WO2016035702A1 - 非線形光学結晶及びその製造方法、テラヘルツ波発生装置並びにテラヘルツ波測定装置 - Google Patents

非線形光学結晶及びその製造方法、テラヘルツ波発生装置並びにテラヘルツ波測定装置 Download PDF

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WO2016035702A1
WO2016035702A1 PCT/JP2015/074410 JP2015074410W WO2016035702A1 WO 2016035702 A1 WO2016035702 A1 WO 2016035702A1 JP 2015074410 W JP2015074410 W JP 2015074410W WO 2016035702 A1 WO2016035702 A1 WO 2016035702A1
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terahertz wave
formula
crystal
optical crystal
terahertz
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English (en)
French (fr)
Japanese (ja)
Inventor
高一郎 秋山
陽一 河田
敬史 安田
篤司 中西
高橋　宏典
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Hamamatsu Photonics KK
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Hamamatsu Photonics KK
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Priority to GB1702460.5A priority Critical patent/GB2546183B/en
Priority to US15/505,963 priority patent/US10248003B2/en
Publication of WO2016035702A1 publication Critical patent/WO2016035702A1/ja
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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/35—Non-linear optics
    • G02F1/355—Non-linear optics characterised by the materials used
    • G02F1/361—Organic materials
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/35—Non-linear optics
    • G02F1/355—Non-linear optics characterised by the materials used
    • G02F1/361—Organic materials
    • G02F1/3611—Organic materials containing Nitrogen
    • G02F1/3612—Heterocycles having N as heteroatom
    • C—CHEMISTRY; METALLURGY
    • C07—ORGANIC CHEMISTRY
    • C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C309/00—Sulfonic acids; Halides, esters, or anhydrides thereof
    • C07C309/01—Sulfonic acids
    • C07C309/28—Sulfonic acids having sulfo groups bound to carbon atoms of six-membered aromatic rings of a carbon skeleton
    • C07C309/29—Sulfonic acids having sulfo groups bound to carbon atoms of six-membered aromatic rings of a carbon skeleton of non-condensed six-membered aromatic rings
    • C07C309/30—Sulfonic acids having sulfo groups bound to carbon atoms of six-membered aromatic rings of a carbon skeleton of non-condensed six-membered aromatic rings of six-membered aromatic rings substituted by alkyl groups
    • C—CHEMISTRY; METALLURGY
    • C07—ORGANIC CHEMISTRY
    • C07D—HETEROCYCLIC COMPOUNDS
    • C07D213/00—Heterocyclic compounds containing six-membered rings, not condensed with other rings, with one nitrogen atom as the only ring hetero atom and three or more double bonds between ring members or between ring members and non-ring members
    • C07D213/02—Heterocyclic compounds containing six-membered rings, not condensed with other rings, with one nitrogen atom as the only ring hetero atom and three or more double bonds between ring members or between ring members and non-ring members having three double bonds between ring members or between ring members and non-ring members
    • C07D213/04—Heterocyclic compounds containing six-membered rings, not condensed with other rings, with one nitrogen atom as the only ring hetero atom and three or more double bonds between ring members or between ring members and non-ring members having three double bonds between ring members or between ring members and non-ring members having no bond between the ring nitrogen atom and a non-ring member or having only hydrogen or carbon atoms directly attached to the ring nitrogen atom
    • C07D213/24—Heterocyclic compounds containing six-membered rings, not condensed with other rings, with one nitrogen atom as the only ring hetero atom and three or more double bonds between ring members or between ring members and non-ring members having three double bonds between ring members or between ring members and non-ring members having no bond between the ring nitrogen atom and a non-ring member or having only hydrogen or carbon atoms directly attached to the ring nitrogen atom with substituted hydrocarbon radicals attached to ring carbon atoms
    • C07D213/36—Radicals substituted by singly-bound nitrogen atoms
    • C07D213/38—Radicals substituted by singly-bound nitrogen atoms having only hydrogen or hydrocarbon radicals attached to the substituent nitrogen atom
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/35—Non-linear optics
    • G02F1/355—Non-linear optics characterised by the materials used
    • G02F1/3551—Crystals
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/35—Non-linear optics
    • G02F1/355—Non-linear optics characterised by the materials used
    • G02F1/361—Organic materials
    • G02F1/3613—Organic materials containing Sulfur

