WO2015084057A1 - Angle-dependent photoluminescence emission spectrum measurement device - Google Patents

Abstract

The present invention provides an improved angle-dependent photoluminescence emission spectrum measurement device which enables a photoluminescence emission spectrum in the range of -90° ≤ φ ≤0° and a photoluminescence emission spectrum in the range of + 90° ≤ φ ≤0° to have enhanced symmetry. The angle-dependent photoluminescence emission spectrum measurement device provided by the present invention comprises: a semi-cylindrical prism having a semi-circumferential surface and a flat surface; an excitation light illumination means illuminating an excitation light toward the flat surface of the semi-cylindrical prism; and an emitted light detection means that is placed on one plane vertical to the longitudinal axis of the semi-cylindrical prism and detecting the emitted light passing through the semi-cylindrical prism while moving along the moving path having a semi-circumference shape surrounding the semi-circumferential surface of the semi-cylindrical prism, wherein the incident path of the excitation light is located outside the plane on which the moving path of the emitted light detection means is placed.

Description

Angle dependent photoluminescence emission spectrum measuring device

The present invention relates to an angle dependent photoluminescence emission spectrum measuring apparatus.

Organic light emitting diodes (OLEDs) are being actively researched due to their high potential to be applied as high efficiency lighting devices. In particular, OLEDs based on small molecular emitters doped in matrix materials have shown exceptionally high efficiencies. Note that by using a molecular material with a transition dipole moment horizontally oriented (i.e., a molecular material with emissive dipoles lying horizontally with respect to the substrate), the outcoupling efficiency Is to achieve a greater improvement. That is, the numerical simulation results show that, although it depends on the OLED structure, the light output efficiency increases 1.5 times in the case of the horizontal dipole orientation compared to the case of the random dipole orientation.

As such, for OLEDs based on small molecular emitters doped in a matrix material, the dipole orientation of the small molecule emitters has been found to be an important factor for improving OLED light output efficiency, resulting in the small size used. There is also a need for a method capable of accurately and reproducibly measuring the molecular dipole orientation of molecular emitters.

For example, Jorg Frischeisen, et. al., "Determination of molecular dipole orientation in doped fluorescent organic thin films by photoluminescence measurements," APPLIED PHYSICS LETTERS 96, 073302 (2010), "Measurement of angular dependence of photoluminescence emission spectra of specific layered structures" and the numerical values. "Procedure for Measuring Dipole Orientation of Molecules" based on "Comparison with Simulation".

In this document, the "procedure for measuring dipole orientation of molecules" is described in blue emitter 4,4'-bis [4- (diphenyl) in 4,4'-bis (N-carbazole) -biphenyl (CBP) matrix. Amino) styryl] biphenyl (BDASBi).

Materials with a random transition dipole orientation can be treated as overlapping one-third p _x -dipole, one-third p _y -dipole and one third p _z -dipole. On the other hand, a material with horizontally oriented dipoles can be considered to consist of a 1/2 p _x -dipole and a 1/2 p _y -dipole. Without loss of generality, considering light emission into the xz plane, the p _y -dipole only emits s-polarized light, while the p _x -dipole and p _z -dipole are responsible for p-polarized light emission. As a result, analyzing the p-polarized light emission yields information about the presence of vertical dipoles (ie, p _z -dipoles). Considering that the dipoles emit the strongest light in the direction perpendicular to their vibration direction, the p _z -dipoles emit light mainly at large emission angles.

In the layered sample used in this document, a 10 nm thick BDASBi: CBP (6 wt%) layer is disposed between two 70 nm thick CBP layers. In this document, a 375 nm continuous oscillation laser diode with an incident angle of 45 ° was used as the excitation source. The energy of the CBP is transferred to the emitter so that luminescence from the matrix is suppressed. Measurement of the angle dependent PL spectrum in the range of 0 ° to 90 ° was made using a polarizer to distinguish between s-polarized light and p-polarized light.

