WO2014132858A1 - Memory module - Google Patents

Memory module Download PDF

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WO2014132858A1
WO2014132858A1 PCT/JP2014/053896 JP2014053896W WO2014132858A1 WO 2014132858 A1 WO2014132858 A1 WO 2014132858A1 JP 2014053896 W JP2014053896 W JP 2014053896W WO 2014132858 A1 WO2014132858 A1 WO 2014132858A1
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memory module
transmission line
wiring
terminal
dram
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PCT/JP2014/053896
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French (fr)
Japanese (ja)
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匡顕 吉村
大野 隆夫
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ピーエスフォー ルクスコ エスエイアールエル
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Publication of WO2014132858A1 publication Critical patent/WO2014132858A1/en

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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38Information transfer, e.g. on bus
    • G06F13/40Bus structure
    • G06F13/4063Device-to-bus coupling
    • G06F13/4068Electrical coupling
    • G06F13/4072Drivers or receivers

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  • the present invention relates to a memory module on which a plurality of memory chips are mounted.
  • a termination resistor element is installed at one end of the transmission line in order to reduce the fact that a signal transmitted at high speed is reflected on the transmission line and disturbs the signal waveform.
  • a technique for connecting and reducing a reflected signal is considered (for example, see Patent Document 1).
  • DDR4 DRAM Double Data Rate 4 Dynamic Access Memory
  • CRC Cyclic Redundancy Check
  • parity check error to the outside of the DRAM as an alert signal.
  • Such a DDR4 DRAM is provided with an alert pin as an output terminal for outputting an alert signal.
  • FIG. 1 is a diagram showing an example of connections on a memory module substrate on which a plurality of DRAMs having an alert signal output function are mounted.
  • the transmission line of the CA (Column Address) signal and the CTRL (Control) signal input from the outside of the memory module 1000 is one stroke.
  • the writing is connected to an input terminal and an input terminal 1002 provided in each of the DRAMs 2000-1 to 2000-9.
  • the transmission line is connected to the terminating resistor 3000 at the end of the DRAM 2000-9 which is the farthest end from the input terminal 1002.
  • the alert signal transmission line for each of the DRAMs 2000-1 to 2000-9 to notify the occurrence of an error is connected to the alert terminal and the output terminal 1001 provided in each of the DRAMs 2000-1 to 2000-9 in a single stroke. Yes.
  • the alert signal output from the DRAMs 2000-1 to 2000-9 is output from the output terminal 1001 provided in the memory module 1000 to the memory controller.
  • the alert signal is reflected on the transmission line.
  • the alert signal when an alert signal is output from the alert terminal of the DRAM 2000-9, the alert signal propagates in the direction of the output terminal 1001 and also in the direction of the DRAM 2000-8. Then, the alert signal propagated in the direction of the DRAM 2000-8 is reflected by the DRAM 2000-1 and propagates in the direction of the output terminal 1001. Due to this reflection, the alert signal output from the output terminal 1001 is disturbed and the alert signal is delayed.
  • the memory module of the present invention includes A loop-shaped transmission line having a plurality of memory chips mounted therein and connected in common with an alert terminal provided in each of the plurality of memory chips to notify that the plurality of memory chips have detected a predetermined error
  • a first connection point on the transmission line and an output terminal are connected via a first resistance element, and the second connection point is the farthest end on the transmission line from the first connection point.
  • a substrate A plurality of first terminals mounted on the substrate, each having a first terminal for outputting a passive signal based on a command signal from the outside, and a second terminal for outputting an active signal not based on the command signal
  • a memory chip Among a plurality of terminals provided in the plurality of memory chips, a transmission line that connects the second terminals in common, A resistance element connected between the transmission line and a wiring for supplying a predetermined potential formed on the substrate;
  • a memory module comprising: the transmission line; and a wiring formed on the substrate and connected to an output terminal that can be connected to the outside.
  • the alert terminals provided in each of the plurality of memory chips mounted on the memory module are connected by the loop-shaped transmission line, and the first connection point on the transmission line and the memory module are connected.
  • the output terminal is connected via a resistance element, and the second connection point that is the farthest end on the transmission line from the first connection point and the power source are connected via the resistance element. Disturbance of the waveform of the alert signal output from can be improved, and the delay of the alert signal can be improved.
  • FIG. 3 is a diagram illustrating an example of an internal configuration of a memory module illustrated in FIG. 2.
  • FIG. 3 is a diagram illustrating an example of wiring in the memory module illustrated in FIG. 2. It is a figure which shows the wiring length of each wiring used for observation. It is a figure which shows the observation result of the signal waveform in a memory controller when an alert signal is output from DRAM. It is a figure which shows the observation result of the signal waveform in a memory controller when an alert signal is output from DRAM. It is a figure which shows the observation result of the signal waveform in a memory controller when an alert signal is output from DRAM. It is a figure which shows the observation result of the signal waveform in a memory controller when an alert signal is output from DRAM. It is a figure which shows the example of application of the memory module of this invention.
  • the point of the present invention lies in the alert signal output from each DRAM, the data input / output wiring connected to the corresponding DQ terminal of each DRAM, and the command / address commonly connected to each DRAM by fly-by.
  • the CA system wiring for transmitting the system signals and the CTL system wiring for transmitting the control system signals are not shown in the drawing.
  • the data input / output wiring transmits data bidirectionally, and the CA system wiring and the control system wiring transmit data in one direction from the memory controller to the memory, as shown in FIG. It shall be present as well.
  • the data input / output wiring is a bidirectional wiring that transmits a data signal for reading or writing in accordance with a Read / Write command.
