WO2012164655A1 - Automatic inspection device and automatic inspection method - Google Patents

Automatic inspection device and automatic inspection method Download PDF

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Publication number
WO2012164655A1
WO2012164655A1 PCT/JP2011/062301 JP2011062301W WO2012164655A1 WO 2012164655 A1 WO2012164655 A1 WO 2012164655A1 JP 2011062301 W JP2011062301 W JP 2011062301W WO 2012164655 A1 WO2012164655 A1 WO 2012164655A1
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Prior art keywords
image
region
printed circuit
circuit board
extracted
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PCT/JP2011/062301
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French (fr)
Japanese (ja)
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昌年 笹井
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株式会社メガトレード
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Priority to PCT/JP2011/062301 priority Critical patent/WO2012164655A1/en
Priority to JP2013517719A priority patent/JPWO2012164655A1/en
Publication of WO2012164655A1 publication Critical patent/WO2012164655A1/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N2021/95638Inspecting patterns on the surface of objects for PCB's
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30141Printed circuit board [PCB]

Definitions

  • the present invention relates to an automatic inspection apparatus for inspecting the formation state of pads, wiring patterns, silk, resist, etc. formed on a printed circuit board, and more specifically, among through holes, slits, screw holes, etc. formed on a printed circuit board.
  • the present invention relates to an automatic inspection apparatus that does not inspect a relatively large slit or the vicinity of the edge of a screw hole.
  • pads, wiring patterns, silk, resist, etc. formed on a printed circuit board are inspected by an automatic inspection device.
  • the light emitted from the illumination device is received and inspected by the line sensor.
  • Through holes, slits, screw holes, and edges of the printed circuit board are obtained from the illumination device.
  • the light is regularly reflected, so it is easy to generate false alarms.
  • through holes need to be inspected in detail, but there is no need for strict inspection in the vicinity of the edges of slits and screw holes. It is preferable not to inspect.
  • Patent Document 1 Patent Document 2, etc.
  • the area had to be set, and the work was very troublesome.
  • JP 2009-53197 A Japanese Patent Laid-Open No. 09-312318
  • the present invention has been made in view of the above-mentioned problems, and by avoiding inspecting areas that are not necessary for inspection, such as the vicinity of slits formed on a printed circuit board, false information is reduced as much as possible.
  • An object is to provide an automatic inspection device.
  • the automatic inspection apparatus of the present invention acquires an image of a printed circuit board in an automatic inspection apparatus that inspects a printed circuit board having a through region such as a through hole, a slit, and a screw hole in order to solve the above problem.
  • the circularity ratio which is the ratio of the circular shape to the rectangular region, out of the penetrating region extracted by the penetrating region extracting means is used to exceed the predetermined threshold value. Also try to extract a small penetrating area.
  • an automatic inspection apparatus for inspecting a printed circuit board having a through region such as a through hole, a slit, and a screw hole
  • image acquisition means for acquiring an image of the printed circuit board, and the through hole from the acquired image
  • a through region extracting means for extracting through regions such as slits, screw holes, and the like, and post-removal image extraction for extracting a post-removal image of the printed board from which the through regions smaller than a predetermined threshold are removed from the extracted through regions
  • the automatic inspection apparatus 1 can inspect the formation state of the printed circuit board 10, and is acquired by the image acquisition unit 2 that acquires an image of the printed circuit board 10 and the image acquisition unit 2.
  • An inspection area A1 (see FIG. 7) is set from the obtained image, and the inspection area A1 can be inspected.
  • the penetration area extracting means 3 for extracting the penetration areas such as the through holes 11, the slits 12, and the screw holes 13 from the image acquired by the image acquisition means 2, and the through area among the extracted penetration areas.
  • a small penetrating region such as the hole 11 is extracted, and the post-removal image extracting means 6 for extracting the post-removal image from which the small penetrating region is removed, and the post-removal image are subjected to contraction processing.
  • the inspection area A1 can be inspected.
  • the automatic inspection apparatus 1 according to the present embodiment will be described in detail.
  • the image acquisition means 2 acquires the surface image from the printed circuit board 10 which is an inspection object.
  • the surface image may be acquired in gray scale.
  • the pad area where the metal is exposed is in gray scale.
  • luminance changes such as a region where the resist is applied on the pad or a region where the resist is directly applied on the printed board 10 are not clear.
  • the surface image of the printed circuit board 10 is preferably acquired by RGB.
  • the image acquisition unit 2 When the surface image of the printed circuit board 10 is acquired by the image acquisition unit 2, light is emitted from an illumination device arranged obliquely above the printed circuit board 10, and the reflected light is reflected on a line sensor or The image is acquired by the area sensor, and the image is binarized with a predetermined threshold.
  • the penetrating region extracting means 3 extracts penetrating regions such as the through hole 11, the slit 12, and the screw hole 13 from the acquired image.
  • penetrating regions such as the through hole 11, the slit 12, and the screw hole 13 from the acquired image.
  • an image of a stage for placing the printed circuit board 10 is acquired in advance, and the printed circuit board 10 and the stage acquired by the image acquisition means 2 are acquired.
  • An image consisting only of the printed circuit board 10 is extracted by taking the difference from the image.
  • the image consisting only of the printed circuit board 10 includes the through holes 11, the slits 12, the screw holes 13, and the pads and wiring patterns formed on the printed circuit board 10, silk, resist, and the like. Become.
  • the extracted image of the printed circuit board 10 is expanded several pixels vertically and horizontally by the expansion processing means 4, and an image in which the through hole 11, the slit 12, and the screw hole 13 are blocked is obtained.
  • the outer contour of the printed circuit board 10 is also expanded, and an image in which the outer contour is swollen is obtained.
  • the upper diagram in FIG. 3 is an image of the printed circuit board 10 showing the extracted penetration region, and the lower diagram in FIG. 3 shows a state in which the image has been inflated (the broken line is the outer contour of the original printed circuit board 10). ).
