WO2016050195A1 - 灯箱、立体测试标版和调整装置及其应用 - Google Patents
灯箱、立体测试标版和调整装置及其应用 Download PDFInfo
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- WO2016050195A1 WO2016050195A1 PCT/CN2015/091014 CN2015091014W WO2016050195A1 WO 2016050195 A1 WO2016050195 A1 WO 2016050195A1 CN 2015091014 W CN2015091014 W CN 2015091014W WO 2016050195 A1 WO2016050195 A1 WO 2016050195A1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
Definitions
- the present invention relates to the field of optical systems, and in particular to a light box, a stereo test label and an adjustment device, and an application thereof, wherein a test pattern provided at different depths by the stereo test label enables the camera to be tested to be moved at least one step at a minimum. Or even without being moved, images with different depth information can be obtained to enable rapid testing and adjustment of the camera.
- the camera system for acquiring image and video information has become a carrier of human visual extension, and has gradually become a core device widely used in various products, for example, Among the products of smartphones, tablets, laptops, PC terminals, personal digital assistants, vehicles, medical devices, and monitoring devices, at least one camera device is deployed, and these cameras are implanted into the ecology of these products.
- a camera system is formed for acquiring information such as images or videos of the surrounding environment.
- the rapid development of these products has also contributed to the booming camera industry.
- the image pickup apparatus includes a camera module and an image sensor and other components such as a lens holder.
- the image plane of the camera module itself is tilted, the tilt tolerance of other components of the camera device, and the package are encapsulated.
- a certain degree of tilt caused by the process will cause the image sensor and the camera module to be tilted and offset in a certain range but not fixed, and finally the imaging quality of the entire camera system will be seriously attenuated. Therefore, before the encapsulation operation of the camera module and the image sensor of the imaging device, the tilt adjustment of the image plane of the camera module and the receiving surface of the image sensor is a necessary and necessary process.
- This process mainly includes two stages of testing and adjustment.
- the traditional methods of testing the optical system include orthographic projection (the standard uses transmissive and reflective) and back projection (the standard uses transmissive).
- the principle is to change the relative position of the part of the camera module to be tested and the image sensor or the image sensor by moving the camera module or the standard plate, thereby obtaining the image quality as a function of the defocus curve, and then calculating the focus position of each target position and
- the tilt vector is used to test the relative tilt of the camera module portion with the standard or image sensor and adjust according to the relative tilt.
- prior art devices that rely on the above principles for testing optical systems have significant technical drawbacks that severely affect the efficiency of testing and adjusting the camera.
- conventional devices for testing camera devices require progressively moving parts to characterize the complete image quality as a function of the defocus curve, which takes a long time; during the testing of the camera device, When the image plane tilt angle of the camera module portion is large, in order to acquire a higher focus position of the target image, it is necessary to move the camera module portion at a larger distance, and it is possible to hit the conventional camera in the process of moving the camera module portion toward the image sensor.
- the appearance of the machine components or degumming of the equipment has led to failure of testing and correction; the conventional equipment is bulky and requires a lot of space, so that the cost of testing the camera device is large.
- the traditional test equipment for testing and adjusting the camera device, it is necessary to reserve a large space to ensure the moving range of the camera device, so that the traditional test device is large in size, complicated in structure, and utilized.
- the traditional test equipment requires a lot of time to operate the camera device, which results in a large production cost of the camera device and cannot be widely applied. Therefore, it is possible to greatly improve the imaging quality of the imaging device, reduce the volume and production cost of the test and adjustment device, and improve the method of focusing on the camera and adjusting the tilt of the image plane, and the development of the test equipment has become an urgent need in the industry. The problem.
- the test box needs to use the light box in the process of testing the camera module.
- the traditional light box for providing the test label includes a test label, and the test pattern of the test label is obtained in the camera module.
- the position of the camera module is changed along the direction perpendicular to the test plate to change the distance between the camera module and the test plate, so that the camera module can obtain different depths at different positions.
- the effect of the test pattern in this way, not only leads to inefficient testing of the camera module, but also affects the test results of the camera module.
- the assembly process of the traditional light box for testing the standard plate is to pass the test pattern of each layer of the test plate to each coordinate point through the test platform, and then illuminate the test image between the layers and layers of each layer of the test mark.
- An object of the present invention is to provide a light box, a stereo test label and an adjusting device and an application thereof, wherein the test pattern provided at different depths by the stereo test label makes the camera to be tested only need to be moved at least one step. Or even without being moved, images with different depth information can be obtained to enable rapid testing and adjustment of the camera.
- An object of the present invention is to provide a light box, a stereo test plate and an adjusting device and an application thereof, wherein the stereo test plate only needs to be moved at least once when the camera device is tested. And obtaining a function relationship between the imaging quality of the imaging device and the related data parameter, and subsequently adjusting the relative position and the inclination of the camera module and the image sensor of the imaging device based on the function relationship, thereby reducing Process.
- An object of the present invention is to provide a light box, a stereo test label and an adjusting device and an application thereof, wherein the stereo test label allows one shot to analyze the focal length and image plane tilt of the camera simultaneously Thus, the corresponding data is derived to support subsequent adjustments.
- An object of the present invention is to provide a light box, a stereo test plate and an adjusting device and an application thereof, wherein the stereo test plate can provide different scene depths, which is compared with a conventional test device.
- the stencil enables the volume of the test equipment to be designed to be small enough to save design margins due to the need to reserve the action space for the camera to minimize the size of the test equipment.
- An object of the present invention is to provide a light box, a stereo test label and an adjusting device and an application thereof, wherein the stereo test label can conform to the trend of increasing miniaturization and miniaturization of the camera device, and simultaneously solve the problem.
- the relative position of the camera module of the camera device and the image sensor is adjusted, it causes a problem of the conventional process bottleneck caused by the bottom mechanism of the test device.
- An object of the present invention is to provide a light box, a stereo test mark and an adjusting device and an application thereof, wherein the stereo test mark can form at least one of the test patterns at different positions of different planes and the same plane, thereby
- the camera device may collect the test patterns at different depths of the stereo test plate in a static state to perform a resolution analysis on the camera device.
- An object of the present invention is to provide a light box, a stereo test label and an adjusting device and an application thereof, the stereo test label can be replaced according to different testing needs, and the specifications of the stereo test label can also be It is adjusted so that it is easy to use.
- An object of the present invention is to provide a light box, a stereo test plate and an adjusting device and an application thereof, wherein the stereo test label includes any depth information and such as transmissive, reflective, projection, zoom, etc. The way to ensure image contrast.
- An object of the present invention is to provide a light box, a stereo test plate and an adjusting device and an application thereof, wherein the test pattern of the stereo test plate can include, for example, a triangle, a circle, an ellipse, a black and white wire pair, Any single or combined shape such as a cross or a star may calculate a pattern of the image quality of the image pickup device, thereby facilitating selection and preparation of the stereo test plate.
- An object of the present invention is to provide a light box, a stereo test plate and an adjusting device and an application thereof, which do not generate more when assisting the test of the camera device and analyzing the resolution Noise, and thus, ensure the accuracy of the test.
- An object of the present invention is to provide a light box, a stereo test label and an adjusting device and an application thereof, and by combining the stereo test labels formed after the test pattern, more resolution power reflecting the camera device can be obtained.
- the data is used to ensure smooth adjustment of the camera device in the subsequent steps.
- An object of the present invention is to provide a light box, a stereo test plate and an adjusting device and an application thereof, in the same field of view, when the test pattern of each layer is captured by the camera module of the camera device, The image planes of the camera modules of the camera device do not appear to each other The phenomenon of interference, thus ensuring the reliability of the test results and the accuracy of the test.
- An object of the present invention is to provide a light box, a stereo test label and an adjusting device and an application thereof, wherein the stereo test label can be a cross-line stereo test label, and the cross-line stereo test label has different a test pattern of spatial depth, such as a cross-hair test pattern, which is a pattern having low sensitivity to various errors, so that when the cross-line stereo test plate assists in testing the camera device, it can be guaranteed
- a test pattern of spatial depth such as a cross-hair test pattern, which is a pattern having low sensitivity to various errors
- An object of the present invention is to provide a light box, a stereo test plate and an adjusting device and an application thereof, wherein the layout of each of the cross-hair test patterns of the cross-line stereo test plate can be based on the test requirements of the camera device It is conveniently adjusted to reduce the time consumption when testing the camera device and further reduce the cost of using the cross-line stereo test plate.
- An object of the present invention is to provide a light box, a stereo test label and an adjusting device and an application thereof, each of the cross-line test patterns has a simple pattern, is convenient to manufacture, and has strong applicability to facilitate the reduction of the Test cost and manufacturing cost of the camera device.
- the focus position and image plane tilt such as MTF (Modulation Transfer Function)
- MTF Modulation Transfer Function
- An object of the present invention is to provide a light box, a stereo test plate and an adjusting device and an application thereof.
- the relationship between the camera module and the image sensor of the camera device is tested and adjusted by using the scene depth principle. The method reduces the process and the time it takes to test and adjust the camera device relative to conventional test methods.
- the camera acquires images with different scene depth information at one time, completing the testing and adjustment process.
- An object of the present invention is to provide a light box, a stereo test plate and an adjusting device and an application thereof, wherein the method can obtain and describe the camera module and the image sensor at least only by taking one image.
- the imaging quality is a function of the defocus curve, thereby simplifying the test steps.
- the imaging device can obtain the imaging quality parameter and other parameter data of the imaging device, and the subsequent adjustment device can adjust the relative position of the camera module and the image sensor based on the parameter, including the focal length And tilt like the image.
- An object of the present invention is to provide a light box, a stereo test plate and an adjusting device and an application thereof, wherein the method can simultaneously test the focal length and image plane tilt of the camera device, and adjust it synchronously Thus, the efficiency is greatly improved.
- An object of the present invention is to provide a light box, a stereo test plate and an adjusting device and an application thereof, by which the tolerances such as the camera device and the tolerance of the packaging process can be reduced as much as possible to the camera device The effect of imaging quality to improve the imaging quality of the camera.
- An object of the present invention is to provide a light box, a stereo test plate and an adjusting device and an application thereof, the adjusting device made according to the method, because in the process of testing the camera device, allowing Since the image pickup device is moved a small number of times, the adjustment device does not need to reserve a large space for allowing the image pickup device to operate, and thus, the volume and cost of the adjustment device can be reduced.
- An object of the present invention is to provide a light box, a stereo test plate and an adjusting device and an application thereof, which are simple in design, convenient in processing, and have high applicability, and therefore can directly improve the product of the camera device. Rate, thus saving costs.
- An object of the present invention is to provide a light box, a stereo test plate and an adjusting device and an application thereof, wherein each test of the light box
- the trial plate layer uses the same reference frame as the basis for assembly and adjustment to ensure the accuracy of the light box after being assembled.
- the reference fiducials of the layout are identical to ensure the accuracy of the light box after being assembled.
- An object of the present invention is to provide a light box, a stereo test plate and an adjusting device and an application thereof, wherein the reference datum for providing the reference pattern can also fix each during assembly of the light box
- the test stencil layer is such that each of the test stencil layers forms a test stencil to ensure that each of the test stencil layers does not exhibit a positional shift or tilt after being adjusted.
- An object of the present invention is to provide a light box, a stereo test label and an adjusting device and an application thereof, wherein each of the test stencil layers is first made into the stereo test label after adjustment, and then more The test labels are mounted on a light box housing in an overlapping manner to form the light box, so that the assembly efficiency of the light box is greatly improved compared with the conventional light box.
- the assembly efficiency of the light box is greatly improved compared with the conventional light box.
- the present invention provides a stereoscopic test plate comprising a plurality of test stencil layers disposed along a depth direction, each of the test stencil layers respectively having at least one test pattern, and any one of the tests
- the test pattern of the stencil layer and the test pattern of the other test stencil layer are disposed without overlapping in the depth direction.
- the back focus fitting accuracy parameter of the camera device to be tested is set to a
- the focal length parameter is EFL
- the position parameter of the stereo test plate is set to h
- the layer parameter of the test stencil layer is set to n
- the tolerance parameter of the camera device is set to t
- the layout parameter of the test pattern is set to d, and the center distance of any one of the test pattern layers of the test stencil layer to the test stencil layer of the layer
- the size parameter of the test pattern is set to L
- the size parameter of any one of the test patterns is L ij
- the parameter tolerance of the stereo test plate is t′
- the rate parameter is n'
- the shape of the test pattern is selected from the group consisting of a square, a triangle, a circle, an ellipse, a crosshair, a black and white line pair, a star, or a combination of a plurality.
- the stereo test label has 2-100 layers of the test stencil layer, and each layer of the test stencil layer has 1-1000 of the test patterns.
- the stereo test plate is selected from one of a transmissive, reflective, projection or zoom imaging type.
- the stereo test label further includes at least one carrier member, each of the carrier members being superposed and spaced apart; wherein each of the carrier members forms each of the test labels a layer, each of the test patterns being selectively disposed or formed on the test stencil layer.
- each of said carrier elements is made of a transparent material.
- the present invention also provides a stereoscopic test plate having a plurality of test patterns arranged along a depth direction and not overlapping, the adjacent two layers of the test patterns being spaced apart from each other to form the three-dimensional Test the standard.
- the stereo test label further includes a plurality of carrier elements, the carrier elements are stacked and spaced apart; wherein each of the carrier elements respectively forms a test stencil layer, each The test pattern is located in each of the test stencil layers.
- the shape of the test pattern is selected from the group consisting of a square, a triangle, a circle, an ellipse, a crosshair, a black and white line pair, a star, or a combination of a plurality.
- the stereo test label has 2-100 layers of the test pattern, and each layer of the test pattern has 1-1000 of the test patterns.
- the invention also provides a design method of a stereo test label, wherein the method comprises the steps of:
- the method further comprises the step of determining the size of the test pattern.
- step (A) setting a back focus fitting precision parameter of the camera to be tested to a, a focal length parameter of EFL, and setting the stereo test label
- the position parameter is h
- a layout parameter of the test pattern setting a center distance of any one of the test pattern layers of the test stencil layer to the test stencil layer of the layer as d ij , setting the camera device
- the size parameter of the test pattern is set to L
- the size parameter of any one of the test patterns is L ij
- the parameter tolerance of the stereo test plate is t′
- the rate parameter is n'
- the shape of the test pattern is selected from the group consisting of a square, a triangle, a circle, an ellipse, a crosshair, a black and white line pair, a star, or a combination of a plurality.
- the invention also provides a method for forming a stereo test label, wherein the method comprises the steps of:
- the contrast of each of the test icons and the test stencil layer of the layer is enhanced by light rays sequentially reaching each of the test stencil layers.
- the light reaching each of the test stencil layers is a uniform ray.
- the invention also provides a method for forming a stereo test label, wherein the method comprises the steps of: arranging a projection source on a light radiation path of a light source, wherein when the light source generates light, the projection source is in a A plurality of multi-layer test patterns that do not overlap are formed along the depth direction in the preset space, and adjacent side functional test patterns are spaced apart from each other to form the stereo test label.
- the projection source is disposed between the light source and the preset space.
- the projection source includes a planar marking and a zoom lens group, wherein the planar marking is disposed between the light source and the zoom lens group such that the light source The generated light is capable of radiating information of the planar plate to the preset space through the zoom lens group.
- the planar plate further has at least one test target, wherein each of the test targets is projected to the preset space through the zoom lens group to form each of the test patterns .
- the shape of the test pattern is selected from the group consisting of a square, a triangle, a circle, an ellipse, a crosshair, a black and white line pair, a star, or a combination of a plurality.
- the present invention also provides a method of forming a cross-line stereo test label, wherein the method includes a multi-layer cross-line test pattern formed along a depth direction, and an image formed after each cross-hair test pattern is projected onto the image side Do not overlap each other.
- the method further comprises the steps of:
- test stencils are stacked and arranged such that the cross-shaped test patterns of each of the test stencil layers are misaligned to form the cross-shaped stereo test stencil.
- the method further includes the steps of: determining the position of the cross-line stereo test label and each of the test labels by counting parameters and accuracy requirements of the tested camera device, respectively. The number of layers in the layer.
- the back focus fitting accuracy parameter of the camera device is set to a
- the focal length parameter is EFL
- the position parameter of the crosshair stereo test label is set to h, any layer.
- the method further comprises the step of determining a layout of the cross-hair test pattern.
- the layout parameter of the cross-hair test pattern is set to d, and any of the cross-line test patterns of the test stencil layer of any layer to the test mark of the layer
- the center distance of the layer is d ij
- the method further includes the steps of: pre-arranging the cross-shaped pattern at an image plane position of the image pickup device, and then forming the cross-shaped pattern along the depth by projection Each of the cross-shaped test patterns arranged in a direction to form the cross-shaped stereo test plate.
- the method further includes the step of: setting a projection source to a light radiation path of a light source, wherein the projection source is preset at a time when the light source radiates light
- the projection source includes a cross-shaped test target.
- the projection source includes a planar marking and a zoom lens group, wherein the planar marking is disposed between the light source and the zoom lens group such that the light source The generated light is capable of projecting information of the planar plate through the zoom lens group to the preset space.
- the dimensions of the cross-shaped test patterns of each layer are the same or different.
- the present invention also provides a cross-line stereoscopic test plate comprising a plurality of test stencil layers disposed along a depth direction, each of the test stencil layers having at least one predetermined area, each of the preset areas being provided One or more cross-hair test patterns, and the cross-hair test pattern of each of the test stencil layers and the cross-hair test pattern of the other of the test stencil layers are arranged without overlapping in the depth direction.
- the back focus fitting accuracy parameter of the camera device to be tested is set to a
- the focal length parameter is EFL
- the position parameter of the crosshair stereo test label is set to h
- the layer parameter of the test stencil layer is set to n
- the tolerance parameter of the camera device is set to t
- the layout parameter of the cross-hair test pattern is set to d, and any of the cross-line test patterns of the test stencil layer of any layer to the test mark of the layer
- the center distance of the layer is d ij
- the size parameter of the cross-hair test pattern is set to L, and the size parameter of any one of the cross-line test patterns is L ij , and the parameter tolerance of the cross-line stereo test label is For t', the medium refractive index parameter is n', the software calculates the allowed speckle parameter as s', and sets the test field tolerance range parameter of the camera device to ⁇ F; wherein the cross-line test pattern
- L ij f(d ij , ⁇ F, t', n', s').
- the dimensions of the cross-shaped test patterns of each layer are the same or different.
- a formation of plexiglass, inorganic glass, transparent display screen is selected for each of the test stencil layers.
- the invention also provides a method for testing an imaging device, the camera device comprising a camera module and an image sensor, wherein the method comprises the steps of:
- the method further comprises the steps of: providing a stereo test label comprising a plurality of test stencil layers disposed along the depth direction, each of the test stencils The layers each have at least one of the test patterns, and the test pattern of any one of the test stencil layers and the test pattern of the other test stencil layers are disposed without overlapping in the depth direction.
- the method further comprises the steps of:
- the method further comprises the step of determining the size of the test pattern.
- the back focus fitting accuracy parameter of the camera device to be tested is set to a
- the focal length parameter is EFL
- the position parameter of the stereo test plate is set to h.
- the parameter number parameter of the test stencil layer is set to n
- the tolerance parameter of the camera device is set to t
- the moving step parameter is s
- a layout parameter of the test pattern setting a mid-range distance of any one of the test pattern layers of the test stencil layer to the test stencil layer of the layer as d ij , setting the camera device
- step (c) setting a resolution power value parameter corresponding to each of the test patterns to mtf (ij) , and setting a shape parameter of each of the test patterns to ⁇
- the manner of imaging quality of the stereo test label may be one or more of OTF, MTF, SFR, CTF or TV line.
- the shape of the test pattern is selected from the group consisting of a square, a triangle, a circle, an ellipse, a cross, a black and white line pair, a star, or a combination of a plurality.
- the stereo test label is formed by one of a transmissive, a reflective, a projection, and a zoom.
- the invention also provides a method for adjusting an imaging device, the method comprising the steps of:
- the method further includes the steps of: calculating, by the stereoscopic image, a focal length of the camera module from the same functional relationship, and the camera module and the image sensor Tilt and offset vector.
- the resolution power value parameter corresponding to each of the test patterns is set to mtf (ij)
- the shape parameter of each of the test patterns is set to ⁇
- the position parameter of each of the test patterns 21 is set.
- mtf (ij) f( ⁇ , h, d, s).
- the method further comprises the steps of:
- the invention also provides an adjustment device comprising:
- a stereoscopic test plate having a plurality of test patterns arranged along a depth direction and not overlapping, wherein two adjacent test patterns are arranged at intervals from each other; wherein the camera device captures the stereo test mark to obtain Images with different depths of the scene;
- An adjustment unit for performing an adjustment operation on the imaging device based on the data information provided by the image.
- the stereo test plate further includes a plurality of test stencil layers, each of the test stencil layers including one of the test patterns, and any one of the test stencil layers
- the test pattern and the test pattern of the other test stencil layer are disposed without overlapping in the depth direction.
- the shape of the test pattern is selected from the group consisting of a square, a triangle, a circle, an ellipse, a cross, a black and white line pair, a star, or a combination of a plurality.
- the stereo test label is formed by one of a transmissive, a reflective, a projection, and a zoom.
- the invention also provides a light box for testing a camera module, comprising:
- the light source being disposed in the light box housing;
- test stencil layers each of the test stencil layers being disposed in the light box housing along a depth direction, wherein each of the test stencil layers respectively has at least one test pattern, and any one of the test labels
- the test pattern of the layout layer does not overlap the test pattern of the other test stencil layer in the depth direction, and light generated by the light source is radiated through each of the test stencil layers.
- the light box further includes at least two first mounting portions, each of the first mounting portions being respectively provided with at least one mounting channel, and the peripheral edges of each of the test stencil layers are respectively connected
- Each of the first mounting portions is disposed to be overlapped with the light box housing at an inner wall of each of the mounting passages of the first mounting portion.
- the light box further includes at least two first mounting portions and a plurality of second mounting portions, each of the first mounting portions being respectively provided with at least one mounting channel, each of the tests Marking layers are respectively disposed on each of the second mounting portions, each of the second mounting portions being respectively connected to an inner wall of each of the mounting channels forming the first mounting portion, each of the first mountings The portions are overlapped and disposed on the light box housing.
- the inner wall of the light box housing forms at least two support platforms, and each of the first mounting portions is separately provided. Placed on at least one of the support stations.
- the light box further includes a plurality of positioning elements
- the light box housing is further provided with at least two positioning channels, each of the positioning channels respectively corresponding to each of the support tables.
- a side wall of the first mounting portion disposed on the support table corresponds to each of the positioning passages, and an end of the positioning member extends from the outside of the light box housing to the light box shell via the positioning passage The inside of the body and the first mounting portion are tightened.
- the light box further includes a third mounting portion, the third mounting portion is overlappedly disposed on the light source, and a sidewall of the third mounting portion corresponds to the positioning The passage, the end of the positioning element extends from the outside of the light box housing via the positioning channel to the interior of the light box housing and abuts the third mounting portion.
- the light box housing includes a first carrying portion and a second carrying portion disposed on the first carrying portion, and the first carrying portion and the second portion
- the connecting position of the carrying portion forms a supporting step, and each of the first mounting portions is disposed on the first carrying portion in an overlapping manner, and the light source is disposed on the supporting step.
- the light box housing is square or circular.
- the layer spacing of adjacent test stencil layers is gradually increased or gradually decreased from one end of the light box housing to the other end.
- the number of layers of the test stencil layer is 2-100.
- the test pattern is selected from the group consisting of a square, a triangle, a circle, an ellipse, a cross, a blackboard pair, and a star.
- the invention also provides a method of assembling a light box, wherein the light box is used for testing a camera module, wherein the assembling method comprises the steps of:
- test stencil layers in a depth direction in a light box housing, wherein each of said test stencil layers respectively has at least one test pattern, and said one of said one of said test stencil layers The test pattern and the other test pattern of the test stencil layer do not overlap in the depth direction;
- the method further comprises the steps of:
- the stereo test plate includes a plurality of the test plate layers disposed overlappingly along the depth direction;
- At least one of the stereo test labels is mounted to the light box housing.
- the method further comprises the steps of:
- test plate includes at least one of the test plate layers
- At least two of the test labels are disposed overlapping the light box housing.
- the method further comprises the steps of:
- the reference datum includes a reference element and having at least one reference pattern, each of the reference patterns being respectively disposed at a different position of the reference element;
- each of the test stencil layers to each of the mounting channels of the first mounting portion, and correspondingly setting the test pattern provided on each of the test stencil layers to the reference component
- the reference pattern is formed to form the test plate.
- the method further comprises the steps of:
- the reference datum includes a reference element and having at least one reference pattern, each of the reference patterns being respectively disposed at a different position of the reference element;
- the method further comprises the steps of:
- the first mounting portion and the second mounting portion are joined by a hot melt adhesive.
- the reference pattern provided on the reference element coincides with the type of the test pattern provided on the test plate.
- the test pattern is selected from the group consisting of a square, a triangle, a circle, an ellipse, a cross, a blackboard pair, and a star.
- FIG. 1 is a schematic diagram showing the relationship between an image pickup module and an image sensor of an image pickup apparatus.
- FIG. 2 is a flow chart showing a parameter determination process of a stereo test plate according to the present invention.
- FIG. 3 is a layout diagram of a test pattern of a test stencil layer in accordance with the present invention.
- FIG 4, 5 and 6 are schematic views, respectively, of a first preferred embodiment of a stereo test plate in accordance with the present invention.
- FIG. 7, 8, 9, and 10 are schematic views of a second preferred embodiment of a stereo test plate in accordance with the present invention, respectively.
- Figures 11, 12, 13, and 14 are schematic views of a third preferred embodiment of a stereo test plate in accordance with the present invention, respectively.
- Figures 15, 16 and 17 are schematic views, respectively, of a fourth preferred embodiment of a stereo test plate in accordance with the present invention.
- Fig. 18 is a flow chart showing the design of a cross-line stereo test label prepared when the test pattern of the stereo test label according to the present invention is implemented as a crosshair.
- Figure 19 is a side elevational view of the above preferred embodiment of the present invention.
- Figure 20 is a diagram showing the relationship between the imaging field of view of the image pickup device and its image resolution force value.
- Figure 21 illustrates a suitable selected type of the test pattern.
- Figure 22 is a schematic illustration of the layout of a cross-hair test pattern of a test stencil layer in accordance with the above-described preferred embodiment of the present invention.
- Figure 23 is a schematic illustration of a first implementation of a cross-hair stereo test panel in accordance with the above-described preferred embodiment of the present invention.
- Figure 24 is a schematic illustration of a second implementation of a cross-hair stereo test panel in accordance with the above-described preferred embodiment of the present invention.
- Fig. 25 is a schematic view showing the pattern formed by the image side of each of the cross-hair test patterns of the cross-line stereoscopic test plate according to the above preferred embodiment of the present invention.
- Figure 26 is a schematic illustration of a third implementation of a cross-hair stereo test panel in accordance with the above-described preferred embodiment of the present invention.
- Figure 27 is a schematic illustration of a fourth implementation of a cross-hair stereo test panel in accordance with the above-described preferred embodiment of the present invention.
- Figure 28 is a flow chart showing the testing and adjustment of the image pickup apparatus according to the present invention.
- Figure 29 is a perspective view showing the layout of a stereo test plate according to the present invention.
- Fig. 30 is a view showing the relationship between the resolution and the image distance of the test pattern at different positions before the adjustment of the image pickup apparatus according to the present invention.
- Figure 31 is a schematic view showing the image pattern of the test pattern at different positions before the adjustment of the image pickup apparatus according to the present invention.
- Fig. 32 is a view showing the relationship between the resolution and the image distance of the test pattern at different positions after the adjustment of the image pickup apparatus according to the present invention.
- Figure 33 is a schematic view showing the image pattern of the test pattern at different positions after the adjustment of the image pickup apparatus according to the present invention.
- Figure 34 is a schematic illustration of the process of adjusting an imaging device using a stereo test plate in accordance with the present invention.
- Figure 35 is a diagram showing the relationship between the depth of field and the focal length of the image pickup apparatus according to the present invention.
- Figure 36 is a block diagram of an adjustment device in accordance with the present invention.
- Figure 37 is a flow chart showing the design method of a stereo test plate according to the present invention.
- Figure 38 is a flow chart showing the manner in which a stereo test plate according to the present invention is formed.
- Figure 39 is a schematic illustration of a test flow in accordance with the present invention.
- Figure 40 is a schematic illustration of the adjustment process in accordance with the present invention.
- Figure 41 is a cross-sectional view of a light box in accordance with a first preferred embodiment of the present invention.
- Figure 42 is a cross-sectional view of a light box in accordance with a second preferred embodiment of the present invention.
- Figure 43 is a flow chart showing the assembly of a light box in accordance with the above preferred embodiment of the present invention.
- 44A to 44E are respectively schematic views showing an assembling process of a light box according to the above preferred embodiment of the present invention.
- Figure 45 is a perspective schematic view of a reference datum in accordance with the above-described preferred embodiment of the present invention.
- Figure 46 is a schematic illustration of a reference reference set to a test machine in accordance with the above-described preferred embodiment of the present invention.
- 47A and 47B are schematic diagrams showing the process of testing a stencil layer and a reference datum when adjusting a test stencil layer in accordance with the above-described preferred embodiment of the present invention.
- Figure 48 is a perspective view of a light box in accordance with a third preferred embodiment of the present invention.
- Figure 49 is an exploded perspective view of a light box in accordance with the above preferred embodiment of the present invention.
- Figure 50 is a cross-sectional view of a light box in accordance with the above-described preferred embodiment of the present invention.
- Figure 51 is a perspective view of a modified embodiment of a light box in accordance with the above-described preferred embodiment of the present invention.
- Figure 52 is a cross-sectional view showing another modified embodiment of the light box in accordance with the above preferred embodiment of the present invention.
- Figure 53 is a flow chart showing the assembly of a light box in accordance with the above preferred embodiment of the present invention.
- 54A through 54G are schematic views of an assembly process in accordance with the above preferred embodiment of the present invention.
- the present invention provides a stereo test stencil 100 for assisting in testing an imaging device 10, wherein the imaging device 10 includes a camera module 11 and an image sensor 12 and other possible components such as a lens mount, wherein The imaging module 11 and the image sensor 12 are packaged to form the imaging device 10.
- the imaging device 10 includes a camera module 11 and an image sensor 12 and other possible components such as a lens mount, wherein The imaging module 11 and the image sensor 12 are packaged to form the imaging device 10.
- the camera module 11 and the image sensor 12 are packaged, there is an image plane tilt when the camera module 11 is imaged, and there are tilt tolerances between other components of the camera device 10 and a packaging process. Limiting the accuracy, the focal length of the camera device 10 and the image plane tilt of the camera module 11 and the image sensor 12 are required to be tested to obtain corresponding data, and the camera module is subsequently based on the data.
