WO2016068707A3 - Interferometer, in particular for optical coherence tomography, comprising a reference arm having optical elements in a fixed positional relationship - Google Patents

Interferometer, in particular for optical coherence tomography, comprising a reference arm having optical elements in a fixed positional relationship Download PDF

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Publication number
WO2016068707A3
WO2016068707A3 PCT/NL2015/050754 NL2015050754W WO2016068707A3 WO 2016068707 A3 WO2016068707 A3 WO 2016068707A3 NL 2015050754 W NL2015050754 W NL 2015050754W WO 2016068707 A3 WO2016068707 A3 WO 2016068707A3
Authority
WO
WIPO (PCT)
Prior art keywords
optical
interferometer
positional relationship
reference arm
optical elements
Prior art date
Application number
PCT/NL2015/050754
Other languages
French (fr)
Other versions
WO2016068707A2 (en
Inventor
Haaije Rimmer De Vries
Enrique GAMBRA
Original Assignee
Cassini B.V.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cassini B.V. filed Critical Cassini B.V.
Publication of WO2016068707A2 publication Critical patent/WO2016068707A2/en
Publication of WO2016068707A3 publication Critical patent/WO2016068707A3/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02027—Two or more interferometric channels or interferometers
    • G01B9/02028—Two or more reference or object arms in one interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02062—Active error reduction, i.e. varying with time
    • G01B9/02067—Active error reduction, i.e. varying with time by electronic control systems, i.e. using feedback acting on optics or light
    • G01B9/02069—Synchronization of light source or manipulator and detector

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Eye Examination Apparatus (AREA)

Abstract

The invention relates to an interferometer for optical tomography, comprising a sample arm configured to direct a sample beam to and receive a reflected sample beam from a sample structure, in particular an eye,and a reference arm comprising at least one reference mirror and configured to direct a reference beam to and receive a reflected reference beam from the at least one reference mirror. All optical elements of the reference arm are arranged in a fixed positional relationship with respect to each other, and the optical elements of the reference arm comprise an adjustable optical element having an adjustable focal length. The interferometer of the invention allows a fast reference plane selection in optical coherence tomography by using a fast dynamic confocal system.
PCT/NL2015/050754 2014-10-29 2015-10-29 Interferometer, in particular for optical coherence tomography, comprising a reference arm having optical elements in a fixed positional relationship WO2016068707A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL2013701A NL2013701B1 (en) 2014-10-29 2014-10-29 Interferometer, in particular for optical coherence tomography, comprising a reference arm having optical elements in a fixed positional relationship.
NL2013701 2014-10-29

Publications (2)

Publication Number Publication Date
WO2016068707A2 WO2016068707A2 (en) 2016-05-06
WO2016068707A3 true WO2016068707A3 (en) 2016-06-16

Family

ID=52355137

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/NL2015/050754 WO2016068707A2 (en) 2014-10-29 2015-10-29 Interferometer, in particular for optical coherence tomography, comprising a reference arm having optical elements in a fixed positional relationship

Country Status (2)

Country Link
NL (1) NL2013701B1 (en)
WO (1) WO2016068707A2 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3570725A4 (en) 2017-01-17 2020-10-07 Duke University Optical coherence tomography device and system
CN107692977B (en) * 2017-10-31 2024-03-01 天津恒宇医疗科技有限公司 OCT-based dual-mode optical micro-contrast imaging system
GB202020740D0 (en) 2020-12-30 2021-02-10 Occuity Ltd Optical measurement apparatus and method of rapid measurement
GB2607041A (en) 2021-05-26 2022-11-30 Occuity Ltd Optical measurement apparatus and method of rapid measurement
DE102022113798A1 (en) * 2022-06-01 2023-12-07 Heidelberg Engineering Gmbh Device for carrying out optical coherence tomography

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005058220A1 (en) * 2005-12-06 2007-06-14 Carl Zeiss Meditec Ag Interferometric sample measurement
US20120044499A1 (en) * 2010-08-19 2012-02-23 Canon Kabushiki Kaisha Image acquisition apparatus, image acquisition system, and method of controlling the same
US20140160430A1 (en) * 2008-07-21 2014-06-12 Optovue, Inc. Extended range imaging

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4409331B2 (en) * 2004-03-30 2010-02-03 株式会社トプコン Optical image measuring device
EP2485009A1 (en) * 2011-02-04 2012-08-08 Haag-Streit Ag Frequency domain OCT
US20130169971A1 (en) * 2011-11-23 2013-07-04 Wasatch Photonics, Inc. Oct imaging system for curved samples

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005058220A1 (en) * 2005-12-06 2007-06-14 Carl Zeiss Meditec Ag Interferometric sample measurement
US20140160430A1 (en) * 2008-07-21 2014-06-12 Optovue, Inc. Extended range imaging
US20120044499A1 (en) * 2010-08-19 2012-02-23 Canon Kabushiki Kaisha Image acquisition apparatus, image acquisition system, and method of controlling the same

Also Published As

Publication number Publication date
NL2013701B1 (en) 2016-10-04
WO2016068707A2 (en) 2016-05-06

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