WO2015100597A1 - Dielectric resonator, dielectric filter and communication device - Google Patents

Dielectric resonator, dielectric filter and communication device Download PDF

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Publication number
WO2015100597A1
WO2015100597A1 PCT/CN2013/091064 CN2013091064W WO2015100597A1 WO 2015100597 A1 WO2015100597 A1 WO 2015100597A1 CN 2013091064 W CN2013091064 W CN 2013091064W WO 2015100597 A1 WO2015100597 A1 WO 2015100597A1
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WO
WIPO (PCT)
Prior art keywords
dielectric
blind hole
dielectric filter
hole
blind
Prior art date
Application number
PCT/CN2013/091064
Other languages
French (fr)
Chinese (zh)
Inventor
张晓峰
梁丹
陈科
Original Assignee
华为技术有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 华为技术有限公司 filed Critical 华为技术有限公司
Priority to PCT/CN2013/091064 priority Critical patent/WO2015100597A1/en
Priority to CN201380002662.6A priority patent/CN104981938A/en
Publication of WO2015100597A1 publication Critical patent/WO2015100597A1/en

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01PWAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P1/00Auxiliary devices
    • H01P1/20Frequency-selective devices, e.g. filters
    • H01P1/2002Dielectric waveguide filters

Definitions

  • Dielectric resonator Dielectric resonator, dielectric filter and communication
  • the present invention relates to the field of communications technologies, and in particular, to a dielectric resonator, a dielectric filter, and a communication device. Background technique
  • Dielectric filters are widely used in various communication systems due to their small size, low loss, and high selectivity.
  • the ability of the dielectric filter to select signals is mainly passband loss and stopband attenuation, and the passband loss is smaller. , the smaller the signal loss, the easier it is to pass; likewise, the larger the stopband attenuation, the better the signal selectivity and the easier it is to pass.
  • the dielectric filter includes a dielectric resonator having a resonant cavity, a cover plate, and a screw.
  • a plurality of resonant cavities are often designed in the dielectric filter and cascaded in a certain manner to form a filter having a passband selection characteristic.
  • the conventional dielectric filter often adjusts the resonant cavity frequency of the dielectric filter by grinding the medium and repeatedly silver plating, but the repeated plating after grinding causes the debugging to be inconvenient. Summary of the invention
  • the present invention provides a dielectric resonator and a dielectric filter to facilitate debugging.
  • a dielectric filter comprising: a dielectric body composed of a medium and a conductive layer covering the dielectric body, the dielectric body including a first blind via, the first blind via from the first A surface extends toward the interior of the dielectric body, an inner wall of the first blind via is a medium, and the first blind via is used to change a resonant frequency of the dielectric resonator.
  • the first blind hole for changing a resonant frequency of the dielectric resonator includes: the first blind hole is used to change by a change in at least one of a cross-sectional area and a depth of the first blind hole The resonant frequency of the dielectric resonator.
  • the first blind hole for changing a resonant frequency of the dielectric resonator includes: the first blind hole is used to change a change in an insertion length of a first debugging component inserted into the first blind hole The resonant frequency of the dielectric resonator.
  • the dielectric resonator further includes the first debugging component and for fixing the first debugging The first cover of the assembly.
  • the lower surface of the first cover plate is made of a metal material.
  • the cover plate is provided with a first hole, the first hole is in communication with the first blind hole, and the debugging component is matched with the first blind hole through the first hole, and is used for debugging The resonant frequency of the dielectric resonator, wherein the first debugging component includes a screw and a nut for fixing the screw to the first cover.
  • the first debugging component includes a screw, the first hole is a threaded hole, and the screw is fixed to the first cover plate through the threaded hole.
  • a dielectric filter comprising at least one dielectric resonator.
  • the dielectric filter includes at least two of the dielectric resonators, and the first cover plates of the at least two of the dielectric resonators are integrally connected.
  • a dielectric filter comprising: a dielectric body composed of a medium and a conductive layer covering the dielectric body, the dielectric body comprising at least two dielectric resonators, the dielectric filter further comprising a coupling structure
  • the coupling structure is configured to connect every two adjacent dielectric resonators, and the dielectric body further includes at least one second blind hole, wherein the second blind hole is used to debug a coupling bandwidth of the coupling structure.
  • the second blind hole extends from the conductive layer to the inside of the medium body, the inner wall of the second blind hole is a medium, and the second blind hole is disposed at a position corresponding to the coupling structure.
  • the second blind hole is used to debug the coupling bandwidth of the coupling structure, and the second blind hole is configured to change the coupling structure by changing at least one of a cross-sectional area and a depth of the second blind hole. Coupling bandwidth.
  • the second blind hole is used to debug the coupling bandwidth of the coupling structure, and the second blind hole is used to change the coupling structure by changing a insertion length of a second debugging component inserted into the second blind hole. Coupling bandwidth.
  • the dielectric filter further comprises the second debugging component and a second cover for fixing the second debugging component.
  • the cover plate is further provided with a plurality of second holes, the second holes are in communication with the second blind holes, and the second debugging component is coupled to the second blind holes through the second holes. Used to debug the coupling bandwidth of the dielectric filter.
  • the dielectric filter includes at least two of the second debug component and a second cover, At least two second cover plates are integrally connected.
  • a communication device that includes the dielectric filter described above.
  • the medium body is provided with a first blind hole for debugging the resonant frequency of the dielectric resonator, thereby changing the medium structure of the dielectric body of the dielectric resonator, or because the medium body is provided with a debugging medium.
  • a second blind via of the filter's coupling bandwidth changes the dielectric structure of the dielectric body of the dielectric filter.
  • the change of the electromagnetic field distribution in the dielectric resonator and the dielectric filter changes the frequency of the dielectric resonator and the coupling bandwidth of the dielectric filter, and the frequency of the dielectric filter composed of the dielectric resonator. In turn, it may change due to the change of the frequency of the dielectric resonator, that is, the frequency or coupling bandwidth of the dielectric filter may be adjusted, thereby achieving the purpose of changing the frequency or coupling bandwidth of the dielectric filter.
  • FIG. 1 is an exploded perspective view of a dielectric resonator according to an embodiment of the present invention
  • Figure 2 is a schematic view showing the assembly of the dielectric resonator shown in Figure 1;
  • FIG. 3a is an exploded perspective view of a dielectric filter according to an embodiment of the present invention
  • FIG. 3b is an exploded perspective view of a dielectric filter according to another embodiment of the present invention
  • FIG. 3c is another embodiment of the present invention
  • FIG. 4 is an assembled view of the dielectric filter shown in FIG. 3b;
  • Figure 5 is a cross-sectional view taken along line ⁇ - ⁇ in Figure 4;
  • Fig. 6 is an enlarged schematic view of a circle IV in Fig. 5.
  • Figure 7 is a schematic diagram showing the variation of the frequency of the dielectric filter shown in Figure 3b as a function of the width of the first blind via;
  • Figure 8 is a schematic diagram showing the simulation of the frequency of the dielectric filter shown in Figure 3b as a function of the depth of the first blind via
  • FIG. 9 is a schematic diagram showing the simulation of the coupling bandwidth of the dielectric filter shown in FIG. 3b as a function of the depth of the second blind via.
  • the dielectric resonator 10 includes a dielectric body 12 composed of a medium and a conductive layer 125 covering the dielectric body 12.
  • the dielectric body 12 includes a first blind via 122, and the first blind via 122 extends from the conductive layer 125.
  • the inner wall of the first blind hole 122 is a medium, and the first blind hole 122 is used to change the resonant frequency of the dielectric resonator 10 .
  • the surface of the medium body 12 may be divided into a first surface 121 provided with the first blind hole 122 and a second surface 123 not provided with the first blind hole 122, the first surface 121 and the The second surface 123 is attached to the conductive layer 125.
  • the dielectric structure of the dielectric body 12 of the dielectric resonator 10 is changed.
  • a change in the dielectric structure of the dielectric body 12 of the dielectric resonator 10 can result in an electromagnetic field within the dielectric resonator 10 and a dielectric filter 100 composed of the dielectric resonator 10 (eg The distribution within Figure 3) changes.
  • the change of the distribution of the electromagnetic field in the dielectric resonator 10 changes the frequency of the dielectric resonator 10
  • the frequency of the dielectric filter 100 composed of the dielectric resonator 10 can also be adjusted to realize the change.
  • the size and depth of the cross-sectional area of the first blind via 122 may change the resonant frequency of the dielectric resonator 10. For example, increasing the cross-sectional area and depth of the first blind via 122 may increase the resonant frequency of the dielectric resonator 10, that is, increase.
  • the frequency of the dielectric filter 100 The shape of the cross-sectional area of the first blind hole 122 is not limited in the present invention. For example, it may be a circular shape, a hexagonal shape, a square shape or other irregular shapes.
  • the first blind hole 122 extends into the medium body.
  • the method may also be not limited. For example, it may be a vertical extension, a trapezoidal extension, an S-shaped extension, or other irregular extension.
  • the number of the first blind holes 122 is not limited in the present invention, and may be, for example, one. More than one, specifically set according to actual needs, in the present embodiment, the number of 1 is set at the strongest electric field of the dielectric resonator 10, which has the greatest influence on the frequency adjustment.
  • the width of the first blind via 122 increases, i.e., as the cross-sectional area of the first blind via 122 increases, the resonant frequency of the dielectric resonator 10 increases. As the depth of the first blind via 122 increases, the resonant frequency of the dielectric resonator 10 increases.
  • the resonant frequency of the dielectric resonator 10 can be changed by inserting the debug component 30 in the first blind via 122.
  • the dielectric resonator 10 of the present invention can change the resonant frequency of the dielectric resonator 10 by changing at least one of the cross-sectional area and the depth of the first blind via 122, and can also be inserted through the insertion.
  • the change in the insertion length of the debug component 30 of the first blind via 122 changes the resonant frequency of the dielectric resonator 10, thereby solving the prior art in which the dielectric resonator 10 is adjusted by a method of grinding a medium and repeatedly silver plating. The problem of inconvenience in mass production and debugging caused by the resonance frequency.
  • the material of the dielectric body 12 may be a material having a high dielectric constant (dielectric constant greater than 1), low loss (QF value greater than 1000), and a stable temperature coefficient, such as ceramic, titanium. Acid salt, etc.
  • the second surfaces 123 are connected to each other, and the first surface 121 is connected to a part of the second surface 123.
  • the first surface 121 may be a top surface of the medium body 12, and one of the second surfaces 123 opposite to the first surface 121 is referred to as a bottom surface.
  • the first surface 121 does not include the inner wall of the first blind hole 122, i.e., the inner wall of the first blind hole 122 does not adhere to the conductive layer 125.
  • the first blind hole 122 may extend perpendicularly from the first surface 121 toward the inside of the medium body 12.
  • the cross-sectional shape of the first blind hole 122 may be a square shape.
  • the medium body 12 is a rectangular parallelepiped.
  • the second surfaces 123 are perpendicularly connected to each other, and the first surface 121 is vertically connected to a part of the second surface 123.
  • the first blind hole 122 may also extend from the first surface 121 to the interior of the media body 12 in other manners, such as obliquely extending, trapezoidal or S-shaped extensions, and the like.
  • the cross-sectional shape of the first blind hole 122 may be other shapes such as a circle, a hexagon, and an ellipse.
  • the medium body 12 may be other shapes such as a cylinder, a hexagon, or the like.
  • the conductive layer 125 may be a conductive film and formed by electroplating.
  • the first surface 121 and the second surface 123 are described.
  • the conductive layer 125 may be formed on the first surface 121 and the second surface 123 by glue bonding.
  • the conductive layer 125 is made of a metal material such as silver or copper.
  • the dielectric resonator 10 may further include a cover 20 and the debug assembly 30 for fixing the debug assembly 30.
  • the area of the cover plate 20 can be further increased, in addition to the fixing of the debugging assembly 30, for example, in conformity with the shape of the first surface 121 of the dielectric body 12, to dissipate heat from the dielectric resonator 10. That is the role of heat dissipation.
  • the material of the cover plate 20 may be a metal material or a material in which at least the lower surface is plated with a metal, so as to prevent leakage of electromagnetic wave energy in the dielectric resonator 10.
  • the cover 20 is welded to the first surface 121, so that the combination of the cover 20 and the first surface 121 is relatively firm, that is, the combination of the cover 20 and the medium body 12 is relatively strong.
  • the cover 20 is glued to the first surface 121 by glue, thereby facilitating the mounting of the cover 20 and the media body 12.
  • the cover 20 is mounted on the first surface 121 of the medium body 12, that is, the cover 20 covers the first blind hole 122 of the medium body 12, thereby preventing electromagnetic waves from leaking from the top surface of the medium body 12.
  • the debugging component 30 is mounted at a position corresponding to the first blind hole 122 of the cover plate 20, that is, the cover plate 20 is mounted as a debugging component 30 on the carrier of the medium body 12, thereby facilitating debugging of the component. 30 is mounted on the media body 12.
  • the cover plate 20 is provided with a first hole 24, the first hole 24 is in communication with the first blind hole 122, and the debugging component 30 passes through the first hole 24 and the first blind hole 122. Cooperating, for debugging the resonant frequency of the dielectric resonator 10.
  • the debugging assembly 30 includes a screw 34 and a nut 32 for fixing the screw 34 to the cover plate 20.
  • the screw 34 may be referred to as a debugging screw, because the debugging screw is a screw 34 for debugging frequency, and the material may be metal or some or all of the material may be other dielectric materials such as plastic.
  • the debugging screw portion is made of other dielectric materials, part of the material of the debugging screw inserted into the resonant cavity is a medium, and a part of the material connected to the cover plate is metal, so that the electromagnetic wave energy in the dielectric resonator 10 can be better prevented.
  • the debugging assembly 30 includes a screw 34, the first hole 24 is a threaded hole, and the screw 34 is fixed to the cover plate 20 through the threaded hole.
  • the cover plate 20 is mounted on the surface of the medium body 12 where the first blind hole 122 is disposed.
