WO2011036318A3 - Sistema para el mapeo de la eficiencia de superficies fotovoltaicas bajo condiciones de irradiación solar - Google Patents

Sistema para el mapeo de la eficiencia de superficies fotovoltaicas bajo condiciones de irradiación solar Download PDF

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Publication number
WO2011036318A3
WO2011036318A3 PCT/ES2010/000392 ES2010000392W WO2011036318A3 WO 2011036318 A3 WO2011036318 A3 WO 2011036318A3 ES 2010000392 W ES2010000392 W ES 2010000392W WO 2011036318 A3 WO2011036318 A3 WO 2011036318A3
Authority
WO
WIPO (PCT)
Prior art keywords
irradiation conditions
lasers
solar
efficiency
photon beam
Prior art date
Application number
PCT/ES2010/000392
Other languages
English (en)
French (fr)
Other versions
WO2011036318A2 (es
Inventor
Joaquín MÁRTIN CALLEJA
Francisco Javier Navas Pineda
Rodrigo ALCÁNTARA PUERTO
Concepcion Fernadez Lorenzo
Original Assignee
Universidad De Cádiz (Otri)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Universidad De Cádiz (Otri) filed Critical Universidad De Cádiz (Otri)
Publication of WO2011036318A2 publication Critical patent/WO2011036318A2/es
Publication of WO2011036318A3 publication Critical patent/WO2011036318A3/es

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Classifications

    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9501—Semiconductor wafers
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Photovoltaic Devices (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

Sistema para el mapeo de la eficiencia de superficies foto voltaicas bajo condiciones de irradiación solar. Permite obtener imágenes de eficiencia fotoconversora de superficies fotovoltaicas, con alta resolución espacial y bajo condiciones de irradiación semejantes a radiación solar. Se basa en el barrido sistemático de la superficie activa a estudiar con un haz de fotones, -monocromático, altamente focalizado y con una distribución gaussiana de la energía-, al tiempo que se mide la corriente eléctrica generada. La representación de la corriente generada en función de la posición de incidencia del haz fotónico genera un mapa de eficiencias fotoconversoras. Para excitar la superficie activa bajo condiciones asimilables a la irradiación solar, se utilizan tres láseres como fuentes de excitación, que emiten en las zonas roja, verde y azul del espectro electromagnético, pudiéndose ser empleado un mayor número de láseres. Es de aplicación en el estudio de dispositivos foto voltaicos.
PCT/ES2010/000392 2009-09-28 2010-09-23 Sistema para el mapeo de la eficiencia de superficies fotovoltaicas bajo condiciones de irradiación solar. WO2011036318A2 (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
ES200901913A ES2365002B2 (es) 2009-09-28 2009-09-28 Sitema para el mapeo de la eficiencia de superficies fotovoltaicas bajo condiciones de irradiación solar.
ESP200901913 2009-09-28

Publications (2)

Publication Number Publication Date
WO2011036318A2 WO2011036318A2 (es) 2011-03-31
WO2011036318A3 true WO2011036318A3 (es) 2011-06-30

Family

ID=43796294

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/ES2010/000392 WO2011036318A2 (es) 2009-09-28 2010-09-23 Sistema para el mapeo de la eficiencia de superficies fotovoltaicas bajo condiciones de irradiación solar.

Country Status (2)

Country Link
ES (1) ES2365002B2 (es)
WO (1) WO2011036318A2 (es)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5757474A (en) * 1993-05-10 1998-05-26 Midwest Research Institute System for characterizing semiconductor materials and photovoltaic devices through calibration
EP0877225A2 (en) * 1997-03-12 1998-11-11 Brown & Sharpe Limited Optical surface measurement apparatus and methods
US6167148A (en) * 1998-06-30 2000-12-26 Ultrapointe Corporation Method and system for inspecting the surface of a wafer
ES2201925B1 (es) * 2002-09-11 2005-03-01 Univerdidad De Cadiz. Un sistema automatizado y un procedimiento para el estudio de superficies con propiedades dependientes de la irradiacion fotonica.
EP1860428A2 (en) * 2006-05-26 2007-11-28 Negevtech Ltd. Wafer inspection using short-pulsed continuous broadband illumination

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5757474A (en) * 1993-05-10 1998-05-26 Midwest Research Institute System for characterizing semiconductor materials and photovoltaic devices through calibration
EP0877225A2 (en) * 1997-03-12 1998-11-11 Brown & Sharpe Limited Optical surface measurement apparatus and methods
US6167148A (en) * 1998-06-30 2000-12-26 Ultrapointe Corporation Method and system for inspecting the surface of a wafer
ES2201925B1 (es) * 2002-09-11 2005-03-01 Univerdidad De Cadiz. Un sistema automatizado y un procedimiento para el estudio de superficies con propiedades dependientes de la irradiacion fotonica.
EP1860428A2 (en) * 2006-05-26 2007-11-28 Negevtech Ltd. Wafer inspection using short-pulsed continuous broadband illumination

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
CEMINE V.J. ET AL: "High-resolution mapping of the energy conversion efficiency of solar cells and silicon photodiodes in photovoltaic mode", OPTICS COMMUNICATIONS, vol. 281, no. 22, 15 November 2008 (2008-11-15), pages 5580 - 5587 *

Also Published As

Publication number Publication date
ES2365002A1 (es) 2011-09-20
ES2365002B2 (es) 2012-05-31
WO2011036318A2 (es) 2011-03-31

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