Numerical simulations used in this document are developed by "Chance, Prock, and Silbey" (see "RR Chance, A. Prock, and R. Silbey, J. Chem. Phys. 60, 2744 (1974)"), It is later based on the dipole model extended by "Barnes" ¹⁴ (see "WL Barnes, J. Mod. Opt. 45, 661 (1998)"). A detailed description can be found in S. Nowy, BC Krummacher, J. Frischeisen, NA Reinke, and W. Brutting, J. Appl. Phys. 104, 123109 (2008). The measured curve lies between two simulated curves for a random dipole orientation and an entirely horizontal dipole orientation. In this document, a good agreement between the measurements and simulations for large emission angles where emission from the vertical dipoles is most pronounced was obtained by weighting the simulation values for randomly oriented dipoles and horizontally oriented dipoles of 0.26 and 0.74, respectively. This is the amount corresponding to 91% horizontally oriented px- and py-dipoles and 9% vertical pz-dipole as total fraction. As such, this document reported that the BDASBi transition dipole moment in the CBP matrix had a predominant horizontal orientation.

In the "procedure for measuring the dipole orientation of molecules" based on this "comparison with numerical simulation", it is very important to reproducibly measure the angle dependent photoluminescence emission spectrum for the target sample.

1 is a plan view schematically showing a conventional angle-dependent photoluminescence emission spectrum measurement apparatus. The apparatus of FIG. 1 comprises an excitation light irradiation means 100, a semi-cylindrical prism 200 and an emission light detection means 300. The target sample 900 is located at the center of the flat surface of the semi-cylindrical prism 200. From the excitation light irradiation means 100, the excitation light 110 is irradiated to the target sample 900 at an incident angle of θ. Incident angle (theta) is 45 degrees normally. By the excitation light 110, the photoluminescent molecules in the target sample 900 emit emitted light (eg, fluorescence or phosphorescence) to the surroundings. The emission light 310 at the specific emission angle φ is detected by the emission light detection means 300. The emission light detecting means 300 detects the intensity of the emission light 310 according to the emission angle φ while moving along the semi-circumference around the semi-cylindrical prism 200. In this case, it is noted that the movement path of the emission light detecting means 300 and the incident path of the excitation light 110 lie on the same plane.

FIG. 2 is a typical example of the angle dependent photoluminescence emission spectrum measured with the apparatus of FIG. 1. According to the principle of the device, the photoluminescence emission spectrum in the range of −90 ° ≦ φ ≦ 0 ° and the photoluminescence emission spectrum in the range of + 90 ° ≦ φ ≦ 0 ° should be symmetric with each other. However, according to the present invention, in the angle dependent photoluminescence emission spectrum measured by the conventional apparatus, the photoluminescence emission spectrum in the range of + 90 ° ≦ φ ≦ 0 ° is −90 ° ≦ φ It has a peak that does not exist in the photoluminescence emission spectrum in the range ≦ 0 °. That is, in the angle dependent photoluminescence emission spectrum of FIG. 2, a peculiar peak is shown at a position of φ = about 24 °. According to the inventors of the present invention through the application of Fresnel's law of refraction, the position of this singular peak (ie, φ = about 24 °) was equal to the angle of refraction of the incident excitation light 110. That is, after a part of the incident excitation light 110 has passed through the target sample 900 and the semi-cylindrical prism 200, together with the emission light 310 at φ = about 24 °, the emission light detection means 300 ) Is reached.

In the present invention, the improved angle dependency, such that the photoluminescence emission spectrum in the range -90 ° ≦ φ ≦ 0 ° and the photoluminescence emission spectrum in the range + 90 ° ≦ φ ≦ 0 °, have improved symmetry. An optical luminescence emission spectrum measuring apparatus is provided.

