WO2011032594A1 - Apparatus and method for crystallization of silicon - Google Patents
Apparatus and method for crystallization of silicon Download PDFInfo
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- WO2011032594A1 WO2011032594A1 PCT/EP2009/062099 EP2009062099W WO2011032594A1 WO 2011032594 A1 WO2011032594 A1 WO 2011032594A1 EP 2009062099 W EP2009062099 W EP 2009062099W WO 2011032594 A1 WO2011032594 A1 WO 2011032594A1
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- molten silicon
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B13/00—Single-crystal growth by zone-melting; Refining by zone-melting
- C30B13/28—Controlling or regulating
- C30B13/30—Stabilisation or shape controlling of the molten zone, e.g. by concentrators, by electromagnetic fields; Controlling the section of the crystal
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22D—CASTING OF METALS; CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES
- B22D27/00—Treating the metal in the mould while it is molten or ductile ; Pressure or vacuum casting
- B22D27/02—Use of electric or magnetic effects
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22D—CASTING OF METALS; CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES
- B22D27/00—Treating the metal in the mould while it is molten or ductile ; Pressure or vacuum casting
- B22D27/04—Influencing the temperature of the metal, e.g. by heating or cooling the mould
- B22D27/045—Directionally solidified castings
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B11/00—Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B11/00—Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method
- C30B11/003—Heating or cooling of the melt or the crystallised material
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B35/00—Apparatus not otherwise provided for, specially adapted for the growth, production or after-treatment of single crystals or of a homogeneous polycrystalline material with defined structure
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F27—FURNACES; KILNS; OVENS; RETORTS
- F27B—FURNACES, KILNS, OVENS, OR RETORTS IN GENERAL; OPEN SINTERING OR LIKE APPARATUS
- F27B14/00—Crucible or pot furnaces
- F27B14/08—Details peculiar to crucible or pot furnaces
- F27B14/14—Arrangements of heating devices
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F27—FURNACES; KILNS; OVENS; RETORTS
- F27B—FURNACES, KILNS, OVENS, OR RETORTS IN GENERAL; OPEN SINTERING OR LIKE APPARATUS
- F27B14/00—Crucible or pot furnaces
- F27B14/08—Details peculiar to crucible or pot furnaces
- F27B14/20—Arrangement of controlling, monitoring, alarm or like devices
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F27—FURNACES; KILNS; OVENS; RETORTS
- F27D—DETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
- F27D27/00—Stirring devices for molten material
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- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B9/00—Blowing glass; Production of hollow glass articles
- C03B9/30—Details of blowing glass; Use of materials for the moulds
- C03B9/40—Gearing or controlling mechanisms specially adapted for glass-blowing machines
- C03B9/41—Electric or electronic systems
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B11/00—Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method
- C30B11/002—Crucibles or containers for supporting the melt
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B13/00—Single-crystal growth by zone-melting; Refining by zone-melting
- C30B13/16—Heating of the molten zone
- C30B13/22—Heating of the molten zone by irradiation or electric discharge
- C30B13/24—Heating of the molten zone by irradiation or electric discharge using electromagnetic waves
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/30—Mechanisms for rotating or moving either the melt or the crystal
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1004—Apparatus with means for measuring, testing, or sensing
- Y10T117/1008—Apparatus with means for measuring, testing, or sensing with responsive control means
Definitions
- the present invention generally relates to crystallization of silicon, particularly silicon used in photovoltaic cells. DESCRIPTION OF RELATED ART AND BACKGROUND OF THE INVENTION
- WO 2007/148988 discloses a method and a furnace for crystallization of silicon for photovoltaic cells.
- the furnace comprises a crucible or a plurality of crucibles for containing the silicon, a heating device for heating the crucible, a heat discharging device for discharging the heat from the crucible, and a stirring device comprising an electromagnetic device supplied with an alternating current for applying an alternating electromagnetic field to the crucible.
- an apparatus comprising a crucible for containing silicon, a heating and heat dissipating arrangement provided for melting the silicon contained in the crucible and for subsequently solidifying the molten silicon, and an electromagnetic stirring device provided for stirring the molten silicon in the crucible during the solidification of the molten silicon.
