WO2014125775A1 - Dispositif et procédé de mesure du spectre infrarouge - Google Patents

Dispositif et procédé de mesure du spectre infrarouge Download PDF

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Publication number
WO2014125775A1
WO2014125775A1 PCT/JP2014/000368 JP2014000368W WO2014125775A1 WO 2014125775 A1 WO2014125775 A1 WO 2014125775A1 JP 2014000368 W JP2014000368 W JP 2014000368W WO 2014125775 A1 WO2014125775 A1 WO 2014125775A1
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Prior art keywords
light pulse
infrared light
spectrum
infrared
pulse
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PCT/JP2014/000368
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English (en)
Japanese (ja)
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貴夫 藤
雄高 野村
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大学共同利用機関法人自然科学研究機構
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Priority to JP2015500127A priority Critical patent/JP6281983B2/ja
Publication of WO2014125775A1 publication Critical patent/WO2014125775A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/35—Non-linear optics
    • G02F1/353—Frequency conversion, i.e. wherein a light beam is generated with frequency components different from those of the incident light beams
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/35—Non-linear optics
    • G02F1/353—Frequency conversion, i.e. wherein a light beam is generated with frequency components different from those of the incident light beams
    • G02F1/3536—Four-wave interaction
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/35—Non-linear optics
    • G02F1/355—Non-linear optics characterised by the materials used

