WO2015180266A1 - 电网金属材料电磁脉冲涡流检测装置 - Google Patents

电网金属材料电磁脉冲涡流检测装置 Download PDF

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Publication number
WO2015180266A1
WO2015180266A1 PCT/CN2014/084597 CN2014084597W WO2015180266A1 WO 2015180266 A1 WO2015180266 A1 WO 2015180266A1 CN 2014084597 W CN2014084597 W CN 2014084597W WO 2015180266 A1 WO2015180266 A1 WO 2015180266A1
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Prior art keywords
signal
circuit
eddy current
chip microcomputer
probe
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PCT/CN2014/084597
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English (en)
French (fr)
Inventor
程明
安戈
文黎
叶芳
曹建伟
陈韶瑜
温力
李庆钊
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国家电网公司
国网天津市电力公司
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Publication of WO2015180266A1 publication Critical patent/WO2015180266A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents

Definitions

  • the invention relates to the technical field of non-destructive testing of power systems, in particular to an electromagnetic pulse eddy current detecting device for grid metal materials. Background technique
  • Eddy current testing is a non-destructive testing technology that has developed rapidly in recent years. It is sensitive to surface cracks and can be tested in harsh environments such as surface coating, rough surface and humidity. It has simple structure, high sensitivity and frequency response. Good characteristics and simple test circuit, especially suitable for the detection of fatigue cracks and surface stress cracks in metal materials with complex shapes.
  • the wide frequency characteristics of the pulsed eddy current make it ideal for crack detection in deep metal layers and the excitation of the pulse characteristics allows the eddy current to have a very high peak in the metal, making it easy to observe and measure.
  • the pulse characteristics enable transient analysis that cannot be performed by conventional eddy current testing. Electromagnetic pulse eddy current can realize the surface detection of materials, but there is no special device for electromagnetic pulse eddy current detection of grid metal materials. Summary of the invention
  • the object of the present invention is to overcome the deficiencies of the prior art and to provide an electromagnetic pulse eddy current detecting device for a grid metal material.
  • An electromagnetic pulse eddy current detecting device for grid metal materials comprising a single chip microcomputer, the single chip generates a periodic trigger pulse, the trigger pulse is input to the oscillator, the output of the oscillator is connected with the probe, and the sinusoidal excitation signal generated by the oscillator is transmitted to the excitation coil of the probe.
  • the excitation coil is placed on the tested test piece, and the sinusoidal excitation signal is emitted to the test piece, and the detection coil of the probe collects the reflection signal of the test piece.
  • the detecting coil outputs the reflected signal of the collected test piece to the signal detecting circuit, and the signal detecting circuit extracts a portion sensitive to the crack defect from the reflected signal of the test piece and supplies it to the amplifier, and the amplifier is connected with the A/D conversion circuit.
  • the amplified signal is converted into a digital signal and then sent to the single-chip microcomputer. After the single-chip computer processes and judges the input signal, the buzzer is driven, and the relative size of the crack defect is displayed through the IED display.
  • the probe includes an excitation coil wound on a U-shaped magnet, and a magnetic bar perpendicular to a plane of the U-shaped magnet is disposed at a center point of the opening of the U-shaped magnet, and a detection coil is wound on the magnetic bar, and the excitation coil is wound
  • the detection coil is perpendicular to each other, and both ends of the excitation coil are excitation ends corresponding to the position of the test piece, and the detection coil induces a change of the eddy current counter magnetic field, and is outputted by the output end of the detection coil, and is converted into an electrical signal by the hardware circuit.
  • the oscillator is an LC oscillating circuit that generates an excitation signal.
  • the signal detecting circuit comprises an amplifying circuit, the output of the amplifying circuit is connected with a filter circuit for eliminating various interferences, the filter circuit is connected with the signal selecting circuit, the signal selecting circuit is connected with the peak computing circuit, and the peak computing circuit is timed.
  • the collected current signal is tracked, the peak value of the current signal is selected, and converted into a DC signal output to the A/D conversion circuit.
  • the front end of the filter circuit uses a high-pass filter to filter the power frequency interference caused by power supply harmonics and the clutter interference when moving the probe, and the second stage uses a band-pass filter controlled by the signal selection circuit.
  • the signal selection circuit is composed of a capacitor matrix and a potentiometer.
  • the peak operation circuit specifically adopts a circuit composed of a sample holder and a comparator.
