WO2014156927A1 - Resin sheet for electronic device sealing and production method for electronic device package - Google Patents
Resin sheet for electronic device sealing and production method for electronic device package Download PDFInfo
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- WO2014156927A1 WO2014156927A1 PCT/JP2014/057691 JP2014057691W WO2014156927A1 WO 2014156927 A1 WO2014156927 A1 WO 2014156927A1 JP 2014057691 W JP2014057691 W JP 2014057691W WO 2014156927 A1 WO2014156927 A1 WO 2014156927A1
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- electronic device
- resin sheet
- resin
- sealing
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- FQEMARONUOAYGT-UHFFFAOYSA-N OC1=CCCC=C1 Chemical compound OC1=CCCC=C1 FQEMARONUOAYGT-UHFFFAOYSA-N 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
- H01L23/293—Organic, e.g. plastic
- H01L23/295—Organic, e.g. plastic containing a filler
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
- H01L23/3121—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/93—Batch processes
- H01L2224/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L2224/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/146—Mixed devices
- H01L2924/1461—MEMS
Definitions
- the present invention relates to an electronic device sealing resin sheet and an electronic device package manufacturing method.
- an electronic device package typically, one or a plurality of electronic devices fixed to a substrate or the like are sealed with a sealing resin, and the sealing body is packaged in units of electronic devices as necessary. The procedure of dicing is adopted.
- Moisture present in the sealing resin is vaporized by heating during thermosetting. If a large amount of moisture is present in the sealing resin, cracks may occur in the sealing resin due to this vapor pressure. For this reason, a low hygroscopic sealing resin is required.
- a method for reducing hygroscopicity for example, there is a method of blending silica.
- Patent Document 1 describes that a resin sheet is formed by applying a varnish containing a resin, silica, a silane coupling agent, and the like onto a film and then drying the coating film.
- a varnish containing a resin, silica, a silane coupling agent, and the like onto a film and then drying the coating film.
- sufficient consideration has not been given to hygroscopicity.
- An object of the present invention is to solve the above-mentioned problems and provide a resin sheet for encapsulating electronic devices with low hygroscopicity.
- the present invention includes a filler, has a water absorption of 0.3% by weight or less after being left in an atmosphere of 85 ° C. and 85% RH for 168 hours, and the filler is substantially dispersed in a primary particle state.
- the present invention relates to an electronic device sealing resin sheet.
- the resin sheet for encapsulating an electronic device of the present invention has a water absorption rate of 0.3% by weight or less and low hygroscopicity. Therefore, an electronic device package excellent in moisture resistance reliability can be manufactured.
- the filler is preferably treated with a silane coupling agent. Thereby, it becomes easy to disperse the filler in a state of primary particles. Moreover, since such a filler has high hydrophobicity and such a filler can be disperse
- the content of the filler in the electronic device sealing resin sheet is preferably 70 to 90% by volume. Thereby, hygroscopicity can be reduced.
- the present invention also provides a sealing step in which the electronic device sealing resin sheet is laminated on the electronic device so as to cover one or more electronic devices, and the electronic device sealing resin sheet is cured.
- the present invention relates to a method for manufacturing an electronic device package, which includes a sealing body forming step of forming.
- FIG. 1 is a cross-sectional view schematically showing a resin sheet 11 according to an embodiment of the present invention.
- the resin sheet 11 is typically provided in a state of being laminated on a support 11a such as a polyethylene terephthalate (PET) film. Note that a release treatment may be performed on the support 11a in order to easily peel off the resin sheet 11.
- PET polyethylene terephthalate
- the resin sheet 11 has a water absorption of 0.3% by weight or less, preferably 0.25% by weight or less after being left for 168 hours in an atmosphere of 85 ° C. and 85% RH. Since it is 0.3% by weight or less, it has low hygroscopicity. Therefore, an electronic device package excellent in moisture resistance reliability can be manufactured.
- the lower limit of the water absorption rate is not particularly limited and is, for example, 0.05% by weight or more.
- the water absorption after standing for 168 hours in an atmosphere of 85 ° C. and 85% RH can be measured by the method described in Examples.
- the filler is substantially dispersed in the form of primary particles. For this reason, the above-mentioned water absorption rate can be achieved easily.
- the fact that the filler is substantially dispersed in the form of primary particles means that there is substantially no aggregate. Specifically, it can be measured by the method described in the examples, and the evaluation of filler dispersibility described in the examples is good.
- filler processed with the silane coupling agent is preferable. Thereby, it becomes easy to disperse the filler in a state of primary particles.
- fillers are highly hydrophobic (high hydrophobicity because the silane coupling agent is bonded to the hydrophilic group on the filler surface), and such fillers can be dispersed substantially in the form of primary particles. The hygroscopicity of the resin sheet 11 can be effectively reduced.
- an inorganic filler is preferable.
- the inorganic filler include quartz glass, talc, silica (such as fused silica and crystalline silica), alumina, aluminum nitride, silicon nitride, and boron nitride.
- silica and alumina are preferable and silica is more preferable because of excellent reactivity with the silane coupling agent.
- Silica is preferably fused silica and more preferably spherical fused silica because it is excellent in fluidity.
- the average primary particle diameter of the filler is preferably 1 ⁇ m or more, more preferably 5 ⁇ m or more. When it is 1 ⁇ m or more, it is easy to obtain flexibility and flexibility of the resin sheet.
- the average primary particle diameter of the filler is preferably 40 ⁇ m or less, more preferably 30 ⁇ m or less. When it is 40 ⁇ m or less, it is easy to increase the filling rate of the filler.
- the average primary particle diameter can be derived by, for example, using a sample arbitrarily extracted from the population and measuring it using a laser diffraction / scattering particle size distribution measuring apparatus.
- the silane coupling agent is a compound having a hydrolyzable group and an organic functional group in the molecule.
- hydrolyzable group examples include an alkoxy group having 1 to 6 carbon atoms such as a methoxy group and an ethoxy group, an acetoxy group, and a 2-methoxyethoxy group.