An angle dependent photoluminescence emission spectrum measuring apparatus provided by the present invention,

A semi-cylindrical prism having a semi-circumferential surface and a flat surface;

Excitation light irradiation means for irradiating excitation light toward the flat surface of the semi-cylindrical prism; And

An emission passing through the semi-cylindrical prism, while traveling along a travel path lying on one plane perpendicular to the longitudinal axis of the semi-cylindrical prism and having a semicircumference shape surrounding the semi-circumferential surface of the semi-cylindrical prism Emission light detecting means for detecting light;

The incident path of the excitation light is located outside the plane on which the movement path of the emission light detecting means lies.

In the angle-dependent photoluminescence emission spectrum measuring apparatus of the present invention, the incident path of the excitation light and the moving path of the emission light detecting means lie on different planes. Therefore, even if the excitation light passes through the target sample and the semi-cylindrical prism, it does not reach the emission light detecting means. Therefore, in the angle dependent photoluminescence emission spectrum measured by the apparatus of the present invention, noise due to excitation light does not interfere. Therefore, in the angle dependent photoluminescence emission spectrum measured by the apparatus of the present invention, the photoluminescence emission spectrum in the range of -90 ° ≤φ≤0 ° and in the range of + 90 ° ≤φ≤0 ° The photoluminescence emission spectrum has significantly improved symmetry. In the angle dependent photoluminescence emission spectrum measured by the apparatus of the present invention, the photoluminescence emission spectrum in the range of -90 ° ≤φ≤0 ° and the photoluminescence in the range of + 90 ° ≤φ≤0 ° Since any of the suns emission spectra can be compared with the numerical simulation results, the apparatus of the present invention can provide improved reproducibility. Further, it has been found in the present invention that, more surprisingly, in the apparatus of the present invention, the reproducibility according to the number of measurements is remarkably improved. That is, when the angle dependent photoluminescence emission spectrum is repeatedly measured for the same sample, the angle dependent photoluminescence emission spectrum of almost the same characteristic can be repeatedly reproduced. Therefore, by using the apparatus of the present invention, the reliability of the "molecular dipole orientation ratio measurement procedure" based on "compare with numerical simulation" can be greatly improved.

1 is a plan view schematically showing a conventional angle-dependent photoluminescence emission spectrum measurement apparatus.

FIG. 2 is a typical example of the angle dependent photoluminescence emission spectrum measured with the apparatus of FIG. 1.

3 schematically shows an embodiment of the angle dependent photoluminescence emission spectrum measurement apparatus of the present invention.

4 shows the definition of the incident angle of the excitation light in the present invention.

5 is an angle dependent photoluminescence emission spectrum measured for the subject sample on the first day in Example 1. FIG.

FIG. 6 shows overlapping angle dependent photoluminescence emission spectra measured on Day 1, 2 weeks after, and 3 weeks after the first day for the same subject sample in Example 1. FIG.

FIG. 7 is an angle dependent photoluminescence emission spectrum measured for the subject sample on the first day in Comparative Example 1. FIG.

FIG. 8 shows overlapping angle dependent photoluminescence emission spectra measured on the first day, two weeks after the first day, and three weeks after the first day for the same subject sample in Comparative Example 1. FIG.

3 schematically shows an embodiment of the angle dependent photoluminescence emission spectrum measurement apparatus of the present invention. 3A is a plan view of one embodiment of the device of the present invention, and FIG. 3B is a side view of one embodiment of the device of the present invention.

The embodiment of FIG. 3 comprises a semi-cylindrical prism 200, an excitation light irradiation means 100 and an emission light detection means 300.

The semi-cylindrical prism 200 has a semi-circumferential surface 210 and a flat surface 220. Naturally, the central axis of the semi-cylindrical prism 200 lies on the flat surface 220 of the semi-cylindrical prism 200.