- FIG. 1 shows a case in which an unadjusted mismatch between the camera module 11 and the image sensor 12 is present, in this example, due to the existence between the camera module 11 and the image sensor 12.
- a slight tilt that is, the optical axis of the camera module 11 is not perpendicular to the photosensitive surface of the image sensor 12 and the optical axes of the two are not aligned, so that the light reflected by the object captured by the camera module 11 cannot be It is uniformly received by the image sensor 12, thereby causing the imaging device 10 to be blurred in imaging.
- the camera module 11 and the image sensor 12 also have other mismatches than the example shown in FIG. 1, for example, the image plane tilt of the camera module 11 itself Wait.
- the stereo test label 100 provided by the present invention includes a plurality of test stencil layers 20 disposed along a depth direction, and each of the test stencil layers 20 has at least one test pattern 21 .
- the test pattern 21 is caused to form scene information of different depths.
- the camera module 11 captures light of different depths of information carrying each of the test patterns 21, and then is received by the image sensor 12 and further photoelectricized. Converting, and generating a signal related to the tilt of the camera module 11 and the image sensor 12 in the background, and subsequently performing an oblique relationship between the camera module 11 and the image sensor 12 based on the signal. Adjustment.
- the relevant parameters of the stereo test label 100 need to be set based on the type of the camera device 10, for example, the number and spacing of the test stencil layer 20 of the stereo test label 100. And the position of the stereo test plate 100, the shape, size, position, density, and the like of each of the test patterns 21.
- the 2 is a design flow chart of the stereo test label 100.
- the relevant test parameters of the camera device 10 need to be performed first.
- the measurement includes parameters such as a test field of view, a focal length, a test distance, and a back focus fitting accuracy requirement of the imaging device 10.
- the test field of view parameter of the camera device 10 is set to F, and accordingly, the camera device 10 is set.
- the focal length parameter is EFL
- the back focus fitting accuracy parameter of the camera device 10 is set to a, wherein the back focus fitting accuracy a is determined by the fitting requirement, and the fitting requirement depends on the requirements of the software processing.
- the type of the image pickup apparatus 10 is determined at the time of initial determination, that is, after the type of the image pickup apparatus 10 to be tested is determined, the test distance of the test layer layer 20 of the first layer is determined in synchronization.
- the position of the stereo test plate 100 and the number of layers of the test plate layer 20 can be calculated.
- the position parameter of the stereo test label 100 is set to h
- the position parameter of the test stencil layer 20 of each layer is h j
- the stereo test plate 100 can be determined by calculating the value of h j The position of each of the test stencil layers 20 is tested.
- the layer parameter of the test stencil layer 20 is set to n, and the tolerance parameter of the camera device 10 is t, wherein the tolerance t of the camera device 10 is determined by a process, which includes but is not limited to the measured site.
- the tolerances of the height, inclination, and offset of the imaging device 10 are further set;
- the process of testing the camera device 10 by using the stereo test label 100 at least only one movement of the camera device 10 is required, and corresponding parameter data can be obtained; wherein the test is performed.
- n f(t, a, s). Based on the above function expression, the number of layers of the test stencil layer 20 can be determined by calculating the value of n. It is worth mentioning that, in another example, it may be possible to obtain corresponding parameters without moving the camera device 10.
- the shape, position and size of the test pattern 21 can be determined.
- the shape of the test pattern 21 is not limited, and may be selected from one or more of a square, a triangle, a circle, an ellipse, a cross, a black and white line pair, and a star pattern. Combination of species. It is worth mentioning that the shape of the test pattern 21 may also be any other icon that can be used to calculate the image quality of the camera device 10, including a physical icon and an icon distinguished by color.
- the layout parameter of the test pattern 21 of the stereo test label 100 is set to d, wherein the layout parameter d of the test pattern 21 represents the density of the test pattern 21, and thus The center distance of any of the test patterns 21 of any of the test stencil layers 20 to the test stencil layer 20 of the layer is set to a parameter d ij , where i represents the test pattern 21 at the layer
- the position on the test stencil layer 20, j represents the number of layers of the test stencil layer 20 of the layer, for example, d ij represents the i th the test pattern 21 of the test stencil layer 20 of the jth layer
- the layout of the test pattern 21 can be determined by calculating the value of d ij . That is, based on the above functional expression, the layout density of the test pattern 21 for each of the test stencil layers 20 can be determined, and it is worth mentioning that, in one embodiment, each of the test stencil layers 20 The density of the test patterns 21 may be the same or may not be uniform.
- the size parameter of each of the test patterns 21 is set to L, and correspondingly, the size parameter of any of the test patterns 21 is L ij , for example, L ij represents the j-th layer
- L ij represents the j-th layer
- the size of the i-th test pattern 21 of the stencil layer 20 is tested.
- the distance representing the test pattern 21 from the test pattern 21 to the center point of the test stencil layer 20 of the layer is d ij .
- the test field span tolerance range parameter is set to ⁇ F
- the manufacturing parameter tolerance of the stereo test label 100 is t′
- the medium refractive index parameter of the stereo test label 100 is n′, which is allowed by software calculation.
- the process of calculating the size L ij of the test pattern 21 is a process of balancing the parameters of the stereo test plate 100 with its manufacturing tolerances, and when the size of the test pattern 21 is L ij After the value is determined, the manufacturing tolerances of the stereo test plate 100 are determined synchronously. It is also worth mentioning that after the parameters of the stereo test label 100 are determined, the stereo test label 100 can be made based on these parameters.
- the present invention provides a method for designing a stereo test label 100, wherein the method includes the steps of:
- the step (A) after the type of the imaging device 10 to be tested is determined, it is first necessary to perform statistics on the relevant parameters of the imaging device 10, including the imaging device 10 Test parameters such as field of view, focal length, and back focus fitting accuracy, It should be understood by those skilled in the art that other parameters of the camera device 10 to be tested may be further counted according to different usage requirements to obtain comprehensive parameter data of the camera device 10, thereby setting better.
- the scheme of the stereo test standard 100 is the scheme of the stereo test standard 100.
- the method further includes the step of determining the size of the test pattern 21.
- the back focus fitting accuracy parameter of the camera device 10 to be tested is set to a
- the focal length parameter is EFL
- the position parameter of the stereo test plate 100 is set to h.
- step (A) setting the layer number parameter of the test stencil layer 20 to n, setting the tolerance parameter of the camera device 10 to t, and moving the step parameter to s;
- the center distance of any of the test patterns 21 to the test stencil layer 20 of the layer is d ij
- the test field of view parameter of the camera device 10 is set to F; wherein the layout of the test pattern 21 is satisfied
- the function expression: d ij f(F,h ij , EFL); wherein the number of layers of the test stencil layer 20 and the layout of the test pattern 21 are determined according to the calculated values of n and d ij .
- each of the test patterns 21 of any one of the test stencil layers 20 and the other layers of the test stencil layer 20 are disposed without overlapping in the depth direction, such that When the camera module 11 captures each of the test patterns 21, each of the test patterns 21 near the camera module 11 does not block light reflected or transmitted away from each of the test patterns 21 of the camera module 11.
- the test pattern 21 of the test stencil layer 20 is in an inverted trapezoidal arrangement, that is, the closer to the test pattern 21 of the camera module 11
- the distance of the center of the test stencil layer 20 of the layer is smaller than the distance from the test pattern 21 of the camera module 11 from the center of the test stencil layer 20 of the layer, as shown in FIG. 4, and In this manner, each of the test patterns 21 of each of the test stencil layers 20 can be captured by the camera module 11 and form an image having depth information.
- the stereo test stencil 100 has a plurality of the test patterns 21 arranged along the depth direction and not overlapping, and the adjacent test patterns 21 are spaced apart from each other, thereby forming the stereo test mark. 100. That is, in a particular embodiment of the invention, each of the test stencil layers 21 needs to be formed by a carrier to carry each of the test patterns 21; and in another embodiment of the invention, each of the The test pattern 21 can also be formed by projection.
- FIG. 5 and FIG. 6 are schematic diagrams of a stereo test label 100 and an application process thereof according to a first preferred embodiment of the present invention.
- the stereo test plate 100 includes each of the test stencil layers 20 disposed along a depth direction, wherein each of the test stencil layers 20 has at least one of the test patterns 21, and any one of the test stencils Each of the test patterns 21 of the layer 20 and each of the test patterns 21 of the other test stencil layers 20 are disposed without overlapping in the depth direction. Further, each of the test patterns 21 has different physical characteristics from each of the test stencil layers 20 such that each of the test patterns 21 can be easily recognized and captured by the camera module 11, for example, each of the tests The pattern 21 can have a different contrast with each of the test stencil layers 20.
- each of the test stencil layers 20 is formed of a transparent material such that the refractive index of the medium of each of the test stencil layers 20 can be reduced as much as possible, thereby making any of the layers of the test stencil layer 20
- Each of the test patterns 21 can be recognized and captured by the camera module 11 without distinction. That is to say, the light corresponding to each of the test patterns 21 of any one of the test stencil layers 20 can be captured by the camera module 11 through the other test stencil layers 20 without loss.
- the image pickup apparatus 10 is enabled to obtain an image of the stereoscopic test plate 100 having depth information.
- the stereo test label 100 is tested by the principle of transmission, and specifically, a light source 40 is disposed on an upper portion of the stereo test label 100, that is, When the camera device 10 is tested, the stereo test label 100 is located between the light source 40 and the camera module 10, so that the uniform light generated by the light source 40 can pass through each of them sequentially.
- the test stencil layer 20 is described and further captured by the camera module 11. In this process, the light of the light source 40, when passing through each of the test stencil layers 20, can increase the amount of each of the test stencil layer 20 and the test stencil layer 20 of the layer in proportion to each of the test stencil layers 20.
- the test pattern The contrast between 21s is such that each of the test patterns 21 can be more easily recognized and captured by the camera module 11.
- 5 and 6 are a top view and a side view, respectively, of the stereo test stencil 100, by which each of the above-described test stencil layers 20 can be easily understood by those skilled in the art.
- a layout relationship such as a position between the patterns 21 is tested.
- the light source 40 is first caused to generate uniform light, which passes through each of the test stencil layers 20 in turn, and is used to enhance each of the test patterns.
- the contrast between 21 and the test stencil layer 20 it is worth mentioning that when the light generated by the light source 40 passes through each of the test stencil layers 20, it plays a consistent role, that is, the test stencil layer 20 and the layer are indiscriminately enhanced.
- the contrast between each of the test patterns 21 of the stencil layer 20 is tested.
- the light carrying the information of each of the test patterns 21 can be accepted by the image sensor 12 and further photoelectrically converted.
- the stereo test plate 100A includes each of the test stencil layers 20A disposed along a depth direction, wherein each of the test patterns 21A of each of the test stencil layers 20A and each of the other test stencil layers 20A
- the test patterns 21A are disposed without overlapping in the depth direction.
- each of the test patterns 21A has different physical characteristics from each of the test stencil layers 20A, so that each of the test patterns 21A can be easily recognized and captured by the camera module 11, for example, each of the tests
- the pattern 21A may have a different contrast with each of the test stencil layers 20A.
- the stereo test label 100A tests the camera device 10 by using a reflective principle.
- at least one light source 40A is disposed at a lower portion of the stereo test label 100A.
- the light source 40A may be provided in two or more so that light generated by the light source 40A can be uniformly tested through each of the test stencil layers 20A. Pattern 21A is reflected. It can be understood that, when the camera device 10 is tested, the stereo test label 100 is located above each of the light source 40A and the camera module 11, and each of the light sources 40A is disposed around the camera module 11.
- each of the light source 40A and the camera module 11 can be adjusted based on different test needs, which does not limit the content and scope of the present invention.
- the light source 40A and the camera module 11 may be located laterally of the stereo test plate 100A instead of below.
- Light generated by each of the light sources 40A may be uniformly passed through each of the test stencil layers 20A in order to enhance each of the test patterns 21 of each of the test stencil layer 20A and the layer of the test stencil layer 20A.
- the contrast between them is such that each of the test patterns 21A can be more easily recognized and captured by the camera module 11.
- FIG 8 and 9 are a plan view and a side view, respectively, of the stereo test plate 100A, by which those skilled in the art can easily understand each of the test plate layers 20A. A layout relationship such as a position between the patterns 21A is tested.
- the specific embodiment of the present invention shown in FIG. 7 differs from the embodiment of the present invention shown in FIG. 4 in that, in the embodiment shown in FIG. 4, the light source 40 generates Light rays are sequentially radiated from the upper portion of the stereo test plate 100 to the lower portion, and finally captured by the camera module 11; and in the embodiment shown in FIG. 7, the light generated by each of the light sources 40A is from the stereo test mark.
- the lower portion of the plate 100A is sequentially radiated to the upper portion for enhancing the contrast between each of the test stencil layer 20A and each of the test patterns 21A.
- each of the test stencil layers 20A may be made of a solid material or may be formed in a space by projection, for example, in the embodiment provided in FIG.
- the test plate 100A may further include at least one carrier member 30A that is superposed and spaced apart, and each of the carrier members 30A is formed with each of the test plate layers 20A. It is worth mentioning that the spacing between adjacent bearing elements 30A determines the spacing between adjacent test stencil layers 20A, and the material and thickness of each of said carrier elements 30A directly affects the stereo test mark.
- each of the carrier elements 30A is made of a transparent material, such that each of the test stencil layers is used when the stereo test stencil 100A is used in a transmissive or reflective manner.
- Each of the test patterns 21A of 20A can be recognized and captured by the camera module 11 indiscriminately, thereby ensuring the accuracy of the test results.
- each of the test patterns 21A may be disposed or formed on each of the carrier members 30A to arrange the test patterns 21A that do not overlap in the depth direction in the test stencil layer 20A, respectively.
- the test pattern 21A may be disposed on at least one preset area of each of the carrier elements 30A, and parameters such as the number, size, and shape of the preset areas are according to the above calculation
- the function expression of the parameters of the test pattern 21A can be obtained by calculation, so that the characteristics of each of the test patterns 21A can be made
- the characteristics of each of the carrier elements 30A are significantly different to facilitate each of the test patterns 21A to be subsequently recognized and captured by the camera module 11.
- each of the preset positions may be first determined on each of the carrier members 30A by the above-described manner, and then each of the carrier members 30A is changed by a processing means such as physical or chemical. Physical characteristics of the preset position, such that the physical characteristics of each of the predetermined regions of each of the carrier elements 30A are significantly different from those of other regions, thereby forming each of the preset positions
- the test pattern 21A may be formed on each of the test stencil layers 20A formed by each of the carrier elements 30A.
- the present invention further provides a method for forming a stereo test label 100A, the method comprising the steps of:
- the light is sequentially passed through each of the test stencil layers 20A to enhance the contrast of each of the test icons 21A and the test stencil layer 20A of the layer.
- the stereo test label 100A is located between the light source 40A and the camera device 10 such that the light generated by the light source 40A passes through each of the test stencil layers in sequence. 20A then arrives at the camera unit 10.
- At least one of the light source 40A and the camera device 10 are disposed on the same side of the stereo test plate 100A, so that the light generated by the light source 40A is The test pattern 21A is reflected.
- the light passing through each of the test stencil layers 20A is uniform light. More importantly, the parameters such as the number, size, and shape of each of the preset regions can be obtained by calculation according to the above-described function expression for calculating the parameters of the test pattern 21A.
- the present invention employs the principle of projection to form the stereo test plate 100B.
- This embodiment of the present invention is specific to the specific embodiment of the present invention illustrated in FIGS. 4 and 7.
- the embodiment is formed by projection, that is, in this embodiment, the stereo test plate 100B may not require the carrier member 30A to carry each of the test patterns 21B.
- the stereo test label 100B includes a light source 40B and a projection source 50B, wherein the projection source 50B is disposed on a path projected by the light source 40B, that is, the light source.
- the light generated by 40B is passed through the projection source 50B and projected, so that an image with depth information can be generated in a preset space for subsequent testing of the image pickup apparatus 10B.
- the present invention can also provide a method for forming a stereo test plate 100B, the method comprising the steps of: setting the projection source 50B to a path radiated by the light generated by the light source 40B, wherein the light source When the light is generated by the 40B, the projection source 50B is disposed such that the plurality of test patterns 21B arranged along the depth direction and not overlapping are projected in the predetermined space, and the adjacent two layers of the test patterns 21B are arranged at intervals. Thereby, the test plate is formed. As shown in FIG. 12, the light source 40B and the projection source 50B are respectively disposed at sides of the preset space for forming the stereo test stencil 100B, and the projection source 50B is located at the light source. Between the 40B and the preset space, such that the light generated by the light source 40B can project information of the projection source 50B into the preset space to form the stereo test having the plurality of test patterns 21B. Standard 100B.
- each of the test patterns 21B of the stereo test plate 100B is formed in the preset space, which uses air as a dielectric layer. Therefore, the influence of the refractive index of the dielectric layer on the test result is reduced as much as possible, thereby ensuring the test accuracy, and another beneficial result brought by forming the stereo test plate 100B in a projection manner is the stereo test mark.
- the volume of the plate 100B can be further reduced.
- 13 and 14 are a plan view and a side view, respectively, of the stereoscopic test plate 100B formed by projection, by which those skilled in the art can easily understand such positions as each of the test patterns 21B. And other layout relationships.
- the stereo test plate 100C includes a light source 40C and a projection source. 50C, wherein the projection source 50C is disposed on a path radiated by the light source 40C, that is, the light generated by the light source 40C is radiated through the projection source 50C, so that a depth can be generated in a preset space.
- the light source 40C and the projection source 50C are respectively disposed at an upper portion of the preset space for forming the stereo test stencil 100C, and the projection source 50C is located at Between the light source 40C and the reserved space, such that the Light generated by the light source 40C can project information of the projection source 50C into the reserved space to form the stereo test plate 100C having the plurality of test patterns 21C.
- the projection source 50C further includes a plane plate 51C and a zoom lens group 52C, wherein the plane plate 51C is disposed between the light source 40C and the zoom lens group 52C, and the plane mark
- the plate 51C further has at least one test target 511C such that light projected by the light source 40C enables each of the test targets 511C to form the stereo test plate 100C in the reserved space through the zoom lens group 52C.
- the parameters such as the size, position and number of the test target 511C can be set based on the different requirements of the stereo test plate 100C.
- 16 and 17 are a plan view and a side view, respectively, of the stereoscopic test plate 100C formed by projection, by which those skilled in the art can easily understand such positions as each of the test patterns 21C. And other layout relationships.
- FIG. 18 is a specific embodiment of the stereo test label 100D according to the present invention, wherein the test pattern 21D of the stereo test label 100D is preferably a cross-hair test pattern 21D, thereby forming A cross-line stereo test plate.
- the cross-line stereo test label includes a plurality of test stencil layers 20D disposed along a depth direction, and each of the test stencil layers 20D has at least one preset area, and each of the preset areas is provided There are one or more of the cross-line test patterns 21D in such a manner that better results can be obtained when the cross-line stereo test mark assists in testing the image pickup apparatus 10.
- the cross-hair test pattern 21D of each of the test stencil layers 20D and the cross-hair test pattern 21D of the other test stencil layer 20D are arranged without overlapping along the depth direction, such that when The image formed by each of the cross-line test patterns 21D of the cross-line stereoscopic test pattern after being projected onto the image side does not cause mutual interference due to the overlap, and thus, the image is captured based on the image pair When the device performs image resolution analysis, no more noise is generated, thereby ensuring the test accuracy of the imaging device 10.
- one of the properties of the image pickup apparatus 10 is such that as the imaging field span of the image pickup apparatus 10 increases, the value of the image resolution force also decreases.
- This property of the image pickup apparatus 10 requires that when the image resolution is analyzed, the sampling range thereof must be defined as small as possible in order to control the test accuracy.
- the above-described manner may cause an error in the image resolution of the image pickup apparatus 10 to be reduced due to an excessively wide range of field of view of sampling, it may increase each The possibility of overlapping interference occurs after the test pattern is projected onto the image side. Therefore, in designing each of the test patterns of the cross-line stereo test label, it is necessary to select an appropriate pattern shape to simultaneously reduce imaging. Post-interference risk and errors due to excessive span of field of view.
- the present invention enumerates several pattern shapes that may be selected as the test pattern.
- shape of the test pattern listed in FIG. 21 is only An example of its possible categories.
- the test pattern 21D in order to avoid the occurrence of interference phenomena, it is ensured that the test pattern 21D can occupy enough pixel points after being projected onto the image side, and the size of the test pattern 21D is specified.
- the shape of the test pattern 21D is preferably the cross-hair test pattern 21D and a word line test pattern. That is, when the density of the test pattern in the predetermined area is ensured, the images formed by the cross-line test pattern 21D and the one-line test pattern after being projected onto the image side do not easily overlap each other.
- the cross-hair test pattern 21D and the one-line test pattern can ensure that the stereo test mark generates less noise when performing image resolution analysis on the image pickup apparatus 10,
- imaging of the test pattern in both the meridional and sagittal directions of the camera device 10 must be considered, that is, when the stereo test plate is assisting the image resolution of the camera device 10
- the image projected to the image side of each of the test patterns preferably extends in both the meridional and sagittal directions of the image pickup device 10, and thus, in these particular embodiments of the invention, the word line
- the image formed after the test pattern is projected onto the image side can only be extended in one direction of the image pickup device 10, and the image formed after the cross line test pattern 21D is projected onto the image side can be at the meridian of the image pickup device 10
- the arcing is extended in both directions to satisfy the testing needs of the camera unit 10.
- parameters such as the position of the cross-line stereoscopic test plate, the layout of the cross-hair test pattern 21D, and the like are limited by the type of the image pickup apparatus 10, that is, in the present invention, when After the type of the imaging device 10 is determined, the parameter data of the cross-line stereo test label can be calculated by measuring the relevant parameters of the imaging device 10, and it is worth mentioning that the imaging device 10 that needs to be measured is required.
- Parameters include, but are not limited to, the test field of view, focal length, test distance, and back focus fitting accuracy of the camera device 10.
- the size, the number of layers, and the like of the cross-line stereo test stencil are determined by calculation.
- the test field of view parameter of the imaging device 10 is set to F, and accordingly, the focal length parameter is EFL, and the back focus fitting accuracy parameter is a, wherein the back focus fitting accuracy a is determined by the fitting requirement, and
- the fitting requirements depend on the needs of the software processing.
- the layer 20D, and Z 1 is determined by the type of the image pickup apparatus 10D initially determined, that is, after the type of the image pickup apparatus 10 to be tested is determined, the test of the first layer of the test stencil layer 20D The distance is determined synchronously. Further, after the relevant parameters of the camera device 10 are determined, based on the parameters, the position of the cross-line stereo test plate and the number of layers of the test plate layer 20D may be calculated.
- the position parameter of the cross-line stereo test plate is set to h
- the position parameter of the test plate layer 20D of any layer is h j
- h j represents the position of the test stencil layer 20D of the jth layer
- the position of each of the test stencil layers 20D of the cross-line stereo test stencil can be determined by calculating the value of h.
- the layer parameter of the test stencil layer 20D is set to n, and the tolerance parameter of the camera device 10 is t, wherein the tolerance t of the camera device 10 is determined by a process, which includes but is not limited to the measured site.
- n f(t, a, s). Based on the above function expression, the number of layers of the test stencil layer 20D can be determined by calculating the value of n.
- the layout and size of the cross-hair test pattern 21D will continue to be determined. .
- the layout parameter of the cross-hair test pattern 21D of the cross-line stereo test plate is set to d, wherein the layout parameter d of the cross-line test pattern 21D represents the crosshair
- the layout of the cross-line test pattern 21D can be determined by calculating the value of d ij . That is to say, based on the above functional expression, the layout density of each of the cross-hair test patterns 21D of each of the test stencil layers 20D can be determined, it is worth mentioning that, in one embodiment, each of the test marks The density of each of the cross-hair test patterns 21D of the layout layer 20D may or may not coincide.
- the size parameter of each of the cross-hair test patterns 21 is set to L, and correspondingly, the size parameter of any of the cross-hair test patterns 21D is L ij , where correspondingly L ij represents The distance between the cross-hair test pattern 21D to the center point of the test stencil layer 20D of the layer is d ij , for example, L ij represents the i-th cross-hair of the j-th layer of the test stencil layer 20D. The size of the pattern 21D is tested.
- test field span tolerance range parameter is set to ⁇ F
- the cross-line stereo test label has a manufacturing parameter tolerance of t′
- the cross-line stereo test label has a medium refractive index parameter of n′
- the process of calculating the size L ij of the cross-hair test pattern 21D is a process of balancing the parameters of the cross-line stereo test label with its manufacturing tolerances, and when the cross-line test pattern is After the value of the size L ij of 21D is determined, the manufacturing tolerances of the cross-line stereo test plate are determined synchronously. It is also worth mentioning that after the parameters of the cross-line stereo test label are determined, the cross-line stereo test label can be made based on these parameters.
- an image formed after each of the cross-hair test patterns 21D is projected onto the image plane ensures that the size thereof is uniform, for example, after the cross-hair test pattern 21D is projected onto the image plane.
- the line width and the line length of the formed image are the same, so those skilled in the art should understand that the line width and line length of each of the cross-hair test patterns 21D of different spatial ranges of the cross-line stereo test plate are different. all different.
- each of the cross-hair test patterns 21D in order to ensure that each of the cross-hair test patterns 21D can be projected to the image plane to achieve a field of view specified to be detected, the space of each of the cross-hair test patterns 21D is designed.
- the position of each of the cross-hair test patterns 21D can be pre-arranged within the field of view of the specified detection of the image plane, and then projected onto the cross-line stereo test plate by back projection.
- the position and size of each of the cross-hair test patterns 21D can be quickly determined at the position of each of the test stencil layers 20D of the cross-line stereo test stencil.
- each of the cross-hair test patterns 21D After the position and size of each of the cross-hair test patterns 21D are determined, further analysis is required to cause an error in each of the cross-hair test patterns 21D on the image plane, for example, to form each of the test labels
- the medium of the layer 20D may cause dimensional inconsistencies, positional shifts, and the like of the cross-hair test pattern 21D to be projected after the image plane. Determining each of the cross-hair test patterns 21D of the cross-line stereo test plate and forming each of the test marks based on the cause and the degree of occurrence of an error after each of the cross-hair test patterns 21D projected onto the image plane The contrast of the media of the layer 20D.
- the medium forming each of the test stencil layers 20D may be a solid medium or a gaseous medium.
- the solid medium may be implemented as an organic or inorganic glass, a transparent display screen or a surface reflection a substance having a higher rate, so that the contrast of each of the test stencil layers 20D formed by each of the cross-hair test patterns 21D and the solid medium can be ensured; when the test stencil layer 20D selects to form the cross from a gaseous medium
- the line stereo test mark it can be realized by projection in a preset space range, but it should be noted that in different embodiments of the present invention, different projection means may be selected to form the cross line stereo test mark. Versions, for example, projection, zoom imaging, etc., are not to be construed as limiting the scope and scope of the present invention.
- the present invention also provides a method of forming a cross-line stereo test label, the method comprising forming a multi-layer cross-hair test pattern 21D along a depth direction, and each of the cross-hair test patterns 21D is projected onto the image side The formed images do not overlap each other.
- the method further includes the step of determining the position of the cross-line stereo test label and the number of layers of the test stencil layer 20D by statistically testing the parameters and accuracy requirements of the camera device 10.
- the back focus fitting accuracy parameter of the camera device may be set to a, the focal length parameter is EFL, and the cross-line stereo test label is set.
- the position parameter is h
- the layer parameter of the test stencil layer may be set to n, the tolerance parameter of the camera device is set to t, and the moving step parameter is s;
- the layout of the cross-hair test pattern 21D is determined.
- the layout parameter of the cross-hair test pattern 21D is set to d, and any of the cross-hair test patterns of any one of the test stencil layers 20D to the test mark of the layer
- the center distance of the layer 20D is d ij
- the size parameter of the cross-hair test pattern 21D is L ij
- the parameter tolerance of the cross-line stereo test label is t′
- the refractive index of the medium is n'
- the size of the cross-hair test pattern 21D can be determined by calculating the value of L ij .
- a cross-line pattern is pre-arranged on the image plane of the image pickup apparatus 10, and then the cross-line pattern is reverse-projected.
- a mode is projected onto the cross-line stereo test plate, whereby the cross-hair test pattern 21D having different depths is formed on the cross-line stereo test plate.
- At least one preset position may be determined in the test stencil layer 20D, and in each of the preset regions respectively Having at least one of the crosshair test patterns 21D; and a plurality of the test stencil layers 20D are superposed and such that the crosshair test pattern 21D and other test stencils of each of the test stencil layers 20D
- Each of the cross-hair test patterns 21D of the layer 20D is misaligned so that an image formed by each of the cross-hair test patterns 21D after being projected onto the image side does not have an interference phenomenon caused by overlapping each other.
- each of the cross-hair test patterns 21D may be formed on a surface of each of the test stencil layers 20D, for example, each of the pre-made cross-hair test patterns 21D may be attached to each The surface of the stencil layer 20D is tested, and then the plurality of layers of the test stencil layer 20D are formed in a logical sequence by lamination to form the cross-line stereo test stencil.
- each of the cross-hair test patterns 21D may be formed inside each of the test stencil layers 20D, so that the cross-line stereo test label can be ensured in the auxiliary operation. The reliability during the test of the imaging device 10 is described.
- the cross-hair test pattern 21D and the test may also be added by a light source 40D.
- the contrast of the stencil layer 20D is such that the information of each of the cross-line test patterns 21D can be more easily acquired by the image pickup apparatus 10.
- the light source 40D is disposed on one side of the cross-line stereo test plate so that the cross-line stereo test plate can be located at the light source 40D and the Between the camera devices 10D, such that the uniform light generated by the light source 40D can sequentially pass through each of the test stencil layers 20D, in the process, the light generated by the light source 40D will increase in proportion to each The contrast between the stencil layer 20D and the cross-line stereo test pattern 21D of the layer is tested, thereby enabling each of the test patterns 21D to be more easily recognized and captured by the camera module 11.
- the light source 40D is disposed at a lower portion of the cross-line stereo test plate, and it should be noted that in this embodiment, the number of the light sources 40D may be more than one, so that The light generated by the light source 40D can uniformly pass through the test stencil layer 20D and proportionally increase the contrast between each of the test stencil layer 20D and the cross-hair stereo test pattern 21D of the layer.
- the embodiment shown in Fig. 23 uses a transmissive principle to test the imaging device 10 differently, and the embodiment shown in Fig. 24 tests the imaging device 10 using the principle of reflection.
- FIG. 25 is a schematic diagram of an image formed after each of the cross-hair test patterns 21D is projected onto the image side when the imaging device 10 is tested, so that the cross-line stereo test plate has different spatial extents.
- the length of the cross-hair test pattern 21D and the line width dimension are different, so that the image size formed after the image is projected to the image side is uniform to facilitate analysis of the image resolution of the image pickup apparatus 10.
- a projection source 50D is disposed on a path of the light generated by the light source 40D, and when the light source 40D emits light, the projection source 50D is projected into the preset space.