  • the first surface 121 is provided, and the debugging component 30 is mounted on the cover plate 20, so that the medium body 12 and the cover are The board 20 and the debug assembly 30 are assembled into a dielectric resonator 10.
  • the screw 34 is inserted into the first blind hole 122 of the medium body 12 through the first hole 24 of the cover 20, and the length of the screw 34 in the first blind hole 122.
  • the difference is to change the electromagnetic field distribution inside the medium body 12, thereby changing the frequency of the dielectric resonator 10, that is, the frequency of the dielectric filter 100 is debugged.
  • the shorter the length of the screw 34 into the first blind hole 122 the higher the frequency of the dielectric resonator 10.
  • the dielectric filter 100 of the present invention includes at least one of the above-described dielectric resonators 10.
  • the first blind via 122 described in the above embodiment is disposed on the resonant cavity included in the dielectric filter 100, wherein the first blind via 122 is disposed on a resonant cavity, or
  • the first blind hole 122 is disposed on the plurality of resonant cavities, and may be designed according to actual needs, and may not be limited in the present invention.
  • the frequency of the dielectric filter 100 is determined by the frequency of the dielectric resonator 10 constituting it.
  • the dielectric filter 100 may include at least two dielectric resonators 10 as shown in FIGS. 1 and 2, and the cover plates 20 of the two dielectric resonators 10 may be integrated into one body.
  • the assembly can be made easier, and the function of dissipating the dielectric filter 100 by the cover 20 can be enhanced by the increase of the area of the cover 20.
  • the portion of the two dielectric resonators 10 to which the dielectric body 12 is connected has no conductive layer 125, that is, the outer surface of the dielectric body 12 of the dielectric filter 100 is disposed. There is a conductive layer 125 and no conductive layer 125 inside. Since the portion where the adjacent dielectric resonators 10 are connected has no conductive layer 125, generally, when the dielectric filter 100 is described, the dielectric bodies 12 of the plurality of dielectric resonators 10 are collectively referred to as the dielectric body 12 of the dielectric filter.
  • the conductive layers 125 of the plurality of dielectric resonators are collectively referred to as a conductive layer 125 covering the dielectric body 12 of the dielectric filter 100, and the dielectric resonator formed by the dielectric bodies 12 of the N dielectric resonators 10 is referred to as a dielectric filter.
  • N dielectric resonators of 100 N is an integer not less than 1).
  • the first blind hole 122 described in the above embodiment is disposed on the resonant cavity included in the dielectric filter 100, and the dielectric filter further includes a coupling structure 40.
  • the coupling structure 40 is used to connect every two adjacent dielectric resonators 10, and the dielectric body 12 further includes at least one second blind hole 124 for debugging the coupling structure 40. Coupling bandwidth.
  • the second blind hole 124 extends from the conductive layer 125 to the inside of the dielectric body 12 , and the inner wall of the second blind hole 124 is a medium, that is, the inner surface of the second blind hole 124 does not adhere to the conductive layer 125 .
  • the position of the second blind hole 124 is set to correspond to the position of the coupling structure 40.
  • the number of the second blind holes 124 included in the dielectric filter 100 may not be set in the present invention. Limited.
  • the number of the second blind holes 124 of the coupling structure 40 is not limited in the present invention. For example, one or more than one may be used, and the actual number may be set according to actual needs.
  • a first blind hole is disposed on each of the resonant cavities
  • a second blind hole 124 is disposed on the coupling structure 40 between each adjacent two resonant cavities, that is, each of the Two blind holes 124 are located between each two adjacent first blind holes 122, and the first blind holes 122 and the second blind holes 124 are spaced apart.
  • the coupling structure 40 can include a plurality of pairs of coupling grooves 42, each pair of coupling grooves 42 including two coupling grooves 42 that are symmetrical with respect to the longitudinal axis of the medium nature 12.
  • One coupling groove 42 of each pair of coupling grooves 42 extends from a longer length second surface 123 of the medium body 12 toward the inside of the medium body 12, and the other coupling groove 42 from a longer length second surface 123 of the medium body 12.
  • the inside of the medium body 12 extends, but the two coupling grooves 42 are not connected, and each of the coupling grooves 42 penetrates the top surface and the bottom surface of the medium body 12.
  • the coupling groove 42 includes four pairs of coupling grooves 42.
  • the coupling structure 40 can also implement the coupling between the resonant cavities in other existing manners, which are not described in the present invention, and may not be limited (ie, the present invention can be combined with the coupling structure that appears later). .
  • the second blind hole 124 is disposed at a position corresponding to the coupling structure 40. Specifically, a second blind hole 124 is disposed between each pair of coupling grooves 42, that is, the position of the second blind hole 124 in the medium body 12 is determined by the position of the coupling groove 42. And the number of the second blind holes 124 is the same as the number of the coupling grooves 42.
  • the medium structure of the medium body 12 of the dielectric filter 100 is changed.
  • the change in the dielectric structure of the dielectric body 12 of the dielectric filter 100 can cause a change in the distribution of the electromagnetic field within the dielectric filter 100.
  • a change in the distribution of the electromagnetic field within the dielectric filter 100 changes the frequency and coupling bandwidth of the dielectric filter 100, thereby achieving the purpose of changing the frequency and coupling bandwidth of the dielectric filter 100.
  • the size and depth of the cross section of the first blind via 122 may change the resonant frequency of the dielectric filter 100.
  • Increasing the cross-sectional area and depth of the first blind via 122 may increase the resonant frequency of the dielectric filter 100.
  • the size and depth of the cross section of the second blind via 124 can change the coupling bandwidth of the dielectric filter 100, such as increasing the cross-sectional area of the second blind via 124 and increasing the depth of the second blind via 124 to reduce the coupling bandwidth of the dielectric filter 100.
  • the shape of the cross section of the second blind hole 124 is not limited in the present invention. For example, it may be a circular shape, a hexagonal shape, a square shape or other irregular shapes.
  • the second blind hole 124 extends into the medium body 12 .
  • the method may also be not limited. For example, it may be vertical extension, trapezoidal extension, S-shaped extension, or other irregular extension.
  • the width of the first blind via 122 increases, that is, as the cross-sectional area of the first blind via 122 increases, the resonant frequency of the dielectric filter 100 increases.
  • the depth of the first blind via 122 increases, the resonant frequency of the dielectric filter 100 increases.
  • increasing the cross-sectional area and depth of the first blind via 122 can increase the resonant frequency of the dielectric filter 100.
  • the coupling bandwidth of the dielectric filter 100 is reduced as the cross-sectional area and depth of the second blind via 124 are increased.
  • the present invention achieves the purpose of changing the frequency and coupling bandwidth of the dielectric filter 100 by designing the first blind via 122 and the second blind via 124 on the dielectric body 12, thereby solving the existing In the art, the problem of inconvenience in mass production and debugging is caused by adjusting the resonance frequency and the coupling bandwidth of the dielectric filter 100 by the method of grinding the medium and repeatedly silver plating.
  • the number of the first blind holes 122 is three
  • the number of the second blind holes 124 is four
  • the number of the second blind holes 124 is larger than the number of the first blind holes 122.
  • the dielectric body 12 is provided with a first blind via 122 in each of the resonant cavities, so that the stopband attenuation of the dielectric filter 100 of the present invention is large and the signal selectivity is good.
  • first blind hole 122 and the second blind hole 124 extend perpendicularly from the first surface 121 toward the inside of the medium body 12.
  • the cross-sectional shape of the first blind hole 122 and the second blind hole 124 may be square.
  • the medium body 12 is a rectangular parallelepiped.
  • first blind hole 122 and the second blind hole 124 may also be other The manner extends from the first surface 121 to the interior of the media body 12, such as obliquely extending, trapezoidal or S-shaped extensions, and the like.
  • the cross-sectional shape of the first blind hole 122 and the second blind hole 124 may be other shapes such as a circle, a hexagon, and an ellipse.
  • the medium body 12 may be other shapes such as a cylinder, a hexagon, or the like.
  • the cross-sectional area and depth of the first blind hole 122 may both be equal to the cross-sectional area and depth of the second blind hole 124.
  • the cross-sectional area of the first blind hole 122 may be equal to the cross-sectional area of the second blind hole 124, but the depth of the first blind hole 122 is not equal to the depth of the second blind hole 124;
  • the cross-sectional area of the first blind hole 122 is not equal to the cross-sectional area of the second blind hole 124, but the depth of the first blind hole 122 is equal to the depth of the second blind hole 124;
  • the cross-sectional area and depth of the first blind hole 122 are not equal to the cross-sectional area and depth of the second blind hole 124. That is, the design and arrangement of the first blind hole 122 and the second blind hole 124 are independent, and may be respectively performed according to actual needs, and may not affect each other.
  • the dielectric filter 100 further includes a plurality of debugging components 30 and a cover plate 20 for fixing the debugging component 30 .
  • the debugging component 30 is mounted on the corresponding cover plate 20 .
  • the positions of the first blind hole 122 and the second blind hole 124 are described.
  • the debug component 30 is inserted into the second blind hole 124 for debugging the coupling bandwidth of the dielectric filter 100 (in this case, the debug component 30 may be referred to as a second debug component); the debug component 30 is inserted In the first blind hole 122, the frequency for debugging the dielectric filter 100 (at this time, the debugging component 30 may be referred to as a first debugging component).
  • the cover plate 20 may further be provided with a plurality of second holes 22, the second holes 22 and the second blind holes
  • the cover plate 20 is provided with a plurality of first holes 24 and a plurality of second holes 22, and the first holes 24 communicate with the first blind holes 122.
  • the first hole 24 and the second hole 22 may be referred to as a debugging hole, because the debugging component 30 is inserted into the first blind hole 122 and the second hole 22 through the first hole 24 . Inserted into the second blind hole 124 to change the electromagnetic field distribution of the resonant cavity in the dielectric body 12, so it can be called a debug hole.
  • the axis of each of the first holes 24 coincides with the axis of each of the first blind holes 122, that is, the first blind holes 122 and the first holes 24 correspond to each other.
  • the axis of each of the second holes 22 coincides with the axis of each of the second blind holes 124, that is, the second blind holes 124 and the second holes 22 correspond to each other.
  • the screw 34 is inserted into the first blind hole 122 of the medium body 12 through the first hole 24 of the cover 20, and the length of the screw 34 in the first blind hole 122.
  • the difference is to change the electromagnetic field distribution inside the medium body 12, thereby changing the frequency of the dielectric filter 100.
  • the electromagnetic field distribution inside the medium body 12 is changed by the difference in the length of the screw 34 in the second blind hole 124, thereby changing the coupling bandwidth of the dielectric filter 100.
  • the longer the length of the screw 34 into the second blind hole 124 the larger the coupling bandwidth of the dielectric filter 100.
  • the shorter the length of the screw 34 into the second blind hole 124 the smaller the coupling bandwidth of the dielectric filter 100.
  • the number of the debugging components 30 disposed on the cover plate 20 can be adjusted according to actual needs, that is, the number of the debugging components 30 can be different from the number of the first blind holes 122 and the second blind holes 124.
  • the debug component 30 is not required, corresponding A corresponding first hole 24 or second hole 22 is not provided on the cover plate 20.
  • the cover plate 20 may be provided with a screw 34 only at a portion of the first blind hole 122, that is, a part of the first hole 24 is provided on the cover plate 20, and the adjustment screw 34 is inserted into the cover plate
  • a blind hole 122 may reduce the frequency of the dielectric filter 100, or withdrawing the screw 34 from the first blind hole 122 may increase the frequency of the dielectric filter 100.
  • the cover plate 20 may be provided with a screw 34 only at a position of a part of the second blind hole 124, that is, a partial second hole 22 is provided on the cover plate 20, and the second blind is extended by the adjusting screw 34.
  • the aperture 124 may increase the coupling bandwidth of the dielectric filter 100, or the extraction of the screw 34 out of the second blind via 124 may reduce the coupling bandwidth of the dielectric filter 100.
  • a screw 34 is disposed on the cover plate 20 at a position corresponding to the first blind hole 122, that is, a position corresponding to the first blind hole 122 is provided on the cover plate 20 A hole 24 is inserted into the first hole 24 but does not protrude into the first blind hole 122. Also available in the cover A screw 34 is disposed on the plate 20 at a position corresponding to the second blind hole 124. That is, a second hole 22 is disposed at a position corresponding to the second blind hole 124 on the cover plate 20, and the screw 34 is provided.
  • the second hole 22 is inserted but does not extend into the second blind hole 124.
  • No screw 34 is provided at a position where the cover plate 20 corresponds to the first blind hole 122 or the second blind hole 124, or the screw 34 is inserted into the hole first hole 24 or the second hole 22 but does not extend.
  • the frequency can be adjusted by changing the sectional area and depth of the first blind hole 122, and the coupling bandwidth can be changed by changing the sectional area and depth of the second blind hole 124. Adjustment.
  • the distribution of the air medium in the first blind hole 122 of the dielectric filter 100 can be changed by the adjustment screw 34, thereby changing the distribution of at least one of the electric field and the magnetic field in the dielectric filter 100, thereby changing The frequency of the dielectric filter 100.
  • the distribution of the air medium in the second blind hole 124 of the dielectric filter 100 can be changed by the adjusting screw 34, thereby changing the distribution of at least one of the electric field and the magnetic field in the dielectric filter 100, thereby The coupling bandwidth of the dielectric filter 100 is described.
  • first blind hole 122 or the second blind hole of the dielectric filter 100 can be changed by extending the screw 34 into the first blind hole 122 or the second blind hole 124.
  • the distribution of the air medium within the 124, while the first blind hole 122 of the dielectric filter 100 or the movement of the screw 34 within the first blind hole 122 or the second blind hole 124 The distribution of the air medium in the second blind hole 124 is also constantly changed, so that the dielectric filter 100 can have different frequencies and coupling bandwidths. Therefore, the embodiment of the present invention can expand the debugging range of the dielectric filter 100.