  • the single-chip microcomputer specifically adopts the MCS8051 model single-chip microcomputer, and the A/D conversion circuit specifically adopts the model type AD14433, and the single-chip microcomputer receives the signal outputted by the A/D conversion circuit through the P0 interface, and the P2 interface of the single-chip microcomputer and the buzzer switch
  • the control interface is connected, and the P1 interface of the MCU is connected to the drive interface of the LED display.
  • Face crack detection device which applies the basic principle of electromagnetic pulse eddy current flaw detection, uses magnetic material to make a fine eddy current sensor, which is used for extracting weak crack signal at the front end, applying single chip control circuit in the background, processing extracted filtering, amplification, A /D conversion and other signals, and finally the sound and light alarms are driven by the single-chip microcomputer.
  • the buzzer sounds an alarm and simultaneously lights a different number of LEDs to show the relative depth of the crack.
  • Figure 1 is a configuration diagram of the apparatus of the present invention
  • Figure 2 is a schematic structural view of a probe in the device of the present invention.
  • FIG. 3 is a circuit schematic diagram of the oscillator of the present invention.
  • Figure 4 is a block diagram of a signal detecting circuit in the present invention.
  • Figure 5 is a schematic diagram of a peak operation circuit in the signal detecting circuit of the present invention.
  • FIG. 6 is a schematic diagram showing the connection between a single chip microcomputer and an AD conversion circuit in the present invention
  • FIG. 7 is a schematic diagram of the control of the single chip microcomputer in the present invention. detailed description
  • the electromagnetic pulse eddy current detecting device of the grid metal material of the invention comprises a single chip microcomputer, and the single chip generates a periodic trigger pulse, the trigger pulse is input to the oscillator, the output of the oscillator is connected with the probe, and the sinusoidal excitation signal generated by the oscillator is generated.
  • the excitation coil is transmitted to the excitation coil of the probe, the excitation coil is placed on the tested test piece, and the sinusoidal excitation signal is emitted to the test piece.
  • the detection coil of the probe collects the reflection signal of the test piece, and the detection coil outputs the reflected signal of the sampled sample to the signal detection.
  • the signal detection circuit extracts the portion sensitive to the crack defect from the reflected signal of the test piece and supplies it to the amplifier, and the amplifier is connected with the A/D conversion circuit, and converts the amplified signal into a digital signal and then supplies it to the single chip microcomputer, the single chip microcomputer After processing the input signal, the buzzer is driven and connected.
  • the probe includes an excitation coil 1 wound on a U-shaped magnet 2, and a magnetic bar perpendicular to a plane of the U-shaped magnet is disposed at a center point of the opening of the U-shaped magnet.
  • a detection coil 3 is wound on the magnetic bar, the excitation coil and the detection coil are perpendicular to each other, and both ends of the excitation coil are excitation ends corresponding to the position of the test piece, and a sine wave of a certain frequency is passed through the excitation coil.
  • the surface of the test piece will produce a certain distribution and size of eddy current under the action of alternating magnetic field.
  • the detection coil induces the eddy current diamagnetic field.
  • the change is outputted by the output of the detection coil, converted into an electrical signal by a hardware circuit, and the defect can be reflected by the change.
  • the oscillator is an excitation signal generating circuit
  • the circuit includes a switching circuit composed of a resistor R2 and a PNP transistor, and a resistor R1 and a capacitor connected to the switching circuit.
  • C1 and the excitation coil L1 are connected in parallel and connected with the diode D1 to form an LC oscillation circuit.
  • L2 is a detection coil.
  • the signal detection circuit includes an amplifying circuit that amplifies a weak voltage signal to a suitable value (about 2V) for later processing, and a filtering circuit for eliminating various types of interference.
  • the filter circuit is connected to the signal selection circuit.
  • the signal selection circuit controls the desired frequency of the filter by controlling the bandpass frequency of the filter, and controls the output frequency of the oscillator.
  • the control frequency range is: 100 Hz 6 MHz.
  • the signal selection circuit is connected to the peak operation circuit, and the peak operation circuit tracks the current signal collected at the time, selects the peak value of the current signal, and converts it into a DC signal to output to the A/D conversion circuit.
  • the front end of the filter circuit uses a high-pass filter to filter power frequency interference caused by power supply harmonics and the clutter interference when moving the probe.
  • the second stage uses a band-pass filter controlled by a signal selection circuit for selecting different penetration depths.
  • the frequency of the defect is only allowed to pass the strobe signal.