- a plurality of the cross-hair test patterns 21D arranged along the depth direction and not overlapping are formed, and the adjacent cross-hair test patterns 21D are disposed spaced apart from each other such that when each of the cross-hair test patterns 21D is projected to the image side After that, there will be no occurrence of phenomena that interfere with each other and cause interference.
- the light source 40D and the projection source 50D are respectively disposed at sides of the preset space for forming the cross-line stereo test plate, and the projection source 50D is located at the light source 40D and Between the preset spaces, the light radiated by the light source 40D can project information of the projection source 50D into the preset space to form the cross having the plurality of the cross-hair test patterns 21D. Line stereo test mark.
- the projection source 50D is disposed on a path of the light source 40D, and the light source 40D and the projection source 50D are both located in the preset space forming the cross-line stereo test label.
- the projection source 50D includes a plane plate 51D and a zoom lens group 52D, wherein the plane plate 51D is disposed between the light source 40D and the zoom lens group 52D, and in the plane plate 51D
- each of the test targets 511D can be obtained when the light radiated by the light source 40D can radiate each of the test targets 511D to the preset space through the zoom lens group 52D.
- Each of the cross-hair test patterns 21D having different depths is formed in the preset space, thereby forming the cross-line stereo test plate.
- cross-line stereo test label can also be formed by other methods.
- the cross-line stereo test label listed above is only an example. It is not intended to limit the scope and scope of the invention.
- the image quality can be tested by using OTF (Optical Transfer Function), MTF (Modulation Transfer Function). Any one or more of SFR (Spatial Frequency Response), or CTF (Contrast Transfer Function), or any other evaluation method that can characterize the resolution of the image pickup apparatus 10 This is carried out, preferably MTF (Modulation Transfer Function).
- OTF Optical Transfer Function
- MTF Modulation Transfer Function
- SFR Spatial Frequency Response
- CTF Contrast Transfer Function
- MTF Modulation Transfer Function
- the camera device 10 described in the present specification includes the camera module 11 and the image sensor 12, it should be noted that the camera module 11 and the image sensor 12 further include other possibilities.
- the member, therefore, the camera module 11 and the image sensor 12 appearing anywhere in the present specification are not considered to be limiting.
- the camera module 11 includes a lens, and possibly also a motor (not shown in the drawing), and the image sensor 12 may further include a PCB board (not shown in the drawing), etc. Therefore, although the present specification describes that the image pickup apparatus 10 includes the image pickup module 11 and the image sensor 12, the image pickup module 11 and the image sensor 12 cannot be regarded as the only one of the image pickup apparatus 10 Example.
- the test method tests the relationship between the camera module 11 of the camera device 10 and the relevant position of the image sensor 12 including focus, tilt, etc. based on the scene depth principle, and accordingly,
- the adjustment method can adjust the relative position of the camera module 11 and the image sensor 12 based on the result of the test, so that the camera module 11 and the image sensor 12 can be in a matching position. In order to ensure the imaging quality of the imaging device 10.
- the adjustment device includes a stereo test plate 100, an adjustment unit 200, and other possible components such as a light source, wherein the stereo test plate 100 is provided with different scene depths based on the principle of the depth of the scene.
- the test pattern 21 is such that, when the camera device 10 is tested, the camera device 10 can obtain images having different scene depth information by at least only one image of the stereo test plate 100.
- the stereo test label 100 has a plurality of the test patterns 21 arranged along the depth direction and not overlapping, and the adjacent two layers of the test patterns 21 are arranged at intervals from each other, wherein the image pickup device When an image of the stereoscopic test plate 100 is photographed, an image having different scene depth information can be obtained.
- test pattern 21 having different scene depths along the depth direction, and to subsequently pass each of the cameras 10 through the camera.
- the test pattern 21 is photographed to obtain an image having different scene depth information.
- the test pattern 21 having different scene depths along the depth direction can be established by establishing the stereo test stencil 100.
- the stereo test label 100 includes a plurality of test stencil layers 20 disposed along a depth direction, each of the test stencil layers 20 Having at least one of the test patterns 21, respectively, and the test pattern 21 of any one of the test stencil layers 20 and the test pattern 21 of the other test stencil layer 20 do not overlap in the depth direction. Settings.
- each of the test patterns 21 of the test stencil layer 20 of different layers corresponds to a different object distance and image distance.
- the number of each of the test patterns 21 is set to m i n j , where j represents the number of layers of the test stencil layer 20 of the jth layer, i represents the number of the i-th test pattern 21, and i
- the value ranges from i>1, that is, at least two test patterns 21 are provided on each test label layer 20 of each layer. Of course, in other embodiments, there may be only one test pattern per layer. twenty one. Those skilled in the art will appreciate that the imaging position corresponding to each of the test patterns 21 is m' ij .
- FIG. 31 is a schematic view showing the arrangement of the stereo test label 100 according to a preferred embodiment of the present invention, wherein the shape of the test pattern 21 is determined according to actual needs, in the test method, When the test pattern 21 of different spatial depths of the stereoscopic test plate 100 is photographed by the camera module 11, the corresponding resolution force value can be obtained.
- a resolution power value parameter corresponding to each of the test patterns 21 as mtf (ij) , setting a shape parameter of each of the test patterns 21 to ⁇ , and a position parameter of each of the test patterns 21 is (h, d);
- FIG. 28 is a flow chart showing the test and adjustment of the image pickup apparatus 10 based on the scene depth principle.
- the camera module 11 and the image sensor 12 are first placed to a target initial position.
- the image sensor 12 can be placed at a corresponding position of the adjustment unit 200, and the camera module 11 can be gripped to a target initial position, so that the camera module 11 corresponds to the position of the image sensor 12, An image of the test pattern 21 of the stereo test label 100 is acquired by cooperation of the camera module 11 and the image sensor 12.
- each of the test patterns 21 is obtained by causing the image pickup apparatus 10 to take an image of the stereoscopic test plate 100 at a target initial position. It is worth mentioning that, in this process, each of the test patterns 21 of all the spatial heights of the stereo test label 100 is simultaneously imaged on one image, so that the test method allows one image to pass. It is possible to collect the test images 21 of different depths and calculate the resolution values of the corresponding test patterns 21 corresponding thereto.
- F j F (v) ⁇ mtf (i1) , mtf (i2) , mtf (i3) ... mtf (ij) ⁇ .
- the focus parameter is set to P, and those skilled in the art should understand that the focus position of the test pattern 21 is obtained by the above function expression: P 0 to P j , and is located in the stereo test plate 100.
- the focus position of the test pattern 21 at the center is P 0 , where P 0 is also the in-focus position of the image pickup apparatus 10.
- a resolution curve and an image distance curve drawn by a function corresponding to F 0 to F 4 as shown in FIG. 30 can be obtained, wherein F 0 corresponds to The function curve of the central field of view (m 0 ), F 1 and F 3 correspond to the resolution function curves of the off-axis field of view (m 1 and m 3 ) with respect to the center-left symmetrical pattern, and F 2 and F 4 correspond to the off-axis field of view ( m 2 and m 4 ) a function curve of the resolution of the vertically symmetric pattern.
- F 0 corresponds to The function curve of the central field of view (m 0 )
- F 1 and F 3 correspond to the resolution function curves of the off-axis field of view (m 1 and m 3 ) with respect to the center-left symmetrical pattern
- F 2 and F 4 correspond to the off-axis field of view ( m 2 and m 4 ) a function curve of the resolution of the vertically symmetric pattern.
- the test method can calculate the tilt vector of the camera device 10 according to a functional expression of the relationship between the resolution and the amount of defocus, and in the following, the adjustment unit 200 can perform the camera.
- the apparatus 10 is adjusted and the images shown in Figs. 32 and 33 are regained.
- the defocuss of the four points (m 1 , m 2 , m 3 , m 4 ) of the off-axis field of view are less than 3 ⁇ m.
- the image plane tilt is improved, and the four regions m 1 , m 2 , m 3 , and m 4 are uniformly imaged, and the resolution is improved, indicating that the image quality of the image pickup apparatus 10 is improved to a large extent.
- the image sensor 12 may be placed on an adjustment platform disposed on the adjusting unit 200, for example, six axes.
- An adjustment member, or other multi-axis adjustment member the camera module 11 is disposed at a target initial position of an upper portion of the image sensor 12, and the camera module 11 is located at the stereo test plate 100 and the adjustment platform
- each of the test patterns 21 of the stereo test label 100 has a corresponding image distance, so that when the image capturing module 11 and the image sensor 12 are used,
- an image having different scene depth information can be obtained.
- an adjustment instruction indicating the data is input to the adjustment unit 200 to control the adjustment platform to adjust the camera module 11 and the The relationship between the image sensors 12 is described, thereby improving the image quality of the image pickup apparatus 10.
- the focus position and the tilt vector of the camera device 10 are calculated from the same image and via the same function relation expression, and the adjustment indication can also be input simultaneously, and the adjustment platform receives the The adjustment indication is the same time, and further, the focus and image plane tilt adjustment of the image pickup apparatus 10 can be simultaneously performed, whereby the efficiency of testing and adjusting the image pickup apparatus 10 can be greatly improved.
- the adjustment device determines that the imaging device 10 is qualified, and performs the subsequent a curing step of the camera module 11 and the image sensor 12; if the camera device 10 does not meet the specifications required for the resolution, the adjusting device determines that the camera device 10 fails to adjust, and continues to perform the camera device 10 Adjustment.
- the adjusting device determines that the number of adjustments of the camera device 10 reaches or exceeds a preset number of times, for example, three times, it may be due to the camera device.
- the article in 10 is caused by a serious defect, and at this time, it is not necessary for the image pickup apparatus 10 to perform the adjustment step.
- the present invention provides a method for testing the camera device 10.
- the camera device 10 includes a camera module 11 and an image sensor 12.
- the method includes the following steps:
- a plurality of test stencil layers 20 are provided, which are disposed along the depth direction, each of the test stencil layers 20 having at least one of the test patterns 21, And the test pattern 21 of any one of the test stencil layers 20 and the test pattern 21 of the other test stencil layer 20 are disposed without overlapping in the depth direction.
- the method further comprises the steps of: (a.1) determining the position of the stereo test label 100 by statistically testing the parameters of the camera device 10; and (a.2) The number of layers of the test stencil layer 20 and the layout of the test pattern designing the test stencil layer are determined according to the accuracy requirements of the image pickup apparatus 10.
- the method further comprises the step of: (a.3) determining the size of the test pattern.
- the present invention further provides a method for adjusting the camera device 10, the method comprising the steps of:
- a stereoscopic image having different scene depth information is acquired by photographing the test pattern 21 of the stereoscopic test plate 100, wherein the stereo test plate 100 has a depth direction and The plurality of test patterns 21 are not overlapped, and the adjacent two layers of the test patterns 21 are arranged at intervals from each other.
- FIG. 41 is a structural diagram of a light box for testing a camera module according to a first preferred embodiment of the present invention, wherein the light box is used to assist in testing the image quality of a camera module.
- the light box includes a light box housing 300, a light source 40, and at least one stereo test label 100.
- the light source 40 is disposed on the light box housing 300, and each of the stereo test labels 100 is separately mounted.
- each of the stereo test labels 100 is located in a light path of the light source 40 to illuminate the light generated by the light source 40
- Each of the stereo test labels 100 may be disposed at an upper portion of the light box housing 300 such that light generated by the light source 40 is radiated from top to bottom through each of the stereo test labels 100. To illuminate each of the stereo test templates 100.
- the light box housing 300 not only forms a load bearing member for carrying each of the stereo test stencil 100 and the light source 40, but also forms an environment in which one end portion and four peripheral portions are closed,
- the external light of the light box enters the interior of the light box housing 300 to interfere with the uniform light radiated by the light source 40. In this way, the subsequent The accuracy of the camera module being tested.
- Each of the stereo test stencils 100 includes a plurality of test stencil layers 20 disposed along a depth direction, and each of the test stencil layers 20 has at least one test pattern 21, respectively, such that the test pattern 21 form scene information of different depths.
- the camera module is capable of capturing light of different depths of information describing each of the test patterns 21 and converting it into an image, thereby The imaging condition of the module can determine the imaging quality of the camera module and adjust related parameters of the camera module.
- the relevant parameters of the stereo test label 100 need to be set according to the type of the camera module, for example, the number and spacing of the test label layer 20 of the stereo test label 100. And the position, the size, the position, the density, and the like of the test pattern 21 of each of the test stencil layers 20 are installed at the position of the light box housing 300, according to the tested The type of camera module is determined. It is also worth mentioning that the number of layers of the test stencil layer of the stereo test label 100 may be 2-100 layers.
- test pattern 21 of any one of the test stencil layers 20 and the test pattern 21 of the other test stencil layer 20 are disposed without overlapping in the depth direction, thereby being in the image capturing mode.
- each of the test patterns 21 of each of the test stencil layers 20 does not interfere with each other to ensure the test accuracy of the camera module.
- the shape of the test pattern 21 is not limited, for example, the test pattern 21 may select a square, a triangle, a circle, an ellipse, a cross, a blackboard line pair.
- a shape group composed of a star or the like that is, the shape of the test pattern 21 of the light box of the present invention may be any icon that can be used to calculate the image quality of the camera module, including an entity icon and An icon that is distinguished by color.
- the stereo test label 100 further includes a first mounting portion 60, and each of the test stencil layers 20 is disposed on the first mounting portion 60, and the first mounting portion 60 is mounted.
- the layer spacing of each of the test stencil layers 20 is determined according to the testing needs of the camera module being tested.
- each of the test stencil layers 20 may be fixed to the first by a hot melt adhesive or other equivalent embodiment. Mounting portion 60.
- each of the test stencil layers 20 is fixed to the first mounting portion 60 by means of a hot melt adhesive, and in the process, when the physics of the glue When the state changes, the position of each of the test stencil layer 20 and the first mounting portion 60 and the inclination of each of the test stencil layers 20 are not offset, thereby ensuring that the light box is The accuracy after being assembled.
- Figure 42 is a structural view of a light box for testing a camera module according to a second preferred embodiment of the present invention, which is different from the above preferred embodiment in the second preferred embodiment of the present invention.
- Each of the test stencil layers 20 of the light box is not directly disposed at the first mounting portion 60.
- the stereo test label 100 includes a first mounting portion 60, a plurality of second mounting portions 70, and a plurality of the test stencil layers 20, each of which is disposed on each of the test stencil layers 20
- the second mounting portions 70, each of the second mounting portions 70 are respectively connected to the first mounting portion 60, for example, in a specific example of the present invention, the test stencil layer 20 and the The second mounting portions 70 may be connected by a hot melt adhesive, and the second mounting portion 70 and the first mounting portion 60 may be connected by a hot melt adhesive.
- the light box provided by the present invention includes the light box housing 300, the light source 40, and at least one of the stereo test labels 100, and the light source 40 is disposed at an upper portion of the light box housing 300.
- Each of the stereo test templates 100 is disposed inside the light box housing 300, and each of the stereo test labels 100 is located in a light path of the light source 40, wherein each of the stereo tests
- the stencils 100 respectively include a plurality of test stencil layers 20 disposed along the depth direction, each of the test stencil layers 20 having at least one test pattern 21, and the test of any one of the test stencil layers 20
- the pattern 21 and the test pattern 21 of the other test stencil layer 20 are disposed without overlapping in the depth direction.
- the stereo test label 100 further includes the first mounting portion 60, and each of the test stencil layers 20 is disposed on the first mounting portion 60 in an overlapping manner.
- the first mounting portion 60 is disposed on the light box housing 300 to form the light box.
- the stereo test label 100 further includes the first mounting portion 60, a plurality of the second mounting portions 70, and a plurality of the test stencil layers 20, Each of the test stencil layers 20 is disposed on each of the second mounting portions 70, and each of the second mounting portions 70 is respectively disposed on the first mounting portion 60, and the first mounting portion 60 is disposed.
- the item 30 is formed to form the light box.
- the present invention also provides a method of assembling a light box, wherein the assembly method greatly improves the assembly efficiency of the light box by simplifying and optimizing the assembly steps of the light box.
- the assembly method provided by the present invention shortens the assembly time of the light box from 2 days to 2 days, 2 days, 3 days, and after the assembly is completed. The accuracy has also been greatly improved to ensure the subsequent test results of the camera module.
- the assembly method includes the following steps.
- Step 4310 Provide a reference datum 80 and fix the reference datum 80 to a test machine 90.
- the reference datum 80 is the basis for assembling and adjusting each of the test stencil layers 20, that is, the determination and adjustment of each parameter of the stereo test stencil 100 are the same
- One of the reference fiducials 80 serves as a basis for determination and adjustment, and in this way, the consistency of each of the stereo test templates 100 can be ensured.
- the reference datum 80 includes a reference member 81 and has at least one reference pattern 82, each of which is disposed at a different position of the reference member 81, as shown in FIG.
- each of the reference patterns 82 is independent of each other, that is, there is no mutual interference between each of the reference patterns 82.
- the type and material of the reference member 81 may not be limited.
- the reference member 81 may be implemented as a square metal piece, such as a steel sheet, and the reference pattern 82.
- the reference element 81 may be provided by laser engraving, and it is understood that the reference pattern 82 may also be printed on the reference element 81. It will be understood by those skilled in the art that the reference pattern 82 provided on the reference element 81 and the test pattern 21 provided on the test stencil layer 20 are of the same type and size, thereby being assembled and adjusted.
- the test pattern 21 provided on the test stencil layer 20 can coincide with the reference pattern 82 provided on the reference element 81 at the position and inclination of each of the test stencil layers 20. It can also be understood that, in the process of assembling the light box, only the pattern of the camera module, the test pattern 21 disposed on the test stencil layer 20, and the portion disposed on the reference member 81 The reference patterns 82 are coincident to determine the position and inclination of the test stencil layer 20.
- the position of the reference pattern 82 is obtained by optical calculation, that is, the position where the reference pattern 82 is located is a theoretical position.
- assembly of the light box can be performed on the test machine 90, which is a test device that subsequently tests and adjusts relevant parameters of the camera module using the light box.
- one of the camera modules may be fixed on the test machine 90, and the reference datum 80 is fixed to the test machine 90, as shown in FIG.
- the reference datum 80 may be secured to the test machine 90 by a locating pin to prevent the reference datum 80 from shifting when the light box is assembled.
- Step 4320 Fix the test stencil layer 20 to the second mounting portion 70 to form a single stencil 150, as shown in FIG. 44A. It is worth mentioning that between the test stencil layer 20 and the second mounting portion 70, it can be fixed by hot melt adhesive to avoid fixing the test stencil layer 20 and the second mounting portion 70. At the same time, a phenomenon of mutual misalignment occurs between the test stencil layer 20 and the second mounting portion 70.
- step 4320 can also be completed between the steps 4310, so that the single standard 150 is formed first, and then The reference datum 80 is formed again and the reference datum 80 is fixed to the test machine 90.
- Step 4330 Fix the first mounting portion 60 to the reference member 81 of the reference datum 80, as shown in FIG. 44B.
- the manner in which the first mounting portion 60 is fixed to the reference member 81 is not limited.
- the first mounting portion 60 may be fixed by means of a positioning pin.
- the reference member 81 is used to ensure that the first mounting portion 60 does not appear to be displaced when the light box is assembled, so that the first mounting portion 60 is not only facilitated from the reference member 81 in the subsequent stage. Disassembled without damaging any of the first mounting portion 60 and the reference member 81, which ensures the accuracy of the subsequently formed light box Very effective.
- Step 4340 The monomer plate 150 is placed in the first mounting portion 60, as shown in FIG. 44C.
- Step 4350 The pattern of the camera module, the test pattern 21 disposed on the test stencil layer 20, and the reference element 81 are set by adjusting the position and the inclination of the single-plate stencil 150.
- the reference patterns 82 coincide, so that the relevant parameters of the single plate 150 are determined.
- the pitch is as shown in Figs. 47A and 47B.
- Step 4360 Fix the adjusted single plate 150 and the first mounting portion 60 to form the stereo test plate 100.
- the second mounting portion 70 of the single-plate 150 of the stereo test label 100 and the first mounting portion 60 may be fixed by hot melt adhesive to avoid When the second mounting portion 70 and the first mounting portion 60 are fixed, the parameters of the stereo test label 100 are changed, for example, during the change of the physical state of the hot melt adhesive, the stereo test label 100 In the case where displacement and tilting do not occur between each of the individual standard plates 150, in this way, the accuracy of the light box after being assembled is ensured.
- Step 4370 Fix at least one of the stereo test labels 100 to the light box housing 300, as shown in FIG. 44D.
- the parameters of the stereo test label 100 are determined, so that in the step 4370, the stereo test label 100 is fixed to the light box.
- the process of the housing 300 does not require re-adjustment of the parameters of the stereo test plate 100, and in this way, the assembly efficiency of the light box can be greatly improved.
- the manner in which the stereo test label 100 and the light box housing 300 are fixed is not limited.
- the stereo test label 100 and the light box shell may be locked by screws.
- the body 300 is fixed, and it is to be understood that this is merely an exemplary description and does not limit the scope and scope of the present invention.
- Step 4380 disposing the light source 40 on the light box housing 300 to form the light box, and the light generated by the light source 40 is radiated through each of the stereo test labels 100 to illuminate each of the The stereo test plate 100 is as shown in Fig. 44E.
- step 4370 and the step 4380 are not limited, so in another embodiment of the invention, the step 4380 can also be completed between the steps 4370, so that The light source 40 is disposed on the light box housing 300, and the stereo test label 100 is mounted on the light box housing 300 to form the light box.
- the present invention provides a method of assembling a light box, wherein the assembly method includes the following steps:
- a light source 40 is disposed in the light box housing 300, and light generated by the light source 40 is radiated through each of the test stencil layers 20.
- the step (C) is completed before the step (B), so that the light source 40 is first disposed on the light box housing 300. And each of the stereo test labels 100 is mounted to the light box housing 300.
- step (A) further includes:
- a reference datum 80 is provided, wherein the reference datum 80 includes a reference element 81 and has at least one reference pattern 82, each of the reference patterns 82 is respectively disposed on the reference element 81;
- Each of the test stencil layers 20 is disposed in the depth direction on the first mounting portion 60, and the test pattern 21 provided on each of the test stencil layers 20 and the reference element 81 are disposed.
- the reference pattern 82 corresponds to form the stereo test plate 100.
- step (A) further comprises:
- a reference datum 80 is provided, wherein the reference datum 80 includes a reference element 81 and has at least one reference pattern 82, each of the reference patterns 82 is respectively disposed on the reference element 81;
- the monomer plate 150 includes a second mounting portion 70 and the test plate layer 20 fixed to the second mounting portion 70;
- Each of the single-plate blanks 150 is disposed on the first mounting portion 60 along the depth direction, and the test pattern 21 provided on each of the test stencil layers 20 and the reference element 81 is disposed.
- the reference pattern 82 corresponds to form the stereo test plate.
- a camera module and the reference component 81 are respectively fixed to a test machine 90, when the camera Fixing the second mounting portion 70 and the first when the pattern of the module coincides with the test pattern 21 provided on each of the test stencil layers 20 and the reference pattern 82 provided on the reference member 81
- the mounting portion 60 is formed to form the stereo test plate 100.
- the second mounting portion 70 and the first mounting portion 60 are fixed by hot melt adhesive.
- the present invention also provides a method of assembling a light box, wherein the assembling method comprises the following steps:
- test stencil layers 20 (a) arranging a plurality of test stencil layers 20 in a depth direction in a light box housing 300, wherein each of the test stencil layers 20 has at least one test pattern 21, and any one of the test labels The test pattern 21 of the layer 20 and the test pattern 21 of the other test stencil layer 20 do not overlap in the depth direction;
- a light source 40 is disposed in the light box housing 300, and light generated by the light source 40 is radiated through each of the test stencil layers 20.
- the method further comprises:
- At least one of the stereo test labels 100 is mounted to the light box housing 20.
- each of the test labels 110A is disposed on the light box housing 300A in an overlapping manner, such that each of the test labels 110A forms a stereo test label 100A, and the light source 40A is disposed on the light box housing 300A.
- each of the test templates 110A is located in the light path of the light source 40A.
- each of the test labels 110A is disposed in an overlapping manner inside the light box housing 300A, and the light source 40A is disposed at an end of the light box housing 300A.
- the uniform light generated by source 40A can be sequentially passed through at least a portion of each of said test stencils 110A to illuminate the portion of each of said test stencils 110A.
- each of the test templates 110A includes at least one test stencil layer 20A, and each of the test stencil layers 20A has at least one test pattern 21A for subsequent testing of the camera module.
- the uniform light generated by the light source 40A is radiated through each of the test stencil layers 20A of the test stencil 110A.
- each of the test stencil layers 20A of the test stencil 110A are in the same horizontal plane, so that when each of the test stencils 110A is overlapped to form the stereo test stencil 100A
- the stereo test plate 100A includes a plurality of test stencil layers 20A disposed along a depth direction, each of the test stencil layers 20A having at least one of the test patterns 21A, and any of the layers of the test
- the test pattern 21A of the stencil layer 20A does not overlap the test pattern 21A of the other test stencil layer 20A in the depth direction. That is to say, the test pattern 21A of each layer of the test stencil layer 20A does not interfere with each other when the camera module is tested, thereby ensuring the reliability of the test result of the camera module.
- the number of the test stencil layers 20A of the test label 110A is not limited, for example, the number of the test stencils 20 may be one, two, three, four. Or more. It will be understood by those skilled in the art that the number of the test stencil layers 20A of each of the test stencils 110A disclosed in the examples of the present invention is four, and it is merely an illustrative description. It is not intended to limit the scope and scope of the invention.
- Each of the test labels 110A further includes a first mounting portion 60A and at least one second mounting portion 70A.
- the first mounting portion 60A is provided with at least one mounting channel 61A, and each of the test marking layers 20A.
- Each of the second mounting portions 70A is mounted to each of the second mounting portions 70A, and each of the second mounting portions 70A is mounted to each of the mounting passages 61A of the first mounting portion 60A. It is worth mentioning that, after the test stencil layer 20A is mounted on the second mounting portion 70A, the test stencil layer 20A and the second mounting portion 70A may form a single stencil 150A. It can be understood by those skilled in the art that the second mounting portion 70A may be disposed around the circumference of the test stencil layer 20A, or the second mounting portion 70A may be symmetrically disposed on the test stencil layer. Both sides of the 20A.
- test stencil layer 20A and the second mounting portion 70A may be connected together by hot melt adhesive, and the second mounting portion 70A is mounted on the first mounting portion.
- the second mounting portion 70A may be connected to the first mounting portion 60A by the hot melt adhesive to form the mounting channel 61A.
- the inner wall It can be understood that the hot melt adhesive has the ability to bond quickly, and the relative position between the second mounting portion 70A and the first mounting portion 60A is also changed during the change of the physical state of the hot melt adhesive. No changes will occur to ensure the accuracy of the light box after assembly.
- Each of the test plates 110A is overlapped and fixed to the light box housing 300A as shown in FIG. Specifically, after each of the test templates 110A is completed, two test labels 110A may be overlapped and fixed to the light box housing 300A.
- the number of layers of the test plate 110A may be 2-100 layers. For example, in a preferred embodiment of the present invention, the number of layers of the test plate 110A may be 5 layers.
- the inner wall of the light box housing 300A extends to form at least two support stages 31A, and both sides of each of the test patterns 100 may be disposed on each of the support stages 31A to be supported by the support stage 31A.
- the light box housing 300A may further be provided with at least two positioning passages 32A to communicate with the inside and the outside of the light box housing 300A, and each of the positioning passages 32A respectively correspond to each of the support bases 31A.
- the sidewall of the test plate 110A corresponds to the positioning channel 32A, and one end of the positioning component 120A may be from the light box housing 300A.
- the outer portion passes through the positioning passage 32A to press the test plate 110A to fix the test plate 120 to the light box housing 300A.
- the positioning member 30 and the inner wall of the light box housing 300A for forming the positioning passage 32A have intermeshing threaded structures.
- the light box further includes a third mounting portion 130A.
- the third mounting portion 130A covers the light source 40A to fix the light source 40A to the light source 40A.
- the light box housing 300A is described.
- a side wall of the third mounting portion 130A corresponds to the positioning passage 32A of the light box housing 300A, and one end of the positioning member 120A passes through the outside of the light box housing 300A Positioning the passage 32A to tighten the third mounting portion 130A, thereby preventing the third mounting portion 130A from being displaced or detached to ensure that the light source 40A is parallel to the test plate 110A, thereby generating the light source 40A.
- Uniform light may pass through each of said test stencil layers 20A of each of said test stencils 110A to uniformly illuminate each of said test stencil layers 20A.
- the light box further includes a light shielding member 140A, the light shielding member 140A is disposed on the third mounting portion 130A, and the light shielding member 140A and the test label 110A are respectively located on both sides of the light source 40A.
- the shading element 140A prevents light generated by the light source 40A from radiating from opposite sides of the test plate 110A, and the shading element 140A also prevents light outside the light box from entering the interior of the light box to interfere
- the light source 40A produces uniform light to ensure the reliability of the light box.
- the light box housing 300A includes a first carrying portion 33A and a second carrying portion 34A.
- the second carrying portion 34A is disposed at an end of the first carrying portion 33A, and the first carrying portion 33A and The central axis of the second carrier portion 34A is coincident, the first carrier portion 33A is for fixing each of the test labels 110A, and the second carrier portion 34A is for fixing the light source 40A.
- the first carrier portion 33A is formed in each of the support tables 31A for providing each of the test labels 110A to the first carrier portion 33A, and the second carrier portion 34A
- the size is larger than the size of the first carrying portion 33A, so that a supporting step 35A is formed at a connecting position of the first carrying portion 33A and the second carrying portion 34A, and the light source 40A is disposed on the supporting step 35A.
- the shape of the light box housing 300A is not limited. In the preferred embodiment of the present invention, as shown in FIG. 48 to FIG. 50, the shape of the light box housing 300A is square, for example. Square or rectangular. In another preferred embodiment of the present invention, as shown in FIG. 51, the shape of the light box housing 300A is circular, such as a perfect circle or an ellipse.
- a modified embodiment of the above preferred embodiment of the present invention is different from the above preferred embodiment in that the test stencil layer 20A of the test stencil 110A is not connected to the second
- the mounting portion 70A directly connects the test stencil layer 20A to the inner wall of the first mounting portion 60A forming the mounting channel 61A, and the test stencil layer 20A and the first mounting portion 60A
- the inner walls forming the mounting passage 61A may be joined together by means of hot melt adhesive.
- the present invention also provides a method of assembling a light box, wherein the assembly method includes the following steps.
- Step 5310 Provide a reference datum 80A and fix the reference datum 80A to a test machine 90A, as shown in FIG. 54A.
- the reference reference 80A is the basis for assembling and adjusting each of the test stencil layers 20A during assembly of the light box.
- the reference datum 80A includes a reference element 81A and has at least one reference pattern 82A, each of which is disposed at a different position of the reference element 81A.
