WO2014209307A1 - Bulk acoustic wave resonator tuner circuits - Google Patents
Bulk acoustic wave resonator tuner circuits Download PDFInfo
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- WO2014209307A1 WO2014209307A1 PCT/US2013/047993 US2013047993W WO2014209307A1 WO 2014209307 A1 WO2014209307 A1 WO 2014209307A1 US 2013047993 W US2013047993 W US 2013047993W WO 2014209307 A1 WO2014209307 A1 WO 2014209307A1
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- port
- coupled
- transmitter
- impedance
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Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/0004—Impedance-matching networks
- H03H9/0014—Impedance-matching networks using bulk acoustic wave devices
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
- H04B1/38—Transceivers, i.e. devices in which transmitter and receiver form a structural unit and in which at least one part is used for functions of transmitting and receiving
- H04B1/40—Circuits
- H04B1/44—Transmit/receive switching
- H04B1/48—Transmit/receive switching in circuits for connecting transmitter and receiver to a common transmission path, e.g. by energy of transmitter
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01Q—ANTENNAS, i.e. RADIO AERIALS
- H01Q5/00—Arrangements for simultaneous operation of antennas on two or more different wavebands, e.g. dual-band or multi-band arrangements
- H01Q5/30—Arrangements for providing operation on different wavebands
- H01Q5/307—Individual or coupled radiating elements, each element being fed in an unspecified way
- H01Q5/314—Individual or coupled radiating elements, each element being fed in an unspecified way using frequency dependent circuits or components, e.g. trap circuits or capacitors
- H01Q5/335—Individual or coupled radiating elements, each element being fed in an unspecified way using frequency dependent circuits or components, e.g. trap circuits or capacitors at the feed, e.g. for impedance matching
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
- H03H7/38—Impedance-matching networks
- H03H7/40—Automatic matching of load impedance to source impedance
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/05—Holders or supports
- H03H9/0538—Constructional combinations of supports or holders with electromechanical or other electronic elements
- H03H9/0566—Constructional combinations of supports or holders with electromechanical or other electronic elements for duplexers
- H03H9/0571—Constructional combinations of supports or holders with electromechanical or other electronic elements for duplexers including bulk acoustic wave [BAW] devices
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
- H04B1/02—Transmitters
- H04B1/04—Circuits
- H04B1/0458—Arrangements for matching and coupling between power amplifier and antenna or between amplifying stages
Definitions
- Embodiments of the present disclosure generally relate to the field of integrated circuits, and more particularly, to techniques and configurations
- RF radio frequency
- tuner circuits are often included between an antenna and other front-end circuitry of the mobile communication device to match the impedance of the antenna to the impedance of the front-end circuitry.
- Such tuners occupy significant space on a printed circuit board within the mobile communication device, and may cause excess power dissipation due to insertion loss and low quality factors in some frequency bands.
- Some mobile communication devices also include DC-DC converters between a power amplifier and an antenna that are used to adjust the voltage supplied to the power amplifier in order to adjust the power of the RF signal generated by the antenna (e.g., increasing the power when the mobile
- DC-DC converters may be costly, and may introduce a high level of noise that may affect the performance of the mobile communication device.
- FIG. 1 schematically illustrates a radio frequency (RF) communication circuit having a tuner circuit including one or more bulk acoustic wave resonators (BAWRs), in accordance with some embodiments.
- FIG. 2 is a simplified cross-sectional side view of a solidly mounted BAWR, in accordance with some embodiments.
- FIG. 3 is a simplified cross-sectional side view of a membrane BAWR, in accordance with some embodiments.
- FIG. 4 illustrates a BAWR configuration that may be included in a tuner circuit, in accordance with some embodiments.
- FIG. 5 illustrates a BAWR configuration that may be included in a tuner circuit, in accordance with some embodiments.
- FIG. 6 illustrates an example of a tuner circuit having BAWRs and variable capacitors, in accordance with some embodiments.
- FIG. 7 illustrates an example of a tuner circuit having a BAWR and capacitors with switches, in accordance with some embodiments.
- FIG. 8 schematically illustrates an embodiment of the RF
- FIG. 9 schematically illustrates an embodiment of the RF
- FIG. 10 is a flow diagram of a method of RF communication, in accordance with some embodiments.
- FIG. 1 1 is a simplified cross-sectional side view of a first integrated circuit (IC) package embodiment of the RF communication circuit of FIG. 1 , in accordance with some embodiments.
- IC integrated circuit
- FIG. 12 is a simplified top view of the IC package of FIG. 1 1 , in accordance with some embodiments.
- FIG. 13 is a simplified cross-sectional side view of a second IC package embodiment of the RF communication circuit of FIG. 1 , in accordance with some embodiments.
- FIG. 14 is a simplified cross-sectional side view of a third IC package embodiment of the RF communication circuit of FIG. 1 , in accordance with some embodiments.
- FIG. 15 is a simplified cross-sectional side view of a fourth IC package embodiment of the RF communication circuit of FIG. 1 , in accordance with some embodiments.
- FIG. 16 is a simplified cross-sectional side view of a fifth IC package embodiment of the RF communication circuit of FIG. 1 , in accordance with some embodiments.
- FIG. 17 is a simplified cross-sectional side view of a sixth IC package embodiment of the RF communication circuit of FIG. 1 , in accordance with some embodiments.
- FIG. 18 schematically illustrates a mobile communication device, in accordance with some embodiments.
- Embodiments of the present disclosure describe techniques and configurations for bulk acoustic wave resonator (BAWR) tuner circuits and their use for impedance matching in integrated circuit (IC) packages and mobile
- phrase “A and/or B” means (A), (B), or (A and B).
- phrase “A, B, and/or C” means (A), (B), (C), (A and B), (A and C), (B and C), or (A, B and C).
- Coupled may mean one or more of the following. “Coupled” may mean that two or more elements are in direct physical or electrical contact. However, “coupled” may also mean that two or more elements indirectly contact each other, but yet still cooperate or interact with each other, and may mean that one or more other elements are coupled or connected between the elements that are said to be coupled with each other.
- FIG. 1 schematically illustrates an RF communication circuit 100, which may include a tuner circuit 106 having one or more BAWRs 1 10, a transmitter circuit 102, an antenna 1 14, and a control circuit 1 18, coupled as shown, in accordance with some embodiments.
- the tuner circuit 106 may include an antenna port 1 12 configured to be coupled to the antenna 1 14, a signal port 108 configured to be coupled to an output port 104 of the transmitter circuit 102, and a control port 1 16 configured to be coupled to a port 120 of the control circuit 1 18.
- the impedance of tuner circuit 106 may be adjusted by adjusting a BAWR or other component, described more fully below.
- the RF communication circuit 100 may be arranged in a system-in-package (SIP) structure.
- the term "port" may represent one or more electrical, optical, or other interfaces for a number of signaling pathways.
- the control port 1 16 of the tuner circuit 106 may be an interface for multiple signaling pathways between different combinations of components of the control circuit 1 18 and components of the tuner circuit 106.
- the output port 104 of the transmitter circuit 102 may be an interface for one or more active lines and one or more ground lines. Additional non-limiting examples of interfaces between the control circuit 1 18 and the tuner circuit 106 are discussed below.
- any measurement made from a point electrically or otherwise equivalent to the port are considered to be measurements made “at” or “from” the port.
- an impedance measurement of the tuner circuit 106 made "from” terminals of the output port 104 may include an impedance measurement made by accessing electrically equivalent terminals of the signal port 108.
- the control circuit 1 18 may be configured to adjust an impedance of the tuner circuit 106.
- the impedance of the tuner circuit 106 may be an impedance as measured from the output port 104 of the transmitter circuit 102.