  • the CA wiring is a wiring for transmitting a command / address signal from the memory controller to each DRAM in one direction, and its termination is the same as that shown in FIG. 1 for preventing reflection of the command / address signal. Further, it is assumed that a termination resistor is provided.
  • the memory module 100 of the present invention and the memory controller 300 that controls the memory module 100 are connected via an output terminal 101 provided in the memory module 100. From the output terminal 101, an alert signal (Alert_n) output from a DRAM mounted (mounted) in the memory module 100 is output.
  • Alert_n an alert signal
  • DRAMs 200-1 to 200-9 which are a plurality of memory chips, are mounted. Each of the DRAMs 200-1 to 200-9 has alert terminals 201-1 to 201-9 for outputting an alert signal.
  • a loop-shaped transmission line formed on the memory module 100 is connected to each of the alert terminals 201-1 to 201-9.
  • connection point 104 on the transmission line and the output terminal 101 are connected via a resistance element 102 (first resistance element).
  • connection point 105 which is the farthest end from the connection point 104 on the transmission line is connected to the power source (VDD) via the resistance element 103 (second resistance element).
  • the memory controller is used to fix the transmission line to the power supply voltage (VDD) and when the alert signal is output. It plays a role of ensuring a sufficient voltage drop for judgment on the side.
  • the resistance element 103 is usually configured by an open drain transistor. This alert signal is a signal notifying that the DRAMs 200-1 to 200-9 have detected a predetermined error.
  • FIG. 4 is a diagram showing an example of wiring in the memory module 100 shown in FIG.
  • the DRAMs 200-1 to 200-9 are each composed of DRAMs 200-1F to 200-9F mounted on the front side of the substrate and DRAMs 200-1B to 200-9B mounted on the rear side of the substrate. Will be described as an example.
  • an alert terminal 201-1 for outputting an alert signal from the DRAM 200-1F and the DRAM 200-1B and an alert terminal 201-2 for outputting an alert signal from the DRAM 200-2F and the DRAM 200-2B are provided. They are connected by wiring TL10.
  • An alert terminal 201-2 that outputs an alert signal from the DRAM 200-2F and the DRAM 200-2B and an alert terminal 201-3 that outputs an alert signal from the DRAM 200-3F and the DRAM 200-3B are connected by a wiring TL9. ing.
  • An alert terminal 201-3 that outputs an alert signal from the DRAM 200-3F and the DRAM 200-3B and an alert terminal 201-4 that outputs an alert signal from the DRAM 200-4F and the DRAM 200-4B are connected by a wiring TL8.
  • An alert terminal 201-4 that outputs an alert signal from the DRAM 200-4F and the DRAM 200-4B and an alert terminal 201-5 that outputs an alert signal from the DRAM 200-5F and the DRAM 200-5B are connected by a wiring TL7.
  • An alert terminal 201-5 that outputs an alert signal from the DRAM 200-5F and the DRAM 200-5B and an alert terminal 201-6 that outputs an alert signal from the DRAM 200-6F and the DRAM 200-6B are connected by a wiring TL6.
  • An alert terminal 201-6 that outputs an alert signal from the DRAM 200-6F and DRAM 200-6B and an alert terminal 201-7 that outputs an alert signal from the DRAM 200-7F and DRAM 200-7B are connected by a wiring TL5.
  • an alert terminal 201-7 that outputs an alert signal from the DRAM 200-7F and DRAM 200-7B and an alert terminal 201-8 that outputs an alert signal from the DRAM 200-8F and DRAM 200-8B are connected by a wiring TL4.
  • an alert terminal 201-8 that outputs an alert signal from the DRAM 200-8F and DRAM 200-8B and an alert terminal 201-9 that outputs an alert signal from the DRAM 200-9F and DRAM 200-9B are connected by a wiring TL3.
  • the alert terminal 201-9 that outputs an alert signal from the DRAM 200-9F and the DRAM 200-9B and the connection point 104 are connected by a wiring TL2. Further, the connection point 104 and the resistance element 102 are connected by a wiring TL1. Further, the connection point 104 and the alert terminal 201-1 that outputs an alert signal from the DRAM 200-1F and the DRAM 200-1B are connected by a wiring TL_RTT. Further, the wirings TL2 to TL10 and the wiring TL_RTT form a loop-shaped transmission line.
  • the following shows the signal waveform observation results in the memory controller 300 when an alert signal is output from the DRAM.
  • the resistance values of the resistance elements 102 and 103 were set to 25 ohms.
  • the wiring length of the wiring TL12 from the alert terminal to each of the alert terminals 201-1 to 201-9 is set to the value shown in FIG.
  • FIG. 5 is a diagram showing the wiring length of each wiring used for observation.
  • the wiring length of the wiring TL1 was 15.2 mm. Further, the wiring length of the wiring TL2 was set to 13.7 mm. Further, the wiring length of the wiring TL3 was set to 29.9 mm. Further, the wiring length of the wiring TL4 was set to 20.0 mm. Further, the wiring length of the wiring TL5 was set to 27.2 mm. Further, the wiring length of the wiring TL6 was set to 12.8 mm. Further, the wiring length of the wiring TL7 was set to 12.8 mm. Further, the wiring length of the wiring TL8 was set to 21.4 mm. Further, the wiring length of the wiring TL9 was set to 11.7 mm.
  • the wiring length of the wiring TL10 was set to 24.6 mm. Further, the wiring length of the wiring TL11 was set to 4.1 mm. Further, the wiring length of the wiring TL12 was set to 6.5 mm. The wiring length of the wiring TL_RTT is 10 mm.