- a control arrangement is provided for controlling the heating and heat dissipating arrangement to solidify the molten silicon at a specified solidification rate and for controlling the electromagnetic stirring device to stir the molten silicon in response to the specified solidification rate of the molten silicon such that the ratio of a speed of the molten silicon and the solidification rate is above a first threshold value.
- the first threshold value may be 10, 100, 1000 or 10 000 depending on the composition of the raw material silicon and/or on the intended application of the crystallized silicon.
- the control arrangement may be provided to control the speed of the molten silicon to be below a second threshold value.
- control arrangement for controlling the electromagnetic stirring device to stir the molten silicon in the crucible during two stages such that a first speed of the molten silicon is obtained in a first one of the stages and a second speed of the molten silicon is obtained in a second one of the stages, wherein the first speed of the molten silicon is higher than the second speed of the molten silicon.
- the above controlled solidification is performed during the second stage.
- the control arrangement is provided for controlling the heating and heat dissipating arrangement to keep the silicon contained in the crucible molten to allow impurities to be transported in the molten silicon.
- the control arrangement is, during the first stage, provided for controlling the heating and heat dissipating arrangement to solidify the molten silicon, to cut a way a portion thereof, and to subsequently re-melt the remaining solidified silicon.
- the electromagnetic stirring device is capable of altering the direction of its stirring and the control arrangement is provided for controlling the electromagnetic stirring device to alter the direction of the stirring of the molten silicon in the crucible during the solidification of the molten silicon.
- a method which silicon is arranged in a crucible.
- the silicon in the crucible is molten and subsequently the molten silicon is solidified while the molten silicon in the crucible is stirred by means of an electromagnetic stirring device.
- the molten silicon is solidified at a specified solidification rate and the stirring by the electromagnetic stirring device is controlled in response to the step of solidifying such that the ratio of a speed of the molten silicon and the solidification rate is above a first threshold value.
- the stirring of the molten silicon in the crucible by the electromagnetic stirring device may be performed in two stages, wherein the stirring is heavier during the first stage and at least the second stage comprises solidifying molten silicon.
- Fig. 1 displays schematically in a cross-sectional side elevation view an apparatus for crystallization of silicon according to one embodiment of the invention.
- Figs. 2-4 display schematically in side elevation views apparatuses for crystallization of silicon according to alternative embodiments of the invention.
- Fig. 1 is illustrated an apparatus for crystallization of solar grade silicon to polycrystalline silicon.
- the apparatus comprises a crucible 11 for containing the solar grade silicon (low purity silicon) .
- the crucible 11 is, during crystallization, arranged in a vacuum furnace (not illustrated) comprising a housing and a top cover which can be removed for loading and unloading. Seals are provided to render the furnace gas tight. Further, fluid inlet (s) and outlet (s) may be provided in order to keep an inert atmosphere in the furnace and optionally to assist in heat dissipation during the crystallization .
- the raw material is placed in the crucible before the crystallization process starts.
- Fig. 1 is shown a layer of solid crystalline silicon 12a and a layer of molten silicon 12b above the solid crystalline silicon 12a.
- the apparatus further comprises a heating devices 13, 15, a cooling or heat dissipating device 14, and heat isolation devices 16 for providing suitable temperatures and temperature gradients in the crucible during the crystallization process.
- the heating devices 13, 15 are also provided for causing the raw material to melt.
- heating devices 13, 15 are illustrated as two devices placed above and below the crucible, the present invention is applicable to apparatuses having only one heating device and more than two heating devices and/or wherein the heating device (s) is/are arranged differently.
- the heating devices 13, 15 may be based on electric heating elements, for example supplied with a direct current or a single phase or three phase alternating current.
- the heating devices 13, 15 may be conventional heating elements or induction heating elements or a combination of both.
- the cooling or heat dissipating device 14 is arranged directly below the crucible 11 and is arranged to dissipate heat from the crucible 11 for the solidification of the raw material silicon therein.
- the cooling or heat dissipating device 14 may be realized as a device for circulation of a cooled gas as disclosed in WO 2006/082085 or by circulation of a cooling liquid.
- the cooling or heat dissipating device 14 is a heat conducting device for conducting heat away from the lower part of the crucible 11.
