WO2015130091A1 - Wired rubber contact and manufacturing method therefor - Google Patents

Wired rubber contact and manufacturing method therefor Download PDF

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Publication number
WO2015130091A1
WO2015130091A1 PCT/KR2015/001847 KR2015001847W WO2015130091A1 WO 2015130091 A1 WO2015130091 A1 WO 2015130091A1 KR 2015001847 W KR2015001847 W KR 2015001847W WO 2015130091 A1 WO2015130091 A1 WO 2015130091A1
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WO
WIPO (PCT)
Prior art keywords
film
raw
rubber layer
openings
electrode portion
Prior art date
Application number
PCT/KR2015/001847
Other languages
French (fr)
Korean (ko)
Inventor
김형익
Original Assignee
주식회사 화우로
김형익
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1020140103269A external-priority patent/KR101544844B1/en
Application filed by 주식회사 화우로, 김형익 filed Critical 주식회사 화우로
Priority to CN201580007479.4A priority Critical patent/CN106030916B/en
Priority to US15/030,400 priority patent/US10191085B2/en
Publication of WO2015130091A1 publication Critical patent/WO2015130091A1/en
Priority to US16/050,447 priority patent/US20180348260A1/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/0735Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00Constructional details common to different types of electric apparatus
    • H05K7/02Arrangements of circuit components or wiring on supporting structure
    • H05K7/10Plug-in assemblages of components, e.g. IC sockets
    • H05K7/1053Plug-in assemblages of components, e.g. IC sockets having interior leads
    • H05K7/1061Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/10Bump connectors ; Manufacturing methods related thereto
    • H01L24/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L24/13Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/00014Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details

Definitions

  • the present invention relates to a wired rubber contact and a method of manufacturing the same, and more particularly, to a wired rubber contact and a method of manufacturing the improved life and reliability.
  • the inspection process is very important as it is directly related to the reliability of the product on the market.
  • Semiconductors require intermediate inspections not only after the packaging phase but also before it.
  • Conventional anisotropic pads have a structure in which insulating silicone rubber is disposed between electrodes and upper and lower electrodes are cured of a silicone resin in which conductive particles are dispersed well, so that the electrodes are electrically energized above and below the electrodes.
  • An object of the present invention for solving the above problems is to provide a wired rubber contact with increased life and improved reliability.
  • Another object of the present invention is to provide a method of manufacturing the wired rubber contact.
  • the wired rubber contact includes a lower film, an upper film, a plurality of conductive wires, a rubber layer, and a film guide.
  • the lower film includes a central region in which a plurality of openings are formed and a peripheral region surrounding the central region, and includes a plurality of lower electrode portions formed in the openings.
  • the upper film includes a plurality of openings and a plurality of upper electrode portions formed in the openings, and an edge thereof is disposed inward of a boundary between the central area and the peripheral area of the lower film.
  • the plurality of conductive wires are disposed between the lower film and the upper film and connect between the lower electrode portions and the upper electrode portions.
  • the rubber layer includes an elastic material and is disposed in the central region of the lower film, and an edge protrudes outward from an edge of the upper film, and fills the conductive wires and between the lower film and the upper film. Keep the distance constant.
  • the film guide may include a film guide disposed on the peripheral area of the lower film along the side surface of the rubber layer, integrally formed with the lower film, and having a thickness thicker than that of the lower film.
  • the upper film and the lower film may be formed integrally with the rubber layer.
  • a wired rubber contact for achieving the above object of the present invention, first penetrating each of the openings in the lower film including a central region formed with a plurality of openings and a peripheral region surrounding the central region; A lower electrode part is formed. Subsequently, a support plate for preventing the flow of the lower film on the peripheral area and opening the center to expose the center area is attached. Thereafter, conductive wires arranged in a vertical direction on the lower electrode portion are coupled. Subsequently, a mold surrounding the central area is formed on the support plate.
  • a raw upper film including a plurality of openings and a plurality of upper electrode portions formed in the openings is disposed on the conductive wire and the mold, and an upper end of the conductive wire is coupled to the upper electrode portions.
  • a rubber layer is formed in an inner space defined by the lower film, the mold, and the raw upper film.
  • the raw upper film is cut along a cutting line disposed inward from a boundary between the central area and the peripheral area of the lower film to form an upper film having an edge disposed inward of an edge of the rubber layer.
  • the mold and the support plate are removed.
  • a film guide is attached onto the peripheral area of the lower film.
  • the attaching the film guide may include forming the film guide integrally with the lower film.
  • the wired rubber contact includes a lower film, an upper film, a plurality of conductive wires, a rubber layer, a film guide, and a coupling member.
  • the lower film includes a plurality of openings and a plurality of lower electrode portions formed in the openings.
  • the upper film includes a plurality of openings and a plurality of upper electrode portions formed in the openings and facing the lower electrode portions.
  • the conductive wires are disposed between the lower film and the upper film and connect between the lower electrode portions and the upper electrode portions, and the length of the conductive wires is longer than a separation distance between the lower film and the upper film.
  • the rubber layer includes an elastic material and is disposed between the lower film and the upper film to fill the conductive wires and to maintain a constant distance between the lower film and the upper film.
  • the film guide is disposed to surround side surfaces of the rubber layer and the lower film and has a thickness thicker than that of the lower film.
  • the adhesive member includes an elastic adhesive and is attached to a side surface of the rubber layer and an upper surface of the film guide to bond the rubber layer and the film guide.
  • the coupling member may include an adhesive member or a coupling jig.
  • a raw bottom film including parts and a raw top film including a plurality of openings and a plurality of upper electrode parts formed in the openings are arranged side by side.
  • the lower electrode portion and the upper electrode portion are connected with a conductive wire.
  • a silicon rubber is injected and cured between the raw upper film and the raw lower film.
  • the raw upper film, the cured silicon rubber and the raw lower film are cut along the boundary between the central area and the peripheral area to form an upper film, a rubber layer and a lower film.
  • the adhesive tape is attached to cover the entire lower surface of the film guide having a central opening having the same or larger size as the central region.
  • the lower surface of the lower film is attached to the adhesive tape exposed through the central opening.
  • the rubber layer is bonded to the film guide.
  • the adhesive tape is removed.
  • the connecting of the lower electrode part and the upper electrode part with a conductive wire may include: forming the lower film and the upper part along two conveyors disposed to face each other such that an upper separation distance is greater than a lower separation distance. Moving the film; And sequentially connecting the lower electrode portion and the upper electrode portion with the conductive wires as the lower film and the upper film are moved.
  • the lower electrode portion fills the opening of the raw lower film
  • the upper electrode portion is formed along the edge of the opening of the upper upper film to form a through hole in the center
  • the connecting of the electrode unit with the conductive wire may include: arranging the source upper film and the source lower film such that the lower electrode part is exposed through the through hole of the upper electrode part; Connecting one end of the conductive wire to an upper surface of the lower electrode portion and connecting the other end of the conductive wire to an upper surface or an inner surface of the upper electrode portion; And disposing the conductive wire between the raw upper film and the original lower film by separating the distance between the original upper film and the original lower film.
  • the connecting of the lower electrode portion and the upper electrode portion with a conductive wire may further include filling the through hole by soldering the upper electrode portion.
  • the lower electrode portion and the upper electrode portion of the conductive member is firmly coupled to the lower film and the upper film is embedded in the rubber layer or the lower electrode portion or the upper electrode portion Defects are prevented.
  • the peripheral area corresponding to the edge of the lower film extends to the outside of the rubber layer and the film guide is combined with the lower film in the peripheral area, so that the wired rubber contact can be easily disposed or fixed on the stage.
  • the film guide is disposed adjacent to the rubber layer to disperse the external force, thereby preventing the external force from concentrating on the boundary between the lower film and the rubber layer. Therefore, the lower film is prevented from peeling off from the rubber layer.
  • a gap is formed between the edge of the upper film and the edge of the center region of the lower film, thereby preventing the upper film from being peeled from the rubber layer by external force, thereby making the electrical connection of the conducting member stable.
  • the upper film and the lower film cover the upper and lower surfaces of the rubber layer to protect the rubber layer and the conducting member from external contaminants such as dust and moisture.
  • the lower surface of the lower film is attached to the adhesive tape by pressing the upper film, but the lower electrode portion is disposed below the lower surface of the film guide.
  • the lower electrode portion can easily contact the electrode pad of the stage after the adhesive tape is removed.
  • the elastic member and the film guide cover the side of the rubber layer, the lower film and the upper film to prevent the lower film or the upper film from being peeled from the rubber layer from external impact.
  • the adhesive member has elasticity to prevent external shock from being transmitted to the energizing member.
  • the conductive wire can be continuously attached through the conveyor, so that the manufacturing time is shortened.
  • the length of the conductive wire is longer than the distance between the raw lower film and the upper upper film and the distance between the lower film and the upper film, thereby preventing the conductive wire from being broken by external impact during the manufacturing process.
  • the process time is shortened by interposing the conductive wire and the mold between the raw top film and the raw bottom film in a continuous process.
  • the rubber layer is formed only in the inner space formed using the mold, so that the process of cutting the cured silicon rubber is omitted, thereby reducing defects in the cutting process.
  • the upper electrode portion and the lower electrode portion have different structures, and thus it is possible to combine a plurality of conductive wires at the same time with the upper electrode portion and the lower electrode portion.
  • FIG. 1 is a plan view illustrating a wired rubber contact according to an embodiment of the present invention.
  • FIG. 2 is a cross-sectional view taken along line II ′ of FIG. 1.
  • FIG. 3 is a cross-sectional view illustrating a state in which the rubber contact illustrated in FIG. 1 is disposed between a semiconductor chip and a stage.
  • 4, 6, 7, 9, 11, 12, 14, 15 to 17 are cross-sectional views illustrating a method of manufacturing the wired rubber contact shown in FIG. 1.
  • 5, 8, 10, and 13 are plan views illustrating a method of manufacturing the wired rubber contact shown in FIG. 1.
  • FIG. 18 is a cross-sectional view illustrating a method of manufacturing a wired rubber contact according to an embodiment of the present invention.
  • 19 and 20 are enlarged cross-sectional views of portions 'A' and 'B' of FIG. 18.
  • 21, 22, 24, 26, 28, 30, and 31 are cross-sectional views illustrating a method of manufacturing the wired rubber contact shown in FIG. 18.
  • FIG. 23 23, 25, 27 and 29 are plan views illustrating a method of manufacturing the wired rubber contact illustrated in FIG. 18.
  • FIG. 32 is a cross-sectional view illustrating a method of manufacturing a wired rubber contact according to an embodiment of the present invention.
  • FIG. 33 is an enlarged cross-sectional view of a portion 'C' of FIG. 32.
  • 34 to 37 are cross-sectional views illustrating a method of manufacturing the wired rubber contact shown in FIG. 32.
  • 38 and 39 are cross-sectional views illustrating a method of manufacturing a wired rubber contact according to an embodiment of the present invention.
  • first and second may be used to describe various components, but the components should not be limited by the terms. The terms are used only for the purpose of distinguishing one component from another.
  • the first component may be referred to as the second component, and similarly, the second component may also be referred to as the first component.
  • FIG. 1 is a plan view illustrating a wired rubber contact according to an exemplary embodiment of the present invention
  • FIG. 2 is a cross-sectional view taken along the line II ′ of FIG. 1.
  • the wired rubber contact includes a film assembly 100, a rubber layer 150, an upper film 200, and an energizing member 300.
  • the film assembly 100 includes a lower film 110 and a film guide 120.
  • the lower film 110 includes a thin synthetic resin film.
  • the lower film 110 may have a thickness of 100 ⁇ m to 250 ⁇ m.
  • the lower film 110 may include a synthetic resin such as polyimide, polyvinyl, polypropylene, polycarbonate, FR4, PVC, and the like.
  • the lower film 110 includes a central area CA and a peripheral area PA surrounding the central area CA.
  • the lower film 110 includes a plurality of openings disposed in the central area CA, and the lower electrode portions 310 are disposed through the lower film 110 in each opening. That is, the upper portion of each lower electrode portion 310 protrudes upward from the upper surface of the lower film 110, and the lower portion of each lower electrode portion 310 protrudes downward from the lower surface of the lower film 110.
  • the film guide 120 has a flat shape and is integrally formed on the lower film 110 to guide the lower film 110 to have a flat shape.
  • the film guide 120 is disposed in the peripheral area PA of the lower film 110.
  • the film guide 120 may include a synthetic resin such as polyimide, polyvinyl, polypropylene, polycarbonate, FR4, PVC.
  • the film guide 120 may have a thickness of 500 ⁇ m to 1 mm.
  • the upper film 200 includes a thin synthetic resin film.
  • the upper film 200 may have a thickness of 100 ⁇ m to 250 ⁇ m.
  • the upper film 200 may include a synthetic resin, such as polyimide, polyvinyl, polypropylene, polycarbonate, FR4, PVC.
  • the upper film 200 may include the same material as the lower film 110.
  • the upper film 200 is disposed on the lower film 110 so as to face each other, and corresponds to the central area CA of the lower film 110.
  • the upper film 200 includes a plurality of openings corresponding to the openings of the lower film 110, and upper electrodes 320 are disposed through the upper film 200 in each opening. That is, the upper portion of each upper electrode portion 320 protrudes upward from the upper surface of the upper film 200, and the lower portion of each upper electrode portion 320 protrudes downward from the lower surface of the upper film 200.
  • the rubber layer 150 is disposed between the central area CA of the lower film 110 and the upper film 200 to maintain a constant distance between the lower film 110 and the upper film 200.
  • the rubber layer 150 may include an elastic material, for example, silicone resin, synthetic rubber, or the like. When an external force is applied on the upper film 200, the rubber layer 150 contracts to resist the external force. In addition, even when the semiconductor chip (20 of FIG. 3) having an irregular shape is disposed on the upper film 200, stable electrical coupling is possible by contraction of the rubber layer 150. In another embodiment, the rubber layer 150 may be omitted because the conductive wire 330 itself has sufficient rigidity and elasticity.
  • a gap g is formed between the edge of the upper film 200 and the edge of the central area CA of the lower film 110.
  • An edge of the rubber layer 150 protrudes from the edge of the upper film 200 by the gap g through the gap g.
  • the edge of the upper film 200 may be disposed at the corner of the rubber layer 150 or protrude more than the rubber layer 150.
  • the edge of the upper film 200 may be peeled off from the rubber layer 150 by external force.
  • the energizing member 300 includes a lower electrode 310, an upper electrode 320 and a conductive wire 330.
  • the lower electrode 310 is formed through each opening of the lower film 110.
  • the lower electrode 310 may be formed using soldering.
  • the lower electrode part 310 may be formed by soldering a liquid solder paste to a screen-printed film (for example, a blind via type film) using heat or a laser.
  • Soldering may include tin, lead, gold, silver alloys, copper, aluminum, nickel, rhodium, alloys thereof, and the like.
  • the width of the upper and lower portions of the lower electrode portion 310 is greater than the diameter of each opening of the lower film 110 so that the lower electrode portion 310 may be firmly coupled to the lower film 110.
  • the upper electrode part 320 is formed through each opening of the upper film 200.
  • the upper electrode 320 may be formed using soldering.
  • the upper electrode part 320 may be formed by soldering a liquid solder paste to a screen-printed film (for example, a blind via type film) using heat or a laser. Soldering may include tin, lead, gold, silver alloys, copper, aluminum, nickel, rhodium, alloys thereof, and the like.
  • the width of the upper and lower portions of the upper electrode portion 320 is greater than the diameter of each opening of the upper film 200 so that the upper electrode portion 320 may be firmly coupled to the upper film 200.
  • the conductive wire 330 penetrates the rubber layer 150 to electrically connect the lower electrode 310 and the upper electrode 320.
  • the conductive wire 330 may include tin, lead, gold, silver alloy, copper, aluminum, nickel, rhodium, alloys thereof, and the like.
  • the conductive wire 330 may include an inner conductive layer (not shown) and an outer elastic layer (not shown) coating the inner conductive layer (not shown).
  • the inner conductive layer (not shown) may include a gold conductor
  • the outer elastic layer (not shown) may include a nickel layer plated on the surface of the inner conductive layer (not shown).
  • FIG. 3 is a cross-sectional view illustrating a state in which the rubber contact illustrated in FIG. 1 is disposed between a semiconductor chip and a stage.
  • the semiconductor chip 20 is disposed on the upper film 200.
  • the electrode pads 21 of the semiconductor chip 20 are in contact with the upper electrode portion 320 exposed on the upper film 200.
  • the stage 30 is disposed below the film assembly 100.
  • the stage 30 may be a stage for inspecting the semiconductor chip 20.
  • the lower electrode portion 310 exposed to the lower portion of the lower film 110 contacts the electrode pads 31 of the stage 30.
  • FIGS. 5, 8, 10 and 13 are wired shown in FIG. It is a top view which shows the manufacturing method of a rubber contact.
  • FIG. 4 is a cross-sectional view illustrating a step of forming lower electrode parts on a lower film.
  • openings are formed in the central region (CA of FIG. 2) of the lower film 110.
  • solder paste is printed in the openings of the lower film 110.
  • the printed solder paste is irradiated with heat or laser to form the lower electrode part 310.
  • FIG. 5 is a plan view illustrating a step of arranging the support plate on the lower film illustrated in FIG. 4, and FIG. 6 is a cross-sectional view of the II-II ′ line of FIG. 5.
  • the support plate 130 is attached to the peripheral area (PA of FIG. 2) of the lower film 110 on which the lower electrode part 310 is formed.
  • the support plate 130 is opened at the center thereof to expose the central area (CA of FIG. 2) of the lower film 110.
  • FIG. 7 is a cross-sectional view illustrating a step of forming a conductive wire on the lower electrode illustrated in FIGS. 5 and 6.
  • the conductive wire 330 is soldered onto the lower electrode 310.
  • the lower electrode portion 310 and the conductive wire 330 are irradiated with heat or a laser beam. Can be formed.
  • FIG. 8 is a plan view illustrating a step of forming a mold on the support plate illustrated in FIG. 7, and FIG. 9 is a cross-sectional view of the III-III ′ line of FIG. 8.
  • the mold 140 surrounding the central region (CA of FIG. 2) is formed on the support plate 130.
  • the mold 140 may be disposed in a peripheral region (PA of FIG. 2) adjacent to the central region (CA of FIG. 2) to surround the central region (CA of FIG. 2).
  • a portion of the mold 140 may be opened to form an inlet (not shown) of a silicon rubber (not shown).
