WO2012108326A1 - Light and heat energy cross-linkable organic thin film transistor insulation layer material - Google Patents

Light and heat energy cross-linkable organic thin film transistor insulation layer material Download PDF

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WO2012108326A1
WO2012108326A1 PCT/JP2012/052356 JP2012052356W WO2012108326A1 WO 2012108326 A1 WO2012108326 A1 WO 2012108326A1 JP 2012052356 W JP2012052356 W JP 2012052356W WO 2012108326 A1 WO2012108326 A1 WO 2012108326A1
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group
film transistor
thin film
organic thin
insulating layer
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French (fr)
Japanese (ja)
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公 矢作
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住友化学株式会社
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having a potential-jump barrier or a surface barrier
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/468Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics
    • H10K10/471Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics the gate dielectric comprising only organic materials
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G2261/00Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
    • C08G2261/30Monomer units or repeat units incorporating structural elements in the main chain
    • C08G2261/32Monomer units or repeat units incorporating structural elements in the main chain incorporating heteroaromatic structural elements in the main chain
    • C08G2261/324Monomer units or repeat units incorporating structural elements in the main chain incorporating heteroaromatic structural elements in the main chain condensed
    • C08G2261/3243Monomer units or repeat units incorporating structural elements in the main chain incorporating heteroaromatic structural elements in the main chain condensed containing one or more sulfur atoms as the only heteroatom, e.g. benzothiophene
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G2261/00Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
    • C08G2261/30Monomer units or repeat units incorporating structural elements in the main chain
    • C08G2261/32Monomer units or repeat units incorporating structural elements in the main chain incorporating heteroaromatic structural elements in the main chain
    • C08G2261/324Monomer units or repeat units incorporating structural elements in the main chain incorporating heteroaromatic structural elements in the main chain condensed
    • C08G2261/3246Monomer units or repeat units incorporating structural elements in the main chain incorporating heteroaromatic structural elements in the main chain condensed containing nitrogen and sulfur as heteroatoms
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G2261/00Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
    • C08G2261/40Polymerisation processes
    • C08G2261/41Organometallic coupling reactions
    • C08G2261/411Suzuki reactions
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G2261/00Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
    • C08G2261/90Applications
    • C08G2261/92TFT applications
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K85/00Organic materials used in the body or electrodes of devices covered by this subclass
    • H10K85/10Organic polymers or oligomers
    • H10K85/111Organic polymers or oligomers comprising aromatic, heteroaromatic, or aryl chains, e.g. polyaniline, polyphenylene or polyphenylene vinylene
    • H10K85/113Heteroaromatic compounds comprising sulfur or selene, e.g. polythiophene

Definitions

  • the present invention relates to a material suitable for forming an insulating layer of an organic thin film transistor.
  • Organic thin-film transistors can be manufactured at a lower temperature than inorganic semiconductors, so plastic substrates and films can be used as their substrates, and by using such substrates, elements that are more flexible, lighter and less fragile than transistors made of inorganic semiconductors. Can be obtained.
  • an element can be manufactured by application of a solution containing an organic material or film formation using a printing method, and a large number of elements can be manufactured on a large-area substrate at low cost.
  • a voltage applied to a gate electrode acts on a semiconductor layer through a gate insulating layer to control on / off of a drain current. Therefore, a gate insulating layer is formed between the gate electrode and the semiconductor layer.
  • organic semiconductor compounds used in the manufacture of field effect organic thin film transistors are easily affected by the environment such as humidity and oxygen, and the transistor characteristics are likely to deteriorate over time due to humidity, oxygen, and the like.
  • the organic semiconductor compound is coated and protected by a gate insulating layer.
  • an insulating layer material is used to form an overcoat layer, a gate insulating layer, and the like that cover the organic semiconductor layer in the organic thin film transistor.
  • an insulating layer or an insulating film of an organic thin film transistor such as the overcoat layer and the gate insulating layer is referred to as an organic thin film transistor insulating layer.
  • a material used for forming the organic thin film transistor insulating layer is referred to as an organic thin film transistor insulating layer material.
  • the material here is a concept including an amorphous material such as a polymer compound, a composition containing the polymer compound, a resin, and a resin composition.
  • the organic thin film transistor insulating layer material is required to have excellent insulating properties and excellent dielectric breakdown strength when formed into a thin film.
  • a semiconductor layer is formed so as to overlap with a gate insulating layer. Therefore, the organic thin film transistor gate insulating layer material has an affinity with the organic semiconductor for forming an interface closely adhered to the organic semiconductor, and the organic semiconductor layer side surface of the film formed from the organic thin film transistor gate insulating layer material is flat. It is required to be.
  • Patent Document 1 describes that an epoxy resin and a silane coupling agent are used in combination as an organic thin film transistor gate insulating layer material.
  • a hydroxyl group produced during the curing reaction of an epoxy resin is reacted with a silane coupling agent. This is because the hydroxyl group enhances the hygroscopicity of the gate insulating layer material and impairs the stability of the transistor performance.
  • Non-Patent Document 1 describes that a resin obtained by thermally cross-linking polyvinylphenol and a melamine compound is used for the gate insulating layer.
  • a resin obtained by thermally cross-linking polyvinylphenol and a melamine compound is used for the gate insulating layer.
  • the hydroxyl group contained in polyvinylphenol is removed by crosslinking with a melamine compound, and at the same time the film strength is increased.
  • the pentacene TFT having this gate insulating layer has a small hysteresis and exhibits durability against gate bias stress.
  • Non-Patent Document 2 describes that polyvinyl gate and a copolymer obtained by copolymerizing vinyl phenol and methyl methacrylate are used for the gate insulating layer.
  • the hydroxyl group of vinylphenol interacts with the carbonyl group of methyl methacrylate to reduce the polarity of the entire film.
  • the pentacene TFT having this gate insulating layer has a small hysteresis and exhibits stable electrical characteristics.
  • the organic thin film transistor having the conventional gate insulating layer has a threshold voltage ( The absolute value and hysteresis of Vth) are large.
  • An object of the present invention is to provide an organic thin film transistor insulating layer material capable of producing an organic thin film transistor having a small absolute value of threshold voltage and small hysteresis.
  • the absolute value and hysteresis of the threshold voltage (Vth) of the organic thin film transistor are reduced by forming a gate insulating layer using a specific resin composition capable of forming a crosslinked structure.
  • Vth threshold voltage
  • the present invention has the formula (1)
  • R 2 represents a hydrogen atom or a methyl group.
  • R 3 and R 4 each independently represents a monovalent organic group having 1 to 20 carbon atoms. A hydrogen atom in the monovalent organic group may be substituted with a fluorine atom. The carbon atom in R 3 and the carbon atom in R 4 may be bonded to form a 5-membered ring or a 6-membered ring.
  • R bb represents a connecting part that connects the main chain and the side chain of the polymer compound and may have a fluorine atom.
  • c represents an integer of 0 or 1.
  • a second functional group containing a first functional group, and the first functional group generates a second functional group that reacts with active hydrogen by the action of electromagnetic waves or heat.
  • the present invention provides an organic thin film transistor insulating layer material containing a polymer compound (A) which is a functional group.
  • the said high molecular compound (A) is further Formula (2).
  • R 1 represents a hydrogen atom or a methyl group.
  • R represents a hydrogen atom or a monovalent organic group having 1 to 20 carbon atoms.
  • Rf represents a fluorine atom or a monovalent organic group having 1 to 20 carbon atoms having a fluorine atom.
  • R aa represents a connecting portion that connects the main chain and the side chain of the polymer compound and may have a fluorine atom.
  • u represents an integer of 0 or 1
  • b represents an integer of 1 to 5.
  • u represents an integer of 0 or 1
  • b represents an integer of 1 to 5.
  • the first functional group is at least one group selected from the group consisting of an isocyanato group blocked with a blocking agent and an isothiocyanato group blocked with a blocking agent.
  • the isocyanato group blocked with the blocking agent and the isothiocyanato group blocked with the blocking agent are represented by the formula (3):
  • Xa represents an oxygen atom or a sulfur atom
  • R 5 and R 6 are the same or different and represent a hydrogen atom or a monovalent organic group having 1 to 20 carbon atoms.
  • It is group represented by these.
  • the isocyanato group blocked with the blocking agent and the isothiocyanato group blocked with the blocking agent are represented by the formula (4):
  • Xb represents an oxygen atom or a sulfur atom
  • R 7 to R 9 are the same or different and each represents a hydrogen atom or a monovalent organic group having 1 to 20 carbon atoms.
  • the polymer compound (A) further includes two or more structural units having one active hydrogen or a structural unit having two or more active hydrogens.
  • the present invention further includes at least one selected from the group consisting of an active hydrogen compound which is a low molecular compound containing two or more active hydrogens and an active hydrogen compound which is a polymer compound containing two or more active hydrogens.
  • the organic thin-film transistor insulating layer material containing the active hydrogen compound is provided.
  • the present invention also includes a step of applying a liquid containing the organic thin film transistor insulating layer material to a substrate to form a coating layer on the substrate; and a step of irradiating the coating layer with an electromagnetic wave or an electron beam; And a method for forming an organic thin film transistor insulating layer including the same.
  • the present invention also includes a step of applying a liquid containing the organic thin film transistor insulating layer material to a base material to form a coating layer on the base material; Irradiating the coating layer with electromagnetic waves or electron beams; and applying heat to the coating layer; And a method for forming an organic thin film transistor insulating layer including the same.
  • the electromagnetic wave is ultraviolet light.
  • the present invention also provides an organic thin film transistor having an organic thin film transistor insulating layer formed using the organic thin film transistor insulating layer material.
  • the organic thin film transistor insulating layer is a gate insulating layer.
  • the present invention also provides a display member comprising the organic thin film transistor.
  • the present invention also provides a display including the display member.
  • An organic thin film transistor having an insulating layer formed using the organic thin film transistor insulating layer material of the present invention has a small absolute value of threshold voltage and a small hysteresis.
  • polymer compound refers to a compound having a structure in which a plurality of the same structural units are repeated in the molecule, and includes a so-called dimer.
  • dimer the “low molecular compound” means a compound that does not have the same structural unit repeatedly in the molecule.
  • the organic thin film transistor insulating layer material of the present invention includes a polymer compound, and the polymer compound has a plurality of functional groups that absorb the energy of electromagnetic waves or the energy of electron beams to cause a dimerization reaction. When it acts, it has a plurality of first functional groups that generate a second functional group that reacts with active hydrogen.
  • the functional group that absorbs electromagnetic energy or electron beam energy to cause a dimerization reaction is referred to as a “photodimerization reactive group” in this specification.
  • active hydrogen means a hydrogen atom bonded to an oxygen atom, a sulfur atom or a nitrogen atom.
  • the photodimerization reactive group is a functional group that can perform a concerted reaction when absorbing light energy or electron beam energy.
  • Functional groups that can perform a concerted reaction can be dimerized by cycloaddition with each other to form a crosslinked structure inside the insulating layer.
  • the electromagnetic wave absorbed by the photodimerization reactive group is preferably low energy, so that when the organic thin film transistor insulating layer material is formed by the photopolymerization method, the photodimerization reactive group may also react.
  • a preferable electromagnetic wave to be absorbed by the photodimerization reactive group is ultraviolet light, for example, light having a wavelength of 400 nm or less, preferably 150 to 390 nm, more preferably 280 to 380 nm.
  • “Dimerization” here means that two molecules of an organic compound are chemically bonded.
  • the molecules to be bound may be the same or different.
  • the chemical structures of the functional groups involved in dimerization in the two molecules to be dimerized may be the same or different.
  • the functional group has a structure and a combination that cause a photodimerization reaction even when a reaction aid such as a catalyst and an initiator is not used. This is because contact with the residue of the reaction aid may cause deterioration of surrounding organic materials.
  • the first functional group contained in the polymer compound does not react with active hydrogen, but when an electromagnetic wave or heat acts on the first functional group, a second functional group is generated and reacts with active hydrogen. That is, the first functional group is deprotected by electromagnetic waves or heat to generate a second functional group that reacts with active hydrogen.
  • the second functional group reacts with and binds to the active hydrogen-containing group of the active hydrogen compound (E), so that a crosslinked structure can be formed inside the insulating layer.
  • the “active hydrogen compound” means a compound having one or more active hydrogens.
  • the second functional group is protected (blocked) in the step of forming the gate insulating layer until electromagnetic waves or heat is applied, and is present in the organic thin film transistor insulating layer material as the first functional group.
  • the storage stability of the organic thin film transistor insulating layer material is improved.
  • a polymer compound containing a repeating unit having a photodimerization reactive group and a repeating unit having the first functional group corresponds to the polymer compound.
  • the repeating unit having a photodimerization reactive group is preferably a repeating unit represented by the above formula (1).
  • the polymer compound contained in the organic thin film transistor insulating layer material of the present invention is preferably a polymer compound having a repeating unit represented by the formula (1) and a repeating unit containing a first functional group. Such a polymer compound is referred to as a polymer compound (A).
  • R 2 represents a hydrogen atom or a methyl group. In some one aspect, R 2 is a methyl group.
  • R 3 and R 4 each independently represents a monovalent organic group having 1 to 20 carbon atoms.
  • a hydrogen atom in the monovalent organic group may be substituted with a fluorine atom.
  • the monovalent organic group having 1 to 20 carbon atoms may be linear, branched or cyclic, and may be saturated or unsaturated.
  • Examples of the monovalent organic group having 1 to 20 carbon atoms include a linear hydrocarbon group having 1 to 20 carbon atoms, a branched hydrocarbon group having 3 to 20 carbon atoms, and a cyclic hydrocarbon having 3 to 20 carbon atoms.
  • Group, aromatic hydrocarbon group having 6 to 20 carbon atoms preferably linear hydrocarbon group having 1 to 6 carbon atoms, branched hydrocarbon group having 3 to 6 carbon atoms, or 3 to 6 carbon atoms.
  • an aromatic hydrocarbon group having 6 to 20 carbon atoms preferably linear hydrocarbon group having 1 to 6 carbon atoms, branched hydrocarbon group having 3 to 6 carbon atoms, or 3 to 6 carbon atoms.
  • a linear hydrocarbon group having 1 to 20 carbon atoms a branched hydrocarbon group having 3 to 20 carbon atoms, and a cyclic hydrocarbon group having 3 to 20 carbon atoms
  • the hydrogen atoms contained in these groups are substituted with fluorine atoms. May be.
  • a hydrogen atom in the group may be substituted with an alkyl group, a fluorine atom, a chlorine atom, a bromine atom, an iodine atom or the like.
  • the monovalent organic group having 1 to 20 carbon atoms include methyl group, ethyl group, propyl group, butyl group, pentyl group, hexyl group, isopropyl group, isobutyl group, tertiary butyl group, cyclopropyl group, Cyclobutyl group, cyclopentyl group, cyclohexyl group, cyclopentynyl group, cyclohexynyl group, trifluoromethyl group, trifluoroethyl group, phenyl group, naphthyl group, anthryl group, tolyl group, xylyl group, dimethylphenyl group, trimethylphenyl group , Ethylphenyl group, diethylphenyl group, triethylphenyl group, propylphenyl group, butylphenyl group, methylnaphthyl group, dimethylnaphthyl group,
  • an alkyl group is preferable.
  • the carbon atom in R 3 and the carbon atom in R 4 may be bonded to form a 5-membered ring or a 6-membered ring.
  • Examples of the 5-membered ring include a cyclopentene ring.
  • Examples of the 6-membered ring include a cyclohexene ring.
  • R ⁇ 3 > and R ⁇ 4 > are the same or different, and are groups selected from the group which consists of a methyl group and an ethyl group.
  • R bb represents a linking moiety that links the main chain and the side chain and may have a fluorine atom.
  • the connecting portion may be a divalent group having a structure that does not exhibit reactivity under environmental conditions for crosslinking the organic thin film transistor insulating layer material of the present invention.
  • Specific examples of the linking moiety include a bond composed of a divalent organic group having 1 to 20 carbon atoms, an ether bond (—O—), a ketone bond (—CO—), an ester bond (—COO—, —OCO—). Amide bond (—NHCO—, —CONH—), urethane bond (—NHCOO—, —OCONH—), and a combination of these bonds.
  • c represents an integer of 0 or 1. In one certain form, c is 1.
  • the divalent organic group having 1 to 20 carbon atoms may be linear, branched or cyclic, and may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group.
  • a divalent linear aliphatic hydrocarbon group having 1 to 20 carbon atoms a divalent branched aliphatic hydrocarbon group having 3 to 20 carbon atoms, and a divalent cyclic hydrocarbon group having 3 to 20 carbon atoms
  • a divalent aromatic hydrocarbon group having 6 to 20 carbon atoms which may be substituted with an alkyl group or the like.
  • a divalent linear aliphatic hydrocarbon group having 1 to 6 carbon atoms a divalent linear aliphatic hydrocarbon group having 1 to 6 carbon atoms, a divalent branched aliphatic hydrocarbon group having 3 to 6 carbon atoms, and a divalent cyclic hydrocarbon group having 3 to 6 carbon atoms.
  • a divalent aromatic hydrocarbon group having 6 to 20 carbon atoms which may be substituted with an alkyl group or the like is preferable.
  • divalent aliphatic hydrocarbon group and the divalent cyclic hydrocarbon group include a methylene group, an ethylene group, a propylene group, a butylene group, a pentylene group, a hexylene group, an isopropylene group, an isobutylene group, and dimethylpropylene.
  • cyclopropylene group, cyclobutylene group, cyclopentylene group, and cyclohexylene group include a methylene group, an ethylene group, a propylene group, a butylene group, a pentylene group, a hexylene group, an isopropylene group, an isobutylene group, and dimethylpropylene.
  • cyclopropylene group, cyclobutylene group, cyclopentylene group, and cyclohexylene group include a methylene group, an ethylene group, a propylene group, a butylene group, a pent
  • divalent aromatic hydrocarbon group having 6 to 20 carbon atoms include phenylene group, naphthylene group, anthrylene group, dimethylphenylene group, trimethylphenylene group, ethylenephenylene group, diethylenephenylene group, triethylenephenylene group, Examples include propylenephenylene group, butylenephenylene group, methylnaphthylene group, dimethylnaphthylene group, trimethylnaphthylene group, vinylnaphthylene group, ethenylnaphthylene group, methylanthrylene group, and ethylanthrylene group.
  • a preferred example of the photodimerization reactive group is a group represented by the formula (5), in which the hydrogen atom at the 3-position and the hydrogen atom at the 4-position of the maleimide group are each substituted with an alkyl group or an aryl group.
  • R ′ is preferably a propane-1,3-diyl group or a butane-1,4-diyl group.
  • R ′ represents an alkanediyl group.
  • the photodimerization reactive group is a group in which the hydrogen atom at the 3-position and the hydrogen atom at the 4-position of the maleimide group are each substituted with an alkyl group or an aryl group, or a group represented by the formula (5).
  • an ultraviolet ray or an electron beam is used.
  • a 2 + 2 cyclization reaction occurs and the organic thin film transistor insulating layer material is crosslinked.
  • preferable examples of the first functional group include an isocyanato group blocked with a blocking agent and an isothiocyanato group blocked with a blocking agent.
  • the isocyanato group blocked with the blocking agent or the isothiocyanato group blocked with the blocking agent is an isocyanate group or an isocyanate group having only one active hydrogen capable of reacting with an isocyanato group or an isothiocyanato group, or It can be produced by reacting with an isothiocyanato group.
  • the blocking agent is preferably one that dissociates at a temperature of 170 ° C. or lower even after reacting with an isocyanato group or an isothiocyanato group.
  • the blocking agent include alcohol compounds, phenol compounds, active methylene compounds, mercaptan compounds, acid amide compounds, acid imide compounds, imidazole compounds, urea compounds, and oxime compounds. , Amine compounds, imine compounds, bisulfites, pyridine compounds, and pyrazole compounds. These blocking agents may be used alone or in combination of two or more.
  • Preferable blocking agents include oxime compounds and pyrazole compounds.
  • Specific blocking agents are exemplified below.
  • alcohol compounds include methanol, ethanol, propanol, butanol, 2-ethylhexanol, methyl cellosolve, butyl cellosolve, methyl carbitol, benzyl alcohol, and cyclohexanol.
  • phenolic compounds include phenol, cresol, ethylphenol, butylphenol, nonylphenol, dinonylphenol, styrenated phenol, and hydroxybenzoic acid ester.
  • active methylene compound include dimethyl malonate, diethyl malonate, methyl acetoacetate, ethyl acetoacetate, and acetylacetone.
  • Examples of mercaptan compounds include butyl mercaptan and dodecyl mercaptan.
  • Examples of the acid amide compounds include acetanilide, acetic acid amide, ⁇ -caprolactam, ⁇ -valerolactam, and ⁇ -butyrolactam.
  • Examples of the acid imide compounds include succinimide and maleic imide.
  • Examples of the imidazole compound include imidazole and 2-methylimidazole.
  • Examples of the urea compound include urea, thiourea, and ethylene urea.
  • Examples of the amine compound include diphenylamine, aniline, and carbazole.
  • Examples of the imine compound include ethyleneimine and polyethyleneimine.
  • An example of a bisulfite is sodium bisulfite.
  • pyridine compounds include 2-hydroxypyridine and 2-hydroxyquinoline.
  • oxime compounds include formaldoxime, acetaldoxime, acetoxime, methyl ethyl ketoxime, and cyclohexanone oxime.
  • the pyrazole compound include 3,5-dimethylpyrazole and 3,5-diethylpyrazole.
  • the isocyanato group or isothiocyanato group blocked with a blocking agent that may be used in the present invention is preferably a group represented by the above formula (3) or a group represented by the above formula (4).
  • Xa represents an oxygen atom or a sulfur atom
  • Xb represents an oxygen atom or a sulfur atom
  • R 5 to R 9 are the same or different and represent a hydrogen atom or a carbon number.
  • 1 to 20 monovalent organic groups are represented. The definition and specific examples of the monovalent organic group are the same as the definition and specific examples of the monovalent organic group described above.
  • R 5 to R 9 are hydrogen atoms.
  • Examples of the isocyanato group blocked with a blocking agent include O- (methylideneamino) carboxyamino group, O- (1-ethylideneamino) carboxyamino group, O- (1-methylethylideneamino) carboxyamino group, O— [1-methylpropylideneamino] carboxyamino group, (N-3,5-dimethylpyrazolylcarbonyl) amino group, (N-3-ethyl-5-methylpyrazolylcarbonyl) amino group, (N-3,5-diethyl) And pyrazolylcarbonyl) amino group, (N-3-propyl-5-methylpyrazolylcarbonyl) amino group, and (N-3-ethyl-5-propylpyrazolylcarbonyl) amino group.
  • Examples of the isothiocyanato group blocked with a blocking agent include an O- (methylideneamino) thiocarboxyamino group, an O- (1-ethylideneamino) thiocarboxyamino group, and an O- (1-methylethylideneamino) thiocarboxyamino group.
  • the first functional group is preferably an isocyanato group blocked with a blocking agent.
  • the polymer compound (A) comprises, for example, a polymerizable monomer that is a raw material of the repeating unit represented by the above formula (1) and a polymerizable monomer containing the first functional group as a photopolymerization initiator or heat. It can manufacture by the method of copolymerizing using a polymerization initiator.
  • Polymerization of the polymerizable monomer may be performed by a method commonly used by those skilled in the art.
  • a method for polymerizing a polymerizable monomer for example, a method in which a polymerizable monomer and a polymerization initiator are dissolved in a suitable solvent, dissolved oxygen in the resulting solution is replaced with an inert gas, and then heated or irradiated for a certain time. Is exemplified.
  • Examples of the polymerizable monomer that is a raw material for the repeating unit represented by the above formula (1) include N- (3′-methacryloyloxypropyl) -3,4-dimethylmaleimide, N- (3′-methacryloyloxypropyl). ) -1-cyclohexene-1,2-dicarboximide.
  • Examples of the polymerizable monomer containing the first functional group include a monomer having an isocyanato group blocked with a blocking agent or an isothiocyanate group blocked with a blocking agent and an unsaturated bond.
  • a monomer having an isocyanato group blocked with the blocking agent or an isothiocyanate group blocked with a blocking agent and an unsaturated bond includes an isocyanate group or a compound having an isothiocyanato group and an unsaturated bond, and a blocking agent. It can be produced by reacting. As the unsaturated bond, a double bond is preferable.
  • Examples of the compound having a double bond and an isocyanato group include 2-acryloyloxyethyl isocyanate, 2-methacryloyloxyethyl isocyanate, and 2- (2′-methacryloyloxyethyl) oxyethyl isocyanate.
  • Examples of the compound having a double bond and an isothiocyanato group include 2-acryloyloxyethyl isothiocyanate, 2-methacryloyloxyethyl isothiocyanate, and 2- (2′-methacryloyloxyethyl) oxyethyl isothiocyanate.
  • the above blocking agent contained in the polymerizable monomer
  • the above blocking agent can be suitably used.
  • an organic solvent, a catalyst or the like can be added as necessary.
  • Examples of the monomer having an isocyanate group blocked with the blocking agent and a double bond include 2- [O- [1′-methylpropylideneamino] carboxyamino] ethyl-methacrylate, 2- [N- [ 1 ', 3'-dimethylpyrazolyl] carbonylamino] ethyl-methacrylate.
  • Examples of monomers having an isothiocyanate group and a double bond blocked with the blocking agent include 2- [O- [1′-methylpropylideneamino] thiocarboxyamino] ethyl-methacrylate, 2- [N— And [1 ′, 3′-dimethylpyrazolyl] thiocarbonylamino] ethyl-methacrylate.
  • photopolymerization initiator examples include acetophenone, 2,2-dimethoxy-2-phenylacetophenone, 2,2-diethoxyacetophenone, 4-isopropyl-2-hydroxy-2-methylpropiophenone, 2-hydroxy- 2-methylpropiophenone, 4,4′-bis (diethylamino) benzophenone, benzophenone, methyl (o-benzoyl) benzoate, 1-phenyl-1,2-propanedione-2- (O-ethoxycarbonyl) oxime, -Phenyl-1,2-propanedione-2- (o-benzoyl) oxime, benzoin, benzoin methyl ether, benzoin ethyl ether, benzoin isopropyl ether, benzoin isobutyl ether, benzoin octyl ether, benzyl, benzyl dimethyl
  • carbonyl compounds such as luketal, benzyl diethy
  • the wavelength of light irradiated to the polymerizable monomer is 360 nm or more, preferably 360 to 450 nm.
  • the thermal polymerization initiator may be any compound that serves as a radical polymerization initiator.
  • the polymer compound (A) used in the present invention polymerizes a polymerizable monomer other than a polymerizable monomer that is a raw material of the repeating unit represented by the above formula (1) and a polymerizable monomer containing the first functional group. Sometimes it may be added and manufactured.
  • Additional polymerizable monomers used include, for example, acrylic acid esters and derivatives thereof, methacrylic acid esters and derivatives thereof, styrene and derivatives thereof, vinyl acetate and derivatives thereof, methacrylonitrile and derivatives thereof, acrylonitrile and derivatives thereof.
  • Examples thereof include N-vinylamide derivatives of acids, terminal unsaturated hydrocarbons and derivatives thereof, and organic germanium derivatives containing unsaturated hydrocarbon groups.
  • the type of polymerizable monomer used additionally is appropriately selected according to the characteristics required for the insulating layer. From the viewpoint of excellent durability against solvents and reducing the hysteresis of organic thin film transistors, monomers that have high molecular density and form a hard film are selected in films containing these compounds, such as styrene and styrene derivatives. . In addition, from the viewpoint of adhesion to the adjacent surface of the insulating layer such as the gate electrode or the surface of the substrate, the polymer compound (A) is made plastic such as methacrylic acid esters and derivatives thereof, acrylic acid esters and derivatives thereof. The monomer to be imparted is selected.
  • monofunctional acrylates and polyfunctional acrylates can be used although the amount of use is limited.
  • monofunctional acrylates and polyfunctional acrylates For example, methyl acrylate, ethyl acrylate, acrylic acid-n-propyl, isopropyl acrylate, acrylic acid-n-butyl, isobutyl acrylate, acrylic acid-sec-butyl, hexyl acrylate, octyl acrylate, acrylic 2-ethylhexyl acid, decyl acrylate, isobornyl acrylate, cyclohexyl acrylate, phenyl acrylate, benzyl acrylate, 2-hydroxyethyl acrylate, 2-hydroxypropyl acrylate, 3-hydroxypropyl acrylate, Acrylic acid -Hydroxybutyl, 2-hydroxyphenylethyl acrylate, ethylene glycol diacrylate, propylene glycol diacrylate, 1,
  • methacrylic acid esters and derivatives thereof monofunctional methacrylates and polyfunctional methacrylates can be used although the amount of use is limited.
  • Such monofunctional methacrylates and Examples of the functional methacrylate include methyl methacrylate, ethyl methacrylate, methacrylic acid-n-propyl, isopropyl methacrylate, methacrylic acid-n-butyl, isobutyl methacrylate, methacrylic acid-sec.
  • styrene and its derivatives examples include styrene, 2,4-dimethyl- ⁇ -methylstyrene, o-methylstyrene, m-methylstyrene, p-methylstyrene, 2,4-dimethylstyrene, 2,5-dimethylstyrene.
  • organic carboxylic acid vinyl esters and derivatives thereof include vinyl acetate, vinyl propionate, vinyl butyrate, vinyl benzoate, and divinyl adipate.
  • allyl esters of organic carboxylic acids and derivatives thereof include allyl acetate, allyl benzoate, diallyl adipate, diallyl terephthalate, diallyl isophthalate, and diallyl phthalate.
  • dialkyl esters of fumaric acid and derivatives thereof include dimethyl fumarate, diethyl fumarate, diisopropyl fumarate, di-sec-butyl fumarate, diisobutyl fumarate, di-n-butyl fumarate, di-2 fumarate -Ethylhexyl, dibenzyl fumarate.
  • dialkyl esters of maleic acid and derivatives thereof include dimethyl maleate, diethyl maleate, diisopropyl maleate, di-sec-butyl maleate, diisobutyl maleate, di-n-butyl maleate, di-2 maleate -Ethylhexyl, dibenzyl maleate.
  • dialkyl esters of itaconic acid and derivatives thereof include dimethyl itaconate, diethyl itaconate, diisopropyl itaconate, di-sec-butyl itaconate, diisobutyl itaconate, di-n-butyl itaconate, di-2 itaconate -Ethylhexyl, dibenzyl itaconate.
  • N-vinylamide derivatives of organic carboxylic acids examples include N-methyl-N-vinylacetamide.
  • terminal unsaturated hydrocarbons and derivatives thereof examples include 1-butene, 1-pentene, 1-hexene, 1-octene, vinylcyclohexane, vinyl chloride, and allyl alcohol.
  • Examples of the organic germanium derivative containing an unsaturated hydrocarbon group include allyltrimethylgermanium, allyltriethylgermanium, allyltributylgermanium, trimethylvinylgermanium, and triethylvinylgermanium.
  • acrylic acid alkyl ester methacrylic acid alkyl ester, styrene, acrylonitrile, methacrylonitrile, and allyltrimethylgermanium are preferable.
  • the charged molar ratio of the polymerizable monomer that is a raw material of the repeating unit represented by the formula (1) is 5 mol% or more and 50 mol% or less, preferably 10 mol% or more and 45 mol% in all monomers involved in the polymerization.
  • the mol% or less more preferably 20 mol% or more and 40 mol% or less.
  • the charged molar ratio of the polymerizable monomer containing the first functional group is 5% by mole or more and 50% by mole or less, preferably 10% by mole or more and 40% by mole or less, more preferably among all the monomers involved in the polymerization. Is 15 mol% or more and 30 mol% or less.
  • the polymer compound (A) has a polystyrene-equivalent weight average molecular weight of preferably 3,000 to 1,000,000, more preferably 5,000 to 500,000, and may be linear, branched or cyclic.
  • polymer compound (A) examples include poly (styrene-co- [N- (3-methacryloyloxypropyl-3 ′, 4′-dimethylmaleimide)]-co- [2- [O- (1′- Methylpropylideneamino) carboxyamino] ethyl-methacrylate]), poly (styrene-co- [N- (3-methacryloyloxypropyl-3 ', 4'-dimethylmaleimide)]-co- [2- [1'- (3 ', 5'-dimethylpyrazolyl) carbonylamino] ethyl-methacrylate]), poly (styrene-co- [N- (3-methacryloyloxypropyl-3', 4'-dimethylmaleimide)]-co-acrylonitrile- Co- [2- [O- (1'-methylpropylideneamino) carboxyamino] ethyl-methacryl
  • Polymer compound (B)> Another preferable aspect of the polymer compound contained in the organic thin film transistor insulating layer material of the present invention is a polymer compound having a plurality of photodimerization reactive groups, a fluorine atom, and a plurality of the first functional groups. It is.
  • a polymer compound having a repeating unit represented by Formula (1), a repeating unit represented by Formula (2), and a repeating unit containing a first functional group is referred to as a polymer compound (B).
