WO2014101177A1 - 有源天线方向图测试系统和方法 - Google Patents

有源天线方向图测试系统和方法 Download PDF

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Publication number
WO2014101177A1
WO2014101177A1 PCT/CN2012/088032 CN2012088032W WO2014101177A1 WO 2014101177 A1 WO2014101177 A1 WO 2014101177A1 CN 2012088032 W CN2012088032 W CN 2012088032W WO 2014101177 A1 WO2014101177 A1 WO 2014101177A1
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WIPO (PCT)
Prior art keywords
signal
digital
analog
uplink
downlink
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Application number
PCT/CN2012/088032
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English (en)
French (fr)
Inventor
黄懿
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华为技术有限公司
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Publication date
Application filed by 华为技术有限公司 filed Critical 华为技术有限公司
Priority to PCT/CN2012/088032 priority Critical patent/WO2014101177A1/zh
Priority to CN201280002997.3A priority patent/CN103384835B/zh
Publication of WO2014101177A1 publication Critical patent/WO2014101177A1/zh

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/10Radiation diagrams of antennas

Definitions

  • the present invention relates to the field of communications technologies, and in particular, to an active antenna pattern test system and method. Background technique
  • the current antenna pattern test mainly uses a radio frequency test instrument that only supports analog signals to perform near-field pattern test on passive antennas whose input and output signals are analog signals, and then through the existing near-field-far field conversion technology.
  • the near-field pattern is calculated to estimate the far-field pattern of the passive antenna.
  • an active antenna having a power supply and an amplifier is often used. Since the input of the downlink signal in the active antenna system is a digital signal, the output is an analog signal, and the input of the uplink signal is an analog signal. The output is a digital signal. Therefore, the near-field test of the active antenna cannot be directly performed by using the existing RF test instrument, and the far-field pattern of the active antenna cannot be estimated by the near-field pattern.
  • embodiments of the present invention provide an active antenna pattern test system and method.
  • an aspect of the present invention provides an active antenna pattern test system, including: a tester and an active antenna, wherein the tester includes: a test probe, a digital interface, and an analog interface, and the test probe The analog interfaces are connected, and the digital interface is connected to a digital interface of the active antenna;
  • the tester is configured to send a first digital signal to the active antenna through the digital interface, and receive, by the test probe, the active antenna to perform digital-to-analog conversion processing on the first digital signal, and then send the first digital signal a first analog signal, obtaining a downlink reference signal and a downlink test signal according to the first digital signal and the first analog signal, and performing correlation processing on the downlink reference signal and the downlink test signal to obtain the downlink reference
  • the amplitude of the signal, the amount of phase change, to the root Obtaining an active antenna downlink signal pattern according to the amplitude phase change amount of the downlink reference signal; or the tester, configured to send a second analog signal to the active antenna through the analog interface and the test probe, and pass
  • the digital interface receives a second digital signal that is sent by the active antenna after performing analog-to-digital conversion processing on the second analog signal, and acquires an uplink reference signal and an uplink according to the second analog signal and the second digital signal.
  • the first digital signal is a tone signal
  • the first analog signal is also a tone signal
  • the tester is specifically configured to: use the first digital signal as the downlink reference signal, perform analog-to-digital conversion processing on the first analog signal, and obtain the downlink test signal, or And as the downlink test signal, the signal is subjected to digital-to-analog conversion processing on the first digital signal to obtain the downlink reference signal.
  • the second digital signal is also a tone signal
  • the tester is specifically configured to: use the second analog signal as the uplink reference signal, perform digital-to-analog conversion processing on the second digital signal, and obtain the uplink test signal, or The signal is used as the uplink test signal, and the uplink reference signal is obtained after performing analog-to-digital conversion processing on the second analog signal.
  • the first digital signal is a multi-carrier signal or a multi-beam signal
  • the first analog signal is also a multi-carrier signal or a multi-beam signal
  • the tester is specifically configured to: use each carrier signal or each beam signal in the first digital signal as each downlink reference signal, perform analog-to-digital conversion processing, splitting, and filtering processing on the first analog signal to obtain Each downlink test signal corresponding to each of the downlink reference signals, or each carrier signal or each beam signal obtained by performing branching and filtering processing on the first analog signal as each downlink test signal, Obtaining each downlink reference signal corresponding to each downlink test signal after performing digital-to-analog conversion processing on each carrier signal or each beam signal in a digital signal; And performing correlation processing on each downlink reference signal and each downlink test signal corresponding to each downlink reference signal to obtain an amplitude phase change amount of each downlink reference signal, to obtain according to the amplitude phase change amount of each downlink reference signal Active antenna downlink multi-carrier or multi-beam signal pattern.
  • the second analog signal is a multi-carrier signal or a multi-beam signal
  • the second digital signal is also a multi-carrier signal or a multi-beam signal
  • the tester is specifically configured to: use each carrier signal or each beam signal in the second analog signal as each uplink reference signal, perform digital-to-analog conversion processing, splitting, and filtering processing on the second digital signal to obtain Each of the uplink test signals corresponding to the uplink reference signals, or each carrier signal or each beam signal obtained by performing the splitting and filtering process on the second digital signal as each uplink test signal, Obtaining each uplink reference signal corresponding to each uplink test signal after performing analog-to-digital conversion processing on each carrier signal or each beam signal in the two analog signals;
  • the present invention provides an active antenna pattern test method using the active antenna pattern test system described above, including:
  • the tester sends a first digital signal to the active antenna through the digital interface, and receives, by the test probe, a first sent by the active antenna after performing digital-to-analog conversion processing on the first digital signal.
  • the tester sends a second analog signal to the active antenna through the analog interface and the test probe, and receives the active antenna through the digital interface, and performs analog-to-digital conversion processing on the second analog signal.
  • a second digital signal obtaining an uplink reference signal and an uplink test signal according to the second analog signal and the second digital signal, and for the uplink reference signal Performing correlation processing with the uplink test signal to obtain an amplitude phase change amount of the uplink reference signal, to obtain an active antenna uplink signal pattern according to the amplitude phase change amount of the uplink reference signal.
  • the first digital signal is a tone signal
  • the first analog signal is also a tone signal
  • the obtaining the downlink reference signal and the downlink test signal according to the first digital signal and the first analog signal specifically includes:
  • the first digital signal as the downlink reference signal, performing analog-to-digital conversion processing on the first analog signal, acquiring the downlink test signal, or using the first analog signal as the downlink test signal, And acquiring the downlink reference signal after performing digital-to-analog conversion processing on the first digital signal.
  • the second digital signal is also a tone signal
  • the obtaining the uplink reference signal and the uplink test signal according to the second analog signal and the second digital signal specifically includes:
  • the second analog signal as the uplink reference signal, performing digital-to-analog conversion processing on the second digital signal to obtain the uplink test signal, or using the second digital signal as the uplink test signal, And acquiring the uplink reference signal after performing analog-to-digital conversion processing on the second analog signal.
  • the first digital signal is a multi-carrier signal or a multi-beam signal
  • the first analog signal is also a multi-carrier signal or a multi-beam signal
  • the obtaining the downlink reference signal and the downlink test signal according to the first digital signal and the first analog signal specifically includes:
  • each carrier signal or each beam signal in the first digital signal as each downlink reference signal, performing analog-to-digital conversion processing, branching, and filtering processing on the first analog signal, and acquiring corresponding to each downlink reference signal
  • Performing correlation processing on the downlink reference signal and the downlink test signal to obtain an amplitude phase change amount of the downlink reference signal, to obtain an active antenna downlink signal direction pattern according to the amplitude phase change amount of the downlink reference signal. include:
  • the second analog signal is a multi-carrier signal or a multi-beam signal
  • the second digital signal is also a multi-carrier signal or a multi-beam signal
  • the obtaining the uplink reference signal and the uplink test signal according to the second analog signal and the second digital signal specifically includes:
  • each carrier signal or each beam signal in the second analog signal as each uplink reference signal, performing digital-to-analog conversion processing, branching, and filtering processing on the second digital signal, and acquiring corresponding to each uplink reference signal
  • An active antenna pattern test system and method provided by an embodiment of the present invention transmits a first digital signal to an active antenna through a digital interface through a tester, and performs digital-to-analog conversion processing on the first digital signal by receiving the active antenna through the test probe.