  • the micro area extraction means 5 extracts a small through area such as the through hole 11 using the image expanded by the expansion processing means 4.
  • various methods can be used.
  • an image subjected to expansion processing by the expansion processing means 4 is expanded by the expansion rate.
  • the shrinkage process is performed to restore the original size of the printed circuit board 10, and the difference between the shrinkage-processed image and the binarized image is obtained.
  • the contracted image since the through region is filled, an image of the through hole 11, the slit 12, and the screw hole 13 is extracted by taking the difference.
  • a ratio of the circular shape to the rectangular region surrounding the penetrating region (circularity ratio), an area, and a threshold value for the maximum length are set and smaller than those threshold values.
  • a through region is extracted and a through region including only the through hole 11 is extracted.
  • the difference between the image extracted by the difference from the stage and the expansion image acquired by the expansion processing means 4 is taken, and the penetration formed in the printed circuit board 10. It is also possible to use a method of extracting an image consisting only of the through hole 11, the slit 12 and the screw hole 13 (shaded area in FIG. 5). At this time, a difference image having a very large area is obtained by expansion of the outer portion of the printed circuit board 10, and the slit 12 and the screw hole 13 have a relatively large area difference image, and the through hole 11 has a relatively small area. The difference image is obtained.
  • the outer portion of the largest printed circuit board 10 is excluded using the first threshold, and the smallest through hole 11 is smaller than the area of the slit 12 or the screw hole 13 and the through hole 11
  • An image consisting only of the through-holes 11 is extracted using a second threshold value that is larger than the area (the bottom diagram in FIG. 5).
  • the post-removal image extracting unit 6 performs a process of adding the small penetrating region image extracted by the minute region extracting unit 5 to the obtained binarized image, and An image that does not exist (that is, an image in which only the large slit 12 and the screw hole 13 exist) is acquired.
  • the position or shape of the small penetrating area is acquired by the minute area extracting means 5, and the image at that position is added to the binarized image.
  • the images of the small penetrating areas extracted by the minute area extracting means 5 are added together, but the center position and diameter of the through hole 11 are extracted by the minute area extracting means 5 and the position and diameter are extracted.
  • the image corresponding to may be removed from the binarized image.
  • the image of the small through hole 11 is removed by the post-removal image extracting means 6 and an image of the printed circuit board 10 including the relatively large slit 12 and screw hole 13 is obtained (FIG. 6 below).
  • the contraction processing means 7 contracts the image having only the outer contour of the printed circuit board 10 and the slit 12 acquired in this way by several pixels toward the inside. Then, as indicated by the outer solid line of the hatched portion in FIG. 6, the outer contour of the printed circuit board 10 enters the inner side of the printed circuit board 10, and the opening width of the slit 12 and the screw hole 13 is also the contour of the slit 12. It enters the inside of the printed circuit board 10 so as to be large.
  • the inspection means 8 inspects the formation state of pads, wiring patterns, silk, resist, etc. of the printed circuit board 10 in the inner area A1 (outside the hatched area in FIG. 7) of the image subjected to the shrinkage process, and the shrinkage process is performed.
  • the outer area A2 (shaded area in FIG. 7) of the image is not inspected.
  • reference data is stored in advance, and the brightness value of the pixel of the image acquired from the printed circuit board 10 to be inspected is compared with the reference data, thereby forming the pad, wiring pattern, silk, resist formation state. Inspect.
  • step S1 when inspecting the printed circuit board 10, an image of the stage on which the printed circuit board 10 is placed is acquired in advance, and an image of the printed circuit board 10 placed on the stage is acquired. And the image which consists only of the printed circuit board 10 is acquired from the difference of those images, and it binarizes (step S1).
  • the extracted image consisting only of the printed circuit board 10 is expanded to fill through regions such as the through holes 11, slits 12, screw holes 13 and the like (step S2), and contraction processing is performed again.
  • the penetrating region is extracted by taking a difference between the images or by taking a difference from the binarized image acquired in step S1 (step S3).
  • the circularity ratio, the area, the maximum length, etc. are calculated for the penetrating regions such as the through holes 11, the slits 12, and the screw holes 13 extracted in this way (step S4), and the penetrating regions smaller than the predetermined threshold ( Specifically, the region of the through hole 11) is extracted (step S5). At this time, the size and the size of the extracted penetrating region are also stored.
  • the extracted region of the through hole 11 is added to the image acquired in step S1, and a post-removal image obtained by removing the image of the through hole 11 is acquired (step S6).
  • the post-removal image is an image including relatively large slits 12, screw holes 13, and the like, as shown in the lower diagram of FIG.
  • step S7 the image is contracted inward (step S7), and the inner region A1 is inspected for the formation state of pads, wiring patterns, silk, resist, and the like (step S8).
  • the image acquisition unit that acquires the image of the printed circuit board 10. 2 and a through area extracting means 3 for extracting a through area such as the through hole 11, the slit 12, and the screw hole 13 from the acquired image, and a through area smaller than a predetermined threshold among the extracted through areas
  • a post-removal image extracting means 6 for extracting a post-removal image of the printed circuit board 10 from which the image has been removed, a contraction processing means 7 for contracting the extracted post-removal image of the printed circuit board 10, and inspecting the contracted area
  • the inspection means 8 is provided so that small through-holes can be inspected and large inspection is not required. Lit 12 and screw hole 13, the vicinity of the edge of the printed board 10 can be prevented from inspection. For this reason, it becomes possible to automatically set the inspection area A1 and reduce false alarms.
  • the post-removal image extracting means 6 extracts a penetrating area smaller than a predetermined threshold by using a circular ratio that is a ratio of a circular shape to a rectangular area, a small slit, a through hole, or the like is mixed. Even in such a case, a small slit is not extracted, and only the through hole 11 that really needs to be inspected can be extracted.
  • the luminance of the acquired image is dark.
  • the portion may be extracted as a through hole 11 or a slit 12.