  • FIG. 10 is a plan view illustrating a process of disposing a raw top film on a mold illustrated in FIGS. 8 and 9, and FIG. 11 is a cross-sectional view of the IV-IV ′ line of FIG. 10.
  • the raw upper film 201 is then disposed on the mold 140, and the conductive wire 330 is connected to the upper electrode part 320.
  • a plurality of openings are formed in the central region of the raw upper film 201, and a solder paste is printed in each opening. Thereafter, the raw upper film 201 is disposed on the mold 140 to insert the upper portion of the conductive wire 330 into the solder paste. Subsequently, the solder paste is irradiated with heat or laser to form the upper electrode part 320 soldered to the conductive wire 330.
  • the raw upper film 201, the lower film 110, the mold 140, and the support plate 130 define an inner space 151, and the conductive wire 330 is disposed in the inner space 151.
  • FIG. 12 is a cross-sectional view illustrating a step of forming a rubber layer in an internal space illustrated in FIGS. 10 and 11.
  • the rubber layer 150 is formed by injecting and curing the silicon rubber into the internal space 151.
  • an opening (not shown) for injecting the silicon rubber into the inner space 151 is formed, and the silicon rubber is opened through the opening (not shown) while keeping the inner space 151 in a vacuum state. It can also be injected.
  • the rubber layer 150 is formed by curing the silicon rubber injected into the internal space 151.
  • the rubber layer 150 may be formed by heating the silicon rubber.
  • FIG. 13 is a plan view illustrating a process of forming a top film by removing a portion of the original upper film shown in FIG. 12, and FIG. 14 is a cross-sectional view taken along the line VV ′ of FIG. 13.
  • the cutting line of the raw upper film 201 is disposed on the rubber layer 150. That is, the cutting line of the raw upper film 201 forms a gap g toward the center region (CA of FIG. 2) based on a boundary between the center region (CA of FIG. 2) and the peripheral region (PA of FIG. 2). Is arranged to.
  • the edge of the upper film 200 and the edge of the rubber layer 150 are spaced apart by a gap g.
  • FIG. 15 is a cross-sectional view illustrating a step of removing a mold illustrated in FIGS. 13 and 14.
  • the mold 140 surrounding the rubber layer 150 is then removed.
  • the edge of the rubber layer 150 is exposed to the outside so that the pressure applied to the upper portion of the rubber layer 150 may be transmitted to the side.
  • FIG. 16 is a cross-sectional view illustrating a step of removing the support plate illustrated in FIG. 15.
  • the support plate 130 disposed on the lower film 110 is removed afterwards.
  • the film guide (120 of FIG. 17) may be omitted without removing the support plate 130, so that the support plate 130 may serve as the film guide (120 of FIG. 17).
  • 17 is a cross-sectional view showing a step of attaching a film guide on the lower film shown in FIG.
  • the film guide 120 is continuously attached to the peripheral area (PA of FIG. 2) of the lower film 110.
  • the film guide 120 is opened at the center, and the rubber layer 150 and the upper film 200 are exposed through the opened center of the film guide 120.
  • the lower electrode portion 310 and the upper electrode portion 320 of the conductive member 300 is firmly coupled to the lower film 110 and the upper film 200, the lower electrode portion 310 ) Or a defect in which the upper electrode portion 320 is embedded in the rubber layer 150 is prevented.
  • peripheral area PA corresponding to the edge of the lower film 110 extends to the outside of the rubber layer 150 and the film guide 120 is coupled to the lower film 110 in the peripheral area PA, thereby wired.
  • the rubber contact can be easily placed or secured on the stage (30 in FIG. 3).
  • the film guide 120 is disposed adjacent to the rubber layer 150 to disperse the external force to prevent the external force from concentrating on the boundary between the lower film 110 and the rubber layer 150. Therefore, the lower film 110 is prevented from peeling off from the rubber layer 150.
  • a gap g is formed between the edge of the upper film 200 and the edge of the center area CA of the lower film 110, so that the upper film 200 is peeled from the rubber layer 150 by an external force.
  • the electrical connection of the energization member 300 is stabilized by preventing the phenomenon.
  • FIG. 18 is a cross-sectional view illustrating a method of manufacturing a wired rubber contact according to an embodiment of the present invention
  • FIGS. 19 and 20 are enlarged cross-sectional views of portions 'A' and 'B' of FIG. 18.
  • two opposing conveyors 501, 502 are first placed in order to make wired rubber contacts.
  • the separation distance at the top of the two conveyors 501, 502 is greater than the separation distance at the bottom.
  • the upper portions of the conveyors 501 and 502 are arranged in the planar direction, and the lower portions are arranged side by side in the vertical direction.
  • the original lower film 1101 and the original upper film 1201 move from the top to the bottom of the conveyors 501 and 502, respectively.
  • Each of the original lower film 1101 and the original upper film 1201 includes a plurality of openings, and a lower electrode portion 310 and an upper electrode portion 320 are disposed in each opening.
  • a liquid solder paste may be disposed in each of the openings of the raw bottom film 1101 and the raw top film 1201 by screen printing.
  • the conductive wire 1330 connecting the lower electrode 310 and the upper electrode 320 is disposed at a portion where the distance between the conveyors 501 and 502 becomes narrow.
  • one end of the conductive wire 1330 is inserted into the liquid solder paste of the raw lower film 1101 and the other end is inserted into the liquid solder paste of the raw upper film 1201, and then heat or laser is applied to the liquid solder paste. You can investigate.
  • the liquid solder paste is irradiated with heat or a laser, the lower electrode 310 and the upper electrode 320, which are connected through the conductive wire 1330, are formed.
  • the length of the conductive wire 1330 is longer than the distance between the original lower film 1101 and the original upper film 1201, thereby preventing the conductive wire 1330 from being broken during the manufacturing process.
  • the conductive wire 1330 is sequentially disposed between the lower electrode 310 and the upper electrode 320. Connected.
  • 21, 22, 24, 26, 28, 30, and 31 are cross-sectional views illustrating a method of manufacturing the wired rubber contact shown in FIG. 18, and FIGS. 23, 25, 27, and 29 are manufactured in the wired rubber contact shown in FIG. Are plan views illustrating the method.
  • FIG. 21 is a cross-sectional view illustrating a conductive member manufactured through the process of FIGS. 18 to 20.
  • the energizing member 1300 connects the lower electrode 310 and the upper electrode 320.
  • the lower electrode 310 is disposed through the openings of the original lower film 1101
  • the upper electrode 320 is disposed through the openings of the original upper film 1201.
  • the energizing member 1300 is disposed only in the center region of the original lower film 1101 and the original upper film 1201.
  • FIG. 22 is a cross-sectional view illustrating a step of filling a silicon rubber between the raw bottom film and the raw top film shown in FIG. 21.
  • a silicon rubber is filled between the raw bottom film 1101 and the raw top film 1201.
  • the silicon rubber is disposed not only in the central region in which the energizing member 1300 is disposed, but also in the peripheral region surrounding the central region in which the energizing member 1300 is not disposed.
  • the filled silicone rubber is then cured.
  • FIG. 23 is a plan view illustrating a process of forming a lower film, an upper film, and a rubber layer by cutting a portion of the raw lower film, the upper upper film, and the cured silicon rubber shown in FIG. 22, and FIG. 24 is shown in FIG. 23. Sectional view of the VI-VI 'line.
  • the raw lower film 1101 is cured along the boundary between the central area CA in which the conducting member 300 is disposed and the peripheral area PA in which the conducting member 300 is not disposed.
  • the silicon rubber 1151 and the raw upper film 1201 are cut to form the lower film 1102, the rubber layer 1150, and the upper film 1200.
  • FIG. 25 is a cross-sectional view illustrating a step of attaching an adhesive tape to a film guide
  • FIG. 26 is a cross-sectional view of the VII-VII ′ line of FIG. 25.
  • the adhesive tape 1123 is attached to the lower surface of the film guide 1120.
  • the film guide 1120 includes a central opening 1108 in which the lower film 1102 and the rubber layer 1150 are accommodated, and a fixing hole 1107 for fixing to the stage (30 of FIG. 3).
  • the adhesive tape 1123 is easily attached and detached, and the lower surface of the film guide 1120 is attached to the upper surface coated with the adhesive material.
  • the central portion of the adhesive tape 1123 is exposed through the central opening 1108 of the film guide 1120.
  • FIG. 27 is a plan view illustrating a step of attaching the lower film shown in FIGS. 23 and 24 to the adhesive tape shown in FIGS. 25 and 26, and
  • FIG. 28 is a cross-sectional view taken along the line VIII-VIII ′ of FIG. 27.
  • the lower surface of the lower film 1102 is attached to the upper surface of the adhesive tape 1123 exposed through the central opening 1108 of the film guide 1120.
  • the upper film 1200 is pressed so that the lower surface of the lower film 1102 is attached to the adhesive tape 1123, but the lower portion of the lower electrode 310 is lower than the lower surface of the film guide 1120. Place it.
  • the lower electrode 310 is disposed below the lower surface of the film guide 1120, after the adhesive tape 1123 is removed, the lower electrode 310 is disposed on the electrode pad of the stage (30 of FIG. 3). 3, 31) can be easily contacted.
  • FIG. 29 is a plan view illustrating the step of attaching the rubber layers illustrated in FIGS. 27 and 28 to the film guide
  • FIG. 30 is a cross-sectional view of the line IX-IX ′ illustrated in FIG. 29.
  • an elastic adhesive is applied along the boundary of the rubber layer 1150 and the film guide 1120.
  • the elastic adhesive may comprise a silicone resin.
  • the silicone resin when the silicone resin is applied to a portion of the side of the rubber layer 1150 and the upper surface of the film guide 1120 adjacent to the rubber layer 1150, the applied silicone resin is the side of the rubber layer 1150 and the film Coating part of the top of the guide.
  • an adhesive member 1160 is formed to cure the coated silicone resin to bond the rubber layer 1150 and the film guide 1120.
  • the adhesive member 1160 covers not only the side of the rubber layer 1150 but also the side of the upper film 1200 to prevent the edge of the upper film 1200 from being peeled from the rubber layer 1150.
  • the upper film 1200 and the rubber layer 1150 may be bonded using a joining jig (not shown) instead of the adhesive member 1160.
  • FIG. 31 is a cross-sectional view illustrating a step of removing the adhesive tape shown in FIGS. 29 and 30.
  • the adhesive tape 1123 is removed from the lower surface of the lower substrate 1102 and the lower surface of the film guide 1120. This completes the wired rubber contact.
  • the elastic member 1160 and the film guide 1120 cover the sides of the rubber layer 1150, the lower film 1102 and the upper film 1200 to prevent the lower film ( 1102 or upper film 1200 is prevented from peeling off from rubber layer 1150.
  • the adhesive member 1160 has elasticity to prevent the external shock from being transmitted to the energizing member 1300.
  • the conductive wires 1330 can be continuously attached through the conveyors 501 and 502, thereby shortening the manufacturing time.
  • the length of the conductive wire 1330 is longer than the distance between the original lower film 1101 and the original upper film 1201 and the distance between the lower film 1102 and the upper film 1200, and thus the external impact during the manufacturing process. This prevents the conductive wire 1330 from breaking.
  • FIG. 32 is a cross-sectional view illustrating a method of manufacturing a wired rubber contact according to an embodiment of the present invention
  • FIG. 33 is an enlarged cross-sectional view of a portion 'C' of FIG. 32.
  • the rest of the components except for the mold is the same as the embodiment shown in Figs. 18 to 31, and overlapping description of the same components will be omitted.
  • the original lower film 1101 and the original upper film 1201 move from the top to the bottom of the conveyors 501 and 502, respectively.
  • the primitive mold 1141 is dripped on the upper raw film 1201.
  • the raw mold 1141 comprises uncured synthetic resin and is applied as if surrounding the periphery of the raw top film 1201.
  • the raw mold 1141 may be dropped on the raw bottom film 1101, or may be dropped together on the raw top film 1201 and the raw bottom film 1101 together.
  • the raw mold may include a photoresist.
  • the raw mold 1141 dropped on the original upper film 1201 is contacted and attached to the original lower film 1101.
  • the conductive wire 1330 connecting the lower electrode 310 and the upper electrode 320 is disposed at a portion where the distance between the conveyors 501 and 502 becomes narrow.
  • 34 to 37 are cross-sectional views illustrating a method of manufacturing the wired rubber contact shown in FIG. 32.
  • FIG. 34 is a cross-sectional view illustrating the energizing member manufactured through the process of FIGS. 32 and 33.
  • the energizing member 1300 connects the lower electrode 310 and the upper electrode 320, and only within the central region of the raw lower film 1101 and the raw upper film 1201. Is placed.
  • the primitive mold 1141 is disposed in the peripheral region of the primitive lower film 1101 and the primitive upper film 1201 to surround the energizing member 1300.
  • the primitive mold 1141 is then cured to form a mold 1140.
  • the inner space 151 is defined by the original lower film 1101, the original upper film 1201, and the mold 1140.
  • 35 is a cross-sectional view illustrating a step of filling a silicon rubber in the internal space shown in FIG. 34.
  • the silicon rubber is filled in the internal space 151 defined by the original lower film 1101, the original upper film 1201, and the mold 1140.
  • the silicon rubber is disposed only in the central region where the energizing member 1300 is disposed. The filled silicone rubber is then cured.
  • FIG. 36 is a cross-sectional view illustrating a process of cutting a portion of a raw upper film shown in FIG. 35 and removing a mold;
  • the raw upper film 1101 is cut along the boundary between the central area CA in which the conducting member 1300 is disposed and the peripheral area PA in which the conducting member 1300 is not disposed.
  • the upper film 1200 is formed.
  • the cutting line of the raw upper film 1201 is the same as the edge of the mold 1150.
  • a cutting line of the raw top film 1201 may be disposed on the top surface of the mold 1150 to form a gap (g of FIG. 2).
  • the mold 1140 is removed to expose the top surface of the raw bottom film 1101 and the side surface of the rubber layer 1150.
  • the mold 1140 can be removed using a solvent such as a developing solution.
  • FIG. 37 is a cross-sectional view illustrating a step of attaching a film guide to an upper surface of the original lower film 1101 shown in FIG. 36.
  • the film guide 1120 is attached to an upper surface of the original lower film 1101.
  • the upper film 1200, the upper electrode part 320, and the rubber layer 1150 are exposed through the central opening of the film guide 1120.
  • the process time is shortened by interposing the conductive wire 1330 and the mold 1140 between the original upper film 1201 and the original lower film 1101 in a continuous process.
  • the rubber layer 1150 is formed only in the internal space 151 formed by using the mold 1140, thereby cutting the cured silicon rubber (1151 of FIG. 22), thereby reducing defects in the cutting process. do.
  • FIGS. 38 and 39 are cross-sectional views illustrating a method of manufacturing a wired rubber contact according to an embodiment of the present invention.
  • the remaining components except for the conducting member are the same as the embodiments shown in Figs. 1 to 37, so that duplicate description of the same components is omitted.
  • a raw bottom film 2101 and a raw top film 2201 having a plurality of openings formed in a central area are prepared.
  • a lower electrode part 2310 is formed to fill each opening of the raw bottom film 2101, and an upper electrode part 2320 is formed around each opening of the raw top film 2201.
  • the lower electrode portion 2310 fills each opening of the original lower film 2101, but the upper electrode portion 2320 has a through hole in the center without filling each opening of the raw upper film 2201. Keep it. That is, the upper electrode part 2320 is formed along the edge of each opening of the original upper film 2201.
  • the source upper film 2201 and the source lower film 2101 are arranged such that the lower electrode part 2310 is exposed through the through hole of the upper electrode part 2320.
  • the conductive wires 2330 are coupled to the lower electrode portion 2310 and the upper electrode portion 2320.
  • one end of the conductive wire 2330 is connected to the upper surface of the lower electrode portion 2310 and the other end is connected to the upper or inner surface of the upper electrode portion 2320.
  • the conductive wire 2330 may be bonded to the lower electrode portion 2310 and the upper electrode portion 2320 using soldering.
  • the distance between the upper upper film 2201 and the lower lower film 2101 is spaced apart so that the conductive wire 2330 is disposed between the upper upper film 2201 and the lower lower film 2101.
  • a soldering process of filling the through hole of the upper electrode part 2320 may be added.
  • the silicon rubber is filled and cured between the raw upper film 2201 and the raw lower film 2101.
  • the raw top film 2201 and / or cured silicon rubber are cut to form a top film (not shown) and a rubber layer (not shown).
  • a film guide (not shown) is disposed along the side of the rubber layer (not shown).
  • the upper electrode portion 2320 and the lower electrode portion 2310 have different structures, so that a plurality of conductive wires 2330 are simultaneously connected to the upper electrode portion 2320 and the lower electrode portion 2310. It is possible to combine
  • a structure including a rubber layer is disclosed.
  • the rubber layer may be omitted and the wired rubber contact may be implemented using the elasticity of the conductive wire itself.
  • the raw top film and the raw bottom film can be used interchangeably with the terms top film and bottom film, respectively.
  • the lower electrode portion and the upper electrode portion of the energizing member is firmly coupled to the lower film and the upper film to prevent the failure of the lower electrode portion or the upper electrode portion embedded in the rubber layer.
  • the peripheral area corresponding to the edge of the lower film extends to the outside of the rubber layer and the film guide is combined with the lower film in the peripheral area, so that the wired rubber contact can be easily disposed or fixed on the stage.
  • the film guide is disposed adjacent to the rubber layer to disperse the external force, thereby preventing the external force from concentrating on the boundary between the lower film and the rubber layer. Therefore, the lower film is prevented from peeling off from the rubber layer.
  • a gap is formed between the edge of the upper film and the edge of the center region of the lower film, thereby preventing the upper film from being peeled from the rubber layer by external force, thereby making the electrical connection of the conducting member stable.
  • the upper film and the lower film cover the upper and lower surfaces of the rubber layer to protect the rubber layer and the conducting member from external contaminants such as dust and moisture.
  • the lower surface of the lower film is attached to the adhesive tape by pressing the upper film, but the lower electrode portion is disposed below the lower surface of the film guide.
  • the lower electrode portion can easily contact the electrode pad of the stage after the adhesive tape is removed.
  • the elastic member and the film guide cover the side of the rubber layer, the lower film and the upper film to prevent the lower film or the upper film from being peeled from the rubber layer from external impact.
  • the adhesive member has elasticity to prevent external shock from being transmitted to the energizing member.
  • the conductive wire can be continuously attached through the conveyor, so that the manufacturing time is shortened.
  • the length of the conductive wire is longer than the distance between the raw lower film and the upper upper film and the distance between the lower film and the upper film, thereby preventing the conductive wire from being broken by external impact during the manufacturing process.