  • the antenna uplink signal pattern realizes the pattern test of the active antenna, and solves the limitation that the existing RF tester can only test the passive antenna, and satisfies the test requirements in practical applications.
  • FIG. 1 is a schematic structural diagram of an active antenna pattern test system according to an embodiment of the present invention.
  • FIG. 2 is a flowchart of a method for testing a downlink direction of an active antenna performed by the active antenna pattern test system shown in FIG. 1 according to an embodiment of the present invention
  • FIG. 3 is a flowchart of an active antenna uplink direction diagram 'J test method performed by the active antenna pattern test system shown in FIG. 1 according to an embodiment of the present invention
  • FIG. 4 is a schematic structural diagram of another active antenna pattern test system according to an embodiment of the present invention.
  • FIG. 5 is a schematic structural diagram of another active antenna pattern test system according to an embodiment of the present invention.
  • 1 is a schematic structural diagram of an active antenna pattern test system according to an embodiment of the present invention.
  • the system specifically includes: a tester 1 and an active antenna 2, wherein the tester 1 includes : Test probe 1 1 , digital interface 12 and analog interface 13 , test probe 1 1 and mode The interface 13 is connected, and the digital interface 12 is connected to the digital interface 21 of the active antenna 2, wherein
  • the tester 1 is configured to transmit a first digital signal to the digital interface 21 of the active antenna 2 through the digital interface 12, and receive the first transmitted by the active antenna 2 after performing digital-to-analog conversion processing on the first digital signal through the test probe 11. And simulating the signal, acquiring the downlink reference signal and the downlink test signal according to the first digital signal and the first analog signal, and performing correlation processing on the downlink reference signal and the downlink test signal to obtain an amplitude phase change amount of the downlink reference signal, according to the downlink reference signal Amplitude phase change amount to obtain the active antenna downlink signal pattern; or
  • the tester 1 is configured to send a second analog signal to the active antenna 2 through the analog interface 13 and the test probe 11 , and receive a second transmission by the active antenna 2 after performing analog-to-digital conversion processing on the second analog signal through the digital interface 21 .
  • a digital signal obtaining an uplink reference signal and an uplink test signal according to the second analog signal and the second digital signal, and performing correlation processing on the uplink reference signal and the uplink test signal to obtain an amplitude phase change amount of the uplink reference signal, according to the uplink reference signal
  • the amplitude phase change amount acquires the uplink signal pattern of the active antenna.
  • FIG. 2 is a flowchart of a method for testing an active antenna downlink pattern performed by using the active antenna pattern test system shown in FIG. 1 according to an embodiment of the present invention. As shown in FIG. 2, the method is specifically implemented. Includes:
  • Step 100 The tester sends the first digital signal to the active antenna through the digital interface, and receives the first analog signal sent by the active antenna to perform digital-to-analog conversion processing on the first digital signal through the test probe;
  • the tester sends a first digital signal to the active antenna through the digital interface, and after the active antenna receives the first digital signal through its digital interface, digitally modulates the first digital signal. After the conversion process, the first analog signal is transmitted to the space, so that the tester receives the first analog signal sent by the active antenna through the preset test probe.
  • Step 101 The tester obtains a downlink reference signal and a downlink test signal according to the first digital signal and the first analog signal;
  • the tester acquires the downlink reference signal and the downlink test signal according to the first digital signal previously transmitted to the active antenna through the digital interface and the first analog signal transmitted by the active antenna received through the test probe.
  • the manner in which the tester obtains the downlink reference signal and the downlink test signal according to the first digital signal and the first analog signal depends on actual application requirements, and specifically ⁇ Under the mouth:
  • the first analog signal sent by the active antenna after performing digital-to-analog conversion processing on the first digital signal is also a single tone signal.
  • the tester uses the first digital signal as the downlink reference signal
  • the analog signal is processed by the analog-to-digital conversion process to obtain the downlink test signal, so that the tester obtains the downlink reference signal and the downlink test signal in the digital domain
  • the tester uses the first analog signal as the downlink test signal
  • the first digital signal is subjected to digital-to-analog conversion processing to obtain a downlink reference signal, so that the tester obtains the downlink reference signal and the downlink test signal of the analog domain.
  • the first digital signal sent by the tester to the active antenna through the digital interface is a multi-carrier signal or a multi-beam signal
  • the first analog signal sent by the active antenna after performing digital-to-analog conversion processing on the first digital signal is also It is a multi-carrier signal or a multi-beam signal.
  • the tester uses each carrier signal or each beam signal in the first digital signal as each downlink reference signal, the first analog signal is subjected to analog-to-digital conversion processing, shunting, and filtering processing, and then acquired and downlinked.
  • Each downlink test signal corresponding to the reference signal if each carrier signal or each beam signal obtained by splitting and filtering the first analog signal is used as each downlink test signal, then each carrier signal in the first digital signal or Each beam signal is subjected to digital-to-analog conversion processing, and then each downlink reference signal corresponding to each downlink 'J test signal is acquired.
  • Step 102 The tester performs correlation processing on the downlink reference signal and the downlink test signal to obtain an amplitude phase change amount of the downlink reference signal, to obtain an active antenna according to the amplitude phase change amount of the downlink reference signal. Downstream signal pattern.
  • the tester performs correlation processing on the acquired downlink reference signal and the downlink test signal, and obtains the amplitude phase change amount of the downlink reference signal according to the result of the correlation processing.
  • the amplitude phase change amount of the downlink reference signal corresponding to each test point is obtained by referring to the above method, thereby obtaining the active antenna according to the amplitude phase change amount of the plurality of downlink reference signals tested.
  • the near-field pattern of the downlink signal, and further, the near-field pattern is calculated by using the existing near-field-far field conversion technique to calculate the far-field pattern of the downlink signal of the active antenna.
  • the tester directly performs correlation processing on the acquired downlink reference signal and the downlink test signal; and tests the scenario for the multicarrier signal or multibeam signal in step 101, the tester Respectively for each downlink reference signal and Performing correlation processing on each downlink test signal corresponding to each downlink reference signal to obtain an amplitude phase change amount of each downlink reference signal, to obtain an active antenna downlink multi-carrier or multi-beam signal according to the amplitude phase change amount of each downlink reference signal Direction map.
  • FIG. 3 is a flowchart of a method for testing an uplink pattern of an active antenna performed by using the active antenna pattern test system shown in FIG. 1 according to an embodiment of the present invention, as shown in FIG. Includes:
  • Step 200 The tester sends a second analog signal to the active antenna through the analog interface and the test probe, and receives a second digital signal sent by the active antenna to perform analog-to-digital conversion processing on the second analog signal through the digital interface;
  • the tester transmits a second analog signal through an analog interface and a preset test probe, and the active antenna receives the second analog signal radiated by the test probe through the antenna array, and then After the analog signal is subjected to analog-to-digital conversion processing, the second digital signal is transmitted to the digital interface of the tester through the digital interface.
  • Step 201 The tester obtains an uplink reference signal and an uplink 'J test signal according to the second analog signal and the second digital signal;
  • the tester obtains an uplink reference signal and an uplink test signal based on a second analog signal previously transmitted through the analog interface and the pre-set test probe and a second digital signal transmitted through the active antenna received through the digital interface.
  • the manner in which the tester obtains the uplink reference signal and the uplink test signal according to the second analog signal and the second digital signal is selected according to actual application requirements, and the details are as follows:
  • the second digital signal sent by the active antenna after performing analog-to-digital conversion processing on the second analog signal is also Single tone signal.