- the control circuit 1 18 may be configured to adjust an impedance of the tuner circuit 106 based at least in part on an impedance of the antenna 1 14.
- the control circuit 1 18 may measure the impedance of the antenna 1 14 (e.g., as measured from the antenna port 1 12 of the tuner circuit 106), and/or the control circuit 1 18 may adjust the impedance of the tuner circuit 106 based on an impedance measurement that includes both the impedance of the tuner circuit 106 and the impedance of the antenna 1 14 (e.g., as measured from the output port 104 of the transmitter circuit 102).
- control circuit 1 18 may be configured to adjust an impedance of the tuner circuit 106 by adjusting a BAWR of the
- a BAWR may be generally configured to convert an electrical signal into an acoustic wave at an input electrode, and convert the acoustic wave to an electrical signal at an output electrode.
- a BAWR may act as a frequency-dependent impedance element, exhibiting lower impedance when driven by signals at frequencies near or equal to a resonant frequency of the BAWR and exhibiting higher impedance when driven by signals at other frequencies.
- FIGS. 2 and 3 are simplified cross-sectional side views of two different types of BAWRs that may be included among the BAWRs 1 10 of the RF
- FIG. 2 depicts a solidly mounted BAWR 200, which may include a first electrode 202 and a second electrode 204 separated by a piezoelectric material 206 (e.g., aluminum nitride). Electrodes (such as the electrodes 202 and 204) may be formed from a conductive material, such as aluminum,
- the first electrode 202, second electrode 204, and piezoelectric material 206 may act as a resonator, propagating an acoustic wave through the piezoelectric material and oscillating strongly at a particular resonant frequency.
- the first electrode 202, second electrode 204, and piezoelectric material 206 may be coupled to a reflector stack 208, which may consist of alternating layers of material having a higher acoustic impedance (e.g., the layer 210) and material having a lower acoustic impedance (e.g., the layer 212).
- each of the layers 210 and 212 may have a thickness equal to a quarter of the wavelength associated with the resonant frequency.
- the reflector stack 208 may be mounted to a substrate 214.
- the reflector stack 208 may act as an acoustic mirror, reflecting acoustic waves back to the piezoelectric material 206 and providing acoustic isolation between the piezoelectric material 206 and the substrate 214 (limiting the coupling between the acoustic waves and the substrate 214). This isolation may improve the quality factor (Q-factor) of the BAWR 200, which may correspond to a superior ability to store energy while limiting losses.
- Q-factor quality factor
- FIG. 3 depicts a membrane BAWR 300, which may include a first electrode 302 and a second electrode 304 separated by a piezoelectric material 306.
- a substrate 314 formed from, e.g., quartz, glass, alumina, sapphire or silicon, for example
- the air gap 308 may provide acoustic isolation between the piezoelectric
- the first electrode 302, second electrode 304, and piezoelectric material 306 may act as a resonator and oscillate strongly at a particular resonant frequency.
- BAWRs 1 10 of the tuner circuit 106 may include one or more solidly mounted BAWRs, one or more membrane BAWRs, other types of BAWRs, or a combination of multiple types of BAWRs.
- the selection of which types of BAWRs to include in the tuner circuit 106 may be based on, for example, performance requirements and manufacturing considerations.
- some embodiments of solidly mounted BAWRs (such as the BAWR 200) may be more easily integrated into an IC package than some embodiments of membrane BAWRs.
- Some BAWRs may be purchased as prepackaged components having footprints of approximately 1 square millimeter or less.
- a BAWR may include more than one layer of piezoelectric material, with layers separated by an electrode, and thus may include more than one "acoustic layer" through which an acoustic wave may propagate.
- Different electrode pairs may be differently driven (e.g., by AC or DC signals).
- Other acoustic resonators may be used instead of one or more of the BAWRs 1 10; for example, surface acoustic wave (SAW) resonators may be used.
- SAW surface acoustic wave
- FIGS. 4 and 5 illustrate different example configurations of the
- BAWRs 1 10 that may be included in the tuner circuit 106, in accordance with some embodiments.
- four BAWRs 402, 404, 406 and 408 are depicted as configured as a lattice network 400 between two input terminals 108a and 108b and two output terminals 1 12a and 1 12b.
- the input is depicted as a lattice network 400 between two input terminals 108a and 108b and two output terminals 1 12a and 1 12b.
- the input may be included in the tuner circuit 106, in accordance with some embodiments.
- four BAWRs 402, 404, 406 and 408 are depicted as configured as a lattice network 400 between two input terminals 108a and 108b and two output terminals 1 12a and 1 12b.
- the input is depicted as a lattice network 400 between two input terminals 108a and 108b and two output terminals 1 12a and 1 12b.
- terminals 108a and 108b may be coupled to the signal port 108 of the tuner circuit 106.
- the output terminals 1 12a and 1 12b may be coupled to the antenna port 1 12 of the tuner circuit 106.
- FIG. 5 four
- BAWRs 502, 504, 506 and 508 are depicted as configured as a ladder network 500 between two input terminals 108a and 108b and two output terminals 1 12a and 1 12b.
- the input terminals 108a and 108b may be coupled to the signal port 108 of the tuner circuit 106 and the output terminals 1 12a and 1 12b may be coupled to the antenna port 1 12 of the tuner circuit 106.
- Some embodiments of the tuner circuit 106 may include combinations of the lattice and ladder networks illustrated in FIGS. 4 and 5 (e.g., arranged in series).
- control circuit 1 18 of FIG. 1 may be configured to adjust an impedance of the tuner circuit 106 by adjusting a BAWR of the
- the control circuit 1 18 may be configured to adjust the operation of a circuit including the BAWRs 1 10 in any of a number of ways.
- the control circuit 1 18 may be configured to provide a DC voltage that may be applied between two electrodes of at least one BAWR included in the tuner circuit 106.
- the control circuit 1 18 may include a DC voltage source having a first terminal coupled to the first electrode 202 of the solidly mounted BAWR 200 (FIG. 2), and a second terminal coupled to the second electrode 204 of the solidly mounted BAWR 200. Applying a DC voltage between two electrodes of a BAWR (e.g., BAWR 200 of FIG. 2 or BAWR 300 of FIG. 3) may cause the resonant frequency of the BAWR to shift, thereby changing the impedance of a circuit including the BAWR.
- a BAWR e.g., BAWR 200 of FIG. 2 or BAWR 300 of FIG. 3
- the piezoelectric material 206 of the BAWR 200 may include a ferroelectric material (such as (Ba x Sri -x ) ⁇ 3) whose piezoelectric coefficient increases as a DC bias is applied.
- a ferroelectric material such as (Ba x Sri -x ) ⁇ 3
- a BAWR includes multiple acoustic layers
- different DC voltages may be applied to different layers.
- DC potentials may be varied between different pairs of electrodes to achieve different resonance behaviors.
- a BAWR having an electrode-ferroelectric-electrode-ferroelectric-electrode structure may allow for two achievable resonance modes that the control circuit 1 18 may switch between.
- control circuit 1 18 may provide the same or different DC voltage configurations to different ones of multiple BAWRs included in the tuner circuit 106 (in addition to varying the DC voltages across one or more piezoelectric layer of a single BAWR). In some embodiments, the control circuit 1 18 may be configured to adjust the DC voltage(s) applied to one or more of the
- one or more processors or other logic devices may determine the desired impedance for the tuner circuit based in part on a desired frequency or band of frequencies of operation for the RF communication circuit 100 (e.g., during transmission or reception of RF signals) and the known characteristics of the components of the RF communication circuit 100 (e.g., the impedance of the transmitter circuit 102 at various frequencies). These one or more processors or logic devices may be included in the control circuit 1 18 or may be separate from the control circuit 1 18.
