WO2016069800A1 - Systèmes et procédés pour conformer des testeurs de dispositif à un dispositif de circuit intégré avec soupape de surpression - Google Patents

Systèmes et procédés pour conformer des testeurs de dispositif à un dispositif de circuit intégré avec soupape de surpression Download PDF

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Publication number
WO2016069800A1
WO2016069800A1 PCT/US2015/057896 US2015057896W WO2016069800A1 WO 2016069800 A1 WO2016069800 A1 WO 2016069800A1 US 2015057896 W US2015057896 W US 2015057896W WO 2016069800 A1 WO2016069800 A1 WO 2016069800A1
Authority
WO
WIPO (PCT)
Prior art keywords
fluid
relief valve
pressure relief
pedestal
heat
Prior art date
Application number
PCT/US2015/057896
Other languages
English (en)
Inventor
Nasser Barabi
Chee Wah HO
Joven R. TIENZO
Oksana Kryachek
Elena V. NAZAROV
Original Assignee
Essai, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US14/525,223 external-priority patent/US9383406B2/en
Application filed by Essai, Inc. filed Critical Essai, Inc.
Priority to KR1020177014494A priority Critical patent/KR102372074B1/ko
Publication of WO2016069800A1 publication Critical patent/WO2016069800A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations

Definitions

  • the present invention generally relates to the testing of integrated circuit (IC) devices such as packaged semiconductor chips.
  • Device testers are configured to conform to the shape of integrated circuit devices under test (DUTs) while maintaining a set point temperature on an IC device under test.
  • DUTs integrated circuit devices under test
  • the tester includes a thermal control unit and a fluid management system configured to supply the thermal control unit with fluids for pneumatic actuation, cooling, and condensation abating.
  • the fluids are kept under pressure in a sub-assembly of the thermal control unit. As temperature changes the fluid can be over pressurized with the accompanying potential damage to the sub-assembly of the thermal control unit.
  • an IC device tester is configured to maintain the set point temperature on an IC DUT by having a thermal control unit and a fluid management system configured to supply the thermal control unit with fluids for pneumatic actuation, cooling, and condensation abating.
  • the fluid is kept under pressure in a sub-assembly of the thermal control unit, a fluid management system.
  • the fluid management system is prevented from being over pressurized by incorporating a pressure relief valve that can prevent potential damage to the sub- assembly of the thermal control unit due to the fluid being over pressurized as temperature changes.
  • FIG. 1 is a side view of an exemplary thermal control unit that includes a z-axis force balancing mechanism in accordance with one aspect of the invention
  • FIG. 2 is a cross-sectional view thereof taken along section lines 2-2 in
  • FIG. 1 A first figure.
  • FIG. 3 is another cross-sectional view thereof taken along section lines
  • FIG. 4 is a bottom perspective view of the z-axis load distributor actuator block of the z-axis force distribution system of the TCU shown in FIGS. 1-4;
  • FIG. 5 is a cross-sectional view of the load distributor actuator block shown in FIG. 4 along the line 5-5, in combination with a spring loaded gimbal;
  • FIG. 6 is a side view of another exemplary embodiment of a thermal control unit in accordance with the present invention.
  • FIG. 7 A is cross-sectional view thereof taken along section lines 7A-
  • FIG. 7A in FIG. 6, while FIG. 7B is an exploded view of FIG. 7A;
  • FIG. 8 is another cross-sectional view thereof taken along section lines
  • FIG. 9 is another cross-sectional view thereof taken along section lines
  • FIG. 10A is a bottom perspective view of an exemplary z-axis load distributor actuator block for the z-axis force distribution system of the TCU 600 shown in FIGS. 6-9;
  • FIG. 10B is a bottom perspective view of an alternative embodiment of the z-axis load distributor actuator block of FIG. 10A;
  • FIG. 11 is a cross-sectional view of the load distributor actuator block shown in FIG. 10A along the line 11-11, in combination with a spring loaded gimbal;
  • FIG. 12A is a cross-sectional view of a slightly curved IC device prior to testing
  • FIG. 12B is a cross-sectional view of an IC device deformed by testing
  • FIGS. 13A and 13B are cross-sectional views illustrating embodiments of a pedestal, a substrate pusher and the test socket in accordance with the present invention
  • FIGS. 13C and 13D are cross-sectional views of additional
  • test socket inserts are embodiments of the test socket inserts
  • FIG. 13E is a perspective view of the test socket and test socket insert for the embodiment of FIG. 13 A;
  • FIGS. 13F and 13G are cross-sectional views illustrating a suspension pin and a test pin for the embodiment of FIG. 13 A, in rest condition and test condition, respectively;
  • FIGS. 14A-14D are a front view, a top view, a perspective view and a blown-up view illustrating an exemplary fused heater in accordance with some embodiments of the present invention.
  • FIGS. 15A and 15B are perspective and exploded views of another exemplary embodiment of a thermal control unit (TCU) in accordance with the present invention.
  • TCU thermal control unit
  • FIGS. 16A and 16B are perspective and exploded views of the Flow
  • FIGS. 17A and 17B are perspective and exploded views of the FMS.
  • TEU Thermal Head Unit
  • FIGS. 17C and 17D are perspective views of the gimbal module
  • FIG. 17E is a perspective views of the heater assembly
  • FIGS. 17F, 17G, and 17H are perspective and exploded views of the
  • FIG. 171 is a perspective view of the inner structure of the heat exchanger plate (cold plate);
  • FIGS. 17J and 17K are top view and a cross-sectional view along the line 17K-17K for the thermal head unit (THU);
  • FIG. 18 is a perspective view of the flexible cable chain assembly
  • FIGS. 19A and 19B are perspective and exploded views of the thermal control unit (TCU) with the dry boxes for condensation abatement;
  • FIG. 20 depicts a sub-assembly of the thermal control unit where a heat-transfer fluid is flowing during in-use condition
  • FIG. 21 depicts the sub-assembly of the thermal control unit where the heat-transfer fluid is not flowing during an undocked condition
  • FIG. 22 illustrates the sub-assembly of the thermal control connected to a pressure relief valve during in-use condition
  • FIG. 23 illustrates the sub-assembly of the thermal control connected to the pressure relief valve during the undocked condition
  • FIG. 24 is a cross-sectional view illustrating the pressure relief valve with an internal piston is under pressure during the in-use condition.
  • FIG. 25 is a cross-sectional view illustrating the pressure relief valve with the piston is not under pressure and allowed to move as the fluid expands during the undocked condition.
  • the invention relates to thermal control units (TCUs) that may be used to maintain a set point temperature on an IC device under test (DUT).
  • TCU can suitably include features common to those described in U.S. Patent 7,663,388, which is incorporated herein by reference. Such features would include, in a z-axis stacked arrangement, a heat-conductive pedestal for contacting the DUT and containing a thermal sensor, a fluid circulation block, and a thermoelectric module (a Peltier device) or heater between the heat-conductive pedestal and the fluid circulation block for pumping heat away from the DUT and into the fluid circulating block (or for pumping heat into DUT).
  • the common features would also include in the z-stack arrangement a spring loaded pusher mechanism for exerting a z-axis force compliant force that holds the fluid block, thermoelectric module (or heater) and heat conducting pedestal tightly together.