- a methoxy group is preferable because it easily removes volatile components such as alcohol generated by hydrolysis.
- organic functional group examples include vinyl group, epoxy group, styryl group, methacryl group, acrylic group, amino group, ureido group, mercapto group, sulfide group, and isocyanate group.
- an epoxy group is preferable because it easily reacts with an epoxy resin or a phenol resin.
- silane coupling agent examples include vinyl group-containing silane coupling agents such as vinyltrimethoxysilane and vinyltriethoxysilane; 2- (3,4-epoxycyclohexyl) ethyltrimethoxysilane, 3-glycidoxypropylmethyl Epoxy group-containing silane coupling agents such as dimethoxysilane, 3-glycidoxypropyltrimethoxysilane, 3-glycidoxypropylmethyldiethoxysilane, 3-glycidoxypropyltriethoxysilane; p-styryltrimethoxysilane, etc.
- vinyl group-containing silane coupling agents such as vinyltrimethoxysilane and vinyltriethoxysilane
- 2- (3,4-epoxycyclohexyl) ethyltrimethoxysilane 3-glycidoxypropylmethyl Epoxy group-containing silane coupling agents such as dimethoxysilane, 3-glycidoxypropyl
- Styryl group-containing silane coupling agent 3-methacryloxypropylmethyldimethoxysilane, 3-methacryloxypropyltrimethoxysilane, 3-methacryloxypropylmethyldiethoxysilane, 3-methacryloxypropyltri Methacrylic group-containing silane coupling agents such as toxisilane; Acrylic group-containing silane coupling agents such as 3-acryloxypropyltrimethoxysilane; N-2- (aminoethyl) -3-aminopropylmethyldimethoxysilane, N-2- (Aminoethyl) -3-aminopropyltrimethoxysilane, 3-aminopropyltrimethoxysilane, 3-aminopropyltriethoxysilane, 3-triethoxysilyl-N- (1,3-dimethyl-butylidene) propylamine, N Amino group-containing silane coupling agents such as phenyl-3-a
- the method for treating the filler with the silane coupling agent is not particularly limited, and examples include a wet method in which the filler and the silane coupling agent are mixed in a solvent, and a dry method in which the filler and the silane coupling agent are treated in a gas phase. It is done.
- the treatment amount of the silane coupling agent is not particularly limited, but it is preferable to treat 0.1 to 1 part by weight of the silane coupling agent with respect to 100 parts by weight of the untreated filler.
- the content of the filler in the resin sheet 11 is preferably 70% by volume or more, and more preferably 74% by volume or more. Hygroscopicity can be reduced as it is 70 volume% or more. On the other hand, the filler content is preferably 90% by volume or less, more preferably 85% by volume or less. A softness
- the filler content can also be explained by using “% by weight” as a unit. Typically, the content of silica will be described in units of “% by weight”. Since silica usually has a specific gravity of 2.2 g / cm 3 , the preferred range of the silica content (% by weight) is, for example, as follows. That is, the content of silica in the resin sheet 11 is preferably 81% by weight or more, and more preferably 84% by weight or more. 94 weight% or less is preferable and, as for content of the silica in the resin sheet 11, 91 weight% or less is more preferable.
- the preferred range of the alumina content is, for example, as follows. That is, the content of alumina in the resin sheet 11 is preferably 88% by weight or more, and more preferably 90% by weight or more. 97 weight% or less is preferable and, as for content of the alumina in the resin sheet 11, 95 weight% or less is more preferable.
- Resin sheet 11 preferably contains an epoxy resin and a phenol resin. Thereby, favorable thermosetting is obtained.
- the epoxy resin is not particularly limited.
- triphenylmethane type epoxy resin, cresol novolac type epoxy resin, biphenyl type epoxy resin, modified bisphenol A type epoxy resin, bisphenol A type epoxy resin, bisphenol F type epoxy resin, modified bisphenol F type epoxy resin, dicyclopentadiene type Various epoxy resins such as an epoxy resin, a phenol novolac type epoxy resin, and a phenoxy resin can be used. These epoxy resins may be used alone or in combination of two or more.
- the epoxy equivalent is 150 to 250 and the softening point or the melting point is 50 to 130 ° C., solid at room temperature. From the viewpoint, triphenylmethane type epoxy resin, cresol novolac type epoxy resin, and biphenyl type epoxy resin are more preferable.
- the phenol resin is not particularly limited as long as it causes a curing reaction with the epoxy resin.
- a phenol novolac resin, a phenol aralkyl resin, a biphenyl aralkyl resin, a dicyclopentadiene type phenol resin, a cresol novolak resin, a resole resin, or the like is used.
- These phenolic resins may be used alone or in combination of two or more.
- phenolic resin those having a hydroxyl equivalent weight of 70 to 250 and a softening point of 50 to 110 ° C. are preferably used from the viewpoint of reactivity with the epoxy resin, and in particular, phenol novolak from the viewpoint of high curing reactivity. Resin can be used suitably. From the viewpoint of reliability, low hygroscopic materials such as phenol aralkyl resins and biphenyl aralkyl resins can also be suitably used.
- the blending ratio of the epoxy resin and the phenol resin is blended so that the total of hydroxyl groups in the phenol resin is 0.7 to 1.5 equivalents with respect to 1 equivalent of the epoxy group in the epoxy resin from the viewpoint of curing reactivity. It is preferable to use 0.9 to 1.2 equivalents.
- the total content of the epoxy resin and the phenol resin in the resin sheet 11 is preferably 2.0% by weight or more, and more preferably 3.0% by weight or more. Adhesive force with respect to an electronic device, a board
- the total content of the epoxy resin and the phenol resin in the resin sheet 11 is preferably 20% by weight or less, and more preferably 10% by weight or less. If it is 20% by weight or less, the hygroscopicity can be kept low.