  • the medium body 12 is provided with a plurality of first blind holes 122 and a plurality of second blind holes 124, the movement of the screws 34 in any one of the first blind holes 122 or the second blind holes 124 is also changed, so that the dielectric filter 100 can have different frequencies. And coupling bandwidth. Therefore, the embodiment of the present invention can further expand the debugging range of the dielectric filter 100.
  • the adjustment of the frequency of the dielectric filter 100 of the present invention can be adjusted not only by the length of the screw 34 extending into the first blind hole 122, but also by changing the first blind hole 122.
  • the cross-sectional area and depth are adjusted.
  • the adjustment of the coupling bandwidth of the dielectric filter 100 of the present invention can be adjusted not only by the length of the screw 34 extending into the second blind hole 124, Moreover, it can be adjusted by changing the cross-sectional area and depth of the second blind hole 122, thereby further facilitating adjustment of the frequency and coupling bandwidth of the dielectric filter 100, thereby increasing user convenience.
  • the tops of the first blind holes 122 and the second blind holes 124 may be on the same side.
  • a position of the cover plate 20 corresponding to the top of the first blind hole 122 and the second blind hole 124 may be provided with a screw 34 for adjusting the frequency and coupling bandwidth of the dielectric filter 100.
  • the screws 34 are on the same plane, so that the adjustment of the frequency and the coupling bandwidth of the dielectric filter 100 in the same direction can be realized, and the conventional dielectric filter 100 is no longer required to pass the grinding medium and repeatedly silver plating.
  • Method for adjusting the frequency and the coupling bandwidth that is, adjusting the frequency and the coupling bandwidth around the dielectric filter, and at the same time not hindering the assembly of components around the dielectric filter 100, thereby debugging and assembling the user. Brought convenience.
  • variations in the dielectric structure of the dielectric body 12 of the dielectric filter 100 may result in variations in the distribution of electromagnetic fields within the dielectric filter 100, depending on the principles of the electromagnetic field.
  • the change of the distribution of the electromagnetic field in the dielectric filter 100 changes the frequency and coupling bandwidth of the dielectric filter 100, that is, the frequency and coupling bandwidth of the dielectric filter 100 can be adjusted, thereby realizing the change.
  • the purpose of the frequency and coupling bandwidth of the dielectric filter 100 is, adjusting the frequency and the coupling bandwidth around the dielectric filter, and at the same time not hindering the assembly of components around the dielectric filter 100, thereby debugging and assembling the user.
  • the dielectric filter 100 may include the second blind hole 124 and the corresponding design described above, without limiting whether it includes the first blind hole 122 and corresponding Design.
  • the medium body 12 composed of a medium and the conductive layer 125 covering the medium body
  • the medium body 12 includes at least two dielectric resonators
  • the dielectric filter further includes a coupling structure 40, the coupling The structure 40 is used to connect every two adjacent dielectric resonators, and the dielectric body 12 further includes at least one second blind hole 124 for debugging the coupling bandwidth of the coupling structure 40.
  • the second blind hole 124 extends from the conductive layer 125 to the inside of the medium body 12, the inner wall of the second blind hole 124 is a medium, and the second blind hole 124 is disposed at a position and the coupling structure. 40 corresponds.
  • the dielectric cavity is composed of a medium, and the first blind hole 122 as shown in FIG. 1 and FIG. 2 may not be limited.
  • the dielectric filter 100 includes a debugging component 30 and a cover plate 20 for fixing the debugging component 30.
  • the debugging component 30 is mounted at a position corresponding to the second blind hole 124 of the cover plate 20, and the debugging The component 30 is inserted into the second blind via 124 for adjusting the coupling bandwidth of the dielectric filter 100.
  • the dielectric filter 100 of the present invention may include the first blind via 122 and the first At least one of the two blind holes 124, that is, includes the first blind hole 122 and the corresponding design provided by the embodiment of the present invention, or includes the second blind hole 124 and the corresponding design provided by the embodiment of the present invention, or The first blind hole 122 and the second blind hole 124 and the corresponding design provided by the embodiment of the present invention are included.
  • the present invention also provides a communication device using the above-described dielectric filter 100, which may be a base station for wireless communication or a terminal. Further, the present invention also provides other devices that need to be applied to the dielectric filter 100, such as radar devices and the like.
  • the debug component inserted into the first blind hole 122 is referred to as a first debug component
  • the cover 20 for fixing the first debug component is referred to as a first cover
  • the debug component inserted into the second blind hole 124 is referred to as a second debug component
  • the cover 20 for fixing the second debug component is referred to as a second cover.
  • the cover plate 20 functions to dissipate heat from the dielectric filter 100; when the dielectric filter 100 includes only the second cover, two adjacent second covers may be integrally connected; when the dielectric filter 100 includes the first In the cover plate and the second cover plate, the first cover plate and the second cover plate can be integrally connected, so that the assembly can be made more convenient, and the cover plate 20 can be strengthened by the increase of the area of the cover plate 20.
  • the function of dissipating heat to the dielectric filter 100 may be the same or different; the structures of the first cover and the second cover may be the same or different.

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Abstract

Provided is a dielectric resonator, comprising a dielectric body formed from a dielectric and a conductive layer covering the dielectric body; the dielectric body comprises a first blind hole extending from the conductive layer to the interior of the dielectric body and being used to change the resonance frequency of the dielectric resonator, the inner wall of the first blind hole being a dielectric. The present invention achieves regulation of the frequency of a dielectric resonator by providing a first blind hole in a dielectric body and changing the cross sectional area and depth of the first blind hole. Also provided are a dielectric filter and communication device.

Description

一种介质谐振器、 介质滤波器及通信 i殳备  Dielectric resonator, dielectric filter and communication
技术领域 Technical field
本发明涉及通信技术领域, 尤其涉及一种介质谐振器、介质滤波器及通信 设备。 背景技术  The present invention relates to the field of communications technologies, and in particular, to a dielectric resonator, a dielectric filter, and a communication device. Background technique
由于无线电通信技术的发展,低成本、 高性能的无线通信收发系统需要高 性能的滤波器。 介质滤波器由于其体积小、 损耗小、 选择性高而逐渐广泛应用 到各类通信系统中,而所述介质滤波器选择信号的能力主要是通带损耗和阻带 衰减, 通带损耗越小, 那么信号损失越小,越容易通过; 同样, 阻带衰减越大, 信号选择性越好,越容易通过。所述介质滤波器包括具有谐振腔的介质谐振器、 盖板及螺釘。 为了提高介质滤波器对信号的选择性, 常在介质滤波器中设计多 个谐振腔并进行一定方式的级联, 形成具有通带选择特性的滤波器,谐振腔数 量越多, 阻带衰减越大, 对信号的选择能力越强。 现有的介质滤波器常通过打 磨介质以及反复镀银的方法来调节介质滤波器的谐振腔频率,但这样打磨后反 复电镀致使调试不便。 发明内容  Due to the development of radio communication technology, low-cost, high-performance wireless communication transceiver systems require high-performance filters. Dielectric filters are widely used in various communication systems due to their small size, low loss, and high selectivity. The ability of the dielectric filter to select signals is mainly passband loss and stopband attenuation, and the passband loss is smaller. , the smaller the signal loss, the easier it is to pass; likewise, the larger the stopband attenuation, the better the signal selectivity and the easier it is to pass. The dielectric filter includes a dielectric resonator having a resonant cavity, a cover plate, and a screw. In order to improve the selectivity of the dielectric filter to the signal, a plurality of resonant cavities are often designed in the dielectric filter and cascaded in a certain manner to form a filter having a passband selection characteristic. The more the number of resonant cavities, the more the stopband attenuation Large, the stronger the ability to select signals. The conventional dielectric filter often adjusts the resonant cavity frequency of the dielectric filter by grinding the medium and repeatedly silver plating, but the repeated plating after grinding causes the debugging to be inconvenient. Summary of the invention
本发明提供一种介质谐振器和介质滤波器, 以方便进行调试。  The present invention provides a dielectric resonator and a dielectric filter to facilitate debugging.
第一方面,提供了一种介质滤波器, 其包括由介质构成的介质本体和覆盖 所述介质本体的导电层, 所述介质本体包括第一盲孔, 所述第一盲孔从所述第 一表面向所述介质本体内部延伸, 所述第一盲孔的内壁为介质, 所述第一盲孔 用于改变所述介质谐振器的谐振频率。  In a first aspect, a dielectric filter is provided, comprising: a dielectric body composed of a medium and a conductive layer covering the dielectric body, the dielectric body including a first blind via, the first blind via from the first A surface extends toward the interior of the dielectric body, an inner wall of the first blind via is a medium, and the first blind via is used to change a resonant frequency of the dielectric resonator.
其中, 所述第一盲孔用于改变所述介质谐振器的谐振频率包括: 所述第一 盲孔用于通过所述第一盲孔的截面面积和深度中的至少一项的改变来改变所 述介质谐振器的谐振频率。  The first blind hole for changing a resonant frequency of the dielectric resonator includes: the first blind hole is used to change by a change in at least one of a cross-sectional area and a depth of the first blind hole The resonant frequency of the dielectric resonator.
其中, 所述第一盲孔用于改变所述介质谐振器的谐振频率包括: 所述第一 盲孔用于通过插入所述第一盲孔的第一调试组件的插入长度的改变来改变所 述介质谐振器的谐振频率。  The first blind hole for changing a resonant frequency of the dielectric resonator includes: the first blind hole is used to change a change in an insertion length of a first debugging component inserted into the first blind hole The resonant frequency of the dielectric resonator.
其中,所述介质谐振器还包括所述第一调试组件和用于固定所述第一调试 组件的第一盖板。 Wherein the dielectric resonator further includes the first debugging component and for fixing the first debugging The first cover of the assembly.
其中, 所述第一盖板的下表面为金属材料。  The lower surface of the first cover plate is made of a metal material.
其中, 所述盖板设有第一孔, 所述第一孔与所述第一盲孔连通, 所述调试 组件通过所述第一孔与所述第一盲孔配合,用于调试所述介质谐振器的谐振频 其中, 所述第一调试组件包括螺釘和螺母, 所述螺母用于将所述螺釘固定 于所述第一盖板。  The cover plate is provided with a first hole, the first hole is in communication with the first blind hole, and the debugging component is matched with the first blind hole through the first hole, and is used for debugging The resonant frequency of the dielectric resonator, wherein the first debugging component includes a screw and a nut for fixing the screw to the first cover.
其中, 所述第一调试组件包括螺釘, 所述第一孔为螺纹孔, 所述螺釘通过 所述螺纹孔固定于所述第一盖板。  The first debugging component includes a screw, the first hole is a threaded hole, and the screw is fixed to the first cover plate through the threaded hole.
第二方面, 提供一种介质滤波器, 包括至少一个上的介质谐振器。  In a second aspect, a dielectric filter is provided comprising at least one dielectric resonator.
其中, 所述介质滤波器包括至少两个所述介质谐振器, 所述至少两个所述 介质谐振器的第一盖板连为一体。  The dielectric filter includes at least two of the dielectric resonators, and the first cover plates of the at least two of the dielectric resonators are integrally connected.
第三方面,提供一种介质滤波器, 其包括由介质构成的介质本体和覆盖于 介质本体上的导电层, 所述介质本体包括至少两个介质谐振腔, 所述介质滤波 器还包括耦合结构, 所述耦合结构用于连接每两个相邻的所述介质谐振腔, 所 述介质本体还包括至少一个第二盲孔,所述第二盲孔用于调试所述耦合结构的 耦合带宽, 所述第二盲孔从所述导电层向所述介质本体内部延伸, 所述第二盲 孔的内壁为介质, 所述第二盲孔的设置位置与所述耦合结构相对应。  In a third aspect, a dielectric filter is provided, comprising: a dielectric body composed of a medium and a conductive layer covering the dielectric body, the dielectric body comprising at least two dielectric resonators, the dielectric filter further comprising a coupling structure The coupling structure is configured to connect every two adjacent dielectric resonators, and the dielectric body further includes at least one second blind hole, wherein the second blind hole is used to debug a coupling bandwidth of the coupling structure. The second blind hole extends from the conductive layer to the inside of the medium body, the inner wall of the second blind hole is a medium, and the second blind hole is disposed at a position corresponding to the coupling structure.
其中, 所述第二盲孔用于调试所述耦合结构的耦合带宽包括: 所述第二盲 孔用于通过第二盲孔的截面面积和深度中的至少一个的改变来改变所述耦合 结构的耦合带宽。  The second blind hole is used to debug the coupling bandwidth of the coupling structure, and the second blind hole is configured to change the coupling structure by changing at least one of a cross-sectional area and a depth of the second blind hole. Coupling bandwidth.
其中, 所述第二盲孔用于调试所述耦合结构的耦合带宽包括: 所述第二盲 孔用于通过插入第二盲孔的第二调试组件的插入长度的改变来改变所述耦合 结构的耦合带宽。  The second blind hole is used to debug the coupling bandwidth of the coupling structure, and the second blind hole is used to change the coupling structure by changing a insertion length of a second debugging component inserted into the second blind hole. Coupling bandwidth.
其中,所述介质滤波器还包括所述第二调试组件和用于固定所述第二调试 组件的第二盖板。  Wherein the dielectric filter further comprises the second debugging component and a second cover for fixing the second debugging component.
其中, 所述盖板还设有多个第二孔, 所述第二孔和所述第二盲孔连通, 所 述第二调试组件通过所述第二孔与所述第二盲孔配合,用于调试所述介质滤波 器的耦合带宽。  The cover plate is further provided with a plurality of second holes, the second holes are in communication with the second blind holes, and the second debugging component is coupled to the second blind holes through the second holes. Used to debug the coupling bandwidth of the dielectric filter.
其中, 所述介质滤波器包括至少两个所述第二调试组件和第二盖板, 所述 至少两个第二盖板连为一体。 Wherein the dielectric filter includes at least two of the second debug component and a second cover, At least two second cover plates are integrally connected.