  • the process time is shortened by interposing the conductive wire and the mold between the raw top film and the raw bottom film in a continuous process.
  • the rubber layer is formed only in the inner space formed using the mold, so that the process of cutting the cured silicon rubber is omitted, thereby reducing defects in the cutting process.
  • the upper electrode portion and the lower electrode portion have different structures, and thus it is possible to combine a plurality of conductive wires at the same time with the upper electrode portion and the lower electrode portion.
  • the present invention has industrial applicability applied to test equipment of semiconductors, connecting members between circuit components, and the like.
  • a wired rubber contact connecting a semiconductor chip and an inspection stage is disclosed, but any person having ordinary knowledge and experience in the art may see wherever conventional anisotropic conductive films are used. It will be appreciated that the inventive concept may be applied.

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Abstract

A wired rubber contact comprises a lower film, an upper film, a plurality of conductive wires, a rubber layer, and a film guide. The lower film includes a plurality of lower electrode parts formed in openings. The upper film is disposed such that the edge thereof is located inward from the border between the central region and the peripheral region of the lower film. The plurality of conductive wires are disposed between the lower and upper films and connect the lower electrode parts and upper electrode parts. The rubber layer contains resilient material, has an edge protruding further outward than the edge of the upper film, and maintains the distance between the lower and upper films to be constant. The film guide is disposed on the peripheral region of the lower film along the side surface of the rubber layer, is integrally formed with the lower film, and is thicker than the lower film.

Description

와이어드 러버 컨택트 및 그 제조방법WIRED RUBBER CONTACTS AND MANUFACTURING METHOD THEREOF
본 발명은 와이어드 러버 컨택트 및 그 제조방법에 관한 것으로서, 보다 상세하게는 수명이 증가하고 신뢰성이 향상된 와이어드 러버 컨택트 및 그 제조방법에 관한 것이다.The present invention relates to a wired rubber contact and a method of manufacturing the same, and more particularly, to a wired rubber contact and a method of manufacturing the improved life and reliability.
반도체 제조공정에 있어서, 검사공정은 출시되는 제품의 신뢰도와 직결되는 것으로 매우 중요하다. 반도체는 패키징 단계까지 끝난 후 뿐만 아니라, 그 이전단계에서도 중간중간 검사가 필요하다.In the semiconductor manufacturing process, the inspection process is very important as it is directly related to the reliability of the product on the market. Semiconductors require intermediate inspections not only after the packaging phase but also before it.
패키징이전 또는 이후 단계에서 반도체의 전기적 특성을 검사하기 위해서는, 반도체의 패드에 전기를 인가해야 한다. 고집적 회로를 갖는 반도체의 패드에 전기를 직접 인가하는 것은 거의 불가능하기 때문에, 이방성 특성을 갖는 패드를 반도체와 테스트 스테이지의 사이에 배치한다. 테스트 스테이지에 인가된 전기는 이방성 패드를 통과하여 반도체로 인가되어 테스트를 수행한다.To examine the electrical properties of the semiconductor before or after packaging, electricity must be applied to the pads of the semiconductor. Since it is almost impossible to directly apply electricity to a pad of a semiconductor having a highly integrated circuit, a pad having anisotropic characteristics is disposed between the semiconductor and the test stage. The electricity applied to the test stage is passed through the anisotropic pad to the semiconductor to perform the test.
종래의 이방성 패드는 전극 사이에 절연실리콘 고무가 위치하고 상하의 전극내부에는 전도성 파티클이 잘 분산된 실리콘 레진을 경화시켜 전극 상하에 전기적으로 통전된 상태가 되는 구조를 가지고 있다.Conventional anisotropic pads have a structure in which insulating silicone rubber is disposed between electrodes and upper and lower electrodes are cured of a silicone resin in which conductive particles are dispersed well, so that the electrodes are electrically energized above and below the electrodes.
이는 각 전극마다 분산된 상태가 다르므로 제품의 신뢰성이 제품마다 균일하지 못하게 되며, 전극을 30%이상 누르게 되면 전도성 파티클이 실리콘을 찢어 조금씩 이동함으로 인하여 제품의 품질 및 수명단축을 초래하게 된다.This is because the dispersed state of each electrode is different, the reliability of the product is not uniform for each product, and if the electrode is pressed more than 30%, the conductive particles torn the silicon little by little it causes the quality and life of the product shortened.
또한 실리콘의 높이가 증가하게 되면 품질이 확연히 저하된다. 반대로, 전극의 피치를 줄이게 되면 제품의 수명이 줄고 전기적 특성도 저하되는 문제점이 발생한다.In addition, as the height of the silicon increases, the quality is significantly reduced. On the contrary, if the pitch of the electrode is reduced, there is a problem that the lifetime of the product is reduced and the electrical characteristics are also reduced.
다른 이방성 패드의 기술로서 실리콘 고무에 전선을 박아넣는 기술이 연구되었다. 그러나 실리콘 고무에 전선을 박아넣는 경우, 테스트가 반복되는 과정에서 전선 및 패드가 실리콘 고무 내로 매립되는 문제점이 발생했다.As another anisotropic pad technology, the technology of injecting electric wire into silicone rubber has been studied. However, when the wires are embedded in the silicone rubber, the wires and pads are embedded in the silicone rubber during the test is repeated.
상기와 같은 문제점을 해결하기 위한 본 발명의 목적은 수명이 증가하고 신뢰성이 향상된 와이어드 러버 컨택트를 제공하는 데 있다. An object of the present invention for solving the above problems is to provide a wired rubber contact with increased life and improved reliability.
본 발명의 다른 목적은 상기 와이어드 러버 컨택트의 제조방법을 제공하는 데 있다.Another object of the present invention is to provide a method of manufacturing the wired rubber contact.
상술한 본 발명의 일 목적을 달성하기 위하여, 와이어드 러버 컨택트는 하부필름, 상부필름, 복수개의 도전와이어들, 러버층 및 필름가이드를 포함한다. 상기 하부필름은 복수개의 개구부들이 형성되는 중앙영역 및 상기 중앙영역을 포위하는 주변영역을 포함하고, 상기 개구부들 내에 형성된 복수개의 하부전극부들을 포함한다. 상기 상부필름은 복수개의 개구부들 및 상기 개구부들 내에 형성된 복수개의 상부전극부들을 포함하고, 가장자리가 상기 하부필름의 상기 중앙영역과 상기 주변영역 사이의 경계보다 안쪽에 배치된다. 상기 복수개의 도전와이어들은 상기 하부필름과 상기 상부필름 사이에 배치되고 상기 하부전극부들과 상기 상부전극부들 사이를 연결한다. 상기 러버층은 탄성이 있는 물질을 포함하고, 상기 하부필름의 상기 중앙영역 내에 배치되며, 가장자리가 상기 상부필름의 가장자리보다 바깥쪽으로 돌출되고, 상기 도전와이어들을 매립하고 상기 하부필름과 상기 상부필름 사이의 거리를 일정하게 유지시킨다. 상기 필름가이드는 상기 러버층의 측면을 따라서 상기 하부필름의 상기 주변영역 상에 배치되고 상기 하부필름과 일체로 형성되며 상기 하부필름보다 두꺼운 두께를 갖는 필름가이드를 포함한다.In order to achieve the above object of the present invention, the wired rubber contact includes a lower film, an upper film, a plurality of conductive wires, a rubber layer, and a film guide. The lower film includes a central region in which a plurality of openings are formed and a peripheral region surrounding the central region, and includes a plurality of lower electrode portions formed in the openings. The upper film includes a plurality of openings and a plurality of upper electrode portions formed in the openings, and an edge thereof is disposed inward of a boundary between the central area and the peripheral area of the lower film. The plurality of conductive wires are disposed between the lower film and the upper film and connect between the lower electrode portions and the upper electrode portions. The rubber layer includes an elastic material and is disposed in the central region of the lower film, and an edge protrudes outward from an edge of the upper film, and fills the conductive wires and between the lower film and the upper film. Keep the distance constant. The film guide may include a film guide disposed on the peripheral area of the lower film along the side surface of the rubber layer, integrally formed with the lower film, and having a thickness thicker than that of the lower film.
일 실시예에서, 상기 상부필름과 상기 하부필름은 상기 러버층과 일체로 형성될 수 있다.In one embodiment, the upper film and the lower film may be formed integrally with the rubber layer.
상술한 본 발명의 일 목적을 달성하기 위한 와이어드 러버 컨택트의 제조방법에 있어서, 먼저 복수개의 개구부들이 형성되는 중앙영역 및 상기 중앙영역을 포위하는 주변영역을 포함하는 하부필름에 상기 각 개구부를 관통하는 하부전극부를 형성한다. 이어서, 상기 주변영역 상에 상기 하부필름의 유동을 방지하며 중앙이 개구되어 상기 중앙영역을 노출하는 지지판을 부착한다. 이후에, 상기 하부전극부 상에 수직방향으로 배열되는 도전와이어를 결합한다. 계속해서, 상기 지지판 상에 상기 중앙영역을 포위하는 몰드를 형성한다. 이어서, 복수개의 개구부들 및 상기 개구부들 내에 형성된 복수개의 상부전극부들을 포함하는 원시상부필름을 상기 도전와이어 및 상기 몰드 상에 배치하고, 상기 도전와이어의 상단을 상기 상부전극부들에 결합한다. 이후에, 상기 하부필름, 상기 몰드 및 상기 원시상부필름에 의해 정의되는 내부공간에 러버층을 형성한다. 계속해서, 상기 하부필름의 상기 중앙영역과 상기 주변영역 사이의 경계보다 안쪽에 배치되는 커팅라인을 따라서 상기 원시상부필름을 커팅하여 가장자리가 상기 러버층의 가장자리보다 안쪽에 배치되는 상부필름을 형성한다. 이어서, 상기 몰드 및 상기 지지판을 제거한다. 이후에, 상기 하부필름의 상기 주변영역 상에 필름가이드를 부착한다.In the method of manufacturing a wired rubber contact for achieving the above object of the present invention, first penetrating each of the openings in the lower film including a central region formed with a plurality of openings and a peripheral region surrounding the central region; A lower electrode part is formed. Subsequently, a support plate for preventing the flow of the lower film on the peripheral area and opening the center to expose the center area is attached. Thereafter, conductive wires arranged in a vertical direction on the lower electrode portion are coupled. Subsequently, a mold surrounding the central area is formed on the support plate. Subsequently, a raw upper film including a plurality of openings and a plurality of upper electrode portions formed in the openings is disposed on the conductive wire and the mold, and an upper end of the conductive wire is coupled to the upper electrode portions. Thereafter, a rubber layer is formed in an inner space defined by the lower film, the mold, and the raw upper film. Subsequently, the raw upper film is cut along a cutting line disposed inward from a boundary between the central area and the peripheral area of the lower film to form an upper film having an edge disposed inward of an edge of the rubber layer. . Next, the mold and the support plate are removed. Thereafter, a film guide is attached onto the peripheral area of the lower film.
일 실시예에서, 상기 필름가이드를 부착하는 단계는, 상기 필름가이드를 상기 하부필름과 일체형으로 형성하는 단계를 포함할 수도 있다.In an embodiment, the attaching the film guide may include forming the film guide integrally with the lower film.
상술한 본 발명의 일 목적을 달성하기 위하여, 와이어드 러버 컨택트는 하부필름, 상부필름, 복수개의 도전와이어들, 러버층, 필름가이드 및 결합부재를 포함한다. 상기 하부필름은 복수개의 개구부들 및 상기 개구부들 내에 형성된 복수개의 하부전극부들을 포함한다. 상기 상부필름은 복수개의 개구부들 및 상기 개구부들 내에 형성되며 상기 하부전극부들을 마주보는 복수개의 상부전극부들을 포함한다. 상기 도전와이어들은 상기 하부필름과 상기 상부필름 사이에 배치되고 상기 하부전극부들과 상기 상부전극부들 사이를 연결하며, 길이가 상기 하부필름과 상기 상부필름 사이의 이격거리보다 길다. 상기 러버층은 탄성이 있는 물질을 포함하고, 상기 하부필름과 상기 상부필름 사이에 배치되어 상기 도전와이어들을 매립하고 상기 하부필름과 상기 상부필름 사이의 거리를 일정하게 유지시킨다. 상기 필름가이드는 상기 러버층 및 상기 하부필름의 측면을 포위하도록 배치되고 상기 하부필름보다 두꺼운 두께를 갖는다. 상기 접착부재는 탄성접착제를 포함하고 상기 러버층의 측면과 상기 필름가이드의 상면에 부착되어 상기 러버층과 상기 필름가이드를 결합시킨다.In order to achieve the above object of the present invention, the wired rubber contact includes a lower film, an upper film, a plurality of conductive wires, a rubber layer, a film guide, and a coupling member. The lower film includes a plurality of openings and a plurality of lower electrode portions formed in the openings. The upper film includes a plurality of openings and a plurality of upper electrode portions formed in the openings and facing the lower electrode portions. The conductive wires are disposed between the lower film and the upper film and connect between the lower electrode portions and the upper electrode portions, and the length of the conductive wires is longer than a separation distance between the lower film and the upper film. The rubber layer includes an elastic material and is disposed between the lower film and the upper film to fill the conductive wires and to maintain a constant distance between the lower film and the upper film. The film guide is disposed to surround side surfaces of the rubber layer and the lower film and has a thickness thicker than that of the lower film. The adhesive member includes an elastic adhesive and is attached to a side surface of the rubber layer and an upper surface of the film guide to bond the rubber layer and the film guide.
일 실시예에서, 상기 결합부재는 접착부재 또는 결합치구를 포함할 수 있다.In one embodiment, the coupling member may include an adhesive member or a coupling jig.
상술한 본 발명의 일 목적을 달성하기 위한 와이어드 러버 컨택트의 제조방법에 있어서, 먼저 복수개의 개구부들이 형성되는 중앙영역 및 상기 중앙영역을 포위하는 주변영역을 포함하고 상기 개구부들 내에 형성된 복수개의 하부전극부들을 포함하는 원시하부필름과, 복수개의 개구부들 및 상기 개구부들 내에 형성된 복수개의 상부전극부들을 포함하는 원시상부필름을 나란히 배열한다. 이어서, 상기 하부전극부와 상기 상부전극부를 도전와이어로 연결한다. 이후에, 상기 원시상부필름과 상기 원시하부필름의 사이에 실리콘러버를 주입하여 경화시킨다. 계속해서, 상기 중앙영역과 상기 주변영역 사이의 경계부를 따라서 상기 원시상부필름, 상기 경화된 실리콘러버 및 상기 원시하부필름을 커팅하여 상부필름, 러버층 및 하부필름을 형성한다. 이어서, 상기 중앙영역과 동일하거나 큰 크기를 갖는 중앙개구부를 갖는 필름가이드의 하면 전체를 커버하도록 점착테이프를 부착한다. 이후에, 상기 중앙개구부를 통하여 노출되는 점착테이프에 상기 하부필름의 하면을 부착한다. 계속해서, 상기 러버층과 상기 필름가이드를 결합시킨다. 이어서, 상기 점착테이프를 제거한다.In the method for manufacturing a wired rubber contact to achieve the above object of the present invention, a plurality of lower electrodes formed in the openings and including a central region formed with a plurality of openings and a peripheral region surrounding the central region; A raw bottom film including parts and a raw top film including a plurality of openings and a plurality of upper electrode parts formed in the openings are arranged side by side. Subsequently, the lower electrode portion and the upper electrode portion are connected with a conductive wire. Thereafter, a silicon rubber is injected and cured between the raw upper film and the raw lower film. Subsequently, the raw upper film, the cured silicon rubber and the raw lower film are cut along the boundary between the central area and the peripheral area to form an upper film, a rubber layer and a lower film. Subsequently, the adhesive tape is attached to cover the entire lower surface of the film guide having a central opening having the same or larger size as the central region. Thereafter, the lower surface of the lower film is attached to the adhesive tape exposed through the central opening. Subsequently, the rubber layer is bonded to the film guide. Next, the adhesive tape is removed.
일 실시예에서, 상기 하부전극부와 상기 상부전극부를 도전와이어로 연결하는 단계는, 상부의 이격거리가 하부의 이격거리보다 크도록 서로 마주보게 배치된 두 개의 컨베이어들을 따라서 상기 하부필름과 상기 상부필름을 이동시키는 단계; 및 상기 하부필름과 상기 상부필름이 이동되어감에 따라 순차적으로 상기 하부전극부와 상기 상부전극부 사이를 상기 도전와이어로 연결하는 단계를 포함할 수 있다.In an embodiment, the connecting of the lower electrode part and the upper electrode part with a conductive wire may include: forming the lower film and the upper part along two conveyors disposed to face each other such that an upper separation distance is greater than a lower separation distance. Moving the film; And sequentially connecting the lower electrode portion and the upper electrode portion with the conductive wires as the lower film and the upper film are moved.
일 실시예에서, 상기 하부전극부는 상기 원시하부필름의 개구부를 매립하고, 상기 상부전극부는 상기 원시상부필름의 개구부의 가장자리를 따라서 형성되어 중앙에 관통홀을 형성하며, 상기 하부전극부와 상기 상부전극부를 도전와이어로 연결하는 단계는, 상기 상부전극부의 상기 관통홀을 통하여 상기 하부전극부가 노출되도록 상기 원시상부필름과 상기 원시하부필름을 배열하는 단계; 상기 도전와이어의 일단을 상기 하부전극부의 상면에 연결하고 상기 도전와이어의 타단을 상기 상부전극부의 상면 또는 내면에 연결하는 단계; 및 상기 원시상부필름과 상기 원시하부필름의 거리를 이격시켜서 상기 도전와이어를 상기 원시상부필름과 상기 원시하부필름의 사이에 배치시키는 단계를 포함할 수 있다.In one embodiment, the lower electrode portion fills the opening of the raw lower film, the upper electrode portion is formed along the edge of the opening of the upper upper film to form a through hole in the center, the lower electrode portion and the upper The connecting of the electrode unit with the conductive wire may include: arranging the source upper film and the source lower film such that the lower electrode part is exposed through the through hole of the upper electrode part; Connecting one end of the conductive wire to an upper surface of the lower electrode portion and connecting the other end of the conductive wire to an upper surface or an inner surface of the upper electrode portion; And disposing the conductive wire between the raw upper film and the original lower film by separating the distance between the original upper film and the original lower film.