  • the bandpass frequency adjustment range is 100Hz - 6 ⁇ z, and the corresponding penetration depth is 0-9.99.
  • the signal selection circuit is composed of a capacitor matrix and a potentiometer, and is processed by a specific matching circuit.
  • the band-pass frequency of the filter is changed by changing the filter capacitor parameter value and the potentiometer resistance value matched with the filter, and the crack penetration is selected. Depth and different forms of damage matched to different forms of frequency component signals, so that different frequencies can be selected according to different penetration depths, and frequencies corresponding to this depth can be selected to suppress other interference frequencies, thereby being able to Different forms of damage are effectively detected.
  • the peak operation circuit is specifically composed of a sample holder and a comparator. As shown in FIG. 5, when Vi>Vo, the A1 output is at a high level, and the diode V D is turned on to charge the capacitor CAp and control the A2 sampling. After the peak, Vi ⁇ Vo, A1 output is low, diode V D is reversed, capacitor CAp continues to maintain voltage, and A2 continues to make A2 continue to output Vo at this time, that is, the peak is held and converted into DC signal Send it to the AD for sampling, and use this as the signal that the MCU starts the A/D and start sampling.
  • the peak sampling circuit has two functions: sample and hold. The sample value hold time is automatically set according to the output frequency. The eddy current conductivity meter we developed, because the standard signal is usually at 10 kHz and the frequency is low, Al and A2 use a peak sampling circuit such as LF398. The effect is better.
  • the amplifying circuit specifically adopts an amplifying circuit in a differential form, and the amplifying circuit amplifies the 10-200 mV weak signal outputted by the detecting coil to a 1-2 V amplitude.
  • the single-chip microcomputer specifically adopts a single-chip microcomputer of the MCS8051 type, and the specific type of the A/D conversion circuit is AD14433, and the single-chip microcomputer receives the output of the A/D conversion circuit through the P0 interface.
  • the signal, the P2 interface of the single chip microcomputer is connected with the switch control interface of the buzzer, and the buzzer alarm is driven by the trigger signal in the form of different frequency rhythm pulses, and the P1 interface of the single chip microcomputer is connected with the driving interface of the LED display to digitally form the LED.
  • the penetration depth and test time are shown on the display.
  • the processing process of the input signal by the single chip microcomputer is:
  • the control signal is used as the external interrupt input signal of the microcontroller, and the interrupt trigger mode is The edge trigger mode is used as the signal that the MCU starts A/D and starts sampling.
  • the control port line is set to the level required for sampling (high level for LF398). After the interrupt signal comes, it is set to Hold the level (low for LF398) and start A/D to start sampling data.
  • the MCU obtains the digital voltage value from the A/D converter AD14433, converts it linearly into the penetration depth, and stores the penetration depth in the RAM6264 memory according to the measurement point and time, and displays the measurement point in the liquid crystal display. The penetration depth at the measurement time and the measurement time. When the detected crack or damage exceeds the set value, the buzzer sounds a rapid alarm. After the measurement is completed, the displacement data stored at different measuring points in the RAM6264 can be printed out by the micro-printer according to the needs of the measuring point, or the displacement data of each measuring point at different times can be sent to the PC through the RS232 serial communication interface. Processing again.