第四方面, 提供一种通信设备, 其包括上所述介质滤波器。  In a fourth aspect, a communication device is provided that includes the dielectric filter described above.
本发明中, 因介质本体上设有用于调试介质谐振器的谐振频率的第一盲 孔, 从而改变了所述介质谐振器的介质本体的介质结构, 或, 因介质本体上设 有用于调试介质滤波器的耦合带宽的第二盲孔,从而改变了所述介质滤波器的 介质本体的介质结构。 从理论上讲, 根据电磁场原理, 所述介质本体的介质结 构的改变,可以导致电磁场在所述介质谐振器内和介质滤波器内的分布发生变 化。根据仿真发现, 电磁场在所述介质谐振器内和介质滤波器内的分布发生变 化会改变所述介质谐振器的频率及介质滤波器的耦合带宽,而由介质谐振器构 成的介质滤波器的频率又会因介质谐振器的频率的改变而改变,即可以调节所 述介质滤波器的频率或耦合带宽,从而实现改变所述介质滤波器的频率或耦合 带宽的目的。 附图说明  In the present invention, since the medium body is provided with a first blind hole for debugging the resonant frequency of the dielectric resonator, thereby changing the medium structure of the dielectric body of the dielectric resonator, or because the medium body is provided with a debugging medium. A second blind via of the filter's coupling bandwidth changes the dielectric structure of the dielectric body of the dielectric filter. Theoretically, according to the principle of electromagnetic field, a change in the dielectric structure of the dielectric body can cause a change in the distribution of the electromagnetic field within the dielectric resonator and within the dielectric filter. According to the simulation, the change of the electromagnetic field distribution in the dielectric resonator and the dielectric filter changes the frequency of the dielectric resonator and the coupling bandwidth of the dielectric filter, and the frequency of the dielectric filter composed of the dielectric resonator. In turn, it may change due to the change of the frequency of the dielectric resonator, that is, the frequency or coupling bandwidth of the dielectric filter may be adjusted, thereby achieving the purpose of changing the frequency or coupling bandwidth of the dielectric filter. DRAWINGS
为了更清楚地说明本发明实施例中的技术方案,下面将对实施例中所需要 使用的附图作筒单地介绍,显而易见地, 下面描述中的附图仅仅是本发明的一 些实施例, 对于本领域普通技术人员来讲, 在不付出创造性劳动的前提下, 还 可以根据这些附图获得其他的附图。  In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings used in the embodiments will be briefly described below. It is obvious that the drawings in the following description are only some embodiments of the present invention. Other drawings may also be obtained from those of ordinary skill in the art in view of the drawings.
图 1是本发明实施方式提供的介质谐振器的分解示意图;  1 is an exploded perspective view of a dielectric resonator according to an embodiment of the present invention;
图 2是图 1所示的介质谐振器的组装示意图;  Figure 2 is a schematic view showing the assembly of the dielectric resonator shown in Figure 1;
图 3a是本发明的一种实施方式提供的介质滤波器的分解示意图; 图 3b是本发明的另一种实施方式提供的介质滤波器的分解示意图; 图 3c是本发明的另一种实施方式提供的介质滤波器的分解示意图; 图 4是图 3b所示的介质滤波器的组装示意图;  3a is an exploded perspective view of a dielectric filter according to an embodiment of the present invention; FIG. 3b is an exploded perspective view of a dielectric filter according to another embodiment of the present invention; and FIG. 3c is another embodiment of the present invention; An exploded view of the dielectric filter provided; FIG. 4 is an assembled view of the dielectric filter shown in FIG. 3b;
图 5是图 4中沿直线 ΠΙ-ΠΙ的剖视图;  Figure 5 is a cross-sectional view taken along line ΠΙ-ΠΙ in Figure 4;
图 6是图 5中圆 IV的放大示意图。  Fig. 6 is an enlarged schematic view of a circle IV in Fig. 5.
图 7是图 3b所示的介质滤波器的频率随第一盲孔的宽度变化的仿真示意 图;  Figure 7 is a schematic diagram showing the variation of the frequency of the dielectric filter shown in Figure 3b as a function of the width of the first blind via;
图 8是图 3b所示的介质滤波器的频率随第一盲孔的深度变化的仿真示意 图; 图 9是图 3b所示的介质滤波器的耦合带宽随第二盲孔的深度变化的仿真 示意图。 具体实施方式 Figure 8 is a schematic diagram showing the simulation of the frequency of the dielectric filter shown in Figure 3b as a function of the depth of the first blind via; FIG. 9 is a schematic diagram showing the simulation of the coupling bandwidth of the dielectric filter shown in FIG. 3b as a function of the depth of the second blind via. detailed description
下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清 楚、 完整地描述, 显然, 所描述的实施例仅仅是本发明一部分实施例, 而不是 全部的实施例。基于本发明中的实施例, 本领域普通技术人员在没有作出创造 性劳动前提下所获得的所有其他实施例, 都属于本发明保护的范围。  BRIEF DESCRIPTION OF THE DRAWINGS The technical solutions in the embodiments of the present invention will be described in detail below with reference to the accompanying drawings. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments of the present invention without creative work are within the scope of the present invention.
请一并参考图 1和图 2, 为本发明的实施方式提供的一种介质谐振器 10。 所述介质谐振器 10包括由介质构成的介质本体 12和覆盖介质本体 12的导电 层 125, 所述介质本体 12包括第一盲孔 122, 所述第一盲孔 122从所述导电层 125向所述介质本体 12内部延伸, 所述第一盲孔 122的内壁为介质, 所述第 一盲孔 122用于改变所述介质谐振器 10的谐振频率。其中,介质本体 12的表 面可以分为设有所述第一盲孔 122的第一表面 121和未设有所述第一盲孔 122 的第二表面 123, 所述第一表面 121和所述第二表面 123附着导电层 125。  Referring to FIG. 1 and FIG. 2 together, a dielectric resonator 10 according to an embodiment of the present invention is provided. The dielectric resonator 10 includes a dielectric body 12 composed of a medium and a conductive layer 125 covering the dielectric body 12. The dielectric body 12 includes a first blind via 122, and the first blind via 122 extends from the conductive layer 125. The inner wall of the first blind hole 122 is a medium, and the first blind hole 122 is used to change the resonant frequency of the dielectric resonator 10 . The surface of the medium body 12 may be divided into a first surface 121 provided with the first blind hole 122 and a second surface 123 not provided with the first blind hole 122, the first surface 121 and the The second surface 123 is attached to the conductive layer 125.
因介质本体 12上设有第一盲孔 122, 从而改变了所述介质谐振器 10的介 质本体 12 的介质结构。 从理论上讲, 根据电磁场原理, 所述介质谐振器 10 的介质本体 12的介质结构的改变,可以导致电磁场在所述介质谐振器 10内和 由介质谐振器 10构成的介质滤波器 100 (如图 3所示) 内的分布发生变化。 根据仿真发现, 电磁场在所述介质谐振器 10内的分布发生变化会改变所述介 质谐振器 10的频率, 也可以调节由介质谐振器 10构成的所述介质滤波器 100 的频率, 从而实现改变所述介质谐振器 10, 或由介质谐振器 10构成的介质滤 波器 100的频率的目的。  Since the first blind hole 122 is provided in the dielectric body 12, the dielectric structure of the dielectric body 12 of the dielectric resonator 10 is changed. Theoretically, according to the principle of electromagnetic field, a change in the dielectric structure of the dielectric body 12 of the dielectric resonator 10 can result in an electromagnetic field within the dielectric resonator 10 and a dielectric filter 100 composed of the dielectric resonator 10 (eg The distribution within Figure 3) changes. According to the simulation, it is found that the change of the distribution of the electromagnetic field in the dielectric resonator 10 changes the frequency of the dielectric resonator 10, and the frequency of the dielectric filter 100 composed of the dielectric resonator 10 can also be adjusted to realize the change. The purpose of the dielectric resonator 10, or the frequency of the dielectric filter 100 constituted by the dielectric resonator 10.
具体地, 第一盲孔 122截面面积的大小和深度可以改变介质谐振器 10的 谐振频率, 如增加第一盲孔 122的截面面积和深度可以升高介质谐振器 10的 谐振频率, 即升高介质滤波器 100的频率。 其中, 第一盲孔 122的截面面积的 形状在本发明中可以不予限定, 比如, 可以为圆形、 六角形、 方形或其他不规 则的形状,该第一盲孔 122向介质本体内延伸的方式,也可以不予限定,比如, 可以为垂直延伸, 梯形延伸, S形延伸, 也可以为其他不规则的延伸方式。 第 一盲孔 122的数量在本发明中也可以不予限定, 比如, 可以为 1个, 也可以为 多于 1个, 具体可视实际需求进行设置, 在本实施例中, 其数量为 1 , 设置在 介质谐振器 10的电场最强处, 这样对于频率的调节影响最大。 Specifically, the size and depth of the cross-sectional area of the first blind via 122 may change the resonant frequency of the dielectric resonator 10. For example, increasing the cross-sectional area and depth of the first blind via 122 may increase the resonant frequency of the dielectric resonator 10, that is, increase. The frequency of the dielectric filter 100. The shape of the cross-sectional area of the first blind hole 122 is not limited in the present invention. For example, it may be a circular shape, a hexagonal shape, a square shape or other irregular shapes. The first blind hole 122 extends into the medium body. The method may also be not limited. For example, it may be a vertical extension, a trapezoidal extension, an S-shaped extension, or other irregular extension. The number of the first blind holes 122 is not limited in the present invention, and may be, for example, one. More than one, specifically set according to actual needs, in the present embodiment, the number of 1 is set at the strongest electric field of the dielectric resonator 10, which has the greatest influence on the frequency adjustment.
进一步, 随着第一盲孔 122的宽度的增加, 即随着第一盲孔 122的截面面 积的增加, 介质谐振器 10的谐振频率升高了。 随着第一盲孔 122的深度的增 加, 介质谐振器 10的谐振频率升高了。  Further, as the width of the first blind via 122 increases, i.e., as the cross-sectional area of the first blind via 122 increases, the resonant frequency of the dielectric resonator 10 increases. As the depth of the first blind via 122 increases, the resonant frequency of the dielectric resonator 10 increases.
更进一步, 可以通过在所述第一盲孔 122中插入调试组件 30以改变所述 介质谐振器 10的谐振频率。  Still further, the resonant frequency of the dielectric resonator 10 can be changed by inserting the debug component 30 in the first blind via 122.
综上所述, 本发明的介质谐振器 10即可以通过改变所述第一盲孔 122的 截面面积和深度中的至少一项来改变所述介质谐振器 10的谐振频率, 又可以 通过插入所述第一盲孔 122的调试组件 30的插入长度的改变来改变所述介质 谐振器 10的谐振频率, 从而解决了现有技术中因通过打磨介质以及反复镀银 的方法来调节介质谐振器 10的谐振频率而导致的无法大批量生产及调试不便 的问题。  In summary, the dielectric resonator 10 of the present invention can change the resonant frequency of the dielectric resonator 10 by changing at least one of the cross-sectional area and the depth of the first blind via 122, and can also be inserted through the insertion. The change in the insertion length of the debug component 30 of the first blind via 122 changes the resonant frequency of the dielectric resonator 10, thereby solving the prior art in which the dielectric resonator 10 is adjusted by a method of grinding a medium and repeatedly silver plating. The problem of inconvenience in mass production and debugging caused by the resonance frequency.
在本实施方式中,所述介质本体 12的材料可以是具有高介电常数 (介电常 数大于 1), 低损耗(QF值大于 1000 )及稳定的温度系数等性质的材料, 比如 陶瓷, 钛酸盐等。  In this embodiment, the material of the dielectric body 12 may be a material having a high dielectric constant (dielectric constant greater than 1), low loss (QF value greater than 1000), and a stable temperature coefficient, such as ceramic, titanium. Acid salt, etc.
在本实施方式中, 所述第二表面 123相互连接, 所述第一表面 121与其中 一部分所述第二表面 123连接。 具体地, 第一表面 121可以为介质本体 12的 顶面, 与第一表面 121相对的其中一个第二表面 123被称为底面。 同时, 第一 表面 121不包括第一盲孔 122的内壁, 即第一盲孔 122的内壁不附着导电层 125。  In the present embodiment, the second surfaces 123 are connected to each other, and the first surface 121 is connected to a part of the second surface 123. Specifically, the first surface 121 may be a top surface of the medium body 12, and one of the second surfaces 123 opposite to the first surface 121 is referred to as a bottom surface. At the same time, the first surface 121 does not include the inner wall of the first blind hole 122, i.e., the inner wall of the first blind hole 122 does not adhere to the conductive layer 125.
在本实施方式中,所述第一盲孔 122可以垂直从第一表面 121向介质本体 12内部延伸。 所述第一盲孔 122的截面形状可以为方形。 所述介质本体 12为 长方体。 当介质本体 12为长方体时, 所述第二表面 123相互垂直连接, 所述 第一表面 121与其中一部分所述第二表面 123垂直连接。  In the present embodiment, the first blind hole 122 may extend perpendicularly from the first surface 121 toward the inside of the medium body 12. The cross-sectional shape of the first blind hole 122 may be a square shape. The medium body 12 is a rectangular parallelepiped. When the medium body 12 is a rectangular parallelepiped, the second surfaces 123 are perpendicularly connected to each other, and the first surface 121 is vertically connected to a part of the second surface 123.
在其它实施方式中, 所述第一盲孔 122也可以以其它方式从第一表面 121 向介质本体 12内部延伸,如斜着延伸,梯形或 S型延伸等。所述第一盲孔 122 的截面形状可以为圆形、 六边形及椭圆形等其它形状。 所述介质本体 12可以 为圆柱体、 六边形体等其它形状。  In other embodiments, the first blind hole 122 may also extend from the first surface 121 to the interior of the media body 12 in other manners, such as obliquely extending, trapezoidal or S-shaped extensions, and the like. The cross-sectional shape of the first blind hole 122 may be other shapes such as a circle, a hexagon, and an ellipse. The medium body 12 may be other shapes such as a cylinder, a hexagon, or the like.