  • the tester uses the second analog signal as the uplink reference signal
  • the second digital signal is subjected to digital-to-analog conversion processing to obtain an uplink test signal, so that the tester obtains the uplink reference signal and the uplink test signal of the analog domain
  • the tester uses the second digital signal as the uplink test signal
  • the second analog signal is subjected to analog-to-digital conversion processing to obtain an uplink reference signal, so that the tester obtains the uplink reference signal and the uplink test signal in the digital domain.
  • the active antenna performs the second analog signal.
  • the second digital signal transmitted after the analog-to-digital conversion process is also a multi-carrier signal or a multi-beam signal.
  • the tester uses each carrier signal or each beam signal in the second analog signal as each uplink reference signal, the second digital signal is subjected to digital-to-analog conversion processing, shunting, and filtering processing to obtain and uplink.
  • Step 202 The tester performs correlation processing on the uplink reference signal and the uplink test signal to obtain an amplitude phase change amount of the uplink reference signal, to obtain an active antenna according to the amplitude phase change amount of the uplink reference signal. Upstream signal pattern.
  • the tester performs correlation processing on the acquired uplink reference signal and the uplink test signal, and obtains the amplitude phase change amount of the uplink reference signal according to the result of the correlation processing.
  • the amplitude phase change amount of the uplink reference signal corresponding to each test point is obtained by referring to the above method, thereby obtaining the active antenna according to the amplitude phase change amount of the plurality of uplink reference signals tested.
  • the near-field pattern of the uplink signal, and further, the near-field pattern is calculated by using the existing near-field-far field conversion technique to calculate the far-field pattern of the uplink signal of the active antenna.
  • the tester directly performs correlation processing on the acquired uplink reference signal and the uplink test signal; and tests the scenario for the multi-carrier signal or multi-beam signal in step 201, the tester And performing correlation processing on each uplink reference signal and each uplink test signal corresponding to each of the uplink reference signals to obtain an amplitude phase change amount of each uplink reference signal, to obtain according to the amplitude phase change amount of each uplink reference signal Active antenna uplink multi-carrier or multi-beam signal pattern.
  • the first digital signal is sent to the active antenna through the digital interface through the 'J tester, and the first digital signal is counted by the test probe receiving the active antenna.
  • a first analog signal sent after the mode conversion process acquiring a downlink reference signal and a downlink test signal according to the first digital signal and the first analog signal, and performing correlation processing to obtain an amplitude phase change amount of the downlink reference signal, according to the downlink reference signal Amplitude phase change amount obtains a downlink signal pattern of the active antenna; or sends a second analog signal to the active antenna through the analog interface and the test probe, and receives the active antenna through the digital interface to perform modulus on the second analog signal And converting the second digital signal sent after the processing, acquiring the uplink reference signal and the uplink test signal according to the second analog signal and the second digital signal, and performing correlation processing to obtain an amplitude phase change amount of the uplink reference signal, according to the amplitude of the uplink reference signal
  • the phase change amount obtains
  • FIG. 4 is a schematic structural diagram of another active antenna pattern test system according to an embodiment of the present disclosure.
  • the tester 1 specifically includes: a digital-to-analog converter 14, an analog-to-digital converter 15 and a vector network analyzer 16, the digital-to-analog converter 14 and the analog-to-digital converter 15 are respectively connected to the digital interface 12 and The vector network analyzer 16 is connected, and the vector network analyzer 16 is connected to the analog interface 13.
  • the test procedure for the active antenna downlink signal pattern is specifically as follows:
  • the vector network analyzer 16 is configured to generate a downlink reference signal in the analog domain and send the downlink reference signal to the analog to digital converter 15, the analog to digital converter 15
  • the downlink reference signal is subjected to analog-to-digital conversion processing to generate a first digital signal and transmitted to the active antenna 2 through the digital interface 12; the vector network analyzer 16 receives the active antenna 2 through the test probe 11 to perform digital-to-analog conversion on the first digital signal.
  • the vector network analyzer 16 performs correlation processing on the downlink reference signal and the downlink test signal in an analog domain to obtain the downlink An amplitude phase change amount of the reference signal to obtain an active antenna downlink signal pattern according to the amplitude phase change amount of the downlink reference signal.
  • the test procedure for the active antenna uplink signal pattern is specifically as follows:
  • the vector network analyzer 16 is configured to generate an uplink reference signal in the analog domain and transmit the uplink reference signal as a second analog signal through the analog interface 13 and the test probe 11
  • the active antenna 2 performs analog-to-digital conversion processing on the second analog signal to generate a second digital signal and sends it to the digital-to-analog converter 14 through the digital interface 21; the digital-to-analog converter 14 performs digital-to-analog conversion on the second digital signal.
  • the uplink test signal is generated and sent to the vector network analyzer 16, and the vector network analyzer 16 performs correlation processing on the uplink reference signal and the uplink test signal in the analog domain to obtain the uplink base.
  • FIG. 5 is a schematic structural diagram of another active antenna pattern test system according to an embodiment of the present disclosure.
  • the tester 1 specifically includes: a digital-to-analog converter 14, an analog-to-digital converter 15 and a signal processor 17, a digital-to-analog converter 14 and an analog-to-digital converter 15 respectively connected to an analog interface. 13 is connected to the signal processor 17, and the signal processor 17 is connected to the digital interface 12.
  • the test procedure for the active antenna downlink multi-carrier or multi-beam signal pattern is specifically: the signal processor 17 is configured to generate each carrier signal or each beam signal in the digital domain, and use it as each downlink reference signal and The carrier signal or each beam signal is combined and sent to the active antenna 2 through the digital interface 12; the first analog signal sent by the active antenna 2 after performing digital-to-analog conversion processing on the first digital signal is received by the test probe 11. Transmitting the first analog signal to the analog-to-digital converter 15, and the analog-to-digital converter 15 performs analog-to-digital conversion processing on the first analog signal, and then sends the signal to the signal processor 17, which performs the analog-to-digital conversion process.
  • each downlink test signal corresponding to each downlink reference signal is acquired in the digital domain; the signal processor 17 separately pairs each downlink reference signal and the downlink reference signal in the digital domain.
  • Corresponding respective downlink test signals are subjected to correlation processing to obtain amplitude phase change amounts of the respective downlink reference signals, according to the respective The magnitude of change of phase of the reference signal lines obtain a downlink multicarrier active antenna pattern or beam signals. It should be noted that the generation and parsing of the multi-carrier signal or the multi-beam signal by the signal processor ⁇ are prior art in the art and will not be specifically described.
  • the uplink multi-carrier or multi-beam signal pattern test procedure for the active antenna is specifically: the signal processor 17 is configured to generate each carrier signal or each beam signal in the digital domain and use it as each uplink reference signal and The carrier signal or each beam signal is combined and sent to the digital-to-analog converter 14, and the digital-to-analog converter 14 performs digital-to-analog conversion on the combined signal as a second analog signal, and transmits through the analog interface 13 and the test probe 11. Going out, the active antenna 2 performs analog-to-digital conversion processing on the second analog signal to generate a second digital signal and sends it to the signal processor 17 through the digital interface 21; the signal processor 17 splits and filters the second digital signal.
  • each uplink test signal corresponding to each uplink reference signal is obtained in the digital domain, and is in the number Performing correlation processing on each uplink reference signal and each uplink test signal corresponding to each of the uplink reference signals in the domain to obtain an amplitude phase change amount of each uplink reference signal, according to the amplitude phase change of each uplink reference signal
  • the amount of the active antenna uplink multi-carrier or multi-beam signal pattern is obtained. It should be noted that the generation and parsing of the multi-carrier signal or the multi-beam signal by the signal processor 17 are prior art in the art and will not be specifically described.