Abstract

一种电网金属材料电磁脉冲涡流检测装置，包括单片机，单片机产生周期性触发脉冲到振荡器，振荡器的输出与探头连接，将振荡器产生的正弦激励信号传输到探头上，探头向试件发射正弦激励信号，并采集试件的反射信号输出给信号检出电路，信号检出电路从试件反射信号中提取出对裂纹缺陷敏感的部分并输送给放大器，放大器与A/D转换电路连接，将放大后的信号转换成数字信号后输送给单片机，单片机对输入信号进行处理判断后驱动蜂鸣器，并通过LED显示器显示裂纹缺陷的相对大小。上述装置是一种结构简单、灵敏度高且便于携带的金属表面和近表面裂纹检测装置。

Description

电网金属材料电磁脉冲涡流检测装置 技术领域
本发明涉及电力系统无损检测技术领域， 特别是涉及一种电网金属 材料电磁脉冲涡流检测装置。 背景技术
电网金属材料形状复杂，传统的表面检测方法如磁粉、渗透已不能完 全适用。涡流检测是近年来发展较快的一种无损检测技术，对表面开口裂 纹很灵敏，在表面涂层、表面粗糙、潮湿等恶劣环境下也能开展检测工作， 具有结构简单、灵敏度高、频率响应特性好以及测试电路简单等优点， 特 别适用于形状复杂的电网金属材料的疲劳裂纹和表面应力裂纹的检测工 作。脉冲涡流所具有的宽频特性使它非常适合于金属深层的裂纹检测而且 激励的脉冲特性使涡流在金属中存在一个很高的峰值， 易于观察和测量。 而且脉冲特性能够进行传统涡流检测所不能进行的瞬态分析。电磁脉冲涡 流可以实现材料的表面检测，但是目前并没有针对电网金属材料电磁脉冲 涡流检测的专用装置。 发明内容
本发明的目的在于克服现有技术的不足，提供一种电网金属材料电磁 脉冲涡流检测装置。
为此， 本发明的技术方案如下：
一种电网金属材料电磁脉冲涡流检测装置，包括单片机，单片机产生 周期性触发脉冲， 触发脉冲输入到振荡器， 振荡器的输出与探头连接， 将 振荡器产生的正弦激励信号传输到探头的激励线圈上，激励线圈置于被检 测试件上， 向试件发射正弦激励信号，探头的检测线圈采集试件的反射信 号，检测线圈将采集的试件反射信号输出给信号检出电路，信号检出电路 从试件反射信号中提取出对裂纹缺陷敏感的部分并输送给放大器，放大器 与 A/D转换电路连接， 将放大后的信号转换成数字信号后输送给单片机， 单片机对输入信号进行处理判断后，驱动蜂鸣器，并通过 IED显示器显示 裂纹缺陷的相对大小。
而且， 所述探头包括缠绕在 U型磁体上的激励线圈， 在 U型磁体的开 口中心点处安置有与 U型磁体平面垂直的磁棒， 在磁棒上缠绕有检测线 圈，所述激励线圈与检测线圈相互垂直，激励线圈的两端为与试件位置相 对应的激励端，检测线圈感应涡流反磁场的变化，并由检测线圈的输出端 输出， 由硬件电路转化为电信号。
而且， 所述振荡器是一个产生激励信号的 LC振荡电路。
而且，所述信号检出电路包括放大电路，放大电路的输出与用来消除 各种干扰的滤波电路连接，滤波电路与信号选择电路连接，信号选择电路 与峰值运算电路连接， 峰值运算电路对时时采集到的电流信号进行跟踪， 将电流信号的峰值选择出， 并转换成直流信号输出给 A/D转换电路。
其中，滤波电路前端采用高通滤波器用于滤除电源谐波造成的工频干 扰和移动探头时的杂波干扰，第二级采用受信号选择电路控制的带通滤波 器。
其中， 信号选择电路由电容矩阵和电位器组成。
其中， 峰值运算电路具体采用由采样保持器和比较器组成的电路。 而且，所述单片机具体采用 MCS8051型号的单片机，所述 A/D转换电 路具体采用的型号为 AD14433 , 单片机通过 P0接口接收 A/D转换电路输 出的信号， 单片机的 P2接口与蜂鸣器的开关控制接口连接， 单片机的 P1 接口与 LED显示屏的驱动接口连接。
本发明的优点和积极效果是：
本发明提供了一种结构简单、灵敏度高且便于携带的金属表面和近表 面裂纹检测装置，该装置应用电磁脉冲涡流探伤的基本原理，采用磁性材 料制作一种精细的涡流传感器，用于前端提取微弱的裂纹信号，后台应用 单片机控制电路， 处理提取的滤波、 放大、 A/D转换等信号， 最后由单片 机驱动声、 光报警， 当发现缺陷时， 蜂鸣器发出声音警报，并同时点亮不 同个数的 LED,显示裂纹的相对深度。 附图说明
图 1是本发明装置的构成图；
图 2是本发明装置中探头的结构原理图；