The excitation light irradiation means 100 is arranged to irradiate the excitation light 110 toward the flat surface 220 of the semi-cylindrical prism 200. More specifically, for example, the excitation light 110 may be irradiated toward a point on the central axis of the semi-cylindrical prism 200. In the measurement, the object sample 900 is placed on the point on the central axis of the semi-cylindrical prism 200 to which the excitation light 110 is irradiated, whereby the excitation light 110 is applied to the object sample 900. You will join. The point where the excitation light 110 is incident on the target sample 900 is called the excitation light spot 130. In the case where the target sample 900 contains photoluminescent molecules, the photoluminescent molecules positioned in the excitation light spot 130 are stimulated by the excitation light 110 to emit light emitted to the surroundings (for example, Fluorescence or phosphorescence) 310.

The emission light detecting means 300 detects the emission light 310 passing through the semi-cylindrical prism. The emission light detecting means 300 detects the intensity of the emission light 310 according to the emission angle φ while moving along the movement path 330. The movement path 330 may have a semicircumference shape surrounding the semicircular surface 210 of the semicylindrical prism 200. The center of the semi-circular movement path 330 may be an excitation light spot 130. Accordingly, the semi-circular movement path 330 and the semi-circular surface 210 of the semi-cylindrical prism 200 may form a concentric circle. The movement path 330 of the emission light detecting means 300 lies on one plane 330 perpendicular to the longitudinal axis (ie, the central axis) of the semi-cylindrical prism 200. The plane 330 on which the movement path 330 lies passes through the excitation light spot 130.

The movement path 330 may be formed, for example, by the emission light detecting means 300 moving while the semi-cylindrical prism 200 is stationary. In another example, the movement path 330 is a semi-cylindrical prism 200 in the state in which the emission light detection means 300 is stopped, the longitudinal axis (ie, the central axis) of the semi-cylindrical prism 200 It may be formed by rotating about the center. In another example, the movement path 330 may include a semi-cylindrical prism 200 and a longitudinal axis (ie, a central axis) of the semi-cylindrical prism 200 while the emission light detecting means 300 moves. It may be formed by rotating about.

The angular velocity at which the emission light detecting means 300 moves along the movement path 330 is, for example, about 0.1 ° / sec to about 10 ° / sec, preferably about 1 ° / sec to about 3 ° / sec. Most preferably about 2 ° / sec. If the angular velocity at which the emission light detecting means 300 moves along the movement path 330 is too low, the measurement time is long, and if it is too high, the sample may fall during the measurement.

The distance between the emission light detecting means 300 and the excitation light spot 130, that is, the radius of the movement path 330 of the emission light detecting means 300 is, for example, about 20 cm to about 200 cm, preferably Preferably about 50 cm to about 150 cm, more preferably about 80 cm to about 120 cm, most preferably about 100 cm. If the distance between the emission light detecting means 300 and the excitation light spot 130 is too small, there may be interference of the emission light signal. If the distance between the emission light detecting means 300 and the excitation light spot 130 is too large, the detected emission light signal may not be large enough.

The emission angle φ means the angle between the “vertical line with respect to the flat surface 220” and the emission light path 310 extending through the excitation light spot 130 toward the semicircular surface 210. In FIG. 3A, the emission angle φ in the fourth quadrant has a range of −90 ° to 0 °, and the emission angle φ in the third quadrant has a range of + 90 ° to 0 °. Defined as, but vice versa. The emission light detecting means 300 may move in a range of −90 ° ≦ φ ≦ + 90 °. Alternatively, the emission light detecting means 300 may move in the range of −90 ° ≦ φ ≦ 0 °. Alternatively, the emission light detecting means 300 may move in the range of 0 ° ≦ φ ≦ + 90 °. In the apparatus of the present invention, since the measured photoluminescence emission spectrum has significantly improved symmetry, the emission light detecting means 300 may move only in the range of -90 ° ≦ φ ≦ 0 °, or It may move only in the range of 0 ° ≦ φ ≦ + 90 °.

