WO2011137708A3 - 电阻检测装置及方法 - Google Patents

电阻检测装置及方法 Download PDF

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Publication number
WO2011137708A3
WO2011137708A3 PCT/CN2011/072728 CN2011072728W WO2011137708A3 WO 2011137708 A3 WO2011137708 A3 WO 2011137708A3 CN 2011072728 W CN2011072728 W CN 2011072728W WO 2011137708 A3 WO2011137708 A3 WO 2011137708A3
Authority
WO
WIPO (PCT)
Prior art keywords
resistance
value
under test
resistance detection
proportional relationship
Prior art date
Application number
PCT/CN2011/072728
Other languages
English (en)
French (fr)
Other versions
WO2011137708A2 (zh
Inventor
王正香
Original Assignee
华为技术有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 华为技术有限公司 filed Critical 华为技术有限公司
Priority to CN201180000392.6A priority Critical patent/CN102317798B/zh
Priority to PCT/CN2011/072728 priority patent/WO2011137708A2/zh
Publication of WO2011137708A2 publication Critical patent/WO2011137708A2/zh
Publication of WO2011137708A3 publication Critical patent/WO2011137708A3/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/14—Measuring resistance by measuring current or voltage obtained from a reference source

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

公开了一种电阻检测装置及方法，属于电路领域。该装置包括：基准电阻（101）和电阻检测电路（102）；所述电阻检测电路（102），用于产生与所述基准电阻（101）相关的基准电流和与被测电阻（103）相关的跟随电流，输出所述基准电流和所述跟随电流之间的比例关系（105），使所述被测电阻（103）的阻值能根据所述比例关系（105）和所述基准电阻（101）的阻值得到。使用基准电阻（101）和电阻检测电路（102）来对芯片（104）上的被测电阻（103）进行检测，根据输出的比例关系（105）和基准电阻（101）的阻值可以准确地得到被测电阻（103）的实际阻值，从而知道了其实际阻值相对于其标称值的变化量，进而能知道该芯片（104）上同种类型的其他电阻阻值的相对变化量。
PCT/CN2011/072728 2011-04-13 2011-04-13 电阻检测装置及方法 WO2011137708A2 (zh)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN201180000392.6A CN102317798B (zh) 2011-04-13 2011-04-13 电阻检测装置及方法
PCT/CN2011/072728 WO2011137708A2 (zh) 2011-04-13 2011-04-13 电阻检测装置及方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CN2011/072728 WO2011137708A2 (zh) 2011-04-13 2011-04-13 电阻检测装置及方法

Publications (2)

Publication Number Publication Date
WO2011137708A2 WO2011137708A2 (zh) 2011-11-10
WO2011137708A3 true WO2011137708A3 (zh) 2012-02-23

Family

ID=44904135

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2011/072728 WO2011137708A2 (zh) 2011-04-13 2011-04-13 电阻检测装置及方法

Country Status (2)

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CN (1) CN102317798B (zh)
WO (1) WO2011137708A2 (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103675461B (zh) * 2013-12-20 2016-03-30 北京航天测控技术有限公司 基于可调电流源的电阻测量方法
CN110161313B (zh) 2019-06-19 2020-07-24 中南大学 一种微差法与比例法结合的电阻高精度测量系统与方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4349777A (en) * 1979-11-19 1982-09-14 Takeda Riken Kogyo Kabushikikaisha Variable current source
US5469071A (en) * 1993-12-07 1995-11-21 Kabushiki Kaisha Toshiba Resistor sensor input apparatus
CN2702317Y (zh) * 2003-12-02 2005-05-25 赵军 电阻类仪器比例法检定电路
CN1963556A (zh) * 2006-11-24 2007-05-16 中国计量科学研究院 一种用于整体校验低温电流比较仪比例的仪器及其方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4349777A (en) * 1979-11-19 1982-09-14 Takeda Riken Kogyo Kabushikikaisha Variable current source
US5469071A (en) * 1993-12-07 1995-11-21 Kabushiki Kaisha Toshiba Resistor sensor input apparatus
CN2702317Y (zh) * 2003-12-02 2005-05-25 赵军 电阻类仪器比例法检定电路
CN1963556A (zh) * 2006-11-24 2007-05-16 中国计量科学研究院 一种用于整体校验低温电流比较仪比例的仪器及其方法

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
XU, QIHUA.: "Resistance Measurement and Non-electric Measuration.", February 1981 (1981-02-01), pages 78 *

Also Published As

Publication number Publication date
CN102317798A (zh) 2012-01-11
CN102317798B (zh) 2013-06-26
WO2011137708A2 (zh) 2011-11-10

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