- control circuit 1 18 may be configured to adjust a BAWR of the BAWRs 1 10 or another component of the tuner circuit 106 by providing one or more control signals to various components in the tuner circuit 106.
- control circuit 1 18 may include an adjustable DC voltage or other signal source for applying an adjustable DC voltage or other signal to one or more of variable capacitors arranged in series or in parallel with at least one of the
- BAWRs 1 10 Adding a capacitor in series with a BAWR may increase the capacitance of the total circuit, while adding a capacitor in parallel with a BAWR may decrease the capacitance of the total circuit. Thus, by including variable capacitors in series and/or parallel combinations with arrangements of the BAWRs 1 10, a range of resulting capacitive behavior may be achieved.
- the control signals applied to the variable capacitors may cause the variable capacitors to vary their capacitances, thereby adjusting the impedance of the tuner circuit 106 as would be measured from the output port 104 of the transmitter circuit 102.
- FIG. 6 illustrates an example of a tuner circuit 106 having
- the variable capacitors may be controlled via a DC or other control signal from the control circuit 1 18 via the control port 1 16 of the tuner circuit 106.
- the input terminals 108a and 108b may be coupled to the signal port 108 of the tuner circuit 106 and the output terminals 1 12a and 1 12b may be coupled to the antenna port 1 12 of the tuner circuit 106.
- a variable capacitor (e.g., one or more of the variable capacitors 602, 604, 606 and 608 of FIG. 6) may be a complementary metal oxide semiconductor (CMOS) varactors whose capacitance is adjusted by a DC bias.
- CMOS complementary metal oxide semiconductor
- a varactor stack may be packaged on top of or in proximity to the BAWRs 1 10, which may minimize the length of connective wiring between the varactors and the BAWRs 1 10 and thereby reduce losses.
- a variable capacitor (e.g., one or more of the variable capacitors 602, 604, 606 and 608 of FIG. 6) may be a CMOS) varactors whose capacitance is adjusted by a DC bias.
- a varactor stack may be packaged on top of or in proximity to the BAWRs 1 10, which may minimize the length of connective wiring between the varactors and the BAWRs 1 10 and thereby reduce losses.
- a variable capacitor (e.g., one or more of the variable capacitors 602, 604, 606 and
- MEMS capacitor microelectromechanical systems (MEMS) capacitor whose capacitance may be adjusted by signals generated by one or more processing devices or other logic included in the control circuit 1 18.
- MEMS capacitor may be included in a prepackaged, commercially available MEMS capacitive array module along with an RF switch, and may be tuned using digital signals supplied by the control circuit 1 18 to the module.
- a variable capacitor or other component may be packaged with components of the control circuit 1 18, packaged with components of the tuner circuit 106, distributed between the different packages including the control circuit 1 18 and the tuner circuit 106, or included in a single package that includes both the control circuit 1 18 and the tuner circuit 106, for example.
- FIG. 7 illustrates an example of a tuner circuit 106 having a BAWR 702 with two piezoelectric layers 704 and 706 whose DC bias may be adjusted by DC voltage sources 708 and 710, respectively.
- the tuner circuit 106 may also include a number of switch-capacitor branches 712 (e.g., one or more switch-capacitor branches 712).
- Each switch-capacitor branch 712 may include an RF switch 714 and a capacitor 716.
- the RF switches may be controllable by the control circuit 1 18 using DC voltages in order to modify the effective capacitance of the tuner circuit 106, and the resonant frequency of the BAWR 702 may be modified by adjusting the values provided by the DC voltage sources 708 and 710 (which may be part of or controlled by the control circuit 1 18).
- the capacitor 716 may be a metal-insulator- metal (M IM, also called a metal-oxide-metal) capacitor.
- MIM capacitor may include a thin dielectric layer between bottom and top metal plates, and may have the bottom and top metal plates connected to other circuitry by vias running through insulating material (e.g., as formed by a CMOS process). Multiple metal layers and lateral flux may be used to realize high capacitance values, with some MIM capacitors having a Q-factor as high as 80.
- MIM or other capacitors are combined with a tunable BAWR configuration as shown in FIG. 7, a good tuning range and low overall insertion loss may be achieved for the tuner circuit 106.
- the BAWR 702 of FIG. 7 may be replaced with a different acoustic resonator, such as a SAW resonator.
- Various embodiments of the BAWR-based tuner circuits disclosed herein may provide improved performance over conventional RF tuner circuits.
- a BAWR-based tuner circuit may have a higher Q-factor than conventional inductor-capacitor resonator-based tuner circuits.
- the insertion loss of a BAWR-based tuner circuit which represents the ratio of power input to and output from a component, may be lower than achievable with conventional tuners.
- the control circuit 1 18 to adjust the BAWR-based tuner circuit 106, deviations in performance between different BAWRs (and between a single BAWR and its nominal specifications) can be compensated for during operation.
- the use of BAWRs in RF communication devices has traditionally been limited to filtering applications; the techniques and configurations disclosed herein utilize BAWRs in entirely different contexts and for different purposes, capitalizing on the benefits achievable by advantageous arrangements of BAWRs with other circuitry.
- the RF communication circuit 100 of FIG. 1 may be utilized in mobile communication devices in various ways.
- the RF communication circuit 100 may be included in a mobile communication device in order to perform impedance matching between the transmitter circuit 102 and a combination of the tuner circuit 106 and the
- Some such embodiments may also be configured to perform impedance matching between a receiver and a combination of the tuner circuit 106 and the antenna 1 14. Configuring the RF communication circuit 100 for matching the impedance of a transmitter and/or a receiver over multiple frequency bands of operation (e.g., in the range of 950 MHz - 270 GHz) may allow a mobile
- the transmitter circuit 102 and the antenna 1 14 may be "matched" when the tuner circuit 106 provides a 1 1 % or better improvement in the power transfer efficiency of the RF communication circuit 100 (e.g., 1 dB or greater improvement in the total radiated power from the antenna 1 14). In some embodiments, greater improvements in power transfer efficiency may be achieved when components are "matched.” The amount of improvement achievable may depend on the impedance discrepancy between the antenna 1 14 and the transmitter circuit 102 without the use of the tuner circuit 106.
- the tuner circuit 106 may allow the RF communication circuit 100 to achieve 2 dB or more of improvement; when the VSWR between the antenna 1 14 and the transmitter circuit 102 is smaller (e.g., 3 or less), the
- percentage improvement may be smaller (e.g., less than 1 dB).
- FIG. 8 schematically illustrates an embodiment 800 of the RF communication circuit 100 of FIG. 1 , the RF communication circuit 800 configured for impedance matching.
- the RF communication circuit 800 may include a tuner circuit 106 having one or more BAWRs 1 10, a transmitter circuit 802, an antenna 1 14, and a control circuit 1 18.
- the tuner circuit 106 may include an antenna port 1 12 coupled to the antenna 1 14, a signal port 108 coupled to an output port 104 of the transmitter circuit 802, and a control port 1 16 coupled to a port 120 of the control circuit 1 18.
- the RF communication circuit 800 may include a tuner circuit 106 having one or more BAWRs 1 10, a transmitter circuit 802, an antenna 1 14, and a control circuit 1 18.
- the tuner circuit 106 may include an antenna port 1 12 coupled to the antenna 1 14, a signal port 108 coupled to an output port 104 of the transmitter circuit 802, and a control port 1 16 coupled to a port 120 of the control circuit 1 18.
- communication circuit 800 may further include a receiver 822.
- a receiver 822 may further include a receiver 822.
- the RF communication circuit 800 may be arranged in an SIP structure.
- the transmitter circuit 802 may include a diplexer 814 having a transmitter port 816 coupled to a transmitter 824 (as shown, via a power amplifier (PA) 804), a receiver port 818 coupled to the receiver 822, and a diplexer output port 820 coupled to the output port 104 of the transmitter circuit 802.