  • the insulating layer formed from the material has low polarity, and polarization of the insulating layer is suppressed.
  • a cross-linked structure is formed inside the insulating layer, the movement of the molecular structure is suppressed, and the polarization of the insulating layer is suppressed.
  • the polarization of the insulating layer is suppressed, for example, when used as a gate insulating layer, the hysteresis of the organic thin film transistor is lowered and the operation accuracy is improved.
  • the fluorine atom does not replace the hydrogen atom of the main chain of the polymer compound, but replaces the hydrogen atom of the side chain or side group (pendant group).
  • the fluorine atom is substituted with a side chain or a side group, the affinity for other organic materials such as an organic semiconductor is not lowered, and in the formation of a layer containing the organic material, the organic material is exposed to the exposed surface of the insulating layer. It becomes easy to form a layer in contact.
  • a polymer compound having a repeating unit having a group containing a fluorine atom, a repeating unit having a photodimerization reactive group, and a repeating unit having the first functional group corresponds to the polymer compound (B).
  • Preferred examples of the group containing a fluorine atom include an aryl group in which a hydrogen atom is substituted with fluorine, an alkylaryl group in which a hydrogen atom is substituted with fluorine, particularly a phenyl group in which a hydrogen atom is substituted with fluorine, and a hydrogen atom in fluorine.
  • Preferred examples of the photodimerization reactive group include the same groups as described above.
  • the repeating unit having a group containing a fluorine atom is preferably a repeating unit represented by the above formula (2).
  • R 1 represents a hydrogen atom or a methyl group. In one certain form, R ⁇ 1 > is a hydrogen atom.
  • Rf represents a fluorine atom or a monovalent organic group having 1 to 20 carbon atoms having a fluorine atom. In one certain form, Rf is a fluorine atom. b represents an integer of 1 to 5. In one certain form, b is 5.
  • Rf is an organic group having 1 to 20 carbon atoms having a fluorine atom
  • the monovalent organic group having 1 to 20 carbon atoms having a fluorine atom may be a trifluoromethyl group or 2,2,2-trifluoroethyl.
  • R represents a hydrogen atom or a monovalent organic group having 1 to 20 carbon atoms.
  • R is a monovalent organic group having 1 to 20 carbon atoms
  • the monovalent organic group does not have a fluorine atom.
  • Examples of the monovalent organic group having 1 to 20 carbon atoms represented by R include groups having no fluorine atom among the specific examples of the monovalent organic group having 1 to 20 carbon atoms represented by R 3. It is done.
  • R aa represents a linking moiety that links the main chain and the side chain and may have a fluorine atom.
  • the connecting portion may be a divalent group having a structure that does not exhibit reactivity under environmental conditions for crosslinking the organic thin film transistor insulating layer material of the present invention.
  • Specific examples of the linking moiety include a bond composed of a divalent organic group having 1 to 20 carbon atoms, an ether bond (—O—), a ketone bond (—CO—), an ester bond (—COO—, —OCO—). Amide bond (—NHCO—, —CONH—), urethane bond (—NHCOO—, —OCONH—), and a combination of these bonds.
  • u represents an integer of 0 or 1. In one certain form, a is 1.
  • Examples of the divalent organic group having 1 to 20 carbon atoms include the same groups as the specific examples of the divalent organic group having 1 to 20 carbon atoms represented by R bb .
  • the polymer compound (B) includes, for example, a polymerizable monomer that is a raw material of the repeating unit represented by the above formula (1), a polymerizable monomer that is a raw material of the repeating unit represented by the above formula (2), It can be produced by a method in which a polymerizable monomer containing a first functional group is copolymerized using a photopolymerization initiator or a thermal polymerization initiator.
  • Examples of the polymerizable monomer that is a raw material of the repeating unit represented by the above formula (2) include 2-trifluoromethylstyrene, 3-trifluoromethylstyrene, 4-trifluoromethylstyrene, 2,3,4, Examples include 5,6-pentafluorostyrene and 4-fluorostyrene.
  • the polymer compound (B) that can be used in the present invention is a polymerizable monomer that is a raw material of the repeating unit represented by the above formula (1), and a polymerization that is a raw material of the repeating unit represented by the above formula (2).
  • a polymerizable monomer other than the polymerizable monomer and the polymerizable monomer containing the first functional group may be added during polymerization.
  • the amount of the polymerizable monomer used as the raw material of the repeating unit represented by the above formula (2) is adjusted so that the amount of fluorine atoms introduced into the polymer compound (B) becomes an appropriate amount.
  • the amount of fluorine atoms introduced into the polymer compound (B) is preferably 1 to 80% by mass, more preferably 5 to 70% by mass, and further preferably 10 to 10% by mass with respect to the mass of the polymer compound (B). 60% by mass.
  • the amount of the fluorine base paper is less than 1% by mass, the effect of reducing the hysteresis of the field effect organic thin film transistor may be insufficient.
  • the amount exceeds 80% by mass the affinity with the organic semiconductor material is deteriorated and activated. It may be difficult to stack a layer thereon.
  • the polymer compound (B) has the number of repeating units that the polymer compound (B) has 100.
  • the amount of the repeating unit represented by the formula (2) is preferably 30 to 80.
  • the polymer compound (B) has a polystyrene-equivalent weight average molecular weight of preferably 3,000 to 1,000,000, more preferably 5,000 to 500,000, and may be linear, branched or cyclic.
  • polymer compound (B) examples include poly (styrene-co- [N- (3-methacryloyloxypropyl-3 ′, 4′-dimethylmaleimide)]-co-pentafluorostyrene-co- [2- [ O- (1′-methylpropylideneamino) carboxyamino] ethyl-methacrylate]), poly (styrene-co- [N- (3-methacryloyloxypropyl-3 ′, 4′-dimethylmaleimide)]-co-penta Fluorostyrene-co- [2- [1 ′-(3 ′, 5′-dimethylpyrazolyl) carbonylamino] ethyl-methacrylate]), poly (styrene-co- [N- (3-methacryloyloxypropyl-3 ′, 4'-dimethylmaleimide)]-co-pentafluorostyrene-co-acrylonit
  • ⁇ Polymer compound (C)> Another preferred embodiment of the polymer compound contained in the organic thin film transistor insulating layer material of the present invention has a plurality of photodimerization reactive groups, a plurality of the first functional groups, and two active hydrogens. It is a high molecular compound contained above. Such a polymer compound is referred to as a polymer compound (C).
  • the active hydrogen may be directly bonded to the main chain constituting the polymer compound or may be bonded through a predetermined group.
  • active hydrogen may be contained in each structural unit which comprises a high molecular compound, and may be contained only in a part of structural unit. Furthermore, the active hydrogen may be bonded only to the terminal of the polymer compound.
  • polymer compound (C) examples include two structural units each having a repeating unit represented by the formula (1) and a repeating unit containing a first functional group and one active hydrogen.
  • examples thereof include a high molecular compound having the above, a high molecular compound having a repeating unit represented by the formula (1) and a repeating unit containing a first functional group and having a structural unit having two or more active hydrogens. .
  • the polymer compound (C) includes, for example, a monomer having an active hydrogen-containing group and a monomer having an unsaturated bond such as a double bond, a polymerizable monomer that is a raw material for the repeating unit represented by the above formula (1), It can be produced by copolymerizing with a polymerizable monomer containing one functional group.
  • a polymerizable monomer other than the monomer may be added during the polymerization.
  • a photopolymerization initiator or a thermal polymerization initiator may be applied.
  • the thing similar to what was mentioned above is applicable as a polymerizable monomer, a photoinitiator, and a thermal polymerization initiator.
  • Examples of the monomer having an active hydrogen-containing group and an unsaturated bond include aminostyrene, hydroxystyrene, vinyl benzyl alcohol, aminoethyl methacrylate, ethylene glycol monovinyl ether, and 4-hydroxybutyl acrylate.
  • the polymer compound (C) has a polystyrene-equivalent weight average molecular weight of preferably 3,000 to 1,000,000, more preferably 5,000 to 500,000, and may be linear, branched or cyclic.
  • the molar ratio of the polymerizable monomer containing the first functional group used in producing the polymer compound (C) to the monomer containing active hydrogen and the monomer having an unsaturated bond is preferably 60/100 to 150. / 100, more preferably 70/100 to 120/100, and still more preferably 90/100 to 110/100. If the molar ratio is less than 60/100, the active hydrogen may be excessive and the effect of reducing hysteresis may be reduced. If the molar ratio exceeds 150/100, the functional group that reacts with the active hydrogen will be excessive and the threshold voltage will be absolute. The value can be large.
  • polymer compound (C) examples include poly (styrene-co- [N- (3-methacryloyloxypropyl-3 ′, 4′-dimethylmaleimide)]-co-aminostyrene-co- [2- [O -(1'-methylpropylideneamino) carboxyamino] ethyl-methacrylate]), poly (styrene-co- [N- (3-methacryloyloxypropyl-3 ', 4'-dimethylmaleimide)]-co-aminostyrene -Co- [2- [1 '-(3', 5'-dimethylpyrazolyl) carbonylamino] ethyl-methacrylate]), poly (styrene-co- [N- (3-methacryloyloxypropyl-3 ', 4' -Dimethylmaleimide)]-co-aminostyrene-co-acrylonitrile-co- [2-
  • polymer compound (D) Another preferred embodiment of the polymer compound contained in the organic thin film transistor insulating layer material of the present invention has a plurality of photodimerization reactive groups, a fluorine atom, a plurality of the first functional groups, and A polymer compound containing two or more repeating units containing active hydrogen.
  • a polymer compound (D) Such a polymer compound is referred to as a polymer compound (D).
  • the active hydrogen may be directly bonded to the main chain constituting the polymer compound or may be bonded via a predetermined group.
  • active hydrogen may be contained in each structural unit which comprises a high molecular compound, and may be contained only in a part of structural unit. Furthermore, the active hydrogen may be bonded only to the terminal of the polymer compound.
  • polymer compound (D) examples include a repeating unit represented by the formula (1), a repeating unit represented by the formula (2), and a repeating unit containing a first functional group.
  • a polymer compound having two or more structural units having one active hydrogen, a repeating unit represented by the formula (1), a repeating unit represented by the formula (2), and a first functional group And a polymer compound having a repeating unit and a structural unit having two or more active hydrogens.
  • the polymer compound (D) includes, for example, a monomer having an active hydrogen-containing group and a monomer having an unsaturated bond such as a double bond, a polymerizable monomer serving as a raw material for the repeating unit represented by the above formula (1), It can manufacture by copolymerizing with the polymerizable monomer used as the raw material of the repeating unit represented by Formula (2), and the polymerizable monomer containing a 1st functional group.
  • the monomer which has unsaturated bonds, such as a group containing active hydrogen and a double bond the polymerizable monomer used as the raw material of the repeating unit represented by the said Formula (1), the repetition represented by the said Formula (2)
  • a polymerizable monomer other than the polymerizable monomer serving as the raw material of the unit and the polymerizable monomer containing the first functional group may be added during the polymerization.
  • a photopolymerization initiator or a thermal polymerization initiator may be applied.
  • the thing similar to what was mentioned above is applicable as a polymerizable monomer, a photoinitiator, and a thermal polymerization initiator.
  • monomers having an active hydrogen-containing group and an unsaturated bond include the monomers described above.
  • the polymer compound (D) has a polystyrene-equivalent weight average molecular weight of preferably 3,000 to 1,000,000, more preferably 5,000 to 500,000, and may be linear, branched or cyclic.
  • the molar ratio of the polymerizable monomer, which is a raw material for the first functional group used in the production of the polymer compound (D), to the active hydrogen-containing group and the monomer having an unsaturated bond is preferably 60/100 to 150/100, more preferably 70/100 to 120/100, and still more preferably 90/100 to 110/100. If the molar ratio is less than 60/100, the active hydrogen may be excessive and the effect of reducing hysteresis may be reduced. If the molar ratio exceeds 150/100, the functional group that reacts with the active hydrogen will be excessive and the threshold voltage will be reduced. The absolute value may be large.
  • polymer compound (D) examples include poly (styrene-co- [N- (3-methacryloyloxypropyl-3 ′, 4′-dimethylmaleimide)]-co-aminostyrene-co-pentafluorostyrene-co.
  • the organic thin film transistor insulating layer material of the present invention may contain an active hydrogen compound (E).
  • the active hydrogen compound (E) reacts with the second functional group generated in the polymer compounds (A) to (D) and binds to it, thereby forming a crosslinked structure inside the insulating layer. it can.
  • the active hydrogen compound (E) includes a low molecular compound containing two or more active hydrogens (hereinafter referred to as a low molecular active hydrogen compound (E-1)) and a polymer compound containing two or more active hydrogens ( Hereinafter, the polymer active hydrogen compound (E-2)) is included.
  • Examples of the active hydrogen typically include a hydrogen atom contained in an amino group, a hydroxy group, or a mercapto group.
  • active hydrogen hydrogen contained in a phenolic hydroxy group, hydrogen contained in an alcoholic hydroxy group, aromatic amino group capable of favorably producing a reaction with the above-described reactive functional groups, in particular, isocyanato groups and isothiocyanato groups. Hydrogen contained in is preferred.
  • the low molecular active hydrogen compound (E-1) include a compound having a structure in which two or more active hydrogen-containing groups are bonded to a low molecular structure.
  • this low molecular structure include an alkyl structure and a benzene ring structure.
  • Specific examples of the low molecular weight compound include amine compounds, alcohol compounds, phenol compounds, and thiol compounds.
  • the “alkyl structure” means a linear, branched, or cyclic structure composed of an aliphatic hydrocarbon.
  • the “benzene ring structure” means a linear, branched, or cyclic structure composed of an aromatic hydrocarbon.
  • amine compounds include ethylenediamine, propylenediamine, hexamethylenediamine, N, N, N ′, N ′,-tetraaminoethylethylenediamine, ortho-phenylenediamine, meta-phenylenediamine, para-phenylenediamine, N, N′-diphenyl-para-phenylenediamine, melamine, 2,4,6-triaminopyrimidine, 1,5,9-triazacyclododecane, 1,3-bis (3-aminopropyl) tetramethyldisiloxane, 1 , 4-bis (3-aminopropyldimethylsilyl) benzene, 3- (2-aminoethylaminopropyl) tris (trimethylsiloxy) silane.
  • alcohol compounds examples include ethylene glycol, 1,2-dihydroxypropane, glycerol, and 1,4-dimethanolbenzene.
  • phenolic compounds include 1,2-dihydroxybenzene, 1,3-dihydroxybenzene, 1,4-dihydroxybenzene (hydroquinone), 1,2-dihydroxynaphthalene, resorcin, fluoroglycerol, 2,3,4- Examples include trihydroxybenzaldehyde and 3,4,5-trihydroxybenzamide.
  • thiol compounds include ethylene dithiol and para-phenylene dithiol.
  • the low molecular weight compound containing two or more active hydrogens alcohol compounds, phenol compounds, and aromatic amine compounds are preferable.
  • the active hydrogen may be directly bonded to the main chain constituting the polymer compound or may be bonded through a predetermined group.
  • the active hydrogen may be contained in the structural unit constituting the polymer compound. In that case, it may be contained in each structural unit, or may be contained only in a part of the structural units. . Furthermore, the active hydrogen may be bonded only to the terminal of the polymer compound.
  • polymer active hydrogen compound (E-2) examples include a compound having a structure in which a group containing two or more active hydrogens is bonded to a polymer structure.
  • the polymer active hydrogen compound (E-2) is obtained by polymerizing a monomer having an active hydrogen-containing group and an unsaturated bond such as a double bond alone or by repeating the monomer represented by the above formula (1). Copolymerizing with a polymerizable monomer that is a raw material of the repeating unit represented by the above formula (2) or the repeating unit containing the first functional group, or by copolymerizing the monomer with another copolymerizable compound. It is obtained by forming a coalescence. The polymerization or copolymerization of these polymerizable monomers may be performed using a method usually used by those skilled in the art.
  • a photopolymerization initiator or a thermal polymerization initiator may be applied.
  • the thing similar to what was mentioned above is applicable as a polymerizable monomer, a photoinitiator, and a thermal polymerization initiator.
  • monomers having an active hydrogen-containing group and an unsaturated bond include the monomers described above.
  • monomers containing active hydrogen and monomers having unsaturated bonds monomers containing amino groups are preferred.
  • a novolak resin obtained by condensing a phenol compound and formaldehyde in the presence of an acid catalyst is also preferably used.
  • the weight average molecular weight in terms of polystyrene of the polymer compound containing two or more groups containing active hydrogen is preferably from 1,000 to 1,000,000, and more preferably from 3,000 to 500,000. Thereby, the effect that the flatness and uniformity of the insulating layer are improved can be obtained.
  • the weight average molecular weight in terms of polystyrene is measured by GPC.
  • the polymer compounds (A) to (D) are all light and heat energy crosslinkable and can be used as the organic thin film transistor insulating layer material of the present invention.
  • the polymer compounds (A) and (B) do not have active hydrogen.
  • the second functional group can react with water, and the polymer compounds (A) and (B) can also be thermally crosslinked.
  • One preferable aspect of the organic thin film transistor insulating layer material of the present invention is a composition containing the polymer compound (A) and / or (B) and the active hydrogen compound (E).
  • a composition containing the polymer compound (B) and the active hydrogen compound (E) is more preferable.
  • the mixing ratio of the polymer compound (A) and / or (B) and the active hydrogen compound (E) is determined by the second functional group that can be generated from the polymer compound (A) and / or (B) and the active hydrogen.
  • a ratio in which the molar ratio of the group containing active hydrogen in the compound (E) is 60/100 to 150/100 is preferable. The ratio is more preferably 70/100 to 120/100, and still more preferably 90/100 to 110/100. If the molar ratio is less than 60/100, the active hydrogen may be excessive and the effect of reducing hysteresis may be reduced. If the molar ratio exceeds 150/100, the functional group that reacts with the active hydrogen is excessive.
  • the absolute value of the threshold voltage may increase.
  • Another preferred embodiment of the organic thin film transistor insulating layer material of the present invention is a polymer compound (C).
  • the polymer compound (D) is more preferable. Since the polymer compound (C) and the polymer compound (D) have the first functional group and the group containing active hydrogen, they can be used alone for the organic thin film transistor insulating layer material of the present invention. .
  • the organic thin film transistor insulating layer material of the present invention contains an organic group and a functional group bonded to the polymer compounds (A) to (E).
  • the contents of the organic group and the functional group are appropriately determined by adjusting the amount of the repeating unit having the organic group and the functional group in consideration of the performance required for the organic thin film transistor insulating layer material.
  • the molar fraction of the repeating unit containing a photodimerization reactive group is 0.01 to based on the total number of repeating units of the polymer compound contained in the organic thin film transistor insulating layer material of the present invention. It is 0.7, preferably 0.05 to 0.6, more preferably 0.1 to 0.5. If the molar fraction of the repeating unit containing the photodimerization reactive group is less than 0.01, curing may be insufficient, and if it exceeds 0.7, the transistor characteristics may be adversely affected.
  • the molar fraction of the repeating unit containing the first functional group is 0.01 to 0.7, preferably 0.05 to 0.6, more preferably 0.1 to 0.5. If the molar fraction of the repeating unit containing the first functional group is less than 0.01, curing may be insufficient, and if it exceeds 0.7, transistor characteristics may be adversely affected.
  • the amount of active hydrogen is determined based on the amount that reacts with the first functional group without excess or deficiency.
  • the amount of fluorine introduced into the polymer compound is preferably 50% by mass or less, preferably 1 to 40% by mass, more preferably 5 to 35% by mass with respect to the total amount of the polymer compound.
  • the amount of fluorine exceeds 50% by mass, the affinity with the organic semiconductor material is deteriorated, and it may be difficult to stack the layer thereon.
  • the organic thin film transistor insulating layer material of the present invention includes a solvent for mixing and viscosity adjustment, a crosslinking agent used for crosslinking the polymer compounds (A) to (D), and an additive used in combination with the crosslinking agent.
  • Etc. may be included.
  • Solvents used include ether solvents such as tetrahydrofuran and diethyl ether, aliphatic hydrocarbon solvents such as hexane, alicyclic hydrocarbon solvents such as cyclohexane, unsaturated hydrocarbon solvents such as pentene, and aromatic carbonization such as xylene.
  • Examples thereof include a hydrogen solvent, a ketone solvent such as acetone, an acetate solvent such as butyl acetate, an alcohol solvent such as isopropyl alcohol, a halogen solvent such as chloroform, and a mixed solvent of these solvents.
  • the catalyst for promoting a crosslinking reaction, a leveling agent, a viscosity modifier, etc. can be used.
  • the organic thin film transistor insulating layer material of the present invention is a composition used for forming an insulating layer contained in an organic thin film transistor. Among the insulating layers of organic thin film transistors, it is preferably used for forming an overcoat layer or a gate insulating layer.
  • the organic thin film transistor insulating layer material is preferably an organic thin film transistor overcoat layer composition or an organic thin film transistor gate insulating layer composition, and more preferably an organic thin film transistor gate insulating layer material.
  • FIG. 1 is a schematic cross-sectional view showing the structure of a bottom gate top contact organic thin film transistor according to an embodiment of the present invention.
  • the organic thin film transistor includes a substrate 1, a gate electrode 2 formed on the substrate 1, a gate insulating layer 3 formed on the gate electrode 2, an organic semiconductor layer 4 formed on the gate insulating layer 3, A source electrode 5 and a drain electrode 6 formed on the organic semiconductor layer 4 with a channel portion interposed therebetween, and an overcoat 7 covering the entire element are provided.
  • a bottom gate top contact type organic thin film transistor includes, for example, a gate electrode formed on a substrate, a gate insulating layer formed on the gate electrode, an organic semiconductor layer formed on the gate insulating layer, and a source electrode formed on the organic semiconductor layer. It can be manufactured by forming a drain electrode and forming an overcoat.
  • the organic thin film transistor insulating layer material of the present invention is suitably used for forming a gate insulating layer as an organic thin film transistor gate insulating layer material. Moreover, it can also be used for forming an overcoat layer as an organic thin film transistor overcoat layer material.
  • FIG. 2 is a schematic cross-sectional view showing the structure of a bottom gate bottom contact type organic thin film transistor which is an embodiment of the present invention.
  • a substrate 1 a gate electrode 2 formed on the substrate 1, a gate insulating layer 3 formed on the gate electrode 2, and a channel portion on the gate insulating layer 3 are formed.
  • a bottom gate bottom contact type organic thin film transistor includes, for example, a gate electrode formed on a substrate, a gate insulating layer formed on the gate electrode, a source electrode and a drain electrode formed on the gate insulating layer, and a source electrode and a drain electrode. It can be manufactured by forming an organic semiconductor layer thereon and forming an overcoat.
  • the organic thin film transistor insulating layer material of the present invention is suitably used for forming a gate insulating layer as an organic thin film transistor gate insulating layer material. Moreover, it can also be used for forming an overcoat layer as an organic thin film transistor overcoat layer material.
  • a solvent or the like is added to prepare an insulating layer coating solution, and the insulating layer coating solution is placed under the gate insulating layer or overcoat layer. It is performed by applying to the surface of the layer located, drying and curing.
  • the organic solvent used in the insulating layer coating solution is not particularly limited as long as it dissolves the organic thin film transistor insulating layer material, but is preferably an organic solvent having a boiling point of 100 ° C. to 200 ° C. at normal pressure. .
  • organic solvent examples include 2-heptanone (boiling point 151 ° C.) and propylene glycol monomethyl ether acetate (boiling point 146 ° C.).
  • a leveling agent, a surfactant, a curing catalyst, and the like can be added to the insulating layer coating solution as necessary.
  • the organic thin film transistor insulating layer material of the present invention can also be used for forming a gate insulating layer as an organic thin film transistor gate insulating layer composition.
  • the insulating layer coating solution can be applied onto the gate electrode by a known method such as spin coating, die coater, screen printing, or ink jet.
  • the formed coating layer is dried as necessary. Drying here means removing the solvent contained in the applied resin composition.
  • the dried coating layer is then cured.
  • Curing means that the organic thin film transistor insulating layer material is crosslinked. Cross-linking of the transistor insulating layer material is performed, for example, by applying electromagnetic wave irradiation or heat to the coating layer.
  • a second functional group is generated from the first functional group of the polymer compound (A) or (B), and the second functional group reacts with the active hydrogen-containing group of the active hydrogen compound (E). Because. Alternatively, the second functional group is generated from the first functional group of the polymer compound (C) or (D), and the second functional group reacts with the active hydrogen-containing group in the molecule.
  • Crosslinking of the organic thin film transistor insulating layer material is also performed by irradiating the coating layer with electromagnetic waves or electron beams. This is because when the coating layer is irradiated with an electromagnetic wave or an electron beam, dimerization occurs due to the cyclization reaction of the photodimerization reactive groups of the polymer compounds (A) to (D).
  • the organic thin film transistor insulating layer is: Forming the coating layer on the substrate by applying a liquid containing an organic thin film transistor insulating layer material to the substrate; and irradiating the coating layer with an electromagnetic wave or an electron beam. Is preferred.
  • an organic thin film transistor insulating layer material is formed.
  • it is formed by a forming method including a step of coating a liquid containing the substrate on the substrate and forming a coating layer on the substrate; and a step of irradiating the coating layer with an electromagnetic wave or an electron beam.
  • the layer includes a step of applying a liquid containing an organic thin film transistor insulating layer material to a substrate to form a coating layer on the substrate; a step of irradiating the coating layer with an electromagnetic wave or an electron beam; and heating the coating layer. It is more preferable to form by the forming method including the step of applying.
  • the crosslink density of the insulating layer is improved by performing both the step of irradiating the coating layer with electromagnetic waves or electron beams and the step of applying heat to the coating layer.
  • the organic thin film transistor insulating layer material is used for the gate insulating layer, the absolute value and hysteresis of the threshold voltage (Vth) of the organic thin film transistor are reduced. It is considered that the polarization at the time of voltage application is further suppressed by improving the crosslinking density of the insulating layer, and the absolute value and hysteresis of the threshold voltage of the organic thin film transistor are reduced.
  • the coating layer When heat is applied to the coating layer, the coating layer is heated to a temperature of about 80 to 250 ° C., preferably about 100 to 230 ° C., and maintained for about 5 to 120 minutes, preferably about 10 to 60 minutes. If the heating temperature is too low or the heating time is too short, the insulating layer is not sufficiently crosslinked, and if the heating temperature is too high or the heating time is too long, the insulating layer may be damaged.
  • the irradiation conditions are adjusted in consideration of the degree of crosslinking and damage of the insulating layer.
  • the application condition is adjusted in consideration of the cross-linking of the insulating layer and the degree of damage.
  • the wavelength of the electromagnetic wave to be irradiated is preferably 450 nm or less, more preferably 150 to 410 nm.
  • the organic thin film transistor insulating layer material may be insufficiently crosslinked.
  • electromagnetic waves ultraviolet rays are preferable.
  • Irradiation with ultraviolet rays can be performed using, for example, an exposure apparatus used for manufacturing a semiconductor or a UV lamp used for curing a UV curable resin.
  • the electron beam irradiation can be performed using, for example, a micro electron beam irradiation tube.
  • Heating can be performed using a heater, an oven, or the like. Other irradiation conditions and heating conditions are appropriately determined according to the type and amount of the photodimerization reactive group.
  • a self-assembled monolayer may be formed on the gate insulating layer.
  • the self-assembled monolayer can be formed, for example, by treating the gate insulating layer with a solution obtained by dissolving 1 to 10% by weight of an alkylchlorosilane compound or an alkylalkoxysilane compound in an organic solvent.
  • alkylchlorosilane compound examples include methyltrichlorosilane, ethyltrichlorosilane, butyltrichlorosilane, decyltrichlorosilane, and octadecyltrichlorosilane.
  • alkylalkoxysilane compound examples include methyltrimethoxysilane, ethyltrimethoxysilane, butyltrimethoxysilane, decyltrimethoxysilane, and octadecyltrimethoxysilane.
  • the substrate 1, gate electrode 2, source electrode 5, drain electrode 6 and organic semiconductor layer 4 may be composed of commonly used materials and methods. Resin or plastic plates, films, glass plates, silicon plates, etc. are used as the material of the substrate. As the electrode material, chromium, gold, silver, aluminum, molybdenum, or the like is used, and the electrode is formed by a known method such as a vapor deposition method, a sputtering method, a printing method, or an ink jet method.
  • a ⁇ -conjugated polymer is used as the organic semiconductor compound for forming the organic semiconductor layer 4.
  • polypyrroles, polythiophenes, polyanilines, polyallylamines, fluorenes, polycarbazoles, polyindoles, poly (P -Phenylene vinylene) and the like can be used.
  • low-molecular substances having solubility in organic solvents for example, polycyclic aromatic derivatives such as pentacene, phthalocyanine derivatives, perylene derivatives, tetrathiafulvalene derivatives, tetracyanoquinodimethane derivatives, fullerenes, carbon nanotubes Etc. can be used.
  • the organic semiconductor layer can be formed, for example, by adding a solvent or the like if necessary for the organic semiconductor compound, preparing an organic semiconductor coating solution, applying the organic semiconductor coating solution on the gate insulating layer, and applying the organic semiconductor coating solution to the organic semiconductor coating solution. This is done by drying.
  • the resin constituting the gate insulating layer has a benzene ring and has an affinity for an organic semiconductor compound. Therefore, a uniform and flat interface is formed between the organic semiconductor layer and the gate insulating layer by the coating and drying method.
  • the solvent used in the organic semiconductor coating solution is not particularly limited as long as it dissolves or disperses the organic semiconductor, but is preferably a solvent having a boiling point of 50 ° C. to 200 ° C. at normal pressure.
  • the solvent include chloroform, toluene, anisole, 2-heptanone, and propylene glycol monomethyl ether acetate.
  • the organic semiconductor coating liquid can be applied onto the gate insulating layer by a known method such as spin coating, die coater, screen printing, and ink jet as in the case of the insulating layer coating liquid.
  • the organic thin film transistor of the present invention may be coated with an overcoat material for the purpose of protecting the organic thin film transistor and improving the smoothness of the surface.
  • the insulating layer manufactured using the organic thin film transistor insulating layer material of the present invention can be laminated with a flat film or the like, and a laminated structure can be easily formed. Moreover, an organic electroluminescent element can be suitably mounted on the insulating layer.
  • a display member having an organic thin film transistor can be suitably produced using the organic thin film transistor insulating layer material of the present invention.
  • a display provided with a display member can be manufactured using the display member having the organic thin film transistor.
  • the organic thin film transistor insulating layer material of the present invention can also be used for forming a layer included in a transistor other than an insulating layer and a layer included in an organic electroluminescence element.
  • Synthesis example 1 (Synthesis of Compound 1) In a 500 ml eggplant flask containing a water trap and stirrer, 25 g of 1-cyclohexene-1,2-dicarboxylic anhydride (manufactured by Tokyo Chemical Industry), 12 g of 3-aminopropanol, and 200 ml of toluene are placed in an oil bath. The reaction was carried out at 140 ° C. for 4 hours. After completion of the reaction, the reaction mixture was concentrated with a rotary evaporator, and 100 ml of diethyl ether (manufactured by Wako Pure Chemical Industries) was added.
  • the obtained diethyl ether solution was transferred to a separatory funnel, washed with an aqueous sodium carbonate solution, and then washed with water until the aqueous layer became neutral and separated. After the organic layer was dried over anhydrous magnesium sulfate, the solid was filtered off and the filtrate was concentrated with a rotary evaporator to obtain Compound 1 as a tan viscous liquid.
  • the high molecular compound 3 has the following repeating unit.
  • the numbers in parentheses indicate the mole fraction of repeating units.
  • Synthesis example 2 (Synthesis of polymer compound 4) 1.88 g of 2,1,3-benzothiadiazole-4,7-di (ethylene boronate) and 2,6-dibromo- (4,4-bis-hexadecanyl-4H-cyclopenta [2,1-b; In toluene (80 mL) containing 3.81 g of 3,4-b ′]-dithiophene, under nitrogen, 0.75 g of tetrakis (triphenylphosphine) palladium, methyltrioctylammonium chloride (manufactured by Aldrich, trade name “Aliquat”) 336 "(R)) and 24 mL of 2M aqueous sodium carbonate solution were added.
  • Polymer compound 4 which has the following repeating unit represents the number of repeating units.
  • Example 1 (Production of organic thin film transistor insulating layer material and field effect organic thin film transistor) Into a 10 ml sample bottle, 2.00 g of the propylene glycol monomethyl ether acetate solution of the polymer compound 3 obtained in Synthesis Example 1 and 2.00 g of propylene glycol monomethyl ether acetate are added and dissolved while stirring. A uniform coating solution 1 as a material was prepared.
  • the obtained coating solution was filtered using a membrane filter having a pore diameter of 0.2 ⁇ m, spin-coated on a glass substrate with a chromium electrode, and then dried on a hot plate at 100 ° C. for 1 minute. Then, after irradiating UV light (wavelength 365 nm) of 1600 mJ / cm 2 using an aligner (manufactured by Canon; PLA-521), the gate insulating layer is obtained by baking at 200 ° C. for 30 minutes on a hot plate in nitrogen. It was.