  • the active antenna pattern test system and method provided by this embodiment sends a first digital signal to the active antenna through the digital interface through the tester, and receives the active antenna through the test probe to perform digital-to-analog conversion processing on the first digital signal. Transmitting the first analog signal, acquiring the downlink reference signal and the downlink test signal according to the first digital signal and the first analog signal, and performing correlation processing to obtain an amplitude phase change amount of the downlink reference signal, according to the amplitude phase change amount of the downlink reference signal Obtaining a downlink signal pattern of the active antenna; or transmitting a second analog signal to the active antenna through the analog interface and the test probe, and receiving a second number sent by the active antenna to perform analog-to-digital conversion processing on the second analog signal through the digital interface And obtaining an uplink reference signal and an uplink test signal according to the second analog signal and the second digital signal, and performing correlation processing to obtain an amplitude phase change amount of the uplink reference signal, so as to obtain an active antenna uplink according to the amplitude phase change

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Abstract

本发明提供一种有源天线方向图测试系统和方法,通过测试仪向有源天线发送第一数字信号,并接收有源天线对第一数字信号进行数模转换处理后发送的第一模拟信号,根据第一数字信号和第一模拟信号获取下行基准信号和下行测试信号,并进行相关处理获取下行基准信号的幅度相位变化量,以获取有源天线下行信号方向图;或向有源天线发送第二模拟信号,并接收有源天线对第二模拟信号进行模数转换处理后发送的第二数字信号,根据第二模拟信号和第二数字信号获取上行基准信号和上行测试信号,并进行相关处理获取上行基准信号的幅度相位变化量,以获取有源天线上行信号方向图,从而实现了对有源天线的方向图测试,满足了实际应用中的测试需求。

Description

有源天线方向图测试系统和方法
技术领域 本发明实施例涉及通信技术领域, 尤其涉及一种有源天线方向图测试 系统和方法。 背景技术
当前的天线方向图测试, 主要是釆用仅支持模拟信号的射频测试仪器 对输入输出信号均为模拟信号的无源天线进行近场方向图测试, 再通过现 有的近场-远场转换技术对近场方向图进行计算推算出无源天线的远场方 向图。
但是, 在实际应用中会经常用到具有电源供给以及装有放大器的有源 天线,由于有源天线系统中下行信号的输入为数字信号、输出为模拟信号, 而上行信号的输入为模拟信号, 输出为数字信号, 因此, 均不能直接釆用 现有的射频测试仪器对有源天线进行近场测试, 也无法通过近场方向图推 算有源天线的远场方向图。 发明内容
针对现有技术的上述缺陷, 本发明实施例提供一种有源天线方向图测 试系统和方法。
第一方面, 本发明一方面提供一种有源天线方向图测试系统, 包括: 测试仪和有源天线, 其中, 所述测试仪包括: 测试探头、 数字接口和模拟 接口, 所述测试探头与所述模拟接口相连接, 所述数字接口与所述有源天 线的数字接口相连接;
所述测试仪, 用于通过所述数字接口向所述有源天线发送第一数字信 号, 并通过所述测试探头接收所述有源天线对所述第一数字信号进行数模 转换处理后发送的第一模拟信号, 根据所述第一数字信号和所述第一模拟 信号获取下行基准信号和下行测试信号, 并对所述下行基准信号和所述下 行测试信号进行相关处理获取所述下行基准信号的幅度相位变化量, 以根 据所述下行基准信号的幅度相位变化量获取有源天线下行信号方向图; 或 所述测试仪, 用于通过所述模拟接口和所述测试探头向有源天线发送 第二模拟信号, 并通过所述数字接口接收所述有源天线对所述第二模拟信 号进行模数转换处理后发送的第二数字信号, 根据所述第二模拟信号和所 述第二数字信号获取上行基准信号和上行测试信号, 并对所述上行基准信 号和所述上行测试信号进行相关处理获取所述上行基准信号的幅度相位 变化量, 以根据所述上行基准信号的幅度相位变化量获取有源天线上行信 号方向图。
在第一种可能的实现方式中, 当所述第一数字信号为单音信号时, 所 述第一模拟信号也为单音信号;
所述测试仪具体用于: 将所述第一数字信号作为所述下行基准信号, 对所述第一模拟信号进行模数转换处理后获取所述下行测试信号, 或者, 将所述第一模拟信号作为所述下行测试信号, 对所述第一数字信号进行数 模转换处理后获取所述下行基准信号。
结合第一方面, 在第二种可能的实现方式中, 当所述第二模拟信号为 单音信号时, 所述第二数字信号也为单音信号;
所述测试仪具体用于: 将所述第二模拟信号作为所述上行基准信号, 对所述第二数字信号进行数模转换处理后获取所述上行测试信号, 或者, 将所述第二数字信号作为所述上行测试信号, 对所述第二模拟信号进行模 数转换处理后获取所述上行基准信号。
结合第一方面, 在第三种可能的实现方式中, 当所述第一数字信号为 多载波信号或多波束信号时, 所述第一模拟信号也为多载波信号或多波束 信号;
所述测试仪具体用于: 将所述第一数字信号中的各载波信号或各波束 信号作为各下行基准信号, 对所述第一模拟信号进行模数转换处理、 分路 和滤波处理后获取与所述各下行基准信号对应的各下行测试信号, 或者, 将对所述第一模拟信号进行分路和滤波处理后获取的各载波信号或各波 束信号作为各下行测试信号, 对所述第一数字信号中的各载波信号或各波 束信号进行数模转换处理后获取与所述各下行测试信号对应的各下行基 准信号; 分别对各下行基准信号和与所述各下行基准信号对应的各下行测试 信号进行相关处理获取所述各下行基准信号的幅度相位变化量, 以根据所 述各下行基准信号的幅度相位变化量获取有源天线下行多载波或多波束 信号方向图。