- the cooling or heat dissipating device 14 is a device with movable parts for convection of heat away from the lower part of the crucible 11.
- the heat isolation devices 16 are provided for reducing the heat required for melting the raw material silicon and for allowing the temperature field to be accurately and precisely controlled.
- the heat isolation devices 16 are movable or capable of altering their heat isolation properties in order to assist in the dissipation of heat from the crucible 11 during the solidification process.
- the heating devices 13, 15, the cooling or heat dissipating device 14, and optionally the heat isolation devices 16 are in the following referred to as a heat and heat dissipating arrangement .
- the inventive apparatus comprises an electromagnetic stirring device 17 provided for stirring the molten silicon 12b in the crucible during the solidification of the molten silicon 12b in order to affect the distribution of doping atoms as well and avoid impurities to crystallize into the ingot of solidified silicon.
- the largest amount of impurities is collected at the top of the ingot and is removed before the ingot is sliced into silicon wafers to be used in photovoltaic cells.
- the electromagnetic stirring device 17 comprises one or several electromagnetic devices supplied with an alternating current for applying an alternating electromagnetic field to the molten silicon 12b in the crucible 11.
- the electromagnetic device can for example comprise coils or other types of electrically conducting rails suitable to provide a sufficient alternating electromagnetic field when supplied with an alternating current.
- any material or parts located between the electromagnetic stirring device 17 and the silicon melt should be made of a non ⁇ magnetic material such as austenitic steel, a ceramic, or a polymer in order to not increase the magnetic resistance for the electromagnetic stirring device 17.
- the heat and heat dissipating arrangement and the electromagnetic stirring device 17 are connected to a suitable power supply arrangement .
- a control arrangement 18 is operatively connected to the heat and heat dissipating arrangement and to the electromagnetic stirring device 17 for control thereof during the crystallization process.
- the control arrangement 18 is suitably realized as one or more microcomputers provided with suitable software and input data regarding the structure of the apparatus, the composition of the raw material silicon, and specified solidification rate and amount of stirring.
- the solidification rate v so i is indicated as a vertical arrow and the amount of stirring expressed as a velocity v mel of the molten silicon 12b is indicated as a horizontal arrow.
- the solidification is performed from below and upwards.
- the stirring forces are typically applied in a horizontal direction.
- the speed v mel of the molten silicon 12b may be expressed as a highest speed of the molten silicon, an average speed of the molten silicon, a highest speed of a portion of the molten silicon, or an average speed of a portion of the molten silicon.
- the portion may be a portion located at or above but close to the solidification front of the crystallized silicon 12a.
- the speed v mel of the molten silicon 12b can easily be controlled since it is proportional to the current in the electromagnetic stirring device 17 for a given height of the molten silicon and the solidification rate can easily be controlled since it is proportional to the difference of the heat supplied to, and the heat removed from, the solidification front.
- control arrangement 18 is provided for controlling the heating and heat dissipating arrangement to melt the raw material silicon and to subsequently solidify the molten silicon at a specified solidification rate v sol and for controlling the electromagnetic stirring device 17 to stir the molten silicon 12b in response to the solidification rate v so i of the molten silicon such that the ratio of a speed v mel of the molten silicon and the solidification rate v sol is above a first threshold value TVl, that is: v mel /v sol > TVl
- the first threshold value TVl may be 10, 100, 1000 or 10 000 depending on the composition of the raw material silicon and/or on the intended application of the crystallized silicon.
- the ratio v me i/v so i should be below a second threshold value TV2, that is:
- the second threshold value TV2 may be 100 000, 50 000 or 30 000 depending on the composition of the raw material silicon and/or on the intended application of the crystallized silicon.
- the control arrangement 18 is preferably provided to control the speed of the molten silicon to be below a third threshold value TV3, that is a maximum speed. This speed is preferably in the range of 1 cm/ s to 30 cm/s .
- control arrangement 18 is provided for controlling the electromagnetic stirring device 17 to stir the molten silicon 12b in the crucible 11 during two stages such that a first speed vi of the molten silicon is obtained in a first one of the stages and a second speed v 2 of the molten silicon is obtained in a second one of the stages, wherein the first speed of the molten silicon is higher than the second speed of the molten silicon, that is:
- control arrangement is preferably provided for controlling the heating and heat dissipating arrangement to obtain a specified solidification rate of the molten silicon and for controlling the electromagnetic stirring device to obtain a speed of the molten silicon in response to the solidification rate such that the ratio of the speed of the molten silicon and the solidification rate is fulfilling any of the above expressions containing the first and second threshold values .