  • the polymer compound 4 was dissolved in xylene as a solvent to prepare a solution (organic semiconductor composition) having a concentration of 0.5% by weight, and this was filtered through a membrane filter to prepare a coating solution. .
  • the obtained coating solution is applied on the gate insulating layer by a spin coating method to form an active layer having a thickness of about 30 nm, and then, on the active layer by a vacuum deposition method using a metal mask,
  • a field effect organic thin film transistor was manufactured by forming a source electrode and a drain electrode (having a laminated structure in the order of molybdenum oxide and gold from the active layer side) having a channel length of 20 ⁇ m and a channel width of 2 mm.
  • the field effect organic thin film transistor thus fabricated has the transistor characteristics of a vacuum probe (BCT22MDC-5-5) under the condition that the gate voltage Vg is changed to 20 to -40V and the source-drain voltage Vsd is changed to 0 to -40V.
  • the hysteresis of the field effect organic thin film transistor is that the source-drain voltage Vsd is ⁇ 40 V, and the threshold voltage Vth1 and the gate voltage Vg are changed from ⁇ 40 V to 20 V when the gate voltage Vg is changed from 20 V to ⁇ 40 V. It was expressed as a voltage difference from the threshold voltage Vth2.
  • Comparative Example 1 Manufacture of field-effect organic thin-film transistors
  • a field effect organic thin film transistor was produced in the same manner as in Example 1 except that the coating solution 2 was used in place of the coating solution 1 and UV irradiation was not performed when forming the gate insulating layer. When the transistor characteristics were measured and evaluated, it did not operate as a transistor in the region where the gate voltage Vg was 20V to -40V.

Abstract

The problem addressed by the present invention is to provide an organic thin film transistor insulation layer material capable of producing an organic thin film transistor having low hysteresis and having a threshold voltage with a low absolute value. The problem is solved by an organic thin film transistor insulation layer material containing a polymer compound (A) which has a repeating unit having a substituted maleimide group and has a repeating unit containing a first functional group, said first functional group being a functional group which generates a second functional group which reacts with active hydrogen through the action of electromagnetic radiation or heat.

Description

光及び熱エネルギー架橋性有機薄膜トランジスタ絶縁層材料Light and thermal energy crosslinkable organic thin film transistor insulating layer material
 本発明は、有機薄膜トランジスタが有する絶縁層を形成するのに適した材料に関する。 The present invention relates to a material suitable for forming an insulating layer of an organic thin film transistor.
 有機薄膜トランジスタは、無機半導体より低温で製造できるため、その基板としてプラスチック基板やフィルムを用いることができ、このような基板を用いることにより、無機半導体からなるトランジスタよりフレキシブルであり、軽量で壊れにくい素子を得ることができる。また、有機材料を含む溶液の塗布や印刷法を用いた成膜により素子作製が可能な場合があり、大面積の基板に多数の素子を低コストで製造することが可能な場合がある。 Organic thin-film transistors can be manufactured at a lower temperature than inorganic semiconductors, so plastic substrates and films can be used as their substrates, and by using such substrates, elements that are more flexible, lighter and less fragile than transistors made of inorganic semiconductors. Can be obtained. In some cases, an element can be manufactured by application of a solution containing an organic material or film formation using a printing method, and a large number of elements can be manufactured on a large-area substrate at low cost.
 さらに、トランジスタの検討に用いることができる材料の種類が豊富であるため、分子構造の異なる材料を検討に用いれば、幅広い範囲の特性のバリエーションを有する素子を製造することができる。 Furthermore, since there are a wide variety of materials that can be used for the study of transistors, if materials having different molecular structures are used for the study, elements having a wide range of characteristic variations can be manufactured.
 有機薄膜トランジスタの1種である電界効果型有機薄膜トランジスタでは、ゲート電極に印加される電圧がゲート絶縁層を介して半導体層に作用して、ドレイン電流のオン、オフを制御する。そのため、ゲート電極と半導体層の間にはゲート絶縁層が形成される。 In a field effect organic thin film transistor which is a kind of organic thin film transistor, a voltage applied to a gate electrode acts on a semiconductor layer through a gate insulating layer to control on / off of a drain current. Therefore, a gate insulating layer is formed between the gate electrode and the semiconductor layer.
 また、電界効果型有機薄膜トランジスタの製造に用いられる有機半導体化合物は、湿度、酸素等の環境の影響を受けやすく、トランジスタ特性が、湿度、酸素等に起因する経時劣化を起こしやすい。 In addition, organic semiconductor compounds used in the manufacture of field effect organic thin film transistors are easily affected by the environment such as humidity and oxygen, and the transistor characteristics are likely to deteriorate over time due to humidity, oxygen, and the like.
 そのため、有機半導体化合物が剥き出しになるボトムゲート型有機薄膜トランジスタ素子構造では、素子構造全体を覆うオーバーコート層を形成して有機半導体化合物を外気との接触から保護することが必須となっている。一方、トップゲート型有機薄膜トランジスタ素子構造では、有機半導体化合物はゲート絶縁層によりコートされて保護されている。 Therefore, in the bottom gate type organic thin film transistor element structure in which the organic semiconductor compound is exposed, it is essential to form an overcoat layer covering the entire element structure to protect the organic semiconductor compound from contact with the outside air. On the other hand, in the top gate type organic thin film transistor device structure, the organic semiconductor compound is coated and protected by a gate insulating layer.
 このように、有機薄膜トランジスタにおける有機半導体層を覆うオーバーコート層及びゲート絶縁層等を形成するために、絶縁層材料が用いられる。本願明細書では、上記オーバーコート層及びゲート絶縁層のような有機薄膜トランジスタの絶縁層又は絶縁膜を有機薄膜トランジスタ絶縁層という。また、有機薄膜トランジスタ絶縁層を形成するのに用いる材料を有機薄膜トランジスタ絶縁層材料という。尚、ここでいう材料は、高分子化合物、高分子化合物を含む組成物、樹脂及び樹脂組成物のような無定形材料を含む概念である。 Thus, an insulating layer material is used to form an overcoat layer, a gate insulating layer, and the like that cover the organic semiconductor layer in the organic thin film transistor. In the present specification, an insulating layer or an insulating film of an organic thin film transistor such as the overcoat layer and the gate insulating layer is referred to as an organic thin film transistor insulating layer. A material used for forming the organic thin film transistor insulating layer is referred to as an organic thin film transistor insulating layer material. In addition, the material here is a concept including an amorphous material such as a polymer compound, a composition containing the polymer compound, a resin, and a resin composition.
 有機薄膜トランジスタ絶縁層材料には、絶縁性及び薄膜にしたときの絶縁破壊強度に優れた特性が要求される。また、特にボトムゲート型の電界効果トランジスタでは半導体層がゲート絶縁層に重ねて形成される。そのため、有機薄膜トランジスタゲート絶縁層材料には、有機半導体と密着した界面を形成するための有機半導体との親和性、該有機薄膜トランジスタゲート絶縁層材料から形成した膜の有機半導体層側の表面が平坦になることが要求される。 The organic thin film transistor insulating layer material is required to have excellent insulating properties and excellent dielectric breakdown strength when formed into a thin film. In particular, in a bottom-gate field effect transistor, a semiconductor layer is formed so as to overlap with a gate insulating layer. Therefore, the organic thin film transistor gate insulating layer material has an affinity with the organic semiconductor for forming an interface closely adhered to the organic semiconductor, and the organic semiconductor layer side surface of the film formed from the organic thin film transistor gate insulating layer material is flat. It is required to be.
 このような要求に応える技術として、特許文献1には、有機薄膜トランジスタゲート絶縁層材料としてエポキシ樹脂とシランカップリング剤とを組み合わせて用いることが記載されている。この技術においては、エポキシ樹脂の硬化反応の際に生成する水酸基とシランカップリング剤を反応させる。これは、前記水酸基はゲート絶縁層材料の吸湿性を高め、トランジスタ性能の安定性が損なわれるからである。 As a technology that meets such a requirement, Patent Document 1 describes that an epoxy resin and a silane coupling agent are used in combination as an organic thin film transistor gate insulating layer material. In this technique, a hydroxyl group produced during the curing reaction of an epoxy resin is reacted with a silane coupling agent. This is because the hydroxyl group enhances the hygroscopicity of the gate insulating layer material and impairs the stability of the transistor performance.
 非特許文献1には、ポリビニルフェノールとメラミン化合物とを熱架橋させた樹脂をゲート絶縁層に用いることが記載されている。この技術では、メラミン化合物で架橋することによってポリビニルフェノールに含まれる水酸基を除去し、同時に膜強度を高める。このゲート絶縁層を有するペンタセンTFTはヒステリシスが小さく、ゲートバイアス応力に対して耐久性を示す。 Non-Patent Document 1 describes that a resin obtained by thermally cross-linking polyvinylphenol and a melamine compound is used for the gate insulating layer. In this technique, the hydroxyl group contained in polyvinylphenol is removed by crosslinking with a melamine compound, and at the same time the film strength is increased. The pentacene TFT having this gate insulating layer has a small hysteresis and exhibits durability against gate bias stress.
 非特許文献2には、ポリビニルフェノール及びビニルフェノールとメチルメタクリレートとを共重合させたコポリマーをゲート絶縁層に用いることが記載されている。この技術では、ビニルフェノールの水酸基をメチルメタクリレートのカルボニル基と相互作用させて膜全体の極性を低下させる。このゲート絶縁層を有するペンタセンTFTはヒステリシスが小さく、安定した電気特性を示す。 Non-Patent Document 2 describes that polyvinyl gate and a copolymer obtained by copolymerizing vinyl phenol and methyl methacrylate are used for the gate insulating layer. In this technique, the hydroxyl group of vinylphenol interacts with the carbonyl group of methyl methacrylate to reduce the polarity of the entire film. The pentacene TFT having this gate insulating layer has a small hysteresis and exhibits stable electrical characteristics.
特開2007-305950JP2007-305950A
 しかしながら、有機エレクトロルミネッセンス素子(有機EL素子)のような発光素子の実用化を考慮すると、有機薄膜トランジスタの動作精度をより向上する必要があり、上記従来のゲート絶縁層を有する有機薄膜トランジスタは閾値電圧(Vth)の絶対値及びヒステリシスが大きい。 However, in consideration of practical use of a light-emitting element such as an organic electroluminescence element (organic EL element), it is necessary to further improve the operation accuracy of the organic thin film transistor. The organic thin film transistor having the conventional gate insulating layer has a threshold voltage ( The absolute value and hysteresis of Vth) are large.
 本発明の目的は、閾値電圧の絶対値及びヒステリシスが小さい有機薄膜トランジスタを製造しうる有機薄膜トランジスタ絶縁層材料を提供することである。 An object of the present invention is to provide an organic thin film transistor insulating layer material capable of producing an organic thin film transistor having a small absolute value of threshold voltage and small hysteresis.
 以上の事に鑑み、種々検討を行った結果、架橋構造を形成しうる特定の樹脂組成物を用いてゲート絶縁層を形成することにより有機薄膜トランジスタの閾値電圧(Vth)の絶対値及びヒステリシスを小さくできることを見出し、本発明に至った。 In view of the above, as a result of various studies, the absolute value and hysteresis of the threshold voltage (Vth) of the organic thin film transistor are reduced by forming a gate insulating layer using a specific resin composition capable of forming a crosslinked structure. As a result, the inventors have found out that the present invention can be achieved.
 即ち、本発明は、式(1) That is, the present invention has the formula (1)
Figure JPOXMLDOC01-appb-C000005
Figure JPOXMLDOC01-appb-C000005
 [式中、R2は、水素原子又はメチル基を表す。R及びRは、それぞれ独立に、炭素数1~20の一価の有機基を表す。該一価の有機基中の水素原子は、フッ素原子で置換されていてもよい。R中の炭素原子とR中の炭素原子とが結合し、5員環又は6員環を形成してもよい。Rbbは、高分子化合物の主鎖と側鎖とを連結し、フッ素原子を有していてもよい連結部分を表す。cは、0又は1の整数を表す。]
で表される繰り返し単位と、第1の官能基を含有する繰り返し単位とを有し、該第1の官能基が、電磁波もしくは熱の作用により、活性水素と反応する第2の官能基を生成する官能基である高分子化合物(A)を含有する有機薄膜トランジスタ絶縁層材料を提供するものである。
[Wherein R 2 represents a hydrogen atom or a methyl group. R 3 and R 4 each independently represents a monovalent organic group having 1 to 20 carbon atoms. A hydrogen atom in the monovalent organic group may be substituted with a fluorine atom. The carbon atom in R 3 and the carbon atom in R 4 may be bonded to form a 5-membered ring or a 6-membered ring. R bb represents a connecting part that connects the main chain and the side chain of the polymer compound and may have a fluorine atom. c represents an integer of 0 or 1. ]
And a second functional group containing a first functional group, and the first functional group generates a second functional group that reacts with active hydrogen by the action of electromagnetic waves or heat. The present invention provides an organic thin film transistor insulating layer material containing a polymer compound (A) which is a functional group.
 ある一形態においては、前記高分子化合物(A)が、さらに式(2) In one certain form, the said high molecular compound (A) is further Formula (2).
Figure JPOXMLDOC01-appb-C000006
Figure JPOXMLDOC01-appb-C000006
 [式中、Rは、水素原子又はメチル基を表す。Rは、水素原子又は炭素数1~20の一価の有機基を表す。Rfは、フッ素原子又はフッ素原子を有する炭素数1~20の一価の有機基を表す。Raaは、高分子化合物の主鎖と側鎖とを連結し、フッ素原子を有していてもよい連結部分を表す。uは、0又は1の整数を表し、bは、1~5の整数を表す。Rが複数個ある場合、それらは同一でも相異なっていてもよい。Rfが複数個ある場合、それらは同一でも相異なっていてもよい。]
で表される繰り返し単位を有する。
[Wherein, R 1 represents a hydrogen atom or a methyl group. R represents a hydrogen atom or a monovalent organic group having 1 to 20 carbon atoms. Rf represents a fluorine atom or a monovalent organic group having 1 to 20 carbon atoms having a fluorine atom. R aa represents a connecting portion that connects the main chain and the side chain of the polymer compound and may have a fluorine atom. u represents an integer of 0 or 1, and b represents an integer of 1 to 5. When there are a plurality of R, they may be the same or different. When there are a plurality of Rf, they may be the same or different. ]
It has the repeating unit represented by these.
 ある一形態においては、前記第1の官能基が、ブロック化剤でブロックされたイソシアナト基及びブロック化剤でブロックされたイソチオシアナト基からなる群から選ばれる少なくとも1種の基である。 In one embodiment, the first functional group is at least one group selected from the group consisting of an isocyanato group blocked with a blocking agent and an isothiocyanato group blocked with a blocking agent.
 ある一形態においては、前記ブロック化剤でブロックされたイソシアナト基及びブロック化剤でブロックされたイソチオシアナト基が、式(3) In one embodiment, the isocyanato group blocked with the blocking agent and the isothiocyanato group blocked with the blocking agent are represented by the formula (3):
Figure JPOXMLDOC01-appb-C000007
   (3)
Figure JPOXMLDOC01-appb-C000007
(3)
 [式中、Xaは、酸素原子又は硫黄原子を表し、R及びRは、同一又は相異なり、水素原子又は炭素数1~20の一価の有機基を表す。]
で表される基である。
[Wherein, Xa represents an oxygen atom or a sulfur atom, and R 5 and R 6 are the same or different and represent a hydrogen atom or a monovalent organic group having 1 to 20 carbon atoms. ]
It is group represented by these.
 ある一形態においては、前記ブロック化剤でブロックされたイソシアナト基及びブロック化剤でブロックされたイソチオシアナト基が、式(4) In one embodiment, the isocyanato group blocked with the blocking agent and the isothiocyanato group blocked with the blocking agent are represented by the formula (4):
Figure JPOXMLDOC01-appb-C000008
   (4)
Figure JPOXMLDOC01-appb-C000008
(4)
 [式中、Xbは、酸素原子又は硫黄原子を表し、R~Rは、同一又は相異なり、水素原子又は炭素数1~20の一価の有機基を表す。]
で表される基である。
[Wherein, Xb represents an oxygen atom or a sulfur atom, and R 7 to R 9 are the same or different and each represents a hydrogen atom or a monovalent organic group having 1 to 20 carbon atoms. ]
It is group represented by these.
 ある一形態においては、前記高分子化合物(A)が、さらに、活性水素を1個有する構造単位を2個以上、又は、活性水素を2個以上有する構造単位を含む。 In one embodiment, the polymer compound (A) further includes two or more structural units having one active hydrogen or a structural unit having two or more active hydrogens.
 また、本発明は、さらに、活性水素を2つ以上含有する低分子化合物である活性水素化合物及び活性水素を2つ以上含有する高分子化合物である活性水素化合物からなる群から選ばれる少なくとも1種の活性水素化合物を含有する上記有機薄膜トランジスタ絶縁層材料を提供するものである。 Further, the present invention further includes at least one selected from the group consisting of an active hydrogen compound which is a low molecular compound containing two or more active hydrogens and an active hydrogen compound which is a polymer compound containing two or more active hydrogens. The organic thin-film transistor insulating layer material containing the active hydrogen compound is provided.
 また、本発明は、上記有機薄膜トランジスタ絶縁層材料を含む液を基材に塗布して該基材上に塗布層を形成する工程;及び
 該塗布層に電磁波又は電子線を照射する工程;
を包含する有機薄膜トランジスタ絶縁層の形成方法を提供する。
The present invention also includes a step of applying a liquid containing the organic thin film transistor insulating layer material to a substrate to form a coating layer on the substrate; and a step of irradiating the coating layer with an electromagnetic wave or an electron beam;
And a method for forming an organic thin film transistor insulating layer including the same.
 また、本発明は、上記有機薄膜トランジスタ絶縁層材料を含む液を基材に塗布して該基材上に塗布層を形成する工程;
 該塗布層に電磁波又は電子線を照射する工程;及び
 該塗布層に熱を印加する工程;
を包含する有機薄膜トランジスタ絶縁層の形成方法を提供する。
The present invention also includes a step of applying a liquid containing the organic thin film transistor insulating layer material to a base material to form a coating layer on the base material;
Irradiating the coating layer with electromagnetic waves or electron beams; and applying heat to the coating layer;
And a method for forming an organic thin film transistor insulating layer including the same.
 ある一形態においては、前記電磁波が紫外線である。 In one embodiment, the electromagnetic wave is ultraviolet light.
 また、本発明は、上記有機薄膜トランジスタ絶縁層材料を用いて形成した有機薄膜トランジスタ絶縁層を有する有機薄膜トランジスタを提供する。 The present invention also provides an organic thin film transistor having an organic thin film transistor insulating layer formed using the organic thin film transistor insulating layer material.
 ある一形態においては、前記有機薄膜トランジスタ絶縁層がゲート絶縁層である。 In one embodiment, the organic thin film transistor insulating layer is a gate insulating layer.
 また、本発明は、上記有機薄膜トランジスタを含むディスプレイ用部材を提供する。 The present invention also provides a display member comprising the organic thin film transistor.
 また、本発明は、上記ディスプレイ用部材を含むディスプレイを提供する。 The present invention also provides a display including the display member.
 本発明の有機薄膜トランジスタ絶縁層材料を用いて形成した絶縁層を有する有機薄膜トランジスタは、閾値電圧の絶対値及びヒステリシスが小さい。 An organic thin film transistor having an insulating layer formed using the organic thin film transistor insulating layer material of the present invention has a small absolute value of threshold voltage and a small hysteresis.
本発明の一実施形態であるボトムゲートトップコンタクト型有機薄膜トランジスタの構造を示す模式断面図である。It is a schematic cross section which shows the structure of the bottom gate top contact type organic thin-film transistor which is one Embodiment of this invention. 本発明の他の実施形態であるボトムゲートボトムコンタクト型有機薄膜トランジスタの構造を示す模式断面図である。It is a schematic cross section which shows the structure of the bottom gate bottom contact type organic thin-film transistor which is other embodiment of this invention.
 本明細書において、「高分子化合物」とは、分子中に同じ構造単位が複数繰り返された構造を含む化合物をいい、いわゆる2量体もこれに含まれる。一方、「低分子化合物」とは、分子中に同じ構造単位を繰り返し有していない化合物を意味する。 In the present specification, “polymer compound” refers to a compound having a structure in which a plurality of the same structural units are repeated in the molecule, and includes a so-called dimer. On the other hand, the “low molecular compound” means a compound that does not have the same structural unit repeatedly in the molecule.
<高分子化合物(A)>
 本発明の有機薄膜トランジスタ絶縁層材料は高分子化合物を含み、該高分子化合物は、電磁波のエネルギーもしくは電子線のエネルギーを吸収して二量化反応を起こす官能基を複数個有し、電磁波もしくは熱が作用した場合に、活性水素と反応する第2の官能基を生成する第1の官能基を複数個有する。電磁波のエネルギー又は電子線のエネルギーを吸収して二量化反応を起こす前記官能基を、本明細書では「光二量化反応基」という。また、本明細書において「活性水素」とは、酸素原子、硫黄原子または窒素原子に結合している水素原子を意味する。
<Polymer Compound (A)>
The organic thin film transistor insulating layer material of the present invention includes a polymer compound, and the polymer compound has a plurality of functional groups that absorb the energy of electromagnetic waves or the energy of electron beams to cause a dimerization reaction. When it acts, it has a plurality of first functional groups that generate a second functional group that reacts with active hydrogen. The functional group that absorbs electromagnetic energy or electron beam energy to cause a dimerization reaction is referred to as a “photodimerization reactive group” in this specification. In the present specification, “active hydrogen” means a hydrogen atom bonded to an oxygen atom, a sulfur atom or a nitrogen atom.
 光二量化反応基は、ある一形態では、光エネルギー又は電子線のエネルギーを吸収した場合に協奏反応しうる官能基である。協奏反応しうる官能基は相互に付加環化することにより二量化して、絶縁層の内部に架橋構造を形成することができる。 In one form, the photodimerization reactive group is a functional group that can perform a concerted reaction when absorbing light energy or electron beam energy. Functional groups that can perform a concerted reaction can be dimerized by cycloaddition with each other to form a crosslinked structure inside the insulating layer.
 光二量化反応基が吸収する電磁波は、あまり低エネルギーであると有機薄膜トランジスタ絶縁層材料を光重合法によって形成する際に光二量化反応基も反応してしまう場合があるため、高エネルギーの光が好ましい。光二量化反応基が吸収するのに好ましい電磁波は、紫外線、例えば波長が400nm以下、好ましくは150~390nm、より好ましくは、280~380nmの光である。 The electromagnetic wave absorbed by the photodimerization reactive group is preferably low energy, so that when the organic thin film transistor insulating layer material is formed by the photopolymerization method, the photodimerization reactive group may also react. . A preferable electromagnetic wave to be absorbed by the photodimerization reactive group is ultraviolet light, for example, light having a wavelength of 400 nm or less, preferably 150 to 390 nm, more preferably 280 to 380 nm.
 ここでいう二量化とは、有機化合物の分子2個が化学的に結合することをいう。結合する分子同士は同種でも異種でもよい。二量化する2個の分子中の二量化に関与する官能基同士の化学構造も同一であっても異なっていてもよい。但し、当該官能基は、触媒及び開始剤等の反応助剤が用いられなくても光二量化反応を生じる構造、及び組合せであることが好ましい。反応助剤の残基に接触すると周辺の有機材料が劣化する可能性があるからである。 “Dimerization” here means that two molecules of an organic compound are chemically bonded. The molecules to be bound may be the same or different. The chemical structures of the functional groups involved in dimerization in the two molecules to be dimerized may be the same or different. However, it is preferable that the functional group has a structure and a combination that cause a photodimerization reaction even when a reaction aid such as a catalyst and an initiator is not used. This is because contact with the residue of the reaction aid may cause deterioration of surrounding organic materials.
 前記高分子化合物に含まれる第1の官能基は活性水素と反応しないが、第1の官能基に電磁波又は熱が作用すると第2の官能基が生成し、これが活性水素と反応する。つまり、上記第1の官能基は電磁波又は熱により脱保護されて、活性水素と反応する第2の官能基を生成するものである。第2の官能基は活性水素化合物(E)の活性水素含有基と反応してこれと結合することにより、絶縁層の内部に架橋構造を形成することができる。本明細書において「活性水素化合物」とは、活性水素を1個以上有する化合物を意味する。 The first functional group contained in the polymer compound does not react with active hydrogen, but when an electromagnetic wave or heat acts on the first functional group, a second functional group is generated and reacts with active hydrogen. That is, the first functional group is deprotected by electromagnetic waves or heat to generate a second functional group that reacts with active hydrogen. The second functional group reacts with and binds to the active hydrogen-containing group of the active hydrogen compound (E), so that a crosslinked structure can be formed inside the insulating layer. In the present specification, the “active hydrogen compound” means a compound having one or more active hydrogens.
 第2の官能基は、ゲート絶縁層の形成工程において電磁波又は熱が加えられるまで保護(ブロック)されて、第1の官能基として有機薄膜トランジスタ絶縁層材料中に存在する。その結果、有機薄膜トランジスタ絶縁層材料の貯蔵安定性が向上する。 The second functional group is protected (blocked) in the step of forming the gate insulating layer until electromagnetic waves or heat is applied, and is present in the organic thin film transistor insulating layer material as the first functional group. As a result, the storage stability of the organic thin film transistor insulating layer material is improved.
 例えば、光二量化反応基を有する繰り返し単位と、上記第1の官能基を有する繰り返し単位とを含有する高分子化合物は、前記高分子化合物に該当する。 For example, a polymer compound containing a repeating unit having a photodimerization reactive group and a repeating unit having the first functional group corresponds to the polymer compound.
 光二量化反応基を有する繰り返し単位は、上記式(1)で表される繰り返し単位であることが好ましい。本発明の有機薄膜トランジスタ絶縁層材料に含まれる高分子化合物は、式(1)で表される繰り返し単位と、第1の官能基を含有する繰り返し単位とを有する高分子化合物が好ましい。このような高分子化合物を高分子化合物(A)と記す。 The repeating unit having a photodimerization reactive group is preferably a repeating unit represented by the above formula (1). The polymer compound contained in the organic thin film transistor insulating layer material of the present invention is preferably a polymer compound having a repeating unit represented by the formula (1) and a repeating unit containing a first functional group. Such a polymer compound is referred to as a polymer compound (A).
 式(1)中、Rは、水素原子又はメチル基を表す。ある一形態では、Rはメチル基である。 In formula (1), R 2 represents a hydrogen atom or a methyl group. In some one aspect, R 2 is a methyl group.
 式(1)中、R及びRは、それぞれ独立に、炭素数1~20の一価の有機基を表す。該一価の有機基中の水素原子は、フッ素原子で置換されていてもよい。炭素数1~20の一価の有機基は、直鎖、分岐、環状のいずれであってもよく、飽和であっても不飽和であってもよい。 In the formula (1), R 3 and R 4 each independently represents a monovalent organic group having 1 to 20 carbon atoms. A hydrogen atom in the monovalent organic group may be substituted with a fluorine atom. The monovalent organic group having 1 to 20 carbon atoms may be linear, branched or cyclic, and may be saturated or unsaturated.
 炭素数1~20の一価の有機基としては、例えば、炭素数1~20の直鎖状炭化水素基、炭素数3~20の分岐状炭化水素基、炭素数3~20の環状炭化水素基、炭素数6~20の芳香族炭化水素基が挙げられ、好ましくは、炭素数1~6の直鎖状炭化水素基、炭素数3~6の分岐状炭化水素基、炭素数3~6の環状炭化水素基、炭素数6~20の芳香族炭化水素基が挙げられる。 Examples of the monovalent organic group having 1 to 20 carbon atoms include a linear hydrocarbon group having 1 to 20 carbon atoms, a branched hydrocarbon group having 3 to 20 carbon atoms, and a cyclic hydrocarbon having 3 to 20 carbon atoms. Group, aromatic hydrocarbon group having 6 to 20 carbon atoms, preferably linear hydrocarbon group having 1 to 6 carbon atoms, branched hydrocarbon group having 3 to 6 carbon atoms, or 3 to 6 carbon atoms. And an aromatic hydrocarbon group having 6 to 20 carbon atoms.
 炭素数1~20の直鎖状炭化水素基、炭素数3~20の分岐状炭化水素基、炭素数3~20の環状炭化水素基は、これらの基に含まれる水素原子がフッ素原子で置換されていてもよい。 In a linear hydrocarbon group having 1 to 20 carbon atoms, a branched hydrocarbon group having 3 to 20 carbon atoms, and a cyclic hydrocarbon group having 3 to 20 carbon atoms, the hydrogen atoms contained in these groups are substituted with fluorine atoms. May be.
 炭素数6~20の芳香族炭化水素基は、基中の水素原子がアルキル基、フッ素原子、塩素原子、臭素原子、ヨウ素原子などで置換されていてもよい。 In the aromatic hydrocarbon group having 6 to 20 carbon atoms, a hydrogen atom in the group may be substituted with an alkyl group, a fluorine atom, a chlorine atom, a bromine atom, an iodine atom or the like.
 炭素数1~20の一価の有機基の具体例としては、メチル基、エチル基、プロピル基、ブチル基、ペンチル基、ヘキシル基、イソプロピル基、イソブチル基、ターシャリーブチル基、シクロプロピル基、シクロブチル基、シクロペンチル基、シクロヘキシル基、シクロペンチニル基、シクロヘキシニル基、トリフルオロメチル基、トリフルオロエチル基、フェニル基、ナフチル基、アンスリル基、トリル基、キシリル基、ジメチルフェニル基、トリメチルフェニル基、エチルフェニル基、ジエチルフェニル基、トリエチルフェニル基、プロピルフェニル基、ブチルフェニル基、メチルナフチル基、ジメチルナフチル基、トリメチルナフチル基、ビニルナフチル基、エテニルナフチル基、メチルアンスリル基、エチルアンスリル基、クロロフェニル基、ブロモフェニル基が挙げられる。 Specific examples of the monovalent organic group having 1 to 20 carbon atoms include methyl group, ethyl group, propyl group, butyl group, pentyl group, hexyl group, isopropyl group, isobutyl group, tertiary butyl group, cyclopropyl group, Cyclobutyl group, cyclopentyl group, cyclohexyl group, cyclopentynyl group, cyclohexynyl group, trifluoromethyl group, trifluoroethyl group, phenyl group, naphthyl group, anthryl group, tolyl group, xylyl group, dimethylphenyl group, trimethylphenyl group , Ethylphenyl group, diethylphenyl group, triethylphenyl group, propylphenyl group, butylphenyl group, methylnaphthyl group, dimethylnaphthyl group, trimethylnaphthyl group, vinylnaphthyl group, ethenylnaphthyl group, methylanthryl group, ethylanthryl group, Chloroph Alkenyl groups include bromophenyl group.
 炭素数1~20の一価の有機基としては、アルキル基が好ましい。 As the monovalent organic group having 1 to 20 carbon atoms, an alkyl group is preferable.
 R中の炭素原子とR中の炭素原子とが結合し、5員環又は6員環を形成してもよい。5員環としては、シクロペンテン環が挙げられる。6員環としては、シクロへキセン環が挙げられる。 The carbon atom in R 3 and the carbon atom in R 4 may be bonded to form a 5-membered ring or a 6-membered ring. Examples of the 5-membered ring include a cyclopentene ring. Examples of the 6-membered ring include a cyclohexene ring.
 ある一形態ではR及びRは、同一又は相異なり、メチル基及びエチル基からなる群から選択される基である。 In one certain form, R < 3 > and R < 4 > are the same or different, and are groups selected from the group which consists of a methyl group and an ethyl group.
 式(1)中、Rbbは、主鎖と側鎖とを連結し、フッ素原子を有していてもよい連結部分を表す。連結部分は、本発明の有機薄膜トランジスタ絶縁層材料を架橋させる環境条件の下で反応性を示さない構造を有する二価の基であればよい。連結部分の具体例には、炭素数1~20の二価の有機基からなる結合、エーテル結合(-O-)、ケトン結合(-CO-)、エステル結合(-COO-、-OCO-)、アミド結合(-NHCO-、-CONH-)、ウレタン結合(-NHCOO-、-OCONH-)及びこれらの結合が組み合わされた結合等が挙げられる。cは、0又は1の整数を表す。ある一形態では、cは1である。 In formula (1), R bb represents a linking moiety that links the main chain and the side chain and may have a fluorine atom. The connecting portion may be a divalent group having a structure that does not exhibit reactivity under environmental conditions for crosslinking the organic thin film transistor insulating layer material of the present invention. Specific examples of the linking moiety include a bond composed of a divalent organic group having 1 to 20 carbon atoms, an ether bond (—O—), a ketone bond (—CO—), an ester bond (—COO—, —OCO—). Amide bond (—NHCO—, —CONH—), urethane bond (—NHCOO—, —OCONH—), and a combination of these bonds. c represents an integer of 0 or 1. In one certain form, c is 1.
