WO2010100260A1 - Ir detector system and method - Google Patents
Ir detector system and method Download PDFInfo
- Publication number
- WO2010100260A1 WO2010100260A1 PCT/EP2010/052837 EP2010052837W WO2010100260A1 WO 2010100260 A1 WO2010100260 A1 WO 2010100260A1 EP 2010052837 W EP2010052837 W EP 2010052837W WO 2010100260 A1 WO2010100260 A1 WO 2010100260A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- comparator
- detector
- adc
- fpa
- power
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
- H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
- H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
- H03M1/468—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors in which the input S/H circuit is merged with the feedback DAC array
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/1205—Multiplexed conversion systems
- H03M1/123—Simultaneous, i.e. using one converter per channel but with common control or reference circuits for multiple converters
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/66—Digital/analogue converters
- H03M1/68—Digital/analogue converters with conversions of different sensitivity, i.e. one conversion relating to the more significant digital bits and another conversion to the less significant bits
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/66—Digital/analogue converters
- H03M1/74—Simultaneous conversion
- H03M1/80—Simultaneous conversion using weighted impedances
- H03M1/802—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices
- H03M1/804—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices with charge redistribution
Definitions
- the invention relates to an Infra Red (IR) detector system and method. More specifically, but not exclusively, it relates to an IR detector system and method comprising a low power comparator optimised for use in Successive Approximation Register (SAR) Analogue to Digital convertors (ADCs).
- SAR Successive Approximation Register
- ADCs Analogue to Digital convertors
- the present invention aims to overcome these shortcomings and produce a SAR ADC capable of operation at low power such that it may be suitable for use on Focal Plane Array (FPA) detectors.
- FPA Focal Plane Array
- an IR detector system comprising at least one comparator and a Focal Plane Array (FPA) detector in which the at least one comparator is optimised for use in Successive Approximation Register (SAR) Analogue to Digital Convertors (ADC), the gain of said comparator being adaptable to reduce overall power consumption of the system such that the SAR ADC may be used on the FPA detector.
- FPA Focal Plane Array
- Figure 1 is a schematic diagram of SAR ADC architecture comprising capacitor array, successive approximation register and high gain comparator
- Figure 2 is a schematic diagram of a DAC and comparator output operation with two example input signal levels
- Figure 3 is a schematic diagram of a revised SAR ADC architecture using low and high gain comparators and control logic to adjust comparator and timing to signal dynamics in accordance with one form of the invention.
- Figure 4 is a schematic diagram showing a number of example design timing waveforms.
- a typical SAR ADC consists of a Digital to Analogue Converter (DAC), comparator, and a digital successive approximation register and is shown in Figure 1.
- DAC Digital to Analogue Converter
- capacitors are switched in sequence from the largest to the smallest and the comparator compares the bit weighted signal scaled voltage with a reference voltage. Capacitors are selected or deselected by the SAR logic depending on the comparator output resulting in a digital representation of the input analogue signal. As the comparator input voltage approaches a reference voltage level, higher comparator gain is required to resolve a comparator output signal resulting in higher comparator power to achieve the circuit function. Operation at higher speeds becomes limiting as the effects of signal settling time impact comparator and therefore ADC performance. Additional time is required to achieve signal settling.
- the ability of the comparator to respond can be characterised by threshold limits applied around the nominal crossover point and are typically ⁇ 10mV. Increasing the gain reduces the threshold limits.
- One form of the invention as shown in Figure 3 uses an adaptive approach to set the comparator gain and settling time depending on the dynamics of the input signal, achieving performance whilst reducing overall power.
- a two stage comparison approach is used.
- a fast low power window comparator (A1 , A2) compares the DAC output to a narrow voltage range which in this case set to +/-1 OmV about the reference voltage 'VREF'.
- the window comparator logic generates an output logic signal 'VV if the DAC output is outside this range.
- the high gain comparator uses 14 of the bit conversion period to allow sufficient time for settling.
- the window comparator output V1 is used as the final comparator output signal, 'Vout', when the control input signal 'Sample' is asserted..
- a high gain comparator (A3) is powered on and is used as the final comparator output signal 'Vout', when 'Sample' is asserted.
- the timing control logic senses the comparator outputs V2' and V3' and with the 'Clock' signal is used control the capacitor and comparator settling.
- the window comparator voltage range is set to be just greater than the expected window comparator threshold.
- each ADC instance will have its own threshold characteristic due to the affects of matching and non uniformity at device level.
- the apparent requirement to then set each ADC comparator voltage individually is overcome within the architecture of the adaptive circuit by using a common window comparator voltage for all ADC instances and setting it to encompass the range of the ADC thresholds.
- Each ADC instance operates independently, switching in the high power comparator only when required. Where there is poorer matching, the spread in threshold voltage will be higher.
- the window comparator voltage range will need to be set commensurately higher and the high gain comparator will be switched in earlier resulting in a power increase. A power saving is still achieved as the high gain comparator is not operating all the time.
- the scheme implements a variable gain comparator and timing and has been simulated.
- the first trace is the DAC output and after 7uS the second trace shows that the window comparator has detected that the voltage range is within ⁇ 10mV of the 2.5V voltage reference.
- the high gain comparator turns on as can be seen in Trace 3 with the current increasing to 12OuA.
- the fourth trace shows the sampling of the low power comparators that occurs within the first quarter of the DAC sample period and the sampling of the high power comparator that occurs after % of the DAC sampling period.
- the fifth trace is the x4 clock and the sixth trace shows the combined comparator output.
- the high gain comparator will only be operating between 7 and 9 bits of the 14bit conversion period thereby reducing the average power consumption by a factor of 40% to 50%.