Definitions

  • the present invention relates to an infrared spectrum measuring apparatus and method, and more particularly to an apparatus and method for measuring a high band infrared spectrum at high speed and high sensitivity.
  • the absorption wavelength of the molecule is in the infrared range. Infrared range resonance for many molecular vibrations (e.g., resonance wave number of CO stretching vibration of protein 1650 cm -1, resonance wave number of the CH stretching vibration of lipids, 2900 cm -1, resonance wave number of the OH stretching vibration of water, It is 3400 cm -1 ). Therefore, by irradiating infrared light to a substance (gas, liquid, solid) and measuring the spectrum of reflected light or transmitted light, the composition and structure of the substance are revealed nondestructively and unstained.
  • a substance gas, liquid, solid
  • FT-IR Fourier transform infrared
  • Visible light has a large energy, and in the visible range, the SN ratio of a detector (for example, a photomultiplier) is high. Therefore, recently, a visible light conversion measurement technique has been developed that converts infrared light into visible light and measures it with a visible light detector (see, for example, Non-Patent Document 2).
  • a visible light conversion measurement technique has been developed that converts infrared light into visible light and measures it with a visible light detector (see, for example, Non-Patent Document 2).
  • a measured infrared light pulse spectrum is obtained as follows. First, an infrared light pulse to be measured and a reference light pulse are mixed and incident on the nonlinear optical crystal, and the infrared light pulse to be measured is converted into a visible light pulse. The converted visible light pulse is detected by a visible light detector. The detected visible light pulse spectrum data is calculated by a recovery algorithm to obtain a measured infrared light pulse spectrum.
  • the infrared light pulse to be measured is converted into a visible light pulse by using the non-linear optical characteristics of the solid crystal.
  • P NL is nonlinear polarization
  • E is an electric field
  • ⁇ (2) is a second-order nonlinear susceptibility
  • ⁇ (3) is a third-order nonlinear susceptibility.
  • This technology uses the following physical phenomena. That is, when an electromagnetic wave is incident on the dielectric medium, polarization occurs and an electric dipole is formed. Since the electric field of the electromagnetic wave is sinusoidally oscillated, the formed dipole also oscillates to emit the electromagnetic wave.
  • the dielectric medium is a solid crystal
  • infrared light is easily converted to visible light because the nonlinear susceptibility is large, but the solid crystal has a narrow transmission wavelength range, and the bandwidth of the measured spectrum is about 600 cm ⁇ 1 ( The spectrum width in the infrared region is as narrow as 4.6-5.6 ⁇ m). Therefore, in the conventional visible light conversion measurement technology, resonance due to various molecular vibrations could not be widely captured.
  • the present invention has been made in view of the above problems, and an object of the present invention is to provide a measuring apparatus and method capable of measuring a wide-band infrared light spectrum.
  • the gaseous medium has a weak interaction with light because of its low density, and, for example, ⁇ (3) of air is as small as 100,000 times smaller than that of the MgO crystal. Therefore, the inventors considered that it is difficult to perform wavelength conversion with gas, and conducted wavelength conversion experiments using solid crystals.
  • the present invention was created from the fact that the inventors noticed that a signal was output even if they accidentally removed a solid crystal from the experimental system. It should be noted that even when the solid crystal is removed, the signal is produced because the incident light intensity is so high that the experimental conditions of the inventors even cause air to have a nonlinear optical effect. That is, the present invention is created as a coincidence happens twice.
  • the infrared spectrum measuring apparatus which has been made to solve the above-mentioned problems, is characterized in that the measured infrared light pulse and the reference light pulse are mixed and incident, and the measured infrared light pulse is visible by the nonlinear optical effect. It has a gas medium which up-converts to a light pulse, and a spectroscope which disperses the visible light pulse up-converted by the gas medium to acquire visible light pulse spectrum data.
  • the absorption of light by the gaseous medium is less than the absorption of light by the solid medium, and the transmission wavelength band of the gaseous medium is wider than the transmission wavelength band of the solid medium.
  • a wide-band infrared light spectrum can be measured because a gas medium having a wide transmission wavelength band is used as a medium for up-converting an infrared light pulse to a visible light pulse by the nonlinear optical effect.
  • the above infrared light spectrum measuring apparatus has a recovery operation means for obtaining the infrared light pulse spectrum to be measured by calculating the visible light pulse spectrum data acquired by the spectroscopic device according to a predetermined recovery algorithm. It is also good.
  • the infrared spectrum measuring apparatus may further include a multiplexer for multiplexing the measured infrared light pulse and the reference light pulse. This improves the efficiency of up-converting the measured infrared light pulse to the visible light pulse.
  • the infrared spectrum measuring apparatus may include a focusing optical system which focuses the measured infrared light pulse and the reference light pulse on the gas medium. By focusing, the light intensity in the focusing region is increased, and high-order nonlinear optical effects of the gas medium can be easily induced.
  • the to-be-measured infrared light pulse is a coherent light pulse.
  • the gas medium becomes a high-order nonlinear optical medium.
  • the measured infrared light pulse may be an ultra-wide band light pulse having a bandwidth of 500 to 5000 cm -1 .