Definitions

  • the present invention relates to a nonlinear optical crystal and a manufacturing method thereof, a terahertz wave generating element, a terahertz wave generating apparatus, and a measuring apparatus.
  • the intensity of the terahertz wave generated from the nonlinear optical crystal changes depending on the frequency, but the frequency band in which the intensity decreases varies depending on the type of compound constituting the nonlinear optical crystal. Therefore, for nonlinear optical crystals containing salts of pyrinidium and substituted phenyl sulfonates, terahertz waves with sufficient output intensity in a wide band can be obtained by combining multiple types of substituted phenyl sulfonates that give crystals with different bands in which the output decreases.
  • Patent Document 1 Has been proposed (for example, Patent Document 1).
  • the output intensity of the terahertz wave may be locally reduced in a specific frequency band.
  • the salt of pyrinidium and substituted phenylsulfonate the output intensity of the terahertz wave near 1 THz is greatly reduced, and there is room for improvement in this respect.
  • a main object of the present invention is to sufficiently suppress a local output decrease in a frequency band near 1 THz and maintain a stable output intensity in a wide band with respect to a nonlinear optical crystal formed from an organic material. is there.
  • One aspect of the present invention is a pyridinium represented by the following formula (1), a 4-substituted phenylsulfonate represented by the following formula (2a), and 2,4,6-
  • the present invention relates to a nonlinear optical crystal containing a substituted phenyl sulfonate.
  • R 1 , R 2 and R 3 each independently represent a methyl group or an ethyl group.
  • X represents a halogen atom
  • R 4 , R 5 and R 6 each independently represent a methyl group or an ethyl group.
  • R 1 , R 2 and R 3 in the formula (1) are methyl groups
  • X in the formula (2a) is a chlorine atom
  • R 4 , R 5 and R 6 in the formula (2b) are methyl groups. May be. Thereby, the effect which suppresses a local output fall is show
  • the present invention relates to a method for producing the nonlinear optical crystal.
  • the method includes the step of precipitating the nonlinear optical crystal from a solution containing the pyridinium, the 4-substituted phenylsulfonate, the 2,4,6-substituted phenylsulfonate, and a solvent in which they are dissolved. .
  • the present invention provides a terahertz wave generation device and a terahertz wave measurement device including a terahertz wave generation element including the nonlinear optical crystal.
  • the terahertz wave generator according to the present invention can generate a highly stable terahertz wave in which a local decrease in output intensity is suppressed.
  • stable spectroscopic analysis and the like can be performed in a wide band using the terahertz wave.
  • the present invention can also provide a terahertz wave detecting device including a terahertz wave detecting element including the nonlinear optical crystal. Also with such a terahertz wave detecting element, it is possible to perform a stable spectroscopic analysis or the like in a wide band using the terahertz wave.
  • the present invention it is possible to sufficiently suppress a local output decrease in a frequency band near 1 THz and maintain a stable output intensity in a wide band with respect to a nonlinear optical crystal formed from an organic material.
  • a figure showing one embodiment of a terahertz wave measuring device It is a figure showing one embodiment of a terahertz wave measuring device. It is a figure showing one embodiment of a terahertz wave measuring device. It is a figure showing one embodiment of a terahertz wave measuring device. It is a figure showing one embodiment of a terahertz wave measuring device. It is a figure showing one embodiment of a terahertz wave measuring device. It is a graph which shows the relationship between the emitted light intensity of a nonlinear optical crystal, and a frequency.
  • the crystal according to one embodiment includes pyridinium represented by the following formula (1), 4-substituted phenylsulfonate represented by the following formula (2a), and 2,4,6 represented by the following formula (2b). -Composed of substituted phenyl sulfonates.