在本实施方式中 ,导电层 125可以为导电薄膜并通过电镀的方式形成于所 述第一表面 121和所述第二表面 123。 In this embodiment, the conductive layer 125 may be a conductive film and formed by electroplating. The first surface 121 and the second surface 123 are described.
在其它实施方式中,导电层 125可以通过胶水粘合的方式形成于所述第一 表面 121和所述第二表面 123。  In other embodiments, the conductive layer 125 may be formed on the first surface 121 and the second surface 123 by glue bonding.
在本实施方式中, 导电层 125由银、 铜等金属材料制成。  In the present embodiment, the conductive layer 125 is made of a metal material such as silver or copper.
作为本发明的进一步改进,所述介质谐振器 10还可以包括盖板 20和所述 调试组件 30, 所述盖板 20用于固定所述调试组件 30。 盖板 20的面积除了可 以使其固定住调试组件 30之外, 还可以进一步增大, 比如, 和介质本体 12 的第一表面 121的形状一致, 起到对介质谐振器 10的热量进行散发, 即散热 的作用。  As a further improvement of the present invention, the dielectric resonator 10 may further include a cover 20 and the debug assembly 30 for fixing the debug assembly 30. The area of the cover plate 20 can be further increased, in addition to the fixing of the debugging assembly 30, for example, in conformity with the shape of the first surface 121 of the dielectric body 12, to dissipate heat from the dielectric resonator 10. That is the role of heat dissipation.
在本实施方式中, 所述盖板 20的材料可以是金属材料, 或是至少下表面 镀有金属的材料, 这样可以起到防止介质谐振器 10内的电磁波能量泄露的作 用。  In the present embodiment, the material of the cover plate 20 may be a metal material or a material in which at least the lower surface is plated with a metal, so as to prevent leakage of electromagnetic wave energy in the dielectric resonator 10.
在本实施方式中, 所述盖板 20焊接于所述第一表面 121 , 从而盖板 20和 第一表面 121的结合比较牢靠, 即盖板 20和介质本体 12的结合比较牢靠。在 其它实施方式中, 所述盖板 20通过胶水粘合于所述第一表面 121 , 从而使得 盖板 20和介质本体 12之间的安装筒单方便。  In the embodiment, the cover 20 is welded to the first surface 121, so that the combination of the cover 20 and the first surface 121 is relatively firm, that is, the combination of the cover 20 and the medium body 12 is relatively strong. In other embodiments, the cover 20 is glued to the first surface 121 by glue, thereby facilitating the mounting of the cover 20 and the media body 12.
因盖板 20安装于介质本体 12的第一表面 121 , 即盖板 20遮盖介质本体 12的第一盲孔 122, 从而防止电磁波从介质本体 12的顶面泄露。  Since the cover 20 is mounted on the first surface 121 of the medium body 12, that is, the cover 20 covers the first blind hole 122 of the medium body 12, thereby preventing electromagnetic waves from leaking from the top surface of the medium body 12.
在本实施方式中 ,所述调试组件 30安装于所述盖板 20对应所述第一盲孔 122的位置处, 即盖板 20作为调试组件 30安装于介质本体 12的载体, 从而 方便调试组件 30在介质本体 12上的安装。  In the embodiment, the debugging component 30 is mounted at a position corresponding to the first blind hole 122 of the cover plate 20, that is, the cover plate 20 is mounted as a debugging component 30 on the carrier of the medium body 12, thereby facilitating debugging of the component. 30 is mounted on the media body 12.
进一步, 所述盖板 20设有第一孔 24, 所述第一孔 24与所述第一盲孔 122 连通, 所述调试组件 30通过所述第一孔 24与所述第一盲孔 122配合, 用于调 试所述介质谐振器 10的谐振频率。  Further, the cover plate 20 is provided with a first hole 24, the first hole 24 is in communication with the first blind hole 122, and the debugging component 30 passes through the first hole 24 and the first blind hole 122. Cooperating, for debugging the resonant frequency of the dielectric resonator 10.
更进一步, 所述调试组件 30包括螺釘 34和螺母 32, 所述螺母 32用于将 所述螺釘 34固定于所述盖板 20。 在本实施方式中, 螺釘 34可以被称为调试 螺釘, 因为该调试螺釘是用于调试频率的螺釘 34, 其材料可以是金属的, 也 可以部分或全部材质为其他介质材料, 如塑料。 其中, 当调试螺釘部分材质为 其他介质材料时,调试螺釘插入谐振腔内的部分材料为介质, 与盖板连接的部 分材料为金属, 这样可以更好的防止介质谐振器 10内的电磁波能量的泄露。 在其它实施方式中, 所述调试组件 30包括螺釘 34, 所述第一孔 24为螺 纹孔, 所述螺釘 34通过所述螺纹孔固定于所述盖板 20。 Further, the debugging assembly 30 includes a screw 34 and a nut 32 for fixing the screw 34 to the cover plate 20. In the present embodiment, the screw 34 may be referred to as a debugging screw, because the debugging screw is a screw 34 for debugging frequency, and the material may be metal or some or all of the material may be other dielectric materials such as plastic. Wherein, when the debugging screw portion is made of other dielectric materials, part of the material of the debugging screw inserted into the resonant cavity is a medium, and a part of the material connected to the cover plate is metal, so that the electromagnetic wave energy in the dielectric resonator 10 can be better prevented. Give way. In other embodiments, the debugging assembly 30 includes a screw 34, the first hole 24 is a threaded hole, and the screw 34 is fixed to the cover plate 20 through the threaded hole.
安装时,盖板 20安装于介质本体 12设有第一盲孔 122的面上, 在本实施 例中, 为第一表面 121 , 调试组件 30安装于盖板 20上, 从而介质本体 12、 盖 板 20和调试组件 30组装为介质谐振器 10。  The cover plate 20 is mounted on the surface of the medium body 12 where the first blind hole 122 is disposed. In this embodiment, the first surface 121 is provided, and the debugging component 30 is mounted on the cover plate 20, so that the medium body 12 and the cover are The board 20 and the debug assembly 30 are assembled into a dielectric resonator 10.
使用时, 如需要调试介质谐振器 10的频率, 将螺釘 34通过盖板 20的第 一孔 24伸入介质本体 12的第一盲孔 122中, 通过螺釘 34在第一盲孔 122中 的长度的不同来改变介质本体 12内部的电磁场分布, 从而改变介质谐振器 10 的频率, 即调试介质滤波器 100的频率。 其中, 螺釘 34伸入第一盲孔 122中 的长度越长, 介质谐振器 10 的频率越低。 反之, 螺釘 34伸入第一盲孔 122 中的长度越短, 介质谐振器 10的频率越高。 当然, 也可以没有调试组件 30, 介质谐振器 10的频率通过第一盲孔 122的截面面积和宽度来调节。  In use, if the frequency of the dielectric resonator 10 needs to be debugged, the screw 34 is inserted into the first blind hole 122 of the medium body 12 through the first hole 24 of the cover 20, and the length of the screw 34 in the first blind hole 122. The difference is to change the electromagnetic field distribution inside the medium body 12, thereby changing the frequency of the dielectric resonator 10, that is, the frequency of the dielectric filter 100 is debugged. The longer the length of the screw 34 into the first blind hole 122, the lower the frequency of the dielectric resonator 10. Conversely, the shorter the length of the screw 34 into the first blind hole 122, the higher the frequency of the dielectric resonator 10. Of course, it is also possible to have no debug component 30, and the frequency of the dielectric resonator 10 is adjusted by the cross-sectional area and width of the first blind via 122.
请一并参考图 3至图 6, 本发明的介质滤波器 100包括至少一个上述介质 谐振器 10。 其中, 如图 3a所示, 介质滤波器 100中所包括的谐振腔上设有上 述实施例所描述的第一盲孔 122, 其中, 是在一个谐振腔上设置上述第一盲孔 122, 还是在多个谐振腔上设置上述第一盲孔 122, 可以视实际需求进行设计, 在本发明可以中不予限定。其中,介质滤波器 100的频率由组成其介质谐振器 10的频率决定。  Referring to Figures 3 through 6, the dielectric filter 100 of the present invention includes at least one of the above-described dielectric resonators 10. As shown in FIG. 3a, the first blind via 122 described in the above embodiment is disposed on the resonant cavity included in the dielectric filter 100, wherein the first blind via 122 is disposed on a resonant cavity, or The first blind hole 122 is disposed on the plurality of resonant cavities, and may be designed according to actual needs, and may not be limited in the present invention. Among them, the frequency of the dielectric filter 100 is determined by the frequency of the dielectric resonator 10 constituting it.
在另一实施方式中, 所述介质滤波器 100可以包括至少两个如图 1和图 2 所示的介质谐振器 10, 所述两个介质谐振器 10的盖板 20可以连为一体, 这 样, 可以使得装配更筒易, 而且可以通过盖板 20 面积的增大, 强化盖板 20 所起到的对介质滤波器 100进行散热的功能。  In another embodiment, the dielectric filter 100 may include at least two dielectric resonators 10 as shown in FIGS. 1 and 2, and the cover plates 20 of the two dielectric resonators 10 may be integrated into one body. The assembly can be made easier, and the function of dissipating the dielectric filter 100 by the cover 20 can be enhanced by the increase of the area of the cover 20.
当所述介质滤波器 100包括至少两个介质谐振器 10时, 两个介质谐振器 10中的介质本体 12相连接的部分没有导电层 125 , 即介质滤波器 100的介质 本体 12的外表面设置有导电层 125 , 而内部没有导电层 125。 由于相邻的介质 谐振器 10相接的部分没有导电层 125 , —般, 在描述介质滤波器 100时, 将 多个介质谐振器 10的介质本体 12合称为介质滤波器的介质本体 12, 将多个 介质谐振器的导电层 125合称为覆盖于介质滤波器 100的介质本体 12的导电 层 125 ,而将 N个介质谐振器 10的介质本体 12形成的介质谐振腔称为介质滤 波器 100的 N个介质谐振腔(N为不小于 1的整数)。 在另一实施方式中, 如图 3b所示, 介质滤波器 100中所包括的谐振腔上 设有上述实施例所描述的第一盲孔 122 , 所述介质滤波器还包括耦合结构 40, 所述耦合结构 40用于连接每两个相邻的所述介质谐振器 10,所述介质本体 12 还包括至少一个第二盲孔 124, 所述第二盲孔 124用于调试所述耦合结构 40 的耦合带宽。所述第二盲孔 124从导电层 125向所述介质本体 12的内部延伸, 所述第二盲孔 124的内壁为介质,即所述第二盲孔 124的内表面不附着导电层 125。 第二盲孔 124的设置位置与耦合结构 40的位置相对应。 其中, 是在一个 耦合结构 40上设置, 还是在多个耦合结构 40上设置, 可以视实际需求进行, 即,介质滤波器 100上所包括的第二盲孔 124的数量在本发明中可以不予限定。 此外, 对于一个耦合结构 40的第二盲孔 124的数量在本发明中也可以不予限 定, 比如, 可以为 1个, 也可以为多于 1个, 具体可视实际需求进行设置。 When the dielectric filter 100 includes at least two dielectric resonators 10, the portion of the two dielectric resonators 10 to which the dielectric body 12 is connected has no conductive layer 125, that is, the outer surface of the dielectric body 12 of the dielectric filter 100 is disposed. There is a conductive layer 125 and no conductive layer 125 inside. Since the portion where the adjacent dielectric resonators 10 are connected has no conductive layer 125, generally, when the dielectric filter 100 is described, the dielectric bodies 12 of the plurality of dielectric resonators 10 are collectively referred to as the dielectric body 12 of the dielectric filter. The conductive layers 125 of the plurality of dielectric resonators are collectively referred to as a conductive layer 125 covering the dielectric body 12 of the dielectric filter 100, and the dielectric resonator formed by the dielectric bodies 12 of the N dielectric resonators 10 is referred to as a dielectric filter. N dielectric resonators of 100 (N is an integer not less than 1). In another embodiment, as shown in FIG. 3b, the first blind hole 122 described in the above embodiment is disposed on the resonant cavity included in the dielectric filter 100, and the dielectric filter further includes a coupling structure 40. The coupling structure 40 is used to connect every two adjacent dielectric resonators 10, and the dielectric body 12 further includes at least one second blind hole 124 for debugging the coupling structure 40. Coupling bandwidth. The second blind hole 124 extends from the conductive layer 125 to the inside of the dielectric body 12 , and the inner wall of the second blind hole 124 is a medium, that is, the inner surface of the second blind hole 124 does not adhere to the conductive layer 125 . The position of the second blind hole 124 is set to correspond to the position of the coupling structure 40. In the present invention, the number of the second blind holes 124 included in the dielectric filter 100 may not be set in the present invention. Limited. In addition, the number of the second blind holes 124 of the coupling structure 40 is not limited in the present invention. For example, one or more than one may be used, and the actual number may be set according to actual needs.
在本实施例中,每个谐振腔上均设置有第一盲孔,每相邻的两个谐振腔之 间的耦合结构 40上均设置有第二盲孔 124, 即, 每一个所述第二盲孔 124位 于每两个相邻的所述第一盲孔 122之间, 所述第一盲孔 122和所述第二盲孔 124间隔设计。  In this embodiment, a first blind hole is disposed on each of the resonant cavities, and a second blind hole 124 is disposed on the coupling structure 40 between each adjacent two resonant cavities, that is, each of the Two blind holes 124 are located between each two adjacent first blind holes 122, and the first blind holes 122 and the second blind holes 124 are spaced apart.