- the diplexer 814 may be configured to controllably couple the diplexer output port 820 to one of the transmitter port 816 and the receiver port 818 in response to a control signal (not shown).
- control circuit 1 18 may be configured to adjust the impedance of the tuner circuit 106 so that a combined impedance of the tuner circuit 106 and the antenna 1 14, as measured at the output port 104 of the transmitter circuit 802, is matched to an impedance of the transmitter 824 when the diplexer output port 820 is coupled to the transmitter port 816.
- control circuit 1 18 may be configured to adjust the impedance of the tuner circuit 106 so that a combined impedance of the tuner circuit 106 and the antenna 1 14, as measured at the output port 104 of the transmitter circuit 802, is matched to an impedance of the receiver 822 when the diplexer output port 820 is coupled to the receiver port 818.
- the control circuit 1 18 may be configured to adjust the impedance of the tuner circuit 106 in any suitable manner to perform impedance matching, including using any of the impedance adjustment techniques discussed above.
- the control circuit 1 18 may be configured to provide a DC voltage to be applied between two electrodes of at least one BAWR of the BAWRs 1 10, included in the tuner circuit 106, to adjust the impedance of the tuner circuit 106.
- the control circuit may include an adjustable DC voltage source for applying an adjustable DC voltage to adjust the capacitance of a varactor arranged in series or in parallel with at least one of the one or more BAWRs 1 10.
- the control circuit may include a signal source for applying electrical signals to adjust the capacitance of a MEMS capacitor arranged in series or in parallel with at least one of the one or more BAWRs 1 10.
- the transmitter circuit 802 may include the PA 804, which may amplify the signal from the transmitter 824 for transmission to the antenna 1 14.
- the PA 804 may include a PA input port 806 coupled to the transmitter 824, a PA output port 812 coupled to the transmitter port 816 of the diplexer 814, and a supply voltage port 808 coupled to a supply voltage source 810.
- the PA 804 may be packaged as a single IC package.
- Various embodiments of the BAWR-based RF communication circuit 100 may provide improved performance over conventional impedance matching circuitry.
- the RF communication circuit 800 may achieve better impedance matching than
- some embodiments of the RF communication circuit 800 may extend the life of batteries or other energy sources powering a mobile communication device by limiting power losses, even at high transmit power levels.
- the impedance matching embodiments of the RF communication circuit 100 may reduce costs by eliminating the need for a discrete tuner component, and may save area on a printed circuit board included in a mobile communication device or other computing device (thereby potentially reducing the size of the device and achieving other benefits of smaller footprint devices).
- the RF communication circuit 100 may be included in a mobile communication device in order to perform load line switching for a PA.
- a PA typically receives a supply voltage and provides current to a load at a specified output power level. For a given supply voltage and load, most PAs have a peak output power, and operate most efficiently when the specified output power level is equal or close to the peak output power. When a specified output power level is desired, the PA's peak output power may be adjusted by adjusting the supply voltage and/or the load.
- the RF communication circuit 100 is configured for load-line switching, the circuit may adjust the load seen by a PA in accordance with a specified output power level to improve efficiency. Load line switching may be particularly useful in mobile communication device applications in which a wireless standard (e.g., Universal Terrestrial Radio Access Network (UTRAN), Code Division Multiple Access (CDMA, e.g., CDMA-2000) or Global System for Mobile
- GSM Global System for Mobile communications
- a power control scheme that ensures that a mobile communication device transmits only with the amount of power needed to achieve satisfactory communication performance with a base station (in order to reduce the PA current and conserve battery life to extend communication time).
- Load line switching may also compensate for differences between the range of optimal output impedances for a PA (e.g., 2-10 ohms) and the impedance of a typical antenna (e.g., 50 ohms).
- FIG. 9 schematically illustrates an embodiment 900 of the RF communication circuit 100 of FIG. 1 configured for load line switching.
- the RF communication circuit 900 may include a tuner circuit 106 having one or more BAWRs 1 10, a transmitter circuit 902, an antenna 1 14, and a control circuit 1 18.
- the tuner circuit 106 may include an antenna port 1 12 coupled to the antenna 1 14, a signal port 108 coupled to an output port 104 of the transmitter circuit 902, and a control port 1 16 coupled to a port 120 of the control circuit 1 18.
- the RF communication circuit 900 may be arranged in an SIP structure.
- the RF communication circuit 900 may further include a receiver 922 having an antenna port 904 coupled to a second antenna 914.
- the receiver 922 may include a low-noise amplifier and other components.
- a dual-antenna architecture as shown in FIG. 9, may eliminate the need for a diplexer or duplexing filter to switch between and/or isolate transmission and reception. Additionally, a dual-antenna architecture may allow improved matching of components (e.g., the transmitter circuit 102 to the tuner circuit 106 and antenna 1 14, and the receiver 922 to the antenna 914).
- the transmitter circuit 902 may include a PA 804.
- the PA 804 may include a supply voltage port 808 for receiving a supply voltage from a supply voltage source 810, and a PA output port 812 coupled to the output port 104 of transmitter circuit 902.
- the PA 804 may be configured to output (via the PA output port 812) a current at an output power level that is specified by one or more processors or other logic devices (not shown).
- the PA 804 may have a peak output power, which may be based at least in part on an impedance of the tuner circuit 106 and the antenna 1 14, as measured at the output port 104 of the transmitter circuit 902. In some
- control circuit 1 18 may be configured to adjust the impedance of the tuner circuit 106 to match the peak output power of the PA 804 to the output power level.
- control circuit 1 18 may be configured (e.g., with one or more processors or other logic devices) to adjust the impedance of the tuner circuit 106 to match the peak output power of the PA 804 to the output power level based at least in part on a distance between the mobile communication device and a base station in communication with the mobile communication device.
- the supply voltage provided to the PA 804 by the supply voltage source 810 may be fixed; in some embodiments, (e.g., when the IC package is included in a mobile communication device), the supply voltage provided to the PA 804 may be adjusted by a controller (not shown) based at least in part on a distance between the mobile communication device and a base station in
- the control circuit 1 18 may be configured to adjust the impedance of the tuner circuit 106 in any suitable manner to perform load line switching, including using any of the impedance adjustment techniques discussed above.
- the control circuit 1 18 may be configured to provide a DC voltage to be applied between two electrodes of at least one BAWR of the
- control circuit may include an adjustable DC voltage source for applying an adjustable DC voltage to adjust the capacitance of a varactor arranged in series or in parallel with at least one of the one or more
- control circuit may include a signal source for applying electrical signals to adjust the capacitance of a MEMS capacitor arranged in series or in parallel with at least one of the one or more BAWRs 1 10.
- Any suitable switching network and configuration of BAWRs 1 10 and other components may be used to adjust the impedance of the tuner circuit 106 (e.g., as a function of the output power level) and perform load line switching.
- Various embodiments of the BAWR-based RF communication circuit 100 may provide improved performance over DC-DC converter technology for adjusting the peak output power of a PA and over conventional load line switching circuitry.
- DC-DC converters may be expensive and highly noisy, degrading RF communication performance.
- Existing load line switching circuitry e.g., load line switching networks
- the BAWR-based RF communication circuit 800 may provide load line switching with reduced losses, and may be integrated into an IC package, thereby saving area on a printed circuit board in comparison to conventional approaches (which may require, e.g., off-chip components).
- FIG. 10 is a flow diagram 1000 of a method of RF communication, in accordance with some embodiments.
- the method of the flow diagram 1000 may comport with actions described in connection with FIGS. 1 -8, in some embodiments.
- Various operations are described as multiple discrete operations in turn for illustrative purposes; the order of description should not be construed as to imply that these operations are necessarily order-dependent.
