WO2011068352A3 - 트레이 이송 장치 및 이에 채용되는 사이드 푸시 장치 - Google Patents

트레이 이송 장치 및 이에 채용되는 사이드 푸시 장치 Download PDF

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Publication number
WO2011068352A3
WO2011068352A3 PCT/KR2010/008550 KR2010008550W WO2011068352A3 WO 2011068352 A3 WO2011068352 A3 WO 2011068352A3 KR 2010008550 W KR2010008550 W KR 2010008550W WO 2011068352 A3 WO2011068352 A3 WO 2011068352A3
Authority
WO
WIPO (PCT)
Prior art keywords
tray transfer
same
side push
transferred
work position
Prior art date
Application number
PCT/KR2010/008550
Other languages
English (en)
French (fr)
Other versions
WO2011068352A2 (ko
Inventor
임우영
피승택
김기만
정충민
Original Assignee
주식회사 고영테크놀러지
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 고영테크놀러지 filed Critical 주식회사 고영테크놀러지
Publication of WO2011068352A2 publication Critical patent/WO2011068352A2/ko
Publication of WO2011068352A3 publication Critical patent/WO2011068352A3/ko

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Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G47/00—Article or material-handling devices associated with conveyors; Methods employing such devices
    • B65G47/22—Devices influencing the relative position or the attitude of articles during transit by conveyors
    • B65G47/26—Devices influencing the relative position or the attitude of articles during transit by conveyors arranging the articles, e.g. varying spacing between individual articles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Mechanical Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Special Conveying (AREA)

Abstract

트레이 이송 장치는 대상물, 제1 이송 레일, 제1 및 제2 가이드 레일들, 사이드 푸시부 및 제2 이송 레일을 포함한다. 제1 이송 레일은 대상물을 지지하며 제1 작업 위치까지 이송한다. 제1 및 제2 가이드 레일들은 대상물의 제1 측 및 제2 측에 각각 대응하여 배치되며, 제1 측 및 제2 측을 소정의 간격을 두고 각각 가이드한다. 사이드 푸시부는 대상물이 제1 작업 위치까지 이송된 후에, 대상물이 제1 가이드 레일에 의하여 제1 측을 기준으로 정렬되도록 제2 측을 제1 측을 향하여 제1 방향으로 푸시하고, 정렬 후에는 제1 측으로부터 제2 측을 향하여 제2 방향으로 복귀하는 푸시 암을 포함한다. 제2 이송 레일은 푸시 암이 대상물의 제2 측을 푸시한 후에, 대상물을 지지하며 대상물을 제2 작업 위치까지 이송한다. 이에 따라, 대상물을 정밀하게 정렬할 수 있다.
PCT/KR2010/008550 2009-12-01 2010-12-01 트레이 이송 장치 및 이에 채용되는 사이드 푸시 장치 WO2011068352A2 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020090117506A KR101198754B1 (ko) 2009-12-01 2009-12-01 트레이 이송 장치 및 이에 채용되는 사이드 푸시 장치
KR10-2009-0117506 2009-12-01

Publications (2)

Publication Number Publication Date
WO2011068352A2 WO2011068352A2 (ko) 2011-06-09
WO2011068352A3 true WO2011068352A3 (ko) 2011-10-27

Family

ID=44115417

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2010/008550 WO2011068352A2 (ko) 2009-12-01 2010-12-01 트레이 이송 장치 및 이에 채용되는 사이드 푸시 장치

Country Status (2)

Country Link
KR (1) KR101198754B1 (ko)
WO (1) WO2011068352A2 (ko)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI671536B (zh) * 2018-08-31 2019-09-11 鴻勁精密股份有限公司 電子元件校正單元及其應用之作業分類機
CN110040498A (zh) * 2019-05-20 2019-07-23 广东顺力智能物流装备股份有限公司 一种货物自动对中机构
TWI809476B (zh) * 2021-08-17 2023-07-21 致茂電子股份有限公司 拖曳式托盤移動設備

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63174500U (ko) * 1987-02-20 1988-11-11
JPH0547903A (ja) * 1991-08-07 1993-02-26 Mitsubishi Denki Eng Kk 半導体装置の位置決め装置
JPH06143083A (ja) * 1992-11-06 1994-05-24 Bando Chem Ind Ltd ローラ状ワークの受け渡し装置
JPH10180677A (ja) * 1996-12-20 1998-07-07 Amada Eng Center:Kk 原点位置決め装置
WO2007088927A1 (ja) * 2006-02-01 2007-08-09 Olympus Corporation 基板交換装置及び基板処理装置並びに基板検査装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63174500U (ko) * 1987-02-20 1988-11-11
JPH0547903A (ja) * 1991-08-07 1993-02-26 Mitsubishi Denki Eng Kk 半導体装置の位置決め装置
JPH06143083A (ja) * 1992-11-06 1994-05-24 Bando Chem Ind Ltd ローラ状ワークの受け渡し装置
JPH10180677A (ja) * 1996-12-20 1998-07-07 Amada Eng Center:Kk 原点位置決め装置
WO2007088927A1 (ja) * 2006-02-01 2007-08-09 Olympus Corporation 基板交換装置及び基板処理装置並びに基板検査装置

Also Published As

Publication number Publication date
KR101198754B1 (ko) 2012-11-12
WO2011068352A2 (ko) 2011-06-09
KR20110061003A (ko) 2011-06-09

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