  • the through hole 11 may be detected by pattern matching and only the image at that position may be extracted.
  • the inspection is not performed on the slit 12, the screw hole 13, and the region A2 near the edge of the printed circuit board 10, but the region A2 is missing by a method different from the inspection region A1. Etc. may be inspected.
  • the through hole 11 is detected and the image of the through hole 11 is removed.
  • an area having an area or a maximum length equal to or greater than a predetermined threshold that is, a slit 12 or a screw. It is also possible to perform processing such as extracting the region 13 of the hole 13 and erasing other regions.
  • the present invention is used in a field where inspection is performed by setting a non-inspection area on a printed circuit board or a liquid crystal substrate.

Abstract

[Problem] To provide an automatic inspection device that has been caused to not inspect regions at which inspection is unnecessary such as slits formed in a printed substrate, reducing false alarms as much as possible. [Solution] An automatic inspection device (1), which inspects printed substrates (10) having penetrated regions such as through holes (11), slits (12), or screw holes (13), and is provided with: an image acquisition means (2) that acquires an image of a printed substrate (10); a penetrated region extraction means (3) that extracts penetrated regions such as through holes (11), slits (12), and screw holes (13) from the acquired image; a post-elimination image extraction means (6) that extracts a post-elimination image of the printed substrate (10) having eliminated relatively small through holes (11) from among the extracted penetrated regions; and a shrinking processing means (7) that subjects the extracted post-elimination image of the printed substrate (10) to shrinking processing. It is possible to inspect only the shrinking processed region (A1).

Description

自動検査装置および自動検査方法Automatic inspection device and automatic inspection method
 本発明は、プリント基板に形成されたパッドや配線パターン、シルク、レジストなどの形成状態を検査する自動検査装置に関し、より詳しくは、プリント基板に形成されたスルーホールやスリット、ネジ穴などのうち、比較的大きなスリットやネジ穴の縁部近傍などを検査しないようにした自動検査装置に関するものである。 The present invention relates to an automatic inspection apparatus for inspecting the formation state of pads, wiring patterns, silk, resist, etc. formed on a printed circuit board, and more specifically, among through holes, slits, screw holes, etc. formed on a printed circuit board. The present invention relates to an automatic inspection apparatus that does not inspect a relatively large slit or the vicinity of the edge of a screw hole.
 一般に、プリント基板上に形成されたパッドや配線パターン、シルク、レジストなどは自動検査装置によって検査される。 Generally, pads, wiring patterns, silk, resist, etc. formed on a printed circuit board are inspected by an automatic inspection device.
 ところで、このようなプリント基板を検査する場合、照明装置から照射された光をラインセンサで受光して検査するが、スルーホールやスリット、ネジ穴、プリント基板の縁部については、その照明装置からの光が正反射してしまうため虚報を生じさせやすい。これらの領域のうち、スルーホールについては詳細に検査する必要があるが、スリットやネジ穴の縁部近傍などについては特に厳密な検査が必要ないため、可能であれば非検査領域として、その領域を検査しないようにするのが好ましい。 By the way, when inspecting such a printed circuit board, the light emitted from the illumination device is received and inspected by the line sensor. Through holes, slits, screw holes, and edges of the printed circuit board are obtained from the illumination device. The light is regularly reflected, so it is easy to generate false alarms. Among these areas, through holes need to be inspected in detail, but there is no need for strict inspection in the vicinity of the edges of slits and screw holes. It is preferable not to inspect.
 しかしながら、従来では、このような非検査領域を設定する場合、ユーザーによってその非検査領域を設定する方法しかなかったため(特許文献1、特許文献2など)、プリント基板の種類が変わる度に非検査領域を設定しなければならず、その作業が非常に面倒なものとなっていた。 However, conventionally, when such a non-inspection area is set, there is only a method for setting the non-inspection area by the user (Patent Document 1, Patent Document 2, etc.). The area had to be set, and the work was very troublesome.
特開2009-53197号公報JP 2009-53197 A 特開平09-312318号公報Japanese Patent Laid-Open No. 09-312318
 そこで、本発明は上記課題に鑑みてなされたもので、プリント基板に形成されたスリット近傍などのように検査に必要のない領域を検査しないようにすることで、できる限り虚報を減らすようにした自動検査装置を提供することを目的とする。 Therefore, the present invention has been made in view of the above-mentioned problems, and by avoiding inspecting areas that are not necessary for inspection, such as the vicinity of slits formed on a printed circuit board, false information is reduced as much as possible. An object is to provide an automatic inspection device.
 すなわち、本発明の自動検査装置は、上記課題を解決するために、スルーホール、スリット、ネジ穴などの貫通領域を有するプリント基板を検査する自動検査装置において、プリント基板の画像を取得する画像取得手段と、当該取得された画像から前記スルーホール、スリット、ネジ穴などの貫通領域を抽出する貫通領域抽出手段と、当該抽出された貫通領域のうち、所定の閾値より小さな貫通領域を除去したプリント基板の除去後画像を抽出する除去後画像抽出手段と、当該抽出されたプリント基板の除去後画像を収縮処理する収縮処理手段と、当該収縮処理された領域を検査する検査手段とを備えるようにしたものである。 That is, the automatic inspection apparatus of the present invention acquires an image of a printed circuit board in an automatic inspection apparatus that inspects a printed circuit board having a through region such as a through hole, a slit, and a screw hole in order to solve the above problem. Means, through area extracting means for extracting through areas such as through holes, slits, screw holes and the like from the acquired image, and a print in which through areas smaller than a predetermined threshold are removed from the extracted through areas A post-removal image extracting unit for extracting an image after removal of the substrate; a contraction processing unit for contracting the extracted post-removal image of the printed circuit board; and an inspection unit for inspecting the contracted region. It is a thing.