 前記炭素数1~20の二価の有機基としては、直鎖、分岐、環状のいずれであってもよく、脂肪族炭化水素基であっても芳香族炭化水素基であってもよい。例えば、炭素数1~20の二価の直鎖状脂肪族炭化水素基、炭素数3~20の二価の分岐状脂肪族炭化水素基、炭素数3~20の二価の環状炭化水素基、アルキル基等で置換されていてもよい炭素数6~20の二価の芳香族炭化水素基が挙げられる。中でも、炭素数1~6の二価の直鎖状脂肪族炭化水素基、炭素数3~6の二価の分岐状脂肪族炭化水素基、炭素数3~6の二価の環状炭化水素基、アルキル基等で置換されていてもよい二価の炭素数6~20の芳香族炭化水素基が好ましい。 The divalent organic group having 1 to 20 carbon atoms may be linear, branched or cyclic, and may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group. For example, a divalent linear aliphatic hydrocarbon group having 1 to 20 carbon atoms, a divalent branched aliphatic hydrocarbon group having 3 to 20 carbon atoms, and a divalent cyclic hydrocarbon group having 3 to 20 carbon atoms And a divalent aromatic hydrocarbon group having 6 to 20 carbon atoms which may be substituted with an alkyl group or the like. Among them, a divalent linear aliphatic hydrocarbon group having 1 to 6 carbon atoms, a divalent branched aliphatic hydrocarbon group having 3 to 6 carbon atoms, and a divalent cyclic hydrocarbon group having 3 to 6 carbon atoms. In addition, a divalent aromatic hydrocarbon group having 6 to 20 carbon atoms which may be substituted with an alkyl group or the like is preferable.
 二価の脂肪族炭化水素基及び二価の環状炭化水素基の具体例としては、メチレン基、エチレン基、プロピルレン基、ブチレン基、ペンチレン基、ヘキシレン基、イソプロピレン基、イソブチレン基、ジメチルプロピレン基、シクロプロピレン基、シクロブチレン基、シクロペンチレン基、シクロヘキシレン基が挙げられる。 Specific examples of the divalent aliphatic hydrocarbon group and the divalent cyclic hydrocarbon group include a methylene group, an ethylene group, a propylene group, a butylene group, a pentylene group, a hexylene group, an isopropylene group, an isobutylene group, and dimethylpropylene. Group, cyclopropylene group, cyclobutylene group, cyclopentylene group, and cyclohexylene group.
 炭素数6~20の二価の芳香族炭化水素基の具体例としては、フェニレン基、ナフチレン基、アンスリレン基、ジメチルフェニレン基、トリメチルフェニレン基、エチレンフェニレン基、ジエチレンフェニレン基、トリエチレンフェニレン基、プロピレンフェニレン基、ブチレンフェニレン基、メチルナフチレン基、ジメチルナフチレン基、トリメチルナフチレン基、ビニルナフチレン基、エテニルナフチレン基、メチルアンスリレン基、エチルアンスリレン基が挙げられる。 Specific examples of the divalent aromatic hydrocarbon group having 6 to 20 carbon atoms include phenylene group, naphthylene group, anthrylene group, dimethylphenylene group, trimethylphenylene group, ethylenephenylene group, diethylenephenylene group, triethylenephenylene group, Examples include propylenephenylene group, butylenephenylene group, methylnaphthylene group, dimethylnaphthylene group, trimethylnaphthylene group, vinylnaphthylene group, ethenylnaphthylene group, methylanthrylene group, and ethylanthrylene group.
 光二量化反応基の好ましい例は、マレイミド基の3位の水素原子及び4位の水素原子がそれぞれアルキル基又はアリール基で置換された基、式(5)で表される基である。式(5)中、R’は、プロパン-1,3-ジイル基、ブタン-1,4-ジイル基が好ましい。 A preferred example of the photodimerization reactive group is a group represented by the formula (5), in which the hydrogen atom at the 3-position and the hydrogen atom at the 4-position of the maleimide group are each substituted with an alkyl group or an aryl group. In the formula (5), R ′ is preferably a propane-1,3-diyl group or a butane-1,4-diyl group.
Figure JPOXMLDOC01-appb-C000009
  (5)
Figure JPOXMLDOC01-appb-C000009
(5)
 式(5)中、R’はアルカンジイル基を表す。 In formula (5), R ′ represents an alkanediyl group.
 光二量化反応基が、マレイミド基の3位の水素原子及び4位の水素原子がそれぞれアルキル基若しくはアリール基で置換された基又は式(5)で表される基の場合、紫外線又は電子線を照射すると2+2環化反応が生じ、有機薄膜トランジスタ絶縁層材料が架橋される。 When the photodimerization reactive group is a group in which the hydrogen atom at the 3-position and the hydrogen atom at the 4-position of the maleimide group are each substituted with an alkyl group or an aryl group, or a group represented by the formula (5), an ultraviolet ray or an electron beam is used. When irradiated, a 2 + 2 cyclization reaction occurs and the organic thin film transistor insulating layer material is crosslinked.
 また、上記第1の官能基の好ましい例としては、ブロック化剤でブロックされたイソシアナト基及びブロック化剤でブロックされたイソチオシアナト基が挙げられる。 In addition, preferable examples of the first functional group include an isocyanato group blocked with a blocking agent and an isothiocyanato group blocked with a blocking agent.
 前記ブロック化剤でブロックされたイソシアナト基又は前記ブロック化剤でブロックされたイソチオシアナト基は、イソシアナト基又はイソチオシアナト基と反応しうる活性水素を1分子中に1個だけ有するブロック化剤とイソシアナト基又はイソチオシアナト基とを反応させることにより製造することができる。 The isocyanato group blocked with the blocking agent or the isothiocyanato group blocked with the blocking agent is an isocyanate group or an isocyanate group having only one active hydrogen capable of reacting with an isocyanato group or an isothiocyanato group, or It can be produced by reacting with an isothiocyanato group.
 前記ブロック化剤は、イソシアナト基又はイソチオシアナト基と反応した後でも、170℃以下の温度で解離するものが好ましい。ブロック化剤としては、例えば、アルコ-ル系化合物、フェノ-ル系化合物、活性メチレン系化合物、メルカプタン系化合物、酸アミド系化合物、酸イミド系化合物、イミダゾール系化合物、尿素系化合物、オキシム系化合物、アミン系化合物、イミン系化合物、重亜硫酸塩、ピリジン系化合物、ピラゾール系化合物が挙げられる。これらのブロック化剤は、単独使用してもよく、2種以上を混合して使用してもよい。好ましいブロック化剤としては、オキシム系化合物、ピラゾール系化合物が挙げられる。 The blocking agent is preferably one that dissociates at a temperature of 170 ° C. or lower even after reacting with an isocyanato group or an isothiocyanato group. Examples of the blocking agent include alcohol compounds, phenol compounds, active methylene compounds, mercaptan compounds, acid amide compounds, acid imide compounds, imidazole compounds, urea compounds, and oxime compounds. , Amine compounds, imine compounds, bisulfites, pyridine compounds, and pyrazole compounds. These blocking agents may be used alone or in combination of two or more. Preferable blocking agents include oxime compounds and pyrazole compounds.
 以下に、具体的なブロック化剤を例示する。アルコ-ル系化合物の例としては、メタノール、エタノール、プロパノール、ブタノール、2-エチルヘキサノール、メチルセロソルブ、ブチルセロソルブ、メチルカルビトール、ベンジルアルコール、シクロヘキサノールが挙げられる。フェノール系化合物の例としては、フェノール、クレゾール、エチルフェノール、ブチルフェノール、ノニルフェノール、ジノニルフェノール、スチレン化フェノール、ヒドロキシ安息香酸エステルが挙げられる。活性メチレン系化合物の例としては、マロン酸ジメチル、マロン酸ジエチル、アセト酢酸メチル、アセト酢酸エチル、アセチルアセトンが挙げられる。メルカプタン系化合物の例としては、ブチルメルカプタン、ドデシルメルカプタンが挙げられる。酸アミド系化合物の例としては、アセトアニリド、酢酸アミド、ε-カプロラクタム、δ-バレロラクタム、γ-ブチロラクタムが挙げられ、酸イミド系化合物の例としては、コハク酸イミド、マレイン酸イミドが挙げられる。イミダゾール系化合物の例としては、イミダゾール、2-メチルイミダゾールが挙げられる。
尿素系化合物の例としては、尿素、チオ尿素、エチレン尿素が挙げられる。アミン系化合物の例としては、ジフェニルアミン、アニリン、カルバゾールが挙げられる。イミン系化合物の例としては、エチレンイミン、ポリエチレンイミンが挙げられる。重亜硫酸塩の例としては、重亜硫酸ソーダが挙げられる。ピリジン系化合物の例としては、2-ヒドロキシピリジン、2-ヒドロキシキノリンが挙げられる。オキシム系化合物の例としては、ホルムアルドオキシム、アセトアルドオキシム、アセトオキシム、メチルエチルケトオキシム、シクロヘキサノンオキシムが挙げられる。ピラゾール系化合物の例としては、3,5-ジメチルピラゾール、3,5-ジエチルピラゾールが挙げられる。
Specific blocking agents are exemplified below. Examples of alcohol compounds include methanol, ethanol, propanol, butanol, 2-ethylhexanol, methyl cellosolve, butyl cellosolve, methyl carbitol, benzyl alcohol, and cyclohexanol. Examples of phenolic compounds include phenol, cresol, ethylphenol, butylphenol, nonylphenol, dinonylphenol, styrenated phenol, and hydroxybenzoic acid ester. Examples of the active methylene compound include dimethyl malonate, diethyl malonate, methyl acetoacetate, ethyl acetoacetate, and acetylacetone. Examples of mercaptan compounds include butyl mercaptan and dodecyl mercaptan. Examples of the acid amide compounds include acetanilide, acetic acid amide, ε-caprolactam, δ-valerolactam, and γ-butyrolactam. Examples of the acid imide compounds include succinimide and maleic imide. Examples of the imidazole compound include imidazole and 2-methylimidazole.
Examples of the urea compound include urea, thiourea, and ethylene urea. Examples of the amine compound include diphenylamine, aniline, and carbazole. Examples of the imine compound include ethyleneimine and polyethyleneimine. An example of a bisulfite is sodium bisulfite. Examples of pyridine compounds include 2-hydroxypyridine and 2-hydroxyquinoline. Examples of oxime compounds include formaldoxime, acetaldoxime, acetoxime, methyl ethyl ketoxime, and cyclohexanone oxime. Examples of the pyrazole compound include 3,5-dimethylpyrazole and 3,5-diethylpyrazole.
 本発明に用いてもよいブロック化剤でブロックされたイソシアナト基又はイソチアシアナト基としては、上記式(3)で表される基又は上記式(4)で表される基が好ましい。 The isocyanato group or isothiocyanato group blocked with a blocking agent that may be used in the present invention is preferably a group represented by the above formula (3) or a group represented by the above formula (4).
 式(3)及び式(4)中、Xaは、酸素原子又は硫黄原子を表し、Xbは、酸素原子又は硫黄原子を表し、R~Rは、同一又は相異なり、水素原子又は炭素数1~20の一価の有機基を表す。一価の有機基の定義、具体例等は、前述の一価の有機基の定義、具体例等と同様である。 In the formulas (3) and (4), Xa represents an oxygen atom or a sulfur atom, Xb represents an oxygen atom or a sulfur atom, and R 5 to R 9 are the same or different and represent a hydrogen atom or a carbon number. 1 to 20 monovalent organic groups are represented. The definition and specific examples of the monovalent organic group are the same as the definition and specific examples of the monovalent organic group described above.
 ある一形態では、R~Rは水素原子である。 In one certain form, R 5 to R 9 are hydrogen atoms.
 ブロック化剤でブロックされたイソシアナト基としては、例えば、O-(メチリデンアミノ)カルボキシアミノ基、O-(1-エチリデンアミノ)カルボキシアミノ基、O-(1-メチルエチリデンアミノ)カルボキシアミノ基、O-[1-メチルプロピリデンアミノ]カルボキシアミノ基、(N-3,5-ジメチルピラゾリルカルボニル)アミノ基、(N-3-エチル-5-メチルピラゾリルカルボニル)アミノ基、(N-3,5-ジエチルピラゾリルカルボニル)アミノ基、(N-3-プロピル-5-メチルピラゾリルカルボニル)アミノ基、(N-3-エチル-5-プロピルピラゾリルカルボニル)アミノ基が挙げられる。 Examples of the isocyanato group blocked with a blocking agent include O- (methylideneamino) carboxyamino group, O- (1-ethylideneamino) carboxyamino group, O- (1-methylethylideneamino) carboxyamino group, O— [1-methylpropylideneamino] carboxyamino group, (N-3,5-dimethylpyrazolylcarbonyl) amino group, (N-3-ethyl-5-methylpyrazolylcarbonyl) amino group, (N-3,5-diethyl) And pyrazolylcarbonyl) amino group, (N-3-propyl-5-methylpyrazolylcarbonyl) amino group, and (N-3-ethyl-5-propylpyrazolylcarbonyl) amino group.
 ブロック化剤でブロックされたイソチオシアナト基としては、例えば、O-(メチリデンアミノ)チオカルボキシアミノ基、O-(1-エチリデンアミノ)チオカルボキシアミノ基、O-(1-メチルエチリデンアミノ)チオカルボキシアミノ基、O-[1-メチルプロピリデンアミノ] チオカルボキシアミノ基、(N-3,5-ジメチルピラゾリルチオカルボニル)アミノ基、(N-3-エチル-5-メチルピラゾリルチオカルボニル)アミノ基、(N-3,5-ジエチルピラゾリルチオカルボニル)アミノ基、(N-3-プロピル-5-メチルピラゾリルチオカルボニル)アミノ基、(N-3-エチル-5-プロピルピラゾリルチオカルボニル)アミノ基が挙げられる。
 第1の官能基としては、ブロック化剤でブロックされたイソシアナト基が好ましい。
Examples of the isothiocyanato group blocked with a blocking agent include an O- (methylideneamino) thiocarboxyamino group, an O- (1-ethylideneamino) thiocarboxyamino group, and an O- (1-methylethylideneamino) thiocarboxyamino group. , O- [1-methylpropylideneamino] thiocarboxyamino group, (N-3,5-dimethylpyrazolylthiocarbonyl) amino group, (N-3-ethyl-5-methylpyrazolylthiocarbonyl) amino group, (N -3,5-diethylpyrazolylthiocarbonyl) amino group, (N-3-propyl-5-methylpyrazolylthiocarbonyl) amino group, and (N-3-ethyl-5-propylpyrazolylthiocarbonyl) amino group.
The first functional group is preferably an isocyanato group blocked with a blocking agent.
 高分子化合物(A)は、例えば、上記式(1)で表される繰り返し単位の原料となる重合性モノマーと、第1の官能基を含有する重合性モノマーとを、光重合開始剤もしくは熱重合開始剤を用いて共重合させる方法により製造することが出来る。 The polymer compound (A) comprises, for example, a polymerizable monomer that is a raw material of the repeating unit represented by the above formula (1) and a polymerizable monomer containing the first functional group as a photopolymerization initiator or heat. It can manufacture by the method of copolymerizing using a polymerization initiator.
 重合性モノマーの重合は当業者が通常使用する方法を使用して行えばよい。重合性モノマーの重合方法としては、例えば、重合性モノマー及び重合開始剤を適当な溶媒に溶解し、得られる溶液中の溶存酸素を不活性ガスで置換し、次いで、一定時間加熱又は照射する方法が例示される。 Polymerization of the polymerizable monomer may be performed by a method commonly used by those skilled in the art. As a method for polymerizing a polymerizable monomer, for example, a method in which a polymerizable monomer and a polymerization initiator are dissolved in a suitable solvent, dissolved oxygen in the resulting solution is replaced with an inert gas, and then heated or irradiated for a certain time. Is exemplified.
 上記式(1)で表される繰り返し単位の原料となる重合性モノマーの例としては、N-(3’-メタクリロイルオキシプロピル)-3,4-ジメチルマレイミド、N-(3’-メタクリロイルオキシプロピル)-1-シクロヘキセン-1,2-ジカルボキシミドが挙げられる。 Examples of the polymerizable monomer that is a raw material for the repeating unit represented by the above formula (1) include N- (3′-methacryloyloxypropyl) -3,4-dimethylmaleimide, N- (3′-methacryloyloxypropyl). ) -1-cyclohexene-1,2-dicarboximide.
 第1の官能基を含有する重合性モノマーの例としては、ブロック化剤でブロックされたイソシアナト基又はブロック化剤でブロックされたイソチオシアナト基と不飽和結合とを有するモノマーが挙げられる。該ブロック化剤でブロックされたイソシアナト基又はブロック化剤でブロックされたイソチオシアナト基と不飽和結合とを有するモノマーは、イソシアナト基又はイソチオシアナト基と不飽和結合とを有する化合物と、ブロック化剤とを反応させることにより製造することが出来る。不飽和結合としては、二重結合が好ましい。 Examples of the polymerizable monomer containing the first functional group include a monomer having an isocyanato group blocked with a blocking agent or an isothiocyanate group blocked with a blocking agent and an unsaturated bond. A monomer having an isocyanato group blocked with the blocking agent or an isothiocyanate group blocked with a blocking agent and an unsaturated bond includes an isocyanate group or a compound having an isothiocyanato group and an unsaturated bond, and a blocking agent. It can be produced by reacting. As the unsaturated bond, a double bond is preferable.
 二重結合とイソシアナト基とを有する化合物の例としては、2-アクリロイルオキシエチルイソシアネート、2-メタクリロイルオキシエチルイソシアネート、2-(2’-メタクリロイルオキシエチル)オキシエチルイソシアネートが挙げられる。
二重結合とイソチオシアナト基とを有する化合物の例としては、2-アクリロイルオキシエチルイソチオシアネート、2-メタクリロイルオキシエチルイソチオシアネート、2-(2’-メタクリロイルオキシエチル)オキシエチルイソチオシアネートが挙げられる。
Examples of the compound having a double bond and an isocyanato group include 2-acryloyloxyethyl isocyanate, 2-methacryloyloxyethyl isocyanate, and 2- (2′-methacryloyloxyethyl) oxyethyl isocyanate.
Examples of the compound having a double bond and an isothiocyanato group include 2-acryloyloxyethyl isothiocyanate, 2-methacryloyloxyethyl isothiocyanate, and 2- (2′-methacryloyloxyethyl) oxyethyl isothiocyanate.
 重合性モノマーに含まれるブロック化剤としては、前記のブロック化剤を好適に用いることが出来る。ブロック化剤でブロックされたイソシアナト基又はブロック化剤でブロックされたイソチオシアナト基と不飽和結合とを有するモノマーの製造においては、必要に応じて有機溶媒、触媒等を添加することが出来る。 As the blocking agent contained in the polymerizable monomer, the above blocking agent can be suitably used. In the production of a monomer having an isocyanato group blocked with a blocking agent or an isothiocyanato group blocked with a blocking agent and an unsaturated bond, an organic solvent, a catalyst or the like can be added as necessary.
 前記ブロック化剤でブロックされたイソシアナト基と二重結合とを有するモノマーの例としては、2-〔O-[1’-メチルプロピリデンアミノ]カルボキシアミノ〕エチル-メタクリレート、2-〔N-[1’,3’-ジメチルピラゾリル]カルボニルアミノ〕エチル-メタクリレートが挙げられる。 Examples of the monomer having an isocyanate group blocked with the blocking agent and a double bond include 2- [O- [1′-methylpropylideneamino] carboxyamino] ethyl-methacrylate, 2- [N- [ 1 ', 3'-dimethylpyrazolyl] carbonylamino] ethyl-methacrylate.
 前記ブロック化剤でブロックされたイソチオシアナト基と二重結合とを有するモノマーの例としては、2-〔O-[1’-メチルプロピリデンアミノ]チオカルボキシアミノ〕エチル-メタクリレート、2-〔N-[1’,3’-ジメチルピラゾリル] チオカルボニルアミノ〕エチル-メタクリレートが挙げられる。 Examples of monomers having an isothiocyanate group and a double bond blocked with the blocking agent include 2- [O- [1′-methylpropylideneamino] thiocarboxyamino] ethyl-methacrylate, 2- [N— And [1 ′, 3′-dimethylpyrazolyl] thiocarbonylamino] ethyl-methacrylate.
 前記光重合開始剤としては、例えば、アセトフェノン、2,2-ジメトキシ-2-フェニルアセトフェノン、2,2-ジエトキシアセトフェノン、4-イソプロピル-2-ヒドロキシ-2-メチルプロピオフェノン、2-ヒドロキシ-2-メチルプロピオフェノン、4,4’-ビス(ジエチルアミノ)ベンゾフェノン、ベンゾフェノン、メチル(o-ベンゾイル)ベンゾエート、1-フェニル-1,2-プロパンジオン-2-(O-エトキシカルボニル)オキシム、1-フェニル-1,2-プロパンジオン-2-(o-ベンゾイル)オキシム、ベンゾイン、ベンゾインメチルエーテル、ベンゾインエチルエーテル、ベンゾインイソプロピルエーテル、ベンゾインイソブチルエーテル、ベンゾインオクチルエーテル、ベンジル、ベンジルジメチルケタール、ベンジルジエチルケタール、ジアセチル等のカルボニル化合物、メチルアントラキノン、クロロアントラキノン、クロロチオキサントン、2-メチルチオキサントン、2-イソプロピルチオキサントン等のアントラキノン誘導体又はチオキサントン誘導体、ジフェニルジスルフィド、ジチオカーバメート等の硫黄化合物が挙げられる。 Examples of the photopolymerization initiator include acetophenone, 2,2-dimethoxy-2-phenylacetophenone, 2,2-diethoxyacetophenone, 4-isopropyl-2-hydroxy-2-methylpropiophenone, 2-hydroxy- 2-methylpropiophenone, 4,4′-bis (diethylamino) benzophenone, benzophenone, methyl (o-benzoyl) benzoate, 1-phenyl-1,2-propanedione-2- (O-ethoxycarbonyl) oxime, -Phenyl-1,2-propanedione-2- (o-benzoyl) oxime, benzoin, benzoin methyl ether, benzoin ethyl ether, benzoin isopropyl ether, benzoin isobutyl ether, benzoin octyl ether, benzyl, benzyl dimethyl Examples include carbonyl compounds such as luketal, benzyl diethyl ketal and diacetyl, sulfur compounds such as anthraquinone derivatives such as methyl anthraquinone, chloroanthraquinone, chlorothioxanthone, 2-methylthioxanthone and 2-isopropylthioxanthone, thioxanthone derivatives, diphenyl disulfide and dithiocarbamate. .
 共重合を開始させるエネルギーとして光エネルギーを用いる場合は、重合性モノマーに照射する光の波長は、360nm以上、好ましくは360~450nmである。 When light energy is used as the energy for initiating copolymerization, the wavelength of light irradiated to the polymerizable monomer is 360 nm or more, preferably 360 to 450 nm.
 前記熱重合開始剤としては、ラジカル重合の開始剤となる化合物であればよく、例えば、2,2’-アゾビスイソブチロニトリル、2,2’-アゾビスイソバレロニトリル、2,2’-アゾビス(2,4-ジメチルバレロニトリル)、4,4’-アゾビス(4-シアノバレリックアシッド)、1、1’-アゾビス(シクロヘキサンカルボニトリル)、2,2’-アゾビス(2-メチルプロパン)、2,2’-アゾビス(2-メチルプロピオンアミジン)2塩酸塩等のアゾ系化合物、メチルエチルケトンパーオキシド、メチルイソブチルケトンパーオキシド、シクロヘキサノンパーオキシド、アセチルアセトンパーオキシド等のケトンパーオキシド類、イソブチルパーオキシド、ベンゾイルパーオキシド、2,4-ジクロロベンゾイルパーオキシド、o-メチルベンゾイルパーオキシド、ラウロイルパーオキシド、p-クロロベンゾイルパーオキシド等のジアシルパーオキシド類、2,4,4-トリメチルペンチル-2-ヒドロパーオキシド、ジイソプロピルベンゼンヒドロパーオキシド、クメンヒドロパーオキシド、tert-ブチルヒドロパーオキシド等のヒドロパーオキシド類、ジクミルパーオキシド、tert-ブチルクミルパーオキシド、ジ-tert-ブチルパーオキシド、トリス(tert-ブチルパーオキシ)トリアジン等のジアルキルパーオキシド類、1,1-ジ-tert-ブチルパーオキシシクロヘキサン、2,2-ジ(tert-ブチルパーオキシ)ブタン等のパーオキシケタール類、tert-ブチルパーオキシピバレート、tert-ブチルパーオキシ-2-エチルヘキサノエート、tert-ブチルパーオキシイソブチレート、ジ-tert-ブチルパーオキシヘキサヒドロテレフタレート、ジ-tert-ブチルパーオキシアゼレート、tert-ブチルパーオキシ-3,5,5-トリメチルヘキサノエート、tert-ブチルパーオキシアセテート、tert-ブチルパーオキシベンゾエート、ジ-tert-ブチルパーオキシトリメチルアジペート等のアルキルパーエステル類、ジイソプロピルパーオキシジカーボネート、ジ-sec-ブチルパーオキシジカーボネート、tert-ブチルパーオキシイソプロピルカーボネート等のパーオキシカーボネート類が挙げられる。 The thermal polymerization initiator may be any compound that serves as a radical polymerization initiator. For example, 2,2′-azobisisobutyronitrile, 2,2′-azobisisovaleronitrile, 2,2 ′ -Azobis (2,4-dimethylvaleronitrile), 4,4'-azobis (4-cyanovaleric acid), 1,1'-azobis (cyclohexanecarbonitrile), 2,2'-azobis (2-methylpropane) ), Azo compounds such as 2,2′-azobis (2-methylpropionamidine) dihydrochloride, ketone peroxides such as methyl ethyl ketone peroxide, methyl isobutyl ketone peroxide, cyclohexanone peroxide, acetylacetone peroxide, isobutyl peroxide Oxide, benzoyl peroxide, 2,4-dichlorobenzoyl paro Diacyl peroxides such as sid, o-methylbenzoyl peroxide, lauroyl peroxide, p-chlorobenzoyl peroxide, 2,4,4-trimethylpentyl-2-hydroperoxide, diisopropylbenzene hydroperoxide, cumene hydroperoxide Hydroperoxides such as oxide and tert-butyl hydroperoxide, dialkyl peroxides such as dicumyl peroxide, tert-butylcumyl peroxide, di-tert-butyl peroxide, and tris (tert-butylperoxy) triazine 1,1-di-tert-butylperoxycyclohexane, peroxyketals such as 2,2-di (tert-butylperoxy) butane, tert-butylperoxypivalate, tert-butylperoxy -2-Ethylhexanoate, tert-butylperoxyisobutyrate, di-tert-butylperoxyhexahydroterephthalate, di-tert-butylperoxyazelate, tert-butylperoxy-3,5,5- Alkyl peresters such as trimethylhexanoate, tert-butylperoxyacetate, tert-butylperoxybenzoate, di-tert-butylperoxytrimethyladipate, diisopropylperoxydicarbonate, di-sec-butylperoxydicarbonate And peroxycarbonates such as tert-butylperoxyisopropyl carbonate.
 本発明に用いられる高分子化合物(A)は、上記式(1)で表される繰り返し単位の原料となる重合性モノマー、第1の官能基を含有する重合性モノマー以外の重合性モノマーを重合時に添加して製造してもよい。 The polymer compound (A) used in the present invention polymerizes a polymerizable monomer other than a polymerizable monomer that is a raw material of the repeating unit represented by the above formula (1) and a polymerizable monomer containing the first functional group. Sometimes it may be added and manufactured.
 追加して使用される重合性モノマーとしては、例えば、アクリル酸エステル及びその誘導体、メタアクリル酸エステル及びその誘導体、スチレン及びその誘導体、酢酸ビニル及びその誘導体、メタアクリロニトリル及びその誘導体、アクリロニトリル及びその誘導体、有機カルボン酸のビニルエステル及びその誘導体、有機カルボン酸のアリルエステル及びその誘導体、フマル酸のジアルキルエステル及びその誘導体、マレイン酸のジアルキルエステル及びその誘導体、イタコン酸のジアルキルエステル及びその誘導体、有機カルボン酸のN-ビニルアミド誘導体、末端不飽和炭化水素及びその誘導体等、不飽和炭化水素基を含む有機ゲルマニウム誘導体等が挙げられる。 Additional polymerizable monomers used include, for example, acrylic acid esters and derivatives thereof, methacrylic acid esters and derivatives thereof, styrene and derivatives thereof, vinyl acetate and derivatives thereof, methacrylonitrile and derivatives thereof, acrylonitrile and derivatives thereof. Organic carboxylic acid vinyl esters and derivatives thereof, organic carboxylic acid allyl esters and derivatives thereof, fumaric acid dialkyl esters and derivatives thereof, maleic acid dialkyl esters and derivatives thereof, itaconic acid dialkyl esters and derivatives thereof, organic carboxylic acids Examples thereof include N-vinylamide derivatives of acids, terminal unsaturated hydrocarbons and derivatives thereof, and organic germanium derivatives containing unsaturated hydrocarbon groups.
 追加して使用される重合性モノマーの種類は、絶縁層に要求される特性に応じて適宜選択される。溶媒に対する優れた耐久性や有機薄膜トランジスタのヒステリシスを小さくする観点からは、スチレンやスチレン誘導体のように、これらの化合物を含む膜において、分子の密度が高く、硬い膜を形成するモノマーが選択される。また、ゲート電極や基板の表面等の絶縁層の隣接面に対する密着性の観点からは、メタアクリル酸エステル及びその誘導体、アクリル酸エステル及びその誘導体のように、高分子化合物(A)に可塑性を付与するモノマーが選択される。 The type of polymerizable monomer used additionally is appropriately selected according to the characteristics required for the insulating layer. From the viewpoint of excellent durability against solvents and reducing the hysteresis of organic thin film transistors, monomers that have high molecular density and form a hard film are selected in films containing these compounds, such as styrene and styrene derivatives. . In addition, from the viewpoint of adhesion to the adjacent surface of the insulating layer such as the gate electrode or the surface of the substrate, the polymer compound (A) is made plastic such as methacrylic acid esters and derivatives thereof, acrylic acid esters and derivatives thereof. The monomer to be imparted is selected.