일 실시예에서, 상기 하부전극부와 상기 상부전극부를 도전와이어로 연결하는 단계는, 상기 상부전극부를 솔더링하여 상기 관통홀을 매립하는 단계를 더 포함할 수 있다.In an embodiment, the connecting of the lower electrode portion and the upper electrode portion with a conductive wire may further include filling the through hole by soldering the upper electrode portion.
본 발명은 이와 같은 문제점을 해결하기 위하여 상기와 같은 본 발명에 따르면, 통전부재의 하부전극부 및 상부전극부가 하부필름 및 상부필름에 견고하게 결합되어 하부전극부 또는 상부전극부가 러버층 내로 매립되는 불량이 방지된다.According to the present invention as described above to solve this problem, the lower electrode portion and the upper electrode portion of the conductive member is firmly coupled to the lower film and the upper film is embedded in the rubber layer or the lower electrode portion or the upper electrode portion Defects are prevented.
또한, 하부필름의 가장자리에 해당하는 주변영역이 러버층의 외측으로 연장되고 필름가이드가 주변영역에서 하부필름과 결합하여, 와이어드 러버 컨택트를 스테이지 상에 용이하게 배치하거나 고정할 수 있다. 더욱이 필름가이드가 러버층과 인접하게 배치되어, 외력을 분산시켜서 상기 외력이 하부필름과 러버층 사이의 경계에 집중되는 것을 방지한다. 따라서 하부필름이 러버층으로부터 박리되는 것이 방지된다.In addition, the peripheral area corresponding to the edge of the lower film extends to the outside of the rubber layer and the film guide is combined with the lower film in the peripheral area, so that the wired rubber contact can be easily disposed or fixed on the stage. Furthermore, the film guide is disposed adjacent to the rubber layer to disperse the external force, thereby preventing the external force from concentrating on the boundary between the lower film and the rubber layer. Therefore, the lower film is prevented from peeling off from the rubber layer.
또한, 상부필름의 가장자리와 하부필름의 중앙영역의 가장자리 사이에는 갭이 형성되어, 외력에 의해 상부필름이 러버층으로부터 박리되는 현상을 방지하여 통전부재의 전기적 연결이 안정된다.In addition, a gap is formed between the edge of the upper film and the edge of the center region of the lower film, thereby preventing the upper film from being peeled from the rubber layer by external force, thereby making the electrical connection of the conducting member stable.
더욱이, 상부필름과 하부필름이 러버층의 상하면을 커버하여, 먼지, 습기 등 외부의 오염물질로부터 러버층 및 통전부재를 보호한다.Moreover, the upper film and the lower film cover the upper and lower surfaces of the rubber layer to protect the rubber layer and the conducting member from external contaminants such as dust and moisture.
또한, 상부필름을 가압하여 하부필름의 하면이 점착테이프에 부착되도록 하되, 하부전극부의 하부가 필름가이드의 하면보다 아래쪽에 배치하도록 한다. 하부전극부의 하부가 필름가이드의 하면보다 아래쪽에 배치되면, 점착테이프가 제거된 후 하부전극부가 스테이지의 전극패드에 용이하게 접촉할 수 있다.In addition, the lower surface of the lower film is attached to the adhesive tape by pressing the upper film, but the lower electrode portion is disposed below the lower surface of the film guide. When the lower portion of the lower electrode portion is disposed below the lower surface of the film guide, the lower electrode portion can easily contact the electrode pad of the stage after the adhesive tape is removed.
더욱이, 탄성부재 및 필름가이드가 러버층, 하부필름 및 상부필름의 측면을 커버하여 외부의 충격으로부터 하부필름 또는 상부필름이 러버층으로부터 박리되는 것을 방지한다.Moreover, the elastic member and the film guide cover the side of the rubber layer, the lower film and the upper film to prevent the lower film or the upper film from being peeled from the rubber layer from external impact.
또한, 접착부재가 탄성을 가져서 외부충격이 통전부재로 전달되는 것을 방지한다.In addition, the adhesive member has elasticity to prevent external shock from being transmitted to the energizing member.
더욱이, 컨베이어를 통하여 도전와이어를 연속적으로 부착할 수 있어서, 제조시간이 단축된다.Moreover, the conductive wire can be continuously attached through the conveyor, so that the manufacturing time is shortened.
또한, 도전와이어의 길이는 원시하부필름과 원시상부필름 사이의 거리 및 하부필름과 상부필름 사이의 거리보다 길어서, 제조과정에서 외부충격에 의해 도전와이어가 끊어지는 것이 방지된다.In addition, the length of the conductive wire is longer than the distance between the raw lower film and the upper upper film and the distance between the lower film and the upper film, thereby preventing the conductive wire from being broken by external impact during the manufacturing process.
더욱이, 연속적인 공정으로 도전와이어 및 몰드를 원시상부필름과 원시하부필름의 사이에 개재하여 공정시간이 단축된다.Moreover, the process time is shortened by interposing the conductive wire and the mold between the raw top film and the raw bottom film in a continuous process.
또한, 몰드를 이용하여 형성된 내부공간에만 러버층을 형성하여, 경화된 실리콘러버를 커팅하는 공정이 생략되어 커팅공정에서 발생하는 불량이 감소한다.In addition, the rubber layer is formed only in the inner space formed using the mold, so that the process of cutting the cured silicon rubber is omitted, thereby reducing defects in the cutting process.
더욱이, 상부전극부와 하부전극부가 서로 다른 구조를 가져서, 동시에 다수의 도전와이어를 상부전극부와 하부전극부에 결합하는 것이 가능하다.Moreover, the upper electrode portion and the lower electrode portion have different structures, and thus it is possible to combine a plurality of conductive wires at the same time with the upper electrode portion and the lower electrode portion.
따라서 수명이 연장되고 신뢰성이 향상된다.Therefore, the service life is extended and the reliability is improved.
도 1은 본 발명의 일 실시예에 따른 와이어드 러버 컨택트를 나타내는 평면도이다.1 is a plan view illustrating a wired rubber contact according to an embodiment of the present invention.
도 2는 도 1의 I-I’라인의 단면도이다.FIG. 2 is a cross-sectional view taken along line II ′ of FIG. 1.
도 3은 도 1에 도시된 러버 컨택트가 반도체 칩과 스테이지 사이에 배치된 상태를 나타내는 단면도이다.3 is a cross-sectional view illustrating a state in which the rubber contact illustrated in FIG. 1 is disposed between a semiconductor chip and a stage.
도 4, 6, 7, 9, 11, 12, 14, 15 내지 17은 도 1에 도시된 와이어드 러버 컨택트의 제조방법을 나타내는 단면도들이다.4, 6, 7, 9, 11, 12, 14, 15 to 17 are cross-sectional views illustrating a method of manufacturing the wired rubber contact shown in FIG. 1.
도 5, 8, 10, 13는 도 1에 도시된 와이어드 러버 컨택트의 제조방법을 나타내는 평면도들이다.5, 8, 10, and 13 are plan views illustrating a method of manufacturing the wired rubber contact shown in FIG. 1.
도 18은 본 발명의 일 실시예에 따른 와이어드 러버 컨택트의 제조방법을 나타내는 단면도이다.18 is a cross-sectional view illustrating a method of manufacturing a wired rubber contact according to an embodiment of the present invention.
도 19 및 도 20는 도 18의 ‘A’ 및 ‘B’ 부분을 확대한 단면도들이다.19 and 20 are enlarged cross-sectional views of portions 'A' and 'B' of FIG. 18.
도 21, 22, 24, 26, 28, 30, 31는 도 18에 도시된 와이어드 러버 컨택트의 제조방법을 나타내는 단면도들이다.21, 22, 24, 26, 28, 30, and 31 are cross-sectional views illustrating a method of manufacturing the wired rubber contact shown in FIG. 18.
도 23, 25, 27, 29는 도 18에 도시된 와이어드 러버 컨택트의 제조방법을 나타내는 평면도들이다.23, 25, 27 and 29 are plan views illustrating a method of manufacturing the wired rubber contact illustrated in FIG. 18.
도 32는 본 발명의 일 실시예에 따른 와이어드 러버 컨택트의 제조방법을 나타내는 단면도이다.32 is a cross-sectional view illustrating a method of manufacturing a wired rubber contact according to an embodiment of the present invention.
도 33은 도 32의 ‘C’ 부분을 확대한 단면도이다.33 is an enlarged cross-sectional view of a portion 'C' of FIG. 32.
도 34 내지 도 37은 도 32에 도시된 와이어드 러버 컨택트의 제조방법을 나타내는 단면도들이다.34 to 37 are cross-sectional views illustrating a method of manufacturing the wired rubber contact shown in FIG. 32.
도 38 및 도 39는 본 발명의 일 실시예에 따른 와이어드 러버 컨택트의 제조방법을 나타내는 단면도들이다.38 and 39 are cross-sectional views illustrating a method of manufacturing a wired rubber contact according to an embodiment of the present invention.
본문에 개시되어 있는 본 발명의 실시예들에 대해서, 특정한 구조적 내지 기능적 설명들은 단지 본 발명의 실시예를 설명하기 위한 목적으로 예시된 것으로, 본 발명의 실시예들은 다양한 형태로 실시될 수 있으며 본문에 설명된 실시예들에 한정되는 것으로 해석되어서는 아니 된다.With respect to the embodiments of the present invention disclosed in the text, specific structural to functional descriptions are merely illustrated for the purpose of describing embodiments of the present invention, embodiments of the present invention may be implemented in various forms and It should not be construed as limited to the embodiments described in.
본 발명은 다양한 변경을 가할 수 있고 여러 가지 형태를 가질 수 있는 바, 특정 실시예들을 도면에 예시하고 본문에 설명하고자 한다. 그러나 이는 본 발명을 특정한 개시 형태에 대해 한정하려는 것이 아니며, 본 발명의 사상 및 기술 범위에 포함되는 모든 변경, 균등물 내지 대체물을 포함하는 것으로 이해되어야 한다. 각 도면을 설명하면서 유사한 참조부호를 구성요소에 대해 사용하였다.As the present invention allows for various changes and numerous embodiments, particular embodiments will be illustrated in the drawings and described in the text. However, this is not intended to limit the present invention to a specific disclosed form, it should be understood to include all modifications, equivalents, and substitutes included in the spirit and scope of the present invention. In describing the drawings, similar reference numerals are used for the components.
제1, 제2 등의 용어는 다양한 구성요소들을 설명하는데 사용될 수 있지만, 상기 구성요소들은 상기 용어들에 의해 한정되어서는 안 된다. 상기 용어들은 하나의 구성요소를 다른 구성요소로부터 구별하는 목적으로만 사용된다. 예를 들어, 본 발명의 권리 범위로부터 이탈되지 않은 채 제1 구성요소는 제2 구성요소로 명명될 수 있고, 유사하게 제2 구성요소도 제1 구성요소로 명명될 수 있다.Terms such as first and second may be used to describe various components, but the components should not be limited by the terms. The terms are used only for the purpose of distinguishing one component from another. For example, without departing from the scope of the present invention, the first component may be referred to as the second component, and similarly, the second component may also be referred to as the first component.
어떤 구성요소가 다른 구성요소에 "연결되어" 있다거나 "접속되어" 있다고 언급된 때에는, 그 다른 구성요소에 직접적으로 연결되어 있거나 또는 접속되어 있을 수도 있지만, 중간에 다른 구성요소가 존재할 수도 있다고 이해되어야 할 것이다. 반면에, 어떤 구성요소가 다른 구성요소에 "직접 연결되어" 있다거나 "직접 접속되어" 있다고 언급된 때에는, 중간에 다른 구성요소가 존재하지 않는 것으로 이해되어야 할 것이다. 구성요소들 간의 관계를 설명하는 다른 표현들, 즉 "~사이에"와 "바로 ~사이에" 또는 "~에 이웃하는"과 "~에 직접 이웃하는" 등도 마찬가지로 해석되어야 한다.When a component is referred to as being "connected" or "connected" to another component, it may be directly connected to or connected to that other component, but it may be understood that other components may be present in between. Should be. On the other hand, when a component is said to be "directly connected" or "directly connected" to another component, it should be understood that there is no other component in between. Other expressions describing the relationship between components, such as "between" and "immediately between," or "neighboring to," and "directly neighboring to" should be interpreted as well.
본 출원에서 사용한 용어는 단지 특정한 실시예를 설명하기 위해 사용된 것으로, 본 발명을 한정하려는 의도가 아니다. 단수의 표현은 문맥상 명백하게 다르게 뜻하지 않는 한, 복수의 표현을 포함한다. 본 출원에서, "포함하다" 또는 "가지다" 등의 용어는 설시된 특징, 숫자, 단계, 동작, 구성요소, 부분품 또는 이들을 조합한 것이 존재함을 지정하려는 것이지, 하나 또는 그 이상의 다른 특징들이나 숫자, 단계, 동작, 구성요소, 부분품 또는 이들을 조합한 것들의 존재 또는 부가 가능성을 미리 배제하지 않는 것으로 이해되어야 한다.The terminology used herein is for the purpose of describing particular example embodiments only and is not intended to be limiting of the present invention. Singular expressions include plural expressions unless the context clearly indicates otherwise. In this application, the terms "comprise" or "having" are intended to indicate that there is a feature, number, step, action, component, part, or combination thereof that is described, and that one or more other features or numbers are present. It should be understood that it does not exclude in advance the possibility of the presence or addition of steps, actions, components, parts or combinations thereof.
다르게 정의되지 않는 한, 기술적이거나 과학적인 용어를 포함해서 여기서 사용되는 모든 용어들은 본 발명이 속하는 기술분야에서 통상의 지식을 가진 자에 의해 일반적으로 이해되는 것과 동일한 의미를 가지고 있다. 일반적으로 사용되는 사전에 정의되어 있는 것과 같은 용어들은 관련 기술의 문맥 상 가지는 의미와 일치하는 의미를 가지는 것으로 해석되어야 하며, 본 출원에서 명백하게 정의하지 않는 한, 이상적이거나 과도하게 형식적인 의미로 해석되지 않는다.Unless defined otherwise, all terms used herein, including technical or scientific terms, have the same meaning as commonly understood by one of ordinary skill in the art. Terms such as those defined in the commonly used dictionaries should be construed as having meanings consistent with the meanings in the context of the related art and shall not be construed in ideal or excessively formal meanings unless expressly defined in this application. Do not.
이하, 첨부한 도면들을 참조하여, 본 발명의 바람직한 실시예를 보다 설명하고자 한다. 도면상의 동일한 구성요소에 대해서는 동일한 참조부호를 사용하고 동일한 구성요소에 대해서 중복된 설명은 생략한다.Hereinafter, with reference to the accompanying drawings, it will be described a preferred embodiment of the present invention. The same reference numerals are used for the same elements in the drawings, and duplicate descriptions of the same elements are omitted.
도 1은 본 발명의 일 실시예에 따른 와이어드 러버 컨택트를 나타내는 평면도이고, 도 2는 도 1의 I-I’라인의 단면도이다.1 is a plan view illustrating a wired rubber contact according to an exemplary embodiment of the present invention, and FIG. 2 is a cross-sectional view taken along the line II ′ of FIG. 1.
도 1 및 도 2를 참조하면, 와이어드 러버 컨택트는 필름 어셈블리(100), 러버층(150), 상부필름(200) 및 통전부재(300)를 포함한다.1 and 2, the wired rubber contact includes a film assembly 100, a rubber layer 150, an upper film 200, and an energizing member 300.
필름 어셈블리(100)는 하부필름(110) 및 필름가이드(120)를 포함한다.The film assembly 100 includes a lower film 110 and a film guide 120.
하부필름(110)은 얇은 합성수지 필름을 포함한다. 예를 들어, 하부필름(110)은 100μm 내지 250μm 의 두께를 가질 수 있다. 본 실시예에서, 하부필름(110)은 폴리이미드, 폴리비닐, 폴리프로필렌, 폴리카보네이트, FR4, PVC 등의 합성수지를 포함할 수 있다.The lower film 110 includes a thin synthetic resin film. For example, the lower film 110 may have a thickness of 100 μm to 250 μm. In this embodiment, the lower film 110 may include a synthetic resin such as polyimide, polyvinyl, polypropylene, polycarbonate, FR4, PVC, and the like.
하부필름(110)은 중앙영역(CA) 및 상기 중앙영역(CA)을 포위하는 주변영역(PA)을 포함한다. 하부필름(110)은 중앙영역(CA)에 배치된 복수개의 개구부들을 포함하며, 각 개구부에는 하부전극부들(310)이 하부필름(110)을 관통하여 배치된다. 즉, 각 하부전극부(310)의 상부는 하부필름(110)의 상면으로부터 상부쪽으로 돌출되고, 각 하부전극부(310)의 하부는 하부필름(110)의 하면으로부터 하부쪽으로 돌출된다.The lower film 110 includes a central area CA and a peripheral area PA surrounding the central area CA. The lower film 110 includes a plurality of openings disposed in the central area CA, and the lower electrode portions 310 are disposed through the lower film 110 in each opening. That is, the upper portion of each lower electrode portion 310 protrudes upward from the upper surface of the lower film 110, and the lower portion of each lower electrode portion 310 protrudes downward from the lower surface of the lower film 110.
필름가이드(120)는 평면형상을 가지며 하부필름(110) 상에 일체로 형성되어 하부필름(110)이 평평한 형상을 갖도록 가이드한다. 필름가이드(120)는 하부필름(110)의 주변영역(PA)에 배치된다. 본 실시예에서, 필름가이드(120)는 폴리이미드, 폴리비닐, 폴리프로필렌, 폴리카보네이트, FR4, PVC 등의 합성수지를 포함할 수 있다. 예를 들어, 필름가이드(120)는 500μm 내지 1mm의 두께를 가질 수 있다.The film guide 120 has a flat shape and is integrally formed on the lower film 110 to guide the lower film 110 to have a flat shape. The film guide 120 is disposed in the peripheral area PA of the lower film 110. In this embodiment, the film guide 120 may include a synthetic resin such as polyimide, polyvinyl, polypropylene, polycarbonate, FR4, PVC. For example, the film guide 120 may have a thickness of 500 μm to 1 mm.
상부필름(200)은 얇은 합성수지 필름을 포함한다. 예를 들어, 상부필름(200)은 100μm 내지 250μm 의 두께를 가질 수 있다. 본 실시예에서, 상부필름(200)은 폴리이미드, 폴리비닐, 폴리프로필렌, 폴리카보네이트, FR4, PVC 등의 합성수지를 포함할 수 있다. 예를 들어, 상부필름(200)은 하부필름(110)과 동일한 재질을 포함할 수 있다.The upper film 200 includes a thin synthetic resin film. For example, the upper film 200 may have a thickness of 100 μm to 250 μm. In this embodiment, the upper film 200 may include a synthetic resin, such as polyimide, polyvinyl, polypropylene, polycarbonate, FR4, PVC. For example, the upper film 200 may include the same material as the lower film 110.