  • the present invention also relates to systems and methods for testing of IC devices such as packaged semiconductor chips (also referred to as packaged dies) while preserving the devices' original specifications, especially with respect to the IC devices physical characteristic.
  • IC devices such as packaged semiconductor chips (also referred to as packaged dies)
  • the TCUs in accordance with the invention may be used on DUTs of different constructions.
  • the TCU may be used with IC devices having a lidded package that employs an integrated heat spreader (IHS) or with IC devices having a bare die chip package.
  • IHS integrated heat spreader
  • One aspect of the invention is directed to TCUs having different pushers used to push against different parts of a chip package.
  • a z-axis load distribution system is provided for controllably distributing the total z-axis force applied to from the top of the TCU between different pushers so that a desired balance can be achieved for the exerted by the different pushers.
  • the z-axis forces applied the die pusher/pedestal can be adjusted relative to with the pushing force applied by the substrate pusher to balance the loads on the die and substrate of the bare die package.
  • At least one and preferably both the fluid inlet and/or fluid outlet for the fluid circulation block are swivelable, preferably about a swivel axis that is substantially perpendicular to the z- axis of the TCU.
  • the swivel capability of the fluid inlet and outlet acts to reduce instability of the thermal control unit in response to z-axis movement of the temperature-control fluid block.
  • a means for abating condensation includes a condensation-abating gas inlet and condensation-abating gas transporting passageways in the thermal control unit near surfaces of the thermal control unit on which condensation may occur.
  • FIGS. 1-5 An exemplary embodiment of a TCU in accordance with the invention is illustrated by FIGS. 1-5.
  • the thermal control unit 1 includes the following basic sections arranged in stacked relationship along the z-axis of the TCU: a force transmitting section 10 for transmitted a z-axis force denoted by the arrow F in FIG. 1 to the TCU's DUT contacting pushers as hereinafter described; an inner spring loaded pusher block section 40; a fluid circulation block section 50; a thermoelectric module (hereinafter Peltier device) section 60; and a heat conductive pedestal section 72 having a pusher end 76, which contains a temperature sensor 78, for contacting and pushing against a thermally active central portion of an IC chip, such as the die 104 of a bare die chip package 100.
  • An outer pusher structure is also provided.
  • This pusher structure includes a rigid bottom pusher plate 81 and is suitably fabricated of a metal material, such as aluminum, for rigidity.
  • the bottom pusher plate has a center opening to allow the pusher end of the heat conducting pedestal to project through the pusher plate.
  • a second DUT contacting pusher 82 extends from the bottom of the pusher plate around this center opening.
  • This second pusher extends in the z-axis direction in parallel with the pusher end of the pedestal and contacts and pushes against another part of the IC chip, such as the substrate 102 of the bare die chip package.
  • the outer pusher structure additional includes a skirt 90 secured around the outer perimeter of the bottom pusher plate 81 and that extends upward in the z-axis direction.
  • the fluid circulation block section 50 is seen to have a lower contact plate 58 at the bottom of block's main body 56.
  • This lower contact plate is made of a good heat conductor such as copper and is suitable provided to achieve efficient heat conduction between the fluid circulation block section and the thermoelectric module 60.
  • the upper section 56 of the may be formed from material that does not conduct heat as well as copper or other metals.
  • the force transmitting section 10 of the TCU includes a force distribution block 12 and can additionally include a gimbal adapter 30 above the force distribution block to form a gimbal.
  • the gimbal adapter 30 includes a top coupler part 32 having upper and lower surfaces 32 and 34, with the upper surface of the coupler part being positioned to receive the indicated z-axis force F.
  • the gimbal adaptor further includes springs 36 positioned beneath the lower surface of the top coupler part of the gimbal adaptor at the corners of the coupler part. Springs 36 are held in compression between the adaptor's coupler part and the upper surface 16 of the force distribution block 12 for preload gimbal stability.
  • the outer pusher structure is secured to the force distribution block 12 by force transfer shafts 110.
  • These shafts freely pass through suitably sized holes in the inner spring loaded pusher block and fluid circulation block sections 40, 50.
  • the bottom ends 113 of shafts 110 are suitably anchored to the pusher plate 81 near the outer perimeter of the plate, such as by threaded engagement, while the top ends 112 of the shafts extend through openings 20 (shown in FIG. 4) in the corners of the force distribution block and are topped by cap nuts 115, or any other captive mechanism that allows z-movement to retain the force distribution block on the shafts.
  • cap nuts 115 or any other captive mechanism that allows z-movement to retain the force distribution block on the shafts.
  • the force distribution block is compliantly supported on springs 117 provided around the recessed portion of the shaft beneath the force distribution block and which set on shoulders 119 presented by the recessed portion of the shaft.
  • a z-axis force F applied to the force transmitting section 10 will thus be compliantly transmitted to pusher 82 of the outer pusher structure, and thus to the substrate 102 of bare die chip package 100.
  • the springs can be used to pre-load the force distribution block to the inner pusher spring loaded block 40.
  • bottom shoulders 121 are provided near the bottom end
  • the z-axis force F is transmitted to the die 104 of bare die chip package 100 through the stacked thermal control sections of the TCU, namely, the inner spring loaded pusher block section 40, the fluid circulation block section 50, the Peltier device 60, and the heat conductive pedestal section 72, all of which must be secured together.
  • the fluid circulation block section 50 can be pre-attached to the inner pusher block section by suitable fasteners such as screw fasteners 41.
  • a pedestal retainer ring 43 can be provided at the bottom of the stacked thermal control sections, and retaining fasteners, such as screw fasteners 45, can be used in conjunction with this retainer ring to tie the pedestal 72 and the other thermal control sections 40, 50 and 60 together.
  • the force transmitted to the pusher end of pedestal 72 is uniquely controlled by means in the force distribution block 12, which can be actuated to change the force transmitted to the thermally active part of the DUT through the pedestal relative to the force transmitted to another part of the DUT through the outer pusher structure parts 80, 82.
  • the force changing actuation means for the force distribution block can be provided in the form of at least one and preferably a plurality of pistons 18 nested in bottom surface 14 of the z-axis force distribution block 12.
  • Fluid pressure is provided to the pistons from inlet 22 which protrudes from a side wall 24 of the force distribution block 12.
  • the inlet 22 fluidly communicates with the pistons
  • the inlet may be connected to a source of pressured gas or fluid to effect pneumatic actuation of the pistons.
  • pressured air is typically used, the pressured fluid may be nongaseous as well.
  • oils, water, or aqueous solutions may be used to actuate the piston.
  • the result is pistons that produce a z-axis force that can be adjusted on the fly. By adjusting the pressures behind the pistons, the force transferred to the heat conducting pedestal 72 relative to the force transmitted to the outer pusher 82 can be modified during testing of the DUT without unloading or disassembling the thermal control unit.
  • the adjustable pistons may be preset before use.
  • the z-axis force distribution block 12 can be constructed for ease of loading the pistons 18 in the block by providing a top cover plate 13 that fits in a recess 15 in the top surface 16 of the block.
  • the top cover plate 16 can be secured in this recess by any suitable means such as by screw fasteners.
  • the fluid passageways that are in communication with the piston holes 17 can be formed on the underside of the block.