 アクリル酸エステル類及びその誘導体としては、単官能のアクリレートや、使用量に制約は出てくるが多官能のアクリレートをも使用することができ、このような単官能のアクリレートや多官能のアクリレートとしては、例えば、アクリル酸メチル、アクリル酸エチル、アクリル酸-n-プロピル、アクリル酸イソプロピル、アクリル酸-n-ブチル、アクリル酸イソブチル、アクリル酸-sec-ブチル、アクリル酸ヘキシル、アクリル酸オクチル、アクリル酸-2-エチルヘキシル、アクリル酸デシル、アクリル酸イソボルニル、アクリル酸シクロヘキシル、アクリル酸フェニル、アクリル酸ベンジル、アクリル酸-2-ヒドロキシエチル、アクリル酸-2-ヒドロキシプロピル、アクリル酸-3-ヒドロキシプロピル、アクリル酸-2-ヒドロキシブチル、アクリル酸-2-ヒドロキシフェニルエチル、エチレングリコールジアクリレート、プロピレングリコールジアクリレート、1,4-ブタンジオールジアクリレート、ジエチレングリコールジアクリレート、トリエチレングリコールジアクリレート、トリメチロールプロパンジアクリレート、トリメチロールプロパントリアクリレート、ペンタエリスリトールペンタアクリレート、2,2,2-トリフルオロエチルアクリレート、2,2,3,3,3-ペンタフルオロプロピルアクリレート、2-(パーフルオロブチル)エチルアクリレート、3-パーフルオロブチル-2-ヒドロキシプロピルアクリレート、2-(パーフルオロヘキシル)エチルアクリレート、3-パーフルオロヘキシル-2-ヒドロキシプロピルアクリレート、2-(パーフルオロオクチル)エチルアクリレート、3-パーフルオロオクチル-2-ヒドロキシプロピルアクリレート、2-(パーフルオロデシル)エチルアクリレート、2-(パーフルオロ-3-メチルブチル)エチルアクリレート、3-(パーフルオロ-3-メチルブチル)-2-ヒドロキシプロピルアクリレート、2-(パーフルオロ-5-メチルヘキシル)エチルアクリレート、2-(パーフルオロ-3-メチルブチル)-2-ヒドロキシプロピルアクリレート、3-(パーフルオロ-5-メチルヘキシル)-2-ヒドロキシプロピルアクリレート、2-(パーフルオロ-7-メチルオクチル)エチルアクリレート、3-(パーフルオロ-7-メチルオクチル)-2-ヒドロキシプロピルアクリレート、1H,1H,3H-テトラフルオロプロピルアクリレート、1H,1H,5H-オクタフルオロペンチルアクリレート、1H,1H,7H-ドデカフルオロヘプチルアクリレート、1H,1H,9H-ヘキサデカフルオロノニルアクリレート、1H-1-(トリフルオロメチル)トリフルオロエチルアクリレート、1H,1H,3H-ヘキサフルオロブチルアクリレート、N,N-ジメチルアクリルアミド、N,N-ジエチルアクリルアミド、N-アクリロイルモルフォリンを挙げることができる。 As acrylic acid esters and derivatives thereof, monofunctional acrylates and polyfunctional acrylates can be used although the amount of use is limited. As such monofunctional acrylates and polyfunctional acrylates, For example, methyl acrylate, ethyl acrylate, acrylic acid-n-propyl, isopropyl acrylate, acrylic acid-n-butyl, isobutyl acrylate, acrylic acid-sec-butyl, hexyl acrylate, octyl acrylate, acrylic 2-ethylhexyl acid, decyl acrylate, isobornyl acrylate, cyclohexyl acrylate, phenyl acrylate, benzyl acrylate, 2-hydroxyethyl acrylate, 2-hydroxypropyl acrylate, 3-hydroxypropyl acrylate, Acrylic acid -Hydroxybutyl, 2-hydroxyphenylethyl acrylate, ethylene glycol diacrylate, propylene glycol diacrylate, 1,4-butanediol diacrylate, diethylene glycol diacrylate, triethylene glycol diacrylate, trimethylolpropane diacrylate, trimethylol Propane triacrylate, pentaerythritol pentaacrylate, 2,2,2-trifluoroethyl acrylate, 2,2,3,3,3-pentafluoropropyl acrylate, 2- (perfluorobutyl) ethyl acrylate, 3-perfluorobutyl -2-hydroxypropyl acrylate, 2- (perfluorohexyl) ethyl acrylate, 3-perfluorohexyl-2-hydroxypropyl Acrylate, 2- (perfluorooctyl) ethyl acrylate, 3-perfluorooctyl-2-hydroxypropyl acrylate, 2- (perfluorodecyl) ethyl acrylate, 2- (perfluoro-3-methylbutyl) ethyl acrylate, 3- ( Perfluoro-3-methylbutyl) -2-hydroxypropyl acrylate, 2- (perfluoro-5-methylhexyl) ethyl acrylate, 2- (perfluoro-3-methylbutyl) -2-hydroxypropyl acrylate, 3- (perfluoro -5-methylhexyl) -2-hydroxypropyl acrylate, 2- (perfluoro-7-methyloctyl) ethyl acrylate, 3- (perfluoro-7-methyloctyl) -2-hydroxypropyl acrylate, 1H, 1H, 3H-tetrafluoropropyl acrylate, 1H, 1H, 5H-octafluoropentyl acrylate, 1H, 1H, 7H-dodecafluoroheptyl acrylate, 1H, 1H, 9H-hexadecafluorononyl acrylate, 1H-1- (trifluoromethyl) Examples thereof include trifluoroethyl acrylate, 1H, 1H, 3H-hexafluorobutyl acrylate, N, N-dimethylacrylamide, N, N-diethylacrylamide, and N-acryloylmorpholine.
 メタアクリル酸エステル類及びその誘導体としては、単官能のメタアクリレートや、使用量に制約は出てくるが多官能のメタアクリレートをも使用することができ、このような単官能のメタアクリレートや多官能のメタアクリレートとしては、例えば、メタアクリル酸メチル、メタアクリル酸エチル、メタアクリル酸-n-プロピル、メタアクリル酸イソプロピル、メタアクリル酸-n-ブチル、メタアクリル酸イソブチル、メタアクリル酸-sec-ブチル、メタアクリル酸ヘキシル、メタアクリル酸オクチル、メタアクリル酸-2-エチルヘキシル、メタアクリル酸デシル、メタアクリル酸イソボルニル、メタアクリル酸シクロヘキシル、メタアクリル酸フェニル、メタアクリル酸ベンジル、メタアクリル酸-2-ヒドロキシエチル、メタアクリル酸-2-ヒドロキシプロピル、メタアクリル酸-3-ヒドロキシプロピル、メタアクリル酸-2-ヒドロキシブチル、メタアクリル酸-2-ヒドロキシフェニルエチル、エチレングリコールジメタアクリレート、プロピレングリコールジメタアクリレート、1,4-ブタンジオールジメタアクリレート、ジエチレングリコールジメタアクリレート、トリエチレングリコールジメタアクリレート、トリメチロールプロパンジメタアクリレート、トリメチロールプロパントリメタアクリレート、ペンタエリスリトールペンタメタアクリレート、2,2,2-トリフルオロエチルメタアクリレート、2,2,3,3,3-ペンタフルオロプロピルメタアクリレート、2-(パーフルオロブチル)エチルメタアクリレート、3-パーフルオロブチル-2-ヒドロキシプロピルメタアクリレート、2-(パーフルオロヘキシル)エチルメタアクリレート、3-パーフルオロヘキシル-2-ヒドロキシプロピルメタアクリレート、2-(パーフルオロオクチル)エチルメタアクリレート、3-パーフルオロオクチル-2-ヒドロキシプロピルメタアクリレート、2-(パーフルオロデシル)エチルメタアクリレート、2-(パーフルオロ-3-メチルブチル)エチルメタアクリレート、3-(パーフルオロ-3-メチルブチル)-2-ヒドロキシプロピルメタアクリレート、2-(パーフルオロ-5-メチルヘキシル)エチルメタアクリレート、2-(パーフルオロ-3-メチルブチル)-2-ヒドロキシプロピルメタアクリレート、3-(パーフルオロ-5-メチルヘキシル)-2-ヒドロキシプロピルメタアクリレート、2-(パーフルオロ-7-メチルオクチル)エチルメタアクリレート、3-(パーフルオロ-7-メチルオクチル)-2-ヒドロキシプロピルメタアクリレート、1H,1H,3H-テトラフルオロプロピルメタアクリレート、1H,1H,5H-オクタフルオロペンチルメタアクリレート、1H,1H,7H-ドデカフルオロヘプチルメタアクリレート、1H,1H,9H-ヘキサデカフルオロノニルメタアクリレート、1H-1-(トリフルオロメチル)トリフルオロエチルメタアクリレート、1H,1H,3H-ヘキサフルオロブチルメタアクリレート、N,N-ジメチルメタアクリルアミド、N,N-ジエチルメタアクリルアミド、N-アクリロイルモルフォリンを挙げることができる。 As the methacrylic acid esters and derivatives thereof, monofunctional methacrylates and polyfunctional methacrylates can be used although the amount of use is limited. Such monofunctional methacrylates and Examples of the functional methacrylate include methyl methacrylate, ethyl methacrylate, methacrylic acid-n-propyl, isopropyl methacrylate, methacrylic acid-n-butyl, isobutyl methacrylate, methacrylic acid-sec. -Butyl, hexyl methacrylate, octyl methacrylate, 2-ethylhexyl methacrylate, decyl methacrylate, isobornyl methacrylate, cyclohexyl methacrylate, phenyl methacrylate, benzyl methacrylate, methacrylate 2-hydroxyethyl, 2-hydroxypropyl taacrylate, 3-hydroxypropyl methacrylate, 2-hydroxybutyl methacrylate, 2-hydroxyphenyl methacrylate, ethylene glycol dimethacrylate, propylene glycol dimethacrylate, 1, 4-butanediol dimethacrylate, diethylene glycol dimethacrylate, triethylene glycol dimethacrylate, trimethylolpropane dimethacrylate, trimethylolpropane trimethacrylate, pentaerythritol pentamethacrylate, 2,2,2-trifluoroethyl methacrylate Acrylate, 2,2,3,3,3-pentafluoropropyl methacrylate, 2- (perfluorobutyl) ethyl methacrylate, 3-perful Robutyl-2-hydroxypropyl methacrylate, 2- (perfluorohexyl) ethyl methacrylate, 3-perfluorohexyl-2-hydroxypropyl methacrylate, 2- (perfluorooctyl) ethyl methacrylate, 3-perfluorooctyl- 2-hydroxypropyl methacrylate, 2- (perfluorodecyl) ethyl methacrylate, 2- (perfluoro-3-methylbutyl) ethyl methacrylate, 3- (perfluoro-3-methylbutyl) -2-hydroxypropyl methacrylate, 2- (perfluoro-5-methylhexyl) ethyl methacrylate, 2- (perfluoro-3-methylbutyl) -2-hydroxypropyl methacrylate, 3- (perfluoro-5-methylhexyl) -2 -Hydroxypropyl methacrylate, 2- (perfluoro-7-methyloctyl) ethyl methacrylate, 3- (perfluoro-7-methyloctyl) -2-hydroxypropyl methacrylate, 1H, 1H, 3H-tetrafluoropropyl methacrylate Acrylate, 1H, 1H, 5H-octafluoropentyl methacrylate, 1H, 1H, 7H-dodecafluoroheptyl methacrylate, 1H, 1H, 9H-hexadecafluorononyl methacrylate, 1H-1- (trifluoromethyl) trifluoro Examples thereof include ethyl methacrylate, 1H, 1H, 3H-hexafluorobutyl methacrylate, N, N-dimethylmethacrylamide, N, N-diethylmethacrylamide, and N-acryloylmorpholine.
 スチレン及びその誘導体の例としては、スチレン、2,4-ジメチル-α-メチルスチレン、o-メチルスチレン、m-メチルスチレン、p-メチルスチレン、2,4-ジメチルスチレン、2,5-ジメチルスチレン、2,6-ジメチルスチレン、3,4-ジメチルスチレン、3,5-ジメチルスチレン、2,4,6-トリメチルスチレン、2,4,5-トリメチルスチレン、ペンタメチルスチレン、o-エチルスチレン、m-エチルスチレン、p-エチルスチレン、o-クロロスチレン、m-クロロスチレン、p-クロロスチレン、o-ブロモスチレン、m-ブロモスチレン、p-ブロモスチレン、o-メトキシスチレン、m-メトキシスチレン、p-メトキシスチレン、o-ヒドロキシスチレン、m-ヒドロキシスチレン、p-ヒドロキシスチレン、2-ビニルビフェニル、3-ビニルビフェニル、4-ビニルビフェニル、1-ビニルナフタレン、2-ビニルナフタレン、4-ビニル-p-ターフェニル、1-ビニルアントラセン、α-メチルスチレン、o-イソプロペニルトルエン、m-イソプロペニルトルエン、p-イソプロペニルトルエン、2,4-ジメチル-α-メチルスチレン、2,3-ジメチル-α-メチルスチレン、3,5-ジメチル-α-メチルスチレン、p-イソプロピル-α-メチルスチレン、α-エチルスチレン、α-クロロスチレン、ジビニルベンゼン、ジビニルビフェニル、ジイソプロピルベンゼン、4-アミノスチレンが挙げられる。 Examples of styrene and its derivatives include styrene, 2,4-dimethyl-α-methylstyrene, o-methylstyrene, m-methylstyrene, p-methylstyrene, 2,4-dimethylstyrene, 2,5-dimethylstyrene. 2,6-dimethylstyrene, 3,4-dimethylstyrene, 3,5-dimethylstyrene, 2,4,6-trimethylstyrene, 2,4,5-trimethylstyrene, pentamethylstyrene, o-ethylstyrene, m -Ethylstyrene, p-ethylstyrene, o-chlorostyrene, m-chlorostyrene, p-chlorostyrene, o-bromostyrene, m-bromostyrene, p-bromostyrene, o-methoxystyrene, m-methoxystyrene, p -Methoxystyrene, o-hydroxystyrene, m-hydroxystyrene, p-hydro Cystyrene, 2-vinylbiphenyl, 3-vinylbiphenyl, 4-vinylbiphenyl, 1-vinylnaphthalene, 2-vinylnaphthalene, 4-vinyl-p-terphenyl, 1-vinylanthracene, α-methylstyrene, o-isopropenyl Toluene, m-isopropenyltoluene, p-isopropenyltoluene, 2,4-dimethyl-α-methylstyrene, 2,3-dimethyl-α-methylstyrene, 3,5-dimethyl-α-methylstyrene, p-isopropyl -Α-methylstyrene, α-ethylstyrene, α-chlorostyrene, divinylbenzene, divinylbiphenyl, diisopropylbenzene, 4-aminostyrene.
 有機カルボン酸のビニルエステル及びその誘導体の例としては、酢酸ビニル、プロピオン酸ビニル、酪酸ビニル、安息香酸ビニル、アジピン酸ジビニルが挙げられる。 Examples of organic carboxylic acid vinyl esters and derivatives thereof include vinyl acetate, vinyl propionate, vinyl butyrate, vinyl benzoate, and divinyl adipate.
 有機カルボン酸のアリルエステル及びその誘導体の例としては、酢酸アリル、安息香酸アリル、アジピン酸ジアリル、テレフタル酸ジアリル、イソフタル酸ジアリル、フタル酸ジアリルが挙げられる。 Examples of allyl esters of organic carboxylic acids and derivatives thereof include allyl acetate, allyl benzoate, diallyl adipate, diallyl terephthalate, diallyl isophthalate, and diallyl phthalate.
 フマル酸のジアルキルエステル及びその誘導体の例としては、フマル酸ジメチル、フマル酸ジエチル、フマル酸ジイソプロピル、フマル酸ジ-sec-ブチル、フマル酸ジイソブチル、フマル酸ジ-n-ブチル、フマル酸ジ-2-エチルヘキシル、フマル酸ジベンジルが挙げられる。 Examples of dialkyl esters of fumaric acid and derivatives thereof include dimethyl fumarate, diethyl fumarate, diisopropyl fumarate, di-sec-butyl fumarate, diisobutyl fumarate, di-n-butyl fumarate, di-2 fumarate -Ethylhexyl, dibenzyl fumarate.
 マレイン酸のジアルキルエステル及びその誘導体の例としては、マレイン酸ジメチル、マレイン酸ジエチル、マレイン酸ジイソプロピル、マレイン酸ジ-sec-ブチル、マレイン酸ジイソブチル、マレイン酸ジ-n-ブチル、マレイン酸ジ-2-エチルヘキシル、マレイン酸ジベンジルが挙げられる。 Examples of dialkyl esters of maleic acid and derivatives thereof include dimethyl maleate, diethyl maleate, diisopropyl maleate, di-sec-butyl maleate, diisobutyl maleate, di-n-butyl maleate, di-2 maleate -Ethylhexyl, dibenzyl maleate.
 イタコン酸のジアルキルエステル及びその誘導体の例としては、イタコン酸ジメチル、イタコン酸ジエチル、イタコン酸ジイソプロピル、イタコン酸ジ-sec-ブチル、イタコン酸ジイソブチル、イタコン酸ジ-n-ブチル、イタコン酸ジ-2-エチルヘキシル、イタコン酸ジベンジルが挙げられる。 Examples of dialkyl esters of itaconic acid and derivatives thereof include dimethyl itaconate, diethyl itaconate, diisopropyl itaconate, di-sec-butyl itaconate, diisobutyl itaconate, di-n-butyl itaconate, di-2 itaconate -Ethylhexyl, dibenzyl itaconate.
 有機カルボン酸のN-ビニルアミド誘導体の例としては、N-メチル-N-ビニルアセトアミドが挙げられる。 Examples of N-vinylamide derivatives of organic carboxylic acids include N-methyl-N-vinylacetamide.
 末端不飽和炭化水素及びその誘導体の例としては、1-ブテン、1-ペンテン、1-ヘキセン、1-オクテン、ビニルシクロヘキサン、塩化ビニル、アリルアルコールが挙げられる。 Examples of terminal unsaturated hydrocarbons and derivatives thereof include 1-butene, 1-pentene, 1-hexene, 1-octene, vinylcyclohexane, vinyl chloride, and allyl alcohol.
 不飽和炭化水素基を含む有機ゲルマニウム誘導体の例としては、アリルトリメチルゲルマニウム、アリルトリエチルゲルマニウム、アリルトリブチルゲルマニウム、トリメチルビニルゲルマニウム、トリエチルビニルゲルマニウムが挙げられる。 Examples of the organic germanium derivative containing an unsaturated hydrocarbon group include allyltrimethylgermanium, allyltriethylgermanium, allyltributylgermanium, trimethylvinylgermanium, and triethylvinylgermanium.
 これらのうちでは、アクリル酸アルキルエステル、メタアクリル酸アルキルエステル、スチレン、アクリロニトリル、メタアクリロニトリル、アリルトリメチルゲルマニウムが好ましい。 Among these, acrylic acid alkyl ester, methacrylic acid alkyl ester, styrene, acrylonitrile, methacrylonitrile, and allyltrimethylgermanium are preferable.
 式(1)で表される繰り返し単位の原料となる重合性モノマーの仕込みモル比は、重合に関与する全てのモノマー中、5モル%以上50モル%以下であり、好ましくは10モル%以上45モル%以下、より好ましくは20モル%以上40モル%以下である。上記モノマーの仕込みモル比をこの範囲に調節することにより、絶縁層の内部に架橋構造が十分形成され、極性基の含有量が低いレベルに保たれ、絶縁層の分極が抑制される。 The charged molar ratio of the polymerizable monomer that is a raw material of the repeating unit represented by the formula (1) is 5 mol% or more and 50 mol% or less, preferably 10 mol% or more and 45 mol% in all monomers involved in the polymerization. The mol% or less, more preferably 20 mol% or more and 40 mol% or less. By adjusting the charged molar ratio of the monomer within this range, a sufficient crosslinked structure is formed inside the insulating layer, the content of polar groups is kept at a low level, and polarization of the insulating layer is suppressed.
 第一の官能基を含有する重合性モノマーの仕込みモル比は、重合に関与する全てのモノマー中、5モル%以上50モル%以下であり、好ましくは10モル%以上40モル%以下、より好ましくは15モル%以上30モル%以下である。上記モノマーの仕込みモル比をこの範囲に調節することにより、絶縁層の内部に架橋構造が十分形成され、極性基の含有量が低いレベルに保たれ、絶縁層の分極が抑制される。 The charged molar ratio of the polymerizable monomer containing the first functional group is 5% by mole or more and 50% by mole or less, preferably 10% by mole or more and 40% by mole or less, more preferably among all the monomers involved in the polymerization. Is 15 mol% or more and 30 mol% or less. By adjusting the charged molar ratio of the monomer within this range, a sufficient crosslinked structure is formed inside the insulating layer, the content of polar groups is kept at a low level, and polarization of the insulating layer is suppressed.
 高分子化合物(A)は、ポリスチレン換算の重量平均分子量が3000~1000000が好ましく、5000~500000がより好ましく、直鎖状、分岐状、環状のいずれでもよい。 The polymer compound (A) has a polystyrene-equivalent weight average molecular weight of preferably 3,000 to 1,000,000, more preferably 5,000 to 500,000, and may be linear, branched or cyclic.
 高分子化合物(A)としては、例えば、ポリ(スチレン-コ-[N-(3-メタクリロイルオキシプロピル-3’,4’-ジメチルマレイミド)]-コ-[2-〔O-(1’-メチルプロピリデンアミノ)カルボキシアミノ〕エチル-メタクリレート])、ポリ(スチレン-コ-[N-(3-メタクリロイルオキシプロピル-3’,4’-ジメチルマレイミド)]-コ-[2-〔1’-(3’,5’-ジメチルピラゾリル)カルボニルアミノ〕エチル-メタクリレート])、ポリ(スチレン-コ-[N-(3-メタクリロイルオキシプロピル-3’,4’-ジメチルマレイミド)]-コ-アクリロニトリル-コ-[2-〔O-(1’-メチルプロピリデンアミノ)カルボキシアミノ〕エチル-メタクリレート])、ポリ(スチレン-コ-[N-(3-メタクリロイルオキシプロピル-3’,4’-ジメチルマレイミド)]-コ-アクリロニトリル-コ-[2-〔1’-(3’,5’-ジメチルピラゾリル)カルボニルアミノ〕エチル-メタクリレート])、ポリ(スチレン-コ-[N-(3-メタクリロイルオキシプロピル-3’,4’-ジメチルマレイミド)]-コ-アクリロニトリル-コ-[2-〔O-(1’-メチルプロピリデンアミノ)カルボキシアミノ〕エチル-メタクリレート]-コ-アリルトリメチルゲルマニウム)、ポリ(スチレン-コ-[N-(3-メタクリロイルオキシプロピル-1’-シクロヘキセン-1’、2’-ジカルボキシミド)]-コ-アクリロニトリル-コ-[2-〔1’-(3’,5’-ジメチルピラゾリル)カルボニルアミノ〕エチル-メタクリレート]-コ-アリルトリメチルゲルマニウム)、ポリ([N-(3-メタクリロイルオキシプロピル-1’-シクロヘキセン-1’、2’-ジカルボキシミド)]-コ-[2-〔O-(1’-メチルプロピリデンアミノ)カルボキシアミノ〕エチル-メタクリレート])、ポリ([N-(3-メタクリロイルオキシプロピル-1’-シクロヘキセン-1’、2’-ジカルボキシミド)]-コ-[2-〔1’-(3’,5’-ジメチルピラゾリル)カルボニルアミノ〕エチル-メタクリレート])、ポリ(スチレン-コ-[N-(3-メタクリロイルオキシプロピル-1’-シクロヘキセン-1’、2’-ジカルボキシミド)]-コ-[2-〔O-(1’-メチルプロピリデンアミノ)カルボキシアミノ〕エチル-メタクリレート])、ポリ(スチレン-コ-[N-(3-メタクリロイルオキシプロピル-1’-シクロヘキセン-1’、2’-ジカルボキシミド)]-コ-[2-〔1’-(3’,5’-ジメチルピラゾリル)カルボニルアミノ〕エチル-メタクリレート])等が挙げられる。 Examples of the polymer compound (A) include poly (styrene-co- [N- (3-methacryloyloxypropyl-3 ′, 4′-dimethylmaleimide)]-co- [2- [O- (1′- Methylpropylideneamino) carboxyamino] ethyl-methacrylate]), poly (styrene-co- [N- (3-methacryloyloxypropyl-3 ', 4'-dimethylmaleimide)]-co- [2- [1'- (3 ', 5'-dimethylpyrazolyl) carbonylamino] ethyl-methacrylate]), poly (styrene-co- [N- (3-methacryloyloxypropyl-3', 4'-dimethylmaleimide)]-co-acrylonitrile- Co- [2- [O- (1'-methylpropylideneamino) carboxyamino] ethyl-methacrylate]), poly (styrene-co- [N- (3-methacrylic) Royloxypropyl-3 ', 4'-dimethylmaleimide)]-co-acrylonitrile-co- [2- [1'-(3 ', 5'-dimethylpyrazolyl) carbonylamino] ethyl-methacrylate]), poly (styrene -Co- [N- (3-methacryloyloxypropyl-3 ', 4'-dimethylmaleimide)]-co-acrylonitrile-co- [2- [O- (1'-methylpropylideneamino) carboxyamino] ethyl- Methacrylate] -co-allyltrimethylgermanium), poly (styrene-co- [N- (3-methacryloyloxypropyl-1′-cyclohexene-1 ′, 2′-dicarboximide)]-co-acrylonitrile-co- [ 2- [1 '-(3', 5'-dimethylpyrazolyl) carbonylamino] ethyl-methacrylate] -co-allyl trimer Lugermanium), poly ([N- (3-methacryloyloxypropyl-1′-cyclohexene-1 ′, 2′-dicarboximide)]-co- [2- [O- (1′-methylpropylideneamino) Carboxyamino] ethyl-methacrylate]), poly ([N- (3-methacryloyloxypropyl-1′-cyclohexene-1 ′, 2′-dicarboximide)]-co- [2- [1 ′-(3 ′ , 5′-dimethylpyrazolyl) carbonylamino] ethyl-methacrylate]), poly (styrene-co- [N- (3-methacryloyloxypropyl-1′-cyclohexene-1 ′, 2′-dicarboximide)]-co -[2- [O- (1′-methylpropylideneamino) carboxyamino] ethyl-methacrylate]), poly (styrene-co- [N- (3-methacryloylio) Cypropyl-1′-cyclohexene-1 ′, 2′-dicarboximide)]-co- [2- [1 ′-(3 ′, 5′-dimethylpyrazolyl) carbonylamino] ethyl-methacrylate]) and the like .
<高分子化合物(B)>
 本発明の有機薄膜トランジスタ絶縁層材料に含まれる高分子化合物の好ましい他の態様は、光二量化反応基を複数個有し、フッ素原子を有し、上記第1の官能基を複数個有する高分子化合物である。該高分子化合物の中でも、式(1)で表される繰り返し単位と、式(2)で表される繰り返し単位と、第1の官能基を含有する繰り返し単位とを有する高分子化合物である。このような高分子化合物を高分子化合物(B)と記す。
<Polymer compound (B)>
Another preferable aspect of the polymer compound contained in the organic thin film transistor insulating layer material of the present invention is a polymer compound having a plurality of photodimerization reactive groups, a fluorine atom, and a plurality of the first functional groups. It is. Among the polymer compounds, a polymer compound having a repeating unit represented by Formula (1), a repeating unit represented by Formula (2), and a repeating unit containing a first functional group. Such a polymer compound is referred to as a polymer compound (B).
 有機薄膜トランジスタ絶縁層材料にフッ素が導入されていることにより、該材料から形成される絶縁層は極性が低く、絶縁層の分極が抑制される。また、絶縁層の内部に架橋構造が形成されると、分子構造の移動が抑制され、絶縁層の分極が抑制される。絶縁層の分極が抑制されると、例えばゲート絶縁層として用いた場合に有機薄膜トランジスタのヒステリシスが低下して、動作精度が向上する。 When fluorine is introduced into the organic thin film transistor insulating layer material, the insulating layer formed from the material has low polarity, and polarization of the insulating layer is suppressed. In addition, when a cross-linked structure is formed inside the insulating layer, the movement of the molecular structure is suppressed, and the polarization of the insulating layer is suppressed. When the polarization of the insulating layer is suppressed, for example, when used as a gate insulating layer, the hysteresis of the organic thin film transistor is lowered and the operation accuracy is improved.
 フッ素原子は高分子化合物の主鎖の水素原子を置換するのではなく、側鎖又は側基(ペンダント基)の水素原子を置換することが好ましい。フッ素原子が側鎖又は側基に置換していると有機半導体のような他の有機材料に対する親和性が低下せず、該有機材料を含む層の形成において、有機材料が絶縁層の露出面に接し、層を形成し易くなる。 It is preferable that the fluorine atom does not replace the hydrogen atom of the main chain of the polymer compound, but replaces the hydrogen atom of the side chain or side group (pendant group). When the fluorine atom is substituted with a side chain or a side group, the affinity for other organic materials such as an organic semiconductor is not lowered, and in the formation of a layer containing the organic material, the organic material is exposed to the exposed surface of the insulating layer. It becomes easy to form a layer in contact.
 例えば、フッ素原子を含む基を有する繰り返し単位と、光二量化反応基を有する繰り返し単位と、上記第1の官能基を有する繰り返し単位とを有する高分子化合物は、高分子化合物(B)に該当する。 For example, a polymer compound having a repeating unit having a group containing a fluorine atom, a repeating unit having a photodimerization reactive group, and a repeating unit having the first functional group corresponds to the polymer compound (B). .
 フッ素原子を含む基の好ましい例は、水素原子がフッ素で置換されたアリール基、水素原子がフッ素で置換されたアルキルアリール基、特に水素原子がフッ素で置換されたフェニル基、水素原子がフッ素で置換されたアルキルフェニル基である。 Preferred examples of the group containing a fluorine atom include an aryl group in which a hydrogen atom is substituted with fluorine, an alkylaryl group in which a hydrogen atom is substituted with fluorine, particularly a phenyl group in which a hydrogen atom is substituted with fluorine, and a hydrogen atom in fluorine. A substituted alkylphenyl group;
 光二量化反応基の好ましい例は、前述と同じ基が挙げられる。 Preferred examples of the photodimerization reactive group include the same groups as described above.
 フッ素原子を含む基を有する繰り返し単位は、上記式(2)で表される繰り返し単位であることが好ましい。 The repeating unit having a group containing a fluorine atom is preferably a repeating unit represented by the above formula (2).
 式(2)中、Rは、水素原子又はメチル基を表す。ある一形態では、Rは水素原子である。 In formula (2), R 1 represents a hydrogen atom or a methyl group. In one certain form, R < 1 > is a hydrogen atom.
 式(2)中、Rfは、フッ素原子又はフッ素原子を有する炭素数1~20の一価の有機基を表す。ある一形態では、Rfはフッ素原子である。
 bは、1~5の整数を表す。ある一形態では、bは5である。
In the formula (2), Rf represents a fluorine atom or a monovalent organic group having 1 to 20 carbon atoms having a fluorine atom. In one certain form, Rf is a fluorine atom.
b represents an integer of 1 to 5. In one certain form, b is 5.
 Rfがフッ素原子を有する炭素数1~20の有機基である場合、フッ素原子を有する炭素数1~20の一価の有機基としは、トリフルオロメチル基、2,2,2-トリフルオロエチル基、2,2,3,3,3-ペンタフルオロプロピル基、2-(パーフルオロブチル)エチル基、ペンタフルオロフェニル基、トリフルオロメチルフェニル基等が挙げられる。 When Rf is an organic group having 1 to 20 carbon atoms having a fluorine atom, the monovalent organic group having 1 to 20 carbon atoms having a fluorine atom may be a trifluoromethyl group or 2,2,2-trifluoroethyl. Group, 2,2,3,3,3-pentafluoropropyl group, 2- (perfluorobutyl) ethyl group, pentafluorophenyl group, trifluoromethylphenyl group and the like.
 式(2)中、Rは、水素原子又は炭素数1~20の一価の有機基を表す。 In the formula (2), R represents a hydrogen atom or a monovalent organic group having 1 to 20 carbon atoms.
 Rが炭素数1~20の一価の有機基である場合、該一価の有機基はフッ素原子を有さない。Rで表される炭素数1~20の一価の有機基としては、Rで表される炭素数1~20の一価の有機基の具体例のうちフッ素原子を有さない基が挙げられる。 When R is a monovalent organic group having 1 to 20 carbon atoms, the monovalent organic group does not have a fluorine atom. Examples of the monovalent organic group having 1 to 20 carbon atoms represented by R include groups having no fluorine atom among the specific examples of the monovalent organic group having 1 to 20 carbon atoms represented by R 3. It is done.
 式(2)中、Raaは、主鎖と側鎖とを連結し、フッ素原子を有していてもよい連結部分を表す。連結部分は、本発明の有機薄膜トランジスタ絶縁層材料を架橋させる環境条件の下で反応性を示さない構造を有する二価の基であればよい。連結部分の具体例には、炭素数1~20の二価の有機基からなる結合、エーテル結合(-O-)、ケトン結合(-CO-)、エステル結合(-COO-、-OCO-)、アミド結合(-NHCO-、-CONH-)、ウレタン結合(-NHCOO-、-OCONH-)及びこれらの結合が組み合わされた結合等が挙げられる。uは、0又は1の整数を表す。ある一形態では、aは1である。 In formula (2), R aa represents a linking moiety that links the main chain and the side chain and may have a fluorine atom. The connecting portion may be a divalent group having a structure that does not exhibit reactivity under environmental conditions for crosslinking the organic thin film transistor insulating layer material of the present invention. Specific examples of the linking moiety include a bond composed of a divalent organic group having 1 to 20 carbon atoms, an ether bond (—O—), a ketone bond (—CO—), an ester bond (—COO—, —OCO—). Amide bond (—NHCO—, —CONH—), urethane bond (—NHCOO—, —OCONH—), and a combination of these bonds. u represents an integer of 0 or 1. In one certain form, a is 1.
 前記炭素数1~20の二価の有機基としては、前記のRbbで表される炭素数1~20の二価の有機基の具体例と同じ基が挙げられる。 Examples of the divalent organic group having 1 to 20 carbon atoms include the same groups as the specific examples of the divalent organic group having 1 to 20 carbon atoms represented by R bb .
 高分子化合物(B)は、例えば、上記式(1)で表される繰り返し単位の原料となる重合性モノマーと、上記式(2)で表される繰り返し単位の原料となる重合性モノマーと、第1の官能基を含有する重合性モノマーとを、光重合開始剤もしくは熱重合開始剤を用いて共重合させる方法により製造することが出来る。 The polymer compound (B) includes, for example, a polymerizable monomer that is a raw material of the repeating unit represented by the above formula (1), a polymerizable monomer that is a raw material of the repeating unit represented by the above formula (2), It can be produced by a method in which a polymerizable monomer containing a first functional group is copolymerized using a photopolymerization initiator or a thermal polymerization initiator.
 上記式(2)で表される繰り返し単位の原料となる重合性モノマーの例としては、2-トリフルオロメチルスチレン、3-トリフルオロメチルスチレン、4-トリフルオロメチルスチレン、2,3,4,5,6-ペンタフルオロスチレン、4-フルオロスチレンが挙げられる。 Examples of the polymerizable monomer that is a raw material of the repeating unit represented by the above formula (2) include 2-trifluoromethylstyrene, 3-trifluoromethylstyrene, 4-trifluoromethylstyrene, 2,3,4, Examples include 5,6-pentafluorostyrene and 4-fluorostyrene.