 このように構成すれば、小さなスルーホールについては検査することができるとともに、検査の必要のない大きなスリットやネジ穴、プリント基板の縁部近傍については検査しないようにすることができるため、自動的に検査領域を設定して虚報を減らすことができるようになる。なお、除去後画像を抽出する場合、所定の閾値よりも小さな貫通領域を抽出してそれの小さな領域を除去する他、逆に、所定の閾値よりも大きな貫通領域を抽出するなどして除去後画像を抽出すればよい。 With this configuration, small through holes can be inspected, and large slits and screw holes that do not need to be inspected, and the vicinity of the edge of the printed circuit board can not be inspected. By setting the inspection area, it becomes possible to reduce false alarms. In addition, when extracting an image after removal, in addition to extracting a through region smaller than a predetermined threshold and removing the small region, conversely, after removing by removing a through region larger than the predetermined threshold, etc. What is necessary is just to extract an image.
 また、所定の閾値よりも小さな貫通領域を抽出する場合においては、貫通領域抽出手段で抽出された貫通領域のうち、矩形状領域に対する円形形状が占める割合である円形率を用いて所定の閾値よりも小さな貫通領域を抽出するようにする。 Further, in the case of extracting a penetrating region smaller than a predetermined threshold value, the circularity ratio, which is the ratio of the circular shape to the rectangular region, out of the penetrating region extracted by the penetrating region extracting means is used to exceed the predetermined threshold value. Also try to extract a small penetrating area.
 このようにすれば、小さな縦長状のスリットとスルーホールなどが混在するような場合であっても、本当に検査の必要なスルーホールのみを抽出することができるようになる。 This makes it possible to extract only the through holes that really need to be inspected, even when small vertically long slits and through holes are mixed.
 本発明によれば、スルーホール、スリット、ネジ穴などの貫通領域を有するプリント基板を検査する自動検査装置において、プリント基板の画像を取得する画像取得手段と、当該取得された画像から前記スルーホール、スリット、ネジ穴などの貫通領域を抽出する貫通領域抽出手段と、当該抽出された貫通領域のうち、所定の閾値より小さな貫通領域を除去したプリント基板の除去後画像を抽出する除去後画像抽出手段と、当該抽出されたプリント基板の除去後画像を収縮処理する収縮処理手段と、当該収縮処理された領域を検査する検査手段とを備えるようにしたので、小さなスルーホールについては検査することができるとともに、検査に必要のない大きなスリットやネジ穴、プリント基板の縁部近傍については検査しないようにすることができる。このため、自動的に検査領域を設定して虚報を減らすことができるようになる。 According to the present invention, in an automatic inspection apparatus for inspecting a printed circuit board having a through region such as a through hole, a slit, and a screw hole, image acquisition means for acquiring an image of the printed circuit board, and the through hole from the acquired image A through region extracting means for extracting through regions such as slits, screw holes, and the like, and post-removal image extraction for extracting a post-removal image of the printed board from which the through regions smaller than a predetermined threshold are removed from the extracted through regions Means for contracting the image after removal of the extracted printed circuit board, and inspection means for inspecting the contracted region, so that small through holes can be inspected. Do not inspect large slits and screw holes that are not necessary for inspection, and the vicinity of the edge of the printed circuit board. Door can be. For this reason, it becomes possible to automatically set an inspection area and reduce false alarms.
本発明の一実施の形態における自動検査装置の機能ブロック図Functional block diagram of an automatic inspection apparatus according to an embodiment of the present invention 同形態における貫通領域を抽出する図Drawing to extract the penetration area in the same form 同形態における膨張画像を取得する図The figure which acquires the expansion picture in the same form 同形態におけるスルーホールを抽出する図Diagram for extracting through holes in the same form 他の形態におけるスルーホールを抽出する図Diagram for extracting through holes in other forms 同形態におけるスルーホールの除去後画像を取得する図The figure which acquires the image after the removal of the through hole in the same form 同形態における検査領域を設定する図The figure which sets the inspection area in the same form 同形態における処理を示すフローチャートFlow chart showing processing in the same form
 以下、本発明の一実施の形態について図面を参照して説明する。本実施の形態における自動検査装置1は、プリント基板10の形成状態を検査できるようにしたものであって、そのプリント基板10の画像を取得する画像取得手段2と、その画像取得手段2によって取得された画像から検査領域A1(図7参照)を設定し、その検査領域A1を検査できるようにしたものである。そして、特徴的には、画像取得手段2によって取得された画像からスルーホール11、スリット12、ネジ穴13などの貫通領域を抽出する貫通領域抽出手段3と、その抽出された貫通領域のうちスルーホール11などのような小さな貫通領域を抽出し、その小さな貫通領域を除去した除去後画像を抽出する除去後画像抽出手段6と、その除去後画像を収縮処理し、その収縮処理された領域を検査領域A1として検査できるようにしたものである。以下、本実施の形態における自動検査装置1について詳細に説明する。 Hereinafter, an embodiment of the present invention will be described with reference to the drawings. The automatic inspection apparatus 1 according to the present embodiment can inspect the formation state of the printed circuit board 10, and is acquired by the image acquisition unit 2 that acquires an image of the printed circuit board 10 and the image acquisition unit 2. An inspection area A1 (see FIG. 7) is set from the obtained image, and the inspection area A1 can be inspected. Characteristically, the penetration area extracting means 3 for extracting the penetration areas such as the through holes 11, the slits 12, and the screw holes 13 from the image acquired by the image acquisition means 2, and the through area among the extracted penetration areas. A small penetrating region such as the hole 11 is extracted, and the post-removal image extracting means 6 for extracting the post-removal image from which the small penetrating region is removed, and the post-removal image are subjected to contraction processing. The inspection area A1 can be inspected. Hereinafter, the automatic inspection apparatus 1 according to the present embodiment will be described in detail.