- control arrangement 18 is preferably provided to control the speed of the molten silicon to be below the third threshold value TV3.
- Typical operation data during the second stage are: speed of the molten silicon v me i of 0.05 m/s and a solidification rate v so i of 10 mm/h. This gives a ratio v me i/v so i of 18 000.
- control arrangement 18 is provided for controlling the heating and heat dissipating arrangement to keep the silicon contained in the crucible molten to allow impurities to be transported in the molten silicon. Inclusions in the melt such as oxygen, carbon, oxides, and carbides can be transported from the interior of the melt up to the melt surface.
- control arrangement 18 is, during the first stage, provided for controlling the heating and heat dissipating arrangement to solidify the molten silicon, to cut away a top portion thereof, and to subsequently re-melt the remaining solidified silicon.
- the control arrangement 18 is, during the first stage, provided for controlling the heating and heat dissipating arrangement to solidify the molten silicon, to cut away a top portion thereof, and to subsequently re-melt the remaining solidified silicon.
- the control arrangement 18 is, during the first stage, provided for controlling the heating and heat dissipating arrangement to solidify the molten silicon, to cut away a top portion thereof, and to subsequently re-melt the remaining solidified silicon.
- the crystal quality and the unidirectional growth of the silicon are not critical and therefore an increased stirring and possibly also a higher solidification rate can be used.
- control arrangement 18 is provided for controlling the electromagnetic stirring device 17 to obtain an altered speed of the molten silicon and for controlling the heating and heat dissipating arrangement to alter its heating and heat dissipating in response to the altered speed of the molten silicon, preferably while maintaining the solidification rate.
- the speed is increased while the heat supplied to, and the heat removed, from the solidification front are reduced while the difference of the heat supplied to, and the heat removed, from the solidification front is kept substantially unchanged.
- a more homogenous temperature at the solidification front is obtained at increased stirring.
- control arrangement 18 is provided for controlling the electromagnetic stirring device 17 to obtain an altered, preferably increased, speed of the molten silicon and for controlling the heating and heat dissipating arrangement to alter its heating and heat dissipating in response to the altered speed of the molten silicon such that the ratio of a speed of the molten silicon and the specified solidification rate is kept substantially unchanged.
- An increased stirring during solidification in a latter part of the crystallization process is advantageous to avoid high concentration of doping atoms in the molten silicon.
- Reduced stirring in the beginning of the crystallization process increases the amount of doping atoms in the lower portion of the solidified silicon (ingot) .
- FIGs. 2-4 display schematically in side elevation views apparatuses for crystallization of silicon according to alternative embodiments of the invention.
- Each of the apparatuses comprises a plurality of crucibles 11 and heat and heat dissipating arrangements for melting and solidifying silicon in the crucibles 11.
- the crucibles 11 and the heat and heat dissipating arrangements are housed in a vacuum furnace (not illustrated) .
- the embodiment of Fig. 2 comprises an electromagnetic stirring device 21 which is movable horizontally according to double arrow 22 along the crucibles 11 with respect to one another such that the electromagnetic stirring device 21 can stir the molten silicon in the crucibles 11, one after the other, during the solidification of the molten silicon.
- the electromagnetic stirring device 21 may be movable along rails mounted in the ceiling of the vacuum furnace by means of an electric motor.
- the embodiment of Fig. 3 comprises an electromagnetic stirrer device 31 which is adapted in shape and sized to the number of the crucibles 11 such that the electromagnetic stirrer device 31 can stir the molten silicon in all the crucibles 11 concurrently during the solidification of the molten silicon.
- the embodiment of Fig. 4 comprises a power source 42 and a plurality of electromagnetic stirrer units 41, the number of which corresponds to the number of the crucibles 11.
- Each of the electromagnetic stirrer units 41 is powered by the common power source 42 and is adapted to stir the molten silicon in a respective one of the crucibles 11 during the solidification of the molten silicon.
