WO2014029852A3 - Messung der lichtstrahlung von leuchtdioden - Google Patents

Messung der lichtstrahlung von leuchtdioden Download PDF

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Publication number
WO2014029852A3
WO2014029852A3 PCT/EP2013/067479 EP2013067479W WO2014029852A3 WO 2014029852 A3 WO2014029852 A3 WO 2014029852A3 EP 2013067479 W EP2013067479 W EP 2013067479W WO 2014029852 A3 WO2014029852 A3 WO 2014029852A3
Authority
WO
WIPO (PCT)
Prior art keywords
light
light radiation
measurement
emitting diodes
emitted
Prior art date
Application number
PCT/EP2013/067479
Other languages
English (en)
French (fr)
Other versions
WO2014029852A2 (de
Inventor
Simeon Katz
Holger Specht
Alexander Linkov
Christopher KÖLPER
Original Assignee
Osram Opto Semiconductors Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Osram Opto Semiconductors Gmbh filed Critical Osram Opto Semiconductors Gmbh
Priority to US14/423,695 priority Critical patent/US9683888B2/en
Publication of WO2014029852A2 publication Critical patent/WO2014029852A2/de
Publication of WO2014029852A3 publication Critical patent/WO2014029852A3/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0425—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using optical fibers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0474—Diffusers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
    • G01J2001/4252—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources for testing LED's

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Led Devices (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

Die Erfindung betrifft ein Verfahren zum Messen einer von einer Leuchtdiode (210) abgegebenen Lichtstrahlung (300). Bei dem Verfahren wird ein Ende (121) einer Lichtleitfaser (120), welche mit einer Messeinrichtung (130) verbunden ist, durch eine optische Einrichtung (140) hindurch mit der von der Leuchtdiode (210) abgegebenen Lichtstrahlung (300) bestrahlt, so dass ein Teil der Lichtstrahlung (300) in die Lichtleitfaser (120) eingekoppelt und zu der Messeinrichtung (130) geführt wird. Die optische Einrichtung (140) bewirkt, dass die die optische Einrichtung (140) durchtretende Lichtstrahlung (300) in diffuser Form in Richtung des Endes (121) der Lichtleitfaser (130) abgegeben wird. Die Erfindung betrifft des Weiteren eine Vorrichtung (100) zum Messen einer von einer Leuchtdiode (210) abgegebenen Lichtstrahlung (300).
PCT/EP2013/067479 2012-08-24 2013-08-22 Messung der lichtstrahlung von leuchtdioden WO2014029852A2 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US14/423,695 US9683888B2 (en) 2012-08-24 2013-08-22 Measurement of the light radiation of light-emitting diodes

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102012215092.7A DE102012215092A1 (de) 2012-08-24 2012-08-24 Messung der Lichtstrahlung von Leuchtdioden
DE102012215092.7 2012-08-24

Publications (2)

Publication Number Publication Date
WO2014029852A2 WO2014029852A2 (de) 2014-02-27
WO2014029852A3 true WO2014029852A3 (de) 2014-04-17

Family

ID=49034092

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2013/067479 WO2014029852A2 (de) 2012-08-24 2013-08-22 Messung der lichtstrahlung von leuchtdioden

Country Status (3)

Country Link
US (1) US9683888B2 (de)
DE (1) DE102012215092A1 (de)
WO (1) WO2014029852A2 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108645600B (zh) * 2018-04-28 2021-01-22 海正药业(杭州)有限公司 一种弥散光纤发光均匀性检测仪及其检测方法
DE102018118684A1 (de) * 2018-08-01 2020-02-06 Ledlenser GmbH & Co. KG Optischer Kollimator

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030147770A1 (en) * 2001-05-17 2003-08-07 Purepulse Technologies, Inc. Light treatment monitoring and data collection in a fluid treatment system using light for the treatment of fluid products
KR20050079616A (ko) * 2004-02-06 2005-08-10 옵티맥스 테크놀러지 코포레이션 투과율이 향상된 확산판
US20090021732A1 (en) * 2007-07-18 2009-01-22 Boris Kolodin Light distribution measurement system
US20090236506A1 (en) * 2007-11-20 2009-09-24 Luminus Devices, Inc. Light-emitting device on-wafer test systems and methods

Family Cites Families (14)

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Publication number Priority date Publication date Assignee Title
DE3634597A1 (de) * 1986-10-10 1988-04-14 Philips Patentverwaltung Verfahren und anordnung zur messung der strahldichte von inkohaerentes licht abstrahlenden optischen sendern bzw. der leuchtdichte von inkohaerenten lichtquellen
US5619488A (en) * 1991-09-07 1997-04-08 Fuji Xerox Co., Ltd. Information recording device
US6144787A (en) * 1998-05-04 2000-11-07 Coherent, Inc. Aiming and focussing device for fiber-transported laser radiation
DE19826409C2 (de) * 1998-06-15 2000-07-13 Gms Frank Optic Products Gmbh Verfahren und Vorrichtung zur Messung der Abstrahlcharakteristik von Strahlungsquellen
JP4183370B2 (ja) * 2000-07-07 2008-11-19 株式会社東芝 トルク計測装置
DE10330005B4 (de) * 2003-07-03 2006-12-21 Leica Microsystems Semiconductor Gmbh Vorrichtung zur Inspektion eines Wafers
US20060199144A1 (en) * 2005-03-05 2006-09-07 Yongqian Liu High Efficiency LED Curing Light System
DE102005048685A1 (de) * 2005-10-11 2007-04-26 Schuh & Co. Gmbh Messanordnung und Verfahren zum Messen des Fernfeldes einer Lichtquelle
US20070196109A1 (en) * 2006-02-22 2007-08-23 Al-Chalabi Salah A Secure optical communication system
DE102009005552A1 (de) * 2009-01-20 2010-07-29 Odelo Gmbh Vorrichtung und Verfahren zur Prüfung der Radialsymmetrie der Abstrahlung seitlich emittierender Leuchtdioden (LEDs)
EP2440150A4 (de) * 2009-06-09 2012-11-14 Gen Hospital Corp Verfahren und vorrichtung zur dermatologischen behandlung und gewebeneuformung
TWI494553B (zh) * 2010-02-05 2015-08-01 Samsung Electronics Co Ltd 評估ｌｅｄ光學性質之設備及方法以及製造ｌｅｄ裝置之方法
TWI447361B (zh) * 2011-04-14 2014-08-01 Chroma Ate Inc 一種發光元件測試系統及其方法
US20130335093A1 (en) * 2012-06-13 2013-12-19 Diehl Aerospace Gmbh Method for measuring the light properties of light-emitting diodes

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030147770A1 (en) * 2001-05-17 2003-08-07 Purepulse Technologies, Inc. Light treatment monitoring and data collection in a fluid treatment system using light for the treatment of fluid products
KR20050079616A (ko) * 2004-02-06 2005-08-10 옵티맥스 테크놀러지 코포레이션 투과율이 향상된 확산판
US20090021732A1 (en) * 2007-07-18 2009-01-22 Boris Kolodin Light distribution measurement system
US20090236506A1 (en) * 2007-11-20 2009-09-24 Luminus Devices, Inc. Light-emitting device on-wafer test systems and methods

Also Published As

Publication number Publication date
WO2014029852A2 (de) 2014-02-27
DE102012215092A1 (de) 2014-02-27
US20150204718A1 (en) 2015-07-23
US9683888B2 (en) 2017-06-20

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