  • the fluid inlet 22 can be a fluid line coupler attached, such as by a threaded attachment, to a fluid inlet extension 19 of top cover plate 13.
  • the fluid circulation block 50 constructed fluid passages that enable fluids to be circulated through the block and carry heat away from the pedestal that contacts the thermally active part of the DUT, such as described in U.S. Patent No. 7,663,388.
  • fluid is introduced into and is evacuated from the fluid circulation block by fluid inlet and outlet arms 52, 54 swivelably attached to the sides of the TCU generally at or near the position of the fluid circulation block.
  • FIG. 1 depicts the exemplary range of motion for the swivel attachment of fluid outlet 54.
  • the inlet and outlet arms preferably swivel about a common swivel axis S (shown in FIG. 2), and suitably have a swivel axis that is perpendicular to the z-axis of the TCU. While the fluid inlet arm 52 and fluid outlet arm 54 are shown attached opposite each other on opposite sides of the TCU, it is not intended that this swivel arm attachment aspect of the invention be limited to opposed swivel arms.
  • any of a number of fluids may be circulated through fluid circulation block 50.
  • the fluids are provided in liquid form, but gaseous fluids may be used on occasion. Liquids having a relatively high heat capacity are particularly useful in certain application.
  • the temperature-control fluids may be chosen according to desired conditions. For example, for testing of DUTs at ambient or elevated temperatures, e.g. 20°C to about 65°C, water may serve as a temperature- control fluid. In contrast, cold testing of DUTs at -20°C, -5°C, 0°C, or temperatures therebetween may involve the use of aqueous solutions containing, methanol, ethylene glycol, or propylene glycol or nonaqueous liquids.
  • the thermal control unit 1 includes a condensation-abating system.
  • the condensation-abating system includes a condensation-abating gas inlet 42, which can suitably be located at one edge of the inner spring loaded pusher block section 40 of the TCU.
  • gas inlet 42 connects to gas transporting passageways that extend around the pedestal 72, between the pedestal and the pedestal retaining ring 43, and between the pedestal retaining ring, pedestal and the outer pusher structure 80.
  • the gas transporting passageways are denoted by the numerals 44A, 44B, 44C, 44D, 46A, 46B and 47.
  • the illustrated thermal control unit 1 may be placed over a test socket (not shown) containing a bare die chip package 100.
  • a z-axis force is applied to the gimbal adapter 30, such as by a pneumatic press of an automated chip tester.
  • the z-axis force is transferred by the force distribution block 12 of the self-centering gimbal 10 to pedestal 72 through the stack of thermal control blocks 40, 50 and 60 to the heat conducting pedestal 72, and to the outer pusher structure 80 though the force transfer shafts 110.
  • the two pushers to which this z-axis force is transferred are the pusher end 76 of the pedestal which contacts the die 104 of the bare die chip package and the substrate pusher 72 of the outer pusher structure.
  • the exerted z-axis force is controllably distributed between these pushers by the force distribution block 12.
  • the force exerted on the die relative to the force exerted on the substrate can be adjusted by adjusting the pressure behind the pistons 18 of the force distribution block, which acts a z-axis force actuation means.
  • the force distribution may be preset or adjusted on the fly such that the die force does not exceed a desired or predetermined upper limit to ensure that the die force does not damage the die.
  • the z-axis distance between the pedestal pusher end 76 and the bottom substrate pusher end 82 should be calibrated to ensure the substrate force does not fall below a desire or predetermined lower limit to ensure proper engagement between electrical pads of the DUT and the probes of the test socket.
  • a manufacturer of a particular IC device in bare-die packaging may specify that the particular IC device be cold tested with the application of at least a 55 pound load to the substrate.
  • the specification may also prohibit the die from experiencing a load of 15 pounds or greater. In such a case, a total load of 70 pounds may be applied to the DUT with the die pusher adjusted to limit the load applied to the die not to exceed 15 pounds.
  • the thermal measurement and control elements of the thermal control unit act to monitor and maintain the DUT's set point temperature.
  • the DUT temperature may be monitored by the sensor 78 in the pedestal pusher end 76.
  • a desired electrical signal is supplied to the Peltier device 60 from an external power source to generate the heat flow needed to maintain a desired set point temperature for the DUT in the test socket.
  • Heat transfer between the pedestal and fluid circulating block 50 can be regulated in accordance with the temperature of the DUT as detected by the sensor 78, with heat being removed from the pedestal to the temperature-control fluid being circulated through the fluid block 50 when it is desired to lower the DUT temperature, and with heat being added to the pedestal 72 from the circulating fluid if the DUT temperature needs to be raised. In short, the heat is either carried away or supplied by the temperature-control fluid which is passed through the fluid passage within the fluid circulating block 50.
  • a thermal interface material such as a thermal grease or foil, is optionally provided between the pedestal's top surface 74 and the Peltier device 60, and between the Peltier device and the fluid circulating block 50.
  • DUTs of the invention may be used to carry out cold testing of DUTs.
  • temperature-control fluid may be chilled to temperatures of 0 °C or below. If such testing is carried out under uncontrolled ambient conditions, water or ice may accumulate on surface of the TCUs, DUTs, and test sockets.
  • condensation is may short or otherwise interfere with the proper functioning the electronic components of TCUs, DUTs and test sockets.
  • a number of techniques known in the art have been used to address the condensation problems associated with cold testing. For example, high-volume cold testing of IC devices have been carried out in controlled environments, e.g., within rooms having a low level of atmospheric humidity. In some low-volume cold testing facilities, IC devices may be tested within an enclosure that maintains a low-humidity. In addition or in the alternative, plastic form of other material having a low thermal conductivity may be applied to surfaces of TCUs to address condensation problems associated with the chilling of components of TCUs engaged in cold testing.
  • condensation abatement aspect of the invention provides a new and efficient approach to abatement of condensation on TCU and chip surfaces, which is integrated into the TCU.
  • a condensation-abating gas is introduced under pressure into the TCU through gas inlet 42.
  • the abating gas flushes through the TCU so as to pass over surfaces on which condensation is likely to occur.
  • the gas introduced at inlet 42 flows into horizontal passageway 44A and down through vertical passageway 44B and from there flushes through passageways 44C and 44D around the pedestal (including openings in the pedestal insulating ring 73), and exiting the TCU through two exit routes: through passageways 46 A, 46B between parts of the outer pusher structure 80 and the pedestal retainer 43, which is preferably stainless steel, and through passageway 47 between the pusher end 76 of the pedestal 72 and the substrate pusher 82 of the outer pusher structure.
  • passageway 44A extends generally horizontally through inner spring loaded pusher block 40 until it joins with passageway 44B in a fluid-communicating manner.
  • Passageway 44B extends in a z-axis direction through a portion of block 40, as well as both the upper section 56 and lower section 58 of the fluid circulation block 50.
  • Passageways 44C, 44D, 46A, 46B, and 47 are shown downstream from passageway 44B and located between the skirt 90 and the pedestal 72.
  • one or more additional passageways may be formed by placing a first surface having one or more channels formed therein against a second surface, the surfaces in combination defining the one or more additional passageways.
  • condensation abating gas transporting passageways may be integrated within or interposed between the modules of the inventive TCU.