- a tuner circuit may be provided.
- the tuner circuit may have one or more BAWRs, an antenna port coupled to an antenna, a signal port coupled to the output port of the transmitter circuit, and a control port.
- the tuner circuit of 1002 may be configured as discussed with reference to any of FIGS. 1 -6.
- the transmitter circuit of 1002 may be configured as discussed with reference to any of FIGS. 1 and 8-8.
- a control circuit may be provided.
- the control circuit may be coupled to the control port, and may be configured to adjust an impedance of the tuner circuit.
- the control circuit of 1004 may be configured as discussed above with reference to any of FIGS. 1 -8.
- the impedance of the tuner circuit may be adjusted, using the control circuit, based at least in part on an impedance of the antenna.
- the impedance adjustment of 1006 may be performed using any of the techniques described above with reference to FIGS. 1 -8.
- the transmitter circuit may include a PA having a supply voltage port for receiving a supply voltage and a PA output port coupled to the output port of the transmitter circuit (e.g., as shown in FIG. 9).
- the PA output port may be configured for outputting a current at an output power level, and the PA has a peak output power based at least in part on an impedance of the tuner circuit and the antenna, as measured at the output port.
- adjusting the impedance of the tuner circuit at 1006, using the control circuit 1 18, may include adjusting an impedance of the tuner circuit to match the peak output power of the PA to the output power level.
- the transmitter circuit may include a diplexer having a transmitter port coupled to a transmitter, a receiver port coupled to a receiver, and a diplexer output port coupled to the output port of the transmitter circuit (e.g., as shown in FIG. 8).
- the diplexer output port may be controllably coupled to one of the transmitter port and the receiver port.
- adjusting the impedance of the tuner circuit at 1002, using the control circuit may include adjusting the impedance of the tuner circuit so that a combined impedance of the tuner circuit and the antenna, as measured at the output port of the transmitter circuit, is matched to an impedance of the transmitter when the diplexer output port is coupled to the transmitter port.
- FIGS. 1 1 -15 provide views of various IC package embodiments of the RF communication circuit 100 of FIG. 1 .
- the embodiments shown in FIGS. 1 1 -15 are merely illustrative, and any suitable combination of elements of these embodiments may be used.
- the RF communication circuit 100 may be packaged using a fan-out wafer level structure.
- manufacturing such a package may include constructing an artificial wafer out of placed dies. These dies may be tested prior to generation of the artificial wafer, and may include active and/or passive components and one or more different types of dies.
- the artificial wafer may be constructed by printing, molding, laminating, pressing or other similar techniques.
- the artificial wafer may be constructed using molding to form an embedded ball grid array (BGA) structure.
- BGA embedded ball grid array
- the embedded ball grid array structure may be a fan-out wafer level ball grid array structure (fan-out WLB) structure.
- the embedded ball grid array structure may be an embedded wafer level ball grid array (eWLB) structure. Any suitable dies, components or packages, package technologies, or package concepts may be embedded or stacked in a fan-out WLB structure to package any of the
- FIGS. 1 1 and 12 are simplified cross-sectional side and top views, respectively, of a first IC package embodiment 1 100 of the RF communication circuit 100, in accordance with some embodiments.
- the IC package 1 100 may include afan-out BGA structure and/or an embedded BGA structure (e.g., an eWLB structure) wherein a mold compound 1 1 14 is used to embed a system-on-a-chip (SoC) 1 102, one or more BAWRs 1 10, and one or more dies 1 104 including other circuitry (e.g., one or more inductors).
- SoC system-on-a-chip
- the SoC 1 102 may include some or all of the transmitter circuit 102 and the control circuit 1 18.
- the SoC 1 102 may include some or all of a receiver (e.g., the receiver 822 or 902 of FIGS. 8 and 9, respectively).
- the one or more dies 1 104 may include a diplexer, such as the diplexer 814 of FIG. 8.
- the IC package 1 100 may include multiple BAWRs 1 10; although three are depicted, any suitable number may be included.
- one or more of the BAWRs 1 10 may require a lid structure for mechanical protection of an active area on a surface of a BAWR die.
- electrical connections to a BAWR die may be made by copper post structures or solder balls on the BAWR die (e.g., at the corners of the die to protect active areas between two or more of the posts). Copper post structures and other connectors may be connected within the IC package 1 100 during the redistribution phase of eWLB manufacturing.
- the IC package 1 100 may also include a PA 1 106, which may serve as the PA 804 in embodiments in accordance with the RF communication circuits discussed above with reference to FIGS. 8 and 9.
- the PA 1 106 may be a previously packaged component, and thus may be integrated with the rest of the IC package 1 100 in a package-on-package structure.
- the PA 1 106 may be disposed outside the mold compound 1 1 14. As shown in FIG. 1 1 , the PA 1 106 may be mounted to an interposer 1 1 10, which may provide mechanical support to the PA 1 106 and which may route electrical connections between the PA 1 106 and other circuitry in the IC package 1 100.
- the interposer 1 1 10 may be a silicon flip-chip structure.
- a heat spreader 1 108 may be mounted to the PA 1 106 to dissipate heat generated by the PA 1 106.
- a heat spreader may be mounted to an IC package using a thermally conductive paste.
- the heat spreader 1 108 may be a stand-alone heat sink, or may be connected to an outer shell of a computing device in which the IC package 1 100 is included (e.g., a mobile communication device) or a larger heat sink.
- a number of through-mold vias 1 1 12 may be routed through the mold compound 1 1 14 to provide electrical connections between different components of the IC package 1 100 and/or between the IC package 1 100 and other devices. Through-mold vias may be formed by positioning prefabricated bars made of silicon or other material, and/or by drilling holes into a mold compound (e.g., the mold compound 1 1 14) and filling the holes with conductive material.
- FIG. 13 is a simplified cross-sectional side view of a second IC package embodiment 1300 of the RF communication circuit 100, in accordance with some embodiments.
- the IC package 1300 may include a fan-out BGA structure and/or an embedded BGA structure (e.g., an eWLB structure) wherein a mold compound 1314 is used to embed a system-on-a-chip (SoC) 1302 and one or more dies 1304 including other circuitry (e.g., one or more inductors).
- SoC system-on-a-chip
- the SoC 1302 may include some or all of the transmitter circuit 102 and the control circuit 1 18. In some embodiments (e.g., the RF communication circuits 800 and 900 of FIGS. 8 and 9, respectively), the SoC 1302 may include some or all of a receiver (e.g., the receiver 822 or 922 of FIGS. 8 and 9,
- the one or more dies 1304 may include a diplexer, such as the diplexer 814 of FIG. 8.
- the BAWRs 1 10 may be disposed outside the mold compound 1314. Although three BAWRs 1 10 are depicted in FIG. 13, any suitable number may be included. In particular, the BAWRs 1 10 shown in FIG. 13 are attached to a top side of a fan-out wafer level package.
- the IC package 1300 may also include a PA 1306, disposed outside the mold compound 1314 and side-by-side with the BAWRs 1 10.
- the PA 1306 may serve as PA 804 in embodiments in accordance with the RF communication circuits discussed above with reference to FIGS. 8 and 9. As discussed above with reference to FIG.
- the PA 1306 may be mounted to an interposer 1310, and a heat spreader 1308 may be mounted to the PA 1306.
- the interposer 1310 may be a silicon flip-chip structure.
- the heat spreader 1308 may be a stand-alone heat sink, or may be connected to an outer shell of a computing device in which the IC package 1300 is included (e.g., a mobile communication device) or a larger heat sink.
- a number of through-mold vias 1312 may be routed through the mold compound 1314 to provide electrical connections between different components of the IC package 1300 and/or between the IC package 1300 and other devices.