As shown in FIG. 3B, when the excitation light 110 is incident on the plane 330 at an incident angle of θ _P , the incidence path 110 of the excitation light is a movement path of the emission light detecting means 300. Located outside the plane 330 on which 330 lies (however, the incident path 110 of the excitation light and the plane 330 intersect at the excitation light spot 130). Accordingly, the portion 130 of the excitation light passing through the object sample 900 and the semi-cylindrical prism 200 is also located outside the plane 330, whereby the portion 130 of the excitation light is emitted light detection means 300. ) Will not enter. Thus, the measured photoluminescence emission spectrum does not include noise by the portion 130 of the excitation light.

4 shows the definition of the incident angle of the excitation light in the present invention. The excitation light incident path 110 passes through the excitation light spot 130. The incident angle of the excitation light 110 may be represented by a horizontal component θ _H and a vertical component θ _P.

The horizontal component θ _H of the angle of incidence of the excitation light 110 is the vertical projection line 110 _H of the excitation light incident path 110 with respect to the plane 330 on which the emission light detecting means lies, and the excitation light spot. It is defined as the angle between "vertical line 230 with respect to the flat surface of the semi-cylindrical prism" passing through 130.

The vertical component θ _P of the incident angle of the excitation light 110 is the vertical projection line 110 _H of the excitation light incident path 110 with respect to the plane 330 on which the emission light detecting means lies, and the excitation light incident It is defined as the angle between the paths 110.

The excitation light incidence path 110 is located outside the plane 330 in which the movement path of the emission light detection means lies, except that the incidence light path 110 and the plane 330 of the excitation light intersect at the excitation light spot 130. ), It means that the vertical component θ _P of the incident angle of the excitation light 110 is greater than 0 °. In this case, the vertical component θ _P of the incident angle of the excitation light 110 may be greater than 0 ° and less than 90 °. The horizontal component θ _H of the incident angle of the excitation light 110 may be greater than or equal to 0 ° and less than 90 °.

Preferably, the vertical component θ _P of the incident angle of the excitation light 110 may be about 1 ° to about 89 °. More preferably, the vertical component θ _P of the incident angle of the excitation light 110 may be about 15 ° to about 75 °. Even more preferably, the vertical component θ _P of the incident angle of the excitation light 110 may be about 30 ° to about 45 °. If the vertical component θ _P of the incident angle of the excitation light 110 is too small, the excitation light can be detected directly at the detector. If the vertical component θ _P of the incident angle of the excitation light 110 is too large, the excitation light spot may be excessively large.

Preferably, the horizontal component θ _H of the incident angle of the excitation light 110 may be about 0 ° to about 15 °. More preferably, the horizontal component θ _H of the incident angle of the excitation light 110 may be about 0 ° to about 3 °. Even more preferably, the horizontal component θ _H of the incident angle of the excitation light 110 may be about 0 °. Most preferably, the horizontal component θ _H of the incident angle of the excitation light 110 may be 0 °. If the horizontal component θ _H of the angle of incidence of the excitation light 110 deviates excessively from 0 °, it may be difficult to obtain a symmetric emission spectrum.

The excitation light irradiated from the excitation light irradiation means may have any wavelength that the organic material or the light emitter can absorb. The excitation light irradiated from the excitation light irradiation means may be, for example, ultraviolet rays or visible light. The ultraviolet light may have a wavelength of, for example, about 325 nm to about 405 nm, more preferably about 325 nm to about 350 nm. Visible light may have a wavelength of, for example, about 405 nm to about 520 nm.

The excitation light irradiation means may be, for example, a laser generating device. The excitation light irradiation means may be, for example, an optical waveguide optically connected to the laser generating device. The optical waveguide may be, for example, an optical fiber.

The semi-cylindrical prism can be, for example, fused silica. The radius of the semi-cylindrical prism can be, for example, about 100 mm to about 200 mm. The semicylindrical prism can be, for example, about 30 mm to about 40 mm in length.

The emission light detecting means may be an optical sensor, for example. The light sensor may be, for example, a photomultiplier tube.