如图 3和图 4所示, 在一个实施方式中, 所述耦合结构 40可以包括多对 耦合槽 42, 每对耦合槽 42包括相对介质本质 12的纵长轴线对称的两个耦合 槽 42。 每对耦合槽 42的一个耦合槽 42从介质本体 12的一个长度较长的第二 表面 123向介质本体 12内部延伸, 另一个耦合槽 42从介质本体 12的一个长 度较长的第二表面 123向介质本体 12内部延伸,但两个耦合槽 42未连通,且 每一个耦合槽 42贯穿介质本体 12的顶面和底面。 在本实施方式中, 所述耦合 槽 42包括为四对耦合槽 42。 可以理解的是, 耦合结构 40也可以采用其他现 有方式实现谐振腔之间的耦合, 在本发明中不再赘述, 也可以不予限定(即本 发明可以和以后出现的耦合结构相结合)。  As shown in FIGS. 3 and 4, in one embodiment, the coupling structure 40 can include a plurality of pairs of coupling grooves 42, each pair of coupling grooves 42 including two coupling grooves 42 that are symmetrical with respect to the longitudinal axis of the medium nature 12. One coupling groove 42 of each pair of coupling grooves 42 extends from a longer length second surface 123 of the medium body 12 toward the inside of the medium body 12, and the other coupling groove 42 from a longer length second surface 123 of the medium body 12. The inside of the medium body 12 extends, but the two coupling grooves 42 are not connected, and each of the coupling grooves 42 penetrates the top surface and the bottom surface of the medium body 12. In the present embodiment, the coupling groove 42 includes four pairs of coupling grooves 42. It can be understood that the coupling structure 40 can also implement the coupling between the resonant cavities in other existing manners, which are not described in the present invention, and may not be limited (ie, the present invention can be combined with the coupling structure that appears later). .
在本实施方式中, 所述第二盲孔 124的设置位置与所述耦合结构 40相对 应。 具体可以为, 每一对耦合槽 42之间设有一个第二盲孔 124, 即所述第二 盲孔 124在介质本体 12中的位置由所述耦合槽 42的位置决定。且所述第二盲 孔 124的数量与所述耦合槽 42的对数相同。  In the present embodiment, the second blind hole 124 is disposed at a position corresponding to the coupling structure 40. Specifically, a second blind hole 124 is disposed between each pair of coupling grooves 42, that is, the position of the second blind hole 124 in the medium body 12 is determined by the position of the coupling groove 42. And the number of the second blind holes 124 is the same as the number of the coupling grooves 42.
因介质本体 12上设有第一盲孔 122和第二盲孔 124, 从而改变了所述介 质滤波器 100的介质本体 12的介质结构。 从理论上讲, 根据电磁场原理, 所 述介质滤波器 100的介质本体 12的介质结构的改变, 可以导致电磁场在介质 滤波器 100内的分布发生变化。 根据仿真发现, 电磁场在所述介质滤波器 100 内的分布发生变化会改变所述介质滤波器 100的频率及耦合带宽,从而实现改 变所述介质滤波器 100的频率和耦合带宽的目的。 Since the first blind hole 122 and the second blind hole 124 are provided on the medium body 12, the medium structure of the medium body 12 of the dielectric filter 100 is changed. In theory, according to the principle of electromagnetic field, The change in the dielectric structure of the dielectric body 12 of the dielectric filter 100 can cause a change in the distribution of the electromagnetic field within the dielectric filter 100. According to simulations, a change in the distribution of the electromagnetic field within the dielectric filter 100 changes the frequency and coupling bandwidth of the dielectric filter 100, thereby achieving the purpose of changing the frequency and coupling bandwidth of the dielectric filter 100.
具体地,第一盲孔 122截面的大小和深度可以改变介质滤波器 100的谐振 频率,如增加第一盲孔 122的截面面积和深度可以升高介质滤波器 100的谐振 频率。 第二盲孔 124截面的大小和深度可以改变介质滤波器 100的耦合带宽, 如增加第二盲孔 124的截面面积和增加第二盲孔 124的深度可以减少介质滤波 器 100的耦合带宽。其中, 第二盲孔 124的截面的形状在本发明中可以不予限 定, 比如, 可以为圆形、 六角形、 方形或其他不规则的形状, 该第二盲孔 124 向介质本体 12内延伸的方式, 也可以不予限定, 比如, 可以为垂直延伸, 梯 形延伸, S形延伸, 也可以为其他不规则的延伸方式。  Specifically, the size and depth of the cross section of the first blind via 122 may change the resonant frequency of the dielectric filter 100. Increasing the cross-sectional area and depth of the first blind via 122 may increase the resonant frequency of the dielectric filter 100. The size and depth of the cross section of the second blind via 124 can change the coupling bandwidth of the dielectric filter 100, such as increasing the cross-sectional area of the second blind via 124 and increasing the depth of the second blind via 124 to reduce the coupling bandwidth of the dielectric filter 100. The shape of the cross section of the second blind hole 124 is not limited in the present invention. For example, it may be a circular shape, a hexagonal shape, a square shape or other irregular shapes. The second blind hole 124 extends into the medium body 12 . The method may also be not limited. For example, it may be vertical extension, trapezoidal extension, S-shaped extension, or other irregular extension.
进一步, 请参考图 7, 随着第一盲孔 122的宽度的增加, 即随着第一盲孔 122的截面面积的增加, 介质滤波器 100谐振频率升高了。 请参考图 8, 随着 第一盲孔 122的深度的增加, 介质滤波器 100的谐振频率升高了。 换而言之, 增加第一盲孔 122的截面面积和深度可以升高介质滤波器 100的谐振频率。请 参考图 9, 随着第二盲孔 124的截面面积和深度的增加介质滤波器 100的耦合 带宽减少了。  Further, referring to FIG. 7, as the width of the first blind via 122 increases, that is, as the cross-sectional area of the first blind via 122 increases, the resonant frequency of the dielectric filter 100 increases. Referring to Figure 8, as the depth of the first blind via 122 increases, the resonant frequency of the dielectric filter 100 increases. In other words, increasing the cross-sectional area and depth of the first blind via 122 can increase the resonant frequency of the dielectric filter 100. Referring to FIG. 9, the coupling bandwidth of the dielectric filter 100 is reduced as the cross-sectional area and depth of the second blind via 124 are increased.
更进一步, 本发明通过在介质本体 12上设计所述第一盲孔 122和所述第 二盲孔 124, 从而实现改变所述介质滤波器 100的频率和耦合带宽的目的, 进 而解决了现有技术中因通过打磨介质以及反复镀银的方法来调节介质滤波器 100的谐振频率和耦合带宽而导致的无法大批量生产及调试不便的问题。  Further, the present invention achieves the purpose of changing the frequency and coupling bandwidth of the dielectric filter 100 by designing the first blind via 122 and the second blind via 124 on the dielectric body 12, thereby solving the existing In the art, the problem of inconvenience in mass production and debugging is caused by adjusting the resonance frequency and the coupling bandwidth of the dielectric filter 100 by the method of grinding the medium and repeatedly silver plating.
在本实施方式中, 所述第一盲孔 122为三个,所述多个第二盲孔 124为四 个, 所述第二盲孔 124的数量比所述第一盲孔 122的数量多一个。  In this embodiment, the number of the first blind holes 122 is three, the number of the second blind holes 124 is four, and the number of the second blind holes 124 is larger than the number of the first blind holes 122. One.
介质本体 12每个谐振腔均设有一个第一盲孔 122, 这样可以使得本发明 的介质滤波器 100的阻带衰减较大, 信号选择性较好。  The dielectric body 12 is provided with a first blind via 122 in each of the resonant cavities, so that the stopband attenuation of the dielectric filter 100 of the present invention is large and the signal selectivity is good.
在本实施方式中 ,所述第一盲孔 122和所述第二盲孔 124均垂直从第一表 面 121向介质本体 12内部延伸。 所述第一盲孔 122和所述第二盲孔 124的截 面形状可以为方形。 所述介质本体 12为长方体。  In this embodiment, the first blind hole 122 and the second blind hole 124 extend perpendicularly from the first surface 121 toward the inside of the medium body 12. The cross-sectional shape of the first blind hole 122 and the second blind hole 124 may be square. The medium body 12 is a rectangular parallelepiped.
在其它实施方式中,所述第一盲孔 122和所述第二盲孔 124也可以以其它 方式从第一表面 121向介质本体 12内部延伸, 如斜着延伸, 梯形或 S型延伸 等。所述第一盲孔 122和所述第二盲孔 124的截面形状可以为圆形、 六边形及 椭圆形等其它形状。 所述介质本体 12可以为圆柱体、 六边形体等其它形状。 In other embodiments, the first blind hole 122 and the second blind hole 124 may also be other The manner extends from the first surface 121 to the interior of the media body 12, such as obliquely extending, trapezoidal or S-shaped extensions, and the like. The cross-sectional shape of the first blind hole 122 and the second blind hole 124 may be other shapes such as a circle, a hexagon, and an ellipse. The medium body 12 may be other shapes such as a cylinder, a hexagon, or the like.
在本实施方式中,所述第一盲孔 122的截面面积和深度可以均等于所述第 二盲孔 124的截面面积和深度。  In this embodiment, the cross-sectional area and depth of the first blind hole 122 may both be equal to the cross-sectional area and depth of the second blind hole 124.
在其它实施方式中,所述第一盲孔 122的截面面积可以等于所述第二盲孔 124的截面面积, 但所述第一盲孔 122的深度不等于所述第二盲孔 124深度; 或者, 所述第一盲孔 122的截面面积不等于所述第二盲孔 124的截面面积,但 所述第一盲孔 122的深度等于所述第二盲孔 124深度; 再者, 所述第一盲孔 122的截面面积和深度均不等于所述第二盲孔 124的截面面积和深度。 即, 第 一盲孔 122和第二盲孔 124的设计及设置之间是独立的,可以分别根据实际需 求进行, 二者之间可以不相互影响。  In other embodiments, the cross-sectional area of the first blind hole 122 may be equal to the cross-sectional area of the second blind hole 124, but the depth of the first blind hole 122 is not equal to the depth of the second blind hole 124; Alternatively, the cross-sectional area of the first blind hole 122 is not equal to the cross-sectional area of the second blind hole 124, but the depth of the first blind hole 122 is equal to the depth of the second blind hole 124; The cross-sectional area and depth of the first blind hole 122 are not equal to the cross-sectional area and depth of the second blind hole 124. That is, the design and arrangement of the first blind hole 122 and the second blind hole 124 are independent, and may be respectively performed according to actual needs, and may not affect each other.
如图 3至图 6所示, 所述介质滤波器 100还包括多个调试组件 30和用于 固定所述调试组件 30的盖板 20, 所述调试组件 30安装于所述盖板 20对应所 述第一盲孔 122和所述第二盲孔 124的位置处。 所述调试组件 30插入所述第 二盲孔 124 中, 用于调试所述介质滤波器 100的耦合带宽 (此时, 调试组件 30可以被称为第二调试组件 ) ; 所述调试组件 30插入所述第一盲孔 122中, 用于调试所述介质滤波器 100的频率 (此时, 调试组件 30可以被称为第一调 试组件) 。  As shown in FIG. 3 to FIG. 6 , the dielectric filter 100 further includes a plurality of debugging components 30 and a cover plate 20 for fixing the debugging component 30 . The debugging component 30 is mounted on the corresponding cover plate 20 . The positions of the first blind hole 122 and the second blind hole 124 are described. The debug component 30 is inserted into the second blind hole 124 for debugging the coupling bandwidth of the dielectric filter 100 (in this case, the debug component 30 may be referred to as a second debug component); the debug component 30 is inserted In the first blind hole 122, the frequency for debugging the dielectric filter 100 (at this time, the debugging component 30 may be referred to as a first debugging component).
所述盖板 20还可以设有多个第二孔 22, 所述第二孔 22和所述第二盲孔 The cover plate 20 may further be provided with a plurality of second holes 22, the second holes 22 and the second blind holes
124连通。 换而言之, 所述盖板 20设有多个第一孔 24和多个第二孔 22, 所述 第一孔 24和所述第一盲孔 122连通。 124 connected. In other words, the cover plate 20 is provided with a plurality of first holes 24 and a plurality of second holes 22, and the first holes 24 communicate with the first blind holes 122.
在本实施方式中, 所述第一孔 24和所述第二孔 22可以被称为调试孔, 因 为调试组件 30通过所述第一孔 24插入第一盲孔 122和所述第二孔 22插入到 第二盲孔 124中, 以改变介质本体 12内谐振腔的电磁场分布, 故而可称之为 调试孔。  In the present embodiment, the first hole 24 and the second hole 22 may be referred to as a debugging hole, because the debugging component 30 is inserted into the first blind hole 122 and the second hole 22 through the first hole 24 . Inserted into the second blind hole 124 to change the electromagnetic field distribution of the resonant cavity in the dielectric body 12, so it can be called a debug hole.
在本实施方式中, 每一个第一孔 24的轴线和每一个第一盲孔 122的轴线 重合, 即所述第一盲孔 122和所述第一孔 24——对应。每一个第二孔 22的轴 线和每一个第二盲孔 124的轴线重合, 即所述第二盲孔 124和所述第二孔 22 ——对应。 安装时, 盖板 20安装于介质本体 12的第一表面 121 , 调试组件 30安装 于盖板 20并分别插入所述第一盲孔 122和所述第二盲孔 124中, 从而多个介 质谐振器 10组装为介质滤波器 100。 In the present embodiment, the axis of each of the first holes 24 coincides with the axis of each of the first blind holes 122, that is, the first blind holes 122 and the first holes 24 correspond to each other. The axis of each of the second holes 22 coincides with the axis of each of the second blind holes 124, that is, the second blind holes 124 and the second holes 22 correspond to each other. When installed, the cover plate 20 is mounted on the first surface 121 of the medium body 12, and the debugging assembly 30 is mounted on the cover plate 20 and inserted into the first blind hole 122 and the second blind hole 124, respectively, thereby multiple dielectric resonances. The device 10 is assembled as a dielectric filter 100.