- An IC package arrangement like the IC package 1300 may be advantageous when the embedding of the BAWRs 1 10 in a mold compound has a negative impact on the performance of the BAWRs 1 10 and/or the embedding of the BAWRs 1 10 is prohibitively difficult or expensive.
- various IC packages of the RF communication circuit 100 may mount the BAWRs 1 10 in order to maintain a gap 1316 between the active area of a BAWR and a proximal surface to protect the active area. Maintaining such a gap in an IC package may improve performance of a BAWR.
- FIG. 14 is a simplified cross-sectional side view of a third IC package embodiment 1400 of the RF communication circuit 100, in accordance with some embodiments.
- the IC package 1400 may include a fan-out BGA structure and/or an embedded BGA structure (e.g., an eWLB structure) wherein a mold compound 1414 is used to embed a system-on-a-chip (SoC) 1402, one or more BAWRs 1 10, and one or more dies 1404 including other circuitry (e.g., one or more inductors).
- SoC 1402 may include some or all of the transmitter circuit 102 and the control circuit 1 18.
- the SoC 1402 may include some or all of a receiver (e.g., the receiver 822 or 922 of FIGS. 8 and 9, respectively).
- the one or more dies 1404 may include a diplexer, such as the diplexer 814 of FIG. 8.
- the IC package 1400 may also include a PA 1406 embedded in the mold compound 1414. As discussed above, the PA 1406 may serve as the PA 804 in embodiments in accordance with the RF communication circuits discussed above with reference to FIGS. 8 and 9.
- the PA 1406 may be mounted to an
- the interposer 1410 may be a silicon flip-chip structure.
- the heat spreader 1408 may be a stand-alone heat sink, or may be connected to an outer shell of a computing device in which the IC package 1400 is included (e.g., a mobile communication device) or a larger heat sink.
- No through-mold vias are depicted in FIG. 14; ball connectors are provided for connecting the components of the IC package 1400 to other devices.
- the manufacture of the IC package 1400 may be simplified by the elimination of through-mold vias (e.g., as compared to the IC package 1300 of FIG. 13).
- the potentially larger lateral dimension of the IC package 1400 (e.g., as compared to the IC package 1300 of FIG. 13) may be suitable and not
- FIG. 15 is a simplified cross-sectional side view of a fourth IC package embodiment 1500 of the RF communication circuit 100, in accordance with some embodiments.
- the IC package 1500 may include a fan-out BGA structure and/or an embedded BGA structure (e.g., an eWLB structure) wherein a mold compound 1514 is used to embed a system-on-a-chip (SoC) 1502 and one or more dies 1504 including other circuitry (e.g., one or more inductors).
- SoC 1502 may include some or all of the transmitter circuit 102 and the control circuit 1 18.
- the SoC 1502 may include some or all of a receiver (e.g., the receiver 822 or 922 of FIGS. 8 and 9,
- the one or more dies 1504 may include a diplexer, such as the diplexer 814 of FIG. 8.
- the BAWRs 1 10 may be disposed outside the mold compound 1514. Although three BAWRs 1 10 are depicted in FIG. 15, any suitable number may be included.
- the IC package 1500 may also include a PA 1506 embedded in the mold compound 1514. As discussed above, the PA 1506 may serve as the PA 804 in embodiments in accordance with the RF communication circuits discussed above with reference to FIGS. 8 and 9. In the embodiment shown in FIG. 15, the PA 1506 may be a wire-bonded PA. A heat spreader 1508 may be mounted to the PA 1506.
- the heat spreader 1508 may be a stand-alone heat sink, or may be connected to an outer shell of a computing device in which the IC package 1500 is included (e.g., a mobile communication device) or a larger heat sink.
- a number of through-mold vias 1512 may be routed through the mold compound 1514 to provide electrical connections between different
- the IC package 1500 may have a smaller height than other embodiments (e.g., the IC package 1300 of FIG. 13), which may be advantageous in thin device applications.
- the IC package 1500 of FIG. 15 may also be formed using a laminate embedding technology.
- dies may be placed onto a dielectric carrier, which is prepared with copper structures (to achieve, for example, warpage reduction and advantageous leveling), sometimes in a grid-like arrangement.
- the dielectric carrier may be laminated, and vias may be drilled into the laminated dielectric by laser. Redistribution and solder stop processes may be performed, and solder balls may be applied.
- Embodiments using such laminate embedding technologies may advantageously reduce or eliminate the need for interposers, thereby reducing the size of the IC package and reducing costs.
- FIG. 16 is a simplified cross-sectional side view of a fifth IC package embodiment 1600 of the RF communication circuit 100, in accordance with some embodiments.
- the IC package 1600 may include a flip chip structure having a system-on-a-chip (SoC) 1602, one or more BAWRs 1 10, and one or more dies 1604 including other circuitry (e.g., one or more inductors) arranged side-by-side.
- SoC system-on-a-chip
- the BAWRs 1 10 may be mounted with a gap 1616 between the active area of a BAWR and a proximal surface to protect the active area.
- the IC package 1600 may also include an unpackaged PA 1606 in a flip-chip configuration, which may serve as the PA 804 in embodiments in accordance with the RF communication circuits discussed above with reference to FIGS. 8 and 9.
- the SoC 1602 may include some or all of the transmitter circuit 102 and the control circuit 1 18.
- the SoC 1602 may include some or all of a receiver (e.g., the receiver 822 or 922 of FIGS. 8 and 9, respectively).
- the one or more dies 1604 may include a diplexer, such as the diplexer 814 of FIG. 8.
- the SoC 1602, the BAWRs 1 10, the PA 1606 and the dies 1604 may be mounted to a flip chip substrate 1618. After mounting, a reflow process may be performed, which may be followed by a capillary underfill and cure. In some embodiments, a molded underfill may be used.
- FIG. 17 is a simplified cross-sectional side view of a fifth IC package embodiment 1700 of the RF communication circuit 100, in accordance with some embodiments.
- the IC package 1700 may include a flip-chip structure having a system-on-a-chip (SoC) 1702, one or more BAWRs 1 10, and one or more dies 1704 including other circuitry (e.g., one or more inductors) arranged side-by-side.
- the BAWRs 1 10 may be mounted with a gap 1716 between the active area of a BAWR and a proximal surface to protect the active area.
- the IC package 1700 may also include a packaged PA 1706, which may serve as the PA 804 in embodiments in accordance with the RF communication circuits discussed above with reference to FIGS. 8 and 9.
- interconnectors 1722 may be ball grid array balls (in contrast with the flip-chip bumps 1724) that may interconnect the other components of the IC package 1700.
- the SoC 1702 may include some or all of the transmitter circuit 102 and the control circuit 1 18.
- the SoC 1702 may include some or all of a receiver (e.g., the receiver 822 or 922 of FIGS. 8 and 9, respectively).
- the one or more dies 1704 may include a diplexer, such as the diplexer 814 of FIG. 8.
- the SoC 1702, the BAWRs 1 10, the PA 1706 and the dies 1704 may be mounted to a flip-chip substrate 1718.
- the IC package 1700 may be underfilled by capillary underfill and may be over-molded afterwards. A molded underfill material may be used.
- FIG. 18 schematically illustrates a computing device 1800 in accordance with some implementations.
- the computing device 1800 may be, for example, a mobile communication device.
- the computing device 1800 may house a board such as motherboard 1802.
- the motherboard 1802 may include a number of components, including but not limited to a processor 1804 and at least one communication chip 1806.
- the processor 1804 may be physically and electrically coupled to the motherboard 1802.
- the at least one communication chip 1806 may also be physically and electrically coupled to the motherboard 1802.
- the communication chip 1806 may be part of the processor 1804.