图 3是本发明振荡器的电路原理图；
图 4是本发明中信号检出电路的框图；
图 5是本发明信号检出电路中峰值运算电路的原理图；
图 6是本发明中单片机与 AD转换电路的连接原理图；
图 7是本发明中单片机控制原理图。 具体实施方式
以下结合附图对本发明实施例做进一步详述， 以下实施例只是描述 性的， 不是限定性的， 不能以此限定本发明的保护范围。
如图 1 所示， 本发明的电网金属材料电磁脉冲涡流检测装置包括单 片机， 单片机产生周期性触发脉冲，触发脉冲输入到振荡器， 振荡器的输 出与探头连接， 将振荡器产生的正弦激励信号传输到探头的激励线圈上， 激励线圈置于被检测试件上， 向试件发射正弦激励信号，探头的检测线圈 采集试件的反射信号，检测线圈将采集的试件反射信号输出给信号检出电 路，信号检出电路从试件反射信号中提取出对裂纹缺陷敏感的部分并输送 给放大器，放大器与 A/D转换电路连接，将放大后的信号转换成数字信号 后输送给单片机， 单片机对输入信号进行处理判断后， 驱动蜂鸣器， 并通 在本发明的具体实施中， 如图 2所示， 所述探头包括缠绕在 U型磁体 2 上的激励线圈 1，在 U型磁体的开口中心点处安置有与 U型磁体平面垂直的 磁棒 4， 在磁棒上缠绕有检测线圈 3， 所述激励线圈与检测线圈相互垂直， 激励线圈的两端为与试件位置相对应的激励端，在激励线圈上通以一定频 率的正弦波， 当探头沿着试件表面移动时，试件表面在交变磁场作用下会 产生一定分布和大小的涡流， 当有裂纹时，涡流分布和大小会发生相应的 改变， 检测线圈感应涡流反磁场的变化， 并由检测线圈的输出端输出， 由 硬件电路转化为电信号， 通过变化情况可反映缺陷的情况。
在本发明的具体实施中，如图 3所示，所述振荡器为激励信号产生电 路， 该电路包括一个由电阻 R2和 PNP三极管组成的开关电路， 及与开关 电路连接的由电阻 R1与电容 C1及激励线圈 L1并联后与二极管 D1串联组 成的 LC振荡电路， 图中 L2为检测线圈，单片机产生周期性触发脉冲后通 过该激励信号产生电路产生激励信号，激励信号是一个近似的正弦波， LC 振荡电路的优点是结构简单， 容易起振， 频率便于调整。
在本发明的具体实施中，所述信号检出电路包括将微弱的电压信号放 大到适合值 （2V 左右） 以便后级处理的放大电路， 以及用来消除各种干 扰的滤波电路。滤波电路与信号选择电路连接，信号选择电路通过控制滤 波器的带通频率来选通所需信号， 同时控制振荡器的输出频率，其控制频 率范围为： 100Hz 6MHz。 信号选择电路与峰值运算电路连接， 峰值运 算电路对时时采集到的电流信号进行跟踪，将电流信号的峰值选择出，并 转换成直流信号输出给 A/D转换电路。
其中，滤波电路前端采用高通滤波器用于滤除电源谐波造成的工频干 扰和移动探头时的杂波干扰， 第二级采用带通滤波器受信号选择电路控 制， 用于选择不同的渗透深度缺陷所反应的频率， 仅允许选通信号通过， 其带通频率调节范围为 100Hz—— 6匪 z， 对应的渗透深度为 0— 9. 99讓。 其中， 信号选择电路由电容矩阵和电位器组成， 采用特定匹配电路 进行处理，通过改变与滤波器匹配的滤波电容参数值和电位器电阻值来改 变滤波器的带通频率，选择出与裂纹渗透深度及不同形式损伤相匹配的不 同形式频率分量信号，从而可根据不同的渗透深度选择不同的频率，筛选 出与这一深度相适应的频率而抑制其他干扰频率， 由此能对不同深度缺 陷、 不同形式损伤进行有效的检测。
其中， 峰值运算电路具体由采样保持器和比较器组成， 如图 5所示， 当 Vi〉Vo时， A1输出为高电平， 二极管 VD导通给电容 CAp充电并控制 A2 采样， 当经过峰值后， Vi〈Vo， A1输出为低电平， 二极管 VD反向截止， 电 容 CAp继续保持电压， 并给 A2续航使此时的 A2继续输出 Vo， 即， 峰值 被保持并转换成直流信号，送给 AD进行采样，并以此作为单片机启动 A/D 的信号， 开始采样。 峰值采样电路有两个功能： 采样和保持。采样值保持 时间， 根据输出频率自动设置。我们所研制的涡流电导仪， 由于通常标准 信号在 10kHz以一下， 频率较低， 因此 Al、 A2采用 LF398这样的峰值采 样电路。 其效果较好。