The apparatus of the present invention may further comprise a polarizer positioned between the emission light detecting means and the semi-cylindrical prism. The polarizer can be, for example, an s-polarizer or a p-polarizer. The s-polarizer may serve to transmit only the s-wave of emitted light. The p-polarizer may serve to transmit only p-waves of emitted light. The polarizer can be coupled to the emission light detection means such that it can move with the emission light detection means.

<Example>

Preparation of Target Sample

The subject sample consisted of a fused silica substrate layer (thickness 1 mm) / CBP: Ir (ppy) ₂ acac mixed layer (CBP: Ir (ppy) ₂ acac = 92 wt%: 8 wt%, thickness 30 nm). First, a fused silica substrate was prepared. The thickness of the substrate is taken into consideration so that the sample can be placed in the center of the circle of the semi-cylindrical prism. Then, in a vacuum deposition apparatus having a vacuum degree of 1 × 10 ⁻⁷ torr, the weight ratio of CBP and Ir (ppy) ₂ acac was 92 wt%: 8 wt% until the thickness was 30 nm, and CBP: Ir A (ppy) ₂ acac mixed layer was deposited on the fused silica substrate. Then, CBP: Ir (ppy) ₂ acac mixed layer of the organic material in order to prevent the reaction with the oxygen in the air, CBP: the Ir (ppy) ₂ acac mixed layer was sealed with glass pool in a nitrogen atmosphere.

CBP: 4,4'-Bis (N-carbazolyl) -1,1'-biphenyl.

Ir (ppy) ₂ acac: bis (2-phenylpyridine) iridium (III) acetylacetonate.

Example 1 --- Angle dependent photoluminescence emission spectrum measurement (θ _P = 45 °, θ _H = 0 °)

The measuring device used in Example 1 had the structure as shown in FIG. 3, and specific specifications are as follows.

Excitation light wavelength: 325 nm

Excitation light source: He-Cd laser, Melles Griot

-Excitation light irradiation means: optical fiber, diameter 1mm, Thorlabs

Semi-cylindrical prism: fused silica, diameter 100mm, length 30mm,

-Emission light detection means: photomultiplier tube, Acton

-Polarizer mounted on emitting light detection means: Linear polarizer, Thorlabs

-Recorder: SpectraSense, Acton

-Incident angle of excitation light: θ _P = 45 °, θ _H = 0 °

The distance from the sample to the emission light detection means (or the radius of the travel path of the emission light detection means): 900 mm

An excitation light source and a semi-cylindrical prism were installed on the rotating plate. The rotating plate was rotated about the longitudinal axis of the semi-cylindrical prism. The rotational angular velocity of the rotating plate was 2 ° / sec. The emission light detecting means was fixed outside the rotating plate. The sample was attached to the center of the flat surface of the semi-cylindrical prism. At this time, the fused silica substrate layer and the flat surface of the semi-cylindrical prism were in contact. The emission light intensity signal output from the emission light detection means was transmitted to the recording apparatus. The recording device outputs angle dependent photoluminescence emission spectra.

5 is an angle dependent photoluminescence emission spectrum measured for the subject sample on the first day in Example 1. FIG. FIG. 5A is a spectrum spread over the entire emission angle φ range of −90 ° to + 90 °. FIG. 5 (b) shows the spectrum of the emission angle (φ) in the range of −90 ° to 0 ° and the spectrum of the emission angle (φ) in the range of + 90 ° to 0 °. As shown in (b) of FIG. 5, the angle dependent photoluminescence emission spectrum measured in Example 1 showed very good symmetry and did not include any noise due to excitation light. FIG. 6 shows overlapping angle dependent photoluminescence emission spectra measured on Day 1, 2 weeks after, and 3 weeks after the first day for the same subject sample in Example 1. FIG. As shown in FIG. 6, the spectra measured on different days for the same sample were almost perfectly consistent. 5 and 6, it can be seen that the apparatus of the present invention can exhibit very improved reproducibility.