- the computing device 1800 may include other components that may or may not be physically and electrically coupled to the motherboard 1802. These other components may include, but are not limited to, volatile memory (e.g., DRAM), non-volatile memory (e.g., ROM), flash memory, a graphics processor, a digital signal processor, a crypto processor, a chipset, an antenna, a display, a touchscreen display, a touchscreen controller, a battery, an audio codec, a video codec, a power amplifier, a global positioning system (GPS) device, a compass, a Geiger counter, an accelerometer, a gyroscope, a speaker, a camera, and a mass storage device (such as hard disk drive, compact disc (CD), digital versatile disc (DVD), and so forth).
- volatile memory e.g., DRAM
- non-volatile memory e.g., ROM
- flash memory e.g., a graphics processor, a digital signal processor, a crypto processor, a chips
- the communication chip 1806, the RF front end 1808, and the antenna 1810 may enable wireless RF communications for the transfer of data to and from the computing device 1800.
- the communication chip 1806 and the RF front end_1808 may include any of the RF communication circuits disclosed herein.
- the RF front-end 1808 may include any of the PAs, filters, and/or diplexers described herein, among other components.
- the term "wireless" and its derivatives may be used to describe circuits, devices, systems, methods, techniques, communications channels, etc., that may communicate data through the use of modulated electromagnetic radiation through a non-solid medium. The term does not imply that the associated devices do not contain any wires, although in some embodiments they might not.
- the communication chip 1806 may implement any of a number of wireless standards or protocols, including but not limited to Institute for Electrical and Electronic Engineers (IEEE) standards including Wi-Fi (IEEE 802.1 1 family), IEEE 802.16 standards (e.g., IEEE 802.16-2005 Amendment), Long-Term Evolution (LTE) project along with any amendments, updates, and/or revisions (e.g., advanced LTE project, ultra mobile broadband (UMB) project (also referred to as "3GPP2”), etc.).
- IEEE 802.16 compatible BWA networks are generally referred to as WiMAX networks, an acronym that stands for Worldwide Interoperability for Microwave Access, which is a certification mark for products that pass conformity and interoperability tests for the IEEE 802.16 standards.
- the communication chip 1806 may operate in accordance with a GSM, General Packet Radio Service (GPRS), Universal Mobile Telecommunications System (UMTS), High Speed Packet Access (HSPA), Evolved HSPA (E-HSPA), or LTE network.
- the communication chip 606 may operate in accordance with Enhanced Data for GSM Evolution
- the communication chip 1806 may operate in accordance with CDMA, Time Division Multiple Access (TDMA), Digital Enhanced Cordless
- the communication chip 1806 may operate in accordance with other wireless protocols in other embodiments.
- the computing device 1800 may include a plurality of communication chips 1806.
- a first communication chip 1806 may be dedicated to shorter range wireless communications such as Wi-Fi and Bluetooth and a second communication chip 1806 may be dedicated to longer range wireless
- Each of the communication chips may include one or more embodiments of the RF communication circuits disclosed herein.
- the processor 1804 and/or the communication chip 1806 of the computing device 1800 may include one or more dies or other components in an IC package as described herein.
- the term "processor” may refer to any device or portion of a device that processes electronic data from registers and/or memory to transform that electronic data into other electronic data that may be stored in registers and/or memory.
- the computing device 1800 may be a laptop, a netbook, a notebook, an ultrabook, a smartphone, a tablet, a personal digital assistant (PDA), an ultra mobile PC, a mobile phone, a desktop computer, a server, a printer, a scanner, a monitor, a set-top box, an entertainment control unit, a digital camera, a portable music player, or a digital video recorder.
- the computing device 1800 may be any other electronic device that processes data.
- the RF communication circuits described herein are implemented in a high-performance computing device. In some embodiments, the RF communication circuits described herein are implemented in handheld computing devices.
- Example 1 is a mobile communication device, including: an antenna; a transmitter circuit having an output port; a tuner circuit having one or more bulk acoustic wave resonators (BAWRs), an antenna port coupled to the antenna, a transmitter port coupled to the output port of the transmitter circuit, and a control port; and a control circuit, coupled to the control port, configured to adjust an impedance of the tuner circuit, via adjustment of a BAWR or another component of the tuner circuit, based at least in part on an impedance of the antenna.
- BAWRs bulk acoustic wave resonators
- Example 2 may include the subject matter of Example 1 , further specifying that: the transmitter circuit includes a power amplifier (PA), the PA having a supply voltage port for receiving a supply voltage, the PA having a PA output port coupled to the output port of transmitter circuit, wherein the PA output port is for outputting a current at an output power level, and wherein the PA has a peak output power based at least in part on an impedance of the tuner circuit and the antenna, as measured at the output port; and the control circuit is configured to adjust the impedance of the tuner circuit, via adjustment of a BAWR or another component of the tuner circuit, to match the peak output power of the PA to the output power level.
- PA power amplifier
- Example 3 may include the subject matter of Example 2, further specifying that the antenna is a first antenna, and further including: a second antenna, different from the first antenna, coupled to a receiver.
- Example 4 may include the subject matter of Example 1 , further specifying that: the transmitter circuit includes a diplexer having a transmitter port coupled to a transmitter, the diplexer further having a receiver port coupled to a receiver and a diplexer output port coupled to the output port of the transmitter circuit and controllably coupled to one of the transmitter port and the receiver port; and the control circuit is configured to adjust the impedance of the tuner circuit, via adjustment of a BAWR or another component of the tuner circuit, to enable a combined impedance of the tuner circuit and the antenna, as measured at the output port of the transmitter circuit, to match to an impedance of the transmitter when the diplexer output port is coupled to the transmitter port.
- Example 5 may include the subject matter of any of Examples 1 -4, further specifying that the control circuit is embedded in a mold compound of an embedded ball grid array structure and at least one of the BAWRs is disposed outside the mold compound.
- Example 6 is a method for radio frequency communication, including: providing a tuner circuit having one or more bulk acoustic wave resonators
- BAWRs an antenna port coupled to an antenna, and a control port; and providing a control circuit, coupled to the control port, configured to adjust an impedance of the tuner circuit based at least in part on an impedance of the antenna.
- Example 7 may include the subject matter of Example 6, further including adjusting the impedance of the tuner circuit, using the control circuit, based at least in part on an impedance of the antenna.
- Example 8 may include the subject matter Example 6, further including providing a power amplifier (PA) having a PA output port to be coupled to the tuner circuit and configured to output a current at an output power level, wherein the PA has a peak output power based at least in part on an impedance of the tuner circuit and the antenna, as measured at the output port; wherein the control circuit is configured to adjust the impedance of the tuner circuit by adjusting a BAWR or another component of the tuner circuit to enable an impedance of the tuner circuit to match the peak output power of the PA to the output power level.
- PA power amplifier
- Example 9 may include the subject matter of Example 6, further including providing a diplexer having a transmitter port to be coupled to a transmitter, the diplexer further having a receiver port to be coupled to a receiver and a diplexer output port coupled to the tuner circuit and controllably coupled to one of the transmitter port and the receiver port; wherein the control circuit is configured to adjust the impedance of the tuner circuit, via adjustment of a BAWR or another component of the tuner circuit, to enable a combined impedance of the tuner circuit and the antenna, as measured at the output port of the transmitter circuit, to match an impedance of the transmitter when the diplexer output port is coupled to the transmitter port.