结合第一方面, 在第四种可能的实现方式中, 当所述第二模拟信号为 多载波信号或多波束信号时, 所述第二数字信号也为多载波信号或多波束 信号;
所述测试仪具体用于: 将所述第二模拟信号中的各载波信号或各波束 信号作为各上行基准信号, 对所述第二数字信号进行数模转换处理、 分路 和滤波处理后获取与所述各上行基准信号对应的各上行测试信号, 或者, 将对所述第二数字信号进行分路和滤波处理后获取的各载波信号或各波 束信号作为各上行测试信号, 对所述第二模拟信号中的各载波信号或各波 束信号进行模数转换处理后获取与所述各上行测试信号对应的各上行基 准信号;
分别对各上行基准信号和与所述各上行基准信号对应的各上行测试 信号进行相关处理获取所述各上行基准信号的幅度相位变化量, 以根据所 述各上行基准信号的幅度相位变化量获取有源天线上行多载波或多波束 信号方向图。
第二方面, 本发明一方面应用上述的有源天线方向图测试系统提供一 种有源天线方向图测试方法, 包括:
所述测试仪通过所述数字接口向所述有源天线发送第一数字信号, 并 通过所述测试探头接收所述有源天线对所述第一数字信号进行数模转换 处理后发送的第一模拟信号, 根据所述第一数字信号和所述第一模拟信号 获取下行基准信号和下行测试信号, 并对所述下行基准信号和所述下行测 试信号进行相关处理获取所述下行基准信号的幅度相位变化量, 以根据所 述下行基准信号的幅度相位变化量获取有源天线下行信号方向图; 或
所述测试仪通过所述模拟接口和所述测试探头向有源天线发送第二 模拟信号, 并通过所述数字接口接收所述有源天线对所述第二模拟信号进 行模数转换处理后发送的第二数字信号, 根据所述第二模拟信号和所述第 第二数字信号获取上行基准信号和上行测试信号, 并对所述上行基准信号 和所述上行测试信号进行相关处理获取所述上行基准信号的幅度相位变 化量, 以根据所述上行基准信号的幅度相位变化量获取有源天线上行信号 方向图。
在第一种可能的实现方式中, 当所述第一数字信号为单音信号时, 所 述第一模拟信号也为单音信号;
所述根据所述第一数字信号和所述第一模拟信号获取下行基准信号 和下行测试信号具体包括:
将所述第一数字信号作为所述下行基准信号, 对所述第一模拟信号进 行模数转换处理后获取所述下行测试信号, 或者, 将所述第一模拟信号作 为所述下行测试信号, 对所述第一数字信号进行数模转换处理后获取所述 下行基准信号。
结合第二方面, 在第二种可能的实现方式中, 当所述第二模拟信号为 单音信号时, 所述第二数字信号也为单音信号;
所述根据所述第二模拟信号和所述第二数字信号获取上行基准信号 和上行测试信号具体包括:
将所述第二模拟信号作为所述上行基准信号, 对所述第二数字信号进 行数模转换处理后获取所述上行测试信号, 或者, 将所述第二数字信号作 为所述上行测试信号, 对所述第二模拟信号进行模数转换处理后获取所述 上行基准信号。
结合第二方面, 在第三种可能的实现方式中, 当所述第一数字信号为 多载波信号或多波束信号时, 所述第一模拟信号也为多载波信号或多波束 信号;
所述根据所述第一数字信号和所述第一模拟信号获取下行基准信号 和下行测试信号具体包括:
将所述第一数字信号中的各载波信号或各波束信号作为各下行基准 信号, 对所述第一模拟信号进行模数转换处理、 分路和滤波处理后获取与 所述各下行基准信号对应的各下行测试信号, 或者, 将对所述第一模拟信 号进行分路和滤波处理后获取的各载波信号或各波束信号作为各下行测 试信号, 对所述第一数字信号中的各载波信号或各波束信号进行数模转换 处理后获取与所述各下行测试信号对应的各下行基准信号; 所述对所述下行基准信号和所述下行测试信号进行相关处理获取所 述下行基准信号的幅度相位变化量, 以根据所述下行基准信号的幅度相位 变化量获取有源天线下行信号方向图具体包括:
分别对各下行基准信号和与所述各下行基准信号对应的各下行测试 信号进行相关处理获取所述各下行基准信号的幅度相位变化量, 以根据所 述各下行基准信号的幅度相位变化量获取有源天线下行多载波或多波束 信号方向图。
结合第二方面, 在第四种可能的实现方式中, 当所述第二模拟信号为 多载波信号或多波束信号时, 所述第二数字信号也为多载波信号或多波束 信号;
所述根据所述第二模拟信号和所述第二数字信号获取上行基准信号 和上行测试信号具体包括:
将所述第二模拟信号中的各载波信号或各波束信号作为各上行基准 信号, 对所述第二数字信号进行数模转换处理、 分路和滤波处理后获取与 所述各上行基准信号对应的各上行测试信号, 或者, 将对所述第二数字信 号进行分路和滤波处理后获取的各载波信号或各波束信号作为各上行测 试信号, 对所述第二模拟信号中的各载波信号或各波束信号进行模数转换 处理后获取与所述各上行测试信号对应的各上行基准信号;
所述对所述上行基准信号和所述上行测试信号进行相关处理获取所 述上行基准信号的幅度相位变化量, 以根据所述上行基准信号的幅度相位 变化量获取有源天线上行信号方向图具体包括:
分别对各上行基准信号和与所述各上行基准信号对应的各上行测试 信号进行相关处理获取所述各上行基准信号的幅度相位变化量, 以根据所 述各上行基准信号的幅度相位变化量获取有源天线上行多载波或多波束 信号方向图。
本发明实施例提供的有源天线方向图测试系统和方法, 通过测试仪通 过数字接口向有源天线发送第一数字信号, 并通过测试探头接收有源天线 对第一数字信号进行数模转换处理后发送的第一模拟信号, 根据第一数字 信号和第一模拟信号获取下行基准信号和下行测试信号, 并进行相关处理 获取下行基准信号的幅度相位变化量, 以根据下行基准信号的幅度相位变 化量获取有源天线下行信号方向图; 或通过模拟接口和测试探头向有源天 线发送第二模拟信号, 并通过数字接口接收有源天线对第二模拟信号进行 模数转换处理后发送的第二数字信号, 根据第二模拟信号和第二数字信号 获取上行基准信号和上行测试信号, 并进行相关处理获取上行基准信号的 幅度相位变化量, 以根据上行基准信号的幅度相位变化量获取有源天线上 行信号方向图, 从而实现了对有源天线的方向图测试, 解决了现有的射频 测试仪只能对无源天线进行测试的局限性, 满足了实际应用中的测试需 求。 附图说明
实施例或现有技术描述中所需要使用的附图作一简单地介绍, 显而易见 地, 下面描述中的附图是本发明的一些实施例, 对于本领域普通技术人员 来讲, 在不付出创造性劳动性的前提下, 还可以根据这些附图获得其他的 附图。 图 1为本发明实施例提供的一个有源天线方向图测试系统的结构示意 图;
图 2为本发明实施例提供的一个应用图 1所示的有源天线方向图测试 系统所进行的有源天线下行方向图 'J试方法的流程图;
图 3为本发明实施例提供的一个应用图 1所示的有源天线方向图测试 系统所进行的有源天线上行方向图 'J试方法的流程图;
图 4为本发明实施例提供的另一有源天线方向图测试系统的结构示意 图;
图 5为本发明实施例提供的又一有源天线方向图测试系统的结构示意 图。 具体实施方式 图 1为本发明实施例提供的一个有源天线方向图测试系统的结构示意 图, 如图 1所示, 该系统具体包括: 测试仪 1和有源天线 2 , 其中, 测试 仪 1包括: 测试探头 1 1、 数字接口 12和模拟接口 13 , 测试探头 1 1与模 拟接口 13相连接, 数字接口 12与有源天线 2的数字接口 21相连接, 其 中,
测试仪 1用于通过数字接口 12向有源天线 2的数字接口 21发送第一 数字信号, 并通过测试探头 1 1接收有源天线 2对第一数字信号进行数模 转换处理后发送的第一模拟信号, 根据第一数字信号和第一模拟信号获取 下行基准信号和下行测试信号, 并对下行基准信号和下行测试信号进行相 关处理获取下行基准信号的幅度相位变化量, 以根据下行基准信号的幅度 相位变化量获取有源天线下行信号方向图; 或