- the resin sheet 11 preferably contains a thermoplastic resin. Thereby, the handling property in a non-hardened state and the low stress property of hardened
- Thermoplastic resins include natural rubber, butyl rubber, isoprene rubber, chloroprene rubber, ethylene-vinyl acetate copolymer, ethylene-acrylic acid copolymer, ethylene-acrylic acid ester copolymer, polybutadiene resin, polycarbonate resin, thermoplasticity.
- Polyimide resin, polyamide resin such as 6-nylon and 6,6-nylon, phenoxy resin, acrylic resin, saturated polyester resin such as PET and PBT, polyamideimide resin, fluororesin, styrene-isobutylene-styrene block copolymer Can be mentioned.
- These thermoplastic resins can be used alone or in combination of two or more. Of these, a styrene-isobutylene-styrene block copolymer is preferred from the viewpoint of low stress and low water absorption.
- the content of the thermoplastic resin in the resin sheet 11 is preferably 1.0% by weight or more, and more preferably 1.5% by weight or more.
- flexibility and flexibility are acquired as it is 1.0 weight% or more.
- the content of the thermoplastic resin in the resin sheet 11 is preferably 3.5% by weight or less, and more preferably 3% by weight or less. Adhesiveness with an electronic device or a board
- substrate can be improved as it is 3.5 weight% or less.
- the resin sheet 11 preferably contains a curing accelerator.
- the curing accelerator is not particularly limited as long as it can cure the epoxy resin and the phenol resin, and examples thereof include organophosphorus compounds such as triphenylphosphine and tetraphenylphosphonium tetraphenylborate; 2-phenyl-4, And imidazole compounds such as 5-dihydroxymethylimidazole and 2-phenyl-4-methyl-5-hydroxymethylimidazole.
- organophosphorus compounds such as triphenylphosphine and tetraphenylphosphonium tetraphenylborate
- 2-phenyl-4, And imidazole compounds such as 5-dihydroxymethylimidazole and 2-phenyl-4-methyl-5-hydroxymethylimidazole.
- 2-phenyl-4,5-dihydroxymethylimidazole is preferable because the curing reaction does not rapidly proceed even when the temperature rises during kneading and the resin sheet 11 can be satisfactorily produced.
- the content of the curing accelerator is preferably 0.1 to 5 parts by weight with respect to 100 parts by weight of the total of the epoxy resin and the phenol resin.
- Resin sheet 11 preferably contains a flame retardant component. This can reduce the expansion of combustion when ignition occurs due to component short-circuiting or heat generation.
- a flame retardant component for example, various metal hydroxides such as aluminum hydroxide, magnesium hydroxide, iron hydroxide, calcium hydroxide, tin hydroxide, complex metal hydroxides; phosphazene flame retardants, etc. should be used. Can do. Of these, phosphazene-based flame retardants are preferred, and compounds represented by formula (1) or formula (2) are preferred because they are excellent in flame retardancy and strength after curing.
- R 1 and R 2 are the same or different and are monovalent having at least one group selected from the group consisting of an alkoxy group, a phenoxy group, an amino group, a hydroxyl group, an allyl group, or these groups
- R 3 and R 5 are the same or different and are monovalent having at least one group selected from the group consisting of an alkoxy group, a phenoxy group, an amino group, a hydroxyl group, an allyl group, or these groups
- R 4 represents an organic group
- R 4 represents a divalent organic group having at least one group selected from the group consisting of an alkoxy group, a phenoxy group, an amino group, a hydroxyl group and an allyl group
- y represents 3 to 25 Represents an integer
- z represents an integer of 3 to 25.
- alkoxy group for R 1 and R 2 examples include a methoxy group, an ethoxy group, an n-propoxy group, an isopropoxy group, an n-butoxy group, and a t-butoxy group. Of these, alkoxy groups having 4 to 10 carbon atoms are preferable.
- Examples of the phenoxy group for R 1 and R 2 include a group represented by the formula (3).
- R 11 represents hydrogen, a hydroxyl group, an alkyl group, an alkoxy group, a glycidyl group, or a monovalent organic group having at least one group selected from the group consisting of these groups.
- Examples of the alkyl group for R 11 include a methyl group, an ethyl group, an n-propyl group, an isopropyl group, an n-butyl group, an iso-butyl group, a sec-butyl group, a tert-butyl group, a pentyl group, and a hexyl group. And heptyl, 2-ethylhexyl, octyl, nonyl, decyl, undecyl, dodecyl, tridecyl, tetradecyl, pentadecyl, octadecyl and the like.
- Examples of the alkoxy group for R 11 include the same groups as the alkoxy groups for R 1 and R 2 .
- a phenoxy group is preferable and a group represented by the formula (3) is more preferable because flame retardancy and strength after curing can be favorably obtained.
- X represents an integer of 3 to 25, but 3 to 10 is preferable and 3 to 4 is more preferable because flame retardancy and strength after curing can be obtained satisfactorily.
- examples of the alkoxy group of R 3 and R 5 include a methoxy group, an ethoxy group, an n-propoxy group, an isopropoxy group, an n-butoxy group, and a t-butoxy group. Of these, alkoxy groups having 4 to 10 carbon atoms are preferable.
- Examples of the phenoxy group for R 3 and R 5 include a group represented by the formula (3).
- the monovalent organic group having at least one group selected from the group consisting of an alkoxy group, a phenoxy group, an amino group, a hydroxyl group and an allyl group in R 3 and R 5 is not particularly limited.
- a phenoxy group is preferable and a group represented by the formula (3) is more preferable because flame retardancy and strength after curing can be favorably obtained.
- Examples of the alkoxy group contained in the divalent organic group represented by R 4 include a methoxy group, an ethoxy group, an n-propoxy group, an isopropoxy group, an n-butoxy group, and a t-butoxy group. Of these, alkoxy groups having 4 to 10 carbon atoms are preferable.
- Examples of the phenoxy group contained in the divalent organic group represented by R 4 include a group represented by the formula (3).
- Y represents an integer of 3 to 25, but 3 to 10 is preferable because flame retardancy and strength after curing can be obtained satisfactorily.
- Z represents an integer of 3 to 25, but 3 to 10 is preferable because flame retardancy and strength after curing can be obtained satisfactorily.