 まず、画像取得手段2は、検査対象物であるプリント基板10からその表面画像を取得する。プリント基板10から表面画像を取得する際に、グレースケールで表面画像を取得してもよいが、プリント基板10の内側の領域を検査する場合は、グレースケールであると、金属が露出したパッド領域や、そのパッド上にレジストが塗布されている領域、あるいは、プリント基板10上に直接レジストが塗布されている領域などの輝度変化が明確にならない。このため、好ましくは、RGBによってプリント基板10の表面画像を取得する。この画像取得手段2でプリント基板10の表面画像を取得する場合は、プリント基板10の斜め上方に配列された照明装置から光を照射し、その反射光をプリント基板10の真上のラインセンサやエリアセンサで取得し、その画像を所定の閾値で二値化する。 First, the image acquisition means 2 acquires the surface image from the printed circuit board 10 which is an inspection object. When acquiring the surface image from the printed circuit board 10, the surface image may be acquired in gray scale. However, when inspecting the area inside the printed circuit board 10, the pad area where the metal is exposed is in gray scale. In addition, luminance changes such as a region where the resist is applied on the pad or a region where the resist is directly applied on the printed board 10 are not clear. For this reason, the surface image of the printed circuit board 10 is preferably acquired by RGB. When the surface image of the printed circuit board 10 is acquired by the image acquisition unit 2, light is emitted from an illumination device arranged obliquely above the printed circuit board 10, and the reflected light is reflected on a line sensor or The image is acquired by the area sensor, and the image is binarized with a predetermined threshold.
 貫通領域抽出手段3は、その取得された画像からスルーホール11、スリット12、ネジ穴13などの貫通領域を抽出する。この貫通領域を抽出する場合、まず、図2に示すように、あらかじめプリント基板10を載置するためのステージの画像を取得しておき、画像取得手段2によって取得されたプリント基板10とステージの画像との差分をとることによってプリント基板10のみからなる画像を抽出する。このとき、そのプリント基板10のみからなる画像には、スルーホール11、スリット12、ネジ穴13、および、プリント基板10の上に形成されたパッドや配線パターン、シルク、レジストなどが含まれることになる。 The penetrating region extracting means 3 extracts penetrating regions such as the through hole 11, the slit 12, and the screw hole 13 from the acquired image. When extracting this penetrating region, first, as shown in FIG. 2, an image of a stage for placing the printed circuit board 10 is acquired in advance, and the printed circuit board 10 and the stage acquired by the image acquisition means 2 are acquired. An image consisting only of the printed circuit board 10 is extracted by taking the difference from the image. At this time, the image consisting only of the printed circuit board 10 includes the through holes 11, the slits 12, the screw holes 13, and the pads and wiring patterns formed on the printed circuit board 10, silk, resist, and the like. Become.
 そして、この抽出されたプリント基板10の画像を膨張処理手段4によって上下左右に数画素ずつ膨張させ、スルーホール11やスリット12、ネジ穴13を塞いだ画像を取得する。この膨張処理を行うと、プリント基板10の外側輪郭も膨張処理され、外側輪郭が膨れた画像が得られることになる。これを図3を用いて説明する。図3の上図は、抽出された貫通領域を示すプリント基板10の画像であり、図3の下図は、その画像を膨らまし処理した状態を示している(破線は元のプリント基板10の外側輪郭)。この膨らまし処理を行う場合、スルーホール11やスリット12、ネジ穴13を埋める方向に膨らまし処理をしているので、膨らまし処理された状態では、図3の下図に示すようにスルーホール11やスリット12、ネジ穴13が埋められた画像となる。 Then, the extracted image of the printed circuit board 10 is expanded several pixels vertically and horizontally by the expansion processing means 4, and an image in which the through hole 11, the slit 12, and the screw hole 13 are blocked is obtained. When this expansion process is performed, the outer contour of the printed circuit board 10 is also expanded, and an image in which the outer contour is swollen is obtained. This will be described with reference to FIG. The upper diagram in FIG. 3 is an image of the printed circuit board 10 showing the extracted penetration region, and the lower diagram in FIG. 3 shows a state in which the image has been inflated (the broken line is the outer contour of the original printed circuit board 10). ). When this expansion process is performed, since the expansion process is performed in the direction in which the through hole 11, the slit 12, and the screw hole 13 are filled, in the expanded process, as shown in the lower diagram of FIG. This is an image in which the screw holes 13 are filled.
 次に、微小領域抽出手段5では、この膨張処理手段4によって膨張処理された画像を用いてスルーホール11などの小さな貫通領域を抽出する。この小さな貫通領域を抽出する場合、種々の方法を用いることができるが、まず、第一の方法として、図4に示すように、膨張処理手段4によって膨張処理された画像をその膨張率分だけ収縮処理して元のプリント基板10の大きさに戻し、その収縮処理された画像と二値化された画像との差分をとる。このとき、その収縮処理された画像では、貫通領域が穴埋めされているため、差分をとることにより、スルーホール11やスリット12、ネジ穴13の画像が抽出されることになる。そして、その抽出された貫通領域のうち、その貫通領域を囲む矩形状領域に対する円形形状が占める割合(円形率)や、面積、最大長さに対する閾値を設定しておき、それらの閾値よりも小さな貫通領域を抽出してスルーホール11のみからなる貫通領域を抽出する。 Next, the micro area extraction means 5 extracts a small through area such as the through hole 11 using the image expanded by the expansion processing means 4. When extracting this small penetrating region, various methods can be used. First, as shown in FIG. 4, as the first method, an image subjected to expansion processing by the expansion processing means 4 is expanded by the expansion rate. The shrinkage process is performed to restore the original size of the printed circuit board 10, and the difference between the shrinkage-processed image and the binarized image is obtained. At this time, in the contracted image, since the through region is filled, an image of the through hole 11, the slit 12, and the screw hole 13 is extracted by taking the difference. Then, in the extracted penetrating region, a ratio of the circular shape to the rectangular region surrounding the penetrating region (circularity ratio), an area, and a threshold value for the maximum length are set and smaller than those threshold values. A through region is extracted and a through region including only the through hole 11 is extracted.