  • the crystal is represented by a salt of pyridinium represented by formula (1) and 4-substituted phenylsulfonate represented by formula (2a), and pyridinium represented by formula (1) and formula (2b). It can be a mixed crystal composed of two salts of a salt with 2,4,6-substituted phenylsulfonate.
  • This crystal is a nonlinear optical crystal that exhibits a nonlinear response to incident light, and in particular, can generate light in the terahertz wave band.
  • R 1 , R 2 and R 3 each independently represent a methyl group or an ethyl group.
  • X represents a halogen atom (a fluorine atom, a chlorine atom, a bromine atom or an iodine atom).
  • R 4 , R 5 and R 6 each independently represents a methyl group or an ethyl group. Show.
  • R 1 to R 3 and X in each formula can be appropriately selected so as to form a combination that forms a nonlinear optical crystal containing each compound.
  • R 1 , R 2 and R 3 in the formula (1) are methyl groups
  • X in the formula (2a) is a chlorine atom
  • R 4 , R 5 and R 6 in the formula (2b) are methyl groups. It may be.
  • the ratio of the 4-substituted phenylsulfonate of formula (2a) to the 2,4,6-substituted phenylsulfonate of formula (2b) in the crystal is appropriately adjusted within the range where a desired nonlinear optical response is obtained. be able to.
  • the molar ratio of 4-substituted phenyl sulfonate of formula (2a) to 2,4,6-substituted phenyl sulfonate of formula (2b) is 1:99 to 99: 1 It may be.
  • the crystal according to the above embodiment includes, for example, pyridinium of the formula (1), 4-substituted phenylsulfonate of the formula (2a) and 2,4,6-substituted phenylsulfonate of the formula (2b), and these are dissolved. It can be obtained by a method comprising a step of preparing a solution containing a solvent and a step of precipitating crystals from the solution.
  • Solutions for precipitating crystals include salts of pyridinium of formula (1) and 4-substituted phenylsulfonate of formula (2a), 2,4,6-substitution of pyridinium of formula (1) and formula (2b) It can be prepared by preparing salts with phenylsulfonate and dissolving them in a solvent. Each salt can be synthesized by a person skilled in the art according to a common synthesis method, and some salts are also commercially available.
  • each salt can be synthesized by a method in which a salt containing pyridinium of formula (1) as a cation is used as a starting material, and the anion of the salt is replaced with a sulfonate of formula (2a) or formula (2b).
  • the solution When preparing the solution, the solution may be heated to a predetermined temperature (for example, 45 ° C.) as necessary.
  • a predetermined temperature for example, 45 ° C.
  • each salt may be dissolved in a solvent so as to have a saturated concentration.
  • the solvent for preparing the solution is not particularly limited as long as it can crystallize (recrystallize) the salt.
  • methanol, ethanol, acetonitrile, ethyl acetate, chloroform, acetone, or a combination thereof can be used. Also good. By using these solvents, the crystals according to the present embodiment can be efficiently generated.
  • the temperature of the solution can be decreased continuously or intermittently.
  • the temperature of the solution may be decreased at a cooling rate of 0.1 to 1 ° C./day.
  • Crystals precipitated and grown in the solution are taken out of the solution.
  • the extracted crystal is processed into a desired shape and size if necessary.
  • the maximum thickness of the crystal may be, for example, 0.1 to 2 mm.
  • the crystal (nonlinear optical crystal) according to the embodiment described above can be used as a terahertz wave generating element or a terahertz wave detecting element as exemplified below.
  • FIG. 1 is a diagram showing an embodiment of a terahertz wave measuring apparatus.
  • a terahertz wave measuring apparatus 2 shown in FIG. 1 acquires information on the measuring object S by a transmission measurement method using a terahertz wave.