- the content of the phosphorus element contained in the phosphazene flame retardant is preferably 12% by weight or more.
- the content of the flame retardant component is preferably 10% by weight or more, more preferably 15% by weight or more, in 100% by weight of the organic component (all components excluding the filler).
- a flame retardance is favorably acquired as it is 10 weight% or more.
- the content of the flame retardant component is preferably 30% by weight or less, and more preferably 25% by weight or less. When the content is 30% by weight or less, there is a tendency that there is little decrease in physical properties of the cured product (specifically, physical properties such as glass transition temperature and high-temperature resin strength).
- the resin sheet 11 preferably contains a pigment.
- the pigment is not particularly limited, and examples thereof include carbon black.
- the content of the pigment in the resin sheet 11 is preferably 0.1 to 2% by weight. When the content is 0.1% by weight or more, good marking properties can be obtained. When the content is 2% by weight or less, a cured product strength is sufficiently obtained.
- the resin sheet 11 may contain a release agent. Since the release agent is usually hydrophobic and water repellent, the hygroscopicity can be reduced by blending it. However, since the resin sheet 11 is a sheet shape, it is not necessary to mix
- the method for producing the resin sheet 11 is not particularly limited, but a method of preparing a kneaded product of the above-described components and plastically processing the obtained kneaded product into a sheet shape is preferable. Thereby, a filler can be filled highly and hygroscopicity can be reduced. Moreover, it becomes easy to disperse the filler in the state of primary particles.
- the above-described components are melt-kneaded with a known kneader such as a mixing roll, a pressure kneader, or an extruder.
- the kneaded material is prepared by the above, and the obtained kneaded material is plastically processed into a sheet shape.
- the temperature is preferably equal to or higher than the softening point of each component described above, for example, 30 to 150 ° C., and preferably 40 to 140 ° C., more preferably 60 to 120 in consideration of the thermosetting property of the epoxy resin. ° C.
- the time is, for example, 1 to 30 minutes, preferably 5 to 15 minutes.
- the kneading is preferably performed under reduced pressure conditions (under reduced pressure atmosphere).
- the pressure under reduced pressure is preferably 0.1 kg / cm 2 or less, more preferably 0.05 kg / cm 2 or less.
- the lower limit of the pressure under reduced pressure is not particularly limited, but is, for example, 1 ⁇ 10 ⁇ 4 kg / cm 2 or more.
- the kneaded material after melt-kneading is preferably subjected to plastic working in a high temperature state without cooling.
- the plastic working method is not particularly limited, and examples thereof include a flat plate pressing method, a T die extrusion method, a screw die extrusion method, a roll rolling method, a roll kneading method, an inflation extrusion method, a coextrusion method, and a calendering method.
- the plastic working temperature is preferably not less than the softening point of each component described above, and is 40 to 150 ° C., preferably 50 to 140 ° C., more preferably 70 to 120 ° C. in consideration of the thermosetting property and moldability of the epoxy resin. is there.
- the thickness of the resin sheet 11 is not particularly limited, but is preferably 100 ⁇ m or more, more preferably 150 ⁇ m or more. Further, the thickness of the resin sheet 11 is preferably 2000 ⁇ m or less, more preferably 1000 ⁇ m or less. An electronic device can be favorably sealed as it is in the said range.
- the resin sheet 11 may have a single-layer structure or a multilayer structure in which two or more resin sheets are laminated.
- a single-layer structure is preferable because it has a small surface area and easily absorbs moisture.
- the resin sheet 11 has a smaller surface area than a conventional tablet-shaped sealing resin, it is easy to reduce hygroscopicity.
- the resin sheet 11 is a SAW (Surface Acoustic Wave) filter; a MEMS (Micro Electro Mechanical Systems) such as a pressure sensor and a vibration sensor; an IC (integrated circuit) such as an LSI; a semiconductor such as a transistor; a capacitor; an electronic device such as a resistor Used for sealing.
- SAW Surface Acoustic Wave
- MEMS Micro Electro Mechanical Systems
- IC integrated circuit
- semiconductor such as a transistor
- a capacitor an electronic device such as a resistor Used for sealing.
- it can use suitably for the sealing of the electronic device (specifically SAW filter, MEMS) which needs hollow sealing, and can use it especially suitably for sealing of a SAW filter.
- the sealing method is not particularly limited, and examples thereof include a method in which an uncured resin sheet 11 is laminated on a substrate so as to cover an electronic device on the substrate, and then the resin sheet 11 is cured and sealed. . It does not specifically limit as a board
- substrate For example, a printed wiring board, a ceramic substrate, a silicon substrate, a metal substrate etc. are mentioned.
- FIGS. 2A to 2C are diagrams each schematically showing one step of a method for manufacturing an electronic device package according to an embodiment of the present invention.
- the SAW filter 13 mounted on the printed wiring board 12 is hollow-sealed with the resin sheet 11 to produce the electronic device package 18.
- a printed wiring board 12 on which a plurality of SAW filters 13 are mounted is prepared (see FIG. 2A).
- the SAW filter 13 can be formed by dicing a piezoelectric crystal on which predetermined comb-shaped electrodes are formed by a known method.
- a known device such as a flip chip bonder or a die bonder can be used.
- the SAW filter 13 and the printed wiring board 12 are electrically connected via protruding electrodes 13a such as bumps.
- a hollow portion 14 is maintained between the SAW filter 13 and the printed wiring board 12 so as not to inhibit the propagation of surface acoustic waves on the surface of the SAW filter.
- the distance between the SAW filter 13 and the printed wiring board 12 can be set as appropriate, and is generally about 15 to 50 ⁇ m.
- the resin sheet 11 is laminated on the printed wiring board 12 so as to cover the SAW filter 13, and the SAW filter 13 is resin-sealed with the resin sheet 11 (see FIG. 2B).
- the resin sheet 11 functions as a sealing resin for protecting the SAW filter 13 and its accompanying elements from the external environment.