  • a condensation-abating gas source (not shown) may be connected with inlet 42. Condensation-abating gas is introduced through the inlet 42, and flushed through the gas passageways as above-described, and flows over surfaces on which condensation may occur. As the pedestal 72 is necessarily cold during cold testing, skirt 90 may help direct condensation-abating gas over exposed surfaces of the pedestal prone to collect moisture or ice.
  • any of a number of gases may be used.
  • any dry inert gas e.g., nitrogen, helium, argon, etc.
  • commercially available, dry, oil-free air has been demonstrated to abate condensation on the inventive TCU.
  • TCUs having the above-described integrated means for abating condensation do not experience condensation-related problems during cold testing in uncontrolled atmospheric conditions, whereas the same TCU may suffer from condensation-related problems during cold testing when no condensation-abating gas is used.
  • condensation-abating gas In addition to the use of condensation-abating gas, appropriate measures should be taken to address heat conduction issues. For example, different components of the temperature control unit should be thermally isolated from one another whenever possible to inhibit chilling of water sensitive components of TCUs. In addition, material of low thermal conductivity should be used whenever possible. For example, metals should generally be avoided for components that do not have to conduct heat. As discussed above, portions of the temperature-control fluid block may be made from a metal such as copper for efficient heat conduction. However, other portions of the temperature-control fluid-block, e.g., those exposed to the surrounding ambient environment, may be formed from a material that does not conduct heat, e.g., plastic, to deter the formation of condensation thereon.
  • FIGS 6-11 illustrate another exemplary embodiment of a thermal control unit (TCU) 600 in accordance with the present invention.
  • Advantages of this embodiment include a fast thermal response of 40 °C/second for an IC device under test (DUT) have a test surface area of approximately 16mm x 16mm, with a resulting watt density of approaching 1000 watts per square inch.
  • TCU 600 has an operating range of -60 °C to 160 °C.
  • FIG. 6 is a side view of thermal control unit 600.
  • Figure 7A is cross-sectional view thereof taken along section lines 7A-7A in Figure 6, while Figure 7B is an exploded view of Figure 7B illustrating the components of TCU 600, including force transmitting assembly 610, fluid circulation block (heat exchanger with thermally-conductive plate) 650, heater 660, pedestal 772, and substrate pusher 690.
  • Figures 8 and 9 cross-sectional views thereof taken along section lines 8-8 and 9-9, respectively, in Figure 7A.
  • Figures 10A and 10B are bottom perspective views of two exemplary z-axis load distributor actuator blocks for the z-axis force distribution system of the TCU 600, while Figure 11 is a cross- sectional view along the line 11-11 in Figure 10A.
  • the thermal control unit (TCU) 600 includes the following basic sections arranged in stacked relationship along the z-axis of the TCU 600: a force transmitting assembly 610 for transmitted a z-axis force denoted by the arrow F (see Figure 6) to the TCU's IC device under test (DUT) contacting pushers as hereinafter described; a fluid circulation block 650; a heater 660; and a heat conductive pedestal 772 having a pusher end 776, which includes at least one pedestal temperature sensor, for contacting and pushing against a thermally active central portion of an IC chip, such as the die 799 of a bare die chip package 797.
  • Pusher 780 includes a rigid bottom pusher plate 781 and is suitably fabricated of a metal material, such as aluminum, for rigidity.
  • the bottom pusher plate 781 has a center opening to allow the pusher end of the heat conducting pedestal to project through the pusher plate.
  • a second DUT contacting pusher 682 extends from the bottom of the pusher plate around this center opening. This second pusher 682 extends in the z-axis direction in parallel with the pusher end of the pedestal and contacts and pushes against another part of the IC chip, such as the substrate 798 of the bare die chip package 797.
  • the fluid circulation block (also known as the chiller block) 650 is seen to have a lower contact plate 758 at the bottom of block's main body 656.
  • This lower contact plate 758 is made of a good heat conductor such as copper and is suitable provided to achieve efficient heat conduction between the fiuid circulation block 650 and the heater 660.
  • the block's main body 656 of the may be formed from material that does not conduct heat as well as copper or other metals.
  • Suitable materials for main body 656 include thermoplastics such as PeekTM, UltemTM or TorbnTM, capable of withstanding repeated rapid thermal shock cycles and also reducing condensation abatement needs, during multiple rapid heating/cooling cycles of TCU 600.
  • fluid circulation block 650 preferably includes at least one chiller temperature sensor, enabling TCU 600 to sense when permitted operating range has been exceeded and triggering an appropriate thermal cut off.
  • TCU 600 includes a force distribution block 612 and can additionally include a gimbal adapter 630 above the force distribution block 612 to form the force transmitting assembly 610.
  • the gimbal adapter 630 includes upper and lower surfaces 632 and 634, with the upper surface 632 being positioned to receive the indicated z-axis force F.
  • the gimbal adaptor 630 further includes springs 636
  • Springs 636 are held in compression between the gimbal adaptor 630 and the upper surface 616 of the force distribution block 612 for preload gimbal stability.
  • the outer pusher structure 780 is secured to the force distribution block 612 by force transfer shafts 710. These shafts freely pass through suitably sized holes in the fiuid circulation block 650.
  • the bottom ends 713 of shafts 710 are suitably anchored to the pusher plate 781 near the outer perimeter of the plate, such as by threaded engagement, while the top ends 712 of the shafts extend through openings 1020 (shown in FIG. 10A) in the corners of the force distribution block and are topped by cap nuts 715 to retain the force distribution block on the shafts 710.
  • gimbal block 612 also includes suitably sized holes 1077 for coupling with a corresponding set of alignment pins 757 protruding vertically from the top surface of fluid circulation block 650.
  • Figures 7A and 9 both show the force distribution block 612
  • a z-axis force F applied to the force transmitting assembly 610 will thus be compliantly transmitted to pusher 682 of the outer pusher structure, and thus to the substrate 798 of bare die chip package 797.
  • the springs 717 can be used to pre-load the force distribution block (gimbal block) 612 to the main body 656 of fluid circulation block 650.
  • bottom shoulders 721 are provided near the bottom end
  • the z-axis force F is transmitted to the die 799 of bare die chip package 797 through the stacked thermal control sections of the TCU 600, namely, the fluid circulation block 650, heater 660, and the heat conductive pedestal 772, all of which must be secured together.
  • the force transmitted to the pusher end of pedestal 772 is uniquely controlled by means in the force distribution block 612, which can be actuated to change the force transmitted to the thermally active part of the DUT through the pedestal relative to the force transmitted to another part of the DUT through the outer pusher structure parts 780, 682.
  • the force changing actuator for the force distribution block 612 can be provided in the form of at least one and preferably a plurality of pistons 1018 nested in bottom surface 1014 of a gimbal block 612 for distributing the z-axis force.
  • Pistons 1018 which are preferably evenly spaced in a grouping centered in the bottom to the force distribution block 612, protrude from piston holes 1117 in the bottom of gimbal block 612 and can be actuated in the z-axis direction by altering fluid pressure behind the pistons 1018. Fluid pressure is provided to the pistons from fluid inlet 622 which protrudes from a side wall 1024 of gimbal block 612.
  • the inlet 622 fluidly communicates with the pistons 1018 via fluid passageway 1125 within the gimbal block 612.
  • the inlet 622 may be connected to a source of pressured gas or fluid to effect pneumatic actuation of the pistons 1018.