  • the infrared light spectrum with a wavelength range of 2-20 ⁇ m is measured, resonances due to various molecular vibrations can be widely captured.
  • the reference light pulse may be a chirped light pulse or a picosecond pulse of a single wavelength. This allows spectra to be measured with high frequency resolution. If the reference light pulse is a chirped light pulse, the measured infrared light spectrum can be reproduced with higher resolution by precise measurement of the chirp amount (time change of frequency).
  • the non-linear optical effect may be a third-order non-linear optical effect.
  • the infrared light pulse to be measured can be converted into a visible light pulse.
  • the gas medium may be xenon gas.
  • the xenon gas is a gas with a large non-linear coefficient, and the measured infrared light pulse can be upconverted at high efficiency.
  • the infrared spectrum measuring method of the present invention which has been made to solve the above problems, is characterized in that the measured infrared light pulse and the reference light pulse are mixed and incident in the gas medium, and the nonlinear optical effect of the gas medium is obtained. It has an up-conversion step of converting a measured infrared light pulse into a visible light pulse, and a spectroscopy step of separating the visible light pulse converted in the up-conversion step to acquire visible light pulse spectrum data.
  • the above infrared light spectrum measuring method may have a spectrum recovery step of recovering the spectrum of the measured infrared light pulse by using a predetermined recovery algorithm for the visible light pulse spectrum data acquired in the spectroscopy step. .
  • the measured infrared light pulse may be a coherent light pulse.
  • the measured infrared light pulse may be an ultra-wide band light pulse having a bandwidth of 500 to 5000 cm -1 .
  • the reference light pulse may be a chirped light pulse or a picosecond pulse of a single wavelength. Further, when the reference light pulse is a chirped light pulse, it is preferable to measure the chirp amount (time change of frequency).
  • the non-linear optical effect may be a third-order non-linear optical effect.
  • the gas medium may be xenon gas.
  • a wide-band infrared light spectrum can be measured because a gas medium with a wide transmission wavelength range is used as the medium for up-converting the measured infrared light pulse into a visible light pulse by the nonlinear optical effect.
  • FIG. 1 is a block diagram of an infrared spectrum measuring apparatus according to an embodiment of the present invention.
  • the infrared spectrum measuring apparatus 1 includes a multiplexer 11, a condensing optical system 12, a gas medium 13, a visible spectroscope 14, and a recovery operation means 15. Of these components, the coupler 11 and the focusing optical system 12 can be omitted.
  • a multiplexer 11 for multiplexing the reference optical pulse L r and the measured infrared light pulse L IR is perforated mirror, two-color mirror, a polarizing beam splitter or the like can be used.
  • a lens, a parabolic mirror or the like may be used for the condensing optical system 12.
  • the gas medium 13 is preferably a gas that is transparent in the visible to infrared region.
  • the gas medium 13 may be air, but since air has strong absorption by CO 2 molecules in the vicinity of 4 ⁇ m and 8 ⁇ m, inert gas (argon, xenon, neon, etc.) that absorbs less than air is preferable.
  • inert gas argon, xenon, neon, etc.
  • xenon gas is particularly preferred.
  • the gaseous medium may be jetted out from a cylinder (not shown) to the condensing area S by the condensing optical system 12, the gaseous medium is diffused into the air, so the concentration of the gaseous medium 13 is kept high. I can not do it.
  • the gas medium from the cylinder is injected into a cylinder having a hole through which light collected by the light collection optical system 12 passes.
  • a band pass filter 16 transmits only the visible light pulse Lv up-converted from the measured infrared light pulse L IR by the nonlinear optical effect of the gas medium 13.
  • a lens 17 collimates the visible light pulse Lv.
  • the spectroscope 14 is a spectroscope in the visible region, and includes a prism or a diffraction grating and a CCD (or a photodiode array) for photoelectrically converting a spatial distribution of diffracted light.
  • the recovery operation means 15 is a computer and performs the operation shown in FIG. That is, in step S 11, the visible light pulse Lv up-converted by the gas medium 13 is converted into data by the spectroscope 14, and the spectrum data is acquired by the recovery calculation unit 15. In the subsequent step S12, the spectrum (wavelength) data acquired in step S11 is converted into spectrum (frequency) data.
  • step S13 spectral (frequency) data is inverse Fourier transformed.
  • step S14 assuming that the phase of the reference light pulse L r in the time domain is ⁇ (t), the phase ⁇ (t) from the portion of t> 0 in the time domain in the inverse Fourier transformed spectral data, From the portion of t ⁇ 0, phase correction is performed by subtracting the phase - ⁇ (-t).
  • the phase-corrected spectrum data is Fourier-transformed in step S15 to form a measured infrared light pulse spectrum.
  • the infrared absorption spectrum of the sample 100 can be measured at high speed by the spectroscope in the visible range by irradiating the sample 100 indicated by the dotted line with the measured infrared light pulse L IR generated from the infrared light pulse generating means 10. .
  • the non-linear optical effect of the gas medium 13 depends on the intensity (power per unit area, ie, W / cm 2 ) of light injected into the gas medium, and higher order non-linear optics are provided to the gas medium 13 as the intensity increases. An effect is induced.
  • the pulse width of L r and L IR should be short.
  • the pulse width is preferably femtosecond to picosecond.
  • the intensity of light injected into the gas medium 13 becomes higher as L r and L IR are smaller and condensed by the condensing optical system 12.