  • the terahertz wave measuring apparatus 2 includes a light source 11, a branching unit 12, a chopper 13, an optical path length difference adjusting unit 14, a polarizer 15, a multiplexing unit 16, a terahertz wave generating element 20, a terahertz wave detecting element 40, and a quarter wavelength plate. 51, a polarization separation element 52, a photodetector 53a, a photodetector 53b, a differential amplifier 54, and a lock-in amplifier 55.
  • the crystal according to the present embodiment can be used as the terahertz wave generating element 20 and / or the terahertz wave detecting element 40.
  • the light source 11 outputs pulsed light with a constant repetition period, and may be, for example, a femtosecond pulsed laser light source that outputs pulsed laser light having a pulse width of about femtoseconds.
  • the wavelength of light output from the light source 11 may be, for example, 700 to 1600 nm.
  • the branching unit 12 splits the pulsed light output from the light source 11 into two, outputs one of the two branched pulsed light as the pump light to the mirror M1, and outputs the other as the probe light to the mirror M4.
  • the branching unit 12 may be a beam splitter, for example.
  • the chopper 13 is provided on the optical path of the pump light between the branch part 12 and the mirror M1, and alternately passes and blocks the pump light at a constant cycle.
  • the pump light output from the branching unit 12 and passing through the chopper 13 is sequentially reflected by the mirrors M1 to M3 and input to the terahertz wave generating element 20.
  • the optical system of pump light from the branching section 12 to the terahertz wave generating element 20 is hereinafter referred to as “pump optical system”.
  • the terahertz wave generating device 1 is configured by the light source 11, the branching unit 12, the chopper 13, the mirror M1, the mirror M2, the mirror M3, and the terahertz wave generating element 20 in the pump optical system.
  • the terahertz wave generation device may have a light source and a terahertz wave generation element, and may be configured so that pulsed light output from the light source is input to the terahertz wave generation device. Is optional.
  • the terahertz wave generating element 20 generates and outputs a pulsed terahertz wave by inputting pump light.
  • a pulsed terahertz wave is generated at a constant repetition period and has a pulse width of about several picoseconds.
  • the terahertz wave output from the terahertz wave generation element 20 acquires information (for example, an absorption coefficient and a refractive index) of the measurement object S by passing through the measurement object S, and then is input to the multiplexing unit 16.
  • the terahertz wave optical system from the terahertz wave generating element 20 to the multiplexing unit 16 is hereinafter referred to as a “terahertz wave optical system”.
  • an electromagnetic wave having a frequency mainly in the range of about 0.01 THz to 100 THz is assumed as the terahertz wave.
  • the probe light output from the branching unit 12 is sequentially reflected by the mirrors M4 to M8, passes through the polarizer 15, and is input to the multiplexing unit 16.
  • the optical system of probe light from the branching unit 12 to the multiplexing unit 16 is hereinafter referred to as “probe optical system”.
  • the four mirrors M4 to M7 constitute an optical path length difference adjusting unit 14.
  • the multiplexing unit 16 inputs the terahertz wave output from the terahertz wave generation element 20 and transmitted through the measurement object S and the probe light output from the branching unit 12 and arrived, and the terahertz wave and the probe light are coaxial with each other. Are combined and output to the terahertz wave detecting element 40.
  • the multiplexing unit 16 may be a pellicle having a support frame that forms an opening and a film-like mirror bonded to the support frame.
  • the correlation between the terahertz wave and the probe light is detected by the terahertz wave detecting element 40.
  • the terahertz wave detection element 40 may include the nonlinear optical crystal according to the above-described embodiment, or may include another electro-optical crystal.
