WO2010104291A3 - 광원특성 검사 시스템 및 이를 이용한 검사방법 - Google Patents

광원특성 검사 시스템 및 이를 이용한 검사방법 Download PDF

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Publication number
WO2010104291A3
WO2010104291A3 PCT/KR2010/001401 KR2010001401W WO2010104291A3 WO 2010104291 A3 WO2010104291 A3 WO 2010104291A3 KR 2010001401 W KR2010001401 W KR 2010001401W WO 2010104291 A3 WO2010104291 A3 WO 2010104291A3
Authority
WO
WIPO (PCT)
Prior art keywords
inspected
light sources
optical characteristic
inspection
present
Prior art date
Application number
PCT/KR2010/001401
Other languages
English (en)
French (fr)
Other versions
WO2010104291A2 (ko
Inventor
박성림
이현희
조재봉
김영곤
Original Assignee
광전자정밀 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 광전자정밀 주식회사 filed Critical 광전자정밀 주식회사
Publication of WO2010104291A2 publication Critical patent/WO2010104291A2/ko
Publication of WO2010104291A3 publication Critical patent/WO2010104291A3/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/505—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors measuring the colour produced by lighting fixtures other than screens, monitors, displays or CRTs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/506—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors measuring the colour produced by screens, monitors, displays or CRTs

Abstract

본 발명은 검사대상광원에 대한 제조상태를 신속하고 정확하게 검사할 수 있는 광원특성 검사 시스템 및 검사방법에 관한 것이다다. 이를 위해 본 발명은 검사 대상이 되는 복수개의 검사대상광원과 각각 일대일 대응되도록 구비되며, 구획된 영역에서 상기 검사대상광원에서 발광되는 빛을 측정하는 복수개의 컬러센서, 상기 컬러센서에서 측정된 데이터를 바탕으로 상기 검사대상광원에 대한 특성값을 산출하는 제어부, 그리고 상기 복수개의 검사대상광원이 기판상에 일정간격으로 배열된 검사대상광원 모듈을 반입하여 상기 검사대상광원들이 상기 컬러센서와 일대일 대응되는 위치에 배치되어 고정되도록 하는 설치유닛을 포함하는 광원특성 검사 시스템 및 검사방법을 제공한다.
PCT/KR2010/001401 2009-03-13 2010-03-05 광원특성 검사 시스템 및 이를 이용한 검사방법 WO2010104291A2 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020090021709A KR101049097B1 (ko) 2009-03-13 2009-03-13 광원특성 검사 시스템 및 이를 이용한 검사방법
KR10-2009-0021709 2009-03-13

Publications (2)

Publication Number Publication Date
WO2010104291A2 WO2010104291A2 (ko) 2010-09-16
WO2010104291A3 true WO2010104291A3 (ko) 2010-12-09

Family

ID=42728919

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2010/001401 WO2010104291A2 (ko) 2009-03-13 2010-03-05 광원특성 검사 시스템 및 이를 이용한 검사방법

Country Status (2)

Country Link
KR (1) KR101049097B1 (ko)
WO (1) WO2010104291A2 (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8823406B2 (en) * 2010-10-20 2014-09-02 Cascade Micotech, Inc. Systems and methods for simultaneous optical testing of a plurality of devices under test

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100768884B1 (ko) * 2007-04-26 2007-10-19 서승환 기판의 발광소자 검사장치
KR100816289B1 (ko) * 2006-11-24 2008-03-24 (주)다윈텍 컬러 제어방법 및 이를 이용한 ｌｅｄ 백라이트 시스템
WO2008059767A1 (fr) * 2006-11-15 2008-05-22 Japan Electronic Materials Corp. Appareil d'inspection de dispositif optique
KR20080089380A (ko) * 2005-12-06 2008-10-06 엔피스 리미티드 개선된 ｌｅｄ 어레이

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20080089380A (ko) * 2005-12-06 2008-10-06 엔피스 리미티드 개선된 ｌｅｄ 어레이
WO2008059767A1 (fr) * 2006-11-15 2008-05-22 Japan Electronic Materials Corp. Appareil d'inspection de dispositif optique
KR100816289B1 (ko) * 2006-11-24 2008-03-24 (주)다윈텍 컬러 제어방법 및 이를 이용한 ｌｅｄ 백라이트 시스템
KR100768884B1 (ko) * 2007-04-26 2007-10-19 서승환 기판의 발광소자 검사장치

Also Published As

Publication number Publication date
KR101049097B1 (ko) 2011-07-15
KR20100103208A (ko) 2010-09-27
WO2010104291A2 (ko) 2010-09-16

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