 また、第二の方法として、図5に示すように、ステージとの差分によって抽出された画像と、膨張処理手段4によって取得された膨張画像との差分をとり、プリント基板10に形成された貫通するスルーホール11やスリット12、ネジ穴13のみからなる画像を抽出する方法を用いることもできる(図5における斜線領域)。このとき、プリント基板10の外側部分については膨張によって非常に大きな面積の差分画像が得られ、また、スリット12やネジ穴13は比較的大きな面積の差分画像、スルーホール11については比較的小さな面積の差分画像が得られる。このため、最も大きいプリント基板10の外側部分については第一の閾値を用いて除外するとともに、最も小さいスルーホール11については、スリット12やネジ穴13の面積よりも小さく、かつ、スルーホール11の面積よりも大きな第二の閾値を用いてスルーホール11のみからなる画像を抽出する(図5の最下図)。 As a second method, as shown in FIG. 5, the difference between the image extracted by the difference from the stage and the expansion image acquired by the expansion processing means 4 is taken, and the penetration formed in the printed circuit board 10. It is also possible to use a method of extracting an image consisting only of the through hole 11, the slit 12 and the screw hole 13 (shaded area in FIG. 5). At this time, a difference image having a very large area is obtained by expansion of the outer portion of the printed circuit board 10, and the slit 12 and the screw hole 13 have a relatively large area difference image, and the through hole 11 has a relatively small area. The difference image is obtained. Therefore, the outer portion of the largest printed circuit board 10 is excluded using the first threshold, and the smallest through hole 11 is smaller than the area of the slit 12 or the screw hole 13 and the through hole 11 An image consisting only of the through-holes 11 is extracted using a second threshold value that is larger than the area (the bottom diagram in FIG. 5).
 除去後画像抽出手段6は、図6に示すように、この微小領域抽出手段5によって抽出された小さな貫通領域の画像を前記取得された二値化画像に足し合わせる処理を行い、スルーホール11の存在しない画像(すなわち、大きなスリット12、ネジ穴13のみが存在している画像)を取得する。この足し合わせ処理を行う場合は、微小領域抽出手段5で小さな貫通領域の位置や形状などを取得し、その位置における画像を二値化画像に足し合わせる。なお、ここでは、微小領域抽出手段5で抽出された小さな貫通領域の画像を足し合わせるようにしているが、微小領域抽出手段5によってスルーホール11の中心位置と直径を抽出し、その位置および直径に対応する画像を二値化画像から除去するようにしてもよい。このようにすれば、除去後画像抽出手段6により、小さなスルーホール11の画像が除去され、かつ、比較的大きなスリット12やネジ穴13が含まれているプリント基板10の画像が得られる(図6の下図)。 As shown in FIG. 6, the post-removal image extracting unit 6 performs a process of adding the small penetrating region image extracted by the minute region extracting unit 5 to the obtained binarized image, and An image that does not exist (that is, an image in which only the large slit 12 and the screw hole 13 exist) is acquired. When this addition process is performed, the position or shape of the small penetrating area is acquired by the minute area extracting means 5, and the image at that position is added to the binarized image. Here, the images of the small penetrating areas extracted by the minute area extracting means 5 are added together, but the center position and diameter of the through hole 11 are extracted by the minute area extracting means 5 and the position and diameter are extracted. The image corresponding to may be removed from the binarized image. In this manner, the image of the small through hole 11 is removed by the post-removal image extracting means 6 and an image of the printed circuit board 10 including the relatively large slit 12 and screw hole 13 is obtained (FIG. 6 below).
 次に、収縮処理手段7は、このように取得されたプリント基板10の外側輪郭やスリット12のみが存在する画像を内側に向かって数画素ずつ収縮処理する。すると、図6の斜線部の外側実線に示すように、プリント基板10の外側輪郭はプリント基板10の内側に入り込み、また、スリット12の輪郭についても、そのスリット12やネジ穴13の開口幅が大きくなるようにプリント基板10の内側に入り込む。 Next, the contraction processing means 7 contracts the image having only the outer contour of the printed circuit board 10 and the slit 12 acquired in this way by several pixels toward the inside. Then, as indicated by the outer solid line of the hatched portion in FIG. 6, the outer contour of the printed circuit board 10 enters the inner side of the printed circuit board 10, and the opening width of the slit 12 and the screw hole 13 is also the contour of the slit 12. It enters the inside of the printed circuit board 10 so as to be large.
 検査手段8は、このように収縮処理された画像の内側領域A1(図7における斜線外領域)についてプリント基板10のパッドや配線パターン、シルク、レジストなどの形成状態を検査し、収縮処理された画像の外側領域A2(図7における斜線領域)については検査しないようにする。この検査においては、あらかじめ基準データを記憶させておき、検査対象となるプリント基板10から取得された画像の画素の輝度値と基準データを比較することによってパッドや配線パターン、シルク、レジストの形成状態を検査する。 The inspection means 8 inspects the formation state of pads, wiring patterns, silk, resist, etc. of the printed circuit board 10 in the inner area A1 (outside the hatched area in FIG. 7) of the image subjected to the shrinkage process, and the shrinkage process is performed. The outer area A2 (shaded area in FIG. 7) of the image is not inspected. In this inspection, reference data is stored in advance, and the brightness value of the pixel of the image acquired from the printed circuit board 10 to be inspected is compared with the reference data, thereby forming the pad, wiring pattern, silk, resist formation state. Inspect.
 次に、このように構成された自動検査装置1における検査領域A1の設定方法および自動検査方法について図8のフローチャートを用いて説明する。 Next, a method for setting the inspection area A1 and an automatic inspection method in the automatic inspection apparatus 1 configured as described above will be described with reference to the flowchart of FIG.
