WO2011014282A3 - High magnification spectral reflectance biosensing with discrete light sources - Google Patents

High magnification spectral reflectance biosensing with discrete light sources Download PDF

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Publication number
WO2011014282A3
WO2011014282A3 PCT/US2010/033397 US2010033397W WO2011014282A3 WO 2011014282 A3 WO2011014282 A3 WO 2011014282A3 US 2010033397 W US2010033397 W US 2010033397W WO 2011014282 A3 WO2011014282 A3 WO 2011014282A3
Authority
WO
WIPO (PCT)
Prior art keywords
substrate
spectral reflectance
biosensing
light sources
high magnification
Prior art date
Application number
PCT/US2010/033397
Other languages
French (fr)
Other versions
WO2011014282A2 (en
Inventor
Selim M. Unlu
Emre I. Ozkumur
George Daaboul
Rahul S. Vedula
Bennett B. Goldberg
Original Assignee
Trustees Of Boston University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Trustees Of Boston University filed Critical Trustees Of Boston University
Publication of WO2011014282A2 publication Critical patent/WO2011014282A2/en
Publication of WO2011014282A3 publication Critical patent/WO2011014282A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1765—Method using an image detector and processing of image signal
    • G01N2021/177—Detector of the video camera type
    • G01N2021/1776—Colour camera
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N2021/7769—Measurement method of reaction-produced change in sensor
    • G01N2021/7779—Measurement method of reaction-produced change in sensor interferometric
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's
    • G01N2201/0627—Use of several LED's for spectral resolution

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

A spectral reflectance imaging device (100) for detecting biomolecular targets (126) includes an illumination source (101) that illuminates a substrate (122) with a plurality of separate wavelengths of incoherent light. The substrate includes an oxide layer (124) and a binding agent to selectively bind biomolecular targets to the substrate. An imaging device (130) captures the light reflected from or transmitted through the substrate and an image processing system (140) detects the biomolecular targets a function of the change in reflective properties of the substrate.
PCT/US2010/033397 2009-05-01 2010-05-03 High magnification spectral reflectance biosensing with discrete light sources WO2011014282A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US17481609P 2009-05-01 2009-05-01
US61/174,816 2009-05-01

Publications (2)

Publication Number Publication Date
WO2011014282A2 WO2011014282A2 (en) 2011-02-03
WO2011014282A3 true WO2011014282A3 (en) 2011-03-31

Family

ID=43416531

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2010/033397 WO2011014282A2 (en) 2009-05-01 2010-05-03 High magnification spectral reflectance biosensing with discrete light sources

Country Status (1)

Country Link
WO (1) WO2011014282A2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102818786A (en) * 2012-08-17 2012-12-12 中国科学院上海光学精密机械研究所 Sinusoidal phase modulation parallel complex frequency domain optical coherence tomography imaging system and method
CN103791853A (en) * 2014-01-20 2014-05-14 天津大学 Microstructure measuring device and measuring method based on color strip information processing
CN107548448A (en) * 2015-07-31 2018-01-05 惠普深蓝有限责任公司 The calculating of thickness degree