 本発明に用いることができる高分子化合物(B)は、上記式(1)で表される繰り返し単位の原料となる重合性モノマー、上記式(2)で表される繰り返し単位の原料となる重合性モノマー、第1の官能基を含有する重合性モノマー以外の重合性モノマーを重合時に添加して製造してもよい。 The polymer compound (B) that can be used in the present invention is a polymerizable monomer that is a raw material of the repeating unit represented by the above formula (1), and a polymerization that is a raw material of the repeating unit represented by the above formula (2). A polymerizable monomer other than the polymerizable monomer and the polymerizable monomer containing the first functional group may be added during polymerization.
 上記式(2)で表される繰り返し単位の原料となる重合性モノマーの使用量は、高分子化合物(B)に導入されるフッ素原子の量が適量になるように調節される。 The amount of the polymerizable monomer used as the raw material of the repeating unit represented by the above formula (2) is adjusted so that the amount of fluorine atoms introduced into the polymer compound (B) becomes an appropriate amount.
 高分子化合物(B)に導入されるフッ素原子の量は、高分子化合物(B)の質量に対して、好ましくは1~80質量%、より好ましくは5~70質量%、さらに好ましくは10~60質量%である。フッ素原紙の量が1質量%未満であると電界効果型有機薄膜トランジスタのヒステリシスを低下させる効果が不十分となることがあり、80質量%を超えると有機半導体材料との親和性が悪化して活性層をその上に積層することが困難になることがある。 The amount of fluorine atoms introduced into the polymer compound (B) is preferably 1 to 80% by mass, more preferably 5 to 70% by mass, and further preferably 10 to 10% by mass with respect to the mass of the polymer compound (B). 60% by mass. When the amount of the fluorine base paper is less than 1% by mass, the effect of reducing the hysteresis of the field effect organic thin film transistor may be insufficient. When the amount exceeds 80% by mass, the affinity with the organic semiconductor material is deteriorated and activated. It may be difficult to stack a layer thereon.
 高分子化合物(B)を用いた有機薄膜トランジスタの閾値電圧の絶対値を小さくする観点からは、高分子化合物(B)が有する繰り返し単位の数を100とした場合、高分子化合物(B)が有する式(2)で表される繰り返し単位の量は、30~80が好ましい。 From the viewpoint of reducing the absolute value of the threshold voltage of the organic thin film transistor using the polymer compound (B), the polymer compound (B) has the number of repeating units that the polymer compound (B) has 100. The amount of the repeating unit represented by the formula (2) is preferably 30 to 80.
 高分子化合物(B)は、ポリスチレン換算の重量平均分子量が3000~1000000が好ましく、5000~500000がより好ましく、直鎖状、分岐状、環状のいずれでもよい。 The polymer compound (B) has a polystyrene-equivalent weight average molecular weight of preferably 3,000 to 1,000,000, more preferably 5,000 to 500,000, and may be linear, branched or cyclic.
 高分子化合物(B)としては、例えば、ポリ(スチレン-コ-[N-(3-メタクリロイルオキシプロピル-3’,4’-ジメチルマレイミド)]-コ-ペンタフルオロスチレン-コ-[2-〔O-(1’-メチルプロピリデンアミノ)カルボキシアミノ〕エチル-メタクリレート])、ポリ(スチレン-コ-[N-(3-メタクリロイルオキシプロピル-3’,4’-ジメチルマレイミド)]-コ-ペンタフルオロスチレン-コ-[2-〔1’-(3’,5’-ジメチルピラゾリル)カルボニルアミノ〕エチル-メタクリレート])、ポリ(スチレン-コ-[N-(3-メタクリロイルオキシプロピル-3’,4’-ジメチルマレイミド)]-コ-ペンタフルオロスチレン-コ-アクリロニトリル-コ-[2-〔O-(1’-メチルプロピリデンアミノ)カルボキシアミノ〕エチル-メタクリレート])、ポリ(スチレン-コ-[N-(3-メタクリロイルオキシプロピル-3’,4’-ジメチルマレイミド)]-コ-ペンタフルオロスチレン-コ-アクリロニトリル-コ-[2-〔1’-(3’,5’-ジメチルピラゾリル)カルボニルアミノ〕エチル-メタクリレート])、ポリ(スチレン-コ-[N-(3-メタクリロイルオキシプロピル-3’,4’-ジメチルマレイミド)]-コ-ペンタフルオロスチレン-コ-アクリロニトリル-コ-[2-〔O-(1’-メチルプロピリデンアミノ)カルボキシアミノ〕エチル-メタクリレート]-コ-アリルトリメチルゲルマニウム)、
ポリ(スチレン-コ-[N-(3-メタクリロイルオキシプロピル-1’-シクロヘキセン-1’、2’-ジカルボキシミド)]-コ-ペンタフルオロスチレン-コ-アクリロニトリル-コ-[2-〔1’-(3’,5’-ジメチルピラゾリル)カルボニルアミノ〕エチル-メタクリレート]-コ-アリルトリメチルゲルマニウム)、ポリ([N-(3-メタクリロイルオキシプロピル-1’-シクロヘキセン-1’、2’-ジカルボキシミド)]-コ-ペンタフルオロスチレン-コ-[2-〔O-(1’-メチルプロピリデンアミノ)カルボキシアミノ〕エチル-メタクリレート])、ポリ([N-(3-メタクリロイルオキシプロピル-1’-シクロヘキセン-1’、2’-ジカルボキシミド)]-コ-ペンタフルオロスチレン-コ-[2-〔1’-(3’,5’-ジメチルピラゾリル)カルボニルアミノ〕エチル-メタクリレート])、ポリ(スチレン-コ-(4-トリフルオロメチルスチレン)-コ-[N-(3-メタクリロイルオキシプロピル-1’-シクロヘキセン-1’、2’-ジカルボキシミド)]-コ-[2-〔O-(1’-メチルプロピリデンアミノ)カルボキシアミノ〕エチル-メタクリレート])、ポリ(スチレン-コ-(4-トリフルオロメチルスチレン)-コ-[N-(3-メタクリロイルオキシプロピル-1’-シクロヘキセン-1’、2’-ジカルボキシミド)]-コ-[2-〔1’-(3’,5’-ジメチルピラゾリル)カルボニルアミノ〕エチル-メタクリレート])等が挙げられる。
Examples of the polymer compound (B) include poly (styrene-co- [N- (3-methacryloyloxypropyl-3 ′, 4′-dimethylmaleimide)]-co-pentafluorostyrene-co- [2- [ O- (1′-methylpropylideneamino) carboxyamino] ethyl-methacrylate]), poly (styrene-co- [N- (3-methacryloyloxypropyl-3 ′, 4′-dimethylmaleimide)]-co-penta Fluorostyrene-co- [2- [1 ′-(3 ′, 5′-dimethylpyrazolyl) carbonylamino] ethyl-methacrylate]), poly (styrene-co- [N- (3-methacryloyloxypropyl-3 ′, 4'-dimethylmaleimide)]-co-pentafluorostyrene-co-acrylonitrile-co- [2- [O- (1'-methylpropylideneamino) carboxyamino ] -Ethyl-methacrylate]), poly (styrene-co- [N- (3-methacryloyloxypropyl-3 ', 4'-dimethylmaleimide)]-co-pentafluorostyrene-co-acrylonitrile-co- [2- [ 1 ′-(3 ′, 5′-dimethylpyrazolyl) carbonylamino] ethyl-methacrylate]), poly (styrene-co- [N- (3-methacryloyloxypropyl-3 ′, 4′-dimethylmaleimide)]-co -Pentafluorostyrene-co-acrylonitrile-co- [2- [O- (1'-methylpropylideneamino) carboxyamino] ethyl-methacrylate] -co-allyltrimethylgermanium),
Poly (styrene-co- [N- (3-methacryloyloxypropyl-1′-cyclohexene-1 ′, 2′-dicarboximide)]-co-pentafluorostyrene-co-acrylonitrile-co- [2- [1 '-(3', 5'-dimethylpyrazolyl) carbonylamino] ethyl-methacrylate] -co-allyltrimethylgermanium), poly ([N- (3-methacryloyloxypropyl-1'-cyclohexene-1 ', 2'- Dicarboximide)]-co-pentafluorostyrene-co- [2- [O- (1'-methylpropylideneamino) carboxyamino] ethyl-methacrylate]), poly ([N- (3-methacryloyloxypropyl- 1′-cyclohexene-1 ′, 2′-dicarboximide)]-co-pentafluorostyrene-co- [2- [1 ′-(3 ′, 5′-dimethylpi Zolyl) carbonylamino] ethyl-methacrylate]), poly (styrene-co- (4-trifluoromethylstyrene) -co- [N- (3-methacryloyloxypropyl-1'-cyclohexene-1 ', 2'-di Carboximide)]-co- [2- [O- (1′-methylpropylideneamino) carboxyamino] ethyl-methacrylate]), poly (styrene-co- (4-trifluoromethylstyrene) -co- [N -(3-Methacryloyloxypropyl-1'-cyclohexene-1 ', 2'-dicarboximide)]-co- [2- [1'-(3 ', 5'-dimethylpyrazolyl) carbonylamino] ethyl-methacrylate ]) And the like.
<高分子化合物(C)>
 本発明の有機薄膜トランジスタ絶縁層材料に含まれる高分子化合物の好ましい他の態様は、光二量化反応基を複数個有し、上記第1の官能基を複数個有し、かつ、活性水素を2つ以上含有する高分子化合物である。このような高分子化合物を高分子化合物(C)と記す。活性水素は、高分子化合物を構成する主鎖に直接結合していてもよく、所定の基を介して結合していてもよい。また、活性水素は、高分子化合物を構成する各構造単位に含まれていてもよく、一部の構造単位にのみ含まれていてもよい。さらに、活性水素は、高分子化合物の末端にのみ結合していてもよい。
<Polymer compound (C)>
Another preferred embodiment of the polymer compound contained in the organic thin film transistor insulating layer material of the present invention has a plurality of photodimerization reactive groups, a plurality of the first functional groups, and two active hydrogens. It is a high molecular compound contained above. Such a polymer compound is referred to as a polymer compound (C). The active hydrogen may be directly bonded to the main chain constituting the polymer compound or may be bonded through a predetermined group. Moreover, active hydrogen may be contained in each structural unit which comprises a high molecular compound, and may be contained only in a part of structural unit. Furthermore, the active hydrogen may be bonded only to the terminal of the polymer compound.
 高分子化合物(C)の具体例としては、式(1)で表される繰り返し単位と、第1の官能基を含有する繰り返し単位とを有し、活性水素を1個有する構造単位を2個以上有する高分子化合物、式(1)で表される繰り返し単位と、第1の官能基を含有する繰り返し単位とを有し、活性水素を2個以上有する構造単位を有する高分子化合物が挙げられる。 Specific examples of the polymer compound (C) include two structural units each having a repeating unit represented by the formula (1) and a repeating unit containing a first functional group and one active hydrogen. Examples thereof include a high molecular compound having the above, a high molecular compound having a repeating unit represented by the formula (1) and a repeating unit containing a first functional group and having a structural unit having two or more active hydrogens. .
 高分子化合物(C)は、例えば、活性水素を含有する基及び二重結合等の不飽和結合を有するモノマーを、上記式(1)で表される繰り返し単位の原料となる重合性モノマー及び第1の官能基を含有する重合性モノマーと共重合させることで製造することができる。なお、活性水素を含有する基及び二重結合等の不飽和結合を有するモノマー、上記式(1)で表される繰り返し単位の原料となる重合性モノマー、第1の官能基を含有する重合性モノマー以外の重合性モノマーを重合時に添加して製造してもよい。これらの重合の際には、光重合開始剤や熱重合開始剤を適用してもよい。なお、重合性モノマー、光重合開始剤、熱重合開始剤としては、上述したものと同様のものを適用できる。 The polymer compound (C) includes, for example, a monomer having an active hydrogen-containing group and a monomer having an unsaturated bond such as a double bond, a polymerizable monomer that is a raw material for the repeating unit represented by the above formula (1), It can be produced by copolymerizing with a polymerizable monomer containing one functional group. In addition, a monomer having an active hydrogen-containing group and a double bond or other unsaturated bond, a polymerizable monomer serving as a raw material of the repeating unit represented by the above formula (1), and a polymerizable containing the first functional group A polymerizable monomer other than the monomer may be added during the polymerization. In the polymerization, a photopolymerization initiator or a thermal polymerization initiator may be applied. In addition, the thing similar to what was mentioned above is applicable as a polymerizable monomer, a photoinitiator, and a thermal polymerization initiator.
 活性水素を含有する基及び不飽和結合を有するモノマーとしては、例えば、アミノスチレン、ヒドロキシスチレン、ビニルベンジルアルコール、アミノエチルメタクリレート、エチレングリコールモノビニルエーテル、4-ヒドロキシブチルアクリレートが挙げられる。 Examples of the monomer having an active hydrogen-containing group and an unsaturated bond include aminostyrene, hydroxystyrene, vinyl benzyl alcohol, aminoethyl methacrylate, ethylene glycol monovinyl ether, and 4-hydroxybutyl acrylate.
 高分子化合物(C)は、ポリスチレン換算の重量平均分子量が3000~1000000が好ましく、5000~500000がより好ましく、直鎖状、分岐状、環状のいずれでもよい。 The polymer compound (C) has a polystyrene-equivalent weight average molecular weight of preferably 3,000 to 1,000,000, more preferably 5,000 to 500,000, and may be linear, branched or cyclic.
 高分子化合物(C)を製造する際に用いる第1の官能基を含有する重合性モノマーと活性水素を含有する基及び不飽和結合を有するモノマーとのモル比は、好ましくは60/100~150/100であり、より好ましくは70/100~120/100であり、さらに好ましくは90/100~110/100である。該モル比が、60/100未満であると活性水素が過剰になりヒステリシスの低下効果が小さくなることがあり、150/100を超えると活性水素と反応する官能基が過剰になり閾値電圧の絶対値が大きくなることがある。 The molar ratio of the polymerizable monomer containing the first functional group used in producing the polymer compound (C) to the monomer containing active hydrogen and the monomer having an unsaturated bond is preferably 60/100 to 150. / 100, more preferably 70/100 to 120/100, and still more preferably 90/100 to 110/100. If the molar ratio is less than 60/100, the active hydrogen may be excessive and the effect of reducing hysteresis may be reduced. If the molar ratio exceeds 150/100, the functional group that reacts with the active hydrogen will be excessive and the threshold voltage will be absolute. The value can be large.
 高分子化合物(C)としては、例えば、ポリ(スチレン-コ-[N-(3-メタクリロイルオキシプロピル-3’,4’-ジメチルマレイミド)]-コ-アミノスチレン-コ-[2-〔O-(1’-メチルプロピリデンアミノ)カルボキシアミノ〕エチル-メタクリレート])、ポリ(スチレン-コ-[N-(3-メタクリロイルオキシプロピル-3’,4’-ジメチルマレイミド)]-コ-アミノスチレン-コ-[2-〔1’-(3’,5’-ジメチルピラゾリル)カルボニルアミノ〕エチル-メタクリレート])、ポリ(スチレン-コ-[N-(3-メタクリロイルオキシプロピル-3’,4’-ジメチルマレイミド)]-コ-アミノスチレン-コ-アクリロニトリル-コ-[2-〔O-(1’-メチルプロピリデンアミノ)カルボキシアミノ〕エチル-メタクリレート])、ポリ(スチレン-コ-[N-(3-メタクリロイルオキシプロピル-3’,4’-ジメチルマレイミド)]-コ-アミノスチレン-コ-アクリロニトリル-コ-[2-〔O-(1’-メチルプロピリデンアミノ)カルボキシアミノ〕エチル-メタクリレート]-コ-アリルトリメチルゲルマニウム)、ポリ(スチレン-コ-[N-(3-メタクリロイルオキシプロピル-1’-シクロヘキセン-1’、2’-ジカルボキシミド)]-コ-アミノスチレン-コ-アクリロニトリル-コ-[2-〔1’-(3’,5’-ジメチルピラゾリル)カルボニルアミノ〕エチル-メタクリレート]-コ-アリルトリメチルゲルマニウム)、ポリ([N-(3-メタクリロイルオキシプロピル-1’-シクロヘキセン-1’、2’-ジカルボキシミド)]-コ-アミノスチレン-コ-[2-〔O-(1’-メチルプロピリデンアミノ)カルボキシアミノ〕エチル-メタクリレート])、ポリ([N-(3-メタクリロイルオキシプロピル-1’-シクロヘキセン-1’、2’-ジカルボキシミド)]-コ-アミノスチレン-コ-[2-〔1’-(3’,5’-ジメチルピラゾリル)カルボニルアミノ〕エチル-メタクリレート])、ポリ(アミノスチレン-コ-[N-(3-メタクリロイルオキシプロピル-1’-シクロヘキセン-1’、2’-ジカルボキシミド)]-コ-[2-〔O-(1’-メチルプロピリデンアミノ)カルボキシアミノ〕エチル-メタクリレート])、ポリ(アミノスチレン-コ-[N-(3-メタクリロイルオキシプロピル-1’-シクロヘキセン-1’、2’-ジカルボキシミド)]-コ-[2-〔1’-(3’,5’-ジメチルピラゾリル)カルボニルアミノ〕エチル-メタクリレート])等が挙げられる。 Examples of the polymer compound (C) include poly (styrene-co- [N- (3-methacryloyloxypropyl-3 ′, 4′-dimethylmaleimide)]-co-aminostyrene-co- [2- [O -(1'-methylpropylideneamino) carboxyamino] ethyl-methacrylate]), poly (styrene-co- [N- (3-methacryloyloxypropyl-3 ', 4'-dimethylmaleimide)]-co-aminostyrene -Co- [2- [1 '-(3', 5'-dimethylpyrazolyl) carbonylamino] ethyl-methacrylate]), poly (styrene-co- [N- (3-methacryloyloxypropyl-3 ', 4' -Dimethylmaleimide)]-co-aminostyrene-co-acrylonitrile-co- [2- [O- (1'-methylpropylideneamino) carboxyamino] ethyl -Methacrylate]), poly (styrene-co- [N- (3-methacryloyloxypropyl-3 ', 4'-dimethylmaleimide)]-co-aminostyrene-co-acrylonitrile-co- [2- [O- ( 1′-methylpropylideneamino) carboxyamino] ethyl-methacrylate] -co-allyltrimethylgermanium), poly (styrene-co- [N- (3-methacryloyloxypropyl-1′-cyclohexene-1 ′, 2′- Dicarboximide)]-co-aminostyrene-co-acrylonitrile-co- [2- [1 '-(3', 5'-dimethylpyrazolyl) carbonylamino] ethyl-methacrylate] -co-allyltrimethylgermanium), poly ([N- (3-Methacryloyloxypropyl-1′-cyclohexene-1 ′, 2′-dicarboxyl )]-Co-aminostyrene-co- [2- [O- (1′-methylpropylideneamino) carboxyamino] ethyl-methacrylate]), poly ([N- (3-methacryloyloxypropyl-1′- Cyclohexene-1 ′, 2′-dicarboximide)]-co-aminostyrene-co- [2- [1 ′-(3 ′, 5′-dimethylpyrazolyl) carbonylamino] ethyl-methacrylate]), poly (amino Styrene-co- [N- (3-methacryloyloxypropyl-1′-cyclohexene-1 ′, 2′-dicarboximide)]-co- [2- [O- (1′-methylpropylideneamino) carboxyamino ] Ethyl-methacrylate]), poly (aminostyrene-co- [N- (3-methacryloyloxypropyl-1'-cyclohexene-1 ', 2'-dicarboxymi) )]-Co- [2- [1 '-(3', 5'-dimethylpyrazolyl) carbonylamino] ethyl-methacrylate]) and the like.
<高分子化合物(D)>
 本発明の有機薄膜トランジスタ絶縁層材料に含まれる高分子化合物の好ましい他の態様は、光二量化反応基を複数個有し、フッ素原子を有し、上記第1の官能基を複数個有し、かつ、活性水素を含有する繰り返し単位を2つ以上含有する高分子化合物である。このような高分子化合物を高分子化合物(D)と記す。活性水素は、高分子化合物を構成する主鎖に直接結合していてもよく、所定の基を介して結合していてもよい。また、活性水素は、高分子化合物を構成する各構造単位に含まれていてもよく、一部の構造単位にのみ含まれていてもよい。さらに、活性水素は、高分子化合物の末端にのみ結合していてもよい。
<Polymer compound (D)>
Another preferred embodiment of the polymer compound contained in the organic thin film transistor insulating layer material of the present invention has a plurality of photodimerization reactive groups, a fluorine atom, a plurality of the first functional groups, and A polymer compound containing two or more repeating units containing active hydrogen. Such a polymer compound is referred to as a polymer compound (D). The active hydrogen may be directly bonded to the main chain constituting the polymer compound or may be bonded via a predetermined group. Moreover, active hydrogen may be contained in each structural unit which comprises a high molecular compound, and may be contained only in a part of structural unit. Furthermore, the active hydrogen may be bonded only to the terminal of the polymer compound.
 高分子化合物(D)の具体例としては、式(1)で表される繰り返し単位と、式(2)で表される繰り返し単位と、第1の官能基を含有する繰り返し単位とを有し、活性水素を1個有する構造単位を2個以上有する高分子化合物、式(1)で表される繰り返し単位と、式(2)で表される繰り返し単位と、第1の官能基を含有する繰り返し単位とを有し、活性水素を2個以上有する構造単位を有する高分子化合物が挙げられる。 Specific examples of the polymer compound (D) include a repeating unit represented by the formula (1), a repeating unit represented by the formula (2), and a repeating unit containing a first functional group. A polymer compound having two or more structural units having one active hydrogen, a repeating unit represented by the formula (1), a repeating unit represented by the formula (2), and a first functional group And a polymer compound having a repeating unit and a structural unit having two or more active hydrogens.
 高分子化合物(D)は、例えば、活性水素を含有する基及び二重結合等の不飽和結合を有するモノマーを、上記式(1)で表される繰り返し単位の原料となる重合性モノマー、上記式(2)で表される繰り返し単位の原料となる重合性モノマー及び第1の官能基を含有する重合性モノマーと共重合させることで製造することができる。なお、活性水素を含有する基及び二重結合等の不飽和結合を有するモノマー、上記式(1)で表される繰り返し単位の原料となる重合性モノマー、上記式(2)で表される繰り返し単位の原料となる重合性モノマー、第1の官能基を含有する重合性モノマー以外の重合性モノマーを重合時に添加して製造してもよい。これらの重合の際には、光重合開始剤や熱重合開始剤を適用してもよい。なお、重合性モノマー、光重合開始剤、熱重合開始剤としては、上述したものと同様のものを適用できる。 The polymer compound (D) includes, for example, a monomer having an active hydrogen-containing group and a monomer having an unsaturated bond such as a double bond, a polymerizable monomer serving as a raw material for the repeating unit represented by the above formula (1), It can manufacture by copolymerizing with the polymerizable monomer used as the raw material of the repeating unit represented by Formula (2), and the polymerizable monomer containing a 1st functional group. In addition, the monomer which has unsaturated bonds, such as a group containing active hydrogen and a double bond, the polymerizable monomer used as the raw material of the repeating unit represented by the said Formula (1), the repetition represented by the said Formula (2) A polymerizable monomer other than the polymerizable monomer serving as the raw material of the unit and the polymerizable monomer containing the first functional group may be added during the polymerization. In the polymerization, a photopolymerization initiator or a thermal polymerization initiator may be applied. In addition, the thing similar to what was mentioned above is applicable as a polymerizable monomer, a photoinitiator, and a thermal polymerization initiator.
 活性水素を含有する基及び不飽和結合を有するモノマーの具体例としては、上述したモノマーが挙げられる。 Specific examples of the monomer having an active hydrogen-containing group and an unsaturated bond include the monomers described above.
 高分子化合物(D)は、ポリスチレン換算の重量平均分子量が3000~1000000が好ましく、5000~500000がより好ましく、直鎖状、分岐状、環状のいずれでもよい。 The polymer compound (D) has a polystyrene-equivalent weight average molecular weight of preferably 3,000 to 1,000,000, more preferably 5,000 to 500,000, and may be linear, branched or cyclic.
 高分子化合物(D)を製造する際に用いる第1の官能基の原料となる重合性モノマーと活性水素を含有する基及び不飽和結合を有するモノマーとのモル比は、好ましくは60/100~150/100であり、より好ましくは70/100~120/100であり、さらに好ましくは90/100~110/100である。該該モル比が、60/100未満であると活性水素が過剰になりヒステリシスの低下効果が小さくなることがあり、150/100を超えると活性水素と反応する官能基が過剰になり閾値電圧の絶対値が大きくなることがある。 The molar ratio of the polymerizable monomer, which is a raw material for the first functional group used in the production of the polymer compound (D), to the active hydrogen-containing group and the monomer having an unsaturated bond is preferably 60/100 to 150/100, more preferably 70/100 to 120/100, and still more preferably 90/100 to 110/100. If the molar ratio is less than 60/100, the active hydrogen may be excessive and the effect of reducing hysteresis may be reduced. If the molar ratio exceeds 150/100, the functional group that reacts with the active hydrogen will be excessive and the threshold voltage will be reduced. The absolute value may be large.
 高分子化合物(D)としては、例えば、ポリ(スチレン-コ-[N-(3-メタクリロイルオキシプロピル-3’,4’-ジメチルマレイミド)]-コ-アミノスチレン-コ-ペンタフルオロスチレン-コ-[2-〔O-(1’-メチルプロピリデンアミノ)カルボキシアミノ〕エチル-メタクリレート])、ポリ(スチレン-コ-ペンタフルオロスチレン-コ-[N-(3-メタクリロイルオキシプロピル-3’,4’-ジメチルマレイミド)]-コ-アミノスチレン-コ-[2-〔1’-(3’,5’-ジメチルピラゾリル)カルボニルアミノ〕エチル-メタクリレート])、ポリ(スチレン-コ-ペンタフルオロスチレン-コ-[N-(3-メタクリロイルオキシプロピル-3’,4’-ジメチルマレイミド)]-コ-アミノスチレン-コ-アクリロニトリル-コ-[2-〔O-(1’-メチルプロピリデンアミノ)カルボキシアミノ〕エチル-メタクリレート])、ポリ(スチレン-コ-ペンタフルオロスチレン-コ-[N-(3-メタクリロイルオキシプロピル-3’,4’-ジメチルマレイミド)]-コ-アミノスチレン-コ-アクリロニトリル-コ-[2-〔1’-(3’,5’-ジメチルピラゾリル)カルボニルアミノ〕エチル-メタクリレート])、ポリ(スチレン-コ-ペンタフルオロスチレン-コ-[N-(3-メタクリロイルオキシプロピル-3’,4’-ジメチルマレイミド)]-コ-アミノスチレン-コ-アクリロニトリル-コ-[2-〔O-(1’-メチルプロピリデンアミノ)カルボキシアミノ〕エチル-メタクリレート]-コ-アリルトリメチルゲルマニウム)、ポリ(スチレン-コ-ペンタフルオロスチレン-コ-[N-(3-メタクリロイルオキシプロピル-1’-シクロヘキセン-1’、2’-ジカルボキシミド)]-コ-アミノスチレン-コ-アクリロニトリル-コ-[2-〔1’-(3’,5’-ジメチルピラゾリル)カルボニルアミノ〕エチル-メタクリレート]-コ-アリルトリメチルゲルマニウム)、ポリ([N-(3-メタクリロイルオキシプロピル-1’-シクロヘキセン-1’、2’-ジカルボキシミド)]-コ-アミノスチレン-コ-ペンタフルオロスチレン-コ-[2-〔O-(1’-メチルプロピリデンアミノ)カルボキシアミノ〕エチル-メタクリレート])、ポリ([N-(3-メタクリロイルオキシプロピル-1’-シクロヘキセン-1’、2’-ジカルボキシミド)]-コ-アミノスチレン-コ-ペンタフルオロスチレン-コ-[2-〔1’-(3’,5’-ジメチルピラゾリル)カルボニルアミノ〕エチル-メタクリレート])、ポリ(アミノスチレン-コ-ペンタフルオロスチレン-コ-[N-(3-メタクリロイルオキシプロピル-1’-シクロヘキセン-1’、2’-ジカルボキシミド)]-コ-[2-〔O-(1’-メチルプロピリデンアミノ)カルボキシアミノ〕エチル-メタクリレート])、ポリ(アミノスチレン-コ-ペンタフルオロスチレン-コ-[N-(3-メタクリロイルオキシプロピル-1’-シクロヘキセン-1’、2’-ジカルボキシミド)]-コ-[2-〔1’-(3’,5’-ジメチルピラゾリル)カルボニルアミノ〕エチル-メタクリレート])等が挙げられる。 Examples of the polymer compound (D) include poly (styrene-co- [N- (3-methacryloyloxypropyl-3 ′, 4′-dimethylmaleimide)]-co-aminostyrene-co-pentafluorostyrene-co. -[2- [O- (1′-methylpropylideneamino) carboxyamino] ethyl-methacrylate]), poly (styrene-co-pentafluorostyrene-co- [N- (3-methacryloyloxypropyl-3 ′, 4'-dimethylmaleimide)]-co-aminostyrene-co- [2- [1 '-(3', 5'-dimethylpyrazolyl) carbonylamino] ethyl-methacrylate]), poly (styrene-co-pentafluorostyrene -Co- [N- (3-methacryloyloxypropyl-3 ', 4'-dimethylmaleimide)]-co-aminostyrene-co-acrylic Ronitrile-co- [2- [O- (1'-methylpropylideneamino) carboxyamino] ethyl-methacrylate]), poly (styrene-co-pentafluorostyrene-co- [N- (3-methacryloyloxypropyl- 3 ′, 4′-dimethylmaleimide)]-co-aminostyrene-co-acrylonitrile-co- [2- [1 ′-(3 ′, 5′-dimethylpyrazolyl) carbonylamino] ethyl-methacrylate]), poly ( Styrene-co-pentafluorostyrene-co- [N- (3-methacryloyloxypropyl-3 ', 4'-dimethylmaleimide)]-co-aminostyrene-co-acrylonitrile-co- [2- [O- (1 '-Methylpropylideneamino) carboxyamino] ethyl-methacrylate] -co-allyltrimethylgermanium), poly Tylene-co-pentafluorostyrene-co- [N- (3-methacryloyloxypropyl-1′-cyclohexene-1 ′, 2′-dicarboximide)]-co-aminostyrene-co-acrylonitrile-co- [2 -[1 '-(3', 5'-dimethylpyrazolyl) carbonylamino] ethyl-methacrylate] -co-allyltrimethylgermanium), poly ([N- (3-methacryloyloxypropyl-1'-cyclohexene-1 ', 2′-dicarboximide)]-co-aminostyrene-co-pentafluorostyrene-co- [2- [O- (1′-methylpropylideneamino) carboxyamino] ethyl-methacrylate]), poly ([N — (3-methacryloyloxypropyl-1′-cyclohexene-1 ′, 2′-dicarboximide)]-co-aminostyrene -Co-pentafluorostyrene-co- [2- [1 '-(3', 5'-dimethylpyrazolyl) carbonylamino] ethyl-methacrylate]), poly (aminostyrene-co-pentafluorostyrene-co- [ N- (3-methacryloyloxypropyl-1′-cyclohexene-1 ′, 2′-dicarboximide)]-co- [2- [O- (1′-methylpropylideneamino) carboxyamino] ethyl-methacrylate] ), Poly (aminostyrene-co-pentafluorostyrene-co- [N- (3-methacryloyloxypropyl-1′-cyclohexene-1 ′, 2′-dicarboximide)]-co- [2- [1 ′ -(3 ', 5'-dimethylpyrazolyl) carbonylamino] ethyl-methacrylate]) and the like.
<活性水素化合物(E)>
 本発明の有機薄膜トランジスタ絶縁層材料は、活性水素化合物(E)を含有していてもよい。活性水素化合物(E)は、高分子化合物(A)~(D)中に生成する第2の官能基と反応してこれと結合することにより、絶縁層の内部に架橋構造を形成することができる。活性水素化合物(E)には、活性水素を2つ以上含有する低分子化合物(以下、低分子活性水素化合物(E-1)という。)、及び活性水素を2つ以上含有する高分子化合物(以下、高分子活性水素化合物(E-2)という。)が含まれる。
<Active hydrogen compound (E)>
The organic thin film transistor insulating layer material of the present invention may contain an active hydrogen compound (E). The active hydrogen compound (E) reacts with the second functional group generated in the polymer compounds (A) to (D) and binds to it, thereby forming a crosslinked structure inside the insulating layer. it can. The active hydrogen compound (E) includes a low molecular compound containing two or more active hydrogens (hereinafter referred to as a low molecular active hydrogen compound (E-1)) and a polymer compound containing two or more active hydrogens ( Hereinafter, the polymer active hydrogen compound (E-2)) is included.