  • FIG. 6 is a diagram showing signal waveform observation results in the memory controller 300 when an alert signal is output from the DRAM 200-1F.
  • FIG. 7 is a diagram showing a signal waveform observation result in the memory controller 300 when an alert signal is output from the DRAM 200-3F.
  • FIG. 8 is a diagram showing a signal waveform observation result in the memory controller 300 when an alert signal is output from the DRAM 200-5F.
  • the disturbance of the alert signal waveform output from the memory module 100 can be improved.
  • FIG. 9 is a diagram showing an application example of the memory module of the present invention.
  • each of a plurality of electronic components 400 corresponding to the memory module of the present invention is branched from a transmission line between a receiver-side device 500 corresponding to a memory controller and a resistance element 600 that is a termination resistor. Connected in form.
  • the number of electronic components 400 is not defined. Further, the number of branches from one branch point on the transmission line is not specified.
  • the alert signal issued from the DRAM has been described as an object.
  • any signal can be applied as long as the signal is actively issued from the DRAM to the memory controller.
  • the data signal output from the DRAM to the memory controller is a signal based on the command signal from the memory controller and is a passive signal, and thus does not correspond to the signal issued actively.

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Abstract

Alert terminals ((201-1) to (201-9)) provided on each DRAM ((200-1) to (200-9)) mounted on this memory module (100) are connected with a loop-shape transmission line. A connection point (104) on the transmission line and an output terminal (101) are connected via a resistance element (102), and a power source and a connection point (105) which is the terminal on the transmission line furthest from the connection point (104) are connected via a resistance element (103).

Description

メモリモジュールMemory module
 本発明は、複数のメモリチップが実装されたメモリモジュールに関する。 The present invention relates to a memory module on which a plurality of memory chips are mounted.
 複数のメモリリップが実装されるメモリモジュールにおいて、高速で送信されてくる信号が伝送線路上で反射して信号波形を乱してしまうことを軽減するために、伝送線路の一端に終端抵抗素子を接続し、反射信号を低減する技術が考えられている(例えば、特許文献1参照。)。 In a memory module in which multiple memory lips are mounted, a termination resistor element is installed at one end of the transmission line in order to reduce the fact that a signal transmitted at high speed is reflected on the transmission line and disturbs the signal waveform. A technique for connecting and reducing a reflected signal is considered (for example, see Patent Document 1).
 また、近年、メモリデバイスには、情報を記憶する以外の機能として、様々な機能が具備されている。例えば、メモリモジュールの1つであるDDR4DRAM(Double Data Rate 4 Dynamic Random Access Memory)に、CRC(Cyclic Redundancy Check)エラーやパリティチェックエラー等のエラー発生をDRAM外へアラート信号として出力する機能があらたに設けられている。このようなDDR4DRAMには、アラート信号を出力するための出力端子としてアラートピンが設けられている。 In recent years, memory devices have various functions as functions other than storing information. For example, DDR4 DRAM (Double Data Rate 4 Dynamic Access Memory), which is one of the memory modules, has a function to output an error occurrence such as CRC (Cyclic Redundancy Check) error or parity check error to the outside of the DRAM as an alert signal. Is provided. Such a DDR4 DRAM is provided with an alert pin as an output terminal for outputting an alert signal.
 図1は、アラート信号の出力機能を具備したDRAMが複数実装されたメモリモジュール基板上の接続の一例を示す図である。 FIG. 1 is a diagram showing an example of connections on a memory module substrate on which a plurality of DRAMs having an alert signal output function are mounted.
 図1に示すように、DRAM2000-1~2000-9が実装されたメモリモジュール1000において、メモリモジュール1000の外部から入力されるCA(Column Address)信号やCTRL(Control)信号の伝送線路は、一筆書きで各DRAM2000-1~2000-9それぞれに設けられた入力端子および入力端子1002と接続されている。また、当該伝送線路は、入力端子1002から最遠端となるDRAM2000-9の先で終端抵抗3000と接続されている。一方、DRAM2000-1~2000-9それぞれがエラー発生を通知するためのアラート信号の伝送線路は、一筆書きでDRAM2000-1~2000-9それぞれに設けられたアラート端子および出力端子1001と接続されている。これにより、DRAM2000-1~2000-9から出力されたアラート信号は、メモリモジュール1000に設けられた出力端子1001からメモリコントローラへ出力される。 As shown in FIG. 1, in the memory module 1000 in which the DRAMs 2000-1 to 2000-9 are mounted, the transmission line of the CA (Column Address) signal and the CTRL (Control) signal input from the outside of the memory module 1000 is one stroke. The writing is connected to an input terminal and an input terminal 1002 provided in each of the DRAMs 2000-1 to 2000-9. The transmission line is connected to the terminating resistor 3000 at the end of the DRAM 2000-9 which is the farthest end from the input terminal 1002. On the other hand, the alert signal transmission line for each of the DRAMs 2000-1 to 2000-9 to notify the occurrence of an error is connected to the alert terminal and the output terminal 1001 provided in each of the DRAMs 2000-1 to 2000-9 in a single stroke. Yes. As a result, the alert signal output from the DRAMs 2000-1 to 2000-9 is output from the output terminal 1001 provided in the memory module 1000 to the memory controller.