상부필름(200)은 서로 마주보도록 하부필름(110)의 상부에 배치되고, 하부필름(110)의 중앙영역(CA)에 대응된다.The upper film 200 is disposed on the lower film 110 so as to face each other, and corresponds to the central area CA of the lower film 110.
상부필름(200)은 하부필름(110)의 개구부들에 대응되는 복수개의 개구부들을 포함하며, 각 개구부에는 상부전극들(320)이 상부필름(200)을 관통하여 배치된다. 즉, 각 상부전극부(320)의 상부는 상부필름(200)의 상면으로부터 상부쪽으로 돌출되고, 각 상부전극부(320)의 하부는 상부필름(200)의 하면으로부터 하부쪽으로 돌출된다.The upper film 200 includes a plurality of openings corresponding to the openings of the lower film 110, and upper electrodes 320 are disposed through the upper film 200 in each opening. That is, the upper portion of each upper electrode portion 320 protrudes upward from the upper surface of the upper film 200, and the lower portion of each upper electrode portion 320 protrudes downward from the lower surface of the upper film 200.
러버층(150)은 하부필름(110)의 중앙영역(CA)과 상부필름(200)의 사이에 배치되어, 하부필름(110)과 상부필름(200) 사이의 간격을 일정하게 유지한다.The rubber layer 150 is disposed between the central area CA of the lower film 110 and the upper film 200 to maintain a constant distance between the lower film 110 and the upper film 200.
러버층(150)은 탄성이 있는 물질, 예를 들어, 실리콘 레진, 합성고무 등을 포함할 수 있다. 상부필름(200) 상에 외력이 가해지는 경우, 러버층(150)이 수축하여 외력에 저항한다. 또한, 상부필름(200) 상에 불규칙한 형상을 갖는 반도체칩(도 3의 20)이 배치되더라도 러버층(150)의 수축에 의해 안정적인 전기적 결합이 가능하다. 다른 실시예에서, 도전와이어(330) 자체가 충분한 강성과 탄성을 가져서 러버층(150)이 생략될 수도 있다.The rubber layer 150 may include an elastic material, for example, silicone resin, synthetic rubber, or the like. When an external force is applied on the upper film 200, the rubber layer 150 contracts to resist the external force. In addition, even when the semiconductor chip (20 of FIG. 3) having an irregular shape is disposed on the upper film 200, stable electrical coupling is possible by contraction of the rubber layer 150. In another embodiment, the rubber layer 150 may be omitted because the conductive wire 330 itself has sufficient rigidity and elasticity.
본 실시예에서, 상부필름(200)의 가장자리와 하부필름(110)의 중앙영역(CA)의 가장자리 사이에는 갭(g)이 형성된된다. 상기 갭(g)을 통하여 러버층(150)의 가장자리가 상부필름(200)의 가장자리로부터 갭(g)만큼 돌출된다. 러버층(150)의 가장자리가 상부필름(200)의 가장자리보다 돌출하지 않는 경우, 상부필름(200)의 모서리가 러버층(150)의 코너에 배치되거나 러버층(150)보다 돌출될 수 있다. 상부필름(200)의 가장자리가 러버층(150)의 코너에 배치되거나 러버층(150)보다 돌출되는 경우, 외력에 의해 상부필름(200)이 러버층(150)으로부터 박리되어 들뜰 수 있다. 상부필름(200)이 러버층(150)으로부터 박리되어 들뜨면, 상부전극부(320)에 충격이 가해져서 상부전극부(320)의 접속이 불량해지거나 상부전극부(320)와 연결된 도전와이어(330)가 끊어질 수 있다. 그러나 본 실시예에서와 같이 러버층(150)의 가장자리가 상부필름(200)의 가장자리로부터 갭(g)만큼 돌출되는 경우, 상부필름(200)이 러버층(150)으로부터 박리되는 현상이 방지되어 통전부재(300)의 전기적 연결이 안정된다.In this embodiment, a gap g is formed between the edge of the upper film 200 and the edge of the central area CA of the lower film 110. An edge of the rubber layer 150 protrudes from the edge of the upper film 200 by the gap g through the gap g. When the edge of the rubber layer 150 does not protrude more than the edge of the upper film 200, the edge of the upper film 200 may be disposed at the corner of the rubber layer 150 or protrude more than the rubber layer 150. When the edge of the upper film 200 is disposed at the corner of the rubber layer 150 or protrudes from the rubber layer 150, the upper film 200 may be peeled off from the rubber layer 150 by external force. When the upper film 200 is peeled off and lifted from the rubber layer 150, an impact is applied to the upper electrode part 320 so that the connection of the upper electrode part 320 becomes poor or a conductive wire connected to the upper electrode part 320. 330 may be broken. However, as in the present embodiment, when the edge of the rubber layer 150 protrudes from the edge of the upper film 200 by a gap g, the phenomenon in which the upper film 200 is peeled from the rubber layer 150 is prevented. Electrical connection of the energizing member 300 is stabilized.
통전부재(300)는 하부전극부(310), 상부전극부(320) 및 도전와이어(330)를 포함한다.The energizing member 300 includes a lower electrode 310, an upper electrode 320 and a conductive wire 330.
하부전극부(310)는 하부필름(110)의 각 개구부를 관통하여 형성된다. 본 실시예에서, 하부전극부(310)는 솔더링을 이용하여 형성될 수 있다. 예를 들어, 액상 솔더 페이스트를 스크린 프린트한 필름(예, 블라인드 비어타입 필름)에 열 또는 레이저를 이용하여 솔더링하여 하부전극부(310)를 형성할 수 있다. 솔더링은 주석, 납, 금, 은합금, 구리, 알루미늄, 니켈, 로듐, 이들의 합금 등을 포함할 수 있다. 예를 들어, 하부전극부(310)의 상부 및 하부의 폭은 하부필름(110)의 각 개구부의 직경보다 커서 하부전극부(310)가 하부필름(110)에 견고하게 결합될 수 있다.The lower electrode 310 is formed through each opening of the lower film 110. In the present embodiment, the lower electrode 310 may be formed using soldering. For example, the lower electrode part 310 may be formed by soldering a liquid solder paste to a screen-printed film (for example, a blind via type film) using heat or a laser. Soldering may include tin, lead, gold, silver alloys, copper, aluminum, nickel, rhodium, alloys thereof, and the like. For example, the width of the upper and lower portions of the lower electrode portion 310 is greater than the diameter of each opening of the lower film 110 so that the lower electrode portion 310 may be firmly coupled to the lower film 110.
상부전극부(320)는 상부필름(200)의 각 개구부를 관통하여 형성된다. 본 실시예에서, 상부전극부(320)는 솔더링을 이용하여 형성될 수 있다. 예를 들어, 액상 솔더 페이스트를 스크린 프린트한 필름(예, 블라인드 비어타입 필름)에 열 또는 레이저를 이용하여 솔더링하여 상부전극부(320)를 형성할 수 있다. 솔더링은 주석, 납, 금, 은합금, 구리, 알루미늄, 니켈, 로듐, 이들의 합금 등을 포함할 수 있다. 예를 들어, 상부전극부(320)의 상부 및 하부의 폭은 상부필름(200)의 각 개구부의 직경보다 커서 상부전극부(320)가 상부필름(200)에 견고하게 결합될 수 있다.The upper electrode part 320 is formed through each opening of the upper film 200. In the present embodiment, the upper electrode 320 may be formed using soldering. For example, the upper electrode part 320 may be formed by soldering a liquid solder paste to a screen-printed film (for example, a blind via type film) using heat or a laser. Soldering may include tin, lead, gold, silver alloys, copper, aluminum, nickel, rhodium, alloys thereof, and the like. For example, the width of the upper and lower portions of the upper electrode portion 320 is greater than the diameter of each opening of the upper film 200 so that the upper electrode portion 320 may be firmly coupled to the upper film 200.
도전와이어(330)는 러버층(150)을 관통하여 하부전극부(310)와 상부전극부(320)를 전기적으로 연결한다. 예를 들어, 도전와이어(330)는 주석, 납, 금, 은합금, 구리, 알루미늄, 니켈, 로듐, 이들의 합금 등을 포함할 수 있다. 다른 실시예에서, 도전와이어(330)는 내부도전층(도시되지 않음) 및 상기 내부도전층(도시되지 않음)을 코팅하는 외부탄성층(도시되지 않음)을 포함할 수도 있다. 예를 들어, 내부도전층(도시되지 않음)은 금 도선을 포함하고, 외부탄성층(도시되지 않음)은 내부도전층(도시되지 않음)의 표면에 도금된 니켈층을 포함할 수 있다.The conductive wire 330 penetrates the rubber layer 150 to electrically connect the lower electrode 310 and the upper electrode 320. For example, the conductive wire 330 may include tin, lead, gold, silver alloy, copper, aluminum, nickel, rhodium, alloys thereof, and the like. In another embodiment, the conductive wire 330 may include an inner conductive layer (not shown) and an outer elastic layer (not shown) coating the inner conductive layer (not shown). For example, the inner conductive layer (not shown) may include a gold conductor, and the outer elastic layer (not shown) may include a nickel layer plated on the surface of the inner conductive layer (not shown).
도 3은 도 1에 도시된 러버 컨택트가 반도체 칩과 스테이지 사이에 배치된 상태를 나타내는 단면도이다.3 is a cross-sectional view illustrating a state in which the rubber contact illustrated in FIG. 1 is disposed between a semiconductor chip and a stage.
도 1 내지 도 3을 참조하면, 상부필름(200) 상에 반도체칩(20)이 배치된다. 반도체칩(20)의 전극패드들(21)은 상부필름(200) 상으로 노출된 상부전극부(320)에 접촉된다.1 to 3, the semiconductor chip 20 is disposed on the upper film 200. The electrode pads 21 of the semiconductor chip 20 are in contact with the upper electrode portion 320 exposed on the upper film 200.
필름 어셈블리(100)의 하부에는 스테이지(30)가 배치된다. 예를 들어, 스테이지(30)는 반도체 칩(20) 검사용 스테이지일 수 있다. 하부필름(110)의 하부로 노출된 하부전극부(310)는 스테이지(30)의 전극패드들(31)에 접촉된다.The stage 30 is disposed below the film assembly 100. For example, the stage 30 may be a stage for inspecting the semiconductor chip 20. The lower electrode portion 310 exposed to the lower portion of the lower film 110 contacts the electrode pads 31 of the stage 30.
도 4, 6, 7, 9, 11, 12, 14, 15 내지 17은 도 1에 도시된 와이어드 러버 컨택트의 제조방법을 나타내는 단면도들이고, 도 5, 8, 10, 13는 도 1에 도시된 와이어드 러버 컨택트의 제조방법을 나타내는 평면도들이다.4, 6, 7, 9, 11, 12, 14, 15 to 17 are cross-sectional views illustrating a method of manufacturing the wired rubber contact shown in FIG. 1, and FIGS. 5, 8, 10 and 13 are wired shown in FIG. It is a top view which shows the manufacturing method of a rubber contact.
도 4는 하부필름에 하부전극부들을 형성하는 단계를 나타내는 단면도이다.4 is a cross-sectional view illustrating a step of forming lower electrode parts on a lower film.
도 4를 참조하면, 먼저 하부필름(110)의 중앙영역(도 2의 CA)에 개구부들을 형성한다. 이어서 하부필름(110)의 개구부들에 솔더 페이스트를 프린트한다. 이후에 프린트된 솔더 페이스트에 열 또는 레이저를 조사하여 하부전극부(310)를 형성한다.Referring to FIG. 4, first, openings are formed in the central region (CA of FIG. 2) of the lower film 110. Subsequently, solder paste is printed in the openings of the lower film 110. Thereafter, the printed solder paste is irradiated with heat or laser to form the lower electrode part 310.
도 5는 도 4에 도시된 하부필름 상에 지지판을 배치하는 단계를 나타내는 평면도이고, 도 6은 도 5의 II-II' 라인의 단면도이다.FIG. 5 is a plan view illustrating a step of arranging the support plate on the lower film illustrated in FIG. 4, and FIG. 6 is a cross-sectional view of the II-II ′ line of FIG. 5.
도 5 및 도 6을 참조하면, 하부전극부(310)가 형성된 하부필름(110)의 주변영역(도 2의 PA)에 지지판(130)을 부착한다. 지지판(130)은 중앙이 개구되어 하부필름(110)의 중앙영역(도 2의 CA)을 노출한다.5 and 6, the support plate 130 is attached to the peripheral area (PA of FIG. 2) of the lower film 110 on which the lower electrode part 310 is formed. The support plate 130 is opened at the center thereof to expose the central area (CA of FIG. 2) of the lower film 110.
도 7은 도 5 및 도 6에 도시된 하부전극부 상에 도전와이어를 형성하는 단계를 나타내는 단면도이다.7 is a cross-sectional view illustrating a step of forming a conductive wire on the lower electrode illustrated in FIGS. 5 and 6.
도 7을 참조하면, 하부전극부(310) 상에 도전와이어(330)를 솔더링한다. 예를 들어, 솔더 페이스트가 프린트된 하부필름(110)에 도전와이어(330)의 단부를 삽입한 후에, 솔더 페이스트에 열 또를 레이저를 조사하여 하부전극부(310) 및 도전와이어(330)를 형성할 수 있다.Referring to FIG. 7, the conductive wire 330 is soldered onto the lower electrode 310. For example, after the end of the conductive wire 330 is inserted into the lower film 110 on which the solder paste is printed, the lower electrode portion 310 and the conductive wire 330 are irradiated with heat or a laser beam. Can be formed.
도 8는 도 7에 도시된 지지판 상에 몰드를 형성하는 단계를 나타내는 평면도이고, 도 9는 도 8의 III-III' 라인의 단면도이다.FIG. 8 is a plan view illustrating a step of forming a mold on the support plate illustrated in FIG. 7, and FIG. 9 is a cross-sectional view of the III-III ′ line of FIG. 8.
도 8 및 도 9를 참조하면, 지지판(130) 상에 중앙영역(도 2의 CA)을 포위하는 몰드(140)를 형성한다. 예를 들어, 몰드(140)는 중앙영역(도 2의 CA)에 인접하는 주변영역(도 2의 PA)에 배치되어 중앙영역(도 2의 CA)을 포위할 수 있다.8 and 9, the mold 140 surrounding the central region (CA of FIG. 2) is formed on the support plate 130. For example, the mold 140 may be disposed in a peripheral region (PA of FIG. 2) adjacent to the central region (CA of FIG. 2) to surround the central region (CA of FIG. 2).
다른 실시예에서, 몰드(140)의 일부가 개구되어 실리콘러버(도시되지 않음)의 유입구(도시되지 않음)를 형성할 수도 있다.In another embodiment, a portion of the mold 140 may be opened to form an inlet (not shown) of a silicon rubber (not shown).
도 10은 도 8 및 도 9에 도시된 몰드 상에 원시 상부필름을 배치하는 단계를 나타내는 평면도이고, 도 11은 도 10의 IV-IV' 라인의 단면도이다.FIG. 10 is a plan view illustrating a process of disposing a raw top film on a mold illustrated in FIGS. 8 and 9, and FIG. 11 is a cross-sectional view of the IV-IV ′ line of FIG. 10.
도 10 및 도 11을 참조하면, 이어서 몰드(140) 상에 원시 상부필름(201)을 배치하고 도전와이어(330)를 상부전극부(320)에 연결시킨다.10 and 11, the raw upper film 201 is then disposed on the mold 140, and the conductive wire 330 is connected to the upper electrode part 320.
예를 들어, 원시 상부필름(201)의 중앙영역에 복수개의 개구부들을 형성하고, 각 개구부에 솔더 페이스트를 프린트한다. 이후에 원시 상부필름(201)을 몰드(140) 상에 배치하여 도전와이어(330)의 상부를 솔더 페이스트 내로 삽입한다. 계속해서 솔더 페이스트에 열 또는 레이저를 조사하여, 도전와이어(330)에 솔더링된 상부전극부(320)를 형성한다.For example, a plurality of openings are formed in the central region of the raw upper film 201, and a solder paste is printed in each opening. Thereafter, the raw upper film 201 is disposed on the mold 140 to insert the upper portion of the conductive wire 330 into the solder paste. Subsequently, the solder paste is irradiated with heat or laser to form the upper electrode part 320 soldered to the conductive wire 330.
원시 상부필름(201), 하부필름(110), 몰드(140) 및 지지판(130)은 내부공간(151)을 정의하고, 도전와이어(330)는 내부공간(151)에 배치된다.The raw upper film 201, the lower film 110, the mold 140, and the support plate 130 define an inner space 151, and the conductive wire 330 is disposed in the inner space 151.
도 12는 도 10 및 도 11에 도시된 내부공간에 러버층을 형성하는 단계를 나타내는 단면도이다.FIG. 12 is a cross-sectional view illustrating a step of forming a rubber layer in an internal space illustrated in FIGS. 10 and 11.
도 10 내지 12를 참조하면, 내부공간(151)에 실리콘러버를 주입하고 경화시켜서 러버층(150)을 형성한다. 예를 들어, 내부공간(151)에 실리콘러버를 주입하기 위한 개구부(도시되지 않음)를 형성하고, 내부공간(151)을 진공상태로 유지시킨 채, 상기 개구부(도시되지 않음)로 실리콘러버를 주입할 수도 있다.10 to 12, the rubber layer 150 is formed by injecting and curing the silicon rubber into the internal space 151. For example, an opening (not shown) for injecting the silicon rubber into the inner space 151 is formed, and the silicon rubber is opened through the opening (not shown) while keeping the inner space 151 in a vacuum state. It can also be injected.
이후에 내부공간(151)에 주입된 실리콘러버를 경화시켜서 러버층(150)을 형성한다. 예를 들어, 실리콘러버를 가열하여 러버층(150)을 형성할 수 있다.Thereafter, the rubber layer 150 is formed by curing the silicon rubber injected into the internal space 151. For example, the rubber layer 150 may be formed by heating the silicon rubber.
도 13는 도 12에 도시된 원시상부필름의 일부를 제거하여 상부필름을 형성하는 단계를 나타내는 평면도이고, 도 14는 도 13의 V-V' 라인의 단면도이다.FIG. 13 is a plan view illustrating a process of forming a top film by removing a portion of the original upper film shown in FIG. 12, and FIG. 14 is a cross-sectional view taken along the line VV ′ of FIG. 13.