使用时,如需要调试介质滤波器 100的频率,将螺釘 34通过盖板 20的第 一孔 24伸入介质本体 12的第一盲孔 122中, 通过螺釘 34在第一盲孔 122中 的长度的不同来改变介质本体 12内部的电磁场分布,从而改变介质滤波器 100 的频率。 其中, 螺釘 34伸入第一盲孔 122中的长度越长, 介质滤波器 100的 频率越低。 反之, 螺釘 34伸入第一盲孔 122中的长度越短, 介质滤波器 100 的频率越高。  In use, if the frequency of the dielectric filter 100 needs to be debugged, the screw 34 is inserted into the first blind hole 122 of the medium body 12 through the first hole 24 of the cover 20, and the length of the screw 34 in the first blind hole 122. The difference is to change the electromagnetic field distribution inside the medium body 12, thereby changing the frequency of the dielectric filter 100. The longer the length of the screw 34 into the first blind hole 122, the lower the frequency of the dielectric filter 100. Conversely, the shorter the length of the screw 34 into the first blind hole 122, the higher the frequency of the dielectric filter 100.
如需要调试介质滤波器 100耦合带宽, 将螺釘 34通过盖板 20的第二孔 If it is necessary to debug the dielectric filter 100 coupling bandwidth, pass the screw 34 through the second hole of the cover 20.
22伸入介质本体 12的第二盲孔 124中, 通过螺釘 34在第二盲孔 124中的长 度的不同来改变介质本体 12内部的电磁场分布, 从而改变介质滤波器 100的 耦合带宽。 其中, 螺釘 34伸入第二盲孔 124中的长度越长, 介质滤波器 100 的耦合带宽越大。 反之, 螺釘 34伸入第二盲孔 124中的长度越短, 介质滤波 器 100的耦合带宽越小。 22 extends into the second blind hole 124 of the medium body 12, and the electromagnetic field distribution inside the medium body 12 is changed by the difference in the length of the screw 34 in the second blind hole 124, thereby changing the coupling bandwidth of the dielectric filter 100. The longer the length of the screw 34 into the second blind hole 124, the larger the coupling bandwidth of the dielectric filter 100. Conversely, the shorter the length of the screw 34 into the second blind hole 124, the smaller the coupling bandwidth of the dielectric filter 100.
更进一步,所述盖板 20上设置的调试组件 30的数量可以根据实际需要进 行调节, 也就是, 调试组件 30的数量可以和第一盲孔 122, 第二盲孔 124的 数量不相等。 例如, 当通过在介质本体 12上设计所述第一盲孔 122和所述第 二盲孔 124就可以确保所述介质滤波器 100的频率和耦合带宽时,则不需要调 试组件 30, 相应的, 盖板 20上也不设置相应的第一孔 24或第二孔 22。 或者, 所述盖板 20上可以仅在部分所述第一盲孔 122的位置处设置螺釘 34, 即在盖 板 20上设置部分第一孔 24, 通过调节螺釘 34使其伸入所述第一盲孔 122可 以降低所述介质滤波器 100的频率, 或使所述螺釘 34抽出所述第一盲孔 122 可以增加所述介质滤波器 100的频率。 所述盖板 20上可以仅在部分所述第二 盲孔 124的位置处设置螺釘 34, 即在盖板 20上设置部分第二孔 22, 通过调节 螺釘 34使其伸入所述第二盲孔 124可以增加所述介质滤波器 100的耦合带宽, 或使所述螺釘 34抽出所述第二盲孔 124可以减小所述介质滤波器 100的耦合 带宽。 同时, 也可以在所述盖板 20上对应所述第一盲孔 122的位置处均设置 螺釘 34,即在所述盖板 20上对应所述第一盲孔 122的位置处均设有第一孔 24, 所述螺釘 34插入所述第一孔 24但不伸入所述第一盲孔 122。 也可以在所述盖 板 20上对应所述第二盲孔 124的位置处均设置螺釘 34, 即在所述盖板 20上 对应所述第二盲孔 124的位置处均设有第二孔 22, 所述螺釘 34插入所述第二 孔 22但不伸入所述第二盲孔 124。 当在所述盖板 20对应所述第一盲孔 122或 所述第二盲孔 124的位置处不设置螺釘 34,或者所述螺釘 34插入孔第一孔 24 或第二孔 22但不伸入第一盲孔 122或第二盲孔 124时, 可以通过改变第一盲 孔 122 的截面面积和深度对频率进行调节, 同时可以通过改变第二盲孔 124 的截面面积和深度对耦合带宽进行调节。 Furthermore, the number of the debugging components 30 disposed on the cover plate 20 can be adjusted according to actual needs, that is, the number of the debugging components 30 can be different from the number of the first blind holes 122 and the second blind holes 124. For example, when the frequency and coupling bandwidth of the dielectric filter 100 can be ensured by designing the first blind via 122 and the second blind via 124 on the dielectric body 12, the debug component 30 is not required, corresponding A corresponding first hole 24 or second hole 22 is not provided on the cover plate 20. Alternatively, the cover plate 20 may be provided with a screw 34 only at a portion of the first blind hole 122, that is, a part of the first hole 24 is provided on the cover plate 20, and the adjustment screw 34 is inserted into the cover plate A blind hole 122 may reduce the frequency of the dielectric filter 100, or withdrawing the screw 34 from the first blind hole 122 may increase the frequency of the dielectric filter 100. The cover plate 20 may be provided with a screw 34 only at a position of a part of the second blind hole 124, that is, a partial second hole 22 is provided on the cover plate 20, and the second blind is extended by the adjusting screw 34. The aperture 124 may increase the coupling bandwidth of the dielectric filter 100, or the extraction of the screw 34 out of the second blind via 124 may reduce the coupling bandwidth of the dielectric filter 100. At the same time, a screw 34 is disposed on the cover plate 20 at a position corresponding to the first blind hole 122, that is, a position corresponding to the first blind hole 122 is provided on the cover plate 20 A hole 24 is inserted into the first hole 24 but does not protrude into the first blind hole 122. Also available in the cover A screw 34 is disposed on the plate 20 at a position corresponding to the second blind hole 124. That is, a second hole 22 is disposed at a position corresponding to the second blind hole 124 on the cover plate 20, and the screw 34 is provided. The second hole 22 is inserted but does not extend into the second blind hole 124. No screw 34 is provided at a position where the cover plate 20 corresponds to the first blind hole 122 or the second blind hole 124, or the screw 34 is inserted into the hole first hole 24 or the second hole 22 but does not extend. When entering the first blind hole 122 or the second blind hole 124, the frequency can be adjusted by changing the sectional area and depth of the first blind hole 122, and the coupling bandwidth can be changed by changing the sectional area and depth of the second blind hole 124. Adjustment.
因此,可以通过调节螺釘 34改变所述介质滤波器 100的所述第一盲孔 122 内的空气介质的分布,进而改变所述介质滤波器 100内的电场和磁场中至少一 个的分布, 从而改变所述介质滤波器 100 的频率。 同时, 可以通过调节螺釘 34改变所述介质滤波器 100的所述第二盲孔 124内的空气介质的分布, 进而 改变所述介质滤波器 100内的电场和磁场中至少一个的分布,从而所述介质滤 波器 100的耦合带宽。  Therefore, the distribution of the air medium in the first blind hole 122 of the dielectric filter 100 can be changed by the adjustment screw 34, thereby changing the distribution of at least one of the electric field and the magnetic field in the dielectric filter 100, thereby changing The frequency of the dielectric filter 100. At the same time, the distribution of the air medium in the second blind hole 124 of the dielectric filter 100 can be changed by the adjusting screw 34, thereby changing the distribution of at least one of the electric field and the magnetic field in the dielectric filter 100, thereby The coupling bandwidth of the dielectric filter 100 is described.
因为通过将所述螺釘 34伸入到所述第一盲孔 122或所述第二盲孔 124内 , 可以改变所述介质滤波器 100的所述第一盲孔 122或所述第二盲孔 124内的空 气介质的分布,同时随着所述螺釘 34在所述第一盲孔 122或所述第二盲孔 124 内的移动,所述介质滤波器 100的所述第一盲孔 122或所述第二盲孔 124内的 空气介质的分布也随之不断改变,从而可以使得所述介质滤波器 100具有不同 的频率和耦合带宽。 因此, 本发明实施例可以扩大所述介质滤波器 100的调试 范围。  Because the first blind hole 122 or the second blind hole of the dielectric filter 100 can be changed by extending the screw 34 into the first blind hole 122 or the second blind hole 124. The distribution of the air medium within the 124, while the first blind hole 122 of the dielectric filter 100 or the movement of the screw 34 within the first blind hole 122 or the second blind hole 124 The distribution of the air medium in the second blind hole 124 is also constantly changed, so that the dielectric filter 100 can have different frequencies and coupling bandwidths. Therefore, the embodiment of the present invention can expand the debugging range of the dielectric filter 100.
更进一步, 因介质本体 12设有多个第一盲孔 122和多个第二盲孔 124, 螺釘 34在任意一个所述第一盲孔 122或所述第二盲孔 124内的移动, 所述介 质滤波器 100的所述任意一个第一盲孔 122或所述任意一个第二盲孔 124内的 空气介质的分布也随之不断改变,从而可以使得所述介质滤波器 100具有不同 的频率和耦合带宽。 因此, 本发明实施例进一步可以扩大所述介质滤波器 100 的调试范围。  Further, since the medium body 12 is provided with a plurality of first blind holes 122 and a plurality of second blind holes 124, the movement of the screws 34 in any one of the first blind holes 122 or the second blind holes 124 is The distribution of the air medium in any one of the first blind holes 122 or the any one of the second blind holes 124 of the dielectric filter 100 is also changed, so that the dielectric filter 100 can have different frequencies. And coupling bandwidth. Therefore, the embodiment of the present invention can further expand the debugging range of the dielectric filter 100.
更进一步,因本发明的所述介质滤波器 100的频率的调节不仅可以通过所 述螺釘 34伸入所述第一盲孔 122的长度来调节, 而且可以通过改变所述第一 盲孔 122的截面面积和深度来调节。 同时, 本发明的所述介质滤波器 100耦合 带宽的调节不仅可以通过所述螺釘 34伸入所述第二盲孔 124的长度来调节, 而且可以通过改变所述第二盲孔 122的截面面积和深度来调节,从而进一步方 便调节所述介质滤波器 100的频率和耦合带宽, 增加了用户使用的方便性。 Further, the adjustment of the frequency of the dielectric filter 100 of the present invention can be adjusted not only by the length of the screw 34 extending into the first blind hole 122, but also by changing the first blind hole 122. The cross-sectional area and depth are adjusted. Meanwhile, the adjustment of the coupling bandwidth of the dielectric filter 100 of the present invention can be adjusted not only by the length of the screw 34 extending into the second blind hole 124, Moreover, it can be adjusted by changing the cross-sectional area and depth of the second blind hole 122, thereby further facilitating adjustment of the frequency and coupling bandwidth of the dielectric filter 100, thereby increasing user convenience.
本发明中,所述第一盲孔 122及所述第二盲孔 124的顶部可以在同一面上。 所述盖板 20上对应所述第一盲孔 122及所述第二盲孔 124的顶部的位置可以 设置有调节所述介质滤波器 100的频率和耦合带宽的螺釘 34。 所述螺釘 34在 同一平面上,从而可以实现了在同一面对所述介质滤波器 100的频率及耦合带 宽的调节,而不再像现有的介质滤波器 100需要通过打磨介质以及反复镀银的 方法来进行频率及耦合带宽的调节,即在介质滤波器四周进行频率及耦合带宽 的调节, 同时也不妨碍在所述介质滤波器 100的四周进行元器件的装配,从而 给用户调试及装配带来了便利。 从理论上讲, 根据电磁场原理, 所述介质滤波 器 100的介质本体 12的介质结构的变化, 可以导致电磁场在所述介质滤波器 100内的分布也会发生变化。 根据仿真发现, 电磁场在所述介质滤波器 100内 的分布发生变化会改变所述介质滤波器 100的频率及耦合带宽,即可以调节所 述介质滤波器 100的频率和耦合带宽, 从而可以实现改变所述介质滤波器 100 的频率和耦合带宽的目的。  In the present invention, the tops of the first blind holes 122 and the second blind holes 124 may be on the same side. A position of the cover plate 20 corresponding to the top of the first blind hole 122 and the second blind hole 124 may be provided with a screw 34 for adjusting the frequency and coupling bandwidth of the dielectric filter 100. The screws 34 are on the same plane, so that the adjustment of the frequency and the coupling bandwidth of the dielectric filter 100 in the same direction can be realized, and the conventional dielectric filter 100 is no longer required to pass the grinding medium and repeatedly silver plating. Method for adjusting the frequency and the coupling bandwidth, that is, adjusting the frequency and the coupling bandwidth around the dielectric filter, and at the same time not hindering the assembly of components around the dielectric filter 100, thereby debugging and assembling the user. Brought convenience. Theoretically, variations in the dielectric structure of the dielectric body 12 of the dielectric filter 100 may result in variations in the distribution of electromagnetic fields within the dielectric filter 100, depending on the principles of the electromagnetic field. According to the simulation, the change of the distribution of the electromagnetic field in the dielectric filter 100 changes the frequency and coupling bandwidth of the dielectric filter 100, that is, the frequency and coupling bandwidth of the dielectric filter 100 can be adjusted, thereby realizing the change. The purpose of the frequency and coupling bandwidth of the dielectric filter 100.