  • the polarization separation element 52 receives the probe light output from the terahertz wave detection element 40 and passed through the quarter-wave plate 51, separates the input probe light into two polarization components orthogonal to each other, and outputs them.
  • the polarization separation element 52 may be, for example, a Wollaston prism.
  • the photodetectors 53a and 53b include, for example, photodiodes, detect the power of the two polarization components of the probe light polarized and separated by the polarization separation element 52, and difference the electric signal with a value corresponding to the detected power. Output to the dynamic amplifier 54.
  • the differential amplifier 54 receives the electric signal output from each of the photodetectors 53a and 53b, and outputs an electric signal having a value corresponding to the difference between the two electric signals to the lock-in amplifier 55.
  • the lock-in amplifier 55 synchronously detects the electrical signal output from the differential amplifier 54 at the repetition frequency of passing and blocking the pump light in the chopper 13.
  • the signal output from the lock-in amplifier 55 has a value that depends on the electric field strength of the terahertz wave. In this manner, the correlation between the terahertz wave transmitted through the measurement object S and the probe light is detected, and the electric field amplitude of the terahertz wave is detected, so that information on the measurement object S can be obtained.
  • a prism 30 having an entrance surface 30a, an exit surface 30b, and a reflection surface 30c on the terahertz wave optical system between the terahertz wave generating element 20 and the multiplexing unit 16.
  • the measuring object S may be provided on the reflecting surface 30c.
  • the terahertz wave output from the terahertz wave generating element 20 is input to the incident surface 30a, and the input terahertz wave propagates inside the prism 30 and is totally reflected by the reflecting surface 30c.
  • the signal is output from 30 b to the multiplexing unit 16.
  • the terahertz wave measuring apparatus 2 in FIG. 2 is a total reflection terahertz wave measuring apparatus.
  • the terahertz wave measuring apparatus 2 shown in FIG. 3 is also a total reflection terahertz wave measuring apparatus as in FIG. 2, and an internal total reflection prism 31 is provided in place of the prism 30.
  • the terahertz wave generating element 20, the filter 25, and the terahertz wave detecting element 40 are provided integrally with the internal total reflection prism 31.
  • a beam splitter 17 is provided instead of the multiplexing unit 16.
  • the beam splitter 17 may be a pellicle.
  • FIG. 4 is also a diagram showing an embodiment of the terahertz wave measuring apparatus.
  • the terahertz wave measuring apparatus 2 shown in FIG. 4 includes a light source 11, an optical isolator 60, a half-wave plate 61, a branching unit 12, a mirror M20, a two-wavelength parametric oscillator 70, a terahertz wave generating element 20, and a concave mirror MP1.
  • the terahertz wave generating device 1 and the terahertz wave detecting device 3 are provided.
  • the terahertz wave generating element 20 the crystal according to the above-described embodiment can be used.
  • the two-wavelength parametric oscillator 70 includes mirrors M21 and M22 that are opposed to each other on the optical path, and two bulk KTP crystals 71 and 72 that are sequentially provided on the optical path between them.
  • the terahertz wave detecting device 3 includes a mirror M30, an optical parametric oscillator 80, a lens L1, a concave mirror MP2, a terahertz wave detecting element 40, a mirror M33, a lens L2, and a photodetector 62.
  • the optical parametric oscillator 80 includes mirrors M31 and M32 facing each other on the optical path, and a bulk KTP crystal 81 provided on the optical path between them.
  • the terahertz wave detection element 40 may include the crystal according to the above-described embodiment, or may include another electro-optic crystal.
  • the pulsed light 100 output from the light source 11 passes through the optical isolator 60 and the half-wave plate 61 and then branches into two at the branching section 12.
  • One of the branched lights is output as the pump light 101 to the mirror M20, and the other is output as the probe light 102 to the mirror M23.