Comparative Example 1 --- Angle dependent photoluminescence emission spectrum measurement (θ _P = 0 °, θ _H = 45 °)

In Comparative Example 1, the same sample and measurement device as in Example 1 were used except that the excitation light incident angle was set to θ _P = 0 ° and θ _H = 45 °.

FIG. 7 is an angle dependent photoluminescence emission spectrum measured for the subject sample on the first day in Comparative Example 1. FIG. FIG. 7A is a spectrum spread over the entire emission angle φ range of −90 ° to + 90 °. 7 (b) shows the spectrum of the emission angle (φ) in the range of -90 ° to 0 ° and the spectrum of the emission angle (φ) in the range of +90 ° to 0 ° overlap. As shown in FIG. 7B, the symmetry of the angle dependent photoluminescence emission spectrum measured in Comparative Example 1 was very poor, and included noise caused by excitation light. FIG. 8 shows overlapping angle dependent photoluminescence emission spectra measured on the first day, two weeks after the first day, and three weeks after the first day for the same subject sample in Comparative Example 1. FIG. As shown in FIG. 8, the spectra measured on different days for the same sample were inconsistent. From the results in FIGS. 7 and 8, it can be seen that the reproducibility of the apparatus of the comparative example is very poor.

According to the present invention, in OLEDs based on small molecular emitters doped in a matrix material, the molecular dipole orientation of the small molecular emitters used can be measured accurately and reproducibly.

Claims (10)

1. A semi-cylindrical prism having a semi-circumferential surface and a flat surface;

   Excitation light irradiation means for irradiating excitation light toward the flat surface of the semi-cylindrical prism; And

   An emission passing through the semi-cylindrical prism, while traveling along a travel path lying on one plane perpendicular to the longitudinal axis of the semi-cylindrical prism and having a semicircumference shape surrounding the semi-circumferential surface of the semi-cylindrical prism Emission light detecting means for detecting light;

   The incident path of the excitation light is located outside the plane on which the movement path of the emission light detecting means lies,

   Angle dependent photoluminescence emission spectrum measurement device.
2. The angle dependent photoluminescence emission spectrum measuring apparatus according to claim 1, wherein the movement path of the emission light detecting means is formed by moving the emission light detecting means while the semi-cylindrical prism is stationary. .
3. The semi-cylindrical prism is formed by rotating about the longitudinal axis of the semi-cylindrical prism, according to claim 1, wherein the semi-cylindrical prism is formed while the movement path of the emission light detecting means is stationary. An angle dependent photoluminescence emission spectrum measuring apparatus.
4. The semi-cylindrical prism is formed by rotating the semi-cylindrical prism about the longitudinal axis of the semi-cylindrical prism, as the movement path of the emission light detecting means moves. Angle dependent photoluminescence emission spectrum measurement apparatus.
5. The angle dependent photoluminescence emission spectrum measuring apparatus according to claim 1, wherein the angular velocity at which the emission light detecting means moves along the movement path is 0.1 ° / sec to 10 ° / sec.
6. 2. An angle dependent photoluminescence emission spectrum measurement apparatus according to claim 1, wherein a radius of the movement path of the emission light detecting means is 20 cm to 200 cm.
7. The angle dependent photoluminescence emission spectrum measuring apparatus according to claim 1, wherein the vertical component θ _P of the incident angle of the excitation light is 15 ° to 75 °.
8. The angle dependent photoluminescence emission spectrum measuring apparatus according to claim 1, wherein the horizontal component (θ _H ) of the incident angle of the excitation light is 0 °.
9. The angle dependent photoluminescence emission spectrum measuring apparatus according to claim 1, wherein the excitation light is ultraviolet or visible light.
10. 2. An angle dependent photoluminescence emission spectrum measuring apparatus according to claim 1, further comprising a polarizer positioned between said emission light detecting means and said semi-cylindrical prism.

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