  • pressured air is typically used, the pressured f uid may be nongaseous as well.
  • oils, water, or aqueous solutions may be used to actuate the pistons 1018.
  • the result is pistons that produce a z-axis force that can be adjusted on the fly.
  • the force transferred to the heat conducting pedestal 772 relative to the force transmitted to the outer pusher 682 can be modified during testing of the DUT without unloading or disassembling the thermal control unit.
  • the adjustable pistons may be preset before use.
  • the gimbal block 612 can be constructed for ease of loading the pistons 1018 in the block by providing a top cover plate 1113 that fits in a recess 1115 in the top surface 1116 of the block 612.
  • the top cover plate 1113 can be secured in this recess 1115 by any suitable means such as by screw fasteners.
  • the fluid passageways that are in communication with the piston holes 1117 can be formed on the underside of the block 612.
  • the fluid inlet 622 can be a fluid line coupler attached, such as by a threaded attachment, to a fluid inlet extension 1119 of top cover plate 1113.
  • Figure 10b shows an alternate embodiment of the gimbal block 1012, wherein instead of machine screws, pivoted latches 1090 are used to secure the stacked components of TCU 600 to each other without the need for tools.
  • the fluid circulation block 650 constructed fluid passages that enable fluids to be circulated through the block and carry heat away from the pedestal that contacts the thermally active part of the DUT, such as described in U.S. Patent No. 7,663,388.
  • fluid is introduced into and is evacuated from the fluid circulation block by fiuid inlet and outlet arms 752, 654 swivelably attached to the sides of the TCU 600 generally at or near the position of the fluid circulation block.
  • Swivel attachments to the fluid inlet and outlet arms reduce instability of the thermal control unit due to external forces exerted on the TCU 600, and particularly due to biasing forces exerted by external hoses connected to the fluid inlet and outlet of the fluid circulation block.
  • Figure 6 depicts the exemplary range of motion for the swivel attachment of fluid outlet arm 654.
  • the inlet and outlet arms 752, 654 preferably swivel about a common swivel axis S (shown in Figure 7A), and suitably have a swivel axis that is perpendicular to the z-axis of the TCU 600. While the fluid inlet arm 752 and fluid outlet arm 654 are shown attached opposite each other on opposite sides of the TCU 600, it is not intended that this swivel arm attachment aspect of the invention be limited to opposed swivel arms.
  • any of a number of fluids may be circulated through fluid circulation block 650.
  • the fluids are provided in liquid form, but gaseous fluids may be used on occasion. Liquids having a relatively high heat capacity are particularly useful in certain application.
  • the temperature-control fluids may be chosen according to desired conditions. For example, for testing of DUTs at ambient or elevated temperatures, e.g. 20°C to about 65°C, water may serve as a temperature- control fluid. In contrast, cold testing of DUTs at -20°C, -5°C, 0°C, or temperatures therebetween may involve the use of aqueous solutions containing, methanol, ethylene glycol, or propylene glycol or nonaqueous liquids.
  • thermo control unit TCU
  • condensation-abating system includes a condensation-abating system.
  • temperature-control fluid may be chilled to temperatures of 0 °C or below. If such testing is carried out under uncontrolled ambient conditions, water or ice may accumulate on surface of the TCUs, DUTs, and test sockets. Such condensation may short or otherwise interfere with the proper functioning of the electronic components of TCUs, DUTs and test sockets.
  • the condensation-abating system includes a
  • condensation-abating gas inlet 668 which can suitably be located at one edge of the fluid circulation block 650.
  • gas inlet 668 connects to gas transporting passageways that extend around the pedestal 772, in a manner similar to that of the other embodiment of TCU 1 described above, thereby enabling the approach to abatement of condensation on TCU and chip surfaces, described above for TCU 1 to be integrated into the TCU 600.
  • condensation-abating gas In addition to the use of condensation-abating gas, appropriate measures should be taken to address heat conduction issues. For example, different components of the temperature control unit should be thermally isolated from one another whenever possible to inhibit chilling of water sensitive components of TCUs. In addition, material of low thermal conductivity should be used whenever possible. For example, metals should generally be avoided for components that do not have to conduct heat. As discussed above, portions of the temperature-control fluid block may be made from a metal such as copper for efficient heat conduction. However, other portions of the temperature-control fluid-block, e.g., those exposed to the surrounding ambient environment, may be formed from a material that does not conduct heat, e.g., plastic, to deter the formation of condensation thereon.
  • the illustrated thermal control unit 600 may be placed over a test socket (not shown) containing a bare die chip package 797.
  • a z-axis force is applied to the gimbal adapter 630, such as by a pneumatic press of an automated chip tester.
  • the z-axis force is transferred by the force distribution block 612 of the self- centering gimbal 610 to pedestal 772 through the stack of thermal control
  • the two pushers to which this z-axis force is transferred are the pusher end 776 of the pedestal which contacts the die 798 of the bare die chip package 799 and the substrate pusher 690 of the outer pusher structure.
  • the exerted z-axis force is controllably distributed between these pushers by the force distribution block 612.
  • the force exerted on the die 799 relative to the force exerted on the substrate 798 can be adjusted by adjusting the pressure behind the pistons 1018 of the force distribution block, which acts a z-axis force actuation means.
  • the force distribution may be preset or adjusted on the fly such that the die force does not exceed a desired or predetermined upper limit to ensure that the die force does not damage the die 799.
  • the total z-axis force exerted by force distribution block 612 is equal to a sum of the force exerted on the substrate 798 and the force exerted on the die 799.
  • This force distribution between the substrate 798 and the die 799 is carefully controlled so that no undue internal structural stress, caused by harmful bending forces, is transmitted by the TCU 600 to the DUT, while maintaining efficient thermal conductivity between the TCU 600 and the DUT during the test.
  • the z-axis distance between the pedestal pusher end 776 and the bottom substrate pusher end 682 should be calibrated to ensure the substrate force does not fall below a desire or predetermined lower limit to ensure proper engagement between electrical pads of the DUT and the probes of the test socket.
  • a manufacturer of a particular IC device in bare-die packaging may specify that the particular IC device be cold tested with the application of at least a 55 pound load to the substrate 798.
  • the specification may also prohibit the die 799 from experiencing a load of 15 pounds or greater. In such a case, a total load of 70 pounds may be applied to the DUT with the die pusher 776 adjusted to limit the load applied to the die not to exceed 15 pounds.
  • testing may begin.
  • the thermal measurement and control elements of the thermal control unit act to monitor and maintain the DUT's set point temperature.
  • the DUT temperature may be monitored by the pedestal thermal sensor in the pedestal pusher end 776.
  • a desired electrical current is supplied to the heater 660 from an external power source to generate the heat flow needed to maintain a desired set point temperature for the DUT in the test socket.
  • Heat transfer between the pedestal 772 and fluid circulating block 650 can be regulated in accordance with the temperature of the DUT as detected by the thermal sensor, with heat being removed from the pedestal 772 to the temperature-control fluid being circulated through the fluid block 650 when it is desired to lower the DUT temperature. It is also possible to add supplement heat generated by the heater 660 to the pedestal 772 with additional heat from the circulating fluid if the DUT temperature needs to be raised rapidly. In short, the heat is either carried away or supplied by the temperature-control fluid which is passed through the fluid passage within the fluid circulating block 650.