- the method of laminating the resin sheet 11 on the printed wiring board 12 is not particularly limited, and can be performed by a known method such as hot press or laminator.
- hot press conditions the temperature is, for example, 40 to 100 ° C., preferably 50 to 90 ° C.
- the pressure is, for example, 0.1 to 10 MPa, preferably 0.5 to 8 MPa
- the time is, for example, 0.3 to 10 minutes, preferably 0.5 to 5 minutes.
- it is preferable to press under reduced pressure conditions for example, 0.1 to 5 kPa).
- sealing body forming process In the sealing body forming step, the resin sheet 11 is thermally cured to form the sealing body 15 (see FIG. 2B).
- the heating temperature is preferably 100 ° C or higher, more preferably 120 ° C or higher.
- the upper limit of the heating temperature is preferably 200 ° C. or lower, more preferably 180 ° C. or lower.
- the heating time is preferably 10 minutes or more, more preferably 30 minutes or more.
- the upper limit of the heating time is preferably 180 minutes or less, more preferably 120 minutes or less.
- you may pressurize as needed Preferably it is 0.1 Mpa or more, More preferably, it is 0.5 Mpa or more.
- the upper limit is preferably 10 MPa or less, more preferably 5 MPa or less.
- a substrate mounting step can be performed in which rewiring and bumps are formed on the electronic device package 18 and mounted on a separate substrate (not shown).
- a known apparatus such as a flip chip bonder or a die bonder can be used.
- Epoxy resin 1 YSLV-80XY manufactured by Nippon Steel Chemical Co., Ltd. (bisphenol F type epoxy resin, epkin equivalent 200 g / eq. Softening point 80 ° C.)
- Epoxy resin 2 EPPN-501HY (triphenylmethane type epoxy resin) manufactured by Nippon Kayaku Co., Ltd.
- Epoxy resin 3 YL980 (bisphenol A type epoxy resin) manufactured by Mitsubishi Chemical Corporation Phenol resin 1: MEH-7851-SS manufactured by Meiwa Kasei Co., Ltd.
- Phenol resin 2 ND564 manufactured by Showa Polymer Co., Ltd.
- Thermoplastic resin 1 SIBSTER 072T (styrene-isobutylene-styrene block copolymer) manufactured by Kaneka Corporation
- Thermoplastic resin 2 SG-P3 manufactured by Nagase ChemteX Corporation
- Silane coupling agent treated filler FB-9454FC (fused spherical silica, average primary particle size 20 ⁇ m) manufactured by Denki Kagaku Kogyo Co., Ltd.
- Carbon black # 20 manufactured by Mitsubishi Chemical Flame retardant: FP-100 manufactured by Fushimi Pharmaceutical (phosphazene flame retardant: compound represented by formula (4)) (In the formula, m represents an integer of 3 to 4.)
- Curing accelerator 1 TPP-K (tetraphenylphosphonium tetraphenylborate) manufactured by Hokuko Chemical Co., Ltd.
- Curing accelerator 2 TPP-MK (tetraphenylphosphonium tetra-p-tolylborate) manufactured by Hokuko Chemical Co., Ltd.
- Examples 1-2 and Comparative Example 2 Each component was blended according to the blending ratio shown in Table 1, and melt-kneaded in a roll kneader at 60 to 120 ° C. for 10 minutes under reduced pressure conditions (0.01 kg / cm 2 ) to prepare a kneaded product. Subsequently, the obtained kneaded material was formed into a sheet shape by a flat plate pressing method to produce a resin sheet having a thickness of 200 ⁇ m.
- the cross section (cross section cut in the thickness direction) of the resin sheet was observed with an SEM, and the presence or absence of aggregates of 300 ⁇ m or more was confirmed. Further, a sample having a size of 20 mm ⁇ 20 mm ⁇ thickness of 200 ⁇ m was cut out from the resin sheet, and this was baked in an electric furnace at 700 ° C. for 1 hour to decompose organic components. About the remaining inorganic content, the presence or absence of the aggregate of 300 micrometers or more was confirmed by the particle size distribution measurement. In both the SEM observation and the particle size distribution measurement, a case where an aggregate of 300 ⁇ m or more was not confirmed was judged as ⁇ (good). The case where an aggregate was confirmed by any method was determined as x (bad).
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Abstract
Description
85℃、85%RHの雰囲気下で168時間放置した後の吸水率は、実施例に記載の方法で測定できる。 The
The water absorption after standing for 168 hours in an atmosphere of 85 ° C. and 85% RH can be measured by the method described in Examples.
なお、平均一次粒子径は、例えば、母集団から任意に抽出される試料を用い、レーザー回折散乱式粒度分布測定装置を用いて測定することにより導き出すことができる。 The average primary particle diameter of the filler is preferably 1 μm or more, more preferably 5 μm or more. When it is 1 μm or more, it is easy to obtain flexibility and flexibility of the resin sheet. The average primary particle diameter of the filler is preferably 40 μm or less, more preferably 30 μm or less. When it is 40 μm or less, it is easy to increase the filling rate of the filler.
The average primary particle diameter can be derived by, for example, using a sample arbitrarily extracted from the population and measuring it using a laser diffraction / scattering particle size distribution measuring apparatus.
シリカは通常、比重2.2g/cm3であるので、シリカの含有量(重量%)の好適範囲は例えば以下のとおりである。
すなわち、樹脂シート11中のシリカの含有量は、81重量%以上が好ましく、84重量%以上がより好ましい。樹脂シート11中のシリカの含有量は、94重量%以下が好ましく、91重量%以下がより好ましい。 The filler content can also be explained by using “% by weight” as a unit. Typically, the content of silica will be described in units of “% by weight”.
Since silica usually has a specific gravity of 2.2 g / cm 3 , the preferred range of the silica content (% by weight) is, for example, as follows.
That is, the content of silica in the
すなわち、樹脂シート11中のアルミナの含有量は、88重量%以上が好ましく、90重量%以上がより好ましい。樹脂シート11中のアルミナの含有量は、97重量%以下が好ましく、95重量%以下がより好ましい。 Since alumina usually has a specific gravity of 3.9 g / cm 3 , the preferred range of the alumina content (% by weight) is, for example, as follows.