测试仪 1用于通过模拟接口 13和测试探头 1 1向有源天线 2发送第二 模拟信号, 并通过数字接口 21接收有源天线 2对第二模拟信号进行模数 转换处理后发送的第二数字信号, 根据第二模拟信号和第二数字信号获取 上行基准信号和上行测试信号, 并对上行基准信号和上行测试信号进行相 关处理获取上行基准信号的幅度相位变化量, 以根据上行基准信号的幅度 相位变化量获取有源天线上行信号方向图。
具体地, 图 2为本发明实施例提供的一个应用图 1所示的有源天线方 向图测试系统所进行的有源天线下行方向图测试方法的流程图, 如图 2所 示, 该方法具体包括:
步骤 100, 测试仪通过数字接口向有源天线发送第一数字信号, 并通 过测试探头接收有源天线对第一数字信号进行数模转换处理后发送的第 一模拟信号;
针对有源天线的下行方向图测试, 首先测试仪通过数字接口向有源天 线发送第一数字信号, 有源天线通过自身的数字接口接收到第一数字信号 后, 对第一数字信号进行数模转换处理后向空间发射第一模拟信号, 从而 测试仪通过预先设置好的测试探头接收有源天线发送的第一模拟信号。
步骤 101 , 所述测试仪根据所述第一数字信号和所述第一模拟信号获 取下行基准信号和下行测试信号;
测试仪根据之前通过数字接口发送给有源天线的第一数字信号和通 过测试探头接收的有源天线发送的第一模拟信号获取下行基准信号和下 行测试信号。 其中, 测试仪根据所述第一数字信号和所述第一模拟信号获 取下行基准信号和下行测试信号的方式视实际的应用需要进行选择, 具体 ^口下:
当测试仪通过数字接口向有源天线发送的第一数字信号为单音信号 时, 对应地, 有源天线对第一数字信号进行数模转换处理后发送的第一模 拟信号也为单音信号。 针对此测试场景, 若测试仪将第一数字信号作为下 行基准信号, 则对第一模拟信号进行模数转换处理后获取下行测试信号, 从而测试仪获取数字域的下行基准信号和下行测试信号; 若测试仪将第一 模拟信号作为下行测试信号, 则对第一数字信号进行数模转换处理后获取 下行基准信号, 从而测试仪获取模拟域的下行基准信号和下行测试信号。
当测试仪通过数字接口向有源天线发送的第一数字信号为多载波信 号或多波束信号时, 对应地, 有源天线对第一数字信号进行数模转换处理 后发送的第一模拟信号也为多载波信号或多波束信号。 针对此测试场景, 若测试仪将第一数字信号中的各载波信号或各波束信号作为各下行基准 信号, 则对第一模拟信号进行模数转换处理、 分路和滤波处理后获取与各 下行基准信号对应的各下行测试信号; 若将对第一模拟信号进行分路和滤 波处理后获取的各载波信号或各波束信号作为各下行测试信号, 则对第一 数字信号中的各载波信号或各波束信号进行数模转换处理后获取与各下 行 'J试信号对应的各下行基准信号。
步骤 102 , 所述测试仪对所述下行基准信号和所述下行测试信号进行 相关处理获取所述下行基准信号的幅度相位变化量, 以根据所述下行基准 信号的幅度相位变化量获取有源天线下行信号方向图。
测试仪对获取的下行基准信号和下行测试信号进行相关处理, 根据相 关处理的结果获取下行基准信号的幅度相位变化量。 通过对测试探头位置 的调整得到不同的测试点, 参照上述方法获取与各个测试点对应的下行基 准信号的幅度相位变化量, 从而根据测试的多个下行基准信号的幅度相位 变化量获取有源天线下行信号的近场方向图, 进一步地, 应用现有的近场 -远场转换技术对近场方向图进行计算推算出有源天线下行信号的远场方 向图。
需要说明的是, 针对步骤 101中的单音信号测试场景, 测试仪直接对 获取的下行基准信号和下行测试信号进行相关处理; 针对步骤 101中的多 载波信号或多波束信号测试场景, 测试仪分别对各下行基准信号和与所述 各下行基准信号对应的各下行测试信号进行相关处理获取所述各下行基 准信号的幅度相位变化量, 以根据所述各下行基准信号的幅度相位变化量 获取有源天线下行多载波或多波束信号方向图。
具体地, 图 3为本发明实施例提供的一个应用图 1所示的有源天线方 向图测试系统所进行的有源天线上行方向图测试方法的流程图, 如图 3所 示, 该方法具体包括:
步骤 200 , 测试仪通过模拟接口和测试探头向有源天线发送第二模拟 信号, 并通过数字接口接收有源天线对第二模拟信号进行模数转换处理后 发送的第二数字信号;
针对有源天线的上行方向图测试, 首先测试仪通过模拟接口和预先设 置好的测试探头发射第二模拟信号, 有源天线通过天线阵子接收到测试探 头辐射的第二模拟信号后, 对第二模拟信号进行模数转换处理后通过数字 接口向测试仪的数字接口发送第二数字信号。
步骤 201 , 所述测试仪根据所述第二模拟信号和所述第二数字信号获 取上行基准信号和上行 'J试信号;
测试仪根据之前通过模拟接口和预先设置好的测试探头发射的第二 模拟信号和通过数字接口接收的有源天线发送的第二数字信号获取上行 基准信号和上行测试信号。 其中, 测试仪根据所述第二模拟信号和所述第 二数字信号获取上行基准信号和上行测试信号的方式视实际的应用需要 进行选择, 具体如下:
当测试仪通过模拟接口和预先设置好的测试探头发射的第二模拟信 号为单音信号时, 对应地, 有源天线对第二模拟信号进行模数转换处理后 发送的第二数字信号也为单音信号。 针对此测试场景, 若测试仪将第二模 拟信号作为上行基准信号, 则对第二数字信号进行数模转换处理后获取上 行测试信号, 从而测试仪获取模拟域的上行基准信号和上行测试信号; 若 测试仪将第二数字信号作为上行测试信号, 则对第二模拟信号进行模数转 换处理后获取上行基准信号, 从而测试仪获取数字域的上行基准信号和上 行测试信号。
当测试仪通过模拟接口和预先设置好的测试探头发射的第二模拟信 号为多载波信号或多波束信号时, 对应地, 有源天线对第二模拟信号进行 模数转换处理后发送的第二数字信号也为多载波信号或多波束信号。 针对 此测试场景, 若测试仪将第二模拟信号中的各载波信号或各波束信号作为 各上行基准信号, 则对第二数字信号进行数模转换处理、 分路和滤波处理 后获取与各上行基准信号对应的各上行测试信号; 若将对第二数字信号进 行分路和滤波处理后获取的各载波信号或各波束信号作为各上行测试信 号, 则对第二模拟信号中的各载波信号或各波束信号进行模数转换处理后 获取与各上行测试信号对应的各上行基准信号。
步骤 202 , 所述测试仪对所述上行基准信号和所述上行测试信号进行 相关处理获取所述上行基准信号的幅度相位变化量, 以根据所述上行基准 信号的幅度相位变化量获取有源天线上行信号方向图。
测试仪对获取的上行基准信号和上行测试信号进行相关处理, 根据相 关处理的结果获取上行基准信号的幅度相位变化量。 通过对测试探头位置 的调整得到不同的测试点, 参照上述方法获取与各个测试点对应的上行基 准信号的幅度相位变化量, 从而根据测试的多个上行基准信号的幅度相位 变化量获取有源天线上行信号的近场方向图, 进一步地, 应用现有的近场 -远场转换技术对近场方向图进行计算推算出有源天线上行信号的远场方 向图。
需要说明的是, 针对步骤 201中的单音信号测试场景, 测试仪直接对 获取的上行基准信号和上行测试信号进行相关处理; 针对步骤 201中的多 载波信号或多波束信号测试场景, 测试仪分别对各上行基准信号和与所述 各上行基准信号对应的各上行测试信号进行相关处理获取所述各上行基 准信号的幅度相位变化量, 以根据所述各上行基准信号的幅度相位变化量 获取有源天线上行多载波或多波束信号方向图。
