产生相衬信息和/或暗场信息，并且基于所述相衬信息和/或暗场信息对被检查物体进行CT检查，获得CT图像。
  2. 如权利要求1所述的X射线成像系统，其中控制和数据处理装置控制所述X射线源和所述探测器对对被检查物体进行透射扫描，获得相衬信息和/或暗场信息，基于所述相衬信息和/或暗场信息确定所述被检查物体中的感兴趣位置，并且对所述被检查物体的感兴趣位置进行CT扫描，获得CT图像。
  3. 如权利要求2所述的X射线成像系统，其中对所述被检查物体的感兴趣位置进行CT扫描得到的CT图像包括相衬图像、暗场图像、衰减系数图像、原子序数图像、电子密度图像中的至少之一。
  4. 如权利要求2所述的X射线成像系统，其中所述CT扫描是圆轨道CT扫描、螺旋轨道CT扫描、基于光栅的CT扫描之一。
  5. 如权利要求1所述的X射线成像系统，还包括源光栅，设置在X射线源和第一吸收光栅之间，被扫描物体在源光栅和第一吸收光栅之间进行扫描。
  6. 如权利要求1所述的X射线成像系统，其中X射线源和探测器的位置是可交换的，以形成反几何光栅成像系统。
  7. 如权利要求1所述的X射线成像系统，其中所述探测器具体为线阵探测器或者面阵探测器。
  8. 如权利要求1所述的X射线成像系统，其中所述第一光栅和所述第二光栅分别为吸收光栅和/或相位光栅。
  9. 如权利要求1所述的X射线成像系统，其中所述第一光栅和第二光栅具体为聚焦光栅、弧形光栅或者多段直线光栅的拼接。
  10. 一种X射线成像方法，包括步骤：
    对被检查物体进行透射扫描，获得相衬信息和/或暗场信息；
    基于所述相衬信息和/或暗场信息确定所述被检查物体中的感兴趣位置；
    对所述被检查物体的感兴趣位置进行CT扫描，获得CT图像。
  11. 如权利要求10所述的方法，其中根据所述相衬信息和/或暗场信息确定所述被检查物体中的感兴趣位置的步骤包括：
    从所述被检查物体的相衬信息和/或暗场信息中得到被检查物体的内部特征；
    在所述内部特征满足预定条件的情况下，根据所述内部特征确定感兴趣位置。
  12. 如权利要求10所述的方法，其中对所述被检查物体的感兴趣位置进行CT扫描得到的CT图像包括相衬图像、暗场图像、衰减系数图像、原子序数图像、电子密度图像中的至少之一。
  13. 如权利要求10所述的方法，其中所述CT扫描是圆轨道CT扫描、螺旋轨道CT扫描、基于光栅的CT扫描之一。
  14. 一种X射线成像系统，包括：
    X射线源，发出X射线束；
    沿着X射线的发射方向依次设置的第一光栅和第二光栅；
    探测器，设置在X射线发射方向上第二光栅的下游；
    控制和数据处理装置，用于控制X射线源发出X射线，控制所述探测器接收经过第一光栅和第二光栅的X射线，产生相衬信息和/或暗场信息，以及不使用第一光栅和第二光栅扫描得到的透射图像，并且基于所述透射图像和相衬信息和/或暗场信息判断被检查物体是否包含嫌疑物。
  15. 一种X射线成像系统，包括：
    第一X射线检查设备，获得被检查物体的透射图像；
    第二X射线检查设备，获得被检查物体的相衬信息和/或暗场信息；
    控制和数据处理装置，基于所述透射图像和相衬信息和/或暗场信息判断被检查物体是否包含嫌疑物。
  16. 一种X射线成像系统，包括：
    第一X射线CT设备，用于获得被检查物体的X光CT图像；
    第二X射线CT设备，用于获得被检查物体的相衬CT图像和/或暗场CT图像；
    控制数据处理装置，基于所述X光CT图像和相衬CT图像和/或暗场CT图像判断被检查物体是否包含嫌疑物。
  17. 一种X射线成像系统，包括：
    X射线检查设备，获得被检查物体的透射图像；
    X射线CT设备，用于获得被检查物体的相衬CT图像和/或暗场CT图像；
    控制和数据处理装置，基于所述透射图像和相衬CT图像和/或暗场CT图像判断被检查物体是否包含嫌疑物。
  18. 一种X射线成像系统，包括：
    X射线源，发出X射线束；
    沿着X射线的发射方向依次设置的第一光栅和第二光栅；
    探测器，设置在X射线发射方向上第二光栅的下游；
    控制和数据处理装置，用于控制X射线源和探测器对被检查物体进行CT扫描，得到CT图像，并根据CT图像的信息利用第一光栅和第二光栅，产生被检查物体的相衬信息和/或暗场信息。
PCT/CN2015/098454 2015-04-08 2015-12-23 X射线成像系统和方法 Ceased WO2016161819A1 (zh)

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