在另一实施方式中, 如图 3c所示, 所述介质滤波器 100可以包括上述的 第二盲孔 124 及相应的设计方案, 而不限定其是否包括上述的第一盲孔 122 及相应的设计方案。 具体的, 可以包括由介质构成的介质本体 12和覆盖于介 质本体上的导电层 125 , 所述介质本体 12包括至少两个介质谐振腔, 所述介 质滤波器还包括耦合结构 40, 所述耦合结构 40用于连接每两个相邻的所述介 质谐振腔, 所述介质本体 12还包括至少一个第二盲孔 124, 所述第二盲孔 124 用于调试所述耦合结构 40的耦合带宽, 所述第二盲孔 124从所述导电层 125 向所述介质本体 12内部延伸, 所述第二盲孔 124的内壁为介质, 所述第二盲 孔 124的设置位置与所述耦合结构 40相对应。 其中, 所述介质谐振腔由介质 构成, 对于是否设有如图 1和图 2所示的第一盲孔 122可以不予限定。  In another embodiment, as shown in FIG. 3c, the dielectric filter 100 may include the second blind hole 124 and the corresponding design described above, without limiting whether it includes the first blind hole 122 and corresponding Design. Specifically, the medium body 12 composed of a medium and the conductive layer 125 covering the medium body, the medium body 12 includes at least two dielectric resonators, and the dielectric filter further includes a coupling structure 40, the coupling The structure 40 is used to connect every two adjacent dielectric resonators, and the dielectric body 12 further includes at least one second blind hole 124 for debugging the coupling bandwidth of the coupling structure 40. The second blind hole 124 extends from the conductive layer 125 to the inside of the medium body 12, the inner wall of the second blind hole 124 is a medium, and the second blind hole 124 is disposed at a position and the coupling structure. 40 corresponds. Wherein, the dielectric cavity is composed of a medium, and the first blind hole 122 as shown in FIG. 1 and FIG. 2 may not be limited.
进一步, 所述介质滤波器 100包括调试组件 30和用于固定所述调试组件 30的盖板 20,所述调试组件 30安装于所述盖板 20对应第二盲孔 124的位置, 所述调试组件 30插入所述第二盲孔 124中, 用于调节所述介质滤波器 100的 耦合带宽。  Further, the dielectric filter 100 includes a debugging component 30 and a cover plate 20 for fixing the debugging component 30. The debugging component 30 is mounted at a position corresponding to the second blind hole 124 of the cover plate 20, and the debugging The component 30 is inserted into the second blind via 124 for adjusting the coupling bandwidth of the dielectric filter 100.
综上所述,本发明的所述介质滤波器 100可以包括所述第一盲孔 122和第 二盲孔 124中的至少一个, 即, 包括第一盲孔 122及相应的本发明实施例提供 的设计方案,或者,包括第二盲孔 124及相应的本发明实施例提供的设计方案, 或者,包括第一盲孔 122和第二盲孔 124及相应的本发明实施例提供的设计方 案。 In summary, the dielectric filter 100 of the present invention may include the first blind via 122 and the first At least one of the two blind holes 124, that is, includes the first blind hole 122 and the corresponding design provided by the embodiment of the present invention, or includes the second blind hole 124 and the corresponding design provided by the embodiment of the present invention, or The first blind hole 122 and the second blind hole 124 and the corresponding design provided by the embodiment of the present invention are included.
本发明还提供使用上述介质滤波器 100的通信设备,该通信设备可以为用 于无线通信的基站, 也可以为终端。 进一步的, 本发明还提供其他需要应用到 介质滤波器 100的设备, 比如雷达设备等。  The present invention also provides a communication device using the above-described dielectric filter 100, which may be a base station for wireless communication or a terminal. Further, the present invention also provides other devices that need to be applied to the dielectric filter 100, such as radar devices and the like.
在本发明中,将插入第一盲孔 122的调试组件称为第一调试组件, 用于固 定所述第一调试组件的盖板 20称为第一盖板。 插入第二盲孔 124的调试组件 称为第二调试组件, 用于固定所述第二调试组件的盖板 20称为第二盖板。 当 介质滤波器 100只包括第一盖板时,两个相邻的第一盖板可以连为一体,这样, 可以使得装配更筒易, 而且可以通过盖板 20面积的增大, 强化盖板 20所起到 的对介质滤波器 100进行散热的功能; 当介质滤波器 100只包括第二盖板时, 两个相邻的第二盖板可以连为一体;当介质滤波器 100包括第一盖板和第二盖 板时, 第一盖板和第二盖板可以连为一体, 这样, 可以使得装配更筒易, 而且 可以通过盖板 20面积的增大,强化盖板 20所起到的对介质滤波器 100进行散 热的功能。 同时,第一调试组件和第二调试组件的结构可以相同,也可以不同; 第一盖板和第二盖板的结构可以相同, 也可以不同。  In the present invention, the debug component inserted into the first blind hole 122 is referred to as a first debug component, and the cover 20 for fixing the first debug component is referred to as a first cover. The debug component inserted into the second blind hole 124 is referred to as a second debug component, and the cover 20 for fixing the second debug component is referred to as a second cover. When the dielectric filter 100 includes only the first cover plate, the two adjacent first cover plates can be integrally connected, so that the assembly can be made easier, and the cover plate can be strengthened by the increase of the area of the cover plate 20. 20 functions to dissipate heat from the dielectric filter 100; when the dielectric filter 100 includes only the second cover, two adjacent second covers may be integrally connected; when the dielectric filter 100 includes the first In the cover plate and the second cover plate, the first cover plate and the second cover plate can be integrally connected, so that the assembly can be made more convenient, and the cover plate 20 can be strengthened by the increase of the area of the cover plate 20. The function of dissipating heat to the dielectric filter 100. Meanwhile, the structures of the first debugging component and the second debugging component may be the same or different; the structures of the first cover and the second cover may be the same or different.
最后应说明的是: 以上实施例仅用以说明本发明的技术方案, 而非对其限 制; 尽管参照前述实施例对本发明进行了详细的说明, 本领域的普通技术人员 应当理解: 本发明的保护范围并不局限于此,任何熟悉本技术领域的技术人员 在本发明揭露的技术范围内, 可轻易想到的变化或替换, 都应涵盖在本发明的 保护范围之内。 因此, 本发明的保护范围应以权利要求的保护范围为准。  It should be noted that the above embodiments are only for explaining the technical solutions of the present invention, and are not intended to be limiting; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art The scope of the protection is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the scope of the present invention are covered by the scope of the present invention. Therefore, the scope of the invention should be determined by the scope of the claims.

Claims

权 利 要 求 Rights request
1、 一种介质谐振器, 其特征在于, 所述介质谐振器包括由介质构成的介 质本体和覆盖所述介质本体的导电层, 所述介质本体包括第一盲孔,所述第一 盲孔从所述导电层向所述介质本体内部延伸,所述第一盲孔的内壁为介质, 所 述第一盲孔用于改变所述介质谐振器的谐振频率。 1. A dielectric resonator, characterized in that, the dielectric resonator includes a dielectric body composed of a medium and a conductive layer covering the dielectric body, the dielectric body includes a first blind hole, and the first blind hole Extending from the conductive layer to the inside of the dielectric body, the inner wall of the first blind hole is dielectric, and the first blind hole is used to change the resonant frequency of the dielectric resonator.
2、 如权利要求 1所述的介质谐振器, 其特征在于, 所述第一盲孔用于改 变所述介质谐振器的谐振频率包括:所述第一盲孔用于通过所述第一盲孔的截 面面积和深度中的至少一项的改变来改变所述介质谐振器的谐振频率。 2. The dielectric resonator according to claim 1, wherein the first blind hole is used to change the resonant frequency of the dielectric resonator including: the first blind hole is used to pass through the first blind hole. A change in at least one of the cross-sectional area and depth of the hole changes the resonant frequency of the dielectric resonator.
3、 如权利要求 1或 2所述的介质谐振器, 其特征在于, 所述第一盲孔用 于改变所述介质谐振器的谐振频率包括:所述第一盲孔用于通过插入所述第一 盲孔的第一调试组件的插入长度的改变来改变所述介质谐振器的谐振频率。 3. The dielectric resonator according to claim 1 or 2, wherein the first blind hole is used to change the resonant frequency of the dielectric resonator including: the first blind hole is used to insert the The resonant frequency of the dielectric resonator is changed by changing the insertion length of the first debugging component of the first blind hole.
4、 如权利要求 3所述的介质谐振器, 其特征在于, 所述介质谐振器还包 括所述第一调试组件和用于固定所述第一调试组件的第一盖板。 4. The dielectric resonator according to claim 3, wherein the dielectric resonator further includes the first debugging component and a first cover plate for fixing the first debugging component.
5、 如权利要求 4所述的介质谐振器, 其特征在于, 所述第一盖板的下表 面为金属材料。 5. The dielectric resonator according to claim 4, wherein the lower surface of the first cover plate is made of metal material.
6、 如权利要求 4或 5所述的介质谐振器, 其特征在于, 所述盖板设有第 一孔, 所述第一孔与所述第一盲孔连通, 所述调试组件通过所述第一孔与所述 第一盲孔配合, 用于调试所述介质谐振器的谐振频率。 6. The dielectric resonator according to claim 4 or 5, wherein the cover plate is provided with a first hole, the first hole is connected to the first blind hole, and the debugging component passes through the first blind hole. The first hole cooperates with the first blind hole and is used to adjust the resonant frequency of the dielectric resonator.
7、 如权利要求 3至 6任意一项所述的介质谐振器, 其特征在于, 所述第 一调试组件包括螺釘和螺母, 所述螺母用于将所述螺釘固定于所述第一盖板。 7. The dielectric resonator according to any one of claims 3 to 6, wherein the first debugging component includes a screw and a nut, and the nut is used to fix the screw to the first cover plate. .
8、 如权利要求 3至 6任意一项所述的介质谐振器, 其特征在于, 所述第 一调试组件包括螺釘, 所述第一孔为螺纹孔, 所述螺釘通过所述螺纹孔固定于 所述第一盖板。 8. The dielectric resonator according to any one of claims 3 to 6, wherein the first debugging component includes a screw, the first hole is a threaded hole, and the screw is fixed to the The first cover plate.
9、 一种介质滤波器, 其特征在于, 所述介质滤波器包括至少一个如权利 要求 1至 8任意一项所述的介质谐振器。 9. A dielectric filter, characterized in that the dielectric filter includes at least one dielectric resonator according to any one of claims 1 to 8.
10、 如权利要求 9所述的介质滤波器, 其特征在于, 所述介质滤波器包括 至少两个所述介质谐振器, 所述至少两个所述介质谐振器的第一盖板连为一 体。 10. The dielectric filter according to claim 9, wherein the dielectric filter includes at least two dielectric resonators, and the first cover plates of the at least two dielectric resonators are connected into one body. .
11、 一种介质滤波器, 其特征在于, 所述介质滤波器包括由介质构成的介 质本体和覆盖于介质本体上的导电层, 所述介质本体包括至少两个介质谐振 腔, 所述介质滤波器还包括耦合结构, 所述耦合结构用于连接每两个相邻的所 述介质谐振腔, 所述介质本体还包括至少一个第二盲孔,所述第二盲孔用于调 试所述耦合结构的耦合带宽,所述第二盲孔从所述导电层向所述介质本体内部 延伸, 所述第二盲孔的内壁为介质, 所述第二盲孔的设置位置与所述耦合结构 相对应。 11. A dielectric filter, characterized in that, the dielectric filter includes a dielectric body composed of a medium and a conductive layer covering the dielectric body, and the dielectric body includes at least two dielectric resonances. cavity, the dielectric filter also includes a coupling structure, the coupling structure is used to connect every two adjacent dielectric resonant cavities, the dielectric body also includes at least one second blind hole, the second blind hole For debugging the coupling bandwidth of the coupling structure, the second blind hole extends from the conductive layer to the inside of the dielectric body, the inner wall of the second blind hole is a medium, and the location of the second blind hole Corresponds to the coupling structure.
12、 根据权利要求 11所述的介质滤波器, 其特征在于, 所述第二盲孔用 于调试所述耦合结构的耦合带宽包括:所述第二盲孔用于通过第二盲孔的截面 面积和深度中的至少一个的改变来改变所述耦合结构的耦合带宽。 12. The dielectric filter according to claim 11, wherein the second blind hole is used to adjust the coupling bandwidth of the coupling structure including: the second blind hole is used to pass a cross section of the second blind hole. A change in at least one of area and depth changes the coupling bandwidth of the coupling structure.
13、 根据权利要求 11或 12所述的介质滤波器, 其特征在于, 所述第二盲 孔用于调试所述耦合结构的耦合带宽包括:所述第二盲孔用于通过插入第二盲 孔的第二调试组件的插入长度的改变来改变所述耦合结构的耦合带宽。 13. The dielectric filter according to claim 11 or 12, wherein the second blind hole is used to adjust the coupling bandwidth of the coupling structure by inserting a second blind hole. The insertion length of the second debug component of the hole is changed to change the coupling bandwidth of the coupling structure.
14、 如权利要求 13所述的介质滤波器, 其特征在于, 所述介质滤波器还 包括所述第二调试组件和用于固定所述第二调试组件的第二盖板。 14. The dielectric filter according to claim 13, wherein the dielectric filter further includes the second debugging component and a second cover plate for fixing the second debugging component.
15、 如权利要求 14所述的介质滤波器, 其特征在于, 所述盖板还设有多 个第二孔, 所述第二孔和所述第二盲孔连通, 所述第二调试组件通过所述第二 孔与所述第二盲孔配合, 用于调试所述介质滤波器的耦合带宽。 15. The dielectric filter according to claim 14, wherein the cover plate is further provided with a plurality of second holes, the second holes are connected to the second blind holes, and the second debugging component The second hole cooperates with the second blind hole to adjust the coupling bandwidth of the dielectric filter.
16、 如权利要求 14或 15所述的介质滤波器, 其特征在于, 所述介质滤波 器包括至少两个所述第二调试组件和第二盖板,所述至少两个第二盖板连为一 体。 16. The dielectric filter according to claim 14 or 15, characterized in that, the dielectric filter includes at least two second debugging components and a second cover plate, and the at least two second cover plates are connected to As one body.
17、 一种通信设备, 其特征在于, 包括如权利要求 9至 16任意一项所述 的介质滤波器。 17. A communication device, characterized by comprising the dielectric filter according to any one of claims 9 to 16.
PCT/CN2013/091064 2013-12-31 2013-12-31 Dielectric resonator, dielectric filter and communication device WO2015100597A1 (en)

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