도 12 내지 도 14를 참조하면, 원시상부필름(201)의 일부를 컷팅하여 상부필름(200)을 생성한다. 본 실시예에서, 원시상부필름(201)의 컷팅라인은 러버층(150) 상에 배치된다. 즉, 원시상부필름(201)의 컷팅라인은 중앙영역(도 2의 CA)과 주변영역(도 2의 PA)의 경계부를 기준으로 중앙영역(도 2의 CA)에 쪽으로 갭(g)을 형성하도록 배치된다. 상부필름(200)의 가장자리와 러버층(150)의 가장자리는 갭(g)만큼 이격된다.12 to 14, a portion of the raw upper film 201 is cut to generate the upper film 200. In this embodiment, the cutting line of the raw upper film 201 is disposed on the rubber layer 150. That is, the cutting line of the raw upper film 201 forms a gap g toward the center region (CA of FIG. 2) based on a boundary between the center region (CA of FIG. 2) and the peripheral region (PA of FIG. 2). Is arranged to. The edge of the upper film 200 and the edge of the rubber layer 150 are spaced apart by a gap g.
도 15은 도 13 및 도 14에 도시된 몰드를 제거하는 단계를 나타내는 단면도이다.FIG. 15 is a cross-sectional view illustrating a step of removing a mold illustrated in FIGS. 13 and 14.
도 13 내지 도 15를 참조하면, 이어서 러버층(150)을 둘러싸는 몰드(140)를 제거한다. 몰드(140)를 제거하면 러버층(150)의 가장자리가 외부로 노출되어 러버층(150)의 상부에 인가되는 압력이 사이드로 전달될 수 있다.13 to 15, the mold 140 surrounding the rubber layer 150 is then removed. When the mold 140 is removed, the edge of the rubber layer 150 is exposed to the outside so that the pressure applied to the upper portion of the rubber layer 150 may be transmitted to the side.
도 16는 도 15에 도시된 지지판을 제거하는 단계를 나타내는 단면도이다.FIG. 16 is a cross-sectional view illustrating a step of removing the support plate illustrated in FIG. 15.
도 15 및 도 16을 참조하면, 이후에 하부필름(110) 상에 배치된 지지판(130)을 제거한다. 지지판(130)이 제거되면 하부필름(110)의 상면이 노출된다. 다른 실시예에서 지지판(130)을 제거하지 않고 필름가이드(도 17의 120)를 생략하여, 지지판(130)이 필름가이드(도 17의 120)의 역할을 할 수도 있다.15 and 16, the support plate 130 disposed on the lower film 110 is removed afterwards. When the support plate 130 is removed, the upper surface of the lower film 110 is exposed. In another embodiment, the film guide (120 of FIG. 17) may be omitted without removing the support plate 130, so that the support plate 130 may serve as the film guide (120 of FIG. 17).
도 17은 도 16에 도시된 하부필름 상에 필름가이드를 부착하는 단계를 나타내는 단면도이다.17 is a cross-sectional view showing a step of attaching a film guide on the lower film shown in FIG.
도 17을 참조하면, 계속해서 하부필름(110)의 주변영역(도 2의 PA)에 필름가이드(120)를 부착한다. 본 실시예에서, 필름가이드(120)는 중앙이 개구되고, 러버층(150) 및 상부필름(200)은 필름가이드(120)의 개구된 중앙을 통하여 노출된다.Referring to FIG. 17, the film guide 120 is continuously attached to the peripheral area (PA of FIG. 2) of the lower film 110. In the present embodiment, the film guide 120 is opened at the center, and the rubber layer 150 and the upper film 200 are exposed through the opened center of the film guide 120.
상기와 같은 본 실시예에 따르면, 통전부재(300)의 하부전극부(310) 및 상부전극부(320)가 하부필름(110) 및 상부필름(200)에 견고하게 결합되어 하부전극부(310) 또는 상부전극부(320)가 러버층(150) 내로 매립되는 불량이 방지된다.According to the present embodiment as described above, the lower electrode portion 310 and the upper electrode portion 320 of the conductive member 300 is firmly coupled to the lower film 110 and the upper film 200, the lower electrode portion 310 ) Or a defect in which the upper electrode portion 320 is embedded in the rubber layer 150 is prevented.
또한, 하부필름(110)의 가장자리에 해당하는 주변영역(PA)이 러버층(150)의 외측으로 연장되고 필름가이드(120)가 주변영역(PA)에서 하부필름(110)과 결합하여, 와이어드 러버 컨택트를 스테이지(도 3의 30) 상에 용이하게 배치하거나 고정할 수 있다. 더욱이 필름가이드(120)가 러버층(150)과 인접하게 배치되어, 외력을 분산시켜서 상기 외력이 하부필름(110)과 러버층(150) 사이의 경계에 집중되는 것을 방지한다. 따라서 하부필름(110)이 러버층(150)으로부터 박리되는 것이 방지된다.In addition, the peripheral area PA corresponding to the edge of the lower film 110 extends to the outside of the rubber layer 150 and the film guide 120 is coupled to the lower film 110 in the peripheral area PA, thereby wired. The rubber contact can be easily placed or secured on the stage (30 in FIG. 3). Furthermore, the film guide 120 is disposed adjacent to the rubber layer 150 to disperse the external force to prevent the external force from concentrating on the boundary between the lower film 110 and the rubber layer 150. Therefore, the lower film 110 is prevented from peeling off from the rubber layer 150.
또한, 상부필름(200)의 가장자리와 하부필름(110)의 중앙영역(CA)의 가장자리 사이에는 갭(g)이 형성되어, 외력에 의해 상부필름(200)이 러버층(150)으로부터 박리되는 현상을 방지하여 통전부재(300)의 전기적 연결이 안정된다.In addition, a gap g is formed between the edge of the upper film 200 and the edge of the center area CA of the lower film 110, so that the upper film 200 is peeled from the rubber layer 150 by an external force. The electrical connection of the energization member 300 is stabilized by preventing the phenomenon.
도 18는 본 발명의 일 실시예에 따른 와이어드 러버 컨택트의 제조방법을 나타내는 단면도이고, 도 19 및 도 20은 도 18의 ‘A’ 및 ‘B’ 부분을 확대한 단면도들이다.18 is a cross-sectional view illustrating a method of manufacturing a wired rubber contact according to an embodiment of the present invention, and FIGS. 19 and 20 are enlarged cross-sectional views of portions 'A' and 'B' of FIG. 18.
도 18 내지 도 20을 참조하면, 와이어드 러버 컨택트를 제조하기 위하여, 먼저 두 개의 마주보는 컨베이어들(501, 502)을 배치한다. 두 컨베이어들(501, 502)의 상부의 이격거리는 하부의 이격거리보다 크다. 본 실시예에서, 각 컨베이어(501, 502)의 상부는 평면방향으로 배치되고, 하부는 수직방향으로 나란히 배치된다.18 to 20, two opposing conveyors 501, 502 are first placed in order to make wired rubber contacts. The separation distance at the top of the two conveyors 501, 502 is greater than the separation distance at the bottom. In this embodiment, the upper portions of the conveyors 501 and 502 are arranged in the planar direction, and the lower portions are arranged side by side in the vertical direction.
원시하부필름(1101) 및 원시상부필름(1201)은 각각 컨베이어들(501, 502)의 상부로부터 하부쪽으로 이동한다. 각 원시하부필름(1101) 및 원시상부필름(1201)은 복수개의 개구부들을 포함하고 각 개구부에는 하부전극부(310) 및 상부전극부(320)가 배치된다. 다른 실시예에서, 각 원시하부필름(1101) 및 원시상부필름(1201)의 각 개구부에는 액상 솔더 페이스트가 스크린 프린트의 방식으로 배치될 수 있다.The original lower film 1101 and the original upper film 1201 move from the top to the bottom of the conveyors 501 and 502, respectively. Each of the original lower film 1101 and the original upper film 1201 includes a plurality of openings, and a lower electrode portion 310 and an upper electrode portion 320 are disposed in each opening. In another embodiment, a liquid solder paste may be disposed in each of the openings of the raw bottom film 1101 and the raw top film 1201 by screen printing.
컨베이어들(501, 502) 사이의 거리가 좁아지는 부분에서 하부전극부(310) 및 상부전극부(320)를 연결하는 도전와이어(1330)가 배치된다. 예를 들어, 도전와이어(1330)의 일단을 원시하부필름(1101)의 액상 솔더 페이스트에 삽입하고 타단을 원시상부필름(1201)의 액상 솔더 페이스트에 삽입한 후에, 액상 솔더 페이스트에 열 또는 레이저를 조사할 수 있다. 액상솔더 페이스트에 열 또는 레이저를 조사하면, 도전와이어(1330)를 통하여 연결되는 하부전극부(310) 및 상부전극부(320)가 형성된다.The conductive wire 1330 connecting the lower electrode 310 and the upper electrode 320 is disposed at a portion where the distance between the conveyors 501 and 502 becomes narrow. For example, one end of the conductive wire 1330 is inserted into the liquid solder paste of the raw lower film 1101 and the other end is inserted into the liquid solder paste of the raw upper film 1201, and then heat or laser is applied to the liquid solder paste. You can investigate. When the liquid solder paste is irradiated with heat or a laser, the lower electrode 310 and the upper electrode 320, which are connected through the conductive wire 1330, are formed.
본 실시예에서, 도전와이어(1330)의 길이는 원시하부필름(1101)과 원시상부필름(1201) 사이의 거리보다 길어서, 제조과정에서 도전와이어(1330)가 끊어지는 것이 방지된다.In the present embodiment, the length of the conductive wire 1330 is longer than the distance between the original lower film 1101 and the original upper film 1201, thereby preventing the conductive wire 1330 from being broken during the manufacturing process.
원시하부필름(1101) 및 원시상부필름(1201)이 컨베이어들(501, 502)을 따라 이동하면서, 도전와이어(1330)가 순서대로 하부전극부(310)와 상부전극부(320)의 사이에 연결된다.As the lower raw film 1101 and the upper raw film 1201 move along the conveyors 501 and 502, the conductive wire 1330 is sequentially disposed between the lower electrode 310 and the upper electrode 320. Connected.
도 21, 22, 24, 26, 28, 30, 31는 도 18에 도시된 와이어드 러버 컨택트의 제조방법을 나타내는 단면도들이고, 도 23, 25, 27, 29는 도 18에 도시된 와이어드 러버 컨택트의 제조방법을 나타내는 평면도들이다.21, 22, 24, 26, 28, 30, and 31 are cross-sectional views illustrating a method of manufacturing the wired rubber contact shown in FIG. 18, and FIGS. 23, 25, 27, and 29 are manufactured in the wired rubber contact shown in FIG. Are plan views illustrating the method.
도 21은 도 18 내지 도 20의 공정을 통하여 제조된 통전부재를 나타내는 단면도이다.FIG. 21 is a cross-sectional view illustrating a conductive member manufactured through the process of FIGS. 18 to 20.
도 21을 참조하면, 통전부재(1300)는 하부전극부(310)와 상부전극부(320)를 연결한다. 하부전극부(310)는 원시하부필름(1101)의 개구부들을 관통하여 배치되며, 상부전극부(320)는 원시상부필름(1201)의 개구부들을 관통하여 배치된다. 본 실시예에서, 통전부재(1300)는 원시하부필름(1101)과 원시상부필름(1201)의 중앙영역 내에만 배치된다.Referring to FIG. 21, the energizing member 1300 connects the lower electrode 310 and the upper electrode 320. The lower electrode 310 is disposed through the openings of the original lower film 1101, and the upper electrode 320 is disposed through the openings of the original upper film 1201. In the present embodiment, the energizing member 1300 is disposed only in the center region of the original lower film 1101 and the original upper film 1201.
도 22는 도 21에 도시된 원시하부필름과 원시상부필름의 사이에 실리콘러버를 충진하는 단계를 나타내는 단면도이다.FIG. 22 is a cross-sectional view illustrating a step of filling a silicon rubber between the raw bottom film and the raw top film shown in FIG. 21.
도 22를 참조하면, 원시하부필름(1101)과 원시상부필름(1201)의 사이에 실리콘러버를 충진한다. 본 실시예에서, 실리콘러버는 통전부재(1300)가 배치되는 중앙영역 뿐만 아니라 통전부재(1300)가 배치되지 않으며 상기 중앙영역을 포위하는 주변영역 내에도 배치된다. 이어서 충진된 실리콘러버를 경화시킨다.Referring to FIG. 22, a silicon rubber is filled between the raw bottom film 1101 and the raw top film 1201. In the present embodiment, the silicon rubber is disposed not only in the central region in which the energizing member 1300 is disposed, but also in the peripheral region surrounding the central region in which the energizing member 1300 is not disposed. The filled silicone rubber is then cured.
도 23은 도 22에 도시된 원시하부필름과 원시상부필름 및 경화된 실리콘러버의 일부를 컷팅하여 하부필름, 상부필름 및 러버층을 형성하는 단계를 나타내는 평면도이고, 도 24는 도 23에 도시된 VI-VI' 라인의 단면도이다.FIG. 23 is a plan view illustrating a process of forming a lower film, an upper film, and a rubber layer by cutting a portion of the raw lower film, the upper upper film, and the cured silicon rubber shown in FIG. 22, and FIG. 24 is shown in FIG. 23. Sectional view of the VI-VI 'line.
도 22 내지 도 24를 참조하면, 통전부재(300)가 배치된 중앙영역(CA)과 통전부재(300)가 배치되지 않는 주변영역(PA)의 경계부를 따라서 원시하부필름(1101), 경화된 실리콘러버(1151) 및 원시상부필름(1201)을 커팅하여, 하부필름(1102), 러버층(1150) 및 상부필름(1200)을 형성한다.Referring to FIGS. 22 to 24, the raw lower film 1101 is cured along the boundary between the central area CA in which the conducting member 300 is disposed and the peripheral area PA in which the conducting member 300 is not disposed. The silicon rubber 1151 and the raw upper film 1201 are cut to form the lower film 1102, the rubber layer 1150, and the upper film 1200.
도 25는 필름가이드에 점착테이프를 부착하는 단계를 나타내는 단면도이고, 도 26은 도 25의 VII-VII' 라인의 단면도이다.FIG. 25 is a cross-sectional view illustrating a step of attaching an adhesive tape to a film guide, and FIG. 26 is a cross-sectional view of the VII-VII ′ line of FIG. 25.
도 25 및 도 26을 참조하면, 필름가이드(1120)의 하면에 점착테이프(1123)를 부착한다. 필름가이드(1120)는 하부필름(1102) 및 러버층(1150)이 수납되는 중앙개구부(1108) 및 스테이지(도 3의 30)에 고정하기 위한 고정홀(1107)을 포함한다. 점착테이프(1123)는 첩착 및 탈착이 용이하며, 점착물질이 코팅된 상면에 필름가이드(1120)의 하면이 부착된다.25 and 26, the adhesive tape 1123 is attached to the lower surface of the film guide 1120. The film guide 1120 includes a central opening 1108 in which the lower film 1102 and the rubber layer 1150 are accommodated, and a fixing hole 1107 for fixing to the stage (30 of FIG. 3). The adhesive tape 1123 is easily attached and detached, and the lower surface of the film guide 1120 is attached to the upper surface coated with the adhesive material.
필름가이드(1120)의 중앙개구부(1108)를 통하여 점착테이프(1123)의 중앙부분이 노출된다.The central portion of the adhesive tape 1123 is exposed through the central opening 1108 of the film guide 1120.
도 27은 도 23 및 도 24에 도시된 하부필름을 도 25 및 도 26에 도시된 점착테이프에 부착하는 단계를 나타내는 평면도이고, 도 28은 도 27의 VIII-VIII' 라인의 단면도이다.FIG. 27 is a plan view illustrating a step of attaching the lower film shown in FIGS. 23 and 24 to the adhesive tape shown in FIGS. 25 and 26, and FIG. 28 is a cross-sectional view taken along the line VIII-VIII ′ of FIG. 27.
도 23 내지 도 28을 참조하면, 하부필름(1102)의 하면을 필름가이드(1120)의 중앙개구부(1108)를 통하여 노출된 점착테이프(1123)의 상면에 부착한다. 본 실시예에서, 상부필름(1200)을 가압하여 하부필름(1102)의 하면이 점착테이프(1123)에 부착되도록 하되, 하부전극부(310)의 하부가 필름가이드(1120)의 하면보다 아래쪽에 배치하도록 한다. 하부전극부(310)의 하부가 필름가이드(1120)의 하면보다 아래쪽에 배치되면, 점착테이프(1123)가 제거된 후 하부전극부(310)가 스테이지(도 3의 30)의 전극패드(도 3의 31)에 용이하게 접촉할 수 있다.23 to 28, the lower surface of the lower film 1102 is attached to the upper surface of the adhesive tape 1123 exposed through the central opening 1108 of the film guide 1120. In this embodiment, the upper film 1200 is pressed so that the lower surface of the lower film 1102 is attached to the adhesive tape 1123, but the lower portion of the lower electrode 310 is lower than the lower surface of the film guide 1120. Place it. When the lower portion of the lower electrode 310 is disposed below the lower surface of the film guide 1120, after the adhesive tape 1123 is removed, the lower electrode 310 is disposed on the electrode pad of the stage (30 of FIG. 3). 3, 31) can be easily contacted.
도 29는 도 27 및 도 28에 도시된 러버층을 필름가이드에 부착하는 단계를 나타내는 평면도이고, 도 30은 도 29에 도시된 IX-IX' 라인의 단면도이다.FIG. 29 is a plan view illustrating the step of attaching the rubber layers illustrated in FIGS. 27 and 28 to the film guide, and FIG. 30 is a cross-sectional view of the line IX-IX ′ illustrated in FIG. 29.
도 29 및 도 30을 참조하면, 러버층(1150)과 필름가이드(1120)의 경계부를 따라서 탄성접착제를 도포한다. 예를 들어, 탄성접착제는 실리콘 수지를 포함할 수 있다. 본 실시예에서, 러버층(1150)의 측면과 필름가이드(1120)의 상면 중에서 러버층(1150)에 인접한 부분에 실리콘수지를 도포하면, 도포된 실리콘수지는 러버층(1150)의 측면 및 필름가이드의 상면 일부를 코팅한다.29 and 30, an elastic adhesive is applied along the boundary of the rubber layer 1150 and the film guide 1120. For example, the elastic adhesive may comprise a silicone resin. In the present embodiment, when the silicone resin is applied to a portion of the side of the rubber layer 1150 and the upper surface of the film guide 1120 adjacent to the rubber layer 1150, the applied silicone resin is the side of the rubber layer 1150 and the film Coating part of the top of the guide.
