WO2010124868A3 - Dispositif de mesure de pièces usinées par tomographie assistée par ordinateur - Google Patents

Dispositif de mesure de pièces usinées par tomographie assistée par ordinateur Download PDF

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Publication number
WO2010124868A3
WO2010124868A3 PCT/EP2010/002650 EP2010002650W WO2010124868A3 WO 2010124868 A3 WO2010124868 A3 WO 2010124868A3 EP 2010002650 W EP2010002650 W EP 2010002650W WO 2010124868 A3 WO2010124868 A3 WO 2010124868A3
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Prior art keywords
detector means
radiation
designed
center
rotational axis
Prior art date
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PCT/EP2010/002650
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German (de)
English (en)
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WO2010124868A2 (fr
Inventor
Martin Simon
Siegfried Heeg
Ralf Hock
Manfred Etzel
Uwe Hilpert
Severin Ebner
Original Assignee
Wenzel Volumetrik Gmbh
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Application filed by Wenzel Volumetrik Gmbh filed Critical Wenzel Volumetrik Gmbh
Priority to CN201080028051.5A priority Critical patent/CN102460133B/zh
Priority to EP10722929A priority patent/EP2425233A2/fr
Priority to US13/266,881 priority patent/US20120155606A1/en
Publication of WO2010124868A2 publication Critical patent/WO2010124868A2/fr
Publication of WO2010124868A3 publication Critical patent/WO2010124868A3/fr

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    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
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    • C04B2235/60—Aspects relating to the preparation, properties or mechanical treatment of green bodies or pre-forms
    • C04B2235/604—Pressing at temperatures other than sintering temperatures
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F24—HEATING; RANGES; VENTILATING
    • F24D—DOMESTIC- OR SPACE-HEATING SYSTEMS, e.g. CENTRAL HEATING SYSTEMS; DOMESTIC HOT-WATER SUPPLY SYSTEMS; ELEMENTS OR COMPONENTS THEREFOR
    • F24D11/00—Central heating systems using heat accumulated in storage masses
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F24—HEATING; RANGES; VENTILATING
    • F24D—DOMESTIC- OR SPACE-HEATING SYSTEMS, e.g. CENTRAL HEATING SYSTEMS; DOMESTIC HOT-WATER SUPPLY SYSTEMS; ELEMENTS OR COMPONENTS THEREFOR
    • F24D2220/00—Components of central heating installations excluding heat sources
    • F24D2220/10—Heat storage materials, e.g. phase change materials or static water enclosed in a space
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F24—HEATING; RANGES; VENTILATING
    • F24D—DOMESTIC- OR SPACE-HEATING SYSTEMS, e.g. CENTRAL HEATING SYSTEMS; DOMESTIC HOT-WATER SUPPLY SYSTEMS; ELEMENTS OR COMPONENTS THEREFOR
    • F24D3/00—Hot-water central heating systems
    • F24D3/12—Tube and panel arrangements for ceiling, wall, or underfloor heating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N17/00—Investigating resistance of materials to the weather, to corrosion, or to light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/309—Accessories, mechanical or electrical features support of sample holder
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3306—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object rotates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3307—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts source and detector fixed; object moves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3308—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object translates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/408—Imaging display on monitor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/633—Specific applications or type of materials thickness, density, surface weight (unit area)
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
    • Y02B30/00—Energy efficient heating, ventilation or air conditioning [HVAC]

Abstract

L'invention concerne un dispositif de mesure de pièces usinées par tomographie assistée par ordinateur. Le dispositif selon l'invention comprend une source de rayons X (16) servant à générer un rayonnement intrusif, des moyens de détection (28) servant à détecter le rayonnement intrusif, ainsi qu'un porte-pièce (20, 24, 26) comportant un axe central et/ou de rotation et réalisé de sorte qu'une pièce à mesurer (40) portée par le porte-pièce peut être placée dans une trajectoire (30) du rayonnement intrusif entre la source de rayons X et les moyens de détection et peut être déplacée dans la trajectoire du rayonnement, en particulier le long de l'axe central ou de rotation. Selon l'invention, le rapport A/B d'une première plus petite distance A entre une sortie de rayonnement de la source de rayons X (16) et l'axe central ou de rotation (42), s'étendant dans la trajectoire du rayonnement, du porte-pièce à une deuxième plus petite distance B entre la sortie de rayonnement et les moyens de détection présentant une pluralité de pixels détecteurs placés bidimensionnellement sur une surface est supérieur à 0,5, de préférence supérieur à 0,7 et, mieux encore, supérieur à 0,8, le rapport des côtés et/ou des longueurs d'arête de la surface des moyens de détection se situe dans la plage 1,5:1 à 500:1 et de préférence dans la plage 2:1 à 100:1 et les pixels détecteurs ont une taille maximale inférieure à 100 μm, de préférence inférieure à 80 μm et, mieux encore, inférieure à 50 μm.
PCT/EP2010/002650 2009-04-30 2010-04-30 Dispositif de mesure de pièces usinées par tomographie assistée par ordinateur WO2010124868A2 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
CN201080028051.5A CN102460133B (zh) 2009-04-30 2010-04-30 计算机断层成像工件测量设备
EP10722929A EP2425233A2 (fr) 2009-04-30 2010-04-30 Dispositif de mesure de pièces usinées par tomographie assistée par ordinateur
US13/266,881 US20120155606A1 (en) 2009-04-30 2010-04-30 Computer tomographic workpiece measuring device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102009019215A DE102009019215A1 (de) 2009-04-30 2009-04-30 Computertomographische Werkstückmessvorrichtung
DE102009019215.8 2009-04-30

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WO2010124868A2 WO2010124868A2 (fr) 2010-11-04
WO2010124868A3 true WO2010124868A3 (fr) 2011-02-24

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US (1) US20120155606A1 (fr)
EP (1) EP2425233A2 (fr)
CN (1) CN102460133B (fr)
DE (2) DE102009019215A1 (fr)
WO (1) WO2010124868A2 (fr)

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CN102460133B (zh) 2014-06-04
DE202009019014U1 (de) 2015-08-31
DE102009019215A1 (de) 2010-11-11
US20120155606A1 (en) 2012-06-21
CN102460133A (zh) 2012-05-16
EP2425233A2 (fr) 2012-03-07
WO2010124868A2 (fr) 2010-11-04

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