  • the condensing spot diameter of L r and L IR by the condensing optical system 12 depends on the focal length of the condensing optical system 12 and the coherency of Lr and L IR . Therefore, the focal length of the focusing optical system 12 may be 50 mm, and more preferably 25 mm.
  • the power required for wavelength conversion by the nonlinear optical effect of the gas medium depends on the type of gas and the measurement time, but according to the experiments of the inventors, it is as follows.
  • a third-order nonlinear optical effect is induced. That is, in this case, assuming that the angular frequency of the reference light pulse L r is ⁇ 1 , the third-order nonlinear optical effect (four-wave difference frequency generation: ⁇ 1 + ⁇ 1 - ⁇ 0 ⁇ ⁇ 2 ) occurs and the angular frequency is ⁇ 1 of the measured infrared light pulse L IR ( ⁇ 1), the angular frequency is up-converted to omega 2 of the visible light pulse L V ( ⁇ 2).
  • I r 2 ⁇ I IR 4.4 ⁇ 10 36 W 3 / cm 6
  • the power required for wavelength conversion by the nonlinear optical effect of the gas medium is I r 2 ⁇
  • the power is such that the I IR is 4.4 ⁇ 10 36 W 3 / cm 6 or more.
  • the measured infrared light pulse L IR may be an ultra-wide band (500 to 5000 cm ⁇ 1 ) light pulse. If the measured infrared light pulse L IR is in the ultra-wide band (500 to 5000 cm -1 ), the infrared light spectrum in the wavelength range of 2 to 20 ⁇ m can be measured, so resonances due to various molecular vibrations are widely caught. Can be
  • An off-axis parabolic mirror 22 focuses the combined light pulse L 1 ( ⁇ 1 ) + L 2 ( ⁇ 2 ) into the gas medium 23.
  • a collimator 24 is an off-axis parabolic mirror.
  • 25 is a filter.
  • Ultra-short light pulses (wavelength: 800 nm, pulse width: 25 fs, pulse energy: 0.7 mJ, repetition frequency: 1 KHz) from mode-locked Ti: sapphire laser, BBO ( ⁇ -BaB 2 O 4 with a thickness of 0.1 mm) 2.)
  • the crystal was made incident and a second harmonic light pulse was generated.
  • the second harmonic light pulse is L 2 ( ⁇ 2 ), and the fundamental wave light pulse is L 1 ( ⁇ 1 ).
  • the pulse width of the fundamental wave light pulse L 1 ( ⁇ 1 ) is 25 fs
  • the pulse energy is 675 ⁇ J
  • the wavelength of the second harmonic light pulse L 2 ( ⁇ 2 ) is 400 nm
  • the pulse width is 25 fs
  • the pulse energy is 25 ⁇ J.
  • the fundamental wave light pulse L 1 ( ⁇ 1 ) and the second harmonic light pulse L 2 ( ⁇ 2 ) are combined by the two-color mirror 21 and collected in the argon gas 23 by the off-axis parabolic mirror 22 having a focal length of 150 mm. It is lighted. Then, four-wave mixing ( ⁇ 1 + ⁇ 1 - ⁇ 2 ⁇ ⁇ 0 ) occurs due to filamentation of argon gas, and from the filter 25 transmitting only light of ⁇ 0 , four-wave mixed light pulse L 0 ( ⁇ 0 ) Is obtained.
  • the band of the four-wave mixed light pulse L 0 ( ⁇ 0 ) is, as shown in FIG. 4, 200-6000 cm -1 (1.7-50 ⁇ m in wavelength) in wavenumber, and is an ultra-wide band.
  • the pulse width of the light pulse L 0 ( ⁇ 0 ) was 6.9 fs.
  • the reference light pulse Lr may be a chirped light pulse.
  • the reference light pulse is a chirped light pulse or a single wavelength picosecond pulse
  • the spectrum can be measured with high frequency resolution.
  • the delay time for sweeping is increased, the frequency resolution is improved. Therefore, according to the same logic, the longer the pulse width of the reference light pulse, the more the frequency resolution is improved.
  • the pulse time width of the reference light pulse may be extended by, for example, a diffraction grating stretcher.
  • the reference light pulse is a chirped light pulse
  • the above-described four-wave-mixed ultra-wideband light pulse L 0 ( ⁇ 0 ) is defined as a measured infrared light pulse L IR ( ⁇ 0 ).
  • the pulse energy of this measured infrared light pulse L IR ( ⁇ 0 ) is 0.5 ⁇ J.
  • a portion (pulse energy: 0.1 mJ) of a fundamental pulse (wavelength: 800 nm) of a mode-locked Ti: sapphire laser for generating ultra-broadband light pulse L 0 ( ⁇ 0 ) is stretched by a stretcher to obtain a reference light Pulse L r ( ⁇ 1 ) was used.
  • the pulse width of the reference light pulse L r ( ⁇ 1 ) is 10.3 ps.
  • the measured infrared light pulse L IR ( ⁇ 0 ) and the reference light pulse L r ( ⁇ 1 ) are combined by the perforated mirror 11 and condensed onto the xenon gas 13 by the parabolic mirror 12 having a focal distance of 50 mm.
  • the intensity I IR in the focusing region was estimated to be 4 ⁇ 10 16 W / m 2 .
  • the intensity I r in the focusing region of the reference light pulse L r ( ⁇ 1 ) was 2.2 ⁇ 10 12 W / cm 2 .
  • the index of the equation (2) is estimated to be 2 ⁇ 10 37 W 3 / cm 6, and it is expected that the xenon gas 13 induces the third-order nonlinear optical effect.
  • Band pass filter 16 for cutting the measured infrared light pulse L IR ( ⁇ 0 ) at 200-6000 cm -1 (wavelength 1.7 to 50 ⁇ m) in wave number and the reference light pulse L r ( ⁇ 1 ) at wavelength 800 nm
  • the light path that has passed through is measured by the visible region spectrometer 14 equipped with a camera EMCCD (ProEM + 1600, Princeton Instrument). The camera was synchronized to the repetition rate (1 kHz) of a mode-locked Ti: sapphire laser and spectra were measured on a single shot ( ⁇ 1 ms).
  • the measured spectrum is shown in FIG.
  • the non-linear optical effect induced in the xenon gas 13 is up-conversion by the third-order non-linear optical effect (four-wave difference frequency generation: ⁇ 1 + ⁇ 1 - ⁇ 0 ⁇ ⁇ 2 ).
  • the spectrum waveform obtained by processing the spectrum data of the waveform i of FIG. 5 by the recovery operation means 15 is the waveform b of FIG. From the waveform, CO 2 absorption (wave number: ⁇ 2300 cm -1 , wavelength: ⁇ 4.3 ⁇ m) and water vapor absorption (wave number: ⁇ 1600 cm -1 , wavelength: ⁇ 6.3 ⁇ m and wave number: ⁇ 3700 cm -1 , wavelength : ⁇ 2.7 ⁇ m) is clearly observed.
  • the amount of chirp of the reference light pulse (time change in frequency, ((t)) may be measured in advance. Measure the spectrum of the four-wave difference frequency mixing by sweeping the delay time of the reference light pulse and the infrared light pulse, and measure ⁇ (t) directly from the delay time dependency of the spectrum it can.

