WO2011012741A3 - Microscopy device with tuning fork and rectilinear tip - Google Patents

Microscopy device with tuning fork and rectilinear tip Download PDF

Info

Publication number
WO2011012741A3
WO2011012741A3 PCT/ES2010/000297 ES2010000297W WO2011012741A3 WO 2011012741 A3 WO2011012741 A3 WO 2011012741A3 ES 2010000297 W ES2010000297 W ES 2010000297W WO 2011012741 A3 WO2011012741 A3 WO 2011012741A3
Authority
WO
WIPO (PCT)
Prior art keywords
tip
fork
rectilinear
tuning fork
rectilinear tip
Prior art date
Application number
PCT/ES2010/000297
Other languages
Spanish (es)
French (fr)
Other versions
WO2011012741A2 (en
Inventor
Manuel Puig Vidal
Jorge OTERO DÍAZ
Original Assignee
Universidad De Barcelona
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Universidad De Barcelona filed Critical Universidad De Barcelona
Publication of WO2011012741A2 publication Critical patent/WO2011012741A2/en
Publication of WO2011012741A3 publication Critical patent/WO2011012741A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/02—Probe holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/04—Fine scanning or positioning
    • G01Q10/045—Self-actuating probes, i.e. wherein the actuating means for driving are part of the probe itself, e.g. piezoelectric means on a cantilever probe
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G01Q30/02—Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
    • G01Q30/025—Optical microscopes coupled with SPM
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G01Q30/08—Means for establishing or regulating a desired environmental condition within a sample chamber
    • G01Q30/12—Fluid environment
    • G01Q30/14—Liquid environment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00

Abstract

The device has a tuning fork and a rectilinear tip attached to one tine of the fork, a surface for supporting objects to be analysed and means for holding and moving the fork, said means being positioned so that the tip is inclined with respect to the support surface, at an angle that enables exploration with a rectilinear tip without the fork coming into contact with the objects or the liquid in which said object may be submerged, at the same time allowing visual access to the position of the end of the rectilinear tip from above said support surface, and makes it possible to use a plurality of tuning fork/tip assemblies, thereby enabling simultaneous measurement of several physical parameters of the surface of the object.
PCT/ES2010/000297 2009-07-31 2010-07-12 Microscopy device with tuning fork and rectilinear tip WO2011012741A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
ES200901740A ES2354795B1 (en) 2009-07-31 2009-07-31 MICROSCOPY DEVICE PROVIDED WITH A RESONANT FORK AND A RECTILINAL POINT.
ESP200901740 2009-07-31

Publications (2)

Publication Number Publication Date
WO2011012741A2 WO2011012741A2 (en) 2011-02-03
WO2011012741A3 true WO2011012741A3 (en) 2011-07-14

Family

ID=43529758

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/ES2010/000297 WO2011012741A2 (en) 2009-07-31 2010-07-12 Microscopy device with tuning fork and rectilinear tip

Country Status (2)

Country Link
ES (1) ES2354795B1 (en)
WO (1) WO2011012741A2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SK288589B6 (en) * 2012-10-05 2018-09-03 Centrum Vedecko-Technických Informácií Sr Method for performing the local charge transient analysis
SE537998C2 (en) 2014-05-09 2016-02-02 Per-Axel Uhlin Magnetic vibration sensor

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5729026A (en) * 1996-08-29 1998-03-17 International Business Machines Corporation Atomic force microscope system with angled cantilever having integral in-plane tip
US6094971A (en) * 1997-09-24 2000-08-01 Texas Instruments Incorporated Scanning-probe microscope including non-optical means for detecting normal tip-sample interactions

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5729026A (en) * 1996-08-29 1998-03-17 International Business Machines Corporation Atomic force microscope system with angled cantilever having integral in-plane tip
US6094971A (en) * 1997-09-24 2000-08-01 Texas Instruments Incorporated Scanning-probe microscope including non-optical means for detecting normal tip-sample interactions

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
"IEEE International Instrumentation and Measurement Technology Conference. Canada. May 12-15, 2008.&#160", 12 May 2008, article J. OTERO ET AL.: "Low-noise Instrumentation for the measurement of piezoresistive AFM Cantilesee Deflection in Robotic Nanobiocharacterization Applications" *
S.W. KOK.: "Devtheopment of tuning fork based scanning near-fithed optical microscopy system prototype", SIMTECH TECHNICAL REPORTS (STR_V9_N2_07_PMG)., vol. 9, no. 2, April 2008 (2008-04-01) *

Also Published As

Publication number Publication date
ES2354795B1 (en) 2012-01-30
ES2354795A1 (en) 2011-03-18
WO2011012741A2 (en) 2011-02-03

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