That is, the content of alumina in the
(式中、R1及びR2は、同一若しくは異なって、アルコキシ基、フェノキシ基、アミノ基、水酸基、アリル基又はこれらの基からなる群より選択される少なくとも1種の基を有する1価の有機基を表す。xは3~25の整数を表す。)
(Wherein R 1 and R 2 are the same or different and are monovalent having at least one group selected from the group consisting of an alkoxy group, a phenoxy group, an amino group, a hydroxyl group, an allyl group, or these groups) Represents an organic group, x represents an integer of 3 to 25)
(式中、R3及びR5は、同一若しくは異なって、アルコキシ基、フェノキシ基、アミノ基、水酸基、アリル基又はこれらの基からなる群より選択される少なくとも1種の基を有する1価の有機基を表す。R4は、アルコキシ基、フェノキシ基、アミノ基、水酸基及びアリル基からなる群より選択される少なくとも1種の基を有する2価の有機基を表す。yは3~25の整数を表す。zは3~25の整数を表す。)
(Wherein R 3 and R 5 are the same or different and are monovalent having at least one group selected from the group consisting of an alkoxy group, a phenoxy group, an amino group, a hydroxyl group, an allyl group, or these groups) R 4 represents an organic group, R 4 represents a divalent organic group having at least one group selected from the group consisting of an alkoxy group, a phenoxy group, an amino group, a hydroxyl group and an allyl group, and y represents 3 to 25 Represents an integer, and z represents an integer of 3 to 25.)
(式中、R11は、水素、水酸基、アルキル基、アルコキシ基、グリシジル基又はこれらの基からなる群より選択される少なくとも1種の基を有する1価の有機基を表す。) Examples of the phenoxy group for R 1 and R 2 include a group represented by the formula (3).
(In the formula, R 11 represents hydrogen, a hydroxyl group, an alkyl group, an alkoxy group, a glycidyl group, or a monovalent organic group having at least one group selected from the group consisting of these groups.)
しかし、樹脂シート11はシート状であるので、従来のタブレット状の封止樹脂のように、離型剤を配合する必要がない。また、配合せずとも、低吸湿性を達成できる。このため、樹脂シート11中の離型剤の含有量は、例えば1重量%以下が好ましく、離型剤を含まないことがより好ましい。 The
However, since the
15分間である。 Specifically, the above-described components (for example, filler, epoxy resin, phenol resin, thermoplastic resin, and curing accelerator) are melt-kneaded with a known kneader such as a mixing roll, a pressure kneader, or an extruder. The kneaded material is prepared by the above, and the obtained kneaded material is plastically processed into a sheet shape. As the kneading conditions, the temperature is preferably equal to or higher than the softening point of each component described above, for example, 30 to 150 ° C., and preferably 40 to 140 ° C., more preferably 60 to 120 in consideration of the thermosetting property of the epoxy resin. ° C. The time is, for example, 1 to 30 minutes, preferably 5 to
15 minutes.
図2A~2Cはそれぞれ、本発明の一実施形態に係る電子デバイスパッケージの製造方法の一工程を模式的に示す図である。本実施形態では、プリント配線基板12上に搭載されたSAWフィルタ13を樹脂シート11により中空封止して電子デバイスパッケージ18を作製する。 [Method of manufacturing electronic device package]
2A to 2C are diagrams each schematically showing one step of a method for manufacturing an electronic device package according to an embodiment of the present invention. In the present embodiment, the
SAWフィルタ搭載基板準備工程では、複数のSAWフィルタ13が搭載されたプリント配線基板12を準備する(図2A参照)。SAWフィルタ13は、所定の櫛形電極が形成された圧電結晶を公知の方法でダイシングして個片化することにより形成できる。SAWフィルタ13のプリント配線基板12への搭載には、フリップチップボンダーやダイボンダーなどの公知の装置を用いることができる。SAWフィルタ13とプリント配線基板12とはバンプなどの突起電極13aを介して電気的に接続されている。また、SAWフィルタ13とプリント配線基板12との間は、SAWフィルタ表面での表面弾性波の伝播を阻害しないように中空部分14を維持するようになっている。SAWフィルタ13とプリント配線基板12との間の距離は適宜設定でき、一般的には15~50μm程度である。 (SAW filter mounting substrate preparation process)
In the SAW filter mounting board preparing step, a printed
封止工程では、SAWフィルタ13を覆うようにプリント配線基板12へ樹脂シート11を積層し、SAWフィルタ13を樹脂シート11で樹脂封止する(図2B参照)。樹脂シート11は、SAWフィルタ13及びそれに付随する要素を外部環境から保護するための封止樹脂として機能する。 (Sealing process)
In the sealing step, the
封止体形成工程では、樹脂シート11を熱硬化処理して封止体15を形成する(図2B参照)。 (Sealing body forming process)
In the sealing body forming step, the
続いて、封止体15のダイシングを行ってもよい(図2C参照)。これにより、SAWフィルタ13単位での電子デバイスパッケージ18を得ることができる。 (Dicing process)
Subsequently, dicing of the sealing
必要に応じて、電子デバイスパッケージ18に対して再配線及びバンプを形成し、これを別途の基板(図示せず)に実装する基板実装工程を行うことができる。電子デバイスパッケージ18の基板への実装には、フリップチップボンダーやダイボンダーなどの公知の装置を用いることができる。 (Board mounting process)
If necessary, a substrate mounting step can be performed in which rewiring and bumps are formed on the
エポキシ樹脂1:新日鐵化学(株)製のYSLV-80XY(ビスフェノールF型エポキシ樹脂、エポキン当量200g/eq.軟化点80℃)
エポキシ樹脂2:日本化薬(株)製のEPPN-501HY(トリフェニルメタン型エポキシ樹脂)
エポキシ樹脂3:三菱化学(株)製のYL980(ビスフェノールA型エポキシ樹脂)
フェノール樹脂1:明和化成社製のMEH-7851-SS(ビフェニルアラルキル骨格を有するフェノール樹脂、水酸基当量203g/eq.、軟化点67℃)
フェノール樹脂2:昭和高分子(株)製のND564
熱可塑性樹脂1:カネカ社製のSIBSTER 072T(スチレン-イソブチレン-スチレンブロック共重合体)
熱可塑性樹脂2:ナガセケムテックス(株)製のSG-P3
シランカップリング剤処理フィラー:電気化学工業社製のFB-9454FC(溶融球状シリカ、平均一次粒子径20μm)を信越化学社製のKBM-403(3-グリシドキシプロピルトリメトキシシラン)で処理したもの(FB-9454FC 88.0重量部に対して、KBM-403 0.3重量部の割合で処理)
未処理フィラー:電気化学工業社製のFB-9454FC(溶融球状シリカ、平均一次粒子径20μm)
シランカップリング剤:信越化学社製のKBM-403(3-グリシドキシプロピルトリメトキシシラン)
カーボンブラック:三菱化学社製の#20
難燃剤:伏見製薬所製のFP-100(ホスファゼン系難燃剤:式(4)で表される化
合物)
(式中、mは3~4の整数を表す。)
硬化促進剤1:北興化学工業社製のTPP-K(テトラフェニルホスホニウム・テトラフェニルボレート)
硬化促進剤2:北興化学工業社製のTPP-MK(テトラフェニルホスホニウムテトラ-p-トリルボレート) The components used in the examples will be described.