- the position of each of the reference patterns 82A at the reference member 81A is first determined by optical calculation, and then each of the reference patterns 82A is cast by laser engraving.
- each of the reference patterns 82A is independent of each other, that is, there is no mutual interference between each of the reference patterns 82A.
- the type and material of the reference member 81A may not be limited.
- the reference member 81A may be implemented as a square metal piece such as a steel sheet. It will be understood by those skilled in the art that the reference pattern 82A provided on the reference element 81A and the test pattern 21A provided on the test stencil layer 20A are of the same type and size, thereby being assembled and adjusted.
- the test pattern 21A provided on the test stencil layer 20A can coincide with the reference pattern 82A provided on the reference element 81A at the position and inclination of each of the test stencil layer 20A. It can also be understood that, in the process of assembling the light box, only the pattern of the camera module, the test pattern 21A provided on the test stencil layer 20A, and the portion provided on the reference member 81A.
- the reference patterns 82A are coincident to be able to determine the test mark The position and inclination of the layer 20A.
- the test machine 90A includes at least one positioning pin 91A, and the reference member 81A of the reference reference 80A is provided with at least one first positioning through hole 811, each of the test machine 90A.
- the positioning pins 91A are respectively passed through and held by each of the first positioning through holes 811 of the reference member 81A, thereby fixing the reference reference 80A to the testing machine 90A. In this way, It is possible to prevent the reference base 80A from being displaced during the assembly of the light box.
- step 5320 the test stencil layer 20A is fixed to the second mounting portion 70A to form a single stencil 150A, as shown in FIG. 54C. It is worth mentioning that between the test stencil layer 20A and the second mounting portion 70A, it can be fixed by hot melt adhesive to avoid fixing the test stencil layer 20A and the second mounting portion 70A. At the same time, a phenomenon of mutual misalignment occurs between the test stencil layer 20A and the second mounting portion 70A.
- step 5320 can also be completed between the steps 5310, so that the single standard 150A is formed first, and then The reference datum 80A is formed again, and the reference datum 80A is fixed to the test machine 90A.
- Step 5330 The first mounting portion 60A is placed overlaid and fixed to the reference member 81A of the reference datum 80A as shown in FIG. 54D. It is worth mentioning that the first mounting portion 60A is provided with at least one second positioning channel 62A, and each of the second positioning channels 62A of the first mounting portion 60A is associated with each of the reference elements 81A. Each of the mounting passages 61A corresponds to each of the positioning pins 91A of the testing machine 90A simultaneously passing through and holding each of the first ones of the reference members 81A in the step 5330. The channel 811A and each of the second positioning channels 62A of the first mounting portion 60A are positioned.
- Step 5340 The single plate 150A is mounted in each of the mounting channels 61A of the first mounting portion 60A to form the test plate 110A, as shown in FIG. 54E. Specifically, after the first mounting portion 60A is overlapped and fixed to the reference member 81A, each of the mounting passages 61A of the first mounting portion 60A corresponds to each of the reference members 81A.
- the reference pattern 82 the single plate 150A is placed on the mounting channel 61A of the first mounting portion 60A, and adjusts the position of the single plate 150A and the first mounting portion 60A
- the test pattern 21A provided on the test stencil layer 20A is overlapped with the reference pattern 82 provided on the reference element 81A, and the single stencil 150A and the first mounting portion are subsequently connected.
- the inner wall of the mounting passage 61A is formed of 60A.
- Step 5350 Fix at least two of the test stencils 110A to the light box housing 300A as shown in FIG. 54F.
- the layer spacing of adjacent test templates 110A is different.
- the layer spacing of adjacent test labels 110A is from One end portion of the light box case 300A gradually increases or decreases toward the other end portion.
- Step 5360 disposing the light source 40A on the light box housing 300A to form the light box, and the light generated by the light source 40A is radiated through each of the stereo test labels 100A to illuminate each of the The stereo test plate 100A is as shown in Fig. 54G.
- the present invention also provides a method of assembling a light box, wherein the assembling method comprises the following steps:
- test stencil layers 20A in a depth direction in a light box housing 300A, wherein each of the test stencil layers 20A has at least one test pattern 21A, and any one of the test labels
- the test pattern 21A of the layer 20A does not overlap with the test pattern 21A of the other test stencil layer 20A in the depth direction;
- a light source 40A is disposed in the light box housing 300A, and light generated by the light source 40A is radiated through each of the test stencil layers 20A.
- step (i) includes the steps of:
- test plate 110A includes at least one of the test plate layers 20A;
- At least two of the test labels 110A are disposed overlapping the light box housing 300A.
- the method includes the steps of:
- a reference datum 80A is provided, wherein the reference datum 80A includes a reference element 81A and has at least one reference pattern 82A, each of the reference patterns 82A being respectively disposed at a different position of the reference element 81A;
- a first mounting portion 60A is disposed overlapping the reference member 80, and each mounting channel 61A of the first mounting portion 60A corresponds to each of the reference patterns 82A;
- Each of the test stencil layers 20A is disposed in each of the mounting channels 61A of the first mounting portion 60A, and the test patterns 21A provided in each of the test stencil layers 20A are correspondingly disposed.
- the method further includes the steps of:
- a reference datum 80A is provided, wherein the reference datum 80A includes a reference element 81A and has at least one reference pattern 82A, each of the reference patterns 82A being respectively disposed at a different position of the reference element 81A;
- test stencil layers 20A is mounted on a second mounting portion 70A to form a single standard plate 150A;
- Each of the single-plate blanks 150A is disposed in each of the mounting channels 61A of a first mounting portion 60A, and the test patterns 21A provided in each of the test-label layers 20A are correspondingly disposed on the The reference pattern 82A of the reference element 81A is formed to form the test plate 110A.
- the method includes the steps of:
- test pattern 21A provided in the test stencil layer 20A and the reference pattern 82A disposed on the reference element 81A are obtained by the camera module, and the test pattern 21A acquired by the camera module When the image of the reference pattern 82A overlaps, the second mounting portion 70A and the first mounting portion 60A are connected.
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Abstract
本发明公开一灯箱、一立体测试标版和一调整装置及其应用,其中所述立体测试标版提供具有不同深度的测试图案,在摄像装置被测试时,所述摄像装置仅需要被移动一步或者不被移动就能够获得具有不同深度信息的图像,从而实现对所述摄像装置的测试和调整。
Description
本发明涉及光学系统领域,特别涉及一灯箱、立体测试标版和调整装置及其应用,其中通过所述立体测试标版在不同深度提供的测试图案,使待测试摄像装置最少仅需要被移动一步或甚至不被移动,就可以获得具有不同深度信息的图像,以实现对所述摄像装置进行快速的测试和调整。
随着电子、通讯等高新技术产业智能化的快速发展,用于获取图像和视频信息的摄像系统作为人类视觉延伸的载体,逐渐成为了核心器件被广泛地应用到各种产品中,例如,在智能手机、平板电脑、笔记本电脑、PC终端、个人数字助理、交通工具、医疗器械、监控设备的诸多产品中,都被至少配置了一颗摄像装置,这些摄像装置被植入到这些产品的生态系统中,形成摄像系统,用于获取周围环境的图像或视频等信息。而且,这些产品的快速发展,也同时成就了蓬勃发展的摄像装置行业。
为了能够提供更好的用户体验以及延伸产品的深度,越来越多的电子设备开始朝向小型化、微型化以及高成像质量方向发展,基于这种趋势,摄像装置的体积也在被不断的压缩。因此,如何能够在尽可能地缩小摄像装置的体积的基础上,使其具有高质量的成像品质以及确保摄像装置的产品良率成为了技术研究和突破的方向。
通常,摄像装置包括摄像模块和图像传感器以及其他的诸如镜座等构件,在将摄像模块与图像传感器封装的过程中,摄像模块本身的像面倾斜、摄像装置的其他构件存在的倾斜公差以及封装工艺引起的一定程度的倾斜,都会导致图像传感器与摄像模块在一定范围但不固定的倾斜和偏移,最终致使整个摄像系统的成像质量都会受到严重的衰减。所以在对摄像装置的摄像模块与图像传感器进行封装操作之前,对摄像模块的像面与图像传感器的接受面的倾斜调整是必要而且必须要进行的工艺。
这个过程主要包括测试和调整两个阶段,传统的对光学系统进行测试的方式包括正投影(标版使用透射式和反射式)和逆投影(标版使用透射式),这两种方式的测试原理均是靠移动摄像模块或标版来改变被测摄像模块部分与标版或图像传感器的相对位置,从而,获得成像质量与离焦曲线的函数关系,再通过计算各目标位置的焦点位置和倾斜矢量,来测试摄像模块部分与标版或图像传感器的相对倾斜度,并依据该相对倾斜度进行调整。然而,现有技术的依靠上述原理对光学系统进行测试的装置存在着很大的技术缺陷,以至于严重地影响了对摄像装置进行测试和调整的效率。具体地说,传统的用于测试摄像装置的设备需要逐步移动部件来描绘出完整的成像质量与离焦曲线的函数关系,需要花费较长的时间;在对摄像装置进行测试的过程中,当摄像模块部分的像面倾斜角度较大时,为了采集到目标像更高的焦点位置,需要更大距离地移动摄像模块部分,在摄像模块部分朝向图像传感器移动的过程中有可能撞到传统的设备的机构件或脱胶等情况的出现,以至于导致测试和矫正失败;传统的设备的体积大,需要占用较多的空间,以至于在对摄像装置进行测试时所花费的成本大。
另外,按照传统的对摄像装置进行测试和调整的原理制作的测试设备,其需要预留较大的空间以保证摄像装置的移动范围,使得传统的测试设备体积大、而且结构复杂,并且在利用传统的测试设备对摄像装置进行操作的过程,需要消耗较多的时间,致使摄像装置的生产成本大,无法被广泛地应用。因此,可以大幅度提高摄像装置的成像质量,减少测试及调整设备的体积和生产成本,并且提高对摄像装置的对焦及调整像面倾斜的方法的探索和测试设备的研制,成为业界亟需解决的问题。
另外,在测试设备对摄像模组进行测试的过程中还需要使用到灯箱,传统的用于提供测试标版的灯箱包括一张测试标版,在摄像模组获得测试标版的测试图案的过程中,需要沿着垂直于测试标版的方向移动摄像模组的位置改变摄像模组与测试标版的距离,以使摄像模组在不同的位置分别获得具有不同深度的测
试图案的影响,这样的方式,不仅导致对摄像模组的测试效率低下,而且还会影响对摄像模组的测试结果。传统的用于测试标版的灯箱的组装流程是通过测试平台将每层测试标版的测试图案对应于各坐标点,然后在每层测试标版的层与层之间通过测试图像点亮,进行调节各层测试标版的相应位置并进行固定。这样的组装方式具有较多的缺陷,首先,同一层测试标版的每个测试图案之间没有基准坐标,导致测试标版的精度不够,会影响对摄像模组的测试效果,例如测试标版可能会出现倾斜的现象;其次,每层测试标版之间没有对应基准,导致各层测试标版之间的调整比较困难,影响了对测试机台的调整速度,而且传统的灯箱的这种组装放大会耗费较长的实际,在实际的操作过程中,通过对传统的灯箱的组装过程所耗费的时间进行统计,会发现传统的灯箱需要至少两个人相互配合并耗费两天的时间才能够完成。
发明内容
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,其中通过所述立体测试标版在不同深度提供的测试图案,使待测试摄像装置最少仅需要被移动一步或甚至不被移动,就可以获得具有不同深度信息的图像,以实现对所述摄像装置进行快速的测试和调整。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,其中所述立体测试标版在对所述摄像装置进行测试时,仅需要最少被移动一次所述摄像装置,就能够获得所述摄像装置的成像质量以及相关数据参数的函数关系,并在后续基于所述函数关系对所述摄像装置的摄像模块和图像传感器的相对位置及倾斜度进行调整,从而,减少工序。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,其中所述立体测试标版允许拍摄一次,就能够同时对所述摄像装置的焦距与像面倾斜进行分析,从而,得出相应的数据用于支持后续的调整。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,其中所述立体测试标版能够提供不同的景物深度,相对于传统的测试设备来说,所述立体测试标版能够使得测试设备的体积可以被设计成足够小,从而,节省了由于需要预留供所述摄像装置的动作空间而带来的设计余量,以尽可能地减少测试设备的体积。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,其中所述立体测试标版能够符合所述摄像装置日益小型化和微型化的趋势,并在同时解决了在调整所述摄像装置的摄像模块与图像传感器的相对位置时,导致其碰触到测试设备的底部机构间所带来的传统的工艺瓶颈的问题。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,其中所述立体测试标版能够在不同的平面,同一平面的不同位置形成至少一个所述测试图案,从而,所述摄像装置可以在静态的状态下采集到处于所述立体测试标版的不同深度的所述测试图案,以在后续对所述摄像装置进行解像力分析。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,所述立体测试标版可以根据不同的测试需要来被更换,并且所述立体测试标版的规格还可以被调整,从而,方便使用。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,其中所述立体测试标版包含诸如透射式、反射式、投影式、变焦式等任何可以实现深度信息并保证图像对比度的方式。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,其中所述立体测试标版的所述测试图案可以包括诸如三角形、圆形、椭圆形、黑白线对、十字形或星形等单一或者组合后的任何可以计算所述摄像装置的成像质量的图案,从而,方便所述立体测试标版被选择和制备。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,所述测试图案在辅助进行所述摄像装置的测试并对其进行解像力分析时,不会产生更多的噪音,从而,确保测试的准确度。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,通过组合所述测试图案之后形成的所述立体测试标版,可以得到更多反映所述摄像装置的解像力的数据,以在后续确保对所述摄像装置进行调整的顺利进行。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,在同一个视场范围内,各层的所述测试图案被所述摄像装置的摄像模块捕获时,在所述摄像装置的摄像模块的像面不会出现相互
干涉的现象,从而,确保测试结果的可靠性和测试的精度。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,其中所述立体测试标版可以是十字线立体测试标版,并且所述十字线立体测试标版具有不同空间深度的测试图案,例如十字线测试图案,所述十字线测试图案是对各种误差敏感度很低的图案,这样,在所述十字线立体测试标版辅助对摄像装置测试时,能够保证每所述十字线测试图案与介质层的对比度,以方便摄像装置获取每所述十字线测试图案的信息。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,所述十字线立体测试标版允许在更小的空间范围内布置更多的所述十字线测试图案,以保证每所述十字线测试图案在投影到像方之后,能够在像面上占据更多的像素点,以利于后续的测试结果。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,因为所述十字线立体测试标版允许在更小的空间范围内布置更多的所述十字线测试图案,从而使得所述十字线立体测试标版的组合式样得到了极大的丰富,这样,摄像装置获取的所述十字线立体测试标版的图像能够反应更多的摄像装置的解像力数据,以支持后续的测试结果。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,其中所述十字线立体测试标版的每所述十字线测试图案的布局能够基于摄像装置的测试需要被方便地调整,以减少对摄像装置测试时的时间消耗,并进一步降低所述十字线立体测试标版的使用成本。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,每所述十字线测试图案的图形简单,制作方便,并且具有极强的适用性,以利于降低所述摄像装置的测试成本和制造成本。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,其中所述十字线立体测试标版允许使用任何可以表征摄像装置的解像力的评价方法,来计算摄像装置的焦点位置和像面倾斜,例如MTF(Modulation Transfer Function),以拓展起应用范围。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,在所述方法中,利用景物深度原理对所述摄像装置的摄像模块和图像传感器的关系进行测试和调整,相对于传统的测试方法来说,所述方法减少了工序以及测试和调整所述摄像装置所耗损的时间。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,在所述方法中,通过建立沿着深度方向布置且相互不重叠的多层测试图案,来辅助所述摄像装置一次性获得具有不同景物深度信息的图像,完成测试和调整过程。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,其中所述方法最少只需要拍摄一张图像,就能够获得并描述所述摄像模块与所述图像传感器的成像质量和离焦曲线的函数关系,从而,简化测试步骤。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,在所述方法中,通过较少次数的移动(例如移动1至3次,或甚至不动)所述摄像装置,就能够获得所述摄像装置的成像质量参数和其他的参数数据,并且在后续所述调整装置基于所述参数能够对所述摄像模块与所述图像传感器的相对位置进行调整,包括焦距和像面倾斜。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,其中所述方法能够同时对所述摄像装置的焦距和像面倾斜进行测试,并同步地对其进行调整,从而,大幅度提升效率。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,通过所述方法,能够尽可能地减少诸如所述摄像装置的公差、封装工艺的公差给所述摄像装置的成像质量造成的影响,以提升所述摄像装置的成像品质。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,根据所述方法制成的所述调整装置,因为在对所述摄像装置进行测试的过程中,允许较少次数地移动所述摄像装置,所以所述调整装置不需要预留较大的允许所述摄像装置的动作空间,从而,能够减少所述调整装置的体积和成本。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,其设计简单、加工方便,并且具有极强的适用性,因此,能够直接提升所述摄像装置的产品良率,从而节约成本。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,其中所述灯箱的每个测
试标版层使用同一参考基准作为组装和调整的依据,从而保证所述灯箱在被组装之后的精度。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,其中所述参考基准设有至少一基准图案,每个所述测试标版层分别具有至少一个所述测试图案,在组装所述灯箱时,使每个所述测试标版层的至少一个所述测试图案对应于所述参考基准的至少一个所述基准图案,通过这样的方式,每个所述测试标版层的所述参考基准一致,从而保证所述灯箱在被组装之后的精度。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,其利用每个所述测试标版层自身的所述测试图案作为组装和调整所述灯箱的每个所述测试标版层的位置以及倾斜度的依据,这样的方式不仅可以保证所述灯箱在被组装之后的精度,而且在后续还能够保证利用所述灯箱测试所述摄像模组时的测试精度。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,其中在组装所述灯箱的过程中,用于提供所述基准图案的所述参考基准还可以固定每个所述测试标版层,以使每个所述测试标版层形成一测试标版,从而保证每个所述测试标版层在被调整之后不会出现位置偏移或者倾斜的情况。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,其中先将每个所述测试标版层在调整之后制作成所述立体测试标版,然后再将多个所述测试标版重叠地安装于一灯箱壳体而形成所述灯箱的方式,使得所述灯箱的组装效率较传统的灯箱得到了大幅度的提升。
本发明的一个目的在于提供一灯箱、一立体测试标版和一调整装置及其应用,其中每个所述测试标版层的位置及倾斜度在被确定时使用同一个所述参考基准的方式,使得所述灯箱的组装效率较传统的灯箱得到了大幅度的提升。