  • the pump light 101 passes through the mirror M20 and is input to the two-wavelength parametric oscillator 70, and the two-wavelength pump lights 101a and 101b are output from the two-wavelength parametric oscillator 70.
  • the pump lights 101a and 101b are reflected by the mirror M20 and then input to the terahertz wave generating element 20.
  • the terahertz wave generating element 20 outputs a terahertz wave, and this terahertz wave is reflected by the concave mirror MP1 in a direction toward the concave mirror MP2 of the terahertz wave detection device 3.
  • the probe light 102 output from the branching unit 12 is reflected by the mirror M23, passes through the mirror M30, and is input to the optical parametric oscillator 80 of the terahertz wave detection device 3.
  • the probe light 102 output from the parametric oscillator is reflected by the mirror M30, passes through the lens L1 and the concave mirror MP2, and is input to the terahertz wave detection element 40 together with the terahertz wave.
  • the light output from the terahertz wave detection element 40 is reflected by the mirror M33, transmitted through the lens L2, and then input to the photodetector 62.
  • the photodetector 62 may be, for example, an InGaAs photodetector.
  • FIG. 5 is also a diagram showing an embodiment of the terahertz wave measuring apparatus.
  • a terahertz wave measuring apparatus 2 shown in FIG. 5 includes a terahertz wave generating apparatus 1 including a light source 11, a lens L3, a mirror M40, and a terahertz wave generating element 20, a hollow transmission tube 110, a concave mirror MP3, and a low-pass filter 63. And a concave mirror MP4 and a terahertz wave detection device 3.
  • the terahertz wave generating element 20 the crystal according to the above-described embodiment can be used.
  • the light source 11 outputs two-wavelength probe lights (pulse lights) 102a and 102b.
  • the probe lights 102a and 102b are reflected by the mirror M40 and input to the terahertz wave generating element 20.
  • the terahertz wave output from the terahertz wave generating element 20 is transmitted by the hollow transmission tube 110 and output to the concave mirror MP3.
  • the terahertz wave reflected by the concave mirror MP3 passes through the low-pass filter 63 and is then input to the measurement object S.
  • the light transmitted through the measurement object S and reflected by the concave mirror MP4 is input to the terahertz wave detection device 3.
  • DASC Salt / DSTMS of pyridinium represented by the formula (1), wherein R 1 , R 2 and R 3 are methyl groups, and 4-chlorophenylsulfonate represented by the formula (2a), wherein X is a chlorine atom: Pyridinium represented by the formula (1), wherein R 1 , R 2 and R 3 are methyl groups, and represented by the formula (2b), wherein R 4 , R 5 and R 6 are methyl groups 2,4,6 -Salt with trimethylphenyl sulfonate
  • DAST A salt of pyridinium represented by formula (1), wherein R 1 , R 2 and R 3 are methyl groups, and 4-methylphenylsulfonate
  • DAST crystal and DSTMS crystal DAST crystal and DSTMS crystal were prepared by the same procedure as the above mixed crystal.
  • FIG. 6 is a graph showing the relationship between the intensity (amplitude) of the emitted light of each crystal and its frequency.
  • (a) is a DAST crystal
  • (b) is a DSTMS crystal
  • (c) is an evaluation result of a DASC / DSTMS crystal.
  • DAST crystal and DSTMS crystal a local decrease in output intensity is observed near 1 THz
  • a DASC / DSTMS crystal that is a mixed crystal of DASC and DSTMS the output intensity decreases near 1 THz.
  • SYMBOLS 1 ... Terahertz wave generator, 2 ... Terahertz wave measuring device, 3 ... Terahertz wave detector, 11 ... Light source, 12 ... Branch part, 13 ... Chopper, 14 ... Optical path length difference adjustment part, 15 ... Polarizer, 16 ... Combined Wave part, 17 ... beam splitter, 20 ... terahertz wave generating element, 25 ... filter, 30 ... prism, 30a ... entrance surface, 30b ... exit surface, 30c ... reflection surface, 31 ... total internal reflection prism, 40 ... terahertz wave detection Element: 51... 1/4 wavelength plate, 52... Polarization separating element, 53 a, 53 b... Photo detector, 54 ..