  • fluid circulating block 650 can be made from a suitable thermo-plastic to reduce condensation
  • thermally-conductive plate 758 is made from a relatively-thin (low-mass) and highly-conductive material, such as nickel-plated copper, for superior thermal transfer performance
  • electrically-resistive heater 660 can be made from suitable materials, including ceramic materials such as A1N (aluminum nitride), which has suitable thermally- conductive properties.
  • a suitable thermal interface material such as a thermal grease or foil, e.g., "Artie- SilverTM thermal compound, can be provided between the pedestal's top surface 774 the heater 660, and between the heater 660 and the thermally-conductive plate 758 located at the bottom of fluid circulating block 650.
  • This thermal interface material typically about one mil in thickness, fills out minor imperfections and voids, thereby enhancing thermal conductivity and efficiency of the respective interfaces.
  • the thermal interface material also accommodates the different expansion coefficients of the corresponding components made from different materials, namely, the plate 758, the heater 660 and the pedestal 772 during rapid heating and cooling cycles.
  • a suitable liquid thermal interface material for example water and glycerin
  • a suitable liquid thermal interface material is injected under pressure into the pedestal/die interface from one or more perforations located at the bottom of pedestal pusher end 776.
  • LTIM liquid thermal interface material
  • the LTIM is supplied to and removed from pedestal pusher end 776 via a corresponding set of LTIM input and output 669 shown in Figures 6 and 9.
  • the uneven pressure problem on the DUTs can be partially mitigated by introducing adjustable touchdown coverage that attempts to increase the supported top surface area of the DUTs. This is accomplished by providing additional surface support between the pedestal and the substrate pusher, i.e., on the surrounding components surrounding the die on the substrate, such as resistors, capacitors and I/O drivers.
  • adjustable touchdown coverage does not solve the more serious, undesirable and unintended device flattening problem.
  • the pedestal 1360, the substrate pusher 1370 and the socket insert 1392 of test socket 1390 are configured to accommodate the curved device 1380. Accordingly, the pusher end 1366 of pedestal 1360 is slighted concave in order to substantially match the curvature of the surface of die 1384 of device 1380. Similarly, the top surface of socket insert 1392 is slightly convex in order to substantial match the curvature of the bottom of substrate 1380 of device 1380.
  • Figure 13B is a simplified and exaggerated
  • Figure 13E is a perspective view of test socket 1390 and test socket insert 1392 showing a plurality of suspension support pins 1396
  • Figures 13F and 13G are cross-sectional views illustrating a rest condition and a test condition, respectively.
  • Suspension support pins 1396 support socket insert 1392 in an elevated position (see Figure 13F) above the recess surface of test socket 1390 and ensures that the one or more spring-loaded test pins 1398 do not protrude above the top surface of socket insert 1392 during the rest condition.
  • the top surface of the socket insert 1392 is substantially smooth and free of any obstructive protrusions, thereby facilitating the proper alignment and placement of the device 1380 with respect to the test socket 1390 and the socket insert 1392.
  • test pin(s) 1398 are exposed to and come into contact with the corresponding pad(s) located at the substrate bottom device 1380.
  • typical DUTs include square DUTs ranging from
  • a typical DUT depends on factors such as the size, thicknesses, and/or aspect ratio of the substrate and the die.
  • a 50mm square substrate has a profile that is about 250 mils higher in the middle of the substrate than the sides of the substrate.
  • the corresponding socket insert should have a profile that is about 120 mils higher in the middle than the sides, thereby substantially reducing the flattening problem while allowing the test pins to function within their operational compression and expansion range during testing.
  • test socket inserts may be varied enabling the socket insert to flex and conform in a manner (e.g., differentially across the socket insert) thereby generating substantially less overall stress, i.e., less flattening effect, on the DUTs (see the exaggerated cross- sectional view of Figures 13C and 13D).
  • Test socket inserts may also be made from materials with a variety of stiffness and/or flexibility depending on the DUTs.
  • test sockets may also be heated and/or cooled to minimize temperature differences.
  • Heater 1460 is configured to be operatively coupled to the pedestal of the device tester. Heater 1460 may be fused, thermally and/or electrically.
  • heater elements 1464, 1466 are linked by a fuse 1468, thereby completing a fuse circuit comprising of conductive lead 1461, heater element 1466, fuse 1468, heater element 1464, and conductive lead 1462.
  • Fuse 1468 is located along an open edge of heater body 1469 and hence can be readily accessed during assembly, reconfiguration and/or maintenance.
  • Exemplary fuse 1468 can be made from a material with a suitable melting point, approximately 300 degrees Celsius, thereby substantially reducing the risk of tester damage and/or fire hazards, such as spontaneous combustion.
  • the above embodiments exemplify systems and methods for testing of IC devices such as packaged semiconductor chips while preserving the devices' original specifications.
  • the advantages include minimizing deformation of IC devices under test (DUTs) thereby reducing losses due to physical damage and/or poor contact alignment during subsequent assembly with motherboards.
  • TCU 1500 An exemplary embodiment of a thermal control unit (TCU) 1500 in accordance with the present invention is illustrated in Figures 15A and 15B.
  • Advantages of this embodiment include a fast thermal response of approximately 40 °C/second for an IC device under test (DUT), having a test surface area of
  • TCU thermal control unit
  • the 1500 comprises of three main subsystems, namely the fluid management system (FMS) 1600, the thermal head unit (THU) 1700, and the flexible cable chain assembly 1800.
  • the fluid management system (FMS) 1600 provides the support and connections to the thermal head unit (THU) 1700 supplying it with fluid (liquid and gas) for the pneumatic actuation, cooling and temperature control, and condensation abating.
  • the flexible cable chain assembly 1800 integrates the cables providing the electrical connections to the thermal head unit 1700 with the needed cables housed in a flexible chain.
  • the sub-systems 1600, 1700, and 1800 are described in detail below.
  • the fluid management subsystem 1600 is depicted in Figures 16A and
  • the TCU 16B 16B. It is comprised of the inner manifold 1610 and the outer manifold 1620.
  • the mounting towers 1611 provide the mount for the thermal head unit 1700. Each of the mounting towers is supported on three supporting columns 1612 which are securely fastened to the TCU base 1613.
  • the U-shaped hoses 1614 carry the chilled cooling fluid and are shaped in a U-shape to avoid destabilizing the thermal head unit (THU) 1700 during testing.
  • Tubes 1615 carry the Liquid Thermal Interface Material (LTIM) to the thermal head unit 1700. The function of the LTIM is discussed later when the details of the thermal head unit 1700 is given.
  • the tubes 1616 and 1617 are hooked to the outer manifold 1620.
  • the chilled fluid enters through 1616 and leaves the inner manifold 1610 through the tube 1617 to the outer manifold 1620.
  • the connector 1618 provides an auxiliary inlet port for providing dry gas for condensation abating.
  • the connector 1619 provides the auxiliary outlet port for the dry gas.
  • the port 1621 is the inlet for the chilled fluid and 1622 is the outlet for the chilled fluid.
  • the port 1623 hooks to the tube 1616 providing the flow of the chilled fluid to the inner manifold.
  • the port 1624 hooks to the tube 1617 the chilled fluid flows outward from the inner manifold to the outer manifold 1620.