为了达到上述目的,本发明提供一种立体测试标版,其包括沿着深度方向设置的多个测试标版层,每所述测试标版层分别具有至少一测试图案,并且任意一个所述测试标版层的所述测试图案与其他所述测试标版层的所述测试图案沿着所述深度方向不重叠地设置。
根据本发明的一个优选的实施例,设定待测试一摄像装置的后焦拟合精度参数为a,焦距参数为EFL,设定所述立体测试标版的位置参数为h,任一层所述测试标版层的位置参数为hj;其中,所述立体测试标版的位置满足函数表达式:a=-((EFL*(-hj)/(EFL-hj)-(EFL*(-h)/(EFL-h)))。
根据本发明的一个优选的实施例,设定所述测试标版层的层数参数为n,设定所述摄像装置的公差参数为t,移动步数参数为s;其中,所述测试标版层的层数满足函数表达式:n=f(t,a,s)。
根据本发明的一个优选的实施例,设定所述测试图案的布局参数为d,任一层所述测试标版层的任一所述测试图案到该层所述测试标版层的中心距离为dij,设定所述摄像装置的测试视场参数为F;其中,所述测试图案的布局满足函数表达式:dij=f(F,hij,EFL)。
根据本发明的一个优选的实施例,设定所述测试图案的尺寸参数为L,任一个所述测试图案的尺寸参数为Lij,所述立体测试标版的参数公差为t’,介质折射率参数为n’,软件计算所允许的弥散斑参数为s’,设定所述摄像装置的测试视场容许范围参数为△F;其中,所述测试图案的尺寸满足函数表达式:Lij=f(dij,△F,t’,n’,s’)。
根据本发明的一个优选的实施例,所述测试图案的形状选自方形、三角形、圆形、椭圆形、十字线、黑白线对、星形中的一种或者多种的组合。
根据本发明的一个优选的实施例,所述立体测试标版具有2-100层所述测试标版层,各层所述测试标版层具有1-1000个所述测试图案。
根据本发明的一个优选的实施例,所述立体测试标版选自透射式、反射式、投影式或者变焦成像式中的一种形成。
根据本发明的一个优选的实施例,所述立体测试标版还包括至少一承载元件,每所述承载元件叠合且间隔地设置;其中,每所述承载元件分别形成每所述测试标版层,每所述测试图案选择性地设置或形成于所述测试标版层。
根据本发明的一个优选的实施例,每所述承载元件由透明材料制成。
本发明还提供一种立体测试标版,所述立体测试标版具有沿着深度方向布置并且不重叠的多层测试图案,相邻两层所述测试图案互相间隔地排列,从而形成所述立体测试标版。
根据本发明的一个优选的实施例,所述立体测试标版还包括多个承载元件,所述承载元件叠合且间隔地设置;其中,每所述承载元件分别形成一测试标版层,每所述测试图案位于每所述测试标版层。
根据本发明的一个优选的实施例,所述测试图案的形状选自方形、三角形、圆形、椭圆形、十字线、黑白线对、星形中的一种或者多种的组合。
根据本发明的一个优选的实施例,所述立体测试标版具有2-100层所述测试图案,各层所述测试图案具有1-1000个所述测试图案。
本发明还提供一种立体测试标版的设计方法,其中所述方法包括步骤:
(A)通过统计被测试摄像装置的参数,确定所述立体测试标版的位置;和
(B)根据所述摄像装置的精度要求,确定所述测试标版层的层数、和设计所述测试标版层的测试图案的布局。
根据本发明的一个优选的实施例,在所述步骤(B)中,进一步包括步骤:确定所述测试图案的尺寸。
根据本发明的一个优选的实施例,在所述步骤(A)中,设定待测试一摄像装置的后焦拟合精度参数为a,焦距参数为EFL,设定所述立体测试标版的位置参数为h,任一层所述测试标版层的位置参数为hj;其中,所述立体测试标版的位置满足函数表达式:a=-((EFL*(-hj)/(EFL-hj)-(EFL*(-h)/(EFL-h)));其中,根据计算得出的h的值,确定所述立体测试标版的位置。
根据本发明的一个优选的实施例,在所述步骤(A)中,设定所述测试标版层的层数参数为n,设定所述摄像装置的公差参数为t,移动步数参数为s;其中,所述测试标版层的层数满足函数表达式:n=f(t,a,s);和
设定所述测试图案的布局参数为d,任一层所述测试标版层的任一所述测试图案到该层所述测试标版层的中心距离为dij,设定所述摄像装置的测试视场参数为F;其中,所述测试图案的布局满足函数表达式:dij=f(F,hij,EFL);其中,根据计算得出的n和dij的值,确定所述测试标版层的层数和所述测试图案的布局。
根据本发明的一个优选的实施例,设定所述测试图案的尺寸参数为L,任一个所述测试图案的尺寸参数为Lij,所述立体测试标版的参数公差为t’,介质折射率参数为n’,软件计算所允许的弥散斑参数为s’,设定所述摄像装置的测试视场容许范围参数为△F;其中,所述测试图案的尺寸满足函数表达式:Lij=f(dij,△F,t’,n’,s’);其中,根据计算得出的Lij的值,确定所述测试图案的尺寸。
根据本发明的一个优选的实施例,所述测试图案的形状选自方形、三角形、圆形、椭圆形、十字线、黑白线对、星形中的一种或者多种的组合。
本发明还提供一种立体测试标版的形成方法,其中所述方法包括步骤:
(a)确定至少一预设区域于一测试标版层,在每所述预设区域分别设置至少一测试图案;和
(b)将多个所述测试标版层叠合地设置,并使得每所述测试标版层的所述测试图案与其他所述测试标版层的所述测试图案错位地布置,以形成所述立体测试标版。
根据本发明的一个优选的实施例,在所述步骤(b)中,藉由光线依次到达每所述测试标版层,增强每所述测试图标与该层所述测试标版层的对比度。
根据本发明的一个优选的实施例,到达每所述测试标版层的光线为均匀光线。
本发明还提供一种立体测试标版的形成方法,其中所述方法包括步骤:将一投影源设置于一光源的光线辐射路径,其中当所述光源产生光线时,所述投影源得以在一预设空间内沿着深度方向形成不重叠的多层测试图案,并且相邻两侧功能测试图案互相间隔地排列,以形成所述立体测试标版。
根据本发明的一个优选的实施例,所述投影源设置于所述光源与所述预设空间之间。
根据本发明的一个优选的实施例,所述投影源包括一平面标版和一变焦透镜组,其中所述平面标版设置于所述光源与所述变焦透镜组之间,以使得所述光源产生的光线,得以将所述平面标版的信息透过所述变焦透镜组辐射至所述预设空间。
根据本发明的一个优选的实施例,所述平面标版还具有至少一测试目标,其中每所述测试目标得以经过所述变焦透镜组投影至所述预设空间,以形成每所述测试图案。
根据本发明的一个优选的实施例,所述测试图案的形状选自方形、三角形、圆形、椭圆形、十字线、黑白线对、星形中的一种或者多种的组合。
本发明还提供一种十字线立体测试标版的形成方法,其中所述方法包括沿着深度方向形成的多层十字线测试图案,并且每所述十字线测试图案投影到像方后形成的图像互相不重叠。
根据本发明的一个优选的实施例,在上述方法中,还包括步骤:
确定至少一预设区域于一测试标版层,在每所述预设区域分别设置至少一个所述十字形测试图案;和
将多个所述测试标版层叠合地设置,并使得每所述测试标版层的所述十字形测试图案错位地布置,以形成所述十字形立体测试标版。
根据本发明的一个优选的实施例,在上述方法中,还包括步骤:通过统计被测试摄像装置的参数和精度要求,分别确定所述十字线立体测试标版的位置和每所述测试标版层的层数。
根据本发明的一个优选的实施例,设定所述摄像装置的后焦拟合精度参数为a,焦距参数为EFL,设定所述十字线立体测试标版的位置参数为h,任一层所述测试标版层的位置参数为hj;其中,所述十字线立体测试标版的位置满足函数表达式:a=-((EFL*(-hj)/(EFL-hj)-(EFL*(-h)/(EFL-h)));其中,根据h的值,确定所述十字线立体测试标版的位置;和
设定所述测试标版层的层数参数为n,设定所述摄像装置的公差参数为t,移动步数参数为s;其中,所述测试标版层的层数满足函数表达式:n=f(t,a,s);其中,根据n的值,确定所述测试标版层的层数。
根据本发明的一个优选的实施例,在上述方法中,还包括步骤:确定所述十字线测试图案的布局。
根据本发明的一个优选的实施例,设定所述十字线测试图案的布局参数为d,任一层所述测试标版层的任一所述十字线测试图案到该层所述测试标版层的中心距离为dij,设定所述摄像装置的测试视场参数为F;其中,所述十字线测试图案的布局满足函数表达式:dij=f(F,hij,EFL);其中,根据dij的值,确定所述十字线测试图案的布局。
根据本发明的一个优选的实施例,设定所述十字线测试图案的尺寸参数为L,任一个所述十字线测试图案的尺寸参数为Lij,所述十字线立体测试标版的参数公差为t’,介质折射率参数为n’,软件计算所允许的弥散斑参数为s’,设定所述摄像装置的测试视场容许范围参数为△F;其中,所述十字线测试图案的尺寸满足函数表达式:Lij=f(dij,△F,t’,n’,s’);其中,根据Lij的值,确定所述十字线测试图案的尺寸。
根据本发明的一个优选的实施例,在上述方法中,还包括步骤:在一摄像装置的像面位置预排列十字形图案,然后将所述十字形图案通过投影的方式形成沿着所述深度方向布置的每所述十字形测试图案,以形成所述十字形立体测试标版。
根据本发明的一个优选的实施例,在上述方法中,还包括步骤:将一投影源设置于一光源的光线辐射路径,其中当所述光源辐射光线时,所述投影源得以在一预设空间内形成沿着所述深度方向布置的每所述十字形测试图案,以形成所述十字形立体测试标版;其中所述投影源包括十字形测试目标。
根据本发明的一个优选的实施例,所述投影源包括一平面标版和一变焦透镜组,其中所述平面标版设置于所述光源与所述变焦透镜组之间,以使得所述光源产生的光线,得以将所述平面标版的信息透过所述变焦透镜组投射至所述预设空间。
根据本发明的一个优选的实施例,每层所述十字形测试图案的尺寸相同或不同。
本发明还提供一种十字线立体测试标版,其包括沿着深度方向设置的多个测试标版层,每所述测试标版层具有至少一预设区域,每所述预设区域设有一个或多个十字线测试图案,并且每所述测试标版层的所述十字线测试图案与其他所述测试标版层的所述十字线测试图案沿着所述深度方向不重叠地布置。
根据本发明的一个优选的实施例,设定待测试一摄像装置的后焦拟合精度参数为a,焦距参数为EFL,设定所述十字线立体测试标版的位置参数为h,任一层所述测试标版层的位置参数为hj;其中,所述十字线立体测试标版的位置满足函数表达式:a=-((EFL*(-hj)/(EFL-hj)-(EFL*(-h)/(EFL-h)))。
根据本发明的一个优选的实施例,设定所述测试标版层的层数参数为n,设定所述摄像装置的公差参数为t,移动步数参数为s;其中,所述测试标版层的层数满足函数表达式:n=f(t,a,s)。
根据本发明的一个优选的实施例,设定所述十字线测试图案的布局参数为d,任一层所述测试标版层的任一所述十字线测试图案到该层所述测试标版层的中心距离为dij,设定所述摄像装置的测试视场参数为
F;其中,所述十字线测试图案的布局满足函数表达式:dij=f(F,hij,EFL)。
根据本发明的一个优选的实施例,设定所述十字线测试图案的尺寸参数为L,任一个所述十字线测试图案的尺寸参数为Lij,所述十字线立体测试标版的参数公差为t’,介质折射率参数为n’,软件计算所允许的弥散斑参数为s’,设定所述摄像装置的测试视场容许范围参数为△F;其中,所述十字线测试图案的尺寸满足函数表达式:Lij=f(dij,△F,t’,n’,s’)。
根据本发明的一个优选的实施例,每层所述十字形测试图案的尺寸相同或不同。
根据本发明的一个优选的实施例,每所述测试标版层选择有机玻璃、无机玻璃、透明显示屏的一种形成。
本发明还提供一种对一摄像装置进行测试的方法,所述摄像装置包括一摄像模块和一图像传感器,其中所述方法包括步骤:
(i)建立沿着深度方向具有不同景物深度的测试图案;
(ii)使所述摄像装置拍摄、并获取每所述测试图案的图像信息;以及
(iii)基于所述图像信息计算所述摄像模块的焦点位置、和所述摄像模块与所述图像传感器的倾斜和偏移矢量,以确定所述摄像模块与所述图像传感器的相对位置。
根据本发明的一个优选的实施例,在所述步骤(i)中,还包括步骤:提供包括沿着深度方向设置的多个测试标版层的一立体测试标版,每所述测试标版层分别具有至少一个所述测试图案,并且任意一个所述测试标版层的所述测试图案与其他所述测试标版层的所述测试图案沿着深度方向不重叠地设置。
根据本发明的一个优选的实施例,在所述步骤(i)中,还包括步骤:
根据统计被测试所述摄像装置参数,确定所述立体测试标版的位置;和
根据所述摄像装置的精度要求,确定所述测试标版层的层数、和设计所述测试标版层的所述测试图案的布局。
根据本发明的一个优选的实施例,在所述步骤(i)中,还包括步骤:确定所述测试图案的尺寸。
根据本发明的一个优选的实施例,在上述方法中,设定待测试一摄像装置的后焦拟合精度参数为a,焦距参数为EFL,设定所述立体测试标版的位置参数为h,任一层所述测试标版层的位置参数为hj;其中,所述立体测试标版的位置满足函数表达式:a=-((EFL*(-hj)/(EFL-hj)-(EFL*(-h)/(EFL-h)));其中,根据计算得出的h的值,确定所述立体测试标版的位置。
根据本发明的一个优选的实施例,在上述方法中,设定所述测试标版层的层数参数为n,设定所述摄像装置的公差参数为t,移动步数参数为s;其中,所述测试标版层的层数满足函数表达式:n=f(t,a,s);和
设定所述测试图案的布局参数为d,任一层所述测试标版层的任一所述测试图案到该层所述测试标版层的中旬距离为dij,设定所述摄像装置的测试视场参数为F;其中,所述测试图案的布局满足函数表达式:dij=f(F,hij,EFL);其中,根据计算得出的n和dij的值,确定所述测试标版层的层数和所述测试图案的布局。
根据本发明的一个优选的实施例,在上述方法中,设定所述测试图案的尺寸参数为L,任一个所述测试图案的尺寸参数为Lij,所述立体测试标版的参数公差为t’,介质折射率参数为n’,软件计算所允许的弥散斑参数为s’,设定所述摄像装置的测试视场容许范围参数为△F;其中,所述测试图案的尺寸满足函数表达式:Lij=f(dij,△F,t’,n’,s’);其中,根据计算得出的Lij的值,确定所述测试图案的尺寸。
根据本发明的一个优选的实施例,在所述步骤(c)中,设定每所述测试图案对应的解像力值参数为mtf(ij),设定每所述测试图案的形状参数为ω,每所述测试图案21的位置参数为(h,d);设定光源强度为s,其中,每所述测试图案对应的解像力值满足函数表达式:mtf(ij)=f(ω,h,d,s)。
根据本发明的一个优选的实施例,在上述方法中,每所述测试图案对应的解像力与离焦量的函数关系满足函数表达式:F0=F(v){mtf(01),mtf(02),mtf(03)…(tmf(0j)),Fj=F(v){mtf(i1),mtf(i2),mtf(i3)…mtf(ij)}。
根据本发明的一个优选的实施例,所述立体测试标版的成像质量的方式可以采用OTF,MTF,SFR,CTF或者TV line中的一种或几种。
根据本发明的一个优选的实施例,所述测试图案的形状选自方形、三角形、圆形、椭圆形、十字形、黑白线对、星形中的一种或者多种的组合。
根据本发明的一个优选的实施例,所述立体测试标版由透射式、反射式、投影式、变焦式中的一种形成。
本发明还提供一种对一摄像装置进行调整的方法,所述方法包括步骤:
(α)通过获取具有不同景物深度信息的立体图像,计算所述摄像装置的一摄像模块与一图像传感器的相对位置,并输出数据信息;和
(β)基于所述数据信息,执行对所述摄像模块与所述图像传感器的调整步骤。
根据本发明的一个优选的实施例,在所述步骤(α)中,还包括步骤:通过所述立体图像由同一函数关系计算所述摄像模块的焦距、和所述摄像模块与所述图像传感器的倾斜和偏移矢量。
根据本发明的一个优选的实施例,设定每所述测试图案对应的解像力值参数为mtf(ij),设定每所述测试图案的形状参数为ω,每所述测试图案21的位置参数为(h,d);设定光源强度为s,其中,每所述测试图案对应的解像力值满足函数表达式:mtf(ij)=f(ω,h,d,s)。
根据本发明的一个优选的实施例,在上述方法中,每所述测试图案对应的解像力与离焦量的函数关系满足函数表达式:F0=F(v){mtf(01),mtf(02),mtf(03)…(tmf(0j)),Fj=F(v){mtf(i1),mtf(i2),mtf(i3)…mtf(ij)}。
根据本发明的一个优选的实施例,在所述步骤(A)中,还包括步骤:
(α.1)建立沿着深度方向具有不同景物深度的测试图案;
(α.2)使所述摄像装置拍摄、并获取每所述测试图案的图像信息;以及
(α.3)基于所述图像信息计算所述摄像模块的焦点位置、和所述摄像模块与所述图像传感器的倾斜和偏移矢量,以确定所述摄像模块与所述图像传感器的相对位置。
本发明还提供一种调整装置,其包括:
一立体测试标版,其具有沿着深度方向布置并且不重叠的多层测试图案,相邻两层所述测试图案互相间隔地排列;其中所述摄像装置拍摄所述立体测试标版,以获得具有不同景物深度的图像;和
一调整单元,所述调整单元用于基于所述图像提供的数据信息执行对所述摄像装置的调整操作。
根据本发明的一个优选的实施例,所述立体测试标版还包括多个测试标版层,每所述测试标版层包括一个所述测试图案,并且任意一个所述测试标版层的所述测试图案与其他所述测试标版层的所述测试图案沿着所述深度方向不重叠地设置。
根据本发明的一个优选的实施例,所述测试图案的形状选自方形、三角形、圆形、椭圆形、十字形、黑白线对、星形中的一种或者多种的组合。
根据本发明的一个优选的实施例,所述立体测试标版由透射式、反射式、投影式、变焦式中的一种形成。
本发明还提供一用于测试摄像模组的灯箱,其包括:
一灯箱壳体;
一光源,所述光源设置于所述灯箱壳体;以及
多个测试标版层,每个所述测试标版层沿着深度方向设置于所述灯箱壳体,其中每个所述测试标版层分别具有至少一测试图案,并且任意一个所述测试标版层的所述测试图案与其他的所述测试标版层的所述测试图案在所述深度方向不重叠,并且所述光源产生的光线透过每个所述测试标版层辐射。
根据本发明的一个优选的实施例,所述灯箱还包括至少两第一安装部,每个所述第一安装部分别设有至少一安装通道,每个所述测试标版层的周缘分别连接于所述第一安装部的形成每个所述安装通道的内壁,每个所述第一安装部重叠地设置于所述灯箱壳体。
根据本发明的一个优选的实施例,所述灯箱还包括至少两第一安装部和多个第二安装部,每个所述第一安装部分别设有至少一安装通道,每个所述测试标版层分别设置于每个所述第二安装部,每个所述第二安装部分别连接于所述第一安装部的形成每个所述安装通道的内壁,每个所述第一安装部重叠地设置于所述灯箱壳体。
根据本发明的一个优选的实施例所述灯箱壳体的内壁形成至少两支撑台,每个所述第一安装部分别设
置于至少一个所述支撑台。
根据本发明的一个优选的实施例,所述的灯箱还包括多个定位元件,所述灯箱壳体还设有至少两定位通道,每个所述定位通道分别对应于每个所述支撑台,设置于所述支撑台的所述第一安装部的侧壁对应每个所述定位通道,所述定位元件的端部从所述灯箱壳体的外部经由所述定位通道延伸至所述灯箱壳体的内部并顶紧所述第一安装部。
根据本发明的一个优选的实施例,所述的灯箱还包括一第三安装部,所述第三安装部重叠地设置于所述光源,并且所述第三安装部的侧壁对应所述定位通道,所述定位元件的端部从所述灯箱壳体的外部经由所述定位通道延伸至所述灯箱壳体的内部并顶紧所述第三安装部。
根据本发明的一个优选的实施例,所述灯箱壳体包括一第一承载部和设置于所述第一承载部的一第二承载部,并且在所述第一承载部和所述第二承载部的连接位置形成一支撑台阶,每个所述第一安装部重叠地设置于所述第一承载部,所述光源设置于所述支撑台阶。
根据本发明的一个优选的实施例,所述灯箱壳体是方形或者圆形。
根据本发明的一个优选的实施例,相邻所述测试标版层的层间距从所述灯箱壳体的一端向另一端渐次增加或者渐次减小。
根据本发明的一个优选的实施例,所述测试标版层的层数是2-100。
根据本发明的一个优选的实施例,所述测试图案选自方形、三角形、圆形、椭圆形、十字形、黑板线对、星形组成的形状组。
本发明还提供一组装灯箱的方法,其中所述灯箱用于测试一摄像模组,其中所述组装方法包括步骤:
(i)沿着深度方向重叠地设置多个测试标版层于一灯箱壳体,其中每个所述测试标版层分别具有至少一测试图案,并且任意一个所述测试标版层的所述测试图案与其他的所述测试标版层的所述测试图案在所述深度方向不重叠;和
(ii)设置一光源于所述灯箱壳体,并使所述光源产生的光线穿过每个所述测试标版层辐射。
根据本发明的一个优选的实施例,在所述步骤(i)中,进一步包括步骤:
提供一立体测试标版,其中所述立体测试标版包括沿着所述深度方向重叠地设置的多个所述测试标版层;和
安装至少一个所述立体测试标版于所述灯箱壳体。
根据本发明的一个优选的实施例,在所述步骤(i)中,进一步包括步骤:
提供一测试标版,其中所述测试标版包括至少一个所述测试标版层;和
重叠地设置至少两个所述测试标版于所述灯箱壳体。
根据本发明的一个优选的实施例,在上述方法中,进一步包括步骤:
提供一参考基准,其中所述参考基准包括一基准元件和具有至少一基准图案,每个所述基准图案分别设于所述基准元件的不同位置;
重叠地设置一第一安装部于所述基准元件,并使所述第一安装部的每个安装通道分别对应于每个所述基准图案;以及
将每个所述测试标版层分别设置于所述第一安装部的每个所述安装通道,并且使设于每个所述测试标版层的所述测试图案对应设于所述基准元件的所述基准图案,以形成所述测试标版。
根据本发明的一个优选的实施例,在上述方法中,进一步包括步骤:
提供一参考基准,其中所述参考基准包括一基准元件和具有至少一基准图案,每个所述基准图案分别设于所述基准元件的不同位置;
分别安装每个所述测试标版层于一第二安装部,以形成一单体标版;以及
将每个所述单体标版分别设置于一第一安装部的每个安装通道,并且使设于每个所述测试标版层的所述测试图案对应设于所述基准元件的所述基准图案,以形成所述测试标版。
根据本发明的一个优选的实施例,在上述方法中,进一步包括步骤:
分别设置一摄像模组和所述基准元件于一测试机台,其中所述基准元件位于所述摄像模组的感光路径;和
通过所述摄像模组获取设于所述测试标版层的所述测试图案和设于所述基准元件的所述基准图案,当所述摄像模组获取的所述测试图案与所述基准图案的图像重合时,连接所述第二安装部和所述第一安装部。
根据本发明的一个优选的实施例,在上述方法中,通过热熔胶连接所述第一安装部和所述第二安装部。
根据本发明的一个优选的实施例,设于所述基准元件的所述基准图案与设于所述测试标版的所述测试图案的类型一致。
根据本发明的一个优选的实施例,所述测试图案选自方形、三角形、圆形、椭圆形、十字形、黑板线对、星形组成的形状组。
图1是摄像装置的摄像模块与图像传感器的关系示意图。
图2是根据本发明的立体测试标版的参数确定过程的流程示意图。
图3是根据本发明的测试标版层的测试图案的布局示意图。
图4、图5和图6分别是根据本发明的立体测试标版的第一个优选实施例的示意图。
图7、图8、图9和图10分别是根据本发明的立体测试标版的第二个优选实施例的示意图。
图11、图12、图13和图14分别是根据本发明的立体测试标版的第三个优选实施例的示意图。
图15、图16和图17分别是根据本发明的立体测试标版的第四个优选实施例的示意图。
图18是根据本发明的立体测试标版的测试图案被实施为十字线时制成的十字线立体测试标版的设计流程示意图。
图19是根据本发明的上述优选实施例的侧视示意图。
图20是摄像装置的成像视场跨度和其图像解像力值的关系示意图。
图21说明所述测试图案的适宜被选择的类型。
图22是根据本发明的上述优选实施例的测试标版层的十字线测试图案的布局情况示意图。
图23是根据本发明的上述优选实施例的十字线立体测试标版的第一种实现方式示意图。
图24是根据本发明的上述优选实施例的十字线立体测试标版的第二种实现方式示意图。
图25是根据本发明的上述优选实施例的十字线立体测试标版的每所述十字线测试图案在摄像装置的像方形成的图案示意图。
图26是根据本发明的上述优选实施例的十字线立体测试标版的第三种实现方式示意图。
图27是根据本发明的上述优选实施例的十字线立体测试标版的第四种实现方式示意图。
图28是根据本发明对摄像装置进行测试和调整的流程示意图。
图29是根据本发明的立体测试标版的布局立体示意图。
图30是根据本发明的摄像装置在调整之前不同位置的测试图案的解像力与像距关系示意图。
图31是根据本发明的摄像装置在调整之前不同位置的测试图案在像面成像示意图。
图32是根据本发明的摄像装置在调整之后不同位置的测试图案的解像力与像距关系示意图。
图33是根据本发明的摄像装置在调整之后不同位置的测试图案在像面成像示意图。
图34是根据本发明利用立体测试标版对摄像装置进行调整的过程示意图。
图35是根据本发明的摄像装置的景深和焦距的关系示意图。
图36是根据本发明的调整装置的框图示意图。
图37是根据本发明的立体测试标版的设计方法流程示意图。
图38是根据本发明的立体测试标版的形成方式流程示意图。
图39是根据本发明的测试流程示意图。
图40是根据本发明的调整流程示意图。
图41是根据本发明的第一个优选实施例的灯箱的剖视示意图。
图42是根据本发明的第二个优选实施例的灯箱的剖视示意图。
图43是根据本发明的上述优选实施例的灯箱的组装流程示意图。
图44A至图44E分别是根据本发明的上述优选实施例的灯箱的组装过程示意图。
图45是根据本发明的上述优选实施例的参考基准的立体示意图。
图46是根据本发明的上述优选实施例的参考基准设置于测试机台的示意图。
图47A和图47B是根据本发明的上述优选实施例的调整测试标版层时测试标版层与参考基准的过程示意图。
图48是根据本发明的第三个优选实施例的灯箱的立体示意图。
图49是根据本发明的上述优选实施例的灯箱的分解示意图。
图50是根据本发明的上述优选实施例灯箱的剖视示意图。
图51是根据本发明的上述优选实施例的灯箱的一个变形实施方式的立体示意图。
图52是根据本发明的上述优选实施例的灯箱的另一个变形实施方式的剖视示意图。
图53是根据本发明的上述优选实施例的灯箱的组装流程示意图。
图54A至图54G是根据本发明的上述优选实施例的组装过程示意图。
以下描述用于揭露本发明以使本领域技术人员能够实现本发明。以下描述中的优选实施例只作为举例,本领域技术人员可以想到其他显而易见的变型。在以下描述中界定的本发明的基本原理可以应用于其他实施方案、变形方案、改进方案、等同方案以及没有背离本发明的精神和范围的其他技术方案。
本发明提供一种立体测试标版100,以用于辅助对一摄像装置10进行测试,其中所述摄像装置10包括一摄像模块11和一图像传感器12以及其他可能的诸如镜座等构件,其中所述成像模块11和所述图像传感器12被封装后形成所述摄像装置10。在对所述摄像模块11与所述图像传感器12进行封装时,由于所述摄像模块11成像时存在像面倾斜,同时所述摄像装置10的其他构件之间存在着倾斜公差以及受到封装工艺的精度的限制,需要对所述摄像装置10的焦距以及所述摄像模块11与所述图像传感器12的像面倾斜进行测试,以获得相应的数据,并且在后续基于所述数据对所述摄像模块11和所述图像传感器12之间的倾斜关系进行调整,从而,确保所述摄像装置10在被封装完成之后的成像品质。图1示出了未经调整的所述摄像模块11与所述图像传感器12之间不匹配的一种情况,在这个示例中,由于所述摄像模块11与所述图像传感器12之间存在着些许的倾斜,也就是说所述摄像模块11的光轴不垂直于所述图像传感器12的感光面以及两者光轴没有对齐,导致藉由所述摄像模块11捕获的物体反射的光线不能够被所述图像传感器12均匀地接受,从而,导致所述摄像装置10成像模糊。本技术领域的技术人员应当理解,所述摄像模块11与所述图像传感器12还具有除图1示出的示例之外的其他不匹配的情况,例如,所述摄像模块11本身的像面倾斜等。
如图3至图16所示,本发明提供的所述立体测试标版100包括沿着深度方向设置的多个测试标版层20,每所述测试标版层20分别具有至少一测试图案21,从而,使得所述测试图案21形成不同深度的景物信息。在对所述摄像装置10进行测试的过程中,藉由所述摄像模块11捕获不同深度的载有每所述测试图案21的信息的光线,然后被所述图像传感器12接收并进行进一步的光电转化,并且在后台生成与所述摄像模块11和所述图像传感器12的倾斜相关的一讯号,并在后续基于所述讯号对所述摄像模块11和所述图像传感器12之间的倾斜关系进行调整。
值得一提的是,所述立体测试标版100的相关参数需要基于所述摄像装置10的类型进行设定,例如所述立体测试标版100的所述测试标版层20的层数、间距、以及所述立体测试标版100的位置、每所述测试图案21的形状、尺寸、位置、密度等等。
如图2所示是所述立体测试标版100的设计流程图,具体地说,当待测试的所述摄像装置10的类型被确定之后,需要先对所述摄像装置10的相关测试参数进行测定,包括所述摄像装置10的测试视场、焦距、测试距离、后焦拟合精度需求等参数。为了方便对所述摄像装置10与所述立体测试标版100的参数之间的关系进行描述,设定所述摄像装置10的测试视场参数为F,相应地,设定所述摄像装置10的焦距参数为EFL,设定所述摄像装置10的后焦拟合精度参数为a,其中后焦拟合精度a由拟合需求决定,并且拟合需求取决于软件处理的需求。进一步设定所述立体测试标版100的测试距离为Z,其中Zj表示第j层所述测试标版层20的测试距离,并且j的取值范围为j>=2,例如,Z1表示第一层所述测试标版层20的测试距离,
其中第一层是指所述立体测试标版100最为远离所述摄像模块11的所述测试标版层20,并且Z1由所述摄像装置10的类型初始确定时决定,也就是说,当待测试的所述摄像装置10的类型被确定之后,第一层所述测试标版层20的测试距离被同步确定。进一步地,当所述摄像装置10的相关参数被测定之后,基于所述参数,可以对所述立体测试标版100的位置以及所述测试标版层20的层数进行计算。具体地说,设定所述立体测试标版100的位置参数为h,则本技术领域的技术人员应当理解,各层所述测试标版层20的位置参数为hj,例如,hj表示第j层所述测试标版层20的位置,并且j的取值范围为j>=2;其中,所述测试标版层的位置的函数表达式满足:a=-((EFL*(-hj)/(EFL-hj)-(EFL*(-h)/(EFL-h)))。基于上述函数表达式,可以通过计算hj的值,来确定所述立体测试标版100的每所述测试标版层20的位置。
更进一步地,设定所述测试标版层20的层数参数为n,所述摄像装置10公差参数为t,其中所述摄像装置10公差t由制程决定,其包含但不限于被测所述摄像装置10的高度、倾斜、偏移等公差;进一步设定所述摄像装置10的移动步数参数为s,值得一提的是,被测所述摄像装置10的移动步数s>=1,也就是说,在利用所述立体测试标版100对所述摄像装置10进行测试的过程中,最少仅需要移动一次所述摄像装置10,就可以获得相应的参数数据;其中所述测试标版层20的层数的函数表达式满足:n=f(t,a,s)。基于上述函数表达式,可以通过计算n的值,来确定所述测试标版层20的层数。值得一提的是,在另外的示例,也可能不需要移动所述摄像装置10就可以获得相应参数。
相应地,在确定所述立体测试标版100的位置与所述测试标版层20的层数之后,可以继续确定所述测试图案21的形状、位置和尺寸。在本发明的一个实施例中,所述测试图案21的形状不受限制,其可以选自方形、三角形、圆形、椭圆形、十字形、黑白线对、星形图形中的一种或者多种的组合。值得一提的是,所述测试图案21的形状还可以是其他任何能够用来计算所述摄像装置10的成像质量的图标,包括实体图标以及通过色彩来区分的图标。
作为示例,如图3所示,设定所述立体测试标版100的所述测试图案21的布局参数为d,其中所述测试图案21的布局参数d代表所述测试图案21的密度,因此,任一所述测试标版层20的任一所述测试图案21到该层所述测试标版层20的中心距离被设定为参数dij,其中i表示所述测试图案21在该层所述测试标版层20上的位置,j表示该层所述测试标版层20的层数,例如,dij表示第j层所述测试标版层20的第i个所述测试图案21的布局;其中所述测试图案21的布局的函数表达式满足:dij=f(F,hij,EFL),值得一提的是,测试视场F由待测的所述摄像装置10决定,hij可以通过所述立体测试标版100的位置的函数表达式来计算获得。基于上述函数表达式,可以通过计算dij的值,来确定所述测试图案21的布局。即是说,基于上述函数表达式,可以确定每所述测试标版层20的所述测试图案21的布局密度,值得一提的是,在一个实施例中,各个所述测试标版层20的所述测试图案21的密度可以一致,也可以不一致。
进一步地,如图3所示,设定每所述测试图案21的尺寸参数为L,相应地,任一所述测试图案21的尺寸参数为Lij,例如,Lij表示第j层所述测试标版层20的第i个所述测试图案21的尺寸。代表这个所述测试图案21到该层所述测试标版层20的中心点的距离为dij。进一步设定测试视场跨度容许范围参数为△F,所述立体测试标版100的制作参数公差为t’,所述立体测试标版100的介质折射率参数为n’,软件计算所允许的弥散斑参数为s’,其中所述测试图案21的尺寸的函数表达式满足:Lij=f(dij,△F,t’,n’,s’)。基于上述函数表达式,可以通过计算Lij的值,来确定所述测试图案21的尺寸。