Epoxy resin 1: YSLV-80XY manufactured by Nippon Steel Chemical Co., Ltd. (bisphenol F type epoxy resin, epkin equivalent 200 g / eq. Softening point 80 ° C.)
Epoxy resin 2: EPPN-501HY (triphenylmethane type epoxy resin) manufactured by Nippon Kayaku Co., Ltd.
Epoxy resin 3: YL980 (bisphenol A type epoxy resin) manufactured by Mitsubishi Chemical Corporation
Phenol resin 1: MEH-7851-SS manufactured by Meiwa Kasei Co., Ltd. (phenol resin having a biphenylaralkyl skeleton, hydroxyl group equivalent 203 g / eq., Softening point 67 ° C.)
Phenol resin 2: ND564 manufactured by Showa Polymer Co., Ltd.
Thermoplastic resin 1: SIBSTER 072T (styrene-isobutylene-styrene block copolymer) manufactured by Kaneka Corporation
Thermoplastic resin 2: SG-P3 manufactured by Nagase ChemteX Corporation
Silane coupling agent treated filler: FB-9454FC (fused spherical silica, average primary particle size 20 μm) manufactured by Denki Kagaku Kogyo Co., Ltd. was treated with KBM-403 (3-glycidoxypropyltrimethoxysilane) manufactured by Shin-Etsu Chemical Co., Ltd. Material (treated at a ratio of 0.3 part by weight of KBM-403 to 88.0 parts by weight of FB-9454FC)
Untreated filler: FB-9454FC manufactured by Denki Kagaku Kogyo Co., Ltd. (fused spherical silica, average primary particle size 20 μm)
Silane coupling agent: KBM-403 (3-glycidoxypropyltrimethoxysilane) manufactured by Shin-Etsu Chemical Co., Ltd.
Carbon black: # 20 manufactured by Mitsubishi Chemical
Flame retardant: FP-100 manufactured by Fushimi Pharmaceutical (phosphazene flame retardant: compound represented by formula (4))
(In the formula, m represents an integer of 3 to 4.)
Curing accelerator 1: TPP-K (tetraphenylphosphonium tetraphenylborate) manufactured by Hokuko Chemical Co., Ltd.
Curing accelerator 2: TPP-MK (tetraphenylphosphonium tetra-p-tolylborate) manufactured by Hokuko Chemical Co., Ltd.
表1に記載の配合比に従い、各成分を配合し、ロール混練機により60~120℃、10分間、減圧条件下(0.01kg/cm2)で溶融混練し、混練物を調製した。次いで、得られた混練物を、平板プレス法により、シート状に形成して、厚さ200μmの樹脂シートを作製した。 Examples 1-2 and Comparative Example 2
Each component was blended according to the blending ratio shown in Table 1, and melt-kneaded in a roll kneader at 60 to 120 ° C. for 10 minutes under reduced pressure conditions (0.01 kg / cm 2 ) to prepare a kneaded product. Subsequently, the obtained kneaded material was formed into a sheet shape by a flat plate pressing method to produce a resin sheet having a thickness of 200 μm.
樹脂シートからサイズ20mm×20mm×厚さ200μmのサンプルを切り出し、これを120℃の真空乾燥機中で、3時間放置して乾燥させた。その後、デシケータ中で放冷し、サンプルの乾燥重量M1を測定した。次に、85℃、85%RHの雰囲気下にある恒温恒湿槽中に168時間放置し、サンプルを吸湿させてから取り出し秤量した。秤量値が一定になったときの重量をM2とした。測定したM1及びM2から、下記式に基づき吸水率を算出した。
吸水率(重量%)=[(M2-M1)/M1]×100 [Water absorption rate]
A sample of size 20 mm × 20 mm × thickness 200 μm was cut out from the resin sheet, and this was left to dry in a vacuum dryer at 120 ° C. for 3 hours. Then, it stood to cool in a desiccator and measured the dry weight M1 of the sample. Next, the sample was left in a constant temperature and humidity chamber under an atmosphere of 85 ° C. and 85% RH for 168 hours, and the sample was taken out and weighed. The weight when the weighing value became constant was defined as M2. The water absorption was calculated from the measured M1 and M2 based on the following formula.