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PCT/JP2015/074410 2014-09-02 2015-08-28 非線形光学結晶及びその製造方法、テラヘルツ波発生装置並びにテラヘルツ波測定装置 Ceased WO2016035702A1 (ja)

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GB1702460.5A GB2546183B (en) 2014-09-02 2015-08-28 Non-linear optical crystal and method for manufacturing same, and terahertz-wave generator and terahertz-wave measuring apparatus
US15/505,963 US10248003B2 (en) 2014-09-02 2015-08-28 Non-linear optical crystal and method for manufacturing same, and terahertz-wave generator and terahertz-wave measuring apparatus

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JP2014178042A JP6333676B2 (ja) 2014-09-02 2014-09-02 非線形光学結晶及びその製造方法、テラヘルツ波発生装置並びにテラヘルツ波測定装置。
JP2014-178042 2014-09-02

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023132169A1 (ja) * 2022-01-07 2023-07-13 浜松ホトニクス株式会社 光学部材、光学素子、及び、光学部材の製造方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11709139B2 (en) * 2020-07-24 2023-07-25 New Jersey Institute Of Technology Systems and methods of detecting pipe defects

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005284232A (ja) * 2004-03-29 2005-10-13 Tetsuo Yanai テラヘルツ波発生装置及び計測装置
WO2008034272A1 (en) * 2006-09-18 2008-03-27 ETH Zürich Stilbazolium salt

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5068482B2 (ja) 2006-06-08 2012-11-07 国立大学法人東北大学 テラヘルツ波発生用有機材料
JP5147064B2 (ja) * 2008-03-26 2013-02-20 アークレイ株式会社 有機光学単結晶の製造方法
JP6139327B2 (ja) * 2012-08-30 2017-05-31 アークレイ株式会社 テラヘルツ波分光測定装置及び方法、非線形光学結晶の検査装置及び方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005284232A (ja) * 2004-03-29 2005-10-13 Tetsuo Yanai テラヘルツ波発生装置及び計測装置
WO2008034272A1 (en) * 2006-09-18 2008-03-27 ETH Zürich Stilbazolium salt

Non-Patent Citations (5)

* Cited by examiner, † Cited by third party
Title
B. MONOSZLAI ET AL.: "High-energy terahertz pulses from organic crystals: DAST and DSTMS pumped at Ti:sapphire wavelength", OPTICS LETTERS, vol. 38, no. 23, 1 December 2013 (2013-12-01), pages 5106 - 5109, XP001585946, DOI: doi:10.1364/OL.38.005106 *
MASAHIRO HIRATSUKA ET AL.: "DASC Kessho ni yoru Kotaiiki Terahertz Denjiha no Hassei", 2006 NEN (HEISEI 18 NEN) SHUNKI DAI 53 KAI EXTENDED ABSTRACTS, vol. 3, March 2007 (2007-03-01), pages 1178 *
S. BRAHADEESWARAN ET AL.: "Growth of Ultrathin and Highly Efficient Organic Nonlinear Optical Crystal 4'-Dimethylamino-N-methyl-4- Stilbazolium p-Chlorobenzenesulfonate for Enhanced Terahertz Efficiency at Higher Frequencies", CRYSTAL GROWTH AND DESIGN, vol. 13, no. 2, 10 January 2013 (2013-01-10), pages 415 - 421 *
T. MATSUKAWA ET AL.: "Bulk Crystal Growth of Stilbazolium Derivatives for Terahertz Waves Generation", JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 49, no. 7R, 20 July 2010 (2010-07-20), pages 075502 - 1 - 075502-6 *
TETSUO TANIUCHI ET AL.: "Shin Yuki DAST/DASC Konsho ni Okeru Hacho Kahen Terahertz-ha Hassei Tokusei", 2006 NEN (HEISEI 18 NEN) SHUNKI DAI 53 KAI EXTENDED ABSTRACTS, vol. 3, March 2006 (2006-03-01), pages 1177 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023132169A1 (ja) * 2022-01-07 2023-07-13 浜松ホトニクス株式会社 光学部材、光学素子、及び、光学部材の製造方法
JP2023101198A (ja) * 2022-01-07 2023-07-20 浜松ホトニクス株式会社 光学部材、光学素子、及び、光学部材の製造方法

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