- Example 10 is a radio frequency (RF) communication circuit, including: a radio frequency diplexer having a transmitter port to be coupled to a transmitter, a receiver port to be coupled to a receiver, and a diplexer output port to be controllably coupled to one of the transmitter port and the receiver port; a tuner circuit, coupled to the diplexer output port, having one or more bulk acoustic wave resonators (BAWRs) and one or more other components, an antenna port to be coupled to an antenna, and a control port; and a control circuit, coupled to the control port, configured to adjust an impedance of the tuner circuit via adjustment of a BAWR or other component of the tuner circuit, to enable a combined impedance of the tuner circuit and the antenna, as measured at the diplexer output port, to match an impedance of the transmitter when the diplexer output port is coupled to the transmitter port, and to match an impedance of the receiver when the diplexer output port is coupled to the receiver port.
- Example 1 1 may include the subject matter of Example 10, further specifying that the control circuit is configured to adjust a DC voltage to be applied between two electrodes of at least one BAWR, included in the tuner circuit, to adjust the impedance of the tuner circuit.
- Example 12 may include the subject matter of any of Examples 10-1 1 , further specifying that the control circuit includes an adjustable DC voltage source configured to apply an adjustable DC voltage to adjust the capacitance of a varactor arranged in series or in parallel with at least one of the one or more BAWRs.
- the control circuit includes an adjustable DC voltage source configured to apply an adjustable DC voltage to adjust the capacitance of a varactor arranged in series or in parallel with at least one of the one or more BAWRs.
- Example 13 may include the subject matter of any of Examples 10-12, further specifying that the control circuit includes a signal source configured to apply electrical signals to adjust the capacitance of a microelectromechanical systems (MEMS) capacitor arranged in series or in parallel with at least one of the one or more BAWRs.
- MEMS microelectromechanical systems
- Example 13a may include the subject matter of Example 10, wherein the control circuit and at least one of the BAWRs are embedded in a mold compound of an embedded ball grid array structure.
- Example 14 may include the subject matter of any of Examples 10-14, further specifying that the control circuit is embedded in a mold compound of an embedded ball grid array structure and at least one of the BAWRs is disposed outside the mold compound.
- Example 15 may include the subject matter of any of Examples 10-14, further including a power amplifier (PA) to be coupled between the transmitter and the transmitter port; wherein the control circuit is embedded in a mold compound of an embedded ball grid array structure and the PA is disposed outside the mold compound.
- Example 16 may include the subject matter of any of Examples 10-14, further including a power amplifier (PA) to be coupled between the transmitter and the transmitter port; wherein the control circuit and the PA are embedded in a mold compound of an embedded ball grid array structure.
- PA power amplifier
- Example 17 is a radio frequency (RF) communication circuit, including: a tuner circuit having one or more bulk acoustic wave resonators (BAWRs), an antenna port to be coupled to a transmit antenna, a signal port, and a control port; a power amplifier (PA) having an output port, coupled to the signal port, and configured to output a current at an output power level, wherein the PA has a peak output power based at least in part on an impedance of the tuner circuit and the antenna, as measured at the output port; and a control circuit, coupled to the control port, configured to adjust an impedance of the tuner circuit to match the peak output power of the PA to the output power level.
- BAWRs bulk acoustic wave resonators
- Example 18 may include the subject matter of Example 17, further specifying that no diplexer is interposed between the PA and the tuner circuit.
- Example 19 may include the subject matter of any of Examples 17-18, further specifying that the RF communication circuit is included in a mobile communication device and the output power level is based at least in part on a distance between the mobile communication device and a base station in
- Example 20 may include the subject matter of any of Examples 17-19, further specifying that the control circuit is configured to provide a DC voltage to be applied between two electrodes of at least one BAWR, included in the tuner circuit, to adjust the impedance of the tuner circuit.
- Example 21 may include the subject matter of any of Examples 17-20, further specifying that the control circuit includes an adjustable DC voltage source configured to apply an adjustable DC voltage to adjust the capacitance of a varactor arranged in series or in parallel with at least one of the one or more BAWRs.
- the control circuit includes an adjustable DC voltage source configured to apply an adjustable DC voltage to adjust the capacitance of a varactor arranged in series or in parallel with at least one of the one or more BAWRs.
- Example 22 may include the subject matter of any of Examples 17-21 , further specifying that the control circuit includes a signal source configured to apply electrical signals to adjust the capacitance of a microelectromechanical systems (MEMS) capacitor arranged in series or in parallel with at least one of the one or more BAWRs.
- MEMS microelectromechanical systems
- Example 23 may include the subject matter of any of Examples 17-22, further specifying that the PA and at least one of the BAWRs are packaged side-by- side in a flip-chip structure.
- Example 24 may include the subject matter of any of Examples 17-22, further specifying that the control circuit is embedded in a mold compound of an embedded ball grid array structure, and the PA and at least one of the BAWRs are disposed outside the mold compound.
- Example 25 may include the subject matter of any of Examples 17-23, further specifying that the PA is included in a wire bonded package.
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- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
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- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
Abstract
Description
Claims
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020147036626A KR101712976B1 (en) | 2013-06-26 | 2013-06-26 | Bulk acoustic wave resonator tuner circuits |
| US14/398,049 US9819327B2 (en) | 2013-06-26 | 2013-06-26 | Bulk acoustic wave resonator tuner circuits |
| CN201380034399.9A CN104471864B (en) | 2013-06-26 | 2013-06-26 | Bulk acoustic wave resonator tuner circuit |
| JP2016521390A JP6133504B2 (en) | 2013-06-26 | 2013-06-26 | Bulk acoustic wave resonator tuner circuit |
| DE112013002919.7T DE112013002919B4 (en) | 2013-06-26 | 2013-06-26 | Bulk Acoustic Wave Resonator Tuning Circuits |
| PCT/US2013/047993 WO2014209307A1 (en) | 2013-06-26 | 2013-06-26 | Bulk acoustic wave resonator tuner circuits |
| TW103118254A TWI617136B (en) | 2013-06-26 | 2014-05-26 | Bulk acoustic wave resonator tuner circuits |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/US2013/047993 WO2014209307A1 (en) | 2013-06-26 | 2013-06-26 | Bulk acoustic wave resonator tuner circuits |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2014209307A1 true WO2014209307A1 (en) | 2014-12-31 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/US2013/047993 Ceased WO2014209307A1 (en) | 2013-06-26 | 2013-06-26 | Bulk acoustic wave resonator tuner circuits |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US9819327B2 (en) |
| JP (1) | JP6133504B2 (en) |
| KR (1) | KR101712976B1 (en) |
| CN (1) | CN104471864B (en) |
| DE (1) | DE112013002919B4 (en) |
| TW (1) | TWI617136B (en) |
| WO (1) | WO2014209307A1 (en) |
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| US20240333259A1 (en) * | 2023-04-03 | 2024-10-03 | Qorvo Us, Inc. | Coupled resonator filter tuning circuit |
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- 2013-06-26 CN CN201380034399.9A patent/CN104471864B/en not_active Expired - Fee Related
- 2013-06-26 JP JP2016521390A patent/JP6133504B2/en active Active
- 2013-06-26 US US14/398,049 patent/US9819327B2/en not_active Expired - Fee Related
- 2013-06-26 WO PCT/US2013/047993 patent/WO2014209307A1/en not_active Ceased
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Also Published As
| Publication number | Publication date |
|---|---|
| KR20150045956A (en) | 2015-04-29 |
| JP2016522656A (en) | 2016-07-28 |
| US20150333401A1 (en) | 2015-11-19 |
| CN104471864B (en) | 2016-04-27 |
| DE112013002919T5 (en) | 2015-03-05 |
| US9819327B2 (en) | 2017-11-14 |
| JP6133504B2 (en) | 2017-05-24 |
| TWI617136B (en) | 2018-03-01 |
| DE112013002919B4 (en) | 2024-06-13 |
| TW201501465A (en) | 2015-01-01 |
| KR101712976B1 (en) | 2017-03-22 |
| CN104471864A (en) | 2015-03-25 |
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