值得一提的是,计算所述测试图案21的尺寸Lij的过程为所述立体测试标版100的各项参数与其制作公差进行平衡的过程,并且在当所述测试图案21的尺寸Lij的值确定之后,所述立体测试标版100的制作公差同步确定。还值得一提的是,当所述立体测试标版100的各项参数确定之后,可以基于这些参数,制作所述立体测试标版100。
相应地,如图37所示,本发明提供一种立体测试标版100的设计方法,其中所述方法包括步骤:
(A)通过统计被测试摄像装置10的参数,确定所述立体测试标版100的位置;以及
(B)根据所述摄像装置10的精度要求,确定所述立体测试标版100的测试标版层的层数、和设计所述测试标版层的测试图案的布局。
具体地说,在所述步骤(A)中,当待测试的所述摄像装置10的类型被确定之后,首先需要对所述摄像装置10的相关参数进行统计,其中包括所述摄像装置10的测试视场、焦距、后焦拟合精度等参数,本
技术领域的技术人员应当理解,根据不同的使用需要,还可以进一步对待测试的所述摄像装置10的其他参数进行统计,以获得所述摄像装置10的综合参数数据,从而,设定出更佳的所述立体测试标版100的方案。
进一步地,在所述步骤(B)中,进一步包括步骤:确定所述测试图案21的尺寸。
优选地,在所述步骤(A)中,设定待测试所述摄像装置10的后焦拟合精度参数为a,焦距参数为EFL,设定所述立体测试标版100的位置参数为h,任一层所述测试标版层20的位置参数为hj;其中,所述立体测试标版100的位置满足函数表达式:a=-((EFL*(-hj)/(EFL-hj)-(EFL*(-h)/(EFL-h)));其中,根据计算得出的hj的值,确定所述立体测试标版100的各层测试标版层20的位置。
优选地,在所述步骤(A)中,设定所述测试标版层20的层数参数为n,设定所述摄像装置10的公差参数为t,移动步数参数为s;其中,所述测试标版层20的层数满足函数表达式:n=f(t,a,s);以及设定所述测试图案21的布局参数为d,任一层所述测试标版层20的任一所述测试图案21到该层所述测试标版层20的中心距离为dij,设定所述摄像装置10的测试视场参数为F;其中,所述测试图案21的布局满足函数表达式:dij=f(F,hij,EFL);其中,根据计算得出的n和dij的值,确定所述测试标版层20的层数和所述测试图案21的布局。
优选地,设定所述测试图案21的尺寸参数为L,任一个所述测试图案21的尺寸参数为Lij,所述立体测试标版100的参数公差为t’,介质折射率参数为n’,软件计算所允许的弥散斑参数为s’,设定所述摄像装置100的测试视场容许范围参数为△F;其中,所述测试图案21的尺寸满足函数表达式:Lij=f(dij,△F,t’,n’,s’);其中,根据计算得出的Lij的值,确定所述测试图案21的尺寸。
相应地,任意一层所述测试标版层20的每所述测试图案21与其他层所述测试标版层20的每所述测试图案21沿着所述深度方向不重叠地设置,这样,当所述摄像模块11捕获每所述测试图案21时,靠近所述摄像模块11的每所述测试图案21不会遮挡远离所述摄像模块11的每所述测试图案21所反射或透射的光线。例如,在本发明的一个特定的实施例中,所述测试标版层20的所述测试图案21呈倒梯形设置,也就是说,越是靠近所述摄像模块11的所述测试图案21距该层所述测试标版层20的中心的距离越小于远离所述摄像模块11的所述测试图案21距该层所述测试标版层20的中心的距离,如图4所示,并且通过这样的方式,每所述测试标版层20的每所述测试图案21都能够被所述摄像模块11捕获,并形成具有深度信息的图像。
即是说,所述立体测试标版100具有沿着深度方向布置并不重叠的多层所述测试图案21,相邻所述测试图案21互相间隔地排列,从而,形成所述立体测试标版100。也就是说,在本发明的一个特定的实施例中,每所述测试标版层21需要由载体来承载每所述测试图案21形成;而在本发明的另外一个实施例中,每所述测试图案21还可以通过投影的方式形成。
如图4、图5和图6所示是根据本发明第一优选实施例的立体测试标版100及其应用过程示意图。所述立体测试标版100包括沿着深度方向设置的每所述测试标版层20,其中每所述测试标版层20分别具有至少一个所述测试图案21,并且任意一个所述测试标版层20的每所述测试图案21与其他所述测试标版层20的每所述测试图案21沿着所述深度方向不重叠地设置。进一步地,每所述测试图案21与每所述测试标版层20具有不同的物理特性,以使得每所述测试图案21能够容易被所述摄像模块11识别并捕获,例如,每所述测试图案21与每所述测试标版层20可以具有不同的对比度。
作为优选,每所述测试标版层20由透明的材料形成,这样,可以尽可能地减少每所述测试标版层20的介质折射率,从而,任意一层所述测试标版层20的每所述测试图案21都可以无差别地被所述摄像模块11识别和捕获。也就是说,任意一层所述测试标版层20的每所述测试图案21对应的光线都可以无耗损地穿过其他的所述测试标版层20被所述摄像模块11捕获,从而,使得所述摄像装置10能够获得具有深度信息的所述立体测试标版100的图像。
如图4所示,所述立体测试标版100采用透射式的原理来对所述摄像装置10进行测试,具体地说,在所述立体测试标版100的上部设置一光源40,也就是说,在对所述摄像装置10进行测试时,所述立体测试标版100位于所述光源40与所述摄像模块10之间,这样,所述光源40产生的均匀的光线能够依次穿过每所述测试标版层20,并进而被所述摄像模块11捕获。在这个过程中,所述光源40的光线在穿过每所述测试标版层20时,都能够同比例地增加每所述测试标版层20与该层所述测试标版层20的每所述测试图案
21之间的对比度,从而,使得每所述测试图案21能够更容易被所述摄像模块11识别和捕获。
如图5和图6分别是所述立体测试标版100的俯视图和侧视图,通过这两个视图,本技术领域的技术人员能够很容易地理解每所述测试标版层20的每所述测试图案21之间的诸如位置等布局关系。
相应地,在藉由这种方式的测试过程中,首先让所述光源40产生均匀的光线,这些均匀的光线会依次穿过每所述测试标版层20,并用于增强每所述测试图案21与所述测试标版层20之间的对比度。值得一提的是,当所述光源40产生的光线穿过每所述测试标版层20时,其起到的作用一致,即无差别地增强所述测试标版层20与该层所述测试标版层20的每所述测试图案21之间的对比度。这样,当藉由所述摄像模块11捕获该光线时,承载有每所述测试图案21信息的光线能够被所述图像传感器12所接受,并进行进一步的光电转化。
相应地,如图7至图10所示是根据本发明第二优选实施例的立体测试标版100A及其应用过程示意图。所述立体测试标版100A包括沿着深度方向设置的每所述测试标版层20A,其中每所述测试标版层20A的每所述测试图案21A与其他所述测试标版层20A的每所述测试图案21A沿着所述深度方向不重叠地设置。进一步地,每所述测试图案21A与每所述测试标版层20A具有不同的物理特性,以使得每所述测试图案21A能够容易被所述摄像模块11识别并捕获,例如,每所述测试图案21A与每所述测试标版层20A可以具有不同的对比度。
进一步地,如图7所示,所述立体测试标版100A采用反射式的原理对所述摄像装置10进行测试,具体地说,在所述立体测试标版100A的下部设置至少一光源40A,例如,在本发明的一个特定的实施例中,所述光源40A可以设置两处或者更多,以使得所述光源40A产生的光线能够均匀地穿过每所述测试标版层20A而被测试图案21A反射。可以理解的是,在对所述摄像装置10进行测试时,所述立体测试标版100位于每所述光源40A与所述摄像模块11上方,而每所述光源40A环绕所述摄像模块11设置,本领域的技术人员应当理解,每所述光源40A与所述摄像模块11之间的距离和位置关系,可以基于不同的测试需要来被调整,其并不会限制本发明的内容和范围。如所述光源40A和所述摄像模块11可以位于所述立体测试标版100A的侧方,而不是下方。
每所述光源40A产生的光线可以均匀地依次穿过每所述测试标版层20A,以增强每所述测试标版层20A与该层所述测试标版层20A的每所述测试图案21之间的对比度,从而,使得每所述测试图案21A能够更容易被所述摄像模块11识别和捕获。
如图8和图9分别是所述立体测试标版100A的俯视图和侧视图,通过这两个视图,本技术领域的技术人员能够很容易地理解每所述测试标版层20A的每所述测试图案21A之间的诸如位置等布局关系。
值得一提的是,图7所示的本发明的这个具体的实施例与图4所示的本发明的实施例的区别在于:在图4所示的实施例中,所述光源40产生的光线自所述立体测试标版100的上部依次辐射至下部,最终被所述摄像模块11捕获;而在图7所示的实施例中,每所述光源40A产生的光线自所述立体测试标版100A的下部依次辐射至上部,用来增强每所述测试标版层20A与每所述测试图案21A之间的对比度。
在本发明的一个实施例中,每所述测试标版层20A可以由实体材料制成,也可以通过投影的方式在空间内形成,例如,在图10所提供的实施例中,所述立体测试标版100A还可以包括至少一承载元件30A,所述承载元件30A叠合且间隔地设置,并且每所述承载元件30A分别形成每所述测试标版层20A。值得一提的是,相邻所述承载元件30A的间距决定了相邻所述测试标版层20A之间的间距,而且每所述承载元件30A的材料和厚度直接影响了所述立体测试标版100A的介质折射率,因此,在选择每所述承载元件30A的材料和厚度时,需要考虑到所述立体测试标版100A的介质折射率对所述立体测试标版100A本身的性能的影响。更值得一提的是,每所述承载元件30A由透明的材料制成,这样,无论是采用透射式还是反射式的方式来使用所述立体测试标版100A时,每所述测试标版层20A的每所述测试图案21A都可以无差别地被所述摄像模块11识别和捕获,从而,确保测试结果的精确性。
进一步地,每所述测试图案21A可以设置或者形成于每所述承载元件30A,以分别在所述测试标版层20A布置深度方向不重叠的所述测试图案21A。具体地说,在一个实施例中,所述测试图案21A可以被设置于每所述承载元件30A的至少一预设区域,并且所述预设区域的数量、尺寸和形状等参数根据上述计算所述测试图案21A的参数的函数表达式可以通过计算获得,这样,可以使得每所述测试图案21A的特性于
每所述承载元件30A的特性具有明显的区别,以方便每所述测试图案21A在后续被所述摄像模块11识别和捕获。
在本发明的另外一个实施例中,可以首先在每所述承载元件30A上通过上述方式确定每所述预设位置,然后通过诸如物理或化学等处理手段来改变每所述承载元件30A在每所述预设位置的物理特性,从而,使得每所述承载元件30A的每所述预设区域的物理特性于其他区域的物理特性具有明显的区别,从而,在每所述预设位置形成每所述测试图案21A。当然,本技术领域的技术人员应当理解,还可以有其他的多种方式在每所述承载元件30A形成的每所述测试标版层20A上形成每所述测试图案21A。
相应地,如图38所示,本发明还提供一种立体测试标版100A的形成方法,所述方法包括步骤:
(a)确定至少一预设区域于一测试标版层20A,在每所述预设区域分别设置至少一测试图案21A;以及
(b)将多个所述测试标版层20A叠合地设置,并使得每所述测试标版层20A的所述测试图案21A与其他测试标版层20A的所述测试图案21A错位地布置,以形成所述立体测试版。
优选地,在所述步骤(b)中,藉由光线依次经过每所述测试标版层20A,以增强每所述测试图标21A与该层所述测试标版层20A的对比度。
进一步地,在上述方法一个实施例中,所述立体测试标版100A位于所述光源40A和所述摄像装置10之间,以使得所述光源40A产生的光线依次经过每所述测试标版层20A再到达所述摄像装置10。
进一步地,在上述方法一个实施例中,将至少一个所述光源40A与所述摄像装置10设置于所述立体测试标版100A的同侧,以使得所述光源40A产生的光线会被所述测试图案21A反射。
值得一提的是,经过每所述测试标版层20A的光线为均匀光线。更值得一提的是,每所述预设区域的数量、尺寸和形状等参数可以根据上述计算所述测试图案21A的参数的函数表达式通过计算获得。
如图11至图14所示,本发明采用投影式的原理来形成所述立体测试标版100B,相对于图4和图7所阐述的本发明的具体实施方式来说,本发明的这个具体的实施例采用投影的方式来形成,也就是说,在这个实施例中,所述立体测试标版100B可以不需要所述承载元件30A来承载每所述测试图案21B。
作为示例,如图11所示,所述立体测试标版100B包括一光源40B以及一投影源50B,其中所述投影源50B设在所述光源40B投射的路径上,也就是说,所述光源40B所产生的光线得以经过所述投影源50B并投射出去,从而,在预设空间可以产生具有深度信息的图像,以用于后续的所述摄像装置10B的测试。
相应地,本发明还可以提供一种立体测试标版100B的形成方法,所述方法包括步骤:将所述投影源50B设置于所述光源40B产生的光线所辐射的路径,其中当所述光源40B产生光线时,所述投影源50B的设置,使得在所述预设空间投影出沿着深度方向布置并不重叠的多层测试图案21B,相邻两层所述测试图案21B互相间隔地排列,从而,形成所述测试标版。如图12所示,所述光源40B与所述投影源50B被分别设置于用于形成所述立体测试标版100B的所述预设空间的侧部,并且所述投影源50B位于所述光源40B与所述预设空间之间,以使得所述光源40B产生的光线能够将所述投影源50B的信息投影至所述预设空间内形成具有多层所述测试图案21B的所述立体测试标版100B。
在这个实施例中,在利用测试设备对所述摄像装置10进行测试时,所述立体测试标版100B的每所述测试图案21B形成于所述预设空间内,其以空气作为介质层,因此,尽可能地减少介质层的折射率对测试结果的影响,从而确保测试精度,并且采用投影式的方式形成所述立体测试标版100B所带来的另一个有益成果是所述立体测试标版100B的体积能够被进一步地缩小。
如图13和图14分别是投影形成的所述立体测试标版100B的俯视图和侧视图,通过这两个视图,本技术领域的技术人员能够很容易地理解每所述测试图案21B的诸如位置等布局关系。
如图15、图16和图17所示是采用变焦式原理来对所述摄像装置10进行测试,在本发明的这个实施例中,所述立体测试标版100C包括一光源40C以及一投影源50C,其中所述投影源50C设在所述光源40C辐射的路径上,也就是说,所述光源40C所产生的光线得以经由所述投影源50C辐射,从而,在预设空间可以产生具有深度信息的图像,以用于后续的所述摄像装置10的测试。
作为示例,如图15所示,所述光源40C与所述投影源50C被分别设置于用于形成所述立体测试标版100C的所述预设空间的上部,并且所述投影源50C位于所述光源40C与所述预留空间之间,以使得所述
光源40C产生的光线能够将所述投影源50C的信息投影至所述预留空间内形成具有多层所述测试图案21C的所述立体测试标版100C。
进一步地,所述投影源50C还包括一平面标版51C以及一变焦透镜组52C,其中所述平面标版51C设置于所述光源40C与所述变焦透镜组52C之间,并且所述平面标版51C进一步具有至少一测试目标511C,以使得所述光源40C投射的光线能够将每所述测试目标511C经过所述变焦透镜组52C在所述预留空间内形成所述立体测试标版100C。值得一提的是,所述测试目标511C的尺寸、位置和数量等参数得以基于所述立体测试标版100C的不同需求来进行设定。
如图16和图17分别是投影形成的所述立体测试标版100C的俯视图和侧视图,通过这两个视图,本技术领域的技术人员能够很容易地理解每所述测试图案21C的诸如位置等布局关系。
如图18所示是根据本发明提供的所述立体测试标版100D的一个具体的实施方式,其中所述立体测试标版100D的所述测试图案21D被优选为十字线测试图案21D,从而形成一十字线立体测试标版。具体地说,所述十字线立体测试标版包括沿着深度方向设置的多个测试标版层20D,每所述测试标版层20D具有至少一预设区域,每所述预设区域内设有一个或多个所述十字线测试图案21D,通过这样的方式,在所述十字线立体测试标版辅助对所述摄像装置10进行测试时,可以得到更佳的测试结果。
进一步地,每所述测试标版层20D的所述十字线测试图案21D与其他所述测试标版层20D的所述十字线测试图案21D沿着所述深度方向不重叠地布置,这样,当所述十字线立体测试标版的每所述十字线测试图案21D在投影到像方后形成的图像,不会因为重叠而导致出现互相干涉的现象,从而,在基于所述图像对所述摄像装置进行图像解像力分析时,不会产生更多的噪点,以此,来确保对所述摄像装置10的测试精度。
一般情况下,如图20所示,所述摄像装置10的其中一个性质表现为,随着所述摄像装置10的成像视场跨度的增加,其图像解像力的值也随之降低。所述摄像装置10的这一性质要求在对其进行图像解像力分析时,其取样范围必须被定义的尽可能地小,以便于控制测试精度。但是,本技术领域的似乎人员应当注意,尽管上述的这种方式可以使得由于取样的视场跨度范围过大造成的所述摄像装置10的图像解像力的误差会减小,但是其会增加每所述测试图案投影到像方后出现相互重叠干涉的可能性,因此,在对所述十字线立体测试标版的每所述测试图案进行设计的过程中,必须选择合适的图案形状来同时减少成像后的干涉风险和由于视场范围跨度过大带来的误差。
如图21所示,本发明列举了几种可能被选择为所述测试图案的图案形状,当然,本技术领域的技术人员应当明白,在图21中所列举的所述测试图案的形状仅为举例性说明其可能的类别。
因此,在本发明的这个优选的实施例中,为了避免干涉现象的出现,又保证所述测试图案21D在投影到像方之后能够占有足够多的像素点,在所述测试图案21D的尺寸特定的情况下,所述测试图案21D的形状被优选为所述十字线测试图案21D和一字线测试图案。也就是说,在确保所述测试图案在所述预设区域内的密度时,所述十字线测试图案21D和所述一字线测试图案在投影到像方之后形成的图像不会容易相互重叠和不会出现干涉的现象,从而,便于后续对所述摄像装置10D进行图像解像力分析,而且因为所述十字线测试图案21D和所述一字线测试图案还允许在更小的空间范围内布置更多的图案,从而能够丰富所述立体测试标版的组合式样。
更多地,尽管所述十字线测试图案21D和所述一字线测试图案都能够保证所述立体测试标版在对所述摄像装置10进行图像解像力分析时产生的噪音更少,但是在这个过程中,必须要考虑到所述测试图案在所述摄像装置10的子午和弧矢两个方向的成像,也就是说,当所述立体测试标版在辅助进行所述摄像装置10的图像解像力分析时,每所述测试图案投影到像方的图像优选地在所述摄像装置10的子午和弧矢两个方向延伸,因此,在本发明的这些特定的实施例中,所述一字线测试图案投影到像方后形成的图像只能够在所述摄像装置10的一个方向进行延伸,而所述十字线测试图案21D投影到像方后形成的图像能够在所述摄像装置10的子午和弧矢两个方向进行延伸,才能够满足对所述摄像装置10的测试需要。从而,通过在更小的空间范围内可以布置更多的所述十字线测试图案21D,使得所述摄像装置10拍摄所述十字线立体测试标版后得到的图像才能够更多的反应所述摄像装置10的图像解像力的情况。
随后,在下述的这个实施例和许多附加的实施例中,会对所述十字线立体测试标版的设计原理和形成
方法等进一步的阐述,以便于让本技术领域的技术人员能够更加清晰和准确地理解本发明的内容。然而,本技术领域的技术人员应当注意,本发明的某些特定的实施例可以在没有特定的具体细节公开的情况下被实施,这些细节可以包括但不限于本技术领域的通用理论和技术,而这些并不能被视为没有完全公开。
作为示例,如图18示出了所述十字线立体测试标版的设计流程示意图。具体地说,所述十字线立体测试标版的诸如位置、所述十字线测试图案21D的布局等参数受限于所述摄像装置10的类型,也就是说,在本发明中,当所述摄像装置10的类型被确定之后,可以通过测定所述摄像装置10的相关参数,来计算所述十字线立体测试标版的参数数据,值得一提的是,需要测定的所述摄像装置10的参数包括但不限于所述摄像装置10的测试视场、焦距、测试距离和后焦拟合精度等。
在接下来的描述中,当完成对所述摄像装置10的参数的测定后,会通过计算来确定所述十字线立体测试标版的尺寸、层数等。
具体地说,设定所述摄像装置10的测试视场参数为F,相应地,焦距参数为EFL,后焦拟合精度参数为a,其中后焦拟合精度a由拟合需求决定,并且拟合需求取决于软件处理的需求。进一步设定所述十字线立体测试标版的测试距离为Z,其中Zj表示第j层所述测试标版层20D的测试距离,并且j的取值范围为j>=2,例如,Z1表示第一层所述测试标版层20D的测试距离,其中第一层所述测试标版层20D是指所述十字线立体测试标版最为远离所述摄像模块11的所述测试标版层20D,并且Z1由所述摄像装置10D的类型初始确定时决定,也就是说,当待测试的所述摄像装置10的类型被确定之后,第一层所述测试标版层20D的测试距离被同步确定。进一步地,当所述摄像装置10的相关参数被测定之后,基于所述参数,可以对所述十字线立体测试标版的位置以及所述测试标版层20D的层数进行计算。
更具体地说,设定所述十字线立体测试标版的位置参数为h,则本技术领域的技术人员应当理解,任一层所述测试标版层20D的位置参数为hj,例如,hj表示第j层所述测试标版层20D的位置,并且j的取值范围为j>=2;其中,所述测试标版的位置的函数表达式满足:a=-((EFL*(-hj)/(EFL-hj)-(EFL*(-h)/(EFL-h)))。
基于上述函数表达式,可以通过计算h的值,来确定所述十字线立体测试标版的每所述测试标版层20D的位置。
更进一步地,设定所述测试标版层20D的层数参数为n,所述摄像装置10公差参数为t,其中所述摄像装置10公差t由制程决定,其包含但不限于被测所述摄像装置10的高度、倾斜、偏移等公差;进一步设定所述摄像装置10的移动步数参数为s,值得一提的是,被测所述摄像装置10的移动步数s>=1,也就是说,在利用所述十字线立体测试标版对所述摄像装置10进行测试的过程中,最少仅需要移动一次所述摄像装置10,就可以获得相应的参数数据;其中所述测试标版层20D的层数的函数表达式满足:n=f(t,a,s)。基于上述函数表达式,可以通过计算n的值,来确定所述测试标版层20D的层数。
相应地,当所述十字线立体测试标版的位置和每所述测试标版层20D的层数被通过计算的方式确定之后,会继续对所述十字线测试图案21D的布局和尺寸进行确定。
作为示例,如图22所示,设定所述十字线立体测试标版的所述十字线测试图案21D的布局参数为d,其中所述十字线测试图案21D的布局参数d代表所述十字线测试图案21D的密度,因此,任一所述测试标版层20D的任一所述十字线测试图案21到该层所述测试标版层20D的中心距离被设定为参数dij,其中i表示所述十字线测试图案21在该层所述测试标版层20D上的位置,j表示该层所述测试标版层20D的层数,例如,dij表示第j层所述测试标版层20D的第i个所述十字线测试图案21D的布局;其中所述十字线测试图案21D的布局的函数表达式满足:dij=f(F,hij,EFL),值得一提的是,测试视场F由待测的所述摄像装置10决定,hij可以通过所述十字线立体测试标版的位置的函数表达式来计算获得。基于上述函数表达式,可以通过计算dij的值,来确定所述十字线测试图案21D的布局。即是说,基于上述函数表达式,可以确定每所述测试标版层20D的每所述十字线测试图案21D的布局密度,值得一提的是,在一个实施例中,每所述测试标版层20D的每所述十字线测试图案21D的密度可以一致,也可以不一致。
进一步地,如图22所示,设定每所述十字线测试图案21的尺寸参数为L,相应地,任一所述十字线测试图案21D的尺寸参数为Lij,其中对应地Lij代表这个所述十字线测试图案21D到该层所述测试标版层20D的中心点的距离为dij,例如,Lij表示第j层所述测试标版层20D的第i个所述十字线测试图案21D的尺寸。进一步设定测试视场跨度容许范围参数为△F,所述十字线立体测试标版的制作参数公差为t’,所述
十字线立体测试标版的介质折射率参数为n’,软件计算所允许的弥散斑参数为s’,其中所述十字线测试图案21D的尺寸的函数表达式满足:Lij=f(dij,△F,t’,n’,s’)。基于上述函数表达式,可以通过计算Lij的值,来确定所述十字线测试图案21D的尺寸。
值得一提的是,计算所述十字线测试图案21D的尺寸Lij的过程为所述十字线立体测试标版的各项参数与其制作公差进行平衡的过程,并且在当所述十字线测试图案21D的尺寸Lij的值确定之后,所述十字线立体测试标版的制作公差同步确定。还值得一提的是,当所述十字线立体测试标版的各项参数确定之后,可以基于这些参数,制作所示十字线立体测试标版。
还值得一提的是,由于所述摄像装置10的类型不同,使得各个类型的所述摄像装置10的一个诸如焦距、孔径值、成像范围以及所述图像传感器12的成像单元尺寸值等都有明显的区别,同时参考对所述摄像装置10进行测试时所要求的精度以及所述十字线立体测试标版距所述摄像装置10的距离的不同,来综合计算所述十字线立体测试标版的各项参数。
进一步地,在本发明的一个特定的实施例中,要求每所述十字线测试图案21D投影到像面后形成的图像保证其尺寸一致,例如每所述十字线测试图案21D投影到像面后形成的图像的线宽和线长都相同,所以,本技术领域的技术人员应当理解,所述十字线立体测试标版的不同空间范围的每所述十字线测试图案21D的线宽和线长都不同。
另外,在本发明的一个特定的实施例中,为了保证每所述十字线测试图案21D投影到像面后能够达到指定需要检测的视场范围,在设计每所述十字线测试图案21D的空间位置时,可以在像面的指定检测的视场范围内预先排列好每所述十字线测试图案21D投影的位置,然后再将其通过逆投影的方式投影到所述十字线立体测试标版上,这里,可以快速地在所述十字线立体测试标版的每所述测试标版层20D的位置确定每所述十字线测试图案21D的位置和尺寸。
在每所述十字线测试图案21D的位置和尺寸被确定之后,需要进一步分析会使得每所述十字线测试图案21D在像面上发生误差的因素,例如,用于形成每所述测试标版层20D的介质会使得所述十字线测试图案21D投影到像面之后的尺寸不一致、位置偏移等。基于上述引起每所述十字线测试图案21D在投影到像面后出现误差的原因以及程度,来确定所述十字线立体测试标版的每所述十字线测试图案21D与形成每所述测试标版层20D的介质的对比度。
值得一提的是,形成每所述测试标版层20D的介质可以是实体介质,也可以是气体介质。具体地说,如图19所示,当所述测试标版层20D选择由实体介质形成所述十字线立体测试标版时,实体介质可以被实施为有机或无机玻璃、透明显示屏或者表面反射率较大的物质,这样,可以确保每所述十字线测试图案21D与实体介质形成的每所述测试标版层20D的对比度;当所述测试标版层20D选择由气体介质形成所述十字线立体测试标版时,可以通过投影的方式在预设空间范围内来实现,但是应当注意,在本发明的不同的实施例中,可以选择不同的投影手段来形成所述十字线立体测试标版,例如,投影式、变焦成像式等,而这些都不能被视为对本发明的内容和范围的限制。
还值得一提的是,当所述十字线立体测试标版被设计完成之后,需要对所述十字线立体测试标版的应用进行测试和分析,当每所述十字线测试图案21D投影到像面上形成的图像能够满足测试需要,又不会因为重叠而出现干涉现象时,则表明对所述十字线立体测试标版的设计完成;当所述十字线测试图案21D投影到像面上形成的图像因为重叠而出现干涉现象时,则需要重新对公差进行计算,以重新设定所述十字线测试图案21D的诸如尺寸和密度等的布局。
相应地,本发明还提供一种十字线立体测试标版的形成方法,所述方法包括沿着深度方向形成多层十字线测试图案21D,并且每所述十字线测试图案21D投影到像方后形成的图像互相不重叠。
优选地,在上述方法还包括步骤:通过统计被测试所述摄像装置10的参数和精度要求,分别确定所述十字线立体测试标版的位置和所述测试标版层20D的层数。
具体地说,在计算所述十字线立体测试标版的位置时,可以设定所述摄像装置的后焦拟合精度参数为a,焦距参数为EFL,设定所述十字线立体测试标版的位置参数为h,任一层所述测试标版层的位置参数为hj;其中,所述十字线立体测试标版的位置满足函数表达式:a=-((EFL*(-hj)/(EFL-hj)-(EFL*(-h)/(EFL-h))),通过计算h的值,可以确定所述十字线立体测试标版的位置参数。
在计算所述测试标版层20D的层数时,可以设定所述测试标版层的层数参数为n,设定所述摄像装置的公差参数为t,移动步数参数为s;其中,所述测试标版层的层数满足函数表达式:n=f(t,a,s),通过计算n的值,可以确定所述测试标版层20D的层数。
优选地,在上述方法中,当所述十字线立体测试标版的位置和所述测试标版层20D的层数被确定之后,需要参考形成每所述测试标版层20D的介质等公差,来确定所述十字线测试图案21D的布局。
在本发明的一个实施例中,设定所述十字线测试图案21D的布局参数为d,任一层所述测试标版层20D的任一所述十字线测试图案到该层所述测试标版层20D的中心距离为dij,设定所述摄像装置10的测试视场参数为F;其中,所述十字线测试图案的布局满足函数表达式:dij=f(F,hij,EFL),通过计算dij的值,可以确定所述十字线测试图案21D的布局。
进一步设定所述十字线测试图案21D的尺寸参数为L,任一个所述十字线测试图案21D的尺寸参数为Lij,所述十字线立体测试标版的参数公差为t’,介质折射率参数为n’,软件计算所允许的弥散斑参数为s’,设定所述摄像装置10的测试视场容许范围参数为△F;其中,所述十字线测试图案21D的尺寸满足函数表达式:Lij=f(dij,△F,t’,n’,s’)。通过计算Lij的值,可以确定所述十字线测试图案21D的尺寸。
在本发明的另外的一个实施例中,在确定所述十字线测试图案21D的布局时,在所述摄像装置10的像面预先排列十字线图案,然后将所述十字线图案通过逆投影的方式投影到所述十字线立体测试标版,从而,在所述十字线立体测试标版形成具有不同深度的所述十字线测试图案21D。
值得一提的是,当所述十字线立体测试标版的参数被确定之后的形成过程中,可以确定至少一预设位置于所述测试标版层20D,并且在每所述预设区域分别设置至少一个所述十字线测试图案21D;以及将多个所述测试标版层20D叠合地设置,并使得每所述测试标版层20D的所述十字线测试图案21D与其他测试标版层20D的每所述十字线测试图案21D错位地布置,以使得每所述十字线测试图案21D在投影到像方之后形成的图像不会出现相互重叠而引起的干涉现象。
在本发明的一个实施例中,每所述十字线测试图案21D可以形成于每所述测试标版层20D的表面,例如,可以将预先制作好的每所述十字线测试图案21D附着于每所述测试标版层20D的表面,然后再将多层所述测试标版层20D按照逻辑顺序通过叠合的方式形成所述十字线立体测试标版。而在本发明的另外的一个实施例中,每所述十字线测试图案21D还可以形成于每所述测试标版层20D的内部,这样可以确保所述十字线立体测试标版在辅助进行所述摄像装置10的测试的过程中的可靠性。
如图23和图24所示,在利用所述十字线立体测试标版辅助对所述摄像装置10进行测试时,还可以在通过一光源40D来增加所述十字线测试图案21D与所述测试标版层20D的对比度,来使得每所述十字线测试图案21D的信息能够更加容易被所述摄像装置10获取。
具体地说,作为示例之一,如图23所示,所述光源40D设置于所述十字线立体测试标版的一侧以使得所述十字线立体测试标版能够位于所述光源40D与所述摄像装置10D之间,这样,所述光源40D产生的均匀的光线能够依次穿过每所述测试标版层20D,在这个过程中,所述光源40D产生的光线会同比例地增加每所述测试标版层20D与该层所述十字线立体测试图案21D之间的对比度,从而,使得每所述测试图案21D能够更容易被摄像模块11识别和捕获。
作为示例之二,如图24所示,所述光源40D设置于所述十字线立体测试标版的下部,应当注意,在这个实施例中,所述光源40D的数量可以多于一个,以使得所述光源40D产生的光线能够均匀地穿过所述测试标版层20D,并同比例地增加每所述测试标版层20D与该层所述十字线立体测试图案21D之间的对比度。与图23所示出的实施例采用透射式原理对所述摄像装置10的测试方式不同,图24所示出的实施例采用反射式的原理对所述摄像装置10进行测试。
如图25所示,是在对所述摄像装置10进行测试时,每所述十字线测试图案21D投影到像方之后形成的图像示意图,因此所述十字线立体测试标版的不同空间范围内的所述十字线测试图案21D的长度和线宽尺寸不同,所以,其投影到所述像方之后形成的图像尺寸一致,以便于对所述摄像装置10的图像解像力进行分析。
如图26和图27所示,在本发明的一些实施例中,其采用投影的方式来形成处于不同空间范围内的所述十字线测试图案21D。