在本发明的具体实施中， 所述放大电路具体采用差动形式的放大电 路， 该放大电路是将检测线圈输出的 10— 200mV微弱信号放大到 1-2V幅 值。
在本发明的具体实施中， 如图 6所示， 所述单片机具体采用 MCS8051 型号的单片机， 所述 A/D转换电路具体采用的型号为 AD14433, 单片机通 过 P0接口接收 A/D转换电路输出的信号，单片机的 P2接口与蜂鸣器的开 关控制接口连接， 以不同频率节奏脉冲形式的触发信号驱动蜂鸣器报警， 单片机的 P1接口与 LED显示屏的驱动接口连接， 以数字形在式 LED显示 屏上显示渗透深度及测试时间。
如图 7所示， 所述单片机对输入信号的处理过程为：
( 1 ) 控制信号又作为单片机的外部中断输入信号， 中断触发方式为 边沿触发方式， 以此作为单片机启动 A/D的信号， 开始采样。用单片机的 一个 I/O口， 作为采样保持器的控制口线， 中断信号来之前， 该控制口线 置为采样所需电平（对 LF398为高电平）， 中断信号来后， 置为保持电平 (对 LF398为低电平） ， 并启动 A/D开始采样数据。
( 2 ) 单片机从 A/D转换器 AD14433中获得数字电压值， 将其线性的 折算成渗透深度， 并将该渗透深度按测量点和时间存到 RAM6264存储器 中， 同时液晶显示器中显示该测量点该测量时刻的渗透深度和该测量时 间。 当检测到的裂纹或损伤超过设定值时， 蜂鸣器发出急促的报警声。 测量完成后，存放在 RAM6264中各测量点不同时刻的位移数据，可以根据 需要按测量点通过微型打印机打印输出，也可以通过 RS232串行通讯接口 将各个测量点不同时刻的位移数据送到 PC计算机中再处理。

Claims

权利要求书
1、 一种电网金属材料电磁脉冲涡流检测装置， 其特征在于： 包括单 片机， 单片机产生周期性触发脉冲，触发脉冲输入到振荡器， 振荡器的输 出与探头连接， 将振荡器产生的正弦激励信号传输到探头的激励线圈上， 激励线圈置于被检测试件上， 向试件发射正弦激励信号，探头的检测线圈 采集试件的反射信号，检测线圈将采集的试件反射信号输出给信号检出电 路，信号检出电路从试件反射信号中提取出对裂纹缺陷敏感的部分并输送 给放大器，放大器与 A/D转换电路连接，将放大后的信号转换成数字信号 后输送给单片机， 单片机对输入信号进行处理判断后， 驱动蜂鸣器， 并通 过 IED显示器显示裂纹缺陷的相对大小。
2、 根据权利要求 1所述的电网金属材料电磁脉冲涡流检测装置，其特 征在于： 所述探头包括缠绕在 U型磁体上的激励线圈， 在 U型磁体的开口 中心点处安置有与 U型磁体平面垂直的磁棒， 在磁棒上缠绕有检测线圈， 所述激励线圈与检测线圈相互垂直，激励线圈的两端为与试件位置相对应 的激励端，检测线圈感应涡流反磁场的变化，并由检测线圈的输出端输出， 由硬件电路转化为电信号。
3、 根据权利要求 1所述的电网金属材料电磁脉冲涡流检测装置， 其 特征在于： 所述振荡器是一个产生激励信号的 LC振荡电路。
4、 根据权利要求 1所述的电网金属材料电磁脉冲涡流检测装置， 其 特征在于：所述信号检出电路包括放大电路，放大电路的输出与用来消除 各种干扰的滤波电路连接，滤波电路与信号选择电路连接，信号选择电路 与峰值运算电路连接， 峰值运算电路对时时采集到的电流信号进行跟踪， 将电流信号的峰值选择出， 并转换成直流信号输出给 A/D转换电路， 其中，滤波电路前端采用高通滤波器用于滤除电源谐波造成的工频干 扰和移动探头时的杂波干扰，第二级采用受信号选择电路控制的带通滤波 器；
其中， 信号选择电路由电容矩阵和电位器组成；
其中， 峰值运算电路具体采用由采样保持器和比较器组成的电路。
5、 根据权利要求 1所述的电网金属材料电磁脉冲涡流检测装置， 其 特征在于：所述单片机具体采用 MCS8051型号的单片机，所述 A/D转换电 路具体采用的型号为 AD14433 , 单片机通过 P0接口接收 A/D转换电路输 出的信号， 单片机的 P2接口与蜂鸣器的开关控制接口连接， 单片机的 P1 接口与 LED显示屏的驱动接口连接。
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