WO2014014534A3 - Monitoring radiated infrared - Google Patents
Monitoring radiated infrared Download PDFInfo
- Publication number
- WO2014014534A3 WO2014014534A3 PCT/US2013/038276 US2013038276W WO2014014534A3 WO 2014014534 A3 WO2014014534 A3 WO 2014014534A3 US 2013038276 W US2013038276 W US 2013038276W WO 2014014534 A3 WO2014014534 A3 WO 2014014534A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- optical filter
- light
- infrared
- narrowband
- narrowband light
- Prior art date
Links
- 238000012544 monitoring process Methods 0.000 title 1
- 230000003287 optical effect Effects 0.000 abstract 5
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0411—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0414—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using plane or convex mirrors, parallel phase plates, or plane beam-splitters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0422—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using light concentrators, collectors or condensers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0425—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using optical fibers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0429—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using polarisation elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0488—Optical or mechanical part supplementary adjustable parts with spectral filtering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
- G01J1/1626—Arrangements with two photodetectors, the signals of which are compared
Abstract
A photometer system is provided. The photometer system includes an optical filter having a narrow stopband. The optical filter is positioned to receive a combination of narrowband light and infrared light, wherein the infrared light is radiated from an article illuminated by the narrowband light. The bandwidth of the stopband overlaps a bandwidth of the narrowband light. The system includes an infrared detector positioned to receive filtered light from the optical filter with the narrowband light reduced by the optical filter. The infrared detector is operative to detect the infrared light radiated from the article as passed by the optical filter.
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201261639019P | 2012-04-26 | 2012-04-26 | |
US61/639,019 | 2012-04-26 | ||
US201361801300P | 2013-03-15 | 2013-03-15 | |
US61/801,300 | 2013-03-15 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2014014534A2 WO2014014534A2 (en) | 2014-01-23 |
WO2014014534A3 true WO2014014534A3 (en) | 2014-04-10 |
Family
ID=49949338
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2013/038276 WO2014014534A2 (en) | 2012-04-26 | 2013-04-25 | Monitoring radiated infrared |
Country Status (1)
Country | Link |
---|---|
WO (1) | WO2014014534A2 (en) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2013065035A1 (en) | 2011-11-03 | 2013-05-10 | Verifood Ltd. | Low-cost spectrometry system for end-user food analysis |
GB2543655B (en) | 2013-08-02 | 2017-11-01 | Verifood Ltd | Compact spectrometer comprising a diffuser, filter matrix, lens array and multiple sensor detector |
EP3090239A4 (en) | 2014-01-03 | 2018-01-10 | Verifood Ltd. | Spectrometry systems, methods, and applications |
EP3209983A4 (en) | 2014-10-23 | 2018-06-27 | Verifood Ltd. | Accessories for handheld spectrometer |
WO2016125164A2 (en) | 2015-02-05 | 2016-08-11 | Verifood, Ltd. | Spectrometry system applications |
WO2016125165A2 (en) | 2015-02-05 | 2016-08-11 | Verifood, Ltd. | Spectrometry system with visible aiming beam |
WO2016162865A1 (en) | 2015-04-07 | 2016-10-13 | Verifood, Ltd. | Detector for spectrometry system |
US10066990B2 (en) | 2015-07-09 | 2018-09-04 | Verifood, Ltd. | Spatially variable filter systems and methods |
US10203246B2 (en) | 2015-11-20 | 2019-02-12 | Verifood, Ltd. | Systems and methods for calibration of a handheld spectrometer |
US10254215B2 (en) | 2016-04-07 | 2019-04-09 | Verifood, Ltd. | Spectrometry system applications |
EP3488204A4 (en) | 2016-07-20 | 2020-07-22 | Verifood Ltd. | Accessories for handheld spectrometer |
US10791933B2 (en) | 2016-07-27 | 2020-10-06 | Verifood, Ltd. | Spectrometry systems, methods, and applications |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001349829A (en) * | 2000-06-06 | 2001-12-21 | Hochiki Corp | Gas monitoring device |
US20080035846A1 (en) * | 2006-05-23 | 2008-02-14 | Joseph Talghader | Tunable finesse infrared cavity thermal detectors |
JP2008164242A (en) * | 2006-12-28 | 2008-07-17 | Mitsubishi Electric Corp | Infrared ray detector |
WO2011071011A1 (en) * | 2009-12-09 | 2011-06-16 | パナソニック電工株式会社 | Infrared flame detector |
EP2444791A1 (en) * | 2010-10-25 | 2012-04-25 | General Electric Company | Gas analyzer for measuring at least two components of a gas |
-
2013
- 2013-04-25 WO PCT/US2013/038276 patent/WO2014014534A2/en active Application Filing
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001349829A (en) * | 2000-06-06 | 2001-12-21 | Hochiki Corp | Gas monitoring device |
US20080035846A1 (en) * | 2006-05-23 | 2008-02-14 | Joseph Talghader | Tunable finesse infrared cavity thermal detectors |
JP2008164242A (en) * | 2006-12-28 | 2008-07-17 | Mitsubishi Electric Corp | Infrared ray detector |
WO2011071011A1 (en) * | 2009-12-09 | 2011-06-16 | パナソニック電工株式会社 | Infrared flame detector |
EP2444791A1 (en) * | 2010-10-25 | 2012-04-25 | General Electric Company | Gas analyzer for measuring at least two components of a gas |
Also Published As
Publication number | Publication date |
---|---|
WO2014014534A2 (en) | 2014-01-23 |
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