特開2002-23901号公報Japanese Patent Laid-Open No. 2002-23901
 しかしながら、特に上述した伝送線路が長い場合、伝送線路上にアラート信号の反射が生じてしまうという問題点がある。例えば、図1に示した接続において、DRAM2000-9のアラート端子からアラート信号が出力された場合、当該アラート信号は出力端子1001の方向へ伝播すると共にDRAM2000-8の方向へも伝播する。すると、DRAM2000-8の方向へ伝播したアラート信号がDRAM2000-1で反射して出力端子1001の方向へ伝播する。この反射により、出力端子1001から出力されるアラート信号が乱れてしまうと共に、アラート信号が遅延してしまう。 However, particularly when the above-described transmission line is long, there is a problem that the alert signal is reflected on the transmission line. For example, in the connection shown in FIG. 1, when an alert signal is output from the alert terminal of the DRAM 2000-9, the alert signal propagates in the direction of the output terminal 1001 and also in the direction of the DRAM 2000-8. Then, the alert signal propagated in the direction of the DRAM 2000-8 is reflected by the DRAM 2000-1 and propagates in the direction of the output terminal 1001. Due to this reflection, the alert signal output from the output terminal 1001 is disturbed and the alert signal is delayed.
 本発明のメモリモジュールは、
 複数のメモリチップが実装され、該複数のメモリチップが所定のエラーを検出したことを通知するために該複数のメモリチップそれぞれに設けられたアラート端子と共通に接続された、ループ状の伝送線路を有し、該伝送線路上の第1の接続点と出力端子とが第1の抵抗素子を介して接続され、前記第1の接続点から前記伝送線路上で最遠端となる第2の接続点が第2の抵抗素子を介して電源と接続されたメモリモジュール。
The memory module of the present invention includes
A loop-shaped transmission line having a plurality of memory chips mounted therein and connected in common with an alert terminal provided in each of the plurality of memory chips to notify that the plurality of memory chips have detected a predetermined error A first connection point on the transmission line and an output terminal are connected via a first resistance element, and the second connection point is the farthest end on the transmission line from the first connection point. A memory module in which a connection point is connected to a power supply via a second resistance element.
 また、基板と、
 前記基板上に実装され、それぞれが外部からのコマンド信号に基づく受動的な信号を出力する第1の端子および前記コマンド信号に基づかない能動的な信号を出力する第2の端子を備えた複数のメモリチップと、
 前記複数のメモリチップの備える複数の端子のうち、前記第2の端子同士を共通に接続する伝送線路と、
 前記伝送線路と前記基板上に形成された所定の電位を供給する配線との間に接続された抵抗素子と、
 前記伝送線路と基板上に形成され、外部と接続されうる出力端子とを接続する配線とを備えることを特徴とするメモリモジュール。
A substrate;
A plurality of first terminals mounted on the substrate, each having a first terminal for outputting a passive signal based on a command signal from the outside, and a second terminal for outputting an active signal not based on the command signal A memory chip,
Among a plurality of terminals provided in the plurality of memory chips, a transmission line that connects the second terminals in common,
A resistance element connected between the transmission line and a wiring for supplying a predetermined potential formed on the substrate;
A memory module comprising: the transmission line; and a wiring formed on the substrate and connected to an output terminal that can be connected to the outside.
 以上説明したように、本発明においては、メモリモジュールに実装された複数のメモリチップそれぞれに設けられたアラート端子をループ状の伝送線路で接続し、伝送線路上の第1の接続点とメモリモジュールの出力端子とを抵抗素子を介して接続し、第1の接続点から伝送線路上で最遠端となる第2の接続点と電源とを抵抗素子を介して接続する構成としたため、メモリモジュールから出力されるアラート信号の波形の乱れを改善することができ、また、アラート信号の遅延を改善することができる。 As described above, in the present invention, the alert terminals provided in each of the plurality of memory chips mounted on the memory module are connected by the loop-shaped transmission line, and the first connection point on the transmission line and the memory module are connected. The output terminal is connected via a resistance element, and the second connection point that is the farthest end on the transmission line from the first connection point and the power source are connected via the resistance element. Disturbance of the waveform of the alert signal output from can be improved, and the delay of the alert signal can be improved.
アラート信号の出力機能を具備したDRAMが複数実装されたメモリモジュール基板上の接続の一例を示す図である。It is a figure which shows an example of the connection on the memory module board | substrate with which multiple DRAM provided with the output function of an alert signal was mounted. 本発明のメモリモジュールの接続形態の一例を示す図である。It is a figure which shows an example of the connection form of the memory module of this invention. 図2に示したメモリモジュールの内部構成の一例を示す図である。FIG. 3 is a diagram illustrating an example of an internal configuration of a memory module illustrated in FIG. 2. 図2に示したメモリモジュール内の配線の一例を示す図である。FIG. 3 is a diagram illustrating an example of wiring in the memory module illustrated in FIG. 2. 観測に用いた各配線の配線長を示す図である。It is a figure which shows the wiring length of each wiring used for observation. DRAMからアラート信号が出力された場合のメモリコントローラにおける信号波形の観測結果を示す図である。It is a figure which shows the observation result of the signal waveform in a memory controller when an alert signal is output from DRAM. DRAMからアラート信号が出力された場合のメモリコントローラにおける信号波形の観測結果を示す図である。It is a figure which shows the observation result of the signal waveform in a memory controller when an alert signal is output from DRAM. DRAMからアラート信号が出力された場合のメモリコントローラにおける信号波形の観測結果を示す図である。It is a figure which shows the observation result of the signal waveform in a memory controller when an alert signal is output from DRAM. 本発明のメモリモジュールの適用例を示す図である。It is a figure which shows the example of application of the memory module of this invention.
 以下に、本発明の実施の形態について図面を参照して説明する。 Hereinafter, embodiments of the present invention will be described with reference to the drawings.