本实施例提供的有源天线方向图 'J试系统和方法, 通过 'J试仪通过数 字接口向有源天线发送第一数字信号, 并通过测试探头接收有源天线对第 一数字信号进行数模转换处理后发送的第一模拟信号, 根据第一数字信号 和第一模拟信号获取下行基准信号和下行测试信号, 并进行相关处理获取 下行基准信号的幅度相位变化量, 以根据下行基准信号的幅度相位变化量 获取有源天线下行信号方向图; 或通过模拟接口和测试探头向有源天线发 送第二模拟信号, 并通过数字接口接收有源天线对第二模拟信号进行模数 转换处理后发送的第二数字信号, 根据第二模拟信号和第二数字信号获取 上行基准信号和上行测试信号, 并进行相关处理获取上行基准信号的幅度 相位变化量, 以根据上行基准信号的幅度相位变化量获取有源天线上行信 号方向图, 从而实现了对有源天线的方向图测试, 解决了现有的射频测试 仪只能对无源天线进行测试的局限性, 满足了实际应用中的测试需求。
为了更清楚的描述本发明实施例测试仪对有源天线进行方向图测试 的过程, 针对若干测试场景对测试仪中的各个处理单元和连接方式以及处 理流程进行具体说明, 举例说明如下:
图 4为本发明实施例提供的另一有源天线方向图测试系统的结构示意 图, 本实施例是对在模拟域中对单音信号进行测试的应用场景进行具体说 明, 如图 4所示, 基于图 1所示实施例, 测试仪 1具体包括: 数模转换器 14、 模数转换器 15和矢量网络分析仪 16, 数模转换器 14和模数转换器 15都分别与数字接口 12和矢量网络分析仪 16相连接, 矢量网络分析仪 16与模拟接口 13相连接,
针对有源天线下行信号方向图测试过程具体为: 矢量网络分析仪 16 用于在模拟域中生成下行基准信号并将所述下行基准信号发送给模数转 换器 15 , 模数转换器 15对所述下行基准信号进行模数转换处理后生成第 一数字信号并通过数字接口 12发送给有源天线 2; 矢量网络分析仪 16通 过测试探头 11接收有源天线 2对第一数字信号进行数模转换处理后发送 的第一模拟信号, 并将所述第一模拟信号作为下行测试信号; 矢量网络分 析仪 16对所述下行基准信号和所述下行测试信号在模拟域中进行相关处 理获取所述下行基准信号的幅度相位变化量, 以根据所述下行基准信号的 幅度相位变化量获取有源天线下行信号方向图。
针对有源天线上行信号方向图测试过程具体为: 矢量网络分析仪 16 用于在模拟域中生成上行基准信号并将所述上行基准信号作为第二模拟 信号通过模拟接口 13和测试探头 11发射出去, 有源天线 2对所述第二模 拟信号进行模数转换处理后生成第二数字信号并通过数字接口 21发送给 数模转换器 14; 数模转换器 14对第二数字信号进行数模转换处理后生成 上行测试信号发送给矢量网络分析仪 16, 矢量网络分析仪 16对所述上行 基准信号和所述上行测试信号在模拟域中进行相关处理获取所述上行基 准信号的幅度相位变化量, 以根据所述上行基准信号的幅度相位变化量获 取有源天线上行信号方向图。
图 5为本发明实施例提供的又一有源天线方向图测试系统的结构示意 图, 本实施例是对在数字域中对多载波或多波束信号进行测试的应用场景 进行具体说明, 如图 5所示, 基于图 1所示实施例, 测试仪 1具体包括: 数模转换器 14、 模数转换器 15和信号处理器 17 , 数模转换器 14和模数 转换器 15都分别与模拟接口 13和信号处理器 17相连接, 信号处理器 17 与数字接口 12相连接,
针对有源天线下行多载波或多波束信号方向图测试过程具体为: 信号 处理器 17用于在数字域中生成各载波信号或各波束信号, 并将其作为各 下行基准信号并将所述各载波信号或各波束信号合路处理后通过数字接 口 12发送给有源天线 2; 通过测试探头 1 1接收有源天线 2对第一数字信 号进行数模转换处理后发送的第一模拟信号, 并将所述第一模拟信号发送 给模数转换器 15 , 模数转换器 15对第一模拟信号进行模数转换处理后发 送给信号处理器 17 , 信号处理器 17对经过模数转换处理后的第一模拟信 号进行分路、 滤波处理后在数字域中获取与各下行基准信号对应的各下行 测试信号; 信号处理器 17在数字域中分别对各下行基准信号和与所述各 下行基准信号对应的各下行测试信号进行相关处理获取所述各下行基准 信号的幅度相位变化量, 以根据所述各下行基准信号的幅度相位变化量获 取有源天线下行多载波或多波束信号方向图。 需要说明的是, 信号处理器 Π对多载波信号或多波束信号的产生和解析属于本领域的现有技术,不再 具体说明。
针对有源天线上行多载波或多波束信号方向图测试过程具体为: 信号 处理器 17用于在数字域中生成各载波信号或各波束信号, 并将其作为各 上行基准信号并将所述各载波信号或各波束信号合路处理后发送给数模 转换器 14, 数模转换器 14对合路处理后的信号进行数模转换后作为第二 模拟信号, 通过模拟接口 13和测试探头 11发射出去, 有源天线 2对所述 第二模拟信号进行模数转换处理后生成第二数字信号并通过数字接口 21 发送给信号处理器 17; 信号处理器 17对第二数字信号进行分路、 滤波处 理后在数字域中获取与各上行基准信号对应的各上行测试信号, 并在数字 域中分别对各上行基准信号和与所述各上行基准信号对应的各上行测试 信号进行相关处理获取所述各上行基准信号的幅度相位变化量, 以根据所 述各上行基准信号的幅度相位变化量获取有源天线上行多载波或多波束 信号方向图。 需要说明的是, 信号处理器 17对多载波信号或多波束信号 的产生和解析属于本领域的现有技术, 不再具体说明。
本实施例提供的有源天线方向图测试系统和方法, 通过测试仪通过数 字接口向有源天线发送第一数字信号, 并通过测试探头接收有源天线对第 一数字信号进行数模转换处理后发送的第一模拟信号, 根据第一数字信号 和第一模拟信号获取下行基准信号和下行测试信号, 并进行相关处理获取 下行基准信号的幅度相位变化量, 以根据下行基准信号的幅度相位变化量 获取有源天线下行信号方向图; 或通过模拟接口和测试探头向有源天线发 送第二模拟信号, 并通过数字接口接收有源天线对第二模拟信号进行模数 转换处理后发送的第二数字信号, 根据第二模拟信号和第二数字信号获取 上行基准信号和上行测试信号, 并进行相关处理获取上行基准信号的幅度 相位变化量, 以根据上行基准信号的幅度相位变化量获取有源天线上行信 号方向图, 从而实现了对有源天线的方向图测试, 解决了现有的射频测试 仪只能对无源天线进行测试的局限性, 满足了实际应用中的测试需求。
本领域普通技术人员可以理解: 实现上述方法实施例的全部或部分步 骤可以通过程序指令相关的硬件来完成, 前述的程序可以存储于一计算机 可读取存储介质中, 该程序在执行时, 执行包括上述方法实施例的步骤; 而前述的存储介质包括: ROM、 RAM, 磁碟或者光盘等各种可以存储程 序代码的介质。
最后应说明的是: 以上实施例仅用以说明本发明的技术方案, 而非对 其限制; 尽管参照前述实施例对本发明进行了详细的说明, 本领域的普通 技术人员应当理解: 其依然可以对前述各实施例所记载的技术方案进行修 改, 或者对其中部分技术特征进行等同替换; 而这些修改或者替换, 并不 使相应技术方案的本质脱离本发明各实施例技术方案的精神和范围。

Claims

权 利 要 求 书
1、 一种有源天线方向图测试系统, 其特征在于, 包括: 测试仪和有 源天线, 其中, 所述测试仪包括: 测试探头、 数字接口和模拟接口, 所述 测试探头与所述模拟接口相连接, 所述数字接口与所述有源天线的数字接 口相连接;