 活性水素としては、典型的にはアミノ基、ヒドロキシ基又はメルカプト基に含まれる水素原子が挙げられる。活性水素としては、上述した反応性官能基、中でもイソシアナト基、イソチオシアナト基との反応を良好に生じることができるフェノール性ヒドロキシ基に含まれる水素、アルコール性ヒドロキシ基に含まれる水素、芳香族アミノ基に含まれる水素が好適である。 Examples of the active hydrogen typically include a hydrogen atom contained in an amino group, a hydroxy group, or a mercapto group. As active hydrogen, hydrogen contained in a phenolic hydroxy group, hydrogen contained in an alcoholic hydroxy group, aromatic amino group capable of favorably producing a reaction with the above-described reactive functional groups, in particular, isocyanato groups and isothiocyanato groups. Hydrogen contained in is preferred.
 低分子活性水素化合物(E-1)の具体例としては、2個以上の活性水素含有基が低分子構造に結合した構造を有する化合物が挙げられる。この低分子構造としては、例えば、アルキル構造やベンゼン環構造が挙げられる。該低分子化合物の具体例としては、アミン系化合物、アルコール系化合物、フェノール系化合物及びチオール系化合物が挙げられる。本明細書において、「アルキル構造」とは、脂肪族炭化水素からなる直鎖状、分岐状、または環状の構造を意味する。一方、「ベンゼン環構造」とは、芳香族炭化水素からなる直鎖状、分岐状、または環状の構造を意味する。 Specific examples of the low molecular active hydrogen compound (E-1) include a compound having a structure in which two or more active hydrogen-containing groups are bonded to a low molecular structure. Examples of this low molecular structure include an alkyl structure and a benzene ring structure. Specific examples of the low molecular weight compound include amine compounds, alcohol compounds, phenol compounds, and thiol compounds. In the present specification, the “alkyl structure” means a linear, branched, or cyclic structure composed of an aliphatic hydrocarbon. On the other hand, the “benzene ring structure” means a linear, branched, or cyclic structure composed of an aromatic hydrocarbon.
 アミン系化合物の例としては、エチレンジアミン、プロピレンジアミン、ヘキサメチレンジアミン、N,N,N’,N’,-テトラアミノエチルエチレンジアミン、オルト-フェニレンジアミン、メタ-フェニレンジアミン、パラ-フェニレンジアミン、N,N’-ジフェニル-パラ-フェニレンジアミン、メラミン、2,4,6-トリアミノピリミジン、1,5,9-トリアザシクロドデカン、1,3-ビス(3-アミノプロピル)テトラメチルジシロキサン、1,4-ビス(3-アミノプロピルジメチルシリル)ベンゼン、3-(2-アミノエチルアミノプロピル)トリス(トリメチルシロキシ)シランが挙げられる。 Examples of amine compounds include ethylenediamine, propylenediamine, hexamethylenediamine, N, N, N ′, N ′,-tetraaminoethylethylenediamine, ortho-phenylenediamine, meta-phenylenediamine, para-phenylenediamine, N, N′-diphenyl-para-phenylenediamine, melamine, 2,4,6-triaminopyrimidine, 1,5,9-triazacyclododecane, 1,3-bis (3-aminopropyl) tetramethyldisiloxane, 1 , 4-bis (3-aminopropyldimethylsilyl) benzene, 3- (2-aminoethylaminopropyl) tris (trimethylsiloxy) silane.
 アルコール系化合物の例としては、エチレングリコール、1,2-ジヒドロキシプロパン、グリセロール、1,4-ジメタノールベンゼンが挙げられる。 Examples of alcohol compounds include ethylene glycol, 1,2-dihydroxypropane, glycerol, and 1,4-dimethanolbenzene.
 フェノール系化合物の例としては、1,2-ジヒドロキシベンゼン、1,3-ジヒドロキシベンゼン、1,4-ジヒドロキシベンゼン(ヒドロキノン)、1,2-ジヒドロキシナフタレン、レゾルシン、フルオログリセロール、2,3,4-トリヒドロキシベンズアルデハイド、3,4,5-トリヒドロキシベンズアミドが挙げられる。 Examples of phenolic compounds include 1,2-dihydroxybenzene, 1,3-dihydroxybenzene, 1,4-dihydroxybenzene (hydroquinone), 1,2-dihydroxynaphthalene, resorcin, fluoroglycerol, 2,3,4- Examples include trihydroxybenzaldehyde and 3,4,5-trihydroxybenzamide.
 チオール系化合物の例としては、エチレンジチオール、パラ-フェニレンジチオールが挙げられる。 Examples of thiol compounds include ethylene dithiol and para-phenylene dithiol.
 活性水素を2つ以上含有する低分子化合物としては、アルコール系化合物、フェノール系化合物、芳香族アミン系化合物が好ましい。 As the low molecular weight compound containing two or more active hydrogens, alcohol compounds, phenol compounds, and aromatic amine compounds are preferable.
 一方、高分子活性水素化合物(E-2)においては、活性水素は、高分子化合物を構成する主鎖に直接結合していてもよく、所定の基を介して結合していてもよい。また、活性水素は、高分子化合物を構成する構造単位に含まれていてもよく、その場合は、各構造単位に含まれていてもよく、一部の構造単位にのみ含まれていてもよい。さらに、活性水素は、高分子化合物の末端にのみ結合していてもよい。 On the other hand, in the polymer active hydrogen compound (E-2), the active hydrogen may be directly bonded to the main chain constituting the polymer compound or may be bonded through a predetermined group. The active hydrogen may be contained in the structural unit constituting the polymer compound. In that case, it may be contained in each structural unit, or may be contained only in a part of the structural units. . Furthermore, the active hydrogen may be bonded only to the terminal of the polymer compound.
 高分子活性水素化合物(E-2)の具体例としては、2個以上の活性水素を含有する基が高分子構造に結合した構造を有する化合物が挙げられる。 Specific examples of the polymer active hydrogen compound (E-2) include a compound having a structure in which a group containing two or more active hydrogens is bonded to a polymer structure.
 高分子活性水素化合物(E-2)は活性水素を含有する基及び二重結合等の不飽和結合を有するモノマーを単独で重合させるか、該モノマーを上記式(1)で表される繰り返し単位、上記式(2)で表される繰り返し単位又は第1の官能基を含む繰り返し単位の原料となる重合性モノマーと共重合させるか、該モノマーを他の共重合性化合物と共重合させて重合体を形成することによって得られる。これらの重合性モノマーの重合又は共重合は当業者が通常使用する方法を使用して行えばよい。 The polymer active hydrogen compound (E-2) is obtained by polymerizing a monomer having an active hydrogen-containing group and an unsaturated bond such as a double bond alone or by repeating the monomer represented by the above formula (1). Copolymerizing with a polymerizable monomer that is a raw material of the repeating unit represented by the above formula (2) or the repeating unit containing the first functional group, or by copolymerizing the monomer with another copolymerizable compound. It is obtained by forming a coalescence. The polymerization or copolymerization of these polymerizable monomers may be performed using a method usually used by those skilled in the art.
 これらの重合の際には、光重合開始剤や熱重合開始剤を適用してもよい。なお、重合性モノマー、光重合開始剤、熱重合開始剤としては、上述したものと同様のものを適用できる。 In the polymerization, a photopolymerization initiator or a thermal polymerization initiator may be applied. In addition, the thing similar to what was mentioned above is applicable as a polymerizable monomer, a photoinitiator, and a thermal polymerization initiator.
 活性水素を含有する基及び不飽和結合を有するモノマーの具体例としては、上述したモノマーが挙げられる。 Specific examples of the monomer having an active hydrogen-containing group and an unsaturated bond include the monomers described above.
 活性水素を含有する基及び不飽和結合を有するモノマーの中でも、アミノ基を含有するモノマーが好ましい。 Among the monomers containing active hydrogen and monomers having unsaturated bonds, monomers containing amino groups are preferred.
 また、活性水素を2つ以上含有する高分子化合物としては、フェノール化合物と、ホルムアルデヒドとを、酸触媒の存在下で縮合させることによって得られた、ノボラック樹脂も好適に用いられる。 Also, as a polymer compound containing two or more active hydrogens, a novolak resin obtained by condensing a phenol compound and formaldehyde in the presence of an acid catalyst is also preferably used.
 活性水素を含有する基を2個以上含有する高分子化合物のポリスチレン換算の重量平均分子量は、1000~1000000であることが好ましく、3000~500000であることがより好ましい。これにより、絶縁層の平坦性及び均一性が良好となるという効果が得られるようになる。ポリスチレン換算の重量平均分子量は、GPCにより測定される。 The weight average molecular weight in terms of polystyrene of the polymer compound containing two or more groups containing active hydrogen is preferably from 1,000 to 1,000,000, and more preferably from 3,000 to 500,000. Thereby, the effect that the flatness and uniformity of the insulating layer are improved can be obtained. The weight average molecular weight in terms of polystyrene is measured by GPC.
<有機薄膜トランジスタ絶縁層材料>
 高分子化合物(A)~(D)はいずれも光及び熱エネルギー架橋性であり、本発明の有機薄膜トランジスタ絶縁層材料として使用することができる。高分子化合物(A)及び(B)は活性水素を有しない。しかし、加熱を大気中等の水分を含む雰囲気で行うことにより、第2の官能基は水と反応することができ、高分子化合物(A)及び(B)も熱架橋され得る。本発明の有機薄膜トランジスタ絶縁層材料の好ましい一態様は、高分子化合物(A)及び/又は(B)と活性水素化合物(E)とを含む組成物である。該組成物の中でも、高分子化合物(B)と活性水素化合物(E)とを含む組成物がより好ましい。
<Organic thin film transistor insulating layer material>
The polymer compounds (A) to (D) are all light and heat energy crosslinkable and can be used as the organic thin film transistor insulating layer material of the present invention. The polymer compounds (A) and (B) do not have active hydrogen. However, when the heating is performed in an atmosphere containing moisture such as in the air, the second functional group can react with water, and the polymer compounds (A) and (B) can also be thermally crosslinked. One preferable aspect of the organic thin film transistor insulating layer material of the present invention is a composition containing the polymer compound (A) and / or (B) and the active hydrogen compound (E). Among the compositions, a composition containing the polymer compound (B) and the active hydrogen compound (E) is more preferable.
 高分子化合物(A)及び/又は(B)と活性水素化合物(E)との混合割合は、高分子化合物(A)及び/又は(B)から生成しうる第2の官能基と、活性水素化合物(E)中の活性水素を含有する基のモル比が60/100~150/100となる割合が好ましい。より好ましくは70/100~120/100となる割合であり、さらに好ましくは90/100~110/100となる割合である。該モル比が60/100未満となる割合で混合すると活性水素が過剰になりヒステリシスの低下効果が小さくなることがあり、150/100を超える割合で混合すると活性水素と反応する官能基が過剰になり閾値電圧の絶対値が大きくなることがある。 The mixing ratio of the polymer compound (A) and / or (B) and the active hydrogen compound (E) is determined by the second functional group that can be generated from the polymer compound (A) and / or (B) and the active hydrogen. A ratio in which the molar ratio of the group containing active hydrogen in the compound (E) is 60/100 to 150/100 is preferable. The ratio is more preferably 70/100 to 120/100, and still more preferably 90/100 to 110/100. If the molar ratio is less than 60/100, the active hydrogen may be excessive and the effect of reducing hysteresis may be reduced. If the molar ratio exceeds 150/100, the functional group that reacts with the active hydrogen is excessive. The absolute value of the threshold voltage may increase.
 本発明の有機薄膜トランジスタ絶縁層材料の好ましい他の態様は、高分子化合物(C)である。高分子化合物(C)の中でも高分子化合物(D)がより好ましい。高分子化合物(C)ならびに高分子化合物(D)は、第1の官能基と活性水素を含有する基とを有しているため、本発明の有機薄膜トランジスタ絶縁層材料に単独で用いることができる。 Another preferred embodiment of the organic thin film transistor insulating layer material of the present invention is a polymer compound (C). Among the polymer compounds (C), the polymer compound (D) is more preferable. Since the polymer compound (C) and the polymer compound (D) have the first functional group and the group containing active hydrogen, they can be used alone for the organic thin film transistor insulating layer material of the present invention. .
 本発明の有機薄膜トランジスタ絶縁層材料には、高分子化合物(A)~(E)に結合した有機基及び官能基が含まれる。これら有機基及び官能基の含有量は有機薄膜トランジスタ絶縁層材料に要求される性能を考慮して、有機基及び官能基を有する繰り返し単位の量を調節することにより適宜決定される。 The organic thin film transistor insulating layer material of the present invention contains an organic group and a functional group bonded to the polymer compounds (A) to (E). The contents of the organic group and the functional group are appropriately determined by adjusting the amount of the repeating unit having the organic group and the functional group in consideration of the performance required for the organic thin film transistor insulating layer material.
 好ましい一態様では、本発明の有機薄膜トランジスタ絶縁層材料に含まれる高分子化合物が有する繰り返し単位の合計数を基準にして、光二量化反応基を含有する繰り返し単位のモル分率が、0.01~0.7、好ましくは0.05~0.6、より好ましくは0.1~0.5である。光二量化反応基を含有する繰り返し単位のモル分率が0.01未満であると硬化が不十分になる場合があり、0.7を超えるとトランジスタ特性に悪影響を及ぼす場合がある。 In a preferred embodiment, the molar fraction of the repeating unit containing a photodimerization reactive group is 0.01 to based on the total number of repeating units of the polymer compound contained in the organic thin film transistor insulating layer material of the present invention. It is 0.7, preferably 0.05 to 0.6, more preferably 0.1 to 0.5. If the molar fraction of the repeating unit containing the photodimerization reactive group is less than 0.01, curing may be insufficient, and if it exceeds 0.7, the transistor characteristics may be adversely affected.
 第1の官能基を含有する繰り返し単位のモル分率は、0.01~0.7、好ましくは0.05~0.6、より好ましくは0.1~0.5である。第1の官能基を含有する繰り返し単位のモル分率が0.01未満であると硬化が不十分になる場合があり、0.7を超えるとトランジスタ特性に悪影響を及ぼす場合がある。活性水素の量は第1の官能基と過不足無く反応する量を基準にして決定される。 The molar fraction of the repeating unit containing the first functional group is 0.01 to 0.7, preferably 0.05 to 0.6, more preferably 0.1 to 0.5. If the molar fraction of the repeating unit containing the first functional group is less than 0.01, curing may be insufficient, and if it exceeds 0.7, transistor characteristics may be adversely affected. The amount of active hydrogen is determined based on the amount that reacts with the first functional group without excess or deficiency.
 高分子化合物に導入されるフッ素の量は、高分子化合物全体の量に対して、好ましくは50質量%以下、好ましくは1~40質量%、より好ましくは5~35質量%である。フッ素の量が50質量%を超えると有機半導体材料との親和性が悪化して層をその上に積層することが困難になることがある。 The amount of fluorine introduced into the polymer compound is preferably 50% by mass or less, preferably 1 to 40% by mass, more preferably 5 to 35% by mass with respect to the total amount of the polymer compound. When the amount of fluorine exceeds 50% by mass, the affinity with the organic semiconductor material is deteriorated, and it may be difficult to stack the layer thereon.
 本発明の有機薄膜トランジスタ絶縁層材料には、混合や粘度調節のための溶媒や、高分子化合物(A)~(D)を架橋させるために用いる架橋剤、該架橋剤と組み合わせて用いられる添加剤などを含有させてよい。使用される溶媒としては、テトラヒドロフランやジエチルエーテルなどのエーテル溶媒、ヘキサンなどの脂肪族炭化水素溶媒、シクロヘキサンなどの脂環式炭化水素溶媒、ペンテン等の不飽和炭化水素溶媒、キシレンなどの芳香族炭化水素溶媒、アセトンなどのケトン溶媒、ブチルアセテートなどのアセテート溶媒、イソプロピルアルコールなどのアルコール溶媒、クロロホルムなどのハロゲン溶媒、これらの溶媒の混合溶媒が挙げられる。また、添加剤としては、架橋反応を促進するための触媒、レべリング剤、粘度調節剤などを用いることができる。 The organic thin film transistor insulating layer material of the present invention includes a solvent for mixing and viscosity adjustment, a crosslinking agent used for crosslinking the polymer compounds (A) to (D), and an additive used in combination with the crosslinking agent. Etc. may be included. Solvents used include ether solvents such as tetrahydrofuran and diethyl ether, aliphatic hydrocarbon solvents such as hexane, alicyclic hydrocarbon solvents such as cyclohexane, unsaturated hydrocarbon solvents such as pentene, and aromatic carbonization such as xylene. Examples thereof include a hydrogen solvent, a ketone solvent such as acetone, an acetate solvent such as butyl acetate, an alcohol solvent such as isopropyl alcohol, a halogen solvent such as chloroform, and a mixed solvent of these solvents. Moreover, as an additive, the catalyst for promoting a crosslinking reaction, a leveling agent, a viscosity modifier, etc. can be used.
 本発明の有機薄膜トランジスタ絶縁層材料は、有機薄膜トランジスタに含まれる絶縁層の形成に用いられる組成物である。有機薄膜トランジスタの絶縁層中でも、オーバーコート層又はゲート絶縁層の形成に用いられることが好ましい。有機薄膜トランジスタ絶縁層材料としては、有機薄膜トランジスタオーバーコート層組成物、有機薄膜トランジスタゲート絶縁層組成物であることが好ましく、有機薄膜トランジスタゲート絶縁層材料であることがより好ましい。 The organic thin film transistor insulating layer material of the present invention is a composition used for forming an insulating layer contained in an organic thin film transistor. Among the insulating layers of organic thin film transistors, it is preferably used for forming an overcoat layer or a gate insulating layer. The organic thin film transistor insulating layer material is preferably an organic thin film transistor overcoat layer composition or an organic thin film transistor gate insulating layer composition, and more preferably an organic thin film transistor gate insulating layer material.
<有機薄膜トランジスタ>
 図1は、本発明の一実施形態であるボトムゲートトップコンタクト型有機薄膜トランジスタの構造を示す模式断面図である。この有機薄膜トランジスタには、基板1と、基板1上に形成されたゲート電極2と、ゲート電極2上に形成されたゲート絶縁層3と、ゲート絶縁層3上に形成された有機半導体層4と、有機半導体層4上にチャネル部を挟んで形成されたソース電極5及びドレイン電極6と、素子全体を覆うオーバーコート7とが、備えられている。
<Organic thin film transistor>
FIG. 1 is a schematic cross-sectional view showing the structure of a bottom gate top contact organic thin film transistor according to an embodiment of the present invention. The organic thin film transistor includes a substrate 1, a gate electrode 2 formed on the substrate 1, a gate insulating layer 3 formed on the gate electrode 2, an organic semiconductor layer 4 formed on the gate insulating layer 3, A source electrode 5 and a drain electrode 6 formed on the organic semiconductor layer 4 with a channel portion interposed therebetween, and an overcoat 7 covering the entire element are provided.
 ボトムゲートトップコンタクト型有機薄膜トランジスタは、例えば、基板上にゲート電極を形成し、ゲート電極上にゲート絶縁層を形成し、ゲート絶縁層上に有機半導体層を形成し、有機半導体層上にソース電極、ドレイン電極を形成し、オーバーコートを形成することで製造することができる。本発明の有機薄膜トランジスタ絶縁層材料は、有機薄膜トランジスタゲート絶縁層材料として、ゲート絶縁層を形成するのに好適に用いられる。また、有機薄膜トランジスタオーバーコート層材料として、オーバーコート層を形成するのに用いることもできる。 A bottom gate top contact type organic thin film transistor includes, for example, a gate electrode formed on a substrate, a gate insulating layer formed on the gate electrode, an organic semiconductor layer formed on the gate insulating layer, and a source electrode formed on the organic semiconductor layer. It can be manufactured by forming a drain electrode and forming an overcoat. The organic thin film transistor insulating layer material of the present invention is suitably used for forming a gate insulating layer as an organic thin film transistor gate insulating layer material. Moreover, it can also be used for forming an overcoat layer as an organic thin film transistor overcoat layer material.
 図2は、本発明の一実施形態であるボトムゲートボトムコンタクト型有機薄膜トランジスタの構造を示す模式断面図である。この有機薄膜トランジスタには、基板1と、基板1上に形成されたゲート電極2と、ゲート電極2上に形成されたゲート絶縁層3と、ゲート絶縁層3上にチャネル部を挟んで形成されたソース電極5及びドレイン電極6と、ソース電極5及びドレイン電極6上に形成された有機半導体層4と、素子全体を覆うオーバーコート7とが、備えられている。 FIG. 2 is a schematic cross-sectional view showing the structure of a bottom gate bottom contact type organic thin film transistor which is an embodiment of the present invention. In this organic thin film transistor, a substrate 1, a gate electrode 2 formed on the substrate 1, a gate insulating layer 3 formed on the gate electrode 2, and a channel portion on the gate insulating layer 3 are formed. A source electrode 5 and a drain electrode 6, an organic semiconductor layer 4 formed on the source electrode 5 and the drain electrode 6, and an overcoat 7 that covers the entire element are provided.
 ボトムゲートボトムコンタクト型有機薄膜トランジスタは、例えば、基板上にゲート電極を形成し、ゲート電極上にゲート絶縁層を形成し、ゲート絶縁層上にソース電極、ドレイン電極を形成し、ソース電極、ドレイン電極上に有機半導体層を形成し、オーバーコートを形成することで製造することができる。本発明の有機薄膜トランジスタ絶縁層材料は、有機薄膜トランジスタゲート絶縁層材料として、ゲート絶縁層を形成するのに好適に用いられる。また、有機薄膜トランジスタオーバーコート層材料として、オーバーコート層を形成するのに用いることもできる。 A bottom gate bottom contact type organic thin film transistor includes, for example, a gate electrode formed on a substrate, a gate insulating layer formed on the gate electrode, a source electrode and a drain electrode formed on the gate insulating layer, and a source electrode and a drain electrode. It can be manufactured by forming an organic semiconductor layer thereon and forming an overcoat. The organic thin film transistor insulating layer material of the present invention is suitably used for forming a gate insulating layer as an organic thin film transistor gate insulating layer material. Moreover, it can also be used for forming an overcoat layer as an organic thin film transistor overcoat layer material.
 ゲート絶縁層又はオーバーコート層の形成は、有機薄膜トランジスタ絶縁層材料に要すれば溶媒などを添加して絶縁層塗布液を調製し、絶縁層塗布液を、ゲート絶縁層又はオーバーコート層の下に位置する層の表面に塗布し、乾燥し、硬化させることにより行う。該絶縁層塗布液に用いられる有機溶媒としては、有機薄膜トランジスタ絶縁層材料を溶解させるものであれば特に制限は無いが、好ましくは、常圧での沸点が100℃~200℃の有機溶媒である。該有機溶媒の例としては、2-ヘプタノン(沸点151℃)、プロピレングリコールモノメチルエーテルアセテート(沸点146℃)が挙げられる。該絶縁層塗布液には、必要に応じてレベリング剤、界面活性剤、硬化触媒等を添加することができる。本発明の有機薄膜トランジスタ絶縁層材料は、有機薄膜トランジスタゲート絶縁層組成物として、ゲート絶縁層の形成に用いることもできる。 For the formation of the gate insulating layer or overcoat layer, if necessary for the organic thin film transistor insulating layer material, a solvent or the like is added to prepare an insulating layer coating solution, and the insulating layer coating solution is placed under the gate insulating layer or overcoat layer. It is performed by applying to the surface of the layer located, drying and curing. The organic solvent used in the insulating layer coating solution is not particularly limited as long as it dissolves the organic thin film transistor insulating layer material, but is preferably an organic solvent having a boiling point of 100 ° C. to 200 ° C. at normal pressure. . Examples of the organic solvent include 2-heptanone (boiling point 151 ° C.) and propylene glycol monomethyl ether acetate (boiling point 146 ° C.). A leveling agent, a surfactant, a curing catalyst, and the like can be added to the insulating layer coating solution as necessary. The organic thin film transistor insulating layer material of the present invention can also be used for forming a gate insulating layer as an organic thin film transistor gate insulating layer composition.
 該絶縁層塗布液はスピンコート、ダイコーター、スクリーン印刷、インクジェット等の公知の方法によりゲート電極上に塗布することができる。形成される塗布層は必要に応じて乾燥させる。ここでいう乾燥は、塗布された樹脂組成物に含まれる溶媒を除去することを意味する。 The insulating layer coating solution can be applied onto the gate electrode by a known method such as spin coating, die coater, screen printing, or ink jet. The formed coating layer is dried as necessary. Drying here means removing the solvent contained in the applied resin composition.
 乾燥させた塗布層は、次いで硬化させる。硬化は有機薄膜トランジスタ絶縁層材料が架橋することを意味する。トランジスタ絶縁層材料の架橋は、例えば、塗布層に電磁波の照射又は熱を印加することにより行われる。そうすると、高分子化合物(A)又は(B)の第1の官能基から第2の官能基が生成して、該第2の官能基が活性水素化合物(E)の活性水素含有基と反応するからである。又は、高分子化合物(C)又は(D)の第1の官能基から第2の官能基が生成して、該第2の官能基が分子内の活性水素含有基と反応するからである。 The dried coating layer is then cured. Curing means that the organic thin film transistor insulating layer material is crosslinked. Cross-linking of the transistor insulating layer material is performed, for example, by applying electromagnetic wave irradiation or heat to the coating layer. Then, a second functional group is generated from the first functional group of the polymer compound (A) or (B), and the second functional group reacts with the active hydrogen-containing group of the active hydrogen compound (E). Because. Alternatively, the second functional group is generated from the first functional group of the polymer compound (C) or (D), and the second functional group reacts with the active hydrogen-containing group in the molecule.
 有機薄膜トランジスタ絶縁層材料の架橋は、塗布層に電磁波又は電子線を照射することによっても行われる。塗布層に電磁波又は電子線を照射すると、高分子化合物(A)~(D)の光二量化反応基の環化反応により、二量化するからである。 Crosslinking of the organic thin film transistor insulating layer material is also performed by irradiating the coating layer with electromagnetic waves or electron beams. This is because when the coating layer is irradiated with an electromagnetic wave or an electron beam, dimerization occurs due to the cyclization reaction of the photodimerization reactive groups of the polymer compounds (A) to (D).
 高分子化合物(A)~(D)に含まれる第1の官能基が、電磁波の照射により、活性水素と反応する第2の官能基を生成する官能基である場合、有機薄膜トランジスタ絶縁層は、有機薄膜トランジスタ絶縁層材料を含む液を基材に塗布して該基材上に塗布層を形成する工程;及び該塗布層に電磁波又は電子線を照射する工程;を包含する形成方法で形成することが好ましい。 When the first functional group contained in the polymer compounds (A) to (D) is a functional group that generates a second functional group that reacts with active hydrogen upon irradiation with electromagnetic waves, the organic thin film transistor insulating layer is: Forming the coating layer on the substrate by applying a liquid containing an organic thin film transistor insulating layer material to the substrate; and irradiating the coating layer with an electromagnetic wave or an electron beam. Is preferred.
 高分子化合物(A)~(D)に含まれる第1の官能基が、熱の作用により、活性水素と反応する第2の官能基を生成する官能基である場合、有機薄膜トランジスタ絶縁層材料を含む液を基材に塗布して該基材上に塗布層を形成する工程;及び該塗布層に電磁波又は電子線を照射する工程;を包含する形成方法で形成することが好ましく、有機薄膜トランジスタ絶縁層は、有機薄膜トランジスタ絶縁層材料を含む液を基材に塗布して該基材上に塗布層を形成する工程;該塗布層に電磁波又は電子線を照射する工程;及び該塗布層に熱を印加する工程;を包含する形成方法で形成することがより好ましい。 When the first functional group contained in the polymer compounds (A) to (D) is a functional group that generates a second functional group that reacts with active hydrogen by the action of heat, an organic thin film transistor insulating layer material is formed. Preferably, it is formed by a forming method including a step of coating a liquid containing the substrate on the substrate and forming a coating layer on the substrate; and a step of irradiating the coating layer with an electromagnetic wave or an electron beam. The layer includes a step of applying a liquid containing an organic thin film transistor insulating layer material to a substrate to form a coating layer on the substrate; a step of irradiating the coating layer with an electromagnetic wave or an electron beam; and heating the coating layer. It is more preferable to form by the forming method including the step of applying.
 塗布層に電磁波又は電子線を照射する工程と、塗布層に熱を印加する工程の両方行うことで、絶縁層の架橋密度が向上するからである。特に、有機薄膜トランジスタ絶縁層材料をゲート絶縁層に使用する場合には、有機薄膜トランジスタの閾値電圧(Vth)の絶対値及びヒステリシスが小さくなる。絶縁層の架橋密度が向上することで電圧印加時の分極がより抑制され、有機薄膜トランジスタの閾値電圧の絶対値及びヒステリシスが小さくなると考えられる。 This is because the crosslink density of the insulating layer is improved by performing both the step of irradiating the coating layer with electromagnetic waves or electron beams and the step of applying heat to the coating layer. In particular, when the organic thin film transistor insulating layer material is used for the gate insulating layer, the absolute value and hysteresis of the threshold voltage (Vth) of the organic thin film transistor are reduced. It is considered that the polarization at the time of voltage application is further suppressed by improving the crosslinking density of the insulating layer, and the absolute value and hysteresis of the threshold voltage of the organic thin film transistor are reduced.
 塗布層に熱を印加する場合は、塗布層を約80~250℃、好ましくは約100~230℃の温度に加熱して約5~120分、好ましくは約10~60分維持する。加熱温度が低すぎたり加熱時間が短すぎると絶縁層の架橋が不十分になり、加熱温度が高すぎたり加熱時間が長すぎると絶縁層が損傷する可能性がある。 When heat is applied to the coating layer, the coating layer is heated to a temperature of about 80 to 250 ° C., preferably about 100 to 230 ° C., and maintained for about 5 to 120 minutes, preferably about 10 to 60 minutes. If the heating temperature is too low or the heating time is too short, the insulating layer is not sufficiently crosslinked, and if the heating temperature is too high or the heating time is too long, the insulating layer may be damaged.
 塗布層に電磁波を照射する場合、絶縁層の架橋及び損傷の度合いを考慮して、照射条件を調節する。マイクロ波を印加して加熱する場合は、絶縁層の架橋が及び損傷の度合いを考慮して印加条件を調節する。 When irradiating the coating layer with electromagnetic waves, the irradiation conditions are adjusted in consideration of the degree of crosslinking and damage of the insulating layer. In the case of heating by applying a microwave, the application condition is adjusted in consideration of the cross-linking of the insulating layer and the degree of damage.
 照射する電磁波の波長は450nm以下が好ましく、より好ましくは150~410nmである。照射する電磁波の波長が450nmを越えると有機薄膜トランジスタ絶縁層材料の架橋が不十分になる場合がある。電磁波としては、紫外線が好ましい。 The wavelength of the electromagnetic wave to be irradiated is preferably 450 nm or less, more preferably 150 to 410 nm. When the wavelength of the electromagnetic wave to be irradiated exceeds 450 nm, the organic thin film transistor insulating layer material may be insufficiently crosslinked. As electromagnetic waves, ultraviolet rays are preferable.
 紫外線の照射は、例えば、半導体の製造のために使用されている露光装置やUV硬化性樹脂を硬化させるために使用されているUVランプを用いて行うことができる。電子線の照射は、例えば、超小型電子線照射管を用いて行うことができる。加熱はヒーター及びオーブンなどを用いて行うことができる。その他の照射条件及び加熱条件は、光二量化反応基の種類及び量等に応じて適宜決定される。 Irradiation with ultraviolet rays can be performed using, for example, an exposure apparatus used for manufacturing a semiconductor or a UV lamp used for curing a UV curable resin. The electron beam irradiation can be performed using, for example, a micro electron beam irradiation tube. Heating can be performed using a heater, an oven, or the like. Other irradiation conditions and heating conditions are appropriately determined according to the type and amount of the photodimerization reactive group.
 ゲート絶縁層上には、自己組織化単分子膜層を形成してもよい。該自己組織化単分子膜層は、例えば、有機溶媒中にアルキルクロロシラン化合物もしくはアルキルアルコキシシラン化合物を1~10重量%溶解した溶液でゲート絶縁層を処理することにより形成することが出来る。 A self-assembled monolayer may be formed on the gate insulating layer. The self-assembled monolayer can be formed, for example, by treating the gate insulating layer with a solution obtained by dissolving 1 to 10% by weight of an alkylchlorosilane compound or an alkylalkoxysilane compound in an organic solvent.
 アルキルクロロシラン化合物の例としては、メチルトリクロロシラン、エチルトリクロロシラン、ブチルトリクロロシラン、デシルトリクロロシラン、オクタデシルトリクロロシランが挙げられる。 Examples of the alkylchlorosilane compound include methyltrichlorosilane, ethyltrichlorosilane, butyltrichlorosilane, decyltrichlorosilane, and octadecyltrichlorosilane.