具体地说,如图26所示,将一投影源50D设置于所述光源40D产生的光线的路径上,当所述光源40D发射光线时,得以将所述投影源50D投影到预设空间内形成沿着深度方向布置并不重叠的多层所述十字线测试图案21D,并且相邻所述十字线测试图案21D相互间隔地设置,这样,当每所述十字线测试图案21D投影到像方之后,不会出现相互重叠而导致干涉的现象的出现。进一步地,所述光源40D与所述投影源50D分别设置于用于形成所述十字线立体测试标版的所述预设空间的侧部,并且使得所述投影源50D位于所述光源40D与所述预设空间之间,以使得所述光源40D辐射的光线能够将所述投影源50D的信息投影到所述预设空间内,形成具有多层所述十字线测试图案21D的所述十字线立体测试标版。
如图27所示,所述投影源50D被设置在所述光源40D的路径上,并且所述光源40D与所述投影源50D均位于形成所述十字线立体测试标版的所述预设空间的上部。进一步地,所述投影源50D包括一平面标版51D以及一变焦透镜组52D,其中所述平面标版51D设置于光源40D与所述变焦透镜组52D之间,并且在所述平面标版51D上进一步具有至少一十字线测试目标511D,当所述光源40D辐射的光线能够将每所述测试目标511D通过所述变焦透镜组52D辐射至所述预设空间时,每所述测试目标511D得以在所述预设空间内形成具有不同深度的每所述十字线测试图案21D,从而,形成所述十字线立体测试标版。
值得一提的是,本技术领域的技术人员应当理解,所述十字线立体测试标版还可以由其他的方式来形成,上述在本文所列举的所述十字线立体测试标版仅作为示例,而并不能被视为对本发明的内容和范围的限制。
值得一提的是,在通过所述十字线立体测试标版对所述摄像装置10进行测试时,其成像质量的测试方式可以采用OTF(Optical Transfer Function,光学传递函数),MTF(Modulation Transfer Function,制传递函数),SFR(Spatial Frequency Response,空间频率响应),或者CTF(Contrast Transfer Function,对比度转换函数)中的一种或几种等任何可以表征所述摄像装置10的解像力的评价方式来进行,其中优选为MTF(Modulation Transfer Function)。当然,本技术领域的技术人员应当理解,在这个过程中,还可以通过其他的评价方式来对所述摄像装置10的成像质量进行评价和测试。
还值得一提的是,尽管本说明书描述的所述摄像装置10包括所述摄像模块11与所述图像传感器12,但是应当注意,所述摄像模块11与所述图像传感器12还包括其他的可能构件,因此,在本说明书的任何位置出现的所述摄像模块11与所述图像传感器12并不能被视为限制。例如,本技术领域的技术人员可以设想,所述摄像模块11包括镜头,以及可能还包括马达(附图未示出),所述图像传感器12可能还包括PCB板(附图未示出)等,因此,虽然本说明书描述了所述摄像装置10包括所述摄像模块11与所述图像传感器12,但是所述摄像模块11与所述图像传感器12并不能被视为所述摄像装置10的唯一实施例。
如图28至图35所示是根据本发明的一个优选实施例提供的用于对所述摄像装置10进行测试、调整的方法以及由所述方法结合相关的结构制成的一调整装置。在本发明中,所述测试方法基于景物深度原理对所述摄像装置10的所述摄像模块11与所述图像传感器12的包括焦点、倾斜等在内的相关位置的关系进行测试,相应地,在后续,所述调整方法能够基于测试的结果对所述摄像模块11与所述图像传感器12的相对位置进行调整,从而,使得所述摄像模块11与所述图像传感器12能够处于匹配的位置,以保证所述摄像装置10的成像品质。
如图36所示,所述调整装置包括一立体测试标版100、一调整单元200以及其他可能的构件如光源,其中基于景物深度的原理,所述立体测试标版100被设有不同景物深度的测试图案21,这样,在对所述摄像装置10进行测试时,所述摄像装置10最少仅需要拍摄一张所述立体测试标版100的图像就能够获得具有不同景物深度信息的图像。具体地说,所述立体测试标版100具有沿着深度方向布置并不会重叠的多层所述测试图案21,相邻两层所述测试图案21互相间隔地排列,其中当所述摄像装置10拍摄所述立体测试标版100的图像时,可以获得具有不同景物深度信息的图像。
在通过所述测试方法对所述摄像装置10进行测试之前,建立沿着深度方向具有不同景物深度的所述测试图案21是必要的步骤,并在后续通过所述摄像装置10对这些每所述测试图案21进行拍摄,以获得具有不同景物深度信息的图像。在本发明的这个特定的实施例中,可以通过建立所述立体测试标版100的方式来建立沿着深度方向具有不同景物深度的所述测试图案21。
具体地说,所述立体测试标版100包括沿着深度方向设置的多个测试标版层20,每所述测试标版层20
分别具有至少一个所述测试图案21,并且任意一个所述测试标版层20的所述测试图案21与其他所述测试标版层20的所述测试图案21沿着所述深度方向不重叠地设置。
在所述立体测试标版100的相关参数数据确定之后,本技术领域的技术人员应当理解,所述立体测试标版100的所述测试标版层20的层数为n=j,其中j的取值范围为:j>1。所述测试标版层20的层间距为:h1到hj-1,每所述测试图案21对应的物距为:U1到Uj,相应地,每所述测试图案21对应的像距为:V1到Vj。也就是说,在本发明中,不同层的所述测试标版层20的每所述测试图案21对应不同的物距和像距。进一步设定每所述测试图案21的编号为minj,其中j表示第j层所述测试标版层20的层数,i表示第i个所述测试图案21的编号,并且i的取值范围为i>1,也就是说,在每层所述测试标版层20上至少设有两个所述测试图案21,当然在其他实施例中也可能每层只有一个所述测试图案21。本技术领域的技术人员应当理解,每所述测试图案21对应的成像位置为m’ij。
如图31所示根据本发明的一个优选实施例所提供的所述立体测试标版100的排布示意图,其中所述测试图案21的形状得以根据实际需求而定,在所述测试方法中,当所述立体测试标版100的不同空间深度的所述测试图案21经过所述摄像模块11拍摄之后,都可以得到对应的解像力值。设定每所述测试图案21对应的解像力值参数为mtf(ij),设定每所述测试图案21的形状参数为ω,每所述测试图案21的位置参数为(h,d);进一步设定光源强度为s,其中,每所述测试图案21对应的解像力值满足函数表达式:mtf(ij)=f(ω,h,d,s)。
如图28所示是基于景物深度原理对所述摄像装置10进行测试和调整的流程示意图。具体地说,在使用所述测试方法对所述摄像装置10进行测试时,首先将所述摄像模块11与所述图像传感器12放置到目标初始位置。例如,可以将所述图像传感器12放置到所述调整单元200的相应位置,并夹取所述摄像模块11到目标初始位置,使得所述摄像模块11与所述图像传感器12的位置对应,以使得通过所述摄像模块11与所述图像传感器12的配合来获取所述立体测试标版100的所述测试图案21的图像。
通过使所述摄像装置10在目标初始位置拍摄所述立体测试标版100的图像,来获得每所述测试图案21的图像信息。值得一提的是,在这个过程中,所述立体测试标版100的所有空间高度的每层所述测试图案21都会同时成像在一张图像上,从而,所述测试方法允许通过一张图像就可以采集到不同深度的所述测试图像21,并计算对应的每所述测试图案21的解像力值。本技术领域的技术人员应当理解,所述立体测试标版100的不同深度对应了不同的像距,也就是说,所述立体测试标版100的所述测试图案21与所述摄像装置10之间具有不同深度的像距,由此,通过所述图像信息,可以建立每所述测试图案21对应的解像力与离焦量的函数关系。
所述测试图案21对应的解像力与离焦量的函数关系满足函数表达式:
F0=F(v){mtf(01),mtf(02),mtf(03)…tmf(0j)},
Fj=F(v){mtf(i1),mtf(i2),mtf(i3)…mtf(ij)}。
设定焦点参数为P,本技术领域的技术人员应当理解,通过上述的函数表达式进行计算获得所述测试图案21的焦点位置为:P0到Pj,并且位于所述立体测试标版100的中心所述测试图案21的焦点位置为P0,其中P0也是所述摄像装置10的对焦位置。
在本发明的一个特定的实施例中,在完成计算焦点位置之后,可以得到如图30所示的,从F0到F4对应的函数描绘出的解像力与像距关系曲线,其中F0对应中心视场(m0)的函数曲线,F1和F3对应轴外视场(m1和m3)关于中心左右对称的图案的解像力函数曲线,F2和F4对应轴外视场(m2和m4)关于上下对称的图案的解像力的函数曲线。在图30中,本技术领域的技术人员应当理解,当中心视场对焦位置与所述图像传感器12的光心重合(F0取最大值)时,轴外视场的四个点(m1,m2,m3,m4)的离焦超过10μm,也就是说,所述摄像装置10在此种情况下的像面存在一定程度的倾斜,因此,利用所述摄像装置10获取的图像会出现如图31所示的单边模糊的现象。
在上述过程中,所述测试方法依据解像力与离焦量之间的关系的函数表达式,可以计算出所述摄像装置10的倾斜矢量,并且在后续,所述调整单元200能够对所述摄像装置10的进行调整,并重新获得如图32和图33所示的图像,这时,轴外视场的四个点(m1,m2,m3,m4)的离焦均小于3μm,像面倾斜得到了改善,m1,m2,m3,m4四个区域成像均匀,解像力得到提升,表明所述摄像装置10的成像质量获得了
好大程度的提高。
如图34所示,在利用所述调整装置对所述摄像装置10进行测试和调整的过程中,所述图像传感器12可以被放置于设置在所述调整单元200的调整平台上,例如六轴调整构件,或者其他的多轴调整构件,所述摄像模块11被设置于所述图像传感器12的上部的目标初始位置,并且所述摄像模块11位于所述立体测试标版100与所述调整平台之间,此时,如图35所示,所述立体测试标版100的每个所述测试图案21都会有对应的像距,这样,当利用所述摄像模块11与所述图像传感器12获取所述立体测试标版100的每层所述测试标版层20的每所述测试图案21时,可以获得具有不同景物深度信息的图像。
如图28所示,在计算出所述摄像装置10的倾斜矢量之后,记载有该数据的调整指示被输入到所述调整单元200中,以控制所述调整平台调整所述摄像模块11与所述图像传感器12之间的关系,从而,提升所述摄像装置10的成像品质。
值得一提的是,所述摄像装置10的焦点位置和倾斜矢量由同一张图像并经由同一个函数关系表达式计算得出,而且还可以同时输入调整指示,所述调整平台接受到的所述调整指示为同一时间,并且进一步地,对所述摄像装置10的对焦和像面倾斜调整的可以被同步完成,从而,可以大幅度的提高对所述摄像装置10进行测试和调整的效率。
进一步地,当对所述摄像装置10的调整完成之后,需要对所述摄像装置10的调整效果进一步确认。需要再次重复上述的动作,以对其进行解像力检测和计算,如果所述摄像装置10能够达到解像力所要求的规格,则所述调整装置判定所述摄像装置10合格,并在后续执行对所述摄像模块11与所述图像传感器12的固化步骤;如果所述摄像装置10没有达到解像力所要求的规格,则所述调整装置判定所述摄像装置10调整失败,并继续对所述摄像装置10进行调整。值得一提的是,在本发明的一个特定的实施例中,如果所述调整装置判定所述摄像装置10的调整次数达到或者超过预设次数,例如3次,则可以是由于所述摄像装置10中的单品存在有严重的缺陷造成的,此时,所述摄像装置10没有必要再被执行调整步骤。
相应地,如图39所示,本发明提供一种对所述摄像装置10进行测试的方法,所述摄像装置10包括一摄像模块11以及一图像传感器12,所述方法包括步骤:
(a)建立沿着深度方向具有不同景物深度的测试图案21;
(b)使所述摄像装置10拍摄、并获取每所述测试图案21的图像信息;以及
(c)基于所述图像信息计算所述摄像模块11的焦点位置、以及所述摄像模块11与所述图像传感器12的倾斜矢量,以确定所述摄像模块11与所述图像传感器12的相对位置。
作为优选,参照图31,在所述步骤(a)中,提供包括沿着深度方向设置的多个测试标版层20,每所述测试标版层20分别具有至少一个所述测试图案21,并且任意一个所述测试标版层20的所述测试图案21与其他所述测试标版层20的所述测试图案21沿着所述深度方向不重叠地设置。
作为优选,在所述步骤(a)中,还包括步骤:(a.1)通过统计被测试所述摄像装置10的参数,确定所述立体测试标版100的位置;以及(a.2)根据所述摄像装置10的精度要求,确定所述测试标版层20的层数、和设计所述测试标版层的所述测试图案的布局。作为优选,在上述方法中,还包括步骤:(a.3)确定所述测试图案的尺寸。
相应地,如图40所示,本发明还提供一种对所述摄像装置10进行调整的方法,所述方法包括步骤:
(α)通过获取3D测试标版的具有不同景物深度信息的立体图像图像,计算所述摄像装置10的一摄像模块11与一图像传感器12的相对位置,并输出数据参数;以及
(β)基于所述数据参数,执行对所述摄像模块11与所述图像传感器12的调整步骤。
作为优选,在上述方法中,通过拍摄所述立体测试标版100的所述测试图案21,来获取具有不同景物深度信息的立体图像,其中所述立体测试标版100具有沿着深度方向布置并且不重叠的多层所述测试图案21,相邻两层所述测试图案21互相间隔地排列。
如图41所示是根据本发明的第一个优选实施例的用于测试摄像模组的灯箱的结构图,其中所述灯箱用于辅助测试一摄像模组的成像品质。具体地说,所述灯箱包括一灯箱壳体300、一光源40以及至少一立体测试标版100,所述光源40设置于所述灯箱壳体300,每个所述立体测试标版100分别安装于所述灯箱壳体300,并且每个所述立体测试标版100位于所述光源40的光线路径,以使所述光源40产生的光线照亮
每个所述立体测试标版100。例如在一个具体的示例中,所述光源40可以设置于所述灯箱壳体300的上部,这样,所述光源40产生的光线自上而下穿过每个所述立体测试标版100辐射,以照明每个所述立体测试标版100。
换言之,所述灯箱壳体300不仅形成承载每个所述立体测试标版100和所述光源40的一承载元件,而且所述灯箱还形成一个端部和四个周部都封闭的环境,以防止所述灯箱在参与所述摄像模组的测试时,所述灯箱的外部光线进入到所述灯箱壳体300的内部而干扰所述光源40辐射的均匀光,通过这样的方式,确保后续所述摄像模组被测试的准确性。
每个所述立体测试标版100分别包括沿着深度方向设置的多个测试标版层20,并且每个所述测试标版层20分别具有至少一测试图案21,从而,使得所述测试图案21形成不同深度的景物信息。在对所述摄像模组进行测试的过程中,所述摄像模组能够捕获不同深度的记载有每个所述测试图案21的信息的光线并将其转化为图像,从而在后续根据所述摄像模组的成像情况可以判断所述摄像模组的成像品质并对所述摄像模组的相关参数进行调整。
值得一提的是,所述立体测试标版100的相关参数需要根据所述摄像模组的类型进行设定,例如所述立体测试标版100的所述测试标版层20的层数、间距以及所述立体测试标版10安装在所述灯箱壳体300的位置、每个所述测试标版层20的所述测试图案21的形状、尺寸、位置、密度等参数根据被测试的所述摄像模组的类型被确定。还值得一提的是,所述立体测试标版100的所述测试标版层的层数可以是2-100层。
进一步地,任意一个所述测试标版层20的所述测试图案21与其他所述测试标版层20的所述测试图案21沿着所述深度方向不重叠地设置,从而在所述摄像模组拍摄所述灯箱的影像时,每个所述测试标版层20的每个所述测试图案21不会出现相互干扰的情况,以确保对所述摄像模组的测试精度。
值得一提的是,在本发明的所述灯箱中,所述测试图案21的形状不受限制,例如所述测试图案21可以选择方形、三角形、圆形、椭圆形、十字形、黑板线对、星形等图形组成的形状组,也就是说,本发明的所述灯箱的所述测试图案21的形状可以是任何能够用来计算所述摄像模组的成像质量的图标,包括实体图标以及通过色彩区分的图标。
如图41所示,所述立体测试标版100还包括一第一安装部60,每个所述测试标版层20分别设置于所述第一安装部60,所述第一安装部60安装于所述灯箱壳体300。值得一提的是,每个所述测试标版层20的层间距根据被测试所述摄像模组的测试需要确定。另外,在每个所述测试标版层20的层间距以及倾斜度被确定之后,可以通过热熔胶或者其他等效的实施方式将每个所述测试标版层20固定于所述第一安装部60。例如在本发明的一个较佳的实施方式中,每个所述测试标版层20是通过热熔胶的方式被固定于所述第一安装部60,并且在这个过程中,当胶水的物理状态发生改变时,每个所述测试标版层20与所述第一安装部60的位置以及每个所述测试标版层20的倾斜度都不会发生偏移,从而确保所述灯箱在被完成组装之后的精度。
如图42所示是根据本发明的第二个优选实施例的用于测试摄像模组的灯箱的结构图,与上述优选实施例不同的是,本发明的第二个优选实施例的所述灯箱的每个所述测试标版层20没有被直接设置在所述第一安装部60。
具体地说,所述立体测试标版100包括一第一安装部60、多个第二安装部70和多个所述测试标版层20,每个所述测试标版层20分别设置于每个所述第二安装部70,每个所述第二安装部70分别连接于所述第一安装部60,例如在本发明的一个具体的示例中,所述测试标版层20和所述第二安装部70之间可以通过热熔胶的方式连接,所述第二安装部70和所述第一安装部60之间也可以通过热熔胶的方式连接。
本领域的技术人员可以理解的是,当所述立体测试标版100形成之后,所述立体测试标版100的相关参数都被确定,从而在后续将每个所述立体测试标版100放置于所述灯箱壳体300时,不再需要测试和调整所述立体测试标版100的相关参数,并且在将所述光源40设置于所述灯箱壳体300后,形成所述灯箱。
也就是说,本发明提供的所述灯箱,其包括所述灯箱壳体300、所述光源40以及至少一个所述立体测试标版100,所述光源40设置于所述灯箱壳体300的上部,每个所述立体测试标版100分别设置于所述灯箱壳体300的内部,并且每个所述立体测试标版100位于所述光源40的光线路径,其中每个所述立体测试
标版100分别包括沿着深度方向设置的多个测试标版层20,每个所述测试标版层20分别具有至少一测试图案21,并且任意一个所述测试标版层20的所述测试图案21与其他所述测试标版层20的所述测试图案21沿着所述深度方向不重叠地设置。
在本发明的一个较佳的实施方式中,所述立体测试标版100还包括所述第一安装部60,每个所述测试标版层20分别重叠地设置于所述第一安装部60,所述第一安装部60被设置于所述灯箱壳体300,以形成所述灯箱。在本发明的另一个较佳的实施方式中,所述立体测试标版100还包括所述第一安装部60、多个所述第二安装部70和多个所述测试标版层20,每个所述测试标版层20分别设置于每个所述第二安装部70,每个所述第二安装部70分别设置于所述第一安装部60,所述第一安装部60设置于所述等项课题30,从而形成所述灯箱。
如图43至图47B所示,本发明还提供一组装灯箱的方法,其中所述组装方法通过简化以及优化所述灯箱的组装步骤来大幅度地提高所述灯箱的组装效率。根据实际的测试结果,本发明提供的所述组装方法将所述灯箱的组装时间由原先2人2天完成缩短到2人1天3小时内完成,并且所述的呢各项在组装完成之后的精度也得到了大幅度的提高,以此来保证在后续对所述摄像模组的测试效果。
如图43和图44E所示,所述组装方法包括如下步骤。
步骤4310:提供一参考基准80,并将所述参考基准80固定于一测试机台90。在组装所述灯箱的过程中,所述参考基准80是组装和调整每个所述测试标版层20的依据,即所述立体测试标版100的每个参数的确定和调整都是以同一个所述参考基准80作为确定和调整的依据,通过这样的方式,能够保证每个所述立体测试标版100的一致性。所述参考基准80包括一基准元件81和具有至少一基准图案82,每个所述基准图案82设在所述基准元件81的不同位置,如图45所示。优选地,每个所述基准图案82是相互独立的,即每个所述基准图案82之间不会出现相互干扰的情况。所述基准元件81的类型以及材料可以不受限制,在本发明的一个较佳的实施方式中,所述基准元件81可以被实施为一个方形的金属片,例如钢片,所述基准图案82可以以激光刻铸的方式被设于所述基准元件81,可以理解的是,所述基准图案82也可以被印刷在所述基准元件81。本领域的技术人员可以理解的是,设于所述基准元件81的所述基准图案82和设于所述测试标版层20的所述测试图案21的类型和尺寸一致,从而在组装和调整每个所述测试标版层20的位置和倾斜度时,设于所述测试标版层20的所述测试图案21能够与设于所述基准元件81的所述基准图案82重合。还可以理解的是,在组装所述灯箱的过程中,只有当所述摄像模组的图案、设于所述测试标版层20的所述测试图案21和设于所述基准元件81的所述基准图案82重合,才能够确定所述测试标版层20的位置和倾斜度。
值得一提的是,所述基准图案82所在的位置是通过光学计算之后得到的,也就是说,所述基准图案82所在的位置是理论位置。另外,组装所述灯箱可以在所述测试机台90上进行,所述测试机台90是后续利用所述灯箱测试和调整所述摄像模组的相关参数的测试设备。具体地说,在组装所述灯箱时,所述测试机台90上可以固定一个所述摄像模组,并且将所述参考基准80固定在所述测试机台90,如图46所示。优选地,所述参考基准80可以通过定位销固定到所述测试机台90上,以防止在组装所述灯箱时,所述参考基准80出现移位的现象。
步骤4320:将所述测试标版层20固定于所述第二安装部70,以形成一单体标版150,如图44A。值得一提的是,在所述测试标版层20和所述第二安装部70之间可以通过热熔胶固定,以避免在固定所述测试标版层20和所述第二安装部70时,所述测试标版层20和所述第二安装部70之间出现相互错位的现象。
值得一提的是,所述步骤4310和所述步骤4320没有顺序差别,也就是说,所述步骤4320也可以在所述步骤4310之间完成,从而先形成所述单体标版150,然后再形成所述参考基准80,并将所述参考基准80固定于所述测试机台90。
步骤4330:将所述第一安装部60固定于所述参考基准80的所述基准元件81,如图44B。在本发明中对于将所述第一安装部60固定于所述基准元件81的方式不受限制,例如在一个具体的实施方式中,所述第一安装部60可以通过定位销的方式被固定于所述基准元件81,以保证在组装所述灯箱时,所述第一安装部60不会出现移位的现象,从而在后续不仅方便将所述第一安装部60从所述基准元件81拆卸下来,而且不会破坏所述第一安装部60和所述基准元件81中的任何一个,这对于保证后续形成的所述灯箱的精度
十分的有效。
步骤4340:将所述单体标版150放入所述第一安装部60,如图44C。
步骤4350:通过调整所述单体标版150的位置和倾斜度,使所述摄像模组的图案、设于所述测试标版层20的所述测试图案21和设于所述基准元件81的所述基准图案82重合,从而,所述单体标版150的相关参数被确定。并且重复执行所述步骤4340和所述步骤4350,以使多个所述单体标版150都被放入到所述第一安装部60,并确定相邻所述测试标版层20的层间距,如图47A和图47B所示。
步骤4360:将调整后的所述单体标版150和所述第一安装部60固定,以形成所述立体测试标版100。值得一提的是,在所述立体测试标版100的所述单体标版150的所述第二安装部70与所述第一安装部60之间可以通过热熔胶固定,以避免在固定所述第二安装部70和所述第一安装部60时,所述立体测试标版100的参数发生变化,例如在热熔胶的物理状态改变的过程中,所述立体测试标版100的每个所述单体标版150之间不会出现移位和倾斜的情况,通过这样的方式,确保所述灯箱在被组装之后的精度。
步骤4370:将至少一个所述立体测试标版100固定于所述灯箱壳体300,如图44D。本领域的技术人员可以理解的是,在所述步骤4360中,所述立体测试标版100的参数被确定,从而在所述步骤4370中,将所述立体测试标版100固定于所述灯箱壳体300的过程不需要再重新调整所述立体测试标版100的参数,通过这样的方式,能够大幅度地提高所述灯箱的组装效率。另外,所述立体测试标版100与所述灯箱壳体300的固定方式不受限制,例如在一个具体的示例中,可以通过螺丝锁定的方式将所述立体测试标版100与所述灯箱壳体300固定,可以理解的是,这种方式仅是一个举例性的描述,并不限制本发明的内容和范围。
步骤4380:将所述光源40设置于所述灯箱壳体300,以形成所述灯箱,并且所述光源40产生的光线穿过每个所述立体测试标版100辐射,以照明每个所述立体测试标版100,如图44E。
值得一提的是,所述步骤4370和所述步骤4380的顺序不受限制,从而在本发明的另一个实施例中,所述步骤4380也可以在所述步骤4370之间完成,从而首先将所述光源40设置于所述灯箱壳体300,再将所述立体测试标版100安装于所述灯箱壳体300,以形成所述灯箱。
从而,本发明提供一组装灯箱的方法,其中所述组装方法包括如下步骤:
(A)重叠地布置多个测试标版层20,以形成一立体测试标版100;
(B)安装至少一个所述立体测试标版100于一灯箱壳体300;以及
(C)设置一光源40于所述灯箱壳体300,并使所述光源40产生的光线透过每个所述测试标版层20辐射。
值得一提的是,在本发明的另一个较佳的实施例中,所述步骤(C)在所述步骤(B)之前完成,从而先将所述光源40设置于所述灯箱壳体300,再将每个所述立体测试标版100安装于所述灯箱壳体300。
在本发明的一个较佳的实施方式中,所述步骤(A)进一步包括:
提供一参考基准80,其中所述参考基准80包括一基准元件81和具有至少一基准图案82,每个所述基准图案82分别设于所述基准元件81;
将一第一安装部60固定于所述基准元件81;以及
将每个所述测试标版层20沿着深度方向设置于所述第一安装部60,并使设于每个所述测试标版层20的测试图案21和设于所述基准元件81的所述基准图案82对应,以形成所述立体测试标版100。
在本发明的另一个较佳的实施方式中,所述步骤(A)进一步包括:
提供一参考基准80,其中所述参考基准80包括一基准元件81和具有至少一基准图案82,每个所述基准图案82分别设于所述基准元件81;
制作一单体标版150,其中所述单体标版150包括一第二安装部70和固定于所述第二安装部70的所述测试标版层20;
将一第一安装部60固定于所述基准元件81;以及
将每个所述单体标版150沿着深度方向设置于所述第一安装部60,并使设于每个所述测试标版层20的测试图案21和设于所述基准元件81的所述基准图案82对应,以形成所述立体测试标版。
进一步地,在上述方法中,将一摄像模组和所述基准元件81分别固定于一测试机台90,当所述摄像
模组的图案与设于每个所述测试标版层20的测试图案21以及设于所述基准元件81的所述基准图案82重合时,固定所述第二安装部70和所述第一安装部60,以形成所述立体测试标版100。更进一步地,在上述方法中,通过热熔胶固定所述第二安装部70和所述第一安装部60。
值得一提的是,本发明还提供一组装灯箱的方法,其中所述组装方法包括如下步骤:
(a)沿着深度方向重叠地设置多个测试标版层20于一灯箱壳体300,其中每个所述测试标版层20分别具有至少一测试图案21,并且任意一个所述测试标版层20的所述测试图案21与其他的所述测试标版层20的所述测试图案21在所述深度方向不重叠;和
(b)设置一光源40于所述灯箱壳体300,并使所述光源40产生的光线透过每个所述测试标版层20辐射。
进一步地,在所述步骤(a)中,进一步包括:
(a.1)重叠地设置多个测试标版层20,以形成一立体测试标版100;和
(a.2)安装至少一个所述立体测试标版100于所述灯箱壳体20。
如图48至图50所示是根据本发明的第三个优选实施例的用于测试摄像模组的灯箱,其中所述灯箱包括一灯箱壳体300A、一光源40A和至少两测试标版110A,每个所述测试标版110A重叠地设置于所述灯箱壳体300A,从而每个所述测试标版110A形成一立体测试标版100A,所述光源40A设置于所述灯箱壳体300A,并且每个所述测试标版110A均位于所述光源40A的光线路径。例如在本发明的一个具体的示例中,每个所述测试标版110A重叠地设置于所述灯箱壳体300A的内部,所述光源40A设置于所述灯箱壳体300A的端部,从而所述光源40A产生的均匀光线能够依次穿过每个所述测试标版110A的至少一部分辐射,以照明每个所述测试标版110A的该部分。
进一步地,每个所述测试标版110A包括至少一测试标版层20A,每个所述测试标版层20A分别具有至少一测试图案21A,以供在后续测试所述摄像模组,所述光源40A产生的均匀光线穿过所述测试标版110A的每个所述测试标版层20A辐射。
值得一提的是,所述测试标版110A的每个所述测试标版层20A处于同一个水平面内,从而当每个所述测试标版110A重叠地设置以形成所述立体测试标版100A时,所述立体测试标版100A包括沿着深度方向设置的多个测试标版层20A,每个所述测试标版层20A分别具有至少一个所述测试图案21A,并且任一层所述测试标版层20A的所述测试图案21A与其他的所述测试标版层20A的所述测试图案21A在所述深度方向不重叠。也就是说,每层所述测试标版层20A的所述测试图案21A在所述摄像模组被测试时不会出现相互干扰的情况,从而确保所述摄像模组的测试结果的可靠性。
在本发明的所述灯箱中,所述测试标版110A的所述测试标版层20A的数量不受限制,例如所述测试标版20的数量可以是一个、两个、三个、四个或者更多个。本领域的技术人员可以理解的是,在本发明的示例中揭露的上每个所述测试标版110A的所述测试标版层20A的数量是四个,并且其仅为举例性的描述,并不构成对本发明的内容和范围的限制。
每个所述测试标版110A还分别包括一第一安装部60A和至少一第二安装部70A,所述第一安装部60A设有至少一安装通道61A,每个所述测试标版层20A分别安装于每个所述第二安装部70A,每个所述第二安装部70A分别安装于所述第一安装部60A的每个所述安装通道61A。值得一提的是,当所述测试标版层20A安装于所述第二安装部70A之后,所述测试标版层20A和所述第二安装部70A可以形成一单体标版150A。本领域的技术人员可以理解的是,所述第二安装部70A可以环绕所述测试标版层20A的周缘设置,也可以是所述第二安装部70A对称地设置于所述测试标版层20A的两侧。
值得一提的是,所述测试标版层20A和所述第二安装部70A之间可以通过热熔胶连接在一起,并且在将所述第二安装部70A安装于所述第一安装部60A的所述安装通道61A,并确定所述测试标版110A的参数后,也可以通过热熔胶将所述第二安装部70A连接在所述第一安装部60A的形成所述安装通道61A的内壁。可以理解的是,热熔胶具有快速粘接的能力,并且在热熔胶的物理状态发生变化的过程中,所述第二安装部70A和所述第一安装部60A之间的相对位置也不会发生改变,从而确保在组装后的所述灯箱的精度。
每个所述测试标版110A被重叠地固定于所述灯箱壳体300A,如图49所示。具体地说,在每个所述测试标版110A被制作完成之后,可以将两个所述测试标版110A重叠地固定于所述灯箱壳体300A,所述测
试标版110A的层数可以是2-100层,例如在本发明的一个优选的实施例中,所述测试标版110A的层数可以是5层。所述灯箱壳体300A的内壁延伸以形成至少两支撑台31A,每个所述测试标版100的两侧可以设置于每个所述支撑台31A,以被所述支撑台31A支撑。优选地,所述灯箱壳体300A还可以设有至少两定位通道32A以连通于所述灯箱壳体300A的内部和外部,每个所述定位通道32A分别对应于每个所述支撑台31A,当所述测试标版110A设置于所述支撑台31A后,所述测试标版110A的侧壁对应于所述定位通道32A,所述定位元件120A的一个端部可以从所述灯箱壳体300A的外部穿过所述定位通道32A以顶紧所述测试标版110A,从而将所述测试标版120固定于所述灯箱壳体300A。本领域的就似乎人员可以理解的是,所述定位元件30和所述灯箱壳体300A的用于形成所述定位通道32A的内壁具有相互啮合的螺纹结构。
所述灯箱还包括一第三安装部130A,在所述光源40A设置于所述灯箱壳体300A之后,所述第三安装部130A覆盖于所述光源40A,以将所述光源40A固定于所述灯箱壳体300A。优选地,所述第三安装部130A的侧壁对应于所述灯箱壳体300A的所述定位通道32A,所述定位元件120A的一个端部从所述灯箱壳体300A的外部穿过所述定位通道32A以顶紧所述第三安装部130A,从而防止所述第三安装部130A移位或者脱落,以确保所述光源40A平行于所述测试标版110A,从而所述光源40A产生的均匀光线可以分别穿过每个所述测试标版110A的每个所述测试标版层20A,以均匀地照亮每个所述测试标版层20A。
进一步地,所述灯箱还包括一遮光元件140A,所述遮光元件140A设置于所述第三安装部130A,并且所述遮光元件140A和所述测试标版110A分别位于所述光源40A的两侧,从而所述遮光元件140A防止所述光源40A产生的光线从所述测试标版110A的相对侧辐射,并且所述遮光元件140A还防止所述灯箱外部的光线进入到所述灯箱的内部以干扰所述光源40A产生的均匀光,从而确保所述灯箱的可靠性。