 なお、本発明のポイントは、各DRAMから出力されるアラート信号にあり、各DRAMの対応するDQ端子に接続されるデータ入出力配線および、各DRAMに共通にフライバイにて接続されるコマンド・アドレス系の信号を伝送するCA系配線およびコントロール系信号を伝送するCTL系配線については、簡単のため、図面には記載していない。ここで、データ入出力配線は双方向にデータを伝送し、CA系配線およびコントロール系配線はメモリコントローラからメモリに対して一方向にデータを伝送する配線であるが、図1に示したものと同様に存在しているものとする。ただし、データ入出力配線は、Read/Writeコマンドに応じて読み出しまたは書き込み用のデータ信号を伝送する双方向の配線である。また、CA系配線は、メモリコントローラから各DRAMへのコマンド・アドレス信号を一方向に伝送する配線であると共に、その終端はコマンド・アドレス信号の反射防止のため、図1に示したものと同様に、終端抵抗が設けられているものとする。 The point of the present invention lies in the alert signal output from each DRAM, the data input / output wiring connected to the corresponding DQ terminal of each DRAM, and the command / address commonly connected to each DRAM by fly-by. For simplicity, the CA system wiring for transmitting the system signals and the CTL system wiring for transmitting the control system signals are not shown in the drawing. Here, the data input / output wiring transmits data bidirectionally, and the CA system wiring and the control system wiring transmit data in one direction from the memory controller to the memory, as shown in FIG. It shall be present as well. However, the data input / output wiring is a bidirectional wiring that transmits a data signal for reading or writing in accordance with a Read / Write command. The CA wiring is a wiring for transmitting a command / address signal from the memory controller to each DRAM in one direction, and its termination is the same as that shown in FIG. 1 for preventing reflection of the command / address signal. Further, it is assumed that a termination resistor is provided.
 図2に示すように、本発明のメモリモジュール100と、メモリモジュール100を制御するメモリコントローラ300とは、メモリモジュール100に設けられた出力端子101を介して接続されている。この出力端子101からは、メモリモジュール100内に実装(搭載)されたDRAMから出力されたアラート信号(Alert_n)が出力される。 As shown in FIG. 2, the memory module 100 of the present invention and the memory controller 300 that controls the memory module 100 are connected via an output terminal 101 provided in the memory module 100. From the output terminal 101, an alert signal (Alert_n) output from a DRAM mounted (mounted) in the memory module 100 is output.
 メモリモジュール100には、図3に示すように、複数のメモリチップであるDRAM200-1~200-9が実装されている。また、DRAM200-1~200-9それぞれがアラート信号を出力するためのアラート端子201-1~201-9を有している。そして、メモリモジュール100上に形成されたループ状の伝送線路がアラート端子201-1~201-9それぞれと接続されている。 In the memory module 100, as shown in FIG. 3, DRAMs 200-1 to 200-9, which are a plurality of memory chips, are mounted. Each of the DRAMs 200-1 to 200-9 has alert terminals 201-1 to 201-9 for outputting an alert signal. A loop-shaped transmission line formed on the memory module 100 is connected to each of the alert terminals 201-1 to 201-9.
 その伝送線路上のある接続点104(第1の接続点)と出力端子101とが抵抗素子102(第1の抵抗素子)を介して接続されている。また、伝送線路上で接続点104から最遠端となる接続点105(第2の接続点)が抵抗素子103(第2の抵抗素子)を介して電源(VDD)と接続され、抵抗素子103は、DRAM200-1~200-9のいずれかからアラート信号が出力されていない場合に、当該伝送線を電源電圧(VDD)に固定する役目と、アラート信号が出力されている場合に、メモリコントローラ側で判定に十分な電圧降下を確保する役割とを果たしている。なお、抵抗素子103は、通常オープンドレインのトランジスタによって構成される。このアラート信号は、DRAM200-1~200-9が所定のエラーを検出したことを通知する信号である。 A certain connection point 104 (first connection point) on the transmission line and the output terminal 101 are connected via a resistance element 102 (first resistance element). Further, the connection point 105 (second connection point) which is the farthest end from the connection point 104 on the transmission line is connected to the power source (VDD) via the resistance element 103 (second resistance element). When the alert signal is not output from any of the DRAMs 200-1 to 200-9, the memory controller is used to fix the transmission line to the power supply voltage (VDD) and when the alert signal is output. It plays a role of ensuring a sufficient voltage drop for judgment on the side. Note that the resistance element 103 is usually configured by an open drain transistor. This alert signal is a signal notifying that the DRAMs 200-1 to 200-9 have detected a predetermined error.
 なお、図3に示した構成では、DRAMが9つである場合を例に挙げて示しているが、この数に限定しない。以下の説明においても同様である。 In the configuration shown in FIG. 3, a case where there are nine DRAMs is shown as an example, but the number is not limited to this. The same applies to the following description.
 図4は、図2に示したメモリモジュール100内の配線の一例を示す図である。ここでは、DRAM200-1~200-9が、それぞれ基板のフロント側に実装されるDRAM200-1F~200-9Fと基板のリア側に実装されるDRAM200-1B~200-9Bとから構成される場合を例に挙げて説明する。 FIG. 4 is a diagram showing an example of wiring in the memory module 100 shown in FIG. Here, the DRAMs 200-1 to 200-9 are each composed of DRAMs 200-1F to 200-9F mounted on the front side of the substrate and DRAMs 200-1B to 200-9B mounted on the rear side of the substrate. Will be described as an example.