 アルキルアルコキシシラン化合物の例としては、メチルトリメトキシシラン、エチルトリメトキシシラン、ブチルトリメトキシシラン、デシルトリメトキシシラン、オクタデシルトリメトキシシランが挙げられる。 Examples of the alkylalkoxysilane compound include methyltrimethoxysilane, ethyltrimethoxysilane, butyltrimethoxysilane, decyltrimethoxysilane, and octadecyltrimethoxysilane.
 基板1、ゲート電極2、ソース電極5、ドレイン電極6及び有機半導体層4は、通常使用される材料及び方法で構成すればよい。基板の材料には樹脂やプラスチックの板やフィルム、ガラス板、シリコン板などが用いられる。電極の材料には、クロム、金、銀、アルミニウム、モリブデン等を用い、蒸着法、スパッタ法、印刷法、インクジェット法等の公知の方法で電極を形成する。 The substrate 1, gate electrode 2, source electrode 5, drain electrode 6 and organic semiconductor layer 4 may be composed of commonly used materials and methods. Resin or plastic plates, films, glass plates, silicon plates, etc. are used as the material of the substrate. As the electrode material, chromium, gold, silver, aluminum, molybdenum, or the like is used, and the electrode is formed by a known method such as a vapor deposition method, a sputtering method, a printing method, or an ink jet method.
 有機半導体層4を形成するための有機半導体化合物としてはπ共役ポリマーが用いられ、例えば、ポリピロール類、ポリチオフェン類、ポリアニリン類、ポリアリルアミン類、フルオレン類、ポリカルバゾール類、ポリインドール類、ポリ(P-フェニレンビニレン)類などを用いることができる。また、有機溶媒への溶解性を有する低分子物質、例えば、ペンタセンなどの多環芳香族の誘導体、フタロシアニン誘導体、ペリレン誘導体、テトラチアフルバレン誘導体、テトラシアノキノジメタン誘導体、フラーレン類、カーボンナノチューブ類などを用いることができる。具体的には、2,1,3-ベンゾチアジアゾール-4,7-ジ(エチレンボロネート)と、2,6-ジブロモ-(4,4-ビス-ヘキサデカニル-4H-シクロペンタ[2,1-b;3,4-b’]-ジチオフェンとの縮合物、9,9-ジ-n-オクチルフルオレン-2,7-ジ(エチレンボロネート)と、5,5’-ジブロモ-2,2’-バイチオフェンとの縮合物等があげられる。 As the organic semiconductor compound for forming the organic semiconductor layer 4, a π-conjugated polymer is used. For example, polypyrroles, polythiophenes, polyanilines, polyallylamines, fluorenes, polycarbazoles, polyindoles, poly (P -Phenylene vinylene) and the like can be used. In addition, low-molecular substances having solubility in organic solvents, for example, polycyclic aromatic derivatives such as pentacene, phthalocyanine derivatives, perylene derivatives, tetrathiafulvalene derivatives, tetracyanoquinodimethane derivatives, fullerenes, carbon nanotubes Etc. can be used. Specifically, 2,1,3-benzothiadiazole-4,7-di (ethylene boronate) and 2,6-dibromo- (4,4-bis-hexadecanyl-4H-cyclopenta [2,1-b Condensate with 3,4-b ′]-dithiophene, 9,9-di-n-octylfluorene-2,7-di (ethylene boronate) and 5,5′-dibromo-2,2′-; Examples thereof include condensates with bithiophene.
 有機半導体層の形成は、例えば、有機半導体化合物に要すれば溶媒などを添加して有機半導体塗布液を調製し、該有機半導体塗布液をゲート絶縁層上に塗布し、該有機半導体塗布液を乾燥させることにより行う。本発明では、ゲート絶縁層を構成する樹脂がベンゼン環を有し、有機半導体化合物と親和性がある。それゆえ、上記塗布乾燥法によって、有機半導体層とゲート絶縁層との間に均一で平坦な界面が形成される。 The organic semiconductor layer can be formed, for example, by adding a solvent or the like if necessary for the organic semiconductor compound, preparing an organic semiconductor coating solution, applying the organic semiconductor coating solution on the gate insulating layer, and applying the organic semiconductor coating solution to the organic semiconductor coating solution. This is done by drying. In the present invention, the resin constituting the gate insulating layer has a benzene ring and has an affinity for an organic semiconductor compound. Therefore, a uniform and flat interface is formed between the organic semiconductor layer and the gate insulating layer by the coating and drying method.
 有機半導体塗布液に使用される溶媒としては、有機半導体を溶解又は分散させるものであれば特に制限は無いが、好ましくは、常圧での沸点が50℃~200℃の溶媒である。該溶媒の例としては、クロロホルム、トルエン、アニソール、2-ヘプタノン、プロピレングリコールモノメチルエーテルアセテートが挙げられる。該有機半導体塗布液は、前記絶縁層塗布液と同様にスピンコート、ダイコーター、スクリーン印刷、インクジェット等の公知の方法によりゲート絶縁層上に塗布することができる。 The solvent used in the organic semiconductor coating solution is not particularly limited as long as it dissolves or disperses the organic semiconductor, but is preferably a solvent having a boiling point of 50 ° C. to 200 ° C. at normal pressure. Examples of the solvent include chloroform, toluene, anisole, 2-heptanone, and propylene glycol monomethyl ether acetate. The organic semiconductor coating liquid can be applied onto the gate insulating layer by a known method such as spin coating, die coater, screen printing, and ink jet as in the case of the insulating layer coating liquid.
 本発明の有機薄膜トランジスタは、有機薄膜トランジスタを保護し、また、表面の平滑性を高める目的で、オーバーコート材でコートしてもよい。 The organic thin film transistor of the present invention may be coated with an overcoat material for the purpose of protecting the organic thin film transistor and improving the smoothness of the surface.
 本発明の有機薄膜トランジスタ絶縁層材料を用いて製造した絶縁層は、その上に平坦な膜等を積層することができ、積層構造を容易に形成することができる。また、該絶縁層上に有機エレクトロルミネッセンス素子を好適に搭載することができる。 The insulating layer manufactured using the organic thin film transistor insulating layer material of the present invention can be laminated with a flat film or the like, and a laminated structure can be easily formed. Moreover, an organic electroluminescent element can be suitably mounted on the insulating layer.
 本発明の有機薄膜トランジスタ絶縁層材料を用いて、好適に有機薄膜トランジスタを有するディスプレイ用部材を作製できる。該有機薄膜トランジスタを有するディスプレイ用部材を用いて、ディスプレイ用部材を備えるディスプレイを作製できる。 A display member having an organic thin film transistor can be suitably produced using the organic thin film transistor insulating layer material of the present invention. A display provided with a display member can be manufactured using the display member having the organic thin film transistor.
 本発明の有機薄膜トランジスタ絶縁層材料は、絶縁層以外のトランジスタに含まれる層、有機エレクトロルミネッセンス素子に含まれる層を形成する用途にも用いることができる。 The organic thin film transistor insulating layer material of the present invention can also be used for forming a layer included in a transistor other than an insulating layer and a layer included in an organic electroluminescence element.
 以下、本発明を実施例により説明するが、本発明が実施例により限定されるものではないことは言うまでもない。 Hereinafter, the present invention will be described with reference to examples, but it goes without saying that the present invention is not limited to the examples.
 合成例1
(化合物1の合成)
 水分トラップ、攪拌子を入れた500mlのナスフラスコに、1-シクロヘキセン-1,2-ジカルボン酸無水物(東京化成製)を25g、3-アミノプロパノールを12g、トルエンを200ml入れ、オイルバス中で140℃で4時間反応させた。反応終了後、反応混合物をロータリーエバポレーターで濃縮し、ジエチルエーテル(和光純薬製)を100ml加えた。得られたジエチルエーテル溶液を分液ロートに移し、炭酸ナトリウム水溶液で洗浄した後、水層が中性になるまで水洗し、分液した。有機層を無水硫酸マグネシウムで乾燥させた後、固形物をろ別し、ろ液をロータリーエバポレーターで濃縮し、黄褐色の粘稠な液体である化合物1を得た。
Synthesis example 1
(Synthesis of Compound 1)
In a 500 ml eggplant flask containing a water trap and stirrer, 25 g of 1-cyclohexene-1,2-dicarboxylic anhydride (manufactured by Tokyo Chemical Industry), 12 g of 3-aminopropanol, and 200 ml of toluene are placed in an oil bath. The reaction was carried out at 140 ° C. for 4 hours. After completion of the reaction, the reaction mixture was concentrated with a rotary evaporator, and 100 ml of diethyl ether (manufactured by Wako Pure Chemical Industries) was added. The obtained diethyl ether solution was transferred to a separatory funnel, washed with an aqueous sodium carbonate solution, and then washed with water until the aqueous layer became neutral and separated. After the organic layer was dried over anhydrous magnesium sulfate, the solid was filtered off and the filtrate was concentrated with a rotary evaporator to obtain Compound 1 as a tan viscous liquid.
Figure JPOXMLDOC01-appb-C000010
 化合物1
Figure JPOXMLDOC01-appb-C000010
Compound 1
(化合物2の合成)
 三方コックを取り付けた1Lの三口フラスコに、化合物1を26.18g、メタクリル酸を11.31g、N,N’-ジシクロヘキシルカルボジイミド(和光純薬製)を27.10g、4-ジメチルアミノピリジン(和光純薬製)を触媒量、1,4-ジオキサンを400ml入れ、窒素雰囲気下で24時間攪拌して反応させた。
(Synthesis of Compound 2)
In a 1 L three-necked flask equipped with a three-way cock, 26.18 g of Compound 1, 11.31 g of methacrylic acid, 27.10 g of N, N′-dicyclohexylcarbodiimide (manufactured by Wako Pure Chemical Industries), 4-dimethylaminopyridine (Japanese) 400 ml of 1,4-dioxane was added and the reaction was allowed to stir for 24 hours under a nitrogen atmosphere.
 反応終了後、析出物をろ別し、ろ液をロータリーエバポレーターで濃縮し、ジエチルエーテル(和光純薬製)を100ml加えた。得られたジエチルエーテル溶液を分液ロートに移し、炭酸ナトリウム水溶液で洗浄した後、水層が中性になるまで水洗し、分液した。
有機層を無水硫酸マグネシウムで乾燥させた後、固形物をろ別し、ろ液をロータリーエバポレーターで濃縮し、黄褐色の粘稠な液体である化合物2を得た。
After completion of the reaction, the precipitate was filtered off, the filtrate was concentrated with a rotary evaporator, and 100 ml of diethyl ether (manufactured by Wako Pure Chemical Industries) was added. The obtained diethyl ether solution was transferred to a separatory funnel, washed with an aqueous sodium carbonate solution, and then washed with water until the aqueous layer became neutral and separated.
After the organic layer was dried over anhydrous magnesium sulfate, the solid was filtered off and the filtrate was concentrated with a rotary evaporator to obtain Compound 2 as a tan viscous liquid.
Figure JPOXMLDOC01-appb-C000011
  化合物2
Figure JPOXMLDOC01-appb-C000011
Compound 2
(高分子化合物3の合成)
 50ml耐圧容器(エース製)に、2,3,4,5,6-ペンタフルオロスチレン(アルドリッチ製)を2.00g、アミノスチレン(東京化成製)を0.82g、2-(O-[1’-メチルプロピリデンアミノ]カルボキシアミノ)エチル-メタクリレート(昭和電工製、商品名「カレンズMOI-BM」)を1.65g、化合物2を2.86g、2,2’-アゾビス(2-メチルプロピオニトリル)を0.04g、プロピレングリコールモノメチルエーテルアセテート(和光純薬製)を17.17g入れ、アルゴンガスをバブリングした後、密栓した。60℃のオイルバス中で20時間重合させ、高分子化合物3が溶解している粘稠なプロピレングリコールモノメチルエーテルアセテート溶液を得た。高分子化合物3は、下記繰り返し単位を有している。括弧の添え数字は繰り返し単位のモル分率を示している。
(Synthesis of polymer compound 3)
In a 50 ml pressure vessel (Ace), 2.00 g of 2,3,4,5,6-pentafluorostyrene (Aldrich), 0.82 g of aminostyrene (Tokyo Kasei), 2- (O- [1 1.65 g of '-methylpropylideneamino] carboxyamino) ethyl-methacrylate (manufactured by Showa Denko, trade name “Karenz MOI-BM”), 2.86 g of compound 2, 2,2′-azobis (2-methylpro 0.04 g of (pionitrile) and 17.17 g of propylene glycol monomethyl ether acetate (manufactured by Wako Pure Chemical Industries, Ltd.) were added, and after argon gas was bubbled, it was sealed. Polymerization was performed in an oil bath at 60 ° C. for 20 hours to obtain a viscous propylene glycol monomethyl ether acetate solution in which the polymer compound 3 was dissolved. The high molecular compound 3 has the following repeating unit. The numbers in parentheses indicate the mole fraction of repeating units.
Figure JPOXMLDOC01-appb-C000012
   高分子化合物3
Figure JPOXMLDOC01-appb-C000012
Polymer compound 3
 得られた高分子化合物3の標準ポリスチレンから求めた重量平均分子量は、50000であった(島津製GPC、Tskgel super HM-H 1本+Tskgel super H2000 1本、移動相=THF)。 The weight average molecular weight obtained from the standard polystyrene of the obtained polymer compound 3 was 50,000 (GPC manufactured by Shimadzu, one Tskel super HM-H + one Tskel super H2000, mobile phase = THF).
 合成例2
(高分子化合物4の合成)
 2,1,3-ベンゾチアジアゾール-4,7-ジ(エチレンボロネート)を1.88g、及び2,6-ジブロモ-(4,4-ビス-ヘキサデカニル-4H-シクロペンタ[2,1-b;3,4-b’]-ジチオフェンを3.81g含むトルエン(80mL)中に、窒素下において、テトラキス(トリフェニルホスフィン)パラジウムを0.75g、メチルトリオクチルアンモニウムクロライド(Aldrich製、商品名「Aliquat 336」(登録商標))を1.0g、及び2Mの炭酸ナトリウム水溶液を24mL加えた。この混合物を激しく攪拌し、加熱して24時間還流した。粘稠な反応混合物をアセトン500mLに注ぎ、繊維状の黄色のポリマーを沈澱させた。このポリマーを濾過によって集め、アセトンで洗浄し、真空オーブンにおいて60℃で一晩乾燥させた。得られたポリマーを高分子化合物4とよぶ。高分子化合物4は、下記繰り返し単位を有している。nは繰り返し単位の数を示している。
Synthesis example 2
(Synthesis of polymer compound 4)
1.88 g of 2,1,3-benzothiadiazole-4,7-di (ethylene boronate) and 2,6-dibromo- (4,4-bis-hexadecanyl-4H-cyclopenta [2,1-b; In toluene (80 mL) containing 3.81 g of 3,4-b ′]-dithiophene, under nitrogen, 0.75 g of tetrakis (triphenylphosphine) palladium, methyltrioctylammonium chloride (manufactured by Aldrich, trade name “Aliquat”) 336 "(R)) and 24 mL of 2M aqueous sodium carbonate solution were added. The mixture was stirred vigorously and heated to reflux for 24 hours. The viscous reaction mixture was poured into 500 mL of acetone and mixed with A yellow polymer was precipitated which was collected by filtration, washed with acetone and vacuum oven And dried overnight at Oite 60 ° C.. The resulting polymer is called polymer compound 4. Polymer Compound 4, .n which has the following repeating unit represents the number of repeating units.
Figure JPOXMLDOC01-appb-C000013
  高分子化合物4
Figure JPOXMLDOC01-appb-C000013
Polymer compound 4
 高分子化合物4の標準ポリスチレンから求めた重量平均分子量は、32000であった(島津製GPC、Tskgel super HM-H 1本+Tskgel super H2000 1本、移動相=THF)。 The weight average molecular weight obtained from the standard polystyrene of the polymer compound 4 was 32000 (GPC manufactured by Shimadzu, one Tskel super HM-H + one Tskel super H2000, mobile phase = THF).
 実施例1
(有機薄膜トランジスタ絶縁層材料及び電界効果型有機薄膜トランジスタの製造)
 10mlのサンプル瓶に、合成例1で得た高分子化合物3のプロピレングリコールモノメチルエーテルアセテート溶液を2.00g、プロピレングリコールモノメチルエーテルアセテートを2.00g入れ、攪拌しながら溶解して、有機薄膜トランジスタ絶縁層材料である均一な塗布溶液1を調製した。
Example 1
(Production of organic thin film transistor insulating layer material and field effect organic thin film transistor)
Into a 10 ml sample bottle, 2.00 g of the propylene glycol monomethyl ether acetate solution of the polymer compound 3 obtained in Synthesis Example 1 and 2.00 g of propylene glycol monomethyl ether acetate are added and dissolved while stirring. A uniform coating solution 1 as a material was prepared.
 得られた塗布溶液を孔径0.2μmのメンブレンフィルターを用いてろ過し、クロム電極のついたガラス基板上にスピンコートした後、ホットプレート上で100℃で1分間乾燥させた。その後、アライナー(Canon製;PLA-521)を用いて1600mJ/cmのUV光(波長365nm)を照射した後、窒素中、ホットプレート上で200℃で30分間焼成してゲート絶縁層を得た。 The obtained coating solution was filtered using a membrane filter having a pore diameter of 0.2 μm, spin-coated on a glass substrate with a chromium electrode, and then dried on a hot plate at 100 ° C. for 1 minute. Then, after irradiating UV light (wavelength 365 nm) of 1600 mJ / cm 2 using an aligner (manufactured by Canon; PLA-521), the gate insulating layer is obtained by baking at 200 ° C. for 30 minutes on a hot plate in nitrogen. It was.
 次に、高分子化合物4を溶媒であるキシレンに溶解して、濃度が0.5重量%である溶液(有機半導体組成物)を作製し、これをメンブランフィルターでろ過して塗布液を調製した。 Next, the polymer compound 4 was dissolved in xylene as a solvent to prepare a solution (organic semiconductor composition) having a concentration of 0.5% by weight, and this was filtered through a membrane filter to prepare a coating solution. .
 得られた塗布液を、前記ゲート絶縁層上にスピンコート法により塗布し、約30nmの厚さを有する活性層を形成し、次いで、メタルマスクを用いた真空蒸着法により、活性層上に、チャネル長20μm、チャネル幅2mmのソース電極及びドレイン電極(活性層側から、酸化モリブデン、金の順番で積層構造を有する)を形成することにより、電界効果型有機薄膜トランジスタを作製した。 The obtained coating solution is applied on the gate insulating layer by a spin coating method to form an active layer having a thickness of about 30 nm, and then, on the active layer by a vacuum deposition method using a metal mask, A field effect organic thin film transistor was manufactured by forming a source electrode and a drain electrode (having a laminated structure in the order of molybdenum oxide and gold from the active layer side) having a channel length of 20 μm and a channel width of 2 mm.
<トランジスタ特性の評価>
 こうして作製した電界効果型有機薄膜トランジスタについて、ゲート電圧Vgを20~-40V、ソース・ドレイン間電圧Vsdを0~-40Vに変化させた条件で、そのトランジスタ特性を真空プロ-バ(BCT22MDC-5-HT-SCU;Nagase Electronic Equipment
s Service Co., LTD製)を用いて測定した。結果を表1に示す。
<Evaluation of transistor characteristics>
The field effect organic thin film transistor thus fabricated has the transistor characteristics of a vacuum probe (BCT22MDC-5-5) under the condition that the gate voltage Vg is changed to 20 to -40V and the source-drain voltage Vsd is changed to 0 to -40V. HT-SCU; Nagase Electronic Equipment
s Service Co., LTD). The results are shown in Table 1.
 電界効果型有機薄膜トランジスタのヒステリシスは、ソース・ドレイン間電圧Vsdが-40Vで、ゲート電圧Vgを20V→-40Vに変化させた際の閾値電圧Vth1とゲート電圧Vgを-40V→20Vに変化させた際の閾値電圧Vth2との電圧差異で表した。 The hysteresis of the field effect organic thin film transistor is that the source-drain voltage Vsd is −40 V, and the threshold voltage Vth1 and the gate voltage Vg are changed from −40 V to 20 V when the gate voltage Vg is changed from 20 V to −40 V. It was expressed as a voltage difference from the threshold voltage Vth2.
 比較例1
(電界効果型有機薄膜トランジスタの製造)
 10mlのサンプル瓶に、ポリビニルフェノール-コ-ポリメチルメタクリレート(アルドリッチ製、Mn=6700)を1.00g、N,N,N’,N’,N”,N”-ヘキサメトキシメチルメラミン(住友化学製)を0.163g、熱酸発生剤(みどり化学(株)製、商品名:TAZ-108)を0.113g、2-ヘプタノンを7.00g入れ、攪拌溶解して均一な塗布溶液2を調製した。
Comparative Example 1
(Manufacture of field-effect organic thin-film transistors)
In a 10 ml sample bottle, 1.00 g of polyvinylphenol-co-polymethyl methacrylate (manufactured by Aldrich, Mn = 6700), N, N, N ′, N ′, N ″, N ″ -hexamethoxymethylmelamine (Sumitomo Chemical) Product) 0.163 g, thermal acid generator (manufactured by Midori Chemical Co., Ltd., trade name: TAZ-108) 0.113 g, 2-heptanone 7.00 g, stirred and dissolved to obtain a uniform coating solution 2 Prepared.
 塗布溶液1に代えて塗布溶液2を用い、ゲート絶縁層の形成時にUV照射を行わない以外は実施例1と同様にして電界効果型有機薄膜トランジスタを作製した。トランジスタ特性を測定し、評価したところ、ゲート電圧Vgが20V~―40Vの領域ではトランジスタと
して動作しなかった。
A field effect organic thin film transistor was produced in the same manner as in Example 1 except that the coating solution 2 was used in place of the coating solution 1 and UV irradiation was not performed when forming the gate insulating layer. When the transistor characteristics were measured and evaluated, it did not operate as a transistor in the region where the gate voltage Vg was 20V to -40V.
Figure JPOXMLDOC01-appb-T000014
Figure JPOXMLDOC01-appb-T000014
 1…基板、
 2…ゲート電極、
 3…ゲート絶縁層、
 4…有機半導体層、
 5…ソース電極、
 6…ドレイン電極、
 7…オーバーコート。
1 ... substrate,
2 ... Gate electrode,
3 ... gate insulating layer,
4 ... Organic semiconductor layer,
5 ... Source electrode,
6 ... drain electrode,
7 ... Overcoat.

Claims (14)

  1.  式(1)
    Figure JPOXMLDOC01-appb-C000001
    [式中、R2は、水素原子又はメチル基を表す。R及びRは、それぞれ独立に、炭素数1~20の一価の有機基を表す。該一価の有機基中の水素原子は、フッ素原子で置換されていてもよい。R中の炭素原子とR中の炭素原子とが結合し、5員環又は6員環を形成してもよい。Rbbは、高分子化合物の主鎖と側鎖とを連結し、フッ素原子を有していてもよい連結部分を表す。cは、0または1の整数を表す。]
    で表される繰り返し単位と、第1の官能基を含有する繰り返し単位とを有し、該第1の官能基が、電磁波もしくは熱の作用により、活性水素と反応する第2の官能基を生成する官能基である高分子化合物(A)を含有する有機薄膜トランジスタ絶縁層材料。
    Formula (1)
    Figure JPOXMLDOC01-appb-C000001
    [Wherein R 2 represents a hydrogen atom or a methyl group. R 3 and R 4 each independently represents a monovalent organic group having 1 to 20 carbon atoms. A hydrogen atom in the monovalent organic group may be substituted with a fluorine atom. The carbon atom in R 3 and the carbon atom in R 4 may be bonded to form a 5-membered ring or a 6-membered ring. R bb represents a connecting part that connects the main chain and the side chain of the polymer compound and may have a fluorine atom. c represents an integer of 0 or 1. ]
    And a second functional group containing a first functional group, and the first functional group generates a second functional group that reacts with active hydrogen by the action of electromagnetic waves or heat. Organic thin-film transistor insulating-layer material containing the high molecular compound (A) which is a functional group to do.
  2.  前記高分子化合物(A)が、さらに式(2)
    Figure JPOXMLDOC01-appb-C000002
    [式中、Rは、水素原子又はメチル基を表す。Rは、水素原子又は炭素数1~20の一価の有機基を表す。Rfは、フッ素原子又はフッ素原子を有する炭素数1~20の一価の有機基を表す。Raaは、高分子化合物の主鎖と側鎖とを連結し、フッ素原子を有していてもよい連結部分を表す。uは、0または1の整数を表し、bは、1~5の整数を表す。Rが複数個ある場合、それらは同一でも相異なっていてもよい。Rfが複数個ある場合、それらは同一でも相異なっていてもよい。]
    で表される繰り返し単位を有する請求項1に記載の有機薄膜トランジスタ絶縁層材料。
    The polymer compound (A) is further represented by the formula (2)
    Figure JPOXMLDOC01-appb-C000002
    [Wherein, R 1 represents a hydrogen atom or a methyl group. R represents a hydrogen atom or a monovalent organic group having 1 to 20 carbon atoms. Rf represents a fluorine atom or a monovalent organic group having 1 to 20 carbon atoms having a fluorine atom. R aa represents a connecting portion that connects the main chain and the side chain of the polymer compound and may have a fluorine atom. u represents an integer of 0 or 1, and b represents an integer of 1 to 5. When there are a plurality of R, they may be the same or different. When there are a plurality of Rf, they may be the same or different. ]
    The organic thin-film transistor insulating-layer material of Claim 1 which has a repeating unit represented by these.
  3.  前記第1の官能基が、ブロック化剤でブロックされたイソシアナト基及びブロック化剤でブロックされたイソチオシアナト基からなる群から選ばれる少なくとも1種の基である請求項1又は2に記載の有機薄膜トランジスタ絶縁層材料。 3. The organic thin film transistor according to claim 1, wherein the first functional group is at least one group selected from the group consisting of an isocyanato group blocked with a blocking agent and an isothiocyanate group blocked with a blocking agent. Insulating layer material.
  4.  前記ブロック化剤でブロックされたイソシアナト基及びブロック化剤でブロックされたイソチオシアナト基が、式(3)
    Figure JPOXMLDOC01-appb-C000003
       (3)
    [式中、Xaは、酸素原子又は硫黄原子を表し、R及びRは、同一又は相異なり、水素原子又は炭素数1~20の一価の有機基を表す。]
    で表される基である請求項3に記載の有機薄膜トランジスタ絶縁層材料。
    The isocyanato group blocked with the blocking agent and the isothiocyanato group blocked with the blocking agent are represented by the formula (3):
    Figure JPOXMLDOC01-appb-C000003
    (3)
    [Wherein, Xa represents an oxygen atom or a sulfur atom, and R 5 and R 6 are the same or different and represent a hydrogen atom or a monovalent organic group having 1 to 20 carbon atoms. ]
    The organic thin film transistor insulating layer material according to claim 3, which is a group represented by:
  5.  ブロック化剤でブロックされたイソシアナト基及びブロック化剤でブロックされたイソチオシアナト基が、式(4)
    Figure JPOXMLDOC01-appb-C000004
       (4)
    [式中、Xbは、酸素原子又は硫黄原子を表し、R~Rは、同一又は相異なり、水素原子又は炭素数1~20の一価の有機基を表す。]
    で表される基である請求項3に記載の有機薄膜トランジスタ絶縁層材料。
    An isocyanato group blocked with a blocking agent and an isothiocyanato group blocked with a blocking agent are represented by the formula (4):
    Figure JPOXMLDOC01-appb-C000004
    (4)
    [Wherein, Xb represents an oxygen atom or a sulfur atom, and R 7 to R 9 are the same or different and each represents a hydrogen atom or a monovalent organic group having 1 to 20 carbon atoms. ]
    The organic thin film transistor insulating layer material according to claim 3, which is a group represented by:
  6.  前記高分子化合物(A)が、さらに、活性水素を1個有する構造単位を2個以上、又は、活性水素を2個以上有する構造単位を含む請求項1~5のいずれか一項に記載の有機薄膜トランジスタ絶縁層材料。 6. The polymer compound (A) according to any one of claims 1 to 5, further comprising two or more structural units having one active hydrogen or a structural unit having two or more active hydrogens. Organic thin film transistor insulating layer material.
  7.  さらに、活性水素を2個以上含有する低分子化合物である活性水素化合物及び活性水素を2個以上含有する高分子化合物である活性水素化合物からなる群から選ばれる少なくとも1種の活性水素化合物を含有する請求項1~6のいずれか一項に記載の有機薄膜トランジスタ絶縁層材料。 Furthermore, it contains at least one active hydrogen compound selected from the group consisting of an active hydrogen compound which is a low molecular compound containing two or more active hydrogens and an active hydrogen compound which is a polymer compound containing two or more active hydrogens The organic thin film transistor insulating layer material according to any one of claims 1 to 6.
  8.  請求項1~7のいずれか一項に記載の有機薄膜トランジスタ絶縁層材料を含む液を基材に塗布して該基材上に塗布層を形成する工程;及び
     該塗布層に電磁波又は電子線を照射する工程;
    を包含する有機薄膜トランジスタ絶縁層の形成方法。
    A step of applying a liquid containing the organic thin film transistor insulating layer material according to any one of claims 1 to 7 to a substrate to form a coating layer on the substrate; and electromagnetic waves or electron beams to the coating layer Irradiating;
    A method for forming an organic thin film transistor insulating layer comprising:
  9.  請求項1~7のいずれか一項に記載の有機薄膜トランジスタ絶縁層材料を含む液を基材に塗布して該基材上に塗布層を形成する工程;
     該塗布層に電磁波又は電子線を照射する工程;及び
     該塗布層に熱を印加する工程;
    を包含する有機薄膜トランジスタ絶縁層の形成方法。
    Applying a liquid containing the organic thin film transistor insulating layer material according to any one of claims 1 to 7 to a substrate to form a coating layer on the substrate;
    Irradiating the coating layer with electromagnetic waves or electron beams; and applying heat to the coating layer;
    A method for forming an organic thin film transistor insulating layer comprising:
  10.  前記電磁波が紫外線である請求項8又は9に記載の有機薄膜トランジスタ絶縁層の形成方法。 The method for forming an organic thin film transistor insulating layer according to claim 8 or 9, wherein the electromagnetic wave is ultraviolet light.
  11.  請求項1~7のいずれか一項に記載の有機薄膜トランジスタ絶縁層材料を用いて形成した有機薄膜トランジスタ絶縁層を有する有機薄膜トランジスタ。 An organic thin film transistor having an organic thin film transistor insulating layer formed using the organic thin film transistor insulating layer material according to any one of claims 1 to 7.
  12.  前記有機薄膜トランジスタ絶縁層がゲート絶縁層である請求項11に記載の有機薄膜トランジスタ。 The organic thin film transistor according to claim 11, wherein the organic thin film transistor insulating layer is a gate insulating layer.
  13.  請求項11又は12記載の有機薄膜トランジスタを含むディスプレイ用部材。 A display member comprising the organic thin film transistor according to claim 11.
  14.  請求項13に記載のディスプレイ用部材を含むディスプレイ。 A display comprising the display member according to claim 13.
PCT/JP2012/052356 2011-02-07 2012-02-02 Light and heat energy cross-linkable organic thin film transistor insulation layer material WO2012108326A1 (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2908608A4 (en) * 2012-10-15 2016-06-29 Sumitomo Chemical Co Method for manufacturing electronic device

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007111168A1 (en) * 2006-03-29 2007-10-04 Sumitomo Bakelite Company, Ltd. Resin composition, varnish, resin film, and semiconductor device using the resin film
JP2007301551A (en) * 2006-04-12 2007-11-22 Sumitomo Bakelite Co Ltd Production method of resin film, resin film and semiconductor device
WO2008016110A1 (en) * 2006-08-04 2008-02-07 Mitsubishi Chemical Corporation Insulating layer, electronic device, field effect transistor, and polyvinylthiophenol
WO2010024238A1 (en) * 2008-08-28 2010-03-04 住友化学株式会社 Resin composition, gate insulating layer and organic thin film transistor

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007111168A1 (en) * 2006-03-29 2007-10-04 Sumitomo Bakelite Company, Ltd. Resin composition, varnish, resin film, and semiconductor device using the resin film
JP2007301551A (en) * 2006-04-12 2007-11-22 Sumitomo Bakelite Co Ltd Production method of resin film, resin film and semiconductor device
WO2008016110A1 (en) * 2006-08-04 2008-02-07 Mitsubishi Chemical Corporation Insulating layer, electronic device, field effect transistor, and polyvinylthiophenol
WO2010024238A1 (en) * 2008-08-28 2010-03-04 住友化学株式会社 Resin composition, gate insulating layer and organic thin film transistor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2908608A4 (en) * 2012-10-15 2016-06-29 Sumitomo Chemical Co Method for manufacturing electronic device
US9437821B2 (en) 2012-10-15 2016-09-06 Sumitomo Chemical Company, Limited Method for manufacturing electronic device

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