  • the flow in the outer manifold 1620 is controlled by the solenoid valve 1625.
  • the tube 1626 provides inlet-outlet bypass allowing the chilled fluid to flow directly from the inlet port to the outlet port to avoid having a stagnant flow in the inner manifold.
  • thermal head unit (THU) 1700 is shown in a prospective view in
  • FIG 17 A An exploded view for the thermal head unit (THU) 1700 is depicted in Figure 17B.
  • the THU is comprised of the connector unit 1701, the fluid circulation block 1703, the gimbal module 1710, the heater assembly 1720, and the device kit module 1730 which is comprised of the pedestal assembly 1740 and the pusher assembly 1750.
  • the connector unit 1701 is attached to the fluid circulation block 1703.
  • fluid is introduced into and is evacuated from the fluid circulation block 1703 by fluid inlet and outlet connectors 1704 and 1705.
  • the fluid connectors 1704 and 1705 are securely coupled to the U-shaped hoses 1614 ( Figure 16B) which carries the chilled cooling fluid to the thermal head unit (THU) 1700 during testing.
  • the gimbal module 1710 (also called the Gimbal) is shown in Figures
  • the gimbal adapter 1711 is mounted on the force distribution block 1712 and fits easily in place without the need to use any tools by utilizing the rotary coupler 1713 which is provided with the quick-release clips 1714.
  • the inlet 1715 provides the pressured fluid to effect the pneumatic actuation in the gimbal module 1710. It may be connected to a source of pressured fluid. Although pressured air is typically used, the pressured fluid may be a gas other than air or a liquid.
  • the pins 1716 ensure the accurate alignment of the gimbal adapter 1711 relative to the force distribution block 1712.
  • the quick-release clips 1717 facilitate the mounting and dismounting of pusher assembly 1750 easily, in a short time, and without the need to use any tools.
  • the force changing actuator for the force distribution block can be provided in the form of at least one and preferably a plurality of pistons 1718 nested in bottom surface 1719 of the z-axis force distribution block 1712.
  • Pistons 1718 which are preferably evenly spaced in a grouping centered in the bottom to the force distribution block 1712, and can be actuated in the z-axis direction by altering fluid pressure behind the pistons. Fluid pressure is provided to the pistons from inlet 1715.
  • the heater assembly 1720 is shown in Figure 17E. The heater 1721 is supported within the isolator plate 1722.
  • the heater is an electro-thermal heater where the heat is generated as a result of the flow of electric current flows through a resistance embodied in a suitable material including a ceramic such as aluminum nitride (A1N) which has suitable thermally-conductive properties.
  • the current is supplied through the heater electrical leads 1723.
  • a fuse 1724 is inserted in the resistance circuit. It can be made of a material having a relatively low temperature melting point such as lead. It protects against temperature runaway.
  • the pins 1725 ensure the alignment of the heater assembly within the thermal head unit 1700.
  • the isolator plate 1722 may be made of a material with low thermal conductivity such as plastics.
  • the furrows 1726 are provisions for alignments with the device kit module 1730.
  • FIGs 17G, 17F, and 17H illustrate the device kit module 1730 and its two components; the pedestal assembly 1740 and the substrate pusher assembly 1750.
  • the pedestal assembly 1740 comprises a heat-conductive pedestal 1741 which is having a bottom end configured to contact the die of the DUT.
  • the top side of the pedestal is in direct contact with the heat exchange plate, known as the cold plate, 1742 which is a thin plate made of copper for its superior thermal conductivity.
  • the cooper in the cold plate 1742 is plated with nickel for durability and oxidation protection.
  • the cold plate 1742 is surrounded by channels 1743 that carry the Liquid Thermal Interface Material (LTIM) to enhance the thermal conductivity between the cold plate 1742 and the heater 1721 and between the cold plate 1742 and the heat- conductive pedestal 1741.
  • the LTIM are fluidly communicated to the channels 1743 through the ports 1744.
  • LTIM Liquid Thermal Interface Material
  • the cold plate 1742 is configured to be in direct contact with the heater 1721 on one side and in direct contact with the heat-conductive pedestal 1741 on the other side.
  • the resistive thermal devices (RTDs) 1745 are the temperature sensors that detect the temperature of the cold plate 1742 and feed back the detected temperature to an external temperature control system (not shown).
  • the substrate pusher assembly 1750 is configured to contact the substrate of the DUT.
  • This pusher assembly 1750 includes a rigid pusher plate 1751 and is suitably fabricated of a metal material, such as aluminum, for rigidity.
  • the bottom pusher plate has a center opening 1752 to allow the pusher end of the heat- conductive pedestal 1741 to project through the pusher plate.
  • the pusher assembly 1750 is spring loaded for exerting a z-axis compliant force F to the die of the DUT through the heat-conductive pedestal 1741 and to the substrate of the DUT by the rigid pusher plate 175.
  • the pins 1753 hold substrate pusher assembly 1750, the pedestal assembly 1740, and the heater assembly 1720 tightly together using the preloaded springs 1754 which are typically kept under compression.
  • the pins 1753 are aligned with the holes 1746 in the pedestal assembly 1740 to ensure proper alignment of the device kit module 1730. In operation, the pins 1755 align the device kit module 1730 to the socket assembly supporting the DUT.
  • Figure 171 shows two different configurations for the inner structure of the cold plate 1742.
  • the inner structure follows the pattern of a spiral of parallel channels.
  • the inner structure is composed of arrays of micro-channels.
  • Figure 17K shows the sectioned 17K- 17K (figure 17 J) through the components comprising the thermal head unit (THU) 1700 in stacked relationship along a z-axis together with the socket assembly 1760 and the socket insert 1770 that supports the DUT.
  • the projection of the cables connector unit 1701 is followed by the gimbal adapter 1711.
  • the pins 1716 ensure the alignment of the gimbal adaptor 1711 in the rotary coupler 1713.
  • the gimbal adapter 1711 is mounted on the force distribution block 1712 and fits easily and uniquely in place without the need to use any tools by utilizing the rotary coupler 1713 which is provided with the quick-release clips 1714.
  • the pins 1706 provide a hard-stop to the gimbal adapter 1711 in the rotary coupler 1713.
  • the force distribution block 1712 has the top cover 1707 that fits in a recess 1708.
  • the channel 1709 is a passageway for the pressured fluid to effect the pneumatic actuation in the pistons 1718.
  • the piston 1718 is centered in the bottom to the force distribution block 1712.
  • Connectors 1704 and 1705 are the inlet and outlet to the fluid circulation block 1703.
  • the chilled fluid is transformed through the fluid passageway 1719 imbedded in the fluid circulation block 1703.
  • the heater 1721 is in direct contact on top of the cold plate 1742 which firmly stacked over the heat-conductive pedestal 1741.
  • the bottom pusher plate has to allow the pusher end of the heat-conductive pedestal 1741 project through the center opening 1752 in pusher plate 1751.
  • the pusher assembly 1750 is spring loaded for exerting a z-axis compliant force F to the die of the DUT through the heat-conductive pedestal 1741 contacting and pushing against a thermally active central portion of an IC chip, such as the die of the DUT 1781 and to the substrate of the DUT 1782 by the rigid pusher plate 1751.