이어서, 코팅된 실리콘수지를 경화시켜서 러버층(1150)과 필름가이드(1120)를 결합하는 접착부재(1160)가 생성된다. 본 실시예에서, 접착부재(1160)는 러버층(1150)의 측면 뿐만 아니라 상부필름(1200)의 측면도 커버하여, 상부필름(1200)의 가장자리가 러버층(1150)으로부터 박리되는 것을 방지한다. 다른 실시예에서, 접착부재(1160) 대신에 결합치구(도시되지 않음)를 이용하여 상부필름(1200)과 러버층(1150)을 결합할 수도 있다.Subsequently, an adhesive member 1160 is formed to cure the coated silicone resin to bond the rubber layer 1150 and the film guide 1120. In this embodiment, the adhesive member 1160 covers not only the side of the rubber layer 1150 but also the side of the upper film 1200 to prevent the edge of the upper film 1200 from being peeled from the rubber layer 1150. In another embodiment, the upper film 1200 and the rubber layer 1150 may be bonded using a joining jig (not shown) instead of the adhesive member 1160.
도 31은 도 29 및 도 30에 도시된 점착테이프를 제거하는 단계를 나타내는 단면도이다.FIG. 31 is a cross-sectional view illustrating a step of removing the adhesive tape shown in FIGS. 29 and 30.
도 29 내지 도 31을 참조하면, 이어서 하부기판(1102)의 하면 및 필름가이드(1120)의 하면으로부터 점착테이프(1123)를 제거한다. 따라서 와이어드 러버 컨택트가 완성된다.29 to 31, the adhesive tape 1123 is removed from the lower surface of the lower substrate 1102 and the lower surface of the film guide 1120. This completes the wired rubber contact.
상기와 같은 본 실시예에 따르면, 탄성부재(1160) 및 필름가이드(1120)가 러버층(1150), 하부필름(1102) 및 상부필름(1200)의 측면을 커버하여 외부의 충격으로부터 하부필름(1102) 또는 상부필름(1200)이 러버층(1150)으로부터 박리되는 것을 방지한다.According to the present embodiment as described above, the elastic member 1160 and the film guide 1120 cover the sides of the rubber layer 1150, the lower film 1102 and the upper film 1200 to prevent the lower film ( 1102 or upper film 1200 is prevented from peeling off from rubber layer 1150.
또한, 접착부재(1160)가 탄성을 가져서 외부충격이 통전부재(1300)로 전달되는 것을 방지한다.In addition, the adhesive member 1160 has elasticity to prevent the external shock from being transmitted to the energizing member 1300.
더욱이, 컨베이어(501, 502)를 통하여 도전와이어(1330)를 연속적으로 부착할 수 있어서, 제조시간이 단축된다.Furthermore, the conductive wires 1330 can be continuously attached through the conveyors 501 and 502, thereby shortening the manufacturing time.
또한, 도전와이어(1330)의 길이는 원시하부필름(1101)과 원시상부필름(1201) 사이의 거리 및 하부필름(1102)과 상부필름(1200) 사이의 거리보다 길어서, 제조과정에서 외부충격에 의해 도전와이어(1330)가 끊어지는 것이 방지된다.In addition, the length of the conductive wire 1330 is longer than the distance between the original lower film 1101 and the original upper film 1201 and the distance between the lower film 1102 and the upper film 1200, and thus the external impact during the manufacturing process. This prevents the conductive wire 1330 from breaking.
도 32는 본 발명의 일 실시예에 따른 와이어드 러버 컨택트의 제조방법을 나타내는 단면도이고, 도 33은 도 32의 ‘C’ 부분을 확대한 단면도이다. 본 실시예에서, 몰드를 제외한 나머지 구성요소들은 도 18 내지 도 31에 도시된 실시예와 동일하므로 동일한 구성요소들에 대한 중복되는 설명은 생략한다.32 is a cross-sectional view illustrating a method of manufacturing a wired rubber contact according to an embodiment of the present invention, and FIG. 33 is an enlarged cross-sectional view of a portion 'C' of FIG. 32. In the present embodiment, the rest of the components except for the mold is the same as the embodiment shown in Figs. 18 to 31, and overlapping description of the same components will be omitted.
도 32 및 도 33을 참조하면, 와이어드 러버 컨택트를 제조하기 위하여, 먼저 두 개의 마주보는 컨베이어들(501, 502)을 배치한다.32 and 33, in order to manufacture the wired rubber contact, two opposing conveyors 501, 502 are first placed.
원시하부필름(1101) 및 원시상부필름(1201)은 각각 컨베이어들(501, 502)의 상부로부터 하부쪽으로 이동한다. 상부원시필름(1201) 상에 원시몰드(1141)가 적하된다. 본 실시예에서, 원시몰드(1141)는 경화되지 않은 합성수지를 포함하며, 원시상부필름(1201)의 주변부를 포위하듯이 도포된다. 다른 실시예에서, 원시몰드(1141)가 원시하부필름(1101) 상에 적하되거나, 원시상부필름(1201) 및 원시하부필름(1101) 상에 함께 적하될 수도 있다. 예를 들어, 원시몰드는 포토레지스트를 포함할 수 있다.The original lower film 1101 and the original upper film 1201 move from the top to the bottom of the conveyors 501 and 502, respectively. The primitive mold 1141 is dripped on the upper raw film 1201. In this embodiment, the raw mold 1141 comprises uncured synthetic resin and is applied as if surrounding the periphery of the raw top film 1201. In another embodiment, the raw mold 1141 may be dropped on the raw bottom film 1101, or may be dropped together on the raw top film 1201 and the raw bottom film 1101 together. For example, the raw mold may include a photoresist.
원시하부필름(1101) 및 원시상부필름(1201)이 이동되는 과정에서 원시상부필름(1201) 상에 적하된 원시몰드(1141)는 원시하부필름(1101)에 접촉하여 부착된다.In the process of moving the original lower film 1101 and the original upper film 1201, the raw mold 1141 dropped on the original upper film 1201 is contacted and attached to the original lower film 1101.
컨베이어들(501, 502) 사이의 거리가 좁아지는 부분에서 하부전극부(310) 및 상부전극부(320)를 연결하는 도전와이어(1330)가 배치된다.The conductive wire 1330 connecting the lower electrode 310 and the upper electrode 320 is disposed at a portion where the distance between the conveyors 501 and 502 becomes narrow.
도 34 내지 도 37은 도 32에 도시된 와이어드 러버 컨택트의 제조방법을 나타내는 단면도들이다.34 to 37 are cross-sectional views illustrating a method of manufacturing the wired rubber contact shown in FIG. 32.
도 34는 도 32 및 도 33의 공정을 통하여 제조된 통전부재를 나타내는 단면도이다.FIG. 34 is a cross-sectional view illustrating the energizing member manufactured through the process of FIGS. 32 and 33.
도 32 내지 도 34를 참조하면, 통전부재(1300)는 하부전극부(310)와 상부전극부(320)를 연결하며, 원시하부필름(1101)과 원시상부필름(1201)의 중앙영역 내에만 배치된다. 원시몰드(1141)는 원시하부필름(1101)과 원시상부필름(1201)의 주변영역에 배치되어 통전부재(1300)를 포위한다.32 to 34, the energizing member 1300 connects the lower electrode 310 and the upper electrode 320, and only within the central region of the raw lower film 1101 and the raw upper film 1201. Is placed. The primitive mold 1141 is disposed in the peripheral region of the primitive lower film 1101 and the primitive upper film 1201 to surround the energizing member 1300.
이어서 원시몰드(1141)를 경화시켜서 몰드(1140)를 형성한다. 원시하부필름(1101), 원시상부필름(1201) 및 몰드(1140)에 의해 내부공간(151)이 정의된다.The primitive mold 1141 is then cured to form a mold 1140. The inner space 151 is defined by the original lower film 1101, the original upper film 1201, and the mold 1140.
도 35는 도 34에 도시된 내부공간에 실리콘러버를 충진하는 단계를 나타내는 단면도이다.35 is a cross-sectional view illustrating a step of filling a silicon rubber in the internal space shown in FIG. 34.
도 34 및 도 35를 참조하면, 원시하부필름(1101), 원시상부필름(1201) 및 몰드(1140)에 의해 정의되는 내부공간(151)에 실리콘러버를 충진한다. 본 실시예에서, 실리콘러버는 통전부재(1300)가 배치되는 중앙영역에만 배치된다. 이어서 충진된 실리콘러버를 경화시킨다.34 and 35, the silicon rubber is filled in the internal space 151 defined by the original lower film 1101, the original upper film 1201, and the mold 1140. In this embodiment, the silicon rubber is disposed only in the central region where the energizing member 1300 is disposed. The filled silicone rubber is then cured.
도 36은 도 35에 도시된 원시상부필름의 일부를 컷팅하고 몰드를 제거하는 단계를 나타내는 단면도이다.FIG. 36 is a cross-sectional view illustrating a process of cutting a portion of a raw upper film shown in FIG. 35 and removing a mold;
도 35 및 도 36을 참조하면, 통전부재(1300)가 배치된 중앙영역(CA)과 통전부재(1300)가 배치되지 않는 주변영역(PA)의 경계부를 따라서 원시상부필름(1101)을 커팅하여 상부필름(1200)을 형성한다. 본 실시예에서, 원시상부필름(1201)의 커팅라인은 몰드(1150)의 가장자리와 동일하다. 다른 실시예에서, 원시상부필름(1201)의 커팅라인이 몰드(1150)의 상면에 배치되어 갭(도 2의 g)을 형성할 수도 있다.Referring to FIGS. 35 and 36, the raw upper film 1101 is cut along the boundary between the central area CA in which the conducting member 1300 is disposed and the peripheral area PA in which the conducting member 1300 is not disposed. The upper film 1200 is formed. In this embodiment, the cutting line of the raw upper film 1201 is the same as the edge of the mold 1150. In another embodiment, a cutting line of the raw top film 1201 may be disposed on the top surface of the mold 1150 to form a gap (g of FIG. 2).
이후에, 몰드(1140)를 제거하여 원시하부필름(1101)의 상면 및 러버층(1150)의 측면을 노출시킨다. 예를 들어, 현상액 등의 용제를 이용하여 몰드(1140)를 제거할 수 있다.Thereafter, the mold 1140 is removed to expose the top surface of the raw bottom film 1101 and the side surface of the rubber layer 1150. For example, the mold 1140 can be removed using a solvent such as a developing solution.
도 37은 도 36에 도시된 원시하부필름(1101)의 상면에 필름가이드를 부착하는 단계를 나타내는 단면도이다.FIG. 37 is a cross-sectional view illustrating a step of attaching a film guide to an upper surface of the original lower film 1101 shown in FIG. 36.
도 37을 참조하면, 원시하부필름(1101)의 상면에 필름가이드(1120)를 부착한다. 상부필름(1200), 상부전극부(320) 및 러버층(1150)은 필름가이드(1120)의 중앙개구부를 통하여 노출된다.Referring to FIG. 37, the film guide 1120 is attached to an upper surface of the original lower film 1101. The upper film 1200, the upper electrode part 320, and the rubber layer 1150 are exposed through the central opening of the film guide 1120.
상기와 같은 본 실시예에 따르면, 연속적인 공정으로 도전와이어(1330) 및 몰드(1140)를 원시상부필름(1201)과 원시하부필름(1101)의 사이에 개재하여 공정시간이 단축된다.According to the present embodiment as described above, the process time is shortened by interposing the conductive wire 1330 and the mold 1140 between the original upper film 1201 and the original lower film 1101 in a continuous process.
또한, 몰드(1140)를 이용하여 형성된 내부공간(151)에만 러버층(1150)을 형성하여, 경화된 실리콘러버(도 22의 1151)를 커팅하는 공정이 생략되어 커팅공정에서 발생하는 불량이 감소한다.In addition, the rubber layer 1150 is formed only in the internal space 151 formed by using the mold 1140, thereby cutting the cured silicon rubber (1151 of FIG. 22), thereby reducing defects in the cutting process. do.
도 38 및 도 39는 본 발명의 일 실시예에 따른 와이어드 러버 컨택트의 제조방법을 나타내는 단면도들이다. 본 실시예에서, 통전부재를 제외한 나머지 구성요소들은 도 1 내지 도 37에 도시된 실시예들과 동일하므로 동일한 구성요소들에 대한 중복되는 설명은 생략된다.38 and 39 are cross-sectional views illustrating a method of manufacturing a wired rubber contact according to an embodiment of the present invention. In the present embodiment, the remaining components except for the conducting member are the same as the embodiments shown in Figs. 1 to 37, so that duplicate description of the same components is omitted.
도 38을 참조하면, 중앙영역 내에 복수개의 개구부들이 형성된 원시하부필름(2101) 및 원시상부필름(2201)을 준비한다.Referring to FIG. 38, a raw bottom film 2101 and a raw top film 2201 having a plurality of openings formed in a central area are prepared.
이어서, 원시하부필름(2101)의 각 개구부를 충진하는 하부전극부(2310)를 형성하고, 원시상부필름(2201)의 각 개구부 주변에 상부전극부(2320)를 형성한다. 본 실시예에서, 하부전극부(2310)는 원시하부필름(2101)의 각 개구부를 매립하지만, 상부전극부(2320)는 원시상부필름(2201)의 각 개구부를 매립하지 않고 중앙에 관통홀을 유지한다. 즉, 상부전극부(2320)는 원시상부필름(2201)의 각 개구부의 가장자리를 따라서 형성된다.Subsequently, a lower electrode part 2310 is formed to fill each opening of the raw bottom film 2101, and an upper electrode part 2320 is formed around each opening of the raw top film 2201. In the present embodiment, the lower electrode portion 2310 fills each opening of the original lower film 2101, but the upper electrode portion 2320 has a through hole in the center without filling each opening of the raw upper film 2201. Keep it. That is, the upper electrode part 2320 is formed along the edge of each opening of the original upper film 2201.
이후에, 상부전극부(2320)의 관통홀을 통하여 하부전극부(2310)가 노출되도록, 원시상부필름(2201)과 원시하부필름(2101)을 배열한다.Thereafter, the source upper film 2201 and the source lower film 2101 are arranged such that the lower electrode part 2310 is exposed through the through hole of the upper electrode part 2320.
계속해서, 하부전극부(2310)와 상부전극부(2320)에 도전와이어(2330)를 결합시킨다. 본실시예에서, 도전와이어(2330)의 일단은 하부전극부(2310)의 상면에 연결되고 타단은 상부전극부(2320)의 상면 또는 내면에 연결된다. 예를 들어, 솔더링을 이용하여 도전와이어(2330)를 하부전극부(2310)와 상부전극부(2320)에 본딩할 수도 있다.Subsequently, the conductive wires 2330 are coupled to the lower electrode portion 2310 and the upper electrode portion 2320. In this embodiment, one end of the conductive wire 2330 is connected to the upper surface of the lower electrode portion 2310 and the other end is connected to the upper or inner surface of the upper electrode portion 2320. For example, the conductive wire 2330 may be bonded to the lower electrode portion 2310 and the upper electrode portion 2320 using soldering.
이어서, 원시상부필름(2201)과 원시하부필름(2101)의 거리를 이격시켜서 도전와이어(2330)가 원시상부필름(2201)과 원시하부필름(2101)의 사이에 오도록 배치한다. 이때, 상부전극부(2320)의 관통홀을 매립하는 솔더링 공정이 추가될 수도 있다.Subsequently, the distance between the upper upper film 2201 and the lower lower film 2101 is spaced apart so that the conductive wire 2330 is disposed between the upper upper film 2201 and the lower lower film 2101. In this case, a soldering process of filling the through hole of the upper electrode part 2320 may be added.
이후에, 원시상부필름(2201)과 원시하부필름(2101)의 사이에 실리콘러버 등을 충진하고 경화시킨다.Thereafter, the silicon rubber is filled and cured between the raw upper film 2201 and the raw lower film 2101.
계속해서, 원시상부필름(2201) 및/또는 경화된 실리콘러버(도시되지 않음)을 커팅하여 상부필름(도시되지 않음) 및 러버층(도시되지 않음)을 형성한다.Subsequently, the raw top film 2201 and / or cured silicon rubber (not shown) are cut to form a top film (not shown) and a rubber layer (not shown).
이어서, 러버층(도시되지 않음)의 측면을 따라서 필름가이드(도시되지 않음)를 배치한다.Next, a film guide (not shown) is disposed along the side of the rubber layer (not shown).
상기와 같은 본 실시예에 따르면, 상부전극부(2320)와 하부전극부(2310)가 서로 다른 구조를 가져서, 동시에 다수의 도전와이어(2330)를 상부전극부(2320)와 하부전극부(2310)에 결합하는 것이 가능하다.According to the present exemplary embodiment as described above, the upper electrode portion 2320 and the lower electrode portion 2310 have different structures, so that a plurality of conductive wires 2330 are simultaneously connected to the upper electrode portion 2320 and the lower electrode portion 2310. It is possible to combine
상기 실시예들에서는 러버층을 포함하는 구조를 개시하고 있다. 다른 실시예에서, 러버층을 생략하고 도전와이어 자체의 탄성을 이용하여 와이어드 러버 컨택트를 구현할 수도 있다.In the above embodiments, a structure including a rubber layer is disclosed. In another embodiment, the rubber layer may be omitted and the wired rubber contact may be implemented using the elasticity of the conductive wire itself.
상기 실시예들에서, 원시상부필름 및 원시하부필름은 각각 상부필름 및 하부필름이라는 용어와 혼용해서 사용할 수 있다.In the above embodiments, the raw top film and the raw bottom film can be used interchangeably with the terms top film and bottom film, respectively.
상기와 같은 본 발명의 실시예들에 따르면, 통전부재의 하부전극부 및 상부전극부가 하부필름 및 상부필름에 견고하게 결합되어 하부전극부 또는 상부전극부가 러버층 내로 매립되는 불량이 방지된다.According to the embodiments of the present invention as described above, the lower electrode portion and the upper electrode portion of the energizing member is firmly coupled to the lower film and the upper film to prevent the failure of the lower electrode portion or the upper electrode portion embedded in the rubber layer.