所述测试仪, 用于通过所述数字接口向所述有源天线发送第一数字信 号, 并通过所述测试探头接收所述有源天线对所述第一数字信号进行数模 转换处理后发送的第一模拟信号, 根据所述第一数字信号和所述第一模拟 信号获取下行基准信号和下行测试信号, 并对所述下行基准信号和所述下 行测试信号进行相关处理获取所述下行基准信号的幅度相位变化量, 以根 据所述下行基准信号的幅度相位变化量获取有源天线下行信号方向图; 或 所述测试仪, 用于通过所述模拟接口和所述测试探头向有源天线发送 第二模拟信号, 并通过所述数字接口接收所述有源天线对所述第二模拟信 号进行模数转换处理后发送的第二数字信号, 根据所述第二模拟信号和所 述第二数字信号获取上行基准信号和上行测试信号, 并对所述上行基准信 号和所述上行测试信号进行相关处理获取所述上行基准信号的幅度相位 变化量, 以根据所述上行基准信号的幅度相位变化量获取有源天线上行信 号方向图。
2、 根据权利要求 1所述的有源天线方向图测试系统, 其特征在于, 当所述第一数字信号为单音信号时, 所述第一模拟信号也为单音信号; 所述测试仪具体用于: 将所述第一数字信号作为所述下行基准信号, 对所述第一模拟信号进行模数转换处理后获取所述下行测试信号, 或者, 将所述第一模拟信号作为所述下行测试信号, 对所述第一数字信号进行数 模转换处理后获取所述下行基准信号。
3、 根据权利要求 1所述的有源天线方向图测试系统, 其特征在于, 当所述第二模拟信号为单音信号时, 所述第二数字信号也为单音信号; 所述测试仪具体用于: 将所述第二模拟信号作为所述上行基准信号, 对所述第二数字信号进行数模转换处理后获取所述上行测试信号, 或者, 将所述第二数字信号作为所述上行测试信号, 对所述第二模拟信号进行模 数转换处理后获取所述上行基准信号。
4、 根据权利要求 1所述的有源天线方向图测试系统, 其特征在于, 当所述第一数字信号为多载波信号或多波束信号时, 所述第一模拟信号也 为多载波信号或多波束信号;
所述测试仪具体用于: 将所述第一数字信号中的各载波信号或各波束 信号作为各下行基准信号, 对所述第一模拟信号进行模数转换处理、 分路 和滤波处理后获取与所述各下行基准信号对应的各下行测试信号, 或者, 将对所述第一模拟信号进行分路和滤波处理后获取的各载波信号或各波 束信号作为各下行测试信号, 对所述第一数字信号中的各载波信号或各波 束信号进行数模转换处理后获取与所述各下行测试信号对应的各下行基 准信号;
分别对各下行基准信号和与所述各下行基准信号对应的各下行测试 信号进行相关处理获取所述各下行基准信号的幅度相位变化量, 以根据所 述各下行基准信号的幅度相位变化量获取有源天线下行多载波或多波束 信号方向图。
5、 根据权利要求 1所述的有源天线方向图测试系统, 其特征在于, 当所述第二模拟信号为多载波信号或多波束信号时, 所述第二数字信号也 为多载波信号或多波束信号;
所述测试仪具体用于: 将所述第二模拟信号中的各载波信号或各波束 信号作为各上行基准信号, 对所述第二数字信号进行数模转换处理、 分路 和滤波处理后获取与所述各上行基准信号对应的各上行测试信号, 或者, 将对所述第二数字信号进行分路和滤波处理后获取的各载波信号或各波 束信号作为各上行测试信号, 对所述第二模拟信号中的各载波信号或各波 束信号进行模数转换处理后获取与所述各上行测试信号对应的各上行基 准信号;
分别对各上行基准信号和与所述各上行基准信号对应的各上行测试 信号进行相关处理获取所述各上行基准信号的幅度相位变化量, 以根据所 述各上行基准信号的幅度相位变化量获取有源天线上行多载波或多波束 信号方向图。
6、 一种应用如权利要求 1所述的有源天线方向图测试系统进行的有 源天线方向图测试方法, 其特征在于, 包括: 所述测试仪通过所述数字接口向所述有源天线发送第一数字信号, 并 通过所述测试探头接收所述有源天线对所述第一数字信号进行数模转换 处理后发送的第一模拟信号, 根据所述第一数字信号和所述第一模拟信号 获取下行基准信号和下行测试信号, 并对所述下行基准信号和所述下行测 试信号进行相关处理获取所述下行基准信号的幅度相位变化量, 以根据所 述下行基准信号的幅度相位变化量获取有源天线下行信号方向图; 或 所述测试仪通过所述模拟接口和所述测试探头向有源天线发送第二 模拟信号, 并通过所述数字接口接收所述有源天线对所述第二模拟信号进 行模数转换处理后发送的第二数字信号, 根据所述第二模拟信号和所述第 二数字信号获取上行基准信号和上行测试信号, 并对所述上行基准信号和 所述上行测试信号进行相关处理获取所述上行基准信号的幅度相位变化 量, 以根据所述上行基准信号的幅度相位变化量获取有源天线上行信号方 向图。
7、 根据权利要求 6所述的有源天线方向图测试方法, 其特征在于, 当所述第一数字信号为单音信号时, 所述第一模拟信号也为单音信号; 所述根据所述第一数字信号和所述第一模拟信号获取下行基准信号 和下行测试信号具体包括:
将所述第一数字信号作为所述下行基准信号, 对所述第一模拟信号进 行模数转换处理后获取所述下行测试信号, 或者, 将所述第一模拟信号作 为所述下行测试信号, 对所述第一数字信号进行数模转换处理后获取所述 下行基准信号。
8、 根据权利要求 6所述的有源天线方向图测试方法, 其特征在于, 当所述第二模拟信号为单音信号时, 所述第二数字信号也为单音信号; 所述根据所述第二模拟信号和所述第二数字信号获取上行基准信号 和上行测试信号具体包括:
将所述第二模拟信号作为所述上行基准信号, 对所述第二数字信号进 行数模转换处理后获取所述上行测试信号, 或者, 将所述第二数字信号作 为所述上行测试信号, 对所述第二模拟信号进行模数转换处理后获取所述 上行基准信号。
9、 根据权利要求 6所述的有源天线方向图测试方法, 其特征在于, 当所述第一数字信号为多载波信号或多波束信号时, 所述第一模拟信号也 为多载波信号或多波束信号;
所述根据所述第一数字信号和所述第一模拟信号获取下行基准信号 和下行测试信号具体包括:
将所述第一数字信号中的各载波信号或各波束信号作为各下行基准 信号, 对所述第一模拟信号进行模数转换处理、 分路和滤波处理后获取与 所述各下行基准信号对应的各下行测试信号, 或者, 将对所述第一模拟信 号进行分路和滤波处理后获取的各载波信号或各波束信号作为各下行测 试信号, 对所述第一数字信号中的各载波信号或各波束信号进行数模转换 处理后获取与所述各下行测试信号对应的各下行基准信号;
所述对所述下行基准信号和所述下行测试信号进行相关处理获取所 述下行基准信号的幅度相位变化量, 以根据所述下行基准信号的幅度相位 变化量获取有源天线下行信号方向图具体包括:
分别对各下行基准信号和与所述各下行基准信号对应的各下行测试 信号进行相关处理获取所述各下行基准信号的幅度相位变化量, 以根据所 述各下行基准信号的幅度相位变化量获取有源天线下行多载波或多波束 信号方向图。
10、 根据权利要求 6所述的有源天线方向图测试方法, 其特征在于, 当所述第二模拟信号为多载波信号或多波束信号时, 所述第二数字信号也 为多载波信号或多波束信号;
所述根据所述第二模拟信号和所述第二数字信号获取上行基准信号 和上行测试信号具体包括:
将所述第二模拟信号中的各载波信号或各波束信号作为各上行基准 信号, 对所述第二数字信号进行数模转换处理、 分路和滤波处理后获取与 所述各上行基准信号对应的各上行测试信号, 或者, 将对所述第二数字信 号进行分路和滤波处理后获取的各载波信号或各波束信号作为各上行测 试信号, 对所述第二模拟信号中的各载波信号或各波束信号进行模数转换 处理后获取与所述各上行测试信号对应的各上行基准信号;
所述对所述上行基准信号和所述上行测试信号进行相关处理获取所 述上行基准信号的幅度相位变化量, 以根据所述上行基准信号的幅度相位 变化量获取有源天线上行信号方向图具体包括:
分别对各上行基准信号和与所述各上行基准信号对应的各上行测试 信号进行相关处理获取所述各上行基准信号的幅度相位变化量, 以根据所 述各上行基准信号的幅度相位变化量获取有源天线上行多载波或多波束 信号方向图。
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