 まず、プリント基板10を検査する場合、あらかじめそのプリント基板10を載置するステージの画像を取得しておくとともに、そのステージに載置されたプリント基板10の画像を取得する。そして、それらの画像の差分からプリント基板10のみからなる画像を取得して二値化する(ステップS1)。 First, when inspecting the printed circuit board 10, an image of the stage on which the printed circuit board 10 is placed is acquired in advance, and an image of the printed circuit board 10 placed on the stage is acquired. And the image which consists only of the printed circuit board 10 is acquired from the difference of those images, and it binarizes (step S1).
 一方、この抽出されたプリント基板10のみからなる画像を膨張処理してスルーホール11やスリット12、ネジ穴13などのような貫通した領域を穴埋めし(ステップS2)、再び収縮処理してこれらの画像の差分をとる方法や、ステップS1で取得された二値化画像との差分をとることなどによって貫通領域を抽出する(ステップS3)。 On the other hand, the extracted image consisting only of the printed circuit board 10 is expanded to fill through regions such as the through holes 11, slits 12, screw holes 13 and the like (step S2), and contraction processing is performed again. The penetrating region is extracted by taking a difference between the images or by taking a difference from the binarized image acquired in step S1 (step S3).
 そして、このように抽出されたスルーホール11やスリット12、ネジ穴13などの貫通領域について、円形率や面積や最大長さなどを計算し(ステップS4)、所定の閾値よりも小さな貫通領域(具体的には、スルーホール11の領域)を抽出する(ステップS5)。このとき、その抽出された貫通領域の位置とともにその大きさについても記憶させておくようにする。 Then, the circularity ratio, the area, the maximum length, etc. are calculated for the penetrating regions such as the through holes 11, the slits 12, and the screw holes 13 extracted in this way (step S4), and the penetrating regions smaller than the predetermined threshold ( Specifically, the region of the through hole 11) is extracted (step S5). At this time, the size and the size of the extracted penetrating region are also stored.
 次に、この抽出されたスルーホール11の領域を、ステップS1で取得された画像に足し合わせし、スルーホール11の画像を除去した除去後画像を取得する(ステップS6)。このとき、除去後画像は、図6の下図に示すように、比較的大きなスリット12、ネジ穴13などが含まれる画像となる。 Next, the extracted region of the through hole 11 is added to the image acquired in step S1, and a post-removal image obtained by removing the image of the through hole 11 is acquired (step S6). At this time, the post-removal image is an image including relatively large slits 12, screw holes 13, and the like, as shown in the lower diagram of FIG.
 そして、この除去後画像を内側に向けて収縮処理し(ステップS7)、その内側領域A1についてパッドや配線パターン、シルク、レジストなどの形成状態を検査する(ステップS8)。 Then, after the removal, the image is contracted inward (step S7), and the inner region A1 is inspected for the formation state of pads, wiring patterns, silk, resist, and the like (step S8).
 このように上記実施の形態によれば、スルーホール11、スリット12、ネジ穴13などの貫通領域を有するプリント基板10を検査する自動検査装置1において、プリント基板10の画像を取得する画像取得手段2と、当該取得された画像から前記スルーホール11、スリット12、ネジ穴13などの貫通領域を抽出する貫通領域抽出手段3と、当該抽出された貫通領域のうち、所定の閾値より小さな貫通領域を除去したプリント基板10の除去後画像を抽出する除去後画像抽出手段6と、当該抽出されたプリント基板10の除去後画像を収縮処理する収縮処理手段7と、当該収縮処理された領域を検査する検査手段8とを備えるようにしたので、小さなスルーホールについては検査することができるとともに、検査の必要のない大きなスリット12やネジ穴13、プリント基板10の縁部近傍については検査しないようにすることができる。このため、自動的に検査領域A1を設定して虚報を減らすことができるようになる。 As described above, according to the embodiment, in the automatic inspection apparatus 1 that inspects the printed circuit board 10 having the through regions such as the through holes 11, the slits 12, and the screw holes 13, the image acquisition unit that acquires the image of the printed circuit board 10. 2 and a through area extracting means 3 for extracting a through area such as the through hole 11, the slit 12, and the screw hole 13 from the acquired image, and a through area smaller than a predetermined threshold among the extracted through areas A post-removal image extracting means 6 for extracting a post-removal image of the printed circuit board 10 from which the image has been removed, a contraction processing means 7 for contracting the extracted post-removal image of the printed circuit board 10, and inspecting the contracted area The inspection means 8 is provided so that small through-holes can be inspected and large inspection is not required. Lit 12 and screw hole 13, the vicinity of the edge of the printed board 10 can be prevented from inspection. For this reason, it becomes possible to automatically set the inspection area A1 and reduce false alarms.
 また、除去後画像抽出手段6として、矩形状領域に対する円形形状が占める割合である円形率を用いて所定の閾値よりも小さな貫通領域を抽出するようにすれば、小さなスリットやスルーホールなどが混在しているような場合であっても、小さなスリットが抽出されるようなことがなくなり、本当に検査の必要なスルーホール11のみを抽出することができるようになる。 Further, if the post-removal image extracting means 6 extracts a penetrating area smaller than a predetermined threshold by using a circular ratio that is a ratio of a circular shape to a rectangular area, a small slit, a through hole, or the like is mixed. Even in such a case, a small slit is not extracted, and only the through hole 11 that really needs to be inspected can be extracted.
 なお、本発明は上記実施の形態に限定されることなく、種々の態様で実施することができる。 Note that the present invention is not limited to the above-described embodiment, and can be implemented in various modes.
 例えば、スルーホール11やスリット12、ネジ穴13の画像を抽出する場合、貫通した穴部分については光が届かないためにその部分が暗くなる傾向があるため、取得された画像のうち輝度が暗い部分をスルーホール11やスリット12などとして抽出するようにしてもよい。もしくは、スルーホール11を検出する場合、そのスルーホール11の孔径が分かっている場合は、パターンマッチングによってスルーホール11を検出し、その位置の画像のみを抽出するようにしてもよい。 For example, when extracting an image of the through hole 11, the slit 12, and the screw hole 13, since light does not reach the through hole portion and the portion tends to become dark, the luminance of the acquired image is dark. The portion may be extracted as a through hole 11 or a slit 12. Alternatively, when the through hole 11 is detected, if the diameter of the through hole 11 is known, the through hole 11 may be detected by pattern matching and only the image at that position may be extracted.