 図4に示すように、DRAM200-1FおよびDRAM200-1Bからのアラート信号を出力するアラート端子201-1と、DRAM200-2FおよびDRAM200-2Bからのアラート信号を出力するアラート端子201-2とが、配線TL10で接続されている。また、DRAM200-2FおよびDRAM200-2Bからのアラート信号を出力するアラート端子201-2と、DRAM200-3FおよびDRAM200-3Bからのアラート信号を出力するアラート端子201-3とが、配線TL9で接続されている。また、DRAM200-3FおよびDRAM200-3Bからのアラート信号を出力するアラート端子201-3と、DRAM200-4FおよびDRAM200-4Bからのアラート信号を出力するアラート端子201-4とが、配線TL8で接続されている。また、DRAM200-4FおよびDRAM200-4Bからのアラート信号を出力するアラート端子201-4と、DRAM200-5FおよびDRAM200-5Bからのアラート信号を出力するアラート端子201-5とが、配線TL7で接続されている。また、DRAM200-5FおよびDRAM200-5Bからのアラート信号を出力するアラート端子201-5と、DRAM200-6FおよびDRAM200-6Bからのアラート信号を出力するアラート端子201-6とが、配線TL6で接続されている。また、DRAM200-6FおよびDRAM200-6Bからのアラート信号を出力するアラート端子201-6と、DRAM200-7FおよびDRAM200-7Bからのアラート信号を出力するアラート端子201-7とが、配線TL5で接続されている。また、DRAM200-7FおよびDRAM200-7Bからのアラート信号を出力するアラート端子201-7と、DRAM200-8FおよびDRAM200-8Bからのアラート信号を出力するアラート端子201-8とが、配線TL4で接続されている。また、DRAM200-8FおよびDRAM200-8Bからのアラート信号を出力するアラート端子201-8と、DRAM200-9FおよびDRAM200-9Bからのアラート信号を出力するアラート端子201-9とが、配線TL3で接続されている。また、DRAM200-9FおよびDRAM200-9Bからのアラート信号を出力するアラート端子201-9と、接続点104とが、配線TL2で接続されている。また、接続点104と抵抗素子102とが配線TL1で接続されている。また、接続点104と、DRAM200-1FおよびDRAM200-1Bからのアラート信号を出力するアラート端子201-1とが、配線TL_RTTで接続されている。また、配線TL2~TL10および配線TL_RTTでループ状の伝送線路を形成している。 As shown in FIG. 4, an alert terminal 201-1 for outputting an alert signal from the DRAM 200-1F and the DRAM 200-1B and an alert terminal 201-2 for outputting an alert signal from the DRAM 200-2F and the DRAM 200-2B are provided. They are connected by wiring TL10. An alert terminal 201-2 that outputs an alert signal from the DRAM 200-2F and the DRAM 200-2B and an alert terminal 201-3 that outputs an alert signal from the DRAM 200-3F and the DRAM 200-3B are connected by a wiring TL9. ing. An alert terminal 201-3 that outputs an alert signal from the DRAM 200-3F and the DRAM 200-3B and an alert terminal 201-4 that outputs an alert signal from the DRAM 200-4F and the DRAM 200-4B are connected by a wiring TL8. ing. An alert terminal 201-4 that outputs an alert signal from the DRAM 200-4F and the DRAM 200-4B and an alert terminal 201-5 that outputs an alert signal from the DRAM 200-5F and the DRAM 200-5B are connected by a wiring TL7. ing. An alert terminal 201-5 that outputs an alert signal from the DRAM 200-5F and the DRAM 200-5B and an alert terminal 201-6 that outputs an alert signal from the DRAM 200-6F and the DRAM 200-6B are connected by a wiring TL6. ing. An alert terminal 201-6 that outputs an alert signal from the DRAM 200-6F and DRAM 200-6B and an alert terminal 201-7 that outputs an alert signal from the DRAM 200-7F and DRAM 200-7B are connected by a wiring TL5. ing. Also, an alert terminal 201-7 that outputs an alert signal from the DRAM 200-7F and DRAM 200-7B and an alert terminal 201-8 that outputs an alert signal from the DRAM 200-8F and DRAM 200-8B are connected by a wiring TL4. ing. Also, an alert terminal 201-8 that outputs an alert signal from the DRAM 200-8F and DRAM 200-8B and an alert terminal 201-9 that outputs an alert signal from the DRAM 200-9F and DRAM 200-9B are connected by a wiring TL3. ing. Further, the alert terminal 201-9 that outputs an alert signal from the DRAM 200-9F and the DRAM 200-9B and the connection point 104 are connected by a wiring TL2. Further, the connection point 104 and the resistance element 102 are connected by a wiring TL1. Further, the connection point 104 and the alert terminal 201-1 that outputs an alert signal from the DRAM 200-1F and the DRAM 200-1B are connected by a wiring TL_RTT. Further, the wirings TL2 to TL10 and the wiring TL_RTT form a loop-shaped transmission line.
 このように接続することで、出力端子101から出力されるアラート信号の乱れを軽減させることができる。 By connecting in this way, the disturbance of the alert signal output from the output terminal 101 can be reduced.