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

Le dispositif de mesure du spectre infrarouge (1) se caractérise en ce qu'il peut mesurer une bande large du spectre infrarouge du fait qu'il est doté d'un milieu gazeux (13) dans lequel sont incidentes et mélangées une impulsion infrarouge en cours de mesure LIR et une impulsion de lumière de référence Lr, et qui soumet à conversion ascendante LIR l'impulsion infrarouge en cours de mesure LIR en une impulsion de lumière visible Lv par effet optique non linéaire; et qu'il est également doté d'un dispositif spectral (14) qui acquiert des données de spectre d'impulsions de lumière visible par analyse de l'impulsion de lumière visible Lv soumise à conversion ascendante dans le milieu gazeux (13).
PCT/JP2014/000368 2013-02-14 2014-01-24 Dispositif et procédé de mesure du spectre infrarouge WO2014125775A1 (fr)

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JP2015500127A JP6281983B2 (ja) 2013-02-14 2014-01-24 赤外光スペクトル計測装置及び方法

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111103695A (zh) * 2019-11-08 2020-05-05 中国科学院上海光学精密机械研究所 一种超快激光产生装置
KR20220078925A (ko) * 2020-12-04 2022-06-13 주식회사 파이퀀트 휴대용 분광 장치
CN117213626A (zh) * 2023-11-07 2023-12-12 上海频准激光科技有限公司 基于非线性频率变换的不可见光参数测量方法和系统

Non-Patent Citations (3)

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Title
CARLOS R. BAIZ: "Ultrabroadband detection ot a mid-IR continuum by chirped-pulse upconversion", OPTICS LETTERS, vol. 36, no. 2, 15 January 2011 (2011-01-15), pages 187 - 189, XP001559882, DOI: doi:10.1364/OL.36.000187 *
TAKAO FUJI: "Generation of 12 fs deep- ultraviolet pulses by four-wave mixing through filamentationin neon gas", OPTICS LETTERS, vol. 32, no. 17, 1 September 2007 (2007-09-01), pages 2481 - 2483, XP001507572, DOI: doi:10.1364/OL.32.002481 *
Y. NOMURA: "Single-shot detection of mid- infrared spectra by chirped-pulse upconversion with four-wave difference frequency generation in gases", OPTICS EXPRESS, vol. 21, no. 15, July 2013 (2013-07-01), pages 18249 - 18254 *

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111103695A (zh) * 2019-11-08 2020-05-05 中国科学院上海光学精密机械研究所 一种超快激光产生装置
CN111103695B (zh) * 2019-11-08 2021-09-07 中国科学院上海光学精密机械研究所 一种超快激光产生装置
KR20220078925A (ko) * 2020-12-04 2022-06-13 주식회사 파이퀀트 휴대용 분광 장치
KR102631683B1 (ko) * 2020-12-04 2024-01-31 주식회사 파이퀀트 휴대용 분광 장치
CN117213626A (zh) * 2023-11-07 2023-12-12 上海频准激光科技有限公司 基于非线性频率变换的不可见光参数测量方法和系统
CN117213626B (zh) * 2023-11-07 2024-01-26 上海频准激光科技有限公司 基于非线性频率变换的不可见光参数测量方法和系统

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