- each of the electromagnetic stirrer units 41 is controlled by a single controller.
- a method for crystallization of silicon is provided according to a yet further embodiment of the invention.
- silicon is, in a first step, arranged in a crucible.
- the silicon contained in the crucible is, in a second step, molten.
- the molten silicon is, in a third step, solidified while the molten silicon in the crucible is stirred by means of an electromagnetic stirring device.
- solidification of the molten silicon is controlled at a specified solidification rate and the stirring by the electromagnetic stirring device is controlled in response to the solidification rate such that the ratio of a speed of the molten silicon and the solidification rate is above a first threshold value.
- the control may be performed automatically by a control device, semi-automatically, or manually.
- This embodiment of the invention may be modified according to any other of the embodiments of the present invention.
- a problem of a typical prior art apparatus for crystallization of silicon is that the solidification of the silicon is uneven along the solidification front leading to deteriorated performance of the photovoltaic cells manufactured from the crystallized silicon.
- an apparatus for crystallization of silicon which is identical with the apparatus illustrated in Fig. 1 but in which the control arrangement 18 is provided for controlling the electromagnetic stirring device 17 in a novel manner.
- the control arrangement 18 is arranged to control the electromagnetic stirring device 16 to alter the direction of its stirring, preferably repeatedly or continuously.
- the direction of the stirring of the electromagnetic stirring device 17 is reversed, preferably by means of reversing the current in the electromagnetic stirring device 17.
- the electromagnetic stirring device 17 comprises electric circuitry and a rotating device provided for rotating the electric circuitry under control of the control arrangement 18, thereby rotating the direction of the stirring of the molten silicon in the crucible during the solidification of the molten silicon.
- the altering of direction of the stirring during the solidification of the molten silicon provides a more homogenous temperature profile at the solidification front, which promotes the unidirectional growth of the silicon.
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- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Silicon Compounds (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
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Abstract
Description
Claims
Priority Applications (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012529132A JP5740584B2 (en) | 2009-09-18 | 2009-09-18 | Apparatus and method for crystallizing silicon |
EP09783158.0A EP2478135B1 (en) | 2009-09-18 | 2009-09-18 | Method for crystallization of silicon |
PCT/EP2009/062099 WO2011032594A1 (en) | 2009-09-18 | 2009-09-18 | Apparatus and method for crystallization of silicon |
CA2774176A CA2774176C (en) | 2009-09-18 | 2009-09-18 | Apparatus and method for crystallization of silicon |
NO09783158A NO2478135T3 (en) | 2009-09-18 | 2009-09-18 | |
CN200980161514.2A CN102575376B (en) | 2009-09-18 | 2009-09-18 | Equipment and method for silicon crystallization |
US13/421,561 US8721789B2 (en) | 2009-09-18 | 2012-03-15 | Apparatus and method for crystallization of silicon |
US13/717,033 US8632632B2 (en) | 2009-09-18 | 2012-12-17 | Apparatus and method for crystallization of silicon |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/EP2009/062099 WO2011032594A1 (en) | 2009-09-18 | 2009-09-18 | Apparatus and method for crystallization of silicon |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US13/421,561 Continuation US8721789B2 (en) | 2009-09-18 | 2012-03-15 | Apparatus and method for crystallization of silicon |
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WO2011032594A1 true WO2011032594A1 (en) | 2011-03-24 |
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PCT/EP2009/062099 WO2011032594A1 (en) | 2009-09-18 | 2009-09-18 | Apparatus and method for crystallization of silicon |
Country Status (7)