  • the temperature of the DUT is maintained at a test specified value utilizing a temperature feedback mechanism.
  • the RTD sensor 1745 in the thermal control unit (TCU) 1500, sends the value of the detected temperature to an external controller which controls both temperatures of the heater 1721 and the flow of the chilled fluid.
  • the temperature of the heater 1721 is changed by adjusting the electrical current flowing into the heater 1721 through the heater electrical leads 1723.
  • the flow of the chilled fluid is controlled by changing the electrical current flowing into the solenoid valve 1625.
  • Figure 18 shows the flexible cable chain assembly 1800, within which the electrical cables connecting to the thermal head unit (THU) 1700 through the electrical connector 1810 having a quick-release feature to connect without the use of tools to the connector 1702. Accordingly, the chain can be an assembly of attached separate segments 1812 to provide flexibility of the chain and thereby substantially enhancing the stability of the thermal head unit (THU) 1700 during testing.
  • schemes for abating condensation include a condensation-abating gas inlet and condensation- abating gas transporting passageways in the thermal head unit (THU) 1700 near surfaces of the thermal control unit (TCU) 1500 on which condensation may occur.
  • Another means for abating condensation 1900 is depicted in figures 19A and 19B.
  • the thermal control unit (TCU) 1500 is enclosed in two dry boxes 1910 and 1920 they provide a contained dry environment filled with condensation-abating gas.
  • the smaller box 1910 covers the thermal head unit (THU) 1700 and the larger box 1920 contains the dry environment around the fluid management system 1600.
  • One embodiment of the present invention addresses the problem of build up pressure in a sub-assembly of the thermal control unit hosting a heat-transfer fluid when the sub-assembly is undocked and disconnected and no fluid is flowing in the sub-assembly.
  • Figure 20 shows the configuration 2000 including a sub-assembly
  • the heat-transfer fluid is flowing through the sub-assembly 2010 during an in-use condition.
  • the heat-transfer fluid is flowing from an inlet port 2020 to an outlet port 2030, through the sub-assembly 2010 and a fluid transmission line 2040.
  • flow valves 2025 (at the inlet port 2020) and 2035 (at the outlet port 2030) are both opened and no buildup of pressure due to thermal expansion of the heat-transfer fluid.
  • Figure 21 shows the configuration 2100, where the flow valves 2025 and 2035 are closed and the heat-transfer fluid is not flowing through the subassembly 2010 during the undocked condition. In this condition, the heat-transfer fluid is trapped in the sub-assembly 2010 and in the fluid transmission line 2040. As the temperature rises from cold to room temperature the heat-transfer fluid expands due to thermal expansion and the pressure of the heat-transfer fluid builds up. The resulting over pressurization can damage the sub-assembly 2010.
  • the HFE-7500 fluid has a thermal expansion coefficient of 0.00129 /K. As the temperature rises from clod to room temperature the HFE-7500 fluid expands due to thermal expansion and the pressure of the HFE-7500 fluid builds up. The resulting over pressurization can damage the subassembly 2010. Thus there is a need to relieve that pressure as the temperature rises.
  • One embodiment of the present invention addresses the above described problem of over pressurization the sub-assembly 2010.
  • a pressure relief valve 2260 is attached to the fluid transmission line 2040.
  • the configuration 2200 depicts the in-use condition wherein the heat-transfer fluid is flowing from an inlet port 2020 to an outlet port 2030, through the sub-assembly 2010 and the fluid transmission line 2040.
  • the flow valves 2025 (at the inlet port 2020) and 2035 (at the outlet port 2030) are both opened and no buildup of pressure due to thermal expansion of the heat-transfer fluid.
  • the pressure of the heat-transfer fluid at the inlet port 2020 is approximately about 90 psi.
  • the pressure of the heat-transfer fluid at the outlet port 2030 is approximately between 10 psi to 20 psi.
  • a pressurized air is supplied into the pressure relief valve 2260 through the valve inlet port 2261 at a pressure that is approximately between 80 psi to 100 psi or some other value of pressure higher than the operating pressure of the heat-transfer fluid. Accordingly, the air pressure inside the pressure relief valve 2260 is sufficient to keep a piston or a diaphragm (not shown) inside the pressure relief valve 2260 at a lower position 2263.
  • the pressure relief valve 2260 prevents the over pressurization of the to the thermal control unit sub-assembly and protects sealed chambers and their seals from damage due to over pressurization of the sub-assembly.
  • Figure 24 shows a cross-sectional view of the pressure relief valve 2260 along an axis A-A during the in-use condition.
  • the pressure relief valve 2260 is comprised of a piston 2264 which is capable of moving inside a cylindrical body 2265 and a cylindrical cover 2266.
  • the piston 2264 has two recessed grooves to accommodate two sets of O-ring seals 2267. Two additional sets of O-ring seals are included in the pressure relief valve 2260.
  • Figure 25 depicts a cross-sectional view of the pressure relief valve 2260 along an axis B-B during the undocked condition.
  • the air supplied into the pressure relief valve 2260 at its input port 2261 is almost zero.
  • the piston 2264 is free to move upward under the pressure of the heat- transfer fluid at the coupling port 2262 of the pressure relief valve 2260.
  • the pressure relief valve 2260 serves to prevent the buildup of pressure in the subassembly of the thermal control unit.
  • the pressure relief valve 2260 is effective in preventing over pressurization and in protecting sealed chambers and their seals from damage due to any thermal expansion and over pressurization of the subassembly.
  • the piston 2264 can be replaced by a diaphragm (not shown) which is, similar to the piston, free to move upward under the pressure of the heat-transfer fluid at the coupling port 2262 of the pressure relief valve 2260.
  • the pressure relief valve with the diaphragm serves to prevent the buildup of pressure in the sub-assembly of the thermal control unit. Accordingly, the pressure relief valve with the diaphragm is effective in preventing over pressurization and in protecting sealed chambers and their seals from damage due to any thermal expansion and over pressurization of the sub-assembly.

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Abstract

La présente invention concerne des systèmes et des procédés pour empêcher la surpression dans un système de gestion de fluide utilisé dans un testeur de dispositif de circuit intégré (IC). La prévention de la surpression dans le système de gestion de fluide est basée sur l'utilisation d'une soupape de limitation de pression accouplée au système de gestion de fluide.
PCT/US2015/057896 2014-10-28 2015-10-28 Systèmes et procédés pour conformer des testeurs de dispositif à un dispositif de circuit intégré avec soupape de surpression WO2016069800A1 (fr)

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US14/525,223 US9383406B2 (en) 2009-11-30 2014-10-28 Systems and methods for conforming device testers to integrated circuit device with pressure relief valve
US14/525,223 2014-10-28

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TWI734238B (zh) * 2019-10-29 2021-07-21 鴻勁精密股份有限公司 分類設備及其溫控裝置

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KR102213075B1 (ko) * 2020-01-07 2021-02-08 (주)마이크로컨텍솔루션 반도체 칩 패키지 테스트 소켓
KR102463826B1 (ko) * 2021-03-18 2022-11-04 ㈜킴스옵텍 접촉 특성 개선 구조의 반도체 패키지 검사 지그

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TWI734238B (zh) * 2019-10-29 2021-07-21 鴻勁精密股份有限公司 分類設備及其溫控裝置

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