Water absorption rate (% by weight) = [(M2-M1) / M1] × 100
樹脂シートの断面(厚さ方向に切断した断面)をSEM観察し、300μm以上の凝集物の有無を確認した。
また、樹脂シートからサイズ20mm×20mm×厚さ200μmのサンプルを切り出し、これを電気炉にて700℃で1時間焼いて有機分を分解した。残った無機分について、粒度分布測定により300μm以上の凝集物の有無を確認した。
SEM観察及び粒度分布測定の両方において、300μm以上の凝集物が確認されなかった場合を○(良好)と判定した。いずれかの方法で凝集物が確認された場合を×(不良)と判定した。 [Filler dispersibility]
The cross section (cross section cut in the thickness direction) of the resin sheet was observed with an SEM, and the presence or absence of aggregates of 300 μm or more was confirmed.
Further, a sample having a size of 20 mm × 20 mm × thickness of 200 μm was cut out from the resin sheet, and this was baked in an electric furnace at 700 ° C. for 1 hour to decompose organic components. About the remaining inorganic content, the presence or absence of the aggregate of 300 micrometers or more was confirmed by the particle size distribution measurement.
In both the SEM observation and the particle size distribution measurement, a case where an aggregate of 300 μm or more was not confirmed was judged as ◯ (good). The case where an aggregate was confirmed by any method was determined as x (bad).
表1に記載の配合比に従い、各成分を配合し、これに各成分の総量と同量のメチルエチルケトンを添加して、ワニスを調製した。得られたワニスを、コンマコ―タ-により、厚み50μmのポリエステルフィルムA(三菱化学ポリエステル社製、MRF-50)の剥離処理面上に、乾燥後の厚みが50μmとなるように塗工し、乾燥させた。次いで、厚み38μmのポリエステルフィルムB(三菱化学ポリエステル社製、MRF-38)の剥離処理面を、乾燥後のワニス上に張り合わせて、薄膜樹脂シートを調製した。
その後、ポリエステルフィルムAおよびポリエステルフィルムBを適宜剥離しながら、ロールラミネ―タ―により、薄膜樹脂シートを4枚積層することにより、厚み200μmの樹脂シートを調製した。 Comparative Example 1
Each component was blended according to the blending ratio shown in Table 1, and the same amount of methyl ethyl ketone as the total amount of each component was added thereto to prepare a varnish. The obtained varnish was coated on a release-treated surface of a 50 μm thick polyester film A (MRF-50, manufactured by Mitsubishi Chemical Polyester Co., Ltd.) with a comma coater so that the thickness after drying was 50 μm. Dried. Next, the peel-treated surface of a 38 μm thick polyester film B (MRF-38, manufactured by Mitsubishi Chemical Polyester) was laminated on the varnish after drying to prepare a thin film resin sheet.
Then, while peeling the polyester film A and the polyester film B as appropriate, four thin film resin sheets were laminated by a roll laminator to prepare a resin sheet having a thickness of 200 μm.
11a 支持体
13 SAWフィルタ
14 中空部分
15 封止体
18 電子デバイスパッケージ DESCRIPTION OF
Claims (4)
- フィラーを含み、
85℃、85%RHの雰囲気下で168時間放置した後の吸水率が0.3重量%以下であり、
前記フィラーが実質的に一次粒子の状態で分散している電子デバイス封止用樹脂シート。 Including fillers,
The water absorption after standing for 168 hours in an atmosphere of 85 ° C. and 85% RH is 0.3% by weight or less,
An electronic device sealing resin sheet in which the filler is substantially dispersed in a primary particle state. - 前記フィラーが、シランカップリング剤により処理されたものである請求項1に記載の電子デバイス封止用樹脂シート。 The resin sheet for sealing an electronic device according to claim 1, wherein the filler is treated with a silane coupling agent.
- 前記電子デバイス封止用樹脂シート中の前記フィラーの含有量が70~90体積%である請求項1又は2に記載の電子デバイス封止用樹脂シート。 The resin sheet for sealing an electronic device according to claim 1 or 2, wherein the content of the filler in the resin sheet for sealing an electronic device is 70 to 90% by volume.
- 1又は複数の電子デバイスを覆うように請求項1~3のいずれかに記載の電子デバイス封止用樹脂シートを前記電子デバイス上に積層する積層工程、及び
前記電子デバイス封止用樹脂シートを硬化させて封止体を形成する封止体形成工程を含む電子デバイスパッケージの製造方法。
A lamination step of laminating the electronic device sealing resin sheet according to any one of claims 1 to 3 on the electronic device so as to cover one or a plurality of electronic devices, and curing the electronic device sealing resin sheet An electronic device package manufacturing method including a sealing body forming step of forming a sealing body.
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2013
- 2013-03-28 JP JP2013069876A patent/JP5793160B2/en active Active
-
2014
- 2014-03-20 WO PCT/JP2014/057691 patent/WO2014156927A1/en active Application Filing
- 2014-03-20 KR KR1020157022302A patent/KR20150136472A/en not_active Application Discontinuation
- 2014-03-20 SG SG11201507887YA patent/SG11201507887YA/en unknown
- 2014-03-20 CN CN201480018974.0A patent/CN105102512A/en active Pending
- 2014-03-25 TW TW103111071A patent/TWI614292B/en active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2000336250A (en) * | 1999-05-28 | 2000-12-05 | Toray Ind Inc | Epoxy-based resin composition |
JP2001114994A (en) * | 1999-08-06 | 2001-04-24 | Toray Ind Inc | Epoxy resin composition and semiconductor device |
JP2002053737A (en) * | 2000-08-09 | 2002-02-19 | Nitto Denko Corp | Epoxy resin composition for sealing semiconductor and semiconductor device made by using it |
JP2008285593A (en) * | 2007-05-17 | 2008-11-27 | Nitto Denko Corp | Sealing thermosetting type adhesion sheet |
Also Published As
Publication number | Publication date |
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TW201508018A (en) | 2015-03-01 |
JP5793160B2 (en) | 2015-10-14 |
CN105102512A (en) | 2015-11-25 |
SG11201507887YA (en) | 2015-11-27 |
TWI614292B (en) | 2018-02-11 |
JP2014189791A (en) | 2014-10-06 |
KR20150136472A (en) | 2015-12-07 |
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