 また、上記実施の形態では、スリット12やネジ穴13、プリント基板10の縁部近傍の領域A2については検査しないようにしているが、この領域A2については、検査領域A1とは異なる方法で欠けなどを検査するようにしてもよい。 Further, in the above embodiment, the inspection is not performed on the slit 12, the screw hole 13, and the region A2 near the edge of the printed circuit board 10, but the region A2 is missing by a method different from the inspection region A1. Etc. may be inspected.
 さらには、上記実施の形態では、スルーホール11を検出してそのスルーホール11の画像を除去するようにしたが、所定の閾値以上の面積や最大長さを有する領域(すなわち、スリット12やネジ穴13の領域)を抽出し、それ以外の領域を消し込むような処理を行うようにしてもよい。 Furthermore, in the above embodiment, the through hole 11 is detected and the image of the through hole 11 is removed. However, an area having an area or a maximum length equal to or greater than a predetermined threshold (that is, a slit 12 or a screw). It is also possible to perform processing such as extracting the region 13 of the hole 13 and erasing other regions.
 本発明は、プリント基板や液晶基板などにおいて非検査領域を設定して検査を行うような分野において使用される。 The present invention is used in a field where inspection is performed by setting a non-inspection area on a printed circuit board or a liquid crystal substrate.
1・・・自動検査装置
2・・・画像取得手段
3・・・貫通領域抽出手段
4・・・膨張処理手段
5・・・微小領域抽出手段
6・・・除去後画像抽出手段
7・・・収縮処理手段
8・・・検査手段
10・・・プリント基板
11・・・スルーホール
12・・・スリット
13・・・ネジ穴
A1・・・検査領域
A2・・・非検査領域
DESCRIPTION OF SYMBOLS 1 ... Automatic inspection apparatus 2 ... Image acquisition means 3 ... Penetration area extraction means 4 ... Expansion processing means 5 ... Minute area extraction means 6 ... Post-removal image extraction means 7 ... Shrinkage treatment means 8 ... inspection means 10 ... printed circuit board 11 ... through hole 12 ... slit 13 ... screw hole A1 ... inspection area A2 ... non-inspection area

Claims (4)

  1. スルーホール、スリット、ネジ穴などの貫通領域を有するプリント基板を検査する自動検査装置において、
    プリント基板の画像を取得する画像取得手段と、
    当該取得された画像から前記スルーホール、スリット、ネジ穴などの貫通領域を抽出する貫通領域抽出手段と、
    当該抽出された貫通領域のうち、所定の閾値よりも小さな貫通領域を除去したプリント基板の除去後画像を抽出する除去後画像抽出手段と、
    当該抽出されたプリント基板の除去後画像を収縮処理する収縮処理手段と、
    当該収縮処理された領域を検査する検査手段と、
    を備えるようにしたことを特徴とする自動検査装置。
    In an automatic inspection device that inspects printed circuit boards that have through areas such as through holes, slits, and screw holes,
    Image acquisition means for acquiring an image of the printed circuit board;
    A penetrating region extracting means for extracting penetrating regions such as the through hole, slit, screw hole and the like from the acquired image;
    A post-removal image extraction unit that extracts a post-removal image of the printed circuit board from which the through region smaller than a predetermined threshold is removed from the extracted through region;
    Shrinkage processing means for shrinking the image after removal of the extracted printed circuit board;
    Inspection means for inspecting the contracted region;
    An automatic inspection apparatus characterized by comprising:
  2. 前記所定の閾値よりも小さな貫通領域が、貫通領域抽出手段で抽出された貫通領域のうち、矩形状領域に対する円形形状の占める割合を用いて抽出された領域である請求項1に記載の自動検査装置。 2. The automatic inspection according to claim 1, wherein the penetrating region smaller than the predetermined threshold is a region extracted using a ratio of a circular shape to a rectangular region out of the penetrating regions extracted by the penetrating region extracting unit. apparatus.
  3. スルーホール、スリット、ネジ穴などの貫通領域を有するプリント基板を検査する自動検査方法において、
    プリント基板の画像を取得するステップと、
    当該取得された画像から前記スルーホール、スリット、ネジ穴などの貫通領域を抽出するステップと、
    当該抽出された貫通領域のうち、所定の閾値よりも小さな貫通領域を除去したプリント基板の除去後画像を抽出するステップと、
    当該抽出されたプリント基板の除去後画像を収縮処理するステップと、
    当該収縮処理された領域を検査するステップと、
    を備えるようにしたことを特徴とする自動検査方法。
    In an automatic inspection method for inspecting a printed circuit board having a through region such as a through hole, a slit, and a screw hole,
    Obtaining an image of the printed circuit board;
    Extracting a through region such as the through hole, slit, screw hole and the like from the acquired image;
    Extracting the post-removal image of the printed circuit board from which the through region smaller than a predetermined threshold is removed from the extracted through region;
    Shrinking the image after removal of the extracted printed circuit board;
    Inspecting the contracted region;
    An automatic inspection method characterized by comprising:
  4. 前記所定の閾値よりも小さな貫通領域が、前記抽出された貫通領域のうち、矩形状領域に対する円形形状の占める割合を用いて抽出された領域である請求項3に記載の自動検査方法。 The automatic inspection method according to claim 3, wherein the penetrating area smaller than the predetermined threshold is an area extracted using a ratio of a circular shape to a rectangular area in the extracted penetrating area.
PCT/JP2011/062301 2011-05-28 2011-05-28 Automatic inspection device and automatic inspection method WO2012164655A1 (en)

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JPH0526636A (en) * 1991-06-21 1993-02-02 Hitachi Ltd Inspecting method and inspecting device for printed board soldering
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