Abstract
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP10707272A EP2404381A1 (en) | 2009-03-06 | 2010-03-05 | Ir detector system and method |
US13/255,044 US8921790B2 (en) | 2009-03-06 | 2010-03-05 | IR detector system and method |
AU2010220274A AU2010220274B2 (en) | 2009-03-06 | 2010-03-05 | IR detector system and method |
CA2754386A CA2754386C (en) | 2009-03-06 | 2010-03-05 | Ir detector system and method |
IL214986A IL214986A (en) | 2009-03-06 | 2011-09-05 | Ir detector system and method |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB0903864.7A GB0903864D0 (en) | 2009-03-06 | 2009-03-06 | IR detector system and method |
GB0903864.7 | 2009-03-06 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2010100260A1 true WO2010100260A1 (en) | 2010-09-10 |
Family
ID=40600600
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2010/052837 WO2010100260A1 (en) | 2009-03-06 | 2010-03-05 | Ir detector system and method |
Country Status (7)
Country | Link |
---|---|
US (1) | US8921790B2 (en) |
EP (1) | EP2404381A1 (en) |
AU (1) | AU2010220274B2 (en) |
CA (1) | CA2754386C (en) |
GB (1) | GB0903864D0 (en) |
IL (1) | IL214986A (en) |
WO (1) | WO2010100260A1 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI475809B (en) * | 2012-01-20 | 2015-03-01 | Yu Ling Yu | Successive approximation register type capacitance to digital converter |
CN103795414B (en) * | 2014-01-27 | 2017-06-16 | 无锡艾立德智能科技有限公司 | A kind of infrared focal plane array reading circuit of branch's multiplexing |
JP6333051B2 (en) * | 2014-05-08 | 2018-05-30 | オリンパス株式会社 | Successive comparison type A / D conversion circuit |
EP4187218A1 (en) | 2016-01-11 | 2023-05-31 | Carrier Corporation | Infrared presence detector system |
JP6461403B2 (en) * | 2018-04-17 | 2019-01-30 | ローム株式会社 | Compensation circuit offset correction method |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5880691A (en) * | 1995-11-07 | 1999-03-09 | California Institute Of Technology | Capacitively coupled successive approximation ultra low power analog-to-digital converter |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB8521019D0 (en) | 1985-08-22 | 1986-10-01 | Rank Pullin Controls Ltd | Imaging apparatus |
US5570091A (en) * | 1993-09-21 | 1996-10-29 | Yamaha Corporation | Analog-to-digital converter |
US6028309A (en) * | 1997-02-11 | 2000-02-22 | Indigo Systems Corporation | Methods and circuitry for correcting temperature-induced errors in microbolometer focal plane array |
US6778123B1 (en) | 1999-12-21 | 2004-08-17 | Micron Technology, Inc. | Calibration of A/D converters by reusing capacitors used for sampling |
KR100573073B1 (en) * | 2004-07-29 | 2006-04-24 | 매그나칩 반도체 유한회사 | 2 bits binary comparator and binary comparating device using it |
-
2009
- 2009-03-06 GB GBGB0903864.7A patent/GB0903864D0/en not_active Ceased
-
2010
- 2010-03-05 AU AU2010220274A patent/AU2010220274B2/en not_active Ceased
- 2010-03-05 WO PCT/EP2010/052837 patent/WO2010100260A1/en active Application Filing
- 2010-03-05 CA CA2754386A patent/CA2754386C/en not_active Expired - Fee Related
- 2010-03-05 EP EP10707272A patent/EP2404381A1/en not_active Ceased
- 2010-03-05 US US13/255,044 patent/US8921790B2/en not_active Expired - Fee Related
-
2011
- 2011-09-05 IL IL214986A patent/IL214986A/en not_active IP Right Cessation
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5880691A (en) * | 1995-11-07 | 1999-03-09 | California Institute Of Technology | Capacitively coupled successive approximation ultra low power analog-to-digital converter |
Non-Patent Citations (2)
Title |
---|
HAIDONG GUO ET AL: "A low-power 16-bit 500 kS/s ADC", MICROELECTRONICS AND ELECTRON DEVICES, 2005. WMED '05. 2005 IEEE WORKS HOP ON BOISE, ID, USA APRIL 15, 2005, PISCATAWAY, NJ, USA,IEEE LNKD- DOI:10.1109/WMED.2005.1431628, 15 April 2005 (2005-04-15), pages 84 - 87, XP010798787, ISBN: 978-0-7803-9072-0 * |
KHEN-SANG TAN ET AL: "ERROR CORRECTION TECHNIQUES FOR HIGH-PERFORMANCE DIFFERENTIAL A/D CONVERTERS", IEEE JOURNAL OF SOLID-STATE CIRCUITS, IEEE SERVICE CENTER, PISCATAWAY, NJ, US LNKD- DOI:10.1109/4.62175, vol. 25, no. 6, 1 December 1990 (1990-12-01), pages 1318 - 1327, XP000176559, ISSN: 0018-9200 * |
Also Published As
Publication number | Publication date |
---|---|
IL214986A (en) | 2017-06-29 |
CA2754386C (en) | 2017-01-03 |
US20110315879A1 (en) | 2011-12-29 |
GB0903864D0 (en) | 2009-04-22 |
EP2404381A1 (en) | 2012-01-11 |
AU2010220274A1 (en) | 2011-09-22 |
US8921790B2 (en) | 2014-12-30 |
IL214986A0 (en) | 2011-11-30 |
CA2754386A1 (en) | 2010-09-10 |
AU2010220274B2 (en) | 2016-02-25 |
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