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US (2) | US8721789B2 (en) |
EP (1) | EP2478135B1 (en) |
JP (1) | JP5740584B2 (en) |
CN (1) | CN102575376B (en) |
CA (1) | CA2774176C (en) |
NO (1) | NO2478135T3 (en) |
WO (1) | WO2011032594A1 (en) |
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CN103014850A (en) * | 2012-12-10 | 2013-04-03 | 常州大学 | Novel polycrystalline silicon ingot casting device and ingot casting method thereof |
US10898949B2 (en) | 2017-05-05 | 2021-01-26 | Glassy Metals Llc | Techniques and apparatus for electromagnetically stirring a melt material |
EP3935019B1 (en) | 2019-03-05 | 2022-09-28 | Abb Schweiz Ag | A continuous glass melting tank with an immersed stirring body |
Citations (5)
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US6849121B1 (en) * | 2001-04-24 | 2005-02-01 | The United States Of America As Represented By The Secretary Of The Air Force | Growth of uniform crystals |
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FR2908125A1 (en) * | 2006-11-02 | 2008-05-09 | Commissariat Energie Atomique | PROCESS FOR PURIFYING METALLURGICAL SILICON BY DIRECTED SOLIDIFICATION |
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JPH05254817A (en) * | 1992-03-12 | 1993-10-05 | Kawasaki Steel Corp | Production of polycrystal silicon ingot |
JP3273291B2 (en) * | 1993-10-19 | 2002-04-08 | 新日本製鐵株式会社 | Stirring method of molten steel in continuous casting mold |
JPH0871716A (en) * | 1994-09-08 | 1996-03-19 | Nippon Steel Corp | Method for controlling molten steel flow in mold in continuous casting |
JPH09165212A (en) * | 1995-12-15 | 1997-06-24 | Kawasaki Steel Corp | Production of silicone raw material powder for solar cell and silicone ingot for solar cell |
JPH10182125A (en) * | 1996-12-20 | 1998-07-07 | Kawasaki Steel Corp | Production of powdery high-purity silicon |
JPH10245216A (en) * | 1997-03-04 | 1998-09-14 | Kawasaki Steel Corp | Production of silicon for solar cell |
JPH1192284A (en) * | 1997-09-10 | 1999-04-06 | Mitsubishi Materials Corp | Production of silicon ingot having polycrystal structure solidified in one direction |
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JP5100969B2 (en) * | 2005-03-02 | 2012-12-19 | 新日鉄住金マテリアルズ株式会社 | Method for removing carbon from silicon |
JP4441435B2 (en) * | 2005-04-12 | 2010-03-31 | 新日本製鐵株式会社 | Linear moving magnetic field type electromagnetic stirrer |
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JP2008254039A (en) * | 2007-04-06 | 2008-10-23 | Mitsubishi Materials Corp | Casting method and casting device |
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2009
- 2009-09-18 JP JP2012529132A patent/JP5740584B2/en active Active
- 2009-09-18 CA CA2774176A patent/CA2774176C/en active Active
- 2009-09-18 WO PCT/EP2009/062099 patent/WO2011032594A1/en active Application Filing
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- 2009-09-18 EP EP09783158.0A patent/EP2478135B1/en active Active
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DE19704075A1 (en) * | 1997-02-04 | 1998-08-06 | Rossendorf Forschzent | Production of semiconductor single crystals |
US6849121B1 (en) * | 2001-04-24 | 2005-02-01 | The United States Of America As Represented By The Secretary Of The Air Force | Growth of uniform crystals |
WO2007148988A1 (en) * | 2006-06-23 | 2007-12-27 | Rec Scanwafer As | Crystallization furnace |
FR2908125A1 (en) * | 2006-11-02 | 2008-05-09 | Commissariat Energie Atomique | PROCESS FOR PURIFYING METALLURGICAL SILICON BY DIRECTED SOLIDIFICATION |
FR2909990A1 (en) * | 2006-12-13 | 2008-06-20 | Efd Induction Sa Sa | METHOD AND APPARATUS FOR THE MANUFACTURE OF BLOCKS OF A SEMICONDUCTOR MATERIAL |
Also Published As
Publication number | Publication date |
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NO2478135T3 (en) | 2018-04-14 |
US20120167629A1 (en) | 2012-07-05 |
JP2013505184A (en) | 2013-02-14 |
EP2478135B1 (en) | 2017-11-15 |
EP2478135A1 (en) | 2012-07-25 |
US20130104601A1 (en) | 2013-05-02 |
CN102575376B (en) | 2016-07-06 |
CA2774176C (en) | 2014-07-29 |
US8632632B2 (en) | 2014-01-21 |
CN102575376A (en) | 2012-07-11 |
JP5740584B2 (en) | 2015-06-24 |
US8721789B2 (en) | 2014-05-13 |
CA2774176A1 (en) | 2011-03-24 |
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