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006116362A2 (en) 2005-04-25 2006-11-02 The Trustees Of Boston University Structured substrates for optical surface profiling
EP2536818B1 (en) * 2010-02-18 2018-10-03 Bima Limited Immobilised-bead immunomultiplex assay
BE1019985A3 (en) * 2011-05-23 2013-03-05 Willy Boermans DO CHEMIE USING COLOR SENSORS.
FR2993661B1 (en) * 2012-07-17 2014-08-22 Centre Nat Rech Scient METHOD AND DEVICE FOR MEASURING A MEDIUM OF INTEREST
US9606056B2 (en) 2013-12-06 2017-03-28 Canon Kabushiki Kaisha Selection of spectral bands or filters for material classification under multiplexed illumination
US9989463B2 (en) 2013-07-02 2018-06-05 Canon Kabushiki Kaisha Material classification
US10151680B2 (en) * 2013-10-28 2018-12-11 Trustees Of Boston University Nanoparticles for self referencing calibration
CN103604758A (en) * 2013-12-02 2014-02-26 中山鼎晟生物科技有限公司 Food detection apparatus based on photochemical reaction
US10488328B2 (en) 2014-03-07 2019-11-26 Trustees Of Boston University Polarization enhanced interferometric imaging
CN108369179B (en) * 2015-09-22 2021-12-24 波士顿大学董事会 Multiplex phenotypic analysis of nanovesicles
CA3012212A1 (en) * 2016-02-05 2017-08-10 Nanoview Diagnostics Inc. Detection of exosomes having surface markers
EP3299799A1 (en) * 2016-09-27 2018-03-28 Berthold Technologies GmbH & Co. KG Method and measuring system for measuring molecular interactions in a thin layer
GB201711886D0 (en) 2017-07-24 2017-09-06 Univ College Cardiff Consultants Ltd Analysing nano - objects
CN110567853A (en) * 2019-10-22 2019-12-13 中国矿业大学(北京) Mine dust measurement system based on image
FR3104718B1 (en) * 2019-12-13 2022-12-23 Commissariat Energie Atomique Particle detection device and method and manufacturing method
CN112730275B (en) * 2021-02-04 2023-06-30 华东理工大学 Microscopic spectrum imaging system, pesticide detection system and method thereof
CN113183625B (en) * 2021-04-23 2022-11-29 广州诚鼎机器人有限公司 Stock detection device and oval calico printing machine
CN114001657B (en) * 2021-09-26 2023-06-13 河北大学 Gauge block length calibration device and calibration method based on low-coherence light series interference
CN113959349B (en) * 2021-10-25 2022-04-19 湖南捷力泰科技有限公司 Membrane quality detection device and method

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63182552A (en) * 1987-01-26 1988-07-27 Dainippon Printing Co Ltd Deformation inspecting device
JPH10332329A (en) * 1997-05-30 1998-12-18 Takeaki Yoshimura Optical frequency sweeping type tomoimage measuring method and its device
US20040061784A1 (en) * 2002-07-17 2004-04-01 Kenneth Perlin BRDF analyzer
WO2006116362A2 (en) * 2005-04-25 2006-11-02 The Trustees Of Boston University Structured substrates for optical surface profiling

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7110118B2 (en) 2000-12-19 2006-09-19 Trustees Of Boston University Spectral imaging for vertical sectioning
KR100482365B1 (en) 2002-07-12 2005-04-13 삼성전자주식회사 Refresh control circuits in pseudo sram device and method same

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63182552A (en) * 1987-01-26 1988-07-27 Dainippon Printing Co Ltd Deformation inspecting device
JPH10332329A (en) * 1997-05-30 1998-12-18 Takeaki Yoshimura Optical frequency sweeping type tomoimage measuring method and its device
US20040061784A1 (en) * 2002-07-17 2004-04-01 Kenneth Perlin BRDF analyzer
WO2006116362A2 (en) * 2005-04-25 2006-11-02 The Trustees Of Boston University Structured substrates for optical surface profiling

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
DATABASE WPI Week 199910, Derwent World Patents Index; AN 1999-109406, XP002616774 *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102818786A (en) * 2012-08-17 2012-12-12 中国科学院上海光学精密机械研究所 Sinusoidal phase modulation parallel complex frequency domain optical coherence tomography imaging system and method
CN103791853A (en) * 2014-01-20 2014-05-14 天津大学 Microstructure measuring device and measuring method based on color strip information processing
CN107548448A (en) * 2015-07-31 2018-01-05 惠普深蓝有限责任公司 The calculating of thickness degree
CN107548448B (en) * 2015-07-31 2020-11-20 惠普深蓝有限责任公司 Calculation of layer thickness

Also Published As

Publication number Publication date
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