또한, 하부필름의 가장자리에 해당하는 주변영역이 러버층의 외측으로 연장되고 필름가이드가 주변영역에서 하부필름과 결합하여, 와이어드 러버 컨택트를 스테이지 상에 용이하게 배치하거나 고정할 수 있다. 더욱이 필름가이드가 러버층과 인접하게 배치되어, 외력을 분산시켜서 상기 외력이 하부필름과 러버층 사이의 경계에 집중되는 것을 방지한다. 따라서 하부필름이 러버층으로부터 박리되는 것이 방지된다.In addition, the peripheral area corresponding to the edge of the lower film extends to the outside of the rubber layer and the film guide is combined with the lower film in the peripheral area, so that the wired rubber contact can be easily disposed or fixed on the stage. Furthermore, the film guide is disposed adjacent to the rubber layer to disperse the external force, thereby preventing the external force from concentrating on the boundary between the lower film and the rubber layer. Therefore, the lower film is prevented from peeling off from the rubber layer.
또한, 상부필름의 가장자리와 하부필름의 중앙영역의 가장자리 사이에는 갭이 형성되어, 외력에 의해 상부필름이 러버층으로부터 박리되는 현상을 방지하여 통전부재의 전기적 연결이 안정된다.In addition, a gap is formed between the edge of the upper film and the edge of the center region of the lower film, thereby preventing the upper film from being peeled from the rubber layer by external force, thereby making the electrical connection of the conducting member stable.
더욱이, 상부필름과 하부필름이 러버층의 상하면을 커버하여, 먼지, 습기 등 외부의 오염물질로부터 러버층 및 통전부재를 보호한다.Moreover, the upper film and the lower film cover the upper and lower surfaces of the rubber layer to protect the rubber layer and the conducting member from external contaminants such as dust and moisture.
또한, 상부필름을 가압하여 하부필름의 하면이 점착테이프에 부착되도록 하되, 하부전극부의 하부가 필름가이드의 하면보다 아래쪽에 배치하도록 한다. 하부전극부의 하부가 필름가이드의 하면보다 아래쪽에 배치되면, 점착테이프가 제거된 후 하부전극부가 스테이지의 전극패드에 용이하게 접촉할 수 있다.In addition, the lower surface of the lower film is attached to the adhesive tape by pressing the upper film, but the lower electrode portion is disposed below the lower surface of the film guide. When the lower portion of the lower electrode portion is disposed below the lower surface of the film guide, the lower electrode portion can easily contact the electrode pad of the stage after the adhesive tape is removed.
더욱이, 탄성부재 및 필름가이드가 러버층, 하부필름 및 상부필름의 측면을 커버하여 외부의 충격으로부터 하부필름 또는 상부필름이 러버층으로부터 박리되는 것을 방지한다.Moreover, the elastic member and the film guide cover the side of the rubber layer, the lower film and the upper film to prevent the lower film or the upper film from being peeled from the rubber layer from external impact.
또한, 접착부재가 탄성을 가져서 외부충격이 통전부재로 전달되는 것을 방지한다.In addition, the adhesive member has elasticity to prevent external shock from being transmitted to the energizing member.
더욱이, 컨베이어를 통하여 도전와이어를 연속적으로 부착할 수 있어서, 제조시간이 단축된다.Moreover, the conductive wire can be continuously attached through the conveyor, so that the manufacturing time is shortened.
또한, 도전와이어의 길이는 원시하부필름과 원시상부필름 사이의 거리 및 하부필름과 상부필름 사이의 거리보다 길어서, 제조과정에서 외부충격에 의해 도전와이어가 끊어지는 것이 방지된다.In addition, the length of the conductive wire is longer than the distance between the raw lower film and the upper upper film and the distance between the lower film and the upper film, thereby preventing the conductive wire from being broken by external impact during the manufacturing process.
더욱이, 연속적인 공정으로 도전와이어 및 몰드를 원시상부필름과 원시하부필름의 사이에 개재하여 공정시간이 단축된다.Moreover, the process time is shortened by interposing the conductive wire and the mold between the raw top film and the raw bottom film in a continuous process.
또한, 몰드를 이용하여 형성된 내부공간에만 러버층을 형성하여, 경화된 실리콘러버를 커팅하는 공정이 생략되어 커팅공정에서 발생하는 불량이 감소한다.In addition, the rubber layer is formed only in the inner space formed using the mold, so that the process of cutting the cured silicon rubber is omitted, thereby reducing defects in the cutting process.
더욱이, 상부전극부와 하부전극부가 서로 다른 구조를 가져서, 동시에 다수의 도전와이어를 상부전극부와 하부전극부에 결합하는 것이 가능하다.Moreover, the upper electrode portion and the lower electrode portion have different structures, and thus it is possible to combine a plurality of conductive wires at the same time with the upper electrode portion and the lower electrode portion.
따라서 수명이 연장되고 신뢰성이 향상된다.Therefore, the service life is extended and the reliability is improved.
본 발명은 반도체의 테스트 장비, 회로부품들 사이의 연결부재 등에 적용되는 산업상 이용가능성을 갖는다. 상기의 본 실시예에서는 반도체 칩과 검사용 스테이지를 연결하는 와이어드 러버 컨택트에 대해서 개시하고 있으나, 당해기술분야에서 통상의 지식과 경험을 가진 자라면 종래의 이방성 도전필름이 사용되던 곳이라면 어디라도 본 발명의 개념이 적용될 수 있음을 알 수 있을 것이다.The present invention has industrial applicability applied to test equipment of semiconductors, connecting members between circuit components, and the like. In the above-described embodiment, a wired rubber contact connecting a semiconductor chip and an inspection stage is disclosed, but any person having ordinary knowledge and experience in the art may see wherever conventional anisotropic conductive films are used. It will be appreciated that the inventive concept may be applied.
상술한 바와 같이, 본 발명의 바람직한 실시예를 참조하여 설명하였지만 해당 기술 분야에서 통상의 지식을 가진 자라면 하기의 특허청구범위에 기재된 본 발명의 사상 및 영역으로부터 벗어나지 않는 범위 내에서 본 발명을 다양하게 수정 및 변경시킬 수 있음을 이해할 수 있을 것이다.As described above, the present invention has been described with reference to a preferred embodiment of the present invention, but those skilled in the art may vary the present invention without departing from the spirit and scope of the present invention as set forth in the claims below. It will be understood that modifications and changes can be made.

Claims (10)

  1. 복수개의 개구부들이 형성되는 중앙영역 및 상기 중앙영역을 포위하는 주변영역을 포함하고, 상기 개구부들 내에 형성된 복수개의 하부전극부들을 포함하는 하부필름;A lower film including a central region in which a plurality of openings are formed and a peripheral region surrounding the central region, and including a plurality of lower electrode portions formed in the openings;
    복수개의 개구부들 및 상기 개구부들 내에 형성된 복수개의 상부전극부들을 포함하고, 가장자리가 상기 하부필름의 상기 중앙영역과 상기 주변영역 사이의 경계보다 안쪽에 배치되는 상부필름;An upper film including a plurality of openings and a plurality of upper electrode portions formed in the openings, the upper film having an edge disposed inside the boundary between the central area and the peripheral area of the lower film;
    상기 하부필름과 상기 상부필름 사이에 배치되고 상기 하부전극부들과 상기 상부전극부들 사이를 연결하는 복수개의 도전와이어들;A plurality of conductive wires disposed between the lower film and the upper film and connecting the lower electrode portions and the upper electrode portions;
    탄성이 있는 물질을 포함하고, 상기 하부필름의 상기 중앙영역 내에 배치되며, 가장자리가 상기 상부필름의 가장자리보다 바깥쪽으로 돌출되고, 상기 도전와이어들을 매립하고 상기 하부필름과 상기 상부필름 사이의 거리를 일정하게 유지시키는 러버층; 및An elastic material, disposed in the central region of the lower film, an edge protruding outward from an edge of the upper film, embedding the conductive wires, and maintaining a distance between the lower film and the upper film; Rubber layer to keep it; And
    상기 러버층의 측면을 따라서 상기 하부필름의 상기 주변영역 상에 배치되고 상기 하부필름과 일체로 형성되며 상기 하부필름보다 두꺼운 두께를 갖는 필름가이드를 포함하는 와이어드 러버 컨택트.And a film guide disposed on the peripheral area of the lower film along the side of the rubber layer and integrally formed with the lower film, the film guide having a thickness greater than that of the lower film.
  2. 제1항에 있어서, 상기 상부필름과 상기 하부필름은 상기 러버층과 일체로 형성되는 것을 특징으로 하는 와이어드 러버 컨택트.The wired rubber contact as claimed in claim 1, wherein the upper film and the lower film are integrally formed with the rubber layer.
  3. 복수개의 개구부들이 형성되는 중앙영역 및 상기 중앙영역을 포위하는 주변영역을 포함하는 하부필름에 상기 각 개구부를 관통하는 하부전극부를 형성하는 단계;Forming a lower electrode portion penetrating the openings in a lower film including a central region in which a plurality of openings are formed and a peripheral region surrounding the central region;
    상기 주변영역 상에 상기 하부필름의 유동을 방지하며 중앙이 개구되어 상기 중앙영역을 노출하는 지지판을 부착하는 단계;Attaching a support plate preventing the flow of the lower film on the peripheral area and opening the center to expose the central area;
    상기 하부전극부 상에 수직방향으로 배열되는 도전와이어를 결합하는 단계;Coupling conductive wires arranged in a vertical direction on the lower electrode portion;
    상기 지지판 상에 상기 중앙영역을 포위하는 몰드를 형성하는 단계;Forming a mold surrounding the central region on the support plate;
    복수개의 개구부들 및 상기 개구부들 내에 형성된 복수개의 상부전극부들을 포함하는 원시상부필름을 상기 도전와이어 및 상기 몰드 상에 배치하고, 상기 도전와이어의 상단을 상기 상부전극부들에 결합하는 단계;Disposing a raw upper film including a plurality of openings and a plurality of upper electrode portions formed in the openings on the conductive wire and the mold, and coupling an upper end of the conductive wire to the upper electrode portions;
    상기 하부필름, 상기 몰드 및 상기 원시상부필름에 의해 정의되는 내부공간에 러버층을 형성하는 단계;Forming a rubber layer in an inner space defined by the lower film, the mold and the raw upper film;
    상기 하부필름의 상기 중앙영역과 상기 주변영역 사이의 경계보다 안쪽에 배치되는 커팅라인을 따라서 상기 원시상부필름을 커팅하여 가장자리가 상기 러버층의 가장자리보다 안쪽에 배치되는 상부필름을 형성하는 단계;Cutting the raw upper film along a cutting line disposed inward from a boundary between the central area and the peripheral area of the lower film to form an upper film having an edge disposed inward of an edge of the rubber layer;
    상기 몰드 및 상기 지지판을 제거하는 단계; 및Removing the mold and the support plate; And
    상기 하부필름의 상기 주변영역 상에 필름가이드를 부착하는 단계를 포함하는 와이어드 러버 컨택트의 제조방법.And attaching a film guide on the peripheral area of the lower film.
  4. 제3항에 있어서, 상기 필름가이드를 부착하는 단계는, 상기 필름가이드를 상기 하부필름과 일체형으로 형성하는 단계를 포함하는 것을 특징으로 하는 와이어드 러버 컨택트의 제조방법.The method of claim 3, wherein attaching the film guide comprises forming the film guide integrally with the lower film.
  5. 복수개의 개구부들 및 상기 개구부들 내에 형성된 복수개의 하부전극부들을 포함하는 하부필름;A lower film including a plurality of openings and a plurality of lower electrode portions formed in the openings;
    복수개의 개구부들 및 상기 개구부들 내에 형성되며 상기 하부전극부들을 마주보는 복수개의 상부전극부들을 포함하는 상부필름;An upper film including a plurality of openings and a plurality of upper electrode portions formed in the openings and facing the lower electrode portions;
    상기 하부필름과 상기 상부필름 사이에 배치되고 상기 하부전극부들과 상기 상부전극부들 사이를 연결하며, 길이가 상기 하부필름과 상기 상부필름 사이의 이격거리보다 긴 복수개의 도전와이어들;A plurality of conductive wires disposed between the lower film and the upper film and connecting the lower electrode portions and the upper electrode portions, and having a length greater than a separation distance between the lower film and the upper film;
    탄성이 있는 물질을 포함하고, 상기 하부필름과 상기 상부필름 사이에 배치되어 상기 도전와이어들을 매립하고 상기 하부필름과 상기 상부필름 사이의 거리를 일정하게 유지시키는 러버층;A rubber layer comprising an elastic material and disposed between the lower film and the upper film to fill the conductive wires and to maintain a constant distance between the lower film and the upper film;
    상기 러버층 및 상기 하부필름의 측면을 포위하도록 배치되고 상기 하부필름보다 두꺼운 두께를 갖는 필름가이드; 및A film guide disposed to surround side surfaces of the rubber layer and the lower film and having a thickness thicker than that of the lower film; And
    탄성접착제를 포함하고 상기 러버층의 측면과 상기 필름가이드의 상면에 부착되어 상기 러버층과 상기 필름가이드를 결합시키는 결합부재를 포함하는 와이어드 러버 컨택트.A wired rubber contact comprising an elastic adhesive and attached to a side of the rubber layer and an upper surface of the film guide to couple the rubber layer to the film guide.
  6. 제5항에 있어서, 상기 결합부재는 접착부재 또는 결합치구를 포함하는 것을 특징으로 하는 와이어드 러버 컨택트.6. The wired rubber contact as claimed in claim 5, wherein the coupling member comprises an adhesive member or a coupling jig.
  7. 복수개의 개구부들이 형성되는 중앙영역 및 상기 중앙영역을 포위하는 주변영역을 포함하고 상기 개구부들 내에 형성된 복수개의 하부전극부들을 포함하는 원시하부필름과, 복수개의 개구부들 및 상기 개구부들 내에 형성된 복수개의 상부전극부들을 포함하는 원시상부필름을 나란히 배열하는 단계;A raw bottom film comprising a central region in which a plurality of openings are formed and a peripheral region surrounding the central region, and including a plurality of lower electrode portions formed in the openings, a plurality of openings and a plurality of openings formed in the openings. Arranging the original upper film including the upper electrode parts side by side;
    상기 하부전극부와 상기 상부전극부를 도전와이어로 연결하는 단계;Connecting the lower electrode portion and the upper electrode portion with a conductive wire;
    상기 원시상부필름과 상기 원시하부필름의 사이에 실리콘러버를 주입하여 경화시키는 단계;Injecting and curing a silicone rubber between the raw upper film and the raw lower film;
    상기 중앙영역과 상기 주변영역 사이의 경계부를 따라서 상기 원시상부필름, 상기 경화된 실리콘러버 및 상기 원시하부필름을 커팅하여 상부필름, 러버층 및 하부필름을 형성하는 단계;Cutting the raw upper film, the cured silicon rubber and the raw lower film along a boundary between the central area and the peripheral area to form an upper film, a rubber layer and a lower film;
    상기 중앙영역과 동일하거나 큰 크기를 갖는 중앙개구부를 갖는 필름가이드의 하면 전체를 커버하도록 점착테이프를 부착하는 단계;Attaching an adhesive tape to cover the entire lower surface of the film guide having a central opening having a size equal to or larger than that of the central region;
    상기 중앙개구부를 통하여 노출되는 점착테이프에 상기 하부필름의 하면을 부착하는 단계;Attaching a lower surface of the lower film to the adhesive tape exposed through the central opening;
    상기 러버층과 상기 필름가이드를 결합시키는 단계; 및Bonding the rubber layer and the film guide to each other; And
    상기 점착테이프를 제거하는 단계를 포함하는 와이어드 러버 컨택트의 제조방법.Method of manufacturing a wired rubber contact comprising the step of removing the adhesive tape.
  8. 제7항에 있어서, 상기 하부전극부와 상기 상부전극부를 도전와이어로 연결하는 단계는,The method of claim 7, wherein the connecting of the lower electrode portion and the upper electrode portion with a conductive wire,
    상부의 이격거리가 하부의 이격거리보다 크도록 서로 마주보게 배치된 두 개의 컨베이어들을 따라서 상기 하부필름과 상기 상부필름을 이동시키는 단계; 및Moving the lower film and the upper film along two conveyors disposed to face each other such that an upper separation distance is greater than a lower separation distance; And
    상기 하부필름과 상기 상부필름이 이동되어감에 따라 순차적으로 상기 하부전극부와 상기 상부전극부 사이를 상기 도전와이어로 연결하는 단계를 포함하는 것을 특징으로 하는 와이어드 러버 컨택트의 제조방법.And sequentially connecting the lower electrode portion and the upper electrode portion with the conductive wires as the lower film and the upper film are moved.
  9. 제7항에 있어서, 상기 하부전극부는 상기 원시하부필름의 개구부를 매립하고, 상기 상부전극부는 상기 원시상부필름의 개구부의 가장자리를 따라서 형성되어 중앙에 관통홀을 형성하며,The method of claim 7, wherein the lower electrode portion fills the opening of the raw lower film, and the upper electrode portion is formed along an edge of the opening of the raw upper film to form a through hole in the center thereof.
    상기 하부전극부와 상기 상부전극부를 도전와이어로 연결하는 단계는,Connecting the lower electrode portion and the upper electrode portion with a conductive wire,
    상기 상부전극부의 상기 관통홀을 통하여 상기 하부전극부가 노출되도록 상기 원시상부필름과 상기 원시하부필름을 배열하는 단계;Arranging the source upper film and the source lower film such that the lower electrode part is exposed through the through hole of the upper electrode part;
    상기 도전와이어의 일단을 상기 하부전극부의 상면에 연결하고 상기 도전와이어의 타단을 상기 상부전극부의 상면 또는 내면에 연결하는 단계; 및Connecting one end of the conductive wire to an upper surface of the lower electrode portion and connecting the other end of the conductive wire to an upper surface or an inner surface of the upper electrode portion; And
    상기 원시상부필름과 상기 원시하부필름의 거리를 이격시켜서 상기 도전와이어를 상기 원시상부필름과 상기 원시하부필름의 사이에 배치시키는 단계를 포함하는 것을 특징으로 하는 와이어드 러버 컨택트의 제조방법.And disposing the conductive wire between the raw upper film and the raw lower film by separating the distance between the upper raw film and the lower raw film.
  10. 제9항에 있어서, 상기 하부전극부와 상기 상부전극부를 도전와이어로 연결하는 단계는, 상기 상부전극부를 솔더링하여 상기 관통홀을 매립하는 단계를 더 포함하는 것을 특징으로 하는 와이어드 러버 컨택트의 제조방법.The method of claim 9, wherein the connecting of the lower electrode part and the upper electrode part with a conductive wire further comprises soldering the upper electrode part to fill the through hole. .
PCT/KR2015/001847 2014-02-28 2015-02-26 Wired rubber contact and manufacturing method therefor WO2015130091A1 (en)

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