 以下に、DRAMからアラート信号が出力された場合のメモリコントローラ300における信号波形の観測結果を示す。この観測では、抵抗素子102,103の抵抗値を25オームとした。また、各伝送線路である配線TL1~TL10、TL_RTT、DRAM200-1F~200-9Fの各アラート端子から各アラート端子201-1~201-9までの配線TL11およびDRAM200-1B~200-9Bの各アラート端子から各アラート端子201-1~201-9までの配線TL12の配線長を図5に示した値とした。 The following shows the signal waveform observation results in the memory controller 300 when an alert signal is output from the DRAM. In this observation, the resistance values of the resistance elements 102 and 103 were set to 25 ohms. In addition, the transmission lines TL1 to TL10, TL_RTT, the wirings TL11 from the alert terminals of the DRAMs 200-1F to 200-9F to the alert terminals 201-1 to 201-9, and the DRAMs 200-1B to 200-9B The wiring length of the wiring TL12 from the alert terminal to each of the alert terminals 201-1 to 201-9 is set to the value shown in FIG.
 図5は、観測に用いた各配線の配線長を示す図である。 FIG. 5 is a diagram showing the wiring length of each wiring used for observation.
 図5に示すように、本観測では、配線TL1の配線長を15.2mmとした。また、配線TL2の配線長を13.7mmとした。また、配線TL3の配線長を29.9mmとした。また、配線TL4の配線長を20.0mmとした。また、配線TL5の配線長を27.2mmとした。また、配線TL6の配線長を12.8mmとした。また、配線TL7の配線長を12.8mmとした。また、配線TL8の配線長を21.4mmとした。また、配線TL9の配線長を11.7mmとした。また、配線TL10の配線長を24.6mmとした。また、配線TL11の配線長を4.1mmとした。また、配線TL12の配線長を6.5mmとした。また、配線TL_RTTの配線長を10mmとした。 As shown in FIG. 5, in this observation, the wiring length of the wiring TL1 was 15.2 mm. Further, the wiring length of the wiring TL2 was set to 13.7 mm. Further, the wiring length of the wiring TL3 was set to 29.9 mm. Further, the wiring length of the wiring TL4 was set to 20.0 mm. Further, the wiring length of the wiring TL5 was set to 27.2 mm. Further, the wiring length of the wiring TL6 was set to 12.8 mm. Further, the wiring length of the wiring TL7 was set to 12.8 mm. Further, the wiring length of the wiring TL8 was set to 21.4 mm. Further, the wiring length of the wiring TL9 was set to 11.7 mm. Further, the wiring length of the wiring TL10 was set to 24.6 mm. Further, the wiring length of the wiring TL11 was set to 4.1 mm. Further, the wiring length of the wiring TL12 was set to 6.5 mm. The wiring length of the wiring TL_RTT is 10 mm.
 図6は、DRAM200-1Fからアラート信号が出力された場合のメモリコントローラ300における信号波形の観測結果を示す図である。また、図7は、DRAM200-3Fからアラート信号が出力された場合のメモリコントローラ300における信号波形の観測結果を示す図である。また、図8は、DRAM200-5Fからアラート信号が出力された場合のメモリコントローラ300における信号波形の観測結果を示す図である。 FIG. 6 is a diagram showing signal waveform observation results in the memory controller 300 when an alert signal is output from the DRAM 200-1F. FIG. 7 is a diagram showing a signal waveform observation result in the memory controller 300 when an alert signal is output from the DRAM 200-3F. FIG. 8 is a diagram showing a signal waveform observation result in the memory controller 300 when an alert signal is output from the DRAM 200-5F.
 図6において、破線の円で囲んだ部分Aにて、立下りの波形に段ができてしまう現象が改善されている。また、破線の円で囲んだ部分Bにて、立ち上がりの波形に段ができてしまう現象が改善されている。 In FIG. 6, the phenomenon that a step is formed in a falling waveform is improved in a portion A surrounded by a broken-line circle. In addition, the phenomenon that the rising waveform is stepped at the portion B surrounded by the broken-line circle is improved.
 また、図7において、区間CでHighレベルからLowレベルへアラート信号のレベルが推移する応答性の改善がみられる。また、区間DでLowレベルからHighレベルへアラート信号のレベルが推移する応答性の改善がみられる。 Further, in FIG. 7, in the section C, an improvement in responsiveness in which the level of the alert signal changes from the high level to the low level is seen. In addition, in the section D, an improvement in responsiveness in which the level of the alert signal changes from the low level to the high level is observed.
 このように、メモリモジュール100から出力されるアラート信号の波形の乱れを改善することができる。 Thus, the disturbance of the alert signal waveform output from the memory module 100 can be improved.
 図9は、本発明のメモリモジュールの適用例を示す図である。 FIG. 9 is a diagram showing an application example of the memory module of the present invention.
 図9に示すように、本発明のメモリモジュールに相当する複数の電子部品400それぞれが、メモリコントローラに相当するReceiver側装置500と終端抵抗である抵抗素子600との間の伝送線路から分岐された形態で接続されている。ここで電子部品400の数については規定しない。また、伝送線路上の1つの分岐点から分岐する数についても規定しない。 As shown in FIG. 9, each of a plurality of electronic components 400 corresponding to the memory module of the present invention is branched from a transmission line between a receiver-side device 500 corresponding to a memory controller and a resistance element 600 that is a termination resistor. Connected in form. Here, the number of electronic components 400 is not defined. Further, the number of branches from one branch point on the transmission line is not specified.
 なお、本実施例では、DRAMから発行されるアラート信号を対象にして説明したが、DRAMからメモリコントローラに対して能動的に発行される信号であれば、どのような信号に対して適用しても良い。なお、DRAMからメモリコントローラに出力されるデータ信号は、メモリコントローラからのコマンド信号に基づく信号であり受動的信号であるため、上記能動的に発行される信号には該当しない。 In this embodiment, the alert signal issued from the DRAM has been described as an object. However, any signal can be applied as long as the signal is actively issued from the DRAM to the memory controller. Also good. Note that the data signal output from the DRAM to the memory controller is a signal based on the command signal from the memory controller and is a passive signal, and thus does not correspond to the signal issued actively.