所述灯箱壳体300A包括一第一承载部33A和一第二承载部34A,所述第二承载部34A设置于所述第一承载部33A的端部,并且所述第一承载部33A和所述第二承载部34A的中轴重合,所述第一承载部33A用于固定每个所述测试标版110A,所述第二承载部34A用于固定所述光源40A。更具体地说,所述第一承载部33A形成每个所述支撑台31A,以供将每个所述测试标版110A设置于所述第一承载部33A,所述第二承载部34A的尺寸大于所述第一承载部33A的尺寸,从而在所述第一承载部33A和所述第二承载部34A的连接位置形成一支撑台阶35A,所述光源40A被设置于所述支撑台阶35A。
值得一提的是,所述灯箱壳体300A的形状可以不受限制,在本发明的如图48至图50的这个较佳的实施方式中,所述灯箱壳体300A的形状是方形,例如正方形或者长方形。在本发明的另一个较佳的实施方式中,如图51所示,所述灯箱壳体300A的形状是圆形,例如正圆形或者椭圆形。
如图52所示是根据本发明的上述优选实施例的一个变形实施方式,与上述优选实施例不同的是,所述测试标版110A的所述测试标版层20A没有连接于所述第二安装部70A,而是将所述测试标版层20A直接连接于所述第一安装部60A的形成所述安装通道61A的内壁,并且所述测试标版层20A和所述第一安装部60A的形成所述安装通道61A的内壁可以通过热熔胶的方式连接在一起。
如图53至图54E所示,本发明还提供一组装灯箱的方法,其中所述组装方法包括如下步骤。
步骤5310:提供一参考基准80A,并将所述参考基准80A固定于一测试机台90A,如图54A所示。在组装所述灯箱的过程中,所述参考基准80A是组装和调整每个所述测试标版层20A的依据。所述参考基准80A包括一基准元件81A和具有至少一基准图案82A,每个所述基准图案82A设在所述基准元件81A的不同位置。在制作所述参考基准80A的过程中,首先通过光学计算确定每个所述基准图案82A在所述基准元件81A的位置,然后通过激光刻铸的方式将每个所述基准图案82A刻铸在所述基准元件81A的相应位置,可以理解的是,所述基准图案82A也可以被印刷在所述基准元件81A。优选地,每个所述基准图案82A是相互独立的,即每个所述基准图案82A之间不会出现相互干扰的情况。所述基准元件81A的类型以及材料可以不受限制,在本发明的一个较佳的实施方式中,所述基准元件81A可以被实施为一个方形的金属片,例如钢片。本领域的技术人员可以理解的是,设于所述基准元件81A的所述基准图案82A和设于所述测试标版层20A的所述测试图案21A的类型和尺寸一致,从而在组装和调整每个所述测试标版层20A的位置和倾斜度时,设于所述测试标版层20A的所述测试图案21A能够与设于所述基准元件81A的所述基准图案82A重合。还可以理解的是,在组装所述灯箱的过程中,只有当所述摄像模组的图案、设于所述测试标版层20A的所述测试图案21A和设于所述基准元件81A的所述基准图案82A重合,才能够确定所述测试标
版层20A的位置和倾斜度。
如图54B所示,所述测试机台90A包括至少一定位销91A,所述参考基准80A的所述基准元件81A设有至少一第一定位通孔811,所述测试机台90A的每个所述定位销91A分别穿过并保持于所述基准元件81A的而每个所述第一定位通孔811,从而将所述参考基准80A固定于所述测试机台90A,通过这样的方式,可以防止在组装所述灯箱的过程中,所述参考基准80A出现移位的现象。
步骤5320,将所述测试标版层20A固定于所述第二安装部70A,以形成一单体标版150A,如图54C所示。值得一提的是,在所述测试标版层20A和所述第二安装部70A之间可以通过热熔胶固定,以避免在固定所述测试标版层20A和所述第二安装部70A时,所述测试标版层20A和所述第二安装部70A之间出现相互错位的现象。
值得一提的是,所述步骤5310和所述步骤5320没有顺序差别,也就是说,所述步骤5320也可以在所述步骤5310之间完成,从而先形成所述单体标版150A,然后再形成所述参考基准80A,并将所述参考基准80A固定于所述测试机台90A。
步骤5330:将所述第一安装部60A重叠地放置并固定于所述参考基准80A的所述基准元件81A,如图54D所示。值得一提的是,所述第一安装部60A设有至少一第二定位通道62A,所述第一安装部60A的每个所述第二定位通道62A分别与每个所述基准元件81A的每个所述安装通道61A相对应,从而在所述步骤5330中,所述测试机台90A的每个所述定位销91A同时穿过并保持于所述基准元件81A的每个所述第一定位通道811A和所述第一安装部60A的每个所述第二定位通道62A。
步骤5340:将所述单体标版150A安装于所述第一安装部60A的每个所述安装通道61A内,以形成所述测试标版110A,如图54E所示。具体地说,当所述第一安装部60A被重叠地固定于所述基准元件81A后,所述第一安装部60A的每个所述安装通道61A对应于设于所述基准元件81A的每个所述参考图案82,所述单体标版150A被放置于所述第一安装部60A的所述安装通道61A,并调整所述单体标版150A与所述第一安装部60A的位置,以使设于所述测试标版层20A的所述测试图案21A与设于所述基准元件81A的所述参考图案82重合,后续连接所述单体标版150A与所述第一安装部60A的形成所述安装通道61A的内壁。
步骤5350:将至少两个所述测试标版110A固定于所述灯箱壳体300A,如图54F所示。根据被测试所述摄像模组的类型,相邻所述测试标版110A的层间距不同,例如在本发明的一个较佳的实施方式中,相邻所述测试标版110A的层间距从所述灯箱壳体300A的一端部向另一端部渐次增大或减小。
步骤5360:将所述光源40A设置于所述灯箱壳体300A,以形成所述灯箱,并且所述光源40A产生的光线穿过每个所述立体测试标版100A辐射,以照明每个所述立体测试标版100A,如图54G所示。
值得一提的是,本发明还提供一组装灯箱的方法,其中所述组装方法包括如下步骤:
(i)沿着深度方向重叠地设置多个测试标版层20A于一灯箱壳体300A,其中每个所述测试标版层20A分别具有至少一测试图案21A,并且任意一个所述测试标版层20A的所述测试图案21A与其他的所述测试标版层20A的所述测试图案21A在所述深度方向不重叠;和
(ii)设置一光源40A于所述灯箱壳体300A,并使所述光源40A产生的光线穿过每个所述测试标版层20A辐射。
进一步地,在所述步骤(i)中包括步骤:
提供一测试标版110A,其中所述测试标版110A包括至少一个所述测试标版层20A;和
重叠地设置至少两个所述测试标版110A于所述灯箱壳体300A。
在本发明的一个较佳的实施方式中,在上述方法中包括步骤:
提供一参考基准80A,其中所述参考基准80A包括一基准元件81A和具有至少一基准图案82A,每个所述基准图案82A分别设于所述基准元件81A的不同位置;
重叠地设置一第一安装部60A于所述基准元件80,并使所述第一安装部60A的每个安装通道61A分别对应于每个所述基准图案82A;以及
将每个所述测试标版层20A分别设置于所述第一安装部60A的每个所述安装通道61A,并且使设于每个所述测试标版层20A的所述测试图案21A对应设于所述基准元件81A的所述基准图案82A,以形成所述
测试标版110A。
在本发明的另一个较佳的实施方式中,在上述方法进一步包括步骤:
提供一参考基准80A,其中所述参考基准80A包括一基准元件81A和具有至少一基准图案82A,每个所述基准图案82A分别设于所述基准元件81A的不同位置;
分别安装每个所述测试标版层20A于一第二安装部70A,以形成一单体标版150A;以及
将每个所述单体标版150A分别设置于一第一安装部60A的每个安装通道61A,并且使设于每个所述测试标版层20A的所述测试图案21A对应设于所述基准元件81A的所述基准图案82A,以形成所述测试标版110A。
进一步地,在上述方法中包括步骤:
分别设置一摄像模组和所述基准元件81A于一测试机台90A,其中所述基准元件81A位于所述摄像模组的感光路径;和
通过所述摄像模组获取设于所述测试标版层20A的所述测试图案21A和设于所述基准元件81A的所述基准图案82A,当所述摄像模组获取的所述测试图案21A与所述基准图案82A的图像重合时,连接所述第二安装部70A和所述第一安装部60A。
本领域的技术人员应理解,上述描述及附图中所示的本发明的实施例只作为举例而并不限制本发明。本发明的目的已经完整并有效地实现。本发明的功能及结构原理已在实施例中展示和说明,在没有背离所述原理下,本发明的实施方式可以有任何变形或修改。
Claims (90)
- 一立体测试标版,其特征在于,包括沿着深度方向设置的多个测试标版层,每所述测试标版层分别具有至少一测试图案,并且任意一个所述测试标版层的所述测试图案与其他所述测试标版层的所述测试图案沿着所述深度方向不重叠地设置。
- 根据权利要求1所述的立体测试标版,其中设定待测试一摄像装置的后焦拟合精度参数为a,焦距参数为EFL,设定所述立体测试标版的位置参数为h,任一层所述测试标版层的位置参数为hj;其中,所述立体测试标版的位置满足函数表达式:a=-((EFL*(-hj)/(EFL-hj)-(EFL*(-h)/(EFL-h)))。
- 根据权利要求2所述的立体测试标版,其中设定所述测试标版层的层数参数为n,设定所述摄像装置的公差参数为t,移动步数参数为s;其中,所述测试标版层的层数满足函数表达式:n=f(t,a,s)。
- 根据权利要求3所述的立体测试标版,其中设定所述测试图案的布局参数为d,任一层所述测试标版层的任一所述测试图案到该层所述测试标版层的中心距离为dij,设定所述摄像装置的测试视场参数为F;其中,所述测试图案的布局满足函数表达式:dij=f(F,hij,EFL)。
- 根据权利要求4所述的立体测试标版,其中设定所述测试图案的尺寸参数为L,任一个所述测试图案的尺寸参数为Lij,所述立体测试标版的参数公差为t’,介质折射率参数为n’,软件计算所允许的弥散斑参数为s’,设定所述摄像装置的测试视场容许范围参数为△F;其中,所述测试图案的尺寸满足函数表达式:Lij=f(dij,△F,t’,n’,s’)。
- 根据权利要求1至5中任一所述的立体测试标版,其中所述测试图案的形状选自方形、三角形、圆形、椭圆形、十字线、黑白线对、星形中的一种或者多种的组合。
- 根据权利要求1至5中任一所述的立体测试标版,其中所述立体测试标版具有2-100层所述测试标版层,各层所述测试标版层具有1-1000个所述测试图案。
- 根据权利要求1至5中任一所述的立体测试标版,其中所述立体测试标版选自透射式、反射式、投影式或者变焦成像式中的一种形成。
- 根据权利要求1至5中任一所述的立体测试标版,其中各所述测试标版层包括至少一承载元件,所述承载元件叠合且间隔地设置,每所述测试图案选择性地设置或形成于所述承载元件。
- 根据权利要求9所述的立体测试标版,其中每所述承载元件由透明材料制成。
- 一立体测试标版,其特征在于,所述立体测试标版具有沿着深度方向布置并且不重叠的多层测试图案,相邻两层所述测试图案互相间隔地排列。
- 根据权利要求11所述的立体测试标版,其中所述立体测试标版还包括多个承载元件,所述承载元件叠合且间隔地设置;其中,每所述承载元件分别形成一测试标版层,每所述测试图案位于每所述测试标版层。
- 根据权利要求11或12所述的立体测试标版,其中所述测试图案的形状选自方形、三角形、圆形、椭圆形、十字线、黑白线对、星形中的一种或者多种的组合。
- 根据权利要求11或12所述的立体测试标版,其中所述立体测试标版具有2-100层所述测试图案,各层所述测试图案具有1-1000个所述测试图案。
- 一立体测试标版的设计方法,其特征在于,所述方法包括步骤:(A)通过统计被测试摄像装置的参数,确定所述立体测试标版的位置;和(B)根据所述摄像装置的精度要求,确定所述测试标版层的层数、和设计所述测试标版层的测试图案的布局。
- 根据权利要求15所述的设计方法,其中在所述步骤(B)中,进一步包括步骤:确定所述测试图案的尺寸。
- 根据权利要求16所述的设计方法,其中在所述步骤(A)中,设定待测试一摄像装置的后焦拟合精度参数为a,焦距参数为EFL,设定所述立体测试标版的位置参数为h,任一层所述测试标版层的位置参数为hj;其中,所述立体测试标版的位置满足函数表达式:a=-((EFL*(-hj)/(EFL-hj)-(EFL*(-h)/(EFL-h)));其中,根据计算得出的h的值,确定所述立体测试标版的位置。
- 根据权利要求17所述的设计方法,其中在所述步骤(A)中,设定所述测试标版层的层数参数为n,设定所述摄像装置的公差参数为t,移动步数参数为s;其中,所述测试标版层的层数满足函数表达式:n=f(t,a,s);和设定所述测试图案的布局参数为d,任一层所述测试标版层的任一所述测试图案到该层所述测试标版层的中心距离为dij,设定所述摄像装置的测试视场参数为F;其中,所述测试图案的布局满足函数表达式:dij=f’(F,hij,EFL);其中,根据计算得出的n和dij的值,确定所述测试标版层的层数和所述测试图案的布局。
- 根据权利要求18所述的设计方法,其中设定所述测试图案的尺寸参数为L,任一个所述测试图案的尺寸参数为Lij,所述立体测试标版的参数公差为t’,介质折射率参数为n’,软件计算所允许的弥散斑参数为s’,设定所述摄像装置的测试视场容许范围参数为△F;其中,所述测试图案的尺寸满足函数表达式:Lij=f”(dij,△F,t’,n’,s’);其中,根据计算得出的Lij的值,确定所述测试图案的尺寸。
- 根据权利要求19所述的设计方法,其中所述测试图案的形状选自方形、三角形、圆形、椭圆形、十字线、黑白线对、星形中的一种或者多种的组合。
- 一立体测试标版的形成方法,其特征在于,所述方法包括步骤:(a)确定至少一预设区域于一测试标版层,在每所述预设区域分别设置至少一测试图案;和(b)将多个所述测试标版层叠合地设置,并使得每所述测试标版层的所述测试图案与其他所述测试标版层的所述测试图案错位地布置,以形成所述立体测试标版。
- 根据权利要求21所述的方法,其中在所述步骤(b)中,藉由光线依次经过每所述测试标版层投射,以增强每所述测试图标与该层所述测试标版层的对比度。
- 根据权利要求22所述的方法,在上述方法中,将一光源和将要测试的摄像装置分别设置于所述立体测试标版的两相反侧,以使得所述光源产生的光线依次穿过每所述测试标版层。
- 根据权利要求22所述的方法,在上述方法中,将至少一光源和将要测试的摄像装置设置于所述立体测试标版的同侧,以使得所述光源产生的光线到达所述测试图案后被反射。
- 根据权利要求22至24中任一所述的方法,其中到达每所述测试标版层的光线为均匀光线。
- 一立体测试标版的形成方法,其特征在于,所述方法包括步骤:将一投影源设置于一光源的光线辐射路径,其中当所述光源产生光线时,所述投影源得以在一预设空间内沿着深度方向形成不重叠的多层测试图案,并且相邻两侧所述测试图案互相间隔地排列,以形成所述立体测试标版。
- 根据权利要求26所述的形成方法,其中所述投影源设置于所述光源与所述预设空间之间。
- 根据权利要求26所述的形成方法,其中所述投影源包括一平面标版和一变焦透镜组,其中所述平面标版设置于所述光源与所述变焦透镜组之间,以使得所述光源产生的光线,得以将所述平面标版的信息透过所述变焦透镜组辐射至所述预设空间。
- 根据权利要求28所述的形成方法,其中所述平面标版还具有至少一测试目标,其中每所述测试目标得以经过所述变焦透镜组投影至所述预设空间,以形成所述测试图案。
- 根据权利要求26所述的形成方法,其中所述测试图案的形状选自方形、三角形、圆形、椭圆形、十字线、黑白线对、星形中的一种或者多种的组合。
- 一十字线立体测试标版的形成方法,其特征在于,所述方法包括沿着深度方向形成的多层十字线测试图案,并且每所述十字线测试图案投影到像方后形成的图像互相不重叠。
- 根据权利要求31所述的方法,其中在上述方法中,还包括步骤:确定至少一预设区域于一测试标版层,在每所述预设区域分别设置至少一个所述十字形测试图案;和将多个所述测试标版层叠合地设置,并使得所述测试标版层的所述十字形测试图案错位地布置,以形成所述十字形立体测试标版。
- 根据权利要求31或32所述的方法,其中在上述方法中,还包括步骤:通过统计被测试摄像装置的参数和精度要求,分别确定所述十字线立体测试标版的位置和所述测试标版层的层数。
- 根据权利要求33所述的方法,其中设定所述摄像装置的后焦拟合精度参数为a,焦距参数为EFL,设定所述十字线立体测试标版的位置参数为h,任一层所述测试标版层的位置参数为hj;其中,所述十字线立体测试标版的位置满足函数表达式:a=-((EFL*(-hj)/(EFL-hj)-(EFL*(-h)/(EFL-h)));其中,根据h的值,确定所述十字线立体测试标版的位置;和设定所述测试标版层的层数参数为n,设定所述摄像装置的公差参数为t,移动步数参数为s;其中,所述测试标版层的层数满足函数表达式:n=f(t,a,s);其中,根据n的值,确定所述测试标版层的层数。
- 根据权利要求31或32所述的方法,其中在上述方法中,还包括步骤:确定所述十字线测试图案的布局。
- 根据权利要求35所述的方法,其中设定所述十字线测试图案的布局参数为d,任一层所述测试标版层的任一所述十字线测试图案到该层所述测试标版层的中心距离为dij,设定所述摄像装置的测试视场参数为F;其中,所述十字线测试图案的布局满足函数表达式:dij=f(F,hij,EFL);其中,根据dij的值,确定所述十字线测试图案的布局。
- 根据权利要求36所述的方法,其中设定所述十字线测试图案的尺寸参数为L,任一个所述十字线测试图案的尺寸参数为Lij,所述十字线立体测试标版的参数公差为t’,介质折射率参数为n’,软件计算所允许的弥散斑参数为s’,设定所述摄像装置的测试视场容许范围参数为△F;其中,所述十字线测试图案的尺寸满足函数表达式:Lij=f(dij,△F,t’,n’,s’);其中,根据Lij的值,确定所述十字线测试图案的尺寸。
- 根据权利要求31或32所述的方法,其中在上述方法中,还包括步骤:在一摄像装置的像面位置预排列十字形图案,然后将所述十字形图案通过投影的方式形成沿着所述深度方向布置的每所述十字形测试图案,以形成所述十字形立体测试标版。
- 根据权利要求31或32所述的方法,其中在上述方法中,还包括步骤:将一投影源设置于一光源的光线投射路径,其中当所述光源投射光线时,所述投影源得以在一预设空间内形成沿着所述深度方向布置的所述十字形测试图案,以形成所述十字形立体测试标版;其中所述投影源包括十字形测试目标。
- 根据权利要求39所述的方法,其中所述投影源包括一平面标版和一变焦透镜组,其中所述平面标版设置于所述光源与所述变焦透镜组之间,以使得所述光源产生的光线,得以将所述平面标版的信息透过所述变焦透镜组辐射至所述预设空间。
- 根据权利要求31或32所述的方法,其中每层所述十字形测试图案的尺寸相同或不同。
- 一十字线立体测试标版,其特征在于,包括沿着深度方向设置的多个测试标版层,每所述测试标版层具有至少一预设区域,每所述预设区域设有一个或多个十字线测试图案,并且每所述测试标版层的所述十字线测试图案与其他所述测试标版层的所述十字线测试图案沿着所述深度方向不重叠地布置。
- 根据权利要求42所述的十字线立体测试标版,其中设定待测试一摄像装置的后焦拟合精度参数为a,焦距参数为EFL,设定所述十字线立体测试标版的位置参数为h,任一层所述测试标版层的位置参数为hj;其中,所述十字线立体测试标版的位置满足函数表达式:a=-((EFL*(-hj)/(EFL-hj)-(EFL*(-h)/(EFL-h)))。
- 根据权利要求43所述的十字线立体测试标版,其中设定所述测试标版层的层数参数为n,设定所述摄像装置的公差参数为t,移动步数参数为s;其中,所述测试标版层的层数满足函数表达式:n=f(t,a,s)。
- 根据权利要求44所述的十字线立体测试标版,其中设定所述十字线测试图案的布局参数为d,任一层所述测试标版层的任一所述十字线测试图案到该层所述测试标版层的中心距离为dij,设定所述摄像装置的测试视场参数为F;其中,所述十字线测试图案的布局满足函数表达式:dij=f’(F,hij,EFL)。
- 根据权利要求45所述的十字线立体测试标版,其中设定所述十字线测试图案的尺寸参数为L,任一个所述十字线测试图案的尺寸参数为Lij,所述十字线立体测试标版的参数公差为t’,介质折射率参数为 n’,软件计算所允许的弥散斑参数为s’,设定所述摄像装置的测试视场容许范围参数为△F;其中,所述十字线测试图案的尺寸满足函数表达式:Lij=f”(dij,△F,t’,n’,s’)。
- 根据权利要求42至46中任一所述的十字线立体测试标版,其中每层所述十字形测试图案的尺寸相同或不同。
- 根据权利要求42至46中任一所述的十字线立体测试标版,其中每所述测试标版层选择有机玻璃、无机玻璃、透明显示屏的一种形成。
- 一对一摄像装置进行测试的方法,所述摄像装置包括一摄像模块和一图像传感器,其特征在于,所述方法包括步骤:(i)建立沿着深度方向具有不同景物深度的测试图案;(ii)使所述摄像装置拍摄、并获取每所述测试图案的图像信息;以及(iii)基于所述图像信息计算所述摄像模块的焦点位置、和所述摄像模块与所述图像传感器的倾斜和偏移矢量,以确定所述摄像模块与所述图像传感器的相对位置。
- 根据权利要求49所述的测试方法,其中在所述步骤(i)中,还包括步骤:提供包括沿着深度方向设置的多个测试标版层的一立体测试标版,每所述测试标版层分别具有至少一个所述测试图案,并且任意一个所述测试标版层的所述测试图案与其他所述测试标版层的所述测试图案沿着深度方向不重叠地设置。
- 根据权利要求50所述的测试方法,其中在所述步骤(i)中,还包括步骤:根据统计被测试所述摄像装置参数,确定所述立体测试标版的位置;和根据所述摄像装置的精度要求,确定所述测试标版层的层数、和设计所述测试标版层的所述测试图案的布局。
- 根据权利要求51所述的测试方法,其中在所述步骤(i)中,还包括步骤:确定所述测试图案的尺寸。
- 根据权利要求52所述的测试方法,其中在上述方法中,设定待测试一摄像装置的后焦拟合精度参数为a,焦距参数为EFL,设定所述立体测试标版的位置参数为h,任一层所述测试标版层的位置参数为hj;其中,所述立体测试标版的位置满足函数表达式:a=-((EFL*(-hj)/(EFL-hj)-(EFL*(-h)/(EFL-h)));其中,根据计算得出的h的值,确定所述立体测试标版的位置。
- 根据权利要求53所述的测试方法,其中在上述方法中,设定所述测试标版层的层数参数为n,设定所述摄像装置的公差参数为t,移动步数参数为s;其中,所述测试标版层的层数满足函数表达式:n=f(t,a,s);和设定所述测试图案的布局参数为d,任一层所述测试标版层的任一所述测试图案到该层所述测试标版层的中旬距离为dij,设定所述摄像装置的测试视场参数为F;其中,所述测试图案的布局满足函数表达式:dij=f’(F,hij,EFL);其中,根据计算得出的n和dij的值,确定所述测试标版层的层数和所述测试图案的布局。
- 根据权利要求53所述的测试方法,其中在上述方法中,设定所述测试图案的尺寸参数为L,任一个所述测试图案的尺寸参数为Lij,所述立体测试标版的参数公差为t’,介质折射率参数为n’,软件计算所允许的弥散斑参数为s’,设定所述摄像装置的测试视场容许范围参数为△F;其中,所述测试图案的尺寸满足函数表达式:Lij=f”(dij,△F,t’,n’,s’);其中,根据计算得出的Lij的值,确定所述测试图案的尺寸。
- 根据权利要求49至55中任一所述的测试方法,在所述步骤(iii)中,设定每所述测试图案对应的解像力值参数为mtf(ij),设定每所述测试图案的形状参数为ω,每所述测试图案21的位置参数为(h,d);设定光源强度为s,其中,每所述测试图案对应的解像力值满足函数表达式:mtf(ij)=f(ω,h,d,s)。
- 根据权利要求56所述的测试方法,其中在上述方法中,所述测试图案对应的解像力与离焦量的函数关系满足函数表达式:F0=F(v){mtf(01),mtf(02),mtf(03)…tmf(0j)},Fj=F(v){mtf(i1),mtf(i2),mtf(i3)…mtf(ij)}。
- 根据权利要求49所述的测试方法,其中反映成像质量的方式可以采用OTF,MTF,SFR,CTF或者TV line中的一种或几种。
- 根据权利要求57所述的测试方法,其中反映成像质量的方式可以采用OTF,MTF,SFR,CTF或者TV line中的一种或几种。
- 根据权利要求49所述的测试方法,其中所述测试图案的形状选自方形、三角形、圆形、椭圆形、十字形、黑白线对、星形中的一种或者多种的组合。
- 根据权利要求50所述的测试方法,其中所述立体测试标版由透射式、反射式、投影式、变焦式中的一种形成。
- 一对一摄像装置进行调整的方法,其特征在于,所述方法包括步骤:(α)通过获取具有不同景物深度信息的立体图像,计算所述摄像装置的一摄像模块与一图像传感器的相对位置,并输出数据信息;和(β)基于所述数据信息,执行对所述摄像模块与所述图像传感器的调整步骤。
- 根据权利要求62所述的调整方法,其中在所述步骤(α)中,还包括步骤:通过所述立体图像由同一函数关系计算所述摄像模块的焦距、和所述摄像模块与所述图像传感器的倾斜和偏移矢量。
- 根据权利要求63所述的调整方法,设定所述测试图案对应的解像力值参数为mtf(ij),设定所述测试图案的形状参数为ω,所述测试图案的位置参数为(h,d);设定光源强度为s,其中,每所述测试图案对应的解像力值满足函数表达式:mtf(ij)=f(ω,h,d,s)。
- 根据权利要求64所述的调整方法,其中在上述方法中,每所述测试图案对应的解像力与离焦量的函数关系满足函数表达式:F0=F(v){mtf(01),mtf(02),mtf(03)…(tmf(0j)),Fj=F(v){mtf(i1),mtf(i2),mtf(i3)…mtf(ij)}。
- 根据权利要求62所述的调整方法,其中在所述步骤(α)中,还包括步骤:(α.1)建立沿着深度方向具有不同景物深度的测试图案;(α.2)使所述摄像装置拍摄、并获取每所述测试图案的图像信息;以及(α.3)基于所述图像信息计算所述摄像模块的焦点位置、和所述摄像模块与所述图像传感器的倾斜和偏移矢量,以确定所述摄像模块与所述图像传感器的相对位置。
- 一调整装置,用于调整一摄像装置,其特征在于,包括:一立体测试标版,其具有沿着深度方向布置并且不重叠的多层测试图案,相邻两层所述测试图案互相间隔地排列;其中所述摄像装置拍摄所述立体测试标版,以获得具有不同景物深度的图像;和一调整单元,用于基于所述图像提供的数据执行对所述摄像装置的调整操作。
- 根据权利要求67所述的调整装置,其中所述立体测试标版还包括多个测试标版层,每所述测试标版层包括一个所述测试图案,并且任意一个所述测试标版层的所述测试图案与其他所述测试标版层的所述测试图案沿着所述深度方向不重叠地设置。
- 根据权利要求68所述的调整装置,其中所述测试图案的形状选自方形、三角形、圆形、椭圆形、十字形、黑白线对、星形中的一种或者多种的组合。
- 根据权利要求67至69中任一所述的调整装置,其中所述立体测试标版由透射式、反射式、投影式、变焦式中的一种形成。
- 一用于测试摄像模组的灯箱,其特征在于,包括:一灯箱壳体;一光源,所述光源设置于所述灯箱壳体;以及多个测试标版层,每个所述测试标版层沿着深度方向设置于所述灯箱壳体,其中每个所述测试标版层分别具有至少一测试图案,并且任意一个所述测试标版层的所述测试图案与其他的所述测试标版层的所述测试图案在所述深度方向不重叠,并且所述光源产生的光线透过每个所述测试标版层辐射。
- 根据权利要求71所述的灯箱,还包括至少两第一安装部,每个所述第一安装部分别设有至少一安装通道,每个所述测试标版层的周缘分别连接于所述第一安装部的形成每个所述安装通道的内壁,每个所述第一安装部重叠地设置于所述灯箱壳体。
- 根据权利要求71所述的灯箱,还包括至少两第一安装部和多个第二安装部,每个所述第一安装部分别设有至少一安装通道,每个所述测试标版层分别设置于每个所述第二安装部,每个所述第二安装部分别连接于所述第一安装部的形成每个所述安装通道的内壁,每个所述第一安装部重叠地设置于所述灯箱壳体。
- 根据权利要求73所述的灯箱,其中所述灯箱壳体的内壁形成至少两支撑台,每个所述第一安装部分别设置于至少一个所述支撑台。
- 根据权利要求74所述的灯箱,还包括多个定位元件,所述灯箱壳体还设有至少两定位通道,每个所述定位通道分别对应于每个所述支撑台,设置于所述支撑台的所述第一安装部的侧壁对应每个所述定位通道,所述定位元件的端部从所述灯箱壳体的外部经由所述定位通道延伸至所述灯箱壳体的内部并顶紧所述第一安装部。
- 根据权利要求75所述的灯箱,还包括一第三安装部,所述第三安装部重叠地设置于所述光源,并且所述第三安装部的侧壁对应所述定位通道,所述定位元件的端部从所述灯箱壳体的外部经由所述定位通道延伸至所述灯箱壳体的内部并顶紧所述第三安装部。
- 根据权利要求73所述的灯箱,其中所述灯箱壳体包括一第一承载部和设置于所述第一承载部的一第二承载部,并且在所述第一承载部和所述第二承载部的连接位置形成一支撑台阶,每个所述第一安装部重叠地设置于所述第一承载部,所述光源设置于所述支撑台阶。
- 根据权利要求73所述的灯箱,其中所述灯箱壳体是方形或者圆形。
- 根据权利要求71或73所述的灯箱,其中相邻所述测试标版层的层间距从所述灯箱壳体的一端向另一端渐次增加或者渐次减小。
- 根据权利要求71或73所述的灯箱,其中所述测试标版层的层数是2-100。
- 根据权利要求71或73所述的灯箱,其中所述测试图案选自方形、三角形、圆形、椭圆形、十字形、黑板线对、星形组成的形状组。
- 一组装灯箱的方法,其中所述灯箱用于测试一摄像模组,其特征在于,包括步骤:(i)沿着深度方向重叠地设置多个测试标版层于一灯箱壳体,其中每个所述测试标版层分别具有至少一测试图案,并且任意一个所述测试标版层的所述测试图案与其他的所述测试标版层的所述测试图案在所述深度方向不重叠;和(ii)设置一光源于所述灯箱壳体,并使所述光源产生的光线穿过每个所述测试标版层辐射。
- 根据权利要求82所述的组装方法,其中在所述步骤(i)中,进一步包括步骤:提供一立体测试标版,其中所述立体测试标版包括沿着所述深度方向重叠地设置的多个所述测试标版层;和安装至少一个所述立体测试标版于所述灯箱壳体。
- 根据权利要求82所述的组装方法,其中在所述步骤(i)中,进一步包括步骤:提供一测试标版,其中所述测试标版包括至少一个所述测试标版层;和重叠地设置至少两个所述测试标版于所述灯箱壳体。
- 根据权利要求84所述的组装方法,其中在上述方法中,进一步包括步骤:提供一参考基准,其中所述参考基准包括一基准元件和具有至少一基准图案,每个所述基准图案分别设于所述基准元件的不同位置;重叠地设置一第一安装部于所述基准元件,并使所述第一安装部的每个安装通道分别对应于每个所述基准图案;以及将每个所述测试标版层分别设置于所述第一安装部的每个所述安装通道,并且使设于每个所述测试标版层的所述测试图案对应设于所述基准元件的所述基准图案,以形成所述测试标版。
- 根据权利要求84所述的组装方法,其中在上述方法中,进一步包括步骤:提供一参考基准,其中所述参考基准包括一基准元件和具有至少一基准图案,每个所述基准图案分别设于所述基准元件的不同位置;分别安装每个所述测试标版层于一第二安装部,以形成一单体标版;以及将每个所述单体标版分别设置于一第一安装部的每个安装通道,并且使设于每个所述测试标版层的所述测试图案对应设于所述基准元件的所述基准图案,以形成所述测试标版。
- 根据权利要求86所述的组装方法,其中在上述方法中,进一步包括步骤:分别设置一摄像模组和所述基准元件于一测试机台,其中所述基准元件位于所述摄像模组的感光路径;和通过所述摄像模组获取设于所述测试标版层的所述测试图案和设于所述基准元件的所述基准图案,当所述摄像模组获取的所述测试图案与所述基准图案的图像重合时,连接所述第二安装部和所述第一安装部。
- 根据权利要求87所述的组装方法,其中在上述方法中,通过热熔胶连接所述第一安装部和所述第二安装部。
- 根据权利要求87所述的组装方法,其中设于所述基准元件的所述基准图案与设于所述测试标版的所述测试图案的类型一致。
- 根据权利要求87所述的组装方法,其中所述测试图案选自方形、三角形、圆形、椭圆形、十字形、黑板线对、星形组成的形状组。
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| CN201410783740.7A CN105791811B (zh) | 2014-09-30 | 2014-12-16 | 一种立体测试标版及其设计和形成方法 |
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