WO2012074287A3 - Adc for removing column fixed pattern noise and cmos image sensor including same - Google Patents
Adc for removing column fixed pattern noise and cmos image sensor including same Download PDFInfo
- Publication number
- WO2012074287A3 WO2012074287A3 PCT/KR2011/009198 KR2011009198W WO2012074287A3 WO 2012074287 A3 WO2012074287 A3 WO 2012074287A3 KR 2011009198 W KR2011009198 W KR 2011009198W WO 2012074287 A3 WO2012074287 A3 WO 2012074287A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- bit
- memory
- sync
- adc
- output value
- Prior art date
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Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/63—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/50—Analogue/digital converters with intermediate conversion to time interval
- H03M1/56—Input signal compared with linear ramp
Abstract
The present invention relates to an ADC for removing fixed pattern noise, in which the ADC comprises: a comparison unit which compares an input voltage (VIN) with a ramp input increasing with a constant slope according to time, and outputs the comparison result to a sync-shift block unit; the sync-shift block unit which shifts a sync signal, on the basis of information for C-FPN removal received from a memory for C-FPN removal and the comparison result of the comparison unit; an n-bit counter which outputs an n-bit digital counter output value to an n-bit memory or a memory for C-FPN removal; the n-bit memory which stores the digital counter output value of the n-bit counter using the shifted sync signal; and the memory for C-FPN removal which provides the sync-shift block unit with the digital counter output value of the n-bit counter corresponding to a reference voltage, wherein the sync signal is a signal used to determine the digital counter output value of the n-bit counter. A difference of conversion characteristics between column ADCs is solved, so that the C-FPN characteristic in a CIS can be removed to implement an improved image.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2010-0122859 | 2010-12-03 | ||
KR1020100122859A KR101211082B1 (en) | 2010-12-03 | 2010-12-03 | ADC for cancelling column fixed pattern noise and CMOS image sensor using it |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2012074287A2 WO2012074287A2 (en) | 2012-06-07 |
WO2012074287A3 true WO2012074287A3 (en) | 2012-10-11 |
Family
ID=46172397
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/KR2011/009198 WO2012074287A2 (en) | 2010-12-03 | 2011-11-30 | Adc for removing column fixed pattern noise and cmos image sensor including same |
Country Status (2)
Country | Link |
---|---|
KR (1) | KR101211082B1 (en) |
WO (1) | WO2012074287A2 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102195409B1 (en) | 2014-05-29 | 2020-12-30 | 삼성전자주식회사 | Device and method for lamp signal calibration and image sensor using the same |
KR102261595B1 (en) | 2014-09-19 | 2021-06-04 | 삼성전자주식회사 | An image sensor, and an image processing system including the same |
KR102292137B1 (en) | 2015-01-09 | 2021-08-20 | 삼성전자주식회사 | Image sensor, and image processing system including the same |
KR20160123708A (en) | 2015-04-17 | 2016-10-26 | 에스케이하이닉스 주식회사 | Image sensing device |
CN111372016B (en) * | 2020-04-14 | 2022-07-01 | 上海微阱电子科技有限公司 | Image sensor for reducing column fixed pattern noise |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20060052524A (en) * | 2004-11-08 | 2006-05-19 | 소니 가부시끼 가이샤 | Analog-to-digital conversion method, analog-to-digital converter, semiconductor device for detecting distribution of physical quantity, and electronic apparatus |
KR20080022887A (en) * | 2006-09-08 | 2008-03-12 | 삼성전자주식회사 | Correlated double sampling and analogue to digital converting apparatus using multiple sampling in cmos image sensor |
JP2009089066A (en) * | 2007-09-28 | 2009-04-23 | Sony Corp | A/d converting circuit, solid-state imaging device and camera system |
KR20090058011A (en) * | 2006-10-06 | 2009-06-08 | 소니 가부시끼 가이샤 | Solid state imaging device, solid state imaging device drive method, and imaging device |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5375030B2 (en) | 2008-10-31 | 2013-12-25 | 富士通セミコンダクター株式会社 | Image sensor |
-
2010
- 2010-12-03 KR KR1020100122859A patent/KR101211082B1/en active IP Right Grant
-
2011
- 2011-11-30 WO PCT/KR2011/009198 patent/WO2012074287A2/en active Application Filing
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20060052524A (en) * | 2004-11-08 | 2006-05-19 | 소니 가부시끼 가이샤 | Analog-to-digital conversion method, analog-to-digital converter, semiconductor device for detecting distribution of physical quantity, and electronic apparatus |
KR20080022887A (en) * | 2006-09-08 | 2008-03-12 | 삼성전자주식회사 | Correlated double sampling and analogue to digital converting apparatus using multiple sampling in cmos image sensor |
KR20090058011A (en) * | 2006-10-06 | 2009-06-08 | 소니 가부시끼 가이샤 | Solid state imaging device, solid state imaging device drive method, and imaging device |
JP2009089066A (en) * | 2007-09-28 | 2009-04-23 | Sony Corp | A/d converting circuit, solid-state imaging device and camera system |
Also Published As
Publication number | Publication date |
---|---|
KR20120061523A (en) | 2012-06-13 |
WO2012074287A2 (en) | 2012-06-07 |
KR101211082B1 (en) | 2012-12-12 |
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