 以上、実施の形態を参照して本願発明を説明したが、本願発明は上記実施の形態に限定されるものではない。本願発明の構成や詳細には、本願発明のスコープ内で当業者が理解し得る様々な変更をすることができる。 The present invention has been described above with reference to the embodiments, but the present invention is not limited to the above embodiments. Various changes that can be understood by those skilled in the art can be made to the configuration and details of the present invention within the scope of the present invention.
 この出願は、2013年2月26日に出願された日本出願特願2013-035656を基礎とする優先権を主張し、その開示の全てをここに取り込む。 This application claims priority based on Japanese Patent Application No. 2013-035656 filed on February 26, 2013, the entire disclosure of which is incorporated herein.

Claims (10)

  1.  複数のメモリチップが実装され、該複数のメモリチップが所定のエラーを検出したことを通知するために該複数のメモリチップそれぞれに設けられたアラート端子と共通に接続された、ループ状の伝送線路を有し、該伝送線路上の第1の接続点と出力端子とが第1の抵抗素子を介して接続され、前記第1の接続点から前記伝送線路上で最遠端となる第2の接続点が第2の抵抗素子を介して電源と接続されたメモリモジュール。 A loop-shaped transmission line having a plurality of memory chips mounted therein and commonly connected to an alert terminal provided in each of the plurality of memory chips in order to notify that the plurality of memory chips have detected a predetermined error A first connection point on the transmission line and an output terminal are connected via a first resistance element, and the second connection point is the farthest end on the transmission line from the first connection point. A memory module in which a connection point is connected to a power supply via a second resistance element.
  2.  請求項1に記載のメモリモジュールにおいて、
     前記第1の抵抗素子の抵抗値は、25オームであることを特徴とするメモリモジュール。
    The memory module according to claim 1,
    The memory module according to claim 1, wherein a resistance value of the first resistance element is 25 ohms.
  3.  請求項1または請求項2に記載のメモリモジュールにおいて、
     前記第2の抵抗素子の抵抗値は、25オームであることを特徴とするメモリモジュール。
    The memory module according to claim 1 or 2,
    The memory module according to claim 1, wherein the resistance value of the second resistance element is 25 ohms.
  4.  基板と、
     前記基板上に実装され、それぞれが外部からのコマンド信号に基づく受動的な信号を出力する第1の端子および前記コマンド信号に基づかない能動的な信号を出力する第2の端子を備えた複数のメモリチップと、
     前記複数のメモリチップの備える複数の端子のうち、前記第2の端子同士を共通に接続する伝送線路と、
     前記伝送線路と前記基板上に形成された所定の電位を供給する配線との間に接続された抵抗素子と、
     前記伝送線路と基板上に形成され、外部と接続されうる出力端子とを接続する配線とを備えることを特徴とするメモリモジュール。
    A substrate,
    A plurality of first terminals mounted on the substrate, each having a first terminal for outputting a passive signal based on a command signal from the outside, and a second terminal for outputting an active signal not based on the command signal A memory chip,
    Among a plurality of terminals provided in the plurality of memory chips, a transmission line that connects the second terminals in common,
    A resistance element connected between the transmission line and a wiring for supplying a predetermined potential formed on the substrate;
    A memory module comprising: the transmission line; and a wiring formed on the substrate and connected to an output terminal that can be connected to the outside.
  5.  請求項4に記載のメモリモジュールにおいて、
     前記伝送線路は、閉ループ状に構成されていることを特徴とするメモリモジュール。
    The memory module according to claim 4,
    The memory module, wherein the transmission line is configured in a closed loop shape.
  6.  請求項4に記載のメモリモジュールにおいて、
     前記伝送線路は、ループを構成することを特徴とするメモリモジュール。
    The memory module according to claim 4,
    The memory module, wherein the transmission line constitutes a loop.
  7.  請求項4に記載のメモリモジュールにおいて、
     前記複数のメモリチップのそれぞれは、コマンド・アドレス端子を備え、前記基板は、前記コマンド・アドレス端子をフライバイにて接続するコマンド・アドレス配線を備えることを特徴とするメモリモジュール。
    The memory module according to claim 4,
    Each of the plurality of memory chips includes a command / address terminal, and the substrate includes a command / address wiring for connecting the command / address terminal by fly-by.
  8.  請求項7に記載のメモリモジュールにおいて、
     前記コマンド・アドレス配線の終端と所定の電位を供給する配線との間に接続された第2の抵抗素子をさらに備えることを特徴とするメモリモジュール。
    The memory module according to claim 7,
    A memory module, further comprising a second resistance element connected between a terminal of the command / address wiring and a wiring for supplying a predetermined potential.
  9.  請求項4に記載のメモリモジュールにおいて、
     前記伝送線路と前記出力端子との間に設けられた配線は、抵抗素子を含んで構成されることを特徴とするメモリモジュール。
    The memory module according to claim 4,
    The memory module, wherein the wiring provided between the transmission line and the output terminal includes a resistance element.
  10.  請求項4に記載のメモリモジュールにおいて、
     前記伝送線路は、終端を有していないことを特徴とするメモリモジュール。
    The memory module according to claim 4,
    The memory module, wherein the transmission line has no termination.
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"JEDEC STANDARD DDR 4 SDRAM JESD79-4", JEDEC, September 2012 (2012-09-01), pages 6, Retrieved from the Internet <URL:http://www.jedec.org/standards-documents/docs/jesd79-4> [retrieved on 20140411] *

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